CN116990450A - Defect detection method and system for cornea shaping mirror - Google Patents
Defect detection method and system for cornea shaping mirror Download PDFInfo
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Abstract
The application discloses a defect detection method and a defect detection system for a cornea shaping lens, and relates to the technical field of cornea shaping lens detection, wherein the method comprises the following steps: acquiring processing information of a target lens; performing data dimension reduction processing to obtain N historical defect detection data sets; obtaining N design parameter intervals and N processing equipment sets; determining N first data extraction frequencies and N second data extraction frequencies; constructing a defect detection library; obtaining a target first data extraction frequency and a target second data extraction frequency; performing defect detection on the target lens to obtain a target defect detection data set; and inputting the target first data extraction frequency and the target second data extraction frequency into a defect detection analysis model to obtain a defect detection result. The application solves the technical problems of low accuracy and poor reliability of detection results of the defect detection of the cornea shaping lens in the prior art, and achieves the technical effect of improving the defect detection efficiency of the cornea shaping lens.
Description
Technical Field
The application relates to the technical field of cornea shaping mirror detection, in particular to a defect detection method and system of a cornea shaping mirror.
Background
The cornea shaping lens is in direct contact with the cornea of the eyeball, so that the cornea shaping lens has higher quality requirement. At present, the defect detection of the cornea shaping lens mainly utilizes a scientific detection technology to detect the cornea shaping lens, and utilizes an intelligent data processing technology to analyze lens detection data, however, because the cornea shaping lens is closely related to the eyeball structure of a wearer, the detection requirements are changed along with the difference of the wearer. Therefore, the general data processing technology cannot reliably process the detection data with high efficiency. In the prior art, the defect detection accuracy of the cornea shaping lens is low, and the reliability of the detection result is poor.
Disclosure of Invention
The application provides a defect detection method and a defect detection system for a cornea shaping lens, which are used for solving the technical problems of low defect detection accuracy and poor reliability of detection results of the cornea shaping lens in the prior art.
In view of the above problems, the present application provides a method and a system for detecting defects of a cornea shaping lens.
In a first aspect of the present application, there is provided a defect detection method for a cornea shaping mirror, the method comprising:
acquiring processing information of a target lens, wherein the processing information comprises design parameter information and processing equipment information;
extracting a historical defect detection data set processed by a cornea shaping mirror in a preset historical time window, and performing data dimension reduction processing to obtain N historical defect detection data sets, wherein each historical defect detection data set corresponds to one defect type;
matching the N historical defect detection data sets with a historical processing database to obtain N design parameter intervals and N processing equipment sets, wherein the N design parameter intervals and the N processing equipment sets are in one-to-one correspondence;
determining N first data extraction frequencies and N second data extraction frequencies based on the N sets of historical defect detection data;
constructing a defect detection library according to the N first data extraction frequencies, the N second data extraction frequencies, the N design parameter intervals and the N processing equipment sets;
inputting the design parameter information and the processing equipment information into the defect detection library for matching to obtain a target first data extraction frequency and a target second data extraction frequency;
performing defect detection on the target lens to obtain a target defect detection data set;
and inputting the target first data extraction frequency and the target second data extraction frequency into a defect detection analysis model by combining the target defect detection data set to obtain a defect detection result.
In a second aspect of the present application, there is provided a defect detection system for a cornea shaping lens, the system comprising:
the processing information acquisition module is used for acquiring processing information of the target lens, wherein the processing information comprises design parameter information and processing equipment information;
the detecting data set obtaining module is used for extracting a historical defect detecting data set processed by the cornea shaping mirror in a preset historical time window and carrying out data dimension reduction processing to obtain N historical defect detecting data sets, wherein each historical defect detecting data set corresponds to one defect type;
the processing equipment set obtaining module is used for matching the N historical defect detection data sets with a historical processing database to obtain N design parameter intervals and N processing equipment sets, wherein the N design parameter intervals are in one-to-one correspondence with the N processing equipment sets;
a data extraction frequency determination module for determining N first data extraction frequencies and N second data extraction frequencies based on the N sets of historical defect detection data;
the defect detection library construction module is used for constructing a defect detection library according to N first data extraction frequencies, N second data extraction frequencies, N design parameter intervals and N processing equipment sets;
the target extraction frequency obtaining module is used for inputting the design parameter information and the processing equipment information into the defect detection library for matching to obtain a target first data extraction frequency and a target second data extraction frequency;
the target detection data acquisition module is used for carrying out defect detection on the target lens to obtain a target defect detection data set;
the defect detection result obtaining module is used for obtaining a defect detection result by utilizing the target first data extraction frequency and the target second data extraction frequency and combining the target defect detection data set to input a defect detection analysis model.
One or more technical schemes provided by the application have at least the following technical effects or advantages:
acquiring processing information of a target lens, wherein the processing information comprises design parameter information and processing equipment information; extracting a historical defect detection data set processed by a cornea shaping mirror in a preset historical time window, and performing data dimension reduction processing to obtain N historical defect detection data sets, wherein each historical defect detection data set corresponds to one defect type; matching the N historical defect detection data sets with a historical processing database to obtain N design parameter intervals and N processing equipment sets, wherein the N design parameter intervals and the N processing equipment sets are in one-to-one correspondence; determining N first data extraction frequencies and N second data extraction frequencies based on the N historical defect detection data sets; constructing a defect detection library according to the N first data extraction frequencies, the N second data extraction frequencies, the N design parameter intervals and the N processing equipment sets; inputting design parameter information and processing equipment information into a defect detection library for matching to obtain a target first data extraction frequency and a target second data extraction frequency; performing defect detection on the target lens to obtain a target defect detection data set; and inputting the target first data extraction frequency and the target second data extraction frequency into a defect detection analysis model by combining the target defect detection data set to obtain a defect detection result. The technical effect of improving the reliability of the defect detection result and the detection efficiency is achieved.
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In order to more clearly illustrate the technical solutions of the embodiments of the present application, the drawings required for the description of the embodiments will be briefly described below, and it is apparent that the drawings in the following description are only some embodiments of the present application, and other drawings may be obtained according to these drawings without inventive effort for a person skilled in the art.
FIG. 1 is a schematic flow chart of a method for detecting defects of a cornea shaping lens according to an embodiment of the present application;
FIG. 2 is a schematic flow chart of obtaining N historical defect detection data sets according to N leaf nodes in a defect detection method of a cornea shaping lens according to an embodiment of the present application;
FIG. 3 is a schematic flow chart of N design parameter intervals obtained in the defect detection method of the cornea shaping lens according to the embodiment of the present application;
fig. 4 is a schematic structural diagram of a defect detection system of a cornea shaping lens according to an embodiment of the present application.
Reference numerals illustrate: the device comprises a processing information acquisition module 11, a detection data set acquisition module 12, a processing equipment set acquisition module 13, a data extraction frequency determination module 14, a defect detection library construction module 15, a target extraction frequency acquisition module 16, a target detection data acquisition module 17 and a defect detection result acquisition module 18.
Detailed Description
The application provides a defect detection method and a defect detection system for a cornea shaping lens, which are used for solving the technical problems of low defect detection accuracy and poor reliability of detection results of the cornea shaping lens in the prior art.
The technical solutions in the embodiments of the present application will be clearly and completely described below with reference to the accompanying drawings in the embodiments of the present application. It will be apparent that the described embodiments are only some, but not all, embodiments of the application. All other embodiments, which can be made by those skilled in the art based on the embodiments of the application without making any inventive effort, are intended to be within the scope of the application.
It should be noted that the terms "comprises" and "comprising," along with any variations thereof, are intended to cover a non-exclusive inclusion, such that a process, method, system, article, or server that comprises a list of steps or elements is not necessarily limited to those steps or elements expressly listed or inherent to such process, method, article, or apparatus, but may include other steps or modules not expressly listed or inherent to such process, method, article, or apparatus.
Example 1
As shown in fig. 1, the present application provides a defect detection method of a cornea shaping mirror, wherein the method comprises:
step S100: acquiring processing information of a target lens, wherein the processing information comprises design parameter information and processing equipment information;
in one possible embodiment, the target lens is any cornea shaping lens for which defect detection is desired. The processing information is the operation information of processing the blank of the cornea shaping lens into the target lens, and comprises design parameter information and processing equipment information. Wherein the design parameter information includes a long axial distance, a short axial distance, a tear storage capacity, a radius of curvature of an arc of a side, and the like. The processing equipment information is information describing equipment conditions of processing the target lens, and comprises processing equipment types, processing equipment service lives and the like. And basic data is provided for the defect detection of the lens by acquiring the processing information of the target lens.
Step S200: extracting a historical defect detection data set processed by a cornea shaping mirror in a preset historical time window, and performing data dimension reduction processing to obtain N historical defect detection data sets, wherein each historical defect detection data set corresponds to one defect type;
further, as shown in fig. 2, the step S200 of the embodiment of the present application further includes extracting the historical defect detection data set processed by the cornea shaping lens in the preset historical time window, and performing data dimension reduction processing to obtain N historical defect detection data sets:
step S210: obtaining a defect type set during cornea shaping lens processing, wherein the defect type set comprises scratches, gaps and edge arc tilting;
step S220: constructing a plurality of internal nodes of the dimension reduction decision tree according to the defect type set, and marking the defect type of each internal node;
step S230: and respectively inputting the history detection data into a plurality of internal nodes in the dimension reduction decision tree to perform defect type matching, classifying the successfully matched history detection data into leaf nodes corresponding to the internal nodes, and obtaining N history defect detection data sets according to N leaf nodes.
Specifically, the preset history time window is a history time period for performing cornea shaping lens processing, and may be half a month, one quarter, or the like. The historical defect detection data set is a data set obtained after defect detection is carried out within a preset historical time window, and comprises a slit lamp inspection result, a lens surface detection result and the like. The historical defect detection data set comprises qualified detection data and unqualified detection data, and the amount of contained information is too large, so that the difficulty of data processing is reduced by data dimension reduction, N historical defect detection data sets are obtained through data dimension reduction, and each historical defect detection data set corresponds to one defect type.
Specifically, defect types generated in the cornea shaping mirror processing process are collected to obtain a defect type set, wherein the defect type set comprises scratches, notches and edge-arc tilting. And constructing a plurality of internal nodes of the dimension reduction decision tree according to the defect type set, and marking the defect type of each internal node. And taking the plurality of internal nodes as a basic framework of the dimension reduction decision tree, further respectively inputting the history detection data into the plurality of internal nodes in the dimension reduction decision tree to perform defect type matching, classifying the history detection data successfully matched into leaf nodes corresponding to the internal nodes, discarding the history detection data not successfully matched, and then obtaining N history defect detection data sets according to N leaf nodes. Therefore, the method and the device realize the aim of carrying out dimension reduction analysis on the historical defect detection data set efficiently and rapidly.
Step S300: matching the N historical defect detection data sets with a historical processing database to obtain N design parameter intervals and N processing equipment sets, wherein the N design parameter intervals and the N processing equipment sets are in one-to-one correspondence;
further, as shown in fig. 3, step S300 of the embodiment of the present application further includes:
step S310: matching corresponding design parameters according to the historical processing information in the historical processing database data to obtain a matching result;
step S320: according to N design parameter sets corresponding to N historical defect detection data sets in the matching result;
step S330: and obtaining N design parameter intervals according to the maximum value and the minimum value in the N design parameter sets.
Further, step S300 of the embodiment of the present application further includes:
step S340: obtaining N processing equipment sets according to processing equipment corresponding to the N historical defect detection data sets in the matching result;
step S350: and acquiring service lives of the processing equipment in the N processing equipment sets to obtain N processing equipment service life information sets.
In one possible embodiment, the N sets of historical defect detection data are matched with a historical processing database, wherein the historical processing database is data generated by processing within a preset historical time window, so as to obtain the N design parameter intervals and the N sets of processing equipment. The N design parameter intervals are corresponding cornea shaping mirror parameter ranges when N historical defect detection data sets are generated, and processing is performed when N historical defect detection data sets are generated when N processing equipment sets are generated. The N design parameter intervals are in one-to-one correspondence with the N processing equipment sets. By analyzing the N historical defect detection data sets, the design parameter range and the used processing equipment for generating similar defects are determined.
Specifically, the N historical defect detection data sets are matched with a historical processing database, and corresponding design parameters are matched according to historical processing information in the historical processing database data to obtain a matching result. And respectively extracting the maximum value and the minimum value in the sets as two endpoints of the design parameter interval according to N design parameter sets corresponding to the N historical defect detection data sets in the matching result, and further obtaining N design parameter intervals.
Specifically, corresponding N sets of processing apparatuses are obtained by processing apparatuses corresponding to N sets of historical defect detection data in the matching result. Furthermore, the service lives of the processing equipment in the N processing equipment sets are collected, and N processing equipment service life information sets are obtained. Wherein the N sets of processing equipment lifetime information comprise a length of time that the processing equipment has been in use.
Step S400: determining N first data extraction frequencies and N second data extraction frequencies based on the N sets of historical defect detection data;
further, the determining N first data extraction frequencies and N second data extraction frequencies based on the N historical defect detection data sets in step S400 further includes:
step S410: determining time nodes corresponding to the N historical defect detection data sets according to the preset historical time window, and obtaining N time node sets;
step S420: traversing the N time node sets to determine defect interval time and obtaining N interval time sets;
step S430: extracting minimum interval time from the N interval time sets as N first data extraction frequencies;
step S440: the maximum interval time is extracted from the N sets of interval times as N second data extraction frequencies.
Specifically, N first data extraction frequencies and N second data extraction frequencies are determined according to defect data interval times in the N historical defect detection data sets. Wherein the N first data extraction frequencies are intervals for extracting frequently occurring defect data. The N second data extraction frequencies are intervals for extracting defect data with longer occurrence time intervals, and the N first data extraction frequencies are smaller than the N second data extraction frequencies. The amount of data extracted at the N first data extraction frequencies is greater than the amount of data extracted at the N second data extraction frequencies. By extracting data according to different extraction frequencies, the efficiency of data extraction can be improved on the premise of ensuring that defect data is not missed.
Specifically, determining time nodes corresponding to the N historical defect detection data sets according to the preset historical time window, and obtaining N time node sets. And then carrying out defect interval time analysis on each time node set to determine N interval time sets. Wherein the N interval time sets reflect the interval time size of the defect occurrence. Further, the minimum interval time is extracted from the N interval time sets as N first data extraction frequencies, and then the maximum interval time is extracted from the N interval time sets as N second data extraction frequencies.
Step S500: constructing a defect detection library according to the N first data extraction frequencies, the N second data extraction frequencies, the N design parameter intervals and the N processing equipment sets;
in one possible embodiment, the defect detection library is constructed by using N design parameter intervals and N sets of processing equipment as index items and N first data extraction frequencies and N second data extraction frequencies as indexed items. Wherein the defect detection library reflects the defect detection condition during cornea shaping lens processing.
Step S600: inputting the design parameter information and the processing equipment information into the defect detection library for matching to obtain a target first data extraction frequency and a target second data extraction frequency;
further, step S600 of the embodiment of the present application further includes:
step S610: matching the design parameter information with N design parameter intervals in the defect detection library to obtain a target design parameter interval;
step S620: searching in a defect detection library by taking a target design parameter interval as an index to obtain a target first data extraction frequency to be optimized and a target second data extraction frequency to be optimized;
step S630: matching the processing equipment information with N processing equipment sets, judging whether the matching is successful, and if so, taking the target first data extraction frequency to be optimized and the target second data extraction frequency to be optimized as the target first data extraction frequency and the target second data extraction frequency;
step S640: if not, optimizing the first data extraction frequency of the target to be optimized and the second data extraction frequency of the target to be optimized according to the processing equipment information and the N processing equipment life information sets, and obtaining the first data extraction frequency of the target and the second data extraction frequency of the target according to the optimization result.
Specifically, the design parameter information and the processing equipment information are input into the defect detection library for matching, and the target first data extraction frequency and the target second data extraction frequency which accord with the target lens are determined. The data extraction frequency of the actual condition of fitting the target lens is achieved, and therefore reliability of detection data is improved.
Specifically, the design parameter information is matched with N design parameter intervals in the defect detection library, the range of the design parameters in the design parameter information is determined, and a target design parameter interval is obtained from Russian. And taking the target design parameter interval as an index, and searching the indexed item in the defect detection library to obtain the first data extraction frequency of the target to be optimized and the second data extraction frequency of the target to be optimized. And matching the processing equipment information with the N processing equipment sets, judging whether the matching is successful, if so, indicating that the processing equipment is consistent, and taking the target first data extraction frequency to be optimized and the target second data extraction frequency to be optimized as the target first data extraction frequency and the target second data extraction frequency without considering the influence of the processing equipment on the processing defects.
Specifically, if not, the processing equipment is replaced, and the first data extraction frequency of the target to be optimized and the second data extraction frequency of the target to be optimized need to be optimized according to the information of the processing equipment, so that the extracted data is more reliable. Preferably, the ratio of the service life of the target lens processing equipment in the processing equipment information to the service life average value of the N processing equipment service life information sets is used as an optimization coefficient. Multiplying the optimization coefficient with the target first data extraction frequency to be optimized and the target second data extraction frequency to be optimized to obtain the target first data extraction frequency and the target second data extraction frequency.
Step S700: performing defect detection on the target lens to obtain a target defect detection data set;
in one possible embodiment, the target defect inspection data set is obtained by aggregating the defect inspection data by one skilled in the art using a defect inspection apparatus to inspect the target lens for defects. The method realizes the aim of providing basic data for the subsequent analysis of the defect detection result.
Step S800: and inputting the target first data extraction frequency and the target second data extraction frequency into a defect detection analysis model by combining the target defect detection data set to obtain a defect detection result.
Further, step S800 of the embodiment of the present application further includes:
step S810: the defect detection analysis model comprises a first data extraction channel, a second data extraction channel and a defect detection analysis layer;
step S820: acquiring a plurality of sample first data extraction frequencies, a plurality of sample target defect detection data sets and a plurality of sample first data extraction results as construction data, and performing supervision training on a framework constructed based on a feedforward neural network to acquire a first data extraction channel;
step S830: acquiring a plurality of sample second data extraction frequencies, a plurality of sample target defect detection data sets and a plurality of sample second data extraction results as construction data, and performing supervision training on a framework constructed based on a feedforward neural network to acquire a second data extraction channel;
step S840: and constructing a mapping relation among the first data extraction results of the plurality of samples, the second data extraction results of the plurality of samples and the defect detection results of the plurality of samples, and generating a defect detection analysis layer based on the mapping relation.
Specifically, the target first data extraction frequency and the target second data extraction frequency are input into a defect detection analysis model in combination with a target defect detection data set, and a defect detection result is obtained through intelligent operation of the defect detection analysis model. The defect detection analysis model is used for carrying out differential extraction on data and carrying out intelligent analysis on detection results.
Specifically, the defect detection analysis model comprises a first data extraction channel, a second data extraction channel and a defect detection analysis layer. The first data extraction channel is used for carrying out data extraction on the defect detection data set according to the first data extraction frequency to obtain a first data extraction result. The second data extraction channel is used for carrying out data extraction on the defect detection data set according to the second data extraction frequency to obtain a second data extraction result. The defect detection analysis layer is used for comprehensively analyzing the first data extraction result and the second data extraction result to obtain a defect detection result.
Specifically, a plurality of sample first data extraction frequencies, a plurality of sample target defect detection data sets and a plurality of sample first data extraction results are obtained to serve as construction data, and supervision training is performed on a framework constructed based on a feedforward neural network until output reaches convergence, so that a first data extraction channel is obtained. And acquiring a plurality of sample second data extraction frequencies, a plurality of sample target defect detection data sets and a plurality of sample second data extraction results as construction data, and performing supervision training on a framework constructed based on the feedforward neural network until the output reaches convergence, so as to acquire a second data extraction channel. Further, a mapping relationship among the plurality of sample first data extraction results, the plurality of sample second data extraction results and the plurality of sample defect detection results is constructed, and a defect detection analysis layer is generated based on the mapping relationship. And then, the target first data extraction frequency and the target second data extraction frequency are combined with the target defect detection data set to be input into a defect detection analysis model, so that a defect detection result is obtained.
In summary, the embodiment of the application has at least the following technical effects:
according to the application, the processing information of the target lens is subjected to data analysis to obtain the processing information, data is provided for subsequent detection analysis, then the historical defect detection data is analyzed, N historical defect detection data sets after dimension reduction clustering are determined, then N first data extraction frequencies and N second data extraction frequencies are determined, the aim of comprehensively extracting the detection data is fulfilled, then a defect detection library is constructed according to the N first data extraction frequencies, the N second data extraction frequencies, N design parameter intervals and N processing equipment sets, defect detection is carried out on the target lens, a detected target defect detection data set is obtained, and intelligent analysis is carried out by combining the target first data extraction frequencies and the target second data extraction frequencies obtained through matching, so that a defect detection result is obtained. The technical effects of improving the detection efficiency and improving the reliability of the defect detection result are achieved.
Example two
Based on the same inventive concept as the defect detection method of a cornea shaping lens in the foregoing embodiments, as shown in fig. 4, the present application provides a defect detection system of a cornea shaping lens, and the system and method embodiments in the embodiments of the present application are based on the same inventive concept. Wherein the system comprises:
a processing information acquisition module 11, wherein the processing information acquisition module 11 is configured to acquire processing information of a target lens, and the processing information includes design parameter information and processing equipment information;
the detecting data set obtaining module 12 is configured to extract a historical defect detecting data set processed by the cornea shaping lens in a preset historical time window, and perform data dimension reduction processing to obtain N historical defect detecting data sets, where each historical defect detecting data set corresponds to a defect type;
the processing equipment set obtaining module 13 is configured to match the N historical defect detection data sets with a historical processing database to obtain N design parameter intervals and N processing equipment sets, where the N design parameter intervals and the N processing equipment sets are in one-to-one correspondence;
a data extraction frequency determination module 14, the data extraction frequency determination module 14 configured to determine N first data extraction frequencies and N second data extraction frequencies based on the N sets of historical defect detection data;
the defect detection library construction module 15 is used for constructing a defect detection library according to the N first data extraction frequencies, the N second data extraction frequencies, the N design parameter intervals and the N processing equipment sets;
the target extraction frequency obtaining module 16, wherein the target extraction frequency obtaining module 16 is configured to input the design parameter information and the processing equipment information into the defect detection library to match, and obtain a target first data extraction frequency and a target second data extraction frequency;
the target detection data obtaining module 17 is used for carrying out defect detection on the target lens to obtain a target defect detection data set;
the defect detection result obtaining module 18 is configured to obtain a defect detection result by using the target first data extraction frequency and the target second data extraction frequency and inputting the defect detection result into the defect detection analysis model in combination with the target defect detection data set.
Further, the detection data set obtaining module 12 is configured to perform the following method:
obtaining a defect type set during cornea shaping lens processing, wherein the defect type set comprises scratches, gaps and edge arc tilting;
constructing a plurality of internal nodes of the dimension reduction decision tree according to the defect type set, and marking the defect type of each internal node;
and respectively inputting the history detection data into a plurality of internal nodes in the dimension reduction decision tree to perform defect type matching, classifying the successfully matched history detection data into leaf nodes corresponding to the internal nodes, and obtaining N history defect detection data sets according to N leaf nodes.
Further, the processing equipment set obtaining module 13 is configured to perform the following method:
matching corresponding design parameters according to the historical processing information in the historical processing database data to obtain a matching result;
according to N design parameter sets corresponding to N historical defect detection data sets in the matching result;
and obtaining N design parameter intervals according to the maximum value and the minimum value in the N design parameter sets.
Further, the processing equipment set obtaining module 13 is configured to perform the following method:
obtaining N processing equipment sets according to processing equipment corresponding to the N historical defect detection data sets in the matching result;
and acquiring service lives of the processing equipment in the N processing equipment sets to obtain N processing equipment service life information sets.
Further, the data extraction frequency determining module 14 is configured to perform the following method:
determining time nodes corresponding to the N historical defect detection data sets according to the preset historical time window, and obtaining N time node sets;
traversing the N time node sets to determine defect interval time and obtaining N interval time sets;
extracting minimum interval time from the N interval time sets as N first data extraction frequencies;
the maximum interval time is extracted from the N sets of interval times as N second data extraction frequencies.
Further, the target extraction frequency obtaining module 16 is configured to perform the following method:
matching the design parameter information with N design parameter intervals in the defect detection library to obtain a target design parameter interval;
searching in a defect detection library by taking a target design parameter interval as an index to obtain a target first data extraction frequency to be optimized and a target second data extraction frequency to be optimized;
matching the processing equipment information with N processing equipment sets, judging whether the matching is successful, and if so, taking the target first data extraction frequency to be optimized and the target second data extraction frequency to be optimized as the target first data extraction frequency and the target second data extraction frequency;
if not, optimizing the first data extraction frequency of the target to be optimized and the second data extraction frequency of the target to be optimized according to the processing equipment information and the N processing equipment life information sets, and obtaining the first data extraction frequency of the target and the second data extraction frequency of the target according to the optimization result.
Further, the defect detection result obtaining module 18 is configured to perform the following method:
the defect detection analysis model comprises a first data extraction channel, a second data extraction channel and a defect detection analysis layer;
acquiring a plurality of sample first data extraction frequencies, a plurality of sample target defect detection data sets and a plurality of sample first data extraction results as construction data, and performing supervision training on a framework constructed based on a feedforward neural network to acquire a first data extraction channel;
acquiring a plurality of sample second data extraction frequencies, a plurality of sample target defect detection data sets and a plurality of sample second data extraction results as construction data, and performing supervision training on a framework constructed based on a feedforward neural network to acquire a second data extraction channel;
and constructing a mapping relation among the first data extraction results of the plurality of samples, the second data extraction results of the plurality of samples and the defect detection results of the plurality of samples, and generating a defect detection analysis layer based on the mapping relation.
It should be noted that the sequence of the embodiments of the present application is only for description, and does not represent the advantages and disadvantages of the embodiments. And the foregoing description has been directed to specific embodiments of this specification. Other embodiments are within the scope of the following claims. In some cases, the actions or steps recited in the claims can be performed in a different order than in the embodiments and still achieve desirable results. In addition, the processes depicted in the accompanying figures do not necessarily require the particular order shown, or sequential order, to achieve desirable results. In some embodiments, multitasking and parallel processing are also possible or may be advantageous.
The foregoing description of the preferred embodiments of the application is not intended to limit the application to the precise form disclosed, and any such modifications, equivalents, and alternatives falling within the spirit and scope of the application are intended to be included within the scope of the application.
The specification and figures are merely exemplary illustrations of the present application and are considered to cover any and all modifications, variations, combinations, or equivalents that fall within the scope of the application. It will be apparent to those skilled in the art that various modifications and variations can be made to the present application without departing from the scope of the application. Thus, the present application is intended to include such modifications and alterations insofar as they come within the scope of the application or the equivalents thereof.
Claims (8)
1. A method for detecting defects in a cornea shaping lens, the method comprising:
acquiring processing information of a target lens, wherein the processing information comprises design parameter information and processing equipment information;
extracting a historical defect detection data set processed by a cornea shaping mirror in a preset historical time window, and performing data dimension reduction processing to obtain N historical defect detection data sets, wherein each historical defect detection data set corresponds to one defect type;
matching the N historical defect detection data sets with a historical processing database to obtain N design parameter intervals and N processing equipment sets, wherein the N design parameter intervals and the N processing equipment sets are in one-to-one correspondence;
determining N first data extraction frequencies and N second data extraction frequencies based on the N sets of historical defect detection data;
constructing a defect detection library according to the N first data extraction frequencies, the N second data extraction frequencies, the N design parameter intervals and the N processing equipment sets;
inputting the design parameter information and the processing equipment information into the defect detection library for matching to obtain a target first data extraction frequency and a target second data extraction frequency;
performing defect detection on the target lens to obtain a target defect detection data set;
and inputting the target first data extraction frequency and the target second data extraction frequency into a defect detection analysis model by combining the target defect detection data set to obtain a defect detection result.
2. The method of claim 1, wherein the extracting the historical defect detection data set for the cornea shaping lens processing in the preset historical time window and performing the data dimension reduction processing to obtain N historical defect detection data sets, the method comprising:
obtaining a defect type set during cornea shaping lens processing, wherein the defect type set comprises scratches, gaps and edge arc tilting;
constructing a plurality of internal nodes of the dimension reduction decision tree according to the defect type set, and marking the defect type of each internal node;
and respectively inputting the history detection data into a plurality of internal nodes in the dimension reduction decision tree to perform defect type matching, classifying the successfully matched history detection data into leaf nodes corresponding to the internal nodes, and obtaining N history defect detection data sets according to N leaf nodes.
3. The method of claim 1, wherein the method comprises:
matching corresponding design parameters according to the historical processing information in the historical processing database data to obtain a matching result;
according to N design parameter sets corresponding to N historical defect detection data sets in the matching result;
and obtaining N design parameter intervals according to the maximum value and the minimum value in the N design parameter sets.
4. A method according to claim 3, wherein the method comprises:
obtaining N processing equipment sets according to processing equipment corresponding to the N historical defect detection data sets in the matching result;
and acquiring service lives of the processing equipment in the N processing equipment sets to obtain N processing equipment service life information sets.
5. The method of claim 1, wherein the determining N first data extraction frequencies and N second data extraction frequencies based on the N sets of historical defect detection data, the method comprising:
determining time nodes corresponding to the N historical defect detection data sets according to the preset historical time window, and obtaining N time node sets;
traversing the N time node sets to determine defect interval time and obtaining N interval time sets;
extracting minimum interval time from the N interval time sets as N first data extraction frequencies;
the maximum interval time is extracted from the N sets of interval times as N second data extraction frequencies.
6. The method of claim 4, wherein the method comprises:
matching the design parameter information with N design parameter intervals in the defect detection library to obtain a target design parameter interval;
searching in a defect detection library by taking a target design parameter interval as an index to obtain a target first data extraction frequency to be optimized and a target second data extraction frequency to be optimized;
matching the processing equipment information with N processing equipment sets, judging whether the matching is successful, and if so, taking the target first data extraction frequency to be optimized and the target second data extraction frequency to be optimized as the target first data extraction frequency and the target second data extraction frequency;
if not, optimizing the first data extraction frequency of the target to be optimized and the second data extraction frequency of the target to be optimized according to the processing equipment information and the N processing equipment life information sets, and obtaining the first data extraction frequency of the target and the second data extraction frequency of the target according to the optimization result.
7. The method of claim 1, wherein the method comprises:
the defect detection analysis model comprises a first data extraction channel, a second data extraction channel and a defect detection analysis layer;
acquiring a plurality of sample first data extraction frequencies, a plurality of sample target defect detection data sets and a plurality of sample first data extraction results as construction data, and performing supervision training on a framework constructed based on a feedforward neural network to acquire a first data extraction channel;
acquiring a plurality of sample second data extraction frequencies, a plurality of sample target defect detection data sets and a plurality of sample second data extraction results as construction data, and performing supervision training on a framework constructed based on a feedforward neural network to acquire a second data extraction channel;
and constructing a mapping relation among the first data extraction results of the plurality of samples, the second data extraction results of the plurality of samples and the defect detection results of the plurality of samples, and generating a defect detection analysis layer based on the mapping relation.
8. A defect detection system for a cornea shaping lens, the system comprising:
the processing information acquisition module is used for acquiring processing information of the target lens, wherein the processing information comprises design parameter information and processing equipment information;
the detecting data set obtaining module is used for extracting a historical defect detecting data set processed by the cornea shaping mirror in a preset historical time window and carrying out data dimension reduction processing to obtain N historical defect detecting data sets, wherein each historical defect detecting data set corresponds to one defect type;
the processing equipment set obtaining module is used for matching the N historical defect detection data sets with a historical processing database to obtain N design parameter intervals and N processing equipment sets, wherein the N design parameter intervals are in one-to-one correspondence with the N processing equipment sets;
a data extraction frequency determination module for determining N first data extraction frequencies and N second data extraction frequencies based on the N sets of historical defect detection data;
the defect detection library construction module is used for constructing a defect detection library according to N first data extraction frequencies, N second data extraction frequencies, N design parameter intervals and N processing equipment sets;
the target extraction frequency obtaining module is used for inputting the design parameter information and the processing equipment information into the defect detection library for matching to obtain a target first data extraction frequency and a target second data extraction frequency;
the target detection data acquisition module is used for carrying out defect detection on the target lens to obtain a target defect detection data set;
the defect detection result obtaining module is used for obtaining a defect detection result by utilizing the target first data extraction frequency and the target second data extraction frequency and combining the target defect detection data set to input a defect detection analysis model.
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