CN116990344B - Fluorination reaction heat testing method and system - Google Patents
Fluorination reaction heat testing method and system Download PDFInfo
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- CN116990344B CN116990344B CN202311008949.1A CN202311008949A CN116990344B CN 116990344 B CN116990344 B CN 116990344B CN 202311008949 A CN202311008949 A CN 202311008949A CN 116990344 B CN116990344 B CN 116990344B
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- 238000012360 testing method Methods 0.000 title claims abstract description 38
- 238000003682 fluorination reaction Methods 0.000 title claims abstract description 30
- 238000010998 test method Methods 0.000 claims abstract description 7
- 241000143252 Idaea infirmaria Species 0.000 claims description 41
- 238000000034 method Methods 0.000 claims description 19
- 238000012216 screening Methods 0.000 claims description 16
- 238000012790 confirmation Methods 0.000 claims description 14
- 238000012544 monitoring process Methods 0.000 claims description 10
- 238000010276 construction Methods 0.000 claims description 5
- 238000010438 heat treatment Methods 0.000 claims description 4
- 238000012545 processing Methods 0.000 claims description 4
- 230000000694 effects Effects 0.000 description 5
- 238000006243 chemical reaction Methods 0.000 description 3
- 125000004429 atom Chemical group 0.000 description 2
- 238000010586 diagram Methods 0.000 description 2
- -1 fluorine ions Chemical class 0.000 description 2
- 239000007864 aqueous solution Substances 0.000 description 1
- 230000009286 beneficial effect Effects 0.000 description 1
- 230000009194 climbing Effects 0.000 description 1
- 230000007547 defect Effects 0.000 description 1
- 229910052731 fluorine Inorganic materials 0.000 description 1
- 239000011737 fluorine Substances 0.000 description 1
- 125000001153 fluoro group Chemical group F* 0.000 description 1
- 241000894007 species Species 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N25/00—Investigating or analyzing materials by the use of thermal means
- G01N25/20—Investigating or analyzing materials by the use of thermal means by investigating the development of heat, i.e. calorimetry, e.g. by measuring specific heat, by measuring thermal conductivity
Abstract
The invention discloses a thermal test method and a thermal test system for a fluorination reaction, which relate to the technical field of the fluorination reaction and solve the problem that the corresponding fluorination reaction is affected due to the fact that a temperature curve is severely fluctuated because the applied pressure parameter is not obviously defined.
Description
Technical Field
The invention relates to the technical field of fluorination reaction, in particular to a thermal test method and a thermal test system for fluorination reaction.
Background
The fluorination reaction is a typical donor reaction and is characterized by the fact that fluorine atoms are split by electron donor atoms into free fluorine ions, which are readily converted to fluoride ions in aqueous solution, which combine with acceptor atoms to form inorganic species.
The fluorination reaction is in the reaction process, and comprises a test cavity, a sample heater, a temperature sensor, a pressure sensor and a high-pressure test tank, wherein the sample heater is required to heat a sample in the normal test process, and meanwhile, the sample is subjected to pressurization treatment in the high-pressure test tank, so that the pressure is increased, and the normal operation of the fluorination reaction is ensured.
In the reaction heat test process, the temperature curve can be changed due to the specific fluorination process, and the applied pressure parameter is not obviously defined, so that the temperature curve has severe fluctuation, the corresponding fluorination reaction can be influenced, the heat test error of the fluorination reaction is increased, and a better test effect can not be achieved.
Disclosure of Invention
Aiming at the defects of the prior art, the invention provides a fluorination reaction heat test method and a fluorination reaction heat test system, which solve the problem that the temperature curve has severe fluctuation caused by the fact that the applied pressure parameter is not obviously defined, so that the corresponding fluorination reaction is influenced.
In order to achieve the above purpose, the invention is realized by the following technical scheme: the Wen Bo curve confirmation end is used for controlling the temperature of a sample participating in the fluorination reaction, collecting a thermal temperature curve generated in the test process and transmitting the collected thermal temperature curve into the test terminal;
the test terminal comprises a pressure parameter adjusting unit, a wave change curve confirming unit, a screening unit and a threshold unit, wherein the pressure parameter adjusting unit gradually increases the pressure parameters in the high-pressure test pool, the increased pressure parameters are Y1, a group of monitoring periods are stopped after the increase is finished, the next group of pressure parameters are increased, and a group of monitoring periods are stopped every time the next group of pressure parameters are increased, wherein Y1 is a preset value;
the wave-changing curve confirming unit confirms the thermal temperature curve changed at the end of each group of monitoring period and marks the thermal temperature curve as a wave-changing temperature curve, wherein different wave-changing temperature curves correspond to different pressure parameters;
the screening unit is used for carrying out preliminary screening on a plurality of variable wave temperature curves preferentially, analyzing whether a temperature change interval in the variable wave temperature curve belongs to a preset interval or not, screening part of variable wave temperature curves according to analysis results, reserving a corresponding waveform curve, calibrating the corresponding waveform curve as a standard curve, and transmitting the reserved standard curve into a wave parameter analysis terminal, wherein the specific mode is as follows:
selecting a maximum value and a minimum value from a plurality of variable wave temperature curves, and confirming a variable wave interval belonging to the variable wave temperature curves;
directly selecting a preset interval from the threshold unit, wherein the end values of the two ends of the preset interval are preset values, analyzing whether the strain wave interval belongs to the preset interval, if so, marking the corresponding wave temperature curve as a standard curve, and if not, not performing any treatment;
transmitting the marked standard curves into a wave parameter analysis terminal;
the wave parameter analysis terminal comprises a wave change curve construction unit, an interval locking unit and an optimal pressure parameter confirmation unit, wherein the wave change curve construction unit confirms the wave parameters of a plurality of standard curves, constructs a wave parameter change curve according to the confirmed wave parameters, and transmits the constructed wave parameter change curve into the interval locking unit, and the wave parameter analysis terminal comprises the following specific modes:
preferentially confirming the fluctuation points in the corresponding standard curve from the confirmed standard curve, wherein the trend trends of line segments at two ends of the fluctuation points are opposite, and marking a plurality of fluctuation points in the standard curve;
confirming temperature fluctuation values between adjacent fluctuation points, and marking the confirmed temperature fluctuation values as BD i-k Wherein i represents different standard curves, k represents different temperature fluctuation values, and a plurality of temperature fluctuation values BD are obtained i-k Performing mean processing to obtain a defined mean value, and marking as XD i ；
Recording the number of the fluctuation points in the standard curve, and marking the recorded number as GS i BZ is adopted i ＝XD i ×A1+GS i Obtaining the fluctuation parameter BZ belonging to the standard curve by the X A2 i Wherein A1 and A2 are both preset fixed coefficient factors；
The fluctuation parameters BZ corresponding to different standard curves are processed i Sequentially confirming, establishing a wave change curve, taking a pressure parameter as a transverse coordinate axis, taking a fluctuation parameter as a vertical coordinate axis, selecting a specified point in the coordinate system, and connecting the specified point, wherein when intermittent pressure parameters occur, the connection is not performed, so that the fluctuation parameter change curve is obtained;
the interval locking unit confirms a group of intervals with the fastest fluctuation parameter falling in the fluctuation parameter change curve and transmits the confirmed falling intervals to the optimal pressure parameter confirming unit, and the specific mode is as follows:
confirming trend parameters of different points in the variable wave curve, and marking the fluctuation parameters of the different points as BZ t Marking the pressure references at different points as K t Wherein t represents different points, and t=1, 2, … …, n;
by Q j ＝(BZ j+1 -BZ j )÷(K j+1 -K j ) Obtaining trend parameters Q of a plurality of adjacent points j J is less than or equal to t, j is less than or equal to 1 and less than or equal to n-1, and if the corresponding points are not adjacent, no trend parameter confirmation work is performed;
from several trend parameters Q j Confirming the minimum trend parameter, confirming the endpoint value corresponding to the trend parameter, extracting the internal pressure parameter according to the endpoint value participating in calculation, merging the pressure parameters, and confirming the corresponding descending interval;
the optimal pressure parameter confirming unit is used for selecting optimal pressure parameters according to the confirmed descending interval and transmitting the optimal pressure parameters to the display terminal for display:
confirming an original variable wave temperature curve from the pressure parameters, selecting the maximum value of the variable wave temperature curve, selecting a group of parameters with the maximum values from the maximum values as optimal parameters, marking the corresponding variable wave temperature curve as the optimal curve, marking the corresponding pressure parameter as the optimal parameter, and transmitting the optimal parameter to a display terminal for display.
Preferably, a thermal test method for fluorination reaction comprises the steps of:
firstly, heating a sample preferentially, confirming a thermal temperature curve, subsequently adjusting pressure parameters of a high-pressure test pool step by step, and recording corresponding temperature change waveforms;
step two, confirming a wave change interval according to the temperature value in the temperature change waveform preferentially, analyzing whether the wave change interval belongs to a preset interval, eliminating partial temperature change waveforms which do not belong to the preset interval, and confirming a standard curve;
thirdly, confirming a fluctuation parameter corresponding to the standard curve from the confirmed standard curve according to the variation parameters among the fluctuation points and the fluctuation times, and constructing a variable wave curve belonging to a plurality of fluctuation parameters according to the variation condition of the fluctuation parameter;
step four, confirming a group of intervals with the fastest fluctuation parameter falling from the wave-changing curve, and calibrating the confirmed intervals as falling intervals;
fifthly, confirming a plurality of pressure parameters corresponding to the descending interval from the confirmed descending interval, selecting the maximum value of the corresponding temperature curve from the plurality of pressure parameters, calibrating a group of temperature curves with the maximum selected temperature values as the optimal curve, and marking the corresponding pressure parameters as the optimal parameters.
Advantageous effects
The invention provides a thermal test method and a thermal test system for a fluorination reaction. Compared with the prior art, the method has the following beneficial effects:
the method comprises the steps of preferentially confirming a normal thermal temperature curve, subsequently, adjusting pressure parameters in the fluorination reaction process, recording a corresponding temperature curve in real time in the adjustment process, deleting part of the temperature curve according to temperature change, reserving part of the temperature curve as a standard curve, confirming the fluctuation state of the corresponding standard curve in the actual treatment process, and confirming a corresponding fluctuation value;
the method comprises the steps of establishing a corresponding relation trend graph according to the change relation between the pressure parameters and the fluctuation values, confirming a group of pressure intervals with the fastest numerical value reduction, selecting the optimal pressure parameters from the pressure intervals, marking the optimal pressure parameters as the optimal parameters for external personnel to select, and in the actual analysis processing process, not only ensuring the normal running of the fluorination reaction, but also minimizing the thermal stability of the temperature, confirming the optimal pressure parameters, displaying and improving the integral effect of the whole thermal test.
Drawings
FIG. 1 is a schematic diagram of a principal frame of the present invention;
fig. 2 is a schematic diagram of the principle framework of the test terminal and the wave parameter analysis terminal of the invention.
Detailed Description
The following description of the embodiments of the present invention will be made clearly and completely with reference to the accompanying drawings, in which it is apparent that the embodiments described are only some embodiments of the present invention, but not all embodiments. All other embodiments, which can be made by those skilled in the art based on the embodiments of the invention without making any inventive effort, are intended to be within the scope of the invention.
Example 1
Referring to fig. 1 and 2, the present application provides a fluorination reaction heat testing system, which includes a Wen Bo curve confirmation end, a testing terminal, a parameter analysis terminal and a display terminal, wherein the Wen Bo curve confirmation end is electrically connected with an input node of the testing terminal, the testing terminal is electrically connected with an input node of the parameter analysis terminal, and the parameter analysis terminal is electrically connected with an input node of the display terminal;
the test terminal comprises a pressure parameter adjusting unit, a wave change curve confirming unit, a screening unit and a threshold unit, wherein the pressure parameter adjusting unit is electrically connected with an input node of the wave change curve confirming unit, the wave change curve confirming unit and the threshold unit are electrically connected with an input node of the screening unit, the wave parameter analyzing terminal comprises a wave change curve constructing unit, a section locking unit and an optimal pressure parameter confirming unit, the wave change curve constructing unit is electrically connected with an input node of the section locking unit, and the section locking unit is electrically connected with an input node of the optimal pressure parameter confirming unit;
the Wen Bo curve confirmation end is used for heating a sample participating in the fluorination reaction, confirming a thermal temperature curve generated in the test process, transmitting the confirmed thermal temperature curve into the test terminal, specifically, the thermal temperature curve is a curve constructed by temperature parameters generated in a normal pressure state, the pressure value is an initial value, the follow-up operation of the fluorination reaction is convenient for ensuring the temperature curve to be more stable, the pressure value is required to be adjusted, climbing is gradually carried out, and a corresponding temperature change curve is recorded;
the pressure parameter adjusting unit in the test terminal gradually increases the pressure parameter in the high-pressure test tank, wherein the increased pressure parameter is Y1, a group of monitoring periods are stopped after the increase is finished, the next group of pressure parameters are increased, a group of monitoring periods are stopped every time the next group of pressure parameters are increased, Y1 is a preset value, the specific value of Y1 is determined by an operator according to experience, the monitoring period is a preset period, and the specific value of Y1 is determined by the operator according to experience;
the wave-changing curve confirming unit confirms the thermal temperature curve changed at the end of each group of monitoring period and marks the thermal temperature curve as a wave-changing temperature curve, wherein different wave-changing temperature curves correspond to different pressure parameters, and particularly, when the pressure parameters are changed, the temperature is changed, and in the temperature changing process, the corresponding temperature curve is directly recorded, namely the corresponding wave-changing temperature curve;
the screening unit is used for carrying out preliminary screening on a plurality of variable wave temperature curves preferentially, analyzing whether a temperature change interval in the variable wave temperature curves belongs to a preset interval or not, screening part of variable wave temperature curves according to analysis results, reserving corresponding waveform curves, calibrating the corresponding waveform curves as standard curves, and transmitting the reserved standard curves into a wave parameter analysis terminal, wherein the specific mode for screening is as follows:
selecting a maximum value and a minimum value from a plurality of variable wave temperature curves, and confirming a variable wave interval belonging to the variable wave temperature curves;
directly selecting a preset interval from the threshold unit, wherein the end values at the two ends of the preset interval are preset values, the specific value is drawn by an operator according to experience, whether the strain wave interval belongs to the preset interval is analyzed, if so, the corresponding strain wave temperature curve is marked as a standard curve, and if not, no treatment is carried out;
and transmitting the marked standard curves into the parameter analysis terminal.
Example two
In the implementation process of this embodiment, compared with the first embodiment, the specific difference is that:
the wave parameter analysis terminal comprises a wave parameter analysis unit, a section locking unit and a section locking unit, wherein the wave parameter analysis unit is used for analyzing a plurality of standard curves, establishing a wave parameter change curve according to the confirmed plurality of wave parameters and transmitting the established wave parameter change curve into the section locking unit, and the specific mode for establishing the wave parameter change curve is as follows:
preferentially confirming the fluctuation points corresponding to the inside of the standard curve from the confirmed standard curve, wherein the trend directions of the line segments at the two ends of the fluctuation points are opposite, namely, when the trend direction of the line segment at the front end of the fluctuation point is upward, the trend direction of the line segment at the other end is downward, and after marking a plurality of fluctuation points in the standard curve;
confirming temperature fluctuation values between adjacent fluctuation points, and marking the confirmed temperature fluctuation values as BD i-k Wherein i represents different standard curves, k represents different temperature fluctuation values, and a plurality of temperature fluctuation values BD are obtained i-k Performing mean processing to obtain a defined mean value, and marking as XD i ；
Recording the number of the fluctuation points in the standard curve, and marking the recorded number as GS i BZ is adopted i ＝XD i ×A1+GS i Obtaining the fluctuation parameter BZ belonging to the standard curve by the X A2 i Wherein A1 and A2 are preset fixed coefficient factors, and the specific values of the factors are determined by operators according to experience;
the fluctuation parameters BZ corresponding to different standard curves are processed i After the confirmation is completed, a variable wave curve is established, the pressure parameter is taken as a transverse coordinate axis, the fluctuation parameter is taken as a vertical coordinate axis, a designated point is selected in the coordinate system, and connection is carried out, when the intermittent pressure parameter appears, the connection is not carried out, so that the fluctuation parameter variable curve is obtained, and particularly, a plurality of intermittent line segments exist in the variable wave curve, and the standard curve eliminates parts, so that the partial pressure parameter cannot be selected, the continuous pressure parameter can be connected, the variable wave segments are confirmed, the variable wave segments are combined, and the corresponding variable wave curve is confirmed.
The interval locking unit is used for controlling the fluctuation parameter BZ in the variable wave curve i The most descending interval is confirmed, and the confirmed descending interval is transmitted to the optimal pressure parameter confirmation unit, wherein the specific mode for confirming is as follows:
confirming trend parameters of different points in the variable wave curve, and marking the fluctuation parameters of the different points as BZ t Marking the pressure references at different points as K t Wherein t represents different points, and t=1, 2, … …, n;
by Q j ＝(BZ j+1 -BZ j )÷(K j+1 -K j ) Obtaining trend parameters Q of a plurality of adjacent points j If the corresponding point positions are not adjacent, trend parameter confirmation work is not carried out, specifically, because the standard curve which is removed exists in the variable wave curve, a discontinuous part exists, and the end points of the discontinuous part are non-adjacent point positions, so that the corresponding trend parameters are not required to be confirmed;
from several trend parameters Q j Confirming the minimum trend parameter, confirming the endpoint value corresponding to the trend parameter, extracting the internal pressure parameter according to the endpoint value participated in calculation, merging the pressure parameter, confirming the corresponding descending interval, specifically, the smaller the trend parameter is, the faster the corresponding fluctuation parameter descends, the faster the fluctuation parameter descends, the smaller the corresponding thermal temperature curve change amplitude is, and therefore the higher the thermal stability is in the process of carrying out the fluorination reaction;
the optimal pressure parameter confirming unit confirms the corresponding pressure parameter according to the confirmed descending interval, confirms the original variable wave temperature curve from the pressure parameter, selects the maximum value of the variable wave temperature curve, selects a group of parameters with the maximum value from a plurality of maximum values as optimal parameters, marks the corresponding variable wave temperature curve as the optimal curve, marks the corresponding pressure parameter as the optimal parameter, and transmits the optimal parameter to the display terminal for confirmation by external personnel;
specifically, a plurality of pressure parameters exist in the falling interval, so that different wave-changing temperature curves are corresponding, and the working temperature can reach the highest effect and can reach the best effect on the premise of guaranteeing the thermal stability, so that the corresponding pressure point position is determined, wherein the determined pressure point position is the corresponding best point position, and the determined pressure parameter is the best parameter.
Example III
A thermal test method for fluorination reactions comprising the steps of:
firstly, heating a sample preferentially, confirming a thermal temperature curve, subsequently adjusting pressure parameters of a high-pressure test pool step by step, and recording corresponding temperature change waveforms;
step two, confirming a wave change interval according to the temperature value in the temperature change waveform preferentially, analyzing whether the wave change interval belongs to a preset interval, eliminating partial temperature change waveforms which do not belong to the preset interval, and confirming a standard curve;
thirdly, confirming a fluctuation parameter corresponding to the standard curve from the confirmed standard curve according to the variation parameters among the fluctuation points and the fluctuation times, and constructing a variable wave curve belonging to a plurality of fluctuation parameters according to the variation condition of the fluctuation parameter;
step four, confirming a group of intervals with the fastest fluctuation parameter falling from the wave-changing curve, and calibrating the confirmed intervals as falling intervals;
fifthly, confirming a plurality of pressure parameters corresponding to the descending interval from the confirmed descending interval, selecting the maximum value of the corresponding temperature curve from the plurality of pressure parameters, calibrating a group of temperature curves with the maximum selected temperature values as the optimal curve, and marking the corresponding pressure parameters as the optimal parameters.
Example IV
This embodiment includes all of the three embodiments described above in the specific implementation.
Some of the data in the above formulas are numerical calculated by removing their dimensionality, and the contents not described in detail in the present specification are all well known in the prior art.
The above embodiments are only for illustrating the technical method of the present invention and not for limiting the same, and it should be understood by those skilled in the art that the technical method of the present invention may be modified or substituted without departing from the spirit and scope of the technical method of the present invention.
Claims (4)
1. A thermal fluorination reaction test system comprising:
wen Bo curve confirmation end, which is used for controlling the temperature of the sample participating in the fluorination reaction, collecting the thermal temperature curve generated in the test process, and transmitting the collected thermal temperature curve into the test terminal;
the test terminal comprises a pressure parameter adjusting unit, a wave change curve confirming unit, a screening unit and a threshold unit, wherein the pressure parameter adjusting unit gradually increases the pressure parameters in the high-pressure test pool, the increased pressure parameters are Y1, a group of monitoring periods are stopped after the increase is finished, the next group of pressure parameters are increased, and a group of monitoring periods are stopped every time the next group of pressure parameters are increased, wherein Y1 is a preset value;
the wave-changing curve confirming unit confirms the thermal temperature curve changed at the end of each group of monitoring period and marks the thermal temperature curve as a wave-changing temperature curve, wherein different wave-changing temperature curves correspond to different pressure parameters;
the screening unit is used for carrying out preliminary screening on a plurality of variable wave temperature curves preferentially, analyzing whether a temperature change interval in the variable wave temperature curves belongs to a preset interval or not, screening part of variable wave temperature curves according to analysis results, reserving a corresponding waveform curve, calibrating the corresponding waveform curve as a standard curve, and transmitting the reserved standard curve into the wave parameter analysis terminal;
the wave parameter analysis terminal comprises a wave change curve construction unit, an interval locking unit and an optimal pressure parameter confirmation unit, wherein the wave change curve construction unit confirms the wave parameters of a plurality of standard curves, constructs a wave parameter change curve according to the confirmed wave parameters, and transmits the constructed wave parameter change curve into the interval locking unit;
the interval locking unit confirms a group of intervals with the fastest fluctuation parameter falling in the fluctuation parameter change curve and transmits the confirmed falling intervals to the optimal pressure parameter confirming unit;
the optimal pressure parameter confirming unit is used for selecting optimal pressure parameters according to the confirmed descending interval and transmitting the optimal pressure parameters to the display terminal for display;
the specific mode of the screening unit for screening the partial variable wave temperature curve is as follows:
selecting a maximum value and a minimum value from a plurality of variable wave temperature curves, and confirming a variable wave interval belonging to the variable wave temperature curves;
directly selecting a preset interval from the threshold unit, wherein the end values of the two ends of the preset interval are preset values, analyzing whether the strain wave interval belongs to the preset interval, if so, marking the corresponding wave temperature curve as a standard curve, and if not, not performing any treatment;
transmitting the marked standard curves into a wave parameter analysis terminal;
the wave-varying curve construction unit is used for constructing a wave-varying parameter variation curve in the following specific modes:
preferentially confirming the fluctuation points in the corresponding standard curve from the confirmed standard curve, wherein the trend trends of line segments at two ends of the fluctuation points are opposite, and marking a plurality of fluctuation points in the standard curve;
between adjacent fluctuation pointsConfirming the temperature fluctuation values, and marking the confirmed temperature fluctuation values as BD i-k Wherein i represents different standard curves, k represents different temperature fluctuation values, and a plurality of temperature fluctuation values BD are obtained i-k Performing mean processing to obtain a defined mean value, and marking as XD i ；
Recording the number of the fluctuation points in the standard curve, and marking the recorded number as GS i BZ is adopted i ＝XD i ×A1+GS i Obtaining the fluctuation parameter BZ belonging to the standard curve by the X A2 i Wherein A1 and A2 are both preset fixed coefficient factors;
the fluctuation parameters BZ corresponding to different standard curves are processed i And sequentially confirming, after the confirmation is finished, establishing a wave change curve, taking the pressure parameter as a transverse coordinate axis, taking the fluctuation parameter as a vertical coordinate axis, selecting a specified point in the coordinate system, and connecting the specified point, wherein when the intermittent pressure parameter occurs, the connection is not performed, and the fluctuation parameter change curve is obtained.
2. The fluorination reaction heat test system of claim 1, wherein the section locking unit confirms the descending section in the following manner:
confirming trend parameters of different points in the variable wave curve, and marking the fluctuation parameters of the different points as BZ t Marking the pressure parameters of different points as K t Wherein t represents different points, and t=1, 2, … …, n;
by Q j ＝(BZ j+1 -BZ j )÷(K j+1 -K j ) Obtaining trend parameters Q of a plurality of adjacent points j J is less than or equal to t, j is less than or equal to 1 and less than or equal to n-1, and if the corresponding points are not adjacent, no trend parameter confirmation work is performed;
from several trend parameters Q j And confirming the minimum trend parameter, confirming the endpoint value corresponding to the trend parameter, extracting the internal pressure parameter according to the endpoint value participating in calculation, merging the pressure parameters, and confirming the corresponding descending interval.
3. The system according to claim 1, wherein the optimal pressure parameter confirming unit confirms an original variable wave temperature curve from the pressure parameters, selects a maximum value of the variable wave temperature curve, selects a group of parameters with the maximum values from the plurality of maximum values as optimal parameters, marks the corresponding variable wave temperature curve as the optimal curve, marks the corresponding pressure parameter as the optimal parameter, and transmits the optimal parameter to the display terminal for display.
4. A thermal test method for fluorination, which operates based on the thermal test system of any one of claims 1 to 3, comprising the steps of:
firstly, heating a sample preferentially, confirming a thermal temperature curve, subsequently adjusting pressure parameters of a high-pressure test pool step by step, and recording corresponding temperature change waveforms;
step two, confirming a wave change interval according to the temperature value in the temperature change waveform preferentially, analyzing whether the wave change interval belongs to a preset interval, eliminating partial temperature change waveforms which do not belong to the preset interval, and confirming a standard curve;
thirdly, confirming a fluctuation parameter corresponding to the standard curve from the confirmed standard curve according to the variation parameters among the fluctuation points and the fluctuation times, and constructing a variable wave curve belonging to a plurality of fluctuation parameters according to the variation condition of the fluctuation parameter;
step four, confirming a group of intervals with the fastest fluctuation parameter falling from the wave-changing curve, and calibrating the confirmed intervals as falling intervals;
fifthly, confirming a plurality of pressure parameters corresponding to the descending interval from the confirmed descending interval, selecting the maximum value of the corresponding temperature curve from the plurality of pressure parameters, calibrating a group of temperature curves with the maximum selected temperature values as the optimal curve, and marking the corresponding pressure parameters as the optimal parameters.
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| US20040234446A1 (en) * | 2002-10-28 | 2004-11-25 | Platinum Research Organization Ltd. | Process for the production of metal fluoride materials |
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| WO2000000279A1 (en) * | 1998-06-17 | 2000-01-06 | Leiv Eiriksson Nyfotek As | Entropy optimal operation and design of one or several chemical reactors |
| CN108121387A (en) * | 2017-12-13 | 2018-06-05 | 江南大学 | A kind of automatic driving of exothermal reaction process and optimal control method |
| CN115826546A (en) * | 2023-02-20 | 2023-03-21 | 深圳普菲特信息科技股份有限公司 | Parameter adjusting method and system based on production line reaction kettle and readable storage medium |
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