CN116953339A

CN116953339A - Correlation analysis method and device for data analysis

Info

Publication number: CN116953339A
Application number: CN202310961507.2A
Authority: CN
Inventors: 潘聪; 黄金辉; 李彦慧; 王磊; 孙博
Original assignee: Zhuhai Jingshi Measurement And Control Technology Co ltd
Current assignee: Zhuhai Jingshi Measurement And Control Technology Co ltd
Priority date: 2023-08-01
Filing date: 2023-08-01
Publication date: 2023-10-27

Abstract

The invention relates to a correlation analysis method and a device for data analysis, wherein the method comprises the following steps: acquiring a plurality of test waveform data; interpreting a plurality of test waveform data, dividing each test waveform data into a plurality of segments; for each piece of test waveform data, judging whether the test waveform data is qualified or not in a segmented mode; based on the reference waveform data, calculating correlation coefficients between the test waveform data and the reference waveform data in a segmented manner for each test waveform data, and judging whether the test waveform data and the reference waveform data have correlation. The method realizes automatic analysis and processing of the acquired voltage waveforms, judges whether the waveforms are qualified or not, and carries out correlation judgment, thereby achieving the technical effect of judging the similarity of the test waveforms and the reference waveforms.

Description

Correlation analysis method and device for data analysis

Technical Field

The invention belongs to the technical field of testing, and particularly relates to a correlation analysis method and device for data analysis.

Background

In the field of testing, voltage sampling is often required to be carried out on a voltage point to be tested of a circuit board, and a degree of identity analysis is carried out on the voltage point to be tested and a reference waveform, so that whether the voltage point to be tested meets design requirements or not is judged, in actual sampling, various factors such as burrs, interference and the like exist, the acquired voltage waveform does not meet expectations, and the waveforms are often required to be compared in a sectional mode one by one, so that the processing process is tedious, time consuming and easy to cause errors.

Disclosure of Invention

The invention provides a correlation analysis method and a correlation analysis device for data analysis, which aim to at least solve one of the technical problems in the prior art. The correlation analysis method and the correlation analysis device for data analysis can realize automatic analysis and processing of the acquired voltage waveform, judge whether the waveform is qualified or not, and judge the correlation of the acquired voltage waveform and the reference waveform, so as to achieve the technical effect of judging the similarity of the test waveform and the reference waveform.

The technical scheme of the invention relates to a correlation analysis method and a device for data analysis, wherein the method comprises the following steps:

s100, acquiring a plurality of test waveform data;

s200, interpreting a plurality of test waveform data, and dividing each test waveform data into a plurality of segments;

s300, judging whether the test waveform data are qualified or not in a segmented mode for each test waveform data;

s400, based on the reference waveform data, calculating correlation coefficients between the test waveform data and the reference waveform data in a segmented mode for each piece of test waveform data, and judging whether the test waveform data and the reference waveform data have correlation.

Further, the step S200 includes:

s210, dividing each test waveform data into a stable segment and an unstable segment;

s220, respectively acquiring segmentation parameters of each stable segment and each unstable segment for the test waveform data;

s230, judging whether the test waveform data is qualified or not.

Further, the segmentation parameters include parameters of the stable segment and parameters of the unstable segment,

the parameters of the stable segment comprise stable segment starting time, stable segment duration, stable segment voltage starting value, stable segment voltage ending value, stable segment voltage average value and stable segment voltage value range;

the parameters of the unstable section comprise unstable section starting time, unstable section duration, unstable section voltage starting value, unstable section voltage ending value, unstable section voltage average value and unstable section voltage value range.

Further, the stable segment parameter further comprises a stable segment voltage maximum threshold value and a stable segment voltage minimum threshold value, and the stable segment voltage average value is between the stable segment voltage maximum threshold value and the stable segment voltage minimum threshold value;

the unstable segment parameter further includes a maximum threshold value of an unstable segment voltage start value, a minimum threshold value of an unstable segment voltage start value, a maximum threshold value of an unstable segment voltage end value, and a minimum threshold value of an unstable segment voltage end value.

Further, if the test waveform data is a stable segment in a certain segment, the average value of the voltage of the stable segment is in the range of the maximum threshold value of the voltage of the stable segment and the minimum threshold value of the voltage of the stable segment, and the test waveform data is qualified in the segment;

if the test waveform data is an unstable segment in a certain segment, the voltage starting value of the unstable segment is between the maximum threshold value of the voltage starting value of the unstable segment and the minimum threshold value of the voltage starting value of the unstable segment, and the voltage ending value of the unstable segment is between the maximum threshold value of the voltage ending value of the unstable segment and the minimum threshold value of the voltage ending value of the unstable segment, the test waveform data is qualified in the segment.

Further, the step S400 includes:

if the correlation coefficient of a certain section of the test waveform data and the reference waveform data is larger than or equal to a preset value, the test waveform data and the reference waveform data are correlated in the section;

if the correlation coefficient of a certain section of the test waveform data and the reference waveform data is smaller than a preset value, the test waveform data and the reference waveform data are uncorrelated in the section;

and if the correlation coefficient of each section of the test waveform data and the reference waveform data is larger than or equal to a preset value, the test waveform data and the reference waveform data are correlated.

Further, the preset value is greater than 0.8 and less than or equal to 1.

Further, the test waveform data is a square wave.

The invention also proposes a correlation analysis device for data analysis, for implementing a correlation analysis method for data analysis, the device comprising:

waveform acquisition means for testing waveform data;

the waveform processing device is used for segmenting the test waveform data, judging whether the test waveform data is qualified or not, and calculating the correlation coefficient of the test waveform data and the reference waveform data in a segmented manner, and is connected with the waveform acquisition device;

and the storage device is used for storing the test waveform data, the reference waveform data and the processing result of the waveform processing device and is connected with the waveform processing device.

The present invention also proposes a computer readable storage medium having stored thereon program instructions which, when executed by a processor, implement a correlation analysis method for data analysis.

According to some embodiments of the invention, the beneficial effects of the invention are as follows:

the correlation analysis method and the correlation analysis device for data analysis can realize automatic analysis and processing of the acquired voltage waveform, judge whether the waveform is qualified or not, and judge the correlation of the acquired voltage waveform and the reference waveform, so as to achieve the technical effect of judging the similarity of the test waveform and the reference waveform.

Further, additional aspects and advantages of the invention will be set forth in part in the description which follows and, in part, will be obvious from the description, or may be learned by practice of the invention.

Drawings

Fig. 1 is a flow chart of a correlation analysis method for data analysis according to the present invention.

Fig. 2 is a flow chart of a segment check of a correlation analysis method for data analysis according to the present invention.

Fig. 3 is a schematic diagram of a correlation analysis device for data analysis according to the present invention.

Fig. 4 is a schematic diagram of judgment test waveform data of a correlation analysis method for data analysis according to the present invention.

Fig. 5 is a schematic diagram of test waveform data after adding a minimum threshold and a maximum threshold according to a correlation analysis method for data analysis of the present invention.

FIG. 6 is a schematic diagram of a rising edge map of a correlation analysis method for data analysis according to the present invention.

Fig. 7 is a schematic diagram of a falling edge map of a correlation analysis method for data analysis according to the present invention.

Fig. 8 is a schematic diagram of step detection according to a correlation analysis method for data analysis of the present invention.

Detailed Description

For the purpose of making the objects, technical solutions and advantages of the embodiments of the present invention more apparent, the technical solutions of the embodiments of the present invention will be clearly and completely described below with reference to the accompanying drawings in the embodiments of the present invention, and it is apparent that the described embodiments are some embodiments of the present invention, but not all embodiments of the present invention. All other embodiments, which can be made by those skilled in the art based on the embodiments of the invention without making any inventive effort, are intended to be within the scope of the invention.

The conception, specific structure, and technical effects produced by the present invention will be clearly and completely described below with reference to the embodiments and the drawings to fully understand the objects, aspects, and effects of the present invention.

It should be noted that, unless otherwise specified, when a feature is referred to as being "fixed" or "connected" to another feature, it may be directly or indirectly fixed or connected to the other feature. As used herein, the singular forms "a", "an" and "the" are intended to include the plural forms as well, unless the context clearly indicates otherwise. Furthermore, unless defined otherwise, all technical and scientific terms used herein have the same meaning as commonly understood by one of ordinary skill in the art. The terminology used in the description presented herein is for the purpose of describing particular embodiments only and is not intended to be limiting of the invention. The term "and/or" as used herein includes any combination of one or more of the associated listed items.

It should be understood that although the terms first, second, third, etc. may be used in this disclosure to describe various elements, these elements should not be limited by these terms. These terms are only used to distinguish one element of the same type from another. For example, a first element could also be termed a second element, and, similarly, a second element could also be termed a first element, without departing from the scope of the present disclosure. The use of any and all examples, or exemplary language (e.g., "such as") provided herein, is intended merely to better illuminate embodiments of the invention and does not pose a limitation on the scope of the invention unless otherwise claimed. Further, as used herein, the industry term "pose" refers to the position and pose of an element relative to a spatial coordinate system.

Referring to fig. 1 to 8, a correlation analysis method and apparatus for data analysis, referring to fig. 1, the method includes the steps of:

s100, acquiring a plurality of test waveform data;

Specifically, in some embodiments, waveform data of a plurality of tested points are obtained from a tested circuit board through an oscilloscope or other equipment, wherein each test point corresponds to one or more reference voltage waveforms, the reference voltage waveforms are usually voltage waveform time sequences expected by the test point or waveforms used for comparison with other test points, the obtained plurality of test waveform data are firstly segmented, each segment of the test waveform data is checked to obtain a result of whether the waveform is qualified, correlation analysis is further performed on the qualified waveform and the reference waveform data, correlation calculation is performed on the test waveform data and the reference waveform data according to the segments to obtain a correlation coefficient, when the correlation coefficient is larger than a preset value, the test waveform data of the segment are correlated with the reference waveform data, and when all segments of the test waveform data are correlated with corresponding segments of the reference waveform data, the test waveform data are correlated with the reference waveform data.

Further, according to fig. 2, the step S200 includes:

s230, judging whether the test waveform data is qualified or not.

Specifically, referring to fig. 4, in one embodiment, the test waveform data is a blue waveform, the reference waveform data is a yellow waveform, the test waveform data and the reference waveform data are respectively segmented into a stable segment and an unstable segment, wherein the test waveform data includes a first stable segment, a first unstable segment, a second stable segment, a second unstable segment and a third stable segment, the first stable segment is a low level, the first unstable segment is a rising edge, the second stable segment is a high level, the second unstable segment is a falling edge, and the third stable segment is a low level.

Further, referring to fig. 5, the stable segment parameter further includes a stable segment voltage maximum threshold and a stable segment voltage minimum threshold, and the stable segment voltage average value is between the stable segment voltage maximum threshold and the stable segment voltage minimum threshold;

Specifically, referring to fig. 5, the blue portion is test waveform data, and the purple portion includes two curves respectively located above and below the test waveform data, and respectively representing a maximum threshold and a minimum threshold of a corresponding segment.

The test waveform data is qualified only if all segments are qualified.

In particular, segment inspection is performed on the collected plurality of test waveform data, and for a stable segment, in some embodiments, the average value of the voltage of the stable segment is within the range of the maximum threshold value of the voltage of the stable segment and the minimum threshold value of the voltage of the stable segment, and the test waveform data is qualified in the segment;

in other embodiments, the method further comprises checking the stable segment for the number and magnitude of the glitches, neither of which exceeds a preset glitch threshold, and the test waveform data is qualified at the segment.

For the unstable segment, in some embodiments, the unstable segment voltage onset value is between a maximum threshold value of the unstable segment voltage onset value and a minimum threshold value of the unstable segment voltage onset value, and the unstable segment voltage ending value is between the maximum threshold value of the unstable segment voltage ending value and the minimum threshold value of the unstable segment voltage ending value, the test waveform data is qualified at this segment.

In other embodiments, the method further comprises checking the number and the amplitude of burrs of the unstable section, wherein the number and the amplitude of burrs do not exceed preset burrs thresholds, and the test waveform data is qualified in the section.

In other embodiments, the method further comprises checking for the presence of a plateau including a rising edge and a falling edge, and qualifying the test waveform data at the plateau when the plateau duration is less than a predetermined time.

Further, the step S400 includes:

Specifically, in some embodiments, the correlation coefficient is a pearson correlation coefficient.

Further, the preset value is greater than 0.8 and less than or equal to 1.

Further, the test waveform data is a square wave.

waveform acquisition means for testing waveform data;

In addition, for step S210, the present invention also proposes a segmentation method for dividing the test waveform data into a stable segment and an unstable segment, including:

s211, filtering the test waveform data to obtain filtered test waveform data of each piece of waveform data;

s212, based on the filtered test waveform data, rising edge detection is carried out to obtain a rising starting point and a rising ending point of each rising edge;

s213, detecting a falling edge based on the filtered test waveform data to obtain a falling starting point and a falling ending point of each falling edge;

s214, mapping the rising start point and the rising end point of each rising edge and the falling start point and the falling end point of each falling edge to corresponding waveform data to obtain a mapping rising start point, a mapping rising end point, a mapping falling start point and a mapping falling end point of the test waveform data.

Specifically, in step S211, referring to fig. 6 and fig. 7, filtering is performed by using a moving average algorithm (convolve) to obtain a thumbnail of the whole curve, and the influence of the burr on the waveform data segmentation processing can be effectively reduced by using the data after moving average, and in fig. 6 and fig. 7, the broken line is the filtered data.

Further, referring to fig. 6, the step S212 includes:

s2121, marking a rising starting point and a rising ending point from zero time based on a maximum level and a minimum level, wherein the rising starting point is a first measured voltage value of which the measured voltage value is larger than the minimum level multiplied by a first threshold value, and the rising ending point is a last measured voltage value of which the measured voltage value is smaller than the maximum level multiplied by a second threshold value;

s2122, if all the measured voltage values from the rising start point to the rising end point monotonically rise, recording a line segment formed by all the measured voltage sampling points from the rising start point to the rising end point as a rising edge;

s2123, repeating the steps S2121 to S2122 until the current waveform data is traversed, and obtaining all rising edges.

Specifically, referring to fig. 6, the detection of the rising edge uses the data of the moving average as the detection source, and the detection of the rising edge is divided into a detection rising start point and a rising end point, where the rising start point starts from zero time according to the time sequence, scans and judges the data curve of the moving average in sequence, and when the magnitude of the first detected collection voltage value is equal to the first threshold value, the first threshold value is the rising start point, where the first threshold value is a fraction that is greater than 1 and is close to 1, such as 1.05, 1.1, 1.15, and so on.

Referring to fig. 6, point a is an upward rising start point.

After determining the rising start point, it is necessary to determine a rising end point, where the rising end point is the last measured voltage value where the measured voltage value is less than the maximum level multiplied by a second threshold value, where the second threshold value is a fraction of less than 1 and close to 1, such as 0.95, 0.9, 0.85, etc.

Referring to fig. 6, point b is the rising end point.

After detecting the point A and the point B, all data points between the point A and the point B need to be judged, and only all measured voltage values satisfying the rising start point (the point A) to the rising end point (the point B) can be monotonically increased, so that a line segment formed by all measured voltage sampling points from the rising start point to the rising end point can be recorded as a rising edge.

Referring to fig. 7, the step S213 includes:

s2131, marking a falling starting point and a falling ending point from zero time based on the maximum level and the minimum level, wherein the falling starting point is a first measured voltage value of which the measured voltage value is smaller than the maximum level multiplied by a third threshold value, and the falling ending point is a last measured voltage value of which the measured voltage value is larger than the minimum level multiplied by a fourth threshold value;

s2132, if all the measured voltage values from the start point to the end point monotonically decrease, recording a line segment formed by all the voltage measured points from the start point to the end point as a falling edge;

s2133, repeating steps S2131 to S2132 until the current waveform data is traversed, and obtaining all falling edges.

Specifically, referring to fig. 7, the detection of the falling edge uses the data of the moving average as the detection source, and the detection of the falling edge is divided into a detection falling start point and a falling end point, wherein the falling start point sequentially scans and judges the data curve of the moving average from zero time according to the time sequence, and when the magnitude of the first detected collected voltage value is smaller than the maximum level multiplied by a third threshold, the point is the rising start point, wherein the third threshold is a fraction smaller than 1 and close to 1, such as 0.95, 0.9, 0.85, and the like.

Referring to fig. 7, point c is a descent start point.

When determining the start point of the drop, it is necessary to determine the end point of the drop, where the end point of the drop is the last measured voltage value of the measured voltage value greater than the minimum level multiplied by a fourth threshold, where the fourth threshold is a fraction greater than 1 and close to 1, such as 1.05, 1.1, 1.15, etc.

The point 7,D is referred to as the rising end point.

After detecting the point C and the point D, judging all data points between the point C and the point D, and recording a line segment formed by all measurement voltage sampling points from the point C to the point D as a falling edge only if all measurement voltage values satisfying the point C from the point C to the point D are monotonically reduced.

Further, referring to fig. 6, the step S214 includes:

s2141, for a single rising edge, searching a first point which meets the equality of the ordinate of the waveform data and the ordinate of the rising start point from the abscissa of the rising end point to the abscissa of the rising start point as a mapping rising start point;

s2142, for a single rising edge, searching a first point which meets the equality of the ordinate of the waveform data and the ordinate of the rising termination point from the abscissa of the rising start point to the abscissa of the rising termination point as a mapped rising termination point;

s2143, repeating the steps S2141 to S2142 until the current waveform data is traversed, and the mapping rising start points and mapping rising end points corresponding to all rising edges are obtained.

Further, referring to fig. 7, the step S214 further includes:

s2144, for a single falling edge, searching a first point which meets the equality of the ordinate of the waveform data and the ordinate of the falling starting point from the abscissa of the falling ending point to the abscissa of the falling starting point as a mapping falling starting point;

s2145, for a single falling edge, searching a first point which meets the equality of the ordinate of the waveform data and the ordinate of the falling termination point from the abscissa of the falling start point to the abscissa of the falling termination point as a mapping falling termination point;

s2146, repeating the steps S2144 to S2145 until the current waveform data is traversed, and the mapping falling start points and the mapping falling end points corresponding to all falling edges are obtained.

Specifically, referring to fig. 6 and 7, the rising start point (point a), the rising end point (point B), the falling start point (point C) and the falling end point (point D) need to be mapped to real waveform data, and taking the rising start point (point a) as an example, the X coordinate of the rising start point (point a) may directly fall on a level and cannot be used directly, and the Y coordinate of the rising start point (point a) needs to be used, and the first point smaller than the Y value of the rising start point (point a) is found from right to left through a section of the X to x+ window width (the window width is a value used when a sliding average is used), and the point a' at this time may fall on a rising edge of the real waveform data.

Specifically, it is noted that, in the timing chart, the start point needs to be from right to left and the end point needs to be from left to right, in order to restore the rising start point (point a), the rising end point (point B), the falling start point (point C), and the falling end point (point D) to the actual waveform data.

In some embodiments, after the coordinates of the rising edge and the falling edge of the real waveform data have been found, an error occurs, and the actual rising edge starting point needs to be adjusted, and the accurate search is implemented by using the ripple (ripple) calculated in step S220, taking a 'as an example, and taking the minimum level+the ripple value as the target value, and searching the first point less than or equal to the target value from right to left from a', where the point is the starting point of the rising edge.

Referring to fig. 8, in some embodiments, a step determination needs to be performed, during the rising or falling process, some parts do not directly rise from the lowest voltage to the maximum voltage or the maximum voltage drops to the minimum voltage, and one or more steps appear, at this time, the complete falling/rising edge curve data needs to be rounded up to obtain new data, the new data is used to perform peak value searching, if the peak value is detected, it is indicated that a step may exist, and further calculation of the step length and the total length proportion of the current rising or falling is needed to determine whether the step exists.

It should be appreciated that the method steps in embodiments of the present invention may be implemented or carried out by computer hardware, a combination of hardware and software, or by computer instructions stored in non-transitory computer-readable memory. The method may use standard programming techniques. Each program may be implemented in a high level procedural or object oriented programming language to communicate with a computer system. However, the program(s) can be implemented in assembly or machine language, if desired. In any case, the language may be a compiled or interpreted language. Furthermore, the program can be run on a programmed application specific integrated circuit for this purpose.

Furthermore, the operations of the processes described herein may be performed in any suitable order unless otherwise indicated herein or otherwise clearly contradicted by context. The processes (or variations and/or combinations thereof) described herein may be performed under control of one or more computer systems configured with executable instructions, and may be implemented as code (e.g., executable instructions, one or more computer programs, or one or more applications), by hardware, or combinations thereof, collectively executing on one or more processors. The computer program includes a plurality of instructions executable by one or more processors.

Further, the method may be implemented in any type of computing platform operatively connected to a suitable computing platform, including, but not limited to, a personal computer, mini-computer, mainframe, workstation, network or distributed computing environment, separate or integrated computer platform, or in communication with a charged particle tool or other imaging device, and so forth. Aspects of the invention may be implemented in machine-readable code stored on a non-transitory storage medium or device, whether removable or integrated into a computing platform, such as a hard disk, optical read and/or write storage medium, RAM, ROM, etc., such that it is readable by a programmable computer, which when read by a computer, is operable to configure and operate the computer to perform the processes described herein. Further, the machine readable code, or portions thereof, may be transmitted over a wired or wireless network. When such media includes instructions or programs that, in conjunction with a microprocessor or other data processor, implement the steps described above, the invention described herein includes these and other different types of non-transitory computer-readable storage media. The invention may also include the computer itself when programmed according to the methods and techniques of the present invention.

The computer program can be applied to the input data to perform the functions described herein, thereby converting the input data to generate output data that is stored to the non-volatile memory. The output information may also be applied to one or more output devices such as a display. In a preferred embodiment of the invention, the transformed data represents physical and tangible objects, including specific visual depictions of physical and tangible objects produced on a display.

The present invention is not limited to the above embodiments, but can be modified, equivalent, improved, etc. by the same means to achieve the technical effects of the present invention, which are included in the spirit and principle of the present invention. Various modifications and variations are possible in the technical solution and/or in the embodiments within the scope of the invention.

Claims

1. A method of data processing, the method comprising the steps of:

s100, acquiring a plurality of test waveform data;

2. A data processing method according to claim 1, wherein,

the step S200 includes:

s230, judging whether the test waveform data is qualified or not.

3. A data processing method according to claim 2, wherein,

the segmentation parameters include parameters of the stable segment and parameters of the non-stable segment,

4. A data processing method according to claim 3, wherein,

the stable segment parameters further comprise a stable segment voltage maximum threshold value and a stable segment voltage minimum threshold value, and the stable segment voltage average value is between the stable segment voltage maximum threshold value and the stable segment voltage minimum threshold value;

5. The method for data processing according to claim 4, wherein,

if the test waveform data is a stable segment in a certain segment, the average value of the voltage of the stable segment is in the range of the maximum threshold value of the voltage of the stable segment and the minimum threshold value of the voltage of the stable segment, and the test waveform data is qualified in the segment;

6. A data processing method according to claim 1, wherein,

the step S400 includes:

7. The method for data processing according to claim 6, wherein,

the preset value is more than 0.8 and less than or equal to 1.

8. A data processing method according to claim 1, wherein,

the test waveform data is a square wave.

9. Data processing apparatus for implementing a data processing method according to any one of claims 1 to 8, characterized in that the data processing apparatus comprises:

waveform acquisition means for testing waveform data;

10. A computer readable storage medium, having stored thereon program instructions which, when executed by a processor, implement the method of any of claims 1 to 8.