CN116932306A

CN116932306A - Electronic equipment testing device, method and testing equipment

Info

Publication number: CN116932306A
Application number: CN202210328430.0A
Authority: CN
Inventors: 张可毅; 任强; 康意恒; 回海波
Original assignee: Datang Mobile Communications Equipment Co Ltd
Current assignee: Datang Mobile Communications Equipment Co Ltd
Priority date: 2022-03-30
Filing date: 2022-03-30
Publication date: 2023-10-24

Abstract

The embodiment of the invention provides an electronic equipment testing device, an electronic equipment testing method and electronic equipment testing equipment, and relates to the technical field of testing, wherein the device comprises: service layer and unit layer, the service layer includes: the test code module, the unit layer includes: the system comprises a scene design module, an equipment management module and a service selection module; a test code module for managing and storing codes of a plurality of device test interfaces and codes of a plurality of test scripts; the scene design module is used for configuring parameters of the equipment control interface and calling the configured equipment control interface to control the electronic equipment connected with the test equipment; the device management module is used for controlling the starting and closing of each device control interface; the service selection module is used for configuring parameters of the test script, and calling the configured test script to test the service of the electronic equipment connected with the test equipment. The embodiment of the invention can improve the efficiency of testing the electronic equipment.

Description

Electronic equipment testing device, method and testing equipment

Technical Field

The present invention relates to the field of testing technologies, and in particular, to an electronic device testing apparatus, an electronic device testing method, and an electronic device testing device.

Background

After the software or hardware version of the electronic device is iteratively updated, a test maintainer can test various services of the electronic device, so that whether faults exist in the software or hardware of the electronic device can be determined. If the fault exists, the software or hardware of the electronic equipment can be further adjusted so as to ensure that the electronic equipment can normally operate.

If more electronic devices need to be tested, test maintenance personnel need to test each service of each electronic device in sequence. The workload of test maintenance personnel is large, resulting in lower efficiency of electronic equipment testing.

Disclosure of Invention

The embodiment of the invention aims to provide an electronic equipment testing device, an electronic equipment testing method and electronic equipment testing equipment, so that the efficiency of electronic equipment testing is improved. The specific technical scheme is as follows:

in a first aspect, an embodiment of the present invention provides an electronic device testing apparatus, applied to a testing device, where the apparatus includes: service layer and unit layer, the service layer includes: a test code module, the unit layer comprising: the system comprises a scene design module, an equipment management module and a service selection module;

the test code module is used for managing and storing codes of a plurality of device test interfaces and codes of a plurality of test scripts, wherein each device control interface is used for controlling one electronic device connected with the test device, and each test script is used for: testing a service of the electronic device connected with the testing device;

The scene design module is used for configuring parameters of the equipment control interface and calling the configured equipment control interface to control the electronic equipment connected with the test equipment;

the device management module is used for controlling the starting and closing of each device control interface;

the service selection module is used for configuring parameters of the test script, and calling the configured test script to test the service of the electronic equipment connected with the test equipment.

In a second aspect, an embodiment of the present invention provides a method for testing an electronic device, where the method is applied to a testing device, and the testing device includes: a device control interface for controlling an electronic device connected to the test device, and test scripts, each test script for: testing a service of an electronic device connected to the test device, the method comprising:

acquiring a target parameter instruction, determining a target environment parameter based on the target parameter instruction, and configuring a target control interface in a device control interface by adopting the target environment parameter, wherein the target environment parameter comprises: the target control interface is used for controlling the equipment to be tested connected with the test equipment;

Acquiring script selection instructions, and extracting target test scripts from each test script based on the script selection instructions;

acquiring a script parameter determining instruction, determining a target script parameter based on the script parameter determining instruction, and configuring the target test script by adopting the target script parameter;

running the configured target test script, and testing the equipment to be tested through the configured target control interface to obtain equipment running data of the equipment to be tested in the test process;

and analyzing the equipment operation data to generate a test result of the equipment to be tested.

In a third aspect, an embodiment of the present invention provides a test apparatus, including a memory, a transceiver, and a processor:

a memory for storing a computer program comprising a device control interface for controlling an electronic device connected to the test device and test scripts, each test script being for: testing a service of the electronic device connected with the testing device; a transceiver for transceiving data under control of the processor; a processor for reading the computer program in the memory and performing the following operations:

In a fourth aspect, embodiments of the present invention also provide a computer program product comprising instructions which, when run on a computer, cause the computer to perform the method of any of the second aspects described above.

The embodiment of the invention has the beneficial effects that:

the embodiment of the invention provides an electronic equipment testing device, which is applied to testing equipment, and comprises: service layer and unit layer, above-mentioned service layer includes: and a test code module, wherein the unit layer comprises: the system comprises a scene design module, an equipment management module and a service selection module; the test code module is used for managing and storing codes of a plurality of equipment test interfaces and codes of a plurality of test scripts; the scene design module is used for configuring parameters of the equipment control interface and calling the configured equipment control interface to control the electronic equipment connected with the test equipment; the device management module is used for controlling the starting and closing of each device control interface; the service selection module is used for configuring parameters of the test script, and calling the configured test script to test the service of the electronic equipment connected with the test equipment.

As can be seen from the above, in this embodiment, the code of each device control interface and the code of each test script are already stored in the test code module in the service layer, and different device control interfaces can control different electronic devices, and different test scripts can control one service in the electronic devices. Therefore, the scene design module can call different equipment test interfaces to directly control different electronic equipment, and call different test scripts to directly test the service of the electronic equipment. Therefore, different electronic devices can be tested by the electronic device testing device. The manual workload required in the testing process of the electronic equipment is less, so that the testing efficiency of the electronic equipment can be improved.

Drawings

In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the drawings used in the embodiments or the description of the prior art will be briefly described, and it is obvious that the drawings in the following description are only some embodiments of the present invention, and other drawings may be obtained according to these drawings for a person having ordinary skill in the art.

Fig. 1 is a schematic structural diagram of a first electronic device testing apparatus according to an embodiment of the present invention;

FIG. 2 is a schematic diagram of a device connection relationship according to an embodiment of the present invention;

fig. 3 is a schematic structural diagram of a second electronic device testing apparatus according to an embodiment of the present invention;

fig. 4 is a schematic structural diagram of a third electronic device testing apparatus according to an embodiment of the present invention;

fig. 5 is a schematic structural diagram of a fourth electronic device testing apparatus according to an embodiment of the present invention;

fig. 6 is a schematic structural diagram of a fifth electronic device testing apparatus according to an embodiment of the present invention;

fig. 7 is a schematic structural diagram of a sixth electronic device testing apparatus according to an embodiment of the present invention;

fig. 8 is a flow chart of a first electronic device testing method according to an embodiment of the present invention;

Fig. 9 is a flow chart of a second method for testing electronic equipment according to an embodiment of the present application;

fig. 10 is a flowchart of a third electronic device testing method according to an embodiment of the present application;

fig. 11 is a schematic structural diagram of a test apparatus according to an embodiment of the present application.

Detailed Description

The following description of the embodiments of the present application will be made clearly and completely with reference to the accompanying drawings, in which it is apparent that the embodiments described are only some embodiments of the present application, but not all embodiments. Based on the embodiments of the present application, all other embodiments obtained by the person skilled in the art based on the present application are included in the scope of protection of the present application.

In the embodiment of the application, the term "and/or" describes the association relation of the association objects, which means that three relations can exist, for example, a and/or B can be expressed as follows: a exists alone, A and B exist together, and B exists alone. The character "/" generally indicates that the context-dependent object is an "or" relationship.

The term "plurality" in embodiments of the present application means two or more, and other adjectives are similar.

The following description of the embodiments of the present invention will be made clearly and completely with reference to the accompanying drawings, in which it is apparent that the embodiments described are only some embodiments of the present invention, but not all embodiments. Based on the embodiments of the present invention, all other embodiments obtained by a person of ordinary skill in the art based on the embodiments of the present invention are included in the scope of protection of the present invention.

In order to solve the above problems, the embodiments of the present invention provide an electronic device testing apparatus, an electronic device testing method, and an electronic device testing apparatus, which have low efficiency in testing electronic devices in the prior art.

The embodiment of the invention provides an electronic equipment testing device, which is applied to testing equipment, and comprises: service layer and unit layer, above-mentioned service layer includes: and a test code module, wherein the unit layer comprises: the system comprises a scene design module, an equipment management module and a service selection module;

the test code module is configured to manage and store codes of a plurality of device test interfaces and codes of a plurality of test scripts, where each device control interface is configured to control an electronic device connected to the test device, and each test script is configured to: testing a service of the electronic equipment connected with the testing equipment;

Referring to fig. 1, a schematic structural diagram of a first electronic device testing apparatus according to an embodiment of the present invention is provided.

Specifically, the electronic device testing apparatus is applied to a testing device, and the apparatus includes: service layer and unit layer, above-mentioned unit layer includes: the scene design module 101, the device management module 102 and the service selection module 103, where the service layer includes: the code module 104 is tested.

The test device may be any device having data storage capability, data transmission capability and data processing capability, such as a computer or a server.

The test code module 104 is configured to manage and store codes of a plurality of device test interfaces and codes of a plurality of test scripts.

Wherein each device control interface is used for controlling an electronic device connected with the test device, and each test script is used for: and testing one service of the electronic equipment connected with the testing equipment.

Specifically, the test code module 104 may include code for controlling each device control interface of each electronic device that may be connected to the test device. Each device control interface can be integrated into a unified interface by adopting a modularized design, so that the device control interfaces can be managed and used uniformly. The electronic device connected with the test device may be a device to be tested, or may be an auxiliary device for adjusting a test environment where the device to be tested is located, for example, the device to be tested may be a terminal, a base station, a server, etc., the auxiliary device may be a test instrument, etc., for example, the test instrument may be a spectrometer for measuring power of the device to be tested, and the test instrument may be an attenuator, a radio frequency matrix, etc. for adjusting the device to be tested.

The test equipment and the electronic equipment connected with the test equipment jointly form a test environment for testing the equipment to be tested, different test environments can be formed by adjusting the electronic equipment connected with the test equipment, and the electronic equipment connected with the test equipment in the different test environments can be the same or different.

In addition, testing of a service of an electronic device may be referred to as a test line. The test scripts are respectively realized by different codes, so that the test scripts for testing the same service can be divided into different versions in order to adapt to the test requirements of different versions of the equipment to be tested, and the test scripts of different versions are respectively used for testing the electronic equipment of different versions. In order to facilitate the management of test scripts of different versions, each test script can be stored in an open-source version control tool Git database, and the Git database is used for carrying out version management and can respectively store the test scripts of different versions in a distributed storage mode.

And if the configuration of the test script needs to be updated, the configuration of the test script is updated in a data updating mode, namely, only the updated configuration is used for replacing the updated part in the original configuration, or the invalid part is deleted, and the original configuration is not directly covered by the updated configuration.

For example, test scripts may be used to test traffic such as BO (Buffer Occupation, buffer occupancy), FTP (File Transfer Protocol ), UDP (User Datagram Protocol, user datagram protocol), ping (Packet Internet Groper, internet packet explorer), and the like.

In addition, the test modes adopted by different test scripts can be different, for example, ping test can be realized by using test modes such as adb (Android Debug Bridge, android system debug bridge) or cmd (Command, windows system Command prompt).

The scene design module 101 is configured to configure parameters of a device control interface, and call the configured device control interface to control an electronic device connected to the test device.

Specifically, after the test device is connected to a different electronic device, the scene design module 101 may configure parameters of a device control interface for controlling the electronic device, so as to control the connected electronic device through the device control interface and communicate with the connected electronic device.

Wherein configuring parameters of the device control interface may include: the device information of the electronic device connected with the test device includes an IP address, a port number, a channel number, and the like of the device to be tested. The parameters may be parameters input by a user into the test device, and in addition, device information of different electronic devices may be stored in the test device, and the user may input a first parameter selection instruction to select parameters for configuring the device control interface.

Referring to fig. 2, a schematic diagram of a device connection relationship is provided for an embodiment of the present invention, and it can be seen that the test device can communicate with the connected electronic device 1, electronic device 2 to electronic device n through the above device control interface based on TCP/IP (Transmission Control Protocol/Internet Protocol ) and through a TCP Server (Transmission Control Protocol Server, transmission control protocol service) application.

In addition, the part of functions of the tested device to be tested need to interact with other auxiliary devices to be realized, so in the process of testing the device to be tested, the test device needs to be connected with both the device to be tested and the auxiliary devices, and in the process of testing, the scene design module 101 needs to configure parameters of device control interfaces for controlling the device to be tested and the auxiliary devices so as to control the device to be tested and the auxiliary devices. For example, if the device to be tested is a terminal, and if the rate of data transmission between the terminal and the base station needs to be tested, the base station is an auxiliary device, and the test device needs to be connected with the base station, so that the base station is controlled in the test process.

The device management module 102 is configured to control the on and off of each device control interface.

Specifically, the device management module 102 may control to enable a device control interface corresponding to the electronic device to which the test device is connected and to disable other interfaces.

In addition, if the test environment needs to be adjusted during the process of testing the device to be tested, but the test device is not connected with the auxiliary device for adjusting the test environment, the device management module 102 in the embodiment of the invention may close the device control interface for controlling the auxiliary device, so that the user may manually adjust the test environment without using the auxiliary device to simulate the function of the auxiliary device during the test.

The service selection module 103 is configured to configure parameters of a test script, and call the configured test script to test a service of an electronic device connected to the test device.

The service selection module 103 may select a test script based on a service to be tested, and if the test script is stored in the Git database, the service selection module 103 may search and obtain the required test script from the Git database by using a bat (Batch script) manner.

In addition, the parameters for configuring the test script may include a preset threshold, a test rate, a test duration, and the like for determining a test result in the test process. The above parameters may be manually entered by a user. In addition, parameters for configuring different test scripts can be stored in the test equipment, and the user can input a second parameter selection instruction to select parameters for configuring the test scripts.

In one embodiment of the invention, in the process of testing the business of the electronic equipment, the test is required to be completed according to the test cases, and the test cases can be manually input by a user, namely, the user needs to manually input the test cases when the test equipment performs the test every time, and the method is suitable for the test with fewer test times and stronger randomness of the test cases.

In another embodiment of the present invention, in the process of testing the service of the electronic device, the service selection module 103 may obtain device operation data of the electronic device, where the services tested by different target test scripts are different, and the device operation data obtained in the operation process is different. For example, if the target test script is used for testing the power consumption of the processor in the terminal, the obtained device operation data includes the current, the voltage, and the like of the processor in the operation process, and if the target test script is used for testing the data transmission rate of the base station, the obtained device operation data includes the data amount of the data transmitted by the base station in the operation process, and the like.

After acquiring the device operation data, the service selection module 103 may analyze the device operation data to generate a test result of the service of the electronic device.

Specifically, when testing different services of different electronic devices, the manner of analyzing the device operation data is different, for example, if the test script is used for testing the power consumption of the processor in the terminal, if the obtained device operation data includes the current and the voltage of the processor in the operation process, the product of the current and the voltage can be calculated as the power consumption. If the test script is used for testing the data sending rate of the base station, under the condition that the acquired equipment operation data comprises the data quantity of the data sent by the base station in the operation process, the quotient between the data quantity and the test duration can be calculated and used as the data sending rate.

Finally, the test result may be obtained by comparing with a preset threshold in the parameters for configuring the test script. For example, the power consumption of the processor may be calculated and then compared with a preset threshold power consumption, and if the calculated power consumption is higher than the preset threshold power consumption, it may be determined that the processor is currently in a high power consumption state.

After the test result is obtained, statistical processing can be performed on the test result. The test results may be statistically analyzed based on robotframes (machine frames), and test reports of the business of the electronic device may be generated.

Referring to fig. 3, a schematic structural diagram of a second electronic device testing apparatus according to an embodiment of the present invention, and compared with the embodiment shown in fig. 1, the service layer further includes a testing task module 105.

The test task module 105 is configured to manage and store test cases.

The test case is used for: and testing the electronic equipment connected with the testing equipment.

Specifically, the test cases can be classified and stored according to the tested electronic equipment and the tested service, the test cases for testing the same service of the same electronic equipment belong to the same class, the test cases of the same class can form a test case set, and the test equipment can respectively store different test case sets.

The service selection module 103 is specifically configured to extract a test case from the test task module, configure parameters of a test script, and call the configured test script to test a service of an electronic device connected to the test device by using the extracted test case.

Because the test cases are stored in the test task module 105, the service selection module 103 may directly call the test cases from the test task module 105 to complete the test of the electronic device. The test cases invoked by the service selection module 103 may be user-selected test cases.

Therefore, the test cases for testing the electronic equipment are stored in the test task module, the service selection module can directly call the test cases stored in the test task module for testing, and a user does not need to manually input the test cases, so that the test process of the electronic equipment is simplified.

Referring to fig. 4, a schematic structural diagram of a third electronic device testing apparatus according to an embodiment of the present invention, compared to the embodiment shown in fig. 1, the apparatus further includes a UI (User Interface) layer, where the UI layer includes a parameter configuration module 106 and/or a code execution module 107. Specifically, in fig. 4, the UI layer includes two modules, i.e., the parameter configuration module 106 and the code execution module 107, but in embodiments of the present invention, only any one of the parameter configuration module 106 and the code execution module 107 may be actually included.

The parameter configuration module 106 is configured to display the first interface and/or the second interface on a display of the test device.

Wherein, the first interface is: the interface is used for configuring parameters of the equipment control interface, and the second interface is: and the interface is used for configuring the parameters of the test script.

In one embodiment of the present invention, the first interface may include a component for inputting parameters of the device control interface, so that a user may input parameters in the component, so that the scene design module 101 may configure the device control interface based on the parameters input by the user.

In addition, if the parameters for configuring the device control interface are stored in the test device, the parameter configuration module 106 may display the parameters stored in the test device in the first interface, and the first interface may further include a component for selecting the parameters of the device control interface, so that the user may select the parameters stored in the test device through the component, so that the scene design module 101 may configure the device control interface based on the parameters selected by the user.

The parameter configuration module 106 may display the parameters of the device control interface through the first interface, or may display part of information included in the parameters of the device control interface, such as names, identifiers, etc. of the parameters, so as to be selected by the user.

In another embodiment of the present invention, a component for inputting parameters of the test script may be included in the second interface, so that a user may input parameters in the component, so that the service selection module 103 may configure the test script based on the parameters input by the user.

In addition, if the parameters for configuring the test script are stored in the test device, the parameter configuration module 106 may display the parameters stored in the test device in a second interface, and the second interface may further include a component for selecting the parameters of the test script, so that the user may select the parameters stored in the test device through the component, so that the service selection module 103 may configure the test script based on the parameters selected by the user.

The parameter configuration module 106 may display the parameters of the test script through the second interface, or may display part of information included in the parameters of the test script, such as names, identifiers, etc. of the parameters, so as to allow the user to select.

The code execution module 107 is configured to display an interface for selecting a test script on a display of the test device.

Specifically, the code execution module 107 may display the information of the test script recorded in the test code module 104 and the components for selecting the test script on the display. The code execution module 107 may display information of each test script on the display, where the information may include a name, a number, an electronic device for testing, a service for testing, etc. of the test script, so that a user may select a target test script from among the test scripts displayed on the display.

In addition, if the electronic device testing apparatus includes a test task module 105 for storing test cases. The code execution module 107 may further display, on a display, case information of each test case or case set information of a test case set, including a name, a number, test equipment for testing, a service for testing, and the like of the test case or the test case set, so that a user may select the test case.

The code execution module 107 may display other information such as the test progress of the electronic device.

From the above, the electronic device testing apparatus further includes a UI layer, where a parameter configuration module may be included in the UI layer, so that a user may select parameters of the device control interface and/or parameters of the test script through information displayed on the display. In addition, the UI layer may further include a code execution module, so that the user may select a test script through information displayed on the display. Therefore, the electronic equipment testing device provided by the embodiment of the invention can simplify the operation mode of the user, and is convenient for the user to test the electronic equipment by using the electronic equipment testing device.

Referring to fig. 5, a schematic structural diagram of a fourth electronic device testing apparatus according to an embodiment of the present invention, and compared with the embodiment shown in fig. 1, the service layer further includes a test data module 108.

The test data module 108 is configured to: and acquiring and storing equipment operation data generated in the testing process of the electronic equipment connected with the testing equipment.

Specifically, the test data module 108 may obtain the device operation data from the service selection module 103 and write the device operation data into an operation data file. In addition, the test data module 108 may store the operation data files in a classified manner, for example, the operation data files may be classified according to the electronic devices corresponding to the recorded operation data of the device, where the operation data files corresponding to the same electronic device belong to the same class; the operation data files can be classified according to the service corresponding to the recorded equipment operation data, and the operation data files with the same corresponding service belong to the same class; the operation data files can be classified according to the version of the electronic equipment corresponding to the recorded equipment operation data, and the operation data files with the same corresponding version belong to the same class; the running data files can be classified according to the generating time of the running data files, and the running data files with the same generating time period belong to the same class.

In addition, the test data module 108 described above may also be used to: and acquiring and storing log data generated by the test equipment in the process of testing.

Specifically, the test data module 108 may store the log data in a log file, where the log file may have an xml format, and the log file may include different levels such as debug (debug), info (message), warning (alarm), error (error), critical (disaster), and the like, and the level of the log file gradually increases from the debug level to the critical level in the above order. The higher the level is, the higher the fault level of the test script represented by the log data recorded in the log file is in the running process.

In addition, the test equipment can also store the log files in a classified mode. For example, the log files may be classified according to the version of the test script corresponding to the recorded log data, where the corresponding log files with the same version belong to the same class; the electronic equipment tested by the test script corresponding to the recorded log data can be classified, and the same log files of the corresponding electronic equipment belong to the same class; the log files can be classified according to the service tested by the test script corresponding to the recorded log data, and the log files with the same corresponding service belong to the same class; the log files can be classified according to the generation time of the log files, and the log files with the generation time belonging to the same time period belong to the same class; the log files may be classified according to the level of the log files, and the log files belonging to the same level belong to the same class.

In the above, after the test of the electronic device is completed, the test data module may further store the operation data file and the log file to record the device operation data and the log data generated in the test process of the electronic device, so as to analyze and count the device operation data and the log data, thereby managing and adjusting the test process of the electronic device.

Referring to fig. 6, a schematic structural diagram of a fifth electronic device testing apparatus according to an embodiment of the present invention, compared with the embodiment shown in fig. 5, the apparatus further includes a UI layer, where the UI layer includes a data management module 109, and the data management module 109 is configured to:

the device operation data and/or log data stored by the test data module 108 are displayed on a display of the test device.

Specifically, the electronic device testing apparatus may display, through the data management module 109, the serial numbers of each operation data file stored in the test data module 108, the storage paths of the operation data files, the electronic devices corresponding to the device operation data recorded in the operation data files, the version numbers of the electronic devices, the tested services corresponding to the operation data recorded in the operation data files, and so on, so as to be checked by the user. The user may select and view device operational data stored in the operational data file.

In addition, the electronic device testing apparatus may display, through the data management module 109, the serial numbers of the log files, the storage paths of the log files, the electronic devices corresponding to the log files, the version numbers of the electronic devices, the version numbers of the test scripts corresponding to the log files, the services corresponding to the log files, the levels of the log files, and so on stored in the test data module 108, so as to be checked by the user. The user may select the displayed log file according to the level of the log file, and the user may also select and view log data stored in the log file.

Furthermore, the data management module 109 may also send a log mail including the log file to a management device that manages the test device, so as to report the log file to the management device.

From the above, the data management module may display the operation data file and/or the log file, so that the user may view the operation data recorded in the operation data file and/or the log data recorded in the log file, so that the user may view the data to determine the test result of the electronic device and the test condition of the test process.

Referring to fig. 7, a schematic structural diagram of a sixth electronic device testing apparatus according to an embodiment of the present invention includes each module included in fig. 1 and fig. 3 to fig. 6, so that functions of the electronic device testing apparatus shown in the foregoing embodiments can be implemented.

Corresponding to the electronic equipment testing device, the embodiment of the invention also provides an electronic equipment testing method.

Referring to fig. 8, a flowchart of a first electronic device testing method is provided in an embodiment of the present invention. The test device is applied to test equipment, and the test equipment comprises: a device control interface for controlling an electronic device connected to the test device, and test scripts, each test script being configured to: testing a service of an electronic device connected to the testing device, the method comprises the following steps S801-S805.

S801: and acquiring a target parameter instruction, determining a target environment parameter based on the target parameter instruction, and configuring a target control interface in the equipment control interface by adopting the target environment parameter.

Wherein the target environmental parameters include: and the target control interface is used for controlling the equipment to be tested connected with the testing equipment.

In one embodiment of the present invention, the target parameter command may be a command including a target environmental parameter input by a user, so that the test device may determine the target environmental parameter based on the target parameter command. In addition, the user may input an instruction to select an interface from among the device control interfaces as the target control interface.

In addition, the test device may further include a display, and different environmental parameters are stored in the test device, where the different environmental parameters include device information of different electronic devices, that is, device information of each electronic device that may be connected to the test device is recorded in the test device itself for a user to select. The above-described determination of the target environmental parameter based on the target parameter instruction may be achieved by the following steps a-B.

Step A: and displaying the stored environmental parameters through the display.

In particular, the test apparatus may display only the environmental parameters for configuring the target control interface on the above-described display, so that the user selects the target environmental parameters for configuring the target control interface from the displayed environmental parameters. All of the environmental parameters stored by the test equipment may also be displayed for selection by the user.

And (B) step (B): and acquiring a target parameter instruction, and extracting the environment parameter indicated by the target parameter instruction from the stored environment parameters based on the target parameter instruction to serve as a target environment parameter.

The target parameter instruction is generated based on the environmental parameters displayed by the display.

Specifically, after displaying the environmental parameters on the display, the user may indicate a target environmental parameter selected from the displayed environmental parameters by inputting a target parameter instruction.

Therefore, the user can directly select the target environment parameter from the environment parameters because the environment parameters are stored in the test equipment, and the user does not need to manually input the target environment parameter, so that the user can complete the configuration process of the target control interface more simply.

S802: and acquiring script selection instructions, and extracting target test scripts from the test scripts based on the script selection instructions.

Specifically, the user may input a script selection instruction, and after receiving the script selection instruction, the test device may extract a test script indicated by the script selection instruction from the test scripts stored in the test device itself, and determine the test script as the target test script. The user can select a target test script from test scripts for testing the electronic equipment, and different test scripts are used for testing different services, namely, the user can select the target test script according to the service required to be tested.

If the test equipment comprises a display, the test equipment can display the stored information of each test script through the display for the user to select.

S803: and acquiring a script parameter determining instruction, determining a target script parameter based on the script parameter determining instruction, and configuring the target test script by adopting the target script parameter.

In one embodiment of the present invention, a user may directly input a script parameter determining instruction including a target script parameter into the test device, so that the test device determines the target script parameter.

In addition, if the test device includes a display, and different script parameters are stored in the test device, the different script parameters are used for configuring different test scripts, that is, script parameters possibly used by each test script in the test process are stored in the test device, so that the user can select the script parameters. The determination of the target script parameter based on the script parameter determining instruction may be achieved by the following steps C to D.

Step C: and displaying the stored script parameters through the display.

Specifically, the test device may display script parameters for configuring the above-described target test script only through the display, so that the user selects target script parameters for configuring the target test script from among the displayed script parameters. In addition, the test device may also display all script parameters stored by the test device via the display so that the user may select target script parameters from the displayed script parameters.

Step D: and acquiring a script parameter determining instruction, and extracting script parameters indicated by the script parameter determining instruction from the stored script parameters to serve as target script parameters.

Wherein the script parameter determining instruction is generated based on script parameters displayed by the display.

Specifically, after the script parameters are displayed on the display, the user may select target script parameters from the displayed environment parameters by inputting script parameter determination instructions.

Therefore, the user can directly select the target script parameters from the script parameters because the script parameters are stored in the test equipment, and the user does not need to manually input the target script parameters, so that the user can complete the configuration process of the target test script more simply.

S804: and running the configured target test script, and testing the equipment to be tested through the configured target control interface to obtain equipment running data of the equipment to be tested in the testing process.

Specifically, the test is required to be completed according to the test cases in the process of testing the target test script, and the test cases can be manually input by a user, namely, the user needs to manually input the test cases when the test equipment performs the test every time, and the method is suitable for the test with fewer test times and stronger test case randomness.

In addition, the test device may further store: the test cases for testing the electronic equipment connected with the test equipment, namely, different test cases for testing the electronic equipment possibly connected with the test equipment are prestored in the test equipment, and the test equipment can directly call the test cases stored by the test cases to test the equipment to be tested.

The user can select different test cases from the test cases stored in the test equipment, and the test equipment can sequentially execute the different test cases in a traversing mode to test the equipment to be tested.

Under the above circumstances, the process of running the configured target test script and testing the device to be tested through the configured target control interface may be implemented through the following steps E to F.

Step E: and acquiring a case selection instruction, and extracting a target test case from the stored test cases based on the case selection instruction.

Specifically, the use case selection instruction may be an instruction input by a user.

In addition, if the test equipment includes a display, the test equipment can display the test cases stored by the test equipment through the display so as to be selected by a user.

Step F: and executing the configured target test script to execute the target test case, and testing the equipment to be tested through the configured target control interface.

Therefore, the test case used for testing the device to be tested is stored in the test device, and the user can directly select the test case stored in the test device, and can directly and conveniently test the device to be tested without manually inputting the test case, so that the test process of the electronic device is simplified.

S805: and analyzing the equipment operation data to generate a test result of the equipment to be tested.

As can be seen from the above, in this embodiment, the device to be tested is tested by the test device, where the test device includes a device control interface and each test script, and the test device can configure the target control interface based on the target environmental parameter in the device control interface, so that the test device can control the device to be tested through the target control interface. And different test scripts can test different services, and the test equipment can test the services to be tested based on the target test script in the test scripts. Therefore, the scheme test equipment provided by the embodiment of the invention can directly use different test scripts stored by the equipment and directly control different equipment to be tested through different equipment control interfaces stored by the equipment, so that different services of different equipment to be tested are tested. The manual workload required in the testing process of the electronic equipment is less, so that the testing efficiency of the electronic equipment can be improved.

In addition, by writing a new device control interface and a test script in the test device, the test device can be used for testing new electronic devices and new services, so that the expandability of the embodiment of the invention is stronger.

In another embodiment of the present invention, the electronic device connected to the test device includes an auxiliary device, where the auxiliary device is used for: and adjusting the testing environment of the equipment to be tested.

Referring to fig. 9, a flowchart of a second electronic device testing method according to an embodiment of the present invention further includes the following step S806 before the step S804, compared with the embodiment shown in fig. 8.

S806: and acquiring an auxiliary parameter determining instruction, determining an auxiliary environment parameter based on the auxiliary parameter determining instruction, and configuring an auxiliary control interface in the equipment control interfaces by adopting the auxiliary environment parameter.

Wherein, the auxiliary environmental parameters include: and the auxiliary control interface is used for controlling the auxiliary equipment.

In one embodiment of the present invention, the user may directly input an auxiliary parameter determining instruction including an auxiliary environment parameter into the test apparatus, so that the test apparatus determines the auxiliary environment parameter. In addition, the user can also input instructions to select an interface from the device control interfaces as an auxiliary control interface.

In addition, the test device may further include a display, and the test device stores environmental parameters of different auxiliary devices, where the different environmental parameters include device information of different auxiliary devices, that is, the test device records the environmental parameters of each auxiliary device that may be connected to the test device, so that a user may select the auxiliary environmental parameters from the environmental parameters. Specifically, the process of determining the auxiliary environmental parameter is similar to the foregoing steps a-B, and will not be described herein.

In addition, the aforementioned step S804 may be implemented by the following step S804A, as compared with the aforementioned embodiment shown in fig. 8.

S804A: and running the configured target test script, testing the equipment to be tested through the configured target control interface, and controlling the auxiliary equipment through the configured auxiliary control interface in the testing process so as to adjust the testing environment.

Specifically, in the process of testing the device to be tested by the operation target test script, the auxiliary equipment can be controlled and operated through the auxiliary control interface, and the test environment can be adjusted after the auxiliary equipment is operated, so that the test equipment can acquire the equipment operation data of the device to be tested in the process of operating the device to be tested in different test environments.

For example, in the process of testing, the test equipment can control an attenuator serving as auxiliary equipment through an auxiliary test interface, and the size of a signal in a circuit of the equipment to be tested is adjusted through the attenuator, so that equipment operation data in the process of operating the equipment to be tested under various conditions with different signal sizes are obtained in the test process.

Therefore, the test equipment in the embodiment of the invention not only can be connected with the equipment to be tested through the target control interface to test the equipment to be tested, but also can be connected with the auxiliary equipment to adjust the test environment in the test process through the auxiliary equipment, and a user is not required to control the auxiliary equipment independently in the test process, so that the test process of the equipment to be tested is simplified.

Referring to fig. 10, a flow chart of a third electronic device testing method according to an embodiment of the present invention, compared with the embodiment shown in fig. 8, further includes the following steps S807 and/or S808 after the above step S805.

S807: and writing the equipment operation data into an operation data file, and storing the operation data file in the test equipment.

S808: and acquiring log data generated in the running process of the target test script, writing the log data into a log file, and storing the log file in the test equipment.

The above can show that after the test of the device to be tested is completed, the test device can also store the operation data file and the log file to record the device operation data and the log data generated in the test process of the electronic device, so that the device operation data and the log data can be analyzed and counted later, and the test process of the electronic device can be managed and adjusted.

Specifically, the steps executed in the electronic device testing method applied to the testing device may be implemented by each module in the foregoing electronic device testing apparatus, and in this embodiment, the electronic device testing method is not described in detail.

Corresponding to the electronic equipment testing method applied to the testing equipment, the embodiment of the invention provides the testing equipment.

Referring to fig. 11, a schematic structural diagram of a test apparatus according to an embodiment of the present invention includes a memory 1101, a transceiver 1102, and a processor 1103:

a memory 1101 for storing a computer program comprising a device control interface for controlling an electronic device connected to the test device and respective test scripts, each test script being adapted to: testing a service of the electronic device connected with the testing device; a transceiver 1102 for receiving and transmitting data under the control of the processor; a processor 1103 for reading the computer program in the memory and performing the following operations:

Where in FIG. 11, a bus architecture may comprise any number of interconnected buses and bridges, with one or more processors, specifically represented by processor 1103, and various circuits of memory, represented by memory 1101, linked together. The bus architecture may also link together various other circuits such as peripheral devices, voltage regulators, power management circuits, etc., which are well known in the art and, therefore, will not be described further herein. The bus interface provides an interface. The transceiver 1102 may be a number of elements, i.e., including a transmitter and a receiver, providing a means for communicating with various other apparatus over a transmission medium, including wireless channels, wired channels, optical cables, etc. The processor 1103 is responsible for managing the bus architecture and general processing, and the memory 1101 may store data used by the processor 1103 in performing operations.

The processor 1103 may be a Central Processing Unit (CPU), an application specific integrated circuit (Application Specific Integrated Circuit, ASIC), a Field programmable gate array (Field-Programmable Gate Array, FPGA), or a complex programmable logic device (Complex Programmable Logic Device, CPLD), and the processor may also employ a multi-core architecture.

In one embodiment of the present invention, the test device further includes a display, and the memory further stores different environmental parameters, where the different environmental parameters respectively include device information of different electronic devices, and the acquiring a target parameter instruction determines a target environmental parameter based on the target parameter instruction, and specifically includes:

displaying the stored environmental parameters via the display;

and acquiring a target parameter instruction, and extracting the environment parameter indicated by the target parameter instruction from the stored environment parameters based on the target parameter instruction to serve as a target environment parameter, wherein the target parameter instruction is generated based on the environment parameter displayed by the display.

From the above, since the environmental parameters are stored in the test device, the user can directly select the target environmental parameters from the environmental parameters without manually inputting the target environmental parameters, so that the user can complete the configuration process of the target control interface more simply.

In one embodiment of the present invention, the test device further includes a display, and the memory further stores different script parameters, where the different script parameters are used for configuring different test scripts, the acquiring script parameter determining instruction, determining a target script parameter based on the script parameter determining instruction, and specifically includes:

Displaying the stored script parameters via the display;

and acquiring a script parameter determining instruction, and extracting script parameters indicated by the script parameter determining instruction from the stored script parameters to serve as target script parameters, wherein the script parameter determining instruction is generated based on the script parameters displayed by the display.

Therefore, the user can directly select the target script parameters from the script parameters without manually inputting the target script parameters, so that the user can complete the configuration process of the target test script more simply.

In one embodiment of the present invention, the memory 1101 further stores: the test case for testing the electronic equipment connected with the test equipment is used for running the configured target test script and testing the equipment to be tested through the configured target control interface, and specifically comprises the following steps:

acquiring a case selection instruction, and extracting a target test case from the stored test cases based on the case selection instruction;

and executing the target test case by the configured target test script, and testing the equipment to be tested through the configured target control interface.

In one embodiment of the present invention, the electronic device connected to the test device includes an auxiliary device, where the auxiliary device is used to: the processor 1103 is further configured to, before adjusting a test environment in which the device under test is located and testing the device under test through the configured target control interface in the target test script after the configuration is executed, obtain device operation data of the device under test in a test process, perform:

acquiring an auxiliary parameter determining instruction, determining an auxiliary environment parameter based on the auxiliary parameter determining instruction, and configuring an auxiliary control interface in the equipment control interfaces by adopting the auxiliary environment parameter, wherein the auxiliary environment parameter comprises: the auxiliary equipment information is used for controlling the auxiliary equipment through the auxiliary control interface;

the running of the configured target test script tests the device to be tested through the configured target control interface, and specifically comprises the following steps:

And running the configured target test script, testing the equipment to be tested through the configured target control interface, and controlling the auxiliary equipment through the configured auxiliary control interface in the test process so as to adjust the test environment.

In one embodiment of the present invention, after the obtaining the device operation data of the device under test during the testing process, the processor 1103 is further configured to:

writing the equipment operation data into an operation data file, and storing the operation data file into the test equipment;

and/or

Script operation data generated in the operation process of the target test script is obtained, the script operation data is written into a log file, and the log file is stored in the test equipment.

In yet another embodiment of the present invention, there is also provided a computer program product containing instructions that, when run on a computer, cause the computer to perform the method of any of the above embodiments of the electronic device testing.

When the computer program product provided by the embodiment of the invention is applied to test the electronic equipment, the embodiment tests the equipment to be tested through the test equipment, the test equipment comprises an equipment control interface and each test script, and the test equipment can configure the target control interface based on the target environment parameters in the equipment control interface, so that the test equipment can control the equipment to be tested through the target control interface. And different test scripts can test different services, and the test equipment can test the services to be tested based on the target test script in the test scripts. Therefore, the scheme test equipment provided by the embodiment of the invention can directly use different test scripts stored by the equipment and directly control different equipment to be tested through different equipment control interfaces stored by the equipment, so that different services of different equipment to be tested are tested. The manual workload required in the testing process of the electronic equipment is less, so that the testing efficiency of the electronic equipment can be improved.

In the above embodiments, it may be implemented in whole or in part by software, hardware, firmware, or any combination thereof. When implemented in software, may be implemented in whole or in part in the form of a computer program product. The computer program product includes one or more computer instructions. When loaded and executed on a computer, produces a flow or function in accordance with embodiments of the present invention, in whole or in part. The computer may be a general purpose computer, a special purpose computer, a computer network, or other programmable apparatus. The computer instructions may be stored in or transmitted from one computer-readable storage medium to another, for example, by wired (e.g., coaxial cable, optical fiber, digital Subscriber Line (DSL)), or wireless (e.g., infrared, wireless, microwave, etc.). The computer readable storage medium may be any available medium that can be accessed by a computer or a data storage device such as a server, data center, etc. that contains an integration of one or more available media. The usable medium may be a magnetic medium (e.g., floppy Disk, hard Disk, magnetic tape), an optical medium (e.g., DVD), or a semiconductor medium (e.g., solid State Disk (SSD)), etc.

It is noted that relational terms such as first and second, and the like are used solely to distinguish one entity or action from another entity or action without necessarily requiring or implying any actual such relationship or order between such entities or actions. Moreover, the terms "comprises," "comprising," or any other variation thereof, are intended to cover a non-exclusive inclusion, such that a process, method, article, or apparatus that comprises a list of elements does not include only those elements but may include other elements not expressly listed or inherent to such process, method, article, or apparatus. Without further limitation, an element defined by the phrase "comprising one … …" does not exclude the presence of other like elements in a process, method, article, or apparatus that comprises the element.

In this specification, each embodiment is described in a related manner, and identical and similar parts of each embodiment are all referred to each other, and each embodiment mainly describes differences from other embodiments. In particular, for the method, the test device and the computer program embodiments, the description is relatively simple, since it is substantially similar to the method embodiments, and reference is made to the description of the method embodiments for relevant points.

It will be appreciated by those skilled in the art that embodiments of the present application may be provided as a method, system, or computer program product. Accordingly, the present application may take the form of an entirely hardware embodiment, an entirely software embodiment or an embodiment combining software and hardware aspects. Furthermore, the present application may take the form of a computer program product embodied on one or more computer-usable storage media (including, but not limited to, magnetic disk storage, optical storage, and the like) having computer-usable program code embodied therein.

The present application is described with reference to flowchart illustrations and/or block diagrams of methods, apparatus (systems) and computer program products according to embodiments of the application. It will be understood that each flow and/or block of the flowchart illustrations and/or block diagrams, and combinations of flows and/or blocks in the flowchart illustrations and/or block diagrams, can be implemented by computer-executable instructions. These computer-executable instructions may be provided to a processor of a general purpose computer, special purpose computer, embedded processor, or other programmable data processing apparatus to produce a machine, such that the instructions, which execute via the processor of the computer or other programmable data processing apparatus, create means for implementing the functions specified in the flowchart flow or flows and/or block diagram block or blocks.

These processor-executable instructions may also be stored in a processor-readable memory that can direct a computer or other programmable data processing apparatus to function in a particular manner, such that the instructions stored in the processor-readable memory produce an article of manufacture including instruction means which implement the function specified in the flowchart flow or flows and/or block diagram block or blocks.

These processor-executable instructions may also be loaded onto a computer or other programmable data processing apparatus to cause a series of operational steps to be performed on the computer or other programmable apparatus to produce a computer implemented process such that the instructions which execute on the computer or other programmable apparatus provide steps for implementing the functions specified in the flowchart flow or flows and/or block diagram block or blocks.

It will be apparent to those skilled in the art that various modifications and variations can be made to the present application without departing from the spirit or scope of the application. Thus, if such modifications and variations of the present application fall within the scope of the embodiments of the present application and the equivalent techniques thereof, the present application is also intended to include such modifications and variations.

Claims

1. An electronic device testing apparatus, characterized by being applied to a testing device, the apparatus comprising: service layer and unit layer, the service layer includes: a test code module, the unit layer comprising: the system comprises a scene design module, an equipment management module and a service selection module;

2. The apparatus of claim 1, wherein the service layer further comprises: a test task module;

The test task module is used for managing and storing test cases, wherein the test cases are used for: testing the electronic equipment connected with the testing equipment;

the service selection module is specifically configured to extract a test case from the test task module, configure parameters of a test script, and call the configured test script to test a service of an electronic device connected with the test device by adopting the extracted test case.

3. The apparatus according to claim 1 or 2, further comprising a user interface, UI, layer comprising a parameter configuration module and/or a code execution module;

the parameter configuration module is configured to display a first interface and/or a second interface on a display of the test device, where the first interface is: the interface is used for configuring parameters of the equipment control interface, and the second interface is: an interface for configuring parameters of the test script;

the code execution module is used for displaying an interface for selecting the test script on a display of the test equipment.

4. The apparatus according to claim 1 or 2, wherein the service layer further comprises: and the test data module is used for:

Acquiring and storing equipment operation data generated in a testing process of electronic equipment connected with the testing equipment;

and/or

And acquiring and storing log data generated by the test equipment in the process of testing.

5. The apparatus of claim 4, further comprising a UI layer, wherein the UI layer includes a data management module, wherein the data management module is configured to:

and displaying the equipment operation data and/or log data stored by the test data module on a display of the test equipment.

6. An electronic device testing method, characterized in that it is applied to a testing device, and the testing device includes: a device control interface for controlling an electronic device connected to the test device, and test scripts, each test script for: testing a service of an electronic device connected to the test device, the method comprising:

7. The method of claim 6, wherein the test device includes a display, and wherein the test device has different environmental parameters stored therein, wherein the different environmental parameters include device information of different electronic devices, wherein the obtaining the target parameter instruction, and wherein determining the target environmental parameter based on the target parameter instruction, comprises:

displaying the stored environmental parameters via the display;

8. The method of claim 6, wherein the test device includes a display and wherein the test device has different script parameters stored therein, the different script parameters being used to configure different test scripts, the obtaining script parameter determination instructions, determining target script parameters based on the script parameter determination instructions, comprising:

displaying the stored script parameters via the display;

9. The method of claim 6, wherein the test device has stored therein: the test case for testing the electronic equipment connected with the test equipment, the running of the configured target test script tests the equipment to be tested through the configured target control interface, and the test case comprises the following steps:

10. Method according to any of claims 6-9, characterized in that the electronic device connected to the test device comprises an auxiliary device for: adjusting the testing environment of the device to be tested, testing the device to be tested through the configured target control interface after the configured target test script is operated, and before the device operation data of the device to be tested in the testing process is obtained, further comprising:

the running of the configured target test script tests the device to be tested through the configured target control interface, and the running comprises the following steps:

11. The method according to any one of claims 6-9, further comprising, after said obtaining device operation data of said device under test during testing:

and/or

And acquiring log data generated in the running process of the target test script, writing the log data into a log file, and storing the log file in the test equipment.

12. A test apparatus comprising a memory, a transceiver, and a processor:

13. The test device of claim 12, further comprising a display, wherein the memory further stores different environmental parameters, wherein the different environmental parameters respectively include device information of different electronic devices, and wherein the acquiring the target parameter instruction, and determining the target environmental parameter based on the target parameter instruction, specifically comprises:

displaying the stored environmental parameters via the display;

14. The test device of claim 12, further comprising a display, and wherein the memory further stores different script parameters for configuring different test scripts, wherein the acquiring script parameter determining instructions, based on the script parameter determining instructions, determine target script parameters, specifically comprises:

displaying the stored script parameters via the display;

15. The test device of claim 12, wherein the memory further has stored therein: the test case for testing the electronic equipment connected with the test equipment is used for running the configured target test script and testing the equipment to be tested through the configured target control interface, and specifically comprises the following steps:

16. Test device according to any of claims 12-15, characterized in that the electronic device connected to the test device comprises auxiliary equipment for: the testing environment where the equipment to be tested is located is adjusted, and after the configured target testing script is operated, the equipment to be tested is tested through the configured target control interface, and before equipment operation data of the equipment to be tested in the testing process is obtained, the processor is further used for:

17. The test device of any one of claims 12-16, wherein after the obtaining device operational data of the device under test during the test, the processor is further configured to:

and/or