CN116930052A - Spacecraft element performance evaluation device and method in vacuum pollution environment - Google Patents
Spacecraft element performance evaluation device and method in vacuum pollution environment Download PDFInfo
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- 229920002379 silicone rubber Polymers 0.000 claims description 6
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- 238000003380 quartz crystal microbalance Methods 0.000 claims description 2
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Abstract
The invention belongs to the technical field of spacecraft space environmental effect test, and particularly relates to a spacecraft element performance evaluation device and method in a vacuum pollution environment. Aiming at the influence of the products of the air outlet of spacecraft materials, especially organic materials, caused by vacuum environment in space on the sensitive materials or elements of the spacecraft, especially the laser optical elements, which are used as pollution sources, on the laser damage resistance of the sensitive materials or the laser elements of the spacecraft, the method provides a performance evaluation device of the elements of the spacecraft under the vacuum pollution environment, and provides a method for developing the laser damage resistance of the spacecraft influenced by the vacuum pollution environment under the space service state. By using the method, the laser damage resistance of the spacecraft sensitive material after the vacuum pollution effect can be accurately evaluated, and support is provided for the development, selection and evaluation of the spacecraft material and the components under the space laser effect.
Description
Technical Field
The invention belongs to the technical field of spacecraft space environmental effect test, and particularly relates to a spacecraft element performance evaluation device and method in a vacuum pollution environment.
Background
In the in-orbit service process of the spacecraft and sensitive materials, optical elements and parts, the spacecraft and sensitive materials are often in a certain vacuum and temperature environment, so that physically adsorbed or chemically adsorbed molecules in the materials are released, and then deposited nearby, especially on the surfaces of materials or elements with lower temperature, so that pollution effects are caused, and the optical and electrical properties of the spacecraft and the sensitive materials are reduced or even fail.
In the on-orbit operation process of the space laser system, on one hand, the pollutants discharged from the vacuum can generate pollution effect on optical materials or elements, so that the performance of the space laser system is reduced, and on the other hand, in the process of transmitting laser in a light path, high-energy photons in the laser can act on the optical materials or elements, especially various coated optical elements such as an anti-reflection element, an optical filter, a reflection element and the like, so that the optical films are damaged.
If the space laser is polluted before being acted on the sensitive materials and elements of the spacecraft, the pollutants on the surfaces of the sensitive materials and elements can volatilize under the action of the laser after the materials and elements are subjected to the laser again, and on the other hand, the pollutants can be solidified under the long-term action of the laser and gradually bond with the optical elements and the materials to form a thermal absorption color center, and if the laser continuously works for a long time, the capability of the laser to bear the laser action can be reduced, namely the capability of the laser damage resistance is reduced.
The research only mentions that vacuum gas and pollution can influence the optical performance of the space laser system, but does not mention the influence of vacuum pollution on the laser damage resistance of spacecraft sensitive materials or elements and how to perform experimental research.
In the aspect of patents, the university of vinca and the complanate et al develop the application of the patent of the invention of a pollutant removal method and a device based on multi-pulse laser, and in the patent, the multi-pulse laser is used as a pollutant removal method. The research of a device and a method for testing the ultraviolet induced pollution enhancement effect of space of a spacecraft and a device and a method for testing the molecular pollution in a cabin of the spacecraft by ionization total dose is carried out by Shanghai optical precision mechanical institute Shen Zicai and Wang Yanzhi of China academy of sciences and the like, and the method and the device for testing the pollution enhancement effect of ultraviolet photons and the pollution of energy particles in the cabin of the spacecraft by ionization total dose are researched. However, the related studies are to consider the cause of the increase in the amount of contamination and the test method. In the long-term on-orbit service state of the spacecraft in the future, the influence of pollution on the laser damage resistance of the spacecraft is not considered. The influence of space pollution environment on the laser damage resistance of the spacecraft is not related at home and abroad, and a test device for the influence of space pollution on the laser damage resistance of the spacecraft is not built.
Disclosure of Invention
The invention aims to build a spacecraft element performance evaluation device under a vacuum pollution environment aiming at the problem that the molecular pollution effect of the vacuum pollution environment in the space on spacecraft sensitive materials, elements or part components can influence the laser damage resistance change of the spacecraft sensitive materials, elements or part components, and provides the performance evaluation of the spacecraft elements under the vacuum pollution environment.
The technical scheme of the invention is as follows:
a spacecraft element performance evaluation device under a vacuum pollution environment comprises a laser light source, a beam splitter, an energy analyzer, a glass window, a vacuum cavity, a pollution source bracket, a pollution source temperature control device, a pollution source 8, a high-speed camera shooting and photographing system, a pollution component real-time monitoring system, a sample, a pollution monitoring device, a sample table, an optical sample temperature control device, a vacuum system and a testing and controlling system;
the laser is generated by a laser light source, is divided into two paths by a beam splitter, one path of laser energy is measured by an energy analyzer, and the other path of laser energy enters a vacuum cavity through a glass window and irradiates a sample;
the energy analyzer is used for measuring the laser energy of the beam splitting, analyzing to obtain the laser energy incident on the surface of the test sample and is positioned above the beam splitting mirror;
the high-speed camera shooting system is used for detecting the sputtering process, the appearance of the sample and the like of the laser acting on the surface of the sample and is positioned in the vacuum cavity and in front of the sample;
the pollution component real-time monitoring system is used for measuring the pollution components in the vacuum cavity in real time and is positioned at the bottom of the inner side of the vacuum cavity;
and the testing and controlling system is used for testing and controlling temperature, vacuum, pollution components, laser damage process, sample morphology and the like, is positioned outside the vacuum cavity and is connected with the high-speed shooting and photographing system and the vacuum gauge.
Further, the laser light source is one of a 1064nm, 532 nm, 355nm pulse light source or a 1.0-1.1 micron continuous light source.
The beam splitter 2 is an optical reflection-transmission mirror capable of splitting laser light into two beams of light having a certain energy ratio.
The glass window is made of glass having high transmittance and low absorptivity, such as quartz glass, or laser light is introduced into the vacuum chamber through an optical fiber.
Further, the pollution source bracket and the pollution source temperature control device are both composed of high-temperature control and low-temperature control, wherein the high-temperature control uses an electric heating wire, the low-temperature control uses liquid nitrogen or bath oil temperature control device, and the temperature range is-80 ℃ to +120 ℃.
Further, the pollution source is one or more of gray-scale cable and silicone rubber.
Further, the pollution monitoring device is realized by a quartz crystal microbalance.
Further, the optical sample temperature control devices are both composed of high-temperature control and low-temperature control, wherein the high-temperature control uses an electric heating wire, the low-temperature control uses a liquid nitrogen or bath oil temperature control device, and the temperature range is-80 ℃ to +120 ℃.
The vacuum system consists of a mechanical pump and a molecular pump, and the vacuum degree is lower than 0.1Pa.
A spacecraft element performance evaluation method under a vacuum pollution environment comprises the following steps:
a, analyzing the in-orbit service temperature environment of the spacecraft sensitive material/element;
b, determining the laser damage resistance of the spacecraft sensitive material/element in the vacuum environment;
c, determining the laser damage resistance of the spacecraft sensitive material/element in the vacuum pollution environment;
and d, obtaining the laser damage resistance influence of the polluted environment under vacuum on the spacecraft material/element.
Further, a spacecraft sensitive material/element in-orbit service temperature environment analysis is specifically as follows: the temperature of the sensitive material or element is analyzed based on the on-orbit altitude of the sensitive material/element, the position on the spacecraft, the orientation relationship with the sun, the thermal control design, etc.
Further, b, determining the laser damage resistance of the spacecraft sensitive material/element in the vacuum environment, specifically: closing a vacuum cavity, vacuumizing to below 0.1Pa by utilizing a vacuum system, starting a pollution component real-time monitoring system and a pollution deposition monitoring device, keeping temperature control of a sample and the pollution deposition monitoring device by utilizing a temperature control device, adjusting the wavelength and the incident energy of a laser, splitting beams by utilizing a beam splitting mirror, monitoring laser energy, utilizing real-time monitoring of laser damage materials, and obtaining the laser damage resistance of the sample by adjusting the energy of a medium-pulse laser or the action time of continuous laser, wherein the damage threshold or the laser energy and the action time are usually expressed.
Further, c, determining the laser damage resistance of the spacecraft sensitive material/element in the vacuum pollution environment, specifically: closing a vacuum cavity, vacuumizing to below 0.1Pa by using a vacuum system, starting a pollution component real-time monitoring system and a pollution deposition monitoring device, keeping temperature control of a sample and the pollution deposition monitoring device by using a temperature control device, placing a pollution source such as a gray-scale cable or silicon rubber on a pollution source support, adjusting heating temperature of the pollution source by using the pollution source temperature control device to enable the pollution source to be discharged, adjusting wavelength and incident energy of a laser after the discharging time reaches a certain set time or the pollutant deposition amount on the pollution deposition monitoring device reaches a set value, splitting by using a beam splitter, monitoring laser energy by using a beam splitting mirror, and obtaining the laser damage resistance of the sample by using real-time monitoring of laser damage materials and adjusting the energy of pulse laser or the action time of continuous laser in step 1, wherein the laser damage resistance is generally represented by a damage threshold or laser energy and the action time.
Further, d obtains the laser damage resistance effect of the polluted environment under vacuum on the spacecraft material/element, and specifically comprises the following steps: and c, comparing and analyzing the data obtained in the steps b and c to obtain the influence of the vacuum pollution environment on the laser damage resistance of the spacecraft material or element. And d, carrying out microscopic analysis and comparison on the components, the morphology and the like of the samples obtained in the steps b and c, so that a microscopic mechanism of the spacecraft material or the element with the influence of the vacuum pollution environment on the laser damage resistance can be analyzed.
The invention has the following technical effects:
(1) Aiming at the problem that the pollution effect of sensitive materials, elements or components of the spacecraft caused by vacuum gas pollution in the space service process of the spacecraft can reduce the laser damage resistance of the spacecraft, the performance evaluation device for the spacecraft elements in the vacuum pollution environment is provided;
(2) The performance evaluation method of the spacecraft element in the vacuum pollution environment can be developed, and the influence of pollution sediments on the laser damage resistance of the spacecraft sensitive material, element or component and the microscopic mechanism of the spacecraft sensitive material, element or component in the vacuum environment of space service can be accurately evaluated.
Drawings
FIG. 1 is a diagram of a spacecraft element performance evaluation device in a vacuum contaminated environment in accordance with the present invention.
FIG. 2 is a flow chart of a method for evaluating performance of spacecraft elements in a vacuum polluted environment in the invention.
Detailed Description
The present invention will be described in detail with reference to the following examples and drawings.
Example 1: the method is characterized by taking an exposed optical window element as a research object, 1064nm pulse laser as a laser light source, GD 414 silicone rubber widely applied to current spacecrafts as a pollution source and a geosynchronous orbit as a service orbit.
a. According to the orbit height of the spacecraft being 35786km which is the geosynchronous orbit, considering that a pollution source is irradiated by the sun, the optical material part is controlled by heat, and the temperature of the pollution source is selected to be 100 ℃ and the temperature of a sample is 50 ℃;
b. closing a 6 vacuum cavity, vacuumizing to below 0.1Pa by using a 15 vacuum system, starting a 10 pollution component real-time monitoring system and a 12 pollution deposition monitoring device, keeping the temperature control of a 11 sample and a 12 pollution deposition monitoring device by using a 14 temperature control device, adjusting the wavelength of a 1 laser to 1064nm, splitting beams by using a 2 beam splitter in the test process, monitoring the laser energy by using 3, performing real-time monitoring of laser damaged materials by using 9, and adjusting the incident energy of pulse laser in the 1 to be 4J/cm 2 Starting to gradually increase until laser damage and breakage occur, selecting only one position on the surface of the sample by laser of each energy to perform a laser damage resistance test, so that the laser damage resistance of the 11 samples can be obtained, and the laser damage resistance is generally expressed by the relation between damage probability and laser energy;
d. closing a 6 vacuum cavity, vacuumizing to below 0.1Pa by using a 15 vacuum system, starting a 10 pollution component real-time monitoring system and a 12 pollution deposition monitoring device, keeping the temperature control of an 11 sample and the 12 pollution deposition monitoring device by using a 14 temperature control device, placing a GD 414 silicon rubber pollution source on a 6 pollution source bracket, adjusting the heating temperature of the pollution source to 100 ℃ by using a 7 pollution source temperature control device so as to enable the pollution source 8 to be discharged, and enabling the discharge time to reach a certain set time, such as 5 hours, or enabling the pollutant deposition on the 14 pollution deposition monitoring device to reach a set value, such as 1 multiplied by 10 -5 g/cm 2 Adjust 1 excitationThe wavelength of the optical device is 1064nm, the beam is split by a 3 beam splitter in the test process, the laser energy is monitored by 4 pairs, the laser damage material is monitored in real time by 7 pairs, and the incident energy of the pulse laser in the step 1 is adjusted from 4J/cm 2 Starting to gradually increase until laser damage and breakage occur, selecting only one position on the surface of the sample by laser of each energy to perform a laser damage resistance test, so that the laser damage resistance of the 9 samples can be obtained, and the laser damage resistance is generally expressed by the relation between damage probability and laser energy;
e. and c, comparing and analyzing the data obtained in the steps c and d to obtain the influence of the ionizing radiation of space protons on the laser damage resistance of the exposed anti-reflection window element/material of the spacecraft. Further, the microscopic analysis means such as SEM, XPS, AFM can be utilized to obtain the surface morphology, microscopic components, laser damage morphology and the like of the samples in c and d which are not irradiated by laser, and the microscopic mechanisms of the space proton ionizing radiation on the influence of the laser damage resistance of the spacecraft exposed light-increasing optical window element can be analyzed and compared.
Example 2: a quartz glass element with a film coating thickness of 5nm is taken as a study object, 355nm pulse laser is taken as a laser source, a service track is a geosynchronous track, and a gray scale cable is taken as a pollution source.
a. According to the orbit height of the spacecraft being 35786km which is the geosynchronous orbit, considering that a pollution source is irradiated by the sun, the optical material part is controlled by heat, and the temperature of the pollution source is selected to be 100 ℃ and the temperature of a sample is 50 ℃;
b. closing a 6 vacuum cavity, vacuumizing to below 0.1Pa by using a 15 vacuum system, starting a 10 pollution component real-time monitoring system and a 12 pollution deposition monitoring device, keeping the temperature control of an 11 sample and 12 pollution deposition monitoring device by using a 14 temperature control device, adjusting the wavelength of a 1 laser to 355nm, splitting beams by using a 2 beam splitter in the test process, monitoring the laser energy by using 3, performing real-time monitoring of laser damaged materials by using 9, and adjusting the incident energy of pulse laser in the 1 to be 4J/cm 2 Starting to gradually increase until laser damage and breakage occur, and selecting only one position on the sample surface by each energy laserPerforming a laser damage resistance test, so that the laser damage resistance of the 11 samples can be obtained, wherein the laser damage resistance is generally expressed by the relation between damage probability and laser energy;
d. closing a 6 vacuum cavity, vacuumizing to below 0.1Pa by using a 15 vacuum system, starting a 10 pollution component real-time monitoring system and a 12 pollution deposition monitoring device, keeping the temperature control of an 11 sample and the 12 pollution deposition amount monitoring device by using a 14 temperature control device, placing a gray scale cable pollution source on a 6 pollution source bracket, adjusting the heating temperature of the pollution source to 100 ℃ by using a 7 pollution source temperature control device so as to enable the pollution source 8 to be discharged, and enabling the discharge time to reach a certain set time, such as 5 hours, or enabling the pollutant deposition amount on the 14 pollution deposition monitoring device to reach a set value, such as 1 multiplied by 10 -5 g/cm 2 The wavelength of the laser device 1 is adjusted to 355nm, the laser beam is split by a 3 beam splitter in the test process, the laser energy is monitored by 4 pairs, the laser damage material is monitored in real time by 7 pairs, and the incident energy of the pulse laser in the laser device 1 is adjusted to be 4J/cm 2 Starting to gradually increase until laser damage and breakage occur, selecting only one position on the surface of the sample by laser of each energy to perform a laser damage resistance test, so that the laser damage resistance of the 9 samples can be obtained, and the laser damage resistance is generally expressed by the relation between damage probability and laser energy;
e. and c, comparing and analyzing the data obtained in the steps c and d to obtain the influence of the ionizing radiation of space protons on the laser damage resistance of the exposed anti-reflection window element/material of the spacecraft. Further, the microscopic analysis means such as SEM, XPS, AFM can be utilized to obtain the surface morphology, microscopic components, laser damage morphology and the like of the samples in c and d which are not irradiated by laser, and the microscopic mechanisms of the space proton ionizing radiation on the influence of the laser damage resistance of the spacecraft exposed light-increasing optical window element can be analyzed and compared.
The foregoing description of the preferred embodiments of the invention is not intended to be limiting, but rather is intended to cover all modifications, equivalents, alternatives, and improvements that fall within the spirit and scope of the invention.
Claims (14)
1. The spacecraft element performance evaluation device under the vacuum pollution environment is characterized by comprising a laser light source (1), a beam splitter (2), an energy analyzer (3), a glass window (4), a vacuum cavity (5), a pollution source bracket (6), a pollution source temperature control device (7), a pollution source (8), a high-speed camera shooting system (9), a pollution component real-time monitoring system (10), a sample (11), a pollution monitoring device (12), a sample table (13), an optical sample temperature control device (14), a vacuum system (15) and a testing and controlling system (16);
the laser is generated by a laser light source (1), is divided into two paths by a beam splitter (2), one path of laser energy is measured by an energy analyzer (3), and the other path of laser energy enters a vacuum cavity (5) through a glass window (4) and irradiates a sample (11);
the energy analyzer (3) is used for measuring the laser energy of the light splitting, analyzing to obtain the laser energy incident on the surface of the test sample, and is positioned above the beam splitting mirror (2);
the high-speed camera shooting system (9) is used for detecting sputtering processes, sample morphology and the like of laser acting on the surface of the sample and is positioned in the vacuum cavity (5) and in front of the sample (11);
the pollution component real-time monitoring system (10) is used for measuring the pollution components in the vacuum cavity (5) in real time and is positioned at the bottom of the inner side of the vacuum cavity (5);
the testing and control system (16) is used for testing and controlling temperature, vacuum, pollution components, laser damage process, sample morphology and the like, is positioned outside the vacuum cavity (5) and is connected with the high-speed shooting and photographing system (9) and the vacuum gauge (10).
2. The device for evaluating performance of spacecraft elements in a vacuum polluted environment according to claim 1, wherein the laser light source (1) is one of a pulse light source of 1064nm, 532 nm, 355nm, etc. or a continuous light source of 1.0-1.1 μm.
3. The device for evaluating performance of a spacecraft element in a vacuum contaminated environment according to claim 1, wherein said beam splitter (2) is an optical reflection-transmission mirror capable of splitting laser light into two beams of light having a certain energy ratio.
4. The device for evaluating performance of a spacecraft element in a vacuum contaminated environment according to claim 1, wherein the glass window (4) is made of glass having high transmittance and low absorptivity such as quartz glass, or laser light is introduced into the vacuum chamber through an optical fiber.
5. The spacecraft element performance evaluation device under vacuum pollution environment according to claim 1, wherein the pollution source bracket (6) and the pollution source temperature control device (7) are both composed of high temperature control and low temperature control, wherein the high temperature control uses an electric heating wire, the low temperature control uses a liquid nitrogen or bath oil temperature control device, and the temperature range is-80 ℃ to +120 ℃.
6. The device for evaluating the performance of spacecraft elements in a vacuum polluted environment according to claim 1, wherein said pollution source (8) is one or more of gray-scale cable and silicone rubber.
7. The device for evaluating the performance of spacecraft elements in a vacuum contaminated environment according to claim 1, wherein said contamination monitoring means (12) are realized by quartz crystal microbalances.
8. The spacecraft element performance evaluation device under vacuum polluted environment according to claim 1, characterized in that the optical sample temperature control device (14) is composed of high temperature control and low temperature control, wherein the high temperature control uses an electric heating wire, the low temperature control uses a liquid nitrogen or bath oil temperature control device, and the temperature range is-80 ℃ to +120 ℃.
9. The spacecraft element performance evaluation device according to claim 1, wherein the vacuum system (15) consists of a mechanical pump and a molecular pump, and the vacuum is lower than 0.1Pa.
10. A spacecraft element performance evaluation method in a vacuum pollution environment is characterized by comprising the following steps:
a, analyzing the in-orbit service temperature environment of the spacecraft sensitive material/element;
b, determining the laser damage resistance of the spacecraft sensitive material/element in the vacuum environment;
c, determining the laser damage resistance of the spacecraft sensitive material/element in the vacuum pollution environment;
and d, obtaining the laser damage resistance influence of the polluted environment under vacuum on the spacecraft material/element.
11. The method for evaluating the performance of spacecraft elements in the vacuum pollution environment according to claim 10, wherein the in-orbit service temperature environment analysis of the spacecraft sensitive material/element is specifically as follows: the temperature of the sensitive material or element is analyzed based on the on-orbit altitude of the sensitive material/element, the position on the spacecraft, the orientation relationship with the sun, the thermal control design, etc.
12. The method for evaluating the performance of a spacecraft element in a vacuum polluted environment according to claim 10, wherein the step b is to determine the laser damage resistance of the spacecraft sensitive material/element in the vacuum polluted environment, specifically: closing a vacuum cavity (5), vacuumizing to below 0.1Pa by utilizing a vacuum system (15), starting a pollution component real-time monitoring system (10) and a pollution deposition monitoring device (12), keeping temperature control of a sample (11) and the pollution deposition monitoring device (12) by utilizing a temperature control device (14), adjusting the wavelength and incident energy of a laser (1), splitting beams by utilizing a beam splitting mirror (2), monitoring laser energy by utilizing a beam splitting mirror (3), carrying out real-time monitoring of laser damaged materials by utilizing a beam splitting mirror (9), and obtaining the laser damage resistance of the sample (11) by adjusting the energy of pulse laser or the action time of continuous laser in the sample, wherein the laser damage resistance is generally represented by a damage threshold or the laser energy and the action time.
13. The method for evaluating the performance of a spacecraft element in a vacuum polluted environment according to claim 10, wherein c is used for determining the laser damage resistance of a spacecraft sensitive material/element in the vacuum polluted environment, specifically: closing a vacuum cavity (5), vacuumizing to below 0.1Pa by using a vacuum system (15), starting a pollution component real-time monitoring system (10) and a pollution deposition monitoring device (12), keeping temperature control of a sample (11) and the pollution deposition monitoring device (12) by using a temperature control device (14), placing a dust-skin cable or a silicon rubber and other pollution sources on a pollution source bracket (6), adjusting the heating temperature of the pollution source by using a pollution source temperature control device (7) to enable the pollution source (6) to be out, adjusting the wavelength and the incident energy of a laser (1) after the out-gassing time reaches a certain set value or the pollutant deposition on the pollution deposition monitoring device (12) reaches a set value, splitting the beam by using a beam splitter (2), monitoring the laser energy by using a beam splitter (3), and performing real-time monitoring of laser damage materials by using a laser (9), and obtaining the anti-laser damage capability of the sample (11) by adjusting the energy of pulse laser in the (1) or the action time of continuous laser, wherein the anti-laser damage capability is usually represented by a damage threshold or the laser energy and the action time.
14. The method for evaluating the performance of a spacecraft element in a vacuum polluted environment according to claim 10, wherein d is the laser damage resistance effect of the polluted environment in vacuum on the spacecraft material/element, specifically: and c, comparing and analyzing the data obtained in the steps b and c to obtain the influence of the vacuum pollution environment on the laser damage resistance of the spacecraft material or element. And d, carrying out microscopic analysis and comparison on the components, the morphology and the like of the samples obtained in the steps b and c, so that a microscopic mechanism of the spacecraft material or the element with the influence of the vacuum pollution environment on the laser damage resistance can be analyzed.
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| JPH11248627A (en) * | 1998-03-06 | 1999-09-17 | Nikon Corp | Device and method for measuring light loss |
| JP2008233104A (en) * | 2003-09-19 | 2008-10-02 | Japan Science & Technology Agency | Laser damage evaluation method of optical material |
| CN101876612A (en) * | 2009-12-17 | 2010-11-03 | 中国航天科技集团公司第五研究院第五一○研究所 | In-situ monitoring method for outgasing contamination of nonmetallic materials on optical surface of spacecraft |
| JP2020165758A (en) * | 2019-03-29 | 2020-10-08 | 地方独立行政法人神奈川県立産業技術総合研究所 | Auxiliary device for infrared spectroscopic analysis, infrared spectroscopic analysis system, and infrared emissivity measurement method |
| CN113758947A (en) * | 2021-08-11 | 2021-12-07 | 中国科学院上海光学精密机械研究所 | Test device and method for inducing molecular pollution in spacecraft cabin by total ionization dose |
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