CN116899911A - Test sorting machine - Google Patents

Abstract

The application discloses a test separator, which comprises: the clamping device is provided with a plurality of clamping mechanisms and is suitable for driving the clamping mechanisms to rotate; the clamping mechanism comprises a feeding device, a detection device, a testing device, a first storage device and a second storage device which are spaced along the circumferential direction of the clamping device, wherein each clamping mechanism is suitable for clamping an electronic element to be detected on the feeding device, the detection device is suitable for detecting whether the electronic element has an appearance defect, and the testing device is suitable for detecting whether the electronic element has a performance defect; the test handler is adapted to store electronic components in the first storage device or in the second storage device. Therefore, the test sorting machine can respectively detect the electronic components clamped by the clamping mechanism through the detection device and the test device, then the defective products are separated from the good products, and compared with the prior art, the number of the test sorting machines required for sorting the electronic components is smaller, so that the sorting flow of the electronic components can be simplified.

Description

Test sorting machine

Technical Field

The application relates to the field of product detection, in particular to a test sorting machine.

Background

The test separator is used for detecting whether the quality of the product is qualified or not, the test separator can separate defective products from qualified products, and when the product is an electronic element, whether the quality of the electronic element is qualified or not can be determined by detecting the appearance and the electrical characteristics of the electronic element.

In the related art, the existing test sorting machine has single function, some test sorting machines can only detect whether the appearance of an electronic element is qualified or not, and when defective products with unqualified appearance exist, the test sorting machine can separate the defective products from the good products. And, some test sorters can only detect whether the electrical characteristics of the electronic component are qualified, and when there are defective products with unqualified performances, the test sorters can separate the defective products from the good products. The multiple test sorters need to be used in series, which causes complicated sorting procedures of electronic elements and influences the production efficiency of the electronic elements.

Disclosure of Invention

In order to simplify the sorting flow of electronic components and improve the production efficiency of the electronic components, the application provides a test sorting machine.

The application provides a test sorting machine which adopts the following technical scheme:

a test handler, comprising: the clamping device is provided with a plurality of clamping mechanisms which are suitable for clamping electronic components, the clamping mechanisms are sequentially distributed along the circumferential direction of the clamping device, and the clamping device is suitable for driving the clamping mechanisms to rotate around the central axis of the clamping device; the electronic component clamping device comprises a feeding device, a detection device, a testing device, a first storage device and a second storage device which are spaced along the circumferential direction of the clamping device, wherein each clamping mechanism is suitable for clamping an electronic component to be detected on the feeding device, the detection device is suitable for detecting whether the electronic component clamped by the clamping mechanism has an appearance defect, and the testing device is suitable for detecting whether the electronic component clamped by the clamping mechanism has a performance defect; the test handler is configured to control the gripping mechanism to store the corresponding electronic component in the first storage device when the electronic component is not defective, and to control the gripping mechanism to store the corresponding electronic component in the second storage device when the electronic component is defective.

Through adopting above-mentioned technical scheme, test sorter can detect the electronic component that clamping mechanism gripped through detection device and testing arrangement respectively, then separate the electronic component of defective products from the electronic component of good product, compare with prior art, the required test sorter quantity of sorting electronic component is less to can simplify the separation flow of electronic component, and then can improve the production efficiency of electronic component.

Preferably, the clamping device is provided with a fixing seat and a driving piece, the clamping mechanisms are fixed on the fixing seat, the clamping mechanisms are sequentially spaced apart along the circumferential direction of the fixing seat, the driving piece is in transmission connection with the fixing seat, the driving piece is suitable for driving the fixing seat to rotate around the central axis of the fixing seat so as to drive the clamping mechanisms to rotate around the central axis of the clamping device, and the clamping mechanisms are suitable for rotating to be opposite to the feeding device, the detection device, the testing device, the first storage device and the second storage device respectively.

Through adopting above-mentioned technical scheme, drive the fixing base through the driving piece and drive and press from both sides and get the mechanism and rotate to be relative with a plurality of devices of test sorter, a plurality of clamping mechanisms that just set up relatively with a plurality of devices one-to-one under the same moment can pack electronic component into corresponding device simultaneously to make a plurality of devices of test sorter carry out corresponding operation, thereby can realize that test sorter realizes multiple test and sorting function to electronic component simultaneously, improved test sorter's functionality, required sorting step when having reduced electronic component and selected separately.

Preferably, at least two of the feeding device, the detecting device, the testing device, the first storage device and the second storage device are adapted to be opposite to the clamping mechanism at the same time.

Through adopting above-mentioned technical scheme, the clamping mechanism that is opposite respectively with a plurality of devices under the same moment can pack electronic component in the corresponding device simultaneously, and a plurality of devices can handle electronic component simultaneously, can reduce the waiting time of packing into electronic component of each device in the test sorter to can further improve the separation efficiency of test sorter.

Preferably, the clamping mechanism is provided with a fixing part, a moving assembly and a clamping part, the clamping part is suitable for clamping the electronic element, the fixing part is fixedly connected with the fixing seat, the clamping part is fixedly connected with the moving assembly, the moving assembly drives the clamping part to move close to or far away from the fixing part, so that the clamping part moves along the axial direction of the fixing seat to drive the electronic element to move close to or far away from the feeding device, the detecting device, the testing device, the first storage device and the second storage device.

By adopting the technical scheme, the clamping piece is suitable for moving close to or far away from each device of the test separator, so that the clamping piece can conveniently load or remove the electronic element into or from each device of the test separator, and the clamping piece and the electronic element clamped by the clamping piece can be ensured not to interfere with each device of the test separator, so that the test separator can smoothly operate.

Preferably, the detecting device and the testing device are both provided with at least one, at least one calibrating device is arranged between the testing device and the adjacent detecting device, the calibrating device is suitable for being opposite to the clamping mechanism, and the calibrating device is suitable for calibrating the clamping position and the clamping angle of the electronic element on the clamping mechanism to a preset clamping position and a preset clamping angle.

Through adopting above-mentioned technical scheme, before clamping the mechanism with electronic component transport to the adjacent testing arrangement that sets up and one that is located the downstream side in the detection device, calibrate electronic component's angle and position through calibrating device, can make the electronic component after adjusting can be relative with testing arrangement's test position or detection arrangement's test position to clamping mechanism with electronic component shifts into testing arrangement or detection device in can being convenient for, can avoid electronic component to shift into testing arrangement or detection device in the time-lag.

Preferably, the calibration device comprises a chuck and a plurality of claws, wherein the claws are arranged on the chuck and are spaced along the circumferential direction of the chuck, the electronic element is suitable for being placed at the center of the upper surface of the chuck, and the claws are suitable for moving towards the center of the chuck along the radial direction of the chuck so as to push the electronic element to move to a preset clamping position and a preset clamping angle relative to the clamping mechanism.

Through adopting above-mentioned technical scheme, through the position of a plurality of jack catchs on the adjustment chuck and the motion distance of every jack catchs, can adjust the position of holding in advance of electronic component and hold in advance and get the angle to can make the position of electronic component relative clamp get the mechanism more suitable, and then be convenient for clamp get the mechanism and pack into the testing arrangement that is located calibrating device's downstream side with electronic component.

Preferably, the feeding device comprises: the device comprises a vibrating piece, a direction adjusting piece and a guide rail, wherein one end of the guide rail is connected and matched with the vibrating piece, and the other end of the guide rail is suitable for being positioned right below the clamping mechanism; the vibrating piece is suitable for storing the electronic element to be detected, and is suitable for driving the electronic element to move along the guide rail towards a direction approaching to the clamping mechanism when vibrating; the direction adjusting piece is arranged on the guide rail and is suitable for adjusting the preset clamping surface of the electronic element to be opposite to the clamping mechanism.

Through adopting above-mentioned technical scheme, the guide rail can be with a plurality of electronic components on the vibrating member to the one end of keeping away from the vibrating member of guide rail after ordering in proper order carry, and the orientation of face is got in the preset clamp of electronic component can be adjusted according to the position of the characteristic structure of electronic component to the direction regulating member, through vibrating member, direction regulating member and guide rail cooperation, can make the test sorter realize using clamp to get the technical effect of mechanism automatic clamp to wait to detect electronic component to can improve the detection efficiency of test sorter.

Preferably, the first storage device includes: the article placing tray is provided with a plurality of article placing grids and is detachably arranged on the carrying seat, the position detecting piece is suitable for detecting first position data, the first position data are position data of the article placing grids which are not placed, and the carrying seat is suitable for driving the article placing tray to move according to the first position data so that the article placing grids which are not placed are opposite to the clamping mechanism.

Through adopting above-mentioned technical scheme, the controller can be according to first position data control driving motor drive bearing seat body drive thing dish motion to make the putting check of putting the thing and press from both sides and get the mechanism relatively, press from both sides the electronic component that the structure clamp got the good product can place in putting the thing check of putting the thing not, so that putting the thing check of putting the thing not and change into putting the thing check of putting the thing, the user can retrieve and put the thing dish in order to shift the electronic component of good product.

Preferably, the first storage device is further provided with a storage piece, the storage piece defines a plurality of storage spaces, and each storage space is suitable for placing a storage tray; the position detecting piece is further adapted to detect second position data, the second position data is position data of the storage boxes of the stored objects, the bearing seat is configured to store the corresponding storage boxes of the stored objects in the storage space when the number of the storage boxes of the stored objects reaches the preset number according to the second position data, and take out the storage boxes of the stored objects from the storage space.

Through adopting above-mentioned technical scheme, through the thing dish of putting of carrier seat automatic discharge thing quantity reach the thing dish of putting of presetting the thing quantity, and the thing dish of putting of automatic loading not putting, can reduce the frequency of manual operation test sorter to can improve the degree of automation of test sorter, help further improve electronic component's separation efficiency.

Preferably, the detection device is configured as a 3D5s multi-angle detection camera; the test device is configured as a piezoelectric characteristic detection device.

Through adopting above-mentioned technical scheme, the camera body can gather the outward appearance picture of a plurality of planes of electronic component through a plurality of reflecting prisms, 3D5s multi-angle detects that the camera can carry out visual detection to a plurality of planes of electronic component simultaneously, thereby can improve detection device's detection efficiency, low voltage characteristic detection device can be circular telegram to electronic component, low voltage characteristic detection device can judge whether electronic component has performance defects such as short circuit, short circuit through electronic component's actual current value and voltage value etc., thereby test sorter can confirm whether corresponding electronic component is the yields according to electronic component's electrical property.

In summary, the present application includes at least one of the following beneficial technical effects:

1. the test sorting machine can respectively detect the electronic components clamped by the clamping mechanism through the detection device and the test device, then separate the electronic components with defective products from the electronic components with good products, and compared with the prior art, the number of the test sorting machines required for sorting the electronic components is less, so that the sorting flow of the electronic components can be simplified, and the production efficiency of the electronic components can be improved;

2. the driving piece drives the fixing seat to drive the clamping mechanism to rotate to be opposite to a plurality of devices of the test sorting machine, and the plurality of clamping mechanisms which are in one-to-one correspondence with the plurality of devices and are arranged opposite to each other at the same time can simultaneously load the electronic components into the corresponding devices so as to enable the plurality of devices of the test sorting machine to execute corresponding operations, thereby realizing the functions of testing and sorting the electronic components simultaneously, improving the functionality of the test sorting machine and reducing sorting steps required by sorting the electronic components;

3. the carrying seat is used for automatically unloading the object placing trays with the number reaching the preset number and automatically loading the object placing trays without the object placing, so that the frequency of manually operating the test sorting machine can be reduced, the degree of automation of the test sorting machine can be improved, and the sorting efficiency of electronic elements can be further improved.

Drawings

Fig. 1 is a schematic diagram of a test handler according to an embodiment of the present application;

FIG. 2 is a schematic view of a test handler according to an embodiment of the present application with a cabinet removed;

FIG. 3 is a schematic view of another angle of the test handler according to an embodiment of the present application after the cabinet is removed;

FIG. 4 is a top view of the test handler with the cabinet removed according to an embodiment of the present application;

FIG. 5 is a schematic view of a gripping device according to an embodiment of the present application;

FIG. 6 is an enlarged schematic view at A in FIG. 5;

FIG. 7 is a schematic diagram of a feeding device according to an embodiment of the present application;

FIG. 8 is a schematic view of a carrier according to an embodiment of the present application;

FIG. 9 is a schematic diagram of a calibration device according to an embodiment of the present application;

FIG. 10 is a schematic diagram of a detection device according to an embodiment of the present application;

FIG. 11 is a schematic diagram of a testing device according to an embodiment of the application.

Reference numerals illustrate:

100. a test handler;

10. a clamping device; 101. a clamping mechanism; 102. a fixing seat; 103. a driving member; 104. a fixing member; 105. a motion assembly; 106. a clamping member; 107. a motion seat; 108. a guide post; 109. a return spring; 110. a clamping part; 111. a negative pressure part;

20. a feeding device; 201. a vibrating member; 202. a direction adjusting member; 203. a guide rail;

30. a detection device; 40. a testing device;

50. a first storage device; 501. a bearing seat; 502. a position detecting member; 503. a storage member; 504. a storage space; 505. a bearing seat body; 506. a support rail;

60. a second storage device; 70. a cabinet body; 80. a support table;

90. a calibration device; 901. a chuck; 902. and (3) clamping jaws.

Detailed Description

The present application is described in further detail below with reference to fig. 1-11.

The embodiment of the application discloses a test handler 100, wherein the test handler 100 is suitable for sorting electronic components to separate electronic components with good products from electronic components with bad products, and it should be noted that the electronic components may refer to chips and the like.

Referring to fig. 1 to 11, the test handler 100 includes: the device comprises a clamping device 10, a feeding device 20, a detecting device 30, a testing device 40, a first storage device 50 and a second storage device 60. The test handler 100 may further include a cabinet 70 covering the outside of the plurality of devices of the test handler 100 and a support table 80 for supporting the plurality of devices. The gripping device 10 has a plurality of gripping mechanisms 101 adapted to grip electronic components, the plurality of gripping mechanisms 101 being arranged in sequence along the circumferential direction of the gripping device 10, and in some preferred embodiments, the spacing distances between any adjacent two of the gripping mechanisms 101 being equal. The gripping device 10 is adapted to drive a plurality of gripping mechanisms 101, each rotating about a central axis of the gripping device 10.

And, the feeding device 20, the detecting device 30, the testing device 40, the first storage device 50 and the second storage device 60 are disposed at intervals along the circumferential direction of the gripping device 10, and when the gripping mechanism 101 rotates around the central axis of the gripping device 10, the gripping mechanism 101 may pass through the feeding device 20, the detecting device 30, the testing device 40, the first storage device 50 and the second storage device 60, respectively. Meanwhile, each clamping mechanism 101 is adapted to clamp the electronic component to be tested on the feeding device 20, that is, when the clamping mechanism 101 rotates to the feeding device 20 and clamps the tested electronic component from the feeding device 20, the clamping mechanism 101 can drive the clamped electronic component to pass through the testing device 30, the testing device 40, the first storage device 50 and the second storage device 60 respectively. The inspection device 30 can detect whether the electronic component clamped by the clamping mechanism 101 has an appearance defect when the electronic component passes through the inspection device 30, and the test device 40 can detect whether the electronic component clamped by the clamping mechanism 101 has a performance defect when the electronic component passes through the test device 40.

Further, after the electronic components pass through the detecting device 30 and the testing device 40, the test handler 100 is configured to control the gripping mechanism 101 to store the corresponding electronic components in the first storage device 50 when the electronic components are not defective, and to control the gripping mechanism 101 to store the corresponding electronic components in the second storage device 60 when the electronic components are defective, so that the electronic components with good products are stored in the first storage device 50, the electronic components with bad products are stored in the second storage device 60, the worker can collect the electronic components with good products for subsequent production, and the worker can collect the electronic components with bad products for scrapping. The defects refer to appearance defects and performance defects of the electronic component.

Referring to fig. 5 and 6, in some embodiments of the present application, the gripping device 10 may be provided with a fixing base 102 and a driving member 103, where the gripping mechanism 101 is fixed to the fixing base 102, and the fixing base 102 provides fixing positions for a plurality of gripping mechanisms 101, and the plurality of gripping mechanisms 101 are sequentially spaced apart along a circumferential direction of the fixing base 102.

The driving piece 103 is in transmission connection with the fixing base 102, the driving piece 103 is suitable for driving the fixing base 102 to rotate around the central axis of the fixing base 102 to drive the plurality of clamping mechanisms 101 to rotate around the central axis of the clamping device 10, specifically, the driving piece 103 can be a driving motor, in some preferred embodiments, the driving motor can be a DD motor (Direct Drive Ratary-direct driving rotary motor), the DD motor is provided with a decoder, the DD motor has higher rotation angle precision, and an output shaft of the driving motor can be directly connected with the fixing base 102 to reduce angle rotation errors generated by mechanical structure friction between the driving motor and the fixing base 102.

The gripping mechanism 101 is adapted to rotate to oppose the loading device 20, the detection device 30, the testing device 40, the first storage device 50 and the second storage device 60, respectively. When the gripping mechanism 101 rotates to be opposite to the feeding device 20, the gripping mechanism 101 can grip the electronic components to be sorted from the feeding device 20. When the gripping mechanism 101 rotates to be opposite to the inspection device 30, the gripping mechanism 101 can load the electronic component to be appearance-inspected into the inspection device 30, and the gripping mechanism 101 can take out the electronic component having been appearance-inspected from the inspection device 30. When the gripping mechanism 101 rotates to be opposite to the testing device 40, the gripping mechanism 101 can load the electronic component to be tested for performance into the testing device 40, and the gripping mechanism 101 can take out the electronic component having been tested for performance from the testing device 40. When the clamping mechanism 101 rotates to face the first storage device 50 and the electronic component clamped by the clamping mechanism 101 is good, the clamping mechanism 101 can load the good electronic component into the first storage device 50. When the clamping mechanism 101 rotates to face the second storage device 60 and the electronic component clamped by the clamping mechanism 101 is defective, the clamping mechanism 101 can load the defective electronic component into the second storage device 60.

Therefore, the driving piece 103 drives the fixing seat 102 to drive the clamping mechanism 101 to rotate to be opposite to the devices of the test handler 100, so that the clamping mechanism 101 can load the electronic components into the devices of the test handler 100, and the devices of the test handler 100 execute corresponding operations, thereby realizing that the test handler 100 can realize multiple testing and sorting functions on the electronic components at the same time, improving the functionality of the test handler 100, and reducing sorting steps required during sorting of the electronic components.

Referring to fig. 2-4, in some embodiments of the application, at least two of the loading device 20, the detection device 30, the testing device 40, the first storage device 50, and the second storage device 60 are adapted to be respectively opposite the gripping mechanism 101 at the same time. The plurality of gripping mechanisms 101, which are provided in one-to-one correspondence with the plurality of devices at the same time and are opposed to each other, can simultaneously load the electronic components into the corresponding devices. In some preferred embodiments, the feeding device 20, the detecting device 30, the testing device 40, the first storage device 50 and the second storage device 60 are respectively opposite to the gripping mechanism 101 at the same time, so that the feeding device 20, the detecting device 30, the testing device 40, the first storage device 50 and the second storage device 60 can process the electronic components at the same time, the time required for waiting for loading the electronic components in each device in the test handler 100 can be reduced, and the sorting efficiency of the test handler 100 can be further improved.

Referring to fig. 5 and 6, in some embodiments of the present application, the clamping mechanism 101 has a fixing member 104, a moving assembly 105 and a clamping member 106, the clamping member 106 is adapted to clamp an electronic component, in some specific embodiments, as shown in fig. 5 and 6, the clamping member 106 may include a clamping portion 110, a communicating tube and a negative pressure portion 111, the clamping portion 110 has an adsorption hole penetrating the clamping portion 110 along an axial direction of the fixing base 102, the communicating tube is communicated between the clamping portion 110 and the negative pressure portion 111, the negative pressure portion 111 is adapted to suck air in the clamping portion 110 through the communicating tube, so that negative pressure can be generated in the adsorption hole of the clamping portion 110, and the clamping portion 110 can clamp the electronic component by means of negative pressure adsorption.

The fixing piece 104 is fixedly connected with the fixing seat 102, the clamping piece 106 is fixedly connected with the moving assembly 105, the moving assembly 105 drives the clamping piece 106 to move close to or away from the fixing piece 104, and the clamping piece 106 moves along the axial direction of the fixing seat 102 to drive the electronic component to move close to or away from the feeding device 20, the detecting device 30, the testing device 40, the first storage device 50 and the second storage device 60. Specifically, the axial direction of the fixing base 102 may refer to the up-down direction in fig. 2. The moving assembly 105 may include a moving seat 107, a driving motor and a return spring 109, where the gripping member 106 is mounted on the moving seat 107, the moving seat 107 is movably disposed on the fixing member 104, the fixing member 104 or the moving seat 107 has a guiding post 108, and the guiding post 108 is adapted to guide the moving seat 107, so that the moving seat 107 is adapted to move along an axial direction of the fixing seat 102 relative to the fixing seat 102, and thus the moving seat 107 may drive the gripping member 106 to drive the electronic component to move close to or far from the fixing member 104.

And, driving motor can drive motion seat 107 to the direction of keeping away from mounting 104 and move, returns the outside that the guide post 108 was located to the cover of normal spring 109, and when driving motor drive motion seat 107 moved the direction of keeping away from mounting 104 back, return normal spring 109 can produce the elasticity, and when driving motor was not in the output power, return normal spring 109's elasticity can drive motion seat 107 to be close to the direction motion of mounting 104, can realize the technical effect that clamping piece 106 moved along the axial direction of fixing base 102 from this. When the clamping member 106 is located right above the feeding device 20, the clamping member 106 moves close to the feeding device 20, so that the clamping member 106 can clamp the electronic component on the feeding device 20, and then the clamping member 106 can move away from the feeding device 20, so that the electronic component is prevented from interfering with the feeding device 20 when the clamping member 106 drives the electronic component to rotate.

When the clamping member 106 is located right above the detecting device 30, the clamping member 106 moves close to the detecting device 30, the clamping member 106 can load the clamped electronic component into the detecting device 30, and after the detecting device 30 detects the appearance of the electronic component, the clamping member 106 can move away from the detecting device 30, so that interference between the electronic component and the detecting device 30 when the clamping member 106 drives the electronic component to rotate is avoided. When the clamping member 106 is located right above the testing device 40, the clamping member 106 moves close to the testing device 40, so that the clamping member 106 can load the clamped electronic component into the testing device 40, and after the performance test of the electronic component by the testing device 40 is completed, the clamping member 106 can move away from the testing device 40, so that the electronic component is prevented from interfering with the testing device 40 when the clamping member 106 drives the electronic component to rotate.

When the clamping member 106 is located right above the first storage device 50, by moving the clamping member 106 close to the first storage device 50, good electronic components clamped by the clamping member 106 can be loaded into the first storage device 50, then the clamping member 106 does not clamp the electronic components any more, the electronic components can be separated from the clamping member 106 when the clamping member 106 moves away from the first storage device 50, good electronic components can be stored in the first storage device 50, and the clamping member 106 can be used for clamping the electronic components to be sorted again. When the gripping member 106 is positioned directly above the second storage device 60, the defective electronic components gripped by the gripping member 106 may be loaded into the second storage device 60 by movement of the gripping member 106 proximate to the second storage device 60, and in some embodiments, the second storage device 60 may be a storage case. Then, the clamping member 106 does not clamp the electronic components any more, the electronic components can be separated from the clamping member 106 when the clamping member 106 moves away from the first storage device 50, the electronic components with defective products can be stored in the first storage device 50, and the clamping member 106 can be used for clamping the electronic components to be sorted again.

Thus, by moving the gripping member 106 to move toward or away from each device of the test handler 100, it is possible to facilitate the gripping member 106 to load or remove electronic components into or from each device of the test handler 100, and it is also possible to ensure that the gripping member 106 and the electronic components gripped by the gripping member 106 do not interfere with each device of the test handler 100, thereby enabling the test handler 100 to operate smoothly.

Referring to fig. 2 to fig. 4, in some embodiments of the present application, at least one detecting device 30 and at least one testing device 40 are provided, for example, in the embodiment shown in fig. 2, two detecting devices 30 may be provided, and one testing device 40 may be provided, so that after one detecting device 30 detects an electronic component and the testing device 40 detects the electronic component, the other detecting device 30 may detect the appearance of the electronic component again, and by detecting the appearance of the electronic component multiple times, the number of defective products in the screened electronic component may be further reduced, so that the sorting accuracy of the test handler 100 may be further improved, and further, the product yield of the electronic component may be effectively improved. Of course, in some embodiments, the test device 40 may be provided in plural numbers, and by testing the performance of the electronic components plural times, the number of defective products in the screened electronic components may be further reduced, so that the sorting accuracy of the test handler 100 may be further improved.

Moreover, a calibration device 90 may be disposed between at least one testing device 40 and an adjacent detecting device 30, where the calibration device 90 is adapted to be opposite to the clamping mechanism 101, and the calibration device 90 is adapted to calibrate the clamping position and the clamping angle of the electronic component on the clamping mechanism 101 to a preset clamping position and a preset clamping angle. Before the clamping mechanism 101 transfers the electronic component to one of the testing device 40 and the detecting device 30 which are adjacently arranged and positioned at the downstream side, the angle and the position of the electronic component are calibrated by the calibrating device 90, so that the adjusted electronic component can be opposite to the testing position of the testing device 40 or the testing position of the detecting device 30, the clamping mechanism 101 can conveniently transfer the electronic component into the testing device 40 or the detecting device 30, and the clamping stagnation when the electronic component is transferred into the testing device 40 or the detecting device 30 can be avoided.

Referring to fig. 9, in some embodiments of the present application, the calibration device 90 includes a chuck 901 and a plurality of jaws 902, each of the plurality of jaws 902 being disposed on the chuck 901 and spaced apart in a circumferential direction of the chuck 901, the electronic component being adapted to be placed at a center of an upper surface of the chuck 901, the plurality of jaws 902 each being adapted to move in a radial direction of the chuck 901 toward the center of the chuck 901 to urge the electronic component to move to a preset gripping position and a preset gripping angle with respect to the gripping mechanism 101. In the embodiment shown in fig. 9, when the electronic component is a square electronic component, the number of the claws 902 may be four, the four claws 902 are adapted to abut against the four side walls of the electronic component, and when the four claws 902 all move towards the center of the chuck 901 to move to the corresponding preset positions, the electronic component is pushed by the claws 902 to the four claws 902 to contact with the electronic component, and at this time, the electronic component is adjusted to the preset clamping position and the preset clamping angle.

Therefore, by adjusting the positions of the plurality of claws 902 on the chuck 901 and the moving distance of each claw 902, the preset gripping position and the preset gripping angle of the electronic component can be adjusted, so that the position of the electronic component relative to the gripping mechanism 101 can be made more appropriate, thereby facilitating the gripping mechanism 101 to load the electronic component into the test device 40 located on the downstream side of the calibration device 90. When the calibration device 90 calibrates the position of the electronic component, the clamping mechanism 101 can maintain the clamping state with the electronic component, so that the clamping position between the clamping mechanism 101 and the electronic component is prevented from being offset due to excessive clamping times between the clamping mechanism 101 and the electronic component.

Referring to fig. 7, in some embodiments of the present application, the feeding device 20 may include: the electronic component clamping device comprises a vibrating piece 201, a direction adjusting piece 202 and a guide rail 203, wherein one end of the guide rail 203 is connected and matched with the vibrating piece 201, the other end of the guide rail 203 is suitable for being located under the clamping mechanism 101, the vibrating piece 201 is suitable for storing the electronic component to be detected, the vibrating piece 201 is suitable for driving the electronic component to move along the guide rail 203 towards the direction close to the clamping mechanism 101 when vibrating, and the direction adjusting piece is arranged on the guide rail 203 and is suitable for adjusting the preset clamping surface of the electronic component to be opposite to the clamping mechanism 101. In some embodiments, the guide rail 203 may be disposed obliquely downward from an end of the guide rail 203 connected to the vibrating member 201 to an end of the guide rail 203 away from the vibrating member 201, so that the electronic component can be easily moved from the end of the guide rail 203 connected to the vibrating member 201 toward the end of the guide rail 203 away from the vibrating member 201 after being vibrated.

The guide rail 203 can sequentially convey the plurality of electronic components on the vibrating member 201 to the end of the guide rail 203 away from the vibrating member 201 after sorting, so that the gripping mechanism 101 can grip one electronic component from the guide rail 203 when the gripping mechanism 101 is located directly above the guide rail 203. Further, the electronic component may be provided with a feature, which may be a protrusion, a recess, a rib, etc., and the direction adjusting member may include, but is not limited to: the direction adjusting piece can adjust the direction of the preset clamping surface of the electronic element according to the position of the characteristic structure of the electronic element, so that the clamping mechanism 101 is convenient for clamping the electronic element, and the preset clamping surface of the electronic element can be a plane of the electronic element clamped by the clamping mechanism 101. By the cooperation of the vibrating member 201, the direction adjusting member 202, and the guide rail 203, the test handler 100 can be made to realize the technical effect of automatically gripping the electronic component to be tested using the gripping mechanism 101, so that the test handler 100 can be improved in detection efficiency.

Referring to fig. 8, in some embodiments of the present application, the first storage device 50 may include: the carrying seat 501, the storage tray and the position detecting piece 502, the storage tray is provided with a plurality of storage grids which are detachably arranged on the carrying seat 501, the storage grids are arranged on the storage tray in a plurality of rows and columns along the radial direction of the storage tray, and the size of each storage grid is matched with the size of the electronic element. The position detecting member 502 may be configured as a visual detecting camera, where the position detecting member 502 is adapted to detect first position data, where the first position data is position data of a non-placed object placing grid, and the carrying seat 501 is adapted to drive the object placing tray to move according to the first position data, so that the non-placed object placing grid is opposite to the clamping mechanism 101.

The bearing seat 501 comprises a bearing seat body 505, a supporting guide rail 506, a driving motor and a controller, wherein the bearing seat body 505 is used for fixing a storage tray, the bearing seat body 505 is movably arranged on the supporting guide rail 506, and the supporting guide rail 506 can support the bearing seat body 505. The driving motor is in transmission connection with the carrying seat body 505, and the driving motor is suitable for driving the carrying seat body 505 to move along the supporting guide rail 506 in the horizontal direction perpendicular to the plane shown in fig. 4, so that the plurality of storage compartments of the storage tray move to be opposite to the clamping mechanism 101 respectively. The controller is communicatively coupled to both the position detector 502 and the drive motor, and in some embodiments may be a separate controller for the carrier 501, and in other embodiments may be a controller for the test handler 100. The controller can control the driving motor to drive the bearing seat body 505 to drive the storage tray to move according to the first position data, so that the storage grid of the non-stored object is opposite to the clamping mechanism 101. When the clamping mechanism 101 moves along the axial direction (i.e. the up-down direction in fig. 2) of the clamping device 10, the electronic components of good products clamped by the clamping structure can be placed in the non-placed object placing grid, so that the non-placed object placing grid is converted into the placed object placing grid, and the user can recover the object placing tray to transfer the electronic components of good products.

Referring to fig. 2-4, in some embodiments of the present application, the first storage device 50 may further be provided with a storage member 503, where the storage member 503 defines a plurality of storage spaces 504, each storage space 504 is adapted to store a tray, in the embodiment shown in fig. 2, the plurality of storage spaces 504 may be sequentially spaced apart along the height direction (i.e., the up-down direction in fig. 2) of the test handler 100, and each storage space 504 is adapted to store one tray, and in some embodiments, each storage space 504 is adapted to store a plurality of trays, an operator may store a tray that is not stored in the storage member 503, and the operator may retrieve a tray that is already stored from the storage member 503.

The position detecting element 502 is further adapted to detect second position data, where the second position data is position data of the placed object storage compartments, and the carrying seat 501 is configured to store the corresponding placed object storage disc in the storage space 504 and take out the non-placed object storage disc from the storage space 504 when the number of the placed object storage compartments reaches the preset number according to the second position data. The controller can control the driving motor to drive the bearing seat body 505 to drive the storage tray to move according to the second position data, so as to store the storage tray with the stored storage tray in the storage space 504, and take out the storage tray without the stored storage tray from the storage space 504. The preset number of objects may be the maximum number of objects placed on the object placing tray, or the preset number of objects may be the number of objects placed set by the user. The frequency of manually operating the test handler 100 can be reduced by automatically unloading the trays with the number of the articles reaching the preset number of the articles through the bearing seat 501 and automatically loading the trays without the articles, so that the automation degree of the test handler 100 can be improved, and the sorting efficiency of electronic elements can be further improved.

Further, in some embodiments, the structure of the feeding device 20 may be the same as the structure of the first storage device 50 in the above embodiments, that is, the feeding device 20 may include: the carrying seat 501, the object placing tray, the position detecting part 502 and the storing part 503, the object placing tray of the feeding device 20 may be located under the clamping mechanism 101, the electronic element to be detected may be placed on the object placing tray of the feeding device 20, the clamping mechanism 101 may clamp the electronic element to be detected on the object placing tray of the feeding device 20, and then the clamping mechanism 101 conveys the electronic element to be detected to the detecting device 30 and the testing device 40 for detection.

Further, in some embodiments, the first storage device 50 and/or the second storage device 60 may be configured as a conveyor or a tray, etc., when the first storage device 50 and/or the second storage device 60 are configured as a conveyor, the conveyor has a conveyor belt and a driving motor, the conveyor belt is adapted to be located directly under the gripping mechanism 101, and when the gripping mechanism 101 places the detected electronic component on the conveyor belt, the driving motor may drive the conveyor belt to move the detected electronic component so as to convey the detected electronic component to the corresponding storage location. When the first storage device 50 and/or the second storage device 60 are configured as a Tray, the Tray has a plurality of storage compartments for storing electronic components, and the gripping mechanism 101 may sequentially place the detected electronic components in the plurality of storage compartments of the Tray, so as to facilitate personnel to collect good electronic components or defective electronic components. The specific structure of the Tray is disclosed in the prior art and will not be described in detail herein.

In some embodiments of the present application, as shown in fig. 10 and 11, the detection device 30 is configured as a 3D5s multi-angle detection camera, wherein the 3D5s multi-angle detection camera has a camera body and a plurality of reflection prisms therein, the camera body can collect appearance pictures of a plurality of planes of the electronic component through the plurality of reflection prisms, and the 3D5s multi-angle detection camera can perform visual detection on the plurality of planes of the electronic component at the same time, so that the detection efficiency of the detection device 30 can be improved.

And, the test device 40 is configured as the piezoelectric characteristic detection device 30. After the electronic component is placed at the preset position of the low-voltage electrical characteristic detecting device 30, the low-voltage electrical characteristic detecting device 30 may energize the electronic component, and the low-voltage electrical characteristic detecting device 30 may determine whether the electronic component has a performance defect such as a short circuit or a short circuit through an actual current value, a voltage value, etc. of the electronic component, so that the test handler 100 may determine whether the corresponding electronic component is good according to the electrical characteristic of the electronic component. However, the present application is not limited thereto, and for example, the test device 40 may implement other types of testing functions, so that the functions of the test handler 100 may be more abundant, the number of test handlers 100 required for sorting electronic components may be further reduced, and further, the sorting process of the electronic components may be further simplified, which is helpful for further improving the production efficiency of bridge electronic components.

The above embodiments are not intended to limit the scope of the present application, so: all equivalent changes in structure, shape and principle of the application should be covered in the scope of protection of the application.

Claims (10)

1. A test handler, comprising:

the clamping device (10), the clamping device (10) is provided with a plurality of clamping mechanisms (101) which are suitable for clamping electronic components, the clamping mechanisms (101) are sequentially arranged along the circumferential direction of the clamping device (10), and the clamping device (10) is suitable for driving the clamping mechanisms (101) to rotate around the central axis of the clamping device (10);

the electronic component clamping device comprises a feeding device (20), a detection device (30), a testing device (40), a first storage device (50) and a second storage device (60) which are spaced along the circumferential direction of the clamping device (10), wherein each clamping mechanism (101) is suitable for clamping an electronic component to be detected on the feeding device (20), the detection device (30) is suitable for detecting whether the electronic component clamped by the clamping mechanism (101) has an appearance defect or not, and the testing device (40) is suitable for detecting whether the electronic component clamped by the clamping mechanism (101) has a performance defect or not;

the test handler (100) is configured to control the gripping mechanism (101) to store the corresponding electronic component in the first storage device (50) when the electronic component is not defective, and to control the gripping mechanism (101) to store the corresponding electronic component in the second storage device (60) when the electronic component is defective.

2. A test handler according to claim 1, wherein the gripping device (10) is provided with a fixing base (102) and a driving member (103), the gripping mechanism (101) is fixed to the fixing base (102), a plurality of the gripping mechanisms (101) are sequentially spaced apart along a circumferential direction of the fixing base (102), the driving member (103) is in transmission connection with the fixing base (102), the driving member (103) is adapted to drive the fixing base (102) to rotate around a central axis of the fixing base (102) so as to drive the plurality of the gripping mechanisms (101) to rotate around a central axis of the gripping device (10), and the gripping mechanisms (101) are adapted to rotate to be opposite to the feeding device (20), the detecting device (30), the testing device (40), the first storing device (50) and the second storing device (60), respectively.

3. A test handler according to claim 2, wherein at least two of the loading device (20), the detecting device (30), the testing device (40), the first storing device (50) and the second storing device (60) are adapted to be opposed to the gripping mechanism (101) respectively at the same time.

4. A test handler according to claim 2, wherein the gripping mechanism (101) has a fixing member (104), a moving assembly (105) and a gripping member (106), the gripping member (106) is adapted to grip the electronic component, the fixing member (104) is fixedly connected to the fixing base (102), the gripping member (106) is fixedly connected to the moving assembly (105), the gripping member (106) is driven by the moving assembly (105) to move close to or away from the fixing member (104), and the gripping member (106) is driven to move along an axial direction of the fixing base (102) to drive the electronic component to move close to or away from the feeding device (20), the detecting device (30), the testing device (40), the first storage device (50) and the second storage device (60).

5. A test handler according to claim 1, wherein the detecting means (30) and the testing means (40) are each provided with at least one, at least one of the testing means (40) and the adjacent detecting means (30) being provided with a calibration means (90), the calibration means (90) being adapted to be opposed to the gripping means (101), the calibration means (90) being adapted to calibrate the gripping position and the gripping angle of the electronic component on the gripping means (101) to a preset gripping position and a preset gripping angle.

6. A test handler according to claim 5, wherein the calibration device (90) comprises a chuck (901) and a plurality of jaws (902), a plurality of the jaws (902) being provided on the chuck (901) and being spaced apart in a circumferential direction of the chuck (901), the electronic component being adapted to be placed at a center of an upper surface of the chuck (901), a plurality of the jaws (902) being adapted to be moved in a radial direction of the chuck (901) towards the center of the chuck (901) for pushing the electronic component to a preset gripping position and a preset gripping angle with respect to the gripping mechanism (101).

7. A test handler according to claim 1, wherein the loading device (20) comprises: the device comprises a vibrating piece (201), a direction adjusting piece (202) and a guide rail (203), wherein one end of the guide rail (203) is connected and matched with the vibrating piece (201), and the other end of the guide rail (203) is suitable for being positioned under the clamping mechanism (101);

the vibrating piece (201) is suitable for storing the electronic component to be detected, and the vibrating piece (201) is suitable for driving the electronic component to move along the guide rail (203) towards a direction approaching the clamping mechanism (101) when vibrating;

the direction adjusting piece is arranged on the guide rail (203) and is suitable for adjusting the preset clamping surface of the electronic component to be opposite to the clamping mechanism (101).

8. A test handler according to claim 1, wherein the first storage means (50) comprises: the device comprises a bearing seat (501), a storage tray and a position detection piece (502), wherein the storage tray is provided with a plurality of storage grids and is detachably arranged on the bearing seat (501), the position detection piece (502) is suitable for detecting first position data, the first position data are position data of storage grids which are not stored, and the bearing seat (501) is suitable for driving the storage tray to move according to the first position data so that the storage grids which are not stored are opposite to the clamping mechanism (101).

9. A test handler according to claim 8, wherein the first storage means (50) is further provided with a storage member (503), the storage member (503) defining a plurality of storage spaces (504), each storage space (504) being adapted for receiving a tray;

the position detecting piece (502) is further adapted to detect second position data, the second position data is position data of the storage grids of the stored objects, the bearing seat (501) is configured to store the corresponding storage disc of the stored objects in the storage space (504) and take out the storage disc of the non-stored objects from the storage space (504) when the number of the storage grids of the stored objects reaches the preset number according to the second position data.

10. A test handler according to claim 1, characterized in that the detection device (30) is configured as a 3D5s multi-angle detection camera;

the test device (40) is configured as a piezoelectric property detection device (30).