CN116878388B - Line scanning measurement method, device and system and computer readable storage medium - Google Patents
Line scanning measurement method, device and system and computer readable storage medium Download PDFInfo
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- 238000000691 measurement method Methods 0.000 title claims abstract description 29
- 238000005259 measurement Methods 0.000 claims abstract description 96
- 238000000034 method Methods 0.000 claims abstract description 27
- 238000012216 screening Methods 0.000 claims description 10
- 238000010586 diagram Methods 0.000 description 3
- 238000005516 engineering process Methods 0.000 description 3
- 238000004519 manufacturing process Methods 0.000 description 3
- 230000000694 effects Effects 0.000 description 2
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/08—Measuring arrangements characterised by the use of optical techniques for measuring diameters
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/26—Measuring arrangements characterised by the use of optical techniques for measuring angles or tapers; for testing the alignment of axes
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T7/00—Image analysis
- G06T7/10—Segmentation; Edge detection
- G06T7/13—Edge detection
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T7/00—Image analysis
- G06T7/60—Analysis of geometric attributes
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- Length Measuring Devices By Optical Means (AREA)
Abstract
The invention discloses a line scanning measurement method, a device, a system and a computer readable storage medium; the method comprises the steps of setting scanning parameters according to a target object to be detected, outputting driving control signals according to the set scanning parameters to drive and control a light source device and a line scanning camera, enabling the light source device to be matched with the line scanning camera to scan the target object to be detected according to a preset path, sequentially receiving image information collected by the line scanning camera, splicing a plurality of received image information according to a receiving sequence to obtain global image information, finally measuring all target devices according to measuring parameters on the obtained global image information, and displaying measured results simultaneously; the method solves the technical problems of low efficiency and large amount of manual operation required by operators in the measurement process when the target device on the planar product is measured by a secondary element measurement method in the related art.
Description
Technical Field
The present invention relates to the field of device measurement technologies, and in particular, to a line scanning measurement method, device, system, and computer readable storage medium.
Background
The method for detecting the product rapidly and effectively judges whether the product is qualified or not, and is required to be detected by a plurality of manufacturing enterprises before the product leaves a factory or enters the next working procedure. In the related art, when measuring parameters of a plurality of target devices on a large-sized planar product, a two-dimensional measurement method is generally adopted for measuring, that is, after a lens with high precision is moved to a specified position, the corresponding image size is measured. However, with the development of automatic large-scale intelligent manufacturing technology, the production efficiency of products is improved rapidly, and the two-dimensional measurement method is small in view field of a lens, automatic matching measurement cannot be performed on the same type of devices on a product plane, and detection personnel are required to perform manual selection measurement, so that the measurement efficiency is reduced.
Therefore, how to solve the technical problem of low measurement efficiency existing in the related art when the device on the planar product is measured by the two-dimensional measurement method is a technical problem that needs to be solved by those skilled in the art.
Disclosure of Invention
The embodiment of the invention provides a line scanning measurement method, a device, a system and a computer readable storage medium, which are used for solving the technical problem of low measurement efficiency when a device on a planar product is measured by a secondary element measurement method in the related art.
In a first aspect, an embodiment of the present invention provides a line scan measurement method, including:
setting scanning parameters according to a target object to be detected;
outputting a driving control signal according to the scanning parameters to drive a light source device and a line scanning camera to scan the target object to be detected according to a preset path;
receiving the image information acquired by the line scanning cameras one by one, and splicing the received image information to obtain global image information according to a receiving sequence;
receiving measurement parameters of a target device, and measuring all the target devices on the global image information according to the measurement parameters;
wherein the measurement parameters include external contour information, internal shape information, and measurement object information;
the receiving the measurement parameters of the target devices, and measuring all the target devices on the global image according to the measurement parameters comprises:
receiving external contour information and internal shape information of the target device;
traversing and matching all devices on the global image information according to the external contour information and the internal shape information, and screening out all the target devices;
and measuring all the target devices according to the measurement object information.
The line scanning measuring method provided by the embodiment of the invention has at least the following beneficial effects:
according to the line scanning measurement method, after scanning parameters are set according to a target object to be measured, driving control signals are output according to the set scanning parameters to drive and control a light source device and a line scanning camera, so that the light source device is matched with the line scanning camera to scan the target object to be measured according to a preset path, image information acquired by the line scanning camera is sequentially received, the received image information is spliced according to a receiving sequence to obtain global image information, and finally, on the obtained global image information, all target devices are measured according to measurement parameters, and measurement results are displayed simultaneously; after the overall scanning of the target object to be measured is rapidly completed in a line scanning mode to obtain global image information, all target devices are automatically measured on the global image information at one time according to measurement parameters, so that the technical problems that in the related art, when the target devices on a planar product are measured through a two-dimensional measurement method, the efficiency is low, and a large amount of manual operations are required by operators in the measurement process are solved.
According to other embodiments of the present invention, the line scan measurement method includes: one or more of point position information, point-to-point distance information, line segment length information, circle center position information, radius information of a circle, arc length information, arc circle center information and included angle information;
the measuring all the target devices according to the measurement object information comprises the following steps:
numbering all the target devices;
and measuring all the target devices according to the measurement object information, and displaying the measurement results after corresponding to the numbers of the target devices.
According to the line scan measurement method of other embodiments of the present invention, the traversing matching all devices on the global image according to the external contour information and the internal shape information, and screening out all the target devices further includes:
and marking similar devices on the global image, which are similar to the target device.
According to other embodiments of the present invention, the setting scan parameters according to the target object includes:
setting scanning starting position information, scanning ending position information and scanning height information according to the size information and the material information of the target object to be detected.
In a second aspect, one embodiment of the present invention provides a line sweep measuring device comprising:
the scanning parameter setting module is used for setting scanning parameters according to the target object to be detected;
the driving signal output module is used for outputting driving control signals according to the scanning parameters to drive the light source device and the line scanning camera to scan the target object to be detected according to a preset path;
the global image generation module is used for receiving the image information acquired by the line scanning camera one by one and splicing the received image information according to the receiving sequence to obtain global image information;
the measuring module is used for receiving the measuring parameters of the target devices and measuring all the target devices on the global image information according to the measuring parameters;
wherein the measurement parameters include external contour information, internal shape information, and measurement object information;
the receiving the measurement parameters of the target devices, and measuring all the target devices on the global image according to the measurement parameters comprises:
receiving external contour information and internal shape information of the target device;
traversing and matching all devices on the global image information according to the external contour information and the internal shape information, and screening out all the target devices;
and measuring all the target devices according to the measurement object information.
In a third aspect, one embodiment of the present invention provides a line sweep measurement system comprising: a light source device, a line scan camera device, and a line scan measuring device as described above;
the line scanning measuring device is respectively and electrically connected with the light source device and the line scanning camera device, and outputs a driving control signal for controlling the movement of the light source device and the line scanning camera device;
the line scanning camera device transmits the collected image information to the line scanning measuring device, and the line scanning measuring device splices the received image information according to the receiving sequence to obtain global image information;
the line scan measuring device is also used for receiving measurement parameters of target devices and measuring all the target devices on the global image according to the measurement parameters.
According to further embodiments of the present invention, the line scan measuring system includes a light source device including a light source module and a first movement mechanism;
the light source module is fixed on the first movement mechanism, and the working state of the first movement mechanism is controlled by the linear scanning measuring device.
According to further embodiments of the present invention, a line scan measurement system includes a line scan camera module and a second motion mechanism;
the line scanning camera module is fixed on the second movement mechanism, and the working state of the second movement mechanism is controlled by the line scanning measuring device.
In a fourth aspect, an embodiment of the present invention provides a computer-readable storage medium storing an executable program that is executed by a processor to implement the line sweep measuring method as described above.
Drawings
FIG. 1 is a schematic flow chart of a line sweep measuring method according to an embodiment of the present invention;
FIG. 2 is a flowchart of a step S400 in a line sweep measurement method according to an embodiment of the present invention;
FIG. 3 is a flowchart illustrating a method for measuring a line sweep according to an embodiment of the present invention in step S430;
FIG. 4 is a schematic diagram of a specific embodiment of a line scan measurement method for measuring a target device on global image information according to an embodiment of the present invention;
FIG. 5 is a schematic block diagram of a line scan measuring device according to an embodiment of the present invention;
FIG. 6 is a block diagram of an embodiment of a line sweep measuring system according to an embodiment of the present invention.
Detailed Description
The conception and technical effects of the present invention will be clearly and completely described in conjunction with the following examples to fully understand the objects, features and effects of the present invention. It is apparent that the described embodiments are only some embodiments of the present invention, but not all embodiments, and that other embodiments obtained by those skilled in the art without inventive effort are within the scope of the present invention based on the embodiments of the present invention.
In the description of the embodiments of the present invention, if "several" is referred to, it means more than one, if "multiple" is referred to, it is understood that the number is not included if "greater than", "less than", "exceeding", and it is understood that the number is included if "above", "below", "within" is referred to. If reference is made to "first", "second" it is to be understood as being used for distinguishing technical features and not as indicating or implying relative importance or implicitly indicating the number of technical features indicated or implicitly indicating the precedence of the technical features indicated.
Referring to fig. 1 and 2, an embodiment of the present invention provides a line scan measurement method, which includes the steps of:
s100, setting scanning parameters according to a target object to be detected;
in order to improve the applicability of the line scan measurement method, the target objects to be measured with different materials and different sizes can be measured, so that the scanning parameters need to be adjusted before specific line scan measurement is performed, and the line scan measurement method can be suitable for various different target objects to be measured.
S200, outputting a driving control signal according to the scanning parameters to drive the light source device and the line scanning camera to scan a target object to be detected according to a preset path;
the driving control signals comprise driving control signals of the light source device and driving control signals of the line scanning camera and are used for driving the light source device and the line scanning camera respectively. In this step, the preset path is determined according to specific scan parameters, for example, the size of the target to be measured included in the scan parameters is one of the important parameters for determining the preset path, and the complete image information can be obtained after multiple scans of the target to be measured are required under the condition that the scan width of the line scan camera is limited and the size (width) of the target to be measured is larger. In addition, as the materials of the target object to be measured are different, a bottom light source is sometimes needed, and a surface light source is sometimes needed, so that the line scanning camera can acquire complete image information of the target object to be measured by outputting different driving control signals according to different scanning parameters to drive the light source device and the line scanning camera to scan the target object to be measured according to a preset path.
S300, receiving image information acquired by the line scanning cameras one by one, and splicing the received image information to obtain global image information according to a receiving sequence;
in step S200, after the target object to be measured is scanned according to the preset path, a plurality of image information is obtained, and in step S300, the plurality of received image information is received, and the plurality of image information is spliced according to the receiving order, so that global image information of the target object to be measured is obtained, and the global image information can integrally represent structural information on the target object to be measured.
S400, receiving measurement parameters of the target devices, and measuring all the target devices on the global image information according to the measurement parameters.
The method comprises the steps of selecting a target device, wherein the measurement parameters of the target device are the measurement parameters of a specific device of a certain type on a target object to be measured, screening all the target devices on global image information, measuring the measurement parameters of all the target devices simultaneously and efficiently, and displaying all measurement results.
Wherein, the measurement parameters in step S400 include external contour information, internal shape information, and measurement object information, then step S400 includes the following sub-steps:
s410, receiving external contour information and internal shape information of a target device;
s420, traversing and matching all devices on the global image information according to the external contour information and the internal shape information, and screening out all target devices;
s430, measuring all target devices according to the measurement object information.
In this embodiment, in order to quickly screen out all target devices on the global image information, first, after external contour information and internal shape information of the target devices are received, all devices consistent with the received external contour information and internal shape information are traversed and matched on the global image information, so that all target devices can be screened out, and finally, all obtained target devices are measured according to measurement object information. Wherein, the external contour information and the internal shape information of the receiving target device are obtained by selecting the target device from the global image information frame.
According to the line scanning measurement method, after the whole scanning of the target object to be measured is completed rapidly in a line scanning mode to obtain global image information, all target devices are automatically measured on the global image information at one time according to measurement parameters, the technical problems that efficiency is low and a large amount of manual operations are required by operators in a measurement process when the target devices on a planar product are measured through a secondary element measurement method in the related art are solved, and the line scanning measurement method is efficient and reduces the manual operation of the operators.
Referring to fig. 3, in particular, in some embodiments, the measurement object information includes one or more of point position information, point-to-point distance information, line segment length information, arc center information, and included angle information. In this embodiment, the above-described embodiment S430 measures all target devices according to the measurement object, including:
s431, numbering all target devices;
s432, measuring all target devices according to the measured object information, and displaying the measurement results after corresponding to the numbers of the target devices.
In this embodiment, since all the screened target devices are required to be measured according to the measurement object information, and the measurement results are displayed, after all the target devices are screened out on the global image information, all the target devices need to be numbered, and each number corresponds to one target device one by one. Furthermore, after all the target devices are measured according to the measurement object information, measurement results corresponding to the numbers of the target devices are displayed, so that related measurement personnel can quickly and intuitively obtain the measurement object information of all the target devices according to the displayed measurement results.
In some embodiments, since more types of devices are usually disposed on the target to-be-measured object, and the structural shape of the target device to be measured may have a similar structural shape to other devices, in order to prompt the relevant measurer that a similar device exists on the current target to-be-measured object, the relevant measurer can be reminded that a similar device similar to the target device exists on the current target to-be-measured object and the position of the similar device is marked on the global image information by marking the similar device which has consistent external contour information with the target device and is inconsistent with the internal shape information of the target device while performing step S420 in the above embodiments. In this embodiment, by marking similar devices similar to the target device, it is possible to alert the relevant measurer that there is a similar device currently, thereby preventing the similar device from being mistakenly used as the target device for measurement.
In some embodiments, the step S100 of setting the scan parameters according to the target object to be measured includes: setting scanning starting position information, scanning ending position information and scanning height information according to size information and material information of the object to be detected. In this embodiment, in order to improve the applicability of the line scan measurement method provided by the embodiment of the present invention, before the target object to be measured is scanned, scan parameters are set, and different scan parameters are set according to different target objects to be measured, so that the line scan measurement method can adapt to target objects to be measured with different sizes and different materials, and improves the applicability of the line scan measurement method provided by the embodiment of the present invention.
The following describes a specific working procedure of a line sweep measuring method according to an embodiment of the present invention through a specific embodiment:
referring to fig. 4, in the present embodiment, the line scan width of the line scan camera is 1/2 of the width of the target object to be measured according to the size of the target object to be measured, and if the material of the target object to be measured is opaque, then corresponding scan start position information, scan end position information and scan height information can be set for the target object to be measured at this time. In this embodiment, since the line scanning width of the line scanning camera is 1/2 of the width of the target object to be measured, two scans are required to be performed on the target object to be measured, in order to save the scanning time of the line scanning camera and improve the measurement efficiency, the preset path of the scan is set to be that after the first scan is performed from the left end to the right end of the upper half area of the target object to be measured, the line scanning camera moves to the lower half area of the target object to be measured, then the second scan is performed from the right end to the left end of the lower half area of the target object to be measured, and the 2 image information obtained by the two scans are spliced to obtain global image information. At this time, by selecting any one of the first target device to the fourth target device as the target device on the global image information, taking the first target device as an example, after selecting the target device, and selecting the measurement object information as the distance between the midpoints of two long (the first target device is rectangular) pieces of the first target device (i.e., the measurement object information is the distance information from the point a to the point b), before measuring on the global image information, traversing all devices on the matching global image information according to the external contour information and the internal shape information of the selected first target device, and further screening out the second target device, the third target device and the fourth target device, and in addition, marking similar devices on the global image information, wherein the determination conditions of the similar devices are as follows: the outer contour information is identical but the inner shape information is not identical. In this embodiment, after all target devices are screened, numbering is performed according to the sequence obtained by scanning all target devices on the global image information, the distance information from a point a to a point b on all target devices is measured, and after each measurement result corresponds to the number of the target device, the measurement results of a plurality of target devices are displayed on the same page. Obviously, after global image information is obtained, the same target device can be measured by multiple different measurement object information, and after the measurement of the current target device is completed, the next target device can be selected for measurement. The line scanning measuring method provided by the embodiment of the invention can be used for automatically measuring all target devices at one time according to the measuring parameters on the global image information after the whole scanning of the target object to be measured is completed quickly in a line scanning mode to obtain the global image information, so that the technical problems that the efficiency is low and a great amount of manual operations are required by operators in the measuring process when the target devices on the planar product are measured by a secondary element measuring method in the related technology are solved.
Referring to fig. 5, an embodiment of the present invention provides a line sweep measuring apparatus including:
the scanning parameter setting module is used for setting scanning parameters according to the target object to be detected;
the driving signal output module is used for outputting driving control signals according to the scanning parameters to drive the light source device and the line scanning camera to scan the target object to be detected according to a preset path;
the global image generation module is used for receiving the image information acquired by the line scanning camera one by one and splicing the plurality of received image information according to the receiving sequence to obtain global image information;
the measuring module is used for receiving the measuring parameters of the target devices and measuring all the target devices on the global image information according to the measuring parameters;
wherein the measurement parameters include external contour information, internal shape information, and measurement object information;
receiving measurement parameters of the target devices, and measuring all the target devices on the global image according to the measurement parameters comprises:
receiving external contour information and internal shape information of a target device;
traversing and matching all devices on the global image information according to the external contour information and the internal shape information, and screening out all target devices;
and measuring all target devices according to the measured object information.
In this embodiment, the scan parameter setting module determines specific scan parameters by receiving the target object to be measured input by the related measurement personnel, for example, sets different scan start position information, scan end position information and scan height information according to the target object to be measured with different sizes, and selects different light source devices (for example, selects a surface light source or a bottom light source) according to the materials of the different target object to be measured, so that the line scan measuring device can adapt to various different types of target objects to be measured, and improves applicability of the line scan measuring device. In this embodiment, the driving control signals output by the driving signal output module include a light source driving control signal and a line scanning driving control signal, which are respectively used for driving the light source device and the line scanning device. In addition, the output driving control signals (including the light source driving control signals and the line scanning driving control signals) enable the light source device and the line scanning camera to scan the target object to be detected according to a preset path, wherein the preset path is also determined according to the received scanning parameters, and the line scanning camera cannot completely scan the whole target object to be detected at one time, so that the global image information is obtained by splicing the image information obtained by scanning the line scanning camera after the target object to be detected is required to be scanned for a plurality of times. In some implementations, the preset path is typically an "arcuate" scan path, such as: after the line scanning camera scans from the left to the right of the target object to be measured, the line scanning camera moves downwards according to the scanning width during the second scanning, scans from the right to the left of the target object to be measured, and changes the scanning direction from the left to the right of the target object to be measured until the target object to be measured is completely scanned and then received when the target object to be measured is scanned for the third time, and the scanning time of the line scanning camera can be effectively reduced and the working efficiency of the line scanning measuring device is improved by setting the preset path into a Z shape. In this embodiment, after scanning according to a preset path, the line scanning camera sequentially sends the scanned image information to the global image generation module, and the global image generation module splices the received image information into global image information according to the receiving sequence of the image information. After global image information is obtained through splicing, the measurement module measures all target devices on the global image information according to the received measurement parameters of the target devices. The global image information generally has a plurality of types of devices, and is generally measured for a device of a specific type, so after receiving the measured parameters of the target devices, all the target devices are screened out on the global image and numbered, each target parameter is measured, and the measured result is displayed after corresponding to the target device.
The principle of the process of measuring the target object by the line scanning measuring device in the embodiment of the invention corresponds to the principle of the process of measuring the target object by the line scanning measuring method in any embodiment by mutual reference.
Referring to fig. 6, one embodiment of the present invention provides a wire sweep measuring system including a light source device, a wire sweep camera device, and the wire sweep measuring device described in the above embodiments; the line scanning measuring device is respectively and electrically connected with the light source device and the line scanning camera device, and outputs a driving control signal for controlling the movement of the light source device and the line scanning camera device after receiving scanning parameters of a target object to be measured. Meanwhile, the line scanning camera device transmits the scanned image information to the line scanning measuring device, the line scanning measuring device splices the received image information according to the receiving sequence to obtain global image information, and the line scanning measuring device measures all target devices according to the measuring parameters on the global image information after receiving the measuring parameters of the target devices. In the embodiment of the invention, the principle of the process of measuring the target object by the line scanning measuring device and the principle of the process of measuring the target object by the line scanning measuring method in any embodiment are mutually referred to and correspond.
In some embodiments, the line sweep measuring device comprises a computer loaded with a program capable of executing the line sweep measuring method described in any of the embodiments above. After the related measuring personnel inputs the information of the target object to be measured into the computer, the computer automatically determines corresponding scanning parameters, the computer carries out driving control on the light source device and the line scanning camera device according to the scanning parameters, and finally the computer displays the measuring result of the target device.
In some embodiments, a light source apparatus includes a light source module and a first movement mechanism; the light source module is fixed on the first movement mechanism, and the working state of the first movement mechanism is controlled by the wire sweep measuring device (namely a computer). In this embodiment, the light source module may be implemented by an LED light source, where the LED light source is fixed on the first motion mechanism and moves along with the movement of the first motion mechanism, so as to provide a clear image scanning environment for the line scanning camera device.
In some embodiments, the line scan camera device includes a line scan camera module and a second motion mechanism; the line scanning camera module is fixed on the second motion mechanism, and the working state of the second motion mechanism is controlled by the line scanning measuring device (namely a computer). In this example, the line scanning camera module may be implemented by a CCD camera, after the CCD camera is electrically connected to the computer, the image information of the scanned target object to be measured is transmitted to the computer, after the computer receives the image information, the processing procedure of the image information and the line scanning measurement method in any embodiment are referred to each other correspondingly, and finally the computer displays the measurement results of all the target devices.
An embodiment of the present invention also provides a computer-readable storage medium storing a computer-executable program that, when executed by a processor, implements the line sweep measurement method set forth in any of the above embodiments.
The embodiments of the present invention have been described in detail with reference to the accompanying drawings, but the present invention is not limited to the above embodiments, and various changes can be made within the knowledge of one of ordinary skill in the art without departing from the spirit of the present invention. Furthermore, embodiments of the invention and features of the embodiments may be combined with each other without conflict.
Claims (7)
1. A method of line sweep measurement comprising:
setting scanning parameters according to a target object to be detected;
outputting a driving control signal according to the scanning parameters to drive a light source device and a line scanning camera to scan the target object to be detected according to a preset path;
receiving the image information acquired by the line scanning cameras one by one, and splicing the received image information to obtain global image information according to a receiving sequence;
receiving measurement parameters of a target device, and measuring all the target devices on the global image information according to the measurement parameters;
wherein the measurement parameters include external contour information, internal shape information, and measurement object information;
the receiving the measurement parameters of the target devices, and measuring all the target devices on the global image according to the measurement parameters comprises:
receiving external contour information and internal shape information of the target device;
traversing and matching all devices on the global image information according to the external contour information and the internal shape information, and screening out all the target devices;
measuring all the target devices according to the measurement object information;
the measurement object information includes: one or more of point position information, point-to-point distance information, line segment length information, circle center position information, radius information of a circle, arc length information, arc circle center information and included angle information;
the measuring all the target devices according to the measurement object information comprises the following steps:
numbering all the target devices;
measuring all the target devices according to the measurement object information, and displaying the measurement results after corresponding to the numbers of the target devices;
the setting of the scan parameters according to the target object to be measured includes:
setting scanning starting position information, scanning ending position information and scanning height information according to the size information and the material information of the target object to be detected.
2. The line scan measurement method according to claim 1, wherein said traversing all devices on the global image based on the external contour information and the internal shape information, and screening out all the target devices, further comprises:
and marking similar devices on the global image, which are similar to the target device.
3. A line sweep measuring device, comprising:
the scanning parameter setting module is used for setting scanning parameters according to the target object to be detected;
the driving signal output module is used for outputting driving control signals according to the scanning parameters to drive the light source device and the line scanning camera to scan the target object to be detected according to a preset path;
the global image generation module is used for receiving the image information acquired by the line scanning camera one by one and splicing the received image information according to the receiving sequence to obtain global image information;
the measuring module is used for receiving the measuring parameters of the target devices and measuring all the target devices on the global image information according to the measuring parameters;
wherein the measurement parameters include external contour information, internal shape information, and measurement object information;
the receiving the measurement parameters of the target devices, and measuring all the target devices on the global image according to the measurement parameters comprises:
receiving external contour information and internal shape information of the target device;
traversing and matching all devices on the global image information according to the external contour information and the internal shape information, and screening out all the target devices;
measuring all the target devices according to the measurement object information;
the measurement object information includes: one or more of point position information, point-to-point distance information, line segment length information, circle center position information, radius information of a circle, arc length information, arc circle center information and included angle information;
the measuring all the target devices according to the measurement object information comprises the following steps:
numbering all the target devices;
measuring all the target devices according to the measurement object information, and displaying the measurement results after corresponding to the numbers of the target devices;
the setting of the scan parameters according to the target object to be measured includes:
setting scanning starting position information, scanning ending position information and scanning height information according to the size information and the material information of the target object to be detected.
4. A line sweep measurement system comprising: a light source device, a line scan camera device and a line scan measuring device as claimed in claim 3;
the line scanning measuring device is respectively and electrically connected with the light source device and the line scanning camera device, and outputs a driving control signal for controlling the movement of the light source device and the line scanning camera device;
the line scanning camera device transmits the collected image information to the line scanning measuring device, and the line scanning measuring device splices the received image information according to the receiving sequence to obtain global image information;
the line scan measuring device is also used for receiving measurement parameters of target devices and measuring all the target devices on the global image according to the measurement parameters.
5. The line scan measurement system of claim 4 wherein said light source device comprises a light source module and a first motion mechanism;
the light source module is fixed on the first movement mechanism, and the working state of the first movement mechanism is controlled by the linear scanning measuring device.
6. The wire sweep measurement system of claim 4 or 5, wherein the wire sweep camera device includes a wire sweep camera module and a second motion mechanism;
the line scanning camera module is fixed on the second movement mechanism, and the working state of the second movement mechanism is controlled by the line scanning measuring device.
7. A computer-readable storage medium, characterized in that the computer-readable storage medium stores an executable program that is executed by a processor to implement the line sweep measuring method according to claim 1 or 2.
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