CN116859132A - High-frequency waveform testing method, device, tester and storage medium - Google Patents
High-frequency waveform testing method, device, tester and storage medium Download PDFInfo
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R29/00—Arrangements for measuring or indicating electric quantities not covered by groups G01R19/00 - G01R27/00
- G01R29/02—Measuring characteristics of individual pulses, e.g. deviation from pulse flatness, rise time or duration
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R29/00—Arrangements for measuring or indicating electric quantities not covered by groups G01R19/00 - G01R27/00
- G01R29/02—Measuring characteristics of individual pulses, e.g. deviation from pulse flatness, rise time or duration
- G01R29/023—Measuring pulse width
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R29/00—Arrangements for measuring or indicating electric quantities not covered by groups G01R19/00 - G01R27/00
- G01R29/04—Measuring form factor, i.e. quotient of root-mean-square value and arithmetic mean of instantaneous value; Measuring peak factor, i.e. quotient of maximum value and root-mean-square value
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Abstract
The application discloses a high-frequency waveform testing method, a device, a tester and a storage medium, belonging to the technical field of digital testers, wherein the high-frequency waveform testing method comprises the following steps: determining a sampling period of the low-frequency sampling waveform; determining a trigger level according to the to-be-detected high-frequency waveform; sampling the high-frequency waveform to be detected by using the low-frequency sampling waveform for a preset test time based on the trigger level to obtain a target waveform of the reciprocating cycle; determining a circulation parameter of the target waveform according to the target waveform; and determining waveform parameters of the to-be-detected high-frequency waveform according to the cycle parameters and the sampling period. According to the method, high-frequency sampling is not needed, the high-frequency waveform parameters can be tested only by using a sampling waveform with a lower frequency, and the parameters of the high-frequency waveform can be tested simply and accurately.
Description
Technical Field
The application belongs to the technical field of waveform testing, and particularly relates to a high-frequency waveform testing method, a device, a tester and a storage medium.
Background
With the progress of waveform parameter measurement technology, the accuracy requirement on high-frequency waveform parameters is higher and higher. Existing high frequency waveform testing generally relies on bandwidth boosting, and according to the nyquist sampling theorem, parameters of waveforms must be measured using a sampling rate that is 2 times the bandwidth of the signal to be tested, for example, a system using a 1GHz bandwidth tests waveforms below 500 MHz.
However, the actual situation is that the high-frequency sampling rate is difficult to achieve, and for the purpose of accurate sampling, the sampling rate of the signal to be detected is generally 3-5 times that of the signal to be detected.
Disclosure of Invention
The application aims to provide a high-frequency waveform testing method, a device, a tester and a storage medium for testing parameters of high-frequency waves.
According to a first aspect of an embodiment of the present application, there is provided a high-frequency waveform testing method, including:
determining a sampling period of the low-frequency sampling waveform;
determining a trigger level according to the to-be-detected high-frequency waveform;
sampling the high-frequency waveform to be detected by using the low-frequency sampling waveform for a preset test time based on the trigger level to obtain a target waveform of the reciprocating cycle;
determining a circulation parameter of the target waveform according to the target waveform;
and determining waveform parameters of the to-be-detected high-frequency waveform according to the cycle parameters and the sampling period.
In some alternative embodiments of the present application, the step of determining the sampling period of the low frequency sampling waveform comprises:
acquiring a period of the to-be-detected high-frequency waveform to determine the expected period precision;
and determining the sampling period of the low-frequency sampling waveform by adopting a preset low-frequency period relation according to the period of the high-frequency waveform to be detected and the expected period precision.
In some alternative embodiments of the present application, the preset low frequency periodic relation is:
K＝P 0 /P 2
P 1 ＝P 2 *K+P A
wherein K is an integer, P 1 Sampling period, P, of the low frequency sampled waveform 0 Is the period lower limit of the low-frequency sampling waveform, P 2 For the expected period of the high-frequency waveform to be measured, P A For a desired cycle accuracy.
In some alternative embodiments of the application, the waveform parameters include at least one of: the period of the high-frequency waveform to be detected, and the rising edge time or the falling edge time of the high-frequency waveform to be detected.
In some alternative embodiments of the present application, the waveform parameter is the period of the high frequency waveform to be measured;
a step of acquiring a target waveform of a reciprocation cycle, comprising:
acquiring a plurality of periodic trigger points, wherein the periodic trigger points are rising edge trigger points;
distinguishing high level and low level in a plurality of period trigger points to obtain a first target waveform;
a step of determining a cycle parameter of a target waveform from the target waveform, comprising:
and determining the number of the periodic triggering high levels and the number of the periodic triggering low levels in each cycle of the target waveform according to the first target waveform.
In some optional embodiments of the present application, the step of determining the waveform parameter of the to-be-detected high frequency waveform according to the cycle parameter and the sampling period, specifically, the period of the to-be-detected high frequency waveform is obtained by calculating the following formula:
P 3 ＝P 1 (M+N)/(2(M+N)+1)
wherein P is 1 P is the sampling period of the low frequency sampling waveform 3 And M is the number of high levels in each cycle, and N is the number of low levels in each cycle for the period of the high-frequency waveform to be detected.
In some optional embodiments of the present application, the waveform parameter is a rising edge time or a falling edge time of the high frequency waveform to be measured;
the step of determining the trigger level according to the high frequency waveform to be detected comprises the following steps:
determining an initial trigger level of a rising edge or a falling edge according to the highest level of the to-be-detected high-frequency waveform, and determining a final trigger level of the rising edge or the falling edge according to the highest level of the to-be-detected high-frequency waveform;
a step of acquiring a target waveform of a reciprocation cycle, comprising:
acquiring a plurality of edge trigger points;
distinguishing high level and low level in a plurality of edge trigger points to obtain a second target waveform;
a step of determining a cycle parameter of a target waveform from the target waveform, comprising:
determining the number of edge-triggered high levels and the number of edge-triggered low levels in each cycle of the second target waveform;
determining waveform parameters of the to-be-detected high-frequency waveform according to the cycle parameters and the sampling period, wherein the method comprises the following steps of:
determining the starting trigger level moment and the ending trigger level moment of the rising edge or the falling edge according to the number of the edge trigger high levels, the number of the edge trigger low levels and the sampling period in each cycle;
and determining the rising edge time or the falling edge time of the to-be-detected high-frequency waveform according to the starting trigger level time and the ending trigger level time.
According to a second aspect of an embodiment of the present application, there is provided a high-frequency waveform testing apparatus including:
the sampling wave period determining module is used for determining the sampling period of the low-frequency sampling waveform;
the trigger level determining module is used for determining a trigger level according to the to-be-detected high-frequency waveform;
the sampling module is used for sampling the to-be-detected high-frequency waveform for a preset test time by utilizing the low-frequency sampling waveform based on the trigger level so as to acquire a target waveform of the reciprocating cycle;
the circulation parameter determining module is used for determining circulation parameters of the target waveform according to the target waveform;
the to-be-detected high-frequency waveform determining module is used for determining waveform parameters of the to-be-detected high-frequency waveform according to the circulation parameters and the sampling period.
In some alternative embodiments of the present application, a sampling wave period determination module includes:
the estimation unit is used for acquiring the period of the to-be-detected high-frequency waveform so as to determine the expected period precision;
the sampling period determining unit is used for determining the sampling period of the low-frequency sampling waveform by adopting a preset low-frequency period relation according to the period of the high-frequency waveform to be detected and the expected period precision.
In some optional embodiments of the present application, when the waveform parameter is a period of the to-be-detected high frequency waveform, the sampling module includes:
the periodic trigger point acquisition unit is used for acquiring a plurality of periodic trigger points, wherein the periodic trigger points are rising edge trigger points;
the periodic trigger point distinguishing unit is used for distinguishing high level and low level in a plurality of periodic trigger points to obtain an acquisition waveform;
the cycle parameter determining module is specifically configured to determine the number of the periodically triggered high levels and the number of the periodically triggered low levels in each cycle of the acquisition waveform according to the acquisition waveform.
In some optional embodiments of the present application, when the waveform parameter is a rising edge time or a falling edge time of the high-frequency waveform to be detected, the trigger level determining module is specifically configured to determine an initial trigger level of the rising edge or the falling edge according to a highest level of the high-frequency waveform to be detected, and determine a termination trigger level of the rising edge or the falling edge according to the highest level of the high-frequency waveform to be detected;
a sampling module, comprising:
an edge trigger point acquisition unit configured to acquire a plurality of edge trigger points;
an edge trigger point distinguishing unit for distinguishing high level and low level in a plurality of edge trigger points to obtain a target waveform;
the cycle parameter determining module is specifically used for determining the number of edge-triggered high levels and the number of edge-triggered low levels in each cycle of the target waveform;
the to-be-detected high-frequency waveform determining module comprises:
the trigger time determining unit is used for determining the initial trigger level moment and the final trigger level moment of the rising edge or the falling edge according to the number of the edge trigger high levels, the number of the edge trigger low levels and the sampling period in each cycle;
and the rising edge and falling edge time determining unit is used for determining the rising edge time or the falling edge time of the to-be-detected high-frequency waveform according to the starting trigger level time and the ending trigger level time.
According to a third aspect of the embodiments of the present application, there is provided a testing machine, which uses the high-frequency waveform testing method according to any one of the embodiments of the first aspect to detect waveforms.
According to a fourth aspect of embodiments of the present application, there is provided a readable storage medium having stored thereon a program or instructions which when executed by a processor of a server implements a high frequency waveform testing method as shown in any one of the embodiments of the first aspect.
The technical scheme of the application has the following beneficial technical effects:
the method of the embodiment of the application obtains the target waveform by sampling the to-be-detected high-frequency waveform by utilizing the low-frequency sampling waveform, and determines the waveform parameters of the to-be-detected high-frequency waveform according to the target waveform. According to the method, high-frequency sampling is not needed, the high-frequency waveform parameters can be tested only by using a sampling waveform with a lower frequency, and the parameters of the high-frequency waveform can be tested simply and accurately.
Drawings
FIG. 1 is a flow chart of a method for testing a high frequency waveform according to an exemplary embodiment of the application;
FIG. 2 is a schematic diagram of waveforms during a test cycle in an exemplary embodiment of the present application;
FIG. 3 is a schematic waveform diagram of a test of rising or falling edge time in an exemplary embodiment of the application;
FIG. 4 is a schematic diagram of a high frequency waveform testing apparatus according to an exemplary embodiment of the present application;
fig. 5 is a schematic diagram of a tester according to an exemplary embodiment of the present application.
Detailed Description
The objects, technical solutions and advantages of the present application will become more apparent by the following detailed description of the present application with reference to the accompanying drawings. It should be understood that the description is only illustrative and is not intended to limit the scope of the application. In addition, in the following description, descriptions of well-known structures and techniques are omitted so as not to unnecessarily obscure the present application.
A layer structure schematic diagram according to an embodiment of the present application is shown in the drawings. The figures are not drawn to scale, wherein certain details may be exaggerated and some details may be omitted for clarity. The shapes of the various regions, layers and relative sizes, positional relationships between them shown in the drawings are merely exemplary, may in practice deviate due to manufacturing tolerances or technical limitations, and one skilled in the art may additionally design regions/layers having different shapes, sizes, relative positions as actually required.
It will be apparent that the described embodiments are some, but not all, embodiments of the application. All other embodiments, which can be made by those skilled in the art based on the embodiments of the application without making any inventive effort, are intended to be within the scope of the application.
In the description of the present application, it should be noted that the terms "first," "second," and "third" are used for descriptive purposes only and are not to be construed as indicating or implying relative importance.
In addition, the technical features of the different embodiments of the present application described below may be combined with each other as long as they do not collide with each other.
The method, the device, the tester and the storage medium for testing the high-frequency waveform provided by the embodiment of the application are described in detail below through specific embodiments and application scenes thereof with reference to the accompanying drawings.
As shown in fig. 1, in a first aspect of an embodiment of the present application, there is provided a high-frequency waveform testing method, including:
step S110: determining a sampling period of the low-frequency sampling waveform;
step S120: determining a trigger level according to the to-be-detected high-frequency waveform;
step S130: sampling the high-frequency waveform to be detected by using the low-frequency sampling waveform for a preset test time based on the trigger level to obtain a target waveform of the reciprocating cycle;
step S140: determining a circulation parameter of the target waveform according to the target waveform;
step S150: and determining waveform parameters of the to-be-detected high-frequency waveform according to the cycle parameters and the sampling period.
The method of the embodiment obtains a target waveform by sampling the to-be-detected high-frequency waveform by utilizing the low-frequency sampling waveform, and determines waveform parameters of the to-be-detected high-frequency waveform according to the target waveform. According to the method, high-frequency sampling is not needed, the high-frequency waveform parameters can be tested only by using a sampling waveform with a lower frequency, and the parameters of the high-frequency waveform can be tested simply and accurately.
For a clearer description, the following description will be given for the above steps, respectively:
first, step S110: a sampling period of the low frequency sampling waveform is determined.
The step of determining the sampling period of the low-frequency sampling waveform is because not all low-frequency waveforms have higher precision in sampling the high-frequency waveform to be detected, and the low-frequency sampling waveform in a specific sampling period range is needed. The particular sampling period may be determined based on the expected period of the high frequency waveform to be detected and the expected period accuracy.
Step S120 follows: and determining the trigger level according to the to-be-detected high-frequency waveform.
The step of determining the trigger level may be based on the waveform parameters of a particular test. For example, if the period of the waveform is tested, the trigger level setting may be performed according to the rising edge of the high frequency waveform to be detected; if the rising edge time or the falling edge time of the test waveform is the rising edge time, namely, the rising edge time is 10 to 90 percent of the highest level, and the falling edge time is 90 to 10 percent of the highest level, 90 to 10 percent of the highest level of the to-be-detected high-frequency waveform can be used as the trigger level; if the high level time or the low level time of the test waveform is detected, 90% and 10% of the highest level of the to-be-detected high frequency waveform can be used as trigger levels, the high level time is the duration of more than 90% of the highest level, and the low level time is the duration of less than 10% of the highest level; if the time delay from one trigger point to another trigger point of a waveform is tested, the trigger levels of the two trigger points can be set as required, so that the delay time from one trigger point of one waveform to one trigger point of the other waveform can be tested. It should be noted that 10% and 90% of the highest level are only for illustration, and the application process may set the trigger level according to a specific practical situation.
Step S130 follows: and based on the trigger level, sampling the to-be-detected high-frequency waveform by using the low-frequency sampling waveform for a preset test time to acquire a target waveform of the reciprocating cycle.
The preset test time in this step is to collect the complete target waveform, and the specific time can be determined according to the test requirement. The step can acquire the high-frequency waveform to be tested by outputting the low-frequency pattern waveform, and acquire the target waveform after the preset test time.
Step S140 follows: and determining the circulation parameters of the target waveform according to the target waveform.
After the target waveform is obtained, determining a high-low level arrangement rule and the number of high-low levels in each cycle of the target waveform according to the target waveform. When testing the period of the high-frequency waveform to be detected, obtaining a first target waveform; and when the rising edge time or the falling edge time of the to-be-detected high-frequency waveform is tested, obtaining a second target waveform.
Finally, step S150: and determining waveform parameters of the to-be-detected high-frequency waveform according to the cycle parameters and the sampling period.
The step can calculate the waveform parameters of the to-be-detected high-frequency waveform by only collecting the to-be-detected high-frequency waveform by using the low-frequency waveform, and the system with very high bandwidth is not required to test the to-be-detected high-frequency waveform.
In some embodiments, step S110: determining a sampling period of a low frequency sampling waveform, comprising:
step S111: acquiring a period of the to-be-detected high-frequency waveform to determine the expected period precision;
specifically, according to the past high-frequency waveform or the estimated period of the high-frequency waveform to be detected, determining the expected period precision according to the estimated period of the high-frequency waveform to be detected;
step S112: and determining the sampling period of the low-frequency sampling waveform by adopting a preset low-frequency period relation according to the period of the high-frequency waveform to be detected and the expected period precision.
Specifically, the preset low-frequency periodic relation is:
K＝P 0 /P 2
P 1 ＝P 2 *K+P A
wherein K is an integer, P 1 Sampling period, P, of the low frequency sampled waveform 0 Is the period lower limit of the low-frequency sampling waveform, P 2 For the expected period of the high-frequency waveform to be measured, P A For a desired cycle accuracy.
In this embodiment, K is an integer upward, so that the number of periods including the to-be-detected high-frequency waveform in one period of the low-frequency sampling waveform can be calculated, and then the sampling period of the low-frequency sampling waveform can be determined by using the integer K, the expected period of the to-be-detected high-frequency waveform, and the expected period precision. The desired cycle accuracy in this embodiment can be set according to actual needs. By way of example, the desired period accuracy may be 0.1ns, 0.2ns, 0.3ns.
In some embodiments, the waveform parameters of the high frequency waveform to be detected include at least one of: the method comprises the steps of detecting the period of the high-frequency waveform to be detected, the rising edge time or the falling edge time of the high-frequency waveform to be detected, the high-level time or the low-level time of the high-frequency waveform to be detected or the time delay from one trigger point to another trigger point of the high-frequency waveform to be detected.
In some embodiments, when the waveform parameter is the period of the high frequency waveform to be measured; step S130: acquiring a target waveform for a reciprocation cycle, comprising:
step S1311: acquiring a plurality of periodic trigger points, wherein the periodic trigger points are rising edge trigger points;
step S1312: distinguishing high level and low level in a plurality of period trigger points to obtain a first target waveform;
in some embodiments, step S140: determining a cycle parameter of the target waveform from the target waveform, comprising:
step S1411: and determining the number of the periodic triggering high levels and the number of the periodic triggering low levels in each cycle of the first target waveform according to the first target waveform.
In some embodiments, step S150: determining waveform parameters of the to-be-detected high-frequency waveform according to the cycle parameters and the sampling period, and specifically obtaining the period of the to-be-detected high-frequency waveform through the following formula:
P 3 ＝P 1 (M+N)/(2(M+N)+1)
wherein P is 1 Sampling period, P, of the low frequency sampled waveform 3 And M is the number of high levels in each cycle, and N is the number of low levels in each cycle.
By way of example, as shown in fig. 2, the frequency of the to-be-detected high frequency waveform is tested by using the low frequency sampling waveform, for example, the period of the low frequency sampling waveform is 5.1ns, and the period of the to-be-detected high frequency waveform is 2.5ns, so that each period of the low frequency sampling waveform can take the position of one to-be-detected high frequency waveform period, then judge whether the position is high level or low level, delay 0.1ns for each cycle (cycle), and finally complete the acquisition of the whole 2.5ns period of the to-be-detected high frequency waveform through 25 cycles. Finally, a series of first target waveforms can be obtained, and 111110 … … is obtained, wherein 0 represents that the waveform to be detected is in a low level state at the corresponding moment, and 1 represents that the waveform to be detected is in a high level state at the corresponding moment. For example, after long acquisition, the average obtained is N1 and M0 reciprocating cycles, so that the number of 1 and the number of 0 are substituted into the period calculation formula P 3 ＝P 1 And (M+N)/(2 (M+N) +1), and calculating the period of the to-be-detected high-frequency waveform.
In another embodiment, when the waveform parameter is a rising edge time or a falling edge time of the high-frequency waveform to be measured; step S120: determining a trigger level according to the to-be-detected high frequency waveform, including:
step S121: and determining the initial trigger level of the rising edge or the falling edge according to the highest level of the to-be-detected high-frequency waveform, and determining the final trigger level of the rising edge or the falling edge according to the highest level of the to-be-detected high-frequency waveform.
Specifically, step S130: acquiring a target waveform for a reciprocation cycle, comprising:
step S1321: acquiring a plurality of edge trigger points;
step S1322: and distinguishing high level from low level in the plurality of edge trigger points to obtain a second target waveform.
Specifically, step S140: determining a cycle parameter of the target waveform from the target waveform, comprising:
step S1421: the number of edge-triggered high levels and the number of edge-triggered low levels in each cycle of the second target waveform are determined.
Specifically, step S150: determining waveform parameters of the to-be-detected high-frequency waveform according to the cycle parameters and the sampling period, wherein the method comprises the following steps:
step S1511: determining the starting trigger level moment and the ending trigger level moment of the rising edge or the falling edge according to the number of the edge trigger high levels, the number of the edge trigger low levels and the sampling period in each cycle; specifically, the starting trigger level time of the rising edge, the ending trigger level time of the rising edge, the starting trigger level time of the falling edge and the ending trigger level time of the falling edge are determined, and are shown in fig. 3 in detail.
Step S1512: and determining the rising edge time or the falling edge time of the to-be-detected high-frequency waveform according to the initial trigger level time and the termination trigger level time.
Specifically, the rising edge time of the to-be-detected high-frequency waveform is determined according to the starting trigger level time of the rising edge and the ending trigger level time of the rising edge, and the rising edge time of the to-be-detected high-frequency waveform is determined according to the starting trigger level time of the falling edge and the ending trigger level time of the falling edge.
In this embodiment, the rising edge start trigger level and the ending trigger level or the falling edge start trigger level and the ending trigger level are set, and the rising edge or the falling edge time is calculated by collecting a plurality of edge trigger points.
Illustratively, 10% and 90% trigger point positions are tested by sampling the edges of the low frequency sampled waveform with 10% and 90% trigger points of the highest level of the high frequency waveform to be detected. For example, the period of the low-frequency sampling waveform is 5.1ns, the period of the to-be-detected high-frequency waveform is 2.5ns, so that the trigger point can still be sampled with the resolution of 0.1ns due to the difference between the periods of the low-frequency sampling waveform and the to-be-detected high-frequency waveform, and the low-frequency sampling waveform has two trigger levels of VOH and VOL, so that 10% and 90% of the trigger points can be sampled simultaneously. For example, using the VOH to sample 90% trigger points, as shown in fig. 3, the potential state resulting in the second target waveform is denoted by 0000110000 …, similarly, 10% trigger points may be sampled using VOL to result in 001111111100, since the resolution (Tap) is the same for both the VOL and VOH trigger level acquisition processes, from the VOL acquisition to 1 to the VOH acquisition to 1, differing by 2 resolutions, that is, 2 resolutions for the 10% and 90% trigger point gap, and since each resolution is 0.1ns, the rising and falling edge times are 0.2ns.
The trigger points in the above embodiment, that is, the scan results of jumping at the two trigger level points of the VOH and the VOL, are higher than the trigger level to obtain the result 1 and lower than the trigger level to obtain the result 0, and the interval of the VOH, that is, the high level time, can be obtained through the scan results, otherwise, the interval of the VOL is obtained, that is, the low level time. For example, when the waveform parameter is the rising edge time or the falling edge time of the high-frequency waveform to be measured, for example, VOH is 2.5V, the highest level of the waveform is 3V, and a higher level than 2.5V is used as the high level, the high level time is obtained by multiplying the number of each period 1 obtained by scanning with the VOH level reference by the resolution.
Similarly, when the waveform parameter is the time delay from one trigger point to another trigger point of the high-frequency waveform to be detected, the time delay from one trigger point to another trigger point of the waveform parameter of the high-frequency waveform to be detected can be obtained by obtaining the time delays of the VOH and the VOL trigger points, wherein one trigger point is the VOH, and the other trigger point is the VOL.
In summary, the method of the embodiment of the application tests various parameters of the high-frequency waveform to be detected through the low-frequency sampling waveform, and in order to improve the testing precision of the parameters, the period of the low-frequency sampling waveform can be adjusted, and the overall sampling resolution is improved, so that the sampling precision is improved.
It should be noted that, in the high-frequency waveform testing method provided by the embodiment of the present application, the execution body may be a high-frequency waveform testing device, or a control module of the high-frequency waveform testing device for executing the method of the high-frequency waveform testing. In the embodiment of the application, a method for executing high-frequency waveform test by using the high-frequency waveform test device is taken as an example, and the high-frequency waveform test device provided by the embodiment of the application is described.
As shown in fig. 4, in a second aspect of the embodiment of the present application, there is provided a high-frequency waveform testing apparatus including:
a sampling wave period determining module 410, configured to determine a sampling period of the low frequency sampling waveform;
the trigger level determining module 420 is configured to determine a trigger level according to the to-be-detected high frequency waveform;
the sampling module 430 is configured to sample the to-be-detected high frequency waveform with a low frequency sampling waveform for a preset test time based on the trigger level, so as to obtain a target waveform of the reciprocation cycle;
a loop parameter determination module 440 for determining a loop parameter of the target waveform according to the target waveform;
the to-be-detected high-frequency waveform determining module 450 is configured to determine waveform parameters of the to-be-detected high-frequency waveform according to the cycle parameters and the sampling period.
The device of the embodiment samples the to-be-detected high frequency waveform by using the low frequency sampling waveform through the sampling module 430 to obtain a target waveform, and determines waveform parameters of the to-be-detected high frequency waveform according to the target waveform through the to-be-detected high frequency waveform determining module 450. The device does not need high-frequency sampling, can realize the test of the parameters of the high-frequency waveform by only needing low-frequency sampling waveform with lower frequency, and can simply and accurately test the parameters of the high-frequency waveform.
In some embodiments, the sampling wave period determination module 410 includes:
the estimation unit is used for acquiring the period of the to-be-detected high-frequency waveform so as to determine the expected period precision;
the sampling period determining unit is used for determining the sampling period of the low-frequency sampling waveform by adopting a preset low-frequency period relation according to the period of the high-frequency waveform to be detected and the expected period precision.
In some embodiments, when the waveform parameter is a period of the high frequency waveform to be detected, the sampling module 430 includes:
the periodic trigger point acquisition unit is used for acquiring a plurality of periodic trigger points, wherein the periodic trigger points are rising edge trigger points;
the periodic trigger point distinguishing unit is used for distinguishing high level and low level in a plurality of periodic trigger points to obtain an acquisition waveform;
the cycle parameter determining module 440 is specifically configured to determine the number of cycle-triggered high levels and the number of cycle-triggered low levels in each cycle of the acquisition waveform according to the acquisition waveform.
In another embodiment, when the waveform parameter is a rising edge time or a falling edge time of the high-frequency waveform to be detected, the trigger level determining module 420 is specifically configured to determine an initial trigger level of the rising edge or the falling edge according to a highest level of the high-frequency waveform to be detected, and determine a final trigger level of the rising edge or the falling edge according to the highest level of the high-frequency waveform to be detected;
sampling module 430, comprising:
an edge trigger point acquisition unit configured to acquire a plurality of edge trigger points;
an edge trigger point distinguishing unit for distinguishing high level and low level in a plurality of edge trigger points to obtain a target waveform;
the cycle parameter determining module 440 is specifically configured to determine the number of edge-triggered high levels and the number of edge-triggered low levels in each cycle of the target waveform;
the to-be-detected high frequency waveform determining module 450 includes:
the trigger time determining unit is used for determining the initial trigger level time and the final trigger level time of the rising edge or the falling edge according to the number of the edge trigger high levels, the number of the edge trigger low levels and the sampling period in each cycle;
and the rising edge and falling edge time determining unit is used for determining the rising edge time or the falling edge time of the to-be-detected high-frequency waveform according to the initial trigger level time and the termination trigger level time.
The high-frequency waveform testing device in the embodiment of the application can be a device, and can also be a component, an integrated circuit or a chip in a terminal. The device may be a mobile electronic device or a non-mobile electronic device. By way of example, the mobile electronic device may be a cell phone, tablet computer, notebook computer, palm computer, vehicle mounted electronic device, wearable device, ultra-mobile personal computer (ultra-mobile personal computer, UMPC), netbook or personal digital assistant (personal digital assistant, PDA), etc., and the non-mobile electronic device may be a server, network attached storage (Network Attached Storage, NAS), personal computer (personal computer, PC), television (TV), teller machine or self-service machine, etc., and embodiments of the present application are not limited in particular.
The high-frequency waveform testing device in the embodiment of the application can be a device with an operating system. The operating system may be an Android operating system, an ios operating system, or other possible operating systems, and the embodiment of the present application is not limited specifically.
The high-frequency waveform testing device provided by the embodiment of the application can realize each process realized by the method embodiment of fig. 1, and in order to avoid repetition, the description is omitted here.
Optionally, as shown in fig. 5, the embodiment of the present application further provides a testing machine 500, which includes a processor 501, a memory 502, and a program or an instruction stored in the memory 502 and capable of running on the processor 501, where the program or the instruction implements each process of the above-mentioned high-frequency waveform testing method embodiment when executed by the processor 501, and the process can achieve the same technical effect, so that repetition is avoided and no further description is given here.
The embodiments of the present application have been described above with reference to the accompanying drawings, but the present application is not limited to the above-described embodiments, which are merely illustrative and not restrictive, and many forms may be made by those having ordinary skill in the art without departing from the spirit of the present application and the scope of the claims, which are to be protected by the present application.
Claims (10)
1. A method of testing a high frequency waveform, comprising:
determining a sampling period of the low-frequency sampling waveform;
determining a trigger level according to the to-be-detected high-frequency waveform;
sampling the high-frequency waveform to be tested for a preset test time by utilizing the low-frequency sampling waveform based on the trigger level so as to obtain a target waveform of reciprocating cycle;
determining a circulation parameter of the target waveform according to the target waveform;
and determining waveform parameters of the high-frequency waveform to be detected according to the cycle parameters and the sampling period.
2. The method of claim 1, wherein the step of determining the sampling period of the low frequency sampling waveform comprises:
acquiring a period of the to-be-detected high-frequency waveform to determine the expected period precision;
and determining the sampling period of the low-frequency sampling waveform by adopting a preset low-frequency period relation according to the high-frequency waveform period to be detected and the expected period precision.
3. The method of claim 2, wherein the predetermined low frequency periodic relation is:
K＝P 0 /P 2
P 1 ＝P 2 *K+P A
wherein K is an integer, P 1 Sampling period, P, of the low frequency sampled waveform 0 Is the period lower limit of the low-frequency sampling waveform, P 2 For the expected period of the high-frequency waveform to be measured, P A For a desired cycle accuracy.
4. A method of testing a high frequency waveform according to any one of claims 1-3, wherein the waveform parameters include at least one of: the period of the high-frequency waveform to be detected, the rising edge time or the falling edge time of the high-frequency waveform to be detected.
5. The method according to claim 4, wherein the waveform parameter is a period of the high-frequency waveform to be measured;
the step of acquiring a target waveform of a reciprocation cycle includes:
acquiring a plurality of periodic trigger points, wherein the periodic trigger points are rising edge trigger points;
distinguishing high level and low level in the plurality of periodic trigger points to obtain a first target waveform;
the step of determining the cycle parameters of the target waveform according to the target waveform comprises the following steps:
and determining the number of the periodic triggering high levels and the number of the periodic triggering low levels in each cycle of the first target waveform according to the first target waveform.
6. The method according to claim 5, wherein the step of determining the waveform parameter of the high-frequency waveform to be measured according to the cycle parameter and the sampling period is performed by calculating the period of the high-frequency waveform to be measured according to the following formula:
P 3 ＝P 1 (M+N)/(2(M+N)+1)
wherein P is 1 P is the sampling period of the low frequency sampling waveform 3 And M is the number of high levels in each cycle, and N is the number of low levels in each cycle for the period of the high-frequency waveform to be detected.
7. The method according to claim 4, wherein the waveform parameter is a rising edge time or a falling edge time of the high-frequency waveform to be tested;
the step of determining the trigger level according to the to-be-detected high-frequency waveform comprises the following steps:
determining an initial trigger level of a rising edge or a falling edge according to the highest level of the to-be-detected high-frequency waveform, and determining a final trigger level of the rising edge or the falling edge according to the highest level of the to-be-detected high-frequency waveform;
the step of acquiring a target waveform of a reciprocation cycle includes:
acquiring a plurality of edge trigger points;
distinguishing high level and low level in the edge trigger points to obtain a second target waveform;
the step of determining the cycle parameters of the target waveform according to the target waveform comprises the following steps:
determining the number of edge-triggered high levels and the number of edge-triggered low levels in each cycle of the second target waveform;
the step of determining the waveform parameters of the to-be-detected high-frequency waveform according to the cycle parameters and the sampling period includes:
determining the starting trigger level time and the ending trigger level time of the rising edge or the falling edge according to the number of the edge trigger high levels, the number of the edge trigger low levels and the sampling period in each cycle;
and determining rising edge time or falling edge time of the high-frequency waveform to be detected according to the initial trigger level time and the termination trigger level time.
8. A high frequency waveform testing apparatus, comprising:
the sampling wave period determining module is used for determining the sampling period of the low-frequency sampling waveform;
the trigger level determining module is used for determining a trigger level according to the to-be-detected high-frequency waveform;
the sampling module is used for sampling the high-frequency waveform to be tested for a preset test time by utilizing the low-frequency sampling waveform based on the trigger level so as to obtain a target waveform of reciprocating cycle;
the circulation parameter determining module is used for determining circulation parameters of the target waveform according to the target waveform;
and the to-be-detected high-frequency waveform determining module is used for determining waveform parameters of the to-be-detected high-frequency waveform according to the circulating parameters and the sampling period.
9. A testing machine for waveform detection using the high frequency waveform testing method of any one of claims 1 to 7.
10. A readable storage medium, characterized in that the readable storage medium has stored thereon a program or instructions which, when executed by a processor, implement the steps of the high frequency waveform testing method of any one of claims 1-7.
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