CN116819395B - Rail transit turnout fault analysis method and system - Google Patents
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Abstract
The invention relates to the technical field of rail transit, and discloses a rail transit turnout fault analysis method and a rail transit turnout fault analysis system, wherein the method comprises the following steps: scanning a rail transit turnout link to obtain a turnout voltage waveform; splicing the obtained turnout voltage waveforms in a periodic sheet form, and performing FFT spectrum analysis and calculation on domain points in the periodic sheet to obtain the phase, frequency and amplitude of the domain points in the single-period sheet; preprocessing domain points according to the phase, frequency and amplitude of the domain points in the single-period sheet, and generating a time domain curve for the preprocessed domain points in an arithmetic array mode; performing switch voltage waveform restoration according to the time domain curve to obtain switch voltage waveforms of a preset number of periodic slices; splicing the turnout voltage waveforms of the obtained preset number of periodic slices; comparing the switch voltage waveform obtained after splicing with a preset waveform table in a threshold value; and determining the state of the track traffic turnout according to the comparison result.
Description
Technical Field
The invention relates to the technical field of rail transit, in particular to a rail transit turnout fault analysis method and system.
Background
The signal interlocking system is core equipment for ensuring the running safety of the train in rail transit, and the turnout is used as connecting equipment for realizing the switching of the running rails of the train, so that the running safety and the efficiency of the train are directly influenced, and the state monitoring of the turnout is always a serious importance. With the development of the integration and intellectualization technology, under the situation of high density and ultra-large network, when the switch detects a fault, the interlocking system usually collects the switch position through an execution layer, and the execution layer collects three representation states (positioning, inversion and quarto) of the switch and reports the interlocking system. When the turnout fails and loses the meter, the execution layer reports the four-switch state to warn the turnout failure, inhibit the train from passing and ensure the driving safety. Switch failure is often caused by various complex reasons, such as: the reasons such as short circuit, circuit breaking, reverse connection, mixed line of the switch machine line and the like of the external display diode of the driving switch machine can cause switch meter losing, when faults occur, the execution layer only reports four states and does not analyze the reason of switch meter losing, so maintenance personnel are required to examine and repair the reason of meter losing, the faults are complicated in condition, the fault examination time is long, the train cannot normally run, and the operation efficiency is reduced.
Disclosure of Invention
The invention provides a rail transit turnout fault analysis method and system, which are used for solving the technical problems in the prior art.
According to a first aspect of the invention, a rail transit switch fault analysis method is provided.
The rail transit turnout fault analysis method comprises the following steps:
scanning a rail transit turnout link to obtain a turnout voltage waveform; splicing the obtained turnout voltage waveforms in a periodic sheet form, and performing FFT spectrum analysis and calculation on domain points in the periodic sheet to obtain the phase, frequency and amplitude of the domain points in the single-period sheet;
preprocessing domain points according to the phase, frequency and amplitude of the domain points in the single-period sheet, and generating a time domain curve for the preprocessed domain points in an arithmetic array mode; wherein the preprocessing includes random noise removal processing and noise direct current component removal processing;
performing switch voltage waveform restoration according to the time domain curve to obtain switch voltage waveforms of a preset number of periodic slices; splicing the turnout voltage waveforms of the obtained preset number of periodic slices;
comparing the switch voltage waveform obtained after splicing with a preset waveform table in a threshold value; determining the state of the track traffic turnout according to the comparison result; and judging whether the rail transit turnout has a fault or not and judging the fault reason according to the state of the rail transit turnout.
In addition, the rail transit turnout fault analysis method further comprises the following steps: before splicing the obtained turnout voltage waveforms in a periodic sheet form, carrying out equal proportion reduction on the turnout voltage waveforms to obtain turnout voltage waveforms with equal proportion reduction; and amplifying the switch voltage waveform with equal proportion in a differential mode, and biasing the switch voltage waveform subjected to differential amplification to rise above the zero point.
Wherein the number of domain points within a single periodic slice is 256.
The FFT spectrum analysis and calculation formula is as follows:
；
wherein An is a modulus; pn is the phase; fn is frequency; A/N is the amplitude; n is any point of 256 domain points, a and b represent complex numbers, and N is a domain point.
The calculation formula of the time domain curve is as follows:
；
wherein S is a time domain curve, adc is a DC component amplitude, and P 1 、P 2 、P 256 The phases of domain point 1, domain point 2, and domain point 256, m 1 、m 2 、m 256 Frequencies of domain point 1, domain point 2, and domain point 256, respectively, A 1 、A 2 、A 256 The magnitudes of Domain_Point 1, domain_Point 2, domain_Point 256, P, respectively i Is the circumference ratio.
According to a second aspect of the present invention, there is provided a rail transit switch failure analysis system.
The rail transit turnout fault analysis system comprises:
the turnout waveform acquisition module is used for scanning the track traffic turnout links to obtain turnout voltage waveforms;
the waveform spectrum calculation module is used for splicing the obtained turnout voltage waveform in a periodic sheet form, and carrying out FFT spectrum analysis and calculation on domain points in the periodic sheet to obtain the phase, frequency and amplitude of the domain points in the single-period sheet;
the time domain curve generation module is used for preprocessing domain points according to the phase, the frequency and the amplitude of the domain points in the single-period sheet and generating a time domain curve for the preprocessed domain points in an arithmetic array mode; wherein the preprocessing includes random noise removal processing and noise direct current component removal processing;
the turnout voltage waveform restoring module is used for carrying out turnout voltage waveform restoration according to the time domain curve to obtain turnout voltage waveforms of the preset number of periodic slices; splicing the turnout voltage waveforms of the obtained preset number of periodic slices;
the turnout state judging module is used for comparing the obtained turnout voltage waveform after splicing with a preset waveform table in a threshold value; determining the state of the track traffic turnout according to the comparison result; and judging whether the rail transit turnout has a fault or not and judging the fault reason according to the state of the rail transit turnout.
In addition, the rail transit turnout fault analysis system further comprises: the waveform processing module is used for carrying out equal-proportion reduction on the turnout voltage waveform before splicing the obtained turnout voltage waveform in a periodic sheet form to obtain the turnout voltage waveform with equal-proportion reduction; and amplifying the switch voltage waveform with equal proportion in a differential mode, and biasing the switch voltage waveform subjected to differential amplification to rise above the zero point.
Wherein the number of domain points within a single periodic slice is 256.
The FFT spectrum analysis and calculation formula is as follows:
；
wherein An is a modulus; pn is the phase; fn is frequency; A/N is any point with the amplitude N of 256 domain points, a and b represent complex numbers, and N is a domain point.
The calculation formula of the time domain curve is as follows:
；
wherein S is a time domain curve, adc is a DC component amplitude, and P 1 、P 2 、P 256 The phases of domain point 1, domain point 2, and domain point 256, m 1 、m 2 、m 256 Frequencies of domain point 1, domain point 2, and domain point 256, respectively, A 1 、A 2 、A 256 The magnitudes of Domain_Point 1, domain_Point 2, domain_Point 256, P, respectively i Is the circumference ratio.
The technical scheme provided by the invention can comprise the following beneficial effects:
on the premise of based on a safety protection mechanism, the invention combines the current signal system fault-safety-continuous running direction, and starts from the safety-efficiency balance of the interlocking system. The method has the advantages that the switch detection link is optimized, a fault analysis algorithm is added, when the switch breaks down, automatic diagnosis of fault reasons is achieved, and the availability of the whole system is increased while the fault processing efficiency is improved.
It is to be understood that both the foregoing general description and the following detailed description are exemplary and explanatory only and are not restrictive of the invention as claimed.
Drawings
The accompanying drawings, which are incorporated in and constitute a part of this specification, illustrate embodiments consistent with the invention and together with the description, serve to explain the principles of the invention.
FIG. 1 is a flow diagram illustrating a method of analyzing a rail transit switch failure according to an exemplary embodiment;
FIG. 2 is a block diagram illustrating a rail transit switch failure analysis system in accordance with an exemplary embodiment;
fig. 3 is a schematic diagram of a rail transit switch failure analysis flow shown in accordance with an exemplary embodiment.
Detailed Description
The following description and the drawings sufficiently illustrate specific embodiments herein to enable those skilled in the art to practice them. Portions and features of some embodiments may be included in, or substituted for, those of others. The scope of the embodiments herein includes the full scope of the claims, as well as all available equivalents of the claims. The terms "first," "second," and the like herein are used merely to distinguish one element from another element and do not require or imply any actual relationship or order between the elements. Indeed the first element could also be termed a second element and vice versa. Moreover, the terms "comprises," "comprising," or any other variation thereof, are intended to cover a non-exclusive inclusion, such that a structure, apparatus, or device that comprises a list of elements does not include only those elements but may include other elements not expressly listed or inherent to such structure, apparatus, or device. Without further limitation, an element defined by the phrase "comprising one … …" does not exclude the presence of other like elements in a structure, apparatus or device comprising the element. Various embodiments are described herein in a progressive manner, each embodiment focusing on differences from other embodiments, and identical and similar parts between the various embodiments are sufficient to be seen with each other.
The terms "longitudinal," "transverse," "upper," "lower," "front," "rear," "left," "right," "vertical," "horizontal," "top," "bottom," "inner," "outer," and the like herein refer to an orientation or positional relationship based on that shown in the drawings, merely for ease of description herein and to simplify the description, and do not indicate or imply that the devices or elements referred to must have a particular orientation, be constructed and operate in a particular orientation, and thus are not to be construed as limiting the invention. In the description herein, unless otherwise specified and limited, the terms "mounted," "connected," and "coupled" are to be construed broadly, and may be, for example, mechanically or electrically coupled, may be in communication with each other within two elements, may be directly coupled, or may be indirectly coupled through an intermediary, as would be apparent to one of ordinary skill in the art.
Herein, unless otherwise indicated, the term "plurality" means two or more.
Herein, the character "/" indicates that the front and rear objects are an or relationship. For example, A/B represents: a or B.
Herein, the term "and/or" is an association relation describing an object, meaning that three relations may exist. For example, a and/or B, represent: a or B, or, A and B.
It should be understood that, although the steps in the flowchart are shown in sequence as indicated by the arrows, the steps are not necessarily performed in sequence as indicated by the arrows. The steps are not strictly limited to the order of execution unless explicitly recited herein, and the steps may be executed in other orders. Moreover, at least some of the steps in the figures may include multiple sub-steps or stages that are not necessarily performed at the same time, but may be performed at different times, nor does the order in which the sub-steps or stages are performed necessarily performed in sequence, but may be performed alternately or alternately with at least a portion of other steps or other steps.
The various modules in the apparatus or systems of the present application may be implemented in whole or in part in software, hardware, and combinations thereof. The above modules may be embedded in hardware or may be independent of a processor in the computer device, or may be stored in software in a memory in the computer device, so that the processor may call and execute operations corresponding to the above modules.
Embodiments of the invention and features of the embodiments may be combined with each other without conflict.
Fig. 1 shows an embodiment of a rail transit switch failure analysis method of the present invention.
In this alternative embodiment, the rail transit switch fault analysis method includes:
step S101, scanning a rail transit turnout link to obtain a turnout voltage waveform; splicing the obtained turnout voltage waveforms in a periodic sheet form, and performing FFT spectrum analysis and calculation on domain points in the periodic sheet to obtain the phase, frequency and amplitude of the domain points in the single-period sheet;
step S103, preprocessing domain points according to the phase, frequency and amplitude of the domain points in the single-period sheet, and generating a time domain curve for the preprocessed domain points in an arithmetic progression mode; wherein the preprocessing includes random noise removal processing and noise direct current component removal processing;
step S105, performing switch voltage waveform restoration according to a time domain curve to obtain switch voltage waveforms of a preset number of periodic slices; splicing the turnout voltage waveforms of the obtained preset number of periodic slices;
step S107, comparing the spliced turnout voltage waveform with a preset waveform table in a threshold value; determining the state of the track traffic turnout according to the comparison result; and judging whether the rail transit turnout has a fault or not and judging the fault reason according to the state of the rail transit turnout.
In this alternative embodiment, the method for analyzing a rail transit switch fault further includes: before splicing the obtained turnout voltage waveforms in a periodic sheet form, carrying out equal proportion reduction on the turnout voltage waveforms to obtain turnout voltage waveforms with equal proportion reduction; and amplifying the switch voltage waveform with equal proportion in a differential mode, and biasing the switch voltage waveform subjected to differential amplification to rise above the zero point.
Fig. 2 shows an embodiment of a rail transit switch failure analysis system of the present invention.
In this alternative embodiment, the rail transit switch fault analysis system includes:
the turnout waveform acquisition module 201 is used for scanning the track traffic turnout link to obtain turnout voltage waveforms;
the waveform spectrum calculation module 203 is configured to splice the obtained turnout voltage waveforms in a periodic slice form, and perform FFT spectrum analysis and calculation on domain points in the periodic slice to obtain a phase, a frequency and an amplitude of the domain points in the single-period slice;
the time domain curve generating module 205 is configured to pre-process the domain points according to the phase, the frequency and the amplitude of the domain points in the single-period sheet, and generate a time domain curve for the pre-processed domain points in an arithmetic array manner; wherein the preprocessing includes random noise removal processing and noise direct current component removal processing;
the switch waveform restoring module 207 is configured to restore the switch voltage waveform according to the time domain curve, so as to obtain a switch voltage waveform of a predetermined number of periodic slices; splicing the turnout voltage waveforms of the obtained preset number of periodic slices;
the switch state judging module 209 is configured to compare the switch voltage waveform obtained after the splicing with a preset waveform table; determining the state of the track traffic turnout according to the comparison result; and judging whether the rail transit turnout has a fault or not and judging the fault reason according to the state of the rail transit turnout.
In this alternative embodiment, the rail transit switch fault analysis system further includes: the waveform processing module (not shown in the figure) is used for carrying out equal-proportion reduction on the turnout voltage waveform before splicing the obtained turnout voltage waveform in a periodic sheet form to obtain the turnout voltage waveform with equal-proportion reduction; and amplifying the switch voltage waveform with equal proportion in a differential mode, and biasing the switch voltage waveform subjected to differential amplification to rise above the zero point.
In a specific application, the number of domain points in a single period slice is 256. The FFT spectrum analysis and calculation formula is as follows:
；
wherein An is a modulus; pn is the phase; fn is frequency; A/N is the amplitude; n is any point of 256 domain points, a and b represent complex numbers, and N is a domain point.
The calculation formula of the time domain curve is as follows:
；
wherein S is a time domain curve, adc is a DC component amplitude, and P 1 、P 2 、P 256 The phases of domain point 1, domain point 2, and domain point 256, m 1 、m 2 、m 256 Frequencies of domain point 1, domain point 2, and domain point 256, respectively, A 1 、A 2 、A 256 The magnitudes of Domain_Point 1, domain_Point 2, domain_Point 256, P, respectively i Is the circumference ratio.
In order to facilitate understanding of the above technical solutions of the present invention, the following description of the above technical solutions of the present invention is given by way of specific examples.
As shown in fig. 3, taking a five-wire turnout point switch ZDJ9 as an example, after the ZDJ9 point switch is connected, an execution layer detection module scans X1-X5 of the ZDJ9, reduces the voltage waveform equal ratio passing through a circuit, inputs and amplifies the voltage waveform equal ratio in a differential mode, and finally biases the voltage waveform equal ratio to the zero point to be lifted to an execution layer CPU;
the CPU of the executive layer splices and records the waveforms conveyed by the detection module in a periodic slice mode; and carrying out FFT spectrum analysis (Fourier transform) on 256 domain points in the periodic slice, and calculating the phase (P), the frequency (f) and the amplitude (m) of the domain points in the single-period slice. A time domain curve is generated. And restoring the turnout waveforms acquired in the single-period sheet.
The ZDJ9 switch machine detection module restores the waveform to the waveform when the waveform is double-channel, and when the switch machine is positioned, the waveform of the channel 1 is biased to 1.66V, the frequency is 50Hz, the positive half-wave amplitude is 40mV, and the negative half-wave amplitude is-1.2V. Channel 2 is biased by 1.66V, frequency 50Hz, negative half wave of magnitude-1.2V. When the four-way switch is rotated, the waveforms of the channel 1 and the channel 2 are 1.66V bias voltages, the reduced waveforms are compared with a threshold value spelling waveform table by threshold values, and the state of the matched turnout of the ZDJ9 switch machine is given.
When the ZDJ9 switch machine breaks down, the reasons of losing the table due to the switch fault are numerous, and only two reasons are exemplified here, and as reference, when the external diode of the switch machine breaks down and is short-circuited, the waveform of the CPU reduction channel 1 is a sine wave with the bias of 1.66V, the frequency of 50Hz and the amplitude of 40 mV-40 mV, and the channel 2 is a negative half wave (fixed table) with the bias of 1.66V, the frequency of 50Hz and the amplitude of 40mV or a positive half wave (inverse table) with the bias of 1.66V, the frequency of 50Hz and the amplitude of 40 mV; when the fault of the external diode is broken, the CPU restores the channel 1 to acquire a sine wave with the waveform of 1.66V offset, 50Hz frequency and 1.2V-1.2V amplitude, and the channel 2 is a negative half wave (epitope) with the waveform of 1.66V offset, 50Hz frequency and 1.2V amplitude or a positive half wave (counter-epitope) with the waveform of 1.66V offset, 50Hz frequency and 1.2V amplitude.
Therefore, when the turnout is normal, the execution layer normally gives out turnout representation, and when the turnout is in fault, the execution layer uploads the four-switch state and simultaneously analyzes the fault, so that the automatic diagnosis of the fault cause is realized. The fault processing efficiency is improved, and the usability of the whole system is increased.
The present invention is not limited to the structure that has been described above and shown in the drawings, and various modifications and changes can be made without departing from the scope thereof. The scope of the invention is limited only by the appended claims.
Claims (10)
1. A rail transit switch fault analysis method, comprising:
scanning a rail transit turnout link to obtain a turnout voltage waveform; splicing the obtained turnout voltage waveforms in a periodic sheet form, and performing FFT spectrum analysis and calculation on domain points in the periodic sheet to obtain the phase, frequency and amplitude of the domain points in the single-period sheet;
preprocessing domain points according to the phase, frequency and amplitude of the domain points in the single-period sheet, and generating a time domain curve for the preprocessed domain points in an arithmetic array mode; wherein the preprocessing includes random noise removal processing and noise direct current component removal processing;
performing switch voltage waveform restoration according to the time domain curve to obtain switch voltage waveforms of a preset number of periodic slices; splicing the turnout voltage waveforms of the obtained preset number of periodic slices;
comparing the switch voltage waveform obtained after splicing with a preset waveform table in a threshold value; determining the state of the track traffic turnout according to the comparison result; and judging whether the rail transit turnout has a fault or not and judging the fault reason according to the state of the rail transit turnout.
2. The rail transit switch failure analysis method of claim 1, further comprising:
before splicing the obtained turnout voltage waveforms in a periodic sheet form, carrying out equal proportion reduction on the turnout voltage waveforms to obtain turnout voltage waveforms with equal proportion reduction;
and amplifying the switch voltage waveform with equal proportion in a differential mode, and biasing the switch voltage waveform subjected to differential amplification to rise above the zero point.
3. The method of analyzing rail transit switch faults according to claim 1, wherein the number of domain points in a single period sheet is 256.
4. The track traffic switch fault analysis method according to claim 1, wherein the formula of the FFT spectrum analysis calculation is:
；
wherein An is a modulus; pn is the phase; fn is frequency; A/N is the amplitude; n is any point of 256 domain points, a and b represent complex numbers, and N is a domain point.
5. The method for analyzing the rail transit switch fault according to claim 1, wherein the calculation formula of the time domain curve is:
；
wherein S is a time domain curve, adc is a DC component amplitude, and P 1 、P 2 、P 256 The phases of domain point 1, domain point 2, and domain point 256, m 1 、m 2 、m 256 Frequencies of domain point 1, domain point 2, and domain point 256, respectively, A 1 、A 2 、A 256 The magnitudes of Domain_Point 1, domain_Point 2, domain_Point 256, P, respectively i Is the circumference ratio.
6. A rail transit switch failure analysis system, comprising:
the turnout waveform acquisition module is used for scanning the track traffic turnout links to obtain turnout voltage waveforms;
the waveform spectrum calculation module is used for splicing the obtained turnout voltage waveform in a periodic sheet form, and carrying out FFT spectrum analysis and calculation on domain points in the periodic sheet to obtain the phase, frequency and amplitude of the domain points in the single-period sheet;
the time domain curve generation module is used for preprocessing domain points according to the phase, the frequency and the amplitude of the domain points in the single-period sheet and generating a time domain curve for the preprocessed domain points in an arithmetic array mode; wherein the preprocessing includes random noise removal processing and noise direct current component removal processing;
the turnout voltage waveform restoring module is used for carrying out turnout voltage waveform restoration according to the time domain curve to obtain turnout voltage waveforms of the preset number of periodic slices; splicing the turnout voltage waveforms of the obtained preset number of periodic slices;
the turnout state judging module is used for comparing the obtained turnout voltage waveform after splicing with a preset waveform table in a threshold value; determining the state of the track traffic turnout according to the comparison result; and judging whether the rail transit turnout has a fault or not and judging the fault reason according to the state of the rail transit turnout.
7. The track traffic switch failure analysis system of claim 6, further comprising:
the waveform processing module is used for carrying out equal-proportion reduction on the turnout voltage waveform before splicing the obtained turnout voltage waveform in a periodic sheet form to obtain the turnout voltage waveform with equal-proportion reduction; and amplifying the switch voltage waveform with equal proportion in a differential mode, and biasing the switch voltage waveform subjected to differential amplification to rise above the zero point.
8. The track traffic switch failure analysis system of claim 6, wherein the number of domain points within a single cycle slice is 256.
9. The track traffic switch failure analysis system according to claim 6, wherein the formula of the FFT spectral analysis calculation is:
；
wherein An is a modulus; pn is the phase; fn is frequency; A/N is the amplitude; n is any point of 256 domain points, a and b represent complex numbers, and N is a domain point.
10. The track traffic switch failure analysis system according to claim 6, wherein the time domain curve has a calculation formula:
；
wherein S is a time domain curve, adc is a DC component amplitude, and P 1 、P 2 、P 256 The phases of domain point 1, domain point 2, and domain point 256, m 1 、m 2 、m 256 Frequencies of domain point 1, domain point 2, and domain point 256, respectively, A 1 、A 2 、A 256 The magnitudes of Domain_Point 1, domain_Point 2, domain_Point 256, P, respectively i Is the circumference ratio.
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Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN103175897A (en) * | 2013-03-13 | 2013-06-26 | 西南交通大学 | High-speed turnout damage recognition method based on vibration signal endpoint detection |
| CN107054410A (en) * | 2017-04-01 | 2017-08-18 | 广州地铁集团有限公司 | The intelligent diagnosis system and diagnostic method of point machine |
| CN110356432A (en) * | 2019-06-11 | 2019-10-22 | 北京全路通信信号研究设计院集团有限公司 | A kind of method and system can be used for track circuit failure inspection |
| CN111637964A (en) * | 2020-05-12 | 2020-09-08 | 西南交通大学 | Rail corrugation identification method |
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| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| FR3084748B1 (en) * | 2018-08-01 | 2024-01-05 | Commissariat Energie Atomique | RAIL HEALTH CONTROL |
| CN112858473B (en) * | 2020-12-25 | 2022-07-12 | 杭州浙达精益机电技术股份有限公司 | Turnout switch blade damage state monitoring method based on feature fusion |
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Patent Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN103175897A (en) * | 2013-03-13 | 2013-06-26 | 西南交通大学 | High-speed turnout damage recognition method based on vibration signal endpoint detection |
| CN107054410A (en) * | 2017-04-01 | 2017-08-18 | 广州地铁集团有限公司 | The intelligent diagnosis system and diagnostic method of point machine |
| CN110356432A (en) * | 2019-06-11 | 2019-10-22 | 北京全路通信信号研究设计院集团有限公司 | A kind of method and system can be used for track circuit failure inspection |
| CN111637964A (en) * | 2020-05-12 | 2020-09-08 | 西南交通大学 | Rail corrugation identification method |
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