CN116794587A - Method for measuring high-voltage error of low-frequency voltage transformer by using standard capacitor - Google Patents
Method for measuring high-voltage error of low-frequency voltage transformer by using standard capacitor Download PDFInfo
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Abstract
The invention discloses a method for measuring high-voltage error of a low-frequency voltage transformer by using a standard capacitor, which comprises the following steps: connecting a tested low-frequency voltage transformer and a low-frequency standard voltage transformer into a difference loop under a preset low voltage, and measuring a low-voltage ratio error and a low-voltage phase error; introducing a high-voltage standard capacitor and a low-voltage standard capacitor under a preset high voltage, connecting the high-voltage standard capacitor and a tested low-frequency voltage transformer into an equal-power loop, and measuring a first capacitance ratio and a first dielectric loss and a second capacitance ratio and a second dielectric loss; measuring a high-voltage capacitance voltage coefficient, a high-voltage dielectric loss voltage coefficient, a low-voltage capacitance voltage coefficient and a low-voltage dielectric loss voltage coefficient by using a comparison method; measuring a low-voltage capacitance ratio measurement error, a low-voltage dielectric loss measurement error, a high-voltage capacitance ratio measurement error and a high-voltage dielectric loss measurement error by using a capacitance rotation method; and calculating a high-voltage ratio error and a high-voltage phase error of the tested low-frequency voltage transformer under preset high voltage according to the parameters.
Description
Technical Field
The invention relates to the technical field of high-voltage electrical equipment, and more particularly relates to a method for measuring high-voltage error of a low-frequency voltage transformer by using a standard capacitor.
Background
The flexible low-frequency power transmission is flexible by means of a power electronic technology, and suitable frequency of 0-50 Hz is selected to improve the power grid transmission capacity and flexible regulation and control capability, so that the flexible low-frequency power transmission is a novel efficient alternating current power transmission technology. Has obvious economic advantages for offshore wind power delivery, new energy power generation collection and delivery and the like. At the beginning of the last century, germany constructed a 16.7Hz single-phase ac railway traction power supply system in order to reduce brush sparks in series excited machines and has been used until now. In 1994, wang Xifan institute proposed a 50/3Hz frequency division transmission technology, and grid connection with a power frequency power grid is realized through a frequency doubling transformer, so as to solve the problems of high output power and long-distance transmission of a low-rotation-speed hydraulic generator. In recent years, with the development of offshore wind power technology in China, active power transmission is limited due to the large influence of sea cable capacitance to ground, and low-frequency power transmission research suitable for long-distance large-capacity power transmission is required to be carried out.
The low-frequency transformer is used as an important device for low-frequency transmission voltage and current measurement and power grid protection, and the key performance of the low-frequency transformer needs to be verified. The key performance test of the low-frequency transformer comprises an insulation test and an accuracy test. The insulation test is a general test of low-frequency high-voltage electric equipment, only needs to solve a low-frequency power supply, and the accuracy test is a unique and important test of a low-frequency transformer and is also a test which needs to be carried out.
The standard voltage transformer is key equipment for the accuracy test of the transformer, and the standard voltage transformer needs to trace the magnitude to the national standard, and the national standard in China is established under the power frequency and cannot be directly used for low frequency.
Disclosure of Invention
Aiming at the defects of the prior art, the invention provides a method for measuring the high-voltage error of a low-frequency voltage transformer by using a standard capacitor.
According to one aspect of the present invention, there is provided a method of measuring an error at a high voltage of a low frequency voltage transformer using a reference capacitor, comprising:
connecting a tested low-frequency voltage transformer and a low-frequency standard voltage transformer into a difference loop under a preset low voltage, and measuring a low-voltage ratio error and a low-voltage phase error of the tested low-frequency voltage transformer under the low voltage, wherein the preset low voltage is the rated primary voltage of the low-frequency standard voltage transformer;
under a preset high voltage, a high-voltage standard capacitor and a low-voltage standard capacitor are introduced and are connected with a tested low-frequency voltage transformer to form an equal-power loop, and a first capacitance ratio and a first dielectric loss of the tested low-frequency voltage transformer under the preset low voltage and a second capacitance ratio and a second dielectric loss of the tested low-frequency voltage transformer under the preset high voltage are measured through a high-voltage capacitance bridge;
Measuring the high-voltage Rong Dianya coefficient and the high-voltage dielectric loss voltage coefficient of the high-voltage standard capacitor and the low-voltage coefficient and the low-voltage dielectric loss voltage coefficient of the low-voltage standard capacitor by using a comparison method;
measuring a high-voltage capacitance ratio measurement error and a low-voltage dielectric loss measurement error of a high-voltage capacitance bridge under a preset low voltage by using a capacitance rotation method, and measuring the high-voltage capacitance ratio measurement error and the high-voltage dielectric loss measurement error under a preset high voltage;
calculating a high-voltage ratio error of the measured low-frequency voltage transformer under preset high voltage according to the low-voltage ratio error, the first capacitance ratio, the second capacitance ratio, the high-voltage Rong Dianya coefficient, the high-voltage capacitance voltage coefficient, the high-voltage capacitance ratio measurement error and the high-voltage capacitance ratio measurement error;
and calculating the high-voltage phase error of the tested low-frequency voltage transformer under preset high voltage according to the low-voltage phase error, the first dielectric loss, the second dielectric loss, the high-voltage dielectric loss voltage coefficient, the low-voltage dielectric loss measurement error and the high-voltage dielectric loss measurement error.
Optionally, the low-frequency voltage transformer to be measured and the low-frequency standard voltage transformer are connected into a difference loop, and the low-voltage ratio error and the low-voltage phase error of the low-frequency voltage transformer to be measured under low voltage are measured, including:
After a 380V alternating current power supply is connected into a variable frequency source, the variable frequency source is connected with a voltage regulating transformer and a step-up transformer in parallel to generate high voltage with adjustable frequency, a high-voltage terminal of a primary winding of a tested low-frequency voltage transformer and a primary winding of a low-frequency standard voltage transformer are respectively connected into the high voltage, the low-voltage terminal is connected with the ground in a short circuit mode, wherein the rated primary voltage of the low-frequency standard voltage transformer is U N1 Rated secondary voltage Ua of 57.7V with transformation ratio N 1 Rated voltage of the tested low-frequency voltage transformer is U N2 Rated secondary voltage U b Also 57.7V, with a transformation ratio of N 2 ，U N1 ＜U N2 ；
When the same primary voltage is added to the primary terminals of the low-frequency standard voltage transformer and the tested low-frequency voltage transformer, a multi-disc induction voltage divider is connected in parallel to the secondary winding of the low-frequency standard voltage transformer, and the proportional winding of the multi-disc induction voltage divider is regulated to ensure that the output voltage of the multi-disc induction voltage divider is equal to the rated secondary voltage of the tested low-frequency voltage transformer;
the method comprises the steps of inputting a multi-disc induction voltage divider output winding serving as a U end of a parameter voltage input transformer calibrator, connecting a high-voltage terminal of the multi-disc induction voltage divider output winding with a high-voltage terminal of a measured low-frequency voltage transformer secondary winding, and connecting a low-voltage terminal of the multi-disc induction voltage divider output winding and a low-voltage terminal of the measured low-frequency voltage transformer secondary winding to two ends of a transformer calibrator differential measurement terminal delta U;
The transformer calibrator measures low voltage ratio errors and low voltage phase errors under preset low voltage.
Optionally, introducing a high-voltage standard capacitor and a low-voltage standard capacitor under a preset high voltage, connecting the high-voltage standard capacitor and the low-frequency voltage transformer to be tested into an equal-power loop, measuring a first capacitance ratio and a first dielectric loss of the low-frequency voltage transformer to be tested under the preset low voltage and a second capacitance ratio and a second dielectric loss of the low-frequency voltage transformer to be tested under the preset high voltage through a high-voltage capacitance bridge, and including:
connecting a primary winding high-voltage terminal of the low-frequency voltage transformer to be tested with a high-voltage terminal of a high-voltage standard capacitor, and connecting a secondary winding high-voltage terminal of the low-frequency voltage transformer to be tested with a high-voltage terminal of the low-voltage standard capacitor;
connecting a primary winding of a low-frequency voltage transformer to be tested with low-frequency preset high voltage, connecting a low-voltage terminal of a high-voltage standard capacitor to a tested terminal of a high-voltage capacitance bridge, connecting the low-voltage terminal of the low-voltage standard capacitor to a reference terminal of the high-voltage capacitance bridge, and connecting a low-voltage terminal of a secondary winding of the low-frequency voltage transformer to be tested and a high-voltage capacitance bridge grounding terminal to be grounded;
the voltage regulator is regulated to regulate the primary voltage to a preset low voltage, and a first capacitance ratio and a first dielectric loss measured by the high-voltage capacitance bridge at the moment are recorded;
And regulating the primary voltage to a preset high voltage to be measured, and recording a second capacitance ratio and a second dielectric loss measured by the high-voltage capacitor bridge at the moment.
Optionally, measuring the high voltage Rong Dianya coefficient and the high voltage dielectric loss voltage coefficient of the high voltage reference capacitor and the low voltage capacitor voltage coefficient and the low voltage dielectric loss voltage coefficient of the low voltage reference capacitor using a comparison method includes:
the high-voltage electrodes of the low-voltage standard capacitor or the high-voltage standard capacitor and the reference standard capacitor are respectively connected with the high-voltage output terminal of the high-voltage power supply, and the low-voltage measuring terminals are respectively connected to the high-voltage capacitor bridge by shielded cables;
respectively at 10% U N 、20％U N 、30％U N 、40％U N 、50％U N 、60％U N 、70％U N 、80％U N 、90％U N 、100％U N Measuring capacitance ratio and loss factor at test voltage, wherein U N A rated voltage of the low-voltage standard capacitor or the high-voltage standard capacitor;
adjusting bridge balance under each specified test voltage, respectively reading capacitance and dielectric loss, and calculating a capacitance voltage coefficient and a dielectric loss voltage coefficient under each specified test voltage;
and selecting the maximum absolute value of each test voltage measurement point as a low-voltage capacitance voltage coefficient and a low-voltage dielectric loss voltage coefficient or a high-voltage Rong Dianya coefficient and a high-voltage dielectric loss voltage coefficient.
Optionally, measuring the high voltage capacitance ratio measurement error and the low voltage dielectric loss measurement error of the high voltage capacitance bridge at a preset low voltage and the high voltage capacitance ratio measurement error and the high voltage dielectric loss measurement error at a preset high voltage by using a capacitance rotation method includes:
the high-voltage electrodes of two test low-voltage standard capacitors with the same capacitance are respectively connected with a high-voltage output terminal of a high-voltage power supply, and a low-voltage measurement terminal is respectively connected with a reference terminal and a tested terminal of a high-voltage capacitance bridge by using a shielded cable;
under the preset low voltage, respectively taking one of the test low-voltage standard capacitors as a reference standard device and the other test low-voltage standard capacitor as a tested capacitor, and measuring the low-voltage capacity proportional indication value and the low-voltage dielectric loss under two loops;
calculating a low-voltage capacitance ratio measurement error and a low-voltage dielectric loss measurement error of a high-voltage capacitance bridge under a preset low voltage according to the low-voltage capacitance ratio indication values and the low-voltage dielectric loss of the two test low-voltage standard capacitors;
the high-voltage electrodes of two test high-voltage standard capacitors with the same capacitance are respectively connected with a high-voltage output terminal of a high-voltage power supply, and a low-voltage measurement terminal is respectively connected with a reference terminal and a tested terminal of a high-voltage capacitance bridge by using a shielded cable;
Under preset high voltage, respectively taking one of the test high-voltage standard capacitors as a reference standard device and the other test high-voltage standard capacitor as a tested capacitor, and measuring the high-voltage capacity proportional indication value and the high-voltage dielectric loss under two loops;
and calculating a high-voltage capacitance ratio measurement error and a high-voltage dielectric loss measurement error of the high-voltage capacitance bridge under a preset low voltage according to the high-voltage capacitance ratio indication values and the high-voltage dielectric loss of the two tested high-voltage standard capacitors.
According to another aspect of the present invention, there is provided an apparatus for measuring an error at a high voltage of a low frequency voltage transformer using a reference capacitor, comprising:
the first measuring module is used for connecting the tested low-frequency voltage transformer and the low-frequency standard voltage transformer into a difference loop under the preset low voltage, measuring the low-voltage ratio error and the low-voltage phase error of the tested low-frequency voltage transformer under the low voltage, wherein the preset low voltage is the rated primary voltage of the low-frequency standard voltage transformer;
the second measuring module is used for introducing a high-voltage standard capacitor and a low-voltage standard capacitor under a preset high voltage, connecting the high-voltage standard capacitor and the low-frequency voltage transformer to be measured into an equal-power loop, and measuring a first capacitance ratio and a first dielectric loss of the low-frequency voltage transformer to be measured under the preset low voltage and a second capacitance ratio and a second dielectric loss of the low-frequency voltage transformer to be measured under the preset high voltage through the high-voltage capacitance bridge;
The third measuring module is used for measuring the high-voltage Rong Dianya coefficient and the high-voltage dielectric loss voltage coefficient of the high-voltage standard capacitor, and the low-voltage coefficient and the low-voltage dielectric loss voltage coefficient of the low-voltage standard capacitor by using a comparison method;
the fourth measuring module is used for measuring a low-voltage power ratio measuring error and a low-voltage dielectric loss measuring error of the high-voltage capacitor bridge under a preset low voltage by using a capacitance rotation method, and a high-voltage power ratio measuring error and a high-voltage dielectric loss measuring error under a preset high voltage;
the first calculation module is used for calculating the high-voltage ratio error of the measured low-frequency voltage transformer under preset high voltage according to the low-voltage ratio error, the first capacitance ratio, the second capacitance ratio, the high-voltage Rong Dianya coefficient, the high-voltage capacitance voltage coefficient, the high-voltage capacitance ratio measurement error and the high-voltage capacitance ratio measurement error;
the second calculation module is used for calculating the high-voltage phase error of the tested low-frequency voltage transformer under the preset high voltage according to the low-voltage phase error, the first dielectric loss, the second dielectric loss, the high-voltage dielectric loss voltage coefficient, the low-voltage dielectric loss measurement error and the high-voltage dielectric loss measurement error.
According to a further aspect of the present invention there is provided a computer readable storage medium storing a computer program for performing the method according to any one of the above aspects of the present invention.
According to still another aspect of the present invention, there is provided an electronic device including: a processor; a memory for storing the processor-executable instructions; the processor is configured to read the executable instructions from the memory and execute the instructions to implement the method according to any of the above aspects of the present invention.
Therefore, the invention provides a method for measuring the error of the low-frequency voltage transformer under high voltage by using the standard capacitor, which solves the problem of lack of the high-voltage-class low-frequency standard voltage transformer and can realize the error measurement of the high-class low-frequency voltage transformer.
Drawings
Exemplary embodiments of the present invention may be more completely understood in consideration of the following drawings:
FIG. 1 is a flow chart of a method for measuring error at high voltage of a low frequency voltage transformer using a reference capacitor according to an exemplary embodiment of the present invention;
FIG. 2 is a schematic diagram of an error measurement loop of a measured low frequency voltage transformer at low voltage according to an exemplary embodiment of the present invention;
FIG. 3 is a schematic diagram of a measurement voltage transformer error loop provided by an exemplary embodiment of the present invention;
FIG. 4 is a circuit diagram for measuring the power frequency voltage linearity of a high voltage reference capacitor according to an exemplary embodiment of the present invention;
FIG. 5 is a schematic diagram of an apparatus for measuring error at high voltage of a low frequency voltage transformer using a reference capacitor according to an exemplary embodiment of the present invention;
fig. 6 is a structure of an electronic device provided in an exemplary embodiment of the present invention.
Detailed Description
Hereinafter, exemplary embodiments according to the present invention will be described in detail with reference to the accompanying drawings. It should be apparent that the described embodiments are only some embodiments of the present invention and not all embodiments of the present invention, and it should be understood that the present invention is not limited by the example embodiments described herein.
It should be noted that: the relative arrangement of the components and steps, numerical expressions and numerical values set forth in these embodiments do not limit the scope of the present invention unless it is specifically stated otherwise.
It will be appreciated by those of skill in the art that the terms "first," "second," etc. in embodiments of the present invention are used merely to distinguish between different steps, devices or modules, etc., and do not represent any particular technical meaning nor necessarily logical order between them.
It should also be understood that in embodiments of the present invention, "plurality" may refer to two or more, and "at least one" may refer to one, two or more.
It should also be appreciated that any component, data, or structure referred to in an embodiment of the invention may be generally understood as one or more without explicit limitation or the contrary in the context.
In addition, the term "and/or" in the present invention is merely an association relationship describing the association object, and indicates that three relationships may exist, for example, a and/or B may indicate: a exists alone, A and B exist together, and B exists alone. In the present invention, the character "/" generally indicates that the front and rear related objects are an or relationship.
It should also be understood that the description of the embodiments of the present invention emphasizes the differences between the embodiments, and that the same or similar features may be referred to each other, and for brevity, will not be described in detail.
Meanwhile, it should be understood that the sizes of the respective parts shown in the drawings are not drawn in actual scale for convenience of description.
The following description of at least one exemplary embodiment is merely exemplary in nature and is in no way intended to limit the invention, its application, or uses.
Techniques, methods, and apparatus known to one of ordinary skill in the relevant art may not be discussed in detail, but where appropriate, the techniques, methods, and apparatus should be considered part of the specification.
It should be noted that: like reference numerals and letters denote like items in the following figures, and thus once an item is defined in one figure, no further discussion thereof is necessary in subsequent figures.
Embodiments of the invention are operational with numerous other general purpose or special purpose computing system environments or configurations with electronic devices, such as terminal devices, computer systems, servers, etc. Examples of well known terminal devices, computing systems, environments, and/or configurations that may be suitable for use with the terminal device, computer system, server, or other electronic device include, but are not limited to: personal computer systems, server computer systems, thin clients, thick clients, hand-held or laptop devices, microprocessor-based systems, set-top boxes, programmable consumer electronics, network personal computers, small computer systems, mainframe computer systems, and distributed cloud computing technology environments that include any of the foregoing, and the like.
Electronic devices such as terminal devices, computer systems, servers, etc. may be described in the general context of computer system-executable instructions, such as program modules, being executed by a computer system. Generally, program modules may include routines, programs, objects, components, logic, data structures, etc., that perform particular tasks or implement particular abstract data types. The computer system/server may be implemented in a distributed cloud computing environment in which tasks are performed by remote processing devices that are linked through a communications network. In a distributed cloud computing environment, program modules may be located in both local and remote computing system storage media including memory storage devices.
Exemplary method
Fig. 1 is a flow chart of a method for measuring an error at a high voltage of a low frequency voltage transformer using a reference capacitor according to an exemplary embodiment of the present invention. The method 100 for measuring the high voltage error of the low frequency voltage transformer by using the standard capacitor according to the embodiment can be applied to an electronic device, as shown in fig. 1, and comprises the following steps:
step 101, connecting a tested low-frequency voltage transformer and a low-frequency standard voltage transformer into a difference loop under a preset low voltage, and measuring a low-voltage ratio error and a low-voltage phase error of the tested low-frequency voltage transformer under the low voltage, wherein the preset low voltage is the rated primary voltage of the low-frequency standard voltage transformer;
Step 102, introducing a high-voltage standard capacitor and a low-voltage standard capacitor under a preset high voltage, connecting the high-voltage standard capacitor and a tested low-frequency voltage transformer into an equal-power loop, and measuring a first capacitance ratio and a first dielectric loss of the tested low-frequency voltage transformer under the preset low voltage and a second capacitance ratio and a second dielectric loss of the tested low-frequency voltage transformer under the preset high voltage through a high-voltage capacitance bridge;
step 103, measuring the high voltage Rong Dianya coefficient and the high voltage dielectric loss voltage coefficient of the high voltage standard capacitor, and the low voltage coefficient and the low voltage dielectric loss voltage coefficient of the low voltage standard capacitor by using a comparison method;
104, measuring a high-voltage capacitance ratio measurement error and a low-voltage dielectric loss measurement error of the high-voltage capacitance bridge under a preset low voltage by using a capacitance rotation method, and measuring the high-voltage capacitance ratio measurement error and the high-voltage dielectric loss measurement error under a preset high voltage;
step 105, calculating a high voltage ratio error of the measured low-frequency voltage transformer under preset high voltage according to the low voltage ratio error, the first capacitance ratio, the second capacitance ratio, the high voltage Rong Dianya coefficient, the high voltage capacitance voltage coefficient, the high voltage capacitance ratio measurement error and the high voltage capacitance ratio measurement error;
And step 106, calculating the high-voltage phase error of the tested low-frequency voltage transformer under the preset high voltage according to the low-voltage phase error, the first dielectric loss, the second dielectric loss, the high-voltage dielectric loss voltage coefficient, the low-voltage dielectric loss measurement error and the high-voltage dielectric loss measurement error.
In particular, the reference capacitor is a gas-insulated flat capacitor which has the characteristic of excellent frequency characteristics, and researches have shown that the capacitance and dielectric loss voltage coefficient are affected by the frequency by an order of magnitude of 10-6. The invention provides a method for measuring the error of a high-voltage-class low-frequency voltage transformer by using a standard capacitor on the premise of the existing low-voltage-class low-frequency voltage proportion standard, and can measure the error of the low-frequency voltage transformer under the condition of lacking the high-voltage-class standard voltage transformer. The method comprises the following specific steps:
the first step: at a low voltage level, connecting a tested low-frequency voltage transformer and a low-frequency standard voltage transformer into a difference loop, and measuring the ratio error f of the tested low-frequency voltage transformer under low voltage 0 And phase error delta 0 As shown in fig. 2.
In FIG. 2, after a 380V AC power supply is connected to a variable frequency source, the variable frequency source is connected in parallel with a regulating transformer and a boosting transformer to generate high voltage with adjustable frequency, and the PT to be measured and the standard PT are respectively N The primary winding high-voltage terminal of (a) is connected with high voltageThe low voltage terminal is short-circuited to ground. PT (PT) N Rated primary voltage U N1 Rated secondary voltage Ua of 57.7V with transformation ratio N 1 Rated PT voltage U N2 Rated secondary voltage U b Also 57.7V, with a transformation ratio of N 2 ，U N1 ＜U N2 Due to PT N Has the same secondary voltage as PT, and therefore N 1 ＜N 2 . When PT is performed N After the same primary voltage is applied to the primary terminal of PT, ua=u N1 /N 1 ，Ub＝U N2 /N 2 U is then a ＞U b Therefore, it is required to perform PT N The secondary winding is connected with a multi-disc induction voltage divider in parallel, and the proportion winding of the multi-disc induction voltage divider is regulated to ensure that the output voltage of the multi-disc induction voltage divider is equal to U b Equal.
The method comprises the steps of taking a multi-disc induction voltage divider output winding as a U end of a parameter voltage input transformer calibrator, connecting a high-voltage terminal of the multi-disc induction voltage divider output winding with a high-voltage terminal of a PT secondary winding, and connecting a low-voltage terminal of the multi-disc induction voltage divider output winding and a low-voltage terminal of the PT secondary winding to two ends of a differential measurement terminal delta U of the transformer calibrator.
At this time, the transformer calibrator will measure at low voltage U 1 Lower ratio error f 0 And phase error delta 0 。
And a second step of: under high voltage, a high-low voltage standard capacitor is introduced and connected with a tested voltage transformer to form an equal-power loop, and the error of the tested voltage transformer under high voltage is measured through a high-voltage capacitor bridge. As shown in fig. 3.
In FIG. 3, C 1 Is a high-voltage standard capacitor, C 2 For the low-voltage standard capacitor, the primary winding high-voltage terminal of PT is connected with C 1 High voltage terminal of PT is connected with C 2 Is connected to the high voltage terminal of the (c). Connecting primary winding of PT with low frequency high voltage U, and connecting C 1 The low-voltage terminal is connected to the tested terminal C of the high-voltage capacitance bridge X C is carried out by 2 Reference terminal C of low-voltage terminal connected to high-voltage capacitance bridge N The tap connects a secondary winding low voltage terminal of the PT and the high voltage capacitor bridge ground terminal to ground. The height of the loopThe capacitance of the capacitor C1, the capacitance of the capacitor C2 and the transformation ratio N of PT need to satisfy the following formula:
regulating voltage regulator to regulate primary voltage to PT N Is set to the rated primary voltage U 1 Recording the capacitance ratio N measured by the high-voltage capacitor bridge 0 And dielectric loss D 0 Then, the primary voltage is regulated to the high voltage U to be measured, and the capacitance ratio N and the dielectric loss D measured by the high-voltage capacitance bridge at the moment are recorded.
Then the error of PT under U is:
δ≈δ 0 +(D-D 0 )-ΔD 1 +ΔD 2 -(β-β 0 )
wherein:for the capacitance-voltage coefficient of the high-voltage reference capacitor, < + >>Is the capacitance voltage coefficient of the low-voltage standard capacitor, delta D 1 Dielectric loss voltage coefficient, deltaD, of high voltage standard capacitor 2 The dielectric loss voltage coefficient of the low-voltage standard capacitor is respectively the capacitance ratio measurement error and the dielectric loss measurement error of the high-voltage capacitor bridge under the U voltage, and alpha and beta are respectively 0 、β 0 Respectively the high voltage capacitor bridge is U 1 Capacitance ratio measurement error and dielectric loss measurement error under voltage.
And a third step of: the voltage coefficient of the reference capacitor was measured by a comparison method, as shown in fig. 4. Cx is the high/low voltage reference capacitor that needs to be measured.
The measurement steps are as follows:
①C x and C N The high voltage electrode of (2) is connected with the high voltage output terminal of the high voltage power supply, and the low voltage measuring terminals are respectively connected to the high voltage capacitance bridge by shielded cables. Let the rated voltage of the standard capacitor be U 0 Respectively at 10% U N 、20％U N 、30％U N 、40％U N 、50％U N 、60％U N 、70％U N 、80％U N 、90％U N 、100％U N Capacitance ratio and loss factor are measured as follows.
(2) The bridge balance is adjusted at each prescribed test voltage, the capacitance C and the dielectric loss D are read, respectively, and then the voltage coefficient of the capacitance is calculated according to formula (1), and the voltage coefficient of the dielectric loss is calculated according to formula (2).
For high voltage standard capacitors:
ΔD 1 ＝D 1x -D 10 (2)
for a low voltage standard capacitor:
ΔD 2 ＝D 2x -D 20 (4)
wherein: c (C) 1x 、C 2x Capacitance of the high voltage reference capacitor and the low voltage reference capacitor at high voltage, respectively; d (D) 1x And D 2x Dielectric loss values of the high-voltage standard capacitor and the low-voltage standard capacitor under high voltage respectively; c (C) 10 、C 20 Capacitance of the low voltage reference capacitor and the low voltage reference capacitor, respectively; d (D) 10 、D 20 Dielectric loss values of the high voltage reference capacitor and the low voltage reference capacitor at a low voltage, respectively.
(3) The measurement should be performed 3 times each at least when the voltage rises and falls, and each voltage percentage point selects the intermediate value of 6 or more measured data, which are sequenced by size, as the verification result, and selects the maximum absolute value of each measured point as the voltage coefficient value.
Fourth step: and measuring the error of the high-voltage capacitance bridge at each voltage point by using a capacitance rotation method. As shown in FIG. 4, two low-voltage reference capacitors C having the same capacitance are taken A And C B And connecting according to the comparative normal line. At the measured voltage points respectively with C A And C B For the reference capacitor, the capacitance of the other reference capacitor is measured (wherein the current flowing through the high-voltage capacitor bridge in both cases covers the current range of the high-voltage capacitor bridge in the equipower loop), and the measured proportional indication values are respectively X A And X B Dielectric loss of D A And D B The capacitance ratio measurement error and the dielectric loss measurement error at this voltage point are respectively:
when the capacitance rotation method is used for measuring at low voltage, the capacitance ratio measurement error and the dielectric loss measurement error of the high-voltage capacitance bridge are respectively alpha 0 、β 0 When the capacitance ratio measurement error and the dielectric loss measurement error of the high-voltage capacitance bridge are respectively alpha and beta when the capacitance rotation method is used for measurement under high voltage.
Therefore, the invention provides a method for measuring the error of the low-frequency voltage transformer under high voltage by using the standard capacitor, which solves the problem of lack of the high-voltage-class low-frequency standard voltage transformer and can realize the error measurement of the high-class low-frequency voltage transformer.
Exemplary apparatus
Fig. 5 is a schematic structural view of an apparatus for measuring an error at a high voltage of a low frequency voltage transformer using a reference capacitor according to an exemplary embodiment of the present invention. As shown in fig. 5, the apparatus 500 includes:
the first measurement module 510 is configured to connect the measured low-frequency voltage transformer and the low-frequency standard voltage transformer into a difference loop under a preset low voltage, and measure a low-voltage ratio error and a low-voltage phase error of the measured low-frequency voltage transformer under the low voltage, where the preset low voltage is a rated primary voltage of the low-frequency standard voltage transformer;
the second measurement module 520 is configured to introduce a high-voltage reference capacitor and a low-voltage reference capacitor under a preset high voltage, connect the high-voltage reference capacitor and the low-frequency voltage transformer to be measured into an equal-power loop, and measure a first capacitance ratio and a first dielectric loss of the low-frequency voltage transformer to be measured under the preset low voltage and a second capacitance ratio and a second dielectric loss of the low-frequency voltage transformer to be measured under the preset high voltage through the high-voltage capacitance bridge;
A third measuring module 530 for measuring the high voltage Rong Dianya coefficient and the high voltage dielectric loss voltage coefficient of the high voltage reference capacitor and the low voltage capacitance voltage coefficient and the low voltage dielectric loss voltage coefficient of the low voltage reference capacitor by using a comparison method;
a fourth measurement module 540, configured to measure a high-voltage capacitor bridge ratio measurement error and a low-voltage dielectric loss measurement error at a preset low voltage, and a high-voltage capacitor bridge ratio measurement error and a high-voltage dielectric loss measurement error at a preset high voltage by using a capacitance rotation method;
the first calculating module 550 is configured to calculate a high voltage ratio error of the measured low frequency voltage transformer under a preset high voltage according to the low voltage ratio error, the first capacitance ratio, the second capacitance ratio, the high voltage Rong Dianya coefficient, the low voltage capacitance voltage coefficient, the high voltage capacitance ratio measurement error, and the high voltage capacitance ratio measurement error;
the second calculating module 560 is configured to calculate a high voltage phase error of the measured low frequency voltage transformer under a preset high voltage according to the low voltage phase error, the first dielectric loss, the second dielectric loss, the high voltage dielectric loss voltage coefficient, the low voltage dielectric loss measurement error, and the high voltage dielectric loss measurement error.
Optionally, the first measurement module 510 includes:
the first connection sub-module is used for connecting a 380V alternating current power supply into a variable frequency source, connecting the variable frequency source with a voltage regulating transformer and a step-up transformer in parallel, generating high voltage with adjustable frequency, respectively connecting the high voltage terminals of primary windings of a tested low-frequency voltage transformer and a low-frequency standard voltage transformer into the high voltage, and connecting the low voltage terminals in short circuit and grounding, wherein the rated primary voltage of the low-frequency standard voltage transformer is U N1 Rated secondary voltage Ua of 57.7V with transformation ratio N 1 Rated voltage of the tested low-frequency voltage transformer is U N2 Rated secondary voltage U b Also 57.7V, with a transformation ratio of N 2 ，U N1 ＜U N2 ；
The first regulating submodule is used for connecting a multi-disc induction voltage divider in parallel on the secondary winding of the low-frequency standard voltage transformer after the same primary voltage is applied to the primary terminals of the low-frequency standard voltage transformer and the tested low-frequency voltage transformer, and regulating the proportional winding of the multi-disc induction voltage divider so that the output voltage of the multi-disc induction voltage divider is equal to the rated secondary voltage of the tested low-frequency voltage transformer;
the output sub-module is used for inputting the output winding of the multi-disc induction voltage divider as a parameter voltage to the U end of the transformer calibrator, connecting a high-voltage terminal of the output winding of the multi-disc induction voltage divider with a high-voltage terminal of a secondary winding of the tested low-frequency voltage transformer, and connecting a low-voltage terminal of the output winding of the multi-disc induction voltage divider with a low-voltage terminal of the secondary winding of the tested low-frequency voltage transformer to two ends of a differential measurement terminal DeltaU of the transformer calibrator;
The first measurement submodule is used for measuring a low-voltage ratio error and a low-voltage phase error under a preset low voltage by the transformer calibrator.
Optionally, the second measurement module 520 includes:
the second connection submodule is used for connecting a primary winding high-voltage terminal of the low-frequency voltage transformer to be tested with a high-voltage terminal of the high-voltage standard capacitor, and a secondary winding high-voltage terminal of the low-frequency voltage transformer to be tested is connected with a high-voltage terminal of the low-voltage standard capacitor;
the third connection sub-module is used for connecting a primary winding of the tested low-frequency voltage transformer with low-frequency preset high voltage, connecting a low-voltage terminal of the high-voltage standard capacitor to a tested terminal of the high-voltage capacitance bridge, connecting the low-voltage terminal of the low-voltage standard capacitor to a reference terminal of the high-voltage capacitance bridge, and grounding a low-voltage terminal of a secondary winding of the tested low-frequency voltage transformer and a high-voltage capacitance bridge grounding terminal;
the second regulating submodule is used for regulating the voltage regulator, regulating the primary voltage to a preset low voltage, and recording the first capacitance ratio and the first dielectric loss measured by the high-voltage capacitance bridge at the moment;
the recording sub-module is used for adjusting the primary voltage to a preset high voltage to be measured and recording a second capacitance ratio and a second dielectric loss measured by the high-voltage capacitance bridge at the moment.
Optionally, the third measurement module 530 includes:
a fourth connection sub-module for connecting the high voltage electrodes of the low voltage reference capacitor or the high voltage reference capacitor and the high voltage output terminal of the high voltage power supply respectively, and the low voltage measurement terminals are connected to the high voltage capacitance bridge respectively by shielded cables;
a second measuring submodule for measuring the temperature of the sample at 10% U N 、20％U N 、30％U N 、40％U N 、50％U N 、60％U N 、70％U N 、80％U N 、90％U N 、100％U N Measuring capacitance ratio and loss factor at test voltage, wherein U N A rated voltage of the low-voltage standard capacitor or the high-voltage standard capacitor;
the first calculation sub-module is used for adjusting bridge balance under each specified test voltage, respectively reading capacitance and dielectric loss, and calculating a capacitance voltage coefficient and a dielectric loss voltage coefficient under each specified test voltage;
the selecting submodule is used for selecting the maximum absolute value of each test voltage measuring point as a low-voltage capacitor voltage coefficient and a low-voltage dielectric loss voltage coefficient or a high-voltage Rong Dianya coefficient and a high-voltage dielectric loss voltage coefficient.
Optionally, the fourth measurement module 540 includes:
a fifth connection sub-module for respectively connecting the high voltage electrodes of the two test low voltage reference capacitors with the same capacitance with the high voltage output terminals of the high voltage power supply, and the low voltage measurement terminals are respectively connected to the reference terminal and the measured terminal of the high voltage power bridge by shielded cables;
The third measurement submodule is used for measuring the low-voltage capacity proportion indication value and the low-voltage dielectric loss under two loops under the preset low voltage by taking one of the test low-voltage standard capacitors as a reference standard device and the other test low-voltage standard capacitor as a tested capacitor;
the second calculation sub-module is used for calculating a low-voltage capacitance ratio measurement error and a low-voltage dielectric loss measurement error of the high-voltage capacitance bridge under a preset low voltage according to the low-voltage capacitance ratio indication value and the low-voltage dielectric loss of the two tested low-voltage standard capacitors;
a sixth connection sub-module for respectively connecting the high voltage electrodes of the two test high voltage standard capacitors with the same capacitance with the high voltage output terminal of the high voltage power supply, and connecting the low voltage measurement terminals to the reference terminal and the measured terminal of the high voltage power bridge by using shielded cables respectively;
the fourth measurement submodule is used for measuring the high-voltage capacity proportion indication value and the high-voltage dielectric loss under two loops by taking one of the test high-voltage standard capacitors as a reference standard device and the other test high-voltage standard capacitor as a tested capacitor under the preset high voltage;
and the third calculation sub-module is used for calculating the high-voltage capacitance ratio measurement error and the high-voltage dielectric loss measurement error of the high-voltage capacitance bridge under the preset low voltage according to the high-voltage capacitance ratio indication value and the high-voltage dielectric loss of the two tested high-voltage standard capacitors.
Exemplary electronic device
Fig. 6 is a structure of an electronic device provided in an exemplary embodiment of the present invention. As shown in fig. 6, the electronic device 60 includes one or more processors 61 and memory 62.
The processor 61 may be a Central Processing Unit (CPU) or other form of processing unit having data processing and/or instruction execution capabilities and may control other components in the electronic device to perform the desired functions.
Memory 62 may include one or more computer program products that may include various forms of computer-readable storage media, such as volatile memory and/or non-volatile memory. The volatile memory may include, for example, random Access Memory (RAM) and/or cache memory (cache), and the like. The non-volatile memory may include, for example, read Only Memory (ROM), hard disk, flash memory, and the like. One or more computer program instructions may be stored on the computer readable storage medium that may be executed by the processor 61 to implement the methods of the software programs of the various embodiments of the present invention described above and/or other desired functions. In one example, the electronic device may further include: an input device 63 and an output device 64, which are interconnected by a bus system and/or other forms of connection mechanisms (not shown).
In addition, the input device 63 may also include, for example, a keyboard, a mouse, and the like.
The output device 64 can output various information to the outside. The output means 64 may include, for example, a display, speakers, a printer, and a communication network and remote output devices connected thereto, etc.
Of course, only some of the components of the electronic device relevant to the present invention are shown in fig. 6 for simplicity, components such as buses, input/output interfaces, etc. being omitted. In addition, the electronic device may include any other suitable components depending on the particular application.
Exemplary computer program product and computer readable storage Medium
In addition to the methods and apparatus described above, embodiments of the invention may also be a computer program product comprising computer program instructions which, when executed by a processor, cause the processor to perform steps in a method according to various embodiments of the invention described in the "exemplary methods" section of this specification.
The computer program product may write program code for performing operations of embodiments of the present invention in any combination of one or more programming languages, including an object oriented programming language such as Java, C++ or the like and conventional procedural programming languages, such as the "C" programming language or similar programming languages. The program code may execute entirely on the user's computing device, partly on the user's device, as a stand-alone software package, partly on the user's computing device, partly on a remote computing device, or entirely on the remote computing device or server.
Furthermore, embodiments of the invention may also be a computer-readable storage medium, having stored thereon computer program instructions, which when executed by a processor, cause the processor to perform steps in a method according to various embodiments of the invention described in the "exemplary method" section of the description above.
The computer readable storage medium may employ any combination of one or more readable media. The readable medium may be a readable signal medium or a readable storage medium. The readable storage medium can include, for example, but is not limited to, an electronic, magnetic, optical, electromagnetic, infrared, or semiconductor system, or device, or a combination of any of the foregoing. More specific examples (a non-exhaustive list) of the readable storage medium would include the following: an electrical connection having one or more wires, a portable disk, a hard disk, random Access Memory (RAM), read-only memory (ROM), erasable programmable read-only memory (EPROM or flash memory), optical fiber, portable compact disk read-only memory (CD-ROM), an optical storage device, a magnetic storage device, or any suitable combination of the foregoing.
The basic principles of the present invention have been described above in connection with specific embodiments, however, it should be noted that the advantages, benefits, effects, etc. mentioned in the present invention are merely examples and not intended to be limiting, and these advantages, benefits, effects, etc. are not to be considered as essential to the various embodiments of the present invention. Furthermore, the specific details disclosed herein are for purposes of illustration and understanding only, and are not intended to be limiting, as the invention is not necessarily limited to practice with the above described specific details.
In this specification, each embodiment is described in a progressive manner, and each embodiment is mainly described in a different manner from other embodiments, so that the same or similar parts between the embodiments are mutually referred to. For system embodiments, the description is relatively simple as it essentially corresponds to method embodiments, and reference should be made to the description of method embodiments for relevant points.
The block diagrams of the devices, systems, apparatuses, systems according to the present invention are merely illustrative examples and are not intended to require or imply that the connections, arrangements, configurations must be made in the manner shown in the block diagrams. As will be appreciated by one of skill in the art, the devices, systems, apparatuses, systems may be connected, arranged, configured in any manner. Words such as "including," "comprising," "having," and the like are words of openness and mean "including but not limited to," and are used interchangeably therewith. The terms "or" and "as used herein refer to and are used interchangeably with the term" and/or "unless the context clearly indicates otherwise. The term "such as" as used herein refers to, and is used interchangeably with, the phrase "such as, but not limited to.
The method and system of the present invention may be implemented in a number of ways. For example, the methods and systems of the present invention may be implemented by software, hardware, firmware, or any combination of software, hardware, firmware. The above-described sequence of steps for the method is for illustration only, and the steps of the method of the present invention are not limited to the sequence specifically described above unless specifically stated otherwise. Furthermore, in some embodiments, the present invention may also be embodied as programs recorded in a recording medium, the programs including machine-readable instructions for implementing the methods according to the present invention. Thus, the present invention also covers a recording medium storing a program for executing the method according to the present invention.
It is also noted that in the systems, devices and methods of the present invention, components or steps may be disassembled and/or assembled. Such decomposition and/or recombination should be considered as equivalent aspects of the present invention. The previous description of the disclosed aspects is provided to enable any person skilled in the art to make or use the present invention. Various modifications to these aspects will be readily apparent to those skilled in the art, and the generic principles defined herein may be applied to other aspects without departing from the scope of the invention. Thus, the present invention is not intended to be limited to the aspects shown herein but is to be accorded the widest scope consistent with the principles and novel features disclosed herein.
The foregoing description has been presented for purposes of illustration and description. Furthermore, this description is not intended to limit embodiments of the invention to the form disclosed herein. Although a number of example aspects and embodiments have been discussed above, a person of ordinary skill in the art will recognize certain variations, modifications, alterations, additions, and subcombinations thereof.
Claims (8)
1. A method for measuring error at high voltage of a low frequency voltage transformer using a reference capacitor, comprising:
connecting a tested low-frequency voltage transformer and a low-frequency standard voltage transformer into a difference loop under a preset low voltage, and measuring a low-voltage ratio error and a low-voltage phase error of the tested low-frequency voltage transformer under the low voltage, wherein the preset low voltage is the rated primary voltage of the low-frequency standard voltage transformer;
introducing a high-voltage standard capacitor and a low-voltage standard capacitor under a preset high voltage, connecting the high-voltage standard capacitor and the low-voltage standard capacitor with the tested low-frequency voltage transformer to form an equal-power loop, and measuring a first capacitance ratio and a first dielectric loss of the tested low-frequency voltage transformer under the preset low voltage and a second capacitance ratio and a second dielectric loss of the tested low-frequency voltage transformer under the preset high voltage through a high-voltage capacitance bridge;
Measuring a high-voltage Rong Dianya coefficient and a high-voltage dielectric loss voltage coefficient of the high-voltage standard capacitor and a low-voltage capacitance voltage coefficient and a low-voltage dielectric loss voltage coefficient of the low-voltage standard capacitor by using a comparison method;
measuring a high-voltage capacitance ratio measurement error and a low-voltage dielectric loss measurement error of the high-voltage capacitance bridge under the preset low voltage by using a capacitance rotation method, and measuring a high-voltage capacitance ratio measurement error and a high-voltage dielectric loss measurement error under the preset high voltage;
calculating a high-voltage ratio error of the measured low-frequency voltage transformer under the preset high voltage according to the low-voltage ratio error, the first capacitance ratio, the second capacitance ratio, the high-voltage Rong Dianya coefficient, the low-voltage capacitance voltage coefficient, the low-voltage capacitance ratio measurement error and the high-voltage capacitance ratio measurement error;
and calculating the high-voltage phase error of the tested low-frequency voltage transformer under the preset high voltage according to the low-voltage phase error, the first dielectric loss, the second dielectric loss, the high-voltage dielectric loss voltage coefficient, the low-voltage dielectric loss measurement error and the high-voltage dielectric loss measurement error.
2. The method of claim 1, wherein connecting the measured low frequency voltage transformer with the low frequency standard voltage transformer in a differential loop, measuring the low voltage ratio error and the low voltage phase error of the measured low frequency voltage transformer at low voltage, comprises:
after a 380V alternating current power supply is connected into a variable frequency source, the variable frequency source is connected with a voltage regulating transformer and a step-up transformer in parallel to generate high voltage with adjustable frequency, a high-voltage terminal of a primary winding of a tested low-frequency voltage transformer and a primary winding of a low-frequency standard voltage transformer are respectively connected into the high voltage, the low-voltage terminal is connected with the ground in a short circuit mode, wherein the rated primary voltage of the low-frequency standard voltage transformer is U N1 Rated secondary voltage Ua of 57.7V with transformation ratio N 1 Rated voltage of the tested low-frequency voltage transformer is U N2 Rated secondary voltage U b Also 57.7V, with a transformation ratio of N 2 ，U N1 ＜U N2 ；
When the same primary voltage is added to the primary terminals of the low-frequency standard voltage transformer and the tested low-frequency voltage transformer, a multi-disc induction voltage divider is connected in parallel to the secondary winding of the low-frequency standard voltage transformer, and the proportional winding of the multi-disc induction voltage divider is regulated to ensure that the output voltage of the multi-disc induction voltage divider is equal to the rated secondary voltage of the tested low-frequency voltage transformer;
the method comprises the steps of inputting a multi-disc induction voltage divider output winding serving as a U end of a parameter voltage input transformer calibrator, connecting a high-voltage terminal of the multi-disc induction voltage divider output winding with a high-voltage terminal of a measured low-frequency voltage transformer secondary winding, and connecting a low-voltage terminal of the multi-disc induction voltage divider output winding and a low-voltage terminal of the measured low-frequency voltage transformer secondary winding to two ends of a transformer calibrator differential measurement terminal delta U;
And the transformer calibrator measures a low-voltage ratio error and a low-voltage phase error under the preset low voltage.
3. The method of claim 1, wherein introducing a high voltage reference capacitor and a low voltage reference capacitor at a predetermined high voltage, connecting with the measured low frequency voltage transformer into an equal power loop, measuring a first capacitance ratio and a first dielectric loss of the measured low frequency voltage transformer at the predetermined low voltage and a second capacitance ratio and a second dielectric loss at the predetermined high voltage through a high voltage capacitance bridge, comprising:
connecting a primary winding high-voltage terminal of the low-frequency voltage transformer to be tested with a high-voltage terminal of a high-voltage standard capacitor, and connecting a secondary winding high-voltage terminal of the low-frequency voltage transformer to be tested with a high-voltage terminal of the low-voltage standard capacitor;
connecting a primary winding of a low-frequency voltage transformer to be tested with low-frequency preset high voltage, connecting a low-voltage terminal of a high-voltage standard capacitor to a tested terminal of a high-voltage capacitance bridge, connecting the low-voltage terminal of the low-voltage standard capacitor to a reference terminal of the high-voltage capacitance bridge, and connecting a low-voltage terminal of a secondary winding of the low-frequency voltage transformer to be tested and a high-voltage capacitance bridge grounding terminal to be grounded;
The voltage regulator is regulated to regulate primary voltage to the preset low voltage, and the first capacitance ratio and the first dielectric loss measured by the high-voltage capacitance bridge at the moment are recorded;
and adjusting the primary voltage to the preset high voltage to be measured, and recording the second capacitance ratio and the second dielectric loss measured by the high-voltage capacitor bridge at the moment.
4. The method of claim 1, wherein measuring the high voltage Rong Dianya coefficient and the high voltage dielectric loss voltage coefficient of the high voltage reference capacitor and the low voltage dielectric loss voltage coefficient of the low voltage reference capacitor using a comparison method comprises:
connecting the high voltage electrodes of the low voltage reference capacitor or the high voltage reference capacitor with the high voltage output terminals of the high voltage power supply respectively, and connecting the low voltage measurement terminals to the high voltage capacitance bridge respectively by using shielded cables;
respectively at 10% U N 、20％U N 、30％U N 、40％U N 、50％U N 、60％U N 、70％U N 、80％U N 、90％U N 、100％U N Measuring capacitance ratio and loss factor at test voltage, wherein U N A rated voltage for the low voltage reference capacitor or the high voltage reference capacitor;
adjusting bridge balance under each specified test voltage, respectively reading capacitance and dielectric loss, and calculating a capacitance voltage coefficient and a dielectric loss voltage coefficient under each specified test voltage;
And selecting the maximum absolute value of each test voltage measurement point as the low-voltage capacitance voltage coefficient and the low-voltage dielectric loss voltage coefficient or the high-voltage power Rong Dianya coefficient and the high-voltage dielectric loss voltage coefficient.
5. The method of claim 1, wherein measuring the high voltage capacitance bridge at the preset low voltage ratio measurement error and the low voltage dielectric loss measurement error, and the high voltage capacitance ratio measurement error and the high voltage dielectric loss measurement error at the preset high voltage using a capacitance rotation method comprises:
the high-voltage electrodes of two test low-voltage standard capacitors with the same capacitance are respectively connected with a high-voltage output terminal of a high-voltage power supply, and a low-voltage measurement terminal is respectively connected to a reference terminal and a tested terminal of the high-voltage capacitance bridge by using a shielded cable;
under the preset low voltage, respectively taking one of the test low-voltage standard capacitors as a reference standard device and the other test low-voltage standard capacitor as a tested capacitor, and measuring the low-voltage capacity proportional indication value and the low-voltage dielectric loss under two loops;
calculating a low-voltage capacitance ratio measurement error and a low-voltage dielectric loss measurement error of the high-voltage capacitance bridge under the preset low voltage according to the low-voltage capacitance ratio indication values and the low-voltage dielectric loss of the two test low-voltage standard capacitors;
Connecting high-voltage electrodes of two high-voltage standard capacitors with the same capacitance with high-voltage output terminals of a high-voltage power supply respectively, and connecting low-voltage measurement terminals to a reference terminal and a tested terminal of the high-voltage capacitance bridge respectively by using shielded cables;
under the preset high voltage, respectively taking one of the test high voltage standard capacitors as a reference standard device and the other test high voltage standard capacitor as a tested capacitor, and measuring the high voltage capacity proportion indication value and the high voltage dielectric loss under two loops;
and calculating a high-voltage capacitance ratio measurement error and a high-voltage dielectric loss measurement error of the high-voltage capacitance bridge under the preset low voltage according to the high-voltage capacitance ratio indication values and the high-voltage dielectric loss of the two tested high-voltage standard capacitors.
6. An apparatus for measuring a high voltage error of a low frequency voltage transformer using a reference capacitor, comprising:
the first measurement module is used for connecting the tested low-frequency voltage transformer and the low-frequency standard voltage transformer into a difference loop under the preset low voltage, and measuring the low-voltage ratio error and the low-voltage phase error of the tested low-frequency voltage transformer under the low voltage, wherein the preset low voltage is the rated primary voltage of the low-frequency standard voltage transformer;
The second measurement module is used for introducing a high-voltage standard capacitor and a low-voltage standard capacitor under a preset high voltage, connecting the high-voltage standard capacitor and the low-frequency voltage transformer to be measured into an equal-power loop, and measuring a first capacitance ratio and a first dielectric loss of the low-frequency voltage transformer to be measured under the preset low voltage and a second capacitance ratio and a second dielectric loss of the low-frequency voltage transformer to be measured under the preset high voltage through a high-voltage capacitance bridge;
a third measurement module for measuring a high voltage Rong Dianya coefficient and a high voltage dielectric loss voltage coefficient of the high voltage standard capacitor, and a low voltage capacitance voltage coefficient and a low voltage dielectric loss voltage coefficient of the low voltage standard capacitor by using a comparison method;
a fourth measurement module, configured to measure a high-voltage capacitance bridge ratio measurement error and a low-voltage dielectric loss measurement error at the preset low voltage by using a capacitance rotation method, and a high-voltage capacitance bridge ratio measurement error and a high-voltage dielectric loss measurement error at the preset high voltage;
the first calculating module is used for calculating a high-voltage ratio error of the measured low-frequency voltage transformer under the preset high voltage according to the low-voltage ratio error, the first capacitance ratio, the second capacitance ratio, the high-voltage power Rong Dianya coefficient, the low-voltage capacitance voltage coefficient, the low-voltage capacitance ratio measurement error and the high-voltage capacitance ratio measurement error;
The second calculation module is configured to calculate a high-voltage phase error of the measured low-frequency voltage transformer under the preset high voltage according to the low-voltage phase error, the first dielectric loss, the second dielectric loss, the high-voltage dielectric loss voltage coefficient, the low-voltage dielectric loss measurement error and the high-voltage dielectric loss measurement error.
7. A computer readable storage medium, characterized in that the storage medium stores a computer program for executing the method of any of the preceding claims 1-5.
8. An electronic device, the electronic device comprising:
a processor;
a memory for storing the processor-executable instructions;
the processor is configured to read the executable instructions from the memory and execute the instructions to implement the method of any of the preceding claims 1-5.
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| CN116990738A (en) * | 2023-09-28 | 2023-11-03 | 国网江苏省电力有限公司营销服务中心 | Low-voltage-driven 1kV voltage proportion standard quantity value tracing method, device and system |
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| CN116990738A (en) * | 2023-09-28 | 2023-11-03 | 国网江苏省电力有限公司营销服务中心 | Low-voltage-driven 1kV voltage proportion standard quantity value tracing method, device and system |
| CN116990738B (en) * | 2023-09-28 | 2023-12-01 | 国网江苏省电力有限公司营销服务中心 | Low-voltage-driven 1kV voltage proportion standard quantity value tracing method, device and system |
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