CN116794587A - Method for measuring high-voltage error of low-frequency voltage transformer by using standard capacitor - Google Patents

Abstract

The invention discloses a method for measuring the error of a low-frequency voltage transformer under high voltage by using a standard capacitor, which includes: connecting the measured low-frequency voltage transformer and the low-frequency standard voltage transformer into a difference loop under a preset low voltage, and measuring the low-voltage ratio. error and low-voltage phase error; introduce a high-voltage standard capacitor and a low-voltage standard capacitor at the preset high voltage, connect them to the measured low-frequency voltage transformer to form an equal power loop, and measure the first capacitance ratio, the first dielectric loss, and the second capacitance ratio. and second dielectric loss; use the comparison method to measure the high voltage capacitance voltage coefficient, high voltage dielectric loss voltage coefficient, low voltage capacitance voltage coefficient and low voltage dielectric loss voltage coefficient; use the capacitor rotation method to measure the low voltage capacitance ratio measurement error, low voltage dielectric loss measurement error, high voltage Capacitance ratio measurement error and high-voltage dielectric loss measurement error; calculate the high-voltage ratio error and high-voltage phase error of the measured low-frequency voltage transformer under the preset high voltage based on the above parameters.

Description

Method of measuring the error of low-frequency voltage transformer under high voltage using standard capacitor

Technical field

The present invention relates to the technical field of high-voltage electrical equipment, and more specifically, to a method of measuring the error of a low-frequency voltage transformer under high voltage using a standard capacitor.

Background technique

Flexible low-frequency power transmission uses power electronics technology to flexibly select the appropriate frequency from 0 to 50 Hz to improve the transmission capacity and flexible control capabilities of the power grid. It is a new and efficient AC power transmission technology. It has significant economic advantages for offshore wind power transmission, new energy power generation collection and transmission, etc. At the beginning of the last century, Germany built a 16.7Hz single-phase AC railway traction power supply system in order to reduce the brush sparks of the series motor, and it has been used to this day. In 1994, Academician Wang Xifan proposed the 50/3Hz frequency division transmission technology, which was connected to the industrial frequency power grid through a frequency multiplier transformer, in order to solve the problem of low-speed hydroelectric generators outputting high power and transmitting it over long distances. In recent years, with the development of my country's offshore wind power technology, the large capacitance of submarine cables to the ground has limited active power transmission, and it is necessary to carry out research on low-frequency power transmission suitable for long-distance and large-capacity power transmission.

As an important device for low-frequency transmission voltage and current measurement and power grid protection, low-frequency transformers need to be verified for their key performance. The key performance tests of low-frequency transformers include insulation tests and accuracy tests. The insulation test is a general test for low-frequency and high-voltage electrical equipment. It only needs to solve the low-frequency power supply. The accuracy test is a unique and important test for low-frequency transformers, and it is also a test that must be carried out.

Standard voltage transformers are key equipment for transformer accuracy testing. Since standard voltage transformers need to be traceable to national benchmarks, my country's existing national benchmarks are all established at power frequency and cannot be directly used at low frequencies.

Contents of the invention

In view of the shortcomings of the existing technology, the present invention provides a method of using a standard capacitor to measure the error of a low-frequency voltage transformer under high voltage.

According to one aspect of the present invention, a method for measuring the error of a low-frequency voltage transformer under high voltage using a standard capacitor is provided, including:

At the preset low voltage, connect the low-frequency voltage transformer under test and the low-frequency standard voltage transformer to form a difference loop, and measure the low-voltage ratio error and low-voltage phase error of the low-frequency voltage transformer under test at low voltage. The preset low voltage It is the rated primary voltage of the low-frequency standard voltage transformer;

Under the preset high voltage, introduce high-voltage standard capacitors and low-voltage standard capacitors, connect them to the low-frequency voltage transformer under test to form an equal power loop, and measure the low-frequency voltage transformer under test under the preset low voltage through the high-voltage capacitor bridge. a capacitance ratio and a first dielectric loss and a second capacitance ratio and a second dielectric loss under a preset high voltage;

Use the comparison method to measure the high-voltage capacitance voltage coefficient and high-voltage dielectric loss voltage coefficient of the high-voltage standard capacitor, as well as the low-voltage capacitance voltage coefficient and low-voltage dielectric loss voltage coefficient of the low-voltage standard capacitor;

Use the capacitance rotation method to measure the low-voltage capacitance ratio measurement error and low-voltage dielectric loss measurement error of the high-voltage capacitance bridge at a preset low voltage, as well as the high-voltage capacitance ratio measurement error and high-voltage dielectric loss measurement error at a preset high voltage;

According to the low voltage ratio error, the first capacitance ratio, the second capacitance ratio, the high voltage capacitance voltage coefficient, the low voltage capacitance voltage coefficient, the low voltage capacitance ratio measurement error and the high voltage capacitance ratio measurement error, calculate the measured low frequency voltage transformer under the preset high voltage. High voltage ratio error;

Based on the low-voltage phase error, first dielectric loss, second dielectric loss, high-voltage dielectric loss voltage coefficient, low-voltage dielectric loss voltage coefficient, low-voltage dielectric loss measurement error and high-voltage dielectric loss measurement error, calculate the measured low-frequency voltage transformer at the preset high voltage high voltage phase error under.

Optionally, connect the low-frequency voltage transformer under test and the low-frequency standard voltage transformer to form a difference loop, and measure the low-voltage ratio error and low-voltage phase error of the low-frequency voltage transformer under test at low voltage, including:

After connecting the 380V AC power source to the variable frequency source, connect it in parallel with the voltage-regulating transformer and the step-up transformer to generate a high voltage with adjustable frequency. Connect the high-voltage terminals of the primary winding of the low-frequency voltage transformer under test and the low-frequency standard voltage transformer respectively. Enter high voltage, and the low-voltage terminal is short-circuited to ground. The rated primary voltage of the low-frequency standard voltage transformer is U _N1 , the rated secondary voltage Ua is 57.7V, the transformation ratio is N ₁ , and the rated voltage of the measured low-frequency voltage transformer is U _N2 . The rated secondary voltage U _b is also 57.7V, the transformation ratio is N ₂ , U _N1 < U _N2 ;

When the same primary voltage is applied to the primary terminals of the low-frequency standard voltage transformer and the low-frequency voltage transformer under test, a multi-disk inductive voltage divider is connected in parallel to the secondary winding of the low-frequency standard voltage transformer to adjust the multi-disk inductive voltage divider. The proportional winding of the transformer makes its output voltage equal to the rated secondary voltage of the low-frequency voltage transformer under test;

Input the output winding of the multi-disk induction voltage divider as a parameter voltage to the U terminal of the transformer calibrator. Connect the high-voltage terminal of the output winding of the multi-disk induction voltage divider with the high-voltage terminal of the secondary winding of the low-frequency voltage transformer under test. The low-voltage terminal of the output winding of the multi-disk induction voltage divider and the low-voltage terminal of the secondary winding of the low-frequency voltage transformer under test are connected to both ends of the differential measurement terminal △U of the transformer calibrator;

The transformer calibrator measures the low voltage ratio error and low voltage phase error at the preset low voltage.

Optionally, under the preset high voltage, introduce a high-voltage standard capacitor and a low-voltage standard capacitor, connect them to the low-frequency voltage transformer under test to form an equal power loop, and measure the low-frequency voltage transformer under test at the preset low voltage through the high-voltage capacitor bridge. The first capacitance ratio and the first dielectric loss under the voltage and the second capacitance ratio and the second dielectric loss under the preset high voltage include:

Connect the high-voltage terminal of the primary winding of the low-frequency voltage transformer under test to the high-voltage terminal of the high-voltage standard capacitor, and connect the high-voltage terminal of the secondary winding of the low-frequency voltage transformer under test to the high-voltage terminal of the low-voltage standard capacitor;

Connect the primary winding of the low-frequency voltage transformer under test to the low-frequency preset high voltage, connect the low-voltage terminal of the high-voltage standard capacitor to the tested terminal of the high-voltage capacitor bridge, and connect the low-voltage terminal of the low-voltage standard capacitor to the reference terminal of the high-voltage capacitor bridge. Tap to ground the primary and secondary winding low-voltage terminals and the high-voltage capacitor bridge grounding terminal of the low-frequency voltage transformer under test;

Adjust the voltage regulator to adjust the primary voltage to the preset low voltage, and record the first capacitance ratio and the first dielectric loss measured by the high-voltage capacitor bridge at this time;

Adjust the primary voltage to the preset high voltage to be measured, and record the second capacitance ratio and second dielectric loss measured by the high-voltage capacitor bridge at this time.

Optionally, use the comparison method to measure the high-voltage capacitance voltage coefficient and high-voltage dielectric loss voltage coefficient of the high-voltage standard capacitor, and the low-voltage capacitance voltage coefficient and low-voltage dielectric loss voltage coefficient of the low-voltage standard capacitor, including:

Connect the high-voltage electrodes of the low-voltage standard capacitor or the high-voltage standard capacitor and the reference standard capacitor to the high-voltage output terminal of the high-voltage power supply respectively, and the low-voltage measurement terminals are connected to the high-voltage capacitor bridge with shielded cables;

Respectively at 10% _UN , 20% _UN , 30% _UN , 40% _UN , 50% _UN , 60% _UN , 70% _UN , 80% _UN , 90% _UN , 100%U Measure the capacitance ratio and loss factor under the _N test voltage, where U _N is the rated voltage of the low-voltage standard capacitor or the high-voltage standard capacitor;

Adjust the bridge balance at each specified test voltage, read the capacitance and dielectric loss respectively, and calculate the capacitance voltage coefficient and dielectric loss voltage coefficient at each specified test voltage;

Select the maximum absolute value of a test voltage measurement point as the low-voltage capacitor voltage coefficient and low-voltage dielectric loss voltage coefficient or the high-voltage capacitor voltage coefficient and high-voltage dielectric loss voltage coefficient.

Optionally, use the capacitance rotation method to measure the low-voltage capacitance ratio measurement error and low-voltage dielectric loss measurement error of the high-voltage capacitance bridge at a preset low voltage, and the high-voltage capacitance ratio measurement error and high-voltage dielectric loss measurement at a preset high voltage. Errors include:

Connect the high-voltage electrodes of the two test low-voltage standard capacitors with the same capacitance to the high-voltage output terminal of the high-voltage power supply, and the low-voltage measurement terminals are connected to the reference terminal and the measured terminal of the high-voltage capacitor bridge using shielded cables;

Under the preset low voltage, use one of the test low-voltage standard capacitors as the reference standard, and the other test low-voltage standard capacitor as the capacitor under test, and measure the low-voltage capacitance ratio indication and low-voltage dielectric loss in the two circuits;

Based on the low-voltage capacitance ratio indication and low-voltage dielectric loss of the two tested low-voltage standard capacitors, calculate the low-voltage capacitance ratio measurement error and low-voltage dielectric loss measurement error of the high-voltage capacitance bridge at the preset low voltage;

Connect the high-voltage electrodes of the two test high-voltage standard capacitors with the same capacitance to the high-voltage output terminal of the high-voltage power supply, and the low-voltage measurement terminals are connected to the reference terminal and the measured terminal of the high-voltage capacitor bridge using shielded cables;

Under the preset high voltage, use one of the test high-voltage standard capacitors as the reference standard, and the other test high-voltage standard capacitor as the capacitor under test, and measure the high-voltage capacitance ratio indication and high-voltage dielectric loss in the two circuits;

Based on the high-voltage capacitance ratio indication values and high-voltage dielectric loss of the two tested high-voltage standard capacitors, calculate the high-voltage capacitance ratio measurement error and high-voltage dielectric loss measurement error of the high-voltage capacitance bridge at the preset low voltage.

According to another aspect of the present invention, a device for measuring the error of a low-frequency voltage transformer under high voltage using a standard capacitor is provided, including:

The first measurement module is used to connect the low-frequency voltage transformer under test and the low-frequency standard voltage transformer into a difference loop at a preset low voltage, and measure the low-voltage ratio error and low-voltage value of the low-frequency voltage transformer under test at low voltage. Phase error, the preset low voltage is the rated primary voltage of the low-frequency standard voltage transformer;

The second measurement module is used to introduce high-voltage standard capacitors and low-voltage standard capacitors under the preset high voltage, connect them to the measured low-frequency voltage transformer to form an equal power loop, and measure the measured low-frequency voltage transformer through the high-voltage capacitor bridge. The first capacitance ratio and the first dielectric loss are preset at a low voltage and the second capacitance ratio and the second dielectric loss are at a preset high voltage;

The third measurement module is used to measure the high-voltage capacitance voltage coefficient and high-voltage dielectric loss voltage coefficient of the high-voltage standard capacitor using the comparison method, as well as the low-voltage capacitance voltage coefficient and low-voltage dielectric loss voltage coefficient of the low-voltage standard capacitor;

The fourth measurement module is used to measure the low-voltage capacitance ratio measurement error and low-voltage dielectric loss measurement error of the high-voltage capacitance bridge under the preset low voltage using the capacitance rotation method, and the high-voltage capacitance ratio measurement error and high voltage under the preset high voltage. Dielectric loss measurement error;

The first calculation module is used to calculate the measured low-frequency voltage mutual inductance based on the low-voltage ratio error, the first capacitance ratio, the second capacitance ratio, the high-voltage capacitance voltage coefficient, the low-voltage capacitance voltage coefficient, the low-voltage capacitance ratio measurement error, and the high-voltage capacitance ratio measurement error. The high voltage ratio error of the device at the preset high pressure;

The second calculation module is used to calculate the measured low frequency based on the low-voltage phase error, first dielectric loss, second dielectric loss, high-voltage dielectric loss voltage coefficient, low-voltage dielectric loss voltage coefficient, low-voltage dielectric loss measurement error and high-voltage dielectric loss measurement error. The high voltage phase error of the voltage transformer at the preset high voltage.

According to another aspect of the present invention, a computer-readable storage medium is provided, the storage medium stores a computer program, and the computer program is used to execute the method described in any of the above aspects of the present invention.

According to yet another aspect of the present invention, an electronic device is provided. The electronic device includes: a processor; a memory for storing instructions executable by the processor; and the processor for reading from the memory. Fetch the executable instructions and execute the instructions to implement the method described in any of the above aspects of the present invention.

Therefore, the present invention proposes a method of using standard capacitors to measure the error of low-frequency voltage transformers at high voltages. This method solves the problem of lack of high-voltage level low-frequency standard voltage transformers and can realize error measurement of higher-level low-frequency voltage transformers.

Description of the drawings

A more complete understanding of exemplary embodiments of the invention may be obtained by reference to the following drawings:

Figure 1 is a schematic flow chart of a method for measuring the error of a low-frequency voltage transformer under high voltage using a standard capacitor according to an exemplary embodiment of the present invention;

Figure 2 is a schematic diagram of the error measurement circuit of the tested low-frequency voltage transformer at low voltage provided by an exemplary embodiment of the present invention;

Figure 3 is a schematic diagram of a measuring voltage transformer error loop provided by an exemplary embodiment of the present invention;

Figure 4 is a circuit diagram of a high-voltage standard capacitor power frequency voltage linearity measurement circuit provided by an exemplary embodiment of the present invention;

Figure 5 is a schematic structural diagram of a device for measuring the error of a low-frequency voltage transformer under high voltage using a standard capacitor according to an exemplary embodiment of the present invention;

Figure 6 is a structure of an electronic device provided by an exemplary embodiment of the present invention.

Detailed ways

Hereinafter, exemplary embodiments according to the present invention will be described in detail with reference to the accompanying drawings. Obviously, the described embodiments are only some embodiments of the present invention, rather than all embodiments of the present invention. It should be understood that the present invention is not limited to the example embodiments described here.

It should be noted that the relative arrangement of components and steps, numerical expressions and numerical values set forth in these examples do not limit the scope of the invention unless otherwise specifically stated.

Those skilled in the art can understand that terms such as "first" and "second" in the embodiments of the present invention are only used to distinguish different steps, devices or modules, etc., and do not represent any specific technical meaning, nor do they represent the differences between them. necessary logical sequence.

It should also be understood that in the embodiment of the present invention, "multiple" may refer to two or more than two, and "at least one" may refer to one, two, or more than two.

It should also be understood that any component, data or structure mentioned in the embodiments of the present invention can generally be understood to mean one or more unless there is an explicit limitation or contrary inspiration is given in the context.

In addition, the term "and/or" in the present invention is only an association relationship describing related objects, indicating that there can be three relationships, for example, A and/or B, which can mean: A alone exists, and A and B exist simultaneously. , there are three situations of B alone. In addition, the character "/" in the present invention generally indicates that the related objects are in an "or" relationship.

It should also be understood that the description of the various embodiments of the present invention focuses on the differences between the various embodiments, and the similarities or similarities between the embodiments can be referred to each other. For the sake of brevity, they will not be described again one by one.

At the same time, it should be understood that, for convenience of description, the dimensions of various parts shown in the drawings are not drawn according to actual proportional relationships.

The following description of at least one exemplary embodiment is merely illustrative in nature and is in no way intended to limit the invention, its application or uses.

Techniques, methods and devices known to those of ordinary skill in the relevant art may not be discussed in detail, but where appropriate, the techniques, methods and devices should be considered a part of the specification.

It should be noted that similar reference numerals and letters refer to similar items in the following figures, so that once an item is defined in one figure, it does not need further discussion in subsequent figures.

Embodiments of the present invention may be applied to electronic devices such as terminal devices, computer systems, servers, etc., which may operate with numerous other general or special purpose computing system environments or configurations. Examples of well-known terminal devices, computing systems, environments and/or configurations suitable for use with terminal devices, computer systems, servers and other electronic devices include, but are not limited to: personal computer systems, server computer systems, thin clients, thick clients Computers, handheld or laptop devices, microprocessor-based systems, set-top boxes, programmable consumer electronics, networked personal computers, small computer systems, mainframe computer systems and distributed cloud computing technology environments including any of the above systems, etc.

Electronic devices such as terminal devices, computer systems, servers, etc. may be described in the general context of computer system executable instructions (such as program modules) being executed by the computer system. Generally, program modules may include routines, programs, object programs, components, logic, data structures, etc., that perform specific tasks or implement specific abstract data types. The computer system/server may be implemented in a distributed cloud computing environment where tasks are performed by remote processing devices linked through a communications network. In a distributed cloud computing environment, program modules may be located on local or remote computing system storage media including storage devices.

Example methods

FIG. 1 is a schematic flowchart of a method for measuring the error of a low-frequency voltage transformer under high voltage using a standard capacitor according to an exemplary embodiment of the present invention. This embodiment can be applied to electronic equipment. As shown in Figure 1, a method 100 for measuring the error of a low-frequency voltage transformer under high voltage using a standard capacitor includes the following steps:

Step 101, under the preset low voltage, connect the low-frequency voltage transformer under test and the low-frequency standard voltage transformer to form a difference loop, measure the low-voltage ratio error and low-voltage phase error of the low-frequency voltage transformer under test under low voltage, and preset Let the low voltage be the rated primary voltage of the low-frequency standard voltage transformer;

Step 102: Under the preset high voltage, introduce a high-voltage standard capacitor and a low-voltage standard capacitor, connect them to the measured low-frequency voltage transformer to form an equal power loop, and measure the measured low-frequency voltage transformer at the preset low voltage through the high-voltage capacitor bridge. The first capacitance ratio and the first dielectric loss under the preset high voltage and the second capacitance ratio and the second dielectric loss under the preset high voltage;

Step 103, use the comparison method to measure the high-voltage capacitance voltage coefficient and high-voltage dielectric loss voltage coefficient of the high-voltage standard capacitor, and the low-voltage capacitance voltage coefficient and low-voltage dielectric loss voltage coefficient of the low-voltage standard capacitor;

Step 104: Use the capacitance rotation method to measure the low-voltage capacitance ratio measurement error and low-voltage dielectric loss measurement error of the high-voltage capacitance bridge under the preset low voltage, and the high-voltage capacitance ratio measurement error and high-voltage dielectric loss measurement error under the preset high voltage. ;

Step 105: Calculate the preset value of the measured low-frequency voltage transformer based on the low-voltage ratio error, the first capacitance ratio, the second capacitance ratio, the high-voltage capacitance voltage coefficient, the low-voltage capacitance voltage coefficient, the low-voltage capacitance ratio measurement error, and the high-voltage capacitance ratio measurement error. High pressure ratio error under high pressure;

Step 106: Calculate the value of the measured low-frequency voltage transformer based on the low-voltage phase error, the first dielectric loss, the second dielectric loss, the high-voltage dielectric loss voltage coefficient, the low-voltage dielectric loss voltage coefficient, the low-voltage dielectric loss measurement error, and the high-voltage dielectric loss measurement error. High voltage phase error at preset high voltage.

Specifically, the standard capacitor is a gas-insulated flat capacitor, which has excellent frequency characteristics. Studies have shown that its capacitance and dielectric loss voltage coefficient are affected by frequency in the order of 10-6. The present invention proposes a method for measuring the error of high-voltage and low-frequency voltage transformers by using standard capacitors on the premise that there is an existing low-voltage level and low-frequency voltage ratio standard. This method can measure low-frequency voltage mutual inductance in the absence of a high-voltage level standard voltage transformer. device error. Specific steps are as follows:

Step 1: At the low voltage level, connect the low-frequency voltage transformer under test and the low-frequency standard voltage transformer to form a difference loop, and measure the ratio error f ₀ and phase error δ ₀ of the low-frequency voltage transformer under test at low voltage. as shown in picture 2.

In Figure 2, after the 380V AC power supply is connected to the variable frequency source, it is connected in parallel with the voltage-regulating transformer and the step-up transformer to generate a high voltage with adjustable frequency. Connect the high-voltage terminals of the primary winding of the tested PT and the standard PT _N respectively. High voltage and low voltage terminals are shorted to ground. The rated primary voltage of PT _N is U _N1 , the rated secondary voltage Ua is 57.7V, the transformation ratio is N ₁ , the rated voltage of PT is U _N2 , the rated secondary voltage U _b is also 57.7V, the transformation ratio is N ₂ , U _N1 < U _N2 , since PT _N and PT have the same secondary voltage, N ₁ < N ₂ . When the same primary voltage is applied to the primary terminals of PT _N and PT, Ua = U _N1 /N ₁ , Ub = U _N2 /N ₂ , then U _a > U _b , therefore, it is necessary to apply a voltage on the secondary winding of PT _N Connect multi-disk inductive voltage dividers in parallel and adjust the proportional windings of the multi-disk inductive voltage dividers so that their output voltage is equal to U _b .

Input the output winding of the multi-disk induction voltage divider as a parameter voltage to the U terminal of the transformer calibrator, connect the high-voltage terminal of the output winding of the multi-disk induction voltage divider to the high-voltage terminal of the PT secondary winding, and divide the multi-disk induction voltage The low-voltage terminal of the transformer output winding and the low-voltage terminal of the PT secondary winding are connected to both ends of the differential measurement terminal △U of the transformer calibrator.

At this time, the transformer calibrator will measure the ratio error f ₀ and phase error δ ₀ at low voltage U ₁ .

Step 2: Under high voltage, introduce high and low voltage standard capacitors, connect them to the voltage transformer under test to form an equal power loop, and measure the error of the voltage transformer under test under high voltage through the high voltage capacitor bridge. As shown in Figure 3.

In Figure 3, C ₁ is a high-voltage standard capacitor, C ₂ is a low-voltage standard capacitor, connect the high-voltage terminal of the primary winding of PT to the high-voltage terminal of C ₁ , and connect the high-voltage terminal of the secondary winding of PT to the high-voltage terminal of C ₂ . Connect _the primary winding of PT to _the low-frequency high voltage U, connect the C ₁ low-voltage terminal to _the measured terminal C The primary and secondary winding low-voltage terminals and the high-voltage capacitor bridge ground terminal are grounded. The capacitance of the high-voltage capacitor C1, the capacitance of the low-voltage capacitor C2 and the transformation ratio N of the PT of this circuit need to satisfy the following formula:

Adjust the voltage regulator to adjust the primary voltage to the rated primary voltage U ₁ of PT _N. Record the capacitance ratio N ₀ and dielectric loss D ₀ measured by the high-voltage capacitor bridge at this time, and then adjust the primary voltage to the high voltage that needs to be measured. U, record the capacitance ratio N and dielectric loss D measured by the high-voltage capacitor bridge at this time.

Then the error of PT under U at this time is:

δ≈δ ₀ +(DD ₀ )-ΔD ₁ +ΔD ₂ -(β-β ₀ )

In the formula: is the capacitance voltage coefficient of the high-voltage standard capacitor,/> is the capacitance voltage coefficient of the low-voltage standard capacitor, ΔD ₁ is the dielectric loss voltage coefficient of the high-voltage standard capacitor, ΔD ₂ is the dielectric loss voltage coefficient of the low-voltage standard capacitor, α and β are the capacitance ratio measurement errors of the high-voltage capacitor bridge under U voltage. and dielectric loss measurement error, α ₀ and β ₀ are respectively the capacitance ratio measurement error and dielectric loss measurement error of the high-voltage capacitor bridge under U ₁ voltage.

Step 3: Use the comparison method to measure the voltage coefficient of the standard capacitor, as shown in Figure 4. Cx is the high/low voltage standard capacitor that needs to be measured.

The measurement steps are as follows:

_① The high-voltage electrodes of _C Assume that the rated voltage of the standard capacitor is U ₀ , respectively at 10% _UN , 20% _UN , 30% _UN , 40% _UN , 50% _UN , 60% _UN , 70% _UN , 80%U Measure the capacitance ratio and loss factor under _N , 90% _UN and 100% _UN .

② Adjust the bridge balance at each specified test voltage, read the capacitance C and dielectric loss D respectively, and then calculate the voltage coefficient of the capacitance according to equation (1), and calculate the voltage coefficient of the dielectric loss according to equation (2).

For high voltage standard capacitors:

ΔD ₁ =D _1x -D ₁₀ (2)

For low voltage standard capacitors:

ΔD ₂ =D _2x -D ₂₀ (4)

Among them: C _1x and C _2x are the capacitances of high-voltage standard capacitors and low-voltage standard capacitors under high voltage respectively; D _1x and D _2x are the dielectric loss values of high-voltage standard capacitors and low-voltage standard capacitors under high voltage respectively; C ₁₀ and C ₂₀ are the capacitances of low-voltage standard capacitors and low-voltage standard capacitors respectively; D ₁₀ and D ₂₀ are the dielectric loss values of high-voltage standard capacitors and low-voltage standard capacitors at low voltage, respectively.

③ Measurements should be carried out at least three times when the voltage rises and falls. For each voltage percentage point, the middle value of 6 or more measurement data sorted by size is selected as the verification result, and the maximum absolute value of each measurement point is selected. as the voltage coefficient value.

Step 4: Use the capacitor rotation method to measure the error of the high-voltage capacitor bridge at each voltage point. As shown in Figure 4, take two low-voltage standard capacitors _CA and C _B with the same capacitance and connect them according to the comparison method. At the measured voltage point, use C _A and C _B as standard capacitors respectively, and measure the capacitance of another standard capacitor (wherein, the current flowing through the high-voltage capacitor bridge in the two cases covers the high-voltage capacitor bridge in the aforementioned equal power circuit. _current range) _, the _measured proportional indication values are X _A and

When measuring using the capacitance rotation method at low voltage, the capacitance ratio measurement error and dielectric loss measurement error of the high-voltage capacitance bridge are α ₀ and β ₀ respectively. When measuring using the capacitance rotation method at high voltage, the capacitance of the high-voltage capacitance bridge The ratio measurement error and dielectric loss measurement error are α and β respectively.

Therefore, the present invention proposes a method of using standard capacitors to measure the error of low-frequency voltage transformers at high voltages. This method solves the problem of lack of high-voltage level low-frequency standard voltage transformers and can realize error measurement of higher-level low-frequency voltage transformers.

Exemplary device

FIG. 5 is a schematic structural diagram of a device for measuring the error of a low-frequency voltage transformer under high voltage using a standard capacitor according to an exemplary embodiment of the present invention. As shown in Figure 5, device 500 includes:

The first measurement module 510 is used to connect the low-frequency voltage transformer under test and the low-frequency standard voltage transformer into a difference loop at a preset low voltage, and measure the low-voltage ratio error sum of the low-frequency voltage transformer under test at low voltage. Low voltage phase error, the preset low voltage is the rated primary voltage of the low-frequency standard voltage transformer;

The second measurement module 520 is used to introduce high-voltage standard capacitors and low-voltage standard capacitors at a preset high voltage, connect them to the measured low-frequency voltage transformer to form an equal power loop, and measure the measured low-frequency voltage transformer through the high-voltage capacitor bridge. The first capacitance ratio and the first dielectric loss at the preset low voltage and the second capacitance ratio and the second dielectric loss at the preset high voltage;

The third measurement module 530 is used to measure the high-voltage capacitance voltage coefficient and high-voltage dielectric loss voltage coefficient of the high-voltage standard capacitor, and the low-voltage capacitance voltage coefficient and low-voltage dielectric loss voltage coefficient of the low-voltage standard capacitor using the comparison method;

The fourth measurement module 540 is used to measure the low-voltage capacitance ratio measurement error and the low-voltage dielectric loss measurement error of the high-voltage capacitance bridge under the preset low voltage using the capacitance rotation method, and the high-voltage capacitance ratio measurement error under the preset high voltage. High voltage dielectric loss measurement error;

The first calculation module 550 is used to calculate the measured low-frequency voltage based on the low-voltage ratio error, the first capacitance ratio, the second capacitance ratio, the high-voltage capacitance voltage coefficient, the low-voltage capacitance voltage coefficient, the low-voltage capacitance ratio measurement error, and the high-voltage capacitance ratio measurement error. The high voltage ratio error of the transformer at the preset high voltage;

The second calculation module 560 is used to calculate the measured value based on the low-voltage phase error, the first dielectric loss, the second dielectric loss, the high-voltage dielectric loss voltage coefficient, the low-voltage dielectric loss voltage coefficient, the low-voltage dielectric loss measurement error, and the high-voltage dielectric loss measurement error. High voltage phase error of low frequency voltage transformer at preset high voltage.

Optionally, the first measurement module 510 includes:

The first connection submodule is used to connect the 380V AC power supply to the variable frequency source and connect it in parallel with the voltage-regulating transformer and the step-up transformer to generate a high voltage with adjustable frequency, respectively, to connect the measured low-frequency voltage transformer to the low-frequency standard voltage. The high-voltage terminal of the primary winding of the transformer is connected to high voltage, and the low-voltage terminal is short-circuited to ground. The rated primary voltage of the low-frequency standard voltage transformer is U _N1 , the rated secondary voltage Ua is 57.7V, the transformation ratio is N ₁ , and the measured low-frequency voltage The rated voltage of the transformer is U _N2 , the rated secondary voltage U _b is also 57.7V, the transformation ratio is N ₂ , U _N1 < U _N2 ;

The first adjustment submodule is used to connect multiple inductive voltage dividers in parallel to the secondary winding of the low-frequency standard voltage transformer after adding the same primary voltage to the primary terminals of the low-frequency standard voltage transformer and the low-frequency voltage transformer under test. regulator, adjust the proportional winding of the multi-disk inductive voltage divider so that its output voltage is equal to the rated secondary voltage of the low-frequency voltage transformer under test;

The output submodule is used to input the output winding of the multi-disk induction voltage divider as a parameter voltage to the U terminal of the transformer calibrator, and connect the high-voltage terminal of the output winding of the multi-disk induction voltage divider to the secondary winding of the low-frequency voltage transformer under test. Connect the high-voltage terminals of the multi-disk induction voltage divider output winding and the low-voltage terminals of the secondary winding of the low-frequency voltage transformer under test to both ends of the differential measurement terminal △U of the transformer calibrator;

The first measurement submodule is used for the transformer calibrator to measure the low-voltage ratio error and low-voltage phase error at the preset low voltage.

Optionally, the second measurement module 520 includes:

The second connection submodule is used to connect the high-voltage terminal of the primary winding of the low-frequency voltage transformer under test to the high-voltage terminal of the high-voltage standard capacitor, and the high-voltage terminal of the secondary winding of the low-frequency voltage transformer under test to the high-voltage terminal of the low-voltage standard capacitor;

The third connection submodule is used to connect the primary winding of the low-frequency voltage transformer under test to the low-frequency preset high voltage, connect the low-voltage terminal of the high-voltage standard capacitor to the tested terminal of the high-voltage capacitor bridge, and connect the low-voltage terminal of the low-voltage standard capacitor. The reference terminal of the high-voltage capacitor bridge is tapped to ground the primary and secondary winding low-voltage terminals and the high-voltage capacitor bridge ground terminal of the low-frequency voltage transformer under test;

The second adjustment submodule is used to adjust the voltage regulator, adjust the primary voltage to a preset low voltage, and record the first capacitance ratio and the first dielectric loss measured by the high-voltage capacitor bridge at this time;

The recording submodule is used to adjust the primary voltage to a preset high voltage that needs to be measured, and record the second capacitance ratio and the second dielectric loss measured by the high-voltage capacitor bridge at this time.

Optionally, the third measurement module 530 includes:

The fourth connection submodule is used to connect the high-voltage electrodes of the low-voltage standard capacitor or the high-voltage standard capacitor and the reference standard capacitor to the high-voltage output terminal of the high-voltage power supply, and the low-voltage measurement terminals are connected to the high-voltage capacitance bridge using shielded cables;

The second measurement sub-module is used to measure 10% _UN , 20% _UN , 30% _UN , 40% _UN , 50% _UN , 60% _UN , 70% _UN , 80% _UN , Measure the capacitance ratio and loss factor under 90% U _N and 100% U _N test voltage, where U _N is the rated voltage of the low-voltage standard capacitor or high-voltage standard capacitor;

The first calculation submodule is used to adjust the bridge balance at each specified test voltage, read the capacitance and dielectric loss respectively, and calculate the capacitance voltage coefficient and dielectric loss voltage coefficient at each specified test voltage;

The selection submodule is used to select the maximum absolute value of a test voltage measurement point as the low-voltage capacitor voltage coefficient and low-voltage dielectric loss voltage coefficient or the high-voltage capacitor voltage coefficient and high-voltage dielectric loss voltage coefficient.

Optionally, the fourth measurement module 540 includes:

The fifth connection submodule is used to connect the high-voltage electrodes of two test low-voltage standard capacitors of the same capacitance to the high-voltage output terminal of the high-voltage power supply. The low-voltage measurement terminals are respectively connected to the reference terminal and the target terminal of the high-voltage capacitor bridge using shielded cables. Test terminal;

The third measurement submodule is used to measure the low-voltage capacitance ratio of the two circuits under the preset low voltage, using one of the test low-voltage standard capacitors as the reference standard and the other test low-voltage standard capacitor as the capacitor under test. value and low voltage dielectric loss;

The second calculation submodule is used to calculate the low-voltage capacitance ratio measurement error and the low-voltage dielectric loss measurement error of the high-voltage capacitance bridge at the preset low voltage based on the low-voltage capacitance ratio indication values and low-voltage dielectric loss of the two tested low-voltage standard capacitors. ;

The sixth connection submodule is used to connect the high-voltage electrodes of two test high-voltage standard capacitors of the same capacitance to the high-voltage output terminal of the high-voltage power supply. The low-voltage measurement terminals are respectively connected to the reference terminal and the target terminal of the high-voltage capacitor bridge using shielded cables. Test terminal;

The fourth measurement submodule is used to measure the high-voltage capacitance ratio of the two circuits under the preset high voltage, using one of the test high-voltage standard capacitors as the reference standard and the other test high-voltage standard capacitor as the capacitor under test. Indication value and high voltage dielectric loss;

The third calculation submodule is used to calculate the high-voltage capacitance ratio measurement error and high-voltage dielectric loss measurement of the high-voltage capacitance bridge at the preset low voltage based on the high-voltage capacitance ratio indication values and high-voltage dielectric loss of the two test high-voltage standard capacitors. error.

Example electronic device

Figure 6 is a structure of an electronic device provided by an exemplary embodiment of the present invention. As shown in FIG. 6 , electronic device 60 includes one or more processors 61 and memory 62 .

The processor 61 may be a central processing unit (CPU) or other form of processing unit with data processing capabilities and/or instruction execution capabilities, and may control other components in the electronic device to perform desired functions.

Memory 62 may include one or more computer program products, which may include various forms of computer-readable storage media, such as volatile memory and/or non-volatile memory. The volatile memory may include, for example, random access memory (RAM) and/or cache memory (cache). The non-volatile memory may include, for example, read-only memory (ROM), hard disk, flash memory, etc. One or more computer program instructions may be stored on the computer-readable storage medium, and the processor 61 may execute the program instructions to implement the methods and/or software programs of various embodiments of the present invention described above. Other desired features. In one example, the electronic device may further include an input device 63 and an output device 64, and these components are interconnected through a bus system and/or other forms of connection mechanisms (not shown).

In addition, the input device 63 may also include, for example, a keyboard, a mouse, and the like.

This output device 64 can output various information to the outside. The output device 64 may include, for example, a display, a speaker, a printer, a communication network and remote output devices connected thereto, and the like.

Of course, for simplicity, only some of the components related to the present invention in the electronic device are shown in FIG. 6 , and components such as buses, input/output interfaces, etc. are omitted. In addition to this, the electronic device may include any other suitable components depending on the specific application.

Example computer program products and computer-readable storage media

In addition to the above methods and devices, embodiments of the present invention may also be a computer program product, which includes computer program instructions that, when executed by a processor, cause the processor to execute the “exemplary method” described above in this specification The steps in methods according to various embodiments of the invention are described in Sec.

The computer program product may be written in any combination of one or more programming languages, including object-oriented programming languages, such as Java, C++, etc., to write program codes for performing operations of embodiments of the present invention. , also includes conventional procedural programming languages, such as the "C" language or similar programming languages. The program code may execute entirely on the user's computing device, partly on the user's device, as a stand-alone software package, partly on the user's computing device and partly on a remote computing device, or entirely on the remote computing device or server execute on.

In addition, embodiments of the present invention may also be a computer-readable storage medium having computer program instructions stored thereon. The computer program instructions, when executed by a processor, cause the processor to execute the above-mentioned “exemplary method” part of this specification. The steps in methods according to various embodiments of the invention are described in .

The computer-readable storage medium may be any combination of one or more readable media. The readable medium may be a readable signal medium or a readable storage medium. Readable storage media may include, for example, but are not limited to, electrical, magnetic, optical, electromagnetic, infrared, or semiconductor systems, systems or devices, or any combination thereof. More specific examples (non-exhaustive list) of readable storage media include: electrical connection with one or more conductors, portable disk, hard disk, random access memory (RAM), read only memory (ROM), erasable programmable read-only memory (EPROM or flash memory), optical fiber, portable compact disk read-only memory (CD-ROM), optical storage device, magnetic storage device, or any suitable combination of the above.

The basic principles of the present invention have been described above in conjunction with specific embodiments. However, it should be pointed out that the advantages, advantages, effects, etc. mentioned in the present invention are only examples and not limitations. These advantages, advantages, effects, etc. cannot be considered to be Each embodiment of the present invention must have. In addition, the specific details disclosed above are only for the purpose of illustration and to facilitate understanding, and are not limiting. The above details do not limit the present invention to the fact that the invention must be implemented using the above specific details.

Each embodiment in this specification is described in a progressive manner, and each embodiment focuses on its differences from other embodiments. The same or similar parts between the various embodiments can be referred to each other. For the system embodiment, since it basically corresponds to the method embodiment, the description is relatively simple. For relevant details, please refer to the partial description of the method embodiment.

The block diagrams of devices, systems, equipment, and systems involved in the present invention are only illustrative examples and are not intended to require or imply that they must be connected, arranged, or configured in the manner shown in the block diagrams. As those skilled in the art will recognize, these devices, systems, devices, systems may be connected, arranged, and configured in any manner. Words such as "includes," "includes," "having," etc. are open-ended terms that mean "including, but not limited to," and may be used interchangeably therewith. As used herein, the words "or" and "and" refer to the words "and/or" and are used interchangeably therewith unless the context clearly dictates otherwise. As used herein, the word "such as" refers to the phrase "such as, but not limited to," and may be used interchangeably therewith.

The methods and systems of the present invention may be implemented in many ways. For example, the method and system of the present invention can be implemented through software, hardware, firmware, or any combination of software, hardware, and firmware. The above order for the steps of the method is for illustration only, and the steps of the method of the present invention are not limited to the order specifically described above unless otherwise specifically stated. Furthermore, in some embodiments, the present invention can also be implemented as programs recorded in recording media, and these programs include machine-readable instructions for implementing the methods according to the present invention. Thus, the present invention also covers recording media storing a program for executing the method according to the present invention.

It should also be noted that in the system, device and method of the present invention, each component or each step can be decomposed and/or recombined. These decompositions and/or recombinations should be regarded as equivalent solutions of the present invention. The above description of the disclosed aspects is provided to enable any person skilled in the art to make or use the invention. Various modifications to these aspects will be readily apparent to those skilled in the art, and the generic principles defined herein may be applied to other aspects without departing from the scope of the invention. Thus, the present invention is not intended to be limited to the aspects shown herein but is to be accorded the widest scope consistent with the principles and novel features disclosed herein.

The foregoing description has been presented for the purposes of illustration and description. Furthermore, this description is not intended to limit embodiments of the invention to the form disclosed herein. Although various example aspects and embodiments have been discussed above, those skilled in the art will recognize certain variations, modifications, changes, additions and sub-combinations thereof.

Claims (8)

1. A method for measuring error at high voltage of a low frequency voltage transformer using a reference capacitor, comprising:

connecting a tested low-frequency voltage transformer and a low-frequency standard voltage transformer into a difference loop under a preset low voltage, and measuring a low-voltage ratio error and a low-voltage phase error of the tested low-frequency voltage transformer under the low voltage, wherein the preset low voltage is the rated primary voltage of the low-frequency standard voltage transformer;

introducing a high-voltage standard capacitor and a low-voltage standard capacitor under a preset high voltage, connecting the high-voltage standard capacitor and the low-voltage standard capacitor with the tested low-frequency voltage transformer to form an equal-power loop, and measuring a first capacitance ratio and a first dielectric loss of the tested low-frequency voltage transformer under the preset low voltage and a second capacitance ratio and a second dielectric loss of the tested low-frequency voltage transformer under the preset high voltage through a high-voltage capacitance bridge;

Measuring a high-voltage Rong Dianya coefficient and a high-voltage dielectric loss voltage coefficient of the high-voltage standard capacitor and a low-voltage capacitance voltage coefficient and a low-voltage dielectric loss voltage coefficient of the low-voltage standard capacitor by using a comparison method;

measuring a high-voltage capacitance ratio measurement error and a low-voltage dielectric loss measurement error of the high-voltage capacitance bridge under the preset low voltage by using a capacitance rotation method, and measuring a high-voltage capacitance ratio measurement error and a high-voltage dielectric loss measurement error under the preset high voltage;

calculating a high-voltage ratio error of the measured low-frequency voltage transformer under the preset high voltage according to the low-voltage ratio error, the first capacitance ratio, the second capacitance ratio, the high-voltage Rong Dianya coefficient, the low-voltage capacitance voltage coefficient, the low-voltage capacitance ratio measurement error and the high-voltage capacitance ratio measurement error;

and calculating the high-voltage phase error of the tested low-frequency voltage transformer under the preset high voltage according to the low-voltage phase error, the first dielectric loss, the second dielectric loss, the high-voltage dielectric loss voltage coefficient, the low-voltage dielectric loss measurement error and the high-voltage dielectric loss measurement error.

2. The method of claim 1, wherein connecting the measured low frequency voltage transformer with the low frequency standard voltage transformer in a differential loop, measuring the low voltage ratio error and the low voltage phase error of the measured low frequency voltage transformer at low voltage, comprises:

after a 380V alternating current power supply is connected into a variable frequency source, the variable frequency source is connected with a voltage regulating transformer and a step-up transformer in parallel to generate high voltage with adjustable frequency, a high-voltage terminal of a primary winding of a tested low-frequency voltage transformer and a primary winding of a low-frequency standard voltage transformer are respectively connected into the high voltage, the low-voltage terminal is connected with the ground in a short circuit mode, wherein the rated primary voltage of the low-frequency standard voltage transformer is U _N1 Rated secondary voltage Ua of 57.7V with transformation ratio N ₁ Rated voltage of the tested low-frequency voltage transformer is U _N2 Rated secondary voltage U _b Also 57.7V, with a transformation ratio of N ₂ ，U _N1 ＜U _N2 ；

When the same primary voltage is added to the primary terminals of the low-frequency standard voltage transformer and the tested low-frequency voltage transformer, a multi-disc induction voltage divider is connected in parallel to the secondary winding of the low-frequency standard voltage transformer, and the proportional winding of the multi-disc induction voltage divider is regulated to ensure that the output voltage of the multi-disc induction voltage divider is equal to the rated secondary voltage of the tested low-frequency voltage transformer;

the method comprises the steps of inputting a multi-disc induction voltage divider output winding serving as a U end of a parameter voltage input transformer calibrator, connecting a high-voltage terminal of the multi-disc induction voltage divider output winding with a high-voltage terminal of a measured low-frequency voltage transformer secondary winding, and connecting a low-voltage terminal of the multi-disc induction voltage divider output winding and a low-voltage terminal of the measured low-frequency voltage transformer secondary winding to two ends of a transformer calibrator differential measurement terminal delta U;

And the transformer calibrator measures a low-voltage ratio error and a low-voltage phase error under the preset low voltage.

3. The method of claim 1, wherein introducing a high voltage reference capacitor and a low voltage reference capacitor at a predetermined high voltage, connecting with the measured low frequency voltage transformer into an equal power loop, measuring a first capacitance ratio and a first dielectric loss of the measured low frequency voltage transformer at the predetermined low voltage and a second capacitance ratio and a second dielectric loss at the predetermined high voltage through a high voltage capacitance bridge, comprising:

connecting a primary winding high-voltage terminal of the low-frequency voltage transformer to be tested with a high-voltage terminal of a high-voltage standard capacitor, and connecting a secondary winding high-voltage terminal of the low-frequency voltage transformer to be tested with a high-voltage terminal of the low-voltage standard capacitor;

connecting a primary winding of a low-frequency voltage transformer to be tested with low-frequency preset high voltage, connecting a low-voltage terminal of a high-voltage standard capacitor to a tested terminal of a high-voltage capacitance bridge, connecting the low-voltage terminal of the low-voltage standard capacitor to a reference terminal of the high-voltage capacitance bridge, and connecting a low-voltage terminal of a secondary winding of the low-frequency voltage transformer to be tested and a high-voltage capacitance bridge grounding terminal to be grounded;

The voltage regulator is regulated to regulate primary voltage to the preset low voltage, and the first capacitance ratio and the first dielectric loss measured by the high-voltage capacitance bridge at the moment are recorded;

and adjusting the primary voltage to the preset high voltage to be measured, and recording the second capacitance ratio and the second dielectric loss measured by the high-voltage capacitor bridge at the moment.

4. The method of claim 1, wherein measuring the high voltage Rong Dianya coefficient and the high voltage dielectric loss voltage coefficient of the high voltage reference capacitor and the low voltage dielectric loss voltage coefficient of the low voltage reference capacitor using a comparison method comprises:

connecting the high voltage electrodes of the low voltage reference capacitor or the high voltage reference capacitor with the high voltage output terminals of the high voltage power supply respectively, and connecting the low voltage measurement terminals to the high voltage capacitance bridge respectively by using shielded cables;

respectively at 10% U _N 、20％U _N 、30％U _N 、40％U _N 、50％U _N 、60％U _N 、70％U _N 、80％U _N 、90％U _N 、100％U _N Measuring capacitance ratio and loss factor at test voltage, wherein U _N A rated voltage for the low voltage reference capacitor or the high voltage reference capacitor;

adjusting bridge balance under each specified test voltage, respectively reading capacitance and dielectric loss, and calculating a capacitance voltage coefficient and a dielectric loss voltage coefficient under each specified test voltage;

And selecting the maximum absolute value of each test voltage measurement point as the low-voltage capacitance voltage coefficient and the low-voltage dielectric loss voltage coefficient or the high-voltage power Rong Dianya coefficient and the high-voltage dielectric loss voltage coefficient.

5. The method of claim 1, wherein measuring the high voltage capacitance bridge at the preset low voltage ratio measurement error and the low voltage dielectric loss measurement error, and the high voltage capacitance ratio measurement error and the high voltage dielectric loss measurement error at the preset high voltage using a capacitance rotation method comprises:

the high-voltage electrodes of two test low-voltage standard capacitors with the same capacitance are respectively connected with a high-voltage output terminal of a high-voltage power supply, and a low-voltage measurement terminal is respectively connected to a reference terminal and a tested terminal of the high-voltage capacitance bridge by using a shielded cable;

under the preset low voltage, respectively taking one of the test low-voltage standard capacitors as a reference standard device and the other test low-voltage standard capacitor as a tested capacitor, and measuring the low-voltage capacity proportional indication value and the low-voltage dielectric loss under two loops;

calculating a low-voltage capacitance ratio measurement error and a low-voltage dielectric loss measurement error of the high-voltage capacitance bridge under the preset low voltage according to the low-voltage capacitance ratio indication values and the low-voltage dielectric loss of the two test low-voltage standard capacitors;

Connecting high-voltage electrodes of two high-voltage standard capacitors with the same capacitance with high-voltage output terminals of a high-voltage power supply respectively, and connecting low-voltage measurement terminals to a reference terminal and a tested terminal of the high-voltage capacitance bridge respectively by using shielded cables;

under the preset high voltage, respectively taking one of the test high voltage standard capacitors as a reference standard device and the other test high voltage standard capacitor as a tested capacitor, and measuring the high voltage capacity proportion indication value and the high voltage dielectric loss under two loops;

and calculating a high-voltage capacitance ratio measurement error and a high-voltage dielectric loss measurement error of the high-voltage capacitance bridge under the preset low voltage according to the high-voltage capacitance ratio indication values and the high-voltage dielectric loss of the two tested high-voltage standard capacitors.

6. An apparatus for measuring a high voltage error of a low frequency voltage transformer using a reference capacitor, comprising:

the first measurement module is used for connecting the tested low-frequency voltage transformer and the low-frequency standard voltage transformer into a difference loop under the preset low voltage, and measuring the low-voltage ratio error and the low-voltage phase error of the tested low-frequency voltage transformer under the low voltage, wherein the preset low voltage is the rated primary voltage of the low-frequency standard voltage transformer;

The second measurement module is used for introducing a high-voltage standard capacitor and a low-voltage standard capacitor under a preset high voltage, connecting the high-voltage standard capacitor and the low-frequency voltage transformer to be measured into an equal-power loop, and measuring a first capacitance ratio and a first dielectric loss of the low-frequency voltage transformer to be measured under the preset low voltage and a second capacitance ratio and a second dielectric loss of the low-frequency voltage transformer to be measured under the preset high voltage through a high-voltage capacitance bridge;

a third measurement module for measuring a high voltage Rong Dianya coefficient and a high voltage dielectric loss voltage coefficient of the high voltage standard capacitor, and a low voltage capacitance voltage coefficient and a low voltage dielectric loss voltage coefficient of the low voltage standard capacitor by using a comparison method;

a fourth measurement module, configured to measure a high-voltage capacitance bridge ratio measurement error and a low-voltage dielectric loss measurement error at the preset low voltage by using a capacitance rotation method, and a high-voltage capacitance bridge ratio measurement error and a high-voltage dielectric loss measurement error at the preset high voltage;

the first calculating module is used for calculating a high-voltage ratio error of the measured low-frequency voltage transformer under the preset high voltage according to the low-voltage ratio error, the first capacitance ratio, the second capacitance ratio, the high-voltage power Rong Dianya coefficient, the low-voltage capacitance voltage coefficient, the low-voltage capacitance ratio measurement error and the high-voltage capacitance ratio measurement error;

The second calculation module is configured to calculate a high-voltage phase error of the measured low-frequency voltage transformer under the preset high voltage according to the low-voltage phase error, the first dielectric loss, the second dielectric loss, the high-voltage dielectric loss voltage coefficient, the low-voltage dielectric loss measurement error and the high-voltage dielectric loss measurement error.

7. A computer readable storage medium, characterized in that the storage medium stores a computer program for executing the method of any of the preceding claims 1-5.

8. An electronic device, the electronic device comprising:

a processor;

a memory for storing the processor-executable instructions;

the processor is configured to read the executable instructions from the memory and execute the instructions to implement the method of any of the preceding claims 1-5.