CN116794407A - Electromagnetic compatibility testing method, system, electronic equipment and storage medium - Google Patents
Electromagnetic compatibility testing method, system, electronic equipment and storage medium Download PDFInfo
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Abstract
The application discloses an electromagnetic compatibility testing method, an electromagnetic compatibility testing system, electronic equipment and a storage medium, wherein the electromagnetic compatibility testing method comprises the following steps: acquiring the voltage change rate and the current change rate of a part to be tested, wherein the part to be tested is a part in a vehicle, the voltage change rate is obtained based on a preset voltage test circuit, and the current change rate is obtained based on a preset current test circuit; comparing the voltage change rate with a first preset threshold value to obtain a first comparison result; comparing the current change rate with a second preset threshold value to obtain a second comparison result; and responding to the first comparison result to indicate that the voltage change rate is smaller than or equal to a first preset threshold value and the second comparison result to indicate that the current change rate is smaller than or equal to a second preset threshold value, and marking that the electromagnetic compatibility of the component to be tested is qualified. The application solves the technical problems that the capacitance compatibility test is carried out on the whole vehicle, the specific parts are difficult to determine after the problems are found, and the problem is more troublesome to further check.
Description
Technical Field
The application belongs to the technical field of electromagnetic compatibility, and particularly relates to an electromagnetic compatibility testing method, an electromagnetic compatibility testing system, electronic equipment and a storage medium.
Background
Electromagnetic compatibility testing refers to the process of detecting and evaluating electromagnetic interference and anti-interference capabilities of electronic products, systems or devices. In modern society, various electronic devices and systems have been widely used in life and industry, and their interrelation is also more and more complicated, in which case the problem of electromagnetic interaction between a product and the environment is more and more serious. To ensure that the individual devices can function properly and avoid unnecessary cross-talk, special design and EMC (Electromagnetic Compatibility ) testing is required. The test comprises various contents such as radio frequency radiation, conductive interference and the like, and relevant specifications are formulated for international standards.
The electromagnetic compatibility standard test of the existing vehicle refers to national standards GB34660, GB/T18655 and the like, and electromagnetic interference problems possibly existing in the whole system can be found at one time by carrying out the electromagnetic compatibility test on the whole vehicle, so that the time cost is saved. However, it is difficult to determine which specific components are affected after a problem is found by performing a capacitive compatibility test on the whole vehicle, and further troubleshooting the problem is troublesome.
Disclosure of Invention
The embodiment of the application provides an electromagnetic compatibility testing method, an electromagnetic compatibility testing system, electronic equipment and a storage medium, which are used for at least solving the technical problems that after a problem is found, the specific components are difficult to determine and the problem is more troublesome to check.
According to a first aspect of an embodiment of the present application, there is provided an electromagnetic compatibility testing method, including: acquiring the voltage change rate and the current change rate of a part to be tested, wherein the part to be tested is a part in a vehicle, the voltage change rate is obtained based on a preset voltage test circuit, and the current change rate is obtained based on a preset current test circuit; comparing the voltage change rate with a first preset threshold value to obtain a first comparison result; comparing the current change rate with a second preset threshold value to obtain a second comparison result; and responding to the first comparison result to indicate that the voltage change rate is smaller than or equal to a first preset threshold value and the second comparison result to indicate that the current change rate is smaller than or equal to a second preset threshold value, and marking that the electromagnetic compatibility of the component to be tested is qualified.
Optionally, the electromagnetic compatibility testing method further includes: responding to the first comparison result to indicate that the voltage change rate is larger than a first preset threshold value and the second comparison result to indicate that the current change rate is larger than a second preset threshold value, comparing the voltage change rate with a third preset threshold value to obtain a third comparison result, and comparing the current change rate with a fourth preset threshold value to obtain a fourth comparison result; and responding to the third comparison result to indicate that the voltage change rate is smaller than or equal to a third preset threshold value and the fourth comparison result to indicate that the current change rate is smaller than or equal to a fourth preset threshold value, and marking the part to be tested as a risk part, wherein the risk part is used for representing that the part to be tested needs electromagnetic protection.
Optionally, the electromagnetic compatibility testing method further includes: and in response to the third comparison result indicating that the voltage change rate is greater than a third preset threshold and the fourth comparison result indicating that the current change rate is greater than a fourth preset threshold, marking that the electromagnetic compatibility of the component to be tested is unqualified.
Optionally, the preset voltage test circuit includes a part to be tested, a load and an oscilloscope, the load and the part to be tested form a test loop, and two voltage probes of the oscilloscope are respectively connected to two ends of the part to be tested.
Optionally, the bandwidth of the two probes of the oscilloscope is greater than 500 megahertz.
Optionally, the preset current test circuit includes a part to be tested, a load and an oscilloscope, the load and the oscilloscope form a test loop, and a current probe of the oscilloscope is connected to the test loop.
Optionally, the preset current test circuit comprises a part to be tested, a load, a voltage dividing resistor and an oscilloscope, wherein the load, the voltage dividing resistor and the oscilloscope form a test loop, and two current probes of the oscilloscope are respectively connected to two ends of the voltage dividing resistor.
According to a second aspect of the embodiment of the present application, there is also provided an electromagnetic compatibility test system including:
the device comprises an acquisition module, a control module and a control module, wherein the acquisition module is used for acquiring the voltage change rate and the current change rate of a part to be tested, the part to be tested is a part in a vehicle, the voltage change rate is obtained based on a preset voltage test circuit, and the current change rate is obtained based on a preset current test circuit; the first comparison module is used for comparing the voltage change rate with a first preset threshold value to obtain a first comparison result; the second comparison module is used for comparing the current change rate with a second preset threshold value to obtain a second comparison result; and the marking module is used for marking that the electromagnetic compatibility of the component to be tested is qualified in response to the fact that the first comparison result shows that the voltage change rate is smaller than or equal to a first preset threshold value and the second comparison result shows that the current change rate is smaller than or equal to a second preset threshold value.
Optionally, the electromagnetic compatibility testing system further includes a third comparing module, where the third comparing module is configured to: responding to the first comparison result to indicate that the voltage change rate is larger than a first preset threshold value and the second comparison result to indicate that the current change rate is larger than a second preset threshold value, comparing the voltage change rate with a third preset threshold value to obtain a third comparison result, and comparing the current change rate with a fourth preset threshold value to obtain a fourth comparison result; the marking module is also used for: and responding to the third comparison result to indicate that the voltage change rate is smaller than or equal to a third preset threshold value and the fourth comparison result to indicate that the current change rate is smaller than or equal to a fourth preset threshold value, and marking the part to be tested as a risk part, wherein the risk part is used for representing that the part to be tested needs electromagnetic protection.
Optionally, the marking module is further configured to: and in response to the third comparison result indicating that the voltage change rate is greater than a third preset threshold and the fourth comparison result indicating that the current change rate is greater than a fourth preset threshold, marking that the electromagnetic compatibility of the component to be tested is unqualified.
Optionally, the preset voltage test circuit in the electromagnetic compatibility test system comprises a part to be tested, a load and an oscilloscope, wherein the load and the part to be tested form a test loop, and two voltage probes of the oscilloscope are respectively connected to two ends of the part to be tested.
Optionally, the bandwidth of the two probes of the oscilloscope in the electromagnetic compatibility test system is greater than 500 megahertz.
Optionally, the preset current test circuit in the electromagnetic compatibility test system comprises a part to be tested, a load and an oscilloscope, wherein the load and the oscilloscope form a test loop, and a current probe of the oscilloscope is connected to the test loop.
Optionally, the preset current test circuit in the electromagnetic compatibility test system comprises a component to be tested, a load, a voltage dividing resistor and an oscilloscope, wherein the load, the voltage dividing resistor and the oscilloscope form a test loop, and two current probes of the oscilloscope are respectively connected to two ends of the voltage dividing resistor.
According to a third aspect of embodiments of the present application, there is also provided an electronic device comprising a memory in which a computer program is stored, and a processor arranged to run the computer program to perform the electromagnetic compatibility test method described in any of the embodiments of the first aspect above.
According to a fourth aspect of embodiments of the present application, there is also provided a non-volatile storage medium in which a computer program is stored, wherein the computer program is arranged to perform the electromagnetic compatibility test method described in any of the embodiments of the first aspect above when run on a computer or processor.
In the embodiment of the application, the voltage change rate and the current change rate of the part to be tested are obtained, wherein the part to be tested is a part in a vehicle, the voltage change rate is obtained based on a preset voltage test circuit, and the current change rate is obtained based on a preset current test circuit; comparing the voltage change rate with a first preset threshold value to obtain a first comparison result; comparing the current change rate with a second preset threshold value to obtain a second comparison result; and responding to the first comparison result to indicate that the voltage change rate is smaller than or equal to a first preset threshold value and the second comparison result to indicate that the current change rate is smaller than or equal to a second preset threshold value, and marking the part to be tested as qualified. By judging the current change rate and the voltage change rate of the parts to be tested, whether the electromagnetic compatibility of the parts to be tested is qualified or not is further judged, the electromagnetic compatibility of each part to be tested can be accurately determined, and further the technical problems that the capacitor compatibility test is carried out on the whole vehicle, the specific parts are difficult to determine to be affected after the problems are found, and the problems are more troublesome to check are solved.
Drawings
The accompanying drawings, which are included to provide a further understanding of the application and are incorporated in and constitute a part of this specification, illustrate embodiments of the application and together with the description serve to explain the application and do not constitute a limitation on the application. In the drawings:
FIG. 1 is a flow chart of an electromagnetic compatibility test method according to one embodiment of the present application;
FIG. 2 is a schematic diagram of a predetermined voltage test circuit according to one embodiment of the application;
FIG. 3 is a schematic diagram of a first predetermined current test circuit according to one embodiment of the application;
FIG. 4 is a schematic diagram of a second predetermined current test circuit according to one embodiment of the application;
fig. 5 is a block diagram of an electromagnetic compatibility test system according to one embodiment of the present application.
Detailed Description
In order that those skilled in the art will better understand the present application, a technical solution in the embodiments of the present application will be clearly and completely described below with reference to the accompanying drawings in which it is apparent that the described embodiments are only some embodiments of the present application, not all embodiments. All other embodiments, which can be made by those skilled in the art based on the embodiments of the present application without making any inventive effort, shall fall within the scope of the present application.
It should be noted that the terms "first," "second," and the like in the description and the claims of the present application and the above figures are used for distinguishing between similar objects and not necessarily for describing a particular sequential or chronological order. It is to be understood that the terms so used are interchangeable under appropriate circumstances such that the embodiments of the application described herein are capable of operation in sequences other than those illustrated or otherwise described herein. Furthermore, the terms "comprises," "comprising," and "having," and any variations thereof, are intended to cover a non-exclusive inclusion, such that a process, method, system, article, or apparatus that comprises a list of steps or elements is not necessarily limited to those steps or elements expressly listed but may include other steps or elements not expressly listed or inherent to such process, method, article, or apparatus.
In accordance with an embodiment of the present application, there is provided an embodiment of an electromagnetic compatibility testing method, it being noted that the steps shown in the flowchart of the figures may be performed in a computer system containing at least one set of computer executable instructions, and, although a logical order is shown in the flowchart, in some cases, the steps shown or described may be performed in an order other than that shown or described herein.
The method embodiments may also be performed in an electronic device, similar control device, or cloud, including a memory and a processor. Taking an electronic device as an example, the electronic device may include one or more processors and memory for storing data. Optionally, the electronic apparatus may further include a communication device for a communication function and a display device. It will be appreciated by those of ordinary skill in the art that the foregoing structural descriptions are merely illustrative and are not intended to limit the structure of the electronic device. For example, the electronic device may also include more or fewer components than the above structural description, or have a different configuration than the above structural description.
The processor may include one or more processing units. For example: the processor may include a processing device of a central processing unit (central processing unit, CPU), a graphics processor (graphics processing unit, GPU), a digital signal processing (digital signal processing, DSP) chip, a microprocessor (microcontroller unit, MCU), a programmable logic device (field-programmable gate array, FPGA), a neural network processor (neural-network processing unit, NPU), a tensor processor (tensor processing unit, TPU), an artificial intelligence (artificial intelligent, AI) type processor, or the like. Wherein the different processing units may be separate components or may be integrated in one or more processors. In some examples, the electronic device may also include one or more processors.
The memory may be used to store a computer program, for example, a computer program corresponding to the electromagnetic compatibility testing method in the embodiment of the present application, and the processor implements the electromagnetic compatibility testing method by running the computer program stored in the memory. The memory may include high speed random access memory, and may also include non-volatile memory, such as one or more magnetic storage devices, flash memory, or other non-volatile solid state memory. In some examples, the memory may further include memory remotely located with respect to the processor, which may be connected to the electronic device through a network. Examples of such networks include, but are not limited to, the internet, intranets, local area networks, mobile communication networks, and combinations thereof.
The communication device is used to receive or transmit data via a network. Specific examples of the network described above may include a wireless network provided by a communication provider of the mobile terminal. In one example, the communication device includes a network adapter (network interface controller, NIC) that can connect to other network devices through the base station to communicate with the internet. In one example, the communication device may be a Radio Frequency (RF) module for communicating with the internet wirelessly. In some embodiments of the present solution, the communication device is configured to connect to a mobile device such as a mobile phone, a tablet, or the like, and may send an instruction to the electronic apparatus through the mobile device.
The display devices may be touch screen type liquid crystal displays (liquid crystal display, LCD) and touch displays (also referred to as "touch screens" or "touch display screens"). The liquid crystal display may enable a user to interact with a user interface of the electronic device. In some embodiments, the electronic device has a graphical user interface (graphical user interface, GUI) with which a user can human interact by touching finger contacts and/or gestures on the touch-sensitive surface, executable instructions for performing the human interaction functions described above being configured/stored in one or more processor-executable computer program products or readable storage media.
Fig. 1 is a flowchart of an electromagnetic compatibility testing method according to one embodiment of the present application, as shown in fig. 1, the method includes the steps of:
step S101, a voltage change rate and a current change rate of the component to be tested are obtained.
The to-be-tested component is a component in the vehicle, the voltage change rate is obtained based on a preset voltage test circuit, and the current change rate is obtained based on a preset current test circuit.
It can be understood that the preset voltage test circuit can measure the voltage change rate of the component to be tested, and the preset current test circuit can measure the current change rate of the component to be tested.
Specifically, the voltage change rate is the change rate of the voltage across the component to be measured, and the current change rate is the change rate of the current passing through the component to be measured. The voltage change rate is represented by dU/dt, dU represents the voltage change amount, and dt represents the time-time change amount. The current change rate is expressed by dA/dt, dA represents the current change amount, and dt represents the time change amount.
It is understood that the voltage change rate and the current change rate are based on a change rate for a preset period of time.
The voltage change rate and the current change rate were obtained in an electromagnetic environment.
Alternatively, in some embodiments of the present application, the voltage change rate and the current change rate may be voltage change rates and current change rates corresponding to a plurality of preset time periods, and then the averaging is performed.
Step S102, comparing the voltage change rate with a first preset threshold value to obtain a first comparison result.
Specifically, the first preset threshold value is a qualified threshold value corresponding to the voltage change rate.
Alternatively, in some embodiments of the present application, the first preset threshold is 0.2 volts per microsecond.
And step S103, comparing the current change rate with a second preset threshold value to obtain a second comparison result.
Specifically, the first preset threshold value is a qualified threshold value corresponding to the current change rate.
Alternatively, in some embodiments of the application, the second preset threshold is 20 milliamps per microsecond.
And step S104, marking the electromagnetic compatibility of the component to be tested as qualified in response to the first comparison result indicating that the voltage change rate is smaller than or equal to a first preset threshold value and the second comparison result indicating that the current change rate is smaller than or equal to a second preset threshold value.
Specifically, when the voltage change rate is less than or equal to the first preset threshold value and the current change rate is less than or equal to the second preset threshold value, the compatibility of the component to be tested is qualified.
In the embodiment of the application, the voltage change rate and the current change rate of the part to be tested are obtained, wherein the part to be tested is a part in a vehicle, the voltage change rate is obtained based on a preset voltage test circuit, and the current change rate is obtained based on a preset current test circuit; comparing the voltage change rate with a first preset threshold value to obtain a first comparison result; comparing the current change rate with a second preset threshold value to obtain a second comparison result; and responding to the first comparison result to indicate that the voltage change rate is smaller than or equal to a first preset threshold value and the second comparison result to indicate that the current change rate is smaller than or equal to a second preset threshold value, and marking the part to be tested as qualified. By judging the current change rate and the voltage change rate of the parts to be tested, whether the electromagnetic compatibility of the parts to be tested is qualified or not is further judged, the electromagnetic compatibility of each part to be tested can be accurately determined, and further the technical problems that the capacitor compatibility test is carried out on the whole vehicle, the specific parts are difficult to determine to be affected after the problems are found, and the problems are more troublesome to check are solved.
Optionally, the electromagnetic compatibility testing method further includes the following steps:
step S105, in response to the first comparison result indicating that the voltage change rate is greater than the first preset threshold and the second comparison result indicating that the current change rate is greater than the second preset threshold, comparing the voltage change rate with the third preset threshold to obtain a third comparison result, and comparing the current change rate with the fourth preset threshold to obtain a fourth comparison result.
Specifically, when the voltage change rate is greater than a first preset threshold and when the current change rate is greater than a second preset threshold, the voltage change rate is compared with a third preset threshold, and the current change rate is compared with a fourth preset threshold.
It should be noted that the third preset threshold is greater than the first preset threshold, and the fourth preset threshold is greater than the second preset threshold.
Alternatively, in some embodiments of the present application, the third preset threshold is 10 volts per microsecond and the fourth preset threshold is 100 milliamps per microsecond.
And step S106, marking the part to be tested as a risk part in response to the fact that the third comparison result shows that the voltage change rate is smaller than or equal to a third preset threshold value and the fourth comparison result shows that the current change rate is smaller than or equal to a fourth preset threshold value, wherein the risk part is used for representing that the part to be tested needs electromagnetic protection.
Specifically, when the voltage change rate is greater than the first preset threshold and less than or equal to the third preset threshold, and the current change rate is greater than the second preset threshold and less than or equal to the fourth preset threshold, the part to be detected is marked as a risk part.
It can be understood that when the component to be tested is a risk component, electromagnetic protection needs to be performed on the component to be tested to enable electromagnetic compatibility of the component to be tested to meet requirements.
Optionally, the electromagnetic compatibility testing method further includes: and in response to the third comparison result indicating that the voltage change rate is greater than a third preset threshold and the fourth comparison result indicating that the current change rate is greater than a fourth preset threshold, marking that the electromagnetic compatibility of the component to be tested is unqualified.
Specifically, when the voltage change rate is greater than the third preset threshold and the current change rate is greater than the fourth preset threshold, it indicates that the electromagnetic compatibility of the component to be tested is unqualified.
Optionally, the preset voltage test circuit includes a part to be tested, a load and an oscilloscope, the load and the part to be tested form a test loop, and two voltage probes of the oscilloscope are respectively connected to two ends of the part to be tested.
Specifically, referring to fig. 2, in the preset voltage test circuit, a DUT and a load form a test loop, and two voltage probes of an oscilloscope are respectively connected to two ends of the DUT for measuring a voltage change rate of the DUT.
Optionally, the bandwidth of the two probes of the oscilloscope in the preset voltage test circuit is greater than 500 megahertz (MHz).
Optionally, in some embodiments of the present application, a voltage probe of an oscilloscope in the voltage test circuit is preset to have a attenuation ratio of 10 times, that is, a voltage signal is attenuated by 10 times into the oscilloscope.
It will be appreciated that a bandwidth of 500 mhz enables the measurement of high frequency voltage signals.
Optionally, the preset current test circuit includes a part to be tested, a load and an oscilloscope, the load and the oscilloscope form a test loop, and a current probe of the oscilloscope is connected to the test loop.
Specifically, referring to fig. 3, in the preset current test circuit, a DUT and a load are formed into a test loop, and a current probe of an oscilloscope is directly connected to the test loop.
The closer the connection point of the current probe of the oscilloscope and the test loop is to the DUT, the more accurate the obtained current change rate is.
Optionally, the preset current test circuit comprises a part to be tested, a load, a voltage dividing resistor and an oscilloscope, wherein the load, the voltage dividing resistor and the oscilloscope form a test loop, and two current probes of the oscilloscope are respectively connected to two ends of the voltage dividing resistor.
Specifically, referring to fig. 4, in the preset current test circuit, a DUT, a load and a voltage dividing resistor are sequentially connected to form a test loop, and two current probes of an oscilloscope are respectively connected to two ends of the voltage dividing resistor.
Optionally, in some embodiments of the present application, the current probe of the oscilloscope in the current test circuit is preset to have a damping rate of 1 or 10 times, i.e. the current signal is not damped into the oscilloscope or the current signal is damped by 10 times into the oscilloscope.
It should be noted that, for the embodiments corresponding to fig. 3 and fig. 4, when the current passing through the DUT is less than or equal to 2A (amperes), the preset current test circuit provided by the corresponding embodiment of fig. 3 is adopted; when the current through the DUT is greater than 2A (amperes), the preset current test circuit provided by the corresponding embodiment of fig. 4 is employed.
It should be noted that, the above electromagnetic compatibility testing method may be performed in an unshielded room, and electromagnetic shielding of the oscilloscope is required.
It should be noted that, the preset voltage test circuit and the preset current test circuit described in the above embodiments are grounded.
It can be appreciated that the electromagnetic compatibility test is directly performed on the whole vehicle, and large-scale equipment and high technical requirements are required, so that the cost is relatively high. The application performs independent electromagnetic compatibility test on the vehicle component, and is convenient for positioning which component the electromagnetic compatibility problem is specific to, and simultaneously, the technical cost and the equipment cost are reduced.
From the description of the above embodiments, it will be clear to a person skilled in the art that the method according to the above embodiments may be implemented by means of software plus a necessary general hardware platform, but of course also by means of hardware, but in many cases the former is a preferred embodiment. Based on such understanding, the technical solution of the present application may be embodied essentially or in a part contributing to the prior art in the form of a software product stored in a storage medium (e.g. ROM/RAM, magnetic disk, optical disk) comprising instructions for causing a terminal device (which may be a mobile phone, a computer, a server, or a network device, etc.) to perform the method according to the embodiments of the present application.
In this embodiment, an electromagnetic compatibility testing system is further provided, and the system is used to implement the foregoing embodiments and preferred implementations, and will not be described in detail. As used below, the term "module" is a combination of software and/or hardware that can implement a predetermined function. While the means described in the following embodiments are preferably implemented in software, implementation in hardware, or a combination of software and hardware, is also possible and contemplated.
Fig. 5 is a block diagram of an electromagnetic compatibility test system 200 according to one embodiment of the present application, as shown in fig. 5, exemplified by the electromagnetic compatibility test system 200, including: the obtaining module 201 is configured to obtain a voltage change rate and a current change rate of a component to be tested, where the component to be tested is a component in a vehicle, the voltage change rate is obtained based on a preset voltage test circuit, and the current change rate is obtained based on a preset current test circuit; the first comparison module 202 is configured to compare the voltage change rate with a first preset threshold to obtain a first comparison result; the second comparison module 203 is configured to compare the current change rate with a second preset threshold to obtain a second comparison result; and the marking module 204 is configured to mark that the electromagnetic compatibility of the component to be tested is qualified in response to the first comparison result indicating that the voltage change rate is less than or equal to a first preset threshold value and the second comparison result indicating that the current change rate is less than or equal to a second preset threshold value.
Optionally, the electromagnetic compatibility testing system further includes a third comparing module, which is respectively connected to the second comparing module 203 and the marking module 204, and is not shown in the figure, and is configured to: responding to the first comparison result to indicate that the voltage change rate is larger than a first preset threshold value and the second comparison result to indicate that the current change rate is larger than a second preset threshold value, comparing the voltage change rate with a third preset threshold value to obtain a third comparison result, and comparing the current change rate with a fourth preset threshold value to obtain a fourth comparison result; the marking module 204 is further configured to: and responding to the third comparison result to indicate that the voltage change rate is smaller than or equal to a third preset threshold value and the fourth comparison result to indicate that the current change rate is smaller than or equal to a fourth preset threshold value, and marking the part to be tested as a risk part, wherein the risk part is used for representing that the part to be tested needs electromagnetic protection.
Optionally, the marking module 204 is further configured to: and in response to the third comparison result indicating that the voltage change rate is greater than a third preset threshold and the fourth comparison result indicating that the current change rate is greater than a fourth preset threshold, marking that the electromagnetic compatibility of the component to be tested is unqualified.
Optionally, the preset voltage test circuit in the electromagnetic compatibility test system 200 includes a component to be tested, a load and an oscilloscope, where the load and the component to be tested form a test loop, and two voltage probes of the oscilloscope are respectively connected to two ends of the component to be tested.
Optionally, the bandwidth of the two probes of the oscilloscope in the electromagnetic compatibility test system 200 is greater than 500 megahertz.
Optionally, the preset current test circuit in the electromagnetic compatibility test system 200 includes a component to be tested, a load and an oscilloscope, where the load and the oscilloscope form a test loop, and a current probe of the oscilloscope is connected to the test loop.
Optionally, the preset current test circuit in the electromagnetic compatibility test system 200 includes a part to be tested, a load, a voltage dividing resistor and an oscilloscope, where the load, the voltage dividing resistor and the oscilloscope form a test loop, and two current probes of the oscilloscope are respectively connected to two ends of the voltage dividing resistor.
An embodiment of the application also provides an electronic device comprising a memory in which a computer program is stored and a processor arranged to run the computer program to perform the electromagnetic compatibility test method described in any of the embodiments above.
Alternatively, in the present embodiment, the processor in the electronic device may be configured to execute a computer program to perform the steps of:
step S101, a voltage change rate and a current change rate of the component to be tested are obtained.
Step S102, comparing the voltage change rate with a first preset threshold value to obtain a first comparison result.
And step S103, comparing the current change rate with a second preset threshold value to obtain a second comparison result.
And step S104, marking the electromagnetic compatibility of the component to be tested as qualified in response to the first comparison result indicating that the voltage change rate is smaller than or equal to a first preset threshold value and the second comparison result indicating that the current change rate is smaller than or equal to a second preset threshold value.
Alternatively, specific examples in this embodiment may refer to examples described in the foregoing embodiments and optional implementations, and this embodiment is not described herein.
Embodiments of the present application also provide a non-volatile storage medium in which a computer program is stored, wherein the computer program is arranged to perform the electromagnetic compatibility test method described in any of the above embodiments when run on a computer or processor.
Alternatively, in the present embodiment, the above-described computer program may be configured to store a computer program for performing the steps of:
step S101, a voltage change rate and a current change rate of the component to be tested are obtained.
Step S102, comparing the voltage change rate with a first preset threshold value to obtain a first comparison result.
And step S103, comparing the current change rate with a second preset threshold value to obtain a second comparison result.
And step S104, marking the electromagnetic compatibility of the component to be tested as qualified in response to the first comparison result indicating that the voltage change rate is smaller than or equal to a first preset threshold value and the second comparison result indicating that the current change rate is smaller than or equal to a second preset threshold value.
Alternatively, specific examples in this embodiment may refer to examples described in the foregoing embodiments and optional implementations, and this embodiment is not described herein.
In the foregoing embodiments of the present application, the descriptions of the embodiments are emphasized, and for a portion of this disclosure that is not described in detail in this embodiment, reference is made to the related descriptions of other embodiments.
In some embodiments provided by the present application, it should be understood that the disclosed technology may be implemented in other manners. The above-described embodiments of the apparatus are merely exemplary, and the modules may be divided into a logic function, and there may be other division manners in actual implementation, for example, multiple modules or components may be combined or integrated into another system, or some features may be omitted, or not performed. Alternatively, the coupling or direct coupling or communication connection shown or discussed with respect to each other may be through some interface, module or indirect coupling or communication connection of modules, electrical or otherwise.
The modules described as separate components may or may not be physically separate, and components shown as modules may or may not be physical modules, i.e., may be located in one place, or may be distributed over a plurality of modules. Some or all of the modules may be selected according to actual needs to achieve the purpose of the solution of this embodiment.
In addition, each functional module in each embodiment of the present application may be integrated into one processing module, or each module may exist alone physically, or two or more modules may be integrated into one module. The integrated modules may be implemented in hardware or in software functional modules.
The integrated modules, if implemented in the form of software functional modules and sold or used as a stand-alone product, may be stored in a computer readable storage medium. Based on such understanding, the technical solution of the present application may be embodied essentially or in part or all of the technical solution or in part in the form of a software product stored in a storage medium, including instructions for causing a computer device (which may be a personal computer, a server, or a network device, etc.) to perform all or part of the steps of the method according to the embodiments of the present application. And the aforementioned storage medium includes: a U-disk, a Read-Only Memory (ROM), a random access Memory (RAM, random Access Memory), a removable hard disk, a magnetic disk, or an optical disk, or other various media capable of storing program codes.
The foregoing is merely a preferred embodiment of the present application and it should be noted that modifications and adaptations to those skilled in the art may be made without departing from the principles of the present application, which are intended to be comprehended within the scope of the present application.
Claims (10)
1. An electromagnetic compatibility testing method, comprising:
acquiring a voltage change rate and a current change rate of a part to be tested, wherein the part to be tested is a part in a vehicle, the voltage change rate is obtained based on a preset voltage test circuit, and the current change rate is obtained based on a preset current test circuit;
comparing the voltage change rate with a first preset threshold value to obtain a first comparison result;
comparing the current change rate with a second preset threshold value to obtain a second comparison result;
and responding to the first comparison result to indicate that the voltage change rate is smaller than or equal to the first preset threshold value and the second comparison result to indicate that the current change rate is smaller than or equal to the second preset threshold value, and marking that the electromagnetic compatibility of the component to be tested is qualified.
2. The electromagnetic compatibility testing method of claim 1, further comprising:
responding to the first comparison result to indicate that the voltage change rate is larger than the first preset threshold value and the second comparison result to indicate that the current change rate is larger than the second preset threshold value, comparing the voltage change rate with a third preset threshold value to obtain a third comparison result, and comparing the current change rate with a fourth preset threshold value to obtain a fourth comparison result;
and responding to the third comparison result to indicate that the voltage change rate is smaller than or equal to the third preset threshold value and the fourth comparison result to indicate that the current change rate is smaller than or equal to the fourth preset threshold value, and marking the part to be tested as a risk part, wherein the risk part is used for representing that the part to be tested needs electromagnetic protection.
3. The electromagnetic compatibility testing method of claim 2, further comprising:
and in response to the third comparison result indicating that the voltage change rate is greater than the third preset threshold value and the fourth comparison result indicating that the current change rate is greater than the fourth preset threshold value, marking that the electromagnetic compatibility of the component to be tested is unqualified.
4. The electromagnetic compatibility testing method of claim 1, wherein the preset voltage testing circuit comprises the component to be tested, a load and an oscilloscope, wherein the load and the component to be tested form a testing loop, and two voltage probes of the oscilloscope are respectively connected to two ends of the component to be tested.
5. The method of claim 4, wherein the bandwidth of the two probes of the oscilloscope is greater than 500 megahertz.
6. The method of claim 1, wherein the predetermined current test circuit comprises the part under test, a load and an oscilloscope, the load and the oscilloscope forming a test loop, a current probe of the oscilloscope being connected to the test loop.
7. The electromagnetic compatibility testing method according to claim 1, wherein the preset current testing circuit comprises the component to be tested, a load, a voltage dividing resistor and an oscilloscope, wherein the load, the voltage dividing resistor and the oscilloscope form a testing loop, and two current probes of the oscilloscope are respectively connected to two ends of the voltage dividing resistor.
8. An electromagnetic compatibility test system, comprising:
the device comprises an acquisition module, a control module and a control module, wherein the acquisition module is used for acquiring the voltage change rate and the current change rate of a part to be tested, the part to be tested is a part in a vehicle, the voltage change rate is obtained based on a preset voltage test circuit, and the current change rate is obtained based on a preset current test circuit;
the first comparison module is used for comparing the voltage change rate with a first preset threshold value to obtain a first comparison result;
the second comparison module is used for comparing the current change rate with a second preset threshold value to obtain a second comparison result;
and the marking module is used for marking the part to be detected as qualified in response to the first comparison result indicating that the voltage change rate is smaller than or equal to the first preset threshold value and the second comparison result indicating that the current change rate is smaller than or equal to the second preset threshold value.
9. An electronic device comprising a memory and a processor, characterized in that the memory has stored therein a computer program, the processor being arranged to run the computer program to perform the electromagnetic compatibility test method of any of the preceding claims 1 to 7.
10. A non-volatile storage medium, characterized in that a computer program is stored in the non-volatile storage medium, wherein the computer program is arranged to perform the electromagnetic compatibility test method according to any one of the preceding claims 1 to 7 when run on a computer or processor.
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| Publication number | Priority date | Publication date | Assignee | Title |
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| CN117452276A (en) * | 2023-12-15 | 2024-01-26 | 深圳市力生美半导体股份有限公司 | Switch power supply performance test method and device and switch power supply |
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| Publication number | Priority date | Publication date | Assignee | Title |
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| CN117452276A (en) * | 2023-12-15 | 2024-01-26 | 深圳市力生美半导体股份有限公司 | Switch power supply performance test method and device and switch power supply |
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