CN116699452A - System and method for testing power efficiency of server main board - Google Patents
System and method for testing power efficiency of server main board Download PDFInfo
- Publication number
- CN116699452A CN116699452A CN202310708257.1A CN202310708257A CN116699452A CN 116699452 A CN116699452 A CN 116699452A CN 202310708257 A CN202310708257 A CN 202310708257A CN 116699452 A CN116699452 A CN 116699452A
- Authority
- CN
- China
- Prior art keywords
- voltage value
- efficiency
- power
- output end
- precision resistor
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 238000012360 testing method Methods 0.000 title claims abstract description 59
- 238000000034 method Methods 0.000 title claims abstract description 21
- 238000006243 chemical reaction Methods 0.000 claims abstract description 30
- 238000001514 detection method Methods 0.000 claims description 32
- 230000003321 amplification Effects 0.000 claims description 26
- 238000003199 nucleic acid amplification method Methods 0.000 claims description 26
- 230000002159 abnormal effect Effects 0.000 claims description 7
- 238000011156 evaluation Methods 0.000 claims description 4
- 238000005259 measurement Methods 0.000 abstract description 4
- 238000010586 diagram Methods 0.000 description 6
- 238000005070 sampling Methods 0.000 description 4
- 239000000956 alloy Substances 0.000 description 1
- 229910045601 alloy Inorganic materials 0.000 description 1
- 230000009286 beneficial effect Effects 0.000 description 1
- 239000003990 capacitor Substances 0.000 description 1
- 238000004891 communication Methods 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 238000012544 monitoring process Methods 0.000 description 1
- 230000002093 peripheral effect Effects 0.000 description 1
- 238000010998 test method Methods 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/40—Testing power supplies
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
- G01R19/0084—Arrangements for measuring currents or voltages or for indicating presence or sign thereof measuring voltage only
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02D—CLIMATE CHANGE MITIGATION TECHNOLOGIES IN INFORMATION AND COMMUNICATION TECHNOLOGIES [ICT], I.E. INFORMATION AND COMMUNICATION TECHNOLOGIES AIMING AT THE REDUCTION OF THEIR OWN ENERGY USE
- Y02D10/00—Energy efficient computing, e.g. low power processors, power management or thermal management
Abstract
The application belongs to the technical field of power supply testing, and discloses a system and a method for testing power supply efficiency of a server main board. The system comprises: the device comprises an amplifying module, a data acquisition module and an efficiency determination module; the amplifying module is used for amplifying the voltage at the input end side and the voltage at the output end side of the conversion circuit of the power path to be tested; the data acquisition module is used for acquiring a first amplified voltage value at the input end side, a second amplified voltage value at the output end side, a third voltage value at the input end side and a fourth voltage value at the output end side of the conversion circuit of the power path to be detected; the efficiency determining module is used for determining the power efficiency of the power path to be tested through the first amplified voltage value, the second amplified voltage value, the third voltage value and the fourth voltage value. The system can improve the acquisition precision, and further improve the measurement precision of the power efficiency.
Description
Technical Field
The present application relates to the field of power testing technologies, and in particular, to a system and a method for testing power efficiency of a server motherboard.
Background
The power consumption is an important parameter of the power supply part, and a power IC (power integrated circuit) with high cost and high end is often communicated with the system through a communication interface, so that the power consumption of the load circuit is read in real time; the power efficiency calculation often needs to obtain the power consumption of the front end and the back end of the power IC, so as to calculate the actual power efficiency. Because the current of a power supply circuit is built on a circuit board or a plate power supply using an on-board power supply module is not well measured, a precision resistor is required to be connected in series between an input end and an output end in the conventional power efficiency measurement and calculation process, and in order to meet the requirement that the power consumption of the resistor does not exceed rated power consumption, a precision resistor with larger volume is usually selected. However, under the condition that the layout of the existing PCB (printed circuit board) is more and more dense, connecting a very large precision resistor in series with the input and output ends can affect the placement of the Converter (conversion circuit) and the input and output capacitor, which has a larger influence on the original layout. Meanwhile, when the current of the power supply path is smaller, the existing measuring method has certain errors in measured data, so that the measurement of the power supply precision is not accurate enough.
Disclosure of Invention
Therefore, the embodiment of the application provides a system and a method for testing the power efficiency of a server main board, which can conveniently test the power efficiency and effectively improve the testing precision of the power efficiency.
In a first aspect, the present application provides a system for testing power efficiency of a server motherboard.
The application is realized by the following technical scheme: a test system for power efficiency of a server motherboard, the test system comprising: the device comprises an amplifying module, a data acquisition module and an efficiency determination module;
the amplifying module is used for amplifying the voltage at the input end side and the voltage at the output end side of the conversion circuit of the power path to be tested on the server main board; the data acquisition module is connected with the amplifying module and is used for acquiring a first amplified voltage value at the input end side, a second amplified voltage value at the output end side, a third voltage value at the input end side and a fourth voltage value at the output end side of the conversion circuit of the power path to be detected; and the efficiency determining module is used for determining the power efficiency of the power path to be tested through the first amplified voltage value, the second amplified voltage value, the third voltage value and the fourth voltage value.
In a preferred embodiment of the present application, the amplifying module may further include a first precision resistor, a second precision resistor, a first amplifier, and a second amplifier; the input end of the first precise resistor is connected to the power source of the power path to be tested in the server main board, the output end of the first precise resistor is connected to the input end of the conversion circuit of the power path to be tested, the input end of the second precise resistor is connected to the output end of the conversion circuit, the output end of the second precise resistor is connected to the load end, the first amplifier is connected to the two ends of the first precise resistor in parallel, and the second amplifier is connected to the two ends of the second precise resistor in parallel.
In a preferred example of the present application, it may be further configured that the efficiency determining module further includes a current calculating unit; the current calculation unit is used for respectively calculating a first detection current value of the first precision resistor and a second detection current value of the second precision resistor according to the first amplification voltage value and the second amplification voltage value.
In a preferred example of the present application, it may be further configured that the specific formula of the current calculation unit calculating the first detection current value of the first precision resistor and the second detection current value of the second precision resistor through the first amplified voltage value and the second amplified voltage value respectively is:
wherein V is e V is the first amplified voltage value of the output end of the first amplifier ref For reference voltage, R sense1 Is the resistance value of the first precision resistor, gain 1 For the first amplificationAmplifier gain, V f A second amplified voltage value for the output of the second amplifier,
R sense2 is the resistance value of the second precision resistor, gain 2 Is the amplification gain of the second amplifier.
In a preferred embodiment of the present application, it may be further configured that the efficiency determining module further includes an efficiency calculating unit; the efficiency calculating unit is used for calculating the power efficiency of the power path to be measured through the third voltage value, the fourth voltage value, the first detection current value and the second detection current value.
In a preferred example of the present application, the specific formula for calculating the power efficiency of the power path to be measured by the efficiency calculating unit through the third voltage value, the fourth voltage value, the first detection current value and the second detection current value may be:
wherein eta is the power efficiency of the power path to be tested, V b A third voltage value of the output end of the first precise resistor, I sense1 A first detection current value V of the first precision resistor d A fourth voltage value of the output end of the second precision resistor, I sense2 The second detection current value is the second precision resistor.
In a preferred embodiment of the present application, it may be further configured that the test system further includes a state evaluation module;
the state evaluation module is used for calculating average power efficiency of the power path to be tested in a preset time interval under the current test condition and comparing the average power efficiency with expected power efficiency; if the average power efficiency is greater than or equal to the expected power efficiency, judging that the power path to be tested is in a normal state within a preset time interval under the current test condition; and if the average power supply efficiency is smaller than the expected power supply efficiency, judging that the power supply path to be tested is in an abnormal state in a preset time interval under the current test condition.
In a preferred example of the present application, it may be further provided that the first amplifier and the second amplifier are configured to have the same amplification gain.
In a second aspect, the present application provides a method for testing power efficiency of a server motherboard.
The application is realized by the following technical scheme: a method for testing power efficiency of a server motherboard, the method comprising: the input end of a first precision resistor is connected to a power source of a power path to be tested in a server main board, the output end of the first precision resistor is connected to the input end of a conversion circuit of the power path to be tested, the input end of a second precision resistor is connected to the output end of the conversion circuit, the output end of the second precision resistor is connected to a load end, a first amplifier is connected to two ends of the first precision resistor in parallel, and a second amplifier is connected to two ends of the second precision resistor in parallel; the first precision resistor, the second precision resistor, the first amplifier and the second amplifier are integrated on a circuit board outside the server main board;
the method comprises the steps of respectively acquiring a first amplified voltage value of an output end of a first amplifier, a second amplified voltage value of an output end of a second amplifier, a third voltage value of an output end of a first precision resistor and a fourth voltage value of an output end of a second precision resistor by using a data acquisition device;
and determining the power efficiency of the power path to be tested based on the first amplified voltage value, the second amplified voltage value, the third voltage value and the fourth voltage value.
In a preferred embodiment of the present application, it may be further configured that the test method further includes:
calculating average power efficiency of the power path to be tested in a preset time interval under the current test condition, and comparing the average power efficiency with expected power efficiency;
if the average power efficiency is greater than or equal to the expected power efficiency, judging that the power path to be tested is in a normal state within a preset time interval under the current test condition;
and if the average power supply efficiency is smaller than the expected power supply efficiency, judging that the power supply path to be tested is in an abnormal state in a preset time interval under the current test condition.
In summary, compared with the prior art, the technical scheme provided by the embodiment of the application has the following beneficial effects: the system comprises a test system amplifying module, a data acquisition module and an efficiency determining module; the amplifying module is used for amplifying the voltage at the input end side and the voltage at the output end side of the conversion circuit of the power path to be tested on the server main board; the data acquisition module is connected with the amplifying module and is used for acquiring a first amplified voltage value at the input end side, a second amplified voltage value at the output end side, a third voltage value at the input end side and a fourth voltage value at the output end side of the conversion circuit of the power path to be detected; the efficiency determining module is used for determining the power efficiency of the power path to be tested through an amplified voltage value, a second amplified voltage value, a third voltage value and a fourth voltage value. The acquisition voltage is amplified through the amplification module, so that the problem of insufficient acquisition precision when data acquisition is performed under the condition of small current is solved, and the measurement precision of the power supply efficiency is improved.
Drawings
Fig. 1 is a schematic structural diagram of a system for testing power efficiency of a server motherboard according to an exemplary embodiment of the present application;
fig. 2 is a schematic structural diagram of a system for testing power efficiency of a server motherboard according to another exemplary embodiment of the present application
FIG. 3 is a schematic diagram of a power efficiency test system according to another exemplary embodiment of the present application;
fig. 4 is a flowchart illustrating a method for testing power efficiency of a server motherboard according to an exemplary embodiment of the present application;
FIG. 5 is a schematic diagram illustrating a connection between an efficiency test board and a power path according to an exemplary embodiment of the present application;
FIG. 6 is a schematic diagram of an arrangement of precision resistors and amplifiers provided in an exemplary embodiment of the present application;
fig. 7 is a circuit schematic of an amplifier according to another exemplary embodiment of the present application.
Detailed Description
The present embodiment is only for explanation of the present application and is not to be construed as limiting the present application, and modifications to the present embodiment, which may not creatively contribute to the present application as required by those skilled in the art after reading the present specification, are all protected by patent laws within the scope of claims of the present application.
For the purpose of making the objects, technical solutions and advantages of the embodiments of the present application more apparent, the technical solutions of the embodiments of the present application will be clearly and completely described below with reference to the accompanying drawings in the embodiments of the present application, and it is apparent that the described embodiments are some embodiments of the present application, but not all embodiments of the present application. All other embodiments, which can be made by those skilled in the art based on the embodiments of the application without making any inventive effort, are intended to be within the scope of the application.
In addition, the term "and/or" in the present application is merely an association relationship describing the association object, and indicates that three relationships may exist, for example, a and/or B may indicate: a exists alone, A and B exist together, and B exists alone. In the present application, unless otherwise specified, the term "/" generally indicates that the associated object is an "or" relationship.
The terms "first," "second," and the like in this disclosure are used for distinguishing between similar elements or items having substantially the same function and function, and it should be understood that there is no logical or chronological dependency between the terms "first," "second," and "n," and that there is no limitation on the amount and order of execution.
Embodiments of the application are described in further detail below with reference to the drawings.
In one embodiment of the present application, a system for testing power efficiency of a server motherboard is provided, as shown in fig. 1, the system includes: the device comprises an amplifying module, a data acquisition module and an efficiency determination module; the amplifying module is used for amplifying the voltage at the input end side and the voltage at the output end side of a conversion circuit (Converter) of the power path to be tested; the data acquisition module is connected with the amplifying module and is used for acquiring a first amplified voltage value at the input end side, a second amplified voltage value at the output end side, a third voltage value at the input end side and a fourth voltage value at the output end side of the conversion circuit of the power path to be detected; the efficiency determining module is connected with the data acquisition module and is used for acquiring voltage data of the data acquisition module and determining the power efficiency of the power path to be tested based on the acquired first amplified voltage value, second amplified voltage value, third voltage value and fourth voltage value. The amplifying module is respectively connected with the input end and the output end of the conversion circuit in the power path to be tested.
In some embodiments, the amplification module includes a first precision resistor, a second precision resistor, a first amplifier, and a second amplifier, and the data acquisition module may employ a data acquisition device. Specifically, as shown in fig. 2, an input end of the first precision resistor is connected with a power source of a power path to be tested, an output end of the first precision resistor is connected with an input end of a conversion circuit of the power path to be tested in the server main board, an input end of the second precision resistor is connected with an output end of the conversion circuit, an output end of the second precision resistor is connected with a load end, a first amplifier is connected in parallel with two ends of the first precision resistor, and a second amplifier is connected in parallel with two ends of the second precision resistor.
It should be noted that, the first precision resistor, the second precision resistor, the first amplifier, and the second amplifier are integrated on a circuit board for testing outside the server motherboard, and the circuit board can be attached to the power path to be tested by a stud and a screw. The circuit board for testing and the power path to be tested are fixed together through the studs and the screws, short circuit or disconnection caused by accidental touch of a line for collecting voltage in the testing process can be avoided, and therefore a main board can be better protected, and the power efficiency can be more efficiently tested.
The data acquisition device in the data acquisition module is respectively connected with the output end of the first amplifier, the output end of the second amplifier, the output end of the first precision resistor and the output end of the second precision resistor and is used for acquiring a first amplified voltage value of the output end of the first amplifier, a second amplified voltage value of the output end of the second amplifier, a third voltage value of the output end of the first precision resistor and a fourth voltage value of the output end of the second precision resistor. The first amplified voltage value of the output end of the first amplifier is the first amplified voltage value of the input end side of the conversion circuit, the second amplified voltage value of the output end of the second amplifier is the second amplified voltage value of the output end side of the conversion circuit, the third voltage value of the output end of the first precision resistor is the third voltage value of the input end side of the conversion circuit, and the fourth voltage value of the output end of the second precision resistor is the fourth voltage value of the output end side of the conversion circuit.
The efficiency determining module is connected with the data acquisition module and is used for acquiring the first amplified voltage value, the second amplified voltage value, the third voltage value and the fourth voltage value acquired by the data acquisition module and calculating the power efficiency of the power path to be detected based on the first amplified voltage value, the second amplified voltage value, the third voltage value and the fourth voltage value.
The efficiency determining module further includes a current calculating unit, as shown in fig. 3, configured to calculate a first detection current value of the first precision resistor and a second detection current value of the second precision resistor according to the first amplified voltage value and the second amplified voltage value, respectively;
the efficiency determining module further comprises an efficiency calculating unit, wherein the efficiency calculating unit is connected with the current calculating unit and can acquire a first detection current value and a second detection current value which are calculated by the current calculating unit; the power efficiency of the power path to be measured may be calculated based on the third voltage value, the fourth voltage value, and the first detection current value and the second detection current value acquired in the current calculation unit, which are acquired from the data collector.
The voltage at two ends of the acquisition precision resistor is amplified through the amplifier, so that the problem of insufficient acquisition precision of the data acquisition device when the current is smaller can be effectively solved, and the calculation precision of the power efficiency is further improved. Meanwhile, the precision resistor and the amplifier are integrated on an additional circuit board, so that the layout of a power supply PCB (printed circuit board) can be simplified, and the area of the PCB is saved.
In some embodiments, the test system further comprises: the state evaluation module is connected with the efficiency determination module and can acquire the power efficiency calculated by the efficiency determination module. The average power efficiency of the power path to be tested in a preset time interval under the current test condition can be calculated according to the preset sampling frequency, and the average power efficiency is compared with the expected power efficiency; if the average power efficiency is greater than or equal to the expected power efficiency, judging that the power path to be tested is in a normal state within a preset time interval under the current test condition; if the average power efficiency is smaller than the expected power efficiency, judging that the power path to be tested is in an abnormal state in a preset time interval under the current test condition. And judging the running state of the power supply according to the average power supply efficiency, and informing an engineer to take corresponding treatment measures if the efficiency of the power supply path to be tested is lower. Ensuring the high-efficiency work of the power supply.
In some embodiments, the first amplifier and the second amplifier are the same model, have the same feedback circuit, and therefore have the same amplification gain.
In some embodiments, the first amplifier and the second amplifier have amplification gains of 101 times.
In one embodiment of the present application, a method for testing power efficiency of a server motherboard is provided, as shown in fig. 4, the main steps are described as follows:
s10: connecting the input end of a first precision resistor on the efficiency test board with the power source of a power path to be tested in the server main board, connecting the output end of the first precision resistor with the input end of a conversion circuit of the power path to be tested, connecting the input end of a second precision resistor with the output end of the conversion circuit, connecting the output end of the second precision resistor with a load end, connecting a first amplifier in parallel with two ends of the first precision resistor, and connecting a second amplifier in parallel with two ends of the second precision resistor; the first precision resistor, the second precision resistor, the first amplifier and the second amplifier are integrated on a circuit board outside the server main board.
Specifically, as shown in fig. 5, an input end point a of a first precision resistor is connected to a power source of a power path to be tested in a server motherboard, an output end point B of the first precision resistor is connected to an input end of a conversion circuit (Converter) of a PCB board, an input end point C of a second precision resistor is connected to an output end of the conversion circuit (Converter), and an output end point D of the second precision resistor is connected to a load end. The voltage in the circuit is acquired by a data acquisition device (recrder).
The first precise resistor, the second precise resistor, the first amplifier and the second amplifier are integrated on a circuit board outside a server main board, and the circuit board for testing is locked and attached on a power supply path to be tested through studs and screws. The test board and the power path to be tested are fixed together through the stud and the screw, short circuit or open circuit caused by accidental touch of a line for collecting voltage in the test process can be avoided, and therefore the main board can be better protected, and the power efficiency can be more efficiently tested.
S20: and the data acquisition device is used for respectively acquiring a first amplified voltage value of the output end of the first amplifier, a second amplified voltage value of the output end of the second amplifier, a third voltage value of the output end of the first precision resistor and a fourth voltage value of the output end of the second precision resistor.
Specifically, a data collector (reorder) is used to collect a first amplified voltage value Ve at an output end E of the first amplifier, a second amplified voltage value Vf at an output end F of the second amplifier, a third voltage value Vb at an output end B of the first precision resistor, and a fourth voltage value Vd at an output end D of the second precision resistor. The voltage at two ends of the two precise resistors on the circuit is preprocessed by the amplifier, and the amplified voltage at two ends of the precise resistors is recorded by the data collector (recorder), so that the number of channels of the data collector (recorder) can be effectively reduced. For example, one data collector (recorder) has 20 channels, and the power paths which can be measured simultaneously by adopting the wiring mode in the application are lifted from 5 groups to 10 groups; in addition, if the current on a certain power supply path is smaller, the voltage difference generated at two ends of the precision resistor is smaller, even the situation that the sampling precision of the data acquisition device (recorder) is lower than that of the data acquisition device (recorder) occurs, certain errors exist in the data obtained by the data acquisition device (recorder), and finally the calculated power supply efficiency precision is not high. In the scheme, after the corresponding times are amplified accurately by the amplifier, the data acquisition device (recorder) is used for sampling, so that the accuracy of data can be effectively improved.
S30: and calculating the power efficiency of the power path to be tested based on the first amplified voltage value, the second amplified voltage value, the third voltage value and the fourth voltage value.
The first detection current value of the first precision resistor and the second detection current value of the second precision resistor are respectively obtained through the first amplification voltage value and the second amplification voltage value.
Specifically, since the first amplified voltage Ve at the output end E of the first amplifier is equal to the product of the resistance value of the first precision resistor and the amplification gain of the first amplifier, the detected current value flowing through the first precision resistor, plus the sum of the values of the reference voltages, i.e. V e ＝R sense1 ×Gain 1 ×I sense1 +V ref The method comprises the steps of carrying out a first treatment on the surface of the The second amplified voltage Vf at the output end F of the second amplifier is equal to the product of the resistance of the second precision resistor and the amplification gain of the second amplifier, the detected current value flowing through the second precision resistor, and the sum of the values added with the reference voltage, namely V f ＝R sense2 ×Gain 2 ×I sense2 +V ref . Wherein the reference voltage is common ground, V ref Is 0V.
Wherein, the resistance value R of the first precision resistor sense1 And a resistance value R of the second precision resistor sense2 Is an accurate value, and the resistance values of the first precision resistor and the second precision resistor can be tested by using a high-precision multimeter at the beginning of the testObtained. In some embodiments, the first precision resistor and the second precision resistor are the same, both are WW25BR001FTL, the resistance value is 0.001Ohm, and the precision is ±1%. The amplification gains of the first and second amplifiers are determined by the arranged peripheral circuits of the amplifiers.
In some embodiments, as shown in fig. 6, the first and second amplifiers are configured to be of the same model, with the same FB feedback circuit and the same amplification gain. In some embodiments, the model of the amplifier is specifically MAX9922. Fig. 7 shows a FB feedback circuit diagram of MAX9922. The amplification gains of the first and second amplifiers may be determined by a resistor R in the feedback circuit 003 And resistance R 004 The calculation result shows that the method comprises the steps of,resistance R employed in some embodiments 003 Has a resistance value of 33 Kohm, resistance R 004 Has a resistance value of 330ohm. It can thus be determined that the amplification gains of the first amplifier and the second amplifier are 101 times: />
After the resistance value of the first precise resistor, the amplification gain of the first amplifier and the reference voltage are determined, the first amplification voltage value V is acquired through the data acquisition unit at the output end E point of the first amplifier e A first detected current value of the first precision resistor may be obtained:after the resistance value of the second precision resistor, the amplification gain of the second amplifier and the reference voltage are determined, the second amplification voltage value V passing through the output end F point of the second amplifier of the data acquisition device f A second detected current value of the second precision resistor can be obtained: />Wherein V is e V is the first amplified voltage value of the output end of the first amplifier ref For reference voltage, R sense1 Is the resistance value of the first precision resistor, gain 1 For the amplification gain of the first amplifier, V f R is the second amplified voltage value of the output end of the second amplifier sense2 Is the resistance value of the second precision resistor, gain 2 Is the amplification gain of the second amplifier.
After the first detection current and the second detection current are obtained through calculation, the power efficiency of the power path to be measured is calculated through the third voltage value, the fourth voltage value, the first detection current value and the second detection current value.
Specifically, the third voltage value Vb at the output terminal B of the first precision resistor, the fourth voltage value Vd at the output terminal D of the second precision resistor, and the first detection current value I flowing through the first precision resistor are obtained by calculation sense1 A second detection current value I flowing through a second precision resistor sense2 To calculate the power efficiency of the power path to be detected:wherein η is the power efficiency of the power path to be tested.
In some embodiments, after calculating the power efficiency of the power path to be measured, the method further includes:
calculating the average power efficiency of the power path to be tested in a preset time interval under the current test condition, comparing the average power efficiency with the expected power efficiency, and judging that the power path to be tested is in a normal state in the preset time interval under the current test condition if the calculated average power efficiency is greater than or equal to the expected power efficiency; if the calculated average power efficiency is smaller than the expected power efficiency, judging that the power path to be tested is in an abnormal state within a preset time interval under the current test condition.
Specifically, the sampling frequency of the power efficiency can be calculated every 0.1s, and the average power efficiency eta of the power path to be tested in 0.5h or 1.0h and the expected power efficiency eta are counted * By contrast, the desired power efficiency η * May be 85The percentage of the total weight of the alloy is 90 percent or 95 percent, and can be set according to actual requirements. The state of the power supply under the current test condition is judged by monitoring the power supply efficiency for a period of time and utilizing the average power supply efficiency, when the power supply efficiency is found to be lower than the expected power supply efficiency, the efficiency of the power supply path to be tested under the current test condition can be judged to be lower and in an abnormal state, more energy of the power supply is converted into heat at the moment, the main board can be seriously heated, and engineers are required to take corresponding treatment measures to ensure the high-efficiency work of the power supply.
It will be apparent to those skilled in the art that, for convenience and brevity of description, only the above-described division of the functional units and modules is illustrated, and in practical application, the above-described functional distribution may be performed by different functional units and modules according to needs, i.e. the internal structure of the system of the present application is divided into different functional units or modules to perform all or part of the above-described functions.
Claims (10)
1. A system for testing power efficiency of a server motherboard, the system comprising:
the device comprises an amplifying module, a data acquisition module and an efficiency determination module;
the amplifying module is used for amplifying the voltage at the input end side and the voltage at the output end side of the conversion circuit of the power path to be tested on the server main board;
the data acquisition module is connected with the amplifying module and is used for acquiring a first amplified voltage value at the input end side, a second amplified voltage value at the output end side, a third voltage value at the input end side and a fourth voltage value at the output end side of the conversion circuit of the power path to be detected;
and the efficiency determining module is used for determining the power efficiency of the power path to be tested through the first amplified voltage value, the second amplified voltage value, the third voltage value and the fourth voltage value.
2. The system of claim 1, wherein the amplifying module comprises a first precision resistor, a second precision resistor, a first amplifier, and a second amplifier;
the input end of the first precise resistor is connected to the power source of the power path to be tested in the server main board, the output end of the first precise resistor is connected to the input end of the conversion circuit of the power path to be tested, the input end of the second precise resistor is connected to the output end of the conversion circuit, the output end of the second precise resistor is connected to the load end, the first amplifier is connected to the two ends of the first precise resistor in parallel, and the second amplifier is connected to the two ends of the second precise resistor in parallel.
3. The system for testing power efficiency of a server motherboard according to claim 1, wherein the efficiency determination module further comprises a current calculation unit;
the current calculation unit is used for respectively calculating a first detection current value of the first precision resistor and a second detection current value of the second precision resistor according to the first amplification voltage value and the second amplification voltage value.
4. The system for testing power efficiency of a server motherboard according to claim 3, wherein the specific formulas for calculating the first detected current value of the first precision resistor and the second detected current value of the second precision resistor by the current calculation unit through the first amplified voltage value and the second amplified voltage value respectively are:
wherein V is e V is the first amplified voltage value of the output end of the first amplifier ref For reference voltage, R sense1 Is the resistance value of the first precision resistor, gain 1 For the first amplifierLarge gain, V f R is the second amplified voltage value of the output end of the second amplifier sense2 Is the resistance value of the second precision resistor, gain 2 Is the amplification gain of the second amplifier.
5. The system for testing power efficiency of a server motherboard according to claim 3, wherein the efficiency determination module further comprises an efficiency calculation unit;
the efficiency calculating unit is used for calculating the power efficiency of the power path to be measured through the third voltage value, the fourth voltage value, the first detection current value and the second detection current value.
6. The system according to claim 5, wherein the specific formula for calculating the power efficiency of the power path to be tested by the efficiency calculating unit through the third voltage value, the fourth voltage value, the first detection current value and the second detection current value is:
wherein eta is the power efficiency of the power path to be tested, V b A third voltage value of the output end of the first precise resistor, I sense1 A first detection current value V of the first precision resistor d A fourth voltage value of the output end of the second precision resistor, I sense2 The second detection current value is the second precision resistor.
7. The system for testing power efficiency of a server motherboard according to any one of claims 1 to 6, further comprising a status assessment module;
the state evaluation module is used for calculating average power efficiency of the power path to be tested in a preset time interval under the current test condition and comparing the average power efficiency with expected power efficiency;
if the average power efficiency is greater than or equal to the expected power efficiency, judging that the power path to be tested is in a normal state within a preset time interval under the current test condition;
and if the average power supply efficiency is smaller than the expected power supply efficiency, judging that the power supply path to be tested is in an abnormal state in a preset time interval under the current test condition.
8. The system for testing power efficiency of a server motherboard of claim 2, wherein the first amplifier and the second amplifier are configured to have the same amplification gain.
9. The method for testing the power efficiency of the server main board is characterized by comprising the following steps of:
the input end of a first precision resistor is connected to a power source of a power path to be tested in a server main board, the output end of the first precision resistor is connected to the input end of a conversion circuit of the power path to be tested, the input end of a second precision resistor is connected to the output end of the conversion circuit, the output end of the second precision resistor is connected to a load end, a first amplifier is connected to two ends of the first precision resistor in parallel, and a second amplifier is connected to two ends of the second precision resistor in parallel; the first precision resistor, the second precision resistor, the first amplifier and the second amplifier are integrated on a circuit board outside the server main board;
the method comprises the steps of respectively acquiring a first amplified voltage value of an output end of a first amplifier, a second amplified voltage value of an output end of a second amplifier, a third voltage value of an output end of a first precision resistor and a fourth voltage value of an output end of a second precision resistor by using a data acquisition device;
and determining the power efficiency of the power path to be tested based on the first amplified voltage value, the second amplified voltage value, the third voltage value and the fourth voltage value.
10. The method for testing power efficiency of a server motherboard of claim 9, further comprising:
calculating average power efficiency of the power path to be tested in a preset time interval under the current test condition, and comparing the average power efficiency with expected power efficiency;
if the average power efficiency is greater than or equal to the expected power efficiency, judging that the power path to be tested is in a normal state within a preset time interval under the current test condition;
and if the average power supply efficiency is smaller than the expected power supply efficiency, judging that the power supply path to be tested is in an abnormal state in a preset time interval under the current test condition.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202310708257.1A CN116699452B (en) | 2023-06-15 | 2023-06-15 | System and method for testing power efficiency of server main board |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202310708257.1A CN116699452B (en) | 2023-06-15 | 2023-06-15 | System and method for testing power efficiency of server main board |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN116699452A true CN116699452A (en) | 2023-09-05 |
| CN116699452B CN116699452B (en) | 2024-01-09 |
Family
ID=87823516
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202310708257.1A Active CN116699452B (en) | 2023-06-15 | 2023-06-15 | System and method for testing power efficiency of server main board |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN116699452B (en) |
Citations (10)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN105116214A (en) * | 2015-08-31 | 2015-12-02 | 重庆京东方光电科技有限公司 | Power detection device |
| US20160134241A1 (en) * | 2014-11-12 | 2016-05-12 | Murata Manufacturing Co., Ltd. | Power amplifier |
| CN105978339A (en) * | 2016-07-04 | 2016-09-28 | 东南大学 | Efficiency optimization power supply control method based on genetic algorithm |
| CN109004830A (en) * | 2018-07-09 | 2018-12-14 | 东南大学 | A kind of efficiency optimization power control method based on genetic algorithm |
| CN109450528A (en) * | 2018-11-22 | 2019-03-08 | 东莞铭普光磁股份有限公司 | A kind of the measurement of power loss circuit and method of optical module |
| CN110850158A (en) * | 2019-12-13 | 2020-02-28 | 珠海市运泰利自动化设备有限公司 | Charging efficiency calculation and calibration circuit and method for charger mainboard |
| CN112054678A (en) * | 2020-08-28 | 2020-12-08 | 苏州浪潮智能科技有限公司 | System and method for optimizing server power supply based on input voltage |
| CN213122962U (en) * | 2020-08-26 | 2021-05-04 | 中科可控信息产业有限公司 | Server mainboard consumption monitoring devices |
| CN115598410A (en) * | 2022-12-13 | 2023-01-13 | 成都爱旗科技有限公司（Cn） | Power consumption acquisition system and method |
| CN115902681A (en) * | 2023-02-22 | 2023-04-04 | 江西省中碳数字能源技术有限公司 | Three-phase variable frequency power supply conversion efficiency test system |
-
2023
- 2023-06-15 CN CN202310708257.1A patent/CN116699452B/en active Active
Patent Citations (10)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US20160134241A1 (en) * | 2014-11-12 | 2016-05-12 | Murata Manufacturing Co., Ltd. | Power amplifier |
| CN105116214A (en) * | 2015-08-31 | 2015-12-02 | 重庆京东方光电科技有限公司 | Power detection device |
| CN105978339A (en) * | 2016-07-04 | 2016-09-28 | 东南大学 | Efficiency optimization power supply control method based on genetic algorithm |
| CN109004830A (en) * | 2018-07-09 | 2018-12-14 | 东南大学 | A kind of efficiency optimization power control method based on genetic algorithm |
| CN109450528A (en) * | 2018-11-22 | 2019-03-08 | 东莞铭普光磁股份有限公司 | A kind of the measurement of power loss circuit and method of optical module |
| CN110850158A (en) * | 2019-12-13 | 2020-02-28 | 珠海市运泰利自动化设备有限公司 | Charging efficiency calculation and calibration circuit and method for charger mainboard |
| CN213122962U (en) * | 2020-08-26 | 2021-05-04 | 中科可控信息产业有限公司 | Server mainboard consumption monitoring devices |
| CN112054678A (en) * | 2020-08-28 | 2020-12-08 | 苏州浪潮智能科技有限公司 | System and method for optimizing server power supply based on input voltage |
| CN115598410A (en) * | 2022-12-13 | 2023-01-13 | 成都爱旗科技有限公司（Cn） | Power consumption acquisition system and method |
| CN115902681A (en) * | 2023-02-22 | 2023-04-04 | 江西省中碳数字能源技术有限公司 | Three-phase variable frequency power supply conversion efficiency test system |
Also Published As
| Publication number | Publication date |
|---|---|
| CN116699452B (en) | 2024-01-09 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| US20090121726A1 (en) | Test apparatus and measurement apparatus | |
| US8275569B2 (en) | Test apparatus and diagnosis method | |
| CN105223411A (en) | Overcurrent detection circuit and power supply system | |
| CN110275104A (en) | A kind of weak current measuring device and measuring method of ATE system | |
| CN116699452B (en) | System and method for testing power efficiency of server main board | |
| CN108304023B (en) | High-load stability compensation circuit of switching power supply | |
| EP0295782A1 (en) | In-circuit transistor beta test and method | |
| US6861834B2 (en) | System and method for measuring the power consumed by a circuit on a printed circuit board | |
| CN115856750A (en) | Device and method for quickly calibrating SOC (System on chip) test system | |
| CN116545393A (en) | Precise output amplifying circuit, load detection circuit and device using circuit | |
| WO2005116672A1 (en) | Power supply current measuring apparatus and testing apparatus | |
| CN115290951A (en) | High-voltage-resistance current detection splitter for new energy automobile battery management system | |
| US8143881B2 (en) | Current measuring apparatus for power supply | |
| Pipiska et al. | Electronically isolated measuring circuit for multicell traction battery modules identifying state of charge (SOC) values | |
| US20040196056A1 (en) | System and method for measuring the thickness or temperature of a circuit in a printed circuit board | |
| CN210803660U (en) | Weak current measuring device of ATE system | |
| CN110412485A (en) | A kind of output current detection circuit | |
| Rajeswari et al. | Buck Converter Current Measurement Using Differential Amplifier. | |
| US20030020498A1 (en) | Noise evaluation circuit for IC tester | |
| CN219533333U (en) | Positioning detection circuit for PCBA power rail short circuit | |
| KR20080002448U (en) | Performace test system for control rod coils | |
| US20030001593A1 (en) | System and method for measuring the thickness or temperature of a circuit in a printed circuit board | |
| CN218995566U (en) | Detection device of DVI unit of test system | |
| CN212083624U (en) | Voltage detection circuit, circuit board, device and vehicle-mounted air conditioner | |
| CN112285628B (en) | High-reliability large-current direct current ammeter and calibration method thereof |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| PB01 | Publication | ||
| PB01 | Publication | ||
| SE01 | Entry into force of request for substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| GR01 | Patent grant | ||
| GR01 | Patent grant |