CN116662210B - Interface regression testing method, device and application - Google Patents
Interface regression testing method, device and application Download PDFInfo
- Publication number
- CN116662210B CN116662210B CN202310934835.3A CN202310934835A CN116662210B CN 116662210 B CN116662210 B CN 116662210B CN 202310934835 A CN202310934835 A CN 202310934835A CN 116662210 B CN116662210 B CN 116662210B
- Authority
- CN
- China
- Prior art keywords
- test
- test cases
- interface
- failed
- cases
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
- 238000012360 testing method Methods 0.000 title claims abstract description 378
- 238000012216 screening Methods 0.000 claims abstract description 4
- 238000000034 method Methods 0.000 claims description 21
- 238000004590 computer program Methods 0.000 claims description 14
- 230000006870 function Effects 0.000 claims description 12
- 230000007547 defect Effects 0.000 claims description 8
- 230000008569 process Effects 0.000 claims description 8
- 230000008439 repair process Effects 0.000 claims description 7
- 238000011161 development Methods 0.000 claims description 3
- 230000008676 import Effects 0.000 description 13
- 230000005540 biological transmission Effects 0.000 description 7
- 238000010586 diagram Methods 0.000 description 4
- 238000012795 verification Methods 0.000 description 4
- 238000004891 communication Methods 0.000 description 3
- 238000011144 upstream manufacturing Methods 0.000 description 3
- 230000002159 abnormal effect Effects 0.000 description 2
- 230000006399 behavior Effects 0.000 description 2
- 230000003993 interaction Effects 0.000 description 2
- 238000012986 modification Methods 0.000 description 2
- 230000004048 modification Effects 0.000 description 2
- 230000003287 optical effect Effects 0.000 description 2
- 238000012545 processing Methods 0.000 description 2
- 101100394003 Butyrivibrio fibrisolvens end1 gene Proteins 0.000 description 1
- 230000005856 abnormality Effects 0.000 description 1
- 238000013500 data storage Methods 0.000 description 1
- 239000007787 solid Substances 0.000 description 1
- 230000003068 static effect Effects 0.000 description 1
- 230000001360 synchronised effect Effects 0.000 description 1
- 238000012546 transfer Methods 0.000 description 1
Classifications
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/36—Preventing errors by testing or debugging software
- G06F11/3668—Software testing
- G06F11/3672—Test management
- G06F11/3688—Test management for test execution, e.g. scheduling of test suites
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/36—Preventing errors by testing or debugging software
- G06F11/3668—Software testing
- G06F11/3672—Test management
- G06F11/3684—Test management for test design, e.g. generating new test cases
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02D—CLIMATE CHANGE MITIGATION TECHNOLOGIES IN INFORMATION AND COMMUNICATION TECHNOLOGIES [ICT], I.E. INFORMATION AND COMMUNICATION TECHNOLOGIES AIMING AT THE REDUCTION OF THEIR OWN ENERGY USE
- Y02D10/00—Energy efficient computing, e.g. low power processors, power management or thermal management
Landscapes
- Engineering & Computer Science (AREA)
- Theoretical Computer Science (AREA)
- Computer Hardware Design (AREA)
- Quality & Reliability (AREA)
- Physics & Mathematics (AREA)
- General Engineering & Computer Science (AREA)
- General Physics & Mathematics (AREA)
- Debugging And Monitoring (AREA)
- Test And Diagnosis Of Digital Computers (AREA)
Abstract
The application provides an interface regression testing method, device and application, which comprises the following steps: acquiring a tested interface and assigning a unique interface number, determining a test point, dividing a test scene and assigning a unique scene number; writing at least one test case, and naming each test case; and carrying out primary regression testing by using all the test cases, repairing failed test cases, and carrying out secondary regression testing by using the repaired failed test cases and the test cases associated with the failed test cases until all the tests are passed, wherein the associated test cases are obtained by naming each test case. According to the scheme, the test cases needing secondary regression are screened through the naming of each test case to carry out secondary test, so that basis is provided for interface regression, and screening time is shortened to save interface regression test time.
Description
Technical Field
The present application relates to the field of interface testing, and in particular, to a method, an apparatus, and an application for regression testing of an interface.
Background
The test case of the interface is a test case specially used for testing the interface function of a software system, in the software development, the interface is a key point for data exchange and communication among different modules, components or systems, and the test case of the interface aims at verifying the correctness, reliability and stability of the interface so as to ensure that each component can correctly perform data transmission and interaction.
The interface regression test is a software test method for verifying whether the modified or updated software interface still works as expected, and the existing functions are not destroyed, and the interface regression test is executed, so that the stability and compatibility of the software at the interface level can be ensured, and the risk of introducing new problems after the interface is modified or updated is reduced.
In the existing interface regression test, more subjective factors exist, a unified method is lacking, defects are easy to escape, the tested cases can be used for achieving limitation during defect regression, the method adopted by most of the interface regression tests at present is that the test cases when the defects are found are re-executed once, then artificial self-subjective verification screening is carried out, and places possibly causing other problems due to modification of the defect test cases are considered to exist.
Therefore, there is a need for an interface regression testing method that can improve the accuracy of the interface regression test and consume less time.
Disclosure of Invention
The embodiment of the application provides an interface regression testing method, an interface regression testing device and application, wherein the naming of each test case is used for screening the test case needing secondary regression for secondary test to provide basis for interface regression, and the test case with low priority is abandoned in the testing process to save the time of interface regression testing.
In a first aspect, an embodiment of the present application provides an interface regression testing method, where the method includes:
acquiring at least one tested interface, setting different interface numbers for each tested interface, acquiring test points of all tested interfaces, dividing different test scenes according to the test points, setting different scene numbers for each test scene, writing at least one test case, and naming each test case according to the interface number of the tested interface to which each test case belongs, the scene number of the scene to which each test case belongs and the category of the test case;
acquiring failed test cases during primary regression testing, and selecting and changing reference test cases which are affected after the failed test cases according to interface numbers, scene numbers and self categories in the names of the failed test cases;
and performing a secondary regression test on the failed test cases after the repair and the reference test cases until all the test cases pass.
In a second aspect, an embodiment of the present application provides an interface regression testing apparatus, including:
and (3) a setting module: acquiring at least one tested interface, setting different interface numbers for each tested interface, acquiring test points of all tested interfaces, dividing different test scenes according to the test points, setting different scene numbers for each test scene, writing at least one test case, and naming each test case according to the interface number of the tested interface to which each test case belongs, the scene number of the scene to which each test case belongs and the category of the test case;
the acquisition module is used for: acquiring failed test cases during primary regression testing, and selecting and changing reference test cases which are affected after the failed test cases according to interface numbers, scene numbers and self categories in the names of the failed test cases;
regression testing module: and performing a secondary regression test on the failed test cases after the repair and the reference test cases until all the test cases pass.
In a third aspect, an embodiment of the present application provides an electronic device, including a memory, and a processor, wherein the memory stores a computer program, and the processor is configured to run the computer program to perform an interface regression testing method.
In a fourth aspect, embodiments of the present application provide a readable storage medium having a computer program stored therein, the computer program comprising program code for controlling a process to execute a process, the process comprising an interface regression testing method.
The main contributions and innovation points of the application are as follows:
the embodiment of the application names the test cases through the interface numbers and the scene numbers, and screens the test cases needing to carry out secondary regression according to the names of the test cases during secondary regression, thereby providing basis for interface regression and ensuring accuracy of regression test; according to the scheme, different priorities are set for each test case, so that the failed test case and the test cases associated with the failed test case are further screened, and the time of interface test is saved; when the scheme is used for carrying out secondary regression, not only the failed test cases are tested, but also other test cases related to the failed test cases are subjected to secondary regression, so that the stability of interface test is improved.
The details of one or more embodiments of the application are set forth in the accompanying drawings and the description below to provide a more thorough understanding of the other features, objects, and advantages of the application.
Drawings
The accompanying drawings, which are included to provide a further understanding of the application and are incorporated in and constitute a part of this specification, illustrate embodiments of the application and together with the description serve to explain the application and do not constitute a limitation on the application. In the drawings:
FIG. 1 is a flow chart of an interface regression testing method according to an embodiment of the present application;
FIG. 2 is a flow chart of generating test cases according to an embodiment of the present application;
FIG. 3 is a schematic diagram of a generate path class test case according to an embodiment of the application;
FIG. 4 is a flow chart of performing an interface regression test according to an embodiment of the present application;
FIG. 5 is a block diagram of an interface regression testing apparatus according to an embodiment of the present application;
fig. 6 is a schematic diagram of a hardware structure of an electronic device according to an embodiment of the present application.
Detailed Description
Reference will now be made in detail to exemplary embodiments, examples of which are illustrated in the accompanying drawings. When the following description refers to the accompanying drawings, the same numbers in different drawings refer to the same or similar elements, unless otherwise indicated. The implementations described in the following exemplary embodiments do not represent all implementations consistent with one or more embodiments of the present specification. Rather, they are merely examples of apparatus and methods consistent with aspects of one or more embodiments of the present description as detailed in the accompanying claims.
It should be noted that: in other embodiments, the steps of the corresponding method are not necessarily performed in the order shown and described in this specification. In some other embodiments, the method may include more or fewer steps than described in this specification. Furthermore, individual steps described in this specification, in other embodiments, may be described as being split into multiple steps; while various steps described in this specification may be combined into a single step in other embodiments.
Example 1
The embodiment of the application provides an interface regression testing method, and specifically referring to fig. 1, the method comprises the following steps:
acquiring at least one tested interface, setting different interface numbers for each tested interface, acquiring test points of all tested interfaces, dividing different test scenes according to the test points, setting different scene numbers for each test scene, writing at least one test case, and naming each test case according to the interface number of the tested interface to which each test case belongs, the scene number of the scene to which each test case belongs and the category of the test case;
acquiring failed test cases during primary regression testing, and selecting and changing reference test cases which are affected after the failed test cases according to interface numbers, scene numbers and self categories in the names of the failed test cases;
and performing a secondary regression test on the failed test cases after the repair and the reference test cases until all the test cases pass.
In some embodiments, in the step of obtaining test points of all tested interfaces and dividing different test scenes according to the test points, each interface has a plurality of different test points, and each test point can be divided into different test scenes at the same time.
Specifically, all test points of each tested interface are listed, wherein the test points refer to specific functions, behaviors or conditions of the tested interface, and are targets of the test for checking whether the interface works according to expectations.
By way of example, test points may include input data, boundary conditions, abnormal situations, interaction logic, and the like.
In some embodiments, different priorities are allocated to each test case according to the degree of affecting the service function of the core service from high to low, where the priorities are high, medium and low, the high-priority test case is a test case affecting the core service, the medium-priority test case is a test case affecting the functional correctness, and the low-priority test case is a test case not affecting the service function substantially or slightly but not affecting the service development.
Specifically, setting the priority for each test case can repair the problem in the subsequent regression test according to the priority, and reduce the time required by the regression test.
In some embodiments, the test cases are classified into a logic class, a fault-tolerant class and a path class, where the logic class test cases are test cases for testing the logic functions of the software or the system by using pointers, the fault-tolerant class test cases are test cases for testing the behavior and reaction of the system or the software in the case of faults or errors, and the path class test cases are test cases designed based on different paths and execution logic of the software or the system.
In the scheme, the number a is used for representing the logic class test case, the number b is used for representing the fault tolerance class test case, and the number c is used for representing the path class test case, so that the naming format of each test case in the scheme is xx-scene number-interface number-a/b/c-xx, xx is used for representing other coding elements, and a flow chart for generating the test case is shown in fig. 2.
By way of example, a logical class interface use case in this solution generally indicates that an interface can return the expected correct information after transmitting various legal parameters according to a given transmission request.
The fault-tolerant interface use case in the scheme generally represents various possible situations when an interface transmits according to abnormal logic (null value, not specified parameter type and the like), and the interface is required to be correctly processed and a prompt that abnormality cannot occur is given.
The interface use case of the path class in this solution generally represents that after an interface transmits and obtains a returned value, the value is used when the downstream interface transmits the value, or the generated value is stored in a database and processed by the downstream interface to return, after the downstream interface uses the parameter value, the service is correct, and the same may also be that the parameter value of the interface is from the upstream interface, where all the cases belong to the path class, for example, as shown in fig. 3, there are n paths a, b, c, d, e connected to each other in the same scene, then test uses such as start > a+b+c > end1, start > a+b+d > end2, start > a+e > end2, etc. of different paths can be generated.
Specifically, a basis is provided for a subsequent interface regression test by naming each test case.
In some embodiments, low priority failed test cases are excluded from primary regression testing.
Specifically, in the process of performing the regression test, repairing one problem may cause another larger problem, and since the test cases with low priority do not substantially affect the service function, the test cases with low priority that do not pass are excluded in the primary regression test to save the time of the interface test.
In some embodiments, in the step of using the repaired failed test case and performing a secondary regression test with the reference test case until all test cases pass, if the failed test case is a logic class test case, all path class test cases with the same scene number as the failed test case and all logic class test cases with the same interface number as the same scene number are extracted as reference test cases according to the naming of the failed test case.
Specifically, since modifying the logic class test cases may affect the access number of the interface at the upstream and downstream sides, it is necessary to perform a quadratic regression test on all path class test cases in the same scene to prevent more problems.
In some embodiments, in the step of using the repaired failed test case and performing a secondary regression test with the reference test case until all test cases pass, if the failed test case is a fault-tolerant test case, extracting all path test cases with the same scene number as the failed test case and all fault-tolerant test cases with the same interface number as the failed test case according to the naming of the failed test case as a reference test case.
Specifically, since modifying the fault-tolerant class test cases affects the access numbers of the interfaces at the upstream and downstream sides, the secondary regression test needs to be performed on all path class test cases in the same scene to prevent more problems.
In some embodiments, in the step of using the repaired failed test case and performing a secondary regression test with the reference test case until all test cases pass, if the failed test case is a path class test case, extracting all logic class test cases and all path class test cases under the same scene number as the failed test case according to the name of the failed test case.
In some embodiments, the test cases associated with failed test case presence are only high priority test cases.
Specifically, as shown in fig. 4, in the flow chart of the interface regression test in the scheme, in order to improve the efficiency of the secondary regression test and provide a regression basis for the interface regression test, test cases related to failed test cases are searched through naming of the test cases in the secondary regression, and only the test cases with high priority are required to be executed.
Illustratively, an import interface in a device import scenario has a defect, the import interface has an interface number of import, and the defect of the import interface is roughly described as: the interface supports import device types 3, A, B, C respectively, where errors occur when B devices are imported.
Obtaining a test case which fails the test, wherein the test case is roughly described as follows: when the parameters of the transfer equipment are B types, other parameters are filled in, and whether the return interface is correct or not is checked. If the test case is a logical test case and belongs to the device import scenario, the following test cases are obtained by extracting the test cases including the interface number import, the type a (logical class) and the scenario number sbdr (device import scenario) in the test case names: the use case verification Import device type A of sbxx3-Import-a-sbdr-0014, the use case verification Import device type B of sbxx-Import-a-sbdr-002, the use case verification Import device type C of sbxx-Import-a-sbdr-003, etc. (the above extracted use cases are only examples) and path class test use cases are also extracted, and the test use case names include the use of path classes and device Import scenarios, for example: the sbxx-null-C-sbdr-155 is used for verifying that the interface return data for inquiring the list data of the page device remains correct (the test case also belongs to the large scene of device importing sbdr, and is understood from page operation, namely, whether the imported device post-viewing list corresponds to correct update display, and is mainly used for verifying the display of the downstream interface of the data after the imported device type B, and can also be used for device type A/C reconfirmation).
Example two
Based on the same conception, referring to fig. 5, the application also provides an interface regression testing device, which comprises:
and (3) a setting module: acquiring at least one tested interface, setting different interface numbers for each tested interface, acquiring test points of all tested interfaces, dividing different test scenes according to the test points, setting different scene numbers for each test scene, writing at least one test case, and naming each test case according to the interface number of the tested interface to which each test case belongs, the scene number of the scene to which each test case belongs and the category of the test case;
the acquisition module is used for: acquiring failed test cases during primary regression testing, and selecting and changing reference test cases which are affected after the failed test cases according to interface numbers, scene numbers and self categories in the names of the failed test cases;
regression testing module: and performing a secondary regression test on the failed test cases after the repair and the reference test cases until all the test cases pass.
Example III
This embodiment also provides an electronic device, referring to fig. 6, comprising a memory 404 and a processor 402, the memory 404 having stored therein a computer program, the processor 402 being arranged to run the computer program to perform the steps of any of the method embodiments described above.
In particular, the processor 402 may include a Central Processing Unit (CPU), or an Application Specific Integrated Circuit (ASIC), or may be configured as one or more integrated circuits that implement embodiments of the present application.
The memory 404 may include, among other things, mass storage 404 for data or instructions. By way of example, and not limitation, memory 404 may comprise a Hard Disk Drive (HDD), floppy disk drive, solid State Drive (SSD), flash memory, optical disk, magneto-optical disk, tape, or Universal Serial Bus (USB) drive, or a combination of two or more of these. Memory 404 may include removable or non-removable (or fixed) media, where appropriate. Memory 404 may be internal or external to the data processing apparatus, where appropriate. In a particular embodiment, the memory 404 is a Non-Volatile (Non-Volatile) memory. In particular embodiments, memory 404 includes Read-only memory (ROM) and Random Access Memory (RAM). Where appropriate, the ROM may be a mask-programmed ROM, a Programmable ROM (PROM), an Erasable PROM (EPROM), an Electrically Erasable PROM (EEPROM), an electrically rewritable ROM (EAROM) or FLASH memory (FLASH) or a combination of two or more of these. The RAM may be Static Random Access Memory (SRAM) or Dynamic Random Access Memory (DRAM) where appropriate, and the DRAM may be fast page mode dynamic random access memory 404 (FPMDRAM), extended Data Output Dynamic Random Access Memory (EDODRAM), synchronous Dynamic Random Access Memory (SDRAM), or the like.
Memory 404 may be used to store or cache various data files that need to be processed and/or used for communication, as well as possible computer program instructions for execution by processor 402.
Processor 402 implements any of the interface regression testing methods of the above embodiments by reading and executing computer program instructions stored in memory 404.
Optionally, the electronic apparatus may further include a transmission device 406 and an input/output device 408, where the transmission device 406 is connected to the processor 402 and the input/output device 408 is connected to the processor 402.
The transmission device 406 may be used to receive or transmit data via a network. Specific examples of the network described above may include a wired or wireless network provided by a communication provider of the electronic device. In one example, the transmission device includes a network adapter (Network Interface Controller, simply referred to as NIC) that can connect to other network devices through the base station to communicate with the internet. In one example, the transmission device 406 may be a Radio Frequency (RF) module, which is configured to communicate with the internet wirelessly.
The input-output device 408 is used to input or output information. In this embodiment, the input information may be a test case, a quadratic regression test case, or the like, and the output information may be a test result, or the like.
Alternatively, in the present embodiment, the above-mentioned processor 402 may be configured to execute the following steps by a computer program:
s101, acquiring at least one tested interface, setting different interface numbers for each tested interface, acquiring test points of all tested interfaces, dividing different test scenes according to the test points, setting different scene numbers for each test scene, writing at least one test case, and naming each test case according to the interface number of the tested interface to which each test case belongs, the scene number of the scene to which each test case belongs and the self category;
s102, acquiring failed test cases during primary regression testing, and selecting and changing reference test cases which are affected after the failed test cases according to interface numbers, scene numbers and self categories in the names of the failed test cases;
s103, using the repaired failed test cases and carrying out a secondary regression test with the reference test cases until all the test cases pass.
It should be noted that, specific examples in this embodiment may refer to examples described in the foregoing embodiments and alternative implementations, and this embodiment is not repeated herein.
In general, the various embodiments may be implemented in hardware or special purpose circuits, software, logic or any combination thereof. Some aspects of the application may be implemented in hardware, while other aspects may be implemented in firmware or software which may be executed by a controller, microprocessor or other computing device, although the application is not limited thereto. While various aspects of the application may be illustrated and described as block diagrams, flow charts, or using some other pictorial representation, it is well understood that these blocks, apparatus, systems, techniques or methods described herein may be implemented in, as non-limiting examples, hardware, software, firmware, special purpose circuits or logic, general purpose hardware or controller or other computing devices, or some combination thereof.
Embodiments of the application may be implemented by computer software executable by a data processor of a mobile device, such as in a processor entity, or by hardware, or by a combination of software and hardware. Computer software or programs (also referred to as program products) including software routines, applets, and/or macros can be stored in any apparatus-readable data storage medium and they include program instructions for performing particular tasks. The computer program product may include one or more computer-executable components configured to perform embodiments when the program is run. The one or more computer-executable components may be at least one software code or a portion thereof. In this regard, it should also be noted that any block of the logic flow as in fig. 6 may represent a program step, or interconnected logic circuits, blocks and functions, or a combination of program steps and logic circuits, blocks and functions. The software may be stored on a physical medium such as a memory chip or memory block implemented within a processor, a magnetic medium such as a hard disk or floppy disk, and an optical medium such as, for example, a DVD and its data variants, a CD, etc. The physical medium is a non-transitory medium.
It should be understood by those skilled in the art that the technical features of the above embodiments may be combined in any manner, and for brevity, all of the possible combinations of the technical features of the above embodiments are not described, however, they should be considered as being within the scope of the description provided herein, as long as there is no contradiction between the combinations of the technical features.
The foregoing examples illustrate only a few embodiments of the application, which are described in greater detail and are not to be construed as limiting the scope of the application. It should be noted that it will be apparent to those skilled in the art that several variations and modifications can be made without departing from the spirit of the application, which are all within the scope of the application. Accordingly, the scope of the application should be assessed as that of the appended claims.
Claims (8)
1. The interface regression testing method is characterized by comprising the following steps of:
acquiring at least one tested interface, setting different interface numbers for each tested interface, acquiring test points of all tested interfaces, dividing different test scenes according to the test points, setting different scene numbers for each test scene, writing at least one test case, and naming each test case according to the interface number of the tested interface to which each test case belongs, the scene number of the scene to which each test case belongs and the category of the test case;
acquiring failed test cases during primary regression testing, selecting and changing reference test cases which are affected after the failed test cases according to interface numbers, scene numbers and self categories in the names of the failed test cases, dividing the test cases into logic class test cases, fault-tolerant class test cases and path class test cases according to the self categories of the test cases, and extracting all path class test cases with the same scene number as the failed test cases and all logic class test cases with the same interface number as the failed test cases according to the names of the failed test cases if the failed test cases are logic class test cases; if the failed test case is a fault-tolerant test case, all path test cases with the same scene number as the failed test case and all fault-tolerant test cases with the same scene number and the same interface number are extracted according to the name of the failed test case to serve as reference test cases; if the failed test case is a path class test case, all logic class test cases and all path class test cases under the same scene number as the failed test case are extracted according to the name of the failed test case and are used as reference test cases, different priorities are distributed for each test case according to the degree of influencing the service function of the core service from high to low according to each test case, and the priorities are high priority, medium priority and low priority;
and performing a secondary regression test on the failed test cases after the repair and the reference test cases until all the test cases pass.
2. The method according to claim 1, wherein the high-priority test cases are test cases affecting core services, the medium-priority test cases are test cases affecting functional correctness, and the low-priority test cases are test cases not substantially affecting service functions or slightly affecting service development but not affecting service development.
3. The method of claim 1, wherein the second regression is performed by screening test cases with a high priority, the test cases including repaired failed test cases and selected reference test cases.
4. The interface regression testing method of claim 1 wherein low priority failed test cases are excluded from primary regression testing.
5. The interface regression testing method according to claim 1, wherein a tested interface with a defect is obtained, and a corresponding failed test case is obtained according to the defect of the tested interface.
6. An interface regression testing apparatus, comprising:
and (3) a setting module: acquiring at least one tested interface, setting different interface numbers for each tested interface, acquiring test points of all tested interfaces, dividing different test scenes according to the test points, setting different scene numbers for each test scene, writing at least one test case, and naming each test case according to the interface number of the tested interface to which each test case belongs, the scene number of the scene to which each test case belongs and the category of the test case;
the acquisition module is used for: acquiring failed test cases during primary regression testing, selecting and changing reference test cases which are affected after the failed test cases according to interface numbers, scene numbers and self categories in the names of the failed test cases, dividing the test cases into logic class test cases, fault-tolerant class test cases and path class test cases according to the self categories of the test cases, and extracting all path class test cases with the same scene number as the failed test cases and all logic class test cases with the same interface number as the failed test cases according to the names of the failed test cases if the failed test cases are logic class test cases; if the failed test case is a fault-tolerant test case, all path test cases with the same scene number as the failed test case and all fault-tolerant test cases with the same scene number and the same interface number are extracted according to the name of the failed test case to serve as reference test cases; if the failed test case is a path class test case, all logic class test cases and all path class test cases under the same scene number as the failed test case are extracted according to the name of the failed test case and are used as reference test cases, different priorities are distributed for each test case according to the degree of influencing the service function of the core service from high to low according to each test case, and the priorities are high priority, medium priority and low priority;
regression testing module: and performing a secondary regression test on the failed test cases after the repair and the reference test cases until all the test cases pass.
7. An electronic device comprising a memory and a processor, wherein the memory has stored therein a computer program, the processor being arranged to run the computer program to perform an interface regression testing method according to any of claims 1-5.
8. A readable storage medium, wherein a computer program is stored in the readable storage medium, the computer program comprising program code for controlling a process to perform a process, the process comprising an interface regression testing method according to any one of claims 1-5.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202310934835.3A CN116662210B (en) | 2023-07-28 | 2023-07-28 | Interface regression testing method, device and application |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202310934835.3A CN116662210B (en) | 2023-07-28 | 2023-07-28 | Interface regression testing method, device and application |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN116662210A CN116662210A (en) | 2023-08-29 |
| CN116662210B true CN116662210B (en) | 2023-09-29 |
Family
ID=87715643
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202310934835.3A Active CN116662210B (en) | 2023-07-28 | 2023-07-28 | Interface regression testing method, device and application |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN116662210B (en) |
Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN109344048A (en) * | 2018-08-17 | 2019-02-15 | 中国平安人寿保险股份有限公司 | A kind of test method, storage medium and server |
| CN110633222A (en) * | 2019-11-01 | 2019-12-31 | 中国银行股份有限公司 | Method and device for determining regression test case |
| CN115017040A (en) * | 2022-05-31 | 2022-09-06 | 苏州浪潮智能科技有限公司 | Test case screening method and system, electronic equipment and storage medium |
| CN115454851A (en) * | 2022-09-14 | 2022-12-09 | 海尔优家智能科技（北京）有限公司 | Interface regression testing method and device, storage medium and electronic device |
| CN115809203A (en) * | 2023-02-07 | 2023-03-17 | 杭州罗莱迪思科技股份有限公司 | Software test case dynamic nesting method, device and application thereof |
Family Cites Families (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US9720813B2 (en) * | 2015-08-13 | 2017-08-01 | Ca, Inc. | Method and apparatus for recommending regression tests |
| US10303587B2 (en) * | 2017-07-27 | 2019-05-28 | Hcl Technologies Limited | System and method for generating regression test suite |
-
2023
- 2023-07-28 CN CN202310934835.3A patent/CN116662210B/en active Active
Patent Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN109344048A (en) * | 2018-08-17 | 2019-02-15 | 中国平安人寿保险股份有限公司 | A kind of test method, storage medium and server |
| CN110633222A (en) * | 2019-11-01 | 2019-12-31 | 中国银行股份有限公司 | Method and device for determining regression test case |
| CN115017040A (en) * | 2022-05-31 | 2022-09-06 | 苏州浪潮智能科技有限公司 | Test case screening method and system, electronic equipment and storage medium |
| CN115454851A (en) * | 2022-09-14 | 2022-12-09 | 海尔优家智能科技（北京）有限公司 | Interface regression testing method and device, storage medium and electronic device |
| CN115809203A (en) * | 2023-02-07 | 2023-03-17 | 杭州罗莱迪思科技股份有限公司 | Software test case dynamic nesting method, device and application thereof |
Non-Patent Citations (3)
| Title |
|---|
| Backtracking search optimization algorithm with dual scatter search strategy for automated test case generation;Jingru Ren等;《Journal of King Saud University - Computer and Information Sciences》;全文 * |
| 基于函数调用路径的回归测试用例选择排序方法研究;郑锦勤;牟永敏;;计算机应用研究(第07期);全文 * |
| 基于场景模型的DDS架构一体化舰船任务系统测试;钱巨等;《软件学报》;第33卷(第5期);全文 * |
Also Published As
| Publication number | Publication date |
|---|---|
| CN116662210A (en) | 2023-08-29 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| CN115809203B (en) | Dynamic nesting method and device for software test cases and application of dynamic nesting method and device | |
| CN117033251B (en) | Regression testing method and device for multi-version system of mobile electronic equipment | |
| CN110569194A (en) | interface testing method and device, electronic equipment and storage medium | |
| CN111338869B (en) | Configuration parameter management method, device, equipment and storage medium | |
| CN113297060A (en) | Data testing method and device | |
| CN111767210A (en) | Policy testing method and device, computer equipment and storage medium | |
| CN110134598B (en) | Batch processing method, device and system | |
| CN1804648B (en) | Incremental generation of calibration factors for automated test equipment | |
| CN112699648B (en) | Data processing method and device | |
| CN116662210B (en) | Interface regression testing method, device and application | |
| CN115686535A (en) | Inspection method and device for Kubernets cluster and application | |
| CN112328287A (en) | Embedded equipment system updating method, device, equipment and storage medium | |
| CN112328288A (en) | Method, system, equipment and storage medium for updating server component | |
| CN117150999B (en) | Method, device, terminal and medium for recording ECO implementation information by using redundant circuit | |
| CN113485929B (en) | Data processing method, apparatus, device, storage medium, and program product | |
| CN116756044B (en) | RPC remote debugging method, device and application based on data link tracking | |
| CN117234949B (en) | Test data noise reduction method and device, storage medium and computer equipment | |
| CN112445761B (en) | File checking method and device and storage medium | |
| CN112559254B (en) | Backup file retaining method and device, electronic equipment and storage medium | |
| CN117130895A (en) | Interface testing method, device, electronic equipment and medium | |
| CN114443358A (en) | Rollback method and device based on hierarchical publication | |
| CN116401296A (en) | Engine offline data processing method and device and engine equipment | |
| CN114116483A (en) | Software version testing method and device, storage medium and processor | |
| CN118246886A (en) | Method, device, equipment and storage medium for managing semiconductor chip test information | |
| CN117725914A (en) | Method, device, equipment and medium for verifying correctness of business data report |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| PB01 | Publication | ||
| PB01 | Publication | ||
| SE01 | Entry into force of request for substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| GR01 | Patent grant | ||
| GR01 | Patent grant |