CN116660638B - Device, system and method for testing electronic device of mobile terminal - Google Patents

Device, system and method for testing electronic device of mobile terminal Download PDF

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Publication number
CN116660638B
CN116660638B CN202310038190.5A CN202310038190A CN116660638B CN 116660638 B CN116660638 B CN 116660638B CN 202310038190 A CN202310038190 A CN 202310038190A CN 116660638 B CN116660638 B CN 116660638B
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CN
China
Prior art keywords
electronic device
mobile terminal
control board
terminal electronic
carrier plate
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Active
Application number
CN202310038190.5A
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Chinese (zh)
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CN116660638A (en
Inventor
贾兴旺
李辰龙
张吉成
李正
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Honor Device Co Ltd
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Honor Device Co Ltd
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Publication of CN116660638A publication Critical patent/CN116660638A/en
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    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/003Environmental or reliability tests
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01MTESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M7/00Vibration-testing of structures; Shock-testing of structures
    • G01M7/08Shock-testing
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02General constructional details
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02General constructional details
    • G01R1/04Housings; Supporting members; Arrangements of terminals
    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y02TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
    • Y02EREDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
    • Y02E60/00Enabling technologies; Technologies with a potential or indirect contribution to GHG emissions mitigation
    • Y02E60/10Energy storage using batteries

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Environmental & Geological Engineering (AREA)
  • Telephone Function (AREA)

Abstract

The application relates to the technical field of testing, aims to solve the problems of high cost or poor test data effectiveness of some known electronic device testing schemes, and provides a mobile terminal electronic device testing device, a mobile terminal electronic device testing system and a mobile terminal electronic device testing method. The mobile terminal electronic device testing device comprises a shell, a carrier plate, a driving control board and a battery. The carrier plate is connected to the housing. The carrier plate is provided with a plurality of mounting positions for mounting the electronic devices. The drive control board is connected to the housing. The driving control board is electrically connected to the carrier board and is used for driving the electronic device installed at the installation position, so that the electronic device is in an operation state and relevant data of the electronic device in the operation state are collected. The battery is connected to the housing. The battery is used for supplying power to the drive control board and the carrier board. The application has the advantages of low test cost, high test result effectiveness and high test efficiency.

Description

Device, system and method for testing electronic device of mobile terminal
Technical Field
The application relates to the technical field of testing, in particular to a mobile terminal electronic device testing device, a mobile terminal electronic device testing system and a mobile terminal electronic device testing method.
Background
Mobile terminal products such as mobile phones, notebook computers, tablet computers, electronic watches, etc. generally have various electronic devices. Such as accelerometers, gyroscopes, pressure sensors, microphones, magnetometers, etc. based on MEMS technology. In order to avoid the problem of reliability of the electronic device from affecting user experience and even generating overall risk, when the electronic device is introduced into a mobile terminal product, the reliability test needs to be carried out on the mobile terminal product.
Some known test schemes test by using a mobile terminal product as a whole, wherein the test object is the mobile terminal product, and the mobile terminal product is easy to damage in the test, so that the test cost is high. Other known techniques employ specific fixture testing, however, these test methods are difficult to reflect the actual usage scenario of the electronic device, and the test data are less effective.
Disclosure of Invention
The application provides a mobile terminal electronic device testing device, a mobile terminal electronic device testing system and a mobile terminal electronic device testing method, which are used for solving the problems that some known electronic device testing schemes are high in cost or poor in test data effectiveness.
In a first aspect, an embodiment of the present application provides a mobile terminal electronic device testing apparatus, including a housing, a carrier board, a drive control board, and a battery. The carrier plate is connected to the shell; the carrier plate is provided with a plurality of mounting positions for mounting the electronic devices; the driving control board is connected to the shell; the driving control board is electrically connected with the carrier board and is used for driving the electronic device arranged at the installation position, so that the electronic device is in an operation state and relevant data of the electronic device in the operation state are collected; the battery is connected to the shell; the battery is used for supplying power to the drive control board and the carrier board.
The application method of the mobile terminal electronic device testing device in the embodiment of the application is that the electronic device arranged on the carrier board is driven by the driving control board, so that the electronic device is in an operation state; then, carrying out required tests on the testing device, such as drop tests, high-temperature/high-humidity scene tests, radiation tolerance tests and the like; in the test, the relevant data of the electronic device in the running state is collected and displayed by the drive control board or transmitted to the monitoring equipment connected with the other communication.
Likewise, the mobile terminal electronic device testing device can also be used for fault reproduction of the mobile terminal electronic device.
In the testing device provided by the embodiment of the application, the battery connected to the shell can simulate the weight and space occupation of the battery structure of the actual mobile terminal on one hand, and can be used as a power supply for supplying power to the operation of the electronic device and is consistent with the actual operation state of the electronic device in the mobile terminal on the other hand. In addition, the structure is self-powered by a battery arranged on the shell of the testing device, and a cable connected with an external power supply is not required to be additionally arranged.
In addition, the electronic device is arranged at the mounting position of the carrier plate, so that the situation that the electronic device is arranged on the mobile terminal main board in the mobile terminal can be simulated, and the effectiveness of the test result is further improved.
In one possible embodiment, the carrier plate is provided with M sets of mounting locations, each set comprising N mounting locations for mounting m×n electronic devices, where M is an integer greater than 1 and N is an integer greater than 1.
In the embodiment, the carrier plate can be provided with M×N electronic devices at a time, namely M×N electronic devices can be realized at a time, and the test efficiency is improved. For example, when m=8 and n=8, the test of 64 electronic devices can be performed at a time.
In one possible implementation, the mxn electronic devices are distributed in a matrix at different positions of the carrier plate.
In this embodiment, the electronic devices are respectively disposed at different positions of the carrier, so that the test efficiency is improved, and the situation that the electronic devices are mounted at different positions of the carrier can be tested at the same time, and a suggestion of the mounting positions of the electronic devices on the carrier can be given. For example, if the test results indicate that the electronic device located near the four corners of the carrier board performs best in various tests (such as drop tests, etc.), the position of the electronic device on the circuit board (such as a motherboard) is prioritized for the position near the four corners when designing the mobile terminal.
In one possible embodiment, the drive control board is provided with a micro control unit. The micro control unit is in communication connection with the M×N electronic devices through the IIC bus, and can independently control and monitor the operation of each electronic device.
In the embodiment, the micro control unit can independently control the operation of each electronic device through the IIC, and the control is convenient.
In one possible implementation, the carrier board is a printed circuit board, and is further provided with M IIC switches, where each set of mounting positions is configured with one IIC switch and is electrically connected to the corresponding IIC switch. The drive control board is also provided with a level conversion unit, the micro-control unit is in communication connection with M IIC switches through the level conversion unit, and the level conversion unit is in communication connection with the M IIC switches so as to realize IIC communication of the drive control board and each electronic device.
In this embodiment, each group of electronic devices is controlled by each IIC switch, so that communication between the drive control board and each electronic device can be facilitated.
In one possible embodiment, the drive control board and the carrier board are connected by a flexible circuit board, which is used for communication and power supply between the drive control board and the carrier board.
In this embodiment, the flexible circuit board is arranged to facilitate communication and power supply between the drive control board and the carrier board, and is beneficial to improving the degree of freedom of setting the relative positions of the drive control board and the carrier board.
In one possible embodiment, the drive control board is provided with a first connection socket and the carrier board is provided with a second connection socket. The level conversion unit is electrically connected to the first connecting seat, and the M IIC switches are respectively electrically connected to the second connecting seat; one end of the flexible circuit board is inserted into the first connecting seat, and the other end is inserted into the second connecting seat.
In this embodiment, the communication between the IIC switch and the level shifter unit is achieved through the connection base and the flexible circuit board.
In one possible embodiment, the housing includes a middle frame, a first cover plate, and a second cover plate. The middle frame comprises a frame plate and a surrounding wall, the surrounding wall surrounds the periphery of the frame plate, and the surrounding wall and the frame plate surround a first space and a second space which are positioned on two sides of the frame plate. The first cover plate covers the first space, and the second cover plate covers the second space.
In the embodiment, the structure of the shell accords with the structure of a general intelligent mobile terminal, and the validity of a test result is ensured.
In one possible embodiment, the frame plate is provided with a via hole, which communicates the first space and the second space. The drive control board is connected to the middle frame and located in the first space, and the carrier board is connected to the middle frame and located in the second space. The drive control board and the carrier plate are electrically connected through a flexible circuit board, the flexible circuit board penetrates through the through hole, one end of the flexible circuit board is connected to the drive control board, and the other end of the flexible circuit board is connected to the carrier plate.
In the embodiment, the through holes are formed, so that the flexible circuit board is arranged, and the length of the flexible circuit board is reduced.
In one possible embodiment, the battery is connected to the middle frame and located in the first space. The battery is electrically connected with the drive control board and is used for supplying power to the drive control board and supplying power to the electronic devices on the carrier board through the drive control board and the flexible circuit board.
In this embodiment, the battery can be for drive control panel and carrier plate power supply respectively, and conveniently controls the power supply to the carrier plate through drive control panel as required.
In one possible embodiment, the surface of the frame plate facing the side of the first space has adjacent first and second regions, and the drive control board is mounted to the first region; the second area is concave to form a battery compartment, and the battery is arranged in the battery compartment and is electrically connected with the drive control board at the junction of the first area and the second area.
In the embodiment, the driving control board and the battery are reasonably arranged on the same side of the frame plate, so that the driving control board and the battery are convenient to wire, and the structure of the common commercial intelligent terminal is more met.
Optionally, a plurality of flexible cushion blocks are arranged between the drive control board and the frame board.
The flexible cushion block is arranged to better protect the drive control board.
In one possible embodiment, a pressure plate is provided at the junction of the first region and the second region, the pressure plate being used to compress the connection between the battery and the drive control board.
In this embodiment, the pressing plate is advantageous in improving the connection reliability between the battery and the drive control board.
In one possible embodiment, the drive control board is provided with a first connecting edge and a second connecting edge which are opposite, the first connecting edge corresponds to the pressing plate and is fixed to the frame plate together with the pressing plate by a screw, and the second connecting edge is connected to the frame plate by a screw.
In this embodiment, the first connection edge and the second connection edge are respectively fixed, which is favorable for ensuring the connection stability of the drive control board, and the first connection edge and the pressing plate are fixed on the frame plate together, which is favorable for improving the reliability of the electric connection of the drive control board and the battery.
In one possible embodiment, the side of the first cover plate facing the first space is provided with protective foam, which is located in a region corresponding to the battery and/or the drive control board; and/or the number of the groups of groups,
And one side of the second cover plate, facing the second space, is provided with protective foam, and the protective foam is positioned in a region corresponding to the carrier plate.
In this embodiment, can improve the reliability of structure through the protection bubble cotton, reduce the structure and move in opposite directions collision damage risk.
In one possible embodiment, the drive control board is provided with a communication unit for communicating with an external device. The first cover plate is provided with a through hole at a position corresponding to the communication unit and used for exposing a signal receiving and transmitting part of the communication unit.
In this embodiment, remote monitoring or transmission of control commands via an external device is facilitated via the communication unit.
In one possible embodiment, the first cover plate and/or the second cover plate are/is provided with a weight-reducing groove, and the frame plate is provided with a weight-reducing hole.
In the embodiment, through reasonably arranging the weight reduction grooves or the weight reduction holes, the whole weight of the testing device can be adjusted to adapt to the mobile terminal to be tested, and the effectiveness of the testing result is improved.
In one possible embodiment, the corners of the perimeter wall are rounded and the wall thickness of the portions at the corners of the perimeter wall is greater than the wall thickness of the central portions of the sides of the perimeter wall.
In this embodiment, the enclosure wall is rounded and the corner wall thickness is large, facilitating the reduction of corner drop damage.
In one possible embodiment, the first cover plate is connected with the middle frame through a plurality of screws, the second cover plate is connected with the middle frame through a plurality of screws, and screw joints are filled with screw glue.
In the embodiment, the screw thread adhesive is arranged, so that the reliability of threaded connection can be improved, and the possibility that the screw thread looseness influences the test result in the test is reduced.
In one possible embodiment, the drive control board is provided with a communication unit for communicating with a monitoring device.
In this embodiment, the drive control board is provided with a control unit, facilitating communication with the monitoring device.
In one possible implementation, the communication unit is a Wi-Fi unit, and the Wi-Fi unit is configured to connect to a Wi-Fi hotspot of the monitoring device or implement a Wi-Fi communication connection with the monitoring device through a router.
In this embodiment, wi-Fi communication facilitates the formation of a communication network.
In one possible embodiment, the drive control board includes a micro control unit, a level conversion unit, a battery charge and discharge unit, a USB interface, a transfer interface, and a first connection base. The carrier plate is also provided with M IIC switches, and each group of installation positions is provided with one IIC switch; the carrier plate is also provided with a second connecting seat, and the M IIC switches are respectively and electrically connected to the second connecting seat. The first connecting seat and the second connecting seat are connected through a flexible circuit board. The battery is electrically connected with the battery charging and discharging unit, and the battery charging and discharging unit is electrically connected with the micro-control unit and is used for supplying power to the micro-control unit; the battery charging and discharging unit is electrically connected with the first connecting seat and supplies power to each electronic device through the flexible circuit board, the second connecting seat and the IIC switch; the battery charging and discharging unit is electrically connected with the level conversion unit and is used for supplying power to the level conversion unit. The USB interface is electrically connected with the battery charging and discharging unit and is used for charging the battery through the battery charging and discharging unit. The USB interface is connected to the micro control unit through the switching interface communication and used for burning test firmware to the micro control unit. The micro-control unit is electrically connected with the level conversion unit, and the level conversion unit is electrically connected with the first connecting seat and is in communication connection with each electronic device through the flexible circuit board, the second connecting seat and the M IIC switches. The micro control unit further comprises a communication unit which is used for being in communication connection with a monitoring device so as to transmit the running state of each electronic device to the monitoring device and/or receive control instructions from the monitoring device.
In the embodiment, reasonable power supply and communication structures are arranged, the structure is simple, the functions are perfect, cost saving is facilitated, and testing performance is guaranteed.
In one possible embodiment, the battery charging and discharging unit includes a charging and discharging chip, a first DC-DC converting unit, and a second DC-DC converting unit, and the first DC-DC converting unit and the second DC-DC converting unit are electrically connected to the charging and discharging chip, respectively. The first DC-DC conversion unit is electrically connected with the micro-control unit and is used for supplying power to the micro-control unit; the second DC-DC conversion unit is electrically connected to the first connecting seat and used for supplying power to each electronic device on the carrier plate through the flexible circuit board, and the second DC-DC conversion unit is electrically connected to the level conversion unit and used for supplying power to the level conversion unit; the micro control unit is electrically connected to the second DC-DC conversion unit and is used for controlling the output level of the power supply circuit for supplying power to each electronic device by the second DC-DC conversion unit.
In the embodiment, the power supply with different output voltages can be conveniently realized through the first DC-DC conversion unit and the second DC-DC conversion unit.
In one possible embodiment, the electronic device is a MEMS device mounted to a mobile terminal, and the mobile terminal electronic device testing apparatus is used to test the drop reliability of the MEMS device.
In this embodiment, the method can be applied to MEMS device testing.
In one possible embodiment, the electronic devices mounted to the carrier plate are spaced from the housing by a distance greater than the maximum displacement of the electronic devices that would occur if the mobile terminal electronic device testing apparatus were dropped with the side of the carrier plate mounted downward.
In this embodiment, the possibility of collision failure of the electronic device and the case under test can be reduced.
In one possible embodiment, the carrier plate is detachably connected to the housing and/or the electronic device is detachably connected to the carrier plate.
In this embodiment, carrier plate and electron device are detachable setting respectively, and convenient dismantlement is traded or is utilized once more, reduce cost.
In one possible embodiment, the mass and volume of the mobile terminal electronics testing device is the same as or close to the mass and volume of the mobile terminal to be tested.
In this embodiment, the mass and volume are the same or close to each other, which is advantageous in ensuring the validity of the test results.
In one possible embodiment, the electronic device is an ambient light sensor, a proximity light sensor, a barometric pressure sensor, a fingerprint sensor, a temperature sensor, an NFC device or a memory device.
The mobile terminal electronic device testing apparatus in this embodiment may be used to test other various types of electronic devices.
In a second aspect, an embodiment of the present application provides a mobile terminal electronic device testing system, which includes a monitoring device and the foregoing mobile terminal electronic device testing apparatus; the monitoring equipment is in communication connection with the mobile terminal electronic device testing device and is used for monitoring the running state of each electronic device and/or sending control instructions to the mobile terminal electronic device testing device so as to control the running of each electronic device.
The mobile terminal electronic device testing system in the embodiment adopts the mobile terminal electronic device testing device to communicate with the monitoring equipment, and has the effect of conveniently and remotely monitoring the electronic devices on the mobile terminal electronic device testing device or sending instructions to the mobile terminal electronic device testing device.
In one possible implementation, the communication connection between the monitoring device and the mobile terminal electronics testing apparatus is a Wi-Fi communication connection. The mobile terminal electronic device testing device is connected with the Wi-Fi hot spot of the monitoring equipment, or Wi-Fi communication is realized between the mobile terminal electronic device testing device and the monitoring equipment through the router.
In this embodiment, a communication network is conveniently formed by Wi-Fi communication.
In one possible implementation manner, the number of the monitoring devices is one or more, the number of the mobile terminal electronic device testing devices is one or more, and the communication connection between each monitoring device and each mobile terminal electronic device testing device forms a local area network.
In the embodiment, a plurality of monitoring devices and the mobile terminal electronic device testing device can form a more complex network, which is beneficial to improving the testing efficiency.
In a third aspect, an embodiment of the present application provides a method for testing an electronic device of a mobile terminal, based on the foregoing apparatus for testing an electronic device of a mobile terminal, where the method for testing an electronic device of a mobile terminal includes:
Mounting the electronic device to be tested on the mounting position of the carrier plate;
starting the testing device, driving the control board to drive the electronic device, and enabling the electronic device to be in an operation state;
And in the test operation, related data of the electronic device in an operating state is transmitted to the drive control board, and the drive control board processes the related data or transmits the related data to monitoring equipment in communication connection through the drive control board for analyzing the performance of the electronic device.
The mobile terminal electronic device testing method in the embodiment is based on the mobile terminal electronic device testing device, so that the mobile terminal electronic device testing device has the effect of high test result effectiveness.
In one possible embodiment, the electronic device is a MEMS device, the set test operation comprises a drop of the mobile terminal electronic device test apparatus, the drop comprises a face drop or an angular drop of the mobile terminal electronic device test apparatus, and the related data comprises a drop acceleration of the electronic device.
In the embodiment, the mobile terminal electronic device testing method can be used for performing drop reliability test on the MEMS device.
In one possible implementation manner, the method further comprises the step of performing self-reliability drop verification on the mobile terminal electronic device testing device;
The mobile terminal electronic device testing device performs self-reliability drop verification and comprises the following steps:
a) The method comprises the steps of observing the damage condition of a shell of the mobile terminal electronic device testing device by using the surface drop or corner drop mobile terminal electronic device testing device; after the falling mode and the falling times are set, if the damage of the shell is in the allowable range, the shell is verified to pass, otherwise, the shell is verified to not pass;
b) Carrying out surface falling in a mode that the carrier plate is parallel to the falling surface and the electronic device on the carrier plate is opposite to the falling surface, calculating the maximum relative displacement of opposite movement between the electronic device and the opposite side structure of the electronic device in the falling process, and if the maximum relative displacement is smaller than the initial distance between the electronic device and the opposite side structure of the electronic device, verifying to pass, otherwise, verifying to fail;
c) Carrying out surface falling in a mode that the carrier plate is parallel to the falling surface and the electronic device on the carrier plate faces the falling surface, calculating the maximum deflection of the electronic device in the falling process, and if the maximum deflection is smaller than a set deflection value, verifying passing or not verifying passing;
d) Carrying out surface falling in a mode that the driving control board is parallel to the falling surface and faces the falling surface, if no collision exists between a device on the driving control board and a contralateral structure of the driving control board, verifying to pass, otherwise, verifying to not pass;
e) Performing surface falling in a mode that the battery is parallel to the falling surface, if the deformation of the battery accords with a set value and the battery and the opposite side structure are not collided, verifying to pass, otherwise, verifying to fail;
f) And carrying out surface falling in a mode that the carrier plate is parallel to the falling surface and the electronic device on the carrier plate faces the falling surface, calculating a falling acceleration peak value of the electronic device in the falling process, and if the falling acceleration peak value is smaller than a set value, verifying to pass, otherwise, verifying to fail.
In the embodiment, the reliability of the mobile terminal electronic device testing device can be ensured through the self-reliability drop verification of the mobile terminal electronic device testing device, and the influence of the self-problem of the mobile terminal electronic device testing device on the electronic device testing result is reduced.
In one possible embodiment, the set test operation includes at least one of a temperature, moisture, and radiation resistant test of the electronic device in an operational state operating within the mobile terminal electronic device testing apparatus.
In this embodiment, the test method may be used in other electronic devices or other tests.
In one possible embodiment, the mobile terminal electronics test device is communicatively connected to a monitoring apparatus;
in the test, the test device is used as a server to circularly report related data to the monitoring equipment, and the monitoring equipment is used for implementing monitoring and/or analyzing the related data so as to judge the working state of the electronic device.
In the embodiment, the remote monitoring of the testing device is facilitated through the monitoring equipment.
In one possible implementation manner, the mobile terminal electronic device testing method further includes: the monitoring equipment is used as a client to send a command and data to the mobile terminal electronic device testing device, the testing device analyzes the received command and data, if the command is a writing operation, a relevant writing function is executed according to the command, and relevant writing parameters and writing states are returned; if the command is a read operation, then the relevant read function is executed according to the command and the relevant read parameters are returned.
In the embodiment, the control instruction is conveniently issued to the testing device through the monitoring equipment.
Drawings
In order to more clearly illustrate the technical solutions of the embodiments of the present application, the following description will briefly describe the drawings in the embodiments, it being understood that the following drawings only illustrate some embodiments of the present application and should not be considered as limiting the scope, and that other related drawings may be obtained according to these drawings without inventive effort for a person skilled in the art.
FIG. 1 is a three-dimensional view of a mobile terminal electronic device testing apparatus according to an embodiment of the present application;
FIG. 2 is another perspective view of the mobile terminal electronic device testing apparatus of FIG. 1;
FIG. 3 is an expanded view of the mobile terminal electronic device testing apparatus of FIG. 1;
FIG. 4 is another expanded view of the mobile terminal electronic device testing apparatus of FIG. 1;
FIG. 5 is a block diagram of a mobile terminal electronic device testing apparatus according to an embodiment of the present application;
Fig. 6 is a schematic structural diagram of a mobile terminal electronic device testing apparatus according to an embodiment of the present application after electronic devices are mounted on a carrier board;
Fig. 7 is a schematic structural diagram of a driving control board of the mobile terminal electronic device testing apparatus according to an embodiment of the present application;
FIG. 8 is a partial structural view of a mobile terminal electronic device testing apparatus according to an embodiment of the present application;
FIG. 9 is a plan view of the hidden portion structure of FIG. 8;
FIG. 10 is a three-dimensional view of a mobile terminal electronic device testing apparatus according to another embodiment of the present application;
FIG. 11 is another perspective view of the mobile terminal electronic device testing apparatus of FIG. 10;
FIG. 12 is a structural view of a middle frame of the mobile terminal electronic device testing apparatus of FIG. 10;
FIG. 13 is a schematic diagram of a mobile terminal electronic device testing system according to an embodiment of the present application;
FIG. 14 is a block diagram of a mobile terminal electronic device testing system according to an embodiment of the present application;
FIG. 15 is a block diagram of a mobile terminal electronic device testing system according to an embodiment of the present application;
FIG. 16 is another block diagram of a mobile terminal electronic device testing system according to an embodiment of the present application;
FIG. 17 is a schematic view of a bottom surface drop of a mobile terminal electronic device testing apparatus according to an embodiment of the present application;
FIG. 18 is a left side drop schematic view of a mobile terminal electronic device testing apparatus according to an embodiment of the present application;
FIG. 19 is a schematic view of a corner drop of a mobile terminal electronic device testing apparatus according to an embodiment of the present application;
FIG. 20 is another corner drop schematic view of a mobile terminal electronic device testing apparatus according to an embodiment of the present application;
FIG. 21 is a graph showing the results of an actual drop test of a mobile terminal electronic device testing apparatus according to an embodiment of the present application;
FIG. 22 is a cross-sectional view of a mobile terminal electronic device testing apparatus according to an embodiment of the present application;
FIG. 23 is a plan view (partially hidden) of a mobile terminal electronic device testing apparatus according to an embodiment of the present application;
FIG. 24 is a graph showing displacement of a portion of the electronic device and the second cover plate during a drop test;
FIG. 25 is a simulated view of deformation of the carrier, the electronic device and the second cover plate in a drop test;
FIG. 26 is a plan view (partially hidden) of a mobile terminal electronic device testing apparatus according to an embodiment of the present application;
FIG. 27 is a simulated view of deformation of the carrier plate and the electronic device during a drop test;
FIG. 28 is a table of displacement values for the electronic devices of FIG. 27;
FIG. 29 is a visual representation of the displacement value table of FIG. 28, with different values being represented by different colors;
FIG. 30 is a cross-sectional view of a mobile terminal electronic device testing apparatus according to an embodiment of the present application;
FIG. 31 is a cloud chart of deformation values of a battery when the front of the mobile terminal electronic device testing apparatus falls;
FIG. 32 is a cloud chart of deformation values of a battery when the back of a mobile terminal electronic device testing device falls;
FIG. 33 is a plan view (partially hidden) of a mobile terminal electronic device testing apparatus according to an embodiment of the present application;
FIG. 34 is a peak acceleration table for each of the electronic devices of FIG. 33;
FIG. 35 is a visual representation of the displacement value table of FIG. 34, with different values being represented by different colors;
FIG. 36 is a plot of test device drop acceleration profile, showing different drop accelerations by different colors;
FIG. 37 is a schematic diagram of a testing method according to an embodiment of the application;
FIG. 38 is a Wi-Fi protocol definition table;
FIG. 39 is an interface I of monitoring software of a monitoring device;
FIG. 40 is a second interface of the monitoring software of the monitoring device;
FIG. 41 is an interface III of monitoring software of a monitoring device;
FIG. 42 is an interface IV of monitoring software of a monitoring device;
Fig. 43 is an interface five of monitoring software of the monitoring device.
Description of main reference numerals:
Electronic device 310
MEMS device 310a
Test system 100
Monitoring device 120
Test device 110,110a
Router 130
Housing 11
Carrier plate 12
Drive control board 13
Battery 14
Middle frame 15
First cover plate 16
Second cover plate 17
Screws 18a,18b,18c,18d
Frame plate 19
Wall 20
Flexible circuit board 21
First connecting seat 22
Second connecting seat 23
Protective foam 24
IIC bus 25
IIC switch 26
Micro control unit 27
Level shift unit 28
First region 29
Second region 30
Battery compartment 31
Platen 32
Positive plate 33
Negative electrode sheet 34
Power supply pins 35a,35b
First connecting edge 36
Second connecting edge 37
Battery charging and discharging unit 38
USB interface 39
Interface 40
Charging and discharging chip 41
First DC-DC conversion unit 42
The second DC-DC conversion unit 43
Communication unit 44
Flexible cushion 45
Protective rubber 46
Four corner portions 47
Edge intermediate portion 48
Mounting position W1
First space Q1
Second space Q2
Weight reduction groove C1
Lightening hole K1
Via hole K2
Screw holes K31, K32
Through hole K4
Avoidance hole K5
Gap f1
Width direction Y1
Bottom surface P1
Left side surface P2
Drop surface P0
Detailed Description
The following description of the embodiments of the present application will be made clearly and completely with reference to the accompanying drawings, in which it is apparent that the embodiments described are only some embodiments of the present application, but not all embodiments.
It will be understood that when an element is referred to as being "fixed to" another element, it can be directly on the other element or intervening elements may also be present. When an element is referred to as being "connected" to another element, it can be directly connected to the other element or intervening elements may also be present. When an element is referred to as being "disposed on" another element, it can be directly on the other element or intervening elements may also be present. The terms "vertical," "horizontal," "left," "right," and the like are used herein for illustrative purposes only.
Unless defined otherwise, all technical and scientific terms used herein have the same meaning as commonly understood by one of ordinary skill in the art to which this application belongs. The terminology used herein in the description of the application is for the purpose of describing particular embodiments only and is not intended to be limiting of the application. The term "or/and" as used herein includes any and all combinations of one or more of the associated listed items.
Some embodiments of the application are described in detail. The following embodiments and features of the embodiments may be combined with each other without collision.
Electronic devices based on MEMS technology (hereinafter referred to as MEMS devices), such as accelerometers, gyroscopes, pressure sensors, microphones, magnetometers, etc., have been widely used in mobile terminal products such as various mobile phones, tablet computers, notebook computers, electronic watches, electronic bracelets, VR glasses, etc. Stability of the mechanical structure is a key performance parameter of MEMS devices, and the primary failure of MEMS devices is also mainly due to mechanical structural failure. In order to avoid the reliability problem of the MEMS device from affecting the user experience, the risk of machine withdrawal is generated. When the mobile terminal is introduced into the MEMS device, a plurality of reliability tests are required, and the mobile terminal can be formally put into use only when the test result reaches the standard.
Reliability testing introduced by MEMS devices generally involves:
(1) The reliability test of the MEMS device monomer is used for testing the self structural reliability of the MEMS device;
(2) And (3) complete machine drop test, namely testing drop reliability of the MEMS device assembled in the whole. For example, the reliability of MEMS devices is verified by simulating severe use scenes in daily life through a roller drop and directional drop test machine.
In addition, in the reliability test process of the whole machine, when the MEMS device in the whole machine fails, the equivalent reliability test is required to be repeated in a large batch to reproduce the failure of the MEMS device, so that the risk of mass production is avoided.
For the whole machine drop test, if a mobile terminal whole machine is adopted, the whole machine is seriously damaged after the test is finished, and the mobile terminal whole machine cannot be normally used, so that the test cost is extremely high.
Some test schemes are to load MEMS devices by a special test device for complete machine drop test. However, experiments show that the test results of some known test devices have great difference from the test results obtained by adopting a real mobile terminal, so that certain problems exist in the effectiveness of the test results of the known test devices, and the test results are difficult to accurately evaluate the reliability of the whole machine of the MEMS device, so that the test results have lower value and are difficult to be used for guiding the arrangement of the MEMS device.
That is, the known technology has a problem that it is difficult to combine the test cost and the validity of the test result.
Based on this, this embodiment provides a new mobile terminal electronic device testing apparatus, a mobile terminal electronic device testing system, and a mobile terminal electronic device testing method, which have the advantages of low testing cost and high validity of testing results, and will be described in the following exemplary embodiments.
Fig. 1 to 9 show a mobile terminal electronic device testing apparatus 110 (hereinafter referred to simply as a testing apparatus 110) of the present embodiment.
Fig. 1 and 2 are three-dimensional views of a test device 110 from different perspectives, respectively. Fig. 3 and 4 are two expanded views of the test device 110, respectively.
Referring to fig. 1 and 2, the present embodiment provides a testing apparatus 110, where an electronic device 310 for testing is a MEMS device 310a, and a mobile terminal to which the MEMS device 310a is applied is a mobile phone. As shown, the test device 110 has the same or similar physical dimensions as a cell phone.
Referring to fig. 3,4 and 5 in combination, the test device 110 provided in this embodiment includes a housing 11, a carrier plate 12, a drive control board 13 and a battery 14. The carrier plate 12, the drive control board 13, and the battery 14 are mounted to the housing 11, respectively. The battery 14 may be a lithium battery or other type of battery.
The carrier 12 has a plurality of mounting locations W1 for mounting the electronic devices 310, and the electronic devices 310 are mounted on the mounting locations W1 in use. The driving control board 13 is electrically connected to the carrier board 12, and is used for driving the electronic device 310 installed at the installation position W1, so that the electronic device 310 is in an operation state and collecting relevant data of the electronic device 310 in the operation state. The battery 14 is used to power the drive control board 13 and the carrier plate 12.
The use method of the mobile terminal electronic device testing apparatus 110 in this embodiment is that the electronic device 310 mounted on the carrier plate 12 is driven by the driving control board 13, so that the electronic device 310 is in an operation state; the test device 110 is then subjected to a desired test, such as a drop reliability test; during testing, the relevant data of the electronic device 310 in the running state is collected and displayed by the drive control board 13 or transmitted to a monitoring device (such as a computer or a mobile phone loaded with monitoring software). Optionally, the monitoring device may also send control instructions to the test apparatus 110 to control the electronics 310 to set the desired operation.
The test device 110 is adopted to replace an actual mobile terminal product (such as a mobile phone) with higher price for testing, so that the cost can be remarkably reduced. Meanwhile, in the testing device 110, the battery 14 connected to the housing 11 can simulate the weight and space occupation of the battery structure of an actual mobile terminal product, and can also be used as a power supply for supplying power to the operation of the electronic device 310, so that the electronic device 310 can be tested in an electrified manner, and the battery is consistent with the actual use situation of the electronic device 310 in the mobile terminal, thereby ensuring the validity of data. Some of the known testing techniques fail to operate the MEMS device 310a in a live state during the testing process, and the device function needs to be verified again in a live state after the testing process is completed. The test cannot reproduce the live working use scene in daily life, and the validity of the test data is weak.
In addition, the testing device 110 is powered by the built-in battery 14, and a cable connected with an external power supply is not required to be additionally arranged, so that the testing result is not affected.
In addition, the electronic device 310 is mounted on the mounting position W1 of the carrier 12, so that the situation that the electronic device 310 is mounted on the motherboard of the mobile terminal in the mobile terminal can be simulated, and the validity of the test result is ensured. For example, the MEMS device 310a is mounted on the motherboard of the mobile terminal in such a manner that the pins of the MEMS device 310a are soldered to pads on the motherboard, and the pads are also provided on the carrier board 12 of the test apparatus 110 for soldering the MEMS device 310a to mechanically fix the MEMS device 310a and to supply power to the MEMS device 310 a.
The structure of the housing 11 in the present embodiment may be provided as needed, for example, as illustrated, and the housing 11 includes a center 15, a first cover 16, and a second cover 17. The first cover plate 16 is connected with the middle frame 15 through a plurality of screws 18a, and the second cover plate 17 is connected with the middle frame 15 through a plurality of screws 18 b. The middle frame 15 includes a frame plate 19 and a surrounding wall 20, the surrounding wall 20 surrounds the periphery of the frame plate 19, the surrounding wall 20 and the frame plate 19 surround a first space Q1 and a second space Q2 located at two sides of the frame plate 19, the first cover plate 16 covers the first space Q1, and the second cover plate 17 covers the second space Q2. The structure accords with the basic structure of at least part of mobile phones, and is beneficial to simulating actual mobile phones. The first cover plate 16 and the second cover plate 17 are detachable to facilitate opening of the first space Q1 and the second space Q2. The housing 11 may be made of a metal material (e.g., stainless steel, aluminum alloy, etc.) so as to have high structural strength, which is advantageous for performing a plurality of tests such as drop tests without damage.
In this embodiment, optionally, the first cover plate 16 and/or the second cover plate 17 are provided with a weight-reducing slot C1, and the frame plate 19 is provided with a weight-reducing hole K1, so that the overall weight of the testing device 110 can be adjusted to be equivalent to the weight of an actual mobile terminal (such as a mobile phone) through the appropriate weight-reducing slot C1 and the weight-reducing hole K1, and the degree of coincidence between the testing result and the testing result of the actual mobile terminal is improved.
The arrangement positions of the carrier plate 12, the drive control board 13, and the battery 14 on the housing 11 may be set as desired, for example, the drive control board 13 and the battery 14 are connected to the center 15 and located in the first space Q1, respectively, and the battery 14 is electrically connected to the drive control board 13 for supplying power to the drive control board 13. The carrier plate 12 is connected to the middle frame 15 and located in the second space Q2, and the drive control board 13 and the carrier plate 12 may be electrically connected through a flexible circuit board 21 (Flexible Printed Circuit, FPC), so as to implement communication between the drive control board 13 and the carrier plate 12, and facilitate the battery 14 to supply power to the carrier plate 12 through the drive control board 13. Optionally, the frame plate 19 is provided with a via hole K2, the via hole K2 is communicated with the first space Q1 and the second space Q2, the flexible circuit board 21 passes through the via hole K2, one end of the flexible circuit board extends into the first space Q1 to be connected with the drive control board 13, and the other end of the flexible circuit board extends into the second space Q2 to be connected with the carrier plate 12. Optionally, the drive control board 13 is provided with a first connecting seat 22, the carrier board 12 is provided with a second connecting seat 23, the first connecting seat 22 and the second connecting seat 23 are all FPC seats adapted to the flexible circuit board 21, one end of the flexible circuit board 21 is plugged into the first connecting seat 22, and the other end of the flexible circuit board is plugged into the second connecting seat 23, so that communication and power supply of the drive circuit board and the carrier board 12 are realized.
Referring again to fig. 3 and 4, optionally, a protective foam 24 is disposed on a side of the second cover 17 facing the second space Q2, and the protective foam 24 includes at least an area corresponding to the carrier plate 12. The side of the first cover plate 16 facing the first space Q1 is provided with a protective foam 24, the protective foam 24 being located in a region corresponding to the battery 14 and/or the drive control board 13, only the protective foam 24 corresponding to the region of the battery 14 being shown in fig. 4. By properly arranging the protective foam 24, the structures of the carrier plate 12, the drive control board 13, the battery 14 and the like can be protected, and the possibility of damage in the test (particularly drop test) can be reduced. For other components of the test device 110, such as the flexible circuit board 21, a protective foam protection may also be provided.
The number of electronic devices 310 may be one or more.
In this embodiment, the carrier 12 is provided with M groups of mounting positions W1, each group of mounting positions W1 includes N mounting positions W1, and m×n electronic devices 310 can be mounted, where M is an integer greater than 1, and N is an integer greater than 1. In this embodiment, the carrier 12 can mount the mxn electronic devices 310 at a time, so that the test of the mxn electronic devices 310 can be implemented at most once, and the test efficiency is improved. For example, in fig. 6, m=8 and n=8, and a total of 64 electronic devices 310 are arranged in a matrix at different positions of the carrier board 12, so that the test of 64 electronic devices 310 can be achieved at a time. Of course, it is also permissible to perform the test without mounting the electronic devices 310 at the partial mounting site W1, i.e., test less than 64 electronic devices 310 at a time. The electronics 310 may be integrated on the carrier plate 12 in a removable manner (e.g., soldering) for connection to circuitry on the carrier plate 12. For the electronic device 310 with normal functions after the test, the electronic device can be detached from the carrier plate 12 for reuse, so that the test cost is reduced. Also, the carrier 12 is detachably connected to the housing 11, so that different carriers 12 (e.g. carriers 12 with different sizes) can be replaced to simulate the electronic devices 310 on different motherboards of different mobile terminals. In addition, the electronic devices 310 are respectively arranged at different positions of the carrier plate 12, so that the performance of mounting the electronic devices 310 at different positions of the carrier plate 12 can be tested simultaneously while the testing efficiency is improved, and the suggestion of selecting the design of the mounting positions of the electronic devices 310 on the carrier plate 12 can be given. For example, if the test results indicate that the electronic device 310 located near the four corners of the carrier plate 12 performs best in combination in various tests (e.g., drop tests, etc.), the placement of the electronic device 310 on a circuit board (e.g., motherboard) prioritizes the locations near the four corners in the design of the mobile terminal. Alternatively, the material, size and connection structure of the carrier 12 may be referred to as a circuit board (e.g. motherboard) design of the actual electronic device 310 on the mobile terminal. For example, when the electronic device 310 is a MEMS device 310a mounted on a mobile phone motherboard, the mechanical structure of the corresponding carrier 12 may be modeled as a motherboard design, and is made of a printed circuit board identical to the motherboard material, and the m×n mounting locations W1 include all possible design positions of the MEMS device 310a, so that a test result of mounting the MEMS device 310a at each possible design position can be obtained in one test, and the test result can be used to guide the design position selection of the MEMS device 310 a. Of course, the specific circuit of the carrier plate 12 can be designed according to the operation requirement of the testing device 110, which has a slight influence on the mechanical performance of the MEMS device 310a and a small influence on the testing result.
In this embodiment, the mxn electronic devices 310 on the carrier board 12 can communicate with the drive control board 13 through the IIC bus 25 (Inter-INTEGRATED CIRCUIT BUS, serial communication bus). Through IIC communication, individual control of m×n MEMS devices 310a having the same address can be achieved using one IIC bus 25.
For example, as shown in fig. 5, the carrier board 12 is further provided with M IIC switches 26, and each set of mounting positions W1 is configured with one IIC switch 26 and is electrically connected to the corresponding IIC switch 26, where the IIC switch 26 functions to gate and close IIC communications. The M IIC switches 26 are electrically connected to the second connection base 23, respectively. The devices of the carrier plate 12 may be arranged as desired, for example, in one embodiment shown in fig. 6, the middle region of the carrier plate 12 is provided with 64 MEMS devices 310a distributed in a matrix; 4 IIC switches 26 (8 IIC switches 26 in total) are respectively arranged on two sides of the carrier plate 12, and each IIC switch 26 is respectively and electrically connected with 8 MEMS devices 310a nearby; the peripheral area of the carrier plate 12 is provided with a plurality of screw holes K31, which is convenient for the fixed installation of the carrier plate 12 on the shell 11. The connection of the carrier plate 12 to the housing 11 may emulate the connection of the MEMS device 310a to the motherboard in an actual mobile terminal, for example, the placement and number of screw holes K31 of the carrier plate 12 may be the same, substantially the same or equivalent to the screw holes on the motherboard.
Referring again to fig. 5, the drive control board 13 is provided with a micro control unit 27 (Microcontroller Unit, MCU), and the micro control unit 27 is connected to the mxn electronic devices 310 through IIC communication and is capable of individually controlling and monitoring the operation of each electronic device 310. Optionally, the drive control board 13 is further provided with a level conversion unit 28, and the micro control unit 27 is communicatively connected to the level conversion unit 28, and the level conversion unit 28 is electrically connected to the first connection base 22, and is communicatively connected to the M IIC switches 26 through the flexible circuit board 21, so as to implement IIC communication between the drive control board 13 and each electronic device 310. Referring to fig. 7, the drive control board 13 in this embodiment may be an ESP32 series chip.
Referring to fig. 8 and 9, in the present embodiment, alternatively, the surface of the frame plate 19 on the side facing the first space Q1 has adjacent first and second regions 29 and 30, and the drive control plate 13 is mounted to the first region 29; the second region 30 is concave inward to form a battery compartment 31. Referring to fig. 7 and 4 in combination, the battery 14 is mounted to the battery compartment 31 and is electrically connected to the drive control board 13 at the interface of the first region 29 and the second region 30. Optionally, a pressing plate 32 is disposed at the junction between the first area 29 and the second area 30, where the pressing plate 32 is used to press the connection between the battery 14 and the drive control board 13, for example, press the positive plate 33 and the negative plate 34 of the battery 14 at the two power pins 35a,35b of the drive control board 13, so as to achieve reliable electrical connection between the battery 14 and the drive control board 13. The battery 14 and the drive control Board 13 may be connected by a Board To Board (BTB) connector, and the platen 32 may be a BTB connector platen. Alternatively, the drive control plate 13 is provided with opposite first and second connecting edges 36 and 37, the first connecting edge 36 corresponding to the pressure plate 32 and being fixed to the frame plate 19 together with the pressure plate 32 by the screw 18d, the second connecting edge 37 being screw-connected to the frame plate 19. The drive control board 13 is provided with screw holes K32 at the first connecting side 36 and the second connecting side 37, respectively, for fixed mounting of the drive control board 13.
In this embodiment, the via hole K2 on the frame plate 19 is located in the first area 29, and the through hole K4 is formed in the position of the drive control board 13 corresponding to the via hole K2, so as to allow the flexible circuit board 21 located outside the drive control board 13 to pass through the drive control board 13 to enter the second space Q2 through the via hole K2.
Referring again to fig. 5, in this embodiment, the drive control board 13 is provided with circuits and devices for charging and discharging and firmware burning, such as shown in fig. 5, in addition to the foregoing micro control unit 27, level conversion unit 28 and first connection base 22, and the drive control board 13 is further provided with a battery charging and discharging unit 38, a USB interface 39 and a transfer interface 40.
Wherein, the battery 14 is electrically connected with the battery charging and discharging unit 38, and the battery charging and discharging unit 38 is electrically connected with the micro-control unit 27 for supplying power to the micro-control unit 27. The battery charge and discharge unit 38 is electrically connected to the first connection pad 22 and supplies power to the respective electronic devices 310 through the flexible circuit board 21, the second connection pad 23, and the IIC switch 26. The battery charge and discharge unit 38 is electrically connected to the level shift unit 28 for supplying power to the level shift unit 28. In this way, the battery 14 can supply power to the micro control unit 27 and the level shift unit 28 of the drive control board 13 and the electronics 310 of the carrier board 12, respectively.
To adapt to the difference of the input voltages required by different devices, the battery charging and discharging unit 38 includes a charging and discharging chip 41, a first DC-DC converting unit 42, and a second DC-DC converting unit 43, where the first DC-DC converting unit 42 and the second DC-DC converting unit 43 are electrically connected to the charging and discharging chip 41, respectively. The first DC-DC conversion unit 42 is electrically connected to the micro control unit 27 for supplying power to the micro control unit 27; the second DC-DC conversion unit 43 is electrically connected to the first connection base 22 for supplying power to the electronic devices 310 on the carrier board 12 through the flexible circuit board 21, and the second DC-DC conversion unit 43 is electrically connected to the level conversion unit 28 for supplying power to the level conversion unit 28; the micro control unit 27 is electrically connected to the second DC-DC conversion unit 43 for controlling the output level of the power supply circuit for supplying power to the respective electronic devices 310 by the second DC-DC conversion unit 43. For example, in some embodiments, the output voltage of the first DC-DC conversion unit 42 to the micro control unit 27 is 3.3V, the output voltage of the second DC-DC conversion unit 43 to the carrier plate 12 is 1.8V, and the output voltage of the second DC-DC conversion unit 43 to the level conversion unit 28 is 3.3V.
The USB interface 39 may be a Type-C interface, and the USB interface 39 is electrically connected to the battery charging/discharging unit 38, and is configured to charge the battery 14 through the battery charging/discharging unit 38, where the charging voltage may be 5V. Meanwhile, the USB interface 39 is communicatively connected to the micro-control unit 27 through a transfer interface 40 (e.g., a USB-to-serial interface) for burning test firmware into the micro-control unit 27. The test firmware is used to define and control the operation of the electronic device 310 by the micro control unit 27.
In this embodiment, the drive control board 13 is provided with a communication unit 44 (such as a Wi-Fi communication unit) for communicating the testing device 110 with an external device (such as a monitoring device like a mobile phone, a computer, etc.), so as to transmit the operation status of each electronic device 310 to the monitoring device and/or receive a control command from the monitoring device. The first cover 16 is provided with a avoiding hole K5 corresponding to the position of the communication unit 44, so as to expose a signal transceiver portion (such as an antenna portion) of the communication unit 44, so as to reduce shielding of communication signals. Alternatively, the micro control unit 27 is a chip provided with the communication unit 44, such as an EPS32 chip.
Referring to fig. 8 in combination, in this embodiment, optionally, a plurality of flexible pads 45, such as rubber pads, are interposed between the drive control board 13 and the frame plate 19. The flexible cushion blocks 45 can better support and protect the driving control board 13, reduce the displacement and deformation of the driving control board 13 in the drop test, and ensure the use safety of the driving control board 13. Alternatively, the battery compartment 31 is recessed to form a gap f1 of about 1mm with the battery 14, so that a certain deformation space is provided for the battery 14, and the reliability of the battery 14 is improved.
Fig. 10-12 show another testing device 110a of the present embodiment, which is modified from the testing device 110 described above.
Referring to fig. 10 and 11, the wall thickness of the portion 47 at the four corners of the peripheral wall 20 of the intermediate frame 15 of the test device 110a is increased relative to the test device 110 by a greater amount than the wall thickness of the intermediate portion 48 at each side of the peripheral wall 20, so that the damage to the four corners of the test device 110a can be delayed when the corners are dropped. In addition, at four corners, the screws 18a,18b between the first cover plate 16/second cover plate 17 and the middle frame 15 are respectively moved inward in the width direction Y1 of the testing device 110a, so that drop damage at the screw connection can be reduced. Optionally, each screw is provided with an elastic washer, and screw joints are filled with screw threads, so that the possibility of loosening the screws in the test is reduced.
Referring to fig. 12, optionally, a protective rubber 46 is further provided between the first cover plate 16/the second cover plate 17 and the middle frame 15, so as to improve the connection tightness.
Fig. 13 to 16 show a mobile terminal electronic device testing system 100 provided in this embodiment.
Referring to fig. 13 and 14, the present embodiment provides a mobile terminal electronic device testing system 100 (hereinafter referred to as testing system 100) including a monitoring device 120 and a testing apparatus 110, where the monitoring device 120 is communicatively connected to the testing apparatus 110. The communication connection may be a wireless communication connection (e.g., wi-Fi communication connection). The electronic device 310 may be the MEMS device 310a described above, and the test performed may be a complete machine drop test.
The test device 110 has a communication function so that it can communicate data with the monitoring apparatus 120. During testing, the electronic device 310 to be tested is mounted on the mounting position W1. During testing, data regarding the electronic device 310 may be transmitted to the monitoring device 120.
The monitoring device 120 may be a computer, a cell phone or other electronic device having data processing and communication functions. The monitoring device 120 is configured to monitor an operation state of each electronic device 310, for example, in a test, the testing apparatus 110 reports relevant operation data (such as a falling acceleration) of the electronic device 310 to the monitoring device 120 in real time through Wi-Fi, the monitoring device 120 receives the relevant operation data, and the relevant operation data can be processed through monitoring software installed on the monitoring device 120 and displayed on a display screen of the monitoring device 120, and a tester can also remotely view the operation condition of the electronic device 310 on the monitoring device 120 in real time. The monitoring device 120 may also have a function of sending control instructions to the test apparatus 110 to control the operation of the respective electronic devices 310, if necessary. For example, a switching instruction of the control electronics 310 is input through monitoring software installed on the monitoring device 120 to control the operation of the electronics 310.
In some embodiments, both the monitoring device 120 and the testing apparatus 110 may be one. In other embodiments, the monitoring device 120 may be multiple, and the testing apparatus 110 may be multiple. Each monitoring device 120 and each test apparatus 110 are connected to the same Wi-Fi to form a local area network. In the network, one monitoring device 120 may monitor each electronic device 310 on a plurality of test apparatuses 110, or the operating states of the same test apparatus 110 may be shared among a plurality of monitoring devices 120, and any one test apparatus 110 and any one monitoring device 120 may be connected to each other. The topology network has extremely high development potential and can greatly improve the test efficiency.
Referring to fig. 15, in one embodiment, the testing apparatus 110 connects to the Wi-Fi hotspot of the monitoring device 120 through its communication unit 44, enabling real-time communication of both. In the communication network, the test device 110 serves as a TCP (Transmission Control Protocol ) server, and the monitoring apparatus 120 serves as a TCP client.
As also shown in fig. 16, in another embodiment, the test system 100 further includes a router 130 with Wi-Fi functionality, and the test apparatus 110 and the monitoring device 120 are respectively connected to Wi-Fi of the router 130, thereby forming a communication network. In the communication network, the test device 110 acts as a TCP server and the monitoring apparatus 120 acts as a TCP client.
In other embodiments, the testing device 110 and the monitoring device 120 may also be connected by other wireless communication methods, such as bluetooth connection, etc., which is not limited herein.
Fig. 17-36 show some simulation and resulting display diagrams of test apparatus 110 and test system 100 during testing in an embodiment of the application.
The present embodiment provides a method for testing electronic devices of a mobile terminal (hereinafter referred to as testing method), which is based on the foregoing testing device 110, and the testing method includes:
mounting the electronic device 310 to be tested on the mounting position W1 of the carrier plate 12;
starting the testing device 110, and driving the control board 13 to drive the electronic device 310 so that the electronic device 310 is in an operation state;
A set test operation (e.g., a drop test) is performed on the test apparatus 110, and in the test operation, data about the electronic device 310 in an operating state is transmitted to the drive control board 13, processed by the drive control board 13 or transmitted to the monitoring device 120 through the drive control board 13, for analyzing the performance of the electronic device 310.
Alternatively, the drop test includes a surface drop or corner drop of the test device 110, and the associated data includes a drop acceleration of the electronic device 310.
The surface drop refers to a drop mode in which the test device 110 after the electronic device 310 is mounted falls on the horizontal drop surface P0 from a set height (e.g., 1 m) in a downward posture of one of six surfaces, and fig. 17 and 18 show a bottom surface P1 drop mode and a left side surface P2 drop mode of the test device 110, and other surface drop modes and the like.
The corner drop refers to a drop mode in which the test device 110 after the electronic device 310 is mounted is dropped from a set height (e.g., 1 m) in a posture in which one of four corners is downward on a horizontal drop plane P0, and fig. 19 and 20 show a mode in which two different corners of the test device 110 are dropped.
In this embodiment, before performing the formal drop test, the self-drop reliability verification is further performed on the test device 110.
The test device 110 performs a self-reliability fall verification comprising one, several or all of the following steps a) -f):
a) A surface drop or corner drop test device 110 for observing damage condition of the housing 11 of the test device 110; after the falling mode and the falling times are set, if the damage of the shell 11 is in the allowable range, the verification is passed, otherwise, the verification is not passed;
In an actual drop test performed on the test device 110, as shown in FIG. 21, after 300 drops, some of the screws 18a/18b are torqueless and are loosened; after falling for 1500 times, the corners of the shell 11 are recessed; after dropping for 1500 times, the screw 18a/18b is not loosened after dropping for 1500 times after introducing the screw cement at the screw connection. Wherein each drop comprises a 1m directional drop of six faces and four corners of the test device 110.
In the same drop test of the test device 110a, the four corners of the housing 11 are less damaged, and the screw is not loosened.
B) Referring to fig. 22, the surface falling is performed in such a way that the carrier plate 12 is parallel to the falling surface P0 and the electronic device 310 on the carrier plate 12 faces away from the falling surface P0, in this embodiment, the surface falling of the first cover plate 16 facing the falling surface P0, the maximum relative displacement of the opposite side structure of the electronic device 310 and the opposite side structure of the electronic device 310 in the falling process is calculated, if the maximum relative displacement is smaller than the initial distance L1 between the electronic device 310 and the opposite side structure of the electronic device 310, the verification is passed, otherwise the verification is not passed; in this embodiment, the maximum relative displacement between the top surface of the carrier plate 12 protruding from the MEMS device 310a on the carrier plate 12 and the first cover plate 16 in the drop test is compared with the initial distance L1 between the MEMS device 310a and the first cover plate 16. If the maximum relative displacement is less than the initial spacing L1, it indicates that there is no risk of the MEMS device 310a striking the first cover plate 16 during a drop.
Referring to fig. 22 and 23, for the mounting manner in which the carrier plate 12 is fixed to the frame plate 19 with a round screw 18c at the outer periphery, the displacement of the MEMS device 310a at the intermediate position is generally maximized.
The initial distance L1 is 3.48mm. Simulating the testing device 110, selecting four middle MEMS devices 310a (shown as M44, M45, M54 and M55 in FIG. 23), and respectively obtaining relative displacement graphs of the four MEMS devices 310a and the opposite-side first cover plate 16, shown in FIG. 24, wherein the displacement graphs of the four MEMS devices 310a are respectively marked as M44, M45, M54 and M55; the displacement curves of the corresponding first cover plates 16 are labeled P44, P45, P54, P55. Referring to fig. 25, the practical simulation also shows that, during the falling process, both the carrier plate 12 and the first cover plate 16 are bent and deformed, but the MEMS device 310a does not contact the opposite first cover plate 16, which verifies that the testing device 110 itself has higher falling reliability.
In this embodiment, the dropping step b) is used as the simulation of the possibility of the MEMS device 310a of the testing device 110 and the shell collision, so that the reliability of the testing device 110 itself can be well determined, the possibility of the collision damage between the MEMS device 310a and the first cover plate 16 in the test can be eliminated, and the reliability of the test result is further ensured.
C) Referring to fig. 26 and 27, the surface falling is performed in a manner that the carrier plate 12 is parallel to the falling surface P0 and the electronic device 310 on the carrier plate 12 faces the falling surface P0, in this embodiment, the surface falling of the second cover plate 17 faces the falling surface, the maximum deflection of the electronic device 310 in the falling process, that is, the maximum displacement of the electronic device 310 under the driving of the deformation of the carrier plate 12 is calculated, if the maximum deflection is smaller than the set deflection value, the verification is passed, otherwise, the verification is not passed; as shown in fig. 26, 64 MEMS devices 310a on the testing device 110, the testing device 110 itself falls the reliability verification test to see fig. 27, the peak of the falling displacement is as shown in fig. 28 and 29, the maximum deflection (the maximum displacement in the thickness direction) of the electronic device 310 presents a nearly centrosymmetric distribution; the maximum deflection of the middle part is 1.72906, the maximum value meets the requirements, the edge is constrained by screw connection, and the maximum displacement is about 1/3 of the middle part.
D) Referring to fig. 30, the surface falling is performed in such a way that the driving control board 13 is parallel to the falling surface P0 and the driving control board 13 faces the falling surface P0, in this embodiment, the surface of the first cover board 16 facing the falling surface P0 falls, if no collision exists between the device on the driving control board 13 and the opposite side structure of the driving control board 13, the verification is passed, otherwise the verification is not passed;
Through simulation, referring to fig. 30, the driving control board 13 and the opposite side first cover board 16 have no risk of collision damage, and especially when the protection foam protection is arranged between the shielding cover of the driving control board 13 and the first cover board 16, the driving control board 13 can be kept in normal use in the testing process, and no risk of collision damage is caused.
E) Referring to fig. 31 and 32, the surface falling is performed in such a manner that the battery 14 is parallel to the falling surface P0 (including the surface falling of the first cover plate 16 facing the falling surface P0 and the surface falling of the second cover plate 17 facing the falling surface P0), if the deformation amount of the battery 14 meets the set value and the battery 14 and the opposite side structure have no risk of collision failure, the verification is passed, otherwise the verification is not passed;
Through simulation, as shown in fig. 31 and 32, the deformation of the battery 14 in position is less than 1mm in the case that the first cover plate 16 of the testing device 110 falls off (front falling off) or the second cover plate 17 falls off (back falling off), and no impact failure risk exists.
F) Referring to fig. 33-36, the surface falling is performed in such a way that the carrier plate 12 is parallel to the falling surface P0 and the electronic device 310 on the carrier plate 12 faces the falling surface P0, that is, the surface falling of the second cover plate 17 faces the falling surface P0, a falling acceleration peak value of the electronic device 310 in the falling process is calculated, if the falling acceleration peak value is smaller than a set value, the verification is passed, otherwise, the verification is not passed.
Referring to fig. 33-36, in verification, 64 MEMS devices 310a on carrier plate 12 exhibit a high center, low periphery effect in terms of drop acceleration peak. The middle part has low rigidity, the peripheral rigidity is high, and the acceleration frequency of the middle part is lower than that of the peripheral part; therefore, after the peak value is converted into the peak value within 0.1ms under the same time domain amplitude, the middle acceleration peak value is higher than four weeks. Meets the set value of the severe test of the peak acceleration of the whole machine of 15000g at the highest.
After the test device 110 passes the verification of the above steps, the test device 110 is considered to have a good drop reliability, and can be preferably used for the formal power-on state drop test of the MEMS device 310 a. However, some other testing methods do not fully consider the problem of the stability and reliability of the self structure of the testing device 110, possibly introducing interference factors to the testing result, or failing to accurately determine which specific structures or positions may have a non-negligible effect on the testing result, so that a corresponding self reliability detection means cannot be given out, and thus the testing result may be greatly affected by the stability and reliability of the testing device 110, and the effectiveness of the testing result is reduced.
The test of the test device 110 is equally applicable to the test of the test device 110 a.
Referring to fig. 37, the drop test for conducting the power-on state of the electronic device 310 using the present test apparatus 110 specifically includes:
communicatively connecting the test apparatus 110 with the monitoring device 120, such as through Wi-Fi communication;
In the test, the test device 110 serves as a server to report the relevant data to the monitoring apparatus 120 in a circulating manner, and the monitoring apparatus 120 is used to perform monitoring and/or analyze the relevant data to determine the operating state of the electronic device 310. Optionally, the test method further comprises: the monitoring device 120 as a client sends a command and data to the testing apparatus 110, the testing apparatus 110 analyzes the received command and data, if the command is a write operation, executes a related write function according to the command, and returns a related write parameter and a write state; if the command is a read operation, then the relevant read function is executed according to the command and the relevant read parameters are returned.
For the test system 100 shown in fig. 15 or fig. 16, the micro control unit 27 may determine whether the command is a write operation, if yes, the related data is written into each electronic device 310 through IIC communication, the write parameters and the write status are returned to the monitoring device 120 through Wi-Fi communication, and the data is updated in the monitoring device 120; if not, the micro control unit 27 is determined to be a read operation, and the micro control unit reads the data of the electronic device 310 through IIC communication, and returns the read data to the monitoring device 120 through Wi-Fi communication to update the data.
The Wi-Fi protocol definition adopted in this embodiment is shown in fig. 38, where the monitoring device 120 sends data as a client, and includes 20 bytes, a start bit of 0xA8, end bits of 18 th and 19 th bits of 0x0F and 0x8A, respectively, and a middle bit of the data includes specific read/write operations, commands and data. Of course, in other embodiments, wi-Fi protocols may be defined separately as desired.
In this embodiment, the monitoring device 120 is provided with monitoring software, and fig. 39-43 show interfaces one to five of the monitoring software. Referring to fig. 39, in interface one, the IP address of the communication network may be entered, and the "connect" button may be clicked to effect Wi-Fi communication connection of the monitoring device 120 and the test apparatus 110. The first interface also includes a MEMS device 310a status monitoring alarm window for monitoring the status of the corresponding IIC switch 26 or MEMS device 310 a. Clicking on any of the MEMS devices 310a in interface one, labeled Uxx in interface one (e.g., U11), may access the acceleration data and gyroscope data monitoring interface (interface two, fig. 40) of the MEMS device 310a, and may monitor the relevant data of the MEMS device 310a in real time. Clicking on any IIC switch 26 in interface one (labeled S1-S8 in interface one) may enter the control window of the corresponding IIC switch 26 (interface three, fig. 41), and may or may not disable the corresponding switch to enable energization of the corresponding set of MEMS devices 310 a.
Clicking on the "configure interface" button in interface one may enter interface four (fig. 42) for the relevant configuration. The interface five (fig. 43) is mainly a window for controlling the shutdown of the testing device 110, and may be used to issue a shutdown instruction to the testing device 110 through the monitoring software, so as to shutdown the testing device 110.
The above-mentioned monitoring software and interface design are merely examples, and those skilled in the art may set a suitable software interface according to need, which is not limited herein.
The test method of the test device 110 is equally applicable to the test device 110a.
In view of the above description, the testing device 110/110a, the testing system 100 and the testing method according to the embodiments of the present application have at least one of the following advantages:
(1) The test device 110/110a is self-powered by the self-charging battery 14 without an external power supply, and has a USB interface 39, so that the test device can be circularly charged;
(2) The shape and the volume of the testing device 110/110a are equivalent to those of a commercial intelligent mobile terminal, and the weight interval can be adjusted to meet the weight of different types of mobile terminals, so that the volume and the weight working environment of electronic devices 310 such as MEMS devices 310a in the whole mobile terminal can be simulated;
(3) The test device 110/110a is based on the reliability measures such as the metal shell 11, the protective foam 24, a plurality of flexible cushion blocks 45, the battery compartment 31, the collision avoidance design, the pressing plate 32, the thread compound and the like, and the structure simulation safety verification shows excellent reliability through the reliability and the safety test of the test device 110/110 a; carrying out drop severity verification through structural simulation, and meeting the highest peak acceleration requirement of the whole machine;
(4) The testing device 110/110a can simultaneously test M×N (e.g. 64 in the foregoing embodiment) MEMS devices 310a in batch, so as to realize batch reliability testing of the MEMS devices 310a and improve testing efficiency; after the test is completed, the carrier plate 12 or the MEMS device 310a on the carrier plate 12 can be replaced again, so that the reliability test cost of the MEMS device 310a is greatly reduced;
(5) The test device 110/110a communicates with the monitoring apparatus 120 via Wi-Fi during the test, and may communicate with the monitoring apparatus 120 via Wi-Fi in real-time and remotely and wirelessly. The MEMS device 310a performance parameter data stream is reported in real time via the IIC to the micro-control unit 27 of the test apparatus 110/110 a. The tester can remotely check the operation condition of each MEMS device 310a in real time on the monitoring software of the monitoring device 120;
(6) In this test method, the MEMS device 310a may fail in drop reliability, and may fail to recover to the initial rest value after the impact. The operation of the MEMS device 310a on the monitoring software of the monitoring device 120 is represented by a real-time report value in the small window of the MEMS device 310a and a color change outside the small window of the MEMS device 310a, when the report value exceeds the initial resting value, the color outside the small window of the MEMS device 310a is red, and when the report value is less than the initial resting value, the color outside the small window of the MEMS device 310a is green. If the testing device 110/110a keeps a static state after the falling action is completed, the MEMS device 310a does not return to a static initial value, and the color outside the small window is red, the MEMS device 310a is judged to be faulty, and the display is clear and definite;
(7) The test method can perform network topology, i.e. a plurality of test devices 110/110a and a plurality of monitoring devices 120 can be connected with the same Wi-Fi to form a local area network. In the network, one monitoring device 120 may monitor a plurality of test apparatuses 110/110a, or the operation states of the same test apparatus 110/110a may be shared among a plurality of monitoring devices 120, and any one test apparatus 110/110a and any one monitoring device 120 may be connected to each other. The topology network has extremely high development potential, and can greatly improve the test efficiency;
(8) The test method can be infinitely popularized, is not limited to the MEMS device 310a, and can be suitable for reliability test and fault reproduction of any electronic device 310 in the whole mobile terminal product, such as an ambient light sensor, a proximity light sensor, a barometric sensor, a fingerprint sensor, a temperature sensor, an NFC device, a storage device and the like; furthermore, the method is not limited to drop tests, and is also applicable to other reliability test items, such as high-temperature and high-humidity scenes, radiation tolerance scene tests and the like.
The above embodiments are only for illustrating the technical solution of the present application and not for limiting the same, and although the present application has been described in detail with reference to the above preferred embodiments, it should be understood by those skilled in the art that modifications and equivalents may be made thereto without departing from the spirit and scope of the technical solution of the present application.

Claims (36)

1. A mobile terminal electronic device testing apparatus, comprising:
A housing;
The carrier plate is connected to the shell; the carrier plate is provided with a plurality of mounting positions for mounting the electronic device; the carrier plate is provided with a plurality of mounting positions, and the mounting positions are distributed at different positions of the carrier plate and are used for mounting the electronic device at different positions of the carrier plate; the mounting positions at different positions comprise a mounting position positioned at the middle position of the carrier plate and a mounting position positioned at the periphery of the carrier plate, and are used for testing the performance of mounting the electronic device at different positions of the carrier plate so as to give a suggestion of selecting design for the mounting position of the electronic device on the carrier plate;
A drive control board connected to the housing; the driving control board is electrically connected to the carrier board and is used for driving the electronic device installed at the installation position to enable the electronic device to be in an operation state and collect related data of the electronic device in the operation state;
a battery connected to the housing; the battery is used for supplying power to the drive control board and the carrier plate.
2. The mobile terminal electronic device testing apparatus according to claim 1, wherein:
The carrier plate is provided with M groups of mounting positions, each group of mounting positions comprises N mounting positions for mounting M multiplied by N electronic devices, wherein M is an integer greater than 1, and N is an integer greater than 1.
3. The mobile terminal electronic device testing apparatus according to claim 2, wherein:
M x N the electronic devices are distributed in different positions of the carrier plate in a matrix.
4. The mobile terminal electronic device testing apparatus according to claim 2, wherein:
the driving control board is provided with a micro control unit;
The micro control unit is in communication connection with the M×N electronic devices through the IIC bus, and can independently control and monitor the operation of each electronic device.
5. The mobile terminal electronic device testing apparatus according to claim 4, wherein:
the support plate is a printed circuit board and is also provided with M IIC switches, and each group of installation positions is provided with one IIC switch and is electrically connected with the corresponding IIC switch;
The driving control board is also provided with a level conversion unit, the micro-control unit is in communication connection with the level conversion unit, and the level conversion unit is in communication connection with M IIC switches so as to realize IIC communication between the driving control board and each electronic device.
6. The mobile terminal electronic device testing apparatus of claim 5, wherein:
The drive control board is connected with the carrier board through a flexible circuit board, and the flexible circuit board is used for communication and power supply between the drive control board and the carrier board.
7. The mobile terminal electronic device testing apparatus of claim 6, wherein:
the drive control board is provided with a first connecting seat, and the carrier plate is provided with a second connecting seat;
The level conversion unit is electrically connected to the first connecting seat, and the M IIC switches are respectively electrically connected to the second connecting seat; one end of the flexible circuit board is inserted into the first connecting seat, and the other end of the flexible circuit board is inserted into the second connecting seat.
8. The mobile terminal electronic device testing apparatus according to claim 1, wherein:
The shell comprises a middle frame, a first cover plate and a second cover plate;
The middle frame comprises a frame plate and a surrounding wall, the surrounding wall surrounds the periphery of the frame plate, and the surrounding wall and the frame plate surround a first space and a second space which are positioned at two sides of the frame plate;
The first cover plate covers the first space, and the second cover plate covers the second space.
9. The mobile terminal electronic device testing apparatus of claim 8, wherein:
the frame plate is provided with a via hole, and the via hole is communicated with the first space and the second space;
the drive control board is connected to the middle frame and located in the first space, and the carrier board is connected to the middle frame and located in the second space;
The drive control board is electrically connected with the carrier plate through a flexible circuit board, the flexible circuit board penetrates through the through hole, one end of the flexible circuit board is connected to the drive control board, and the other end of the flexible circuit board is connected to the carrier plate.
10. The mobile terminal electronic device testing apparatus of claim 9, wherein:
the battery is connected to the middle frame and located in the first space;
The battery is electrically connected with the drive control board and is used for supplying power to the drive control board and supplying power to the electronic devices on the carrier board through the drive control board and the flexible circuit board.
11. The mobile terminal electronic device testing apparatus of claim 10, wherein:
The surface of the frame plate facing one side of the first space is provided with a first area and a second area which are adjacent, and the drive control plate is arranged in the first area; the second area is concave to form a battery compartment, and the battery is arranged in the battery compartment and is electrically connected with the drive control board at the junction of the first area and the second area.
12. The mobile terminal electronic device testing apparatus of claim 11, wherein:
and a pressing plate is arranged at the junction of the first area and the second area and is used for pressing the junction of the battery and the drive control board.
13. The mobile terminal electronic device testing apparatus of claim 12, wherein:
The drive control board is provided with a first connecting edge and a second connecting edge which are opposite, the first connecting edge corresponds to the pressing plate and is fixed on the frame plate together with the pressing plate, and the second connecting edge is connected with the frame plate through screws.
14. The mobile terminal electronic device testing apparatus of claim 8, wherein:
A protective foam is arranged on one side of the first cover plate, facing the first space, and is positioned in a region corresponding to the battery and/or the driving control board; and/or the number of the groups of groups,
And a protective foam is arranged on one side of the second cover plate, facing the second space, and is positioned in a region corresponding to the carrier plate.
15. The mobile terminal electronic device testing apparatus of claim 8, wherein:
The drive control board is provided with a communication unit for communicating with external equipment;
and the position of the first cover plate corresponding to the communication unit is provided with a through hole for exposing the signal receiving and transmitting part of the communication unit.
16. The mobile terminal electronic device testing apparatus of claim 8, wherein:
the first cover plate and/or the second cover plate are/is provided with a weight reducing groove, and the frame plate is provided with a weight reducing hole.
17. The mobile terminal electronic device testing apparatus of claim 8, wherein:
and the four corners of the surrounding wall are rounded, and the wall thickness of the parts at the four corners of the surrounding wall is larger than that of the middle parts of all sides of the surrounding wall.
18. The mobile terminal electronic device testing apparatus of claim 8, wherein:
the first cover plate is connected with the middle frame through a plurality of screws, the second cover plate is connected with the middle frame through a plurality of screws, and screw glue is filled in each screw connection position.
19. The mobile terminal electronic device testing apparatus according to claim 1, wherein:
The drive control board is provided with a communication unit for communicating with a monitoring device.
20. The mobile terminal electronic device testing apparatus of claim 19, wherein:
The communication unit is a Wi-Fi unit, and the Wi-Fi unit is used for being connected to a Wi-Fi hot spot of the monitoring equipment or realizing Wi-Fi communication connection with the monitoring equipment through a router.
21. The mobile terminal electronic device testing apparatus according to claim 2, wherein:
the driving control board comprises a micro control unit, a level conversion unit, a battery charging and discharging unit, a USB interface, a conversion interface and a first connecting seat;
The carrier plate is also provided with M IIC switches, and each group of installation positions is provided with one IIC switch; the carrier plate is also provided with a second connecting seat, and M IIC switches are respectively and electrically connected to the second connecting seat;
the first connecting seat is connected with the second connecting seat through a flexible circuit board;
The battery is electrically connected with the battery charging and discharging unit, and the battery charging and discharging unit is electrically connected with the micro-control unit and is used for supplying power to the micro-control unit; the battery charging and discharging unit is electrically connected with the first connecting seat and supplies power to each electronic device through the flexible circuit board, the second connecting seat and the IIC switch; the battery charging and discharging unit is electrically connected with the level conversion unit and is used for supplying power to the level conversion unit;
The USB interface is electrically connected with the battery charging and discharging unit and is used for charging the battery through the battery charging and discharging unit;
The USB interface is in communication connection with the micro control unit through the switching interface and is used for burning test firmware into the micro control unit;
The micro control unit is electrically connected with the level conversion unit, and the level conversion unit is electrically connected with the first connecting seat and is in communication connection with each electronic device through the flexible circuit board, the second connecting seat and the M IIC switches;
The micro control unit also comprises a communication unit which is used for being in communication connection with monitoring equipment so as to transmit the running state of each electronic device to the monitoring equipment and/or receive control instructions from the monitoring equipment.
22. The mobile terminal electronic device testing apparatus of claim 21, wherein:
the battery charging and discharging unit comprises a charging and discharging chip, a first DC-DC conversion unit and a second DC-DC conversion unit, and the first DC-DC conversion unit and the second DC-DC conversion unit are respectively and electrically connected with the charging and discharging chip;
The first DC-DC conversion unit is electrically connected with the micro control unit and is used for supplying power to the micro control unit; the second DC-DC conversion unit is electrically connected to the first connection seat and used for supplying power to each electronic device on the carrier board through the flexible circuit board, and the second DC-DC conversion unit is electrically connected to the level conversion unit and used for supplying power to the level conversion unit; the micro control unit is electrically connected to the second DC-DC conversion unit and is used for controlling the output level of a power supply circuit for supplying power to each electronic device by the second DC-DC conversion unit.
23. A mobile terminal electronic device testing apparatus according to any of claims 1-22, wherein:
The electronic device is an MEMS device arranged on the mobile terminal, and the mobile terminal electronic device testing device is used for testing the falling reliability of the MEMS device.
24. The mobile terminal electronic device testing apparatus of claim 23, wherein:
The electronic devices and the shell are arranged on the carrier plate at intervals, and the intervals are larger than the maximum displacement of the electronic devices when the mobile terminal electronic device testing device falls down from one side of the carrier plate.
25. The mobile terminal electronic device testing apparatus according to claim 1, wherein:
The carrier plate is detachably connected to the housing, and/or the electronic device is detachably connected to the carrier plate.
26. The mobile terminal electronic device testing apparatus according to claim 1, wherein:
The mass and the volume of the mobile terminal electronic device testing device are the same as those of the mobile terminal to be tested.
27. A mobile terminal electronic device testing apparatus according to any of claims 1-22, wherein:
The electronic device is an ambient light sensor, a proximity light sensor, a barometric pressure sensor, a fingerprint sensor, a temperature sensor, an NFC device or a storage device.
28. A mobile terminal electronic device testing system, comprising:
The mobile terminal electronic device testing apparatus of any one of claims 1-27;
Monitoring equipment;
The monitoring equipment is in communication connection with the mobile terminal electronic device testing device and is used for monitoring the running state of each electronic device and/or sending a control instruction to the mobile terminal electronic device testing device so as to control the running of each electronic device.
29. The mobile terminal electronic device testing system of claim 28, wherein:
the communication connection between the monitoring equipment and the mobile terminal electronic device testing device is Wi-Fi communication connection;
And the mobile terminal electronic device testing device is connected with the Wi-Fi hot spot of the monitoring equipment, or Wi-Fi communication is realized between the mobile terminal electronic device testing device and the monitoring equipment through a router.
30. The mobile terminal electronic device testing system of claim 28, wherein:
The monitoring equipment is one or more, the mobile terminal electronic device testing device is one or more, and the monitoring equipment and the mobile terminal electronic device testing devices are in communication connection to form a local area network.
31. A mobile terminal electronic device testing method, characterized in that it is based on the mobile terminal electronic device testing apparatus according to any one of claims 1-27, comprising:
Mounting a plurality of electronic devices to be tested on mounting positions at different positions on the carrier plate, wherein one part of the electronic devices are mounted on the mounting positions of the middle positions of the carrier plate, and the other part of the electronic devices are mounted on the mounting positions of the periphery of the carrier plate;
Starting a testing device, wherein the driving control board drives the electronic device to enable the electronic device to be in an operation state;
And in the test operation, related data of the electronic device in an operating state is transmitted to the drive control board, and the data are processed by the drive control board or transmitted to a monitoring device in communication connection through the drive control board for analyzing the performance of the electronic device.
32. The mobile terminal electronic device testing method of claim 31, wherein:
The electronic device is an MEMS device, the set test operation comprises the falling of the mobile terminal electronic device test device, the falling comprises the surface falling or the corner falling of the mobile terminal electronic device test device, and the related data comprises the falling acceleration of the electronic device.
33. The mobile terminal electronic device testing method of claim 32, wherein:
the method further comprises the step of performing self-reliability drop verification on the mobile terminal electronic device testing device;
The mobile terminal electronic device testing device performs self-reliability drop verification and comprises the following steps:
a) The mobile terminal electronic device testing device is subjected to surface drop or corner drop, and the damage condition of the shell of the mobile terminal electronic device testing device is observed; after the falling mode and the falling times are set, if the damage of the shell is in the allowable range, the shell is verified to pass, otherwise, the shell is verified to not pass;
b) Carrying out surface falling in a mode that the carrier plate is parallel to a falling surface and the electronic device on the carrier plate is opposite to the falling surface, calculating the maximum relative displacement of opposite movement between the electronic device and the opposite side structure of the electronic device in the falling process, and if the maximum relative displacement is smaller than the initial distance between the electronic device and the opposite side structure of the electronic device, verifying to pass, otherwise, verifying to fail;
c) Carrying out surface falling in a mode that the carrier plate is parallel to a falling surface and an electronic device on the carrier plate faces the falling surface, calculating the maximum deflection of the electronic device in the falling process, and if the maximum deflection is smaller than a set deflection value, verifying passing, otherwise, verifying failing;
d) Carrying out surface falling in a mode that the driving control board is parallel to a falling surface and faces the falling surface, if no collision exists between a device on the driving control board and a contralateral structure of the driving control board, verifying to pass, otherwise, verifying to fail;
e) Performing surface falling in a mode that the battery is parallel to a falling surface, if the deformation of the battery accords with a set value and the battery is not collided with the opposite side structure, verifying to pass, otherwise, verifying to not pass;
f) And carrying out surface falling in a mode that the carrier plate is parallel to the falling surface and the electronic device on the carrier plate faces the falling surface, calculating a falling acceleration peak value of the electronic device in the falling process, if the falling acceleration peak value is smaller than a set value, verifying to pass, otherwise, verifying to fail.
34. The mobile terminal electronic device testing method of claim 31, wherein:
The set test operation includes at least one of a temperature, moisture and radiation resistance test of the electronic device in an operating state operating within the mobile terminal electronic device testing apparatus.
35. A method of testing electronic devices of a mobile terminal according to any of the claims 31-34, characterized in that:
The mobile terminal electronic device testing device is in communication connection with a monitoring device;
in the test, the test device is used as a server to circularly report the related data to the monitoring equipment, and the monitoring equipment is used for monitoring and/or analyzing the related data so as to judge the working state of the electronic device.
36. The mobile terminal electronic device testing method of claim 35, wherein:
The mobile terminal electronic device testing method further comprises the following steps: the monitoring equipment is used as a client to send a command and data to the mobile terminal electronic device testing device, the testing device analyzes the received command and data, if the command is a writing operation, a relevant writing function is executed according to the command, and relevant writing parameters and writing states are returned; if the command is a read operation, then the relevant read function is executed according to the command and the relevant read parameters are returned.
CN202310038190.5A 2022-11-22 2023-01-10 Device, system and method for testing electronic device of mobile terminal Active CN116660638B (en)

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