CN116634290B - Image fusion method and device based on gating CMOS gating imaging system - Google Patents

Image fusion method and device based on gating CMOS gating imaging system Download PDF

Info

Publication number
CN116634290B
CN116634290B CN202310912384.3A CN202310912384A CN116634290B CN 116634290 B CN116634290 B CN 116634290B CN 202310912384 A CN202310912384 A CN 202310912384A CN 116634290 B CN116634290 B CN 116634290B
Authority
CN
China
Prior art keywords
pixel
slices
cmos
gating
detection target
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
CN202310912384.3A
Other languages
Chinese (zh)
Other versions
CN116634290A (en
Inventor
于澎
秦海兵
方正军
张华�
何智亮
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Suzhou Insight Technology Co ltd
Original Assignee
Suzhou Insight Technology Co ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Suzhou Insight Technology Co ltd filed Critical Suzhou Insight Technology Co ltd
Priority to CN202310912384.3A priority Critical patent/CN116634290B/en
Publication of CN116634290A publication Critical patent/CN116634290A/en
Application granted granted Critical
Publication of CN116634290B publication Critical patent/CN116634290B/en
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • HELECTRICITY
    • H04ELECTRIC COMMUNICATION TECHNIQUE
    • H04NPICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/50Control of the SSIS exposure
    • H04N25/53Control of the integration time
    • H04N25/532Control of the integration time by controlling global shutters in CMOS SSIS
    • HELECTRICITY
    • H04ELECTRIC COMMUNICATION TECHNIQUE
    • H04NPICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/70SSIS architectures; Circuits associated therewith
    • H04N25/76Addressed sensors, e.g. MOS or CMOS sensors
    • H04N25/77Pixel circuitry, e.g. memories, A/D converters, pixel amplifiers, shared circuits or shared components
    • HELECTRICITY
    • H04ELECTRIC COMMUNICATION TECHNIQUE
    • H04NPICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/70SSIS architectures; Circuits associated therewith
    • H04N25/76Addressed sensors, e.g. MOS or CMOS sensors
    • H04N25/779Circuitry for scanning or addressing the pixel array

Landscapes

  • Engineering & Computer Science (AREA)
  • Multimedia (AREA)
  • Signal Processing (AREA)
  • Optical Radar Systems And Details Thereof (AREA)

Abstract

The invention provides an image fusion method and device based on a gating CMOS gating imaging system, which selects a scanning step distance to enable a detection target to appear in a plurality of slices; when the distance of the detected target is known, only the slice where the detected target is located is reserved; when an interference object exists between the detection target and the gating CMOS gating imaging system and the distance between the detection target and the gating CMOS gating imaging system is known, only other slices except the slice where the interference object exists are reserved, and fusion of images of the other slices except the slice where the interference object exists is carried out; when the distance between the detection target and the interfering object is unknown, reserving all slices and fusing all slice images; setting the pixels meeting the first preset condition as first pixels, and setting the intensity value of the fused first pixels to 0, wherein the first preset condition is that the collected light is continuous light. The image fusion method and the device based on the gating CMOS gating imaging system can remove overexposure interference caused by continuous light to imaging, and realize clear imaging of a detected target.

Description

Image fusion method and device based on gating CMOS gating imaging system
Technical Field
The invention relates to the technical field of gating imaging, in particular to an image fusion method and device based on a gating CMOS gating imaging system.
Background
The gating imaging technology requires that the imaging device has a short shutter time, and the currently common technology is to install auxiliary devices such as an enhancer in front of the conventional CMOS (Complementary Metal Oxide Semiconductor ) or CCD (Charge Coupled Device, charge coupled device) imaging device to form a shutter control device for controlling the shutter time. Through space gating scanning, a group of slice sequences can be obtained, and in order to display all information of the whole detection space, a plurality of obtained slices are required to be fused before or after distance measurement of a detection target is carried out, so that a picture is generated.
However, when there is an interfering substance or continuous light between the detection target and the gated CMOS gated imaging system, the accuracy after the fusion of the plurality of slices may be affected.
Therefore, it is necessary to provide an image fusion method and apparatus based on a gated CMOS gated imaging system to effectively solve the above-mentioned problems.
Disclosure of Invention
The invention provides an image fusion method and device based on a gating CMOS gating imaging system, which can remove overexposure interference caused by continuous light on imaging through judging a first preset condition and a second preset condition, and realize clear imaging of a detected target.
The embodiment of the invention provides an image fusion method based on a gating CMOS gating imaging system, which comprises the following steps:
selecting a scanning step distance to enable a detection target to appear in a plurality of slices;
when the distance of the detection target is known, only the slice where the detection target is located is reserved;
when an interference object exists between the detection target and the gating CMOS gating imaging system and the distance of the interference object is known, only preserving other slices except the slice where the interference object exists and fusing images of the other slices except the slice where the interference object exists;
when the distance between the detection target and the interfering object is unknown, reserving all slices and fusing all slice images;
setting a pixel meeting a first preset condition as a first pixel, and setting the intensity value of the fused first pixel to 0, wherein the first preset condition is that the collected light is continuous light;
setting a pixel meeting a second preset condition as a second pixel, finding an intensity value when the second pixel is not saturated from a plurality of adjacent slices, taking the intensity value when the second pixel is not saturated as the intensity value of the second pixel, wherein the second preset condition is that the second pixel in the strongest frame reaches saturation loss information.
Preferably, the first preset condition is satisfied when the following calculation formula is satisfied:
;
wherein ,for the average value of the intensities of said first pixel in the sequence,/i>For the maximum value of the intensity of said first pixel in the sequence,/or->For the minimum value of the intensity of said first pixel in the sequence,/or->And the coefficient is equal to or greater than 1.
Preferably, causing the detection target to appear in the plurality of slices includes the plurality of slices being 4 or more slices.
Preferably, the detection target can be detected in more than 4 slices when the scanning step satisfies the following calculation formula:
;
wherein ,for the scanning step +.>For the total exposure time, +.>For falling edge width +.>For the rising edge width, theThe falling edge width is the time between when the sensitivity of the gated CMOS is from less than the maximum sensitivity to fall back to 0, and the rising edge width is the time between when the sensitivity of the gated CMOS is from greater than 0 to just reaching the maximum sensitivity.
Preferably, the value ranges of the falling edge width and the rising edge width are 50 nanoseconds to 100 nanoseconds.
Preferably, the method further comprises calculating the sum of the gray values of the images of the region where the detection target is located in each frame of image, and obtaining the following series:
;
wherein ,for the sum of the gray values of the target area in each frame of image,/->For the relative intensity of the pulsed light energy, +.>As a function of the time-dependent intensity of the pulsed light, +.>For the time required for the light pulse from leaving the pulsed light source to returning to the gated CMOS, +.>For time (I)>Is the product of the other constants.
Preferably, the gating CMOS gating imaging system is further installed at a position with a first preset distance value from a plane, the first preset distance value is M, a number sequence which is obtained when a target appears at a distance R-M represented by a pulse function of the target, R is a real distance of the target to be obtained in actual acquisition, and discrete convolution operation is specifically performed by the following formula:
wherein ,for start delay with spatial scanning +.>Scan step +.>Scanning the same detection spatial depth to obtain the sequence intensity of all pixels,/->The pulse function exists for any target to be fetched, < ->Is time.
Preferably, the method further comprises summing the gray values of the target region in each frame of imageThe pulse function exists for any one of the targets after interpolation pretreatment>And performing discrete convolution operation to obtain a target existing pulse function of the detection target.
Preferably, the method further comprises detecting the peak position of the detection target and converting the peak position into a second distance value, wherein the second distance value is added with the first preset distance M to obtain the distance value of the detection target.
The embodiment of the invention also provides an image fusion device based on the gating CMOS gating imaging system, which comprises:
a scanning step selection module for selecting a scanning step such that a detection target appears in a plurality of slices;
the image fusion module is used for only reserving a slice where the detection target is located when the distance of the detection target is known; when an interference object exists between the detection target and the gating CMOS gating imaging system and the distance between the interference object and the gating CMOS gating imaging system is known, only preserving other slices except the slice where the interference object exists and fusing images of the other slices except the slice where the interference object exists; when the distance between the detection target and the interfering object is unknown, reserving all slices and fusing all slice images;
the first preset condition judging module is used for setting the pixels meeting the first preset condition as first pixels, setting the intensity value of the fused first pixels to 0, and the first preset condition is that the collected light is continuous light;
the second preset condition judging module is used for setting the pixel meeting the second preset condition as a second pixel, finding out the intensity value when the second pixel is not saturated from the adjacent multiple slices, taking the intensity value when the second pixel is not saturated as the intensity value of the second pixel, and the second preset condition is that the second pixel in the strongest frame reaches saturation loss information.
Compared with the prior art, the technical scheme of the embodiment of the invention has the following beneficial effects:
the embodiment of the invention provides an image fusion method and device of a gating imaging system based on gating CMOS, which are used for selecting a scanning step distance to enable a detection target to appear in a plurality of slices; when the distance of the detection target is known, only the slice where the detection target is located is reserved; when an interference object exists between the detection target and the gating CMOS gating imaging system and the distance of the interference object is known, only preserving other slices except the slice where the interference object exists and fusing images of the other slices except the slice where the interference object exists; when the distance between the detection target and the interfering object is unknown, reserving all slices and fusing all slice images; setting a pixel meeting a first preset condition as a first pixel, and setting the intensity value of the fused first pixel to 0, wherein the first preset condition is that the collected light is continuous light; setting pixels meeting a second preset condition as second pixels, finding out intensity values when the second pixels are not saturated from a plurality of adjacent slices, taking the intensity values when the second pixels are not saturated as the intensity values of the second pixels, wherein the second preset condition is that the second pixels in the strongest frame reach saturation loss information, fusing images in the plurality of slices according to different distances of a detection target, and processing the fused images in combination with different preset conditions, so that overexposure interference caused by continuous light on imaging can be removed, and clear imaging of the detected target is realized;
further, the gating CMOS gating imaging system is installed at a position with a first preset distance value from a plane, wherein the first preset distance value is M, a plurality of columns which are obtained when a target appears at a distance R-M represented by a pulse function exists in the target are obtained, and the sum of image gray values of a target area in each frame of image is calculatedAfter interpolation pretreatment, a pulse function exists for any target>And performing discrete convolution operation to obtain a target existing pulse function of the detection target, thereby obtaining a high-precision distance value of the detection target.
Drawings
In order to more clearly illustrate the embodiments of the present invention or the prior art, a brief description of the drawings is provided below, wherein it is apparent that the drawings in the following description are some, but not all, embodiments of the present invention. Other figures may be derived from these figures without inventive effort for a person of ordinary skill in the art.
Fig. 1 is a flow chart of an image fusion method of a gated imaging system based on gated CMOS according to an embodiment of the present invention.
Fig. 2 is a schematic block diagram of an image fusion device of a gated CMOS based gated imaging system according to an embodiment of the present invention.
Fig. 3 is a schematic diagram of a shutter shape of a gated CMOS in an image fusion method of a gated CMOS based gated imaging system according to an embodiment of the present invention.
Detailed Description
For the purpose of making the objects, technical solutions and advantages of the embodiments of the present invention more apparent, the technical solutions of the embodiments of the present invention will be clearly and completely described below with reference to the accompanying drawings in the embodiments of the present invention, and it is apparent that the described embodiments are some embodiments of the present invention, but not all embodiments of the present invention. All other embodiments, which can be made by those skilled in the art based on the embodiments of the invention without making any inventive effort, are intended to be within the scope of the invention.
The technical scheme of the invention is described in detail below by specific examples. The following embodiments may be combined with each other, and some embodiments may not be repeated for the same or similar concepts or processes.
Based on the problems existing in the prior art, the invention provides an image fusion method and device based on a gating CMOS gating imaging system, and the method and device can remove overexposure interference caused by continuous light to imaging through judging a first preset condition and a second preset condition, so as to realize clear imaging of a detected target.
Fig. 1 is a flow chart of an image fusion method of a gated imaging system based on gated CMOS according to an embodiment of the present invention; FIG. 2 is a schematic block diagram of an image fusion device of a gated CMOS based gated imaging system according to an embodiment of the present invention; fig. 3 is a schematic diagram of a shutter shape of a gated CMOS in an image fusion method of a gated CMOS-based gated imaging system according to an embodiment of the present invention, wherein the horizontal axis of fig. 3 is the number of steps when scanning a standard reflector in space at a step of 5ns, and the vertical axis is the sum of acquired frame pixels.
Referring now to fig. 1 to 3, an embodiment of the present invention provides an image fusion method based on a gated CMOS gated imaging system, including:
step S101: selecting a scanning step distance to enable a detection target to appear in a plurality of slices;
step S102: when the distance of the detection target is known, only the slice where the detection target is located is reserved;
step S103: when an interference object exists between the detection target and the gating CMOS gating imaging system and the distance of the interference object is known, only preserving other slices except the slice where the interference object exists and fusing images of the other slices except the slice where the interference object exists;
step S104: when the distance between the detection target and the interfering object is unknown, reserving all slices and fusing all slice images;
step S105: setting a pixel meeting a first preset condition as a first pixel, and setting the intensity value of the fused first pixel to 0, wherein the first preset condition is that the collected light is continuous light;
step S106: setting a pixel meeting a second preset condition as a second pixel, finding an intensity value when the second pixel is not saturated from a plurality of adjacent slices, taking the intensity value when the second pixel is not saturated as the intensity value of the second pixel, wherein the second preset condition is that the second pixel in the strongest frame reaches saturation loss information.
Specifically, given a sub-region, for each slice in the slice set, all pixel value gray scales in the same sub-region are added to obtain a sub-region pixel gray scale sum, abbreviated as intensity. The sub-regions may be regions such as the upper left corner coordinates 100,100, 200 pixels wide and 200 pixels high, or may be all pixel regions. And comparing the intensities of the subareas of the slices, wherein the frame corresponding to the slice with the maximum intensity is the strongest frame.
In a specific implementation, a set of slice sequences can be obtained through space gating scanning, and in order to display all information of the whole detection space, the obtained slices need to be fused according to the policies of the steps 101-106, so as to generate and obtain a picture.
In a specific implementation, the first preset condition is satisfied when the following calculation formula is satisfied:
;
wherein ,for the average value of the intensities of said first pixel in the sequence,/i>For the maximum value of the intensity of said first pixel in the sequence,/or->For the minimum value of the intensity of said first pixel in the sequence,/or->And the coefficient is equal to or greater than 1.
In a specific implementation, causing the detection target to appear within the plurality of slices includes the plurality of slices being more than 4 slices.
In a specific implementation, the detection target can be detected in more than 4 slices when the scanning step satisfies the following calculation formula:
;
wherein ,for the scanning step +.>For the total exposure time, +.>For falling edge width +.>To get up toA rising edge width, the falling edge width being a time between when the sensitivity of the gated CMOS is from less than a maximum sensitivity to fall back to 0, the rising edge width being a time between when the sensitivity of the gated CMOS is from greater than 0 to just reaching the maximum sensitivity. Scanning step->Less than the shutter rising edge width +.>Falling edge width->Thereby ensuring that the points of the rising and falling edges can be scanned.
In a specific implementation, the falling edge width and the rising edge width have values ranging from 50 nanoseconds to 100 nanoseconds.
In a specific implementation, the method further comprises the step of calculating the sum of the gray values of the image of the region where the detection target is located in each frame of image to obtain the following series:
;
wherein ,for the sum of the gray values of the target area in each frame of image,/->For the relative intensity of the pulsed light energy, +.>As a function of the time-dependent intensity of the pulsed light, +.>For the time required for the light pulse from leaving the pulsed light source to returning to the gated CMOS, +.>For time of arrivalBetween (I) and (II)>Is the product of the other constants.
In particular, other constants include peak sensitivity of the gated CMOSThe quantum efficiency eta of the gating CMOS to a certain wavelength, the transmittance of the bandpass filter to a certain wavelength>Reflectivity of the photographed object.
Specifically, a plurality of frames of images are obtained after the detection space is scanned, and the images are collectively called an image sequence. And finding the position of the detection target from the multi-frame images through various image recognition and artificial intelligence algorithms. Those skilled in the art may select appropriate image recognition and artificial intelligence algorithms as needed, and will not be described in detail herein.
Can cause->Translation of elements within a series, assuming a target presence pulse functionThe abscissa is +.>Is equivalent to the distance of the target from the gated CMOS gated imaging system, with an ordinate of 0 or 1, when there is a target in the corresponding distance,/->Otherwise->Only one short pulse will be present in the space for this function.
In a specific implementation, the gating CMOS gating imaging system is further installed at a position with a first preset distance value from a plane, the first preset distance value is M, a number sequence which is obtained when a target appears at a distance R-M represented by a pulse function of the target, R is a real distance of the target to be obtained in actual acquisition, and discrete convolution operation is specifically performed by the following formula:
wherein ,for start delay with spatial scanning +.>Scan step +.>Scanning the same detection spatial depth to obtain the sequence intensity of all pixels,/->The pulse function exists for any target to be fetched, < ->Is time.
In the implementation, the method further comprises summing the image gray values of the target area in each frame of imageAfter interpolation pretreatment, a pulse function exists for any target>And performing discrete convolution operation to obtain a target existing pulse function of the detection target.
Specifically, the interpolation preprocessing adopts linear interpolation, and interpolates N points between two points a and b, if the intensity at the point a isThe intensity at point b is +.>Intensity of interpolation point +.>Specifically, the calculation is performed by the following formula:
wherein ,for the intensity at point a, +.>For the intensity at point b, N is an integer, n=1, 2,3 … N.
In a specific implementation, the method further comprises detecting the peak position of the detection target and converting the peak position into a second distance value, wherein the second distance value is added with the first preset distance M to obtain the distance value of the detection target.
The embodiment of the invention also provides an image fusion device based on the gating CMOS gating imaging system, which comprises:
a scanning step selection module 21 for selecting a scanning step such that a detection target appears in a plurality of slices;
an image fusion module 22, configured to, when the distance between the detected objects is known, only preserve the slice in which the detected objects are located; when an interference object exists between the detection target and the gating CMOS gating imaging system and the distance between the interference object and the gating CMOS gating imaging system is known, only preserving other slices except the slice where the interference object exists and fusing images of the other slices except the slice where the interference object exists; when the distance between the detection target and the interfering object is unknown, reserving all slices and fusing all slice images;
a first preset condition judgment module 23, configured to set a pixel that satisfies a first preset condition as a first pixel, and set an intensity value of the first pixel after fusion as 0, where the first preset condition is that the collected light is continuous light;
a second preset condition judgment module 24, configured to set a pixel that satisfies a second preset condition as a second pixel, find an intensity value when the second pixel is not saturated from a plurality of adjacent slices, and use the intensity value when the second pixel is not saturated as the intensity value of the second pixel, where the second preset condition is that the second pixel in the strongest frame reaches saturation loss information.
In summary, the image fusion method and the device for the gating imaging system based on the gating CMOS provided by the embodiment of the invention select the scanning step distance to enable the detection target to appear in a plurality of slices; when the distance of the detection target is known, only the slice where the detection target is located is reserved; when an interference object exists between the detection target and the gating CMOS gating imaging system and the distance of the interference object is known, only preserving other slices except the slice where the interference object exists and fusing images of the other slices except the slice where the interference object exists; when the distance between the detection target and the interfering object is unknown, reserving all slices and fusing all slice images; setting a pixel meeting a first preset condition as a first pixel, and setting the intensity value of the fused first pixel to 0, wherein the first preset condition is that the collected light is continuous light; setting the pixels meeting the second preset condition as second pixels, finding out the intensity value of the second pixels when the second pixels are not saturated from the adjacent multiple slices, taking the intensity value of the second pixels when the second pixels are not saturated as the intensity value of the second pixels, wherein the second preset condition is that the second pixels in the strongest frame reach saturation loss information, fusing the images in the multiple slices according to different distances of a detection target, and processing the fused images by combining different preset conditions, so that overexposure interference caused by continuous light on imaging can be removed, and clear imaging of the detected target is realized.
Further, the gated CMOS gated imaging system is mounted at a first predetermined distance from a plane, the first predetermined distanceFor M, obtaining a number sequence which is obtained when the target appears at a distance R-M represented by a pulse function of the target, and summing the gray values of the target area in each frame of imageAfter interpolation pretreatment, a pulse function exists for any target>And performing discrete convolution operation to obtain a target existing pulse function of the detection target, thereby obtaining a high-precision distance value of the detection target.
Finally, it should be noted that: the above embodiments are only for illustrating the technical solution of the present invention, and not for limiting the same; although the invention has been described in detail with reference to the foregoing embodiments, it will be understood by those of ordinary skill in the art that: the technical scheme described in the foregoing embodiments can be modified or some or all of the technical features thereof can be replaced by equivalents; such modifications and substitutions do not depart from the spirit of the invention.

Claims (8)

1. An image fusion method based on a gating CMOS gating imaging system is characterized by comprising the following steps:
selecting a scanning step distance to enable a detection target to appear in a plurality of slices, wherein the plurality of slices is more than 4 slices;
when the distance of the detection target is known, only the slice where the detection target is located is reserved;
when an interference object exists between the detection target and the gating CMOS gating imaging system and the distance of the interference object is known, only preserving other slices except the slice where the interference object exists and fusing images of the other slices except the slice where the interference object exists;
when the distance between the detection target and the interfering object is unknown, reserving all slices and fusing all slice images;
setting a pixel meeting a first preset condition as a first pixel, and setting the intensity value of the fused first pixel to 0, wherein the first preset condition is that the collected light is continuous light;
setting a pixel meeting a second preset condition as a second pixel, finding an intensity value when the second pixel is not saturated from a plurality of adjacent slices, taking the intensity value when the second pixel is not saturated as the intensity value of the second pixel, wherein the second preset condition is that the second pixel in the strongest frame reaches saturation loss information;
the detection target can be detected in more than 4 slices when the scan step satisfies the following calculation formula:
wherein ,for the scanning step +.>For the total exposure time, +.>For falling edge width +.>The falling edge width is the time between when the sensitivity of the gated CMOS is from less than a maximum sensitivity to fall back to 0, and the rising edge width is the time between when the sensitivity of the gated CMOS is from greater than 0 to just reaching the maximum sensitivity.
2. The gated CMOS gated imaging system based image fusion method of claim 1 wherein the first predetermined condition is satisfied when the following calculation formula is satisfied:
wherein ,for the average value of the intensities of said first pixel in the sequence,/i>For the maximum value of the intensity of said first pixel in the sequence,/or->For the minimum value of the intensity of said first pixel in the sequence,/or->And the coefficient is equal to or greater than 1.
3. The image fusion method based on the gated CMOS gated imaging system of claim 1 wherein the falling edge width and the rising edge width range from 50 nanoseconds to 100 nanoseconds.
4. The image fusion method based on the gated CMOS gated imaging system according to claim 1, further comprising calculating a sum of image gray values of the region where the detection target is located in each frame of image, to obtain the following number:
wherein ,for the sum of the gray values of the target area in each frame of image,/->For the relative intensity of the pulsed light energy, +.>As a function of the time-dependent intensity of the pulsed light, +.>For the time required for the light pulse from leaving the pulsed light source to returning to the gated CMOS, +.>For time (I)>Is the product of the other constants.
5. The method for image fusion based on a gated CMOS gated imaging system according to claim 4, further comprising installing the gated CMOS gated imaging system at a first preset distance value from a plane, where the first preset distance value is M, to obtain a sequence of values obtained when a target occurs at a distance R-M characterized by a pulse function, and performing a discrete convolution operation according to the following formula:
wherein ,for start delay with spatial scanning +.>Scan step +.>Scanning the same detection spatial depth to obtain the sequence intensity of all pixels,/->To take one of the purposes at willThe mark is pulse function, < >>Is time.
6. The method of claim 5, further comprising summing the gray values of the image for the target region in each frame of the imageThe pulse function exists for any one of the targets after interpolation pretreatment>And performing discrete convolution operation to obtain a target existing pulse function of the detection target.
7. The method for image fusion based on a gated CMOS gated imaging system of claim 6 further comprising detecting a peak position of the detected target and converting the peak position into a second distance value, wherein the second distance value is added to the first preset distance M to obtain a distance value of the detected target.
8. An image fusion device based on a gated CMOS gated imaging system, comprising:
a scanning step selection module for selecting a scanning step so that a detection target appears in a plurality of slices, wherein the plurality of slices is more than 4 slices;
the image fusion module is used for only reserving a slice where the detection target is located when the distance of the detection target is known; when an interference object exists between the detection target and the gating CMOS gating imaging system and the distance between the interference object and the gating CMOS gating imaging system is known, only preserving other slices except the slice where the interference object exists and fusing images of the other slices except the slice where the interference object exists; when the distance between the detection target and the interfering object is unknown, reserving all slices and fusing all slice images;
the first preset condition judging module is used for setting the pixels meeting the first preset condition as first pixels, setting the intensity value of the fused first pixels to 0, and the first preset condition is that the collected light is continuous light;
a second preset condition judging module, configured to set a pixel that meets a second preset condition as a second pixel, find an intensity value when the second pixel is not saturated from a plurality of adjacent slices, and use the intensity value when the second pixel is not saturated as the intensity value of the second pixel, where the second preset condition is that the second pixel in a strongest frame reaches saturation loss information;
the detection target can be detected in more than 4 slices when the scan step satisfies the following calculation formula:
wherein ,for the scanning step +.>For the total exposure time, +.>For falling edge width +.>The falling edge width is the time between when the sensitivity of the gated CMOS is from less than a maximum sensitivity to fall back to 0, and the rising edge width is the time between when the sensitivity of the gated CMOS is from greater than 0 to just reaching the maximum sensitivity. />
CN202310912384.3A 2023-07-25 2023-07-25 Image fusion method and device based on gating CMOS gating imaging system Active CN116634290B (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN202310912384.3A CN116634290B (en) 2023-07-25 2023-07-25 Image fusion method and device based on gating CMOS gating imaging system

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN202310912384.3A CN116634290B (en) 2023-07-25 2023-07-25 Image fusion method and device based on gating CMOS gating imaging system

Publications (2)

Publication Number Publication Date
CN116634290A CN116634290A (en) 2023-08-22
CN116634290B true CN116634290B (en) 2023-09-26

Family

ID=87603092

Family Applications (1)

Application Number Title Priority Date Filing Date
CN202310912384.3A Active CN116634290B (en) 2023-07-25 2023-07-25 Image fusion method and device based on gating CMOS gating imaging system

Country Status (1)

Country Link
CN (1) CN116634290B (en)

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN112738410A (en) * 2020-12-24 2021-04-30 重庆金山医疗器械有限公司 Imaging method and device and endoscope equipment
CN116320773A (en) * 2023-05-18 2023-06-23 苏州洞悉科技有限公司 Gating imaging control method based on gating CMOS

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US11187523B1 (en) * 2020-05-28 2021-11-30 Bae Systems Information And Electronic Systems Integration Inc. Three-dimensional shape estimation of objects via polarimetry

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN112738410A (en) * 2020-12-24 2021-04-30 重庆金山医疗器械有限公司 Imaging method and device and endoscope equipment
CN116320773A (en) * 2023-05-18 2023-06-23 苏州洞悉科技有限公司 Gating imaging control method based on gating CMOS

Also Published As

Publication number Publication date
CN116634290A (en) 2023-08-22

Similar Documents

Publication Publication Date Title
CN110248096B (en) Focusing method and device, electronic equipment and computer readable storage medium
CN109146930B (en) Infrared and visible light image registration method for electric power machine room equipment
US8879869B2 (en) Image defect map creation using batches of digital images
EP2445192A2 (en) Scene based non-uniformity correction for infrared detector arrays
US7315658B2 (en) Digital camera
EP1265194A2 (en) Method, system and program for processing and storing radiation images
US20070253638A1 (en) Digital Image Acquisition and Processing System
US11688039B2 (en) Method for generating a super-resolution image and related device
WO2007095483A2 (en) Detection and removal of blemishes in digital images utilizing original images of defocused scenes
CN110248101B (en) Focusing method and device, electronic equipment and computer readable storage medium
CN110191287B (en) Focusing method and device, electronic equipment and computer readable storage medium
CN113379636B (en) Infrared image non-uniformity correction method, device, equipment and storage medium
CN112866675B (en) Depth map generation method and device, electronic equipment and computer-readable storage medium
CN116634290B (en) Image fusion method and device based on gating CMOS gating imaging system
CN111325691B (en) Image correction method, apparatus, electronic device, and computer-readable storage medium
CN112866655B (en) Image processing method and device, electronic equipment and computer readable storage medium
CN112866510B (en) Focusing method and device, electronic equipment and computer readable storage medium
JP6591332B2 (en) Radiation intensity distribution measuring system and method
KR101733028B1 (en) Method For Estimating Edge Displacement Againt Brightness
KR101826711B1 (en) Method for Calibrating Depth Map of ToF camera
CN112866548B (en) Phase difference acquisition method and device and electronic equipment
CN111062887B (en) Image definition judging method based on improved Retinex algorithm
CN112866547B (en) Focusing method and device, electronic equipment and computer readable storage medium
CN117456371B (en) Group string hot spot detection method, device, equipment and medium
CN112866552B (en) Focusing method and device, electronic equipment and computer readable storage medium

Legal Events

Date Code Title Description
PB01 Publication
PB01 Publication
SE01 Entry into force of request for substantive examination
SE01 Entry into force of request for substantive examination
GR01 Patent grant
GR01 Patent grant