CN116633323A - High-speed digital acquisition system response characteristic calibration method and system based on photoconductive technology - Google Patents
High-speed digital acquisition system response characteristic calibration method and system based on photoconductive technology Download PDFInfo
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Abstract
The invention discloses a response characteristic calibration method of a high-speed digital acquisition system based on a photoconductive technology, belonging to the technical field of high-speed digital signal processing; the method comprises the following steps: the method is characterized by comprising the following steps of: generating an ultrafast pulse signal x (t) by laser; measuring an ultrafast pulse signal x (t) through a high-speed digital acquisition system to obtain a time domain measurement result y (t); according to the ultrafast pulse signal x (t) and the time domain measurement result y (t), calculating the frequency domain response characteristic H (j omega) and the time domain response characteristic of the high-speed digital acquisition system; the response characteristic is constituted from the frequency domain response characteristic H (j ω) and the time domain response characteristic. The invention further comprises a response characteristic calibration system of the high-speed digital acquisition system based on the photoconductive technology. The invention excites the semiconductor material by the femtosecond laser to generate the ultrafast pulse signal, which is used for calibrating the response characteristic of a high-speed digital acquisition system, so that the measured signal can be accurately described by a deconvolution method.
Description
Technical Field
The invention relates to the technical field of high-speed digital signal processing, in particular to a response characteristic calibration method of a high-speed digital acquisition system based on a photoconductive technology.
Background
High-speed digital acquisition systems typically include digital real-time oscilloscopes, digital sampling oscilloscopes, high-speed data acquisition cards, communication signal analyzers, and the like. The response characteristics comprise time domain response and frequency domain response, wherein the time domain response mainly refers to impulse response of a system, and is generally characterized by adopting rising time or falling time parameters of impulse response waveforms; the frequency domain response includes an amplitude-frequency response (amplitude-frequency response) and a phase-frequency response (phase-frequency response), typically using a 3dB indicator of the amplitude-frequency response to characterize the system bandwidth.
1. High-speed digital acquisition system and response characteristics thereof:
the high-speed digital acquisition system is used for acquiring and analyzing signals transmitted at high speed, has the characteristics of wide frequency bandwidth, high sampling rate and the like, and has wide application in various industries such as military, aerospace, aviation, railway, machinery and the like. A typical high-speed digital acquisition system includes: broadband oscilloscopes (broadband sampling oscilloscopes, broadband real-time oscilloscopes), high-speed data acquisition cards, communication signal analyzers, and the like. The bandwidth of the current high-speed digital acquisition system can reach the order of hundred gigahertz.
The high-speed signal is usually measured by a large-bandwidth digital acquisition system, and in order to improve the response measurement accuracy of the system, the bandwidth of the high-speed digital acquisition system is required to be more than 3 times of the bandwidth of the measured signal. When the 3-fold bandwidth condition is satisfied, the measurement error introduced by the high-speed digital acquisition system in the measurement result is negligible. However, with the development of ultra-high speed and ultra-wideband electronic information technology, the bandwidth of a transmission signal is continuously improved, the bandwidth of a high-speed digital acquisition system is difficult to reach a 3-time relation measurement condition, and the accuracy of a measurement result is seriously affected by errors generated by the high-speed digital acquisition system. In order to break through the technical bottleneck of measurement accuracy reduction caused by insufficient measurement bandwidth, a digital deconvolution technology is applied to correction of measurement results, so that high-accuracy calculation of a system response function is realized.
2. High-speed digital acquisition system response characteristic calibration:
the method for calibrating the response characteristics of the high-speed digital acquisition system mainly comprises 3 steps: standard pulse methods, NTN (noise-to-noise) methods, and ultrafast pulse deconvolution methods.
(1) Standard pulse method
The standard pulse method is to use a standard pulse source with the known rise time being 3 times or more than the transient response time of the tested high-speed digital acquisition system to generate a standard pulse signal, and the rise time of the pulse signal is measured by the high-speed digital acquisition system to be used as the time domain response characteristic. And measuring the amplitude-frequency response of the high-speed digital acquisition system by using a sweep frequency method as the frequency domain response characteristic. The method also has certain limitations:
when the bandwidth of the high-speed digital acquisition system reaches more than 30GHz, the rise time is more than 3 times that of a standard pulse source, so that the standard pulse source is difficult to realize, and the equipment on the market is less;
the time domain response waveform of the high-speed digital acquisition system cannot be calculated;
the phase frequency response characteristics of the high-speed digital acquisition system cannot be obtained.
(2) NTN method
In some high-speed digital acquisition systems (e.g., the 86100 series sampling oscilloscope of Keysight, usa), when the dc bias voltage is not zero, an extremely narrow electrical pulse signal is generated at the input. The pulse shape is proportional to the impulse response of the system sampling circuit, called the "k-out" pulse. The NTN method utilizes the 'key-out' pulse characteristic to realize three times of measurement by butting three high-speed digital acquisition systems in pairs, and then respective response functions of the three high-speed digital acquisition systems are extracted through deconvolution calculation, so that the calibration of the response characteristic of the system is realized. The method has certain limitations:
the method is only suitable for the response characteristic calibration of 86100 series broadband sampling oscilloscopes produced by Keysight corporation in the United states;
the uncertainty of the NTN validity introduction is large;
the phase frequency response characteristic calibration result is discrete and unstable.
The bandwidth of the high-speed digital acquisition system capable of being calibrated is limited, and the national metering reference measurement capacity of pulse waveform parameters based on the NTN method in China is 50GHz at present.
(3) Ultrafast pulse deconvolution method
With the development of photoelectric technology, the application of the femtosecond laser technology further improves the response speed of the electric pulse. However, even if the high-speed pulse generated by the photoelectric technology reaches the picosecond level, the high-speed digital acquisition system with the bandwidth reaching the millimeter wave level still cannot meet the requirement of 3 times of the standard pulse method. According to the signal and system theory, if the waveform of the standard pulse signal is known, even if the bandwidth of the standard pulse signal does not reach 3 times of the detected high-speed digital acquisition system, the impulse response of the high-speed digital acquisition system can be solved by utilizing the deconvolution signal processing technology, so that the bandwidth and the transient response index of the high-speed digital acquisition system are obtained. A prerequisite for the implementation of the ultrafast pulse deconvolution method is that the waveform data of the standard pulse signal need to be measured with high accuracy.
3. Photoconductive technology:
when a semiconductor material is exposed to light, the concentration of self carriers changes due to the absorption of photons, resulting in a change in the conductivity of the material, a phenomenon known as the photoconductive effect. When photon energy is larger than the forbidden band width of the semiconductor material, electron-hole pairs can be generated in the semiconductor material, excited carriers can be accelerated under the action of an external electric field, current is generated, and electromagnetic waves are released. Ultra-fast electrical pulse signals can be generated using photoconductive technology.
4. Generation of standard pulse signals:
there are two methods for generating a standard pulse signal: circuit methods and electro-optical methods.
The circuit method is based on the circuit method to generate standard pulse signals. There are two ways in which faster rise (fall) times can be produced at present, namely: step recovery diode and nonlinear transmission line compression techniques. The step recovery diode-based approach can produce ultrafast pulse signals with rise times of tens of picoseconds to hundreds of picoseconds. The nonlinear transmission line compression technology can generate an ultrafast pulse signal with the falling time of a few picoseconds, and the signal bandwidth can reach the terahertz magnitude.
The photoelectric method is based on that a femtosecond laser excites a photoelectric device to generate an ultrafast pulse waveform. NIST generates ultra-fast pulse signals based on femtosecond laser excitation of a commercial photodetector with a 3dB bandwidth of 100 GHz. The German PTB is based on the femtosecond laser to excite the low-temperature gallium arsenide photoconductive switch to generate an ultrafast pulse signal, and the signal bandwidth can reach the terahertz magnitude.
Disclosure of Invention
The invention aims to provide a response characteristic calibration method of a high-speed digital acquisition system based on a photoconductive technology, which can accurately describe a measured signal.
In order to solve the technical problems, the invention provides a response characteristic calibration method of a high-speed digital acquisition system based on a photoconductive technology, which comprises the following steps:
generating an ultrafast pulse signal x (t) by laser;
measuring an ultrafast pulse signal x (t) through a high-speed digital acquisition system to obtain a time domain measurement result y (t);
according to the ultrafast pulse signal x (t) and the time domain measurement result y (t), calculating a frequency domain response characteristic H (j omega) and a time domain response characteristic;
the response characteristic is constituted from the frequency domain response characteristic H (j ω) and the time domain response characteristic.
Preferably, the frequency domain response characteristic H (jω) and the time domain response characteristic are calculated according to the ultrafast pulse signal x (t) and the time domain measurement result y (t), and specifically include the following steps:
performing Fourier transformation and deconvolution on the ultrafast pulse signal x (t) and the time domain measurement result y (t) to obtain frequency domain response characteristics H (j omega);
and performing inverse Fourier transform and integral operation on the frequency domain response characteristic H (j omega) to obtain a time domain response characteristic.
Preferably, fourier transform and deconvolution processing are performed on the ultrafast pulse signal x (t) and the time-domain measurement result y (t) to obtain a frequency-domain response characteristic H (jω), and specifically includes the following steps:
performing Fourier transform on the ultrafast pulse signal X (t) to obtain a first frequency domain result X (j omega);
performing Fourier transform on the time domain measurement result Y (t) to obtain a second frequency domain result Y (j omega);
deconvolution processing is performed on the first frequency domain result X (jω) and the second frequency domain result Y (jω) to obtain a frequency domain response characteristic H (jω).
Preferably, the inverse fourier transform and the integral operation are performed on the frequency domain response characteristic H (jω) to obtain a time domain response characteristic, and specifically includes the steps of:
performing inverse Fourier transform on the frequency domain response characteristic H (j omega) to obtain impulse response H (t);
performing integral operation on the impulse response h (t) to obtain a step response s (t);
and obtaining time domain response characteristics according to the impulse response h (t) and the step response s (t).
Preferably, the time domain response characteristic is obtained according to the impulse response h (t) and the step response s (t), and specifically comprises the following steps:
the time domain response characteristic is constituted according to the rise/fall time of the impulse response h (t) and the step response s (t).
Preferably, deconvolution processing is performed on the first frequency domain result X (jω) and the second frequency domain result Y (jω) to obtain a frequency domain response characteristic H (jω), where the specific calculation formula is:
H(jω)＝Y(jω)/X(jω)
wherein: i H (ω) is the amplitude-frequency response characteristic of the high-speed digital acquisition system,is the phase-frequency response characteristic of a high-speed digital acquisition system.
Preferably, the ultrafast pulse signal x (t) is generated by a laser, comprising in particular the following steps:
the semiconductor material is excited by the femtosecond laser to generate an ultrafast pulse signal.
Preferably, the laser is a femtosecond laser.
The invention also provides a response characteristic calibration system of the high-speed digital acquisition system based on the photoconductive technology, which comprises the following steps:
the ultrafast pulse signal generation module is used for generating an ultrafast pulse signal x (t) through laser;
the time domain measurement module is used for measuring the ultrafast pulse signal x (t) through the high-speed digital acquisition system to obtain a time domain measurement result y (t);
the characteristic calculating module is used for calculating frequency domain response characteristics H (j omega) and time domain response characteristics according to the ultrafast pulse signal x (t) and the time domain measurement result y (t);
and the response characteristic construction module is used for constructing response characteristics according to the frequency domain response characteristics H (j omega) and the time domain response characteristics.
Compared with the prior art, the invention has the beneficial effects that:
the invention excites the semiconductor material by the femtosecond laser to generate the ultrafast pulse signal, the signal has the bandwidth of terahertz magnitude, and is used for calibrating the response characteristic of a high-speed digital acquisition system, so that the measured signal can be accurately described by a deconvolution method.
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The following describes the embodiments of the present invention in further detail with reference to the accompanying drawings.
FIG. 1 is a schematic diagram of the data acquisition and data processing flow for the calibration of the response characteristics of the fast pulse signal generation and high-speed digital acquisition system in example 1;
FIG. 2 is a schematic structural diagram of a photoconductive chip;
FIG. 3 is a schematic diagram of a transmission line;
fig. 4 is a flow chart of a method for calibrating response characteristics of a high-speed digital acquisition system based on photoconductive technology.
Detailed Description
In the following description, numerous specific details are set forth in order to provide a thorough understanding of the present invention. The present invention may be embodied in many other forms than those herein described, and those skilled in the art will readily appreciate that the present invention may be similarly embodied without departing from the spirit or essential characteristics thereof, and therefore the present invention is not limited to the specific embodiments disclosed below.
The terminology used in the one or more embodiments of the specification is for the purpose of describing particular embodiments only and is not intended to be limiting of the one or more embodiments of the specification. As used in this specification, one or more embodiments and the appended claims, the singular forms "a," "an," and "the" are intended to include the plural forms as well, unless the context clearly indicates otherwise. It should also be understood that the term "and/or" as used in one or more embodiments of the present specification refers to and encompasses any or all possible combinations of one or more of the associated listed items.
It should be understood that, although the terms first, second, etc. may be used in one or more embodiments of this specification to describe various information, these information should not be limited by these terms. These terms are only used to distinguish one type of information from another. For example, a first may also be referred to as a second, and similarly, a second may also be referred to as a first, without departing from the scope of one or more embodiments of the present description. The word "if" as used herein may be interpreted as "at … …" or "at … …" or "responsive to a determination", depending on the context.
The invention is described in further detail below with reference to the attached drawing figures:
as shown in fig. 4, the invention provides a response characteristic calibration method of a high-speed digital acquisition system based on photoconductive technology, which comprises the following steps:
generating an ultrafast pulse signal x (t) by laser;
measuring an ultrafast pulse signal x (t) through a high-speed digital acquisition system to obtain a time domain measurement result y (t);
according to the ultrafast pulse signal x (t) and the time domain measurement result y (t), calculating a frequency domain response characteristic H (j omega) and a time domain response characteristic;
the response characteristic is constituted from the frequency domain response characteristic H (j ω) and the time domain response characteristic.
Preferably, the frequency domain response characteristic H (jω) and the time domain response characteristic are calculated according to the ultrafast pulse signal x (t) and the time domain measurement result y (t), and specifically include the following steps:
performing Fourier transformation and deconvolution on the ultrafast pulse signal x (t) and the time domain measurement result y (t) to obtain frequency domain response characteristics H (j omega);
and performing inverse Fourier transform and integral operation on the frequency domain response characteristic H (j omega) to obtain a time domain response characteristic.
Preferably, fourier transform and deconvolution processing are performed on the ultrafast pulse signal x (t) and the time-domain measurement result y (t) to obtain a frequency-domain response characteristic H (jω), and specifically includes the following steps:
performing Fourier transform on the ultrafast pulse signal X (t) to obtain a first frequency domain result X (j omega);
performing Fourier transform on the time domain measurement result Y (t) to obtain a second frequency domain result Y (j omega);
deconvolution processing is performed on the first frequency domain result X (jω) and the second frequency domain result Y (jω) to obtain a frequency domain response characteristic H (jω).
Preferably, the inverse fourier transform and the integral operation are performed on the frequency domain response characteristic H (jω) to obtain a time domain response characteristic, and specifically includes the steps of:
performing inverse Fourier transform on the frequency domain response characteristic H (j omega) to obtain impulse response H (t);
performing integral operation on the impulse response h (t) to obtain a step response s (t);
and obtaining time domain response characteristics according to the impulse response h (t) and the step response s (t).
Preferably, the time domain response characteristic is obtained according to the impulse response h (t) and the step response s (t), and specifically comprises the following steps:
the time domain response characteristic is constituted according to the rise/fall time of the impulse response h (t) and the step response s (t).
Preferably, deconvolution processing is performed on the first frequency domain result X (jω) and the second frequency domain result Y (jω) to obtain a frequency domain response characteristic H (jω), where the specific calculation formula is:
H(jω)＝Y(jω)/X(jω)
wherein: i H (ω) is the amplitude-frequency response characteristic of the high-speed digital acquisition system,is the phase-frequency response characteristic of a high-speed digital acquisition system.
Preferably, the ultrafast pulse signal x (t) is generated by a laser, comprising in particular the following steps:
the semiconductor material is excited by a femtosecond laser to generate an ultrafast pulse signal x (t).
Preferably, the laser is a femtosecond laser.
The invention also provides a response characteristic calibration system of the high-speed digital acquisition system based on the photoconductive technology, which comprises the following steps:
the ultrafast pulse signal generation module is used for generating an ultrafast pulse signal x (t) through laser;
the time domain measurement module is used for measuring the ultrafast pulse signal x (t) through the high-speed digital acquisition system to obtain a time domain measurement result y (t);
the characteristic calculating module is used for calculating frequency domain response characteristics H (j omega) and time domain response characteristics according to the ultrafast pulse signal x (t) and the time domain measurement result y (t);
and the response characteristic construction module is used for constructing response characteristics according to the frequency domain response characteristics H (j omega) and the time domain response characteristics.
In order to better illustrate the technical effects of the present invention, the present invention provides the following specific embodiments to illustrate the above technical flow:
embodiment 1, a method for calibrating response characteristics of a high-speed digital acquisition system based on photoconductive technology:
the invention mainly comprises the following steps: ultrafast pulse signal generation, data acquisition and data processing for response characteristic calibration of a high-speed digital acquisition system, as shown in fig. 1.
The ultrafast pulse signal is generated based on a photoconductive technology, the core of which is a photoconductive chip. The photoconductive chip is composed of a semiconductor material and a transmission line, and the semiconductor material is excited by femtosecond laser, so that an ultrafast pulse signal is generated due to the existence of a photoconductive effect. The ultra-fast pulse signal is coupled into a high-speed digital acquisition system through a photoconductive chip transmission line. The high-speed digital acquisition system completes data acquisition of the ultrafast pulse signals. And obtaining the response characteristic of the high-speed digital acquisition system through data processing based on the ultrafast pulse signals generated by the photoconductive technology and the measurement result of the high-speed digital acquisition system. The data processing comprises the following steps: fourier transform, deconvolution methods, inverse fourier transform, integral operations, and the like.
1. Generating an ultrafast pulse signal:
the ultrafast pulse waveform is generated by a femtosecond laser exciting the semiconductor material. The semiconductor material is contained in a prepared photoconductive chip comprising three parts: a base portion, a photoconductive portion, a signal transmission portion, as shown in fig. 2. Wherein the photoconductive part is excited by the femtosecond laser to generate an ultrafast pulse signal, and the signal is transmitted by the signal transmission part.
1) Photoconductive chip design and preparation:
the signal transmission part is composed of a transmission line, the transmission line is made of gold, the transmission line structure is shown in figure 3, wherein the width of a ground wire is more than or equal to 100 mu m, the width of a signal line is more than or equal to 20 mu m, a photoconductive gap is more than or equal to 10 mu m (femtosecond laser is loaded to the photoconductive part through the photoconductive gap), the distance between the signal line and the ground wire is more than or equal to 15 mu m, the length of the transmission line is more than or equal to 500 mu m, and the thickness of the transmission line is more than or equal to 0.5 mu m.
The thickness of the photoconductive part is more than or equal to 1 mu m, the photoconductive part is a low-temperature gallium arsenide crystal, and the growth temperature is 200-300 ℃.
The thickness of the substrate part is more than or equal to 300 mu m, and the material of the substrate part is semi-insulating gallium arsenide crystal.
2) And (3) laser selection:
the laser is used to excite the semiconductor material to produce an ultrafast pulse waveform. The laser adopts femtosecond laser, the laser pulse width is less than or equal to 100fs, the laser wavelength is 800 nm-900 nm, and the laser output power is 200 mW-400 mW.
2. High-speed digital acquisition system response characteristic calibration:
the ultra-fast pulse signal x (t) is coupled into a high-speed digital acquisition system through a transmission line of the photoconductive chip, and is acquired by the high-speed digital acquisition system to obtain a time domain measurement result y (t).
The response characteristics of the high-speed digital acquisition system are obtained by the following steps:
1) Performing Fourier transform on the ultrafast pulse signal X (t) to obtain a first frequency domain result X (j omega);
2) Measuring an ultrafast pulse signal x (t) through a high-speed digital acquisition system to obtain a time domain measurement result y (t); performing Fourier transform on the measured result Y (t) of the high-speed digital acquisition system to obtain a second frequency domain result Y (j omega);
3) Based on the first frequency domain result X (jω) and the second frequency domain result Y (jω), obtaining a frequency domain response characteristic H (jω) of the high-speed digital acquisition system by a deconvolution method:
H(jω)＝Y(jω)/X(jω)
wherein:
i H (ω) is the amplitude-frequency response characteristic of the high-speed digital acquisition system,is the phase-frequency response characteristic of a high-speed digital acquisition system;
4) Obtaining impulse response H (t) of the high-speed digital acquisition system through an inverse Fourier transform method according to frequency domain response characteristic H (j omega) of the high-speed digital acquisition system;
5) Performing integral operation on the impulse response h (t) to obtain a step response s (t) of the high-speed digital acquisition system;
6) The rise/fall time of impulse response h (t) and step response s (t) form the time domain response characteristic of the high-speed digital acquisition system;
7) The frequency domain response characteristic H (jω) in step 3) and the time domain response characteristic in step 6) constitute the response characteristic of the high-speed digital acquisition system.
In the several embodiments provided by the present invention, it should be understood that the disclosed apparatus and method may be implemented in other manners. For example, the above-described apparatus embodiments are merely illustrative, and the division of modules, or units is merely a logical function division, and there may be additional divisions when actually implemented, e.g., multiple units, modules, or components may be combined or integrated into another apparatus, or some features may be omitted, or not performed.
The units may or may not be physically separate, and the components shown as units may be one physical unit or a plurality of physical units, may be located in one place, or may be distributed in a plurality of different places. Some or all of the units may be selected according to actual needs to achieve the purpose of the solution of this embodiment.
In addition, each functional unit in the embodiments of the present invention may be integrated in one processing unit, or each unit may exist alone physically, or two or more units may be integrated in one unit. The integrated units may be implemented in hardware or in software functional units.
In particular, according to embodiments of the present disclosure, the processes described above with reference to flowcharts may be implemented as computer software programs. For example, embodiments of the present disclosure include a computer program product comprising a computer program embodied on a computer readable medium, the computer program comprising program code for performing the method shown in the flowcharts. In such embodiments, the computer program may be downloaded and installed from a network via a communication portion, and/or installed from a removable medium. The above-described functions defined in the method of the present invention are performed when the computer program is executed by a Central Processing Unit (CPU). The computer readable medium of the present invention may be a computer readable signal medium or a computer readable storage medium, or any combination of the two. The computer readable storage medium can be, for example, but not limited to, an electronic, magnetic, optical, electromagnetic, infrared, or semiconductor system, apparatus, or device, or any combination of the above.
The flowcharts and block diagrams in the figures illustrate the architecture, functionality, and operation of possible implementations of systems, methods and computer program products according to various embodiments of the present invention. In this regard, each block in the flowchart or block diagrams may represent a module, segment, or portion of code, which comprises one or more executable instructions for implementing the specified logical function(s). It should also be noted that, in some alternative implementations, the functions noted in the block may occur out of the order noted in the figures. For example, two blocks shown in succession may, in fact, be executed substantially concurrently, or the blocks may sometimes be executed in the reverse order, depending upon the functionality involved. It will also be noted that each block of the block diagrams and/or flowchart illustration, and combinations of blocks in the block diagrams and/or flowchart illustration, can be implemented by special purpose hardware-based systems which perform the specified functions or acts, or combinations of special purpose hardware and computer instructions.
The foregoing is merely illustrative of specific embodiments of the present invention, and the scope of the present invention is not limited thereto, but any changes or substitutions within the technical scope of the present invention should be covered by the scope of the present invention. Therefore, the protection scope of the present invention shall be subject to the protection scope of the claims.
Claims (9)
1. The high-speed digital acquisition system response characteristic calibration method based on the photoconductive technology is characterized by comprising the following steps of:
generating an ultrafast pulse signal x (t) by laser;
measuring an ultrafast pulse signal x (t) through a high-speed digital acquisition system to obtain a time domain measurement result y (t);
according to the ultrafast pulse signal x (t) and the time domain measurement result y (t), calculating a frequency domain response characteristic H (j omega) and a time domain response characteristic;
the response characteristic is constituted from the frequency domain response characteristic H (j ω) and the time domain response characteristic.
2. The method for calibrating response characteristics of a high-speed digital acquisition system based on the photoconductive technology according to claim 1, wherein the frequency domain response characteristics H (jω) and the time domain response characteristics are calculated according to the ultrafast pulse signal x (t) and the time domain measurement result y (t), specifically comprising the following steps:
performing Fourier transformation and deconvolution on the ultrafast pulse signal x (t) and the time domain measurement result y (t) to obtain frequency domain response characteristics H (j omega);
and performing inverse Fourier transform and integral operation on the frequency domain response characteristic H (j omega) to obtain a time domain response characteristic.
3. The method for calibrating response characteristics of a high-speed digital acquisition system based on the photoconductive technology according to claim 2, wherein the fourier transform and deconvolution processing are performed on the ultrafast pulse signal x (t) and the time domain measurement result y (t) to obtain the frequency domain response characteristics H (jω), specifically comprising the following steps:
performing Fourier transform on the ultrafast pulse signal X (t) to obtain a first frequency domain result X (j omega);
performing Fourier transform on the time domain measurement result Y (t) to obtain a second frequency domain result Y (j omega);
deconvolution processing is performed on the first frequency domain result X (jω) and the second frequency domain result Y (jω) to obtain a frequency domain response characteristic H (jω).
4. The method for calibrating response characteristics of a high-speed digital acquisition system based on photoconductive technology according to claim 3, wherein the method for calibrating response characteristics of a time domain by performing inverse fourier transform and integral operation on the response characteristics of a frequency domain H (jω) comprises the following steps:
performing inverse Fourier transform on the frequency domain response characteristic H (j omega) to obtain impulse response H (t);
performing integral operation on the impulse response h (t) to obtain a step response s (t);
and obtaining time domain response characteristics according to the impulse response h (t) and the step response s (t).
5. The method for calibrating response characteristics of a high-speed digital acquisition system based on photoconductive technology according to claim 4, wherein the time domain response characteristics are obtained according to impulse response h (t) and step response s (t), and specifically comprising the following steps:
the time domain response characteristic is constituted according to the rise/fall time of the impulse response h (t) and the step response s (t).
6. The method for calibrating response characteristics of a high-speed digital acquisition system based on photoconductive technology according to claim 3, wherein deconvolution processing is performed on a first frequency domain result X (jω) and a second frequency domain result Y (jω) to obtain a frequency domain response characteristic H (jω), and the specific calculation formula is as follows:
H(jω)＝Y(jω)/X(jω)
wherein: i H (ω) is the amplitude-frequency response characteristic of the high-speed digital acquisition system,is the phase-frequency response characteristic of a high-speed digital acquisition system.
7. The method for calibrating response characteristics of a high-speed digital acquisition system based on photoconductive technology according to claim 1, wherein the ultra-fast pulse signal x (t) is generated by laser, comprising the following steps:
the semiconductor material is excited by a femtosecond laser to generate an ultrafast pulse signal x (t).
8. The method for calibrating response characteristics of high-speed digital acquisition system based on photoconductive technology according to claim 1, wherein:
the laser is a femtosecond laser.
9. A photoconductive-based high-speed digital acquisition system response characteristic calibration system for implementing the photoconductive-based high-speed digital acquisition system response characteristic calibration method as set forth in any one of claims 1 to 8, comprising:
the ultrafast pulse signal generation module is used for generating an ultrafast pulse signal x (t) through laser;
the time domain measurement module is used for measuring the ultrafast pulse signal x (t) through the high-speed digital acquisition system to obtain a time domain measurement result y (t);
the characteristic calculating module is used for calculating frequency domain response characteristics H (j omega) and time domain response characteristics according to the ultrafast pulse signal x (t) and the time domain measurement result y (t);
and the response characteristic construction module is used for constructing response characteristics according to the frequency domain response characteristics H (j omega) and the time domain response characteristics.
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