CN116594069A - Effective complex resistivity data area screening method for shallow surface tectorial membrane contaminated sites - Google Patents
Effective complex resistivity data area screening method for shallow surface tectorial membrane contaminated sites Download PDFInfo
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Abstract
The application relates to a screening method of effective complex resistivity data areas of a contaminated site with a shallow surface tectorial membrane, which belongs to the technical field of data processing. The application provides a method for systematically calculating complex resistivity characteristic parameters of damaged areas of the impermeable films on the shallow surfaces of polluted sites, which effectively identifies and quantifies the distribution of the damaged areas of the impermeable films on the shallow surfaces of the polluted sites. The application provides a reliable complex resistivity measurement data evaluation and screening technology for a shallow surface film covered contaminated site, which is beneficial to improving the accuracy of a complex resistivity detection technology in contaminated site investigation and interpretation work thereof.
Description
Technical Field
The application relates to the technical field of data processing, in particular to a screening method for effective complex resistivity data areas of a shallow surface tectorial membrane polluted site.
Background
Complex resistivity detection techniques utilize a measurement array to acquire hundreds or thousands of sets of measurement data by arranging a large number of electrode sets to power the subsurface. And calculating and obtaining an underground complex resistivity distribution profile by adopting a chromatographic inversion technology, and further analyzing and analyzing the distribution of the pollution area. In the polluted site restoration and management engineering, a method of covering an impermeable film on the shallow surface is often adopted to obstruct rainfall infiltration, so that the secondary pollution diffusion risk of the polluted site is prevented. Surface covering impermeable films are often subject to localized breakage during their construction or during sampling of the borehole. In the complex resistivity detection of the polluted site, the impermeable film area covered by the shallow surface can block the transmission of electric signals to influence the quality of complex resistivity measurement data, and the impermeable film damaged area can generate an electric signal transmission channel to acquire relatively reliable complex resistivity measurement data. How to identify the damaged area of the impermeable film and reliable complex resistivity measurement data by using a complex resistivity detection technology on a shallow surface tectorial membrane polluted site, and further, the improvement of the accuracy of the complex resistivity detection technology on the investigation and interpretation of the polluted site is a problem which needs to be solved urgently.
Disclosure of Invention
The application overcomes the defects of the prior art and provides an effective complex resistivity data area screening method for a shallow surface tectorial membrane polluted site.
In order to achieve the above purpose, the application adopts the following technical scheme:
the application provides a screening method of effective complex resistivity data areas of a shallow surface tectorial membrane polluted site, which comprises the following steps:
constructing a complex resistivity two-dimensional model of the pollution area under the condition of covering the impermeable films with different breakage ratios;
performing forward modeling and inversion numerical simulation on the resistivity two-dimensional model, and calculating inversion errors of the resistivity two-dimensional model and inversion errors of a pollution area;
establishing fitting curves of different anti-seepage film breakage ratios according to the resistivity two-dimensional model inversion error and the pollution area inversion error, and determining effective anti-seepage film breakage ratios;
extracting shallow resistivity data of the resistivity two-dimensional model, calculating a resistivity threshold of a damaged area of the impermeable film, and further determining an effective impermeable film damage ratio threshold;
extracting and calculating the shallow surface resistivity data of the polluted site, and calculating the film covering breakage ratio of the shallow surface of the polluted site according to the resistivity threshold value of the seepage-proofing film breakage area;
and screening the effective complex resistivity data area according to the effective anti-seepage film breakage ratio threshold value.
Further, in a preferred embodiment of the present application, the depth of the impermeable film is equal to the average burial depth of the impermeable film in the actual field, and the same-sized damaged areas are arranged at equal intervals in the extending direction of the impermeable film, and the calculation formula of the breakage ratio of the impermeable film is:
；
wherein nThe number of the damage areas of the single impermeable film is 0 to n e N is a positive integer of e Is half of the number of electrodes of the measuring line,for the length of the single rupture zone of the barrier film,d e for the measurement of the electrode spacing,Ntaking a positive integer of 1 to 4,Lfor the length of the complex resistivity line, < >>Is the breakage ratio of the impermeable film.
Further, in a preferred embodiment of the present application, the method for screening the effective complex resistivity data area of the contaminated site with the shallow surface coating further includes:
the width of the resistivity two-dimensional model is the length of an actual measuring line in siteLThe width of the model units is the same, and the value range is the sameThe depth is the inversion complex resistivity profile depth of the field measurement data, the longitudinal dimension of the model unit is amplified layer by layer according to the same multiple from top to bottom, and the simulation electrodes are arranged at equal intervals and are consistent with the actual field arrangement;
the pollutant distribution area is set as a rectangular area with the transverse width set asThe embedded depth range is determined according to the average distribution area of the field pollution area, the impermeable film is arranged as a layer of unit, and the thickness of the unit is the actual thickness of the impermeable film paved on the field;
wherein ,d e the electrode spacing is measured.
Further, in a preferred embodiment of the present application, the method for screening the effective complex resistivity data area of the contaminated site with the shallow surface coating further includes:
the complex resistivity two-dimensional model of the impermeable membrane comprises the following complex resistivity parameter settings: the resistivity value of the impermeable film is more than or equal to 1 multiplied by 10 5 Omega is m, the polarization value of the impermeable film is less than or equal to 1 multiplied by 10 -2 mV/V；
The complex resistivity parameter setting of the polluted area in the model comprises the following steps: the average resistivity value and the polarization value of the polluted area inverted by the site complex resistivity survey line;
the background complex resistivity parameter setting in the model comprises the following steps: background resistivity and polarization average value of field complex resistivity survey line inversion.
Further, in a preferred embodiment of the present application, in the step of performing forward modeling and inversion numerical simulation on the resistivity two-dimensional model, calculating inversion errors of the resistivity two-dimensional model and inversion errors of a contaminated area, the method specifically includes:
the method comprises the following steps of carrying out numerical simulation, carrying out model forward modeling, carrying out inversion modeling, carrying out on the model forward modeling, and carrying out on the model forward modeling, wherein data adopted in the numerical simulation are consistent with the data adopted in the field complex resistivity measurement, the model forward modeling adopts a finite difference or finite element method, and carrying out inversion modeling adopts Gaussian Newton least square iteration, wherein a model error calculation formula is as follows:
；
wherein For the model resistivity inversion error,mnumber of units of complex resistivity model, +.>Inverting the resistivity for the kth element of the complex resistivity model without barrier coating, < +.>Resistivity values of the kth cell of the inverted complex resistivity model; />Inversion error for model polarizability,>inverting the polarizability value for the kth element of the complex resistivity model without barrier film coverage,/for the complex resistivity model without barrier film coverage>A polarizability value of a kth cell of the inverted complex resistivity model;
the inversion error of the contaminated area of the model is calculated as follows:
；
wherein To invert the error for the resistivity of the contaminated area of the model,cnumber of units of contaminated area for complex resistivity model, < ->Inverting the resistivity, +.>Resistivity values of the ith cell of the contamination zone for the inverted complex resistivity model; />Inversion error of the polarization ratio of the polluted area of the model, +.>Inverting the polarizability value for the ith cell of the complex resistivity model contamination zone without barrier film coverage, +.>The polarization value of the ith cell of the contaminated area is the inverted complex resistivity model.
Further, in a preferred embodiment of the present application, in the step of establishing a fitting curve of different anti-seepage film breakage ratios according to the resistivity two-dimensional model inversion error and the contaminated area inversion error and determining the effective anti-seepage film breakage ratio, the method specifically includes:
respectively taking the model resistivity inversion error, the model polarization inversion error, the model polluted region resistivity inversion error and the model polluted region polarization inversion error as vertical axes and the impermeable film breakage ratio as horizontal axes, and performing curve fitting to obtain a model resistivity inversion error curve, a model polarization inversion error curve, a model polluted region resistivity inversion error curve and a model polluted region polarization curve;
and when the slope changes of the model resistivity inversion error curve, the model polarization inversion error curve, the model pollution area resistivity inversion error curve and the model pollution area polarization curve at the same anti-seepage film breakage ratio are all smaller than 1%, the maximum value of the anti-seepage film breakage ratio meeting the conditions is the effective anti-seepage film breakage ratio.
Further, in a preferred embodiment of the present application, in the step of extracting the shallow resistivity data of the resistivity two-dimensional model and calculating the resistivity threshold of the damaged area of the impermeable film, further determining the effective breakage ratio threshold of the impermeable film, the method specifically includes:
the calculation formula of the resistivity threshold value of the damaged area of the impermeable film is as follows:
；
wherein To calculate the horizontal coordinate along the direction of the measuring line asxWhere under the model surfacejThe resistivity value of the individual cells is such that,hthe number of shallow units of the complex resistivity model is the number of shallow units;
calculating average resistivity values of model shallow units of all impervious film damaged areasTaking the average value of the (B) as the resistivity threshold value of the damaged area of the impermeable film;
at average resistivity valueFor the vertical axis, coordinate values of unit horizontal positionxConstructing an average resistivity curve of the shallow model as a horizontal axis +.>In the curve +.>Extracting the resistivity threshold value less than the damage area of the impermeable film>Calculating the horizontal length and the width of the curve partLI.e., the effective barrier film breakage ratio threshold.
Further, in a preferred embodiment of the present application, in the step of extracting and calculating the contaminated site shallow surface resistivity data and calculating the contaminated site shallow surface tectorial membrane breakage ratio according to the model impermeable membrane breakage zone resistivity threshold, the method specifically includes:
the calculation formula of the shallow surface resistivity data of the contaminated site is as follows:
；
wherein To measure the horizontal coordinate along the measuring line direction asxA place; below the surface of the survey line areajResistivity values of the individual parameter elements;hthe number of the shallow earth surface parameter units is the number of the shallow earth surface parameter units; />The average resistivity value of the parameter units at the same horizontal position of the measuring line is calculated along the measuring line direction, and the average resistivity value also represents the shallow surface resistivity data of the polluted site.
Further, in a preferred embodiment of the present application, the method for screening the effective complex resistivity data area of the contaminated site with the shallow surface coating further includes:
with shallow surface average resistivity valuesFor the vertical axis, coordinate values of unit horizontal positionxConstructing a shallow ground surface average resistivity curve of a field as a horizontal axis +.>；
In the curveExtracting the resistivity threshold value less than the damage area of the impermeable film>Is defined as an effective parameter curve; when the interval between adjacent effective parameter curves is less than +.>When adjacent effective parameter curves and the curve parts clamped by the effective parameter curvesThe method can be combined into the same curve area, different curve areas are marked in sequence along the direction of the measuring line, and the ratio of the sum of the horizontal lengths of the effective parameter curves in the different curve areas to the horizontal length of the curve area is calculated, namely the damage ratio of the shallow surface tectorial membrane of the polluted site in the curve area;
wherein The length of a single impervious film failure zone is the effective complex resistivity model.
Further, in a preferred embodiment of the present application, in the step of screening the effective complex resistivity data region according to the effective impermeable membrane breakage ratio threshold, the method specifically includes:
when the damage ratio of the shallow surface coating film of the polluted site in the curve area is larger than or equal to the damage ratio threshold value of the effective impermeable film, defining the inversion complex resistivity profile area of the site measurement data in the horizontal range of the curve area as an effective complex resistivity data area.
The application solves the defects existing in the background technology, and has the following beneficial effects:
the application provides a method for systematically calculating complex resistivity characteristic parameters of damaged areas of the impermeable films on the shallow surfaces of polluted sites, which effectively identifies and quantifies the distribution of the damaged areas of the impermeable films on the shallow surfaces of the polluted sites. The application provides a reliable complex resistivity measurement data evaluation and screening technology for a shallow surface film covered contaminated site, which is beneficial to improving the accuracy of a complex resistivity detection technology in contaminated site investigation and interpretation work thereof.
Drawings
In order to more clearly illustrate the embodiments of the application or the technical solutions in the prior art, the drawings that are required in the embodiments or the description of the prior art will be briefly described, it being obvious that the drawings in the following description are only some embodiments of the application, and that other embodiments of the drawings can be obtained according to these drawings without inventive effort for a person skilled in the art.
FIG. 1 is a flow chart of a method for screening effective complex resistivity data areas of a contaminated site with a shallow surface coating;
FIG. 2 is a schematic diagram of a complex resistivity model and a reference model under the condition of covering with impermeable films with different breakage ratios in the present application;
FIG. 3 is a cross section of the complex resistivity inversion of the contaminated area under the condition of covering with impermeable films of different breakage ratios in the present application;
FIG. 4 is a graph of the model and contamination inversion error versus different barrier membrane breakage ratios for the present application;
FIG. 5 is a shallow average resistivity curve of an effective complex resistivity model and its calculated resistivity threshold for damaged areas of the impermeable film and effective impermeable film damage ratio threshold in accordance with the present application;
FIG. 6 is a plot of the shallow surface resistivity of a contaminated site and an effective complex resistivity data field in accordance with the present application.
Detailed Description
In order that the above-recited objects, features and advantages of the present application will be more clearly understood, a more particular description of the application will be rendered by reference to the appended drawings and appended detailed description. It should be noted that, without conflict, the embodiments of the present application and features in the embodiments may be combined with each other.
In the following description, numerous specific details are set forth in order to provide a thorough understanding of the present application, however, the present application may be practiced in other ways than those described herein, and therefore the scope of the present application is not limited to the specific embodiments disclosed below.
Example 1
In order to achieve the above purpose, the present application provides a method for screening effective complex resistivity data areas of a contaminated site with a shallow surface tectorial membrane, wherein the method is shown in fig. 1, and specifically comprises the following steps:
s1: constructing a complex resistivity two-dimensional model of a polluted area under the condition that impermeable films with different breakage ratios (2.38% -50.79%) are covered as shown in FIG. 2;
s2: forward modeling and inversion numerical simulation are carried out on the complex resistivity two-dimensional model, and inversion errors of the complex resistivity two-dimensional model and inversion errors of a pollution area are calculated, as shown in fig. 3;
s3: establishing fitting curves of different anti-seepage film breakage ratios according to the resistivity two-dimensional model inversion errors and the pollution area inversion errors, and determining effective anti-seepage film breakage ratios as shown in fig. 4;
s4: as shown in fig. 5, shallow resistivity data of the resistivity two-dimensional model are extracted, and the resistivity threshold of the damaged area of the impermeable film is calculated, so that the effective breakage ratio threshold of the impermeable film is determined;
s5: extracting and calculating the superficial surface resistivity data of the polluted site, and calculating the superficial surface tectorial membrane breakage ratio of the polluted site according to the resistivity threshold value of the seepage-proofing membrane breakage zone, as shown in fig. 6 (1);
s6: as shown in fig. 6 (2) and (3), the effective complex resistivity data region is screened based on the effective barrier film breakage ratio threshold.
And constructing a complex resistivity two-dimensional model of the polluted area under the covering condition of the impermeable films with different breakage ratios, wherein the set depth of the impermeable film is 0.6 m as shown in figure 2, and the set depth is the average burial depth of the impermeable film in the actual field. The same-size damage areas are arranged at equal intervals in the extending direction of the impermeable film, and the damage ratio of the impermeable film is [ ]) The calculation formula of (2) is as follows:
；
wherein nThe number of single anti-seepage film breakage areas is a positive integer of 0 to 32 in the example,d e for a line electrode spacing of 2 m,Ntaking 2, length of single anti-seepage film damage areaThe value is 1 m, and the breakage ratio of the model in the example ranges from 2.38% to 50.79%, as shown in fig. 2 and 3.
The width of the complex resistivity two-dimensional model is 126. 126 m of the field actual measuring line, the width of the model units is 0.5 m, the depth is 21.3 m of the inversion complex resistivity profile of the field measurement data, and the longitudinal dimension of the model units is amplified layer by layer from top to bottom by 1.1 times; the equidistant intervals of the simulation electrodes are consistent with the actual field arrangement and are 2 m; the pollutant distribution area is a rectangular area, the transverse width of the pollutant distribution area is 42 m, and the burial depth range of the pollutant distribution area is 2 m-12 m; the impermeable film was provided as a single layer of cells having a cell thickness of 0.5. 0.5 mm.
And (3) setting a complex resistivity two-dimensional model of an impermeable film: the resistivity value of the impermeable film is 1 multiplied by 10 5 Omega, m, the polarization value of the impermeable film is 1 multiplied by 10 -2 mV/V; the resistivity value of a model polluted region is 200Ω×m, and the polarization value is 1 mV/V; the model background resistivity value is 10Ω×m, and the polarization value is 40 mV/V;
the numerical simulation measurement array is consistent with the field complex resistivity measurement, and is a gradient array; the model forward modeling adopts a finite difference method to calculate, and the inversion modeling adopts Gaussian Newton least square method iteration; the model inversion error calculation formula is as follows:
；
wherein For the model resistivity inversion error,mnumber of units of complex resistivity model, +.>Inverting the resistivity for the kth element of the complex resistivity model without barrier coating, < +.>Resistivity values of the kth cell of the inverted complex resistivity model; />Inversion error for model polarizability,>inverting the polarizability value for the kth element of the complex resistivity model without barrier film coverage,/for the complex resistivity model without barrier film coverage>The polarizability value of the kth cell of the inverted complex resistivity model.
The contamination zone inversion error of the model is calculated as follows:
；
wherein To invert the error for the resistivity of the contaminated area of the model,cnumber of units of contaminated area for complex resistivity model, < ->Inverting the resistivity, +.>Resistivity values of the ith cell of the contamination zone for the inverted complex resistivity model; />Inversion error of the polarization ratio of the polluted area of the model, +.>Inverting the polarizability value for the ith cell of the complex resistivity model contamination zone without barrier film coverage, +.>The polarization value of the ith cell of the contaminated area is the inverted complex resistivity model. In this example, +.>See fig. 3.
Respectively byFor the longitudinal axis, in->Performing curve fitting on the horizontal axis to obtain four fitting curves, and performing curve fitting to obtain four fitting curves which are +.> As shown in fig. 4; when the slope changes of the four fitting curves at the same impermeable film breakage ratio are all smaller than 1%, the maximum value of the impermeable film breakage ratio satisfying the condition is the effective impermeable film breakage ratio, as shown in fig. 4 +.>0.381.
The complex resistivity model corresponding to the effective anti-seepage film breakage ratio of 0.381 is shown as the model shown in the figure 5 (1) and is an effective complex resistivity model, and the anti-seepage film breakage ratio is0.254; extracting resistivity data of units above shallow layer 0.6 m, and calculating average resistivity value of units at the same horizontal position along the direction of the line>The calculation formula is as follows:
；
wherein To calculate the horizontal coordinate along the direction of the measuring line asxWhere under the model surfacejThe resistivity value of the individual cells is such that,his the number of shallow units of the complex resistivity model. At average resistivity value +.>For the vertical axis, coordinate values of unit horizontal positionxConstructing an average resistivity curve of the shallow model as a horizontal axis +.>As shown in fig. 5 (2). Calculating average resistance of model shallow layer units of all seepage-proofing film breakage areasRate->The average value of (2) is taken as the resistivity threshold value of the breakage zone of the impermeable film>The value was 150 ohm.m. In the curve->Extracting the resistivity threshold value less than the damage area of the impermeable film>Calculating the horizontal length and the width of the curve partLIs the ratio of the effective barrier film breakage ratio threshold +.>The value was 51.59%.
Calculating resistivity data of parameter units above 2 m in inversion resistivity profile of field measurement data, and calculating average resistivity values of parameter units at the same horizontal position of the measuring line along the measuring line direction. The calculation formula is as follows:
；
wherein To measure the horizontal coordinate along the measuring line direction asxAt the position below the earth surface of the survey line areajThe resistivity values of the individual parameter elements,his the number of shallow surface parameter units. With a shallow surface average resistivity value->For the vertical axis, coordinate values of unit horizontal positionxConstructing a shallow ground surface average resistivity curve of a field as a horizontal axis +.>As shown in fig. 6 (1). In the curve->Extracting a curve part smaller than the resistivity threshold value 150 Ohm-m of the damaged area of the impermeable film, and defining the curve part as an effective parameter curve; when the interval between adjacent effective parameter curves is smaller than 3 m, the adjacent effective parameter curves and the curve parts clamped by the adjacent effective parameter curves can be combined into the same curve area, and the different curve areas are sequentially marked (1, 2 … … z) along the direction of the measuring line; calculating the ratio of the sum of the horizontal lengths of the effective parameter curves in different curve areas to the horizontal length of the curve area, namely the anti-seepage film breakage ratio of the curve area +.>As shown in fig. 6 (1),the inverted complex resistivity profile area of the field measurement data defining the horizontal range of the curve area is the effective complex resistivity data area, which is greater than the effective barrier film breakage ratio threshold value of 51.59%, as shown by the black curve area in fig. 6 (2) and (3).
In summary, the first aspect of the present application proposes a method for systematically calculating complex resistivity characteristic parameters of damaged areas of a shallow impermeable film on a contaminated site, so as to effectively identify and quantify the distribution of damaged areas of the shallow impermeable film on the contaminated site. The second aspect of the application provides a reliable complex resistivity measurement data evaluation and screening technology for shallow surface tectorial membrane contaminated sites, which is helpful for improving the accuracy of complex resistivity detection technology in contaminated site investigation and interpretation work thereof.
In the several embodiments provided by the present application, it should be understood that the disclosed apparatus and method may be implemented in other ways. The above described device embodiments are only illustrative, e.g. the division of the units is only one logical function division, and there may be other divisions in practice, such as: multiple units or components may be combined or may be integrated into another system, or some features may be omitted, or not performed. In addition, the various components shown or discussed may be coupled or directly coupled or communicatively coupled to each other via some interface, whether indirectly coupled or communicatively coupled to devices or units, whether electrically, mechanically, or otherwise.
The units described above as separate components may or may not be physically separate, and components shown as units may or may not be physical units; can be located in one place or distributed to a plurality of network units; some or all of the units may be selected according to actual needs to achieve the purpose of the solution of this embodiment.
In addition, each functional unit in each embodiment of the present application may be integrated in one processing unit, or each unit may be separately used as one unit, or two or more units may be integrated in one unit; the integrated units may be implemented in hardware or in hardware plus software functional units.
Those of ordinary skill in the art will appreciate that: all or part of the steps for implementing the above method embodiments may be implemented by hardware related to program instructions, and the foregoing program may be stored in a computer readable storage medium, where the program, when executed, performs steps including the above method embodiments; and the aforementioned storage medium includes: a mobile storage device, a Read-Only Memory (ROM), a random access Memory (RAM, random Access Memory), a magnetic disk or an optical disk, or the like, which can store program codes.
Alternatively, the above-described integrated units of the present application may be stored in a computer-readable storage medium if implemented in the form of software functional modules and sold or used as separate products. Based on such understanding, the technical solutions of the embodiments of the present application may be embodied in essence or a part contributing to the prior art in the form of a software product stored in a storage medium, including several instructions for causing a computer device (which may be a personal computer, a server, or a network device, etc.) to execute all or part of the methods of the embodiments of the present application. And the aforementioned storage medium includes: a removable storage device, ROM, RAM, magnetic or optical disk, or other medium capable of storing program code.
The foregoing is merely illustrative embodiments of the present application, but the scope of the present application is not limited thereto, and any person skilled in the art can easily think about variations or substitutions within the technical scope of the present application, and the application should be covered. Therefore, the protection scope of the application is subject to the protection scope of the claims.
Claims (10)
1. The screening method for the effective complex resistivity data area of the shallow surface tectorial membrane polluted site is characterized by comprising the following steps:
constructing a complex resistivity two-dimensional model of the pollution area under the condition of covering the impermeable films with different breakage ratios;
performing forward modeling and inversion numerical simulation on the resistivity two-dimensional model, and calculating inversion errors of the resistivity two-dimensional model and inversion errors of a pollution area;
establishing fitting curves of different anti-seepage film breakage ratios according to the resistivity two-dimensional model inversion error and the pollution area inversion error, and determining effective anti-seepage film breakage ratios;
extracting shallow resistivity data of the resistivity two-dimensional model, calculating a resistivity threshold of a damaged area of the impermeable film, and further determining an effective impermeable film damage ratio threshold;
extracting and calculating the shallow surface resistivity data of the polluted site, and calculating the film covering breakage ratio of the shallow surface of the polluted site according to the resistivity threshold value of the seepage-proofing film breakage area;
and screening the effective complex resistivity data area according to the effective anti-seepage film breakage ratio threshold value.
2. The method for screening the effective complex resistivity data area of the shallow surface tectorial membrane contaminated site according to claim 1, further comprising the steps of:
the depth of the impermeable film is the average burial depth of the impermeable film in the actual field, the same-size damage areas are arranged at equal intervals in the extending direction of the impermeable film, and the calculation formula of the damage ratio of the impermeable film is as follows:
；
wherein nThe number of the damage areas of the single impermeable film is 0 to n e N is a positive integer of e Half of the number of the electrodes of the measuring line, the length of a single seepage-proofing film breakage area,d e for the measurement of the electrode spacing,Ntaking a positive integer of 1 to 4,Lthe length of the test line is the complex resistivity, and the damage ratio of the impermeable film.
3. The method for screening the effective complex resistivity data area of the shallow surface tectorial membrane contaminated site according to claim 1, which is characterized by further comprising the steps of;
the width of the resistivity two-dimensional model is the length of an actual measuring line in siteLThe width of the model units is the same, and the value range is the sameThe depth is the inversion complex resistivity profile depth of the field measurement data, the longitudinal dimension of the model unit is amplified layer by layer according to the same multiple from top to bottom, and the simulation electrodes are arranged at equal intervals and are consistent with the actual field arrangement;
the pollutant distribution area is set as a rectangular area with the transverse width set asThe embedded depth range is determined according to the average distribution area of the field pollution area, the impermeable film is arranged as a layer of unit, and the thickness of the unit is the actual thickness of the impermeable film paved on the field;
wherein ,d e the electrode spacing is measured.
4. The method for screening the effective complex resistivity data area of the shallow surface tectorial membrane contaminated site according to claim 1, wherein the method comprises the steps of,
the complex resistivity two-dimensional model of the impermeable membrane comprises the following complex resistivity parameter settings: the resistivity value of the impermeable film is more than or equal to 1 multiplied by 10 5 Omega is m, the polarization value of the impermeable film is less than or equal to 1 multiplied by 10 -2 mV/V；
The complex resistivity parameter setting of the polluted area in the model comprises the following steps: the average resistivity value and the polarization value of the polluted area inverted by the site complex resistivity survey line;
the background complex resistivity parameter setting in the model comprises the following steps: background resistivity and polarization average value of field complex resistivity survey line inversion.
5. The method for screening the effective complex resistivity data area of the shallow surface tectorial membrane contaminated site according to claim 1, wherein in the step of performing forward modeling and inversion numerical simulation on the resistivity two-dimensional model and calculating the inversion error of the resistivity two-dimensional model and the inversion error of the contaminated site, the method specifically comprises the following steps:
the method comprises the following steps of carrying out numerical simulation, carrying out model forward modeling, carrying out inversion modeling, carrying out on the model forward modeling, and carrying out on the model forward modeling, wherein data adopted in the numerical simulation are consistent with the data adopted in the field complex resistivity measurement, the model forward modeling adopts a finite difference or finite element method, and carrying out inversion modeling adopts Gaussian Newton least square iteration, wherein a model error calculation formula is as follows:
；
wherein For the model resistivity inversion error,mnumber of units of complex resistivity model, +.>Inverting the resistivity for the kth element of the complex resistivity model without barrier coating, < +.>Resistivity values of the kth cell of the inverted complex resistivity model;inversion error for model polarizability,>inverting the polarizability value for the kth element of the complex resistivity model without barrier film coverage,/for the complex resistivity model without barrier film coverage>A polarizability value of a kth cell of the inverted complex resistivity model; the inversion error of the contaminated area of the model is calculated as follows:
；
wherein To invert the error for the resistivity of the contaminated area of the model,cnumber of units of contaminated area for complex resistivity model, < ->Inverting the resistivity, +.>Resistivity values of the ith cell of the contamination zone for the inverted complex resistivity model; />Inversion error of the polarization ratio of the polluted area of the model, +.>Inverting the polarizability value for the ith cell of the complex resistivity model contamination zone without barrier film coverage, +.>Complex resistivity model contamination for inversionThe polarization value of the ith cell of the region.
6. The method for screening the effective complex resistivity data area of the shallow surface tectorial membrane contaminated site according to claim 1, wherein in the steps of establishing fitting curves with different impermeable membrane breakage ratios according to inversion errors of the resistivity two-dimensional model and inversion errors of a contaminated area and determining the effective impermeable membrane breakage ratios, the method specifically comprises the following steps:
respectively taking the model resistivity inversion error, the model polarization inversion error, the model polluted region resistivity inversion error and the model polluted region polarization inversion error as vertical axes and the impermeable film breakage ratio as horizontal axes, and performing curve fitting to obtain a model resistivity inversion error curve, a model polarization inversion error curve, a model polluted region resistivity inversion error curve and a model polluted region polarization curve;
and when the slope changes of the model resistivity inversion error curve, the model polarization inversion error curve, the model pollution area resistivity inversion error curve and the model pollution area polarization curve at the same anti-seepage film breakage ratio are all smaller than 1%, the maximum value of the anti-seepage film breakage ratio meeting the conditions is the effective anti-seepage film breakage ratio.
7. The method for screening the effective complex resistivity data area of the contaminated site with the shallow surface tectorial membrane according to claim 1, wherein the step of extracting the shallow resistivity data of the resistivity two-dimensional model and calculating the resistivity threshold of the damaged area of the impermeable membrane so as to determine the effective impermeable membrane damage ratio threshold specifically comprises the following steps:
the calculation formula of the resistivity threshold value of the damaged area of the impermeable film is as follows:
；
wherein To calculate the horizontal coordinate along the direction of the measuring line asxWhere under the model surfacejThe resistivity value of the individual cells is such that,hthe number of shallow units of the complex resistivity model is the number of shallow units;
calculating average resistivity values of model shallow units of all impervious film damaged areasTaking the average value of the (B) as the resistivity threshold value of the damaged area of the impermeable film;
at average resistivity valueFor the vertical axis, coordinate values of unit horizontal positionxConstructing an average resistivity curve of the shallow model as a horizontal axis +.>In the curve +.>Extracting the resistivity threshold value less than the damage area of the impermeable film>Calculating the horizontal length and the width of the curve partLI.e., the effective barrier film breakage ratio threshold.
8. The method for screening the effective complex resistivity data area of the contaminated site with the shallow surface coating according to claim 1, wherein in the step of extracting and calculating the contaminated site shallow surface resistivity data and calculating the contaminated site shallow surface coating damage ratio according to the resistivity threshold of the model impermeable membrane damage area, the method specifically comprises the following steps:
the calculation formula of the shallow surface resistivity data of the contaminated site is as follows:
；
wherein To measure the horizontal coordinate along the measuring line direction asxA place; below the surface of the survey line areajResistivity values of the individual parameter elements;hthe number of the shallow earth surface parameter units is the number of the shallow earth surface parameter units; />The average resistivity value of the parameter units at the same horizontal position of the measuring line is calculated along the measuring line direction, and the average resistivity value also represents the shallow surface resistivity data of the polluted site.
9. The method for screening the effective complex resistivity data area of the shallow surface tectorial membrane contaminated site according to claim 8, further comprising:
with shallow surface average resistivity valuesFor the vertical axis, coordinate values of unit horizontal positionxConstructing a shallow ground surface average resistivity curve of a field as a horizontal axis +.>；
In the curveExtracting the resistivity threshold value less than the damage area of the impermeable film>Is defined as an effective parameter curve; when the interval between adjacent effective parameter curves is less than +.>When the method is used, adjacent effective parameter curves and curve parts clamped by the effective parameter curves can be combined into the same curve area, different curve areas are marked in sequence along the direction of the measuring line, and the ratio of the sum of the horizontal lengths of the effective parameter curves in the different curve areas to the horizontal length of the curve area is calculated, namely the shallow surface tectorial membrane of the polluted site in the curve area is obtainedLoss ratio;
wherein The length of a single impervious film failure zone is the effective complex resistivity model.
10. The method for screening the effective complex resistivity data area of the shallow surface tectorial membrane polluted site according to any one of claims 1 to 9, wherein the step of screening the effective complex resistivity data area according to the effective impermeable membrane breakage ratio threshold value specifically comprises the following steps:
when the damage ratio of the shallow surface coating film of the polluted site in the curve area is larger than or equal to the damage ratio threshold value of the effective impermeable film, defining the inversion complex resistivity profile area of the site measurement data in the horizontal range of the curve area as an effective complex resistivity data area.
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