CN116593033A - Temperature measurement utensil calibration system - Google Patents
Temperature measurement utensil calibration system Download PDFInfo
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- CN116593033A CN116593033A CN202310775819.4A CN202310775819A CN116593033A CN 116593033 A CN116593033 A CN 116593033A CN 202310775819 A CN202310775819 A CN 202310775819A CN 116593033 A CN116593033 A CN 116593033A
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- temperature
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- calibration
- standard temperature
- platinum resistor
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- 238000009529 body temperature measurement Methods 0.000 title claims description 10
- BASFCYQUMIYNBI-UHFFFAOYSA-N platinum Chemical compound [Pt] BASFCYQUMIYNBI-UHFFFAOYSA-N 0.000 claims description 74
- 229910052697 platinum Inorganic materials 0.000 claims description 37
- 238000001514 detection method Methods 0.000 claims description 21
- 238000004164 analytical calibration Methods 0.000 claims description 12
- 238000012937 correction Methods 0.000 claims description 6
- 238000006243 chemical reaction Methods 0.000 claims description 3
- 230000008014 freezing Effects 0.000 claims description 3
- 238000007710 freezing Methods 0.000 claims description 3
- 230000000087 stabilizing effect Effects 0.000 claims description 3
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 claims description 3
- 238000012795 verification Methods 0.000 claims description 2
- 238000000034 method Methods 0.000 description 3
- 238000013461 design Methods 0.000 description 2
- 238000006467 substitution reaction Methods 0.000 description 2
- 238000010586 diagram Methods 0.000 description 1
- 230000000750 progressive effect Effects 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01K—MEASURING TEMPERATURE; MEASURING QUANTITY OF HEAT; THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR
- G01K15/00—Testing or calibrating of thermometers
- G01K15/002—Calibrated temperature sources, temperature standards therefor
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01K—MEASURING TEMPERATURE; MEASURING QUANTITY OF HEAT; THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR
- G01K15/00—Testing or calibrating of thermometers
- G01K15/005—Calibration
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02E—REDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
- Y02E30/00—Energy generation of nuclear origin
- Y02E30/30—Nuclear fission reactors
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- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Measuring Temperature Or Quantity Of Heat (AREA)
Abstract
The application belongs to the technical field of calibration of temperature measuring appliances, and particularly relates to a calibration system of a temperature measuring appliance, which is designed to control by a computer, can automatically control the temperature of constant temperature equipment to reach each calibration temperature point through configuration required by calibration temperature points and related calibration temperature specifications, judge whether the standard temperature meets the related calibration temperature specification requirements or not, and complete calibration of a plurality of multi-type calibration temperature measuring appliances by recording related data by the computer, and has the advantages of reliability, high efficiency, higher accuracy and simple operation.
Description
Technical Field
The application belongs to the technical field of temperature measuring instrument calibration, and particularly relates to a temperature measuring instrument calibration system.
Background
Currently, calibration of temperature measuring appliances is performed by using constant temperature equipment, and mainly adopts the following two modes:
1) The manual calibration is carried out, the indication of the standard temperature measuring instrument is read manually, whether the temperature deviation of the constant-temperature equipment is in accordance with the standard requirement of the temperature regulation or not and whether the change rate accords with the standard requirement of the temperature regulation are judged, the reliability is poor, the related data is recorded manually, the efficiency is low, and errors are easy to introduce;
2) The method has the advantages that the indication of the standard temperature measuring instrument is read by a computer, whether the temperature deviation calibration temperature point and the change rate of the constant temperature equipment meet the requirements of the temperature regulation standard or not is judged by the aid of the computer, the reliability is high, the computer is used for recording related data, the efficiency and the accuracy are high, but a corresponding calibration system can calibrate only specific types of temperature measuring instruments, the compatibility of other types of measuring instruments is not realized, and in addition, only one temperature measuring instrument can be calibrated at a time generally, the operation is complex.
The present application has been made in view of the above-described technical drawbacks.
It should be noted that the above disclosure of the background art is only for aiding in understanding the inventive concept and technical solution of the present application, which is not necessarily prior art to the present application, and should not be used for evaluating the novelty and the inventive idea of the present application in the case where no clear evidence indicates that the above-mentioned content is already disclosed at the filing date of the present application.
Disclosure of Invention
It is an object of the present application to provide a temperature measuring appliance calibration system that overcomes or alleviates at least one of the known technical drawbacks.
The technical scheme of the application is as follows:
a temperature-metering-instrument calibration system, comprising:
a constant temperature device;
standard platinum resistor, put in the thermostatic equipment;
a standard detection digital multimeter connected with a standard platinum resistor;
a plurality of calibrated temperature measuring devices placed within the thermostatic device;
a multi-path scanning switch connected with each calibrated temperature measuring instrument;
the calibration detection digital multimeter is connected with the multi-path scanning switch;
the computer is connected with the constant temperature equipment, the standard detection digital multipurpose meter, the multi-path scanning switch and the calibration detection digital multipurpose meter;
the computer can be configured with calibration temperature points, related calibration temperature specification requirements and a channel switching instruction of the multi-channel scanning switch;
the computer can control the temperature of the constant temperature equipment to reach various calibration temperature points, after the temperature of the constant temperature equipment reaches any calibration temperature point, the resistance value of the standard platinum resistor is acquired through the standard detection digital multimeter, the standard temperature of the constant temperature equipment is obtained through conversion of the resistance value of the standard platinum resistor, after the standard temperature meets the corresponding related calibration temperature specification requirements, the multi-path scanning switch is controlled to switch according to the multi-path scanning switch switching channel instruction, the calibration detection digital multimeter is connected with various calibrated temperature measuring instruments, the temperature measurement value of each calibrated temperature measuring instrument is acquired through the calibration detection digital multimeter, and the deviation of each temperature measurement value and the standard temperature is calculated.
According to at least one embodiment of the present application, in the above-mentioned temperature measuring instrument calibration system, the plurality of calibrated temperature measuring instruments are of a platinum thermal resistor, an armoured K-type thermocouple, an armoured/non-armoured E-type thermocouple, an armoured/non-armoured T-type thermocouple or a temperature transmitter;
the temperature gauge instrument calibration system further comprises:
auxiliary calibration device comprising:
the freezing point tank is used for placing a reference end of the thermocouple and used for calibrating the thermocouple;
the direct current voltage stabilizing source and the standard resistor are used for being matched with the temperature transmitter to calibrate the temperature transmitter.
According to at least one embodiment of the present application, in the calibration system of the temperature measuring instrument, the related calibration temperature specification requirements include deviation of the standard temperature from the calibration temperature point and change rate of the standard temperature;
the computer can calculate the deviation of the standard temperature and the calibration temperature point:
Δt correction of standard deviation ＝t Calibrating temperature points -t Standard temperature ；
Wherein,,
Δt correction of standard deviation Deviation of standard temperature and calibration temperature point;
t calibrating temperature points Calibrating the temperature of the temperature point;
t standard temperature Is the standard temperature;
the computer can calculate the rate of change of the standard temperature:
wherein,,
t standard temperature ' is the rate of change of the standard temperature;
Δt standard temperature Is the change of standard temperature;
Δt is the time corresponding to the standard temperature change.
According to at least one embodiment of the present application, in the calibration system for a temperature measuring instrument, the computer converts the resistance value of the standard platinum resistor to obtain the standard temperature of the constant temperature device, specifically:
W(t standard temperature )-W r (t Standard temperature )＝a 7 [W(t Standard temperature )-1]+b 7 [W(t Standard temperature )-1] 2 +c 7 [W(t Standard temperature )-1] 3 ；
W(t Standard temperature )＝R(t Standard temperature )/R tp ；
Wherein,,
D i interpolation constant for the ith temperature scale of the standard platinum resistor;
W r (t standard temperature ) A reference function of standard platinum resistance at standard temperature;
W(t standard temperature ) Calculating a ratio for the resistance of the standard platinum resistor at the standard temperature;
a 7 、b 7 、c 7 the verification coefficient of the standard platinum resistor;
R(t standard temperature ) Resistance at standard temperature for standard platinum resistance;
R tp is the resistance of a standard platinum resistor at the triple point of water.
Drawings
FIG. 1 is a schematic diagram of a temperature measurement appliance calibration system provided by an embodiment of the present application;
FIG. 2 is a schematic flow chart of a temperature measuring appliance calibration provided by an embodiment of the application;
wherein:
1-a constant temperature device; 2-standard platinum resistance; 3-standard digital multimeter; 4-calibrated temperature measuring appliance; 5-a multi-path scanning switch; 6-calibrating a digital multimeter; 7-a computer; 8 auxiliary calibration equipment.
For the purpose of better illustrating the embodiments, certain elements of the drawings are omitted, enlarged or reduced in size and do not represent the actual product dimensions, and furthermore, the drawings are for illustrative purposes only and are not to be construed as limiting the application.
Detailed Description
In order to make the technical solution of the present application and its advantages more clear, the technical solution of the present application will be further and completely described in detail with reference to the accompanying drawings, it being understood that the specific embodiments described herein are only some of the embodiments of the present application, which are for explanation of the present application and not for limitation of the present application. It should be noted that, for convenience of description, only the part related to the present application is shown in the drawings, and other related parts may refer to the general design, and the embodiments of the present application and the technical features of the embodiments may be combined with each other to obtain new embodiments without conflict.
Furthermore, unless defined otherwise, technical or scientific terms used in the description of the application should be given the ordinary meaning as understood by one of ordinary skill in the art to which the application pertains. The terms "upper," "lower," "left," "right," "center," "vertical," "horizontal," "inner," "outer," and the like as used in the description of the present application are merely used for indicating relative directions or positional relationships, and do not imply that the devices or elements must have a specific orientation, be constructed and operated in a specific orientation, and that the relative positional relationships may be changed when the absolute position of the object to be described is changed, thus not being construed as limiting the application. The terms "first," "second," "third," and the like, as used in the description of the present application, are used for descriptive purposes only and are not to be construed as indicating or implying any particular importance to the various components. The use of the terms "a," "an," or "the" and similar referents in the description of the application are not to be construed as limiting the amount absolutely, but rather as existence of at least one. As used in this description of the application, the terms "comprises," "comprising," or the like are intended to cover an element or article that appears before the term as such, but does not exclude other elements or articles from the list of elements or articles that appear after the term.
Furthermore, unless specifically stated and limited otherwise, the terms "mounted," "connected," and the like in the description of the present application are used in a broad sense, and for example, the connection may be a fixed connection, a removable connection, or an integral connection; can be mechanically or electrically connected; can be directly connected or indirectly connected through an intermediate medium, and can also be communicated with the inside of two elements, and the specific meaning of the two elements can be understood by a person skilled in the art according to specific situations.
The application is described in further detail below with reference to fig. 1 to 2.
A temperature gauge calibration system, as shown in fig. 1, comprising:
a thermostatic device 1;
a standard platinum resistor 2 placed inside the thermostatic device 1;
standard detection digital multipurpose table 3, connected with standard platinum resistor 2;
a plurality of calibrated temperature measuring appliances 4 placed inside the thermostatic device 1;
a multi-path scanning switch 5 connected to each of the calibrated temperature measuring devices 4;
the calibration detection digital multi-purpose table 6 is connected with the multi-path scanning switch 5;
the computer 7 is connected with the constant temperature equipment 1, the standard detection digital multipurpose table 3, the multi-path scanning switch 5 and the calibration detection digital multipurpose table 6;
the computer 7 can be configured with calibration temperature points, related calibration temperature specification requirements and a channel switching instruction of a multi-channel scanning switch;
the computer 7 can control the temperature of the thermostatic equipment 1 to reach various calibration temperature points, after the temperature of the thermostatic equipment 1 reaches any calibration temperature point, the resistance value of the standard platinum resistor 2 is acquired through the standard detection digital multi-purpose table 3, the standard temperature of the thermostatic equipment 1 is obtained through conversion of the resistance value of the standard platinum resistor 2, after the standard temperature meets the corresponding related calibration temperature specification requirements, the multi-way scanning switch 5 is controlled to switch according to the multi-way scanning switch switching channel instruction, so that the calibration detection digital multi-purpose table 6 is connected with various calibration temperature metering devices 4, the temperature measurement value of each calibrated temperature metering device 4 is acquired through the calibration detection digital multi-purpose table 6, and the deviation between each temperature measurement value and the standard temperature or the deviation between each temperature measurement value and the corresponding theoretical value is calculated.
For the calibration system of the temperature measuring appliance disclosed in the above embodiment, it can be understood by those skilled in the art that the design is controlled by the computer 7, and through the configuration required by the calibration temperature points and the related calibration temperature specifications, the temperature of the thermostatic device 1 can be automatically controlled to reach each calibration temperature point, and whether the standard temperature meets the related calibration temperature specification requirements is judged, and the related data is recorded by the computer, so as to complete the calibration of a plurality of multi-type calibrated temperature measuring appliances 4, which is reliable, efficient and has higher accuracy, simple to operate, and the specific process is referred to fig. 2.
In some alternative embodiments, in the above described thermometer calibration system, the plurality of calibrated thermometers 4 are of the platinum thermal resistor type, sheathed K-type thermocouple, sheathed/non-sheathed E-type thermocouple, sheathed/non-sheathed T-type thermocouple or temperature transmitter;
the temperature gauge instrument calibration system further comprises:
auxiliary calibration device 8, comprising:
the freezing point tank is used for placing a reference end of the thermocouple and used for calibrating the thermocouple;
the direct current voltage stabilizing source and the standard resistor are used for being matched with the temperature transmitter to calibrate the temperature transmitter.
In some alternative embodiments, in the above-mentioned calibration system for a temperature measuring instrument, the related calibration temperature specification requirements include deviation of the standard temperature from the calibration temperature point, and rate of change of the standard temperature;
the computer 7 is able to calculate the deviation of the standard temperature from the calibration temperature point:
Δt correction of standard deviation ＝t Calibrating temperature points -t Standard temperature ；
Wherein,,
Δt correction of standard deviation Deviation of standard temperature and calibration temperature point;
t calibrating temperature points Calibrating the temperature of the temperature point;
t standard temperature Is the standard temperature;
the computer 7 is able to calculate the rate of change of the standard temperature:
wherein,,
t standard temperature ' is the rate of change of the standard temperature;
Δt standard temperature Is the change of standard temperature;
Δt is the time corresponding to the standard temperature change.
In the above-described temperature measuring instrument calibration system, the resistance calculation ratio of the standard platinum resistance 2 at the standard temperature is calculated as follows:
W(t standard temperature )＝R(t Standard temperature )/R tp ……1
Wherein,,
R(t standard temperature ) The resistance of the standard platinum resistor 2 at the standard temperature;
R tp the resistance of the standard platinum resistor 2 under the three-phase point of water can be checked by an examination certificate;
the reference function of the standard platinum resistance 2 at standard temperature is calculated as follows:
wherein,,
C i interpolation constant for the ith temperature scale of the standard platinum resistor 2;
the inverse function of equation 2 is found to be:
wherein,,
D i the constant is interpolated for the ith temperature scale of standard platinum resistor 2.
C i 、D i The specific values of (2) are referred to as follows:
| i | C i | D i |
| 0 | 2.78157254 | 439.932854 |
| 1 | 1.64650916 | 472.418020 |
| 2 | -0.13714390 | 37.684494 |
| 3 | -0.00649767 | 7.472018 |
| 4 | -0.00234444 | 2.920828 |
| 5 | 0.00511868 | 0.005184 |
| 6 | 0.00187982 | -0.963864 |
| 7 | -0.00204472 | -0.188732 |
| 8 | -0.00046122 | 0.191203 |
| 9 | 0.00045724 | 0.049025 |
W(t standard temperature )-W r (t Standard temperature )＝a 7 [W(t Standard temperature )-1]+b 7 [W(t Standard temperature )-1] 2 +c 7 [W(t Standard temperature )-1] 3 ……4
The computer 7 converts the resistance value of the standard platinum resistor 2 to obtain the standard temperature of the constant temperature equipment 1, specifically, the method comprises the steps of calculating W (t Standard temperature ) Then calculate by 4 to obtain W r (t Standard temperature ) Further, t is calculated by the formula 3 Standard temperature 。
In the description, each embodiment is described in a progressive manner, and each embodiment is mainly described by the differences from other embodiments, so that the same similar parts among the embodiments are mutually referred.
Having thus described the technical aspects of the present application with reference to the preferred embodiments shown in the drawings, it should be understood by those skilled in the art that the scope of the present application is not limited to the specific embodiments, and those skilled in the art may make equivalent changes or substitutions to the related technical features without departing from the principle of the present application, and those changes or substitutions will fall within the scope of the present application.
Claims (4)
1. A temperature-metering-instrument calibration system, comprising:
a thermostatic device (1);
a standard platinum resistor (2) is placed in the constant temperature equipment (1);
a standard detection digital multimeter (3) connected with a standard platinum resistor (2);
a plurality of calibrated temperature measuring appliances (4) placed inside the thermostatic device (1);
a multi-path scanning switch (5) connected with each calibrated temperature measuring instrument (4);
a calibration detection digital multimeter (6) connected with the multi-path scanning switch (5);
the computer (7) is connected with the constant temperature equipment (1), the standard detection digital multipurpose meter (3), the multi-path scanning switch (5) and the calibration detection digital multipurpose meter (6);
the computer (7) can be configured with a calibration temperature point, related calibration temperature specification requirements and a multichannel scanning switch switching channel instruction;
the computer (7) can control the temperature of the constant temperature equipment (1) to reach various calibration temperature points, after the temperature of the constant temperature equipment (1) reaches any calibration temperature point, the resistance value of the standard platinum resistor (2) is acquired through the standard detection digital multimeter (3), the standard temperature of the constant temperature equipment (1) is obtained through conversion of the resistance value of the standard platinum resistor (2), after the standard temperature meets the corresponding related calibration temperature specification requirements, the multi-path scanning switch (5) is controlled to switch according to the multi-path scanning switch channel instruction, the calibration detection digital multimeter (6) is connected with various calibrated temperature measuring instruments (4), the temperature measurement value of each calibrated temperature measuring instrument (4) is acquired through the calibration detection digital multimeter (6), and the deviation of each temperature measurement value and the standard temperature is calculated.
2. The temperature measuring instrument calibration system of claim 1, wherein,
the types of the plurality of calibration temperature measuring appliances (4) are platinum thermal resistors, armoured K-type thermocouples, armoured/non-armoured E-type thermocouples, armoured/non-armoured T-type thermocouples or temperature transmitters;
the temperature gauge instrument calibration system further comprises:
auxiliary calibration device (8), comprising:
the freezing point tank is used for placing a reference end of the thermocouple and used for calibrating the thermocouple;
the direct current voltage stabilizing source and the standard resistor are used for being matched with the temperature transmitter to calibrate the temperature transmitter.
3. The temperature measuring instrument calibration system of claim 1, wherein,
the related calibration temperature specification requirements include the deviation of the standard temperature from the calibration temperature point, and the rate of change of the standard temperature;
the computer (7) is able to calculate the deviation of the standard temperature from the calibration temperature point:
Δt correction of standard deviation ＝t Calibrating temperature points -t Standard temperature ；
Wherein,,
Δt correction of standard deviation Deviation of standard temperature and calibration temperature point;
t calibrating temperature points Calibrating the temperature of the temperature point;
t standard temperature Is the standard temperature;
the computer (7) is able to calculate the rate of change of the standard temperature:
wherein,,
t standard temperature ' is the rate of change of the standard temperature;
Δt standard temperature Is the change of standard temperature;
Δt is the time corresponding to the standard temperature change.
4. The temperature measuring instrument calibration system of claim 1, wherein,
the computer (7) converts the resistance value of the standard platinum resistor (2) to obtain the standard temperature of the constant temperature equipment (1), and the standard temperature is specifically:
W(t standard temperature )-W r (t Standard temperature )＝a 7 [W(t Standard temperature )-1]+b 7 [W(t Standard temperature )-1] 2 +c 7 [W(t Standard temperature )-1] 3 ；W(t Standard temperature )＝R(t Standard temperature )/R tp ；
Wherein,,
D i interpolation constant for the ith temperature scale of the standard platinum resistor (2);
W r (t standard temperature ) Is a reference function of a standard platinum resistor (2) at a standard temperature;
W(t standard temperature ) Calculating a ratio for the resistance of the standard platinum resistor (2) at a standard temperature;
a 7 、b 7 、c 7 is the verification coefficient of a standard platinum resistor (2);
R(t standard temperature ) Is the resistance of a standard platinum resistor (2) at standard temperature;
R tp is the resistance of a standard platinum resistor (2) at the triple point of water.
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| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202310775819.4A CN116593033A (en) | 2023-06-28 | 2023-06-28 | Temperature measurement utensil calibration system |
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| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202310775819.4A CN116593033A (en) | 2023-06-28 | 2023-06-28 | Temperature measurement utensil calibration system |
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| CN116593033A true CN116593033A (en) | 2023-08-15 |
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| CN202310775819.4A Pending CN116593033A (en) | 2023-06-28 | 2023-06-28 | Temperature measurement utensil calibration system |
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- 2023-06-28 CN CN202310775819.4A patent/CN116593033A/en active Pending
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