CN116577793A - Distance measuring device based on image sensor capable of dynamically adjusting pixel area output - Google Patents

Distance measuring device based on image sensor capable of dynamically adjusting pixel area output Download PDF

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CN116577793A
CN116577793A CN202310839730.XA CN202310839730A CN116577793A CN 116577793 A CN116577793 A CN 116577793A CN 202310839730 A CN202310839730 A CN 202310839730A CN 116577793 A CN116577793 A CN 116577793A
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image sensor
cmos image
pixel
column
sampling
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CN116577793B (en
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代红林
刘楠
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Tianjin Yike Automation Co ltd
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01S—RADIO DIRECTION-FINDING; RADIO NAVIGATION; DETERMINING DISTANCE OR VELOCITY BY USE OF RADIO WAVES; LOCATING OR PRESENCE-DETECTING BY USE OF THE REFLECTION OR RERADIATION OF RADIO WAVES; ANALOGOUS ARRANGEMENTS USING OTHER WAVES
    • G01S17/00—Systems using the reflection or reradiation of electromagnetic waves other than radio waves, e.g. lidar systems
    • G01S17/02—Systems using the reflection of electromagnetic waves other than radio waves
    • G01S17/06—Systems determining position data of a target
    • G01S17/08—Systems determining position data of a target for measuring distance only
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01C—MEASURING DISTANCES, LEVELS OR BEARINGS; SURVEYING; NAVIGATION; GYROSCOPIC INSTRUMENTS; PHOTOGRAMMETRY OR VIDEOGRAMMETRY
    • G01C3/00—Measuring distances in line of sight; Optical rangefinders
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01S—RADIO DIRECTION-FINDING; RADIO NAVIGATION; DETERMINING DISTANCE OR VELOCITY BY USE OF RADIO WAVES; LOCATING OR PRESENCE-DETECTING BY USE OF THE REFLECTION OR RERADIATION OF RADIO WAVES; ANALOGOUS ARRANGEMENTS USING OTHER WAVES
    • G01S7/00—Details of systems according to groups G01S13/00, G01S15/00, G01S17/00
    • G01S7/48—Details of systems according to groups G01S13/00, G01S15/00, G01S17/00 of systems according to group G01S17/00
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/20—Analysis of motion
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/50—Depth or shape recovery
    • G06T7/521—Depth or shape recovery from laser ranging, e.g. using interferometry; from the projection of structured light
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/70—Determining position or orientation of objects or cameras

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  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Theoretical Computer Science (AREA)
  • Radar, Positioning & Navigation (AREA)
  • Remote Sensing (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Electromagnetism (AREA)
  • Computer Networks & Wireless Communication (AREA)
  • Optics & Photonics (AREA)
  • Multimedia (AREA)
  • Measurement Of Optical Distance (AREA)
  • Length Measuring Devices By Optical Means (AREA)

Abstract

The invention relates to the technical field of optical measurement equipment, and provides a ranging device of an image sensor based on pixel area output capable of being dynamically adjusted, which comprises: the linear array CMOS image sensor, a processor and a memory, wherein the memory stores computer readable instructions which when executed by the processor realize the following steps: if the movement direction of the object to be detected is the direction along the laser beam emitted by the laser emitter, acquiring a CMOS image sensor at a first sampling momentVoltage data of (2); acquisition [ B, D ]]The method comprises the steps of carrying out a first treatment on the surface of the Acquisition of [ B-delta ]l,D+Δl]The method comprises the steps of carrying out a first treatment on the surface of the Acquiring voltage data of the CMOS image sensor at a second sampling moment; acquisition of [ C, E ]]The method comprises the steps of carrying out a first treatment on the surface of the Will [ B-delta ]l,D+Δl]Updated to [ H, R ]]The method comprises the steps of carrying out a first treatment on the surface of the And acquiring the position of the spot centroid of the CMOS image sensor at the second sampling moment according to the position and the voltage of the second target pixel point. The invention reduces the calculated amount when determining the position of the centroid of the light spot.

Description

Distance measuring device based on image sensor capable of dynamically adjusting pixel area output
Technical Field
The invention relates to the technical field of optical measurement equipment, in particular to a distance measuring device based on an image sensor capable of dynamically adjusting pixel area output.
Background
The distance measurement principle of the laser triangular distance measurement sensor is that a laser beam emitted by a laser emitter is irradiated onto an object to be measured, wherein a part of the diffusely reflected laser beam passes through a condensing lens and forms a laser spot on a linear array CMOS image sensor, and the distance from the object to be measured to the laser triangular distance measurement sensor can be obtained according to the centroid position of the laser spot. In the prior art, when the centroid position of a laser spot is determined, the linear array CMOS image sensor needs to output the position and voltage information of all pixel points, for example, the linear array CMOS image sensor is a 4-linear array CMOS image sensor, the pixels of the 4-linear array CMOS image sensor are distributed in 4 rows, and if the number of pixels in each row is 4096, the number of pixels of the 4-linear array CMOS image sensor is 4×4096; one pixel corresponds to one pixel, and then the number of the pixels of the 4-linear array CMOS image sensor is 4 multiplied by 4096; if the centroid position of the laser spot is determined according to the positions and voltages of all the pixel points output by the linear array CMOS image sensor, the problem of large calculation amount exists.
Disclosure of Invention
The invention aims to provide a ranging device based on an image sensor capable of dynamically adjusting the output of a pixel area, so as to reduce the calculated amount in the process of determining the centroid position of a laser spot.
According to the present invention, a ranging apparatus based on an image sensor capable of dynamically adjusting pixel area output, the ranging apparatus comprises: the system comprises a laser emitter, a linear array CMOS image sensor, a processor and a memory; the memory has stored thereon computer readable instructions which when executed by the processor perform the steps of:
s100, acquiring the movement direction of the object to be detected.
S200, if the movement direction of the object to be detected is the direction along the laser beam emitted by the laser emitter, the process proceeds to S300.
S300, acquiring voltage data of the CMOS image sensor at the first sampling moment, wherein the voltage data of the CMOS image sensor at the first sampling moment comprises voltages of all pixel points of the CMOS image sensor at the first sampling moment.
S400, acquiring a first target pixel column number interval [ B, D ] according to voltage data of the CMOS image sensor at the first sampling moment, wherein B is the minimum value of the column numbers of all pixel points meeting a first preset condition in all pixel points of the CMOS image sensor at the first sampling moment, D is the maximum value of the column numbers of all pixel points meeting the first preset condition in all pixel points of the CMOS image sensor at the first sampling moment, and the first preset condition is that the corresponding voltage is larger than a preset voltage threshold value.
S500, obtaining a monitoring pixel column number interval [ B-delta ]l,D+Δl]，ΔlFor a preset column number threshold or deltal= (D-B)/n, n is a positive integer of 2 or more.
S600, acquiring voltage data of a CMOS image sensor at a second sampling moment, wherein the voltage data of the CMOS image sensor at the second sampling moment comprises the voltage of a first target pixel point; the first target pixel point is the row number of all the pixel points of the CMOS image sensor at the second sampling time belonging to the monitoring pixel row number interval [ B-delta ]l,D+Δl]Is a pixel of (a) a pixel of (b).
S700, acquiring a second target pixel column number interval [ C, E ] according to the voltage data of the CMOS image sensor at the second sampling moment, wherein C is the minimum value of the columns of all pixel points meeting the first preset condition in the first target pixel points, and E is the maximum value of the columns of all pixel points meeting the first preset condition in the first target pixel points.
S800, the monitoring pixel column number interval [ B-delta ]l,D+Δl]Updated to [ H, R ]]The method comprises the steps of carrying out a first treatment on the surface of the When C>B and E>At D, h=b- Δl+S 1 ，R=D+Δl+S 1 The method comprises the steps of carrying out a first treatment on the surface of the When C<B and E<At D, h=b- Δl-S 1 ，R=D+Δl-S 1 ；S 1 For the second sampling time, the moving distance of the pixel column number interval is monitored compared with the first sampling time, S 1 =max(|C-B|,|E-D|)。
S900, acquiring the position of a facula centroid of the CMOS image sensor at a second sampling moment according to the position and voltage of a second target pixel point, wherein the position of the facula centroid is used for acquiring the distance between an object to be detected and a laser triangulation sensor; and the second target pixel point is a pixel point of which the column number in the pixel point of the CMOS image sensor at the second sampling moment belongs to an updated monitoring pixel column number interval [ H, R ].
The invention has at least the following beneficial effects:
the invention provides a distance measuring device based on an image sensor capable of dynamically adjusting pixel area output, which aims at an object to be measured moving along the direction of a laser beam emitted by a laser emitter and is characterized in that the distance measuring device is used for measuring the distance between first target pixel column numbers [ B, D ] corresponding to a first sampling moment]Acquiring a monitoring pixel column number interval [ B-delta ]l,D+Δl]First target pixel column number interval [ B, D]Corresponding to the position of the laser spot of the object to be detected at the first acquisition time, and monitoring the pixel column number interval [ B-delta ]l,D+Δl]Is within the first target pixel column number interval [ B, D ]]Is extended on the basis of (a) a first target pixel column number interval [ B, D]Compared with the first target pixel column number interval [ B, D ]]Is wide in scope; for the second sampling moment, since the object to be measured is moved from the position of the object to be measured at the first sampling moment to the position of the object to be measured at the second sampling moment, the position of the laser spot at the second sampling moment is also obtained by the position movement of the laser spot at the first sampling moment, and based on the position movement of the laser spot at the second sampling moment, the second target pixel column number interval [ C, E ] is obtained]Instead of traversing the voltage values of the pixels of all columns as at the first sampling instant, only the column number belonging to the second target column (i.e. B-deltalColumn to D+deltalColumn) and based on the second target pixel column number interval [ C, E]Compared with the first target pixel column number interval [ B, D ]]The moving direction and the moving amplitude of the laser spot are obtained according to the position relation of the laser spot, and the monitoring pixel column number interval [ B-delta ] is obtained based on the moving direction and the moving amplitudel,D+Δl]Updated so that the laser light spot of the second sampling interval completely falls into the updated monitoring pixel column number interval [ H, R ]]Therefore, the invention does not need to acquire the position of the light spot centroid at the second sampling moment according to all the pixel points, but only needs to belong to the updated monitoring pixel column number interval [ H, R ] according to the column number]Is a pixel of (1)The position and the voltage of the center of mass of the laser spot are determined, and the calculated amount in the process of determining the position of the center of mass of the laser spot is reduced.
Drawings
In order to more clearly illustrate the technical solutions of the embodiments of the present invention, the drawings required for the description of the embodiments will be briefly described below, and it is apparent that the drawings in the following description are only some embodiments of the present invention, and other drawings may be obtained according to these drawings without inventive effort for a person skilled in the art.
FIG. 1 is a flowchart of steps implemented when computer readable instructions provided by an embodiment of the present invention are executed by the processor.
Detailed Description
The following description of the embodiments of the present invention will be made clearly and completely with reference to the accompanying drawings, in which it is apparent that the embodiments described are only some embodiments of the present invention, but not all embodiments. All other embodiments, which can be made by those skilled in the art based on the embodiments of the invention without making any inventive effort, are intended to fall within the scope of the invention.
Example 1
According to the present invention, a ranging apparatus based on an image sensor capable of dynamically adjusting pixel area output, the ranging apparatus comprises: the system comprises a laser emitter, a linear array CMOS image sensor, a processor and a memory; the memory has stored thereon computer readable instructions.
As shown in fig. 1, the computer readable instructions when executed by the processor implement the steps of:
s100, acquiring the movement direction of the object to be detected.
Optionally, the movement direction of the object to be measured is obtained through movement direction information of the object to be measured input by a user. It should be understood that the user knows the application scenario of the laser triangulation sensor in advance, that is, the user has a pre-judgment on the movement direction of the object to be measured by using the laser triangulation sensor, so the user may input the movement direction information of the object to be measured before executing S100.
S200, if the movement direction of the object to be detected is the direction along the laser beam emitted by the laser emitter, the process proceeds to S300.
According to the invention, if the movement direction of the object to be measured is the direction perpendicular to the laser beam emitted by the laser emitter, the S300-S900 is not executed any more, and the centroid position of the laser spot still needs to be determined according to all the pixel points of the linear array CMOS image sensor.
S300, acquiring voltage data of the CMOS image sensor at the first sampling moment, wherein the voltage data of the CMOS image sensor at the first sampling moment comprises voltages of all pixel points of the CMOS image sensor at the first sampling moment.
According to the present invention, the voltage data of the CMOS image sensor at the first sampling time in S300 is U 1 ，U 1 =((u 1 1,1 ,u 1 1,2 ,…,u 1 1,m ,…,u 1 1,M ),(u 1 2,1 ,u 1 2,2 ,…,u 1 2,m ,…,u 1 2,M ),…,(u 1 n,1 ,u 1 n,2 ,…,u 1 n,m ,…,u 1 n,M ),…,(u 1 N,1 ,u 1 N,2 ,…,u 1 N,m ,…,u 1 N,M ))；(u 1 n,1 ,u 1 n,2 ,…,u 1 n,m ,…,u 1 n,M ) The voltage of the pixel point of the nth row of the CMOS image sensor at the first sampling moment, u 1 n,m The voltage of the pixel points of the nth row and the mth column of the CMOS image sensor at the first sampling moment is obtained, the value range of N is 1 to N, N is the total number of rows of the pixel points included in the CMOS image sensor, the value range of M is 1 to M, and M is the total number of columns of the pixel points included in the CMOS image sensor.
For example, the CMOS image sensor is a 4-line CMOS image sensor, and then the CMOS image sensor includes a total number n=4 of rows of pixels; if the number of pixels included in each row is 4096, then m=4096.
S400, acquiring a first target pixel column number interval [ B, D ] according to voltage data of the CMOS image sensor at the first sampling moment, wherein B is the minimum value of the column numbers of all pixel points meeting a first preset condition in all pixel points of the CMOS image sensor at the first sampling moment, D is the maximum value of the column numbers of all pixel points meeting the first preset condition in all pixel points of the CMOS image sensor at the first sampling moment, and the first preset condition is that the corresponding voltage is larger than a preset voltage threshold value.
According to the invention, the voltage threshold is used for filtering noise, and when the voltage of a certain pixel point is larger than the voltage threshold, the position corresponding to the pixel point is judged not to receive the laser reflected by the surface of the object to be detected; otherwise, judging that the position corresponding to the pixel point can receive the laser reflected by the surface of the object to be detected; the voltage threshold is set according to an empirical value.
According to the invention, the method for acquiring the first target pixel column number interval [ B, D ] comprises the following steps:
s410, traversing U 1 Acquisition (u) 1 n,1 ,u 1 n,2 ,…,u 1 n,m ,…,u 1 n,M ) Corresponding first pixel column number interval [l n,1 ,l n,2 ]，l n,1 The minimum value of the column numbers of all pixel points meeting the first preset condition in the nth row pixel points of the CMOS image sensor at the first sampling moment,l n,2 and the maximum value of the column numbers of all pixels meeting the first preset condition in the nth row pixel point of the CMOS image sensor at the first sampling moment.
S420, obtaining a first target pixel column number interval [ B, D ]]，B=min(l 1,1 ,l 2,1 ,…,l n,1 ,…,l N,1 )，D=max(l 1,2 ,l 2,2 ,…,l n,2 ,…,l N,2 ) Min () takes the minimum value and max () takes the maximum value.
S500, obtaining a monitoring pixel column number interval [ B-delta ]l,D+Δl]，ΔlFor a preset column number threshold or deltal= (D-B)/n, n is a positive integer of 2 or more.
Preferably, when deltalWhen the number of columns is a preset column threshold value, delta is not less than 5lAnd is less than or equal to 10. As proved by small batch experiments, when the delta is more than or equal to 5%lWhen the number of the monitoring pixel columns is less than or equal to 10, the range of the monitoring pixel column number interval can not only meet the requirement of acquiring a second target pixel column number interval [ C, E ]]And the corresponding calculation amount is relatively small.
Preferably, when deltalWhen= (D-B)/n, the method for obtaining n includes:
s510, a first variable k=2 is set.
S520, B- (D-B)/k and D+ (D-B)/k are obtained.
S530, if [ B- (D-B)/k ] <0 or [ D+ (D-B)/k ] > M, then k=k+1, repeating S520 until [ B- (D-B)/k ]. Gtoreq.0 and [ D+ (D-B)/k ]. Ltoreq.M.
S540, obtaining n as k.
The S510-S540 can obtain a relatively large number of monitor pixel columns under the premise of ensuring that the number of monitor pixel columns does not exceed the number of pixel columns, so as to meet the requirement of obtaining the second target number of pixel columns [ C, E ].
S600, acquiring voltage data of a CMOS image sensor at a second sampling moment, wherein the voltage data of the CMOS image sensor at the second sampling moment comprises the voltage of a first target pixel point; the first target pixel point is the row number of all the pixel points of the CMOS image sensor at the second sampling time belonging to the monitoring pixel row number interval [ B-delta ]l,D+Δl]Is a pixel of (a) a pixel of (b).
Optionally, the time difference between the second sampling time and the first sampling time is 1 sampling period of the CMOS image sensor, the 1 sampling period is smaller, and the position of the light spot corresponding to the second sampling time is moved by a smaller distance than the position of the light spot corresponding to the first sampling time, so that the B-delta of the CMOS image sensor based on the second sampling timelColumn to D+deltalThe column may acquire subsequent C and E.
According to the invention, the voltage data of the CMOS image sensor at the second sampling moment is U 2 ，U 2 =((u 2 l1,B-Δ ,u 2 l1,B-Δ+1 ,…,u 2 1,b ,…,u 2 l1,D+Δ ),(u 2 l2,B-Δ ,u 2 l2,B-Δ+1 ,…,u 2 2,b ,…,u 2 l2,D+Δ ),…,(u 2 ln,B-Δ ,u 2 ln,B-Δ+1 ,…,u 2 n,b ,…,u 2 ln,D+Δ ),…,(u 2 lN,B-Δ ,u 2 lN,B-Δ+1 ,…,u 2 N,b ,…,u 2 lN,D+Δ ))；(u 2 ln,B-Δ ,u 2 ln,B-Δ+1 ,…,u 2 n,b ,…,u 2 ln,D+Δ ) A voltage of a pixel point of a second target column of an nth row of the CMOS image sensor at a second sampling time, u 2 n,b The value range of B is B-delta for the voltage of the pixel point of the nth row and the B column of the CMOS image sensor at the second sampling momentlTo D+deltalThe method comprises the steps of carrying out a first treatment on the surface of the The second target column is B-deltalColumn to D+deltalColumns.
S700, acquiring a second target pixel column number interval [ C, E ] according to the voltage data of the CMOS image sensor at the second sampling moment, wherein C is the minimum value of the columns of all pixel points meeting the first preset condition in the first target pixel points, and E is the maximum value of the columns of all pixel points meeting the first preset condition in the first target pixel points.
According to the present invention, the method for acquiring the second target pixel column number section [ C, E ] includes:
s710, traversing U 2 Acquisition (u) 2 ln,B-Δ ,u 2 ln,B-Δ+1 ,…,u 2 n,b ,…,u 2 ln,D+Δ ) Corresponding second pixel column number interval [ f n,1 ,f n,2 ]，f n,1 The minimum value of the columns of all pixel points meeting the first preset condition in the pixel points of the second target column of the nth row of the CMOS image sensor at the second sampling moment, f n,2 And the maximum value of the columns of all pixel points meeting the first preset condition in the pixel points of the second target column of the nth row of the CMOS image sensor at the second sampling moment.
S720, obtaining a second target pixel column number interval [ C, E ]]，C=min(f 1,1 ,f 2,1 ,…,f n,1 ,…,f N,1 )，E=max(f 1,2 ,f 2,2 ,…,f n,2 ,…,f N,2 )。
S800, the monitoring pixel column number interval [ B-delta ]l,D+Δl]Updated to [ H, R ]]The method comprises the steps of carrying out a first treatment on the surface of the When C>B and E>At D, h=b- Δl+S 1 ，R=D+Δl+S 1 The method comprises the steps of carrying out a first treatment on the surface of the When C<B and E<At D, h=b- Δl-S 1 ，R=D+Δl-S 1 ；S 1 For the second sampling time, the moving distance of the pixel column number interval is monitored compared with the first sampling time, S 1 =max(|C-B|,|E-D|)。
S900, acquiring the position of a facula centroid of the CMOS image sensor at a second sampling moment according to the position and voltage of a second target pixel point, wherein the position of the facula centroid is used for acquiring the distance between an object to be detected and a laser triangulation sensor; and the second target pixel point is a pixel point of which the column number in the pixel point of the CMOS image sensor at the second sampling moment belongs to an updated monitoring pixel column number interval [ H, R ].
As known to those skilled in the art, the process of obtaining the centroid position of the light spot based on the position of the pixel and the gray information is the prior art, and is not described herein again; after the pixel point for determining the centroid of the light spot is determined, any method for acquiring the distance between the object to be measured and the laser triangulation sensor based on the position of the centroid of the light spot acquired by the pixel point in the prior art falls into the protection scope of the invention.
The invention provides a distance measuring device based on an image sensor capable of dynamically adjusting pixel area output, which aims at an object to be measured moving along the direction of a laser beam emitted by a laser emitter and is characterized in that the distance measuring device is used for measuring the distance between first target pixel column numbers [ B, D ] corresponding to a first sampling moment]Acquiring a monitoring pixel column number interval [ B-delta ]l,D+Δl]First target pixel column number interval [ B, D]Corresponding to the position of the laser spot of the object to be detected at the first acquisition time, and monitoring the pixel columnNumber interval [ B-delta ]l,D+Δl]Is within the first target pixel column number interval [ B, D ]]Is extended on the basis of (a) a first target pixel column number interval [ B, D]Compared with the first target pixel column number interval [ B, D ]]Is wide in scope; for the second sampling moment, since the object to be measured is moved from the position of the object to be measured at the first sampling moment to the position of the object to be measured at the second sampling moment, the position of the laser spot at the second sampling moment is also obtained by the position movement of the laser spot at the first sampling moment, and based on the position movement of the laser spot at the second sampling moment, the second target pixel column number interval [ C, E ] is obtained]Instead of traversing the voltage values of the pixels of all columns as at the first sampling instant, only the column number belonging to the second target column (i.e. B-deltalColumn to D+deltalColumn) and based on the second target pixel column number interval [ C, E]Compared with the first target pixel column number interval [ B, D ]]The moving direction and the moving amplitude of the laser spot are obtained according to the position relation of the laser spot, and the monitoring pixel column number interval [ B-delta ] is obtained based on the moving direction and the moving amplitudel,D+Δl]Updated so that the laser light spot of the second sampling interval completely falls into the updated monitoring pixel column number interval [ H, R ]]Therefore, the invention does not need to acquire the position of the light spot centroid at the second sampling moment according to all the pixel points, but only needs to belong to the updated monitoring pixel column number interval [ H, R ] according to the column number]The position and the voltage of the pixel point of the (2) are used for determining the position of the centroid of the laser spot, so that the calculated amount in the process of determining the position of the centroid of the laser spot is reduced.
The position of the spot centroid of the CMOS image sensor at the second sampling moment is obtained based on the S100-S900, so that the calculated amount in the process of determining the position of the spot centroid at the second sampling moment is reduced; in order to reduce the calculation amount in the process of determining the positions of the spot centroids of other subsequent sampling moments, the invention adopts the same method as the method of S600-S900 to acquire the positions of the spot centroids of the third sampling moment and the subsequent sampling moment (namely, the sampling moment which is larger than the third sampling moment, such as the fourth sampling moment and the fifth sampling moment) of the CMOS image sensor, and a method for acquiring the positions of the spot centroids of the CMOS image sensor at the third sampling moment is taken as an example for description.
In order to obtain the location of the centroid of the spot of the CMOS image sensor at the third sampling instant, the computer readable instructions of the present invention when executed by the processor further implement the steps of:
s1000, obtaining the voltage U of the CMOS image sensor at the third sampling moment 3 =((u 3 1,H ,u 3 1,H+1 ,…,u 3 1,r ,…,u 3 1,R ),(u 3 2,H ,u 3 2,H+1 ,…,u 3 2,r ,…,u 3 2,R ),…,(u 3 n,H ,u 3 n,H+1 ,…,u 3 n,r ,…,u 3 n,R ),…,(u 3 N,H ,u 3 N,H+1 ,…,u 3 N,r ,…,u 3 N,R ))；(u 3 n,H ,u 3 n,H+1 ,…,u 3 n,r ,…,u 3 n,R ) A voltage of a pixel point of a third target column of an nth row of the CMOS image sensor at a third sampling time, u 3 n,r The voltage of the pixel point of the nth row and the nth column of the CMOS image sensor at the third sampling moment is the value range of R from H to R; the third target column is from the H column to the R column.
Optionally, the time difference between the third sampling time and the second sampling time is 1 sampling period of the CMOS image sensor, the 1 sampling period is smaller, and the position of the light spot corresponding to the third sampling time is moved by a smaller distance than the position of the light spot corresponding to the second sampling time, so that subsequent G and Q can be obtained from the H column to the R column of the CMOS image sensor based on the third sampling time.
S1100, traversing U 3 Acquisition (u) 3 n,H ,u 3 n,H+1 ,…,u 3 n,r ,…,u 3 n,R ) Corresponding third pixel column number interval [ p ] n,1 ,p n,2 ]，p n,1 The minimum value, p, of the columns of all pixel points meeting the first preset condition in the pixel points of a third target column of an nth row of the CMOS image sensor at the third sampling moment n,2 For the third sampling instant CMOSThe maximum value of the columns of all pixel points meeting the first preset condition in the pixel points of the third target column of the nth row of the image sensor.
S1200, obtaining a third target pixel column number interval [ G, Q ]]，G=min(p 1,1 ,p 2,1 ,…,p n,1 ,…,p N,1 )，Q=max(p 1,2 ,p 2,2 ,…,p n,2 ,…,p N,2 )。
S1300, the updated monitoring pixel column number interval [ H, R ]]Updated to [ V, W]The method comprises the steps of carrying out a first treatment on the surface of the When G>C and Q>At E, v=h+s 2 ，W=R+S 2 The method comprises the steps of carrying out a first treatment on the surface of the When G<C and Q<v=h-S at E 2 ，W=R-S 2 ；S 2 For the third sampling time, the moving distance of the pixel column number interval is monitored compared with the second sampling time, S 2 =max(|G-C|,|Q-E|)。
S1400, acquiring the position of the facula centroid of the CMOS image sensor at the third sampling moment according to the position and the voltage of the third target pixel point; and the third target pixel point is a pixel point of which the column number in the pixel point of the CMOS image sensor at the third sampling moment belongs to an updated monitoring pixel column number interval [ V, W ].
For the third sampling moment, because the object to be detected is moved from the position of the object to be detected at the second sampling moment to the position of the object to be detected at the third sampling moment, the position of the laser spot at the third sampling moment is also obtained by the position of the laser spot at the second sampling moment, and based on the position and the movement amplitude of the laser spot at the third sampling moment, the method for acquiring the third target pixel column number interval [ G, Q ] is not used for traversing the voltage values of the pixel points of all columns like the first sampling moment, but only traversing the voltage values of the pixel points of the column number belonging to the third target column, and based on the position relation of the third target pixel column number interval [ G, Q ] compared with the second target pixel column number interval [ C, E ], the movement direction and the movement amplitude are updated, and the laser spot at the third sampling interval completely falls into the updated monitoring pixel column number interval [ V, W ], so that the centroid of the laser spot at the third sampling moment can be determined only according to the position of the monitored pixel point of the column number belonging to the updated pixel column number [ V, W ] without determining the centroid of the laser spot in the laser spot position process.
Example two
The difference between this embodiment and the first embodiment is that: the method further comprises the following steps before S100:
s010, judging whether the distance between the object to be measured and the laser triangulation ranging sensor belongs to a preset distance interval [ h ] min ,h max ]。
It should be understood that the user knows the application scenario of the laser triangulation sensor in advance, that is, the user has a prejudgement about the range of the distance between the object to be measured and the laser triangulation sensor measured by the laser triangulation sensor, so the user can input the range of the distance between the object to be measured and the laser triangulation sensor before executing S010, by comparing the range of the distance with the preset distance interval [ h min ,h max ]Comparing to judge whether the distance between the object to be measured and the laser triangulation distance measuring sensor belongs to a preset distance interval [ h ] min ,h max ]In the manner of (a) according to the invention, only if the distance range belongs to a preset distance interval [ h ] min ,h max ]When the subinterval of (2) is included, the judging result is included; otherwise, the judging result is not included.
For example, a preset distance interval [ h ] min ,h max ]Is [5,10]The unit is cm; if the user inputs that the distance range of the object to be measured from the laser triangulation sensor is [6-8 ] before S010 is performed]If the unit is cm, the distance between the object to be detected and the laser triangulation ranging sensor is determined to be within a preset distance interval [ h ] min ,h max ]The method comprises the steps of carrying out a first treatment on the surface of the If the user inputs that the distance range of the object to be measured from the laser triangulation sensor is 3-5 before S010 is performed]If the unit is cm, the distance between the object to be detected and the laser triangulation ranging sensor is not within the preset distance interval [ h ] min ,h max ]。
S020, if the determination result is that it belongs, the flow proceeds to S030.
In the present embodiment, if the determination result is not in S020, S030 is not executed, but S100 is entered, and the steps of S100 to S900 in the first embodiment are executed.
S030, acquiring the spot centroid position of the CMOS image sensor according to a preset target pixel point; the preset target pixel points are pixel points of which the column numbers in the pixel points of the CMOS image sensor belong to a preset column number interval [ I, J ]; the acquisition method of I and J comprises the following steps:
s031, the distance between the acquired sample object and the laser triangulation ranging sensor is h min Sample pixel column number interval [ i ] corresponding to time min,1 ,i min,2 ]，i min,1 Distance h from sample object to laser triangle distance measuring sensor min The minimum value of the column number of all pixel points meeting the first preset condition in all pixel points of the CMOS image sensor, i min,2 Distance h from sample object to laser triangle distance measuring sensor min And the maximum value of the column numbers of all pixel points meeting the first preset condition in all pixel points of the CMOS image sensor.
S032, obtaining the distance h between the sample object and the laser triangulation ranging sensor max The corresponding sample pixel column number interval [ j ] max,1 ,j max,2 ]，j max,1 Distance h from sample object to laser triangle distance measuring sensor max Minimum value of column number of all pixel points meeting first preset condition in all pixel points of CMOS image sensor, j max,2 Distance h from sample object to laser triangle distance measuring sensor max And the maximum value of the column numbers of all pixel points meeting the first preset condition in all pixel points of the CMOS image sensor.
S033, obtaining preset column number intervals [ I, J ]]，I=min(i min,1 , j max,1 )，J=max(i min,2 , j max,2 )。
In this embodiment, the distance between the object to be measured and the laser triangulation ranging sensor belongs to a preset distance interval [ h ] min ,h max ]Under the condition of (1), the invention directly refers to the pixel point of the CMOS image sensor that the column number belongs to the preset column number areaM [ I, J]On the one hand, compared with all the pixels of the CMOS image sensor, the pixel of the CMOS image sensor has the column number belonging to the preset column number interval [ I, J ]]The number of the pixels is small, so that the calculation amount of a processor can be reduced; on the other hand, compared with the first embodiment, the number of columns in the pixel of the CMOS image sensor directly belongs to the preset column number interval [ I, J ]]The method for acquiring the spot centroid position of the CMOS image sensor by the pixel points is simpler and more effective, and the distance range which is suitable for the object to be detected and is from the triangular laser sensor is known and falls in a preset distance interval [ h ] min ,h max ]A scene within.
While certain specific embodiments of the invention have been described in detail by way of example, it will be appreciated by those skilled in the art that the above examples are for illustration only and are not intended to limit the scope of the invention. Those skilled in the art will also appreciate that many modifications may be made to the embodiments without departing from the scope and spirit of the invention. The scope of the invention is defined by the appended claims.

Claims (9)

1. A ranging device based on an image sensor capable of dynamically adjusting pixel area output, the ranging device comprising: the system comprises a laser emitter, a linear array CMOS image sensor, a processor and a memory; the memory has stored thereon computer readable instructions which when executed by the processor perform the steps of:
s100, acquiring the motion direction of an object to be detected;
s200, if the movement direction of the object to be detected is the direction along the laser beam emitted by the laser emitter, entering S300;
s300, acquiring voltage data of a first sampling time CMOS image sensor, wherein the voltage data of the first sampling time CMOS image sensor comprises voltages of all pixel points of the first sampling time CMOS image sensor;
s400, acquiring a first target pixel column number interval [ B, D ] according to voltage data of the CMOS image sensor at a first sampling moment, wherein B is the minimum value of the column numbers of all pixel points meeting a first preset condition in all pixel points of the CMOS image sensor at the first sampling moment, D is the maximum value of the column numbers of all pixel points meeting the first preset condition in all pixel points of the CMOS image sensor at the first sampling moment, and the first preset condition is that the corresponding voltage is larger than a preset voltage threshold;
s500, obtaining a monitoring pixel column number interval [ B-delta ]l,D+Δl]，ΔlFor a preset column number threshold or deltal= (D-B)/n, n is a positive integer of 2 or more;
s600, acquiring voltage data of a CMOS image sensor at a second sampling moment, wherein the voltage data of the CMOS image sensor at the second sampling moment comprises the voltage of a first target pixel point; the first target pixel point is the row number of all the pixel points of the CMOS image sensor at the second sampling time belonging to the monitoring pixel row number interval [ B-delta ]l,D+Δl]Is a pixel of (1);
s700, acquiring a second target pixel column number interval [ C, E ] according to voltage data of the CMOS image sensor at a second sampling moment, wherein C is the minimum value of the column numbers of all pixel points meeting a first preset condition in the first target pixel points, and E is the maximum value of the column numbers of all pixel points meeting the first preset condition in the first target pixel points;
s800, the monitoring pixel column number interval [ B-delta ]l,D+Δl]Updated to [ H, R ]]The method comprises the steps of carrying out a first treatment on the surface of the When C>B and E>At D, h=b- Δl+S 1 ，R=D+Δl+S 1 The method comprises the steps of carrying out a first treatment on the surface of the When C<B and E<At D, h=b- Δl-S 1 ，R=D+Δl-S 1 ；S 1 For the second sampling time, the moving distance of the pixel column number interval is monitored compared with the first sampling time, S 1 =max(|C-B|,|E-D|)；
S900, acquiring the position of a facula centroid of the CMOS image sensor at a second sampling moment according to the position and voltage of a second target pixel point, wherein the position of the facula centroid is used for acquiring the distance between an object to be detected and a laser triangulation sensor; and the second target pixel point is a pixel point of which the column number in the pixel point of the CMOS image sensor at the second sampling moment belongs to an updated monitoring pixel column number interval [ H, R ].
2. The distance measuring device of claim 1, wherein the voltage data of the CMOS image sensor at the first sampling time in S300 is U 1 ，U 1 =((u 1 1,1 ,u 1 1,2 ,…,u 1 1,m ,…,u 1 1,M ),(u 1 2,1 ,u 1 2,2 ,…,u 1 2,m ,…,u 1 2,M ),…,(u 1 n,1 ,u 1 n,2 ,…,u 1 n,m ,…,u 1 n,M ),…,(u 1 N,1 ,u 1 N,2 ,…,u 1 N,m ,…,u 1 N,M ))；(u 1 n,1 ,u 1 n,2 ,…,u 1 n,m ,…,u 1 n,M ) The voltage of the pixel point of the nth row of the CMOS image sensor at the first sampling moment, u 1 n,m The method comprises the steps that voltage of pixel points of an nth row and an mth column of the CMOS image sensor at a first sampling moment is obtained, the value range of N is 1 to N, N is the total number of rows of the pixel points included in the CMOS image sensor, the value range of M is 1 to M, and M is the total number of columns of the pixel points included in the CMOS image sensor; s400 includes:
s410, traversing U 1 Acquisition (u) 1 n,1 ,u 1 n,2 ,…,u 1 n,m ,…,u 1 n,M ) Corresponding first pixel column number interval [l n,1 ,l n,2 ]，l n,1 The minimum value of the column numbers of all pixel points meeting the first preset condition in the nth row pixel points of the CMOS image sensor at the first sampling moment,l n,2 the method comprises the steps that the maximum value of the column number of all pixel points meeting a first preset condition in the nth row pixel points of the CMOS image sensor at a first sampling moment is obtained;
s420, obtaining a first target pixel column number interval [ B, D ]]，B=min(l 1,1 ,l 2,1 ,…,l n,1 ,…,l N,1 )，D=max(l 1,2 ,l 2,2 ,…,l n,2 ,…,l N,2 ) Min () takes the minimum value and max () takes the maximum value.
3. The distance measuring device of claim 1, wherein the voltage data of the CMOS image sensor at the second sampling time in S600 is U 2 ，U 2 =((u 2 l1,B-Δ ,u 2 l1,B-Δ+1 ,…,u 2 1,b ,…,u 2 l1,D+Δ ),(u 2 l2,B-Δ ,u 2 l2,B-Δ+1 ,…,u 2 2,b ,…,u 2 l2,D+Δ ),…,(u 2 ln,B-Δ ,u 2 ln,B-Δ+1 ,…,u 2 n,b ,…,u 2 ln,D+Δ ),…,(u 2 lN,B-Δ ,u 2 lN,B-Δ+1 ,…,u 2 N,b ,…,u 2 lN,D+Δ ))；(u 2 ln,B-Δ ,u 2 ln,B-Δ+1 ,…,u 2 n,b ,…,u 2 ln,D+Δ ) A voltage of a pixel point of a second target column of an nth row of the CMOS image sensor at a second sampling time, u 2 n,b The value range of B is B-delta for the voltage of the pixel point of the nth row and the B column of the CMOS image sensor at the second sampling momentlTo D+deltalThe method comprises the steps of carrying out a first treatment on the surface of the The second target column is B-deltalColumn to D+deltalA column; s700 includes:
s710, traversing U 2 Acquisition (u) 2 ln,B-Δ ,u 2 ln,B-Δ+1 ,…,u 2 n,b ,…,u 2 ln,D+Δ ) Corresponding second pixel column number interval [ f n,1 ,f n,2 ]，f n,1 The columns of all pixel points meeting the first preset condition in the pixel points of the second target column of the nth row of the CMOS image sensor at the second sampling momentMinimum value, f n,2 The maximum value of the column numbers of all pixel points meeting the first preset condition in the pixel points of a second target column of an nth row of the CMOS image sensor at the second sampling moment;
s720, obtaining a second target pixel column number interval [ C, E ]]，C=min(f 1,1 ,f 2,1 ,…,f n,1 ,…,f N,1 )，E=max(f 1,2 ,f 2,2 ,…,f n,2 ,…,f N,2 )。
4. The distance measuring device based on the image sensor capable of dynamically adjusting the output of the pixel area according to claim 1, wherein in S500, when ΔlWhen= (D-B)/n, the method for obtaining n includes:
s510, setting a first variable k=2;
s520, B- (D-B)/k and D+ (D-B)/k are obtained;
s530, if [ B- (D-B)/k ] <0 or [ D+ (D-B)/k ] > M, then k=k+1, repeating S520 until [ B- (D-B)/k ]. Gtoreq.0 and [ D+ (D-B)/k ]. Ltoreq.M;
s540, obtaining n as k.
5. The distance measuring device based on the image sensor capable of dynamically adjusting the output of the pixel area according to claim 1, wherein in S500, when ΔlWhen the number of columns is a preset column threshold value, delta is not less than 5l≤10。
6. The distance measuring device based on the image sensor capable of dynamically adjusting the output of the pixel area according to claim 1, wherein the time difference between the second sampling time and the first sampling time is 1 sampling period of the CMOS image sensor.
7. The image sensor-based ranging device of claim 1, wherein the computer readable instructions when executed by the processor further implement the steps of:
s1000, obtaining the voltage U of the CMOS image sensor at the third sampling moment 3 =((u 3 1,H ,u 3 1,H+1 ,…,u 3 1,r ,…,u 3 1,R ),(u 3 2,H ,u 3 2,H+1 ,…,u 3 2,r ,…,u 3 2,R ),…,(u 3 n,H ,u 3 n,H+1 ,…,u 3 n,r ,…,u 3 n,R ),…,(u 3 N,H ,u 3 N,H+1 ,…,u 3 N,r ,…,u 3 N,R ))；(u 3 n,H ,u 3 n,H+1 ,…,u 3 n,r ,…,u 3 n,R ) A voltage of a pixel point of a third target column of an nth row of the CMOS image sensor at a third sampling time, u 3 n,r The voltage of the pixel point of the nth row and the nth column of the CMOS image sensor at the third sampling moment is the value range of R from H to R; the third target column is from an H column to an R column;
s1100, traversing U 3 Acquisition (u) 3 n,H ,u 3 n,H+1 ,…,u 3 n,r ,…,u 3 n,R ) Corresponding third pixel column number interval [ p ] n,1 ,p n,2 ]，p n,1 The minimum value, p, of the columns of all pixel points meeting the first preset condition in the pixel points of a third target column of an nth row of the CMOS image sensor at the third sampling moment n,2 The maximum value of the column numbers of all pixel points meeting the first preset condition in the pixel points of a third target column of an nth row of the CMOS image sensor at the third sampling moment;
s1200, obtaining a third target pixel column number interval [ G, Q ]]，G=min(p 1,1 ,p 2,1 ,…,p n,1 ,…,p N,1 )，Q=max(p 1,2 ,p 2,2 ,…,p n,2 ,…,p N,2 )；
S1300, the updated monitoring pixel column number interval [ H, R ]]Updated to [ V, W]The method comprises the steps of carrying out a first treatment on the surface of the When G>C and Q>At E, v=h+s 2 ，W=R+S 2 The method comprises the steps of carrying out a first treatment on the surface of the When G<C and Q<v=h-S at E 2 ，W=R-S 2 ；S 2 For the third sampling time, the moving distance of the pixel column number interval is monitored compared with the second sampling time, S 2 =max(|G-C|,|Q-E|)；
S1400, acquiring the position of the facula centroid of the CMOS image sensor at the third sampling moment according to the position and the voltage of the third target pixel point; and the third target pixel point is a pixel point of which the column number in the pixel point of the CMOS image sensor at the third sampling moment belongs to an updated monitoring pixel column number interval [ V, W ].
8. The distance measuring device based on the image sensor capable of dynamically adjusting the output of the pixel area according to claim 7, wherein the time difference between the third sampling instant and the second sampling instant is 1 sampling period of the CMOS image sensor.
9. The ranging device based on the image sensor capable of dynamically adjusting the pixel area output according to claim 1, wherein in S100, the movement direction of the object to be measured is obtained through the movement direction information of the object to be measured input by the user.
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Citations (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2002082545A1 (en) * 2001-04-05 2002-10-17 Johns Hopkins University A dual pixel-type array for imaging and motion centroid localization
CN102128608A (en) * 2010-12-07 2011-07-20 北京航空航天大学 Highly dynamic two-dimensional attitude angle measuring method and system
US20220018943A1 (en) * 2019-04-04 2022-01-20 Huawei Technologies Co., Ltd. Ranging Method, Radar, and Vehicle-Mounted Radar
CN114460594A (en) * 2022-04-14 2022-05-10 宜科(天津)电子有限公司 Image denoising method based on triangular ranging
CN114494407A (en) * 2022-04-14 2022-05-13 宜科(天津)电子有限公司 Image processing method for distance measurement
CN115639571A (en) * 2022-10-31 2023-01-24 哈尔滨工业大学 Streak tube imaging laser radar image coordinate correction method and device
CN115994935A (en) * 2022-11-07 2023-04-21 山东大学 Light spot centroid determination method and system applied to laser communication
CN116068568A (en) * 2023-04-07 2023-05-05 天津宜科自动化股份有限公司 Data processing system for obtaining object distance

Patent Citations (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2002082545A1 (en) * 2001-04-05 2002-10-17 Johns Hopkins University A dual pixel-type array for imaging and motion centroid localization
CN102128608A (en) * 2010-12-07 2011-07-20 北京航空航天大学 Highly dynamic two-dimensional attitude angle measuring method and system
US20220018943A1 (en) * 2019-04-04 2022-01-20 Huawei Technologies Co., Ltd. Ranging Method, Radar, and Vehicle-Mounted Radar
CN114460594A (en) * 2022-04-14 2022-05-10 宜科(天津)电子有限公司 Image denoising method based on triangular ranging
CN114494407A (en) * 2022-04-14 2022-05-13 宜科(天津)电子有限公司 Image processing method for distance measurement
CN115639571A (en) * 2022-10-31 2023-01-24 哈尔滨工业大学 Streak tube imaging laser radar image coordinate correction method and device
CN115994935A (en) * 2022-11-07 2023-04-21 山东大学 Light spot centroid determination method and system applied to laser communication
CN116068568A (en) * 2023-04-07 2023-05-05 天津宜科自动化股份有限公司 Data processing system for obtaining object distance

Non-Patent Citations (2)

* Cited by examiner, † Cited by third party
Title
王雪松: "基于近红外CMOS的激光光斑质心检测系统设计", 红外技术, vol. 43, no. 008 *
钱方;孙涛;郭劲;王挺峰: "基于光斑与图像特征的动态激光干扰效果评估", 中国激光, no. 006 *

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