CN116577557A - On-line noise source impedance measuring method for high-voltage power electronic equipment - Google Patents
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Abstract
The application provides an online noise source impedance measuring method of high-voltage power electronic equipment, which comprises the following steps: selecting a parameter measurement mode according to the impedance range of the tested equipment; constructing a measuring clamp based on a measuring environment, and measuring S parameters of the measuring clamp in a selected mode by a measuring instrument; isolating a power circuit of the tested device from a measuring circuit of a measuring instrument through a measuring clamp, providing an adaptive interface for the tested device to fix the tested device, and measuring the tested device in the same way by using the measuring instrument; performing de-embedding processing on the tested equipment based on the S parameter matrix of the measuring clamp, and updating the S parameter matrix of the equipment; and calculating according to the selected mode and the updated S parameter matrix to obtain equipment impedance, and establishing an electromagnetic interference propagation impedance model based on the equipment impedance to carry out electromagnetic compatibility design. The application adopting the scheme establishes the electromagnetic interference propagation path impedance model by measuring the equipment impedance on line, is beneficial to the electromagnetic compatibility design of equipment and saves the electromagnetic compatibility test time and cost.
Description
Technical Field
The application relates to the technical field of power electronics and electromagnetic compatibility, in particular to a method and a device for measuring the impedance of an online noise source of high-voltage power electronic equipment.
Background
Electromagnetic interference emission compliance is a key ring of product verification and is a necessary step before mass production verification. The establishment of the impedance model of the electromagnetic interference propagation path is beneficial to electromagnetic compatibility design. The electromagnetic compatibility test time and cost are very expensive, and the defects of the electromagnetic interference suppression design can be found in advance before the electromagnetic compatibility test by online measurement. However, power electronics operate in high voltage, high current environments, limited by the measurement range of the instrument, and it is difficult to perform on-line impedance measurements.
In commercial end products, de-tech companies provide multiple impedance test fixtures for individual devices of different packages. Two types are specifically classified, wherein the first type of clamp depends on the equipment itself to be provided with a direct current bias source, and the direct current bias voltage provided by the clamp is not more than 42V voltage provided by an instrument; the second clamp has an additional interface, is connected with an external current source or a voltage source as a bias source, and can measure impedance under the condition that the bias voltage is not more than 200V at maximum.
In academic research, researchers have proposed an on-line impedance measurement method based on a high current injection probe that requires two current probes, one for injecting sinusoidal perturbations and one for receiving responses to complete the measurement. However, the current probe has high cost and occupies a large volume, and when in measurement, a long lead wire passing through two probes needs to be welded on a measured element, so that extra line self-inductance is introduced, and the self-inductance is difficult to measure and eliminate.
In summary, it is difficult to measure the device impedance at high voltage and high current on line, which is a technical problem to be solved at present.
Disclosure of Invention
The present application aims to solve at least one of the technical problems in the related art to some extent.
Therefore, a first object of the present application is to provide an online noise source impedance measurement method for a high-voltage power electronic device, which solves the technical problem that the existing method is difficult to perform online impedance measurement in an environment where the power electronic device works under high voltage and high current, realizes online measurement of the device impedance, can establish an accurate electromagnetic interference propagation path impedance model, is beneficial to electromagnetic compatibility design of the device, and saves electromagnetic compatibility test time and cost.
A second object of the present application is to propose a measuring clamp for high voltage power electronics.
The third object of the application is to provide an online noise source impedance measuring device for high-voltage power electronic equipment.
To achieve the above object, an embodiment of a first aspect of the present application provides an online noise source impedance measurement method for a high-voltage electronic device, including: selecting a parameter measurement mode according to the impedance range of the tested equipment; constructing a measuring clamp corresponding to the tested equipment based on voltage bias and current bias of a measuring environment, and measuring S parameters of the measuring clamp by using a parameter measuring mode through a measuring instrument to obtain an S parameter matrix corresponding to each part of devices of the measuring clamp, wherein the measuring clamp comprises a phase stabilizing cable, a high-voltage broadband straight-off device, a coaxial cable and an adaptation clamp of the tested equipment; isolating a power circuit of the tested equipment and a measuring circuit of a measuring instrument through the measuring clamp, providing an adaptive interface for the tested equipment through the measuring clamp to fix the tested equipment, and measuring S parameters of the tested equipment in a parameter measuring mode by using the measuring instrument to obtain an S parameter matrix of the tested equipment; performing de-embedding processing on the tested equipment based on the S parameter matrix corresponding to the high-voltage broadband straight-stop, the coaxial cable and the tested equipment adapting clamp obtained by measurement, and updating the S parameter matrix of the tested equipment; and calculating according to the parameter measurement mode and the updated S parameter matrix of the tested equipment to obtain the impedance of the tested equipment, and establishing an electromagnetic interference propagation impedance model based on the impedance of the tested equipment to carry out electromagnetic compatibility design.
According to the online noise source impedance measurement method for the high-voltage electronic equipment, disclosed by the embodiment of the application, the problem that the power electronic equipment is limited by the measurement range of an instrument and is difficult to perform online impedance measurement in a high-voltage and high-current working environment is solved by utilizing the characteristic that the broadband high-voltage DC blocker is used for blocking a direct-current signal and allowing a radio-frequency signal to pass. By measuring the impedance of the equipment on line, an impedance model of an electromagnetic interference propagation path is established, which is beneficial to the electromagnetic compatibility design of the equipment and saves the electromagnetic compatibility test time and cost.
Optionally, in one embodiment of the present application, the parameter measurement mode includes an improved parallel method, an improved series method, and an improved reflection method based on electric field isolation, and the parameter measurement mode is selected according to an impedance range of the device under test, including:
if the device of the tested equipment is a low-impedance device, adopting an improved parallel communication method to measure parameters;
if the device of the tested equipment is a high-impedance device, adopting an improved series method to measure parameters;
and if the device of the tested equipment is a resistive device, adopting an improved reflection method to measure parameters.
Optionally, in one embodiment of the application, the impedance measured by the modified parallel method is Z PT The corresponding normalized impedance is expressed asThe corresponding normalized impedance matrix and the updated S-parameter matrix are respectively expressed as:
improved series-pass impedance Z ST The corresponding normalized impedance is expressed asThe corresponding normalized admittance matrix and the updated S-parameter matrix are respectively expressed as:
impedance measured by improved reflection method is Z Re The corresponding normalized impedance is expressed asThe corresponding updated S-parameter matrix is expressed as:
optionally, in an embodiment of the present application, the de-embedding process is performed on the tested device based on the measured S parameter matrix corresponding to the high-voltage broadband dc-dc converter, the coaxial cable and the tested device adapting fixture, and updating the S parameter matrix of the tested device includes:
calibrating the connection part of the phase stabilization cable and the high-voltage broadband straight separator, and moving a reference plane from an S parameter test port of the measuring instrument to an outlet of the phase stabilization cable;
according to the measured S parameter matrix corresponding to the tested equipment, the high-voltage broadband straight-stop, the coaxial cable and the tested equipment adapting clamp, the S parameter matrix is converted into a T parameter matrix in the same mode;
calculating to obtain an actual T parameter matrix T of the tested equipment based on the T parameter matrix and the parameter measurement mode REAL And calculating an actual S parameter matrix S of the tested equipment according to the actual T parameter matrix REAL And taking the actual S parameter matrix as an updated S parameter matrix.
Optionally, in an embodiment of the present application, a calculation method for converting an S parameter matrix corresponding to the measured device under test, the high-voltage broadband isolator, the coaxial cable, and the device under test adapting fixture into a T parameter matrix is expressed as:
wherein S is 11 Indicating the reflection coefficient of port 1, S, when device port 2 is matched 12 Representing the transmission coefficients from port 2 to port 1 when device port 1 is matched, S 21 Representing the transmission coefficients of port 1 to port 2 when device port 2 is matched, S 22 Representing the reflection coefficient of port 2 when device port 1 is mated, S representing the S parameter matrix of the device, T representing the T parameter matrix of the device,
if the parameter measurement mode is an improved parallel operation method, the actual T parameter matrix of the measured equipment is expressed as:
if the parameter measurement mode is the improved collusion method, the actual T parameter matrix of the tested equipment is expressed as:
if the parameter measurement mode is an improved reflection method, the network T parameter matrix of the connection of the high-voltage broadband isolator and the coaxial cable is recorded as:
the actual S-parameter matrix of the device under test is expressed as:
wherein T is DC-Block1 、T PS-Cable1 、T DUT-Fix1 T parameter matrix representing high-voltage broadband straight-blocking device, coaxial cable and tested equipment adapting clamp on tested equipment port 1 side, T MEAR Representing measured testT parameter matrix corresponding to standby S parameter matrix, T DC-Block2 、T PS-Cable2 、T DUT-Fix2 T parameter matrix representing high-voltage broadband straight-blocking device on port 2 side of tested device, coaxial cable and tested device adapting clamp, S MEAR Representing the measured S parameter matrix, T of the tested equipment 11 Representing the first row and first column elements, T, in a T parameter matrix of a high-voltage broadband repeater and a coaxial cable cascade network 12 Representing the first row and the second column elements in the T parameter matrix of the high-voltage broadband repeater and the coaxial cable cascade network, T 21 Representing the first column element of the second row in the T parameter matrix of the high-voltage broadband repeater and the coaxial cable cascade network, T 22 Representing a second row and a second column of elements in the T parameter matrix of the high-voltage broadband repeater and the coaxial cable cascade network;
the calculation method for converting the actual T parameter matrix of the tested equipment into the actual S parameter matrix is expressed as follows:
wherein T is 11 Representing the first row and first column elements, T, in the actual T parameter matrix of the device under test 12 Representing the first row and the second column elements in the actual T parameter matrix of the tested device, T 21 Representing the second row and first column elements in the actual T parameter matrix of the device under test, T 22 Representing the second row and column elements in the actual T-parameter matrix of the device under test.
Optionally, in an embodiment of the present application, calculating the impedance of the device under test according to the parameter measurement mode and the updated S-parameter matrix of the device under test includes:
if the parameter measurement mode is an improved parallel connection method, the impedance Z of the tested equipment PT Expressed as:
wherein S is 11 Representing a test objectPreparing the first row and first column elements in the updated S parameter matrix, S 12 Representing the first row and second column elements in the updated S-parameter matrix of the device under test.
If the parameter measurement mode is the improved series method, the impedance Z of the measured equipment ST Expressed as:
wherein S is 11 Representing the first row and first column elements in the updated S parameter matrix of the tested device, S 12 Representing the first row and second column elements in the updated S-parameter matrix of the device under test.
If the parameter measurement mode is an improved reflection method, the impedance Z of the measured equipment Re Expressed as:
wherein S is 11 Representing updated S-parameter matrix S of tested equipment REAL 。
To achieve the above object, a second aspect of the present application provides a measurement fixture for high voltage power electronic equipment, which is based on voltage bias and current bias construction of a measurement environment, and comprises a phase stabilizing cable, a high voltage broadband isolator, a coaxial cable and a device under test adapting fixture, wherein,
the high-voltage broadband direct-current isolator is used for isolating the measuring circuit from the power electronic high-voltage high-current circuit;
the phase stabilization cable is used for connecting the vector network analyzer and the high-voltage broadband straight-blocking device;
the coaxial cable is used for connecting the high-voltage broadband straight-blocking device and the equipment to be tested or the equipment to be tested is matched with the clamp;
the tested device is matched with the clamp and used for fixing the tested device.
In order to achieve the above object, an embodiment of a third aspect of the present application provides an online noise source impedance measurement device for a high-voltage power electronic device, which includes a selection module, a first parameter measurement module, a second parameter measurement module, a de-embedding processing module, and an impedance generation module,
the selection module is used for selecting a parameter measurement mode according to the impedance range of the tested equipment;
the first parameter measurement module is used for constructing a measurement clamp corresponding to the tested equipment based on voltage bias and current bias of a measurement environment, and carrying out S parameter measurement on the measurement clamp by using a parameter measurement mode through a measurement instrument to obtain an S parameter matrix corresponding to each part of devices of the measurement clamp, wherein the measurement clamp comprises a phase stabilizing cable, a high-voltage wide-frequency straightener, a coaxial cable and an adaptation clamp of the tested equipment;
the second parameter measurement module is used for isolating a power circuit of the tested equipment from a measurement circuit of the measuring instrument through the measuring clamp, providing an adaptive interface for the tested equipment through the measuring clamp to fix the tested equipment, and measuring S parameters of the tested equipment in a parameter measurement mode by using the measuring instrument to obtain an S parameter matrix of the tested equipment;
the de-embedding processing module is used for performing de-embedding processing on the tested equipment based on the S parameter matrix corresponding to the high-voltage broadband straight-bar, the coaxial cable and the tested equipment adapting clamp obtained through measurement, and updating the S parameter matrix of the tested equipment;
the impedance generation module is used for calculating the impedance of the tested equipment according to the parameter measurement mode and the updated S parameter matrix of the tested equipment, and establishing an electromagnetic interference propagation impedance model based on the impedance of the tested equipment to carry out electromagnetic compatibility design.
Additional aspects and advantages of the application will be set forth in part in the description which follows and, in part, will be obvious from the description, or may be learned by practice of the application.
Drawings
The foregoing and/or additional aspects and advantages of the application will become apparent and readily appreciated from the following description of the embodiments, taken in conjunction with the accompanying drawings, in which:
FIG. 1 is a flow chart of an online noise source impedance measurement method for a high voltage power electronic device according to an embodiment of the present application;
FIG. 2 is a hardware connection diagram of an online noise source impedance measurement method for a high-voltage electronic device according to an embodiment of the present application;
FIG. 3 is a circuit diagram of an improved parallel-through method based on electric field isolation in accordance with an embodiment of the present application;
FIG. 4 is a circuit diagram of an improved series-through method based on electric field isolation in accordance with an embodiment of the present application;
FIG. 5 is a circuit diagram of an improved reflection method based on electric field isolation according to an embodiment of the present application;
FIG. 6 is a graph of S-parameters of a high-voltage broadband retarder according to an embodiment of the present application;
FIG. 7 is a graph showing the S-parameter curve of the parallel straight-through method for measuring different capacitance impedances according to an embodiment of the present application
FIG. 8 is a graph of S-parameters of the series through method for measuring different inductance impedances according to an embodiment of the present application;
FIG. 9 is a graph showing S-parameter curves of the reflection method for measuring different capacitance impedances according to the embodiment of the application;
FIG. 10 is a graph showing S-parameter curves of the reflection method for measuring different inductance impedances according to the embodiment of the application;
FIG. 11 is a diagram of a device under test adapter fixture designed for a chip package device based on an improved parallel-through approach in accordance with an embodiment of the present application;
fig. 12 is a diagram of a device under test adapting jig designed for a chip package device based on an improved series-through method according to an embodiment of the present application;
FIG. 13 is a diagram of a fixture for adapting a device under test designed for a chip package by reflection in accordance with an embodiment of the present application;
FIG. 14 is a diagram of a de-embedding model for online impedance measurement according to an embodiment of the present application;
FIG. 15 is a graph of the actual capacitive impedance obtained after de-embedding according to an embodiment of the present application;
FIG. 16 is a graph of the actual inductance and impedance obtained after de-embedding according to an embodiment of the present application;
FIG. 17 is a schematic diagram of a common mode electromagnetic interference propagation impedance model of a power electronic device according to an embodiment of the present application;
FIG. 18 is a schematic diagram of a differential mode electromagnetic interference propagation impedance model of a power electronic device according to an embodiment of the present application;
FIG. 19 is a schematic diagram of an electromagnetic interference propagation impedance model of a power electronic device according to an embodiment of the present application;
fig. 20 is a schematic structural diagram of an online noise source impedance measurement device for a high-voltage power electronic device according to an embodiment of the present application.
Detailed Description
Embodiments of the present application are described in detail below, examples of which are illustrated in the accompanying drawings, wherein like or similar reference numerals refer to like or similar elements or elements having like or similar functions throughout. The embodiments described below by referring to the drawings are illustrative and intended to explain the present application and should not be construed as limiting the application.
The method and the device for measuring the impedance of the online noise source of the high-voltage power electronic equipment are described below with reference to the accompanying drawings.
Fig. 1 is a flow chart of an online noise source impedance measurement method for a high-voltage power electronic device according to an embodiment of the application.
As shown in fig. 1, the method for measuring the impedance of the on-line noise source of the high-voltage power electronic equipment comprises the following steps:
step 101, selecting a parameter measurement mode according to the impedance range of the tested equipment;
102, constructing a measuring clamp corresponding to tested equipment based on voltage bias and current bias of a measuring environment, and measuring S parameters of the measuring clamp by using a parameter measuring mode through a measuring instrument to obtain an S parameter matrix corresponding to each part of devices of the measuring clamp, wherein the measuring clamp comprises a phase stabilizing cable, a high-voltage broadband straight-blocking device, a coaxial cable and an adaptation clamp of the tested equipment;
step 103, isolating a power circuit of the tested device from a measuring circuit of a measuring instrument through the measuring clamp, providing an adaptive interface for the tested device through the measuring clamp to fix the tested device, and measuring S parameters of the tested device in a parameter measuring mode by using the measuring instrument to obtain an S parameter matrix of the tested device;
step 104, performing de-embedding processing on the tested equipment based on the S parameter matrix corresponding to the high-voltage broadband straight-bar, the coaxial cable and the tested equipment adapting clamp obtained by measurement, and updating the S parameter matrix of the tested equipment;
and 105, calculating to obtain the impedance of the tested equipment according to the parameter measurement mode and the updated S parameter matrix of the tested equipment, and establishing an electromagnetic interference propagation impedance model based on the impedance of the tested equipment to carry out electromagnetic compatibility design.
According to the online noise source impedance measurement method for the high-voltage electronic equipment, disclosed by the embodiment of the application, the problem that the power electronic equipment is limited by the measurement range of an instrument and is difficult to perform online impedance measurement in a high-voltage and high-current working environment is solved by utilizing the characteristic that the broadband high-voltage DC blocker is used for blocking a direct-current signal and allowing a radio-frequency signal to pass. By measuring the impedance of the equipment on line, an impedance model of an electromagnetic interference propagation path is established, which is beneficial to the electromagnetic compatibility design of the equipment and saves the electromagnetic compatibility test time and cost.
Fig. 2 is a hardware connection diagram of an online noise source impedance measurement method for a high-voltage electronic device according to an embodiment of the present application. The vector network analyzer is connected with the measuring clamp, and the measuring clamp comprises a phase stabilizing cable, a high-voltage broadband straight-blocking device, a coaxial cable, a tested device adapting clamp and the like.
Optionally, in one embodiment of the present application, the parameter measurement mode includes an improved parallel method, an improved series method, and an improved reflection method based on electric field isolation, and the parameter measurement mode is selected according to an impedance range of the device under test, including:
if the device of the tested equipment is a low-impedance device, adopting an improved parallel communication method to measure parameters;
if the device of the tested equipment is a high-impedance device, adopting an improved series method to measure parameters;
and if the device of the tested equipment is a resistive device, adopting an improved reflection method to measure parameters.
For example, FIGS. 3, 4 and 5 illustrate embodiments of the present application based on electric field isolationImproved parallel-through method, improved series-through method, and improved reflection method circuit diagram. And selecting a proper measuring method from an improved parallel-through method, an improved series-through method and an improved reflection method based on electric field isolation according to the impedance range of the tested equipment to measure the S parameters, so as to obtain a complex matrix corresponding to the S parameters. S parameter measurement is carried out on the tested equipment in a selected parameter measurement mode, and a complex matrix S corresponding to the S parameter is obtained MEAR The S parameter matrix obtained by the improved parallel operation method is recorded as S MEAR-PT Improved collusion method is S MEAR-ST Improved reflection method of S MEAR-Re ；
Fig. 6, fig. 7, fig. 8, fig. 9, fig. 10 are S-parameter graphs of the device to be measured by different measurement methods according to the present embodiment, in which fig. 6 is an S-parameter graph of the high-voltage broadband dc-blocking device according to the present embodiment, fig. 7 is an S-parameter graph of the parallel straight-through method according to the present embodiment for measuring different capacitance impedances, fig. 8 is an S-parameter graph of the serial straight-through method according to the present embodiment for measuring different inductance impedances, fig. 9 is an S-parameter graph of the reflection method according to the present embodiment for measuring different capacitance impedances, and fig. 10 is an S-parameter graph of the reflection method according to the first embodiment for measuring different inductance impedances.
Optionally, in one embodiment of the application, the impedance measured by the modified parallel method is Z PT The corresponding normalized impedance is expressed asThe corresponding normalized impedance matrix and the updated S-parameter matrix are respectively expressed as:
improved series-pass impedance Z ST The corresponding normalized impedance is expressed asThe corresponding normalized admittance matrix and the updated S-parameter matrix are respectively expressed as:
impedance measured by improved reflection method is Z Re The corresponding normalized impedance is expressed asThe corresponding updated S-parameter matrix is expressed as:
optionally, in an embodiment of the present application, the measurement fixture includes a phase stabilizing cable, a high-voltage broadband retarder, a coaxial cable, a device under test adapting fixture, and the like, and fig. 11, fig. 12, and fig. 13 are respectively an electric field isolation improved parallel-through method, an improved serial-through method, and an improved reflection method of the present embodiment, where the device under test adapting fixture is an adapting fixture of a patch type device, and a discrete device adapting fixture and a power electronic interface adapting fixture can be designed in the same manner.
Fig. 14 is a diagram showing a de-embedding model for on-line impedance measurement according to the present embodiment, as shown in fig. 14, the de-embedding process is performed on the device under test based on the measured S parameter matrix corresponding to the high-voltage broadband isolator, the coaxial cable, and the device under test adapting fixture, the S parameter matrix of the device under test is updated to eliminate the influence of the measuring fixture,
s parameter matrixes corresponding to the high-voltage broadband straight-blocking device, the coaxial cable and the tested equipment adapting clamp are S respectively DC-Block 、S PS-Cable 、S DUT-Fix For a pair ofThe corresponding T parameter matrix is T respectively DC-Block 、T PS-Cable 、T DUT-Fix . The S parameter matrix through the embedded processing is the actual S parameter matrix S of the tested equipment REAL The S parameter matrix after improvement and passing through the past embedding process is marked as S REAL-PT Improved collusion method is S REAL-ST Improved reflection method of S REAL-Re The de-embedding process is to respectively solve the impedance model according to the high-voltage broadband straight-bar, the coaxial cable and the S parameter matrix of the tested equipment adapting fixture. If the measured component exceeds the range of the vector network analyzer, impedance compensation is required for the impedance of the component. The de-embedding process comprises the following specific steps:
calibrating the connection part of the phase stabilization cable and the high-voltage broadband straight separator, and moving a reference plane from an S parameter test port of the measuring instrument to an outlet of the phase stabilization cable;
according to the measured S parameter matrix corresponding to the measured equipment, the high-voltage broadband straight-stop, the coaxial cable and the measured equipment adapting clamp, the S parameter matrix is converted into the T parameter matrix in the same way, namely S MEAR 、S DC-Block 、S PS-Cable 、S DUT-Fix Conversion to T MEAR 、T DC-Block 、T PS-Cable 、T DUT-Fix ；
Calculating to obtain an actual T parameter matrix T of the tested equipment based on the T parameter matrix and the parameter measurement mode REAL And calculating an actual S parameter matrix S of the tested equipment according to the actual T parameter matrix REAL And taking the actual S parameter matrix as an updated S parameter matrix.
For example, fig. 15 is an actual capacitance impedance obtained after the deblocking in the present embodiment, and fig. 16 is an actual inductance impedance obtained after the deblocking in the present embodiment.
Optionally, in one embodiment of the present application, the S parameter matrix corresponding to the measured device under test and the measuring fixture is converted into the T parameter matrix, and the matrix transformation calculation method thereof is as follows:
wherein S is 11 Indicating the reflection coefficient of port 1, S, when device port 2 is matched 12 Representing the transmission coefficients from port 2 to port 1 when device port 1 is matched, S 21 Representing the transmission coefficients of port 1 to port 2 when device port 2 is matched, S 22 Representing the reflection coefficient of port 2 when device port 1 is matched, S representing the parameter matrix of device S, and T representing the T parameter matrix of device.
Solving an actual T matrix of the device to be measured based on matrix inversion takes an impedance measurement mode adopting an improved parallel operation method as an example, and the de-embedding process is expressed as follows:
solving an actual T matrix of a device to be tested based on matrix inversion takes an impedance measurement mode adopting a modified collusion method as an example, and de-embedding is expressed as follows:
based on the actual S matrix of the device to be measured, taking an impedance measurement mode adopting an improved reflection method as an example, the network T parameter matrix of the connection of the high-voltage broadband straight-bar and the coaxial cable is recorded as:
the de-embedding process is expressed as:
wherein T is DC-Block1 、T PS-Cable1 、T DUT-Fix1 T parameter matrix representing high-voltage broadband straight-blocking device, coaxial cable and tested equipment adapting clamp on tested equipment port 1 side, T MEAR Representing measured quiltT parameter matrix corresponding to S parameter matrix of measuring equipment, T DC-Block2 、T PS-Cable2 、T DUT-Fix2 T parameter matrix representing high-voltage broadband straight-blocking device on port 2 side of tested device, coaxial cable and tested device adapting clamp, S MEAR Representing the measured S parameter matrix, T of the tested equipment 11 Representing the first row and first column elements, T, in a T parameter matrix of a high-voltage broadband repeater and a coaxial cable cascade network 12 Representing the first row and the second column elements in the T parameter matrix of the high-voltage broadband repeater and the coaxial cable cascade network, T 21 Representing the first column element of the second row in the T parameter matrix of the high-voltage broadband repeater and the coaxial cable cascade network, T 22 Representing a second row and a second column of elements in the T parameter matrix of the high-voltage broadband repeater and the coaxial cable cascade network;
the calculation method for converting the actual T parameter matrix of the tested equipment into the actual S parameter matrix is expressed as follows:
wherein T is 11 Representing the first row and first column elements, T, in the actual T parameter matrix of the device under test 12 Representing the first row and the second column elements in the actual T parameter matrix of the tested device, T 21 Representing the second row and first column elements in the actual T parameter matrix of the device under test, T 22 Representing the second row and column elements in the actual T-parameter matrix of the device under test.
The actual S parameter matrix S of the tested equipment can be finally obtained REAL 。
Optionally, in an embodiment of the present application, calculating the impedance of the device under test according to the parameter measurement mode and the updated S-parameter matrix of the device under test includes:
if the parameter measurement mode is an improved parallel connection method, the impedance Z of the tested equipment PT Expressed as:
wherein S is 11 Representing the first row and first column elements in the updated S parameter matrix of the tested device, S 12 Representing the first row and second column elements in the updated S-parameter matrix of the device under test.
If the parameter measurement mode is the improved series method, the impedance Z of the measured equipment ST Expressed as:
wherein S is 11 Representing the first row and first column elements in the updated S parameter matrix of the tested device, S 12 Representing the first row and second column elements in the actual S-parameter matrix of the device under test.
If the parameter measurement mode is an improved reflection method, the impedance Z of the measured equipment DUT Expressed as:
wherein S is 11 Representing updated S-parameter matrix S of tested equipment REAL 。
The method comprises the steps of establishing an electromagnetic interference propagation impedance model, specifically obtaining the impedance of a linear stable impedance network based on electric field isolation on-line impedance measurement, and establishing a common mode and differential mode interference propagation impedance model respectively by the impedance of a common mode and differential mode interference propagation channel of a DC-DC converter and common mode and differential mode equivalent voltage sources. For example, fig. 17 and 18 are schematic diagrams of common-mode and differential-mode electromagnetic interference propagation impedance models of the power electronic device according to the present embodiment, and fig. 19 is a schematic diagram of an electromagnetic interference propagation impedance model of the power electronic device according to the present embodiment, where the impedance models of the electromagnetic interference noise sources can be obtained by measuring the impedance shown in fig. 17 and 18.
In order to realize the embodiment, the application also provides a measuring clamp applied to high-voltage power electronic equipment, which is constructed and generated based on voltage bias and current bias of a measuring environment and comprises a phase stabilizing cable, a high-voltage broadband straight-stop, a coaxial cable and an adaptation clamp of the tested equipment, wherein,
the high-voltage broadband direct-current isolator is used for isolating the measuring circuit from the power electronic high-voltage high-current circuit;
the phase stabilization cable is used for connecting the vector network analyzer and the high-voltage broadband straight-blocking device;
the coaxial cable is used for connecting the high-voltage broadband straight-blocking device and the equipment to be tested or the equipment to be tested is matched with the clamp;
the tested device is matched with the clamp and used for fixing the tested device.
In order to achieve the above embodiment, the application also provides an online noise source impedance measuring device for the high-voltage power electronic equipment.
Fig. 20 is a schematic structural diagram of an online noise source impedance measurement device for a high-voltage power electronic device according to an embodiment of the present application.
As shown in fig. 20, the high-voltage power electronic device on-line noise source impedance measuring apparatus includes a selecting module, a first parameter measuring module, a second parameter measuring module, a de-embedding processing module, an impedance generating module, wherein,
the selection module is used for selecting a parameter measurement mode according to the impedance range of the tested equipment;
the first parameter measurement module is used for constructing a measurement clamp corresponding to the tested equipment based on voltage bias and current bias of a measurement environment, and carrying out S parameter measurement on the measurement clamp by using a parameter measurement mode through a measurement instrument to obtain an S parameter matrix corresponding to each part of devices of the measurement clamp, wherein the measurement clamp comprises a phase stabilizing cable, a high-voltage wide-frequency straightener, a coaxial cable and an adaptation clamp of the tested equipment;
the second parameter measurement module is used for isolating a power circuit of the tested equipment from a measurement circuit of the measuring instrument through the measuring clamp, providing an adaptive interface for the tested equipment through the measuring clamp to fix the tested equipment, and measuring S parameters of the tested equipment in a parameter measurement mode by using the measuring instrument to obtain an S parameter matrix of the tested equipment;
the de-embedding processing module is used for performing de-embedding processing on the tested equipment based on the S parameter matrix corresponding to the high-voltage broadband straight-bar, the coaxial cable and the tested equipment adapting clamp obtained through measurement, and updating the S parameter matrix of the tested equipment;
the impedance generation module is used for calculating the impedance of the tested equipment according to the parameter measurement mode and the updated S parameter matrix of the tested equipment, and establishing an electromagnetic interference propagation impedance model based on the impedance of the tested equipment to carry out electromagnetic compatibility design.
It should be noted that the foregoing explanation of the embodiment of the method for measuring the impedance of the online noise source of the high-voltage electronic device is also applicable to the device for measuring the impedance of the online noise source of the high-voltage electronic device in this embodiment, which is not described herein.
In the description of the present specification, a description referring to terms "one embodiment," "some embodiments," "examples," "specific examples," or "some examples," etc., means that a particular feature, structure, material, or characteristic described in connection with the embodiment or example is included in at least one embodiment or example of the present application. In this specification, schematic representations of the above terms are not necessarily directed to the same embodiment or example. Furthermore, the particular features, structures, materials, or characteristics described may be combined in any suitable manner in any one or more embodiments or examples. Furthermore, the different embodiments or examples described in this specification and the features of the different embodiments or examples may be combined and combined by those skilled in the art without contradiction.
Furthermore, the terms "first," "second," and the like, are used for descriptive purposes only and are not to be construed as indicating or implying a relative importance or implicitly indicating the number of technical features indicated. Thus, a feature defining "a first" or "a second" may explicitly or implicitly include at least one such feature. In the description of the present application, the meaning of "plurality" means at least two, for example, two, three, etc., unless specifically defined otherwise.
Any process or method descriptions in flow charts or otherwise described herein may be understood as representing modules, segments, or portions of code which include one or more executable instructions for implementing specific logical functions or steps of the process, and additional implementations are included within the scope of the preferred embodiment of the present application in which functions may be executed out of order from that shown or discussed, including substantially concurrently or in reverse order from that shown or discussed, depending on the functionality involved, as would be understood by those reasonably skilled in the art of the embodiments of the present application.
Logic and/or steps represented in the flowcharts or otherwise described herein, e.g., a ordered listing of executable instructions for implementing logical functions, can be embodied in any computer-readable medium for use by or in connection with an instruction execution system, apparatus, or device, such as a computer-based system, processor-containing system, or other system that can fetch the instructions from the instruction execution system, apparatus, or device and execute the instructions. For the purposes of this description, a "computer-readable medium" can be any means that can contain, store, communicate, propagate, or transport the program for use by or in connection with the instruction execution system, apparatus, or device. More specific examples (a non-exhaustive list) of the computer-readable medium would include the following: an electrical connection (electronic device) having one or more wires, a portable computer diskette (magnetic device), a Random Access Memory (RAM), a read-only memory (ROM), an erasable programmable read-only memory (EPROM or flash memory), an optical fiber device, and a portable compact disc read-only memory (CDROM). In addition, the computer readable medium may even be paper or other suitable medium on which the program is printed, as the program may be electronically captured, via, for instance, optical scanning of the paper or other medium, then compiled, interpreted or otherwise processed in a suitable manner, if necessary, and then stored in a computer memory.
It is to be understood that portions of the present application may be implemented in hardware, software, firmware, or a combination thereof. In the above-described embodiments, the various steps or methods may be implemented in software or firmware stored in a memory and executed by a suitable instruction execution system. As with the other embodiments, if implemented in hardware, may be implemented using any one or combination of the following techniques, as is well known in the art: discrete logic circuits having logic gates for implementing logic functions on data signals, application specific integrated circuits having suitable combinational logic gates, programmable Gate Arrays (PGAs), field Programmable Gate Arrays (FPGAs), and the like.
Those of ordinary skill in the art will appreciate that all or a portion of the steps carried out in the method of the above-described embodiments may be implemented by a program to instruct related hardware, where the program may be stored in a computer readable storage medium, and where the program, when executed, includes one or a combination of the steps of the method embodiments.
In addition, each functional unit in the embodiments of the present application may be integrated in one processing module, or each unit may exist alone physically, or two or more units may be integrated in one module. The integrated modules may be implemented in hardware or in software functional modules. The integrated modules may also be stored in a computer readable storage medium if implemented in the form of software functional modules and sold or used as a stand-alone product.
The above-mentioned storage medium may be a read-only memory, a magnetic disk or an optical disk, or the like. While embodiments of the present application have been shown and described above, it will be understood that the above embodiments are illustrative and not to be construed as limiting the application, and that variations, modifications, alternatives and variations may be made to the above embodiments by one of ordinary skill in the art within the scope of the application.
Claims (8)
1. The method for measuring the impedance of the online noise source of the high-voltage power electronic equipment is characterized by comprising the following steps of:
selecting a parameter measurement mode according to the impedance range of the tested equipment;
constructing a measuring clamp corresponding to the tested equipment based on voltage bias and current bias of a measuring environment, and measuring S parameters of the measuring clamp by using a parameter measuring mode through a measuring instrument to obtain an S parameter matrix corresponding to each part of devices of the measuring clamp, wherein the measuring clamp comprises a phase stabilizing cable, a high-voltage broadband straight-off device, a coaxial cable and an adaptation clamp of the tested equipment;
isolating a power circuit of the tested equipment and a measuring circuit of a measuring instrument through the measuring clamp, providing an adaptive interface for the tested equipment through the measuring clamp to fix the tested equipment, and measuring S parameters of the tested equipment by using the measuring instrument in the parameter measuring mode to obtain an S parameter matrix of the tested equipment;
performing de-embedding processing on the tested equipment based on the S parameter matrix corresponding to the high-voltage broadband straight-stop, the coaxial cable and the tested equipment adapting clamp obtained by measurement, and updating the S parameter matrix of the tested equipment;
and calculating the impedance of the tested equipment according to the parameter measurement mode and the updated S parameter matrix of the tested equipment, and establishing an electromagnetic interference propagation impedance model based on the impedance of the tested equipment to carry out electromagnetic compatibility design.
2. The method of claim 1, wherein the parameter measurement mode comprises an improved parallel-through method, an improved series-through method, an improved reflection method based on electric field isolation, and wherein the selecting the measurement mode according to the impedance range of the device under test comprises:
if the device of the tested equipment is a low-impedance device, adopting the improved parallel method to measure parameters;
if the device of the tested equipment is a high-impedance device, adopting the improved series-pass method to measure parameters;
and if the device of the tested equipment is a resistive device, adopting the improved reflection method to measure parameters.
3. The method of claim 2 wherein the impedance measured by the modified parallel process is Z PT The corresponding normalized impedance is expressed asThe corresponding normalized impedance matrix and the updated S-parameter matrix are respectively expressed as:
the impedance measured by the improved series method is Z ST The corresponding normalized impedance is expressed asThe corresponding normalized admittance matrix and the updated S-parameter matrix are respectively expressed as:
the impedance measured by the improved reflection method is Z Re The corresponding normalized impedance is expressed asThe corresponding updated S-parameter matrix is expressed as:
4. the method of claim 1, wherein the de-embedding the device under test based on the measured S parameter matrix corresponding to the high-voltage broadband isolator, the coaxial cable, and the device under test adapter fixture, and updating the S parameter matrix of the device under test comprises:
calibrating the connection part of the phase stabilization cable and the high-voltage broadband straight separator, and moving a reference plane from an S parameter test port of the measuring instrument to an outlet of the phase stabilization cable;
according to the measured S parameter matrix corresponding to the tested equipment, the high-voltage broadband straight-stop, the coaxial cable and the tested equipment adapting clamp, the S parameter matrix is converted into a T parameter matrix in the same mode;
calculating an actual T parameter matrix T of the tested equipment based on the T parameter matrix and the parameter measurement mode REAL Calculating an actual S parameter matrix S of the tested equipment according to the actual T parameter matrix REAL And taking the actual S parameter matrix as an updated S parameter matrix.
5. The method of claim 4, wherein the calculation method for converting the S parameter matrix corresponding to the measured device under test, the high-voltage broadband isolator, the coaxial cable, and the device under test adapting fixture into the T parameter matrix is expressed as:
wherein S is 11 Indicating the reflection coefficient of port 1, S, when device port 2 is matched 12 Representing the transmission coefficients from port 2 to port 1 when device port 1 is matched, S 21 Representing the transmission coefficients of port 1 to port 2 when device port 2 is matched, S 22 Representing the reflection coefficient of port 2 when device port 1 is mated, S representing the S parameter matrix of the device, T representing the T parameter matrix of the device,
if the parameter measurement mode is the improved parallel operation method, the actual T parameter matrix of the tested device is expressed as:
if the parameter measurement mode is the improved collusion method, the actual T parameter matrix of the tested device is expressed as:
if the parameter measurement mode is the improved reflection method, the network T parameter matrix of the connection of the high-voltage broadband DC blocker and the coaxial cable is recorded as:
the actual S parameter matrix of the tested equipment is expressed as:
wherein T is DC-Block1 、T PS-Cable1 、T DUT-Fix1 T parameter matrix representing high-voltage broadband straight-blocking device, coaxial cable and tested equipment adapting clamp on tested equipment port 1 side, T MEAR Representing a T parameter matrix corresponding to the measured S parameter matrix of the tested equipment, T DC-Block2 、T PS-Cable2 、T DUT-Fix2 T parameter matrix representing high-voltage broadband straight-blocking device on port 2 side of tested device, coaxial cable and tested device adapting clamp, S MEAR Representing the measured S parameter matrix, T of the tested equipment 11 Representing the first row and first column elements, T, in a T parameter matrix of a high-voltage broadband repeater and a coaxial cable cascade network 12 Representing the first row and the second column elements in the T parameter matrix of the high-voltage broadband repeater and the coaxial cable cascade network, T 21 Representing the second row in the T parameter matrix of the high-voltage broadband repeater and the coaxial cable cascade networkA list of elements, T 22 Representing a second row and a second column of elements in the T parameter matrix of the high-voltage broadband repeater and the coaxial cable cascade network;
the calculation method for converting the actual T parameter matrix of the tested equipment into the actual S parameter matrix is expressed as follows:
wherein T is 11 Representing the first row and first column elements, T, in the actual T parameter matrix of the device under test 12 Representing the first row and the second column elements in the actual T parameter matrix of the tested device, T 21 Representing the second row and first column elements in the actual T parameter matrix of the device under test, T 22 Representing the second row and column elements in the actual T-parameter matrix of the device under test.
6. The method of claim 3, wherein the calculating the impedance of the device under test according to the parameter measurement mode and the updated S-parameter matrix of the device under test comprises:
if the parameter measurement mode is the improved parallel operation mode, the impedance Z of the tested equipment PT Expressed as:
wherein S is 11 Representing the first row and first column elements in the updated S parameter matrix of the tested device, S 12 Representing the first row and second column elements in the updated S-parameter matrix of the device under test.
If the parameter measurement mode is the improved collusion method, the impedance Z of the tested equipment ST Expressed as:
wherein S is 11 Representing the first row and first column elements in the updated S parameter matrix of the tested device, S 12 Representing the first row and second column elements in the updated S-parameter matrix of the device under test.
If the parameter measurement mode is the improved reflection method, the impedance Z of the tested equipment Re Expressed as:
wherein S is 11 Representing updated S-parameter matrix S of tested equipment REAL 。
7. The measuring clamp applied to the high-voltage power electronic equipment is characterized in that the measuring clamp is constructed and generated based on voltage bias and current bias of a measuring environment of the power electronic equipment, the device comprises a phase stabilizing cable, a high-voltage broadband isolator, a coaxial cable and an adaptation clamp of the tested equipment, wherein,
the high-voltage broadband DC isolator is used for isolating the measuring circuit from the power electronic high-voltage high-current circuit;
the phase stabilization cable is used for connecting the vector network analyzer and the high-voltage broadband straight-blocking device;
the coaxial cable is used for connecting the high-voltage broadband straight-blocking device and the equipment to be tested or the equipment to be tested to be matched with the clamp;
the tested device is matched with the clamp and used for fixing the tested device.
8. The on-line noise source impedance measuring device of the high-voltage power electronic equipment is characterized by comprising a selecting module, a first parameter measuring module, a second parameter measuring module, a de-embedding processing module and an impedance generating module, wherein,
the selection module is used for selecting a parameter measurement mode according to the impedance range of the tested equipment;
the first parameter measurement module is used for constructing a measurement clamp corresponding to the tested equipment based on voltage bias and current bias of a measurement environment, and carrying out S parameter measurement on the measurement clamp by using a parameter measurement mode through a measurement instrument to obtain an S parameter matrix corresponding to each part of device of the measurement clamp, wherein the measurement clamp comprises a phase stabilizing cable, a high-voltage broadband straight-bar, a coaxial cable and a tested equipment adaptation clamp;
the second parameter measurement module is used for isolating a power circuit of the tested device from a measurement circuit of a measurement instrument through the measurement clamp, providing an adaptive interface for the tested device through the measurement clamp to fix the tested device, and measuring S parameters of the tested device through the parameter measurement mode by using the measurement instrument to obtain an S parameter matrix of the tested device;
the de-embedding processing module is used for performing de-embedding processing on the tested equipment based on the S parameter matrix corresponding to the high-voltage broadband straight-blocking device, the coaxial cable and the tested equipment adapting clamp which are obtained through measurement, and updating the S parameter matrix of the tested equipment;
the impedance generation module is used for calculating the impedance of the tested equipment according to the parameter measurement mode and the updated S parameter matrix of the tested equipment, and establishing an electromagnetic interference propagation impedance model based on the impedance of the tested equipment for electromagnetic compatibility design.
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