CN116577304B - Diffuse reflection laser gas sensor system based on complex working condition - Google Patents
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- 239000000428 dust Substances 0.000 description 7
- 230000000694 effects Effects 0.000 description 7
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 7
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- 238000004088 simulation Methods 0.000 description 2
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- 238000004026 adhesive bonding Methods 0.000 description 1
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- 230000008859 change Effects 0.000 description 1
- 239000003245 coal Substances 0.000 description 1
- 238000001514 detection method Methods 0.000 description 1
- 239000006196 drop Substances 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 230000004907 flux Effects 0.000 description 1
- 239000002737 fuel gas Substances 0.000 description 1
- 230000014509 gene expression Effects 0.000 description 1
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- G01N21/39—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using tunable lasers
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Abstract
The application discloses a diffuse reflection laser gas sensor system based on complex working conditions, which relates to the technical field of laser gas sensors and comprises a gas chamber shell, wherein a light beam generator, a photoelectric detector, a diaphragm and a diffuse reflection surface are arranged in the gas chamber shell, the light beam generator, the photoelectric detector and the diaphragm are arranged on the same surface in the gas chamber shell, and the diffuse reflection surface is arranged on the other surface opposite to the light beam generator, the photoelectric detector and the diaphragm; the light beam generator is used for outputting light beams, the output light beams are reflected by the diffuse reflection surface and then are input to the photoelectric detector through the diaphragm, and the photoelectric detector automatically adjusts the amplification factor according to the light intensity signals of the light beams. The application can inhibit the interference of complex working conditions on optical measurement by utilizing the light path structure of the diffuse reflection mode, ensure the stability and reliability of the air chamber and improve the production efficiency.
Description
Technical Field
The application relates to the technical field of laser gas sensors, in particular to a diffuse reflection laser gas sensor system based on complex working conditions.
Background
The TDLAS (Tunable Diode LaserAbsorption Spectroscopy, i.e. tunable laser diode absorption spectroscopy) laser gas sensor is a gas cell composed of optical lenses. The air chamber has the functions that: transmitting laser in the laser to the air chamber, converting the laser into a light beam transmitted in space in the air chamber, then irradiating the light beam into an atmosphere to be detected, if the atmosphere to be detected also contains the gas to be detected, absorbing the energy of the corresponding wavelength in the laser by the gas to be detected, and finally outputting the light beam to the photoelectric detector through the air chamber; the light intensity signal of the laser beam can be analyzed through the photoelectric detector, so that the gas concentration can be calculated according to the intensity inversion of the absorption curve.
The traditional air chamber devices are all optical devices, are made of optical glass plated with an antireflection film, form a single or multiple reflection mode by adopting an arrangement and combination mode through an angle reflector mode, a plane mirror mode or a curved surface reflector mode, and further realize various length optical paths or shape air chambers, thereby meeting the measurement application of gas sensing.
However, optical measurement systems composed of optical devices are susceptible to various disturbances, including: various optical mirrors are easy to interfere, such as moisture condensation, dust or aerosol adhesion and the like at the mirror, wherein the condensation can cause original light deviation or greatly reduced power under the transmission, refraction and scattering effects of liquid drops, so that a detector end cannot measure; the attached dust and aerosols can cause the original light reflectance to decrease until it is not measured. These problems limit long-term measurement applications of optical devices, such as long-term measurement in outdoor environments and measurement in the presence of condensed water or liquid droplets.
In addition, the air chamber or the fixing means for fixing the optical device may be deformed or the fixing position may be shifted for various reasons, such as shifting of the fixing position in the case of receiving vibration or impact; adopting a glue bonding fixing mode, loosening devices caused by glue aging after long-term application, and the like; the fixed position shift causes the original light path to shift, resulting in the decrease of the light power at the receiving site until the light power cannot be measured. These problems also restrict the measurement applications of the optical device in vibration environments, high temperature and humidity (accelerated glue ageing) etc.
In summary, the optical system has a difficult problem in measurement when facing complex working conditions.
Disclosure of Invention
Therefore, the application provides a diffuse reflection laser gas sensor system based on a complex working condition, which aims to solve the problem that an optical system in the prior art is easy to be interfered when facing the complex working condition, so that a measurement result is inaccurate.
In order to achieve the above object, the present application provides the following technical solutions:
The diffuse reflection laser gas sensor system based on the complex working condition comprises a gas chamber shell, wherein a light beam generator, a photoelectric detector, a diaphragm and a diffuse reflection surface are arranged in the gas chamber shell, the light beam generator, the photoelectric detector and the diaphragm are arranged on the same surface in the gas chamber shell, and the diffuse reflection surface is arranged on the other surface opposite to the light beam generator, the photoelectric detector and the diaphragm;
The light beam generator is used for outputting light beams, the output light beams are reflected by the diffuse reflection surface and then are input to the photoelectric detector through the diaphragm, and the photoelectric detector automatically adjusts the amplification factor according to the light intensity signals of the light beams;
Wherein, the diffuse reflection face is circular, circular the radius r of diffuse reflection face is: r=tan α×l, where α is the divergence angle of the light emitted from the light beam generator, and L is the optical path;
The depth of the diaphragm is as follows: the straight line connecting the outer edge of the diffuse reflection surface and the center point of the photoelectric detector is tangent to the depth of the diaphragm, and the distance from the tangent point to the plane of the optical window of the photoelectric detector is the depth of the diaphragm.
Preferably, the light beam generator is a light source or a collimator.
Preferably, the beam generator has a beam diameter larger than the diameter of the optical path disrupter.
Preferably, the diffuse reflection surface is made of metal, glass or plastic.
Preferably, the average deviation R a of the contour arithmetic of the diffuse reflection surface is 3 lambda-1 mm, wherein lambda is the incident wavelength, and the maximum height R z of the contour of the diffuse reflection surface is less than or equal to 20um.
Preferably, a filter cover is arranged outside the air chamber shell.
Preferably, the filter cover is a porous filter cover.
Preferably, the air chamber housing is black.
Preferably, the photoelectric conversion circuit of the photodetector is an automatic gain control circuit.
Preferably, the photoelectric detector automatically adjusts the amplification factor according to the light intensity signal of the light beam, specifically:
When the photoelectric detector detects that the light intensity signal is less than or equal to 10% of the maximum value corresponding to the current gear resistance, the resistance value of the transimpedance resistance is increased; and when the photoelectric detector detects that the light intensity signal is more than or equal to 90% of the maximum value corresponding to the current gear resistance, the resistance value of the transimpedance resistor is reduced.
Compared with the prior art, the application has at least the following beneficial effects:
The application provides a diffuse reflection laser gas sensor system based on complex working conditions, which comprises a gas chamber shell, wherein a light beam generator, a photoelectric detector, a diaphragm and a diffuse reflection surface are arranged in the gas chamber shell, the light beam generator, the photoelectric detector and the diaphragm are arranged on the same surface in the gas chamber shell, and the diffuse reflection surface is arranged on the other surface opposite to the light beam generator, the photoelectric detector and the diaphragm; the light beam generator is used for outputting light beams, the output light beams are reflected by the diffuse reflection surface and then are input to the photoelectric detector through the diaphragm, and the photoelectric detector automatically adjusts the amplification factor according to the light intensity signals of the light beams. The application can restrain the interference of complex working condition to optical measurement by utilizing the light path structure of diffuse reflection mode, ensures the stability and reliability of the air chamber, and can be applied to environments with high and low temperature, vibration, high dust, easy condensation and dew condensation.
The shell of the air chamber is processed into black, so that the multipath effect caused by the light beam reflected by the structural member can be reduced.
Drawings
In order to more intuitively illustrate the prior art and the application, several exemplary drawings are presented below. It should be understood that the specific shape and configuration shown in the drawings are not generally considered limiting conditions in carrying out the application; for example, those skilled in the art will be able to make routine adjustments or further optimizations for the addition/subtraction/attribution division, specific shapes, positional relationships, connection modes, dimensional proportion relationships, and the like of certain units (components) based on the technical concepts and the exemplary drawings disclosed in the present application.
FIG. 1 is a schematic view of a technical light path structure reflected by a diffuse reflection surface;
FIG. 2 is a schematic diagram of a conventional optical specular reflection structure;
FIG. 3 is a schematic view of roughness of a diffuse reflection surface provided by the present application;
FIG. 4 is a schematic diagram of a diffuse reflection laser gas sensor system based on complex working conditions;
FIG. 5 is a simulation diagram of a diffuse reflection laser gas sensor system based on complex working conditions;
FIG. 6 is a schematic diagram of the result of the diffuse reflection laser gas sensor system based on the complex working condition when the diffuse reflection surface has water drops or angle interference.
Reference numerals illustrate:
1. A light beam generator; 2. a photodetector; 3. a diffuse reflection surface; 3', an optical mirror; 4. a diaphragm.
Detailed Description
The application will be further described in detail by means of specific embodiments with reference to the accompanying drawings.
In the description of the present application: unless otherwise indicated, the meaning of "a plurality" is two or more. The terms "first," "second," "third," and the like in this disclosure are intended to distinguish between the referenced objects without a special meaning in terms of technical connotation (e.g., should not be construed as emphasis on the degree of importance or order, etc.). The expressions "comprising", "including", "having", etc. also mean "not limited to" (certain units, components, materials, steps, etc.).
The terms such as "upper", "lower", "left", "right", "middle", etc. are generally used herein for convenience of visual understanding with reference to the drawings and are not to be construed as absolute limitations on the positional relationship of the actual product. Such changes in the relative positional relationship without departing from the technical idea of the present application are also considered as the scope of the present application.
In order to solve the problems of complex working condition measurement and long-term measurement reliability of a laser gas sensor in actual long-term measurement, for example, a humidity sensor in the meteorological field is used for reducing the frequency of manual maintenance in outdoor measurement for a long time, a flux gas sensor field is used for reducing the influence of raindrops on light path measurement in rainfall days, the laser gas sensor is used in the industrial process control measurement field of high humidity, high dust and high aerosol, the laser gas sensor is used in other application fields such as fuel gas, coal mine and the like, and is used in various environmental measurement with vibration, and the like.
The output beam diameter of the optical device, mainly the beam generator, needs to be larger than or even much larger than the diameter of optical path disruptors such as water drops, dust, aerosol and the like. According to data inquiry, the diameter of water drops formed by condensation and dew is maximum, namely about 0.5mm, so that the diameter of an output light beam of the light beam generator is required to be larger than 0.5mm.
The decrease of the beam diameter of the beam generator can reduce the energy density of a unit area, but if the beam diameter is similar to the diameter of an optical path interfering object, mie scattering can be generated, so that the beam scattering transmission direction is deflected, and the beam cannot be incident to the photoelectric detector, so that measurement cannot be performed. Therefore, the light beam diameter of the light beam generator is preferably 0.5-2mm, which is limited by the area of the output light window of the light beam generator, the area of the photoelectric detector, the structural area of the air chamber and the like.
When the light path is determined, the light path shown in fig. 1 is adopted, the light path is subjected to diffuse reflection once, and after the diffuse reflection exceeds once, detection and subsequent processing cannot be performed due to overlarge light intensity attenuation.
Referring to the conventional optical mirror reflection of fig. 2, after the reflection, emission and reception of the conventional optical mirror 3 'are adjusted, the light beam generator 1 can accurately couple back to the photodetector 2 after emitting light, while the diffuse reflection surface 3 in fig. 1 has no single light path as reflected by the optical mirror 3', but reflects in various angles, and the light beam received by the photodetector 2 is only part of the light beam energy.
Although the diffuse reflection surface 3 loses the energy of the received light beam, the diffuse reflection mode improves the redundancy of the received light beam of the photoelectric detector 2 and improves the light beam receiving capability when the complex working condition is applied.
The diffuse reflection surface 3 may be made of metal, glass or plastic, and the selection criteria mainly concern the surface roughness, and the parameters related to the present application of the basic parameters of the two-dimensional contour surface roughness include the average deviation R a of the contour arithmetic, the root mean square deviation R q of the contour, the average width R sm of the contour unit and the maximum height R z of the contour according to the national standard GB/T1031-2009 (product geometry technical Specification (GPS) surface structure contour method surface roughness parameters and values thereof).
Referring to fig. 3, the X-axis in fig. 3 is the intersection of the nominal surface and the normal cross-section, and the Z-axis corresponds to the profile relief height in the vertical direction in the normal cross-section. The rough surface profile is discretized, namely divided into n equal parts, wherein Z i is the profile height corresponding to the i equal part, the distance between the highest point of the profile peak of the profile maximum height R z and the X axis is called profile peak height Z p, and the distance between the lowest point of the profile valley and the X axis is called profile valley depth Z v.
Within a sampling length, the vertical and horizontal characteristic parameters for the two-dimensional profile surface roughness specified in the standard are defined as follows:
Rz＝Zp+Zv
In the application, the surface roughness R a is less than 1mm, and the index is the roughness category; in order to reduce diffuse reflection optical noise, the diffuse reflection surface 3 is not allowed to have any surface waviness, namely R z is less than or equal to 20um, and surface textures, such as stripes, concentric circles, radial shapes and the like, caused by machining or other reasons during material treatment are avoided, so that the interference effect of an optical system is avoided. Specifically, the value of R a、Rz is a range value, and needs to be selected in the range in combination with the beam diameter, the optical path length, the measurement lower limit of a sensor, the optical interference influence and the like.
To ensure diffuse reflection rather than specular reflection, the range of R a for roughness should be 3 λ to 1mm, where λ is the incident wavelength and R a is generally considered to be specular in the 1/2 λ range.
Based on the analysis, the application provides a diffuse reflection laser gas sensor system based on complex working conditions.
Referring to fig. 4, the diffuse reflection laser gas sensor system based on complex working conditions provided by the application comprises a gas chamber shell, wherein a beam generator 1, a photoelectric detector 2, a diffuse reflection surface 3 and a diaphragm 4 are arranged in the gas chamber shell, the beam generator 1 is a light source or a collimator, the diffuse reflection surface 3 is circular, the circular diffuse reflection surface 3 is beneficial to receiving light beams, and if the diffuse reflection surface is in other shapes, a part of light beams cannot be received;
The light beam generator 1, the photoelectric detector 2 and the diaphragm 4 are arranged on the same surface inside the air chamber shell, and the diffuse reflection surface 3 is arranged on the other surface opposite to the light beam generator 1, the photoelectric detector 2 and the diaphragm 4; specifically, the vertical distance between the beam generator 1 and the photodetector 2 is d, the horizontal distance between the beam generator 1 and the diffuse reflection surface 3 is L, the radius of the circular lens of the diffuse reflection surface 3 is r, and the depth of the diaphragm 4 is I:
Wherein the optical path L is determined, and the calculation of the radius r of the diffuse reflection surface 3 is determined by the light-emitting divergence angle α of the light beam generator 1 and the optical path L, i.e., r=tanα×l; the depth I of the diaphragm 4 is tangent to the depth of the diaphragm 4 by a straight line connecting the outer edge of the diffuse reflection surface 3 and the center point of the photoelectric detector 2, and the distance from the tangent point to the plane of the optical window of the photoelectric detector 2 is the depth I of the diaphragm 4;
In order to further reduce the multipath effect of the diffuse reflection light path, the filter cover needs to be additionally arranged outside the air chamber, a porous filter cover is adopted when the filter cover is additionally arranged, the side wall is prevented from reflecting light beams, meanwhile, the structural part of the air chamber is processed into black, and the multipath effect caused by the light beams reflected by the structural part is reduced.
Meanwhile, when the complex working condition occurs, the optical power is greatly reduced compared with the incident optical power, and the optical power is reduced to below 0.1% in the extreme case. Therefore, for the case of large-amplitude light intensity variation, the photoelectric conversion circuit of the photodetector 2 is designed as an automatic gain control circuit.
The photodetector 2 is a current conversion voltage amplifying circuit, and the amplification factor is adjusted through the resistance value of the transimpedance resistor. When the detected light intensity is less than or equal to 10% of the maximum value (the maximum value corresponding to the current gear resistance), increasing the resistance value of the transimpedance resistance; when the detected light intensity is more than or equal to 90 percent of the maximum value (the maximum value corresponding to the current gear resistance), the resistance value of the transimpedance resistance is reduced; the resistance values of different gears are switched by the program-controlled automatic gain chip in an automatic gain internal circuit, so that the purposes of adjusting, amplifying and reducing the gain are achieved, the modulation and matching of optical signals with different intensities are realized, and the photoelectric signal processing is facilitated. The photoelectric signal conversion voltage signal capability when the optical power is greatly changed can be met, and the rear-end demodulation capability is improved.
It should be noted that 10% and 90% of the switching parameters of the automatic gain can be optimally adjusted according to specific situations, and the diffuse reflection laser gas sensor system provided by the application is applicable to all gases which can be measured by using the TDLAS technology.
Referring to fig. 5, in order to verify the application effect of the diffuse reflection laser gas sensor system based on the complex working condition, the application adopts ZEMAX software to simulate according to the diffuse reflection surface mode. Meanwhile, a contrast group is added, the diffuse reflection surface 3 is replaced by a plane mirror in a traditional design mode by the contrast group, and other conditions are the same.
The specific fitting parameters are as follows: the beam generator 1 selects a light source or a collimator, the output light power of the light source output beam or the collimator output beam is set to be 5mW, the output beam is Gaussian beam, and the spot diameters are respectively 1mm; the photosensitive area of the photodetector 2 is 1mm x 1mm; r a of the diffuse reflection surface 3 is 10um, and the diffuse reflection surface 3 is formed by uniformly distributing hemispheres on the reflection surface; the diffuse reflection surface 3 or the plane reflection mirror surface is 100mm away from the light beam generator 1, and the reflectivity is 96%; the distance d between the beam generator 1 and the photodetector 2 is 10mm.
The design simulation comprises the following steps:
step S1: calculating specular reflection received light power and diffuse reflection surface received light power under a set condition;
step S2: the simulated water drops are uniformly distributed on the plane mirror and the diffuse reflection surface according to a hemispherical body with the diameter of 0.5mm, and the specular reflection received light power and the diffuse reflection surface received light power are calculated;
step S3: under the condition of simulated vibration, the emergent angle of the laser beam deviates by 0 degrees and 0.5 degrees, and the specular reflection received light power and the diffuse reflection surface received light power are calculated.
Referring to fig. 6 and table 1, it can be seen from fig. 6 and table 1 that in normal conditions, the light power received by the plane mirror is better than that of the diffuse reflection surface, but when water drops are formed by dew condensation or the light emitting angle is changed due to vibration, even a small change amount causes large fluctuation of the light power until no light exists; the diffuse reflection surface keeps smaller variation amplitude under the normal condition, the water drop condition and the vibration interference condition, the condition of no light is rarely generated, the reflection energy of light is lost, and the environmental adaptability is improved.
TABLE 1
Therefore, when dew condensation and angle deflection occur, the diffuse reflection laser gas sensor system provided by the application has better effect than the traditional plane mirror optical system, and improves the production efficiency.
The optical path structure design of the diffuse reflection mode is utilized to inhibit the interference of complex working conditions on optical measurement, including but not limited to the influence of scattering, refraction or optical path deformation, compared with the traditional mirror optical system, the optical path structure design has strong dust, aerosol, condensation and structural deformation resistance, and can be applied to environments with high and low temperature, vibration, high dust and easy condensation and condensation.
Any combination of the technical features of the above embodiments may be performed (as long as there is no contradiction between the combination of the technical features), and for brevity of description, all of the possible combinations of the technical features of the above embodiments are not described; these examples, which are not explicitly written, should also be considered as being within the scope of the present description.
The application has been described above with particularity and detail in connection with general description and specific embodiments. It should be understood that numerous conventional modifications and further innovations may be made to these specific embodiments, based on the technical concepts of the present application; but these conventional modifications and further innovations may also fall within the scope of the claims of the present application as long as they do not depart from the technical spirit of the present application.
Claims (10)
1. The diffuse reflection laser gas sensor system based on the complex working condition is characterized by comprising a gas chamber shell, wherein a light beam generator, a photoelectric detector, a diaphragm and a diffuse reflection surface are arranged in the gas chamber shell, the light beam generator, the photoelectric detector and the diaphragm are arranged on the same surface in the gas chamber shell, and the diffuse reflection surface is arranged on the other surface opposite to the light beam generator, the photoelectric detector and the diaphragm;
The light beam generator is used for outputting light beams, the output light beams are reflected by the diffuse reflection surface and then are input to the photoelectric detector through the diaphragm, and the photoelectric detector automatically adjusts the amplification factor according to the light intensity signals of the light beams;
wherein, the diffuse reflection face is circular, circular the radius r of diffuse reflection face is: wherein alpha is the divergence angle of the light emitted by the light beam generator, and L is the optical path;
the depth of the diaphragm is as follows: the straight line connecting the outer edge of the diffuse reflection surface and the center point of the photoelectric detector is intersected with the inner edge of one end of the diaphragm, which is close to the diffuse reflection surface, and the distance from the intersection point to the plane of the optical window of the photoelectric detector is the depth of the diaphragm.
2. The complex regime based diffuse reflecting laser gas sensor system of claim 1, wherein the beam generator is a light source or collimator.
3. The complex regime based diffuse reflecting laser gas sensor system of claim 1, wherein the beam generator has a beam diameter that is greater than the diameter of the optical path disruptor.
4. The diffuse reflection laser gas sensor system based on the complex working conditions according to claim 1, wherein the arithmetic mean deviation R a of the profile of the diffuse reflection surface is 3λ -1 mm, wherein λ is the incident wavelength, and the maximum height R z of the profile of the diffuse reflection surface is less than or equal to 20um.
5. The complex-condition-based diffuse reflection laser gas sensor system according to claim 1, wherein the diffuse reflection surface is made of metal, glass or plastic.
6. The complex regime based diffuse reflection laser gas sensor system of claim 1, wherein a filter housing is provided externally of the plenum housing.
7. The complex regime based diffuse reflection laser gas sensor system of claim 6, wherein the filter housing is a porous filter housing.
8. The complex regime based diffuse reflection laser gas sensor system of claim 1, wherein the gas cell housing is black.
9. The complex-condition-based diffuse reflection laser gas sensor system according to claim 1, wherein the photoelectric conversion circuit of the photodetector is an automatic gain control circuit.
10. The diffuse reflection laser gas sensor system based on the complex working condition according to claim 1, wherein the photoelectric detector automatically adjusts the amplification factor according to the light intensity signal of the light beam, specifically:
When the photoelectric detector detects that the light intensity signal is less than or equal to 10% of the maximum value corresponding to the current gear resistance, the resistance value of the transimpedance resistance is increased; and when the photoelectric detector detects that the light intensity signal is more than or equal to 90% of the maximum value corresponding to the current gear resistance, the resistance value of the transimpedance resistor is reduced.
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Citations (4)
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| JP2008154873A (en) * | 2006-12-25 | 2008-07-10 | Sanyo Electric Co Ltd | Optical measuring instrument |
| CN109975319A (en) * | 2019-03-18 | 2019-07-05 | 四川大学 | A kind of planar optical elements surface quality device for fast detecting and its method |
| CN110621980A (en) * | 2017-05-11 | 2019-12-27 | 梅特勒-托莱多有限公司 | Gas measuring system |
| CN115046962A (en) * | 2022-06-30 | 2022-09-13 | 北京光感慧智科技有限公司 | Laser gas sensor design method and system for inhibiting water vapor condensation influence |
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Patent Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2008154873A (en) * | 2006-12-25 | 2008-07-10 | Sanyo Electric Co Ltd | Optical measuring instrument |
| CN110621980A (en) * | 2017-05-11 | 2019-12-27 | 梅特勒-托莱多有限公司 | Gas measuring system |
| CN109975319A (en) * | 2019-03-18 | 2019-07-05 | 四川大学 | A kind of planar optical elements surface quality device for fast detecting and its method |
| CN115046962A (en) * | 2022-06-30 | 2022-09-13 | 北京光感慧智科技有限公司 | Laser gas sensor design method and system for inhibiting water vapor condensation influence |
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