CN116559719B - Intelligent testing system and testing method for laser power supply - Google Patents
Intelligent testing system and testing method for laser power supply Download PDFInfo
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- CN116559719B CN116559719B CN202310835150.3A CN202310835150A CN116559719B CN 116559719 B CN116559719 B CN 116559719B CN 202310835150 A CN202310835150 A CN 202310835150A CN 116559719 B CN116559719 B CN 116559719B
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- 238000012360 testing method Methods 0.000 title claims abstract description 106
- 238000002955 isolation Methods 0.000 claims abstract description 43
- 238000012544 monitoring process Methods 0.000 claims abstract description 43
- 230000032683 aging Effects 0.000 claims abstract description 25
- 238000001514 detection method Methods 0.000 claims description 17
- 101100236764 Caenorhabditis elegans mcu-1 gene Proteins 0.000 claims description 8
- 238000000034 method Methods 0.000 claims description 3
- 229910052710 silicon Inorganic materials 0.000 claims description 3
- 239000010703 silicon Substances 0.000 claims description 3
- 230000000087 stabilizing effect Effects 0.000 claims description 2
- 238000004519 manufacturing process Methods 0.000 abstract description 6
- 238000010586 diagram Methods 0.000 description 11
- 230000020169 heat generation Effects 0.000 description 3
- 230000008054 signal transmission Effects 0.000 description 3
- 230000000694 effects Effects 0.000 description 2
- 238000012986 modification Methods 0.000 description 2
- 230000004048 modification Effects 0.000 description 2
- 238000005086 pumping Methods 0.000 description 2
- 230000009286 beneficial effect Effects 0.000 description 1
- 238000004891 communication Methods 0.000 description 1
- 230000007547 defect Effects 0.000 description 1
- 230000007812 deficiency Effects 0.000 description 1
- 238000013461 design Methods 0.000 description 1
- 238000011161 development Methods 0.000 description 1
- 230000018109 developmental process Effects 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 238000012423 maintenance Methods 0.000 description 1
Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/40—Testing power supplies
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/003—Environmental or reliability tests
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- H—ELECTRICITY
- H02—GENERATION; CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
- H02J—CIRCUIT ARRANGEMENTS OR SYSTEMS FOR SUPPLYING OR DISTRIBUTING ELECTRIC POWER; SYSTEMS FOR STORING ELECTRIC ENERGY
- H02J13/00—Circuit arrangements for providing remote indication of network conditions, e.g. an instantaneous record of the open or closed condition of each circuitbreaker in the network; Circuit arrangements for providing remote control of switching means in a power distribution network, e.g. switching in and out of current consumers by using a pulse code signal carried by the network
- H02J13/00002—Circuit arrangements for providing remote indication of network conditions, e.g. an instantaneous record of the open or closed condition of each circuitbreaker in the network; Circuit arrangements for providing remote control of switching means in a power distribution network, e.g. switching in and out of current consumers by using a pulse code signal carried by the network characterised by monitoring
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- H—ELECTRICITY
- H02—GENERATION; CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
- H02J—CIRCUIT ARRANGEMENTS OR SYSTEMS FOR SUPPLYING OR DISTRIBUTING ELECTRIC POWER; SYSTEMS FOR STORING ELECTRIC ENERGY
- H02J3/00—Circuit arrangements for ac mains or ac distribution networks
- H02J3/28—Arrangements for balancing of the load in a network by storage of energy
- H02J3/32—Arrangements for balancing of the load in a network by storage of energy using batteries with converting means
Abstract
The invention discloses an intelligent testing system and testing method for a laser power supply, wherein the testing system comprises a feedback type load unit, an AC/DC precharge power supply unit, an electric isolation unit and an MCU monitoring unit, wherein the electric isolation unit is connected to the laser power supply, and the feedback type load unit is connected between the electric isolation unit and a power supply grid; the AC/DC precharge power supply unit is connected with the feedback type load unit; the MCU monitoring unit is respectively connected with the feedback load unit, the AC/DC precharge power supply unit and the electric isolation unit. Therefore, the units are combined to form a test system, and the test system monitors the working state of the laser power supply in real time, controls the working time sequence of the laser power supply when the laser power supply is started or shut down and converts and feeds the electric energy of the aged laser power supply back to a power supply grid during test; the purposes of reducing electric energy loss, reducing heat, relieving power supply pressure of an industrial park, improving the reliability of aging test of a laser power supply and reducing the manufacturing cost of the laser power supply are achieved.
Description
Technical Field
The invention relates to the technical field of power supply testing, in particular to an intelligent testing system and an intelligent testing method for a laser power supply.
Background
With the continuous development and innovation of lasers, laser power supply technology is also in rapid progress, and an excellent laser power supply system can provide a reliable environment for the stable operation of lasers. Therefore, laser power testing becomes particularly important as a standard for verifying the quality of laser power.
The existing laser power supply aging test load device adopts a pure resistance load or a real pumping source for testing (shown in figure 1); these two aging test loading modes have the following drawbacks:
1. the electric energy is converted into heat to be directly consumed, so that a large amount of electric energy is wasted;
2. the batch ageing test field is difficult to heat treat;
3. during batch aging test, power supply of an industrial park is difficult;
4. when the pure resistor load aging test is adopted, the power supply of the laser is damaged due to slight time sequence fluctuation;
5. the real pump source aging test is adopted, so that the pump source cost is extremely high and the maintenance is difficult;
6. the manufacturing cost of the laser power supply is greatly increased.
Moreover, the existing energy-saving feedback type aging test load in the market is suitable for the aging test of the traditional switching power supply, and when the load is matched with the laser power supply for testing, large impact current can be generated at the moment of power-on of the laser power supply due to the capacitive load characteristic of the feedback type aging test load port, so that the laser power supply is damaged. In view of the shortcomings of the existing laser power burn-in test loads, improvements to the existing test systems are needed to address the above-described issues.
Disclosure of Invention
In view of the above, the present invention is directed to the deficiencies of the prior art, and it is a primary object of the present invention to provide an intelligent testing system and testing method for a laser power supply, which combines an electrical isolation unit, an AC/DC pre-charge power unit, an MCU monitoring unit and a feedback load unit to form a testing system for a laser power supply. The testing system can convert and feed the electric energy of the laser power supply back to the power supply grid, so that the purposes of reducing electric energy loss, reducing heat generation, relieving power supply pressure of an industrial park, improving the reliability of aging test of the laser power supply and reducing the manufacturing cost of the laser power supply are achieved.
In order to achieve the above purpose, the present invention adopts the following technical scheme:
the intelligent testing system for the laser power supply comprises a feedback type load unit, wherein the feedback type load unit is used for converting and inverting the electric energy of the laser power supply into electric energy equal to a power supply grid and returning the electric energy to the power supply grid;
an AC/DC pre-charge power supply unit for supplying power to the capacitive load of the feedback load unit;
the electric isolation unit is used for preventing the power supplied by the AC/DC precharge power supply from being transmitted to the power supply end of the laser when the AC/DC precharge power supply supplies power to the feedback load unit, so that the power supply of the laser is unstable and damaged;
the MCU monitoring unit is used for controlling the working time sequence of each unit, monitoring the working state of each unit in the test process in real time and reporting real-time data;
the feedback type load unit is connected between the electric isolation unit and a power supply grid; the AC/DC precharge power supply unit is connected with the feedback type load unit; the MCU monitoring unit is respectively connected with the feedback load unit, the AC/DC precharge power supply unit and the electric isolation unit.
As a preferred embodiment: the AC/DC pre-charge power supply unit is provided with a charging end, the feedback type load unit is provided with a receiving end, and a diode is connected between the charging end of the AC/DC pre-charge power supply unit and the receiving end of the feedback type load unit.
As a preferred embodiment: the AC/DC precharge power supply unit and the feedback load unit are also respectively provided with a signal receiving end; the laser power supply is provided with an output end and a signal receiving end; the MCU monitoring unit is provided with a first signal detection end, a second signal detection end, a first signal emission end, a second signal emission end and a third signal emission end; the first signal detection end is connected with the power receiving end of the feedback load unit, the first signal emission end is connected with the signal receiving end of the laser power supply, the second signal detection end is connected with the output end of the laser power supply, and the third signal emission end is connected with the signal receiving end of the AC/DC precharge power supply unit; the second signal transmitting terminal is connected to the signal receiving terminal of the feedback load unit.
As a preferred embodiment: the output end of the laser power supply is connected with the electric isolation unit and the power receiving end of the feedback load unit in sequence.
As a preferred embodiment: the electric isolation unit is a power diode, a power MOS tube, a relay, an electronic switch or a controllable silicon.
As a preferred embodiment: the MCU monitoring unit is a NUC131LxxAE, STM32G070RBT or PIC18F45Q10 chip.
As a preferred embodiment: the AC/DC pre-charging power supply unit is an external AC/DC power supply.
The testing method applied to the intelligent testing system of the laser power supply comprises the following steps:
s1, a test system is connected with a power supply grid to start self-test, and after the self-test is finished, an AC/DC precharge power supply unit is turned on to charge a feedback load unit in a period T0;
s2, when the MCU monitoring unit detects that the charging amount of the feedback load unit reaches a set value, a signal is given in a period T1, a laser power supply is turned on, and the laser power supply is electrified to operate; the MCU monitoring unit detects the output voltage of the laser power supply at the same time, and when the output voltage of the laser power supply reaches a test requirement value, the MCU monitoring unit gives a signal to the electric isolation unit, and the electric isolation unit is connected; simultaneously turning off the AC/DC precharge power supply unit;
s3, after the AC/DC precharge power supply is turned off, in a period T2, the MCU monitoring unit sends a signal to the feedback type load unit, the feedback type load unit starts to gradually pull up current to drive the load in an AV mode, and when the current reaches a test set requirement value, the operation work of the load with the stability is kept; the laser power supply current is converted and inverted into electric energy equal to the power supply grid through the feedback type load unit through the electric isolation unit, and is returned to the power supply grid;
s4, in the period of T3, the laser power supply reaches the test time, the power supply is disconnected, and the laser power supply is replaced for the next round of aging test.
Compared with the prior art, the invention has obvious advantages and beneficial effects, in particular, the technical scheme can prove that the test system for the laser power supply is formed by combining the electric isolation unit, the AC/DC precharge power supply unit, the MCU monitoring unit and the feedback load unit. The test system can intelligently monitor the working state of the laser power supply in real time when the laser power supply is subjected to aging test, control the working time sequence of the laser power supply when the laser power supply is started or shut down, and convert and feed back the electric energy of the aged laser power supply to a power supply grid; the purposes of reducing electric energy loss, reducing heat generation, relieving power supply pressure of an industrial park, improving the reliability of aging test of a laser power supply and reducing the manufacturing cost of the laser power supply are achieved.
In order to more clearly illustrate the structural features and efficacy of the present invention, a detailed description thereof will be given below with reference to the accompanying drawings and examples.
Drawings
FIG. 1 is a schematic diagram of a conventional test system;
FIG. 2 is a schematic diagram of the whole circuit of the test system according to the present invention;
FIG. 3 is a schematic diagram of the electrical isolation unit of the present invention using a power diode;
FIG. 4 is a schematic diagram of the electrical isolation unit of the present invention using power MOS transistors;
FIG. 5 is a schematic diagram of the electrical isolation unit of the present invention using a relay;
FIG. 6 is a schematic diagram of an electrical isolation unit employing an electronic switch according to the present invention;
FIG. 7 is a schematic diagram of a circuit of an electrically isolated unit employing a thyristor according to the present invention;
FIG. 8 is a schematic circuit diagram of an AC/DC precharge power supply unit employing a feedback load unit in combination with auxiliary VCC according to the present invention;
FIG. 9 is a schematic diagram of an AC/DC pre-charge power supply unit employing an external AC/DC power supply circuit according to the present invention;
FIG. 10 is a schematic diagram of the operation timing of the test system according to the present invention;
FIG. 11 is a schematic diagram of the logic principle of the test system according to the present invention.
The attached drawings are used for identifying and describing:
10. an electrical isolation unit; 20. an AC/DC precharge power supply unit; 30. an MCU monitoring unit; 40. and a feedback type load unit.
Detailed Description
The invention is shown in fig. 2 to 11, an intelligent testing system and testing method for laser power supply, the testing system comprises an electric isolation unit 10, an AC/DC pre-charge power supply unit 20, an MCU monitoring unit 30, and a feedback load unit 40, wherein,
the feedback load unit 40 is configured to convert and invert the electric energy of the laser power supply into electric energy equal to the power supply grid, and return the electric energy to the power supply grid, so as to achieve the effect of energy saving. The energy-saving feedback type aging test load can be composed of energy-saving feedback type aging test loads existing in the market, such as CS1162 of a kesai.
The AC/DC pre-charge power supply unit 20 is configured to supply power to the capacitive load of the feedback load unit 40; before the laser power supply works, the feedback load unit 40 is charged with capacitive load, so that the laser power supply is prevented from being damaged by impact current generated at the moment of power-on operation. The power of the AC/DC pre-charge power unit 20 is an external AC/DC power or is provided by the feedback load unit 40 in combination with the auxiliary VCC.
The electrical isolation unit 10 is configured to prevent the power supplied by the AC/DC precharge power supply from being transmitted to the power supply terminal of the laser when the AC/DC precharge power supply supplies power to the feedback load unit 40, so that the power supply of the laser is unstable and damaged; the main components of the electric isolation unit 10 are unidirectional conductive power devices or controllable switch devices, which are specifically power diodes, power MOS transistors, relays, electronic switches or controllable silicon; in this embodiment, a power diode is used.
The MCU monitoring unit 30 is used for controlling the working time sequence of each unit, monitoring the working state of each unit in the test process in real time, and reporting real-time data, so as to achieve the purpose of ensuring the ordered work and safe operation of the laser power supply in the aging process; the MCU monitoring unit 30 is a commonly used MCU singlechip, and can be selected from NUC131LxxAE, STM32G070RBT or PIC18F45Q10 chips.
The electric isolation unit 10 is connected to a laser power supply, and the feedback load unit 40 is connected between the electric isolation unit 10 and a power supply grid; the AC/DC pre-charge power supply unit 20 is connected to the feedback load unit 40; the MCU monitoring unit 30 is connected with the feedback load unit 40, the AC/DC precharge power supply unit 20 and the electric isolation unit 10, respectively.
The specific constitution and connection relation of each unit are as follows:
the AC/DC pre-charge power supply unit 20 has a charging terminal vo+ and the feedback load unit 40 has a receiving terminal vi+, and a diode Df is connected between the charging terminal vo+ of the AC/DC pre-charge power supply unit 20 and the receiving terminal vi+ of the feedback load unit 40.
The AC/DC precharge power supply unit 20 and the feedback load unit 40 further have signal receiving terminals (MCU 3 port/MCU 2 port), respectively; the laser power supply is provided with an output end VO1+ and a signal receiving end MCU1 port; the MCU monitoring unit 30 has a first signal detection end vi+, a second signal detection end vo1+, a first signal transmission end MCU1, a second signal transmission end MCU2, and a third signal transmission end MCU3; the first signal detection end vi+ is connected to the power receiving end vi+ of the feedback load unit 40, the first signal transmitting end MCU1 is connected to the signal receiving end MCU1 of the laser power supply, the second signal detection end vo1+ is connected to the output end vo1+ of the laser power supply, and the third signal transmitting end MCU3 is connected to the signal receiving end MCU3 of the AC/DC pre-charge power supply unit 20; the second signal transmitting end MCU2 is connected to the signal receiving end MCU2 of the feedback load unit 40.
The output end VO1+ of the laser power supply, the electric isolation unit 10 and the power receiving end VI+ of the feedback load unit 40 are connected in sequence.
The specific working principle is as follows:
the test system is powered on, the test system self-tests, the AC/DC pre-charge power unit 20 starts to operate after self-test, the charging end VO+ of the AC/DC pre-charge power unit 20 outputs charging voltage, and the power receiving end VI+ of the feedback load unit 40 is charged through the diode Df.
When the first signal detection end vi+ of the MCU monitoring unit 30 detects that the charging voltage of the power receiving end vi+ of the feedback load unit 40 reaches a set value, a high level signal is given out through the first signal transmitting end MCU1 port; the MCU1 port of the signal receiving end of the laser power supply detects a high-level signal, and the laser power supply starts to perform power-on operation; the second signal detecting terminal vo1+ of the MCU monitoring unit 30 starts to detect the voltage of the port of the output terminal vo1+ of the laser power supply, and when detecting that the output voltage of the laser power supply reaches the test requirement value, the port of the third signal transmitting terminal MCU3 of the MCU monitoring unit 30 gives a high level signal, the port of the signal receiving terminal MCU3 of the AC/DC precharge power supply unit 20 detects the signal, and the charging terminal vo+ thereof is turned off to output the charging voltage.
The electric quantity of the output end VO1+ port of the laser power supply passes through the electric isolation unit 10 (D1-Dn diode isolation), the electric quantity is supplied to the receiving end VI+ of the feedback load unit 40, after the first signal detection end VI+ of the MCU monitoring unit 30 detects the voltage of the laser power supply, the second signal emission end MCU2 port gives a high-level signal, the signal receiving end MCU2 port of the feedback load unit 40 detects the signal, the current load starts to be gradually pulled up (e.g. from 0A to 45A) in an AV mode (constant voltage mode), and when the test set requirement value (45A) is reached, the load operation work of the stabilizing band 45A is kept.
When the feedback load unit 40 keeps the stable belt 45A operating, the electric energy of the stable belt 45A is converted and inverted into electric energy equal to the electric energy of the power supply grid, and the electric energy is returned to the power supply grid.
The testing method applied to the intelligent testing system of the laser power supply comprises the following steps:
s1, a test system is connected with a power supply grid to start self-test, and after the self-test is finished, an AC/DC precharge power supply unit is turned on to charge a feedback load unit 40 in a period of T0;
s2, when the MCU monitoring unit 30 detects that the charging amount of the feedback load unit 40 reaches a set value, a signal is given in a period T1, a laser power supply is turned on, and the laser power supply is powered on (a power supply grid provides a power source for the laser power supply); the MCU monitoring unit 30 detects the output voltage of the laser power supply at the same time, when the output voltage of the laser power supply reaches a test requirement value, the MCU monitoring unit 30 gives out a signal to the electric isolation unit 10, and the electric isolation unit 10 is connected (the electric communication between the laser power supply and the feedback load unit is realized); simultaneously turning off the AC/DC precharge power supply unit;
s3, after the AC/DC precharge power supply is turned off, in a period T2, the MCU monitoring unit 30 sends a signal to the feedback type load unit 40, the feedback type load unit 40 starts to gradually increase current (such as from 0A to 45A) to drive a load in an AV mode (constant voltage mode), and when the test set requirement value (45A) is reached, the operation work of the stable load is kept; the laser power supply current passes through the electric isolation unit 10, is converted and inverted into electric energy equal to a power supply grid through the feedback type load unit 40, and is returned to the power supply grid;
s4, in the period of T3, the laser power supply reaches the test time, the power supply is disconnected, and the laser power supply is replaced for the next round of aging test.
The test principle of the test system is as follows: the power supply grid provides alternating current energy for the laser power supply, the laser power supply converts the received alternating current energy into direct current energy which is controllable in current and suitable for being applied by the laser pumping source, the direct current energy is provided to the feedback type load unit 40 through the electric isolation unit 10, the feedback type load unit 40 converts the received direct current energy into electric energy which is equal to the power supply grid in reverse, and the electric energy returns to the power supply grid, so that the energy saving effect is achieved.
The practical application benefits of the test system are as follows:
1. the laser power supply is about 200 ten thousand/kilowatt, the laser power supply is subjected to aging test for 4 hours each time, the energy-saving efficiency of the load device for the energy-saving aging test of the laser power supply is 80%, and the energy-saving load device can save one year: 200 x 4 x 0.8=640 kilodegrees of power.
2. The test system improves the 10% direct rate of the laser power supply during aging test, reduces the defects caused by aging load, and greatly reduces the manufacturing cost of the laser power supply.
The design of the invention is focused on that the test system for the laser power supply is formed by combining an electric isolation unit, an AC/DC pre-charge power supply unit, an MCU monitoring unit and a feedback type load unit. The test system can intelligently monitor the working state of the laser power supply in real time when the laser power supply is subjected to aging test, control the working time sequence of the laser power supply when the laser power supply is started or shut down, and convert and feed back the electric energy of the aged laser power supply to a power supply grid; the purposes of reducing electric energy loss, reducing heat generation, relieving power supply pressure of an industrial park, improving the reliability of aging test of a laser power supply and reducing the manufacturing cost of the laser power supply are achieved.
Particularly, the arrangement of the electric isolation unit and the AC/DC pre-charging power supply unit ensures that the current stability of the laser power supply is guaranteed, and the arrangement of the MCU monitoring unit ensures that each unit of the test system works strictly according to time sequence, thereby improving the working safety and stability of the laser power supply.
The foregoing description is only a preferred embodiment of the present invention, and is not intended to limit the technical scope of the present invention, so any minor modifications, equivalent changes and modifications made to the above embodiments according to the technical principles of the present invention still fall within the scope of the technical solutions of the present invention.
Claims (6)
1. An intelligent testing system for a laser power supply is characterized in that: comprises the following steps of
The feedback load unit is used for converting and inverting the electric energy of the laser power supply into electric energy equal to the power supply grid and returning the electric energy to the power supply grid;
an AC/DC pre-charge power supply unit for supplying power to the capacitive load of the feedback load unit; the AC/DC precharge power supply unit is provided with a charging end, the feedback load unit is provided with a power receiving end, and a diode is connected between the charging end of the AC/DC precharge power supply unit and the power receiving end of the feedback load unit;
the electric isolation unit is used for preventing the power supplied by the AC/DC precharge power supply from being transmitted to the power supply end of the laser when the AC/DC precharge power supply supplies power to the feedback load unit, so that the power supply of the laser is unstable and damaged;
the MCU monitoring unit is used for controlling the working time sequence of each unit, monitoring the working state of each unit in the test process in real time and reporting real-time data;
the feedback type load unit is connected between the electric isolation unit and a power supply grid; the AC/DC precharge power supply unit is connected with the feedback type load unit; the MCU monitoring unit is respectively connected with the feedback load unit, the AC/DC precharge power supply unit and the electric isolation unit;
the AC/DC precharge power supply unit and the feedback load unit are also respectively provided with a signal receiving end; the laser power supply is provided with an output end and a signal receiving end; the MCU monitoring unit is provided with a first signal detection end, a second signal detection end, a first signal emission end, a second signal emission end and a third signal emission end; the first signal detection end is connected with the power receiving end of the feedback load unit, the first signal emission end is connected with the signal receiving end of the laser power supply, the second signal detection end is connected with the output end of the laser power supply, and the third signal emission end is connected with the signal receiving end of the AC/DC precharge power supply unit; the second signal transmitting end is connected with the signal receiving end of the feedback load unit;
starting up the test system, powering up the test system, performing self-test, starting running operation of the AC/DC precharge power supply unit after self-test, outputting charging voltage by a charging end VO+ of the AC/DC precharge power supply unit, and charging a power receiving end VI+ of the feedback load unit through a diode Df; when the first signal detection end VI+ of the MCU monitoring unit detects that the charging voltage of the power receiving end VI+ of the feedback load unit reaches a set value, a high-level signal is given out through a port of the first signal transmitting end MCU 1; the MCU1 port of the signal receiving end of the laser power supply detects a high-level signal, and the laser power supply starts to perform power-on operation; the second signal detection end VO1+ of the MCU monitoring unit starts to detect the voltage of the port of the output end VO1+ of the laser power supply, when the output voltage of the laser power supply is detected to reach a test requirement value, the port of the MCU3 of the third signal emission end of the MCU monitoring unit gives out a high-level signal, the port of the MCU3 of the signal receiving end of the AC/DC precharge power supply unit detects the signal, and the charging end VO+ of the AC/DC precharge power supply unit is closed to output charging voltage; the electric quantity of the output end VO1+ port of the laser power supply passes through an electric isolation unit and is provided to the power receiving end VI+ of the feedback load unit, after the first signal detection end VI+ of the MCU monitoring unit detects the voltage of the laser power supply, the port of the second signal transmitting end MCU2 gives a high-level signal, the port of the signal receiving end MCU2 of the feedback load unit detects the signal, the current band load starts to be gradually pulled up in an AV mode, and when the current band load reaches a test set requirement value, the load operation work of the stabilizing band 45A is kept; when the feedback load unit keeps the stable belt 45A to operate, the electric energy of the stable belt 45A is converted and inverted into electric energy equal to the electric energy of the power supply grid, and the electric energy is returned to the power supply grid.
2. The intelligent testing system of laser power according to claim 1, wherein: the output end of the laser power supply is connected with the electric isolation unit and the power receiving end of the feedback load unit in sequence.
3. The intelligent testing system of laser power according to claim 1, wherein: the electric isolation unit is a power diode, a power MOS tube, a relay, an electronic switch or a controllable silicon.
4. The intelligent testing system of laser power according to claim 1, wherein: the MCU monitoring unit is a NUC131LxxAE, STM32G070RBT or PIC18F45Q10 chip.
5. The intelligent testing system of laser power according to claim 1, wherein: the AC/DC pre-charging power supply unit is an external AC/DC power supply.
6. A testing method applied to the intelligent testing system of the laser power supply according to any one of claims 1 to 5, comprising the following steps:
s1, a test system is connected with a power supply grid to start self-test, and after the self-test is finished, an AC/DC precharge power supply unit is turned on to charge a feedback load unit in a period T0;
s2, when the MCU monitoring unit detects that the charging amount of the feedback load unit reaches a set value, a signal is given in a period T1, a laser power supply is turned on, and the laser power supply is electrified to operate; the MCU monitoring unit detects the output voltage of the laser power supply at the same time, and when the output voltage of the laser power supply reaches a test requirement value, the MCU monitoring unit gives a signal to the electric isolation unit, and the electric isolation unit is connected; simultaneously turning off the AC/DC precharge power supply unit;
s3, after the AC/DC precharge power supply is turned off, in a period T2, the MCU monitoring unit sends a signal to the feedback type load unit, the feedback type load unit starts to gradually pull up current to drive the load in an AV mode, and when the current reaches a test set requirement value, the operation work of the load with the stability is kept; the laser power supply current is converted and inverted into electric energy equal to the power supply grid through the feedback type load unit through the electric isolation unit, and is returned to the power supply grid;
s4, in the period of T3, the laser power supply reaches the test time, the power supply is disconnected, and the laser power supply is replaced for the next round of aging test.
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| Publication number | Priority date | Publication date | Assignee | Title |
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