CN116539174A - Measuring device precision compensation method based on AD sampling - Google Patents
Measuring device precision compensation method based on AD sampling Download PDFInfo
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- CN116539174A CN116539174A CN202210092342.5A CN202210092342A CN116539174A CN 116539174 A CN116539174 A CN 116539174A CN 202210092342 A CN202210092342 A CN 202210092342A CN 116539174 A CN116539174 A CN 116539174A
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- 238000005070 sampling Methods 0.000 title claims abstract description 103
- 238000000034 method Methods 0.000 title claims abstract description 34
- 238000005259 measurement Methods 0.000 claims abstract description 65
- 238000012360 testing method Methods 0.000 claims abstract description 39
- 230000008569 process Effects 0.000 claims description 13
- 230000001960 triggered effect Effects 0.000 claims description 3
- 230000009467 reduction Effects 0.000 claims description 2
- 230000001360 synchronised effect Effects 0.000 claims description 2
- 238000004364 calculation method Methods 0.000 description 6
- 238000004891 communication Methods 0.000 description 6
- 230000007613 environmental effect Effects 0.000 description 6
- 238000006243 chemical reaction Methods 0.000 description 5
- 230000009286 beneficial effect Effects 0.000 description 2
- 239000006185 dispersion Substances 0.000 description 2
- 238000000354 decomposition reaction Methods 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 230000006872 improvement Effects 0.000 description 1
- 230000003993 interaction Effects 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 238000012544 monitoring process Methods 0.000 description 1
- 230000001105 regulatory effect Effects 0.000 description 1
- 230000008054 signal transmission Effects 0.000 description 1
Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01K—MEASURING TEMPERATURE; MEASURING QUANTITY OF HEAT; THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR
- G01K7/00—Measuring temperature based on the use of electric or magnetic elements directly sensitive to heat ; Power supply therefor, e.g. using thermoelectric elements
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- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
- H03M1/00—Analogue/digital conversion; Digital/analogue conversion
- H03M1/06—Continuously compensating for, or preventing, undesired influence of physical parameters
- H03M1/08—Continuously compensating for, or preventing, undesired influence of physical parameters of noise
- H03M1/089—Continuously compensating for, or preventing, undesired influence of physical parameters of noise of temperature variations
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- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
- H03M1/00—Analogue/digital conversion; Digital/analogue conversion
- H03M1/12—Analogue/digital converters
- H03M1/124—Sampling or signal conditioning arrangements specially adapted for A/D converters
- H03M1/1245—Details of sampling arrangements or methods
Abstract
The invention discloses a measuring device precision compensation method based on AD sampling, which comprises the following steps: placing the measuring device in an oven and accessing an automatic test system; adjusting the temperature of the oven and triggering the tester to output an analog signal, and transmitting the measurement result, together with the internal operating temperature of the device, to an automatic test system by the measurement device according to the analog signal; the automatic test system calculates a compensation coefficient according to the measurement result and forms a compensation coefficient record together with the internal operating temperature of the device; repeatedly adjusting the temperature of the oven to obtain compensation coefficient records at different running temperatures, and storing the compensation coefficient records in a measuring device; and (3) adopting different compensation coefficients to realize the compensation of the sampling measurement precision according to the internal operating temperature of the device. The invention solves the problems of sampling measurement errors exceeding the standard specified range caused by poor consistency of component precision and temperature characteristics used by a sampling loop of the measuring device based on AD sampling, and greatly improves the sampling measurement precision of the measuring device.
Description
Technical Field
The invention relates to the technical field of sampling measurement precision compensation, in particular to a sampling measurement precision compensation method of a measuring device based on AD sampling.
Background
The sampling measurement precision of the measuring device directly determines whether the automatic monitoring system can accurately monitor the running condition of the power grid, sampling data of the measuring device enters the device after being converted from a voltage-current transformer, is converted into analog small signals through the transformer in sequence, is converted into digital signals through an analog-to-digital conversion AD sampling chip, and finally obtains corresponding measuring data such as voltage, current, frequency, and power through subsequent FFT decomposition, interpolation calculation and the like. In the whole data conversion process, the performance of the sampling loop components, particularly the accuracy of AD conversion, is a key factor mainly influencing the accuracy index. The related components adopted by the sampling loop of the current measuring device, particularly the hardware such as an AD sampling chip and the like are limited by the aspects of technology and the like, the conversion consistency dispersion degree is larger, the temperature consistency is poorer, the sampling measurement error dispersion degree is larger, the sampling measurement error is larger in a high-low temperature environment, and even the sampling measurement error exceeds the error allowable range specified by the standard, so that the dynamic precision compensation on the algorithm needs to be carried out on the sampling loop.
Disclosure of Invention
The invention aims to: the invention aims to provide a method for compensating the sampling measurement precision of a measuring device based on AD sampling, which can greatly improve the sampling measurement precision of the measuring device.
The technical scheme is as follows: the invention relates to a sampling measurement precision compensation method of a measuring device, which is characterized by comprising the following steps of:
(1) Placing the measuring device in a temperature-adjustable oven and accessing an automatic test system;
(2) An oven temperature controller in the automatic test system adjusts the oven environment temperature according to program setting, and after the temperature in the oven is stable for a specific time, the tester is triggered to output an analog sampling signal;
(3) The measuring device calculates a sampling measurement result according to the acquired analog sampling signal, and transmits the sampling measurement result and the actual running temperature inside the measuring device to the automatic test system;
(4) The automatic test system calculates a sampling compensation coefficient according to a sampling measurement result of the measuring device and an analog sampling signal output by the tester, and combines the internal operating temperature of the measuring device to form a corresponding operating temperature+compensation coefficient record;
(5) The automatic test system changes the environmental temperature of the oven according to a set program, repeatedly executes the steps (2) - (4), and finally completes the calculation of the compensation coefficients of a plurality of preset temperature points within a set range to form a plurality of running temperature plus compensation coefficient records;
(6) The automatic test system transmits the recorded running temperature and compensation coefficients to a measuring device, and the measuring device stores a plurality of running temperatures and compensation coefficients in the device;
(7) In the initialization process of the measuring device, dividing the measuring device into a plurality of different sections according to the interval between the minimum temperature and the maximum temperature in the stored record, and selecting a plurality of temperature points according to the set step length;
(8) Calculating compensation coefficients corresponding to the temperature points in each section;
(9) In the running process of the measuring device, according to the internal running temperature of the measuring device, the compensation coefficient of each temperature point is calculated in the initializing process, and the sampling measurement precision real-time dynamic compensation is carried out.
In the step (1), a plurality of measuring devices can be simultaneously placed in the oven, the environmental temperature in the oven can be automatically adjusted through an automatic test system, and the automatic test system can be simultaneously connected with the plurality of measuring devices.
The automatic test system is in communication connection with the measuring device in a wired mode, and analog sampling signal transmission is carried out through the signal cable.
In the step (2), the tester outputs analog sampling signals including but not limited to analog signals such as three-phase voltage and three-phase current, synchronous voltage, zero-sequence current, and the like.
In step (3), the sampling measurement results calculated by the measuring device include, but are not limited to, voltage and current sampling waveforms, effective value amplitude values and phase angles, and the actual running temperature inside the device is acquired through an internal temperature sensor of the device.
In step (4), the sampling compensation coefficients calculated by the automated test system include, but are not limited to, an amplitude compensation coefficient and a phase angle compensation coefficient of each sampling channel.
In step (8), the method of dynamically calculating the compensation coefficient corresponding to each temperature point by the measuring device includes, but is not limited to, calculating the compensation coefficient corresponding to each discrete temperature point in each section by using a nonlinear fitting algorithm.
In the step (9), during the operation of the measuring device, the real-time operation temperature inside the device is reduced to the discrete temperature points obtained by fitting in the initialization stage, and the reduction method includes, but is not limited to, rounding, searching for a corresponding compensation coefficient according to the reduced discrete point temperature, and multiplying the sampling measurement result calculated by the device by the corresponding compensation coefficient to obtain a compensated sampling measurement value.
The beneficial effects are that: compared with the prior art, the invention has the beneficial effects that: (1) According to the invention, the automatic test system is used for completing sampling measurement precision compensation coefficients of a plurality of temperature datum points of the measuring device, and completing calculation of the compensation coefficients of all the temperature points in the initialization stage of the measuring device, the sampling measurement precision compensation function is realized only by multiplying the sampling measurement values by the compensation coefficients in the operation process of the measuring device, and the sampling measurement precision of the measuring device is improved only by adding a very small on-line operation amount; (2) The problems that components such as a sampling loop AD chip of the measuring device are limited by technical process and the like and the consistency and the high-low temperature characteristics are poor are solved through dynamic compensation, and the influence of hardware bottleneck on the sampling measurement precision of the measuring device is eliminated.
Drawings
FIG. 1 is a flow chart of the present invention;
FIG. 2 is a schematic diagram of an automated test system architecture.
Detailed Description
The objects, technical solutions and advantages of the present invention will become more apparent by the following detailed description of the present invention when taken in conjunction with the accompanying drawings. It should be understood that the description is only illustrative and is not intended to limit the scope of the invention. In addition, in the following description, descriptions of well-known structures and techniques are omitted so as not to unnecessarily obscure the present invention.
As shown in fig. 1, the sampling measurement precision compensation method of the measuring device of the invention is characterized in that the measuring device is a measuring device based on a chip and an operating system, and the sampling measurement precision compensation is to compensate the problem that the sampling measurement precision cannot meet the application requirement due to the consistency of hardware sampling loop components and poor temperature characteristics by adopting a software dynamic real-time compensation mode, so that the final sampling measurement precision meets the application requirement; the method specifically comprises the following steps:
(1) Placing the measuring device in a temperature-adjustable oven and accessing an automatic test system; specifically, a plurality of measuring devices are sequentially placed in an oven, the environmental temperature in the oven can be automatically adjusted through an automatic test system, the measuring devices are electrified to run, the measuring devices are connected to a client of the automatic test system in a wired communication mode, communication data interaction with the automatic test system is achieved, the measuring devices are connected with a tester of the automatic test system through a signal cable, and collection of analog sampling signals output by the tester is achieved.
As shown in fig. 2, the automated test system includes an oven temperature controller and a high precision tester, the oven temperature controller is connected with the oven, and the tester is connected with the measuring device. When the automatic test system and the measuring device are in one-to-many relation, the automatic test system can be connected with a plurality of measuring devices at the same time, and sampling measurement precision compensation of the plurality of measuring devices is carried out at the same time.
(2) Adjusting the environmental temperature of the oven, and triggering the tester to output an analog sampling signal after the temperature is stable for a specific time; specifically, the program of the automatic test system presets N temperature points, and the selection and the number of the temperature points depend on the application environment requirement of the measuring device and the influence degree of the temperature on the sampling circuit components, for example: in the temperature range of-40 ℃ to +80 ℃, testing at intervals of 20 ℃, selecting N as 7, wherein the temperature points are-40 ℃, 20 ℃, 0 ℃, 20 ℃, 40 ℃, 60 ℃ and 80 ℃ respectively; in the running process of the system, the environmental temperature of the oven is sequentially regulated to be the temperature of the ith (i is more than or equal to 1 and less than or equal to N) temperature point, after the environmental temperature in the oven reaches the set temperature, the specific time is waited for, so that the internal running temperature of a measuring device in the oven is stable, a trigger tester outputs set voltage and current analog sampling data, and the sampling data is applied to the measuring device through a signal cable.
(3) The measuring device calculates a sampling measurement result and transmits the sampling measurement result to the automatic test system together with the acquired internal operating temperature of the measuring device; specifically, the measurement device obtains a voltage and current sampling measurement calculation result through a series of conversion operation processes in the device according to the collected voltage and current analog quantity sampling data, wherein the measurement result comprises amplitude, angle, original sampling waveform and the like, and the measurement result is transmitted to the automatic test system in a communication mode.
The temperature sensing equipment and the acquisition loop are embedded in the measuring device, the internal operating temperature of the device is acquired and calculated in real time, and the acquired temperature information and the sampling measurement result are transmitted to the automatic test system in a communication mode.
(4) And the automatic test system performs comparison calculation according to the analog quantity measurement result of the measuring device and the theoretical value output by the tester to obtain the analog quantity sampling angle compensation coefficient and the amplitude compensation coefficient of each sampling channel of the measuring device, and combines the internal operating temperature of the measuring device to form a corresponding temperature+compensation coefficient record.
(5) After the calculation of the compensation coefficient under one temperature point is completed, the automatic test system adjusts the temperature of the oven to the temperature of the next test point according to program setting, after the temperature is stabilized for a specific time, the tester is triggered to output the set voltage and current analog sampling data, the recording of the operation temperature and the compensation coefficient of the measuring device under the temperature point is further completed, the process is repeated, and finally the recording of the operation temperature and the compensation coefficient of the measuring device under N temperature points is completed.
(6) And transmitting the records of the operating temperatures and the compensation coefficients of the measuring device at the N temperature points to the measuring device in a communication mode, wherein the measuring device stores the records of the N operating temperatures and the compensation coefficients in the device.
(7) In the process of powering up and initializing the measuring device, the program is divided into a plurality of different sections according to the stored temperature, and in each section, a linear or nonlinear fitting algorithm is adopted to further calculate compensation coefficients corresponding to each discrete temperature point by point, so as to form a compensation coefficient array in the whole temperature range, for example: according to the step length of 1 ℃, a compensation sequence of 121 temperature points is finally formed in the temperature range of-40 ℃ to +80 ℃, each sequence contains compensation coefficients of all sampling channels at the temperature points, and the specific step length and the temperature range are set in a measuring device and an automatic test system in advance.
(8) In the running process of the measuring device, the real-time running temperature inside the device is reduced to discrete temperature points obtained by fitting in an initialization stage, and corresponding compensation coefficients are obtained by searching according to the reduced discrete point temperatures, and the sampling measured value calculated by the device is multiplied by the corresponding compensation coefficients to obtain the sampling measured value after compensation.
The foregoing detailed description has been provided for the purpose of illustrating or explaining the principles of the present invention, and is presented in a description of one embodiment of the invention in more detail, but is not to be construed as limiting the invention. Accordingly, any modification, equivalent replacement, improvement, etc. made without departing from the concept of the present invention should be included in the scope of the present invention. Accordingly, the scope of protection of the present invention is to be determined by the appended claims.
Claims (9)
1. The sampling measurement precision compensation method of the measuring device based on AD sampling is characterized by comprising the following steps of:
(1) Placing the measuring device in a temperature-adjustable oven and accessing an automatic testing system, wherein the automatic testing system comprises an oven temperature controller and a measuring instrument, the oven temperature controller is connected with the oven, and the measuring instrument is connected with the measuring device;
(2) The oven temperature controller adjusts the temperature of the oven according to a preset program, and after the temperature in the oven is continuously stable for a set time, the tester is triggered to output an analog sampling signal;
(3) The measuring device calculates a sampling measurement result according to the acquired analog sampling signal, and transmits the sampling measurement result and the actual running temperature inside the measuring device to the automatic test system;
(4) The automatic test system calculates a sampling compensation coefficient according to a sampling measurement result of the measuring device and an analog sampling signal of the tester, and combines the actual operating temperature inside the measuring device to form a record of the operating temperature and the compensation coefficient;
(5) Adjusting the temperature of the oven within a set temperature range, and repeatedly executing the steps (2) - (4) to obtain a plurality of records of the running temperature and the compensation coefficient;
(6) The automatic test system transmits a plurality of records of the running temperature and the compensation coefficient to the measuring device for storage;
(7) In the initialization process of the measuring device, dividing a section between the minimum temperature and the maximum temperature in the stored record into a plurality of sections, and selecting a plurality of temperature points according to a set step length;
(8) Calculating compensation coefficients corresponding to the temperature points in each section through a fitting algorithm;
(9) And (3) in the running process of the measuring device, according to the internal running temperature of the measuring device, the compensation coefficient corresponding to each temperature point in (8) is used for carrying out real-time dynamic compensation of the sampling measuring result.
2. The sampling measurement accuracy compensation method of an AD sampling-based measurement device according to claim 1, characterized in that: the automatic test system is communicated with the measuring device through a signal cable.
3. The sampling measurement accuracy compensation method of an AD sampling-based measurement device according to claim 1, characterized in that: in the step (2), the analog quantity sampling signals output by the tester comprise three-phase voltage, three-phase current, synchronous voltage, zero sequence voltage and zero sequence current analog quantity signals.
4. The sampling measurement accuracy compensation method of an AD sampling-based measurement device according to claim 1, characterized in that: in the step (3), the sampling measurement result of the measurement device comprises a voltage and current sampling waveform, an effective value amplitude and a phase angle.
5. The sampling measurement accuracy compensation method of an AD sampling-based measurement device according to claim 1, characterized in that: the measuring device collects the actual running temperature inside the measuring device through a built-in temperature sensor.
6. The sampling measurement accuracy compensation method of an AD sampling-based measurement device according to claim 1, characterized in that: in the step (4), the sampling compensation coefficient calculated by the automated test system includes an amplitude compensation coefficient and a phase angle compensation coefficient of each sampling channel of the measuring device.
7. The sampling measurement accuracy compensation method of an AD sampling-based measurement device according to claim 1, characterized in that: in the step (8), a nonlinear fitting algorithm is used for calculating compensation coefficients corresponding to the temperature points in each section.
8. The sampling measurement accuracy compensation method of an AD sampling-based measurement device according to claim 1, characterized in that: in step (9), the measuring device reduces the internal operating temperature to a temperature point during operation, wherein the reduction method is a rounding mode.
9. The sampling measurement accuracy compensation method of an AD sampling-based measurement device according to claim 1, characterized in that: in the step (9), the sampling measurement result calculated by the measurement device is multiplied by the corresponding compensation coefficient to obtain a compensated sampling measurement value.
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| Application Number | Priority Date | Filing Date | Title |
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| CN202210092342.5A CN116539174A (en) | 2022-01-26 | 2022-01-26 | Measuring device precision compensation method based on AD sampling |
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