CN116502979A

CN116502979A - Method and apparatus for generating a dispatch plan for a test sample

Info

Publication number: CN116502979A
Application number: CN202310466876.4A
Authority: CN
Inventors: 郭虹利; 朱俊杰; 戴政桦; 俞敏莲
Original assignee: Basf Integrated Base Guangdong Co ltd
Current assignee: Basf Integrated Base Guangdong Co ltd
Priority date: 2023-04-26
Filing date: 2023-04-26
Publication date: 2023-07-28

Abstract

Embodiments of the present specification provide a method and apparatus for generating a dispatch plan for a test sample. In the method for generating the dispatch plan of the test sample, test tasks corresponding to each sample to be tested in a sample set to be tested are obtained, wherein the test tasks comprise test names and test time; inquiring the placement address of equipment required by the test according to the test name of the test task; determining at least one batch of samples to be tested from the sample set to be tested according to the test tasks corresponding to each sample set to be tested and the placement addresses of equipment required by the test; and generating an execution plan for dispatching the samples to the placement addresses of the equipment required by the test corresponding to each sample to be tested by taking the determined at least one batch of samples to be tested as a unit, wherein the execution plan is used for indicating that each sample to be tested in each batch of samples to be tested is dispatched to the placement address of the equipment required by the corresponding test at a time not later than the corresponding test time.

Description

Method and apparatus for generating a dispatch plan for a test sample

Technical Field

Embodiments of the present disclosure relate generally to the field of intelligent control testing technology, and more particularly, to methods and apparatus for generating a dispatch plan for a test sample.

Background

With the rapid development of artificial intelligence technology, intelligent control testing technology has also become more and more widely applied. In the fields of chemical production, laboratory test and the like, samples to be tested are collected from a production line or an experimental site and then are usually required to be sent to a designated place for corresponding test. Thus, how to plan to help improve the efficiency of sample dispatch from the sample collection to the test site is a problem to be solved in the face of the existing plurality of samples to be tested.

Disclosure of Invention

In view of the foregoing, embodiments of the present specification provide a method and apparatus for generating a dispatch plan for a test sample. By using the method and the device, the automatic generation of the dispatching plan of the test sample can be realized, so that a technical basis is provided for the efficient dispatching of the test sample based on the angles of the samples in batches.

According to an aspect of embodiments of the present specification, there is provided a method for generating a dispatch plan for a test sample, comprising: obtaining test tasks corresponding to each sample to be tested in a sample set to be tested, wherein the test tasks comprise test names and test time; inquiring the placement address of equipment required by the test according to the test name of the test task; determining at least one batch of samples to be tested from the sample set to be tested according to the test tasks corresponding to each sample set to be tested and the placement addresses of equipment required by the test; and generating an execution plan for dispatching the samples to the placement addresses of the equipment required by the test corresponding to each sample to be tested by taking the determined at least one batch of samples to be tested as a unit, wherein the execution plan is used for indicating that each sample to be tested in each batch of samples to be tested is dispatched to the placement address of the equipment required by the corresponding test at a time not later than the corresponding test time.

According to another aspect of embodiments of the present specification, there is provided an apparatus for generating a dispatch plan for a test sample, comprising: the system comprises a task acquisition unit, a test module and a test module, wherein the task acquisition unit is configured to acquire test tasks corresponding to all samples to be tested in a sample set to be tested, and the test tasks comprise test names and test time; the address determining unit is configured to query the placement address of the equipment required by the test according to the test name of the test task; the batch determining unit is configured to determine at least one batch of samples to be tested from the sample set to be tested according to the test tasks corresponding to the samples to be tested in the sample set to be tested and the placement addresses of equipment required for testing; and a plan generating unit configured to generate an execution plan for sample dispatch to the placement address of the test requiring device corresponding to each sample to be tested, with the determined at least one batch of samples to be tested as a unit, wherein the execution plan is used for indicating that each sample to be tested in each batch of samples to be tested is dispatched to the placement address of the corresponding test requiring device no later than the corresponding test time.

According to another aspect of embodiments of the present specification, there is provided an apparatus for generating a dispatch plan for a test sample, comprising: at least one processor, and a memory coupled to the at least one processor, the memory storing instructions that, when executed by the at least one processor, cause the at least one processor to perform the method for generating a dispatch plan for a test sample as described above.

According to another aspect of embodiments of the present specification, there is provided a computer readable storage medium storing a computer program which, when executed by a processor, implements a method for generating a dispatch plan for a test sample as described above.

Drawings

A further understanding of the nature and advantages of the present description may be realized by reference to the following drawings. In the drawings, similar components or features may have the same reference numerals.

FIG. 1 illustrates an exemplary architecture of a method and apparatus for generating a dispatch plan for a test sample in accordance with embodiments of the present description.

FIG. 2 illustrates a flowchart of one example of a method for generating a dispatch plan for a test sample in accordance with embodiments of the present description.

Fig. 3 shows a flowchart of one example of a process for determining at least one batch of samples to be tested according to an embodiment of the present disclosure.

Fig. 4 shows a flowchart of one example of a generation process of a sample dispatch execution plan according to an embodiment of the present specification.

Fig. 5 shows a flowchart of yet another example of a method for generating a dispatch plan for a test sample in accordance with an embodiment of the present description.

Fig. 6 shows a schematic diagram of an example of an application scenario of a generation process of a sample dispatch multi-machine execution plan according to an embodiment of the present specification.

Fig. 7 shows a block diagram of one example of an apparatus for generating a dispatch plan for a test sample in accordance with an embodiment of the present specification.

Fig. 8 shows a block diagram of one example of a lot determining unit in an apparatus for generating a dispatch plan for a test sample according to an embodiment of the present specification.

Fig. 9 shows a block diagram of yet another example of an apparatus for generating a dispatch plan for a test sample in accordance with an embodiment of the present specification.

Fig. 10 shows a block diagram of one example of an apparatus for generating a dispatch plan for a test sample in accordance with an embodiment of the present specification.

Detailed Description

The subject matter described herein will be discussed below with reference to example embodiments. It should be appreciated that these embodiments are discussed only to enable a person skilled in the art to better understand and thereby practice the subject matter described herein, and are not limiting of the scope, applicability, or examples set forth in the claims. Changes may be made in the function and arrangement of elements discussed without departing from the scope of the embodiments herein. Various examples may omit, replace, or add various procedures or components as desired. In addition, features described with respect to some examples may be combined in other examples as well.

As used herein, the term "comprising" and variations thereof mean open-ended terms, meaning "including, but not limited to. The term "based on" means "based at least in part on". The terms "one embodiment" and "an embodiment" mean "at least one embodiment. The term "another embodiment" means "at least one other embodiment". The terms "first," "second," and the like, may refer to different or the same object. Other definitions, whether explicit or implicit, may be included below. Unless the context clearly indicates otherwise, the definition of a term is consistent throughout this specification.

Methods and apparatuses for generating a dispatch plan for a test sample according to embodiments of the present specification will be described in detail with reference to the accompanying drawings.

FIG. 1 illustrates an exemplary architecture 100 of a method and apparatus for generating a dispatch plan for a test sample in accordance with embodiments of the present description.

In fig. 1, a network 110 is employed to interconnect between a terminal device 120 and an application server 130.

Network 110 may be any type of network capable of interconnecting network entities. The network 110 may be a single network or a combination of networks. In terms of coverage, network 110 may be a Local Area Network (LAN), wide Area Network (WAN), or the like. In terms of a carrier medium, the network 110 may be a wired network, a wireless network, or the like. In terms of data switching technology, the network 110 may be a circuit switched network, a packet switched network, or the like.

Terminal device 120 may be any type of electronic computing device capable of connecting to network 110, accessing servers or websites on network 110, processing data or signals, and the like. For example, the terminal device 120 may include various devices for collecting information of a sample to be tested, such as a camera, a barcode scanning device, a two-dimensional barcode scanning device, and the like. The terminal device 120 may scan the sample 121 to be tested stored in a designated location (e.g., sample holder, sample cabinet, etc.) to obtain corresponding information (e.g., sample ID, etc.) for each sample to be tested. Although only one terminal device is shown in fig. 1, it should be understood that there may be a different number of terminal devices connected to the network 110.

In one embodiment, the terminal device 120 may be used by a user. In some cases, the terminal device 120 may interact with the application server 130. For example, terminal device 120 may communicate to application server 130 corresponding information of the sample under test scanned by the user.

In one example, the application server 130 may be connected with a test task generation module 131. The test task generating module 131 may be configured to generate a test task corresponding to each sample to be tested in the sample set to be tested. In one example, application server 130 may also locally generate test tasks corresponding to each sample to be tested in the set of sample to be tested. The dispatch plan for the test samples generated by the application server 130 may be used to instruct the samples 121 to be tested to be dispatched in accordance with the determined lot (e.g., 3 lots as shown in fig. 1).

It should be appreciated that all network entities shown in fig. 1 are exemplary and that any other network entity may be involved in architecture 100, depending on the particular application requirements.

FIG. 2 illustrates a flow chart of a method 200 for generating a dispatch plan for a test sample in accordance with an embodiment of the present description.

As shown in fig. 2, at 210, a test task corresponding to each sample to be tested in the set of samples to be tested is obtained.

In this embodiment, the test task may include a test name and a test time. In one example, the above-described test tasks may be determined in a specified order (e.g., sequential order of placement onto the sample holder). In one example, the test tasks described above may be determined according to a high-level plan and schedule (Advanced Planning and Scheduling, APS). For example, the Test task Test1 corresponding to the sample to be tested Samp1 may include a Test name test_name1 and a Test time test_time1. In one example, the test name may be used to indicate a category of the test, such as visual inspection, impact test, moisture test (moistures test), ash test (ash test), and the like. The test time may be used to indicate the expected time of performance of the test task. In one example, the test time may include a test start time. In one example, the test time may also include a test end time.

At 220, the placement address of the device required for testing is queried according to the test name of the test task.

In this embodiment, the correspondence between the test name and the device required for the test may be set in advance. Wherein, the equipment required by the test can be corresponding to a placement address. In one example, the devices required for the test may be queried from the above-described scheduling results of the APS according to the test names of the test tasks. In one example, the placement address may be queried from a pre-set device information statistics table according to the device required for the test. In one example, the placement address of the device required for testing may also be queried directly from the preset test name-required device-placement address relationship table according to the test name of the test task.

In one example, the "moisture analyzer" may be queried as the device required for the test according to the "moisture test" indicated by test_name1, and then the "XX laboratory 205" may be queried as the placement address according to the "moisture analyzer". Alternatively, when there are plural devices of the same device, the device required for the test may be corresponded with the corresponding identification information (e.g., ID). In one example, the "analytical balance 03" may be queried as the equipment required for the test according to the "ash test" indicated by the test name of the test task, and then the "XX laboratory 102" may be queried as the placement address according to the "analytical balance 03".

At 230, at least one batch of samples to be tested is determined from the set of samples to be tested according to the test tasks corresponding to each sample to be tested in the set of samples to be tested and the placement addresses of the devices required for testing.

In one example, at least one batch of samples to be tested may be determined according to the relative position between the placement addresses of the devices required for testing. For example, the placement addresses of the devices required for testing corresponding to the same batch of samples to be tested are all the same floor. For another example, the distance between the placement addresses of the devices required for testing corresponding to the same batch of samples to be tested is less than a preset distance threshold.

Optionally, with continued reference to fig. 3, fig. 3 shows a schematic diagram of one example of a process 300 of determining at least one batch of samples to be tested according to an embodiment of the present disclosure.

As shown in fig. 3, at 310, a first set of samples to be tested is formed by selecting samples to be tested from the set of samples to be tested for which the corresponding test time satisfies the predetermined time requirement.

In one example, the predetermined time requirement may be that the test start time is within a predetermined time interval (e.g., 9:30-10:00, 10:00-10:30). So that at least one first set of samples to be tested can be formed.

At 320, a set of samples to be tested is formed as a second set of samples to be tested, wherein the set address of the corresponding device required for testing is selected from the first set of samples to be tested to meet the preset address requirement.

In one example, the preset address requirement may be that the placement addresses of the devices required for testing corresponding to the respective samples to be tested belonging to the same second sample set to be tested are all located on the same floor. For another example, the distance between the placement addresses of the devices required for testing corresponding to each sample to be tested belonging to the same second sample set to be tested is smaller than the preset distance threshold. Thus, at least one second set of samples to be tested may be formed in each first set of samples to be tested.

At 330, at least one sample to be tested is determined from the second set of samples to be tested.

In one example, samples to be tested belonging to the same second set of samples to be tested may be determined as the same set of samples to be tested, thereby obtaining at least one determined set of samples to be tested. In one example, the samples to be tested that do not belong to any of the first set of samples to be tested may also be taken as the same batch of samples to be tested. In one example, the samples to be tested, which do not belong to any second sample set to be tested in each first sample set to be tested, may be batched according to the first sample set to be tested, so as to obtain samples to be tested in the same batch as the number of the first sample sets to be tested.

Based on the method, the samples to be tested can be batched according to the time corresponding to the samples to be tested and the placement addresses of the equipment required by the test, so that the efficiency of sample dispatching is improved.

Optionally, the predetermined time requirement may include that the time interval of the current time of the test time interval is smaller than the first predetermined interval. The preset address requirements may include no requirements. The batch may be performed according to the association between the placement addresses of the devices required for the test corresponding to each sample to be tested in the second sample set to be tested, so as to form at least one batch of samples to be tested. In one example, for each second sample set to be tested, batch processing may be further performed according to the association relationship between the placement addresses of the devices required for testing corresponding to the samples to be tested, for example, the samples to be tested whose placement addresses of the devices required for testing belong to the same floor are formed into the same batch of samples to be tested. In one example, the samples to be tested in the batches, which are not determined according to the association relation between the placement addresses of the equipment required for testing, in each second sample set to be tested may be further batched according to the second sample set to be tested, so as to obtain samples to be tested in batches the same as the number of the second sample sets to be tested.

Based on the method, the method and the device can realize more refined batching of the samples to be tested, so that the efficiency of sample dispatching is further improved.

Alternatively, the test time may include a test start time. The above-mentioned preset time requirement includes that the interval between the test start times is smaller than the second preset interval (e.g., 15 minutes, 30 minutes). The preset address requirement includes that the distance between the addresses is smaller than the preset distance. The batch may be performed according to the association between the placement addresses of the devices required for the test corresponding to each sample to be tested in the second sample set to be tested and the association between the corresponding test start times, so as to form at least one batch of samples to be tested.

In one example, for each second sample set to be tested, the batch may be further performed according to the association relationship between the placement addresses of the devices required for testing corresponding to the samples to be tested and the association relationship between the corresponding test start times, for example, the samples to be tested whose placement addresses of the devices required for testing correspond to the same floor and whose difference between the corresponding test start times is not more than 5 minutes are formed into the same batch of samples to be tested. In one example, for samples to be tested in the batch determined according to the association relationship between the placement addresses of the devices required for testing and the association relationship between the corresponding test start times, the samples to be tested in the second set of samples to be tested may be further batched according to the second set of samples to be tested, so as to obtain samples to be tested in the same batch as the second set of samples to be tested.

Returning to fig. 2, at 240, an execution plan for sample dispatch to the placement address of the test device corresponding to each sample to be tested is generated for each of the determined at least one batch of samples to be tested.

In this embodiment, the execution plan may be used to indicate that each sample to be tested in each batch of samples to be tested is dispatched to the placement address of the corresponding test-required device at no later than the corresponding test time.

Optionally, with continued reference to fig. 4, fig. 4 shows a flowchart of one example of a generation process 400 of a sample dispatch execution plan according to an embodiment of the present disclosure.

As shown in fig. 4, at 410, current status information of at least one movable sample-dispatching apparatus is obtained.

In one example, the movable specimen dispensing device may be various automated guided vehicles (Automated Guided Vehicle, AGV) that may be used to dispense the specimen to be tested. Wherein the current status information may include a current location of the movable sample dispatch device.

At 420, for each of the determined at least one batch of samples to be tested, determining whether a target movable sample dispatching device matching the batch of samples to be tested exists in the at least one movable sample dispatching device according to the obtained current state information of the at least one movable sample dispatching device.

In this embodiment, the target movable sample-sending device may be used to send each sample to be tested in the batch of samples to be tested to the placement address of the corresponding test-required device at no later than the corresponding test time. In one example, for a determined batch of samples to be tested, current state information is selected from the obtained current state information of each movable sample dispatching device, and whether the movable sample dispatching device corresponding to the current state information can dispatch each sample to be tested in the batch of samples to be tested to the placement address of the device required for testing corresponding to each sample at a time not later than the corresponding test time can be judged by using Motion Planning (Motion Planning) technology. The motion Planning algorithm may include Path Planning (Path Planning) and trajectory Planning (Trajectory Planning), among others. If yes, it may be determined that a target movable sample dispatching apparatus matched with the batch of samples to be tested exists in the at least one movable sample dispatching apparatus. If not, the current state information which is not selected can be reselected from the obtained current state information of each movable sample dispatching equipment, and the judgment is continued. And when the obtained judging results corresponding to the current state information of each movable sample dispatching device are no, determining that the target movable sample dispatching device matched with the batch of samples to be tested does not exist. It will be appreciated that the presence or absence of a target movable sample-dispensing device that matches each batch of samples to be tested may be determined in a similar manner.

In one example, path planning may be performed according to the current position of the movable sample dispatching device corresponding to the selected current state information and the placement address of the device required for testing corresponding to each sample to be tested in the batch of samples to be tested, where each sample to be tested in the batch of samples to be tested is located, obtained by taking the current position as a starting point and the path, and the placement address of the device required for testing corresponding to each sample to be tested in the batch of samples to be tested. Optionally, in the path planning process, the sequence of the placement addresses of the devices required by the test corresponding to each sample to be tested, which are used as the passing points, may be set according to the sequence of the test time corresponding to each sample to be tested in the batch of samples to be tested. And then, judging whether the expected time for reaching each passing point is not later than the corresponding test time of each sample to be tested in the batch of samples to be tested by combining the running speed and the acceleration limit of the movable sample dispatching equipment. If so, the movable sample dispatch device may be determined to be a target movable sample dispatch device that matches the batch of samples to be tested. If not, the sequence of each passing point can be adjusted, path planning can be carried out again, and then the judgment can be continued. And when the judging results corresponding to the path planning are no, determining that the movable sample dispatching equipment does not belong to the target movable sample dispatching equipment matched with the batch of samples to be tested.

At 430, a sample dispatch stand-alone execution plan corresponding to each target movable sample dispatch device that matches each batch of samples to be tested is generated for at least one batch of samples to be tested for which there is a matching target movable sample dispatch device.

In this embodiment, the sample dispatching stand-alone execution plan is used to instruct a movable sample dispatching device to dispatch each sample to be tested in a corresponding batch of samples to be tested to the placement address of the corresponding test-required device at a time not later than the corresponding test time. In one example, the sample dispatch stand alone execution plan may include an identification of the movable sample dispatch device, corresponding trajectory planning information. The corresponding track planning information may be obtained according to the motion planning process described above.

Alternatively, when there are at least two matched target movable sample dispatching apparatuses for a batch of samples to be tested for which there are matched target movable sample dispatching apparatuses, a sample dispatching stand-alone execution plan for one of the target movable sample dispatching apparatuses may be generated in various ways. In one example, the target mobile sample dispatch device for which the sample dispatch stand alone execution plan is targeted may be randomly selected. In one example, a target mobile sample serving device with the shortest path planning result may be selected.

In one example, the 1 st lot of samples to be tested for which there is a matching target movable sample-dispensing device may include sample to be tested Samp1, sample to be tested Samp5, and sample to be tested Samp7. Batch 2 of samples to be tested for which there is a matching target movable sample-dispensing device may include sample to be tested Samp2 and sample to be tested Samp6. The target movable sample dispatching apparatus that matches the 1 st sample to be tested may be Agv3. The target movable sample dispensing devices that match lot 2 samples to be tested may be Agv and Agv. A placement address for instructing the movable sample-dispatching apparatus Agv3 to dispatch the sample to be tested Samp1, sample to be tested Samp5, and sample to be tested Samp7 to the corresponding test-required apparatuses at no later than the corresponding test time in accordance with the trajectory planning information generated by the motion planning information may be generated. Similarly, a sample dispatch stand-alone execution plan may be generated for instructing the movable sample dispatch device Agv5 or Agv to dispatch the sample under test Samp2 and sample under test Samp6 to the placement addresses of the corresponding test requiring devices at no later than the corresponding test times in accordance with the trajectory planning information generated by the motion planning information.

The following steps 442-444 are performed for at least one batch of samples to be tested for which there is no matching target movable sample-dispensing device.

At 442, a set of movable sample-dispensing devices corresponding to each batch of samples to be tested is determined.

In this embodiment, each movable sample-sending device in the movable sample-sending device group may be used to send each sample to be tested in the batch of samples to be tested to the placement address of the corresponding test-required device at no later than the corresponding test time. In one example, for a determined batch of samples to be tested, where no matched target movable sample dispatching device exists, a state information set consisting of at least two pieces of current state information is selected from the obtained current state information of each movable sample dispatching device, and a motion planning technology can be used to determine whether at least two movable sample dispatching devices corresponding to the state information set can cooperate to dispatch each sample to be tested in the batch of samples to a placement address of a device required for testing corresponding to each sample at a time not later than a corresponding test time. For example, at least two movable sample-sending devices corresponding to the status information sets send a part of samples to be tested in the batch of samples to be tested. If yes, at least two movable sample dispatching devices corresponding to the state information set can be determined to be candidate movable sample dispatching device sets corresponding to the batch of samples to be tested. If not, the unselected state information group can be reselected from the obtained current state information of each movable sample dispatching equipment, and the judgment is continued. It will be appreciated that the set of movable sample-dispensing devices corresponding to each batch of samples to be tested may be determined in a similar manner.

In one example, path planning may be performed to obtain the positions of the part of the samples to be tested in the batch of samples to be tested and the placement addresses of the equipment to be tested corresponding to the part of the samples to be tested in the batch of samples to be tested by taking the respective current positions as a starting point according to the selected current positions of the at least two movable sample dispatching devices corresponding to the state information groups consisting of the at least two current state information and the placement addresses of the equipment to be tested corresponding to the respective samples to be tested in the batch of samples to be tested. The union of the partial samples to be tested corresponding to the at least two movable sample dispatching devices corresponding to the selected state information sets is the batch of samples to be tested. Optionally, in the path planning process, the part of the samples to be tested corresponding to the at least two movable sample sending devices corresponding to the state information sets may be determined according to the distance between the current positions of the at least two movable sample sending devices corresponding to the selected state information sets and the placement addresses of the devices required for testing corresponding to the samples to be tested in the batch of samples to be tested. And then, judging whether the expected time for reaching each passing point is no later than the test time corresponding to each sample to be tested in the batch of samples to be tested by combining the running speed and the acceleration limit of at least two movable sample dispatching devices corresponding to the state information group. If yes, at least two movable sample dispatching devices corresponding to the state information set can be determined to be candidate movable sample dispatching device sets corresponding to the batch of samples to be tested. If not, the sequence of each passing point can be adjusted and path planning can be carried out again, or new movable sample dispatching equipment can be added, and then the judgment can be continued.

Alternatively, the determined movable sample-dispatching apparatus group corresponding to the batch of samples to be tested may be directly determined. Alternatively, there may be at least two candidate movable sample-dispatching-equipment groups, from which movable sample-dispatching-equipment groups corresponding to the batch of samples to be tested may be determined in various ways. In one example, the candidate movable sample dispatch device group may be randomly selected from the at least two candidate movable sample dispatch device groups. In one example, the candidate movable sample dispatching device group with the shortest total length of the corresponding path planning result may be selected from the at least two candidate movable sample dispatching device groups.

At 444, a sample dispatch multi-machine execution plan is generated corresponding to each movable sample dispatch equipment group corresponding to each batch of samples to be tested.

In this embodiment, the above-mentioned multiple sample dispatch execution plan may include sub-execution plans of each movable sample dispatch device in the movable sample dispatch device group. The sub-execution plan may be used to indicate that at least one sample to be tested in the batch of samples to be tested is to be dispatched to the placement address of the corresponding test-required device no later than the corresponding test time. In one example, the sample dispatch multi-machine execution plan may include at least two sub-execution plans. The sub-execution plan may include an identification of the movable sample dispatch device and corresponding trajectory planning information. The corresponding track planning information may be obtained according to the motion planning process described above. Alternatively, the sub-execution plan may include an identification of the sample dispatch multi-machine execution plan to which it belongs.

In one example, lot 3 of samples to be tested for which there is no matching target movable sample-dispensing device may include sample to be tested Samp4, sample to be tested Samp8, and sample to be tested Samp9. The target movable sample-dispensing devices that match lot 3 of samples to be tested may be Agv and Agv. A sample dispatch multi-machine execution plan may be generated that instructs movable sample dispatch devices Agv1 and Agv to cooperatively dispatch sample under test Samp4, sample under test Samp8, and sample under test Samp9 to the placement addresses of the corresponding test requiring devices no later than the corresponding test times. In one example, the above-described sample dispatch multi-machine execution plan may further include a sub-execution plan for instructing the movable sample dispatch device Agv to dispatch the sample to be tested Samp4 and sample to be tested Samp8 to the corresponding placement addresses no later than the corresponding test time and a sub-execution plan for instructing the movable sample dispatch device Agv to dispatch the sample to be tested Samp9 to the placement addresses of the corresponding test requiring devices no later than the corresponding test time.

Based on the above, the present solution can provide a sample dispatch plan generated based on the current state information of the movable sample dispatch devices, for indicating batch dispatch of samples to be tested by one or more movable sample dispatch devices, so as to automatically and timely dispatch samples to be tested to a test site.

Referring now to fig. 5, fig. 5 illustrates a flow chart of yet another example of a method 500 for generating a dispatch plan for a test sample in accordance with an embodiment of the present disclosure.

At 510, test tasks corresponding to each sample to be tested in the set of samples to be tested are obtained.

At 520, the placement address of the device required for testing is queried according to the test name of the test task.

At 530, at least one batch of samples to be tested is determined from the set of samples to be tested according to the test tasks corresponding to each sample to be tested in the set of samples to be tested and the placement addresses of the devices required for testing.

At 540, current status information of at least one movable sample-dispatching apparatus is obtained.

At 550, for each of the determined at least one batch of samples to be tested, determining whether a target movable sample dispatching device matching the batch of samples to be tested exists in the at least one movable sample dispatching device according to the acquired current state information of the at least one movable sample dispatching device.

At 560, a sample dispatch stand-alone execution plan corresponding to each target movable sample dispatch device that matches each batch of samples to be tested is generated for at least one batch of samples to be tested for which there is a matching target movable sample dispatch device.

Steps 572-574, described below, are performed for at least one batch of samples to be tested for which there is no matching target movable sample-dispatching apparatus.

At 572, a set of movable sample-dispensing devices corresponding to each batch of samples to be tested is determined.

At 574, a sample dispatch multi-machine execution plan is generated corresponding to each movable sample dispatch equipment group corresponding to each batch of samples to be tested.

In this embodiment, a candidate sample dispatch multi-machine execution plan corresponding to each movable sample dispatch equipment group corresponding to each batch of samples to be tested may be generated. In one example, the candidate sample dispatch multi-machine execution plan may be derived with reference to the associated operations of step 444 in the previously described FIG. 4 embodiment. The candidate sample dispatch multi-machine execution plan may include sub-execution plans for each of the movable sample dispatch devices in the movable sample dispatch device group. The sub-execution plan may be used to indicate that at least one sample to be tested in the batch of samples to be tested is to be dispatched to the placement address of the corresponding test-required device no later than the corresponding test time.

In this embodiment, a candidate sample dispatch multi-machine execution plan satisfying the optimization condition may be selected from the generated candidate sample dispatch multi-machine execution plans as a candidate sample dispatch multi-machine execution plan to be optimized. In one example, the optimization condition may be that there is an overlap between paths corresponding to different movable sample dispatchers in the movable sample dispatcher group. And then, optimizing the candidate sample dispatching multi-machine execution plan to be optimized to obtain the sample dispatching multi-machine execution plan. Wherein the sample dispatch multi-machine execution plan described above may be used to instruct device coordination in a set of movable sample dispatch devices by transferring samples to be tested between at least one movable sample dispatch device. In one example, the at least one sub-execution plan may include path planning information and sample delivery information. The path planning information is used for indicating a path for routing the placement address of the equipment required for testing corresponding to at least part of the samples to be tested in the batch of samples to be tested. The sample transfer information may include a sample identification to be transferred, a sample transfer direction, a sample transfer location, and a sample transfer apparatus identification. The sample delivery direction may include receiving or delivering. The sample transfer apparatus identifier may include an identifier of a movable sample dispatch apparatus to which the transfer of the sample to be transferred is to be performed.

In one example, as shown in fig. 6, fig. 6 shows a schematic diagram of one example of an application scenario 600 of a generation process of a sample dispatch multi-machine execution plan according to an embodiment of the present specification. The 9 samples to be tested can be divided into three batches. The target movable sample dispatch device that matches the first 2 test samples may be a dispatch car X. The target movable sample dispatch device that matches the second 3 test samples may be a dispatch car Y. The third batch of samples to be tested for which there is no matching target movable sample-dispatching device may be denoted as { sample I, sample II, sample III, sample IV }. The movable sample dispatch equipment set corresponding to the third set of samples to be tested may be denoted as { delivery vehicle a, delivery vehicle B }. The locations where the 9 samples to be tested are placed may be as shown at 610 in fig. 6. The current locations of delivery vehicle a and delivery vehicle B may be as shown at 620, 630, respectively, in fig. 6. The placement addresses corresponding to sample I, sample II, sample III, sample IV are shown as 640, 650, 670, and 660, respectively, in fig. 6. Thus, as shown in the pre-optimization section, a candidate sample dispatch multi-machine execution plan including a sub-execution plan for instructing the dispensing vehicle a to dispatch the sample I, sample IV, and sample III obtained from the sample rack 610 to the placement address (shown as 640, 660, 670 in fig. 6) of the corresponding test-required device at no later than the corresponding test time and a sub-execution plan for instructing the dispensing vehicle B to dispatch the sample II obtained from the sample placement location 610 to the placement address (shown as 650 in fig. 6) of the corresponding test-required device at no later than the corresponding test time can be obtained.

It will be appreciated that the path of delivery vehicle B from current location 630 to sample placement location 610 along with placement address 640 of the test requiring device corresponding to sample I after sample II is retrieved overlaps with the path between delivery vehicle a retrieving sample I from sample placement location 610 and dispatching sample I to placement address 640 of the corresponding test requiring device.

Therefore, the candidate sample dispatching multi-machine execution plan to be optimized can be optimized, and the sample dispatching multi-machine execution plan is obtained. The sample dispatching multi-machine execution plan comprises a sub-execution plan of the delivery vehicle A and a sub-execution plan of the delivery vehicle B. As shown in the optimized section, the sub-execution plan of delivery vehicle a may be used to instruct delivery vehicle a to move from current location 620 to sample placement location 610, to retrieve sample I, sample II, sample III, sample IV, to dispatch sample I to placement address 640 of the corresponding test-required device and to deliver sample II to delivery vehicle B at placement address 640, and to dispatch samples IV, III in turn to placement addresses 660, 670 of the corresponding test-required device. The sub-execution plan of delivery vehicle B may be used to instruct delivery vehicle B to move from current location 630 to placement address 640 of the test-requiring device corresponding to sample I and to receive sample II from delivery vehicle B at placement address 640 and to dispatch sample II to placement address 650 of the corresponding test-requiring device.

It will be appreciated that the time for delivery vehicle a and delivery vehicle B to reach the placement address 640 of the device required for the test corresponding to sample I may be adjusted using motion planning techniques to satisfy that delivery vehicle a and delivery vehicle B meet and sample I, sample II, sample III, sample IV are all dispatched to the corresponding placement address no later than the corresponding test time.

Returning to fig. 5, at 580, instructions are sent to the respective movable sample dispatching apparatus according to the generated execution plan to cause the respective movable sample dispatching apparatus to dispatch each sample to be tested in each batch of samples to be tested to the placement address of the corresponding test requiring apparatus no later than the corresponding test time according to the execution plan.

In this embodiment, the generated execution plan may be issued to the corresponding movable sample dispatch device, so that the sample to be tested may be automatically and timely delivered to the test site.

By using the method for generating the dispatch plan of the test samples disclosed in fig. 1 to 6, batch processing can be performed according to the test tasks and the placement addresses corresponding to the test samples to be tested in the set of test samples, and the execution plan of dispatch of the test samples to be tested can be generated according to the determined batch, so that each test sample in each batch of test samples can be dispatched to the placement address of the corresponding test equipment at a time not later than the corresponding test time.

Fig. 7 shows a block diagram of one example of an apparatus 700 for generating a dispatch plan for a test sample in accordance with embodiments of the present disclosure. The apparatus embodiment may correspond to the method embodiments shown in fig. 2-6, and the apparatus may be specifically applied to various electronic devices.

As shown in fig. 7, the apparatus 700 for generating a dispatch plan for a test sample may include a task acquisition unit 710, an address determination unit 720, a lot determination unit 730, and a plan generation unit 740.

The task obtaining unit 710 is configured to obtain a test task corresponding to each sample to be tested in the sample set to be tested, where the test task includes a test name and a test time. The operation of the task acquisition unit 710 may refer to the operation of 210 described above with respect to fig. 2.

An address determining unit 720 configured to query a placement address of the device required for the test according to the test name of the test task. The operation of the address determination unit 720 may refer to the operation of 220 described above with respect to fig. 2.

And the batch determining unit 730 is configured to determine at least one batch of samples to be tested from the sample set to be tested according to the test task corresponding to each sample to be tested in the sample set to be tested and the placement address of the equipment required for testing. The operation of the lot determining unit 730 may refer to the operation of 230 described above with reference to fig. 2.

Optionally, with further reference to fig. 8, fig. 8 shows a block diagram of one example of a lot determining unit 800 in an apparatus for generating a dispatch plan for a test sample according to an embodiment of the present specification.

As shown in fig. 8, the lot determining unit 800 may include: a first selecting module 810, configured to select, from the set of samples to be tested, samples to be tested whose corresponding test time meets a preset time requirement, to form a first set of samples to be tested; a second selecting module 820 configured to select, from the first sample set to be tested, a sample set to be tested whose placement address of the corresponding device required for testing meets a preset address requirement; a determining module 830 is configured to determine at least one batch of samples to be tested from the second set of samples to be tested.

The operations of the first selection module 810, the second selection module 820, and the determination module 830 described above may refer to the operations of 310-330 described above with respect to fig. 3.

In one example, the preset time requirement includes a time interval of the test time interval current time being less than a first preset interval, and the preset address requirement includes no requirement. The determination module 830 is further configured to: and carrying out batch processing according to the association relation between the placement addresses of the equipment required by the test corresponding to each sample to be tested in the second sample set to be tested, so as to form at least one batch of samples to be tested.

In one example, the test time includes a test start time, the preset time requirement includes that an interval between the test start times is less than a second preset interval, and the preset address requirement includes that a distance between the addresses is less than a preset distance. The determination module 830 is further configured to: and carrying out batch processing according to the association relation between the placement addresses of the equipment required by the test corresponding to each sample to be tested in the second sample set to be tested and the association relation between the corresponding test starting time to form at least one batch of samples to be tested.

The operation of the determination module 830 described above may refer to the operation of the alternative implementation in 330 described above with respect to fig. 3.

Returning to fig. 7, the plan generating unit 740 is configured to generate, in units of the determined at least one batch of samples to be tested, an execution plan for performing sample dispatch to the placement address of the test requiring device corresponding to each sample to be tested, where the execution plan is used to instruct that each sample to be tested in each batch of samples to be tested is dispatched to the placement address of the corresponding test requiring device no later than the corresponding test time. The operation of the plan generation unit 740 may refer to the operation of 240 described above with reference to fig. 2.

In one example, the plan generation unit 740 is further configured to: acquiring current state information of at least one movable sample dispatching device, wherein the current state information comprises a current position; for each batch of samples to be tested in the determined at least one batch of samples to be tested, determining whether a target movable sample dispatching device matched with the batch of samples to be tested exists in the at least one movable sample dispatching device according to the acquired current state information of the at least one movable sample dispatching device, wherein the target movable sample dispatching device is used for dispatching each batch of samples to be tested in the batch of samples to be tested to a placement address of a corresponding device required for testing before the corresponding test time; generating a sample dispatching single machine execution plan corresponding to each target movable sample dispatching device matched with each batch of samples to be tested aiming at least one batch of samples to be tested with the matched target movable sample dispatching device; determining a movable sample dispatching equipment group corresponding to each batch of samples to be tested aiming at least one batch of samples to be tested without matched target movable sample dispatching equipment, wherein the movable sample dispatching equipment group is used for dispatching each sample to be tested in the batch of samples to be tested to a placement address of equipment required by the corresponding test before the corresponding test time; generating a sample dispatching multi-machine execution plan corresponding to each movable sample dispatching equipment group corresponding to each batch of samples to be tested, wherein the sample dispatching multi-machine execution plan comprises a sub-execution plan of each movable sample dispatching equipment in the movable sample dispatching equipment group, and the sub-execution plan is used for indicating that at least one sample to be tested in the batch of samples to be tested is dispatched to a placement address of a corresponding test required equipment before no later than a corresponding test time.

The operation of the plan generation unit 740 described above may refer to the operations of 410-444 described above with respect to fig. 4.

Referring now to fig. 9, fig. 9 shows a block diagram of yet another example of an apparatus 900 for generating a dispatch plan for a test sample in accordance with an embodiment of the present disclosure.

As shown in fig. 9, the apparatus 900 for generating a dispatch plan for a test sample may include a task acquisition unit 910, an address determination unit 920, a lot determination unit 930, a plan generation unit 940, and an instruction transmission unit 950.

In this embodiment, the sub-execution plan includes path planning information including path planning information indicating a placement address of a test requiring device corresponding to each at least part of the samples to be tested in the batch of samples to be tested, and sample transfer information including a sample identification to be transferred, a sample transfer direction including an identification of a movable sample dispatch device opposite to the transfer of the sample to be transferred, a sample transfer position, and a sample transfer device identification including a reception or a delivery. The remaining operations of the task acquiring unit 910, the address determining unit 920, the batch determining unit 930, and the plan generating unit 940 described above may refer to the relevant descriptions of the task acquiring unit 710, the address determining unit 720, the batch determining unit 730, and the plan generating unit 740 in the embodiment of fig. 7, and are not repeated herein.

The instruction sending unit 950 is configured to send an instruction to the respective movable sample sending device according to the generated execution plan, so that the respective movable sample sending device sends each sample to be tested in each batch of samples to be tested to the placement address of the corresponding test requiring device before no later than the corresponding test time according to the execution plan. The operation of the above-described instruction transmitting unit 950 may refer to the operation of 580 described above in fig. 5.

Embodiments of a method and apparatus for generating a dispatch plan for a test sample according to embodiments of the present specification are described above with reference to fig. 1 through 9.

The apparatus for generating a dispatch plan for a test sample according to the embodiments of the present disclosure may be implemented in hardware, or may be implemented in software, or a combination of hardware and software. Taking software implementation as an example, the device in a logic sense is formed by reading corresponding computer program instructions in a memory into a memory by a processor of a device where the device is located. In the present embodiment, the means for generating a dispatch plan for a test sample may be implemented using an electronic device, for example.

Fig. 10 shows a schematic diagram of an apparatus 1000 for generating a dispatch plan for a test sample in accordance with an embodiment of the present disclosure.

As shown in fig. 10, an apparatus 1000 for generating a dispatch plan for a test sample may include at least one processor 1010, memory (e.g., non-volatile memory) 1020, memory 1030, and communication interface 1040, with the at least one processor 1010, memory 1020, memory 1030, and communication interface 1040 being connected together via a bus 1050. The at least one processor 1010 executes at least one computer-readable instruction (i.e., the elements described above as being implemented in software) stored or encoded in memory.

In one embodiment, computer-executable instructions are stored in memory that, when executed, cause the at least one processor 1010 to: obtaining test tasks corresponding to each sample to be tested in a sample set to be tested, wherein the test tasks comprise test names and test time; inquiring the placement address of equipment required by the test according to the test name of the test task; determining at least one batch of samples to be tested from the sample set to be tested according to the test tasks corresponding to each sample set to be tested and the placement addresses of equipment required by the test; and generating an execution plan for dispatching the samples to the placement addresses of the equipment required by the test corresponding to each sample to be tested by taking the determined at least one batch of samples to be tested as a unit, wherein the execution plan is used for indicating that each sample to be tested in each batch of samples to be tested is dispatched to the placement address of the equipment required by the corresponding test at a time not later than the corresponding test time.

It should be appreciated that the computer-executable instructions stored in the memory, when executed, cause the at least one processor 1010 to perform the various operations and functions described above in connection with fig. 1-6 in various embodiments of the present specification.

According to one embodiment, a program product, such as a computer readable medium, is provided. The computer-readable medium may have instructions (i.e., the elements described above implemented in software) that, when executed by a computer, cause the computer to perform the various operations and functions described above in connection with fig. 1-6 in various embodiments of the present specification.

In particular, a system or apparatus provided with a readable storage medium having stored thereon software program code implementing the functions of any of the above embodiments may be provided, and a computer or processor of the system or apparatus may be caused to read out and execute instructions stored in the readable storage medium.

In this case, the program code itself read from the readable medium may implement the functions of any of the above-described embodiments, and thus the machine-readable code and the readable storage medium storing the machine-readable code form part of the present invention.

Computer program code required for operation of portions of the present description may be written in any one or more programming languages, including an object oriented programming language such as Java, scala, smalltalk, eiffel, JADE, emerald, C ++, c#, VB, NET, python and the like, a conventional programming language such as C language, visual Basic 2003, perl, COBOL 2002, PHP and ABAP, a dynamic programming language such as Python, ruby and Groovy, or other programming languages and the like. The program code may execute on the user's computer or as a stand-alone software package, or it may execute partly on the user's computer and partly on a remote computer or entirely on the remote computer or server. In the latter scenario, the remote computer may be connected to the user's computer through any form of network, such as a Local Area Network (LAN) or a Wide Area Network (WAN), or the connection may be made to an external computer (for example, through the Internet), or the connection may be made to the cloud computing environment, or for use as a service, such as software as a service (SaaS).

Examples of readable storage media include floppy disks, hard disks, magneto-optical disks, optical disks (e.g., CD-ROMs, CD-R, CD-RWs, DVD-ROMs, DVD-RAMs, DVD-RWs), magnetic tapes, nonvolatile memory cards, and ROMs. Alternatively, the program code may be downloaded from a server computer or cloud by a communications network.

The foregoing describes specific embodiments of the present disclosure. Other embodiments are within the scope of the following claims. In some cases, the actions or steps recited in the claims can be performed in a different order than in the embodiments and still achieve desirable results. In addition, the processes depicted in the accompanying figures do not necessarily require the particular order shown, or sequential order, to achieve desirable results. In some embodiments, multitasking and parallel processing are also possible or may be advantageous.

Not all steps or units in the above-mentioned flowcharts and system configuration diagrams are necessary, and some steps or units may be omitted according to actual needs. The order of execution of the steps is not fixed and may be determined as desired. The apparatus structures described in the above embodiments may be physical structures or logical structures, that is, some units may be implemented by the same physical entity, or some units may be implemented by multiple physical entities, or may be implemented jointly by some components in multiple independent devices.

The term "exemplary" used throughout this specification means "serving as an example, instance, or illustration," and does not mean "preferred" or "advantageous over other embodiments. The detailed description includes specific details for the purpose of providing an understanding of the described technology. However, the techniques may be practiced without these specific details. In some instances, well-known structures and devices are shown in block diagram form in order to avoid obscuring the concepts of the described embodiments.

The alternative implementation manner of the embodiment of the present disclosure has been described in detail above with reference to the accompanying drawings, but the embodiment of the present disclosure is not limited to the specific details of the foregoing implementation manner, and various simple modifications may be made to the technical solution of the embodiment of the present disclosure within the scope of the technical concept of the embodiment of the present disclosure, and all the simple modifications belong to the protection scope of the embodiment of the present disclosure.

The previous description of the disclosure is provided to enable any person skilled in the art to make or use the disclosure. Various modifications to the disclosure will be readily apparent to those skilled in the art, and the generic principles defined herein may be applied to other variations without departing from the scope of the disclosure. Thus, the disclosure is not intended to be limited to the examples and designs described herein but is to be accorded the widest scope consistent with the principles and novel features disclosed herein.

Claims

1. A method for generating a dispatch plan for a test sample, comprising:

obtaining test tasks corresponding to each sample to be tested in a sample set to be tested, wherein the test tasks comprise test names and test time;

Inquiring the placement address of equipment required by the test according to the test name of the test task;

determining at least one batch of samples to be tested from the sample set to be tested according to the test tasks corresponding to each sample set to be tested and the placement addresses of equipment required by the test; and

and generating an execution plan for sample dispatching to the placement address of the equipment required by the test corresponding to each sample to be tested by taking the determined at least one batch of sample to be tested as a unit, wherein the execution plan is used for indicating that each sample to be tested in each batch of samples to be tested is dispatched to the placement address of the equipment required by the corresponding test at a time not later than the corresponding test time.

2. The method of claim 1, wherein the determining at least one batch of samples to be tested from the set of samples to be tested according to the test task corresponding to each sample to be tested in the set of samples to be tested and the placement address of the equipment required for the test comprises:

selecting corresponding to-be-tested samples with testing time meeting the preset time requirement from the to-be-tested sample set to form a first to-be-tested sample set;

selecting a to-be-tested set with the placement address of the corresponding equipment required by the test meeting the preset address requirement from the first to-be-tested sample set to form a second to-be-tested sample set;

And determining at least one batch of samples to be tested from the second sample set to be tested.

3. The method of claim 2, wherein the predetermined time requirement comprises a test time interval of a current time being less than a first predetermined interval, the predetermined address requirement comprises no requirement,

the determining at least one batch of samples to be tested from the second sample set to be tested includes:

and carrying out batch processing according to the association relation between the placement addresses of the equipment required by the test corresponding to each sample to be tested in the second sample set to be tested, so as to form at least one batch of samples to be tested.

4. The method of claim 2, wherein the test time comprises a test start time, the preset time requirement comprises an interval between test start times being less than a second preset interval, the preset address requirement comprises a distance between addresses being less than a preset distance,

and carrying out batch processing according to the association relation between the placement addresses of the equipment required by the test corresponding to each sample to be tested in the second sample set to be tested and the association relation between the corresponding test starting time to form at least one batch of samples to be tested.

5. The method according to claim 3 or 4, wherein generating an execution plan for sample dispatch to the placement address of the test requiring device corresponding to each sample to be tested based on the determined at least one batch of samples to be tested comprises:

acquiring current state information of at least one movable sample dispatching device, wherein the current state information comprises a current position;

for each batch of samples to be tested in the determined at least one batch of samples to be tested, determining whether target movable sample dispatching equipment matched with the batch of samples to be tested exists in the at least one movable sample dispatching equipment according to the acquired current state information of the at least one movable sample dispatching equipment, wherein the target movable sample dispatching equipment is used for dispatching each sample to be tested in the batch of samples to be tested to a placement address of a corresponding test required equipment at a time not later than the corresponding test time;

generating a sample dispatching single machine execution plan corresponding to each target movable sample dispatching device matched with each batch of samples to be tested aiming at least one batch of samples to be tested with the matched target movable sample dispatching device;

For at least one batch of samples to be tested for which there is no matching target movable sample-dispatching device,

determining a movable sample dispatching equipment group corresponding to each batch of samples to be tested, wherein the movable sample dispatching equipment group is used for dispatching each sample to be tested in the batch of samples to be tested to a placement address of corresponding equipment required by testing at a time not later than a corresponding test time;

generating a sample dispatching multi-machine execution plan corresponding to each movable sample dispatching equipment group corresponding to each batch of samples to be tested, wherein the sample dispatching multi-machine execution plan comprises a sub-execution plan of each movable sample dispatching equipment in the movable sample dispatching equipment group, and the sub-execution plan is used for indicating that at least one sample to be tested in the batch of samples to be tested is dispatched to a placement address of a corresponding test required equipment at no later than a corresponding test time.

6. The method of claim 5, wherein the sub-execution plan includes path planning information indicating a path through which a placement address of a test requiring device corresponding to at least a portion of the samples to be tested in the batch of samples to be tested is routed, and sample delivery information including a sample identification to be delivered, a sample delivery direction, a sample delivery location, and a sample delivery device identification, the sample delivery direction including receiving or delivering, the sample delivery device identification including an identification of a moveable sample dispatch device to which delivery of the sample to be delivered is to be subtended,

The method further comprises the steps of:

and sending instructions to the corresponding movable sample dispatching equipment according to the generated execution plan so that the corresponding movable sample dispatching equipment dispatches each sample to be tested in each batch of samples to the placement address of the equipment required by the corresponding test at the time not later than the corresponding test time according to the execution plan.

7. An apparatus for generating a dispatch plan for a test sample, comprising:

the system comprises a task acquisition unit, a test module and a test module, wherein the task acquisition unit is configured to acquire test tasks corresponding to all samples to be tested in a sample set to be tested, and the test tasks comprise test names and test time;

the address determining unit is configured to query the placement address of the equipment required by the test according to the test name of the test task;

the batch determining unit is configured to determine at least one batch of samples to be tested from the sample set to be tested according to the test tasks corresponding to the samples to be tested in the sample set to be tested and the placement addresses of equipment required for testing; and

the plan generating unit is configured to generate an execution plan for dispatching samples to the placement addresses of the devices required by the test corresponding to each sample to be tested by taking the determined at least one batch of samples to be tested as a unit, wherein the execution plan is used for indicating the placement addresses of the devices required by the test, which are dispatched to the corresponding samples to be tested in each batch of samples to be tested at a time not later than the corresponding test time.

8. The apparatus of claim 7, wherein the plan generation unit is further configured to:

for each batch of samples to be tested in the determined at least one batch of samples to be tested, determining whether a target movable sample dispatching device matched with the batch of samples to be tested exists in the at least one movable sample dispatching device according to the acquired current state information of the at least one movable sample dispatching device, wherein the target movable sample dispatching device is used for dispatching each batch of samples to be tested in the batch of samples to be tested to a placement address of a corresponding device required for testing before the corresponding test time;

determining a movable sample dispatching equipment group corresponding to each batch of samples to be tested, wherein the movable sample dispatching equipment group is used for dispatching each sample to be tested in the batch of samples to be tested to a placement address of corresponding equipment required by testing before the corresponding testing time;

Generating a sample dispatching multi-machine execution plan corresponding to each movable sample dispatching equipment group corresponding to each batch of samples to be tested, wherein the sample dispatching multi-machine execution plan comprises a sub-execution plan of each movable sample dispatching equipment in the movable sample dispatching equipment group, and the sub-execution plan is used for indicating that at least one sample to be tested in the batch of samples to be tested is dispatched to a placement address of a corresponding test required equipment before no later than a corresponding test time.

9. An apparatus for generating a dispatch plan for a test sample, comprising: at least one processor, a memory coupled with the at least one processor, and a computer program stored on the memory, the at least one processor executing the computer program to implement the method of any one of claims 1 to 6.

10. A computer readable storage medium storing a computer program which, when executed by a processor, implements the method of any one of claims 1 to 6.