CN116467173A - Method and device for determining key test, storage medium and electronic device - Google Patents

Method and device for determining key test, storage medium and electronic device Download PDF

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Publication number
CN116467173A
CN116467173A CN202310254907.XA CN202310254907A CN116467173A CN 116467173 A CN116467173 A CN 116467173A CN 202310254907 A CN202310254907 A CN 202310254907A CN 116467173 A CN116467173 A CN 116467173A
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tested
target
determining
matrix
functional modules
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尹德帅
翟源喆
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Qingdao Haier Technology Co Ltd
Haier Smart Home Co Ltd
Haier Uplus Intelligent Technology Beijing Co Ltd
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Qingdao Haier Technology Co Ltd
Haier Smart Home Co Ltd
Haier Uplus Intelligent Technology Beijing Co Ltd
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Priority to CN202310254907.XA priority Critical patent/CN116467173A/en
Publication of CN116467173A publication Critical patent/CN116467173A/en
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    • GPHYSICS
    • G06COMPUTING; CALCULATING OR COUNTING
    • G06FELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00Error detection; Error correction; Monitoring
    • G06F11/36Preventing errors by testing or debugging software
    • G06F11/3668Software testing
    • G06F11/3672Test management
    • G06F11/3684Test management for test design, e.g. generating new test cases
    • GPHYSICS
    • G06COMPUTING; CALCULATING OR COUNTING
    • G06FELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00Error detection; Error correction; Monitoring
    • G06F11/36Preventing errors by testing or debugging software
    • G06F11/3668Software testing
    • G06F11/3672Test management
    • G06F11/3688Test management for test execution, e.g. scheduling of test suites

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  • Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Quality & Reliability (AREA)
  • Physics & Mathematics (AREA)
  • General Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Management, Administration, Business Operations System, And Electronic Commerce (AREA)

Abstract

The application discloses a method and a device for determining key tests, a storage medium and an electronic device, and relates to the technical field of artificial intelligence, comprising the following steps: acquiring N functional modules to be tested in a target application; determining outgoing link information corresponding to each of the N functional modules to be tested, wherein the outgoing link information is used for indicating a data interaction state between the N functional modules to be tested and the N-1 functional modules to be tested; and determining a target matrix corresponding to each functional module to be tested according to the outgoing chain information, so as to determine a target functional module to be tested, which needs to be subjected to key test, in the N functional modules to be tested according to the traversing condition corresponding to the target matrix. The method solves the problem that in the related technology, the key point in the current test is mainly determined by a fixed object, so that the applied test period is long.

Description

Method and device for determining key test, storage medium and electronic device
Technical Field
The application relates to the technical field of artificial intelligence, in particular to a method and a device for determining key tests, a storage medium and an electronic device.
Background
At present, the test task is planned manually, namely, a product manager explains which function is important, a developer explains which part possibly has problems and needs important test, and then a tester plans a test scheme.
Under the conditions of short test task period and shortage of human resources, planning is performed in the key-marking mode, and the test time which is short is compressed to a certain extent. Aiming at the problems of long test period and the like caused by the fact that the key point in the current test is mainly determined by a fixed object in the related technology, no effective solution is proposed.
Accordingly, there is a need for improvements in the related art to overcome the drawbacks of the related art.
Disclosure of Invention
The embodiment of the application provides a method and a device for determining an important test, a storage medium and an electronic device, which are used for at least solving the problem that the important test in the current test in the related technology is mainly determined by a fixed object, so that the applied test period is long.
According to an embodiment of the present application, there is provided a method for determining an emphasis test, including: acquiring N functional modules to be tested in a target application; determining outgoing link information corresponding to each of the N functional modules to be tested, wherein the outgoing link information is used for indicating a data interaction state between the N functional modules to be tested and the N-1 functional modules to be tested; and determining a target matrix corresponding to each functional module to be tested according to the outgoing chain information, so as to determine a target functional module to be tested, which needs to be subjected to key test, in the N functional modules to be tested according to the traversing condition corresponding to the target matrix.
In an exemplary embodiment, after determining the outgoing link information corresponding to each of the N functional modules to be tested, the method further includes: identifying whether each functional module to be tested performs data interaction with the functional modules except the N functional modules to be tested; and under the condition of determining the data interaction, sending prompt information to the target object, wherein the prompt information is used for indicating whether the target object directly initiates a correction flow of the target matrix corresponding to each functional module to be detected.
In an exemplary embodiment, before determining, according to the traversal condition corresponding to the target matrix, a target function module to be tested that needs to be tested in an important way among the N function modules to be tested, the method further includes: determining a matrix power result corresponding to the target matrix; under the condition that the matrix power result is a preset abnormal value, determining the traversing condition corresponding to the target matrix as abnormal, and initiating a correction flow of the abnormal target matrix; and under the condition that the matrix power result is not a preset abnormal value, determining that the traversing condition corresponding to the target matrix is normal, and determining the probability of performing the key test on each functional module to be tested according to the numerical value in the target matrix.
In one exemplary embodiment, initiating a correction procedure for an abnormal target matrix includes: determining a damping factor corresponding to a target application, acquiring a preset correction matrix, and counting the number of modules associated with the abnormal target matrix; filling the damping factors, the correction matrix and the module quantity into a preset correction formula to obtain a target correction formula; wherein the damping factor is a number between 0 and 1, and the correction matrix is an n-order matrix with all elements of 1; and correcting the abnormal target matrix by using a target correction formula to obtain a corrected target matrix.
In an exemplary embodiment, determining the reminding content according to the preset reminding mode to the second object emphasis test includes: determining whether only the second object exists in a preset range of the message board equipment; under the condition that only the second object exists in the preset range, determining the reminding content for the key test of the second object according to a preset reminding mode; and prompting the reminding content through a text display page of the message board equipment under the condition that the second object is not existed in the preset range.
In an exemplary embodiment, the preset correction formula is determined at least by the following formula:
the method comprises the steps of determining a target matrix, wherein G is the target matrix after correction, a is a damping factor, U is the correction matrix, and M is the abnormal target matrix.
In one exemplary embodiment, determining a damping factor corresponding to a target application includes: obtaining a preset damping comparison list, wherein the damping comparison list has a corresponding relation between a plurality of standard damping factors and application types to be tested and a preferred value of the standard damping factors corresponding to the application types to be tested; identifying a target type corresponding to the target application; and matching the target type with the application type to be detected in the damping comparison list, and determining a damping factor corresponding to the target application according to a matching result.
In an exemplary embodiment, after determining, according to the traversal condition corresponding to the target matrix, a target functional module to be tested that needs to be tested in an important way from the N functional modules to be tested, the method further includes: under the condition that at least two target functional modules to be tested exist in the N functional modules to be tested at the same time, determining the key test probability corresponding to the at least two target functional modules to be tested; and taking the target to-be-tested functional module with the maximum key test probability as a first key test module in a test stage.
According to another embodiment of the present application, there is further provided a device for determining an emphasis test of reminder content, including: the acquisition module is used for acquiring N functional modules to be detected in the target application; the determining module is used for determining outgoing link information corresponding to each of the N functional modules to be tested, wherein the outgoing link information is used for indicating the data interaction state between the N functional modules to be tested and the N-1 functional modules to be tested; and the second determining module is used for determining a target matrix corresponding to each functional module to be tested according to the outgoing chain information so as to determine a target functional module to be tested, which needs to be subjected to key test, in the N functional modules to be tested according to the traversing condition corresponding to the target matrix.
According to a further embodiment of the present application, there is also provided a computer-readable storage medium having a computer program stored therein, wherein the computer program is configured to perform the above-described method of determining an emphasis test at run-time.
According to still another embodiment of the present application, there is further provided an electronic device including a memory, a processor, and a computer program stored on the memory and executable on the processor, wherein the processor executes the above-mentioned method for determining an emphasis test by the computer program.
According to the method and the device, N functional modules to be tested in the target application are obtained; determining outgoing link information corresponding to each of the N functional modules to be tested, wherein the outgoing link information is used for indicating a data interaction state between the N functional modules to be tested and the N-1 functional modules to be tested; and determining a target matrix corresponding to each functional module to be tested according to the outgoing chain information, so as to determine a target functional module to be tested, which needs to be subjected to key test, in the N functional modules to be tested according to the traversing condition corresponding to the target matrix. That is, by determining the outgoing link information of the functional module to be tested and the target matrix corresponding to the outgoing link information, and further determining the target functional module to be tested which needs to be subjected to the key test from the functional modules to be tested according to the traversal condition of the target matrix, the problem that the key in the current test is mainly determined by the fixed object in the related technology, the applied test period is long, and the effect of effectively compressing the test time is achieved.
Drawings
The accompanying drawings, which are incorporated in and constitute a part of this specification, illustrate embodiments consistent with the application and together with the description, serve to explain the principles of the application.
In order to more clearly illustrate the embodiments of the present application or the technical solutions in the prior art, the drawings that are required to be used in the description of the embodiments or the prior art will be briefly described below, and it will be obvious to those skilled in the art that other drawings can be obtained from these drawings without inventive effort.
FIG. 1 is a schematic diagram of a hardware environment for an alternative method of determination of emphasis testing in accordance with embodiments of the application;
FIG. 2 is a flow chart of an alternative method of determining an emphasis test in accordance with embodiments of the application;
FIG. 3 is a schematic diagram of an alternative embodiment of a method of determining an alternative emphasis test in accordance with embodiments of the application;
FIG. 4 is a schematic diagram of a matrix of an alternative embodiment of a method of determining an alternative emphasis test in accordance with embodiments of the application;
FIG. 5 is a schematic diagram of a matrix of an alternative embodiment of a method of determining an alternative emphasis test according to embodiments of the application (II);
fig. 6 is a block diagram of a configuration of an alternative determination device for a focus test of reminder content according to an embodiment of the present application.
Detailed Description
In order to make the present application solution better understood by those skilled in the art, the following description will be made in detail and with reference to the accompanying drawings in the embodiments of the present application, it is apparent that the described embodiments are only some embodiments of the present application, not all embodiments. All other embodiments, which can be made by one of ordinary skill in the art based on the embodiments herein without making any inventive effort, shall fall within the scope of the present application.
It should be noted that the terms "first," "second," and the like in the description and claims of the present application and the above figures are used for distinguishing between similar objects and not necessarily for describing a particular sequential or chronological order. It is to be understood that the data so used may be interchanged where appropriate such that embodiments of the present application described herein may be implemented in sequences other than those illustrated or otherwise described herein. Furthermore, the terms "comprises," "comprising," and "having," and any variations thereof, are intended to cover a non-exclusive inclusion, such that a process, method, system, article, or apparatus that comprises a list of steps or elements is not necessarily limited to those steps or elements expressly listed but may include other steps or elements not expressly listed or inherent to such process, method, article, or apparatus.
According to one aspect of the embodiments of the present application, a method for determining a focus test is provided. The key test determination method is widely applied to full-house intelligent digital control application scenes such as artificial intelligence, intelligent home equipment ecology, intelligent house (intelligent House) ecology and the like. Alternatively, in the present embodiment, the above-described determination method of the emphasis test may be applied to a hardware environment constituted by a plurality of terminal apparatuses 102 and servers 104 as shown in fig. 1. As shown in fig. 1, the server 104 is connected to a plurality of terminal devices 102 through a network, and may be used to provide services (such as application services, etc.) for a terminal or a client installed on the terminal, a database may be set on the server or independent of the server, for providing data storage services for the server 104, and cloud computing and/or edge computing services may be configured on the server or independent of the server, for providing data operation services for the server 104.
The network may include, but is not limited to, at least one of: wired network, wireless network. The wired network may include, but is not limited to, at least one of: a wide area network, a metropolitan area network, a local area network, and the wireless network may include, but is not limited to, at least one of: WIFI (Wireless Fidelity ), bluetooth. The terminal device 102 may not be limited to a PC, a mobile phone, a tablet computer, an intelligent air conditioner, an intelligent smoke machine, an intelligent refrigerator, an intelligent oven, an intelligent cooking range, an intelligent washing machine, an intelligent water heater, an intelligent washing device, an intelligent dish washer, an intelligent projection device, an intelligent television, an intelligent clothes hanger, an intelligent curtain, an intelligent video, an intelligent socket, an intelligent sound box, an intelligent fresh air device, an intelligent kitchen and toilet device, an intelligent bathroom device, an intelligent sweeping robot, an intelligent window cleaning robot, an intelligent mopping robot, an intelligent air purifying device, an intelligent steam box, an intelligent microwave oven, an intelligent kitchen appliance, an intelligent purifier, an intelligent water dispenser, an intelligent door lock, and the like.
In this embodiment, a method for determining an emphasis test is provided, including but not limited to being applied to a terminal device, and fig. 2 is a flowchart of a method for determining an emphasis test according to an embodiment of the present application, where the flowchart includes the following steps:
step S202: acquiring N functional modules to be tested in a target application; wherein N is a positive integer greater than or equal to 1.
Step S204: determining outgoing link information corresponding to each of the N functional modules to be tested, wherein the outgoing link information is used for indicating a data interaction state between the N functional modules to be tested and the N-1 functional modules to be tested;
step S208: and determining a target matrix corresponding to each functional module to be tested according to the outgoing chain information, so as to determine a target functional module to be tested, which needs to be subjected to key test, in the N functional modules to be tested according to the traversing condition corresponding to the target matrix.
Through the steps, N functional modules to be tested in the target application are obtained; determining outgoing link information corresponding to each of the N functional modules to be tested, wherein the outgoing link information is used for indicating a data interaction state between the N functional modules to be tested and the N-1 functional modules to be tested; and determining a target matrix corresponding to each functional module to be tested according to the outgoing chain information, so as to determine a target functional module to be tested, which needs to be subjected to key test, in the N functional modules to be tested according to the traversing condition corresponding to the target matrix. That is, by determining the outgoing link information of the functional module to be tested and the target matrix corresponding to the outgoing link information, and further determining the target functional module to be tested which needs to be subjected to the key test from the functional modules to be tested according to the traversal condition of the target matrix, the problem that the key in the current test is mainly determined by the fixed object in the related technology, the applied test period is long, and the effect of effectively compressing the test time is achieved.
Optionally, after determining the outgoing link information corresponding to each of the N functional modules to be tested, the method further includes: identifying whether each functional module to be tested performs data interaction with the functional modules except the N functional modules to be tested; and under the condition of determining the data interaction, sending prompt information to the target object, wherein the prompt information is used for indicating whether the target object directly initiates a correction flow of the target matrix corresponding to each functional module to be detected.
That is, in actual operation, the data of a certain module is not derived from the module currently required to be tested, that is, there are other modules except the functional module to be tested. Under the condition that the functional module to be tested and other modules except the functional module to be tested generate data interaction, the target object needs to be prompted whether to correct the matrix corresponding to each functional module to be tested.
Optionally, before determining the target to-be-tested functional module needing to be subjected to key test in the N to-be-tested functional modules according to the traversal condition corresponding to the target matrix, the method further includes: determining a matrix power result corresponding to the target matrix; under the condition that the matrix power result is a preset abnormal value, determining the traversing condition corresponding to the target matrix as abnormal, and initiating a correction flow of the abnormal target matrix; and under the condition that the matrix power result is not a preset abnormal value, determining that the traversing condition corresponding to the target matrix is normal, and determining the probability of performing the key test on each functional module to be tested according to the numerical value in the target matrix.
Alternatively, taking the preset outlier as 0 as an example, when the result of the power of the target matrix is 0, the target matrix does not have traversability, and then the target matrix needs to be modified. And in the case that the square result of the target matrix is not equal to 0, the target matrix has convenience. The functional module to be tested, which needs to be subjected to the key test, can be determined according to the values in the target matrix.
Optionally, initiating a correction procedure for the abnormal target matrix includes: determining a damping factor corresponding to a target application, acquiring a preset correction matrix, and counting the number of modules associated with the abnormal target matrix; filling the damping factors, the correction matrix and the module quantity into a preset correction formula to obtain a target correction formula; wherein the damping factor is a number between 0 and 1, and the correction matrix is an n-order matrix with all elements of 1; and correcting the abnormal target matrix by using a target correction formula to obtain a corrected target matrix.
Optionally, the preset correction formula is at least determined by the following formula:
the method comprises the steps of determining a target matrix, wherein G is the target matrix after correction, a is a damping factor, U is the correction matrix, and M is the abnormal target matrix.
In short, when the multiplication of the target matrix is 0, that is, the target matrix does not have ergodic property, the target matrix is corrected. The target matrix is modified by g=am+ (1-a) 1/n U. It should be noted that a is a damping factor, a number between 0 and 1, M is the abnormal target matrix, n is the node number, that is, if the current functional module to be tested is 4, n= 4,U is an n-order matrix with all elements being 1. After the correction by the method, all elements in the abnormal target matrix can be larger than 0, so that convenience is provided.
Optionally, determining the damping factor corresponding to the target application includes: obtaining a preset damping comparison list, wherein the damping comparison list has a corresponding relation between a plurality of standard damping factors and application types to be tested and a preferred value of the standard damping factors corresponding to the application types to be tested; identifying a target type corresponding to the target application; and matching the target type with the application type to be detected in the damping comparison list, and determining a damping factor corresponding to the target application according to a matching result.
It should be noted that, in the practical application process, different applications to be tested may correspond to different damping factors. And further, different damping factors are required to be set for different applications to be tested in a targeted manner. And determining a damping factor corresponding to the target type according to the damping comparison table under the condition that the target type corresponding to the target application is identified by presetting the damping comparison table.
Optionally, after determining the target to-be-tested functional module needing to be subjected to the key test in the N to-be-tested functional modules according to the traversal condition corresponding to the target matrix, the method further includes: under the condition that at least two target functional modules to be tested exist in the N functional modules to be tested at the same time, determining the key test probability corresponding to the at least two target functional modules to be tested; and taking the target to-be-tested functional module with the maximum key test probability as a first key test module in a test stage.
In practical application, the number of the target functional modules to be tested is often multiple, and when the number of the target functional modules to be tested is multiple (more than two), the important test probability corresponding to each functional module to be tested needs to be determined, and the larger the probability is, the greater the importance is.
It will be apparent that the embodiments described above are only some, but not all, of the embodiments of the present application. In order to better understand the above-mentioned determination method of the key test, the following description will explain the above-mentioned process with reference to the embodiments, but is not used to limit the technical solutions of the embodiments of the present application, specifically:
FIG. 3 is a schematic diagram of an alternative embodiment of a method of determining an alternative emphasis test according to an embodiment of the application, as shown in FIG. 3, with the following steps:
PageRank is a function that assigns a real value to each page in the web, with the intention that the higher the PageRank of a web page, the more "important" it is. Assuming 4 web pages, a composition and directed graph as shown in FIG. 3, a web transfer matrix is defined to describe the next access actions of the random surfer. Defining A, B, C, D as four modules, the data providing module to the data receiving module is an outgoing (e.g. C has an outgoing chain, pointing to a, a has three outgoing chains pointing to B, C, D respectively) if the number of web pages is n (n=4 in this example), the matrix M is a square matrix of n rows and n columns, and if there are k outgoing chains on the web page j, the exemplary element mij value of the j-th column of the i-th row of the matrix is 1/k for each outgoing chain to the web page i, and the mij value of the other web pages i is=0, for the embodiment shown in fig. 3, a transition matrix as shown in fig. 4 can be obtained, and fig. 4 is a schematic diagram (one) of an alternative embodiment of a determination method for an alternative emphasis test according to the embodiment of the present application.
As illustrated in fig. 4, M is a markov matrix obtained according to fig. 3. It should be noted that each element in the markov matrix is greater than 0, and each column sum is 1. In addition, one of the maximum eigenvalues of the Markov matrix is 1, and the absolute values of the other eigenvalues are smaller than 1
FIG. 5 is a schematic matrix diagram (II) of an alternative embodiment of a method of determining an alternative emphasis test according to an embodiment of the application, as shown in FIG. 5:
assuming that the initial probability of the random surfer being on n web pages is the same, i.e., 1/n, there will be a change in the M matrix as shown in fig. 5, and it can be seen that the probability distribution vector gradually goes to steady state under the action of the markov matrix.
From the description of the above embodiments, it will be clear to a person skilled in the art that the method according to the above embodiments may be implemented by means of software plus the necessary general hardware platform, but of course also by means of hardware, but in many cases the former is a preferred embodiment. Based on such understanding, the technical solution of the present application may be embodied essentially or in a part contributing to the prior art in the form of a software product stored in a storage medium (such as ROM/RAM, magnetic disk, optical disk), comprising several instructions for causing a terminal device (which may be a mobile phone, a computer, a server, or a network device, etc.) to perform the method of the embodiments of the present application.
The embodiment also provides a device for determining the key test of the reminding content, which is used for implementing the above embodiment and the preferred implementation, and is not described again. As used below, the term "module" may be a combination of software and/or hardware that implements a predetermined function. While the devices described in the following embodiments are preferably implemented in software, implementations in hardware, or a combination of software and hardware, are also possible and contemplated.
Fig. 6 is a block diagram of a determining apparatus for an emphasis test of reminder content according to an embodiment of the present application, the apparatus comprising:
an acquiring module 62, configured to acquire N functional modules to be tested in a target application;
the first determining module 64 is configured to determine outgoing link information corresponding to each of the N functional modules to be tested, where the outgoing link information is used to indicate a data interaction state between the nth functional module to be tested and the N-1 functional modules to be tested;
the second determining module 66 is configured to determine, according to the outgoing link information, a target matrix corresponding to each functional module to be tested, so as to determine, according to a traversal condition corresponding to the target matrix, a target functional module to be tested, which needs to be tested in an important way, among the N functional modules to be tested.
Acquiring N functional modules to be tested in the target application through the device; determining outgoing link information corresponding to each of the N functional modules to be tested, wherein the outgoing link information is used for indicating a data interaction state between the N functional modules to be tested and the N-1 functional modules to be tested; and determining a target matrix corresponding to each functional module to be tested according to the outgoing chain information, so as to determine a target functional module to be tested, which needs to be subjected to key test, in the N functional modules to be tested according to the traversing condition corresponding to the target matrix. That is, by determining the outgoing link information of the functional module to be tested and the target matrix corresponding to the outgoing link information, and further determining the target functional module to be tested which needs to be subjected to the key test from the functional modules to be tested according to the traversal condition of the target matrix, the problem that the key in the current test is mainly determined by the fixed object in the related technology, the applied test period is long, and the effect of effectively compressing the test time is achieved.
Optionally, the determining module 62 is further configured to identify whether each of the functional modules to be tested performs data interaction with a functional module other than the N functional modules to be tested; and under the condition of determining the data interaction, sending prompt information to the target object, wherein the prompt information is used for indicating whether the target object directly initiates a correction flow of the target matrix corresponding to each functional module to be detected.
That is, in actual operation, the data of a certain module is not derived from the module currently required to be tested, that is, there are other modules except the functional module to be tested. Under the condition that the functional module to be tested and other modules except the functional module to be tested generate data interaction, the target object needs to be prompted whether to correct the matrix corresponding to each functional module to be tested.
Optionally, the second determining module 68 is further configured to determine a matrix power result corresponding to the target matrix; under the condition that the matrix power result is a preset abnormal value, determining the traversing condition corresponding to the target matrix as abnormal, and initiating a correction flow of the abnormal target matrix; and under the condition that the matrix power result is not a preset abnormal value, determining that the traversing condition corresponding to the target matrix is normal, and determining the probability of performing the key test on each functional module to be tested according to the numerical value in the target matrix.
Alternatively, taking the preset outlier as 0 as an example, when the result of the power of the target matrix is 0, the target matrix does not have traversability, and then the target matrix needs to be modified. And in the case that the square result of the target matrix is not equal to 0, the target matrix has convenience. The functional module to be tested, which needs to be subjected to the key test, can be determined according to the values in the target matrix.
Optionally, the second determining module 68 is further configured to determine a damping factor corresponding to the target application, obtain a preset correction matrix, and count the number of modules associated with the abnormal target matrix; filling the damping factors, the correction matrix and the module quantity into a preset correction formula to obtain a target correction formula; wherein the damping factor is a number between 0 and 1, and the correction matrix is an n-order matrix with all elements of 1; and correcting the abnormal target matrix by using a target correction formula to obtain a corrected target matrix.
Optionally, the second determination module 68 is also configured for g=am+ (1-a) 1/n U;
the method comprises the steps of determining a target matrix, wherein G is the target matrix after correction, a is a damping factor, U is the correction matrix, and M is the abnormal target matrix.
In short, when the multiplication of the target matrix is 0, that is, the target matrix does not have ergodic property, the target matrix is corrected. The target matrix is modified by g=am+ (1-a) 1/n U. It should be noted that a is a damping factor, a number between 0 and 1, M is the abnormal target matrix, n is the node number, that is, if the current functional module to be tested is 4, n= 4,U is an n-order matrix with all elements being 1. After the correction by the method, all elements in the abnormal target matrix can be larger than 0, so that convenience is provided.
Optionally, the second determining module 68 is further configured to obtain a preset damping comparison list, where the damping comparison list has a correspondence between a plurality of standard damping factors and application types to be tested, and preferred values of the standard damping factors corresponding to the application types to be tested; identifying a target type corresponding to the target application; and matching the target type with the application type to be detected in the damping comparison list, and determining a damping factor corresponding to the target application according to a matching result.
It should be noted that, in the practical application process, different applications to be tested may correspond to different damping factors. And further, different damping factors are required to be set for different applications to be tested in a targeted manner. And determining a damping factor corresponding to the target type according to the damping comparison table under the condition that the target type corresponding to the target application is identified by presetting the damping comparison table.
Optionally, the second determining module 68 determines the key test probability corresponding to at least two target functional modules to be tested when determining that at least two target functional modules to be tested exist in the N functional modules to be tested simultaneously; and taking the target to-be-tested functional module with the maximum key test probability as a first key test module in a test stage.
In practical application, the number of the target functional modules to be tested is often multiple, and when the number of the target functional modules to be tested is multiple (more than two), the important test probability corresponding to each functional module to be tested needs to be determined, and the larger the probability is, the greater the importance is.
Embodiments of the present application also provide a computer readable storage medium having a computer program stored therein, wherein the computer program is arranged to perform the steps of any of the method embodiments described above when run.
Alternatively, in the present embodiment, the above-described storage medium may be configured to store a computer program for performing the steps of:
s1, acquiring N functional modules to be tested in a target application;
s2, determining outgoing link information corresponding to each of the N functional modules to be tested, wherein the outgoing link information is used for indicating the data interaction state between the N functional modules to be tested and the N-1 functional modules to be tested;
and S3, determining a target matrix corresponding to each functional module to be tested according to the outgoing chain information, so as to determine a target functional module to be tested, which needs to be subjected to important test, in the N functional modules to be tested according to the traversing condition corresponding to the target matrix.
In one exemplary embodiment, the computer readable storage medium may include, but is not limited to: a usb disk, a Read-Only Memory (ROM), a random access Memory (Random Access Memory, RAM), a removable hard disk, a magnetic disk, or an optical disk, or other various media capable of storing a computer program.
Specific examples in this embodiment may refer to the examples described in the foregoing embodiments and the exemplary implementation, and this embodiment is not described herein.
Embodiments of the present application also provide an electronic device comprising a memory having a computer program stored therein and a processor arranged to run the computer program to perform the steps of any of the method embodiments described above.
Alternatively, in the present embodiment, the above-described processor may be configured to execute the following steps by a computer program:
s1, acquiring N functional modules to be tested in a target application;
s2, determining outgoing link information corresponding to each of the N functional modules to be tested, wherein the outgoing link information is used for indicating the data interaction state between the N functional modules to be tested and the N-1 functional modules to be tested;
and S3, determining a target matrix corresponding to each functional module to be tested according to the outgoing chain information, so as to determine a target functional module to be tested, which needs to be subjected to important test, in the N functional modules to be tested according to the traversing condition corresponding to the target matrix.
In an exemplary embodiment, the electronic apparatus may further include a transmission device connected to the processor, and an input/output device connected to the processor.
Specific examples in this embodiment may refer to the examples described in the foregoing embodiments and the exemplary implementation, and this embodiment is not described herein.
It will be appreciated by those skilled in the art that the modules or steps of the application described above may be implemented in a general purpose computing device, they may be concentrated on a single computing device, or distributed across a network of computing devices, they may be implemented in program code executable by computing devices, so that they may be stored in a storage device for execution by computing devices, and in some cases, the steps shown or described may be performed in a different order than that shown or described herein, or they may be separately fabricated into individual integrated circuit modules, or multiple modules or steps of them may be fabricated into a single integrated circuit module. Thus, the present application is not limited to any specific combination of hardware and software.
The foregoing is merely a preferred embodiment of the present application and it should be noted that modifications and adaptations to those skilled in the art may be made without departing from the principles of the present application and are intended to be comprehended within the scope of the present application.

Claims (10)

1. A method for determining a focus test, comprising:
acquiring N functional modules to be tested in a target application;
determining outgoing link information corresponding to each of the N functional modules to be tested, wherein the outgoing link information is used for indicating a data interaction state between the N functional modules to be tested and the N-1 functional modules to be tested;
and determining a target matrix corresponding to each functional module to be tested according to the outgoing chain information, so as to determine a target functional module to be tested, which needs to be subjected to key test, in the N functional modules to be tested according to the traversing condition corresponding to the target matrix.
2. The method for determining an emphasis test according to claim 1, wherein after determining outgoing link information corresponding to each of the N functional modules to be tested, the method further comprises:
identifying whether each functional module to be tested performs data interaction with the functional modules except the N functional modules to be tested;
and under the condition of determining the data interaction, sending prompt information to the target object, wherein the prompt information is used for indicating whether the target object directly initiates a correction flow of the target matrix corresponding to each functional module to be detected.
3. The method for determining an emphasis test according to claim 1, wherein before determining a target functional module to be tested, which needs an emphasis test, from the N functional modules to be tested according to a traversal condition corresponding to the target matrix, the method further comprises:
determining a matrix power result corresponding to the target matrix;
under the condition that the matrix power result is a preset abnormal value, determining the traversing condition corresponding to the target matrix as abnormal, and initiating a correction flow of the abnormal target matrix;
and under the condition that the matrix power result is not a preset abnormal value, determining that the traversing condition corresponding to the target matrix is normal, and determining the probability of performing the key test on each functional module to be tested according to the numerical value in the target matrix.
4. The method for determining an emphasis test of claim 3, wherein initiating a correction procedure for the abnormal target matrix comprises:
determining a damping factor corresponding to a target application, acquiring a preset correction matrix, and counting the number of modules associated with the abnormal target matrix;
filling the damping factors, the correction matrix and the module quantity into a preset correction formula to obtain a target correction formula; wherein the damping factor is a number between 0 and 1, and the correction matrix is an n-order matrix with all elements of 1;
and correcting the abnormal target matrix by using a target correction formula to obtain a corrected target matrix.
5. The method of claim 4, wherein the predetermined correction formula is determined by at least the following formula:
the method comprises the steps of determining a target matrix, wherein G is the target matrix after correction, a is a damping factor, U is the correction matrix, and M is the abnormal target matrix.
6. The method for determining an emphasis test of claim 5, wherein determining a damping factor corresponding to the target application comprises:
obtaining a preset damping comparison list, wherein the damping comparison list has a corresponding relation between a plurality of standard damping factors and application types to be tested and a preferred value of the standard damping factors corresponding to the application types to be tested;
identifying a target type corresponding to the target application;
and matching the target type with the application type to be detected in the damping comparison list, and determining a damping factor corresponding to the target application according to a matching result.
7. The method for determining an emphasis test according to any of claims 1-6, wherein after determining a target functional module to be tested that needs an emphasis test from the N functional modules to be tested according to a traversal condition corresponding to the target matrix, the method further includes:
under the condition that at least two target functional modules to be tested exist in the N functional modules to be tested at the same time, determining the key test probability corresponding to the at least two target functional modules to be tested;
and taking the target to-be-tested functional module with the maximum key test probability as a first key test module in a test stage.
8. A device for determining a focus test of a reminder content, comprising:
the acquisition module is used for acquiring N functional modules to be detected in the target application;
the first determining module is used for determining outgoing link information corresponding to each of the N functional modules to be tested, wherein the outgoing link information is used for indicating the data interaction state between the N functional modules to be tested and the N-1 functional modules to be tested;
and the second determining module is used for determining a target matrix corresponding to each functional module to be tested according to the outgoing chain information so as to determine a target functional module to be tested, which needs to be subjected to key test, in the N functional modules to be tested according to the traversing condition corresponding to the target matrix.
9. A computer-readable storage medium, characterized in that the computer-readable storage medium comprises a stored program, wherein the program when run performs the method of any one of claims 1 to 7.
10. An electronic device comprising a memory and a processor, characterized in that the memory has stored therein a computer program, the processor being arranged to execute the method according to any of claims 1 to 7 by means of the computer program.
CN202310254907.XA 2023-03-07 2023-03-07 Method and device for determining key test, storage medium and electronic device Pending CN116467173A (en)

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CN202310254907.XA CN116467173A (en) 2023-03-07 2023-03-07 Method and device for determining key test, storage medium and electronic device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN202310254907.XA CN116467173A (en) 2023-03-07 2023-03-07 Method and device for determining key test, storage medium and electronic device

Publications (1)

Publication Number Publication Date
CN116467173A true CN116467173A (en) 2023-07-21

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