CN116433341A - Tester control method and tester control system - Google Patents

Abstract

A control method and a control system of a tester, wherein the control method of the tester comprises the following steps: judging whether the computer hardware lock is read or not; when the computer hardware lock is judged to be read, judging whether the service time stored in the computer hardware lock is less than the critical time stored in the backboard of the testing machine; when the using time is less than the critical time, starting the testing software of the testing machine, and monitoring the testing time of the testing software of the testing machine; storing test time of test software of the tester in the memory; and periodically recording the test time of the test software of the tester in the computer hardware lock to generate the service time. The test machine control method in the embodiment of the present application can use a computer hardware lock as a starting condition of the control mechanism to improve the security of the control mechanism.

Description

Tester control method and tester control system

Technical Field

The present disclosure relates to a control method and a control system, and more particularly to a control method and a control system for a tester.

Background

Semiconductor test systems are intended to test the electrical functions of integrated circuits (Integrated Circuit, ICs) to ensure that the integrated circuits meet relevant specifications.

Since the semiconductor test system is expensive, it is generated by renting the mode application of the semiconductor test system. However, the existing lease-mode control mechanism still has security doubts, such as cracking the control mechanism, which causes damages to the lease manufacturer of the semiconductor test system, so how to improve the security of the lease-mode control mechanism is an urgent problem for manufacturers in the field.

Disclosure of Invention

One aspect of the present disclosure relates to a method for controlling a tester, comprising the steps of: judging whether the computer hardware lock is read or not; when the computer hardware lock is judged to be read, judging whether the service time stored in the computer hardware lock is less than the critical time stored in the backboard of the testing machine; when the using time is less than the critical time, starting the testing software of the testing machine, and monitoring the testing time of the testing software of the testing machine; storing test time of test software of the tester in the memory; and periodically recording the test time of the test software of the tester in the computer hardware lock to generate the service time.

In one embodiment, the tester control method further comprises: and when the computer hardware lock cannot be read or the service time is not less than the critical time, prohibiting starting test software of the tester and outputting warning information.

In another embodiment, the step of storing test time of test software of the tester in the memory includes: test time of test software of the tester is stored in the memory at intervals of a first period. The step of periodically recording test time of test software of the tester in the computer hardware lock to generate the use time comprises: recording test time of test software of the tester in the computer hardware lock at intervals of a second period to generate service time, wherein the second period is larger than the first period.

In one embodiment, the tester control method further comprises: when the test software of the tester is monitored to be closed, the test time of the test software of the tester is written into the computer hardware lock.

In another embodiment, the tester control method further comprises: judging whether the service time of the computer hardware lock is longer than the test time of the memory; when the use time of the computer hardware lock is judged to be longer than the test time of the memory, the use time of the computer hardware lock is used as the starting time of the test software of the monitoring tester; and when the use time of the computer hardware lock is not longer than the test time of the memory, taking the test time of the memory as the starting time of the test software of the monitoring tester.

Another aspect of the present disclosure relates to a tester management system including a memory and a processor. The memory is used for storing a plurality of instructions. The processor is used for reading the instructions and executing the following steps: judging whether the computer hardware lock is read or not; when the computer hardware lock is judged to be read, judging whether the service time stored in the computer hardware lock is less than the critical time stored in the backboard of the testing machine; when the using time is less than the critical time, starting the testing software of the testing machine, and monitoring the testing time of the testing software of the testing machine; storing test time of test software of the tester in the memory; and periodically recording the test time of the test software of the tester in the computer hardware lock to generate the service time.

In one embodiment, the processor is further configured to read the instructions and perform the following steps: and when the computer hardware lock cannot be read or the service time is not less than the critical time, prohibiting starting test software of the tester and outputting warning information.

In another embodiment, the step of storing test software of the tester for execution by the processor in the memory includes: test time of test software of the tester is stored in the memory at intervals of a first period. The step of periodically recording test time of test software of the tester executed by the processor in the computer hardware lock to generate the use time includes: recording the test time of the test software of the tester in the computer hardware lock every a second period, wherein the second period is larger than the first period.

In one embodiment, the processor is further configured to read the instructions and perform the following steps: when the test software of the tester is monitored to be closed, the test time of the test software of the tester is written into the computer hardware lock.

In another embodiment, the processor is further configured to read the instructions and perform the following steps: judging whether the service time of the computer hardware lock is longer than the test time of the memory; when the use time of the computer hardware lock is judged to be longer than the test time of the memory, the use time of the computer hardware lock is used as the starting time of the test software of the monitoring tester; and when the use time of the computer hardware lock is not longer than the test time of the memory, taking the test time of the memory as the starting time of the test software of the monitoring tester.

Therefore, according to the technical content of the present disclosure, the testing machine control method and the testing machine control system in the embodiments of the present disclosure can use the computer hardware lock as the safe starting condition of the control mechanism to improve the security of the control mechanism. In addition, the tester control method and the tester control system can compare the use time of the computer hardware lock memory with the critical time of the tester backboard memory so as to ensure that the tester is still in a usable stage, and further accurately control the use authority and the use time of the tester.

Drawings

The foregoing and other objects, features, advantages and embodiments of the present invention will become more apparent upon reading the following description of the drawings in which:

FIG. 1 is a flow chart of a control method of a tester according to an embodiment of the invention;

FIG. 2 is a schematic circuit block diagram of a control system of a tester, a computer hardware lock and a tester according to an embodiment of the present disclosure;

FIG. 3 is a flow chart illustrating a method for controlling a tester according to an embodiment of the invention;

FIG. 4 is a schematic diagram of a tester control system, a computer hardware lock, and a tester according to one embodiment of the present disclosure.

Various features and elements are not drawn to scale in accordance with conventional practice in the drawings in order to best illustrate the specific features and elements associated with the disclosure. Furthermore, like elements/components are referred to by the same or similar reference numerals among the different figures.

[ symbolic description ]

100,100A method

105,110,115,120,140,150,160 Steps 105A,110A,115A,120A,125A,130A,133A,135A,140A,150A,160A,165A,170A,175A,180A step 200,200A tester control System

210,210A memory

220,220A processor

300,300A computer hardware lock

400,400A tester

410,410A backboard

420A, memory

430a test carrier plate

Detailed Description

For a more complete and thorough description of the present disclosure, the following illustrative descriptions of embodiments and examples are presented; this is not the only form of implementation or use of the specific embodiments of the present disclosure. The description covers the features of the embodiments and the method steps and sequences for constructing and operating the embodiments. However, other embodiments may be utilized to achieve the same or equivalent functions and sequences of steps.

Unless defined otherwise herein, the meanings of scientific and technical terms used herein are the same as those commonly understood and used by one of ordinary skill in the art to which this invention belongs. Furthermore, as used in this specification, the singular noun encompasses the plural version of the noun without conflict with the context; plural nouns as used also encompasses singular versions of the noun.

In addition, as used herein, "coupled" may mean that two or more elements are in direct physical or electrical contact with each other, or in indirect physical or electrical contact with each other, or that two or more elements may be in operation or action with each other.

Fig. 1 is a flow chart illustrating a method 100 for controlling a tester according to an embodiment of the invention. For easy understanding of the present tester control method 100, please refer to fig. 2, which is a schematic circuit block diagram of a tester control system 200, a computer hardware lock 300 and a tester 400 according to an embodiment of the present invention. In fig. 2, the tester control system 200 includes a memory 210 and a processor 220, wherein the memory 200 is coupled to the processor 220, and the processor 220 reads a plurality of instructions stored in the memory 210 to execute related steps.

Referring to fig. 1 and 2, in step 105, the present test machine control method 100 prepares to start test software. In step 110, it is determined by the processor 220 whether the computer hardware key 300 is to be read. For example, when a user wants to use the tester 400 to test an Integrated Circuit (IC), the user needs to ensure that the user has the computer hardware lock 300 for secure booting.

In one embodiment, the computer hardware lock 300 may be a keypro (or Dongle), but the disclosure is not limited to this embodiment, and the computer hardware lock 300 may be implemented by other suitable components. When keypro is started, a master key (master key) is required to be used for burning a specific identification authentication code (ID), and the master key is only reserved in a manufacturer and needs the ID when being read, so that a user cannot crack the use time and other information stored in the keypro and cannot change the setting of the use time and the information. Accordingly, the present application uses the computer hardware lock 300 to enhance the security of the control of the tester 400. In another embodiment, the computer hardware lock 300 can be connected to the testing machine management system 200 through a universal serial bus (Universal Serial Bus, USB), but the present invention is not limited to this embodiment, and the computer hardware lock 300 can also be connected to the testing machine management system 200 by using other suitable components.

After executing step 110, if the processor 220 determines that the computer hardware key 300 is read, it indicates that the user actually has the computer hardware key 300, and step 120 is executed to determine whether the usage time stored in the computer hardware key 300 is less than the critical time stored in the back plate 410 of the testing machine 400 through the processor 220. For example, in addition to ensuring that the user has the computer hardware lock 300, it is further determined whether the user still has the use right, so the present disclosure also determines whether the current overall use time is less than the critical time. In one embodiment, the computer hardware lock 300 binds the ID of the backplane 410 to ensure that both are indeed the complete set of test-related systems leased by the same user. Conversely, the backplane 410 also binds the ID of the computer hardware lock 300.

After executing step 120, if the usage time is determined to be less than the threshold time, it indicates that the user has the usage right, and then step 140 is executed to start the test software of the testing machine 400 and monitor the test time of the test software of the testing machine 400. In one embodiment, the present tester control method 100 can detect the start and end of the test software by the system software (monitor) to obtain the test time of the test software.

Taking the manufacturer set the maximum critical time as 2160 hours, the maximum critical time is written into the back plate 410 before the test machine 400 leaves the factory, so that the user cannot write the program by himself or herself to modify the maximum critical time stored in the back plate 410, so as to ensure that whether the user has the use right can be judged practically. When the user wants to use the testing machine 400, the present case determines whether the current usage time of the memory of the computer hardware lock 300 is less than the maximum critical time 2160 hours. If the current usage time is determined to be less than the maximum critical time, the current usage time is still within 2160 hours of the maximum critical time, so that the user has the right to use the test software of the tester 400 to perform the related test on the integrated circuit. However, the critical time is not limited to 2160 hours in the above embodiment, which is only used to exemplarily illustrate one implementation of the present invention.

In steps 110 and 120, if the processor 220 determines that the computer hardware lock 300 cannot be read, or if the processor 220 determines that the usage time is not less than the threshold time, step 115 is executed, the processor 220 prohibits the start of the test software, and outputs the warning message. For example, when the processor 220 determines that the computer hardware lock 300 cannot be read, it indicates that the user does not have the computer hardware lock 300 for safe start, and therefore, the start of the test software is prohibited, and a warning message is output to prompt the user. In addition, when the processor 220 determines that the usage time is not less than the critical time, which indicates that the usage time of the testing machine 400 exceeds the maximum critical time provided by the manufacturer, the processor 220 outputs a warning message to prompt the user to settle the account and pay the usage fee.

Referring to step 150, the processor 220 may store the test time of the test software of the tester 400 in the memory 210. In step 160, the processor 220 may periodically record the test time of the test software of the tester 400 in the computer hardware key 300 to generate the usage time.

For example, the memory 210 has a faster access speed, so the present case can store the test time in the memory 210 frequently, for example, store the test time in the memory 210 every first period (e.g., every minute) to more accurately grasp the test time of the user, but not affect the overall operation speed. Because the test time is continuously recorded and compared during the test, even if the user leaves the software in a special mode (such as directly shutting down or stopping the software), the user does not need to worry about missing the record of the use time, so the user cannot crack the mechanism in a special mode. In one embodiment, the memory 210 may be a memory map (shared memory) on the tester management system 200.

In addition, since the access speed of the computer hardware lock 300 is lower than that of the memory 210, the present invention periodically stores the test time in the computer hardware lock 300, for example, stores the test time in the computer hardware lock 300 every second period (e.g., every hour) to store the test time in the computer hardware lock 300 with better security, and lengthens the storage time without affecting the overall operation speed. However, the recording time and the type of the memory 210 can be implemented under other suitable conditions without limiting the recording per minute and the recording per hour in the above embodiments. It should be noted that the present disclosure is not limited to the steps and structures shown in fig. 1 and 2, but is merely illustrative of one implementation of the present disclosure.

Fig. 3 is a flow chart illustrating a testing machine control method 100A according to an embodiment of the invention. In comparison to the testing machine management method 100 shown in fig. 1, the testing machine management method 100A of fig. 3 further includes a step 130A of determining a usage time and a testing time, a step 170A … of determining whether the testing time is recorded in the computer hardware lock, and so on, which will be described in detail later.

For easy understanding of the present tester control method 100A, please refer to fig. 4, which is a schematic circuit block diagram of a tester control system 200A, a computer hardware lock 300A and a tester 400A according to an embodiment of the present invention. In fig. 4, a memory 210A is coupled to a processor 220A, and the processor 220A reads a plurality of instructions stored in the memory 210A to perform relevant steps. In addition, the tester control system 200A may be coupled to the tester 400A through the data line 500A, and the tester 400A may test the integrated circuit through the test carrier 430A.

Referring to fig. 3 and 4, in step 105A, the testing machine control method 100A prepares to start testing software. In step 110A, a determination is made by the processor 220A as to whether the computer hardware lock 300A has been read.

After executing step 110A, if the processor 220A determines that the computer hardware lock 300A is read, it indicates that the user actually has the computer hardware lock 300A, and step 120A is executed to determine whether the usage time stored in the computer hardware lock 300A is less than the critical time stored in the back plate 410A of the testing machine 400A through the processor 220A. In one embodiment, the threshold time of the backplate 410A may be stored in the backplate memory 420A.

Referring to step 120A, if the usage time is less than the threshold time, it indicates that the user has the right to use, step 125A is executed to read the service life and billing mode of the backboard 410A and the computer hardware lock 300A. For example, the backplane 410A and the computer hardware lock 300A may record information about a lifetime, such as a lifetime of 3 months, and a billing mode, such as billing … per hour, for subsequent use of the test machine management method 100A.

In steps 110A and 120A, if the processor 220A determines that the computer hardware lock 300A cannot be read, or if the processor 220A determines that the usage time is not less than the critical time, step 115A is executed, and the processor 220A prohibits the start of the test software and outputs a warning message to prompt the user, or requests the user to settle the account and pay the usage fee.

Next, the testing machine control method 100A executes step 130A to determine whether the service time of the computer hardware lock 300A is longer than the testing time of the memory 210A through the processor 220A.

If it is determined that the usage time of the computer hardware key 300A is greater than the test time of the memory 210A, step 133A is executed to monitor the usage time of the computer hardware key 300A as the start time of the test software of the test machine 400A. On the other hand, if it is determined that the usage time of the computer hardware lock 300A is not greater than the test time of the memory 210A, step 135A is executed to use the test time of the memory 210A as the start time of the test software of the monitor test machine 400A.

For example, when the user wants to use the tester 400A to test the integrated circuit, the tester management and control system 200A can read the test time recorded by the memory 210A and the use time recorded by the computer hardware lock 300A and compare the two, and the larger one is the main one, so that the accumulated time is not missed, and even if the user tries to crack, the user can also use one more protection layer.

Subsequently, step 140A is performed to start the test software of the test machine 400A and monitor the test time of the test software of the test machine 400A. In step 150A, the processor 220A may store the test time of the test software of the tester 400A in the memory 210A. In step 160A, the processor 220A may periodically record the test time of the test software of the tester 400A in the computer hardware key 300A to generate the usage time.

Next, step 165A is executed to shut down the test software and record the shut down time. For example, when the shutdown of the test software of the test machine 400A is monitored, the test software is shutdown and the shutdown time is recorded. Step 170A is performed to determine whether the test time is recorded to the computer hardware key 300A by the processor 220A. If the test time is recorded to the computer hardware lock 300A, step 180A is executed to write the test time of the test software of the tester 400A to the computer hardware lock 300A and store the record file. If the test time cannot be recorded to the computer hardware lock 300A, step 175A is executed to directly store the record file.

For example, after the test is completed, the previously recorded usage time is rewritten back to the computer hardware lock 300A, and the trial period is updated, and the usage time is also recorded in the encrypted text file and stored in another memory (non-memory 210A) of the tester management system 200A for data recording. Furthermore, even if the usage time cannot be written back to the computer hardware lock 300A, the usage time is recorded in the encrypted text file and stored in another memory of the tester management system 200A for data recording. It should be noted that the present disclosure is not limited to the steps and structures shown in fig. 3 and 4, which are only illustrative of one implementation of the present disclosure.

In one embodiment, the instant settlement mechanism of the tester control method 100,100A and the tester control system 200,200A is provided. First, the time detected by the system software (monitor) of the test machine management system 200,200A needs to be deducted from the usage time of the memory of the computer hardware lock 300 to avoid the time from being repeatedly calculated. The settlement is then performed at all times stored in the memory 210,210A and the computer hardware locks 300, 300A. Next, the time in the memory 210,210A and the computer hardware locks 300,300A is reset to 0. When the user continues to use the testing machine 400, the related authentication and time calculation are performed again by the testing machine control method 100, 100A.

As can be seen from the above embodiments, the application of the present invention has the following advantages. The tester control method and the tester control system can use the computer hardware lock as the starting condition of the control mechanism so as to improve the safety of the control mechanism. In addition, the tester control method and the tester control system can compare the use time of the computer hardware lock memory with the critical time of the tester backboard memory so as to ensure that the tester is still in a usable stage, and further accurately control the use authority and the use time of the tester.

Although the embodiments of the present invention have been described in detail in the foregoing description, the same is not to be considered as limiting the invention, but rather as limited to the embodiments shown and described.

Claims (10)

1. A method for controlling a tester, comprising:

judging whether a computer hardware lock is read or not;

when the computer hardware lock is judged to be read, judging whether the service time stored in the computer hardware lock is less than a critical time stored in a backboard of a testing machine or not;

when the service time is less than the critical time, starting a test software of the testing machine, and monitoring a test time of the test software of the testing machine;

storing the test time of the test software of the tester in a memory; and

the test time of the test software of the tester is periodically recorded in the computer hardware lock to generate the service time.

2. The tester control method of claim 1, further comprising:

when the computer hardware lock cannot be read or the service time is not less than the critical time, the test software of the testing machine is forbidden to be started and a warning message is output.

3. The method of claim 1, wherein storing the test time of the test software of the tester in the memory comprises:

storing the test time of the test software of the tester in the memory every other first period;

wherein periodically recording the test time of the test software of the tester in the computer hardware lock to generate the usage time comprises:

recording the test time of the test software of the tester in the computer hardware lock at intervals of a second period to generate the service time, wherein the second period is greater than the first period.

4. The tester control method of claim 1, further comprising:

when the test software of the test machine is monitored to be closed, the test time of the test software of the test machine is written into the computer hardware lock.

5. The tester control method of claim 4, further comprising:

judging whether the service time of the computer hardware lock is longer than the test time of the memory;

when the service time of the computer hardware lock is determined to be longer than the test time of the memory, the service time of the computer hardware lock is used as a starting time for monitoring the test time of the test software of the test machine; and

when the use time of the computer hardware lock is not more than the test time of the memory, the test time of the memory is used as the starting time of the test software of the monitoring testing machine.

6. A tester control system, comprising:

a memory for storing a plurality of instructions; and

a processor for reading the instructions and executing the following steps:

judging whether a computer hardware lock is read or not;

when the computer hardware lock is judged to be read, judging whether the service time stored in the computer hardware lock is less than a critical time stored in a backboard of a testing machine or not;

when the service time is less than the critical time, starting a test software of the testing machine and monitoring a test time of the test software of the testing machine;

storing the test time of the test software of the tester in the memory; and

the test time of the test software of the tester is periodically recorded in the computer hardware lock to generate the service time.

7. The tester control system of claim 6, wherein the processor is further configured to read the instructions and perform the steps of:

when the computer hardware lock cannot be read or the service time is not less than the critical time, the test software of the testing machine is forbidden to be started and a warning message is output.

8. The tester control system of claim 6, wherein the step of the processor executing the test time storing the test software of the tester in the memory comprises:

storing the test time of the test software of the tester in the memory every other first period;

wherein the step of periodically recording the test time of the test software of the tester at the computer hardware key to generate the usage time by the processor comprises:

recording the test time of the test software of the tester in the computer hardware lock every second period, wherein the second period is larger than the first period.

9. The tester control system of claim 6, wherein the processor is further configured to read the instructions and perform the steps of:

when the test software of the test machine is monitored to be closed, the test time of the test software of the test machine is written into the computer hardware lock.

10. The tester control system of claim 9, wherein the processor is further configured to read the instructions and perform the steps of:

judging whether the service time of the computer hardware lock is longer than the test time of the memory;

when the service time of the computer hardware lock is determined to be longer than the test time of the memory, the service time of the computer hardware lock is used as a starting time for monitoring the test time of the test software of the test machine; and

when the use time of the computer hardware lock is not more than the test time of the memory, the test time of the memory is used as the starting time of the test software of the monitoring testing machine.

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