CN116430103B - Inversion method, equipment and medium for current density of superconducting tape - Google Patents
Inversion method, equipment and medium for current density of superconducting tape Download PDFInfo
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Abstract
The invention provides a high-temperature superconducting tape current density inversion method, S1, obtaining measured magnetic field data of a superconducting tape to be detected; s2, dividing a first low-frequency current density distribution and a first high-frequency current density distribution based on measured magnetic field data; s3, acquiring second low-frequency current density distribution and second low-frequency magnetic field distribution based on the first low-frequency current density distribution; obtaining a second high-frequency magnetic field distribution based on the second low-frequency magnetic field distribution and the measured magnetic field data; s4, acquiring first high-frequency magnetic field distribution based on the first high-frequency current density distribution; s5, obtaining second high-frequency current density distribution based on the first high-frequency magnetic field distribution, the second high-frequency magnetic field distribution and the first high-frequency current density distribution; s6, iterating S4-S5 until the iteration termination condition is met, and outputting the current density distribution of the superconductive tape to be heated. The method improves inversion accuracy.
Description
Technical Field
The invention relates to the technical field of high-temperature superconducting tapes, and particularly provides a method, equipment and a medium for inverting the current density of a high-temperature superconducting tape.
Background
The high-temperature superconductive strip has excellent electromagnetic property and thermal stability, and particularly, the REBCO coating high-temperature superconductive strip still maintains higher critical current density in a magnetic field of more than 20T, thereby playing an important role in the research fields of high-energy physics, strong magnetic field science and the like. The REBCO high-temperature superconducting film has obvious magnetic field anisotropy, current density shows the characteristic of two-dimensional plane non-uniform distribution, and the current density distribution of the superconducting film plays a decisive role in the performance of a high-temperature superconducting tape.
The current density distribution characteristics cannot be directly tested by the existing experimental means, the magnetic field distribution result on the surface of the superconducting film can be obtained only by a magnetic measurement method, and the distribution characteristics of the current density in the planar space of the two-dimensional film can be indirectly estimated based on the measurement result of the spatial high-resolution magnetic field. By inverting the law of Biot-Savart, a two-dimensional image of the local current density distribution of the superconducting tape can be reconstructed based on the normal component of the measured magnetic field. The magnetic field above the sample can be obtained by various magnetic microscopic testing techniques, such as scanning hall probes, magneto-optical imaging, superconducting quantum interferometers, and the like.
The inversion method of the current density distribution based on the magnetic field data mainly comprises three methods: one is based on QR decomposition to directly solve Biot-Savart law discrete matrix method, the method has high calculation cost, is difficult to realize synchronous and efficient inversion of real-time data, is applicable to ideal conditions without magnetic field noise, and has large inversion result error for noisy actual test conditions; in practical application, a fast Fourier transform-based low-pass filtering technology is adopted to realize fast reconstruction of current density distribution based on a magnetic field, but a high-frequency component, namely inversion at the edge of a superconducting film, has larger error, and the stability of an inversion result is seriously dependent on the selection of low-pass filtering cut-off frequency, so that the method has no general applicability to wide problems; aiming at the stability problem of inversion, an electromagnetic inversion method based on regularization is developed in recent years, and an automatic selection of regularization parameters is realized by adopting a generalized cross validation method, but the inversion of high-frequency components is insufficient, the fluctuation of low-frequency components is obviously enhanced along with the increase of noise, and serious distortion of inversion results is caused.
Although some electromagnetic inversion methods have been developed at present, in practical application, problems still exist in terms of efficient and high-precision inversion of current density, such as dependence of inversion process parameters on experience, insufficient inversion of high-frequency components, volatility of inversion results of low-frequency components, and the like, facing unavoidable noise magnetic field data sources.
Accordingly, there is a need in the art for a new high temperature superconducting tape current density inversion scheme to address the above-described problems.
Disclosure of Invention
The present invention has been made to overcome the above drawbacks, and provides a solution or at least partial solution to the problem that the inversion of the high frequency components is insufficient, and the fluctuation of the low frequency components is significantly enhanced with the increase of noise, causing serious distortion of the inversion result.
In a first aspect, the present invention provides a method for inverting the current density of a high temperature superconducting tape, comprising: s1, acquiring measured magnetic field data of a superconductive tape to be detected at high temperature；
S2, based on the measured magnetic field dataDividing the first low-frequency current density distribution +.>First high-frequency current density distribution->；
S3, based on the first low-frequency current density distributionObtaining a second low-frequency current density distribution +.>And its corresponding second low-frequency magnetic field distribution +.>；
Based on the second low frequency magnetic field distributionSaid measured magnetic field data->Obtaining a second high-frequency magnetic field distribution；
S4, based on the first high-frequency current density distributionAcquiring corresponding first high-frequency magnetic field distribution +.>；
S5, based on the first high-frequency magnetic field distributionThe second high frequencyMagnetic field distribution->Obtaining the corrected high-frequency current density distribution area +.>；
Based on the corrected high-frequency current density distribution regionThe first high-frequency current density distributionObtaining a second high-frequency current density distribution +.>；
S6, iterating S4-S5 until the iteration termination condition is met, and outputting the current based on the second high-frequency current density distributionSaid second low frequency current density profile +.>And obtaining the current density distribution of the superconductive tape to be detected at high temperature.
In one technical scheme of the high-temperature superconducting tape current density inversion method, the method is based on the measured magnetic field dataDividing the first low-frequency current density distribution +.>First high-frequency current density distribution->Comprising the following steps:
in one technical scheme of the high-temperature superconducting tape current density inversion method, the method is based on the measured magnetic field dataAcquiring a first low-frequency current density distribution +.>First high-frequency current density distribution->Comprising the following steps:
based on the measured magnetic field dataInversion is carried out to obtain current density distribution;
setting a threshold value based on the measured magnetic field dataThe threshold value, the current density profile obtain a first low frequency current density profile +.>First high-frequency current density distribution->。
In one technical scheme of the high-temperature superconducting tape current density inversion method, the method is based on the measured magnetic field dataThe threshold value, the current density profile obtain a first low frequency current density profile +.>First high-frequency current density distribution->Comprising the following steps:
calculating the measured magnetic field dataLaplacian>；
Based on the measured magnetic field dataLaplacian>The threshold value divides the first low-frequency current density distribution +.>First high-frequency current density distribution->。
In one technical scheme of the high-temperature superconducting tape current density inversion method, the method is based on the measured magnetic field dataLaplacian>The threshold value divides the first low-frequency current density distribution +.>First high-frequency current density distribution->Comprising the following steps:
judging the measured magnetic field dataLaplacian>A magnitude to the threshold;
if the measured magnetic field dataLaplacian>Above the threshold value, the current density distribution is a first high frequency current density distribution +.>；
If the measured magnetic field dataLaplacian>Less than the threshold value, the current density distribution is a first low frequency current density distribution +.>。
In one technical scheme of the high-temperature superconducting tape current density inversion method, the first low-frequency current density distribution is based onObtaining a second low-frequency current density distribution +.>And its corresponding second low-frequency magnetic field distribution +.>Comprising the following steps:
for the first low frequency current density distributionNoise reduction treatment is carried out to obtain a second low-frequency current density distribution；
For the second low frequency current density distributionPerforming forward operation to obtain low-frequency magnetic field distribution +.>。
In one technical scheme of the high-temperature superconducting tape current density inversion method, the high-frequency current density distribution is based on the first high-frequency current density distributionAcquiring corresponding first high-frequency magnetic field distribution +.>Comprising the following steps:
for the first high frequency current density distributionForward modeling is performed to obtain a first high-frequency magnetic field distribution +.>。
In one technical scheme of the high-temperature superconducting tape current density inversion method, the method is based on first high-frequency magnetic field distributionSaid second high-frequency magnetic field distribution +.>Obtaining the corrected high-frequency current density distribution area +.>Comprising the following steps:
based on the first high-frequency magnetic field distributionSaid second high-frequency magnetic field distribution +.>Calculating the high frequency magnetic field error->；
Based on the high frequency magnetic field errorInversion is carried out to obtain a corrected high-frequency area current field +.>。
In one technical scheme of the high-temperature superconducting tape current density inversion method, iterating S4-S5 until an iteration termination condition is met, and outputting the current based on the second high-frequency current density distributionThe second low frequency current density distributionThe obtained current density distribution of the high-temperature superconductive strip to be measured comprises the following steps:
based on the high frequency magnetic field errorJudging whether the preset precision is met;
if so, outputting a current density distribution based on the second high frequencySaid second low frequency current density profile +.>The current density distribution of the high-temperature superconductive strip to be measured is obtained.
In a second aspect, the present invention provides an electronic device, including a processor and a storage device, the storage device being adapted to store a plurality of program codes, the program codes being adapted to be loaded and executed by the processor to perform the high-temperature superconducting tape current density inversion method according to any one of the technical solutions of the high-temperature superconducting tape current density inversion method described above.
In a third aspect, a computer readable storage medium is provided, in which a plurality of program codes are stored, the program codes are adapted to be loaded and run by a processor to perform the high-temperature superconducting tape current density inversion method according to any one of the technical solutions of the high-temperature superconducting tape current density inversion method described above.
The technical scheme provided by the invention has at least one or more of the following beneficial effects:
in the technical scheme of implementing the invention, the invention provides a high-temperature superconductive tape current density inversion method, which comprises the following steps: s1, acquiring measured magnetic field data of a superconductive tape to be detected at high temperatureThe method comprises the steps of carrying out a first treatment on the surface of the S2, based on the measured magnetic field data +.>Dividing the first low-frequency current density distribution +.>First high-frequency current density distribution->The method comprises the steps of carrying out a first treatment on the surface of the S3, based on the first low-frequency current density distribution +.>Obtaining a second low-frequency current density distribution +.>And its corresponding second low-frequency magnetic field distribution +.>The method comprises the steps of carrying out a first treatment on the surface of the Based on the second low-frequency magnetic field distribution +.>Said measured magnetic field data->Obtaining a second high-frequency magnetic field distribution +.>The method comprises the steps of carrying out a first treatment on the surface of the S4, based on the first high-frequency currentDensity distribution->Acquiring corresponding first high-frequency magnetic field distribution +.>The method comprises the steps of carrying out a first treatment on the surface of the S5, based on the first high-frequency magnetic field distribution +.>Said second high-frequency magnetic field distribution +.>Obtaining the corrected high-frequency current density distribution area +.>The method comprises the steps of carrying out a first treatment on the surface of the Based on the corrected high-frequency current density distribution area +.>Said first high frequency current density distribution +.>Obtaining a second high-frequency current density distribution +.>The method comprises the steps of carrying out a first treatment on the surface of the S6, iterating S4-S5 until the iteration termination condition is met, and outputting +_L based on the second high-frequency current density distribution>Said first low frequency current density profile +.>The current density distribution of the high-temperature superconductive strip to be measured is obtained. Compared with the prior art, the high-temperature superconductive tape current density inversion method provided by the invention has the beneficial effects that: according to the scheme, through iteration high-frequency current density distribution, the situation of insufficient boundary inversion is improved, and rapid high-precision reconstruction of superconducting current density is realized. The method greatly improves inversion accuracy, and is helpful for further analyzing electromagnetism of superconducting thin filmField microstructure characteristics and electro-magneto-thermo-force multi-field coupling mechanisms.
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The present disclosure will become more readily understood with reference to the accompanying drawings. As will be readily appreciated by those skilled in the art: the drawings are for illustrative purposes only and are not intended to limit the scope of the present invention. Moreover, like numerals in the figures are used to designate like parts, wherein:
FIG. 1 is a flow chart showing the main steps of a method for inverting the current density of a high-temperature superconducting tape according to one embodiment of the present invention;
FIG. 2 is a graph comparing the results of different inversion methods according to one embodiment of the invention;
FIG. 3 is a diagram of different noise level inversion accumulated standard deviation according to one embodiment of the invention.
Detailed Description
Some embodiments of the invention are described below with reference to the accompanying drawings. It should be understood by those skilled in the art that these embodiments are merely for explaining the technical principles of the present invention, and are not intended to limit the scope of the present invention.
In the description of the present invention, a "module," "processor" may include hardware, software, or a combination of both. A module may comprise hardware circuitry, various suitable sensors, communication ports, memory, or software components, such as program code, or a combination of software and hardware. The processor may be a central processor, a microprocessor, an image processor, a digital signal processor, or any other suitable processor. The processor has data and/or signal processing functions. The processor may be implemented in software, hardware, or a combination of both. Non-transitory computer readable storage media include any suitable medium that can store program code, such as magnetic disks, hard disks, optical disks, flash memory, read-only memory, random access memory, and the like. The term "a and/or B" means all possible combinations of a and B, such as a alone, B alone or a and B. The term "at least one A or B" or "at least one of A and B" has a meaning similar to "A and/or B" and may include A alone, B alone or A and B. The singular forms "a", "an" and "the" include plural referents.
Example 1
Referring to fig. 1, fig. 1 is a schematic flow chart of main steps of a method for inverting the current density of a high-temperature superconducting tape according to an embodiment of the present invention. As shown in FIG. 1, the inversion method of the current density of the high-temperature superconductive tape in the embodiment of the invention mainly comprises the following steps S1 to S6.
A high-temperature superconductive tape current density inversion method comprises the following steps:
s1, acquiring measured magnetic field data of a superconductive tape to be detected at high temperature；
S2, based on the measured magnetic field dataDividing the first low-frequency current density distribution +.>First high-frequency current density distribution->；
S3, based on the first low-frequency current density distributionObtaining a second low-frequency current density distribution +.>And its corresponding second low-frequency magnetic field distribution +.>The method comprises the steps of carrying out a first treatment on the surface of the Based on the second low-frequency magnetic field distribution +.>Said measured magnetic field data->Obtaining a second high-frequency magnetic field distribution +.>；
Specifically, for a first low frequency current density distributionProcessing to obtain a second low-frequency current density distributionFor the second low-frequency current density distribution +.>Performing forward operation to obtain corresponding second low-frequency magnetic field distribution +.>Then->。
S4, based on the first high-frequency current density distributionAcquiring corresponding first high-frequency magnetic field distribution +.>；
Specifically, for the first high-frequency current density distributionForward modeling is carried out to obtain corresponding first high-frequency magnetic field distribution。
S5, based on the first high-frequency magnetic field distributionSaid second high-frequency magnetic field distribution +.>Obtaining the corrected high-frequency current density distribution area +.>The method comprises the steps of carrying out a first treatment on the surface of the Based on the corrected high-frequency current density distribution area +.>Said first high frequency current density distribution +.>Obtaining a second high-frequency current density distribution +.>；
In particular, the method comprises the steps of,。
s6, iterating S4-S5 until the iteration termination condition is met, and outputting the current based on the second high-frequency current density distributionSaid second low frequency current density profile +.>The current density distribution of the high-temperature superconductive strip to be measured is obtained.
The current density distribution of the superconducting film plays a decisive role in the performance of the high-temperature superconducting tape, and is limited by the influence of inversion precision, so that the high-precision quantitative analysis of the current density distribution of the superconducting film becomes a bottleneck problem for limiting the performance characterization of the superconducting film in microscopic mechanism disclosure. According to the scheme, through iteration high-frequency current density distribution, the situation of insufficient boundary inversion is improved, and rapid high-precision reconstruction of superconducting current density is realized. The method greatly improves inversion precision, and is helpful for further analyzing electromagnetic field microstructure characteristics of the superconducting thin film and an electric-magnetic-thermal-force multi-field coupling mechanism.
In one embodiment, based on the followingMeasuring magnetic field dataAcquiring a first low-frequency current density distribution +.>First high-frequency current density distribution->Comprising the following steps: based on the measured magnetic field data +.>Inversion is carried out to obtain current density distribution; setting a threshold value based on the measured magnetic field data +.>The threshold value, the current density distribution obtain a first low frequency current density distributionFirst high-frequency current density distribution->。
In one embodiment, based on the measured magnetic field dataThe threshold value, the current density profile obtain a first low frequency current density profile +.>First high-frequency current density distribution->Comprising the following steps: calculating the measured magnetic field data +.>Laplacian>The method comprises the steps of carrying out a first treatment on the surface of the Based on the measured magnetic fieldData->Laplacian>The threshold value divides the first low-frequency current density distribution +.>First high-frequency current density distribution->。
In the present embodiment, the intensity of the spatial variation of the magnetic field intensity can be reflected qualitatively in the intensity of the spatial variation of the current density, so that the magnetic field data can be measured by comparisonThe level of the current density distribution is judged by the Laplacian and the magnitude of the threshold value.
Wherein, the liquid crystal display device comprises a liquid crystal display device,is indicated in the high-frequency current density region, +.>Indicated in the low frequency current density region;
first low frequency current density distributionCan be expressed as:
first high frequency current density distributionCan be expressed as:
total current density:。
in one embodiment, the first low frequency current density profile is based onObtaining a second low-frequency current density distribution +.>And its corresponding second low-frequency magnetic field distribution +.>Comprising the following steps: for said first low frequency current density distribution +.>Noise reduction treatment is performed to obtain a second low-frequency current density distribution +.>The method comprises the steps of carrying out a first treatment on the surface of the For said second low frequency current density profile +.>Performing forward operation to obtain low-frequency magnetic field distribution +.>。
Specifically, the magnetic field is rewritten into the form of a flow function g kernel function K according to the Biot-Savart law:
wherein the method comprises the steps of,/>For current element coordinates>,/>,/>Is->Coordinates of->D represents the thickness of the high temperature superconductive tape film, < >>The high-temperature superconductive tape film vacuum magnetic permeability is shown.
Minimization ofObtaining the regular solution of the flow function>：
；
Wherein, the liquid crystal display device comprises a liquid crystal display device,is->Fourier transform form,/->Is->Fourier transform form of>Is->Frequency component of direction, < >>Is->Frequency component of direction, < >>Is->A norm;
determining regularization parameters by a Generalized Cross Validation (GCV) function：
，
Wherein, the liquid crystal display device comprises a liquid crystal display device,；
according to the formulaCalculating a first low-frequency current density distribution +.>WhereinJRepresenting the current density distribution.
The stability parameters are achieved using the above regularized inversion methodIs provided.
In the present embodiment, for the first low frequency current density distributionNoise reduction using median filtering to obtain a second low frequency current density profile>The median filter is adopted to reduce noise in a low-frequency region, so that the problem of fluctuation of inversion results of the region under high noise can be solved.
In one embodiment, the first high frequency current density profile is based onAcquiring corresponding first high-frequency magnetic field distribution +.>Comprising the following steps: for said first high frequency current density distribution +.>Forward modeling is performed to obtain a first high-frequency magnetic field distribution +.>。
Specifically, the same applies to the formulaCalculating a first high-frequency current density distribution +.>WhereinJRepresenting the current density distribution.
In one embodiment, the first high frequency magnetic field distribution is based onSaid second high-frequency magnetic field distribution +.>Obtaining the corrected high-frequency current density distribution area +.>Comprising the following steps: based on the first high-frequency magnetic field distribution +.>Said second high-frequency magnetic field distribution +.>Calculating the high frequency magnetic field error->The method comprises the steps of carrying out a first treatment on the surface of the Obtaining a corrected high-frequency area current field based on the inversion of the high-frequency magnetic field error delta B>。
In this embodiment, the second high-frequency magnetic field distribution：
，
Thus, magnetic field error：
；
In one embodiment, the steps S4-S5 are iterated until an iteration termination condition is met, the output being based on the second high frequency current density distributionSaid second low frequency current density profile +.>The obtained current density distribution of the high-temperature superconductive strip to be measured comprises the following steps: based on the high-frequency magnetic field error +.>Judging whether the preset precision is met;if so, outputting +.>Said second low frequency current density profile +.>The current density distribution of the high-temperature superconductive strip to be measured is obtained.
In this embodiment, under the condition that the iteration requirement is satisfied, the current density distribution of the output high-temperature superconducting tape to be tested:
the situation of insufficient boundary inversion is improved through an iteration technology, rapid high-precision reconstruction of superconducting current density is realized, an inversion result when the standard deviation of noise is 0.005 is shown in fig. 2, and in order to compare the precision of the method provided by the invention and the superiority of the method compared with other methods, the inversion result of the regularization method with the highest inversion precision at present is compared. The inversion result based on the regularization method is insufficient in inversion in a high-frequency area (edge area) and obvious fluctuation in a low-frequency area (non-edge area), and the problems are effectively solved, and the inversion result is well matched with the input result of the positive problem. The effectiveness of this method has been verified by several numerical cases over a wide range of noise levels (i.e., standard deviation of 0.0001-0.01 of noise), as shown in fig. 3, the cumulative mean square deviation of the inversion current of this embodiment is significantly lower than the regularization method over the entire noise range, and increases with noise error level.
Example 2
The invention also provides electronic equipment. In one embodiment of the electronic device according to the present invention, the electronic device includes a processor and a storage device, the storage device may be configured to store a program for performing the high-temperature superconducting tape current density inversion method of the above-described method embodiment, and the processor may be configured to perform the program in the storage device, where the program includes, but is not limited to, a program for performing the high-temperature superconducting tape current density inversion method of the above-described method embodiment, which is not disclosed in detail, please refer to the method section of the embodiment of the present invention. The electronic device may be an electronic device formed including various electronic devices.
Example 3
The invention also provides a computer readable storage medium. In one embodiment of the computer readable storage medium according to the present invention, the computer readable storage medium may be configured to store a program for performing the high temperature superconducting tape current density inversion method of the above method embodiment, which may be loaded and executed by a processor to implement the high temperature superconducting tape current density inversion method. For convenience of explanation, only those portions of the embodiments of the present invention that are relevant to the embodiments of the present invention are shown, and specific technical details are not disclosed, please refer to the method portions of the embodiments of the present invention. The computer readable storage medium may be a storage device including various electronic devices, and optionally, the computer readable storage medium in the embodiments of the present invention is a non-transitory computer readable storage medium.
Further, it should be understood that, since the respective modules are merely set to illustrate the functional units of the apparatus of the present invention, the physical devices corresponding to the modules may be the processor itself, or a part of software in the processor, a part of hardware, or a part of a combination of software and hardware. Accordingly, the number of individual modules in the figures is merely illustrative.
Those skilled in the art will appreciate that the various modules in the apparatus may be adaptively split or combined. Such splitting or combining of specific modules does not cause the technical solution to deviate from the principle of the present invention, and therefore, the technical solution after splitting or combining falls within the protection scope of the present invention.
Thus far, the technical solution of the present invention has been described in connection with the preferred embodiments shown in the drawings, but it is easily understood by those skilled in the art that the scope of protection of the present invention is not limited to these specific embodiments. Equivalent modifications and substitutions for related technical features may be made by those skilled in the art without departing from the principles of the present invention, and such modifications and substitutions will fall within the scope of the present invention.
Claims (5)
1. The inversion method of the current density of the high-temperature superconductive tape is characterized by comprising the following steps of:
s1, acquiring measured magnetic field data of a superconductive tape to be detected at high temperature；
S2, based on the measured magnetic field dataDividing the first low-frequency current density distribution +.>First high-frequency current density distribution->The method specifically comprises the following steps:
based on the measured magnetic field dataInversion is carried out to obtain current density distribution;
setting a threshold value;
calculating the measured magnetic field dataLaplacian>；
Judging the measured magnetic field dataLaplacian>A magnitude to the threshold;
if the measured magnetic field dataLaplacian>Above the threshold value, the current density distribution is a first high frequency current density distribution +.>；
If the measured magnetic field dataLaplacian>Less than the threshold value, the current density distribution is a first low frequency current density distribution +.>；
S3, based on the first low-frequency current density distributionObtaining a second low-frequency current density distribution +.>And its corresponding second low-frequency magnetic field distribution +.>；
Based on the second low frequency magnetic field distributionSaid measured magnetic field data->Obtaining a second high-frequency magnetic field distribution +.>；
S4, based on the first high-frequency current density distributionAcquiring corresponding first high-frequency magnetic field distribution +.>；
S5, based on the first high-frequency magnetic field distributionSaid second high-frequency magnetic field distribution +.>Obtaining the corrected high-frequency current density distribution area +.>；
Based on the corrected high-frequency current density distribution regionSaid first high frequency current density distribution +.>Obtaining a second high-frequency current density distribution +.>；
Wherein based on the first high-frequency magnetic field distributionSaid second high-frequency magnetic field distribution +.>Obtaining the corrected high-frequency current density distribution area +.>Comprising the following steps: based on the first high-frequency magnetic field distribution +.>Said second high-frequency magnetic field distribution +.>Calculating the high frequency magnetic field error->The method comprises the steps of carrying out a first treatment on the surface of the Based on the high-frequency magnetic field error +.>Inversion is carried out to obtain a corrected high-frequency area current field +.>；
S6, iterating S4-S5 until the iteration termination condition is met, and outputting the current based on the second high-frequency current density distributionSaid second low frequency current density profile +.>Obtaining the current density distribution of the superconductive tape to be detected at high temperature: based on the high-frequency magnetic field error +.>Judging whether the preset precision is met;
if so, outputting a current density distribution based on the second high frequencyThe second low frequency current densityDistribution ofAnd obtaining the current density distribution of the superconductive tape to be detected at high temperature.
2. The method of claim 1, wherein the first low frequency current density profile is based onObtaining a second low-frequency current density distribution +.>And its corresponding second low-frequency magnetic field distribution +.>Comprising the following steps:
for the first low frequency current density distributionNoise reduction treatment is performed to obtain a second low-frequency current density distribution +.>；
For the second low frequency current density distributionPerforming forward operation to obtain low-frequency magnetic field distribution +.>。
3. The method according to claim 1, characterized by based on the first high frequency current density distributionAcquiring corresponding first high-frequency magnetic field distribution +.>Comprising the following steps:
for the first high frequency current density distributionForward modeling is performed to obtain a first high-frequency magnetic field distribution +.>。
4. An electronic device comprising a processor and a memory device adapted to store a plurality of program codes, wherein the program codes are adapted to be loaded and executed by the processor to perform the high temperature superconducting tape current density inversion method of any one of claims 1 to 3.
5. A computer readable storage medium having stored therein a plurality of program codes, wherein the program codes are adapted to be loaded and executed by a processor to perform the high temperature superconducting tape current density inversion method of any one of claims 1 to 3.
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