CN116429249A - Light flux adjusting structure based on PDE - Google Patents
Light flux adjusting structure based on PDE Download PDFInfo
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- CN116429249A CN116429249A CN202310238308.9A CN202310238308A CN116429249A CN 116429249 A CN116429249 A CN 116429249A CN 202310238308 A CN202310238308 A CN 202310238308A CN 116429249 A CN116429249 A CN 116429249A
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- 230000001105 regulatory effect Effects 0.000 claims description 12
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- 238000001514 detection method Methods 0.000 description 4
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 3
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J1/00—Photometry, e.g. photographic exposure meter
- G01J1/02—Details
- G01J1/08—Arrangements of light sources specially adapted for photometry standard sources, also using luminescent or radioactive material
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J1/00—Photometry, e.g. photographic exposure meter
- G01J1/02—Details
- G01J1/04—Optical or mechanical part supplementary adjustable parts
- G01J1/0407—Optical elements not provided otherwise, e.g. manifolds, windows, holograms, gratings
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J1/00—Photometry, e.g. photographic exposure meter
- G01J1/02—Details
- G01J1/04—Optical or mechanical part supplementary adjustable parts
- G01J1/0407—Optical elements not provided otherwise, e.g. manifolds, windows, holograms, gratings
- G01J1/0422—Optical elements not provided otherwise, e.g. manifolds, windows, holograms, gratings using light concentrators, collectors or condensers
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J1/00—Photometry, e.g. photographic exposure meter
- G01J1/10—Photometry, e.g. photographic exposure meter by comparison with reference light or electric value provisionally void
- G01J1/16—Photometry, e.g. photographic exposure meter by comparison with reference light or electric value provisionally void using electric radiation detectors
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J1/00—Photometry, e.g. photographic exposure meter
- G01J1/42—Photometry, e.g. photographic exposure meter using electric radiation detectors
- G01J1/44—Electric circuits
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- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B26/00—Optical devices or arrangements for the control of light using movable or deformable optical elements
- G02B26/02—Optical devices or arrangements for the control of light using movable or deformable optical elements for controlling the intensity of light
- G02B26/023—Optical devices or arrangements for the control of light using movable or deformable optical elements for controlling the intensity of light comprising movable attenuating elements, e.g. neutral density filters
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- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B27/00—Optical systems or apparatus not provided for by any of the groups G02B1/00 - G02B26/00, G02B30/00
- G02B27/30—Collimators
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J1/00—Photometry, e.g. photographic exposure meter
- G01J1/02—Details
- G01J1/04—Optical or mechanical part supplementary adjustable parts
- G01J2001/0481—Preset integrating sphere or cavity
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J1/00—Photometry, e.g. photographic exposure meter
- G01J1/02—Details
- G01J1/08—Arrangements of light sources specially adapted for photometry standard sources, also using luminescent or radioactive material
- G01J2001/083—Testing response of detector
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J1/00—Photometry, e.g. photographic exposure meter
- G01J1/42—Photometry, e.g. photographic exposure meter using electric radiation detectors
- G01J1/44—Electric circuits
- G01J2001/4446—Type of detector
- G01J2001/4453—PMT
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- General Physics & Mathematics (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Optics & Photonics (AREA)
- Photometry And Measurement Of Optical Pulse Characteristics (AREA)
Abstract
The invention provides a luminous flux adjusting structure based on PDE, which comprises a light source, a light adjusting group part, an integrating sphere and an optical sleeve, wherein the light source is arranged on the light adjusting group part; the light ray adjusting group part comprises a collimating lens and a condensing lens; the light emitted by the light source is converted into parallel light through the light adjusting group part, the parallel light is converged and then enters the input end of the integrating sphere, the output end of the integrating sphere is connected with one end of the optical sleeve, the light is emitted from the output end of the integrating sphere and enters the optical sleeve, the SiPM to be detected is arranged at the other end of the optical sleeve, and the light irradiates the SiPM to be detected through the optical sleeve. The invention can realize the PDE test of the photoelectric detector, in particular to the photoelectric detector such as SiPM, and can achieve the effect of adjusting the luminous flux input to the SiPM by adjusting the length of the optical sleeve under the condition of certain light intensity, so that the photoelectric detector meets the test requirement of the PDE. Separating the integrating sphere test section from the light source input section is beneficial to ensuring that the test section is not disturbed.
Description
Technical Field
The invention relates to the field of PDE (PDE) tests, in particular to a luminous flux regulating structure based on PDE.
Background
SiPM (Silicon Photomultipliers, silicon photomultiplier, siPM for short) is one of the indispensable photodetectors of the present time-of-flight sensor, and its working principle is that after the external photons are incident, electron-hole pairs are excited, and in geiger mode, the electron-hole pairs are accelerated by an electric field to have enough energy to strike to generate new multiple electron-hole pairs, so as to induce avalanche, and the avalanche is quickly stopped to recover to the state before avalanche under an externally-applied quenching circuit, so as to wait for the next photon to be detected, and the device has many advantages of high gain, high sensitivity and the like.
Photon detection efficiency (PDE, photo Detection Efficiency) is an important parameter for evaluating the performance of silicon photomultipliers (sipms) and can be broken down into three quantities:
PDE＝∈ geo ·QE·∈ trigger wherein E is geo Representing a fill factor, i.e., the ratio of the actual effective light receiving area to the total area; QE is quantum efficiency, which represents the probability of generating electron-hole pairs under photo/thermal excitation; e-shaped article trigger The probability of an electron-hole pair initiating an avalanche is affected by many factors such as operating voltage, wavelength of incident light, intensity of light, etc. In recent years, with the development of the technical field of laser radar, PDE has become one of the most important evaluation parameters of RX (receiving end), and directly affects the detection sensitivity and detection efficiency of laser radar. The technical scheme designs a luminous flux regulating structure based on PDE, which is particularly suitable for PDE test of SiPM, so as to meet PDE test requirements.
Disclosure of Invention
In view of the above prior art, it is an object of the present invention to provide a PDE-based light flux regulating structure to fulfill the PDE test requirements of photodetectors.
Based on the technical purposes, the invention adopts the following technical scheme:
the invention provides a luminous flux adjusting structure based on PDE, which comprises a light source, a light adjusting group part, an integrating sphere and an optical sleeve; the light ray adjusting group part comprises a collimating lens and a condensing lens; the light emitted by the light source is converted into parallel light through the light adjusting group part, the parallel light is converged and then enters the input end of the integrating sphere, the output end of the integrating sphere is connected with one end of the optical sleeve, the light is emitted from the output end of the integrating sphere and enters the optical sleeve, the SiPM to be detected is arranged at the other end of the optical sleeve, and the light irradiates the SiPM to be detected through the optical sleeve.
In a preferred embodiment, the PDE-based light flux adjusting structure further includes a filter reflector and a photodetector, the light emitted by the light source passes through the collimating lens and then reflects the light with the wavelength to be tested by the filter reflector, the reflected light with the wavelength to be tested enters the input end of the integrating sphere through the condensing lens, the light with the wavelength not to be tested is transmitted by the filter reflector through the collimating lens, and the transmitted light with the wavelength not to be tested is sensed by the photodetector.
In a preferred embodiment, the PDE-based luminous flux adjusting structure has an optical fiber at an input end of the integrating sphere, and the light passing through the condensing lens enters the optical fiber and the light passing through the condensing lens enters the input end of the integrating sphere through the optical fiber.
In a preferred embodiment, the PDE-based light flux adjusting structure further includes a first optical attenuation sheet, and the reflected light beam with the wavelength to be tested enters the input end of the integrating sphere through the condensing lens via the first optical attenuation sheet; the first optical attenuation sheet is an adjustable attenuation sheet.
In a preferred embodiment, the PDE-based luminous flux adjusting structure further includes a first mirror and a second mirror, and the light passing through the collimating lens sequentially passes through the first mirror and the second mirror to be irradiated onto the filtering mirror.
In a preferred embodiment, the PDE-based light flux regulating structure, the first mirror and the second mirror are right angle mirrors; the filtering reflector is a right-angle reflector.
In a preferred embodiment, the end face of the other end of the optical ferrule is parallel to the light-emitting surface of the integrating sphere.
In a preferred embodiment, the PDE-based light flux adjusting structure is provided with a second optical attenuator in the optical sleeve, and the light irradiates the SiPM to be measured through the second optical attenuator in the optical sleeve.
In a preferred embodiment, the PDE-based light flux regulating structure, the optical sleeve is a length-adjustable optical sleeve.
In a preferred embodiment, the PDE-based light flux regulating structure, the collimating lens and the condensing lens are both semi-convex lenses.
Compared with the prior art, the PDE-based luminous flux adjusting structure provided by the invention comprises a light source, a light adjusting group part, an integrating sphere and an optical sleeve; the light ray adjusting group part comprises a collimating lens and a condensing lens; the light emitted by the light source is converted into parallel light through the light adjusting group part, the parallel light is converged and then enters the input end of the integrating sphere, the output end of the integrating sphere is connected with one end of the optical sleeve, the light is emitted from the output end of the integrating sphere and enters the optical sleeve, the SiPM to be detected is arranged at the other end of the optical sleeve, and the light irradiates the SiPM to be detected through the optical sleeve. The invention can realize the PDE test of the photoelectric detector, in particular to the photoelectric detector such as SiPM, and can achieve the effect of adjusting the luminous flux input to the SiPM by adjusting the length of the optical sleeve under the condition of certain light intensity, so that the photoelectric detector meets the test requirement of the PDE. The integrating sphere testing part is separated from the light source input part, and the design separates the light path into the input adjusting part and the testing part, so that the testing part is not disturbed.
Drawings
Fig. 1 is a schematic structural diagram of a PDE-based light flux regulating structure provided by the present invention.
Fig. 2 is a schematic diagram of the structure of integrating sphere output of the PDE-based luminous flux adjustment structure provided by the present invention.
Fig. 3 is a schematic structural diagram of a test part of the PDE-based luminous flux adjustment structure provided by the present invention.
The drawings are marked with the following description: 101. a light source; 102. a light ray adjusting group part; 103. an integrating sphere; 104 an optical sleeve; 105. a collimating lens; 106. a condensing lens; 107. SiPM to be measured; 108. a filter mirror; 109. a photodetector; 110. a first mirror; 111. a second mirror; 112. a first optical attenuation sheet; 113. an optical fiber; 114. a second optical attenuation sheet.
Detailed Description
The present invention will be described in further detail with reference to the drawings and examples, in order to make the objects, technical solutions and advantages of the present invention more apparent. It should be understood that the specific embodiments described herein are for purposes of illustration only and are not intended to limit the scope of the invention.
It is noted that when an element is referred to as being "mounted," "secured," or "disposed" on another element, it can be directly on the other element or intervening elements may also be present. When an element is referred to as being "connected to" another element, it can be directly connected to the other element or intervening elements may also be present.
It should be noted that, in the embodiments of the present invention, terms such as left, right, up, and down are merely relative concepts or references to normal use states of the product, and should not be construed as limiting.
As shown in fig. 1, the present invention provides a PDE-based light flux adjusting structure including a light source 101, a light adjusting group 102, an integrating sphere 103, and an optical sleeve 104; the light ray adjusting group part 102 comprises a collimating lens 105 and a condensing lens 106; the light emitted by the light source 101 is converted into parallel light by the light adjusting unit 102, the parallel light is converged and enters the input end of the integrating sphere 103, the output end of the integrating sphere 103 is connected with one end of the optical sleeve 104, the light is emitted from the output end of the integrating sphere 103 and enters the optical sleeve 104, the SiPM107 to be detected is arranged at the other end of the optical sleeve 104, and the light irradiates the SiPM107 to be detected through the optical sleeve. Preferably, in the PDE-based light flux adjusting structure according to the present invention, in this embodiment, the collimating lens 105 and the condensing lens 106 are both semi-convex lenses. The invention enables PDE testing of photodetecting electronics, in particular sipms. The invention can achieve the effect of adjusting the luminous flux input to the SiPM by adjusting the length of the optical sleeve 104 or replacing the optical sleeve 104 with different lengths under the condition of certain light intensity, so that the invention meets the test requirement of the PDE. The invention separates the test part of the integrating sphere 103 from the input part of the light source 101, and the design separates the light path into an input adjustment part and a test part, which is beneficial to ensuring that the test part is not interfered. In addition, the optical sleeve 104 is arranged at the output end of the integrating sphere 103, so that dust prevention can be realized, an optical coating in the integrating sphere 103 is protected, and the service life of the integrating sphere 103 is prolonged.
SiPM consists of an array of SPADs (Single Photon Avalanche Diode, single photon avalanche diodes) and shares the same output, with or without avalanche between each SPAD being a relatively independent event, if the SPAD number at which avalanche occurs under a fixed light condition is considered as a discrete random variable, it should be subject to poisson distribution, PDE should be equal to the ratio of the difference of the avalanche number triggered by photons only minus the thermally-triggered avalanche number to the number of incident photons:
where npe is the number of SPADs where avalanche occurs and nph is the number of incident photons of a single pulse of light. Typical sipms can consist of hundreds to thousands of SPADs, and for PDE test accuracy nph must be lower than npe, and the corresponding nph must be controlled very low, while the timing of the incident light must be measured due to the need to grab the externally applied light-induced avalanche signal, and thus the synchronization signal of the light must also be output, which directly results in the light source 101 requirements becoming particularly stringent for PDE measurements.
Preferably, in the PDE-based light flux adjusting structure according to the present invention, the light adjusting unit 102 further includes a filtering mirror 108 and a photodetector 109, the light emitted by the light source 101 passes through the collimating lens 105, and then is reflected by the filtering mirror 108 to obtain light with a wavelength to be tested, the reflected light with the wavelength to be tested enters the input end of the integrating sphere 103 through the condensing lens 106, the light passing through the collimating lens 105 passes through the filtering mirror 108 to obtain light with a wavelength not to be tested, and the transmitted light with the wavelength not to be tested is sensed by the photodetector 109. The invention sets the filtering reflector 108 at the input part, skillfully filters the non-test light wavelength, intercepts the synchronous signal of the light source 101, does not need to additionally design a synchronous signal output circuit of the light source 101, is beneficial to reducing the cost and simplifying the structure of the device.
Preferably, in the PDE-based luminous flux adjustment structure according to the present invention, the light adjustment assembly 102 further includes a first mirror 110 and a second mirror 111, and the light passing through the collimating lens 105 sequentially passes through the first mirror 110 and the second mirror 111 to be irradiated onto the filtering mirror 108. These arrangements are based on positional adjustments between corresponding components of the actual device structure, which may make the overall device space structure more compact. Preferably, in the PDE-based luminous flux adjustment structure provided by the present invention, the first reflecting mirror 110 and the second reflecting mirror 111 are right-angle reflecting mirrors; the filter mirror 108 is a right angle mirror.
Preferably, in the PDE-based light flux adjusting structure provided by the present invention, the light adjusting unit 102 further includes a first optical attenuation sheet 112, and the reflected light with the wavelength to be tested enters the input end of the integrating sphere 103 through the condensing lens 106 via the first optical attenuation sheet 112; the first optical attenuation sheet 112 is an adjustable attenuation sheet. The first optical attenuation sheet 112 is used for adjusting the light intensity of the input light.
Preferably, in the PDE-based light flux adjusting structure according to the present invention, an optical fiber 113 is disposed at an input end of the integrating sphere 103, the light passing through the condensing lens 106 enters the optical fiber 113, and the light passing through the condensing lens 106 enters the input end of the integrating sphere 103 through the optical fiber 113, so as to guide the light into the integrating sphere 103. Preferably, in the PDE-based light flux adjusting structure according to the present invention, the end surface of the other end of the optical ferrule is parallel to the light emitting surface of the integrating sphere 103, so as to better ensure that the SiPM107 to be measured receives a uniform light (the light intensity variation within the range of 7mm can be controlled to be 8%). Preferably, in the PDE-based luminous flux adjusting structure according to the present invention, the second optical attenuation sheet 114 is disposed in the optical sleeve 104, and the light passes through the second optical attenuation sheet 114 in the optical sleeve and irradiates on the SiPM107 to be measured.
The invention has simple structure, can economically and effectively realize the high attenuation requirement of the light path, can ensure the uniformity effect of light received by the SiPM107 to be tested, realizes that the light wavelength which is not required by testing is filtered out while the circuit synchronous signal circuit output of the light source 101 is not needed, is portable, simple and effectively improves the PDE testing efficiency, and is beneficial to saving the testing cost.
The light input part of this embodiment converts the laser light scattered by the light source 101 into parallel light through a half convex lens, reflects the parallel light and enters the filter mirror 108, the rest light with non-test wavelength passes through the filter mirror 108, enters the photodetector 109, converts the signal into synchronous electric signal, and reflects the light with test wavelength, passes through the adjustable first optical attenuation sheet 112 and then is converged to the optical fiber 113 end through the next half convex lens.
As shown in fig. 2 and 3, after the light to be tested is input into the integrating sphere 103 by the optical fiber 113, the light to be tested is reflected inside the integrating sphere 103 for multiple times, the isotropic light is output from the output end and enters the optical sleeve 104, and then is attenuated twice by the second optical attenuation sheet 114 in the optical sleeve 104, and meanwhile, the angle of the incident light on the SiPM107 to be tested is limited, so that the solid angle is small enough to achieve the effect of reducing the luminous flux. Preferably, the PDE-based light flux adjusting structure provided by the present invention, the optical sleeve 104 is an adjustable length optical sleeve 104.
According to the relation between the light intensity and the luminous flux:
wherein I is the luminous intensity, Φ is the luminous flux, Ω is the solid angle, which in turn is equal to the minimum area on the unit sphere:
since the light output by the integrating sphere 103 is isotropic, the light intensity (I) is constant and the light receiving area (dA) of the SiPM to be measured is constant when the input end is fixed, the solid angle must be made small enough to adjust the light flux, and the solid angle is made small enough by increasing the length (r 2 ) This effect can be achieved smartly.
The invention separates the test part from the input part, so that the test part can be carried out in a better dark environment, which is beneficial to ensuring the test effect. The optical sleeve 104 selected by the invention is easy to assemble, can be matched with an attenuation sheet for use, is economical and practical, and enables the test to be efficient and reliable. The invention selects the filtering reflector 108 on the reflection light path of the input end, not only filters out the light with clutter length, but also utilizes the part of light to output the synchronous signal so as to facilitate PDE test, thereby being beneficial to simplifying the structure and reducing the cost. The invention uses a simple optical sleeve 104 structure, and reduces the solid angle to be low enough so that the uniformity of light received by the chip to be tested is well ensured while the high attenuation requirement of PDE test is met.
In summary, the invention enables PDE testing of photodetecting electronics, particularly SiPMs. The invention uses a simple optical sleeve structure, and reduces the solid angle to be low enough so that the uniformity of light received by the chip to be tested is well ensured while the high attenuation requirement of PDE test is met. The invention can achieve the effect of adjusting the luminous flux input to the SiPM by adjusting the length of the optical sleeve or replacing the optical sleeve with different lengths under the condition of certain light intensity, so that the optical sleeve meets the test requirement of the PDE. The optical filter is selected on the reflection light path of the input end, so that not only is the light with long clutter filtered, but also the light is used for outputting the synchronous signal so as to facilitate PDE test, thereby being beneficial to simplifying the structure and reducing the cost. The integrating sphere testing part is separated from the light source input part, and the design separates the light path into the input adjusting part and the testing part, so that the testing part can be carried out in a better dark environment, and the testing part is not disturbed. In addition, the optical sleeve is arranged at the output end of the integrating sphere, so that dust prevention can be realized, an optical coating in the integrating sphere is protected, and the service life of the integrating sphere is prolonged.
It will be understood that equivalents and modifications will occur to those skilled in the art in light of the present invention and their spirit, and all such modifications and substitutions are intended to be included within the scope of the present invention as defined in the following claims.
Claims (10)
1. A luminous flux adjusting structure based on PDE, which is characterized by comprising a light source, a light adjusting group part, an integrating sphere and an optical sleeve; the light ray adjusting group part comprises a collimating lens and a condensing lens; the light emitted by the light source is converted into parallel light through the light adjusting group part, the parallel light is converged and then enters the input end of the integrating sphere, the output end of the integrating sphere is connected with one end of the optical sleeve, the light is emitted from the output end of the integrating sphere and enters the optical sleeve, the SiPM to be detected is arranged at the other end of the optical sleeve, and the light irradiates the SiPM to be detected through the optical sleeve.
2. The PDE-based optical flux adjustment structure of claim 1, wherein the optical adjustment assembly further comprises a filter mirror and a photodetector, the light emitted by the light source passes through the collimating lens and then reflects the light with the wavelength to be tested through the filter mirror, the reflected light with the wavelength to be tested enters the input end of the integrating sphere through the condensing lens, the light with the wavelength not to be tested is transmitted through the filter mirror by the light passing through the collimating lens, and the transmitted light with the wavelength not to be tested is sensed by the photodetector.
3. The PDE-based flux controlling structure of claim 1, wherein the input end of the integrating sphere is provided with an optical fiber, the light passing through the condenser lens enters the optical fiber, and the light passing through the condenser lens enters the input end of the integrating sphere through the optical fiber.
4. The PDE-based light flux regulating structure of claim 2, wherein said light regulating group further comprises a first optical attenuation sheet through which said reflected light of the wavelength to be tested enters the input end of said integrating sphere via said condensing lens; the first optical attenuation sheet is an adjustable attenuation sheet.
5. The PDE-based luminous flux adjustment structure according to claim 2, wherein the light ray adjustment group portion further includes a first mirror and a second mirror, and the light ray passing through the collimator lens is sequentially irradiated onto the filter mirror through the first mirror and the second mirror.
6. The PDE-based light flux regulating structure of claim 5, wherein said first mirror and second mirror are both right angle mirrors; the filtering reflector is a right-angle reflector.
7. The PDE-based luminous flux adjustment structure of claim 1, wherein the end face of the other end of the optical ferrule is parallel to the light exit face of the integrating sphere.
8. The PDE-based optical flux conditioning structure of claim 1, wherein a second optical attenuation sheet is disposed within the optical sleeve, and light is directed onto the SiPM under test by the second optical attenuation sheet within the optical sleeve.
9. PDE based light flux regulating structure according to any one of claims 1 to 6, wherein the optical sleeve is a length adjustable optical sleeve.
10. The PDE-based luminous flux regulating structure of any one of claims 1 to 6, wherein the collimating lens and the condensing lens are both semi-convex lenses.
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| Application Number | Priority Date | Filing Date | Title |
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| CN202310238308.9A CN116429249A (en) | 2023-03-03 | 2023-03-03 | Light flux adjusting structure based on PDE |
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| Application Number | Priority Date | Filing Date | Title |
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| CN202310238308.9A CN116429249A (en) | 2023-03-03 | 2023-03-03 | Light flux adjusting structure based on PDE |
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| CN116429249A true CN116429249A (en) | 2023-07-14 |
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