CN116298821A - High-power LED multimode control power supply main board function test system - Google Patents
High-power LED multimode control power supply main board function test system Download PDFInfo
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2801—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
- G01R31/2806—Apparatus therefor, e.g. test stations, drivers, analysers, conveyors
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2801—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
- G01R31/2806—Apparatus therefor, e.g. test stations, drivers, analysers, conveyors
- G01R31/2808—Holding, conveying or contacting devices, e.g. test adapters, edge connectors, extender boards
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
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- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
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Abstract
The invention discloses a high-power LED multimode control power supply main board function test system, which relates to the technical field of switch power supply test and comprises an upper computer, a signal acquisition control module, a power supply main board function test board, a digital multimeter, a direct-current voltage stabilizing source, an electric parameter tester, a load box and an alternating-current voltage stabilizing source; the power supply main board functional test board is used for placing a tested power supply main board and providing test conditions required by test, when the upper computer detects that the tested power supply main board is online, the upper computer automatically and sequentially performs flyback no-load test, output detection test, output closing test, output opening test, temperature protection test and output dimming test on the tested power supply main board according to a preset test method, and processes received data to obtain a test result, and if a certain test result is unqualified, the tested power supply main board is discharged and taken out for repair. The whole testing process does not need manual operation of an operator, and the system is utilized for function detection, so that the whole testing efficiency is effectively improved.
Description
Technical Field
The invention relates to the technical field of switch power supply testing, in particular to a high-power LED multimode control power supply main board function testing system.
Background
The lighting fixture device needs to perform function detection before leaving the factory, especially as a power main board of an important part in the fixture device. The existing test scheme is that after the LED lamp fixture which is manually assembled to a connection multimeter is connected with alternating current working voltage, a control potentiometer on a power supply main board is manually adjusted, and the on-off of the LED lamp and the numerical value on the multimeter are observed to judge the function of a product and mark, send and maintain. The test scheme needs to manually operate the test tool, judge whether the power supply main board is good or not, and perform marking, conveying and maintenance, so that the labor intensity is high and the efficiency is low. In addition, because the fixture is made of the LED lamp, an operator can tired eyes and damage eyesight when observing the lamp for a long time, and misjudgment is easily generated due to carelessness in watching under the state of tired eyes. Meanwhile, because the alternating-current working voltage test is directly connected through misoperation in the detection process, the power supply main board with faults can be fried, and potential safety hazards exist.
Therefore, a new power supply main board test scheme is provided, and a ' CN216216577U ' which is independently researched and developed by the company, a high-power multimode control multi-path high-voltage constant-current output non-isolation switch power supply ' is very necessary.
Disclosure of Invention
Aiming at the problems and the technical requirements, the inventor provides a high-power LED multimode control power supply main board function test system, and aims to solve the problems of low manual test efficiency, manual misjudgment and potential safety hazards caused by eye damage. The technical scheme of the invention is as follows:
a high-power LED multimode control power supply main board function test system comprises an upper computer, a signal acquisition control module, a power supply main board function test board, a digital multimeter, a direct current voltage stabilizing source, an electric parameter tester, a load box and an alternating current voltage stabilizing source; the upper computer is respectively connected with the signal acquisition control module, the digital multimeter, the direct-current voltage-stabilizing source and the electric parameter tester, the power supply main board function test board is respectively connected with the signal acquisition control module, the digital multimeter, the direct-current voltage-stabilizing source, the electric parameter tester and the load box, and the electric parameter tester is also connected with the alternating-current voltage-stabilizing source; the power supply main board functional test board is used for placing a tested power supply main board and providing test conditions required by a test, wherein the test conditions comprise a first or second direct current voltage required by the test provided by a direct current voltage stabilizing source, an analog load provided by a load box and alternating current required by the test provided by an alternating current voltage stabilizing source; the electric parameter tester is used for reading the power value of the tested power supply main board;
when the upper computer detects that the tested power supply main board is arranged on the power supply main board function test board, the upper computer automatically tests the tested power supply main board according to a preset test method, and processes received data to obtain a test result.
The beneficial technical effects of the invention are as follows:
the system integrates equipment used for testing, provides testing conditions required by each step of testing, provides a clamp with a testing thimble corresponding to the position of the testing point according to the testing point on the bottom surface of the tested power supply main board, and automatically and sequentially performs a flyback no-load test, an output detection test, an output closing test, an output opening test, a temperature protection test and an output dimming test on the tested power supply main board through a testing method integrated in an upper computer; in each test process, if the test result is qualified, the next test is started, or else, the subsequent test is stopped, and the tested power supply main board is discharged and taken out for repair. The problem of plate explosion caused by misoperation is avoided without manual operation of an operator in the whole test process, the problem that potential safety hazards are easily caused by directly connecting broadband alternating current is further avoided by firstly supplying direct current and then supplying alternating current, the whole test efficiency is effectively improved according to a preset test method and high-energy data processing of an upper computer, and efficient and accurate function detection of the high-power multimode control multi-channel high-voltage constant-current output non-isolation switch power supply is realized.
Drawings
Fig. 1 is a block diagram of a functional test system of a high-power LED multimode control power supply motherboard provided by the present application.
Fig. 2 is a schematic diagram of an internal architecture of the power motherboard functional test board provided in the present application.
Fig. 3 is a schematic diagram of a power motherboard placement fixture provided in the present application.
Fig. 4 is a schematic diagram of the whole power supply to be tested and the labeling of test points.
Fig. 5 is a schematic diagram of a high-power dual-boost circuit of a tested power supply and a test point marking.
Fig. 6 is a schematic diagram of a flyback switching power supply circuit of a tested power supply and a test point marking.
Fig. 7 is a schematic diagram of a non-common ground output circuit of a load end of a tested power supply and a test point marking.
Fig. 8 is a schematic diagram of an over-temperature protection circuit of a tested power supply and a test point marking.
Detailed Description
The following describes the embodiments of the present invention further with reference to the drawings.
The embodiment provides a high-power LED multimode control power supply main board function test system which is used for performing function detection on a high-power multimode control multipath high-voltage constant-current output non-isolated switch power supply (hereinafter referred to as a tested power supply main board) developed by the present department, namely CN 216216577U. As shown in FIG. 1, the system comprises an upper computer, a signal acquisition control module, a power supply main board function test board, a digital multimeter, a direct current voltage stabilizing source, an electric parameter tester, a load box and an alternating current voltage stabilizing source. The upper computer is respectively connected with the signal acquisition control module, the digital multimeter, the direct-current voltage stabilizing source and the electric parameter tester, the power supply main board functional test board is respectively connected with the signal acquisition control module, the digital multimeter, the direct-current voltage stabilizing source, the electric parameter tester and the load box, and the electric parameter tester is also connected with the alternating-current voltage stabilizing source. Optionally, the digital multimeter is a programmable desk digital multimeter, the direct current voltage stabilizing source is a programmable direct current voltage stabilizing source, and the load box and the alternating current voltage stabilizing source are high-power types.
The power supply main board functional test board is used for placing a tested power supply main board and providing test conditions required by test. As shown in fig. 2, the power supply motherboard functional test board includes a power supply motherboard placement fixture, a relay board card, a first voltage stabilizing switch power supply, a second voltage stabilizing switch power supply, a third voltage stabilizing switch power supply, a square wave generator, a short circuit module, and a contactor. The power supply main board placing clamp is a clamp device which is made according to the appearance of the tested power supply main board and the position of the test point on the bottom surface of the tested power supply main board and comprises a test thimble and a connecting wire and is used for placing and locking the tested power supply main board, as shown in fig. 3. The first voltage-stabilizing switch power supply, the second voltage-stabilizing switch power supply, the third voltage-stabilizing switch power supply, the square wave generator, the short circuit module and the load box are all connected to corresponding test ejector pins of the power supply main board placing clamp through relay board cards, the electric parameter tester is connected to corresponding test ejector pins of the power supply main board placing clamp through contactors and then connected with corresponding test points of a tested power supply main board, and the electric parameter tester is used for providing corresponding test conditions except for the first direct current voltage DC250V or the second direct current voltage DC400V required by testing provided by a direct current voltage stabilizing source, the analog load 330R/500W provided by the load box, the alternating current AC400V required by testing provided by an alternating current voltage stabilizing source, and the electric parameter tester also comprises a third direct current voltage DC12V provided by the first voltage-stabilizing switch power supply, a fourth direct current voltage DC15V provided by the second voltage stabilizing switch power supply, a fifth direct current voltage DC5V provided by the third voltage stabilizing switch power supply, and a PWM control signal provided by the square wave generator. The signal acquisition control module is respectively connected with the relay board card and the contactor and is used for switching test conditions according to the instruction of the upper computer. The digital multimeter is connected to a corresponding test thimble of the power supply main board placing clamp through a relay board card and is used for collecting the voltage of a circuit tested by the tested power supply main board or collecting the voltage of an analog load. The electric parameter tester is connected to the corresponding test thimble of the power supply main board placing clamp through the contactor and is used for reading the power value of the tested power supply main board. It should be noted that, in fig. 2, the relay boards are respectively illustrated to clearly show the connection relationship inside the power motherboard function test board, and are actually the same relay board. Alternatively, the square wave generator is 1KHz/0-5V square wave generator.
When the upper computer detects that the tested power supply main board is arranged on the power supply main board functional test board, the upper computer automatically tests the tested power supply main board according to a preset test method, and processes received data to obtain a test result. The preset test method comprises the following steps: the upper computer automatically performs flyback no-load test, output detection test, output closing test, output opening test, temperature protection test and output dimming test on the tested power supply main board in sequence. In each test process, if the test result is qualified, the next test is started, or else, the subsequent test is stopped, and the tested power supply main board is discharged and taken out for repair. The specific implementation of each test is given below, and the test conditions for each test are shown in table 1. Before testing, the active level is set as low level L in the upper computer in advance, and the active level is grounded or opened in the circuit; the inactive level is high H and appears in the circuit as a 5V tap.
<1> flyback no-load test
The flyback no-load test is used for testing a flyback switching power supply circuit and an over-temperature protection circuit of a tested power supply main board. Referring to fig. 4-8, when a flyback no-load test is performed, the upper computer control signal acquisition control module transmits an effective level L to the overtemperature protection circuit enabling end DIG I/O ALL of the tested power supply motherboard, and transmits a random state level X to the non-common ground output circuit enabling end DIG I/O4 of each path of load end. The upper computer controls the direct current voltage stabilizing source to generate a first direct current voltage DC250V and gives the first direct current voltage DC250V to the relevant test point and the ground end F7& F6 of the flyback switching power supply circuit, so that the flyback switching power supply circuit generates direct current voltages DC12V and DC 15V. The relevant test point F7 of the flyback switching power supply circuit is led out from the connection point of the third diode D3 and the first filter capacitor C101 of the flyback switching power supply circuit, and the ground end F6 is led out from any ground end GNDhot of the tested power supply main board.
The upper computer receives the voltage value of the test points F8& F6 led out from the second output end and the ground end of the flyback switching power supply circuit and the voltage value of the test points F9& F6 led out from the output end and the ground end of the over-temperature protection circuit, and also receives the power values of the test points F1& F2 led out from the two input ends of the surge protection circuit of the tested power supply main board, which are fed back by the electric parameter tester, and compares the fed back data with a stored preset range (see table 1), thereby confirming whether the test result is qualified. If the fed-back data are in the respective preset ranges, the upper computer displays that the test is qualified, and enters an output detection test <2>; and if the fed-back data exceeds the preset range, discharging to take out the tested power supply main board and repairing the tested power supply main board.
<2> output test
The output detection test is used for testing the non-common ground output circuit and the over-temperature protection circuit of each path of load end of the tested power supply main board. Referring to fig. 4-8, when an output detection test is performed, based on the test conditions given in the previous test, the upper computer control signal acquisition control module transmits an invalid level H to the overtemperature protection circuit enabling end DIG I/O ALL of the tested power supply motherboard, and transmits an valid level L to the non-common ground output circuit enabling end DIG I/O4 of each path of load end. The upper computer controls the direct current voltage stabilizing source to generate a second direct current voltage DC400V and gives the second direct current voltage DC400V to test points F5 and F6 led out from the output end and the ground end of the high-power double-boost circuit of the tested power supply main board, and meanwhile, the signal acquisition control module controls the relay board card to switch into: the first voltage-stabilizing switch power supply generates a third direct-current voltage DC12V and supplies the third direct-current voltage DC12V to test points F8& F6 led out from a second output end and a ground end of a flyback switch power supply circuit of a tested power supply mainboard, the second voltage-stabilizing switch power supply generates a fourth direct-current voltage DC15V and supplies the fourth direct-current voltage DC15V to test points F9& F6 led out from the output end and the ground end of an over-temperature protection circuit, the third voltage-stabilizing switch power supply generates a fifth direct-current voltage DC5V and supplies the fifth direct-current voltage DC5V to an enabling end DIG I/O ALL of the over-temperature protection circuit, the square wave generator generates PWM control signals (1 KHz/5V) and supplies the PWM control signals to test points F10& F6 led out from the control end and the ground end of each load end non-common ground output circuit, and the test points F3& F4 led out from the load cathode and anode end of each load end non-common ground output circuit are connected with an analog load 330R 500W.
The upper computer receives voltage values of test points F3 and F4 led out from the cathode and anode ends of the load and power values of test points F1 and F2 led out from two input ends of a surge protection circuit of a tested power supply main board and fed back by the electric parameter tester, so as to calculate and obtain current values; and compares the fed back power value and the calculated current value with a stored preset range (see table 1), thereby confirming whether the test result is acceptable. If the power value and the current value are in the respective preset ranges, the upper computer displays that the test is qualified, and enters an output closing test <3>; and if the power value and the current value exceed the preset range, discharging to take out the tested power supply main board and repairing.
<3> output off test
The output closing test is used for testing the high-power double-boost circuit of the tested power supply main board and the non-common ground output circuit of each path of load end. Referring to fig. 4-8, when the output shutdown test is performed, based on the test conditions given in the previous test, the upper computer control signal acquisition control module transmits an active level L to the overtemperature protection circuit enabling end DIG I/O ALL of the tested power supply motherboard, and transmits an inactive level H to the non-common ground output circuit enabling end DIG I/O4 of each load end. The upper computer is controlled by the signal acquisition control module: the relay board is switched into a first voltage-stabilizing switching power supply, a second voltage-stabilizing switching power supply and a square wave generator are closed, a third voltage-stabilizing switching power supply generates a fifth direct-current voltage DC5V and supplies the fifth direct-current voltage DC5V to a non-common ground output circuit enabling end DIG I/O4 of each path of load end, and at the moment, an analog load 330R 500W is still connected to test points F3& F4; the contactor is switched into an alternating current voltage stabilizing source to generate the required alternating current AC400V and supply the required alternating current to test points F1 and F2 led out from two input ends of a surge protection circuit of a tested power supply main board, so that a high-power double-boost circuit and each load end non-common ground output circuit are connected to each voltage signal.
The upper computer receives a voltage value 1 of test points F5& F6 led out from the output end and the ground end of the high-power double-boost circuit and a voltage value 2 of test points F3& F4 led out from the cathode and anode ends of a load, which are fed back by the digital multimeter, and also receives power values of the test points F1& F2 led out from the two input ends of the surge protection circuit, which are fed back by the electric parameter tester, and the current value is calculated by using the voltage value 2 and the power values; and compares the fed back voltage value 1, power value and calculated current value with a stored preset range (see table 1), thereby confirming whether the test result is qualified. If the voltage value 1, the power value and the current value are in the respective preset ranges, the upper computer displays that the test is qualified, and enters an output opening test <4>; and if the voltage value 1, the power value and the current value exceed the preset range, discharging to take out the tested power supply main board and repairing.
<4> output open test
The output opening test is used for testing the non-common ground output circuit of each path of load end of the tested power supply main board. Referring to fig. 4-8, when the output open test is performed, based on the test condition given by the previous test, the upper computer control signal acquisition control module transmits the valid level L to the overtemperature protection circuit enabling end DIG I/O ALL of the tested power supply motherboard and to the non-common ground output circuit enabling end DIG I/O4 of each path of load end. The upper computer controls the relay board card to be switched into by the signal acquisition control module: and closing the third voltage-stabilizing switching power supply, and connecting the analog load 330R 500W to the relevant test point of each load end non-common ground output circuit and the test point F11& F8 of the second output end of the flyback switching power supply circuit in addition to the test point F3& F4 led out from the load cathode and anode of each load end non-common ground output circuit, so that each load end non-common ground output circuit is connected to each voltage signal. The relevant test point F11 of each load end non-common-ground output circuit is led out from the connection point of the resistors R529 and R530 of each load end non-common-ground output circuit.
The upper computer receives voltage values of test points F3 and F4 led out from the cathode and anode ends of the load and fed back by the digital multimeter, and also receives power values of test points F1 and F2 led out from two input ends of the surge protection circuit and fed back by the electric parameter tester, so as to calculate a current value; and compares the fed-back data and the calculated current value with a stored preset range (see table 1), thereby confirming whether the test result is acceptable. If the voltage value, the power value and the current value are in the respective preset ranges, the upper computer displays that the test is qualified, and enters a temperature protection test <5>; and if the voltage value, the power value and the current value exceed the preset range, discharging to take out the tested power supply main board and repairing.
<5> temperature protection test
The temperature protection test is used for testing the non-common ground output circuit of each path of load end of the tested power supply main board. Referring to fig. 4-8, when a temperature protection test is performed, on the basis of the test conditions given in the previous test, the upper computer control signal acquisition control module outputs the same level state as the level state transmitted by the circuit enable end DIG I/O ALL of the over-temperature protection circuit and the non-common ground output circuit enable end DIG I/O4 of each path of load end to the tested power supply main board, namely, the level states are ALL the effective level L. The upper computer controls the relay board card to be switched into by the signal acquisition control module: and (3) connecting the short circuit module to a relevant test point of the non-common ground output circuit of each path of load end and a test point F11& F8 led out from the second output end of the flyback switching power supply circuit of the tested power supply main board so as to simulate the high-temperature short circuit condition of the simulated load, wherein the output current slowly falls back from 1.2A at the moment, and the short circuit output current is removed to recover.
The upper computer receives voltage values of test points F3& F4 led out from the load cathode and anode ends of the non-common ground output circuit of each path of load end fed back by the digital multimeter, and also receives power values of test points F1& F2 led out from two input ends of the surge protection circuit fed back by the electric parameter tester, so as to calculate and obtain a current value; and compares the fed back power value and the calculated current value with a stored preset range (see table 1), thereby confirming whether the test result is acceptable. If the power value and the current value are in the respective preset ranges, the upper computer displays that the test is qualified, and enters an output dimming test <6>; and if the power value and the current value exceed the preset range, discharging to take out the tested power supply main board and repairing.
<6> output dimming test
The output dimming test is used for testing the non-common ground output circuit of each load end of the tested power supply main board. Referring to fig. 4-8, when the output dimming test is performed, on the basis of the test conditions given in the previous test, the upper computer control signal acquisition control module controls the level states of the output circuit enabling end DIG I/O ALL and the non-common ground output circuit enabling end DIG I/O4 of each path of load end to be unchanged, namely, the level states are ALL the effective level L. The upper computer controls the relay board card to be switched into by the signal acquisition control module: the square wave generator generates PWM control signals (1 KHz/2.5V) and gives the PWM control signals to test points F10& F6 led out from the control end and the ground end of the non-common ground output circuit of each path of load end, so that the non-common ground output circuit of each path of load end is connected to corresponding voltage signals.
The upper computer receives voltage values of test points F3& F4 led out from the load cathode and anode ends of the non-common ground output circuit of each path of load end fed back by the digital multimeter, and also receives power values of test points F1& F2 led out from two input ends of the surge protection circuit fed back by the electric parameter tester, so as to calculate and obtain a current value; and compares the fed back power value and the calculated current value with a stored preset range (see table 1), thereby confirming whether the test result is acceptable. Whether the power supply is qualified or not, the power supply enters discharge finally to take out the tested power supply motherboard <7>.
<7> discharging and taking out the tested power supply motherboard
When the output dimming test is executed and the tested power supply main board is discharged and taken out, the upper computer control signal acquisition control module controls the level states of the DIG I/O ALL of the enabling end of the over-temperature protection circuit of the tested power supply main board and the DIG I/O4 of the non-common ground output circuit of each path of load end to be unchanged, namely the level states are ALL the effective level L. As shown in fig. 5, the upper computer controls the relay board card and the contactor to switch into by the signal acquisition control module: and closing the alternating current voltage stabilizing source and the square wave generator, and connecting the short circuit module to test points F5 and F6 led out from the output end and the ground end of the high-power double-boost circuit of the tested power supply main board.
And the upper computer receives the voltage values of the test points F5 and F6 led out from the output end and the ground end of the high-power double-boost circuit fed back by the digital multimeter, and when the fed back voltage value is smaller than a stored preset value (see table 1), the tested power supply main board is taken out.
It should be noted that, when the test item <1> needs to be discharged to take out the tested power supply motherboard, the corresponding test condition can be directly closed; when the test items <2> - <6> need to be discharged to take out the tested power supply main board, corresponding test conditions are closed, a short circuit module is connected to test points F5& F6 led out from the output end and the ground end of a high-power double-boost circuit of the tested power supply main board, and when the voltage value of the monitored test points F5& F6 is smaller than a stored preset value, the tested power supply main board is taken out. In the test process of the test items <1> <7>, each test result is automatically stored in a folder designated by the upper computer for operators and repair operators to check.
TABLE 1 test Condition Table
What has been described above is only a preferred embodiment of the present application, and the present invention is not limited to the above examples. It is to be understood that other modifications and variations which may be directly derived or contemplated by those skilled in the art without departing from the spirit and concepts of the present invention are deemed to be included within the scope of the present invention.
Claims (10)
1. The high-power LED multimode control power supply main board function test system is characterized by comprising an upper computer, a signal acquisition control module, a power supply main board function test board, a digital multimeter, a direct-current voltage stabilizing source, an electric parameter tester, a load box and an alternating-current voltage stabilizing source; the upper computer is respectively connected with the signal acquisition control module, the digital multimeter, the direct current voltage stabilizing source and the electric parameter tester, the power supply main board functional test board is respectively connected with the signal acquisition control module, the digital multimeter, the direct current voltage stabilizing source, the electric parameter tester and the load box, and the electric parameter tester is also connected with the alternating current voltage stabilizing source; the power supply main board functional test board is used for placing a tested power supply main board and providing test conditions required by test, wherein the test conditions comprise first or second direct current voltage required by test provided by the direct current voltage stabilizing source, an analog load provided by the load box and alternating current required by test provided by the alternating current voltage stabilizing source; the electric parameter tester is used for reading the power value of the tested power supply main board;
when the upper computer detects that the tested power supply main board is arranged on the power supply main board function test board, the upper computer automatically tests the tested power supply main board according to a preset test method, and processes received data to obtain a test result.
2. The high-power LED multimode control power supply motherboard functional test system of claim 1, wherein said power supply motherboard functional test station comprises a power supply motherboard placement fixture, a relay board card, a first voltage stabilizing switching power supply, a second voltage stabilizing switching power supply, a third voltage stabilizing switching power supply, a square wave generator, a short circuit module, and a contactor; the power supply main board placing clamp is a clamp device which is made according to the appearance of a tested power supply main board and the position of a test point on the bottom surface of the tested power supply main board and comprises a test thimble and a connecting wire and is used for placing and locking the tested power supply main board; the first voltage-stabilizing switch power supply, the second voltage-stabilizing switch power supply, the third voltage-stabilizing switch power supply, the square wave generator, the short circuit module and the load box are all connected to corresponding test thimbles of the power supply main board placing clamp through the relay board card, the electric parameter tester is connected to corresponding test thimbles of the power supply main board placing clamp through the contactor and then connected with corresponding test points of a tested power supply main board, and the electric parameter tester is used for providing corresponding test conditions, wherein the test conditions further comprise third direct current voltage, fourth direct current voltage, fifth direct current voltage, PWM control signals and a short circuit; the signal acquisition control module is respectively connected with the relay board card and the contactor and is used for switching the test conditions according to an upper computer instruction; the digital multimeter is connected to a corresponding test thimble of the power supply main board placing clamp through the relay board card and is used for collecting the voltage of a circuit tested by the tested power supply main board or collecting the voltage of an analog load.
3. The high-power LED multimode control power supply motherboard functional test system of claim 2, wherein said preset test method comprises:
the upper computer automatically carries out flyback no-load test, output detection test, output closing test, output opening test, temperature protection test and output dimming test on the tested power supply main board in sequence; in each test process, if the test result is qualified, the next test is started, or else, the subsequent test is stopped, and the tested power supply main board is discharged and taken out for repair.
4. The high-power LED multimode control power supply motherboard functional test system of claim 3, wherein said flyback no-load test is used to test a flyback switching power supply circuit and an overtemperature protection circuit of a tested power supply motherboard; when the flyback no-load test is carried out, the upper computer controls the signal acquisition control module to transmit an effective level to an over-temperature protection circuit enabling end of a tested power supply main board and transmit a random state level to a non-common ground output circuit enabling end of each path of load end; the upper computer controls the direct current voltage stabilizing source to generate a first direct current voltage and gives the first direct current voltage to the relevant test point and the ground end of the flyback switching power supply circuit; the upper computer receives the voltage value of the test point led out from the second output end and the ground end of the flyback switching power supply circuit and the voltage value of the test point led out from the output end and the ground end of the over-temperature protection circuit, and also receives the power values of the test points led out from the two input ends of the surge protection circuit of the tested power supply main board and fed back by the electric parameter tester, and compares the fed back data with a stored preset range, thereby confirming whether the test result is qualified.
5. The high-power LED multimode control power supply motherboard functional test system of claim 3, wherein said output detection test is used for testing each load end non-common ground output circuit and over-temperature protection circuit of a tested power supply motherboard; when the output detection test is carried out, the upper computer controls the signal acquisition control module to transmit an invalid level to the enabling end of the over-temperature protection circuit of the tested power supply main board and transmit an effective level to the enabling end of the non-common ground output circuit of each path of load end on the basis of the test condition given by the previous test; the upper computer controls the direct current voltage stabilizing source to generate a second direct current voltage and supply the second direct current voltage to a test point led out from the output end and the ground end of the high-power double-boost circuit of the tested power supply main board, and meanwhile, the signal acquisition control module controls the direct current voltage stabilizing source to: the first voltage-stabilizing switch power supply generates a third direct-current voltage and supplies the third direct-current voltage to a test point led out from the second output end and the ground end of a flyback switch power supply circuit of a tested power supply main board, the second voltage-stabilizing switch power supply generates a fourth direct-current voltage and supplies the fourth direct-current voltage to a test point led out from the output end and the ground end of the over-temperature protection circuit, the third voltage-stabilizing switch power supply generates a fifth direct-current voltage and supplies the fifth direct-current voltage to an enabling end of the over-temperature protection circuit, the square wave generator generates a PWM control signal and supplies the PWM control signal to a test point led out from the control end and the ground end of each load end non-common-ground output circuit, and the analog load is connected to a test point led out from the negative and positive end of the load of each load end non-common-ground output circuit; the upper computer receives the voltage values of the test points led out from the yin and yang ends of the load and fed back by the digital multimeter, also receives the power values of the test points led out from the two input ends of the surge protection circuit of the tested power supply main board and fed back by the electric parameter tester, and compares the fed back power values and the calculated current values with a stored preset range, thereby confirming whether the test result is qualified.
6. The high-power LED multimode control power supply motherboard functional test system of claim 3, wherein said output shutdown test is used to test the high-power dual boost circuit and each load side non-common ground output circuit of the tested power supply motherboard; when the output closing test is carried out, the upper computer controls the signal acquisition control module to transmit an effective level to an over-temperature protection circuit enabling end of a tested power supply main board and transmit an ineffective level to a non-common ground output circuit enabling end of each path of load end on the basis of the test condition given by the previous test; the upper computer is controlled by the signal acquisition control module: the first voltage-stabilizing switching power supply, the second voltage-stabilizing switching power supply and the square wave generator are closed, the third voltage-stabilizing switching power supply generates a fifth direct-current voltage and supplies the fifth direct-current voltage to a non-common ground output circuit enabling end of each path of load end, and the alternating-current voltage-stabilizing power supply generates required alternating current and supplies the alternating current to test points led out from two input ends of a surge protection circuit of a tested power supply main board; the upper computer receives the voltage values of the test points led out from the output end and the ground end of the high-power double-boost circuit and the voltage values of the test points led out from the cathode and the anode of the load, which are fed back by the digital multimeter, and also receives the power values of the test points led out from the two input ends of the surge protection circuit, which are fed back by the electric parameter tester, and compares the fed back data and the calculated current values with a stored preset range, thereby confirming whether the test result is qualified.
7. The high-power LED multimode control power supply motherboard functional test system of claim 3, wherein said output on test is used to test each load side non-common ground output circuit of a power supply motherboard under test; when the output opening test is carried out, the upper computer controls the signal acquisition control module to transmit an unchanged level state to an over-temperature protection circuit enabling end of a tested power supply main board and transmit an effective level to a non-common ground output circuit enabling end of each path of load end on the basis of a test condition given by the previous test; the upper computer is controlled by the signal acquisition control module: closing a third voltage-stabilizing switching power supply, and connecting the analog load to a test point led out from a load cathode and an output cathode of each load end non-common ground output circuit, a related test point of each load end non-common ground output circuit and a test point led out from a second output end of a flyback switching power supply circuit of a tested power supply main board; the upper computer receives the voltage value of the test point led out from the cathode and anode ends of the load and fed back by the digital multimeter, also receives the power values of the test points led out from the two input ends of the surge protection circuit and fed back by the electric parameter tester, and compares the fed back data and the calculated current value with a stored preset range so as to confirm whether the test result is qualified.
8. The high-power LED multimode control power supply motherboard functional test system of claim 3, wherein said temperature protection test is used to test each load side non-common ground output circuit of a tested power supply motherboard; when the temperature protection test is carried out, the upper computer controls the signal acquisition control module to output the level state transmitted by the circuit enabling end of the non-common ground output circuit of each path of load end to the over-temperature protection circuit enabling end of the tested power supply main board on the basis of the test condition given by the previous test; the upper computer controls the short circuit module to be connected to a relevant test point of each load end non-common ground output circuit and a test point led out from a second output end of a flyback switching power supply circuit of a tested power supply main board through the signal acquisition control module; the upper computer receives the voltage values of the test points led out from the load cathode and anode ends of the non-common ground output circuit of each path of load end fed back by the digital multimeter, also receives the power values of the test points led out from the two input ends of the surge protection circuit fed back by the electric parameter tester, and compares the fed back power values and the calculated current values with a stored preset range, thereby confirming whether the test result is qualified.
9. The high-power LED multimode control power supply motherboard functional test system of claim 3, wherein said output dimming test is used to test each load-side non-common-ground output circuit of a tested power supply motherboard; when the output dimming test is carried out, the upper computer controls the signal acquisition control module to unchanged the level state transmitted to the over-temperature protection circuit enabling end of the tested power supply main board and the non-common ground output circuit enabling end of each path of load end on the basis of the test condition given by the previous test; the upper computer controls the square wave generator to generate PWM control signals through the signal acquisition control module and gives the PWM control signals to test points led out from the control end and the ground end of the non-common ground output circuit of each path of load end; the upper computer receives the voltage values of the test points led out from the load cathode and anode ends of the non-common ground output circuit of each path of load end fed back by the digital multimeter, also receives the power values of the test points led out from the two input ends of the surge protection circuit fed back by the electric parameter tester, and compares the fed back power values and the calculated current values with a stored preset range, thereby confirming whether the test result is qualified.
10. The high-power LED multimode control power supply motherboard function test system according to claim 3, wherein when the output dimming test is performed and the discharge is performed to take out the tested power supply motherboard, the upper computer controls the signal acquisition control module to output the constant level state of the circuit enable end to the overheat protection circuit of the tested power supply motherboard and the non-common ground of each path of load end; the upper computer is controlled by the signal acquisition control module: closing an alternating current voltage stabilizing source and a square wave generator, and connecting a short circuit module to a test point led out from the output end and the ground end of a high-power double-boost circuit of a tested power supply main board; and the upper computer receives the voltage values of the test points led out from the output end and the ground end of the high-power double-boost circuit fed back by the digital multimeter, and when the fed back voltage values are smaller than the stored preset values, the tested power supply main board is taken out.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202310493484.7A CN116298821A (en) | 2023-04-28 | 2023-04-28 | High-power LED multimode control power supply main board function test system |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202310493484.7A CN116298821A (en) | 2023-04-28 | 2023-04-28 | High-power LED multimode control power supply main board function test system |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN116298821A true CN116298821A (en) | 2023-06-23 |
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Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202310493484.7A Withdrawn CN116298821A (en) | 2023-04-28 | 2023-04-28 | High-power LED multimode control power supply main board function test system |
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| Country | Link |
|---|---|
| CN (1) | CN116298821A (en) |
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2023
- 2023-04-28 CN CN202310493484.7A patent/CN116298821A/en not_active Withdrawn
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Application publication date: 20230623 |