CN116297465A - Standard sample analysis method based on zircon fission track legal year - Google Patents
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- 229910052845 zircon Inorganic materials 0.000 title claims abstract description 133
- GFQYVLUOOAAOGM-UHFFFAOYSA-N zirconium(iv) silicate Chemical compound [Zr+4].[O-][Si]([O-])([O-])[O-] GFQYVLUOOAAOGM-UHFFFAOYSA-N 0.000 title claims abstract description 132
- 230000004992 fission Effects 0.000 title claims abstract description 19
- 238000012284 sample analysis method Methods 0.000 title claims abstract description 8
- 238000004458 analytical method Methods 0.000 claims abstract description 50
- 238000001514 detection method Methods 0.000 claims abstract description 29
- 238000005259 measurement Methods 0.000 claims abstract description 19
- 238000000034 method Methods 0.000 claims abstract description 12
- 238000003384 imaging method Methods 0.000 claims abstract description 11
- QCWXUUIWCKQGHC-UHFFFAOYSA-N Zirconium Chemical compound [Zr] QCWXUUIWCKQGHC-UHFFFAOYSA-N 0.000 claims description 19
- 229910052726 zirconium Inorganic materials 0.000 claims description 18
- 239000011248 coating agent Substances 0.000 claims description 12
- 238000000576 coating method Methods 0.000 claims description 12
- 239000012535 impurity Substances 0.000 claims description 12
- 238000004949 mass spectrometry Methods 0.000 claims description 9
- 238000011156 evaluation Methods 0.000 claims description 6
- 239000013078 crystal Substances 0.000 claims description 4
- 230000009466 transformation Effects 0.000 claims description 4
- 239000012925 reference material Substances 0.000 claims description 3
- 239000010421 standard material Substances 0.000 claims description 3
- 230000006735 deficit Effects 0.000 claims description 2
- 230000006872 improvement Effects 0.000 description 8
- 239000004973 liquid crystal related substance Substances 0.000 description 6
- ZOKXTWBITQBERF-UHFFFAOYSA-N Molybdenum Chemical compound [Mo] ZOKXTWBITQBERF-UHFFFAOYSA-N 0.000 description 5
- 238000010586 diagram Methods 0.000 description 5
- 229910052750 molybdenum Inorganic materials 0.000 description 5
- 239000011733 molybdenum Substances 0.000 description 5
- 229910052770 Uranium Inorganic materials 0.000 description 4
- 238000006243 chemical reaction Methods 0.000 description 4
- JFALSRSLKYAFGM-UHFFFAOYSA-N uranium(0) Chemical compound [U] JFALSRSLKYAFGM-UHFFFAOYSA-N 0.000 description 4
- 238000002679 ablation Methods 0.000 description 3
- 229910052500 inorganic mineral Inorganic materials 0.000 description 3
- 150000002500 ions Chemical class 0.000 description 3
- 239000011707 mineral Substances 0.000 description 3
- 230000008569 process Effects 0.000 description 3
- 239000000126 substance Substances 0.000 description 3
- MCMNRKCIXSYSNV-UHFFFAOYSA-N Zirconium dioxide Chemical compound O=[Zr]=O MCMNRKCIXSYSNV-UHFFFAOYSA-N 0.000 description 2
- 238000002425 crystallisation Methods 0.000 description 2
- 230000008025 crystallization Effects 0.000 description 2
- 238000006722 reduction reaction Methods 0.000 description 2
- 239000011435 rock Substances 0.000 description 2
- 238000005033 Fourier transform infrared spectroscopy Methods 0.000 description 1
- 239000002253 acid Substances 0.000 description 1
- 230000009286 beneficial effect Effects 0.000 description 1
- 230000015572 biosynthetic process Effects 0.000 description 1
- 230000000903 blocking effect Effects 0.000 description 1
- 238000004364 calculation method Methods 0.000 description 1
- 239000003638 chemical reducing agent Substances 0.000 description 1
- 238000004140 cleaning Methods 0.000 description 1
- 230000006866 deterioration Effects 0.000 description 1
- 239000006185 dispersion Substances 0.000 description 1
- 238000004090 dissolution Methods 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 230000003628 erosive effect Effects 0.000 description 1
- 238000000608 laser ablation Methods 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 230000003287 optical effect Effects 0.000 description 1
- 238000002360 preparation method Methods 0.000 description 1
- 230000002285 radioactive effect Effects 0.000 description 1
- 230000009467 reduction Effects 0.000 description 1
- 239000007921 spray Substances 0.000 description 1
- 230000006641 stabilisation Effects 0.000 description 1
- 238000011105 stabilization Methods 0.000 description 1
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- G01N21/84—Systems specially adapted for particular applications
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- G01N1/00—Sampling; Preparing specimens for investigation
- G01N1/28—Preparing specimens for investigation including physical details of (bio-)chemical methods covered elsewhere, e.g. G01N33/50, C12Q
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- G01N21/35—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light
- G01N21/3563—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light for analysing solids; Preparation of samples therefor
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Abstract
The invention relates to the technical field of zircon analysis. The invention relates to a standard sample analysis method based on zircon fission track legal year. Which comprises the following steps: collecting a zircon standard isotope sample, and selecting and preparing a standard sample from the zircon standard isotope sample; and shooting the zircon standard isotope sample and the standard sample by using a laser imaging device so as to obtain standard image data of the standard isotope sample and the standard sample, and carrying out combined analysis on the two image information so as to obtain zircon surface data. According to the invention, the age measurement of zircon is judged by combining the interference of zircon surface quality factors, so that the interference of the factors on detection data can be reduced, the error range is reduced, zircon with data deviation is eliminated, the accuracy of the data is improved, meanwhile, the standard isotope sample is measured through isotope ratio measurement, the measurement accuracy of the method is improved, meanwhile, the repeated detection numerical analysis before summarizing is carried out, and the wrong numerical entry and archiving are avoided.
Description
Technical Field
The invention relates to the technical field of zircon analysis, in particular to a standard sample analysis method based on a zircon fission track legal year.
Background
In the field of earth science, a zircon fission track method is an important method for measuring the age of substances (such as rocks and minerals), which can determine the age of minerals and rocks by measuring the number of nuclear reaction tracks left in zircon crystals, but when the age of zircon is measured, because zircon is a mineral substance, natural weathering and geological process interference easily occur, the radioactive isotope content of zircon is disturbed, the surface erosion and deterioration of zircon are caused, the age judgment of zircon is affected, and meanwhile, when the age judgment of zircon is measured, the sizes of zircon samples are different, the numerical value of each sample is different, the accuracy of the judgment age cannot be met by single judgment, and the age judgment of zircon is deviated, so that a standard sample analysis method based on the legal year of the zircon fission track is proposed.
Disclosure of Invention
The invention aims to provide a standard sample analysis method based on zircon fission track legal year so as to solve the problems in the background technology.
In order to achieve the above object, a method for analyzing a standard sample based on zircon fission track legal year is provided, which comprises the following steps:
s1, collecting an MAD zircon standard isotope sample, and selecting and preparing the standard sample from the MAD zircon standard isotope sample;
s2, shooting the MAD zircon standard isotope sample and the standard sample by using a laser imaging device so as to acquire standard image data of the standard isotope sample and the standard sample, and carrying out combined analysis on the two image information so as to acquire zircon surface data;
s3, dispersing and placing a standard sample to form a surface coating, measuring the standard sample through an infrared spectrometer to obtain standard sample ratio data, analyzing the standard sample ratio data to obtain serial port position information, and embedding the standard isotope sample into the standard sample to obtain micro serial port position information;
s4, carrying out mass spectrometry on the basis of the tiny serial port position information of the S3 so as to obtain serial port ratio data, and then carrying out comparison analysis on the standard sample ratio data obtained in the S3 and the tiny serial port position information so as to obtain zircon stable ratio data;
s5, based on the zircon surface data acquired in the S2 and the zircon stability ratio data acquired in the S4, combining and analyzing the two information, so as to calculate and acquire a zircon standard sample analysis result, and recording and uploading the zircon standard sample analysis result to a cloud;
and S6, classifying according to the data difference of the zircon standard sample analysis results, comparing and evaluating the zircon standard sample analysis results obtained in the step S5 with cloud data so as to meet the reliable measurement requirement, and finally judging the accuracy of the standard sample analysis results obtained in the step S5 according to the evaluation data.
As a further improvement of the technical scheme, the step of preparing the standard sample for the standard isotope sample by the S1 is as follows:
s1.1, selecting a zircon specimen to remove impurities on the surface and in the zircon specimen;
s1.2, chemically pretreating a zircon sample;
s1.3, adding a proper amount of reference materials and stable isotope standard materials for calibration, thereby obtaining a standard sample.
As a further improvement of the technical scheme, the step of obtaining zircon surface damage data by S2 analysis is as follows:
s2.1, preparing a standard sample according to the S1.3, and judging the surface impurity interference factors of the standard sample so as to obtain a standard sample judgment result;
s2.2, judging according to impurity interference factors on the surface of the standard isotope sample, so as to obtain a standard isotope sample judgment result;
s2.3, acquiring a judgment result of the judgment standard sample based on the S2.1 and a judgment result of the judgment standard isotope sample acquired by the S2.2, so as to detect surface data of the standard sample and the standard isotope sample.
As a further improvement of the technical scheme, the step of performing surface data detection on the standard sample and the standard isotope sample by the S2.3 is as follows:
s2.3.1, obtaining image information of a standard sample according to laser imaging;
s2.3.2, obtaining image information of a standard isotope sample according to laser imaging;
s2.3.3 obtaining image information of a standard sample and S2.3.2 obtaining two image information of a standard isotope sample based on S2.3.1, combining and comparing the two image information to judge the accuracy of the image information, and then combining and evaluating the two image information to obtain zircon quality impairment interference data.
As a further improvement of the present technical solution, the step of obtaining serial port position information in the S3 pair is as follows:
s3.1, dispersing a sample in pure KBr to prepare a KBr coating, and collecting KBr coating data information;
s3.2, acquiring sample measurement information by using an infrared spectrometer, then combining and analyzing the KBr coating data information and the sample measurement information prepared in the S3.1, thereby acquiring serial port position information, and selecting an embedded standard isotope sample according to the serial port position information to acquire micro serial port position information.
As a further improvement of the technical scheme, the step of acquiring zircon stability ratio data by the S4 pair is as follows:
s4.1, carrying out micro-region ionization on the micro-serial port position information based on the micro-serial port position information acquired in the S3.2, and then carrying out mass spectrometry data on the micro-serial port position information;
s4.2, based on the S4.1, the numerical value in zircon crystals is transformed during mass spectrometry, the numerical value transformation is recorded, and the numerical value transformation is cut off when the final stability is achieved, so that the stable isotope ratio of zirconium 235 and zirconium 238 is obtained.
As a further improvement of the technical scheme, the step of recording and uploading the analysis result of the zircon standard sample to the cloud in S5 is as follows:
s5.1, acquiring zircon quality damage interference data acquired by S2.3.3 and stable isotope ratio of zirconium 235 and zirconium 238 acquired by S4.2, and comparing the two data to judge the accuracy of the data so as to acquire an accurate result;
s5.2, based on the accurate results of the two data acquired in the S5.1, performing result analysis on the two data, and acquiring zircon standard sample detection result data.
As a further improvement of the technical scheme, the step of analyzing the result precision of the S6 is as follows:
s6.1, collecting S2.3.3, S3.2, S4.2 and S5.2 data, classifying the data into the same folder, dividing the data into a plurality of different archives according to the numerical value difference of the zircon standard sample detection result data collected in S5.2, and classifying the folder into the different archives according to requirements;
s6.2, searching similar detection result data in the same archive and comparing and analyzing the zircon standard sample detection result data obtained in the S5.2.
As a further improvement of the technical scheme, the comparison and analysis step of the S6.2 is as follows:
s6.2.1, collecting similar folders in an archive according to S2.3.3 data;
s6.2.2, collecting similar folders in the archive according to the S3.2 data;
s6.2.3, collecting similar folders in the archive according to the S4.2 data;
s6.2.4, comparing and evaluating the acquired folders based on S6.2.1, S6.2.2 and S6.2.3 with the data folder of S6.1 to improve the reliability of the measurement result, judging whether secondary detection is needed according to the evaluation result, and acquiring the accurate measured result of zircon for definite years based on the acquired data of S6.1 without secondary detection.
Compared with the prior art, the invention has the beneficial effects that:
according to the standard sample analysis method based on zircon fission track legal year, the zircon surface quality factor interference is combined to judge the age measurement of the zircon, so that the interference of the factors on detection data can be reduced, the error range is reduced, the zircon with data deviation is eliminated, the accuracy of the data is improved, meanwhile, the standard isotope sample is measured through isotope ratio measurement, the measurement accuracy of the method is improved, meanwhile, the repeated detection numerical analysis before summarizing is carried out, the wrong numerical entry is avoided, and the obtained standard sample analysis result is more accurate and reliable.
Drawings
FIG. 1 is an overall flow diagram of the present invention;
FIG. 2 is a block flow diagram of a standard isotope sample preparation standard sample of the present invention;
FIG. 3 is a block flow diagram of the present invention for deriving zircon surface damage data;
FIG. 4 is a block flow diagram of the surface data detection of standard samples and standard isotope samples according to the present invention;
FIG. 5 is a flow chart of the invention for obtaining serial port position information;
FIG. 6 is a block flow diagram of obtaining zircon stabilization ratio data in accordance with the present invention;
FIG. 7 is a block flow chart of recording zircon standard analysis results in accordance with the present invention.
Detailed Description
The following description of the embodiments of the present invention will be made clearly and completely with reference to the accompanying drawings, in which it is apparent that the embodiments described are only some embodiments of the present invention, but not all embodiments. All other embodiments, which can be made by those skilled in the art based on the embodiments of the invention without making any inventive effort, are intended to be within the scope of the invention.
Example 1
1-7, the present embodiment is directed to a method for analyzing a standard sample based on zircon fission track legal years, comprising the steps of:
s1, collecting an MAD zircon standard isotope sample, and selecting and preparing the standard sample from the MAD zircon standard isotope sample;
the step of preparing a standard sample for the standard isotope sample by the S1 is as follows:
s1.1, selecting a zircon sample to remove impurities on the surface and in the zircon sample, and firstly selecting the zircon sample which is complete in form, high in purity and free from natural weathering and geological process interference, and cleaning the impurities on the surface;
s1.2, performing chemical pretreatment on a zircon sample, and performing acid dissolution and chemical reduction on the zircon with impurities removed to generate pure ZrO2;
s1.3, a proper amount of reference material and stable isotope standard material are added for calibration, so that a standard sample is obtained, the detection accuracy is improved, and the influence on the accuracy caused by blocking of detection light by impurities is avoided.
S2, shooting the MAD zircon standard isotope sample and the standard sample by using a laser imaging device so as to acquire standard image data of the standard isotope sample and the standard sample, and carrying out combined analysis on the two image information so as to acquire zircon surface data;
s2, analyzing to obtain zircon surface damage data, wherein the steps are as follows:
s2.1, preparing a standard sample according to the S1.3, and judging the surface impurity interference factors of the standard sample so as to obtain a standard sample judgment result;
s2.2, judging according to impurity interference factors on the surface of the standard isotope sample, so as to obtain a standard isotope sample judgment result;
s2.3, acquiring a judgment result of the judgment standard sample based on the S2.1 and a judgment result of the judgment standard isotope sample acquired by the S2.2, so as to detect surface data of the standard sample and the standard isotope sample, determine reduction of external factors, and avoid interference of the external factors with the detection result to the greatest extent;
s2.3, carrying out surface data detection on the standard sample and the standard isotope sample, wherein the surface data detection comprises the following steps:
s2.3.1, obtaining image information of a standard sample according to laser imaging;
s2.3.2, obtaining image information of a standard isotope sample according to laser imaging;
s2.3.3, acquiring image information of a standard sample and S2.3.2 acquiring two image information of a standard isotope sample based on S2.3.1, comparing the two image information in a combined mode to judge the accuracy of the image information, and then evaluating the two image information in a combined mode to acquire zircon quality damage interference data, wherein the formula for judging the damage degree of the zircon surface through laser imaging is as follows:
wherein the method comprises the steps ofIs the peak amplitude of the laser reflected light wave, ">The laser wavelength is selected to be proper (generally 532 nm) for zircon crystals, and a laser beam is scanned on the surface of the zircon to obtain a laser reflection optical signal. By analyzing the peak amplitude A of the reflected light wave, the total light wave height of the zircon surface can be calculated>According to the height of the comprehensive light wave, whether the zircon surface is damaged or not and the damage depth can be judged.
S3, dispersing and placing a standard sample to form a surface coating, measuring the standard sample through an infrared spectrometer to obtain standard sample ratio data, analyzing the standard sample ratio data to obtain serial port position information, and embedding the standard isotope sample into the standard sample to obtain micro serial port position information;
s3, the step of acquiring serial port position information is as follows:
s3.1, dispersing a sample in pure KBr to prepare a KBr coating, and collecting KBr coating data information;
s3.2, acquiring sample measurement information by using an infrared spectrometer, then combining and analyzing KBr coating data information and sample measurement information prepared in the step S3.1, so as to acquire serial port position information, selecting an embedded standard isotope sample according to the serial port position information to acquire tiny serial port position information, accurately measuring the standard sample by using a Fourier transform infrared spectrometer, and acquiring data such as the concentration of residual nuclear tracks in the sample, the isotope ratio of zirconium 235 and zirconium 238 in zircon crystallization, and the like; the age of the standard is calculated by FTD measurement principle. The calculation formula is as follows:
Wherein, the liquid crystal display device comprises a liquid crystal display device,is the decay constant of zirconium 235 in zircon, < ->Track density ratio between standard sample and standard sample;
s4, carrying out mass spectrometry on the basis of the tiny serial port position information of the S3 so as to obtain serial port ratio data, and then carrying out comparison analysis on the standard sample ratio data obtained in the S3 and the tiny serial port position information so as to obtain zircon stable ratio data;
s4, the step of acquiring zircon stability ratio data is as follows:
s4.1, carrying out micro-region ionization on the micro-serial port position information based on the micro-serial port position information acquired in the S3.2, and then carrying out mass spectrometry data on the micro-serial port position information;
s4.2, carrying out conversion on the numerical value in zircon crystallization during mass spectrometry based on S4.1, recording the numerical value conversion, and stopping when the numerical value conversion is finally stable, so as to obtain the stable isotope ratio of zirconium 235 and zirconium 238, and firstly preparing a zircon denuded sample, so that a tiny area is exposed on the surface of the sample;
a small circular area is then cut into the sample surface using laser target impingement and ionized. Common ion sources are electrospray ion sources and electronic spray ion sources;
from the zircon ionized laser area and the ablation depth, the ablation rates for molybdenum and uranium (RThandRU) can be calculated as:
wherein the method comprises the steps ofIs the rate of ablation of molybdenum and uranium, +.>Is the falling area of laser ablation;
using molybdenum in zirconAnd zirconium->The relative abundance of atoms and the lives of molybdenum and uranium are respectively calculated to be Th/U ratio and atmospheric refractive index +.>Values. The formula is:
wherein is neutralizedIs the emission wavelength of molybdenum and uranium; />Is the wavelength of the plasma emission line in air. Deriving +.>The ratio and the atmospheric refractive index, and judging the evolution process of zircon formation according to the ratio and the atmospheric refractive index.
S5, based on the zircon surface data acquired in the S2 and the zircon stability ratio data acquired in the S4, combining and analyzing the two information, so as to calculate and acquire a zircon standard sample analysis result, and recording and uploading the zircon standard sample analysis result to a cloud;
s5, recording analysis results of zircon standard samples and uploading the analysis results to a cloud end, wherein the steps are as follows:
s5.1, acquiring zircon quality damage interference data acquired by S2.3.3 and stable isotope ratio of zirconium 235 and zirconium 238 acquired by S4.2, and comparing the two data to judge the accuracy of the data, thereby acquiring an accurate result, wherein a measurement formula is as follows:
wherein, the liquid crystal display device comprises a liquid crystal display device,is the decay constant of zirconium 238; />Is the ratio of Pb206 isotopes in zircon; />Is the content of U238 in zircon and the stable isotope ratio of zirconium 235/zirconium 238; />Represents age of zircon;
s5.2, based on the accurate results of the two data acquired in the S5.1, performing result analysis on the two data, and acquiring zircon standard sample detection result data;
s6, classifying according to the data difference of the zircon standard sample analysis results, comparing and evaluating the zircon standard sample analysis results obtained in the step S5 with cloud data so as to meet the reliable measurement requirements, and finally judging the accuracy of the standard sample analysis results obtained in the step S5 according to the evaluation data;
s6, the step of analyzing the accuracy of the result is as follows:
s6.1, collecting S2.3.3, S3.2, S4.2 and S5.2 data, classifying the data into the same folder, dividing the data into a plurality of different archives according to the numerical value difference of the zircon standard sample detection result data collected in S5.2, and classifying the folder into the different archives according to requirements;
s6.2, searching similar detection result data in the same archive, and comparing and analyzing the detection result data of the zircon standard sample obtained in the S5.2;
the comparison and analysis steps of S6.2 are as follows:
s6.2.1, collecting similar folders in an archive according to S2.3.3 data;
s6.2.2, collecting similar folders in the archive according to the S3.2 data;
s6.2.3, collecting similar folders in the archive according to the S4.2 data;
s6.2.4, comparing and evaluating the acquired folders based on S6.2.1, S6.2.2 and S6.2.3 with the data folder of S6.1, wherein the evaluation formula is as follows:
wherein, the liquid crystal display device comprises a liquid crystal display device,is age of zircon after bonding; />Representing the number of zircon samples participating in the combination judgment; />Represents the age of each sample; />Standard deviation of sample age is indicated. According to the formula, the age data of a plurality of zircon samples can be comprehensively calculated to obtain an average age, and the standard deviation of the sample ages is calculated, so that the dispersion degree of the sample data is reflected, and the data acquired by the step S6.1 is obtained as the accurate measured result of the zircon in definite years under the condition of no need of secondary detection.
The foregoing has shown and described the basic principles, principal features and advantages of the invention. It will be understood by those skilled in the art that the present invention is not limited to the above-described embodiments, and that the above-described embodiments and descriptions are only preferred embodiments of the present invention, and are not intended to limit the invention, and that various changes and modifications may be made therein without departing from the spirit and scope of the invention as claimed. The scope of the invention is defined by the appended claims and equivalents thereof.
Claims (9)
1. A standard sample analysis method based on zircon fission track legal year is characterized in that: the method comprises the following steps:
s1, collecting an MAD zircon standard isotope sample, and selecting and preparing the standard sample from the MAD zircon standard isotope sample;
s2, shooting the MAD zircon standard isotope sample and the standard sample by using a laser imaging device so as to acquire standard image data of the standard isotope sample and the standard sample, and carrying out combined analysis on the two image information so as to acquire zircon surface data;
s3, dispersing and placing a standard sample to form a surface coating, measuring the standard sample through an infrared spectrometer to obtain standard sample ratio data, analyzing the standard sample ratio data to obtain serial port position information, and embedding the standard isotope sample into the standard sample to obtain micro serial port position information;
s4, carrying out mass spectrometry on the basis of the tiny serial port position information of the S3 so as to obtain serial port ratio data, and then carrying out comparison analysis on the standard sample ratio data obtained in the S3 and the tiny serial port position information so as to obtain zircon stable ratio data;
s5, based on the zircon surface data acquired in the S2 and the zircon stability ratio data acquired in the S4, combining and analyzing the two information, so as to calculate and acquire a zircon standard sample analysis result, and recording and uploading the zircon standard sample analysis result to a cloud;
and S6, classifying according to the data difference of the zircon standard sample analysis results, comparing and evaluating the zircon standard sample analysis results obtained in the step S5 with cloud data so as to meet the reliable measurement requirement, and finally judging the accuracy of the standard sample analysis results obtained in the step S5 according to the evaluation data.
2. The zircon fission track legal year based standard analysis method according to claim 1, wherein: the step of preparing a standard sample for the standard isotope sample by the S1 is as follows:
s1.1, selecting a zircon specimen to remove impurities on the surface and in the zircon specimen;
s1.2, chemically pretreating a zircon sample;
s1.3, adding a proper amount of reference materials and stable isotope standard materials for calibration, thereby obtaining a standard sample.
3. The zircon fission track legal year based standard analysis method according to claim 2, wherein: the step of obtaining zircon surface damage data by S2 analysis is as follows:
s2.1, preparing a standard sample according to the S1.3, and judging the surface impurity interference factors of the standard sample so as to obtain a standard sample judgment result;
s2.2, judging according to impurity interference factors on the surface of the standard isotope sample, and obtaining a standard isotope sample judgment result;
s2.3, acquiring a judgment result of the judgment standard sample based on the S2.1 and a judgment result of the judgment standard isotope sample acquired by the S2.2, so as to detect surface data of the standard sample and the standard isotope sample.
4. The zircon fission track legal year based standard analysis method according to claim 3, wherein: the step of S2.3 carrying out surface data detection on the standard sample and the standard isotope sample is as follows:
s2.3.1, obtaining image information of a standard sample according to laser imaging;
s2.3.2, obtaining image information of a standard isotope sample according to laser imaging;
s2.3.3 obtaining image information of a standard sample and S2.3.2 obtaining two image information of a standard isotope sample based on S2.3.1, combining and comparing the two image information to judge the accuracy of the image information, and then combining and evaluating the two image information to obtain zircon quality impairment interference data.
5. The zircon fission track legal year based standard analysis method according to claim 4, wherein: the step of S3 is as follows:
s3.1, dispersing a sample in pure KBr to prepare a KBr coating, and collecting KBr coating data information;
s3.2, acquiring sample measurement information by using an infrared spectrometer, then combining and analyzing the KBr coating data information and the sample measurement information prepared in the S3.1, thereby acquiring serial port position information, and selecting an embedded standard isotope sample according to the serial port position information to acquire micro serial port position information.
6. The zircon fission track legal year based standard analysis method according to claim 5, wherein: the step of S4 is as follows:
s4.1, carrying out micro-region ionization on the micro-serial port position information based on the micro-serial port position information acquired in the S3.2, and then carrying out mass spectrometry data on the micro-serial port position information;
s4.2, based on the S4.1, the numerical value in zircon crystals is transformed during mass spectrometry, the numerical value transformation is recorded, and the numerical value transformation is cut off when the final stability is achieved, so that the stable isotope ratio of zirconium 235 and zirconium 238 is obtained.
7. The zircon fission track legal year based standard analysis method according to claim 6, wherein: s5, recording analysis results of zircon standard samples and uploading the analysis results to a cloud end, wherein the steps are as follows:
s5.1, acquiring zircon quality damage interference data acquired by S2.3.3 and stable isotope ratio of zirconium 235 and zirconium 238 acquired by S4.2, and comparing the two data to judge the accuracy of the data so as to acquire an accurate result;
s5.2, based on the accurate results of the two data acquired in the S5.1, performing result analysis on the two data, and acquiring zircon standard sample detection result data.
8. The zircon fission track legal year based standard analysis method according to claim 7, wherein: the step of S6 analysis result precision is as follows:
s6.1, collecting S2.3.3, S3.2, S4.2 and S5.2 data, classifying the data into the same folder, dividing the data into a plurality of different archives according to the numerical value difference of the zircon standard sample detection result data collected in S5.2, and classifying the folder into the different archives according to requirements;
s6.2, searching similar detection result data in the same archive and comparing and analyzing the zircon standard sample detection result data obtained in the S5.2.
9. The zircon fission track legal year based standard analysis method according to claim 8, wherein: the comparison and analysis step of S6.2 is as follows:
s6.2.1, collecting similar folders in an archive according to S2.3.3 data;
s6.2.2, collecting similar folders in the archive according to the S3.2 data;
s6.2.3, collecting similar folders in the archive according to the S4.2 data;
s6.2.4, comparing and evaluating the acquired folders based on S6.2.1, S6.2.2 and S6.2.3 with the data folder of S6.1 to improve the reliability of the measurement result, judging whether secondary detection is needed according to the evaluation result, and acquiring the accurate measured result of zircon for definite years based on the acquired data of S6.1 without secondary detection.
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