CN116256997A - Control circuit and method for electronic toy and electronic toy - Google Patents

Control circuit and method for electronic toy and electronic toy Download PDF

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Publication number
CN116256997A
CN116256997A CN202211742673.5A CN202211742673A CN116256997A CN 116256997 A CN116256997 A CN 116256997A CN 202211742673 A CN202211742673 A CN 202211742673A CN 116256997 A CN116256997 A CN 116256997A
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state
module
processing
type
processing module
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陈丽丽
廖梓妤
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Individual
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    • GPHYSICS
    • G05CONTROLLING; REGULATING
    • G05BCONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B19/00Programme-control systems
    • G05B19/02Programme-control systems electric
    • G05B19/04Programme control other than numerical control, i.e. in sequence controllers or logic controllers
    • G05B19/042Programme control other than numerical control, i.e. in sequence controllers or logic controllers using digital processors
    • G05B19/0423Input/output
    • GPHYSICS
    • G05CONTROLLING; REGULATING
    • G05BCONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B2219/00Program-control systems
    • G05B2219/20Pc systems
    • G05B2219/25Pc structure of the system
    • G05B2219/25257Microcontroller
    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y02TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
    • Y02PCLIMATE CHANGE MITIGATION TECHNOLOGIES IN THE PRODUCTION OR PROCESSING OF GOODS
    • Y02P90/00Enabling technologies with a potential contribution to greenhouse gas [GHG] emissions mitigation
    • Y02P90/02Total factory control, e.g. smart factories, flexible manufacturing systems [FMS] or integrated manufacturing systems [IMS]

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  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Automation & Control Theory (AREA)
  • Test And Diagnosis Of Digital Computers (AREA)

Abstract

The invention relates to a control circuit and a method for an electronic toy and the electronic toy, wherein the control circuit for the electronic toy comprises a processing unit and a test control module; the processing unit comprises more than three processing modules; by adding at least three processing modules, three state types are arranged in the processing modules, so that the three processing modules can be switched under the three states, when the three processing modules can be normally used, one of the processing modules is in a calculation type, one of the processing modules is in a backup type, and the other processing module is in a test type, thus, the three processing modules are not in an empty state during use, and the waste of hardware is avoided; every certain period, each processing module can realize the self-checking and self-testing of the functionality, and at least realize the backup function in cooperation with another processing module, ensure that the processing modules are in a normal interaction state, further optimize the processing mode of the electronic toy, thereby improving the use experience of users.

Description

Control circuit and method for electronic toy and electronic toy
Technical Field
The application relates to the field of control circuits, in particular to a control circuit and method for an electronic toy and the electronic toy.
Background
With the development of the electronic industry, the electronic trend of toys has become more obvious, and compared with the traditional toys, the electronic toys can realize comprehensive acousto-optic and electric interaction, and realize the interaction effect which the traditional toys cannot realize, so that a great number of toys now realize electronics and automation, and once the built-in chip of the electronic toy is damaged or aged in the use process, the interaction of the whole electronic toy is influenced. In the prior art, the service life of the electronic toy can be prolonged by increasing the standby built-in chip, but the problems are that: the standby built-in chip belongs to an empty state during normal use, so that the waste of hardware resources is caused, and all built-in chips do not have the capability of realizing self-checking, so that a user cannot be notified in time when the built-in chip has interactive faults or hardware faults.
Disclosure of Invention
In view of the above problems, the invention provides a control circuit and a control method for an electronic toy and the electronic toy, which solve the problems that redundant chips are wasted in a vacant way and self-inspection cannot be realized.
To achieve the above object, in a first aspect, the present invention provides a control circuit for an electronic toy, including a processing unit and a test control module; the processing unit comprises more than three processing modules; the test control module comprises a state type configuration module, a task allocation module and a verification module, wherein the state type configuration module is used for configuring the state types of more than three processing modules, the state types comprise any one of a calculation type, a backup type and a test type, and the state types of different processing modules at the same time are different; the task allocation module is used for receiving task processing instructions, and sending data to be processed to the processing unit according to the task processing instructions so as to enable more than three processing modules in the processing unit to process the data to be processed in parallel; the method comprises the steps that a processing module currently in a computing type performs first computation on data to be processed to obtain a first computing result, a processing module currently in a backup type performs second computation on the data to be processed to obtain a second computing result, and a processing module currently in a testing type performs third computation on the data to be processed to obtain a third computing result; the verification module is used for judging whether the first calculation result is consistent with the second calculation result, and if not, sending a first control signal to the alarm module so that the alarm module sends out first prompt information; the checking module is further used for judging whether the test passes or not according to the third calculation result, and if not, sending a second control signal to the alarm module so that the alarm module sends out second prompt information.
In some embodiments, the state type configuration module is configured to configure the state types of more than three processing modules according to a time sequence period, where the configured state type of a processing module is different from the configured state type of the processing module in a previous time sequence period and/or a next time sequence period.
In some embodiments, the processing unit includes a first processing module, a second processing module, and a third processing module; the control circuit further comprises a fault processing unit, wherein the fault processing unit is used for marking the first processing module as a fault state when the test of the first processing module fails, sending a first state type adjustment instruction to a state type configuration module, and the state type configuration module is further used for only configuring the state types of the second processing module and the third processing module according to the first state type adjustment instruction; the state type of the second processing module comprises a calculation type, and the state type of the third processing module comprises a test type; alternatively, the state type of the second processing module includes a test type and the state type of the third processing module includes a calculation type.
In some embodiments, after the first processing module has been marked as a fault state, the fault processing unit is further configured to mark the second processing module as a fault state when the second processing module fails the test, and send a second state type adjustment instruction to the state type configuration module, where the state type configuration module is further configured to configure only the state type of the third processing module according to the second state type adjustment instruction, and the third processing module is alternately in a calculation type or a test type according to the timing cycle.
In some embodiments, the control circuit further includes a toy life cycle judging unit, where the toy life cycle judging unit is configured to determine a life cycle state in which the electronic toy is located according to whether each processing module is in a fault state, determine an opening condition of the test control module according to the life cycle state in which the electronic toy is located, and enable the test control module when the opening condition is met, otherwise not enable the test control module.
In some embodiments, the lifecycle state in which the electronic toy is located includes a use state or a rework state; when at least one processing module is in a non-fault state, the life cycle judging unit of the toy determines that the life cycle state of the electronic toy is a use state, and the starting condition of the test control module corresponding to the use state is that key information authentication passes; each processing module is in a fault state, the life cycle judging unit of the toy determines that the life cycle state of the electronic toy is a repair state, and the starting condition of the test control module corresponding to the repair state is that the electronic toy is directly started without key information authentication;
or when each processing module is in a non-fault state, the life cycle judging unit of the toy determines that the life cycle state of the electronic toy is a use state, and the starting condition of the test control module corresponding to the use state is that key information authentication passes; at least one processing module is in a fault state, the life cycle judging unit of the toy determines that the life cycle state of the electronic toy is a repair state, and the starting condition of the test control module corresponding to the repair state is that the electronic toy is directly started without key information authentication.
In some embodiments, the control circuit further includes a key information storage unit for storing key information, the key information being determined according to setting information input by a user; when the life cycle state of the electronic toy is in a use state, the toy life cycle judging unit is used for receiving authentication information input by a user and judging whether the authentication information is matched with the authentication information acquired from the key information storage unit, and if so, the test control module is started.
In some embodiments, the control circuit further comprises a life cycle state adjustment unit that adjusts the life cycle state of the electronic toy from the reworked state to the in-use state when a replacement determination instruction for each processing module in the failed state is detected.
In a second aspect, the present invention also provides a control method for an electronic toy, which is applicable to the control circuit for an electronic toy according to the first aspect; the method comprises the following steps:
the state type configuration module configures the state types of more than three processing modules, wherein the state types comprise any one of a calculation type, a backup type and a test type, and the state types of different processing modules are different at the same time;
The task allocation module receives a task processing instruction, and sends data to be processed to the processing unit according to the task processing instruction so as to enable more than three processing modules in the processing unit to process the data to be processed in parallel; the method comprises the steps that a processing module currently in a computing type performs first computation on data to be processed to obtain a first computing result, a processing module currently in a backup type performs second computation on the data to be processed to obtain a second computing result, and a processing module currently in a testing type performs third computation on the data to be processed to obtain a third computing result;
the verification module judges whether the first calculation result is consistent with the second calculation result, if not, a first control signal is sent to the alarm module, so that the alarm module sends out first prompt information; and the verification module judges whether the test passes or not according to the third calculation result, and if not, the verification module sends a second control signal to the alarm module so that the alarm module sends out second prompt information.
In a third aspect, the present invention provides an electronic toy comprising a housing and a control circuit disposed within the housing, the control circuit being the control circuit for the electronic toy described in the first aspect.
Compared with the prior art, the technical scheme is characterized in that at least three processing modules are additionally arranged, three state types are arranged in the processing modules, so that the three processing modules can be switched in three states, when the three processing modules can be used normally, one processing module is in a calculation type, one processing module is in a backup type, and one processing module is in a test type, therefore, the three processing modules are not in an empty state during use, and the waste of hardware is avoided; meanwhile, every processing module can realize functional self-detection and backup function at least by matching with another processing module at regular intervals, so that the processing modules are ensured to be in a normal interaction state, the processing mode of the electronic toy is further optimized, and the use experience of a user is improved.
The foregoing summary is merely an overview of the present application, and is provided to enable one of ordinary skill in the art to make more clear the present application and to be practiced according to the teachings of the present application and to make more readily understood the above-described and other objects, features and advantages of the present application, as well as by reference to the following detailed description and accompanying drawings.
Drawings
The drawings are only for purposes of illustrating the principles, implementations, applications, features, and effects of the present invention and are not to be construed as limiting the application.
In the drawings of the specification:
fig. 1 is a schematic diagram of a control circuit of an electronic toy according to a first exemplary embodiment;
fig. 2 is a timing cycle chart of an electronic toy according to a second exemplary embodiment;
fig. 3 is a timing cycle chart of an electronic toy according to a third exemplary embodiment;
fig. 4 is a timing cycle chart of an electronic toy according to a fourth exemplary embodiment;
fig. 5 is a schematic diagram of a toy life cycle judging circuit of the electronic toy according to the fifth exemplary embodiment;
fig. 6 is a schematic diagram showing steps of a control method of the electronic toy according to the sixth exemplary embodiment.
Reference numerals referred to in the above drawings are explained as follows:
1. a processing module;
11. a first processing module;
12. a second processing module;
13. a third processing module;
2. a task allocation module;
3. a state type configuration module;
31. calculating a type;
32. a backup type;
33. a test type;
4. a verification module;
5. an alarm module;
601. a life cycle judging unit;
602. A microphone;
603. detecting voice;
605. a fixed storage unit;
606. a key information storage unit;
607. a reading unit;
608. a comparison unit;
610. a functional test controller;
611. storing the test controller;
612. other test mode controllers;
7. an electronic toy;
8. and a test control module.
Detailed Description
In order to describe the possible application scenarios, technical principles, practical embodiments, and the like of the present application in detail, the following description is made with reference to the specific embodiments and the accompanying drawings. The embodiments described herein are only used to more clearly illustrate the technical solutions of the present application, and are therefore only used as examples and are not intended to limit the scope of protection of the present application.
Reference herein to "an embodiment" means that a particular feature, structure, or characteristic described in connection with the embodiment may be included in at least one embodiment of the present application. The appearances of the phrase "in various places in the specification are not necessarily all referring to the same embodiment, nor are they particularly limited to independence or relevance from other embodiments. In principle, in the present application, as long as there is no technical contradiction or conflict, the technical features mentioned in the embodiments may be combined in any manner to form a corresponding implementable technical solution.
Unless defined otherwise, technical terms used herein have the same meaning as commonly understood by one of ordinary skill in the art to which the present application pertains; the use of related terms herein is for the description of specific embodiments only and is not intended to limit the present application.
In the description of the present application, the term "and/or" is a representation for describing a logical relationship between objects, which means that there may be three relationships, e.g., a and/or B, representing: there are three cases, a, B, and both a and B. In addition, the character "/" herein generally indicates that the front-to-back associated object is an "or" logical relationship.
In this application, terms such as "first" and "second" are used merely to distinguish one entity or operation from another entity or operation, and do not necessarily require or imply any actual number, order, or sequence of such entities or operations.
Without further limitation, the use of the terms "comprising," "including," "having," or other like open-ended terms in this application are intended to cover a non-exclusive inclusion, such that a process, method, or article of manufacture that comprises a list of elements does not include additional elements in the process, method, or article of manufacture, but may include other elements not expressly listed or inherent to such process, method, or article of manufacture.
As in the understanding of the "examination guideline," the expressions "greater than", "less than", "exceeding", and the like are understood to exclude the present number in this application; the expressions "above", "below", "within" and the like are understood to include this number. Furthermore, in the description of the embodiments of the present application, the meaning of "a plurality of" is two or more (including two), and similarly, the expression "a plurality of" is also to be understood as such, for example, "a plurality of groups", "a plurality of" and the like, unless specifically defined otherwise.
Referring to fig. 1, in a first aspect, the present invention provides a control circuit for an electronic toy, comprising a processing unit and a test control module 8; the processing unit comprises more than three processing modules 1; the test control module 8 comprises a state type configuration module 3, a task allocation module 2 and a verification module 4, wherein the state type configuration module 3 is used for configuring the state types of more than three processing modules 1, the state types comprise any one of a calculation type 31, a backup type 32 and a test type 33, and the state types of different processing modules 1 at the same time are different; the task allocation module 2 is used for receiving task processing instructions, and sending data to be processed to the processing unit according to the task processing instructions so as to enable more than three processing modules 1 in the processing unit to process the data to be processed in parallel; the method comprises the steps that a first calculation is conducted on data to be processed by a processing module 1 currently in a calculation type 31 to obtain a first calculation result, a second calculation is conducted on the data to be processed by the processing module 1 currently in a backup type 32 to obtain a second calculation result, and a third calculation is conducted on the data to be processed by the processing module 1 currently in a test type 33 to obtain a third calculation result; the checking module 4 is configured to determine whether the first calculation result is consistent with the second calculation result, and if not, send a first control signal to the alarm module 5, so that the alarm module 5 sends out a first prompt message; the verification module 4 is further configured to determine whether the test passes according to the third calculation result, and if not, send a second control signal to the alarm module 5, so that the alarm module 5 sends out a second prompt message.
When three or more processing modules can be used normally, the state type configuration module 3 is configured to configure the state types of the three or more processing modules 1, where the state types include any one of a calculation type 31, a backup type 32, and a test type 33, and the state types of different processing modules 1 are different at the same time. The first calculation is to execute the corresponding operation steps in the task processing instruction, and the second calculation is to execute the same operation as the calculation type 31, but the obtained calculation result is only stored in the corresponding storage unit in the electronic toy 7 and is not fed back to the user as the processing result of the task processing instruction. And then the verification module 4 compares the first calculation result with the second calculation result, judges the normal working state of the current processing module according to the comparison result of the first calculation result and the second calculation result, and if the comparison result and the comparison result are inconsistent, at least one processing module 1 in the comparison result and the comparison result indicate that the calculation is wrong, so that a first control signal can be sent to the alarm module 5, and the alarm module 5 sends out first prompt information.
The third calculation is to verify the working state of each component in the processing module 1 and detect whether the working state is normal or not when the corresponding operation step in the task processing instruction is executed. The third calculation may specifically include the steps of: the method comprises the steps of data storage, logic test, storage test and data recovery, wherein the data storage is used for storing data to be processed, the logic test is carried out on the data to be processed, in the process of processing the data to be processed, the data storage step is also used for storing instructions corresponding to each logic step, the processed data are stored in corresponding storage units, the storage test is used for verifying whether the storage path of the data is correct, and the data recovery specifically comprises the recovery of setting parameters and logic conditions in a processing unit in a previous test stage. If the data saving, the logic testing, the storage testing and the data recovering can be sequentially and normally executed, the test of the processing module 1 currently in the test type 33 is passed, otherwise, the alarm module 5 can send out prompt information.
The processing module 1 is used for processing the received data to be processed, the task allocation module 2 is used for receiving task processing instructions, and sending the data to be processed contained in the task processing instructions to the processing unit according to the task processing instructions, so that more than three processing modules 1 in the processing unit process the data to be processed in parallel; the task processing instruction is an instruction issued by a user, and the task processing instruction can be issued in the form of voice input, key input, and the like.
For example, upon receiving a voice instruction: when playing the baby song, the task allocation module 2 recognizes the instruction of playing the baby song, converts the content contained in the instruction into data to be processed, and sends the data to more than three processing modules 1, the three processing modules 1 perform first calculation on the data to be processed in different processing modes of the data to be processed under different state types, and the first calculation result is: playing the pergola in the pergola category; the processing module 1 in the backup type 32 performs a second calculation on the data to be processed, and the obtained second calculation result is: obtaining a baby song in the category of the baby song, and storing the execution result in a storage unit for verification by a verification unit; the processing module 1 in the test type 33 performs a third calculation on the data to be processed, detects whether or not the respective components of the processing module 1 are operating normally during the execution of the data to be processed, and outputs a result of the third calculation.
The checking module 4 is used for checking whether more than three processing modules 1 are in a normal working state, wherein the checking module 4 compares a first calculation result with a second calculation result of the processing module 1 in a calculation type 31 with the processing module 1 in a backup type 32 to judge whether the two processing modules 1 are in the normal working state, and if the two processing modules are not in the normal working state, a first control signal is sent to prompt an abnormality of one of the two processing modules 1; judging whether the test is passed or not for the processing module 1 in the test type 33 according to a third calculation result, wherein the third calculation result refers to the test result of the processing module 1 in the test type 33, optionally, the third calculation result comprises two results of normal test and abnormal test, if the test is normal, the test of the processing module 1 is passed, if the test is abnormal, the test of the processing module 1 is not passed, and the second control signal is used for prompting that the processing module 1 has failed.
When the first calculation result obtained by the processing module 1 in the calculation type 31 and the first calculation result obtained by the processing module 1 in the backup type 32 are inconsistent with the second calculation result, the first control signal sent by the verification module 4 is used for enabling the alarm module 5 to send out first prompt information, and the first prompt information is used for prompting a user that an abnormal state exists; meanwhile, after the first control signal is sent out, the verification module 4 is further configured to send out a verification test instruction, where the verification test instruction includes two types, the first type is a verification test instruction generated by simulating a task processing instruction, and the simulation task processing instruction is sent to the processing module 1 in the test type 33 and the processing module 1 in the backup type 32 again, the verification module 4 stores in advance a calculation result corresponding to the simulation task processing instruction, after receiving the corresponding first calculation result and the second calculation result, it is determined whether the first calculation result and the second calculation result are consistent with the calculation result stored in the verification module 4 in advance, if they are consistent, it is determined that the two processing modules 1 are in a normal working state, if they are inconsistent, it is determined that the processing module 1 with an incorrect calculation result is in an abnormal state, and a third control signal is sent to the alarm module 5, so that the alarm module 5 sends out third prompt information, where the third prompt information may be prompt for repairing or prompting the abnormal state. Optionally, the third control signal may also be used to switch the state of the processing module 1 in the abnormal state to the fault state, so as to avoid that the processing module 1 is still in the working state, thereby affecting the use experience of the user.
Checking the second type of the test instruction as a state switching instruction, switching the state types of the processing module 1 in the calculation type 31 and the processing module 1 in the backup type 32 to the test type 33, and sending the previous task processing instruction to the two processing modules 1 again as the test instruction, waiting for the third calculation results of the two processing modules 1, and switching the state types of the two processing modules 1 to the state types corresponding to the original state types again if the third calculation results of the two processing modules 1 are normal. Optionally, if the third calculation result of one of the processing modules 1 is a test abnormality, switching the state type of the processing module 1 to a fault state, and sending a fourth control signal for prompting that all the processing modules 1 have failed and need maintenance; the fourth control signal is also used to switch the status type of the other test normal processing module 1 to the calculation type.
In some preferred embodiments, when the state type of the verification module 4 is switched to the fault state for a certain processing module 1, the state type configuration module 3 adjusts the working states of the remaining processing modules 1 while the verification module 4 switches the state type, so as to ensure that at least one processing module 1 is in the calculation type 31, so that the processing module 1 can be used for executing the data to be processed, and ensure the use experience of the user.
By adding at least three processing modules 1 and arranging three state types in the processing modules 1, the three processing modules 1 can be switched in three states, when the three processing modules 1 can be used normally, one of the processing modules 1 is in a calculation type 31, one of the processing modules 1 is in a backup type 32, and one of the processing modules 1 is in a test type 33, so that the three processing modules 1 are not in an empty state during use, and the waste of hardware is avoided; meanwhile, every certain period, each processing module 1 can realize functional self-detection and at least realize a backup function in cooperation with another processing module 1, so that the processing modules 1 are in a normal interaction state, the processing mode of the electronic toy 7 is further optimized, and the use experience of a user is improved.
In some embodiments, the operation speed of the processing module 1 in the backup type 32 is slightly lower than the operation speed of the processing module 1 in the calculation type 31, so as to avoid occupying the processing time of the operation components of the processing module 1 in the calculation type 31, specifically including the response sequence of the voice unit, the playing unit, the electronic database, and the like, and prolong the operation speed of the processing module 1 in the calculation type 31, which causes delay in response of the electronic toy 7 to the user command and damages the user experience.
Referring to fig. 2, in some embodiments, the state type configuration module 3 is configured to configure the state types of more than three processing modules 1 according to a time sequence period, where the configured state type of a certain processing module 1 is different from the configured state type of the processing module 1 in the previous time sequence period and/or the next time sequence period.
In this embodiment, the timing period is added, and the state type configuration module 3 configures the state types of three or more processing modules 1 according to the timing period, which can be specifically understood with reference to fig. 2: when one of the processing modules 1 is placed in the calculation type 31, there must be one processing module 1 placed in the backup type 32 and one processing module 1 placed in the test type 33; at the next timing cycle, the processing module 1 in the calculation type 31 at the previous timing cycle may be placed in the backup type 32 or the test type 33, and so on. In the process of a plurality of time sequence periods, one processing module 1 is necessary to undergo a plurality of state type switching to complete the cycle of calculating, backing up and testing three state types, so that each processing module 1 can realize regular functional testing, and the abnormal function of the processing module 1 can be found in time.
By enabling the three processing modules 1 to be circularly switched in three states in a plurality of periods, when the three processing modules can be normally used, at least one processing module 1 is in a calculation type 31, at least one processing module 1 is in a backup type 32 and at least one processing module 1 is in a test type 33 in each period, the three processing modules 1 are not in an empty state during use, and the waste of hardware is avoided; meanwhile, the function self-detection and the backup function of each processing module 1 can be realized by matching with at least another processing module 1, so that the processing modules 1 are in a normal interaction state, the processing mode of the electronic toy 7 is further optimized, and the use experience of a user is improved.
Referring to fig. 3, in some embodiments, the processing unit includes a first processing module 11, a second processing module 12, and a third processing module 13; the control circuit further comprises a fault processing unit, the fault processing unit is used for marking the first processing module 11 as a fault state when the test of the first processing module 11 fails, and sending a first state type adjustment instruction to the state type configuration module 3, and the state type configuration module 3 is further used for only configuring the state types of the second processing module 12 and the third processing module 13 according to the first state type adjustment instruction; the status type of the second processing module 12 includes a calculation type 31 and the status type of the third processing module 13 includes a test type 33; alternatively, the status type of the second processing module 12 includes the test type 33 and the status type of the third processing module 13 includes the calculation type 31.
In this embodiment, when the failure processing unit receives that the test of the first processing module 11 fails, the failure processing unit marks the first processing module 11 as a failure state, and simultaneously sends a first state type adjustment instruction to the state type configuration module 3, and the state type configuration module 3 performs state adjustment on the remaining second processing module 12 and third processing module 13, so as to ensure that at least one processing module 1 is in the calculation type 31, so that the processing module 1 can be used for executing data to be processed, and ensure the use experience of a user. In this embodiment, if the remaining two processing modules 1 are in a normal working state, the state type configuration module 3 places the second processing module 12 in the calculation type 31, places the third processing module 13 in the test type 33, eliminates the state type of the backup type 32, and retains the test type 33 for retaining the self-test function of the remaining two processing modules 1; alternatively, the second processing module 12 is placed in test type 33 and the third processing module 13 is placed in calculation type 31. As a preferred embodiment, in the next time period, the status type of the second processing module 12 and the status type of the third processing module 13 are switched, so that it is ensured that both the second processing module 12 and the third processing module 13 can be in a test type periodically, so that faults of the remaining two processing modules 1 can be found in time and alarm is given.
Through carrying out the state switching to damaged first processing module 11, can ensure that damaged first processing module 11 can not place in calculation type 31, carry out the state adjustment to remaining two processing modules 1 (i.e. second processing module 12 and third processing module 13) simultaneously, avoid appearing the condition that electronic toy 7 can't carry out corresponding instruction when the user uses, promote user experience and feel. Meanwhile, the test type and the calculation type 31 of the remaining two processing modules 1 are periodically switched, so that the damage condition of the processing modules 1 can be found out in time, and the electronic toy 7 can be repaired in a field returning manner in time.
Referring to fig. 4, in some embodiments, after the first processing module 11 has been marked as a fault state, the fault processing unit is further configured to mark the second processing module 12 as a fault state when the test of the second processing module 12 fails, and send a second state type adjustment instruction to the state type configuration module 3, where the state type configuration module 3 is further configured to configure only the state type of the third processing module 13 according to the second state type adjustment instruction, and to cause the third processing module 13 to be alternately in the calculation type 31 or the test type 33 according to the time sequence period. By switching the state of the damaged second processing module 12, it can be ensured that the damaged second processing module 12 is not placed in the calculation type 31, and at the same time, the state of the remaining third processing module 13 is adjusted, in this embodiment, in order to ensure that the fault problem of the third processing module 13 is found in time, the third processing module 13 is configured to circulate alternately in the calculation type 31 and the test type 33, so that the user can perform the return-to-field maintenance on the electronic toy 7 in time when the third processing module 13 is damaged.
In some embodiments, the control circuit further includes a toy life cycle determining unit 601, where the toy life cycle determining unit 601 is configured to determine a life cycle state in which the electronic toy 7 is located according to whether each processing module 1 is in a fault state, determine an on condition of the test control module 8 according to the life cycle state in which the electronic toy 7 is located, and enable the test control module 8 when the on condition is satisfied, and otherwise disable the test control module 8.
The toy life cycle judging unit 601 is configured to judge a life cycle state of the toy, where the life cycle state indicates a state in which the toy is currently located, for example, when the toy is in a normal use state, the life cycle state may be "normal use", when the toy is in a first processing module 11 failure, but the second processing module 12 and the third processing module 13 are normal, the life cycle state may be set to "first failure state", and so on, when the first processing module 11 and the second processing module 12 are both failed, and the third processing module 13 is normal, the life cycle state may be set to "second failure state"; when all three processing modules 1 are in a fault state, the lifecycle state may be set to a "complete fault state" or a "repair needed" state. For different life cycle states, the starting conditions of the test control module 8 are different, the test control module 8 is started when the starting conditions are met, otherwise, the test control module 8 is not started. For example, in a "complete fault state," the test control module 8 is in a default on state without an on condition, facilitating maintenance by maintenance personnel.
The test control module 8 is used for performing component tests on each processing module 1 in the electronic toy 7, including functional tests, storage tests and the like on each component, and can further overhaul and troubleshoot the processing module 1, so that the repairing operation is facilitated.
By adding the judgment index of the life cycle state, the safety of the data in the processing module 1 is ensured, and the test control module 8 can be started only under the condition that the specific condition is met, so that the leakage risk of the data in the processing module 1 is reduced.
In some embodiments, the lifecycle states in which the electronic toy 7 is placed include a use state or a rework state; when at least one processing module 1 is in a non-fault state, the toy life cycle judging unit 601 determines that the life cycle state of the electronic toy 7 is a use state, and the starting condition of the test control module 8 corresponding to the use state is that key information authentication passes; each processing module 1 is in a fault state, the life cycle judging unit 601 of the toy determines that the life cycle state of the electronic toy 7 is a repairing state, and the starting condition of the test control module 8 corresponding to the repairing state is that the electronic toy is directly started without key information authentication;
Or when each processing module 1 is in a non-fault state, the toy life cycle judging unit 601 determines that the life cycle state of the electronic toy 7 is a use state, and the starting condition of the test control module 8 corresponding to the use state is that the key information authentication passes; at least one processing module 1 is in a fault state, the toy life cycle judging unit 601 determines that the life cycle state of the electronic toy 7 is a repair state, and the starting condition of the test control module 8 corresponding to the repair state is that the electronic toy is directly started without key information authentication.
The key information is key information input by a user when the toy is initialized, and can be voice information, for example: "power-on initialization" or a personal naming method of the electronic toy 7 by a user, and after the electronic toy 7 completes initialization, the life cycle state is automatically cut into a use state. When three processing modules 1 are in a non-fault state, the toy life cycle judging unit 601 determines that the life cycle state of the electronic toy 7 is a use state, and the starting condition of the test control module 8 corresponding to the use state is that key information authentication passes; this key information authentication means that the test control module 8 can be turned on only after the user inputs voice information, and can be reworked by an engineer. When each processing module 1 is in a fault state, the toy life cycle judging unit 601 determines that the life cycle state of the electronic toy 7 is a repairing state, and the starting condition of the test control module 8 corresponding to the repairing state is that key information authentication is not needed to be directly started, when all three processing modules 1 are in the fault state, the whole electronic toy 7 cannot execute a voice instruction of a user, and the whole control circuit is in a stagnation state, so that key information cannot be verified. Meanwhile, after the processing module 1 in the electronic toy 7 fails, the user sends the processing module back to the original factory for repair, and the key information cannot be provided in real time for verification. In order to facilitate the engineer to repair the electronic toy 7, the test control module 8 can be started without authentication key information when the life cycle state of the test control module 8 is a repair state.
In other embodiments, only when the three processing modules 1 are in the normal working state, the toy life cycle judging unit 601 determines that the life cycle state of the electronic toy 7 is the use state, and the starting condition of the test control module 8 corresponding to the use state is that the key information authentication passes. When one processing module 1 is in a fault state, the toy life cycle judging unit 601 determines that the life cycle state of the electronic toy 7 is in a repairing state, and a user can send one of the processing modules 1 of the electronic toy 7 back to the original factory for repairing when the processing module 1 is in the fault state, so that key information authentication starting operation is not needed, and an engineer can repair the electronic toy 7 conveniently.
In some embodiments, the control circuit further includes a key information storage unit 606, where the key information storage unit 606 is configured to store key information, and the key information is determined according to setting information input by a user; when the life cycle state of the electronic toy 7 is in the use state, the toy life cycle judging unit 601 is configured to receive authentication information input by a user, judge whether the authentication information matches the authentication information acquired from the key information storage unit 606, and if yes, enable the test control module 8.
The key information storage unit 606 is configured to store key information, where the key information is determined according to setting information input by a user, and the setting information input by the user may be voice information, or may be a password combination input by a key, and preferably, voice information is used as the setting information input by the user. The key information is stored in the key information storage unit 606, and when the life cycle state of the electronic toy 7 is in the use state, the toy life cycle judging unit 601 is configured to receive authentication information input by a user, judge whether the authentication information is matched with the authentication information acquired by the key information storage unit 606, if yes, enable the test control module 8, and if not, not enable the test control module 8.
The key information of the user is used as the permission judgment standard for starting the test control module 8, so that leakage of electronic data of suppliers after the electronic toy 7 is damaged is avoided, the data safety is protected, and the repair safety of the electronic toy 7 is improved.
In some embodiments, the control circuit further comprises a lifecycle state adjustment unit that adjusts the lifecycle state of the electronic toy 7 from a reworked state to a used state when a replacement determination instruction for each processing module 1 in a faulty state is detected. The life cycle state adjusting unit is used for adjusting the life cycle state of the electronic toy 7 after the repair is finished, so that the initialization flow of the electronic toy 7 after the repair is convenient. As a preferred embodiment, the lifecycle state adjusting unit is further configured to reset the key information in the lifecycle state adjusted to the usage state after the repair is finished, so that the user can re-input the key information for authentication. Therefore, the recycling rate of the electronic toy 7 after repairing can be improved, namely the electronic toy 7 can still be used after a user is replaced, and the electronic toy 7 is prevented from being wasted due to the fact that an original user does not start the electronic toy 7 any more.
Please refer to fig. 5, which illustrates an embodiment of the above technical solution: the microphone 602 is used to collect setting information input by a user at the time of initialization of the electronic toy 7, and store the setting information input by the user in the key information storage unit 606 and the fixed storage unit 605. When the user re-shouts the setting information input by the user (may be the name of the electronic toy 7), the microphone 602 sends the collected voice information to the voice detection 603 unit, the voice detection 603 unit detects the voice information and sends it to the comparison unit 608, meanwhile, the reading unit 607 reads the setting information input by the user in the fixed storage unit 605 and sends it to the comparison unit 608, the comparison unit 608 compares the voice information with the setting information input by the user in the fixed storage unit 605, and if the two are consistent, the electronic toy 7 sends response voice information, for example: "at? ", thereby completing one interaction between the user and the electronic toy 7.
Under the life cycle judging module, the reading unit 607 will first read the state of the current life cycle stored in the fixed storage unit 605 and send the state to the life cycle judging unit 601; the life cycle judging unit 601 judges whether the current life cycle state is a use state or a repair state, if the current life cycle state is the use state, when an engineer needs to start the test control module 8, a prompt is sent to prompt that key information of a user needs to be input, the user inputs the key information through the microphone 602, the voice detecting unit 603 detects the content of the current key information, and the content of the key information is sent to the comparing unit 608; the reading unit 607 reads the setting information input by the user and stored in the key information storage unit 606, and sends the setting information to the comparing unit 608 to output the comparison result after the comparison is completed, if the key information is consistent, the consistent result is sent to the life cycle judging unit 601, the life cycle judging unit 601 controls the test control module 8 to be turned on, and the engineer starts the functional test controller 610, the storage test controller 611, the other test mode controller 612 and the like to test the electronic toy 7. If the comparison result output by the comparison unit 608 is that the key information is inconsistent, an alarm signal is output to the alarm module 5, so that the alarm module 5 alarms or gives an error prompt.
By adding the judgment index of the life cycle state, the safety of the data in the processing module 1 is ensured, and the test control module 8 can be started only under the condition that the specific condition is met, so that the leakage risk of the data in the processing module 1 is reduced.
Referring to fig. 6, in a second aspect, the present invention further provides a control method for an electronic toy, which is applicable to the control circuit for an electronic toy according to the first aspect; the method comprises the following steps:
s1, a state type configuration module configures state types of more than three processing modules, wherein the state types comprise any one of a calculation type, a backup type and a test type, and the state types of different processing modules are different at the same time;
s2, the task distribution module receives a task processing instruction, and sends data to be processed to the processing unit according to the task processing instruction, so that more than three processing modules in the processing unit process the data to be processed in parallel; the method comprises the steps that a processing module currently in a computing type performs first computation on data to be processed to obtain a first computing result, a processing module currently in a backup type performs second computation on the data to be processed to obtain a second computing result, and a processing module currently in a testing type performs third computation on the data to be processed to obtain a third computing result;
S3, the checking module judges whether the first calculation result is consistent with the second calculation result, if not, a first control signal is sent to the alarm unit, so that the alarm unit sends out first prompt information; and the verification module judges whether the test passes or not according to the third calculation result, and if not, the verification module sends a second control signal to the alarm unit so that the alarm unit sends out second prompt information.
When three or more processing modules can be used normally, the state type configuration module 3 is configured to configure the state types of the three or more processing modules 1, where the state types include any one of a calculation type 31, a backup type 32, and a test type 33, and the state types of different processing modules 1 are different at the same time. The first calculation is to execute the corresponding operation steps in the task processing instruction, and the second calculation is to execute the same operation as the calculation type 31, but the obtained calculation result is only stored in the corresponding storage unit in the electronic toy 7 and is not fed back to the user as the processing result of the task processing instruction. And then the verification module 4 compares the first calculation result with the second calculation result, judges the normal working state of the current processing module according to the comparison result of the first calculation result and the second calculation result, and if the comparison result and the comparison result are inconsistent, at least one processing module 1 in the comparison result and the comparison result indicate that the calculation is wrong, so that a first control signal can be sent to the alarm module 5, and the alarm module 5 sends out first prompt information.
The third calculation is to verify the working state of each component in the processing module 1 and detect whether the working state is normal or not when the corresponding operation step in the task processing instruction is executed. The third calculation may specifically include the steps of: the method comprises the steps of data storage, logic test, storage test and data recovery, wherein the data storage is used for storing data to be processed, the logic test is carried out on the data to be processed, in the process of processing the data to be processed, the data storage step is also used for storing instructions corresponding to each logic step, the processed data are stored in corresponding storage units, the storage test is used for verifying whether the storage path of the data is correct, and the data recovery specifically comprises the recovery of setting parameters and logic conditions in a processing unit in a previous test stage. If the data saving, the logic testing, the storage testing and the data recovering can be sequentially and normally executed, the test of the processing module 1 currently in the test type 33 is passed, otherwise, the alarm module 5 can send out prompt information.
The processing module 1 is used for processing the received data to be processed, the task allocation module 2 is used for receiving task processing instructions, and sending the data to be processed contained in the task processing instructions to the processing unit according to the task processing instructions, so that more than three processing modules 1 in the processing unit process the data to be processed in parallel; the task processing instruction is an instruction issued by a user, and the task processing instruction can be issued in the form of voice input, key input, and the like.
For example, upon receiving a voice instruction: when playing the baby song, the task allocation module 2 recognizes the instruction of playing the baby song, converts the content contained in the instruction into data to be processed, and sends the data to more than three processing modules 1, the three processing modules 1 perform first calculation on the data to be processed in different processing modes of the data to be processed under different state types, and the first calculation result is: playing the pergola in the pergola category; the processing module 1 in the backup type 32 performs a second calculation on the data to be processed, and the obtained second calculation result is: playing the baby songs in the category of the baby songs, and storing the execution result in a storage unit for verification by a verification unit; the processing module 1 in the test type 33 performs a third calculation on the data to be processed, detects whether or not the respective components of the processing module 1 are operating normally during the execution of the data to be processed, and outputs a result of the third calculation.
The checking module 4 is used for checking whether more than three processing modules 1 are in a normal working state, wherein the checking module 4 compares a first calculation result with a second calculation result of the processing module 1 in a calculation type 31 with the processing module 1 in a backup type 32 to judge whether the two processing modules 1 are in the normal working state, and if the two processing modules are not in the normal working state, a first control signal is sent to prompt an abnormality of one of the two processing modules 1; judging whether the test is passed or not for the processing module 1 in the test type 33 according to a third calculation result, wherein the third calculation result refers to the test result of the processing module 1 in the test type 33, optionally, the third calculation result comprises two results of normal test and abnormal test, if the test is normal, the test of the processing module 1 is passed, if the test is abnormal, the test of the processing module 1 is not passed, and the second control signal is used for prompting that the processing module 1 has failed.
When the first calculation result obtained by the processing module 1 in the calculation type 31 and the first calculation result obtained by the processing module 1 in the backup type 32 are inconsistent with the second calculation result, the first control signal sent by the verification module 4 is used for enabling the alarm module 5 to send out first prompt information, and the first prompt information is used for prompting a user that an abnormal state exists; meanwhile, after the first control signal is sent out, the verification module 4 is further configured to send out a verification test instruction, where the verification test instruction includes two types, the first type is a verification test instruction generated by simulating a task processing instruction, and the simulation task processing instruction is sent to the processing module 1 in the test type 33 and the processing module 1 in the backup type 32 again, the verification module 4 stores in advance a calculation result corresponding to the simulation task processing instruction, after receiving the corresponding first calculation result and the second calculation result, it is determined whether the first calculation result and the second calculation result are consistent with the calculation result stored in the verification module 4 in advance, if they are consistent, it is determined that the two processing modules 1 are in a normal working state, if they are inconsistent, it is determined that the processing module 1 with an incorrect calculation result is in an abnormal state, and a third control signal is sent to the alarm module 5, so that the alarm module 5 sends out third prompt information, where the third prompt information may be prompt for repairing or prompting the abnormal state. Optionally, the third control signal may also be used to switch the state of the processing module 1 in the abnormal state to the fault state, so as to avoid that the processing module 1 is still in the working state, thereby affecting the use experience of the user.
Checking the second type of the test instruction as a state switching instruction, switching the state types of the processing module 1 in the calculation type 31 and the processing module 1 in the backup type 32 to the test type 33, and sending the previous task processing instruction to the two processing modules 1 again as the test instruction, waiting for the third calculation results of the two processing modules 1, and switching the state types of the two processing modules 1 to the state types corresponding to the original state types again if the third calculation results of the two processing modules 1 are normal. Optionally, if the third calculation result of one of the processing modules 1 is a test abnormality, switching the state type of the processing module 1 to a fault state, and sending a fourth control signal for prompting that all the processing modules 1 have failed and need maintenance; the fourth control signal is also used to switch the status type of the other test normal processing module 1 to the calculation type.
In some preferred embodiments, when the state type of the verification module 4 is switched to the fault state for a certain processing module 1, the state type configuration module 3 adjusts the working states of the remaining processing modules 1 while the verification module 4 switches the state type, so as to ensure that at least one processing module 1 is in the calculation type 31, so that the processing module 1 can be used for executing the data to be processed, and ensure the use experience of the user.
By adding at least three processing modules 1 and arranging three state types in the processing modules 1, the three processing modules 1 can be switched in three states, when the three processing modules 1 can be used normally, one of the processing modules 1 is in a calculation type 31, one of the processing modules 1 is in a backup type 32, and one of the processing modules 1 is in a test type 33, so that the three processing modules 1 are not in an empty state during use, and the waste of hardware is avoided; meanwhile, every certain period, each processing module 1 can realize functional self-detection and at least realize a backup function in cooperation with another processing module 1, so that the processing modules 1 are in a normal interaction state, the processing mode of the electronic toy 7 is further optimized, and the use experience of a user is improved.
In some embodiments, the test control module further includes an operating frequency control unit, where the operating frequency control unit is configured to generate an operating clock frequency of each current processing module, and preferably, the operating frequency control unit has a plurality of operating frequency steps of the processing module built therein, when a certain processing module is marked as a fault state, the operating frequency of the processing module is reduced by one step and then a round of testing is performed, if a new round of testing passes, it indicates that the processing module is degraded by aging, but the processing module is still usable, and when the processing module is used subsequently to process tasks (such as the first calculation, the second calculation or the third calculation), the operating frequency of the processing module is set to the operating frequency after the reduction adjustment, so that when the processing module is marked as the fault state for the first time, the service life of the processing module is prolonged by a frequency reduction manner. If the test function of a certain processing module still fails after the first-gear operating frequency is lowered, continuing to lower the first-gear operating frequency and then testing, if the test result of the processing module is still wrong after the lowest-gear operating frequency is lowered, indicating that the processing module is physically damaged, and marking the processing module as a damaged fault state (namely, the damaged processing module does not participate in the configuration of the state type any more when the state type is configured later).
In some embodiments, the test control module further includes a Wifi connection unit, where the Wifi connection unit is configured to report, when a fault state of the processing module marked as damaged occurs, identification information (such as a number) of the damaged processing module and a clock frequency gear operated by the processing module when an error occurs, to a cloud server through a wireless Wifi network, so that a toy manufacturer can collect error types and corresponding quantity information of the electronic toy in time, and it is convenient to improve and maintain subsequent products. In a third aspect, the present invention provides an electronic toy 7 comprising a housing and a control circuit disposed within the housing, the control circuit being the control circuit for the electronic toy 7 described in the first aspect. By arranging the control circuit according to the first aspect in the electronic toy 7, the time self-checking function of the electronic toy 7 can be realized, meanwhile, at least three processing modules 1 are additionally arranged, and three state types are arranged in the processing modules 1, so that the three processing modules 1 can be switched in three states, one processing module 1 is necessarily in a calculation type 31, one processing module 1 is necessarily in a backup type 32, one processing module 1 is necessarily in a test type 33, and the three processing modules 1 are not in an empty state during use, thereby avoiding the waste of hardware; meanwhile, the function self-detection and the backup function of each processing module 1 can be realized by matching with at least another processing module 1, so that the processing modules 1 are in a normal interaction state, the processing mode of the electronic toy 7 is further optimized, and the use experience of a user is improved.
According to the technical scheme, at least three processing modules 1 are additionally arranged, three state types are arranged in the processing modules 1, so that the three processing modules 1 can be switched in three states, when the three processing modules are in normal working states, one processing module 1 is in a calculation type 31, one processing module 1 is in a backup type 32, one processing module 1 is in a test type 33, and the three processing modules 1 are not in an empty state during use, so that the waste of hardware is avoided; meanwhile, every certain period, each processing module 1 can realize functional self-detection and at least realize a backup function in cooperation with another processing module 1, so that the processing modules 1 are in a normal interaction state, the processing mode of the electronic toy 7 is further optimized, and the use experience of a user is improved.
Finally, it should be noted that, although the foregoing embodiments have been described in the text and the accompanying drawings of the present application, the scope of the patent protection of the present application is not limited thereby. All technical schemes generated by replacing or modifying equivalent structures or equivalent flows based on the essential idea of the application and by utilizing the contents recorded in the text and the drawings of the application, and the technical schemes of the embodiments are directly or indirectly implemented in other related technical fields, and the like, are included in the patent protection scope of the application.

Claims (10)

1. A control circuit for an electronic toy, comprising:
the processing unit comprises more than three processing modules;
a test control module, the test control module comprising:
the state type configuration module is used for configuring the state types of the more than three processing modules, wherein the state types comprise any one of a calculation type, a backup type and a test type, and the state types of different processing modules at the same time are different;
the task allocation module is used for receiving a task processing instruction, and sending data to be processed to the processing unit according to the task processing instruction so as to enable more than three processing modules in the processing unit to process the data to be processed in parallel; the processing module currently in the computing type performs first computation on the data to be processed to obtain a first computing result, the processing module currently in the backup type performs second computation on the data to be processed to obtain a second computing result, and the processing module currently in the testing type performs third computation on the data to be processed to obtain a third computing result;
the verification module is used for judging whether the first calculation result is consistent with the second calculation result, and if not, sending a first control signal to the alarm module so that the alarm module sends out first prompt information; and the verification module is also used for judging whether the test passes or not according to the third calculation result, and if not, sending a second control signal to the alarm module so as to enable the alarm module to send out second prompt information.
2. The control circuit for an electronic toy according to claim 1, wherein said state type configuration module is configured to configure the state types of said three or more processing modules according to a time sequence period, the state type of which one of said processing modules is configured being different from the state type of which the processing module is configured in a previous time sequence period and/or a next time sequence period.
3. The control circuit for an electronic toy according to claim 1 or 2, wherein the processing unit includes a first processing module, a second processing module, and a third processing module; the control circuit further includes:
the fault processing unit is used for marking the first processing module as a fault state when the test of the first processing module fails, and sending a first state type adjustment instruction to the state type configuration module, wherein the state type configuration module is also used for only configuring the state types of the second processing module and the third processing module according to the first state type adjustment instruction;
the state type of the second processing module comprises a calculation type, and the state type of the third processing module comprises a test type; alternatively, the state type of the second processing module includes a test type, and the state type of the third processing module includes a calculation type.
4. A control circuit for an electronic toy according to claim 3, wherein,
when the first processing module has been marked as a fault state, the fault processing unit is further configured to mark the second processing module as a fault state when the second processing module fails to pass the test, and send a second state type adjustment instruction to the state type configuration module, where the state type configuration module is further configured to configure only the state type of the third processing module according to the second state type adjustment instruction, and the third processing module is alternately in a calculation type or a test type according to a time sequence period.
5. The control circuit for an electronic toy according to claim 1, further comprising:
the toy life cycle judging unit is used for determining the life cycle state of the electronic toy according to whether each processing module is in a fault state, determining the starting condition of the test control module according to the life cycle state of the electronic toy, starting the test control module when the starting condition is met, and otherwise, not starting the test control module.
6. The control circuit for an electronic toy according to claim 5, wherein the lifecycle state of the electronic toy includes a use state or a rework state;
When at least one processing module is in a non-fault state, a toy life cycle judging unit determines that the life cycle state of the electronic toy is a use state, the starting condition of the test control module corresponding to the use state is key information authentication passing, and when each processing module is in a fault state, the toy life cycle judging unit determines that the life cycle state of the electronic toy is a repairing state, and the starting condition of the test control module corresponding to the repairing state is that the test control module is directly started without key information authentication;
or when each processing module is in a non-fault state, the toy life cycle judging unit determines that the life cycle state of the electronic toy is the use state, the starting condition of the test control module corresponding to the use state is that key information authentication passes, at least one processing module is in a fault state, the toy life cycle judging unit determines that the life cycle state of the electronic toy is the repair state, and the starting condition of the test control module corresponding to the repair state is that the test control module is directly started without key information authentication.
7. The control circuit for an electronic toy according to claim 6, further comprising:
A key information storage unit for storing the key information, the key information being determined according to setting information input by a user;
when the life cycle state of the electronic toy is a use state, the toy life cycle judging unit is used for receiving authentication information input by a user and judging whether the authentication information is matched with the authentication information acquired from the key information storage unit, and if so, the test control module is started.
8. The control circuit for an electronic toy according to claim 5, further comprising:
and the life cycle state adjusting unit is used for adjusting the life cycle state of the electronic toy from the repairing state to the using state when detecting a replacement determining instruction of each processing module in the fault state.
9. A control method for an electronic toy, characterized by being applied to the control circuit for an electronic toy according to any one of claims 1 to 8;
the method comprises the following steps:
the state type configuration module configures the state types of the more than three processing modules, wherein the state types comprise any one of a calculation type, a backup type and a test type, and the state types of different processing modules are different at the same time;
The task allocation module receives a task processing instruction, and sends data to be processed to a processing unit according to the task processing instruction, so that more than three processing modules in the processing unit process the data to be processed in parallel; the processing module currently in the computing type performs first computation on the data to be processed to obtain a first computing result, the processing module currently in the backup type performs second computation on the data to be processed to obtain a second computing result, and the processing module currently in the testing type performs third computation on the data to be processed to obtain a third computing result;
the verification module judges whether the first calculation result is consistent with the second calculation result, if not, a first control signal is sent to the alarm module, so that the alarm module sends out first prompt information; and the verification module judges whether the test passes or not according to the third calculation result, and if not, the verification module sends a second control signal to the alarm module so that the alarm module sends out second prompt information.
10. An electronic toy, comprising:
a housing;
a control circuit provided in the housing, which is the control circuit for an electronic toy according to any one of claims 1 to 8.
CN202211742673.5A 2022-12-30 2022-12-30 Control circuit and method for electronic toy and electronic toy Pending CN116256997A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN202211742673.5A CN116256997A (en) 2022-12-30 2022-12-30 Control circuit and method for electronic toy and electronic toy

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN202211742673.5A CN116256997A (en) 2022-12-30 2022-12-30 Control circuit and method for electronic toy and electronic toy

Publications (1)

Publication Number Publication Date
CN116256997A true CN116256997A (en) 2023-06-13

Family

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Family Applications (1)

Application Number Title Priority Date Filing Date
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Country Status (1)

Country Link
CN (1) CN116256997A (en)

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