CN116244131A

CN116244131A - Server interface testing method and device, electronic equipment and medium

Info

Publication number: CN116244131A
Application number: CN202310272317.XA
Authority: CN
Inventors: 刘玉静; 许晓平
Original assignee: Suzhou Inspur Intelligent Technology Co Ltd
Current assignee: Suzhou Inspur Intelligent Technology Co Ltd
Priority date: 2023-03-20
Filing date: 2023-03-20
Publication date: 2023-06-09

Abstract

The embodiment of the application discloses a server interface testing method, a device, electronic equipment and a medium, which are applied to the technical field of servers. The method comprises the following steps: after receiving a test instruction, acquiring basic parameters indicated by the test instruction; obtaining a history test result matched with the basic parameter from a database; the database is pre-stored with test results obtained by testing various interface links; performing curve fitting on the historical test result to obtain a curve fitting result; controlling the oscilloscope to test the target interface link to obtain target test data; predicting predicted test data of the current link test based on the curve fitting result; and when the comparison gap between the predicted test data and the target test data meets the test requirement, storing the target test data into the database.

Description

Server interface testing method and device, electronic equipment and medium

Technical Field

The present invention relates to the field of server technologies, and in particular, to a method and apparatus for testing a server interface, an electronic device, and a medium.

Background

With the rapid development of cloud computing and big data industry, the server cluster size is larger and larger. In order to ensure the stable operation of the server and the normal operation of the interfaces and the components of the server, measuring whether the signal integrity of the interfaces of the server accords with the standard has become an essential important flow in the research and development process of the server.

Server interface testing typically involves the verification of both directions of a signal, i.e., receiving and transmitting. The transmission direction test generally depends on a high-speed oscilloscope, a test fixture matched with an interface and a cable, and the physical connection is quite complex. Meanwhile, the number of interfaces of the same type is also more. At present, in order to obtain all link test results of a server interface, all interfaces need to be tested in the existing server interface test. If the test resources are not satisfied, some pruning needs to be carried out on the tested links according to the simulation results, and only links with higher risks are tested, so that the test coverage rate is insufficient and the overall accuracy is doubtful.

Disclosure of Invention

In order to solve the above problems, embodiments of the present application provide a method, an apparatus, an electronic device, and a medium for testing a server interface.

Some embodiments of the application disclose a server interface testing method, which comprises the following steps:

After receiving a test instruction, acquiring basic parameters indicated by the test instruction;

obtaining a history test result matched with the basic parameter from a database; the database is pre-stored with test results obtained by testing various interface links;

performing curve fitting on the historical test result to obtain a curve fitting result;

controlling the oscilloscope to test the target interface link to obtain target test data;

predicting predicted test data of the current link test based on the curve fitting result;

and when the comparison gap between the predicted test data and the target test data meets the test requirement, storing the target test data into the database.

Optionally, after receiving the test instruction, acquiring the basic parameters indicated by the test instruction includes:

after receiving the test instruction, configuring different test parameters for the target interface link as the basic parameters; the test parameters comprise at least one of a tested main board plate, a main board wiring length, an external cable wire, a cable length, a transfer card plate and a transfer card wiring length.

Optionally, the obtaining, from a database, the historical test result matched with the basic parameter includes:

Using the basic parameters and the corresponding attributes thereof as specific key value conditions;

and obtaining a matching test result of the same key value condition in the database.

Optionally, the performing curve fitting on the historical test result to obtain a curve fitting result includes:

and performing curve fitting on the historical test result by using a discrete point curve fitting algorithm to obtain a curve fitting result.

Optionally, before the control oscilloscope tests the target interface link to obtain target test data, the method includes:

setting corresponding communication parameters of physical connection between the oscilloscope and the target interface link; wherein the communication parameters include at least one of an IP address and a port number.

Optionally, after the target test data is stored in the database when the comparison gap between the predicted test data and the target test data meets a test requirement, the method further includes:

analyzing the target test result by using a preset statistical analysis tool to obtain a server performance index;

recording the server performance index to a system log; wherein the server performance index comprises response time, throughput, CPU utilization and network bandwidth.

performing visual processing on the target test data and the comparison result to obtain a visual processing result; wherein the visualization process includes creating a chart, report;

and sending the visualization processing result to a client interface.

Some embodiments of the present application provide a server interface testing apparatus, the apparatus including:

the transmission module is used for acquiring basic parameters indicated by the test instruction after receiving the test instruction; obtaining a history test result matched with the basic parameter from a database; the database is pre-stored with test results obtained by testing various interface links;

the processing module is used for performing curve fitting on the historical test results to obtain curve fitting results; controlling the oscilloscope to test the target interface link to obtain target test data; predicting predicted test data of the current link test based on the curve fitting result;

and the storage module is used for storing the target test data into the database when the comparison gap between the predicted test data and the target test data meets the test requirement.

Optionally, the transmission module is further configured to:

Optionally, the processing module is further configured to:

and performing curve fitting on the result to obtain a curve fitting result.

Optionally, the processing module is further configured to:

and sending the visualization processing result to a client interface.

The embodiment of the application also provides electronic equipment, which comprises a memory, a processor and a computer program stored on the memory and capable of running on the processor, wherein the processor realizes the steps of any one of the server interface testing methods when executing the program.

The embodiments of the present application also provide a computer readable storage medium having stored thereon a computer program which, when executed by a processor, implements the steps of the server interface testing method as described in any of the above.

According to the server interface testing method, the system, the electronic equipment and the medium, after the testing instruction is received, the appointed basic parameters are obtained, the historical testing results matched with the parameters are screened out, curve fitting is carried out on the results, and more accurate prediction testing data can be obtained. By comparing the predicted data with the target test data, whether the test result meets the requirement can be evaluated more quickly and accurately. The relation between the test quantity and the data accuracy can be effectively balanced, the test coverage rate is improved, the accuracy is ensured, and therefore time and labor cost required by the test can be reduced. In addition, the model can also use the historical test result to predict, so that the test workload is reduced, meanwhile, the judgment accuracy is ensured, and the test efficiency and reliability are improved. In addition, the method also stores target test data meeting the requirements into a database, thereby facilitating subsequent testing and analysis.

The foregoing description is only an overview of the technical solutions of the present application, and may be implemented according to the content of the specification in order to make the technical means of the present application more clearly understood, and in order to make the above-mentioned and other objects, features and advantages of the present application more clearly understood, the following detailed description of the present application will be given.

Drawings

In order to more clearly illustrate the embodiments of the present application or the technical solutions in the prior art, a brief description will be given below of the drawings that are needed in the embodiments or the prior art descriptions, and it is obvious that the drawings in the following description are some embodiments of the present application, and that other drawings can be obtained according to these drawings without inventive effort for a person skilled in the art.

FIG. 1 schematically illustrates a flow chart of a method for testing a server interface according to some embodiments of the present application;

FIG. 2 schematically illustrates a flowchart of another server interface testing method provided by some embodiments of the present application;

FIG. 3 schematically illustrates a system component diagram of another method for testing a server interface according to some embodiments of the present application;

FIG. 4 is a schematic diagram schematically illustrating a signal under test component of another method for testing a server interface according to some embodiments of the present application;

FIG. 5 schematically illustrates a conditional argument representation intent of another server interface test method provided by some embodiments of the present application;

FIG. 6 schematically illustrates a workflow diagram of another server interface testing method provided by some embodiments of the present application;

FIG. 7 schematically illustrates a fitted curve of another server interface testing method provided by some embodiments of the present application;

FIG. 8 schematically illustrates a schematic structural diagram of a server interface testing apparatus according to some embodiments of the present application;

FIG. 9 schematically illustrates a block diagram of a computing processing device for performing methods according to some embodiments of the present application;

fig. 10 schematically illustrates a storage unit for holding or carrying program code for implementing methods according to some embodiments of the present application.

Detailed Description

For the purposes of making the objects, technical solutions and advantages of the embodiments of the present application more clear, the technical solutions of the embodiments of the present application will be clearly and completely described below with reference to the drawings in the embodiments of the present application, and it is apparent that the described embodiments are some embodiments of the present application, but not all embodiments. All other embodiments, which can be made by one of ordinary skill in the art based on the embodiments herein without making any inventive effort, are intended to be within the scope of the present application.

Fig. 1 schematically illustrates a flowchart of a method for testing a server interface according to some embodiments of the present application, where the method includes:

step 101, after receiving a test instruction, acquiring basic parameters indicated by the test instruction.

In the embodiment of the present application, the "test instruction" refers to an instruction for testing a server interface, which includes a target interface to be tested and related parameters required for testing. After receiving the test instruction, the model needs to extract "basic parameters" needed for testing, namely key attributes for identifying different interface links, such as external cable wires, lengths and the like, according to information in the instruction. This is a precondition for subsequent testing and data processing.

102, acquiring a history test result matched with the basic parameter from a database; and the database is pre-stored with test results obtained by testing various interface links.

In the embodiment of the application, the database searches for matched historical test results according to the specified basic parameters, and the historical test results are stored in the database in advance. For example, if a test instruction requires testing the response time of a certain interface, then the name and response time of the interface need to be specified as basic parameters when searching the database for matching historical test results. If the database already contains test results of the response time test previously performed for the interface, then these matching historical test results can be obtained.

And step 103, performing curve fitting on the historical test result to obtain a curve fitting result.

In the embodiment of the application, for the historical test results obtained from the database, curve fitting processing is required to obtain accurate curve fitting results. Curve fitting refers to statistical analysis of a discrete set of data points and finding a mathematical model that can represent the set of data points. Curve fitting is typically used to smooth, predict, and classify data. The purpose of the curve fitting is to predict the trend and data distribution of the current test results, thereby providing a reference for subsequent test work. Common curve fitting methods include least squares, polynomial fitting, exponential fitting, and the like. For example, to test the transmission rate of a certain interface link, the historical test result before the interface link needs to be obtained from the database. Assume that we have obtained the first ten test results for the interface link, where each test result includes both the test time and the transmission rate attributes. The test results can be processed by using a curve fitting method to obtain a mathematical model which can represent the change trend of the transmission rate. For example, we can fit a quadratic function curve closest to the test data using least squares. Thus, an accurate curve fitting result is obtained, and thus, a reference can be provided for subsequent testing work.

And 104, controlling the oscilloscope to test the target interface link to obtain target test data.

In the embodiment of the application, the control oscilloscope is an instrument for measuring electronic signals and is used for detecting and measuring the electronic signals in the interface link. And the control oscilloscope sends a test signal to the target interface chain according to the test instruction and receives the returned signal data. The oscilloscope converts the signal data into digital signals, and stores the digital signals in a computer for subsequent data processing and analysis. Illustratively, if the test instructions require testing the transmission rate of a network interface, the control oscilloscope sends test signals to the network interface, and then receives the data transmitted by the interface and stores it as digital signals. The digital signals may be represented in waveform diagrams or other forms for subsequent data processing and analysis.

And step 105, predicting predicted test data of the current link test based on the curve fitting result.

In the embodiment of the present application, the curve fitting result obtained based on the history test result may be used to predict the predicted test data of the present link test. Specifically, a curve model can be obtained through a curve fitting algorithm, and the model can describe the variation trend of the historical test result. And then, predicting future test data by using the curve model, thereby obtaining predicted test data of the current link test. For example, assuming that the historical test result shows a trend that the amplitude variation of the test result increases linearly with the length of the external cable, a straight line can be obtained as a model by using a curve fitting algorithm, and then the amplitude variation data of the current test can be predicted according to the current external cable length.

And 106, storing the target test data into the database when the comparison gap between the predicted test data and the target test data meets the test requirement.

In the embodiment of the application, by comparing the predicted test data and the target test data, whether the difference between the predicted test data and the target test data meets the test requirement is judged, and if the difference meets the test requirement, the target test data is stored in a database. The aim of the method is to predict the target test data by predicting the test data in the test process, thereby reducing the test time and the labor cost and ensuring the accuracy of the test result. For example, when testing an interface, the predicted test data is 100ms, the target test data is 98ms, and the test requirement allows an error of 2ms, so that the comparison difference between the predicted test data and the target test data is smaller than the test requirement, and the target test data can be stored in the database as a historical test result. When a certain interface is tested, the predicted test data is 100ms, the target test data is 105ms, and the comparison difference between the predicted test data and the target test data is larger than the test requirement, which means that a larger difference exists between the test result and the expected result and the test requirement is exceeded. This may mean that there is a problem or failure that requires further investigation and analysis to determine the cause and take the necessary action to correct the problem. Further, by way of example, if it is specified at design time that only test results meeting a specific standard will be stored in the database, the target test data may not be stored in the database; otherwise, if all test results are specified to be stored in the database during design, the target test data is still stored in the database. The cause of the probability is indicated as a result of the error.

In the embodiment of the application, the specified basic parameters are obtained after the test instruction is received, the historical test results matched with the parameters are screened out, and curve fitting is carried out on the results, so that more accurate predicted test data can be obtained. By comparing the predicted data with the target test data, whether the test result meets the requirement can be evaluated more quickly and accurately. The relation between the test quantity and the data accuracy can be effectively balanced, the test coverage rate is improved, the accuracy is ensured, and therefore time and labor cost required by the test can be reduced. In addition, the model can also use the historical test result to predict, so that the test workload is reduced, meanwhile, the judgment accuracy is ensured, and the test efficiency and reliability are improved. In addition, the method also stores target test data meeting the requirements into a database, thereby facilitating subsequent testing and analysis.

Optionally, the step 101 includes: after receiving the test instruction, configuring different test parameters for the target interface link as the basic parameters; the test parameters comprise at least one of a tested main board plate, a main board wiring length, an external cable wire, a cable length, a transfer card plate and a transfer card wiring length.

In this embodiment of the present application, after receiving a test instruction, the server needs to test the target interface link according to test parameters indicated in the instruction, where the test parameters include at least one of a tested motherboard board, a motherboard routing length, an external cable wire, a cable length, a riser board, and a riser routing length. For example, if the test instruction indicates that a motherboard needs to be tested, the server will obtain parameters such as board and trace length of the tested motherboard according to the test instruction, and test the target interface link with these parameters as basic parameters. In addition, if the test instruction indicates that an external device needs to be tested, the server acquires parameters such as the cable type and the length of the external device, and tests the target interface link by taking the parameters as basic parameters.

In the embodiment of the application, by configuring different test parameters as basic parameters, the stability and reliability of the interface link can be tested more comprehensively by testing the different test parameters under the condition of keeping the interface link unchanged. For example, when testing different cable lengths, the performance of the link under different lengths can be observed, so as to find out the influence of the link length on the link performance, and help to optimize and improve the link. Thus, the accuracy and coverage rate of the test can be improved, and the stability and reliability of the product are improved.

Optionally, as shown in fig. 2, step 102 includes:

step 201, using the basic parameters and their corresponding attributes as specific key value conditions.

The basic parameters refer to at least one of the different test parameters (e.g., one or more of a motherboard board under test, motherboard trace length, external cable wire, cable length, riser board, riser trace length). The attribute refers to specific values of different test parameters, for example, the tested motherboard board may be FR4, RO4350B, RO4003C, etc. The use of the basic parameters and their corresponding attributes as specific key conditions means that different test parameters and their attributes are combined together as unique key values for searching the corresponding historical test results in the database. For example, if the test instruction requires testing parameters such as FR4 board to be tested, 20cm length of motherboard trace, PI board to be adapter card, etc., these parameters and their attributes (FR 4, 20cm, PI) are combined together as a specific key value condition. By matching these key conditions, historical test results matching these parameters and their attributes can be obtained from the database.

Step 202, obtaining a matching test result of the same key value condition in the database.

In this embodiment of the present application, obtaining a matching test result of the same key value condition in the database refers to retrieving, from the database, a historical test result matching with the key value condition required by the current test according to the key value condition obtained by the previous test and the corresponding test result. For example, in a testing process of an electronic product, a tester needs to test connection performance of different types of mainboards and adapter cards. In order to obtain a matched test result, a tester needs to set test parameters such as a board of a tested main board, a wiring length of the main board, an external cable wire, a cable length, a switching card board, a wiring length of a switching card and the like as key value conditions before each test. When a tester needs to acquire the test results under the same conditions tested before in the subsequent test process, the system can search in the database according to the key value conditions to acquire the history test results matched with the key value conditions.

In the embodiment of the application, the matching test result of the same key value condition in the database is obtained by using the specific key value condition, so that a tester can be helped to quickly obtain the historical test result similar to the current test parameter. The performance and the data change trend of the past test result can be known more quickly, and the test can be carried out more specifically. The repeated test of the covered test parameter combination can be avoided, and the test efficiency is improved. More comprehensive and accurate test data can be provided for product development so as to better optimize product design and performance.

Optionally, step 103 includes: and performing curve fitting on the historical test result by using a discrete point curve fitting algorithm to obtain a curve fitting result.

In the embodiment of the application, the curve fitting algorithm using discrete points is a curve fitting method, and the fitting of a mathematical model is performed through coordinate values of the discrete points. Discrete points refer to a set of coordinate values, such as (x 1, y 1), (x 2, y 2), (xn, yn). The fitting algorithm predicts the values of the other data points by finding the optimal mathematical model so that the model can pass through the set of discrete points. Illustratively, assuming a function y=f (x), we need to fit this function through a set of discrete points (x 1, y 1), (x 2, y 2), …, (xn, yn). If we assume that f (x) is a quadratic function, then a quadratic fitting algorithm can be used to calculate the coefficients a, b, c of the function, resulting in a curve fit.

In the embodiment of the application, the curve fitting result can be obtained according to the historical test data and used for predicting the current test data, so that the workload of actual test is reduced. The use of curve fitting algorithms can more accurately predict test data and more efficiently cover the various conditions of the interface link during testing than conventional test methods.

Optionally, before step 104, the method includes: setting corresponding communication parameters of physical connection between the oscilloscope and the target interface link; wherein the communication parameters include at least one of an IP address and a port number.

In the embodiment of the application, when the server interface test is performed, the oscilloscope and the target interface link are required to be physically connected, and corresponding communication parameters are set so as to be capable of performing data transmission and communication between the oscilloscope and the target interface link. For example, if an interface test of a network server is to be performed, it is necessary to connect the oscilloscope with the server and set a corresponding IP address and port number so that the oscilloscope can send a test request to the server and receive a test result from the server. Typically, the communication parameter settings between the oscilloscope and the target interface link are made according to specific test requirements and environmental conditions.

In the embodiment of the application, on the premise of ensuring that the physical connection between the oscilloscope and the target interface link is normal, the communication connection is established by setting proper communication parameters, so that the data transmission and the data reception are realized. This is a very important step in the overall test flow, ensuring the reliability and accuracy of the data. For example, by setting the correct IP address and port number, the oscilloscope can send the correct test instruction to the target interface link and receive the target test data, thereby ensuring the accuracy of the test result.

Optionally, after step 106, the method further comprises:

and A1, analyzing the target test result by using a preset statistical analysis tool to obtain a server performance index.

In the embodiment of the application, the target test result can be analyzed by using a preset statistical analysis tool, and the server performance index is extracted from the analysis result. These statistical analysis tools may include various types of software and algorithms for calculating and summarizing key metrics for server performance, such as response time, throughput, CPU usage, memory usage, and the like. For example, when testing the performance of a Web server, the obtained target test result includes data of response time and throughput when different users access the server concurrently, and the data can be analyzed through a preset statistical analysis tool, and key performance indexes such as maximum response time, average response time, throughput peak value and the like are extracted from the data. By analysis and comparison of these metrics, the performance of the server can be evaluated and feedback provided to guide further optimization and improvement.

A2, recording the performance index of the server to a system log; wherein the server performance index comprises response time, throughput, CPU utilization and network bandwidth.

In the embodiment of the application, the recording of the server performance index to the system log is to record the obtained performance index in the log file of the system, so as to facilitate subsequent viewing, analysis and processing. Such performance metrics include, but are not limited to, response time, throughput, CPU utilization, network bandwidth, and the like. Illustratively, assume that a system needs to test the performance of its servers and record performance metrics. During the testing process, the system collects different performance index data, such as response time, throughput, CPU utilization, network bandwidth and the like of the server in a certain time period. Such data may be recorded in a log file of the system for analysis and processing by a system administrator or developer to evaluate and improve performance of the system.

In the embodiment of the application, the performance index of the server is analyzed and recorded, so that the possible performance problem in the system can be diagnosed, the system is analyzed and optimized in performance, and the stability and performance of the system are improved. At the same time, recording these performance indicators is also helpful for understanding the performance of the system under different load conditions, and provides references for future system designs. For example, if a preset statistical analysis tool is used to analyze the response time of the server, it may be found that the response time of the system is longer in some cases, and the problem may be further analyzed and optimized. For example, the CPU utilization rate of the recording system can help to know the load condition of the system and judge whether capacity expansion or optimization is needed or not.

Optionally, after step 106, the method further comprises:

step S1, carrying out visual processing on the target test data and the comparison result to obtain a visual processing result; wherein, the visualization processing comprises creating a chart and reporting.

In the embodiment of the application, the obtained target test data and the comparison result are subjected to visual processing so as to intuitively observe the test result. This process generally involves the creation of charts and reports, which can be implemented using various data visualization tools. For example, using Matplotlib libraries or Tableau software in Python, various types of charts and reports can be created, such as line graphs, bar graphs, scatter graphs, and the like. These visualizations can effectively help the tester understand the test results and quickly discover potential problems.

And step S2, the visualization processing result is sent to a client interface.

In the embodiment of the application, sending the visualization processing result to the client interface means that the processed chart, report and the like are displayed on the client interface used by the user for the user to view, analyze and operate. This may be accomplished by transmitting the results to the client in the form of images, files, etc., or presented using web pages or applications, etc. For example, a network monitoring system collects network data, processes and generates reports, sends the reports in the form of charts and tables to clients, and the clients present the results in the form of web pages that users can access for data review and analysis through a browser.

In the embodiment of the application, the test result is presented to the user through the visualization processing, so that the user is helped to more intuitively know the test result and the performance, and the performance and the bottleneck of the system are better evaluated. Meanwhile, the processing result is sent to the client interface, so that a user can conveniently check the test result, the usability and efficiency of the system are improved, and the method has a good effect.

As shown in fig. 3, in the embodiment of the present application, the control module controls the computer to match with the man-machine interaction software for issuing operation instructions, controlling the oscilloscope, storing test data, analyzing data, and the like. The system comprises a database and a data analysis module. Database: the data sources in the database are various test results, and the more the test results are accumulated, the more accurate the test judgment is. All test results are entered into the database after the decision is accepted as part of the subsequent test decision criteria. And a data analysis module: and judging new data received by the database by taking various parameters influencing the test result as screening conditions and taking the test result in the database as a test standard. And a testing module: the system mainly comprises an oscilloscope, and is matched with a man-machine interaction interface of a control console to realize automatic acquisition of test data by the oscilloscope and save the test data to a corresponding database.

As shown in fig. 4, the tested signal forming module includes a motherboard, a riser card, a cable and corresponding parameters. The main board parameters comprise a board and a length; the adapter card parameters comprise plates and lengths; the cable parameters include wire and length.

As shown in fig. 5, the condition parameters mainly include: the device comprises a tested main board plate, a main board wiring length, an external cable wire, a cable length, a switching card plate and a switching card wiring length. The above is the main parameter that affects the test result currently, and other key influencing factors may be found according to the accumulation of the test data, so that the parameter definition can be added at any time. The variable distinguishing Key value comprises Key1, measured main board, key2, adapter card and external cable wire. The corresponding parameters of Key1/Key2/Key3 are respectively the corresponding lengths. And the test result analysis takes each key value combination as a screening condition to screen out test results with different wiring or cable lengths.

As shown in fig. 6, in the embodiment of the present application, an exemplary embodiment, S1, starts a test, and opens a man-machine interaction interface in a control module.

S2, carrying out basic parameter configuration on the tested link in the interface, and storing the test result of the database.

And S3, after parameter setting is completed, automatically obtaining test results of the same key value condition in the database, and performing curve fitting on the test results by a background to obtain a basic test reference standard. As the precision of the fitted curve is related to the amount of test data, the curve precision is higher and higher along with the increase of the amount of data in the database, and the corresponding judgment standard is more and more accurate. As shown in fig. 7.

Wherein, when fitting discrete data, polynomial curve fitting is carried out on all sample points for 3 times to obtain a relation y (x) =a x ³ +b*x ² +c x+d, current test result (X, Y) error Δe= |y-Y (X) |, according to engineering error 3% as a criterion, if

The test result PASS; if->

The result FAIL is tested.

And S4, controlling the oscilloscope to collect and store test data.

S5, judging a test result according to the S3 judgment method.

S6, data are stored.

S7, testing is completed.

By the above test data accumulation, the fitted curve becomes closer to the ideal value. Meanwhile, because objective errors exist in the test inevitably, the trend of the test result under specific conditions can be judged along with the accumulation of data, and the result of part of links is indirectly judged by combining with the simulation theoretical value, so that real measurement is reduced, and the purposes of improving the efficiency and saving the cost are achieved.

As shown in fig. 8, some embodiments of the present application provide a server interface testing apparatus 30, where the apparatus 30 includes:

the transmission module 301 is configured to obtain, after receiving a test instruction, a basic parameter indicated by the test instruction; obtaining a history test result matched with the basic parameter from a database; the database is pre-stored with test results obtained by testing various interface links;

the processing module 302 is configured to perform curve fitting on the historical test result to obtain a curve fitting result; controlling the oscilloscope to test the target interface link to obtain target test data; predicting predicted test data of the current link test based on the curve fitting result;

and the storage module 303 is configured to store the target test data into the database when the comparison gap between the predicted test data and the target test data meets the test requirement.

Optionally, the transmission module 301 is further configured to:

Optionally, the processing module 302 is further configured to:

and performing curve fitting on the result to obtain a curve fitting result.

Optionally, the processing module 302 is further configured to:

And sending the visualization processing result to a client interface.

The above described embodiments of the apparatus are only illustrative, wherein the elements illustrated as separate elements may or may not be physically separate, and the elements shown as elements may or may not be physical elements, may be located in one place, or may be distributed over a plurality of network elements. Some or all of the modules may be selected according to actual needs to achieve the purpose of the solution of this embodiment. Those of ordinary skill in the art will understand and implement the present invention without undue burden.

Various component embodiments of the present application may be implemented in hardware, or in software modules running on one or more processors, or in a combination thereof. Those skilled in the art will appreciate that some or all of the functions of some or all of the components in a computing processing device according to embodiments of the present application may be implemented in practice using a microprocessor or Digital Signal Processor (DSP). The present application may also be embodied as an apparatus or device program (e.g., computer program and computer program product) for performing a portion or all of the methods described herein. Such a program embodying the present application may be stored on a non-transitory computer readable medium, or may have the form of one or more signals. Such signals may be downloaded from an internet website, provided on a carrier signal, or provided in any other form.

For example, FIG. 9 illustrates a computing processing device in which methods according to the present application may be implemented. The computing processing device conventionally includes a processor 410 and a computer program product in the form of a memory 420 or a non-transitory computer readable medium. The memory 420 may be an electronic memory such as a flash memory, an EEPROM (electrically erasable programmable read only memory), an EPROM, a hard disk, or a ROM. Memory 420 has storage space 430 for program code 431 for performing any of the method steps described above. For example, the memory space 430 for the program code may include individual program code 431 for implementing the various steps in the above method, respectively. The program code can be read from or written to one or more computer program products. These computer program products comprise a program code carrier such as a hard disk, a Compact Disc (CD), a memory card or a floppy disk. Such a computer program product is typically a portable or fixed storage unit as described with reference to fig. 10. The storage unit may have memory segments, memory spaces, etc. arranged similarly to the memory 420 in the computing processing device of fig. 9. The program code may be compressed, for example, in a suitable form. Typically, the storage unit comprises computer readable code 431', i.e. code that can be read by a processor, such as 410, for example, which when run by a computing processing device causes the computing processing device to perform the steps in the method described above.

It should be understood that, although the steps in the flowcharts of the figures are shown in order as indicated by the arrows, these steps are not necessarily performed in order as indicated by the arrows. The steps are not strictly limited in order and may be performed in other orders, unless explicitly stated herein. Moreover, at least some of the steps in the flowcharts of the figures may include a plurality of sub-steps or stages that are not necessarily performed at the same time, but may be performed at different times, the order of their execution not necessarily being sequential, but may be performed in turn or alternately with other steps or at least a portion of the other steps or stages.

Reference herein to "one embodiment," "an embodiment," or "one or more embodiments" means that a particular feature, structure, or characteristic described in connection with the embodiment is included in at least one embodiment of the present application. Furthermore, it is noted that the word examples "in one embodiment" herein do not necessarily all refer to the same embodiment.

In the description provided herein, numerous specific details are set forth. However, it is understood that embodiments of the present application may be practiced without these specific details. In some instances, well-known methods, structures and techniques have not been shown in detail in order not to obscure an understanding of this description.

In the claims, any reference signs placed between parentheses shall not be construed as limiting the claim. The word "comprising" does not exclude the presence of elements or steps not listed in a claim. The word "a" or "an" preceding an element does not exclude the presence of a plurality of such elements. The application may be implemented by means of hardware comprising several distinct elements, and by means of a suitably programmed computer. In the unit claims enumerating several means, several of these means may be embodied by one and the same item of hardware. The use of the words first, second, third, etc. do not denote any order. These words may be interpreted as names.

Finally, it should be noted that: the above embodiments are only for illustrating the technical solution of the present application, and are not limiting thereof; although the present application has been described in detail with reference to the foregoing embodiments, it should be understood by those of ordinary skill in the art that: the technical scheme described in the foregoing embodiments can be modified or some technical features thereof can be replaced by equivalents; such modifications and substitutions do not depart from the spirit and scope of the corresponding technical solutions.

Claims

1. A method for testing a server interface, the method comprising:

2. The method according to claim 1, wherein after receiving the test instruction, obtaining the basic parameters indicated by the test instruction includes:

3. The method of claim 1, wherein the retrieving from a database historical test results that match the base parameter comprises:

4. The method of claim 1, wherein curve fitting the historical test results to obtain curve fitting results comprises:

5. The method of claim 1, wherein prior to the control oscilloscope testing the target interface link for target test data, the method comprises:

6. The method of claim 1, wherein after storing the target test data in the database when the comparison gap between the predicted test data and the target test data meets a test requirement, the method further comprises:

7. The method of claim 1, wherein after storing the target test data in the database when the comparison gap between the predicted test data and the target test data meets a test requirement, the method further comprises:

and sending the visualization processing result to a client interface.

8. A server interface testing apparatus, the apparatus comprising:

9. An electronic device, the device comprising a processor and a memory:

the memory is used for storing a computer program;

the processor is configured to perform the server interface testing method of any one of claims 1-7 according to the computer program.

10. A computer readable storage medium, characterized in that the computer readable storage medium is for storing a computer program for executing the server interface testing method of any one of claims 1-7.