CN116233630A - Method, equipment and storage medium for removing ripple noise of CMOS sensor power supply - Google Patents

Method, equipment and storage medium for removing ripple noise of CMOS sensor power supply Download PDF

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CN116233630A
CN116233630A CN202310495057.2A CN202310495057A CN116233630A CN 116233630 A CN116233630 A CN 116233630A CN 202310495057 A CN202310495057 A CN 202310495057A CN 116233630 A CN116233630 A CN 116233630A
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CN116233630B (en
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杨丽
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Shenzhen Hehuiyuan Electronic Technology Co ltd
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Abstract

The invention provides a method for removing ripple noise of a CMOS sensor power supply, which comprises the steps of obtaining a first RAW image matrix and converting the first RAW image matrix into a first frequency domain matrix after calibrating dark current of any matrix under the multiplication benefit of 1~S shot in a dark environment of a laboratory; further converting into a first spectrum matrix and a first phase spectrum matrix; establishing a fast filter matrix and denoising the first frequency spectrum matrix to obtain a second frequency spectrum matrix; sequentially executing the steps on the RAW image matrix under the 1~S multiplication benefit to obtain a rapid filter matrix set; regenerating a second RAW image matrix, converting the second RAW image matrix into a second frequency domain matrix, generating a third frequency spectrum matrix and a second phase spectrum matrix, acquiring a fast filter matrix, generating a fourth frequency spectrum matrix, and calculating with the second phase spectrum matrix to obtain the third frequency domain matrix; and restoring the third frequency domain matrix into a spatial domain matrix, thereby obtaining the RAW image after removing the power supply ripple noise. According to the method, the power supply ripple wave under the corresponding analog gain is removed, and the RAW image with higher quality is obtained.

Description

Method, equipment and storage medium for removing ripple noise of CMOS sensor power supply
Technical Field
The invention relates to the field of electronic information, in particular to a method, equipment and storage medium for removing power supply ripple noise of a CMOS sensor.
Background
When the CMOS sensor is used for carrying out row exposure, the exposure intensity of each row is caused to have deviation by a power supply ripple wave, so that stripe noise exists in an obtained image, the stripe noise is particularly obvious under higher precision or high analog gain, the image quality is reduced in subsequent processing, and the accuracy in the fields of positioning, identification and the like requiring high precision images is further affected.
The technical scheme of the method is mainly to manually touch two ends of an output pin of a single board power supply module by using an oscilloscope probe, so that the power supply ripple noise can not be accurately measured due to instability of the oscilloscope probe, and the problems of labor and time consumption and low efficiency are solved.
Therefore, an effective elimination scheme is necessary to be provided for the ripple noise of the power supply, so that the long-standing technical barriers in the prior art are solved, the power supply conversion efficiency and the voltage stability are improved, and the safety of various application scenes is further improved.
Disclosure of Invention
In order to solve the technical barriers for a long time in the prior art, the invention provides a method, equipment and a storage medium for removing power supply ripple noise of a CMOS sensor, which have the following specific technical scheme:
in a first aspect, the present invention provides a method for removing ripple noise of a CMOS sensor power supply, comprising the steps of:
step 101: shooting 1~S S matrixes under multiplication under a dark environment of a laboratory, and acquiring a first RAW image matrix under any gain after calibrating dark current according to a universal ISP (Internet service provider) debugging method for the matrix under the gain;
step 102: converting the first RAW image matrix into a first frequency domain matrix;
step 103: converting the first frequency domain matrix into a first frequency spectrum matrix and a first phase spectrum matrix;
step 104: establishing and obtaining a fast filter matrix, and denoising the first frequency spectrum matrix to obtain a second frequency spectrum matrix;
step 105: sequentially executing steps 102-104 on RAW image matrixes after dark current calibration according to a general ISP (Internet service provider) debugging method under the multiplication of 1~S to obtain a rapid filter matrix set;
step 106: regenerating a second RAW image matrix after dark current is calibrated according to a general ISP debugging method under a gain Q, converting the second RAW image matrix into a second frequency domain matrix, and obtaining a third frequency spectrum matrix and a second phase spectrum matrix, wherein the gain;
step 107: acquiring a fast filter matrix under the gain Q in the step 105, and generating a fourth spectrum matrix;
step 108: calculating the fourth frequency spectrum matrix and the second phase spectrum matrix to obtain a third frequency domain matrix;
step 109: and restoring the third frequency domain matrix into a spatial domain matrix, thereby obtaining the RAW image after removing the power supply ripple noise.
Further, the RAW image matrix has the following format under the i multiplication benefit:
Figure SMS_1
，
wherein x and y are coordinate axes of a space domain
Figure SMS_2
The element of (2) is->
Figure SMS_3
The RAW image resolution is +.>
Figure SMS_4
。
Further, the first frequency domain matrix
Figure SMS_5
：
Figure SMS_6
，
Wherein u, v is the frequency domain coordinate axis, j is the imaginary unit, and the coordinate
Figure SMS_7
The element of (2) is->
Figure SMS_8
。
Further, the first spectrum matrix
Figure SMS_9
And a first phase spectrum matrix->
Figure SMS_10
The conversion is carried out by adopting the following modes: the first frequency domain matrix->
Figure SMS_11
Is>
Figure SMS_12
Is converted according to the following formula to generate a first spectrum matrix
Figure SMS_13
And a first phase spectrum matrix->
Figure SMS_14
：
Figure SMS_15
；
Figure SMS_16
；
wherein ,
Figure SMS_17
for the first frequency domain matrix->
Figure SMS_18
At->
Figure SMS_19
The real part of complex element, < >>
Figure SMS_20
For the first frequency domain matrix->
Figure SMS_21
At->
Figure SMS_22
Is the imaginary part of the complex element.
Further, the filter is constructed in the following manner: for the first spectrum matrix
Figure SMS_23
Sequentially traversing the v axis +.>
Figure SMS_26
All points of the interval->
Figure SMS_30
Define a spectral threshold +.>
Figure SMS_25
，/>
Figure SMS_27
If the point is on the v-axis
Figure SMS_29
There is->
Figure SMS_31
If true, define->
Figure SMS_24
For the first frequency domain matrix->
Figure SMS_28
Obtaining a coordinate set satisfying the electric noise frequency:
Figure SMS_32
；
a fast filter is then constructed:
Figure SMS_33
，
the fast filter is applied to a first frequency spectrum matrix to achieve the purpose of removing noise, and specifically comprises the following steps: will be
Figure SMS_34
And->
Figure SMS_35
Two matrices are associated with each other +.>
Figure SMS_36
Element multiplication at coordinates, this operation is for the first spectral matrix +.>
Figure SMS_37
Setting the amplitude value belonging to the noise source frequency coordinate set to zero, thereby generating a second spectrum matrix for removing noise>
Figure SMS_38
。
Further, the fast filter matrix set is obtained by: RAW image matrix set with 1~S times gain
Figure SMS_39
Steps 102-104 are executed to obtain a fast filter matrix set for removing the frequency domain noise frequency points under the corresponding gain:
Figure SMS_40
。
further, the third spectrum matrix and the second spectrum matrix are obtained by the following method: with analog gain
Figure SMS_41
Exposing to generate a RAW image matrix, and performing dark current calibration to obtain a second RAW image matrix +.>
Figure SMS_44
The resolution of the image is +.>
Figure SMS_46
Converting the second RAW image matrix into a second frequency domain matrix to further obtain a second phase spectrum matrix +.>
Figure SMS_42
And a third spectral matrix->
Figure SMS_45
From i=q value, get +.>
Figure SMS_47
Concentrate corresponding +.>
Figure SMS_48
Generating a fourth spectral matrix with noise removed>
Figure SMS_43
；
The third frequency domain matrix is obtained in the following manner: for the fourth spectrum matrix
Figure SMS_49
And a second phase spectrum matrix->
Figure SMS_50
Every coordinate +.>
Figure SMS_51
The elements of (2) are converted according to the following formula to generate a denoised third frequency domain matrix +.>
Figure SMS_52
：
Figure SMS_53
。/>
Further, the RAW image matrix after removing the power supply ripple is obtained by the following method: for the third frequency domain matrix
Figure SMS_54
Every coordinate +.>
Figure SMS_55
Is converted to each coordinate +.>
Figure SMS_56
Is used for generating a spatial domain matrix after removing power supply ripple noise>
Figure SMS_57
：
Figure SMS_58
；
wherein ,
Figure SMS_59
and namely the RAW image matrix after the power supply ripple is removed.
In a second aspect, the present invention provides a computer readable storage medium storing a computer program which when executed by a processor implements the steps of the method of CMOS sensor power supply ripple noise removal of any one of the first aspects.
In a third aspect, the present invention provides a CMOS sensor power supply ripple noise removal device comprising:
one or more processors;
a memory; and
one or more computer programs, wherein the one or more computer programs are stored in the memory and configured to be executed by the one or more processors, which when executing the computer programs, implement the steps of the method of CMOS sensor power supply ripple noise removal of any one of the first aspect.
According to the technical scheme, based on the laboratory environment calibration step, the space domain is converted into the frequency domain, the noise frequency point is determined by using the threshold value, the fast filter matrix is further generated, the filtered frequency domain is rebuilt and restored to the space domain, the power supply ripple removal under the corresponding analog gain is realized, and the RAW image with higher quality is obtained.
Drawings
Fig. 1: the invention relates to a flow chart of a power supply ripple noise removing method of a CMOS sensor.
Fig. 2: the invention relates to a schematic diagram of a power supply ripple noise removing device of a CMOS sensor.
Detailed Description
In order to make the technical problems, technical schemes and beneficial effects to be solved more clear, the invention is further described in detail below with reference to the accompanying drawings and embodiments.
It should be understood that the specific embodiments described herein are for purposes of illustration only and are not intended to limit the scope of the invention.
Referring to fig. 1, a flow chart of a method for removing ripple noise of a power supply of a CMOS sensor according to the present invention includes the following steps:
step 101: shooting 1~S under the dark environment of a laboratory, wherein S matrixes under the multiplication benefit, for example S=16, and acquiring a first RAW image matrix under any gain after calibrating dark current of the matrix under the gain according to a universal ISP (Internet service provider) debugging method; the resolution of the image is
Figure SMS_60
：
Figure SMS_61
；
The matrix format of any one RAW image under the benefit of i multiplication is as follows:
Figure SMS_62
；
wherein x and y are coordinate axes of a space domain, and the coordinates
Figure SMS_63
The element of (2) is->
Figure SMS_64
；
Step 102: the first RAW image matrix is converted into a first frequency domain matrix, specifically: mathematical formulas based on the following discrete fourier transforms:
Figure SMS_65
；
and applies a general fast Fourier transform algorithm to generate a corresponding first frequency domain matrix
Figure SMS_66
：
Figure SMS_67
；
Wherein u, v is the frequency domain coordinate axis, j is the imaginary unit, and the coordinate
Figure SMS_68
The element of (2) is->
Figure SMS_69
；
Step 103: the first frequency domain matrix is converted into a first frequency spectrum matrix and a first phase spectrum matrix, specifically: matrix the frequency domain
Figure SMS_70
Is>
Figure SMS_71
The elements of (2) are transformed according to the following formula to generate a first spectral matrix +.>
Figure SMS_72
And a first phase spectrum matrix->
Figure SMS_73
：
Figure SMS_74
；
Figure SMS_75
；
wherein ,
Figure SMS_76
for the first frequency domain matrix->
Figure SMS_77
At->
Figure SMS_78
The real part of complex element, < >>
Figure SMS_79
For the first frequency domain matrix->
Figure SMS_80
At->
Figure SMS_81
An imaginary part of the complex element;
step 104: establishing and obtaining a fast filter matrix, denoising the first frequency spectrum matrix to obtain a second frequency spectrum matrix, wherein when a CMOS image is subjected to line exposure, analog voltage ripple causes deviation of exposure intensity of each line due to electric appliances or process problems, and each line has inconsistent brightness under a pure dark environment, so that an electric noise signal which is represented as transverse stripes on an obtained RAW image corresponds to a certain point on a v axis (u=0) of a frequency domain, the frequency spectrum data value of the electric noise signal is obviously higher than the values of other positions, namely noise frequency points, and the noise frequency points need to be extracted and eliminated, and the method comprises the following steps:
for the first spectrum matrix
Figure SMS_82
Sequentially traversing the v axis +.>
Figure SMS_85
All points of the interval->
Figure SMS_89
Define a spectral threshold +.>
Figure SMS_83
For example +.>
Figure SMS_87
If on the v-axisSome point->
Figure SMS_88
There is->
Figure SMS_90
If true, define->
Figure SMS_84
For the first frequency domain matrix->
Figure SMS_86
And then obtaining a coordinate set meeting the electric noise frequency:
Figure SMS_91
；
a fast filter is then constructed:
Figure SMS_92
；
the fast filter is applied to the first frequency spectrum matrix to achieve the purpose of removing noise, and specifically comprises the following steps: will be
Figure SMS_93
And->
Figure SMS_94
Two matrices are associated with each other +.>
Figure SMS_95
Element multiplication at coordinates, this operation is for the first spectral matrix +.>
Figure SMS_96
Setting the amplitude value belonging to the noise source frequency coordinate set to zero, thereby generating a second spectrum matrix for removing noise>
Figure SMS_97
；
Step 105: steps 102-104 are sequentially executed on the RAW image matrix after the dark current is calibrated according to the general ISP debugging method under the 1~S multiplication benefit,the method comprises the steps of obtaining a fast filter matrix set, specifically: RAW image matrix set with 1~S times gain
Figure SMS_98
The fast filter filtering is carried out, so that a fast filter matrix set for removing the frequency domain noise frequency points under the corresponding gain is obtained:
Figure SMS_99
；
step 106: regenerating a second RAW image matrix after dark current calibration according to a general ISP debugging method under the gain Q, converting the second RAW image matrix into a second frequency domain matrix, and obtaining a third frequency spectrum matrix
Figure SMS_100
And a second phase spectrum matrix->
Figure SMS_101
The method specifically comprises the following steps: in the application scenario, with a certain analog gain +.>
Figure SMS_102
Exposing to generate a RAW image matrix, and performing dark current calibration to obtain a second RAW image matrix +.>
Figure SMS_103
The resolution of the image is +.>
Figure SMS_104
Converting the second RAW image matrix into a second frequency domain matrix, e.g., q=12;
step 107: the fast filter matrix under the gain Q in step 105 is obtained, and a fourth spectrum matrix is generated, specifically: from the i=q value, we obtain
Figure SMS_105
Concentrate corresponding +.>
Figure SMS_106
Generating a fourth spectral matrix with noise removed>
Figure SMS_107
；
Step 108: the third frequency domain matrix is obtained by calculating the fourth frequency spectrum matrix and the second phase spectrum matrix, specifically:
for the fourth spectrum matrix
Figure SMS_108
And a second phase spectrum matrix->
Figure SMS_109
Every coordinate +.>
Figure SMS_110
The elements of (2) are transformed according to the following mathematical formula to generate a denoised third frequency domain matrix +.>
Figure SMS_111
：
Figure SMS_112
；
Step 109: restoring the third frequency domain matrix into a spatial domain matrix, thereby obtaining a RAW image after removing power supply ripple noise, specifically comprising the following steps: for the third frequency domain matrix
Figure SMS_113
Every coordinate +.>
Figure SMS_114
Is converted to each coordinate +.>
Figure SMS_115
Is used for generating a spatial domain matrix after removing power supply ripple noise>
Figure SMS_116
：
Figure SMS_117
；
wherein ,
Figure SMS_118
and the RAW image matrix after the power supply ripple is removed is used for removing the power supply ripple under the corresponding analog gain, so that a RAW image with higher quality is obtained.
With further reference to fig. 2, a schematic diagram of a CMOS sensor power supply ripple noise removal device of the present invention, the CMOS sensor power supply ripple noise removal device 10 of the present invention further comprises one or more memories 20 and one or more processors 30, wherein the one or more computer programs are stored in the memories 20 and configured to be executed by the one or more processors 30, the processor 30 implementing the steps of the CMOS sensor power supply ripple noise removal method when executing the computer programs.
Those of ordinary skill in the art will appreciate that all or part of the steps in the various methods of the above embodiments may be implemented by a program to instruct related hardware, the program may be stored in a computer readable storage medium, and the storage medium may include: read Only Memory (ROM), random access Memory (RAM, random Access Memory), magnetic or optical disk, and the like.
For the foregoing method embodiments, for simplicity of explanation, the methodologies are shown as a series of acts, it is to be understood and appreciated by one of ordinary skill in the art that the claimed subject matter is not limited by the order of acts, as some steps may, in accordance with the present subject matter, occur in other orders and concurrently, and that the embodiments described herein are presented to a person of ordinary skill in the art with reference to the preferred embodiments, and that the acts and modules are not necessarily required by the present subject matter.
The steps in the method of each embodiment of the application can be sequentially adjusted, combined and deleted according to actual needs, and the technical features described in the embodiments can be replaced or combined.
The foregoing description of the preferred embodiments of the invention is not intended to be limiting, but rather is intended to cover all modifications, equivalents, and alternatives falling within the spirit and principles of the invention.

Claims (10)

1. A method for removing ripple noise of a power supply of a CMOS sensor, comprising the steps of:
step 101: shooting 1~S S matrixes under multiplication under a dark environment of a laboratory, and acquiring a first RAW image matrix under any gain after calibrating dark current according to a universal ISP (Internet service provider) debugging method for the matrix under the gain;
step 102: converting the first RAW image matrix into a first frequency domain matrix;
step 103: converting the first frequency domain matrix into a first frequency spectrum matrix and a first phase spectrum matrix;
step 104: establishing and obtaining a fast filter matrix, and denoising the first frequency spectrum matrix to obtain a second frequency spectrum matrix;
step 105: sequentially executing steps 102-104 on RAW image matrixes after dark current calibration according to a general ISP (Internet service provider) debugging method under the multiplication of 1~S to obtain a rapid filter matrix set;
step 106: regenerating a second RAW image matrix after dark current calibration according to a general ISP debugging method under a gain Q, converting the second RAW image matrix into a second frequency domain matrix, and obtaining a third frequency spectrum matrix and a second phase spectrum matrix, wherein the gain
Figure QLYQS_1
；
Step 107: acquiring a fast filter matrix under the gain Q in the step 105, and generating a fourth spectrum matrix;
step 108: calculating the fourth frequency spectrum matrix and the second phase spectrum matrix to obtain a third frequency domain matrix;
step 109: and restoring the third frequency domain matrix into a spatial domain matrix, thereby obtaining the RAW image after removing the power supply ripple noise.
2. The method of CMOS sensor power supply ripple noise removal of claim 1, wherein the RAW image matrix is formatted for i multiplication as follows:
Figure QLYQS_2
，
wherein x and y are coordinate axes of a space domain
Figure QLYQS_3
The element of (2) is->
Figure QLYQS_4
The RAW image resolution is
Figure QLYQS_5
。
3. The method of CMOS sensor power supply ripple noise removal of claim 2, wherein the first frequency domain matrix
Figure QLYQS_6
：
Figure QLYQS_7
，
Wherein u, v is the coordinate axis of the frequency domain, and the coordinate
Figure QLYQS_8
The element of (2) is->
Figure QLYQS_9
。
4. The method of removing ripple noise of a CMOS sensor power supply of claim 3, wherein the first spectral matrix
Figure QLYQS_10
And a first phase spectrum matrix->
Figure QLYQS_11
The conversion is carried out by adopting the following modes: the first frequency domain matrix->
Figure QLYQS_12
Is>
Figure QLYQS_13
The elements of (2) are transformed according to the following formula to generate a first spectral matrix +.>
Figure QLYQS_14
And a first phase spectrum matrix->
Figure QLYQS_15
：
Figure QLYQS_16
；
Figure QLYQS_17
；
wherein ,
Figure QLYQS_18
for the first frequency domain matrix->
Figure QLYQS_19
At->
Figure QLYQS_20
The real part of complex element, < >>
Figure QLYQS_21
For the first frequency domain matrix->
Figure QLYQS_22
At->
Figure QLYQS_23
Is the imaginary part of the complex element.
5. The method of CMOS sensor power supply ripple noise removal of claim 4, wherein the filter is constructed in the following manner: for the first spectrum matrix
Figure QLYQS_25
Sequentially traversing the v axis +.>
Figure QLYQS_29
All points of the interval->
Figure QLYQS_31
Define a spectral threshold +.>
Figure QLYQS_26
，/>
Figure QLYQS_27
If the point on the v-axis is +>
Figure QLYQS_30
There is->
Figure QLYQS_32
If true, define->
Figure QLYQS_24
For the first frequency domain matrix->
Figure QLYQS_28
Obtaining a coordinate set satisfying the electric noise frequency:
Figure QLYQS_33
；
a fast filter is then constructed:
Figure QLYQS_34
，
the fast filter is applied to a first frequency spectrum matrix to achieve the purpose of removing noise, and specifically comprises the following steps: will be
Figure QLYQS_35
And (3) with
Figure QLYQS_36
Two matrices are associated with each other +.>
Figure QLYQS_37
Element multiplication at coordinates, this operation is for the first spectral matrix +.>
Figure QLYQS_38
Setting the amplitude value belonging to the noise source frequency coordinate set to zero, thereby generating a second spectrum matrix for removing noise>
Figure QLYQS_39
。
6. The method of CMOS sensor power supply ripple noise removal of claim 5, wherein the set of fast filter matrices is obtained by: RAW image matrix set with 1~S times gain
Figure QLYQS_40
Steps 102-104 are executed to obtain a fast filter matrix set for removing the frequency domain noise frequency points under the corresponding gain:
Figure QLYQS_41
。
7. the method of CMOS sensor power supply ripple noise removal of claim 6, wherein the third spectral matrix and the second spectral matrix are obtained by: with analog gain
Figure QLYQS_43
Exposing to generate a RAW image matrix, and performing dark current calibration to obtain a second RAW image matrix +.>
Figure QLYQS_46
The resolution of the image is +.>
Figure QLYQS_48
Converting the second RAW image matrix into a second frequency domain matrix to further obtain a second phase spectrum matrix +.>
Figure QLYQS_42
And a third spectrum matrix
Figure QLYQS_45
From i=q value, get +.>
Figure QLYQS_47
Concentrate corresponding +.>
Figure QLYQS_49
Generating a fourth spectral matrix with noise removed>
Figure QLYQS_44
；
The third frequency domain matrix is obtained in the following manner: for the fourth spectrum matrix
Figure QLYQS_50
And a second phase spectrum matrix
Figure QLYQS_51
Every coordinate +.>
Figure QLYQS_52
The elements of (2) are converted according to the following formula to generate a denoised third frequency domain matrix +.>
Figure QLYQS_53
：
Figure QLYQS_54
Where j is an imaginary unit.
8. The method for removing ripple noise of a CMOS sensor power supply of claim 7, wherein the RAW image matrix after removing the power supply ripple is obtained by: for the third frequency domain matrix
Figure QLYQS_55
Every coordinate +.>
Figure QLYQS_56
Is converted to each coordinate +.>
Figure QLYQS_57
Generates a spatial domain matrix from which power supply ripple noise is removed
Figure QLYQS_58
：
Figure QLYQS_59
；
wherein ,
Figure QLYQS_60
and namely the RAW image matrix after the power supply ripple is removed.
9. A computer readable storage medium storing a computer program, characterized in that the computer program when executed by a processor implements the steps of the method of CMOS sensor power supply ripple noise removal according to any one of claims 1 to 8.
10. A CMOS sensor power supply ripple noise removal device, comprising:
one or more processors;
a memory; and
one or more computer programs, wherein the one or more computer programs are stored in the memory and configured to be executed by the one or more processors, characterized in that the steps of the method of CMOS sensor power supply ripple noise removal according to any one of claims 1 to 8 are implemented when the computer programs are executed by the processors.
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