CN116224057B - Switching tube switch performance test and loss analysis circuit and test method - Google Patents
Switching tube switch performance test and loss analysis circuit and test method Download PDFInfo
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- CN116224057B CN116224057B CN202310505566.9A CN202310505566A CN116224057B CN 116224057 B CN116224057 B CN 116224057B CN 202310505566 A CN202310505566 A CN 202310505566A CN 116224057 B CN116224057 B CN 116224057B
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/327—Testing of circuit interrupters, switches or circuit-breakers
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- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02B—CLIMATE CHANGE MITIGATION TECHNOLOGIES RELATED TO BUILDINGS, e.g. HOUSING, HOUSE APPLIANCES OR RELATED END-USER APPLICATIONS
- Y02B70/00—Technologies for an efficient end-user side electric power management and consumption
- Y02B70/10—Technologies improving the efficiency by using switched-mode power supplies [SMPS], i.e. efficient power electronics conversion e.g. power factor correction or reduction of losses in power supplies or efficient standby modes
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- Testing Electric Properties And Detecting Electric Faults (AREA)
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Abstract
The invention provides a switching tube switching performance test and loss analysis circuit and a testing method thereof, wherein the circuit comprises a direct current power supply V in Input filter capacitor C in The power switching device comprises a first power switching tube S1, a second power switching tube S2, a third power switching tube Q1, a power inductor L and an output capacitor C o Load resistor R o The source electrode of the first power switch tube S1 is connected with the drain electrode of the second power switch tube S2, the two ends of the power inductor L are respectively connected with the drain electrode of the second power switch tube S2 and the drain electrode of the third power switch tube Q1, and the direct current power supply V in And the input filter capacitor C in The anode of the first power switch tube S1 is connected with the drain electrode of the first power switch tube S1 in parallel, the cathode of the first power switch tube S1 is grounded, and the output capacitor C o And the load resistor R o Are all directly connected in parallel with the third power switch tube Q1.
Description
Technical Field
The invention relates to the technical field of switching tube testing, in particular to a switching tube switching performance testing and loss analysis circuit and a testing method.
Background
With the development of deep sea detection technology, deep sea unmanned platforms such as a submarine observation network, a deep sea lander and the like are required to be carried with efficient electric energy conversion devices so as to meet the power requirements of ROVs, communication equipment, searchlight and the like and ensure the safe and stable operation of deep sea scientific investigation equipment. The DC-DC converter power supply is a power conversion device which is applied underwater and is more, the power switch tube is a core device of the DC-DC converter power supply and controls the cut-off and the cut-on of a circuit, and loss can be generated in the high-frequency switching process, so that the efficiency of the converter is reduced.
In the design of a high-frequency switching power supply, a double-pulse test circuit is commonly used for testing switching performances such as loss of a power switching tube in a switching process, and is an important mode for evaluating the switching performances of the switching tube. However, in the high-frequency working state, the influence of the parasitic parameter of the switching tube on the switching performance is more remarkable, in the double-pulse test of the existing two switching processes, the switching tube performs the two switching processes, and in the high-frequency working state, the influence of the parasitic parameter of the switching tube on the switching performance is more remarkable, so that the switching characteristic of the switching tube under the high-frequency continuous working condition cannot be accurately reflected only by the double-pulse test of the two switching processes.
The loss of the switching tube in a switching process can be calculated through a double-pulse test, and the method is an important mode for evaluating the switching performance of the switching tube. However, with the innovation of technology, gaN and SiC high-frequency switching tubes are increasingly and widely used, and the switching frequency is obviously improved, so that the high-frequency switching performance of the high-frequency switching tube cannot be completely described only by double-pulse test, and a circuit is needed at this time, so that the function of a double-pulse test circuit can be realized, and the switching tube can be tested under the continuous high-frequency working condition.
Disclosure of Invention
The invention aims to provide a switching tube switching performance test and loss analysis circuit for solving the problems in the background technology.
The invention is realized by the following technical scheme: the first aspect of the invention discloses a switching tube switching performance test and loss analysis circuit, which comprises a direct current power supply V in Input filter capacitor C in The power switching device comprises a first power switching tube S1, a second power switching tube S2, a third power switching tube Q1, a power inductor L and an output capacitor C o Load resistor R o The source electrode of the first power switch tube S1 is connected with the drain electrode of the second power switch tube S2, the two ends of the power inductor L are respectively connected with the drain electrode of the second power switch tube S2 and the drain electrode of the third power switch tube Q1, and the direct current power supply V in And the input filter capacitor C in The anode of the first power switch tube S1 is connected with the drain electrode of the first power switch tube S1 in parallel, the cathode of the first power switch tube S1 is grounded, and the output capacitor C o And the load resistor R o Are all directly connected in parallel with the third power switch tube Q1.
Optionally, when a high level is applied to the gate of the third power switch tube Q1 and a low level is applied to the gate of the second power switch tube S2, the circuit forms a double pulse test circuit for performing a double pulse test on the first power switch tube S1 and the second power switch tube S2.
Optionally, when a low level is applied to the gate of the third power switch tube Q1, the circuit forms a BUCK circuit, and is used for performing high-frequency switch test on the first power switch tube S1 and the second power switch tube S2.
The invention discloses a testing method based on the switching tube switching performance testing and loss analysis circuit, which comprises the following steps:
when the circuit forms a double pulse test circuit;
the grid electrode of the first power switching tube S1 is applied with double pulses, when the first pulse arrives, the first power switching tube S1 is conducted, and the direct current power supply V in Charging a power inductor L, wherein the current of the power inductor L rises linearly;
after the first pulse is ended, the first power switch tube S1 is turned off, and the direct current power supply V in Stopping charging the power inductor L, and the current I of the power inductor L L Freewheeling through the body diode of the second power switch tube S2;
when the second pulse arrives, the first power switch tube S1 is turned on, the body diode of the second power switch tube S2 is turned off due to the reverse voltage, and the direct current power supply V in Charging the power inductor L again;
recording the voltage V when the first power switch tube S1 is turned on or turned off ds And current I ds Voltage V when the second power switch S2 body diode is turned off d And current I d ；
And analyzing the switching performance of the switching tube according to the switching waveform, and calculating to obtain the switching loss of the switching tube.
Optionally, the test method further includes:
when the circuit forms a BUCK circuit, the first power switching tube S1 and the second power switching tube S2 are alternately conducted at a certain switching frequency,
calculating the loss of the BUCK circuit according to the conversion efficiency of the BUCK circuit;
the loss of the BUCK circuit is subtracted by the loss of the inductor and the capacitor, so that the switching loss can be obtained.
Optionally, the switching loss obtained by the double pulse test is compared with the switching loss obtained by the BUCK circuit high-frequency switching test, and if the results are similar, the tested switching tube has good high-frequency characteristics and meets the requirements.
Compared with the prior art, the invention has the following beneficial effects:
compared with the traditional double-pulse test circuit, the switching performance test and loss analysis circuit and the testing method for the switching tube provided by the invention have the advantages that the BUCK circuit is added, the performances such as the loss and the like of the power switching tube in the switching process can be tested, and the switching tube can be tested under the continuous high-frequency working condition. The switching loss obtained by the double pulse test is compared with the switching loss obtained by the BUCK circuit high-frequency switching test, if the results are similar, the switching performance of the tested switching tube is not affected by parasitic parameters under the high-frequency continuous working condition, the tested switching tube has excellent switching performance and manufacturing process, the parasitic effect is effectively inhibited, and the characteristics of the switching tube are basically stable, so that the high-frequency switching tube is suitable for high-frequency switching application.
Drawings
In order to more clearly illustrate the technical solutions of the embodiments of the present invention, the drawings required for the description of the embodiments will be briefly described below, it being obvious that the drawings in the following description are only preferred embodiments of the present invention, and that other drawings may be obtained according to these drawings without inventive effort for a person skilled in the art.
Fig. 1 is a schematic diagram of a switching tube performance test and loss analysis circuit of the present disclosure.
Fig. 2 is a schematic diagram illustrating a functional control of a switching tube performance test and loss analysis circuit implementing a double pulse test circuit according to an exemplary embodiment of the present disclosure.
Fig. 3 is a schematic diagram illustrating a control of a BUCK circuit function implemented by a switching tube performance test and loss analysis circuit according to an exemplary embodiment of the present disclosure.
Detailed Description
In order to make the objects, technical solutions and advantages of the present invention more apparent, exemplary embodiments according to the present invention will be described in detail with reference to the accompanying drawings. It should be apparent that the described embodiments are only some embodiments of the present invention and not all embodiments of the present invention, and it should be understood that the present invention is not limited by the example embodiments described herein. Based on the embodiments of the invention described in the present application, all other embodiments that a person skilled in the art would have without inventive effort shall fall within the scope of the invention.
In the following description, numerous specific details are set forth in order to provide a more thorough understanding of the present invention. It will be apparent, however, to one skilled in the art that the invention may be practiced without one or more of these details. In other instances, well-known features have not been described in detail in order to avoid obscuring the invention.
It should be understood that the present invention may be embodied in various forms and should not be construed as limited to the embodiments set forth herein. Rather, these embodiments are provided so that this disclosure will be thorough and complete, and will fully convey the scope of the invention to those skilled in the art.
The terminology used herein is for the purpose of describing particular embodiments only and is not intended to be limiting of the invention. As used herein, the singular forms "a", "an" and "the" are intended to include the plural forms as well, unless the context clearly indicates otherwise. It will be further understood that the terms "comprises" and/or "comprising," when used in this specification, specify the presence of stated features, integers, steps, operations, elements, and/or components, but do not preclude the presence or addition of one or more other features, integers, steps, operations, elements, components, and/or groups thereof. As used herein, the term "and/or" includes any and all combinations of the associated listed items.
In order to provide a thorough understanding of the present invention, detailed structures will be presented in the following description in order to illustrate the technical solutions presented by the present invention. Alternative embodiments of the invention are described in detail below, however, the invention may have other implementations in addition to these detailed descriptions.
Referring to fig. 1 to 3, a first aspect of the present invention discloses a switching performance test and loss analysis circuit for a switching tube, the circuit comprising a dc power supply V in Input filter capacitor C in The power switching device comprises a first power switching tube S1, a second power switching tube S2, a third power switching tube Q1, a power inductor L and an output capacitor C o Load resistor R o The source electrode of the first power switch tube S1 is connected with the drain electrode of the second power switch tube S2, the two ends of the power inductor L are respectively connected with the drain electrode of the second power switch tube S2 and the drain electrode of the third power switch tube Q1, and the direct current power supply V in And the input filter capacitor C in The anode of the first power switch tube S1 is connected with the drain electrode of the first power switch tube S1 in parallel, the cathode of the first power switch tube S1 is grounded, and the output capacitor C o And the load resistor R o Are all directly connected in parallel with the third power switch tube Q1.
The invention discloses a switching tube switching performance test and loss analysis circuit, which integrates a BUCK circuit and a double-pulse test circuit, not only can test the performance of a power switching tube such as loss in the switching process, but also can test the switching tube under the continuous high-frequency working condition, and when a high level is applied to the grid electrode of a third power switching tube Q1, the third power switching tube Q1 is in a conducting state constantly; applying a low level to the grid electrode of the second power switch tube S2 to enable the second power switch tube S2 to be in an off state constantly, wherein a body diode of the second power switch tube S2 is used as a reverse freewheeling diode, and the circuit is a double-pulse test circuit and can perform double-pulse test on the first power switch tube S1 and the second power switch tube S2;
when a low level is applied to the grid electrode of the third power switch tube Q1, the third power switch tube Q1 is in an off state constantly, the circuit is a BUCK circuit, and high-frequency switch tests can be conducted on the first power switch tube S1 and the second power switch tube S2.
Specifically, when a high level is applied to the gate of the third power switch tube Q1 and a low level is applied to the gate of the second power switch tube S2, the circuit forms a double pulse test circuit for performing a double pulse test on the first power switch tube S1 and the second power switch tube S2.
Specifically, when a low level is applied to the gate of the third power switch tube Q1, the circuit forms a BUCK circuit, and is used for performing a high-frequency switch test on the first power switch tube S1 and the second power switch tube S2.
The invention discloses a testing method based on the switching tube switching performance testing and loss analysis circuit, which comprises the following steps:
when the circuit forms a double pulse test circuit;
the grid electrode of the first power switching tube S1 is applied with double pulses, when the first pulse arrives, the first power switching tube S1 is conducted, and the direct current power supply V in Charging a power inductor L, the current of which rises linearly, and at the end of the first pulse, the current I of which L The value of the switching current to be tested should be exactly reached;
after the first pulse is ended, the first power switch tube S1 is turned off, and the direct current power supply V in Stopping charging the power inductor L, and the current I of the power inductor L L Freewheeling through the body diode of the second power switch tube S2, wherein the current of the power inductor L is basically kept unchanged;
the second pulse comes, the first power switch tube S1 is turned on, the body diode of the second power switch tube S2 is turned off due to the bearing of reverse voltage, and the direct current power supply V in Charging the power inductor L again, ending the test after the second pulse is ended and the energy storage of the power inductor L is discharged,
in the above process, the voltage V when the first power switch tube S1 is turned on or off is recorded ds And current I ds Voltage V when the second power switch S2 body diode is turned off d And current I d And analyzing the switching performance of the switching tube according to the switching waveform, and calculating to obtain the switching loss of the switching tube.
Further, the test method further comprises:
when the circuit forms a BUCK circuit, the controller generates a driving signal to drive the first power switch tube S1 and the second power switch tube S2 in the BUCK circuit, the first power switch tube S1 and the second power switch tube S2 are alternately conducted at a certain switching frequency, and the controller is not a main part of the circuit, so that the details are not described.
Under the high-frequency working condition, the loss of the BUCK circuit is mainly switching loss, and the loss of the BUCK circuit is calculated according to the conversion efficiency of the BUCK circuit, wherein the conversion efficiency=output power/input power;
the loss of the BUCK circuit is subtracted by the loss of the inductor and the capacitor, so that the switching loss can be obtained.
Comparing the switching loss obtained by the double pulse test with the switching loss obtained by the BUCK circuit high-frequency switching test, if the results are consistent, the conditions that the results are similar are included in the consistent results, namely, the difference value of the switching loss results is within a threshold range or is zero, the switching performance of the tested switching tube is not influenced by parasitic parameters under the high-frequency continuous working condition, the tested switching tube has excellent switching performance and manufacturing process, the parasitic effect is effectively inhibited, and the characteristics of the switching tube are basically stable, so that the switching tube is suitable for high-frequency switching application.
The foregoing description of the preferred embodiments of the invention is not intended to be limiting, but rather to enable any modification, equivalent replacement, improvement or the like to be made within the spirit and principles of the invention.
Claims (1)
1. A switching tube switch performance test and loss analysis circuit is characterized by comprising a direct-current power supply V in Input filter capacitor C in The power switching device comprises a first power switching tube S1, a second power switching tube S2, a third power switching tube Q1, a power inductor L and an output capacitor C o Load resistor R o The source electrode of the first power switch tube S1 is connected with the drain electrode of the second power switch tube S2, the two ends of the power inductor L are respectively connected with the drain electrode of the second power switch tube S2 and the drain electrode of the third power switch tube Q1, the source electrode of the second power switch tube S2 and the third powerThe sources of the switch tube Q1 are all grounded, and the direct current power supply V in And the input filter capacitor C in The anode of the first power switch tube S1 is connected with the drain electrode of the first power switch tube S1 in parallel, the cathode of the first power switch tube S1 is grounded, and the output capacitor C o And the load resistor R o Are directly connected with the third power switch tube Q1 in parallel;
when a high level is applied to the gate of the third power switch tube Q1 and a low level is applied to the gate of the second power switch tube S2, the switch tube switch performance test and loss analysis circuit forms a double pulse test circuit for performing a double pulse test on the first power switch tube S1 and the second power switch tube S2;
when a low level is applied to the grid electrode of the third power switch tube Q1, the switch tube switch performance test and loss analysis circuit forms a BUCK circuit and is used for performing high-frequency switch test on the first power switch tube S1 and the second power switch tube S2;
the switching tube switching performance test and loss analysis circuit is applied to a test method, and the test method comprises the following steps:
when the circuit forms a double pulse test circuit;
the grid electrode of the first power switching tube S1 is applied with double pulses, when the first pulse arrives, the first power switching tube S1 is conducted, and the direct current power supply V in Charging a power inductor L, wherein the current of the power inductor L rises linearly;
after the first pulse is ended, the first power switch tube S1 is turned off, and the direct current power supply V in Stopping charging the power inductor L, and the current I of the power inductor L L Freewheeling through the body diode of the second power switch tube S2;
when the second pulse arrives, the first power switch tube S1 is turned on, the body diode of the second power switch tube S2 is turned off due to the reverse voltage, and the direct current power supply V in Charging the power inductor L again;
when the second pulse is over, the voltage V is recorded when the first power switch tube S1 is turned on or off ds And current I ds Voltage V when the second power switch S2 body diode is turned off d And current I d ；
Analyzing the switching performance of the switching tube according to the switching waveform, and calculating to obtain the switching loss of the switching tube;
the test method further comprises the following steps:
when the circuit forms a BUCK circuit, the first power switching tube S1 and the second power switching tube S2 are alternately conducted at a certain switching frequency,
calculating the loss of the BUCK circuit according to the conversion efficiency of the BUCK circuit;
subtracting the loss of the inductor and the capacitor from the loss of the BUCK circuit to obtain switching loss;
and comparing the switching loss obtained by the double-pulse test with the switching loss obtained by the BUCK circuit high-frequency switching test, and if the results are consistent, indicating that the tested switching tube meets the requirements.
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Citations (13)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5402329A (en) * | 1992-12-09 | 1995-03-28 | Ernest H. Wittenbreder, Jr. | Zero voltage switching pulse width modulated power converters |
| US6809560B1 (en) * | 2003-07-11 | 2004-10-26 | Micrel, Inc. | Load sensing circuit for a power MOSFET switch |
| WO2013163776A1 (en) * | 2012-05-02 | 2013-11-07 | 上海康威特吉能源技术有限公司 | Dual-input step-up/step-down converter of wide input voltage range |
| CN103401419A (en) * | 2013-06-21 | 2013-11-20 | 燕山大学 | Bidirectional double-input BUCK/BUCKBOOST dc converter and power distribution method thereof |
| CN103777086A (en) * | 2012-10-22 | 2014-05-07 | 中国北车集团大同电力机车有限责任公司 | Double-pulse test device for power module |
| CN105974234A (en) * | 2016-05-31 | 2016-09-28 | 西安许继电力电子技术有限公司 | T-shaped three-level converter power module double-pulse testing loop and testing method |
| CN109374996A (en) * | 2018-08-17 | 2019-02-22 | 国电南瑞科技股份有限公司 | A kind of the dipulse test circuit and method of three level DCDC (PCC) power of striding capacitance |
| CN111650491A (en) * | 2020-06-15 | 2020-09-11 | 中车青岛四方车辆研究所有限公司 | Equivalent simplified double-pulse test circuit and method for flying capacitor multi-level inverter |
| CN112147478A (en) * | 2020-08-07 | 2020-12-29 | 北京交通大学 | Wide bandgap semiconductor power device parameter test platform and method |
| CN112583266A (en) * | 2020-12-15 | 2021-03-30 | 北京航空航天大学 | Model prediction control method, system, equipment and medium of Buck-Boost converter |
| CN113252987A (en) * | 2021-07-05 | 2021-08-13 | 西安众力为半导体科技有限公司 | Dynamic resistance test circuit of GaN HEMT power device |
| CN114244104A (en) * | 2021-12-24 | 2022-03-25 | 安徽工业大学 | High-gain zero-ripple passive clamping type Boost converter and control method thereof |
| CN114598169A (en) * | 2022-03-24 | 2022-06-07 | 郑州大学 | Control method of synchronous rectification BUCK circuit used in DCM mode |
Family Cites Families (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US11527958B2 (en) * | 2020-06-03 | 2022-12-13 | Apple Inc. | Three-switch power converter |
-
2023
- 2023-05-08 CN CN202310505566.9A patent/CN116224057B/en active Active
Patent Citations (13)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5402329A (en) * | 1992-12-09 | 1995-03-28 | Ernest H. Wittenbreder, Jr. | Zero voltage switching pulse width modulated power converters |
| US6809560B1 (en) * | 2003-07-11 | 2004-10-26 | Micrel, Inc. | Load sensing circuit for a power MOSFET switch |
| WO2013163776A1 (en) * | 2012-05-02 | 2013-11-07 | 上海康威特吉能源技术有限公司 | Dual-input step-up/step-down converter of wide input voltage range |
| CN103777086A (en) * | 2012-10-22 | 2014-05-07 | 中国北车集团大同电力机车有限责任公司 | Double-pulse test device for power module |
| CN103401419A (en) * | 2013-06-21 | 2013-11-20 | 燕山大学 | Bidirectional double-input BUCK/BUCKBOOST dc converter and power distribution method thereof |
| CN105974234A (en) * | 2016-05-31 | 2016-09-28 | 西安许继电力电子技术有限公司 | T-shaped three-level converter power module double-pulse testing loop and testing method |
| CN109374996A (en) * | 2018-08-17 | 2019-02-22 | 国电南瑞科技股份有限公司 | A kind of the dipulse test circuit and method of three level DCDC (PCC) power of striding capacitance |
| CN111650491A (en) * | 2020-06-15 | 2020-09-11 | 中车青岛四方车辆研究所有限公司 | Equivalent simplified double-pulse test circuit and method for flying capacitor multi-level inverter |
| CN112147478A (en) * | 2020-08-07 | 2020-12-29 | 北京交通大学 | Wide bandgap semiconductor power device parameter test platform and method |
| CN112583266A (en) * | 2020-12-15 | 2021-03-30 | 北京航空航天大学 | Model prediction control method, system, equipment and medium of Buck-Boost converter |
| CN113252987A (en) * | 2021-07-05 | 2021-08-13 | 西安众力为半导体科技有限公司 | Dynamic resistance test circuit of GaN HEMT power device |
| CN114244104A (en) * | 2021-12-24 | 2022-03-25 | 安徽工业大学 | High-gain zero-ripple passive clamping type Boost converter and control method thereof |
| CN114598169A (en) * | 2022-03-24 | 2022-06-07 | 郑州大学 | Control method of synchronous rectification BUCK circuit used in DCM mode |
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|---|---|
| CN116224057A (en) | 2023-06-06 |
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