CN116203031A - Industrial product defect intelligent detection system based on microwave and machine vision technology - Google Patents
Industrial product defect intelligent detection system based on microwave and machine vision technology Download PDFInfo
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
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- G—PHYSICS
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- G01S—RADIO DIRECTION-FINDING; RADIO NAVIGATION; DETERMINING DISTANCE OR VELOCITY BY USE OF RADIO WAVES; LOCATING OR PRESENCE-DETECTING BY USE OF THE REFLECTION OR RERADIATION OF RADIO WAVES; ANALOGOUS ARRANGEMENTS USING OTHER WAVES
- G01S13/00—Systems using the reflection or reradiation of radio waves, e.g. radar systems; Analogous systems using reflection or reradiation of waves whose nature or wavelength is irrelevant or unspecified
- G01S13/86—Combinations of radar systems with non-radar systems, e.g. sonar, direction finder
- G01S13/867—Combination of radar systems with cameras
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- G01S13/00—Systems using the reflection or reradiation of radio waves, e.g. radar systems; Analogous systems using reflection or reradiation of waves whose nature or wavelength is irrelevant or unspecified
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- G01S13/00—Systems using the reflection or reradiation of radio waves, e.g. radar systems; Analogous systems using reflection or reradiation of waves whose nature or wavelength is irrelevant or unspecified
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- G01N21/84—Systems specially adapted for particular applications
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- G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
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Abstract
The invention discloses an industrial defect intelligent detection system based on microwave and machine vision technology, which comprises: a detection system and an imaging system; the detection system is connected with the imaging system and is used for measuring an object to be measured to obtain measurement data and transmitting the measurement data to the imaging system; the imaging system is used for modeling based on the measurement data to obtain target imaging; and transmitting the target imaging to the detection system, wherein the detection system carries out nondestructive detection on the object to be detected based on the target imaging. The invention fuses and crosses microwave detection and machine vision, and improves industrial intelligent detection efficiency by using intelligent technology. The nondestructive testing of multiple angles, multiple aspects and multiple dimensions can be realized to determine the sample defects, and the rapid measurement of the physical properties, the technological parameters and other non-electric quantities of the object to be tested is realized.
Description
Technical Field
The invention belongs to the technical field of nondestructive testing, and particularly relates to an industrial product defect intelligent detection system based on microwave and machine vision technologies.
Background
The application field of the nondestructive testing industry is continuously expanded along with the high-speed development of economy, and the market scale is kept in a rapidly growing situation. As a main technology in the nondestructive testing industry, the microwave detection is gradually updated, and the identification accuracy and efficiency are continuously improved, and meanwhile, the development of new generation artificial intelligence and the development of advanced sensing technology are combined, so that the microwave detection technology is new. The microwave detection technology is an emerging comprehensive nondestructive detection technology based on microwave physics, electronics and microwave measurement. The microwave is used as information carrier to detect and diagnose various applicable material components and natural phenomena, and the method is mainly characterized by carrying out non-contact and non-pollution rapid and high-precision measurement and monitoring on non-electric quantity such as object performance, technological parameters and the like. It is becoming increasingly important in applications such as non-metal, composite, metal surface detection, and ground, lake bottom, and subsurface mineral perspective. Machine vision has been widely used as a high-new imaging technology for replacing human eyes with machines, and the application range of the imaging technology is expanded from the electronic and semiconductor fields to various fields such as industry, traffic, medical treatment and the like. The machine vision can develop rapidly, and is indispensible from the high stability, high resolution, high speed, environmental adaptability and the like. The remote detection device not only can obtain more accurate and clearer image data, but also can ensure the safety of the target object and operators. However, technologies based on microwave in combination with machine vision are still being explored.
Disclosure of Invention
The invention aims to solve the defects of the prior art, and provides an industrial product defect intelligent detection system based on microwave and machine vision technology, which fuses and crosses microwave detection and machine vision to improve industrial intelligent monitoring efficiency.
In order to achieve the above object, the present invention provides the following solutions: industrial product defect intelligent detection system based on microwave and machine vision technique includes: a detection system and an imaging system;
the detection system is connected with the imaging system and is used for measuring an object to be measured to obtain measurement data and transmitting the measurement data to the imaging system;
the imaging system is used for modeling based on the measurement data to obtain target imaging; and transmitting the target imaging to the detection system, wherein the detection system carries out nondestructive detection on the object to be detected based on the target imaging.
Preferably, the detection system comprises: the device comprises a microwave detection device, an image acquisition device and a computing device;
the microwave detection device is connected with the imaging system and is used for measuring the object to be measured to obtain the measurement data;
the image acquisition device is connected with the computing equipment and is used for acquiring image data of the object to be detected based on machine vision;
the computing device is used for carrying out nondestructive testing on the object to be tested based on the target imaging and the image data.
Preferably, the microwave detection device includes: a signal generating unit, a signal transmitting unit and a receiving antenna;
the signal generating unit is used for generating a microwave signal and transmitting the microwave signal to an object to be detected through the signal transmitting unit;
the receiving antenna is used for receiving echo signals of an object to be detected and transmitting the echo signals to the imaging system.
Preferably, the method for obtaining the target imaging by the imaging system comprises the following steps:
sampling the echo signals to obtain an echo matrix;
preprocessing the echo matrix, and generating a two-dimensional image of the object to be detected based on the preprocessed echo matrix;
the target image is generated based on the two-dimensional image.
Preferably, the pretreatment method comprises the following steps:
expanding the echo matrix to obtain an expanded matrix;
and performing signal screening, time delay compensation and superposition processing on the expansion matrix to obtain the preprocessed echo matrix.
Preferably, the method of generating the target image comprises:
constructing a signal measurement vector;
performing minimum dimension reduction processing and scattering signal optimal estimation on the signal measurement vector to obtain a three-dimensional image construction model;
and constructing a model based on the three-dimensional image to obtain three-dimensional image data, and generating the target imaging based on the three-dimensional image data.
Preferably, the image acquisition device comprises a transmission mechanism, acquisition equipment and processing equipment;
the transmission mechanism is used for carrying the acquisition equipment to acquire data of the object to be detected to obtain the image data;
the processing device is used for carrying out data processing based on the image data to obtain image information.
Preferably, the computing device includes a microwave computing unit and an image computing unit;
the microwave computing unit is used for computing the target imaging to obtain an internal damage result of the object to be detected;
the image calculation unit is used for calculating based on the image data to obtain a damage result of the surface of the object to be detected.
Compared with the prior art, the invention has the beneficial effects that:
the intelligent detection system for the industrial defects based on the microwave and machine vision technology provided by the invention fuses and crosses the microwave detection and the machine vision, and improves the intelligent detection efficiency of the industry by using the intelligent technology. The nondestructive testing of multiple angles, multiple aspects and multiple dimensions can be realized to determine the sample defects, and the rapid measurement of the physical properties, the technological parameters and other non-electric quantities of the object to be tested is realized.
Drawings
In order to more clearly illustrate the technical solutions of the present invention, the drawings that are needed in the embodiments are briefly described below, and it is obvious that the drawings in the following description are only some embodiments of the present invention, and that other drawings can be obtained according to these drawings without inventive effort for a person skilled in the art.
FIG. 1 is a schematic diagram of an intelligent detection system for industrial defects based on microwave and machine vision technology according to an embodiment of the present invention;
FIG. 2 is a schematic diagram of an embodiment of a detection system applied in industry.
Detailed Description
The following description of the embodiments of the present invention will be made clearly and completely with reference to the accompanying drawings, in which it is apparent that the embodiments described are only some embodiments of the present invention, but not all embodiments. All other embodiments, which can be made by those skilled in the art based on the embodiments of the invention without making any inventive effort, are intended to be within the scope of the invention.
In order that the above-recited objects, features and advantages of the present invention will become more readily apparent, a more particular description of the invention will be rendered by reference to the appended drawings and appended detailed description.
Example 1
Referring to fig. 1, a schematic structural diagram of an industrial defect intelligent detection system based on microwave and machine vision technology according to a first embodiment of the present invention includes: a detection system and an imaging system;
the detection system is connected with the imaging system and is used for measuring an object to be measured to obtain measurement data and transmitting the measurement data to the imaging system; the imaging system is used for modeling based on the measurement data to obtain target imaging; and transmitting the target imaging to a detection system, and carrying out nondestructive detection on the object to be detected by the detection system based on the target imaging.
Specifically, in this embodiment, the detection system includes: the device comprises a microwave detection device, an image acquisition device and a computing device; the microwave detection device is connected with the imaging system and is used for measuring an object to be measured to obtain measurement data; the image acquisition device is connected with the computing equipment and is used for acquiring image data of the object to be detected based on machine vision; the computing device is used for carrying out nondestructive testing on the object to be tested based on target imaging and image data.
In this embodiment, the microwave detection apparatus includes: a signal generating unit, a signal transmitting unit and a receiving antenna; the signal generating unit is used for generating a microwave signal and transmitting the microwave signal to the object to be detected through the signal transmitting unit; the receiving antenna is used for receiving echo signals of the object to be detected and transmitting the echo signals to the imaging system.
The method for obtaining the target imaging by the imaging system comprises the following steps:
firstly, sampling echo signals to obtain an echo matrix;
specifically, the scattered echo signals collected by an antenna array formed by the L groups of receiving antennas are sampled in time, and the sampling number is M. And combining echo signal data obtained by sampling the L groups of echo signals to obtain an echo matrix of M x L.
Preprocessing an echo matrix, and generating a two-dimensional image of an object to be detected based on the preprocessed echo matrix;
in this embodiment, the pretreatment method includes:
expanding the echo matrix to obtain an expanded matrix;
and performing signal screening, time delay compensation and superposition processing on the expansion matrix to obtain a preprocessed echo matrix. Specifically, performing N times of expansion processing on the echo matrix to obtain an expansion matrix; and calculating the time delay from each point to the receiving antenna, performing time delay compensation and superposition processing on the discrete echo signals received by each receiving antenna, obtaining the energy distribution information of the preprocessed echo matrix, and further generating a two-dimensional image.
Target imaging is generated based on the two-dimensional image.
In this embodiment, a method for generating an object image includes:
constructing a signal measurement vector;
in this embodiment, the signal measurement vector is expressed as:
a＝GB+b
where a represents a signal measurement vector, G represents an echo matrix of m×l, B represents a matrix of discrete signal parameters in all two-dimensional images, and B represents an error.
Performing minimized dimension reduction processing and scattering signal optimal estimation on the signal measurement vector to obtain a three-dimensional image construction model;
and constructing a model based on the three-dimensional image to obtain three-dimensional image data, and generating target imaging based on the three-dimensional image data.
Specifically, firstly, converting a complex form of a signal measurement vector into an equation of a real form;
then it is subjected to L 1 The norm minimizes the dimension reduction to obtain scattering point positions and the number in the signal measurement vector; screening the positions of the scattering points, eliminating false scattering points, and obtaining a three-dimensional image construction model;
scattering points (i.e., three-dimensional image data in this embodiment) that cancel false scattering points are highly dimensionally focused, resulting in imaging of the target.
The image acquisition device includes: the device comprises a transmission mechanism, acquisition equipment and processing equipment;
the transmission mechanism is used for carrying out data acquisition on the object to be detected by the acquisition equipment to obtain image data; in the embodiment, the acquisition equipment adopts a camera to acquire image data of an object to be detected; the processing device is used for carrying out data processing based on the image data to obtain image information. The specific method comprises the following steps:
after obtaining image data of an object to be detected, screening out unqualified images, and extracting ROI (region of interest) from the screened image data;
and extracting texture features of the ROI to obtain a histogram, and constructing a feature vector based on the histogram.
The computing device comprises a microwave computing unit and an image computing unit; in this embodiment, the computing device employs a computer; FIG. 2 is a schematic diagram of the industrial application of the detection system of the present invention.
The microwave computing unit is used for computing the target imaging to obtain an internal damage result of the object to be detected;
the image calculation unit is used for calculating based on the image data to obtain a damage result of the surface of the object to be detected.
The method for obtaining the internal damage result of the object to be detected by the microwave computing unit comprises the following steps:
determining damage characteristic points based on echo signals, and obtaining damage positions and shapes based on the damage characteristic points;
toxin expelling is carried out on the damage characteristic points according to the depth to obtain a characteristic point set;
performing difference processing on the characteristic point set by adopting voxler software to obtain dense point data; and performing three-dimensional display on the damage based on the dense point data.
The method for obtaining the damage result of the surface of the object to be detected by the image computing unit comprises the following steps:
and judging whether the surface of the object to be detected is damaged or not by calculating the Euclidean distance between the feature vector and the standard feature vector stored in the database.
The above embodiments are merely illustrative of the preferred embodiments of the present invention, and the scope of the present invention is not limited thereto, but various modifications and improvements made by those skilled in the art to which the present invention pertains are made without departing from the spirit of the present invention, and all modifications and improvements fall within the scope of the present invention as defined in the appended claims.
Claims (8)
1. Industrial product defect intelligent detection system based on microwave and machine vision technique, its characterized in that includes: a detection system and an imaging system;
the detection system is connected with the imaging system and is used for measuring an object to be measured to obtain measurement data and transmitting the measurement data to the imaging system;
the imaging system is used for modeling based on the measurement data to obtain target imaging; and transmitting the target imaging to the detection system, wherein the detection system carries out nondestructive detection on the object to be detected based on the target imaging.
2. The intelligent detection system for defects in industrial products based on microwave and machine vision technology according to claim 1, wherein said detection system comprises: the device comprises a microwave detection device, an image acquisition device and a computing device;
the microwave detection device is connected with the imaging system and is used for measuring the object to be measured to obtain the measurement data;
the image acquisition device is connected with the computing equipment and is used for acquiring image data of the object to be detected based on machine vision;
the computing device is used for carrying out nondestructive testing on the object to be tested based on the target imaging and the image data.
3. The intelligent detection system for defects in industrial products based on the technology of microwaves and machine vision according to claim 2, wherein said microwave detection device comprises: a signal generating unit, a signal transmitting unit and a receiving antenna;
the signal generating unit is used for generating a microwave signal and transmitting the microwave signal to an object to be detected through the signal transmitting unit;
the receiving antenna is used for receiving echo signals of an object to be detected and transmitting the echo signals to the imaging system.
4. The intelligent detection system for defects in industrial products based on microwave and machine vision technology according to claim 3, wherein the method for obtaining the target image by the imaging system comprises the following steps:
sampling the echo signals to obtain an echo matrix;
preprocessing the echo matrix, and generating a two-dimensional image of the object to be detected based on the preprocessed echo matrix;
the target image is generated based on the two-dimensional image.
5. The intelligent detection system for defects in industrial products based on microwave and machine vision technology according to claim 4, wherein the pretreatment method comprises:
expanding the echo matrix to obtain an expanded matrix;
and performing signal screening, time delay compensation and superposition processing on the expansion matrix to obtain the preprocessed echo matrix.
6. The intelligent detection system for defects in industrial products based on microwave and machine vision technology according to claim 4, wherein the method for generating the target image comprises:
constructing a signal measurement vector;
performing minimum dimension reduction processing and scattering signal optimal estimation on the signal measurement vector to obtain a three-dimensional image construction model;
and constructing a model based on the three-dimensional image to obtain three-dimensional image data, and generating the target imaging based on the three-dimensional image data.
7. The intelligent detection system for defects of industrial products based on the microwave and machine vision technology according to claim 2, wherein the image acquisition device comprises a transmission mechanism, acquisition equipment and processing equipment;
the transmission mechanism is used for carrying the acquisition equipment to acquire data of the object to be detected to obtain the image data;
the processing device is used for carrying out data processing based on the image data to obtain image information.
8. The intelligent detection system for industrial defects based on microwave and machine vision technology according to claim 2, wherein the computing device comprises a microwave computing unit and an image computing unit;
the microwave computing unit is used for computing the target imaging to obtain an internal damage result of the object to be detected;
the image calculation unit is used for calculating based on the image data to obtain a damage result of the surface of the object to be detected.
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