CN116202641A - Oven, temperature uniformity testing method and device thereof and storage medium - Google Patents
Oven, temperature uniformity testing method and device thereof and storage medium Download PDFInfo
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- CN116202641A CN116202641A CN202310309779.4A CN202310309779A CN116202641A CN 116202641 A CN116202641 A CN 116202641A CN 202310309779 A CN202310309779 A CN 202310309779A CN 116202641 A CN116202641 A CN 116202641A
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- oven
- temperature
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01K—MEASURING TEMPERATURE; MEASURING QUANTITY OF HEAT; THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR
- G01K7/00—Measuring temperature based on the use of electric or magnetic elements directly sensitive to heat ; Power supply therefor, e.g. using thermoelectric elements
- G01K7/02—Measuring temperature based on the use of electric or magnetic elements directly sensitive to heat ; Power supply therefor, e.g. using thermoelectric elements using thermoelectric elements, e.g. thermocouples
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- A—HUMAN NECESSITIES
- A47—FURNITURE; DOMESTIC ARTICLES OR APPLIANCES; COFFEE MILLS; SPICE MILLS; SUCTION CLEANERS IN GENERAL
- A47J—KITCHEN EQUIPMENT; COFFEE MILLS; SPICE MILLS; APPARATUS FOR MAKING BEVERAGES
- A47J37/00—Baking; Roasting; Grilling; Frying
- A47J37/06—Roasters; Grills; Sandwich grills
- A47J37/0623—Small-size cooking ovens, i.e. defining an at least partially closed cooking cavity
- A47J37/0664—Accessories
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01K—MEASURING TEMPERATURE; MEASURING QUANTITY OF HEAT; THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR
- G01K1/00—Details of thermometers not specially adapted for particular types of thermometer
- G01K1/14—Supports; Fastening devices; Arrangements for mounting thermometers in particular locations
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01K—MEASURING TEMPERATURE; MEASURING QUANTITY OF HEAT; THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR
- G01K3/00—Thermometers giving results other than momentary value of temperature
Abstract
The invention discloses an oven, a temperature uniformity testing method, a device and a storage medium thereof, wherein the oven comprises a temperature measurement experiment carrier, a plurality of thermocouple carriers are uniformly distributed on the test experiment carrier, and the method comprises the following steps: controlling the oven to heat with preset power until the temperature inside the oven reaches a first temperature threshold, and controlling the oven to continuously heat for a first preset time; after the oven continues to heat for a first preset time, controlling the oven to stop heating until the temperature inside the oven is cooled to a second temperature threshold; and acquiring temperature data detected by the plurality of thermocouple carriers, and generating a temperature curve according to the temperature data, wherein the temperature curve is used for determining the temperature uniformity of the oven. Therefore, the temperature change inside the oven is accurately detected through the thermocouple carriers distributed on the test experiment carrier, and the temperature distribution inside the oven is truly fed back, so that the temperature field inside the oven is accurately represented through the temperature data, and the testing precision of the temperature uniformity of the oven is improved.
Description
Technical Field
The present invention relates to the field of oven technology, and in particular, to a method for testing temperature uniformity of an oven, a computer readable storage medium, a device for testing temperature uniformity of an oven, and an oven.
Background
With the popularization of integrated kitchen series products, modern family cooking gradually develops to refinement, menu content tends to diversify, steaming and baking functions are increasingly valued by users in daily cooking, and compared with traditional electric ovens, the gas oven has obvious advantages in heating speed, and the processed foods have different flavors.
However, unlike the heating temperature range of 50-250 ℃ of the electric oven, the highest heating temperature of the gas oven can reach 450 ℃ by enhancing heat convection only by the fan, and the heat radiation of flame is mainly used for heating the food simultaneously with heat convection, so that a testing means for judging the heating uniformity of the gas oven is needed because of the difference of the heating modes of the food.
Disclosure of Invention
The present invention aims to solve at least one of the technical problems in the related art to some extent. Therefore, a first object of the present invention is to provide a method for testing temperature uniformity of an oven, which can accurately detect temperature variation inside the oven through a plurality of thermocouple carriers distributed on a test experiment carrier, and truly feed back temperature distribution inside the oven, so that an internal temperature field of the oven can be accurately represented through temperature data, and testing accuracy of temperature uniformity of the oven can be improved.
A second object of the present invention is to propose a computer readable storage medium.
A third object of the present invention is to provide a temperature uniformity testing apparatus for an oven.
A fourth object of the present invention is to propose an oven.
To achieve the above object, an embodiment of a first aspect of the present invention provides a temperature uniformity testing method of an oven, wherein the oven includes a temperature measurement experiment carrier, and a plurality of thermocouple carriers are uniformly distributed on the test experiment carrier, the method includes: controlling the oven to heat with preset power until the temperature inside the oven reaches a first temperature threshold, and controlling the oven to continuously heat for a first preset time; after the oven continues to heat for a first preset time, controlling the oven to stop heating until the internal temperature of the oven is cooled to a second temperature threshold; and acquiring temperature data detected by the thermocouple carriers, and generating a temperature curve according to the temperature data, wherein the temperature curve is used for determining the temperature uniformity of the oven.
According to the temperature uniformity testing method of the oven, the oven is controlled to be heated at preset power until the temperature inside the oven reaches a first temperature threshold, the oven is controlled to be continuously heated for a first preset time, further, after the oven is continuously heated for the first preset time, the oven is controlled to stop heating until the temperature inside the oven is cooled to a second temperature threshold, temperature data detected by a plurality of thermocouple carriers are obtained, a temperature curve is generated according to the temperature data, and the temperature curve is used for determining the temperature uniformity of the oven. Therefore, the temperature change inside the oven is accurately detected through the thermocouple carriers distributed on the test experiment carrier, and the temperature distribution inside the oven is truly fed back, so that the temperature field inside the oven is accurately represented through the temperature data, and the testing precision of the temperature uniformity of the oven is improved.
In addition, the temperature uniformity testing method of the oven according to the embodiment of the invention can further comprise the following additional technical features:
according to one embodiment of the invention, the temperature profile includes a temperature rise profile for determining temperature uniformity of the oven during a temperature rise and a temperature drop profile for determining temperature uniformity of the oven during a temperature drop.
According to one embodiment of the invention, before the controlling the oven to heat at the preset power, the method further comprises: and controlling the oven to empty residual fuel gas in the oven, and controlling the oven to heat at the preset power after determining that the oven meets the preset test condition.
According to one embodiment of the invention, the preset test condition includes the oven cavity temperature reaching a preset temperature threshold and the oven cavity pressure reaching a preset pressure threshold.
According to one embodiment of the invention, after the oven interior temperature cools to a second temperature threshold, the method further comprises: and controlling the oven to open an oven door so as to cool the temperature-measuring experiment carrier to the room temperature.
According to one embodiment of the invention, the plurality of thermocouple carriers are uniformly distributed on the front and back sides of the test experiment carrier.
According to one embodiment of the invention, the outer surfaces of the thermocouple carriers are sprayed with high-temperature-resistant black paint, and the insertion openings of thermocouple elements are reserved in the thermocouple carriers.
To achieve the above object, a computer readable storage medium according to a second aspect of the present invention stores a temperature uniformity test program of an oven, which when executed by a processor, implements the temperature uniformity test method of the oven according to the above embodiment of the present invention.
According to the computer readable storage medium, the temperature uniformity test program of the oven stored on the computer readable storage medium is executed by the processor, the internal temperature field of the oven can be accurately represented by the temperature data, and the test precision of the temperature uniformity of the oven is improved.
To achieve the above object, an embodiment of a third aspect of the present invention provides a temperature uniformity testing device for an oven, wherein the oven includes a temperature measurement experiment carrier, and a plurality of thermocouple carriers are uniformly distributed on the test experiment carrier, the device includes: the control module is used for controlling the oven to heat at preset power until the internal temperature of the oven reaches a first temperature threshold value and controlling the oven to continuously heat for a first preset time; and after the oven is continuously heated for a first preset time, controlling the oven to stop heating until the temperature inside the oven is cooled to a second temperature threshold; the analysis module is used for acquiring temperature data detected by the thermocouple carriers and generating a temperature curve according to the temperature data, and the temperature curve is used for determining the temperature uniformity of the oven.
According to the temperature uniformity testing device of the oven, the control module is used for controlling the oven to heat with preset power until the internal temperature of the oven reaches a first temperature threshold value, controlling the oven to continuously heat for a first preset time, controlling the oven to stop heating until the internal temperature of the oven is cooled to a second temperature threshold value after the oven continuously heats for the first preset time, obtaining temperature data detected by a plurality of thermocouple carriers through the analysis module, and generating a temperature curve according to the temperature data, wherein the temperature curve is used for determining the temperature uniformity of the oven. Therefore, the temperature change inside the oven is accurately detected through the thermocouple carriers distributed on the test experiment carrier, and the temperature distribution inside the oven is truly fed back, so that the temperature field inside the oven is accurately represented through the temperature data, and the testing precision of the temperature uniformity of the oven is improved.
In order to achieve the above object, an oven according to a fourth aspect of the present invention includes the temperature uniformity testing apparatus of the oven according to the above embodiment of the present invention.
According to the oven disclosed by the embodiment of the invention, the temperature uniformity testing device of the oven can accurately detect the temperature change in the oven and truly feed back the temperature distribution in the oven, so that the temperature field in the oven is accurately represented by the temperature data, and the testing precision of the temperature uniformity of the oven is improved.
Additional aspects and advantages of the invention will be set forth in part in the description which follows and, in part, will be obvious from the description, or may be learned by practice of the invention.
Drawings
FIG. 1 is a schematic diagram of the installation of a thermometry experiment carrier according to one embodiment of the invention;
FIG. 2 is a schematic illustration of the installation of a thermocouple carrier according to an embodiment of the present invention;
FIG. 3 is a schematic view of the structure of a thermocouple carrier according to an embodiment of the present invention;
FIG. 4 is a flow chart of a method of testing temperature uniformity of an oven according to an embodiment of the present invention;
FIG. 5 is a flow chart of a method of testing temperature uniformity of an oven in accordance with an embodiment of the present invention;
FIG. 6 is a block schematic diagram of a temperature uniformity testing apparatus of an oven according to an embodiment of the present invention;
fig. 7 is a block schematic diagram of an oven according to an embodiment of the present invention.
Detailed Description
Embodiments of the present invention are described in detail below, examples of which are illustrated in the accompanying drawings, wherein like or similar reference numerals refer to like or similar elements or elements having like or similar functions throughout. The embodiments described below by referring to the drawings are illustrative and intended to explain the present invention and should not be construed as limiting the invention.
A temperature uniformity test method of an oven, a computer-readable storage medium, a temperature uniformity test apparatus of an oven, and an oven according to embodiments of the present invention are described below with reference to the accompanying drawings.
Before describing the temperature uniformity testing method of the oven according to the embodiment of the present invention, a part of the structure of the oven according to the embodiment of the present invention will be described with reference to fig. 1 to 3.
Specifically, in some embodiments of the present invention, the oven is a gas oven, which may include components such as a baking tray, a burner, and a smoke exhaust outlet, where the baking tray is used as a food bearing device and is located at a central position of the oven, the burner is distributed on upper and lower sides of the baking tray, and in addition, the oven may include a temperature measurement experiment carrier, and the test experiment carrier is uniformly distributed with a plurality of thermocouple carriers, where, as the glass fiber board has better heat resistance and heat insulation property, and is easy to process, as shown in fig. 1, a rectangular glass fiber board having a size equivalent to that of the baking tray may be selected as the temperature measurement experiment carrier, and, as the heat conduction capability of copper is better, the heat is transferred to the thermocouple while receiving the heat burned by the burner, and the thermocouple carrier is easy to process, so a copper block may be selected as the thermocouple carrier.
Further, in some embodiments of the present invention, the plurality of thermocouple carriers are uniformly distributed on the front and back sides of the test experimental carrier.
Specifically, in this embodiment of the present invention, as shown in fig. 1 and 2, a plurality of thermocouple carriers (e.g., copper blocks) of the same size may be uniformly distributed on the front and rear sides of a test experiment carrier (e.g., glass fiber board) to serve as temperature measurement points of the oven internal temperature.
Further, in some embodiments of the present invention, the outer surfaces of the plurality of thermocouple carriers are sprayed with a high temperature resistant black paint, and the insertion openings of thermocouple elements are left inside the plurality of thermocouple carriers.
It should be understood that since the gas oven heats food mainly by heat radiation, in this embodiment of the present invention, by spraying high temperature resistant black paint on the outer surfaces of the plurality of thermocouple carriers, and, as shown in fig. 3, leaving the insertion openings of the thermocouple elements inside the plurality of thermocouple carriers and fixing them at the inner centers of the thermocouple carriers by screws, the plurality of thermocouple carriers can better receive heat radiation energy, improving accuracy and reliability of the oven temperature uniformity test.
Alternatively, as shown in fig. 2, the length and width a×b of the glass fiber board may be referenced to the overall size of the grill, so as to ensure that the glass fiber board is horizontally centered in the center of the grill, thereby avoiding errors caused by position deviation on the temperature uniformity test, preferably, the thickness C of the glass fiber board may be determined according to the power of the oven, for example, an oven with a power of 2.5kW, and the value of the thickness C may be in the range of 10-12 mm.
In the above embodiments of the present invention, a metal material other than copper blocks may be used as the thermocouple carrier, and a heat insulating material other than glass fiber plate may be used as the temperature measurement experiment carrier, and the materials of the temperature measurement experiment carrier and the thermocouple carrier are not particularly limited.
Fig. 4 is a flow chart of a temperature uniformity test method of an oven according to an embodiment of the present invention.
Specifically, in some embodiments of the present invention, as shown in fig. 4, a temperature uniformity test method of an oven includes:
s101, controlling the oven to heat with preset power until the internal temperature of the oven reaches a first temperature threshold, and controlling the oven to continuously heat for a first preset time.
It will be appreciated that in this embodiment of the present invention, when the temperature uniformity of the oven is started, the oven may be controlled to be heated at a preset power (e.g., the maximum heating power of the oven) so as to quickly raise the temperature inside the oven until the temperature inside the oven reaches the first temperature threshold, and then the oven is controlled to be continuously heated for a first preset time to ensure the stability and accuracy of the temperature inside the oven, so that the temperature data during the temperature raising process of the oven is detected in real time by a plurality of thermocouple carriers uniformly distributed in the test experiment carrier.
Alternatively, in the above embodiment of the present invention, the first temperature threshold and the first preset time may be set correspondingly according to the model and the specification of the oven, for example, the first temperature threshold may be preferably 450 ℃, and the first preset time may be preferably 2 minutes.
And S102, after the oven is continuously heated for a first preset time, controlling the oven to stop heating until the temperature inside the oven is cooled to a second temperature threshold.
It can be appreciated that in this embodiment of the present invention, after the oven is controlled to continuously heat for a first preset time with a preset power, the oven can be controlled to stop heating so as to gradually cool the interior of the oven until the temperature of the interior of the oven is cooled to a second temperature threshold, so that temperature data during cooling of the oven is detected in real time by a plurality of thermocouple carriers uniformly distributed on the test experiment carrier.
Alternatively, in the above embodiment of the present invention, the second temperature threshold may be set accordingly according to the model and the specification of the oven, for example, the second temperature threshold may be preferably 200 ℃.
S103, acquiring temperature data detected by the thermocouple carriers, and generating a temperature curve according to the temperature data, wherein the temperature curve is used for determining the temperature uniformity of the oven.
Specifically, in this embodiment of the present invention, a temperature profile may be generated from temperature data detected by a plurality of thermocouple carriers, and further, a temperature change rate of the oven is characterized by the temperature profile, thereby realizing a temperature uniformity test of the oven.
Further, in some embodiments of the invention, before controlling the oven to heat at the preset power, the method further comprises: and controlling the oven to empty residual fuel gas in the oven, and controlling the oven to heat at maximum power after determining that the oven meets the preset test conditions.
Specifically, in this embodiment of the present invention, the preset test condition may include that the cavity temperature of the oven reaches the preset temperature threshold, and the cavity pressure of the oven reaches the preset pressure threshold, in other words, before the oven is controlled to heat at the maximum power, the oven needs to be controlled to empty the residual fuel gas in the oven, and after the oven is determined to meet the preset test condition, the oven is controlled to heat at the preset power, so as to reduce the influence of the residual fuel gas in the oven, the original cavity temperature and the original cavity pressure on the temperature uniformity test of the oven, and further improve the accuracy and reliability of the temperature uniformity test of the oven.
It should be noted that, in the above embodiment of the present invention, the preset temperature threshold and the preset pressure threshold may be set according to the temperature and the pressure under the standard atmospheric pressure, for example, the preset temperature threshold may be preferably 25 degrees celsius, and the preset pressure threshold may be preferably 101.325 kilopascals.
Further, in some embodiments of the invention, after the oven internal temperature cools to the second temperature threshold, the method further comprises: and controlling the oven to open the oven door so as to cool the temperature-measuring experiment carrier to the room temperature.
It can be appreciated that in this embodiment of the present invention, after the temperature inside the oven is cooled to the second temperature threshold, the oven needs to be controlled to open the oven door so as to cool the temperature measurement experiment carrier to room temperature, thereby reducing the influence of the temperature measurement experiment carrier on the temperature uniformity test of the oven, further improving the accuracy and reliability of the temperature uniformity test of the oven, and simultaneously effectively shortening the test interval for performing the next temperature uniformity test of the oven and improving the temperature uniformity test efficiency of the oven.
The following describes the testing procedure of the oven temperature uniformity test with reference to fig. 5, and specifically, as shown in fig. 5, step S1 is performed before the test starts.
S1, controlling the oven to empty residual fuel gas in the oven.
S2, judging whether the oven meets the preset test conditions, if so, executing the step S3, and if not, exiting the test.
And S3, controlling the oven to heat at preset power until the internal temperature of the oven reaches a first temperature threshold.
S4, controlling the oven to continuously heat for a first preset time.
And S5, controlling the oven to stop heating until the temperature inside the oven is cooled to the second temperature threshold.
S6, acquiring temperature data detected by the thermocouple carriers, and generating a temperature curve according to the temperature data, wherein the temperature curve is used for determining the temperature uniformity of the oven.
S7, controlling the oven to open the oven door so as to cool the temperature-measuring experiment carrier to the room temperature.
In summary, according to the temperature uniformity testing method of the oven provided by the embodiment of the invention, the oven is controlled to be heated with preset power until the internal temperature of the oven reaches the first temperature threshold, the oven is controlled to be continuously heated for the first preset time, further, after the oven is continuously heated for the first preset time, the oven is controlled to stop heating until the internal temperature of the oven is cooled to the second temperature threshold, temperature data detected by a plurality of thermocouple carriers are obtained, and a temperature curve is generated according to the temperature data and is used for determining the temperature uniformity of the oven. Therefore, the temperature change inside the oven is accurately detected through the thermocouple carriers distributed on the test experiment carrier, and the temperature distribution inside the oven is truly fed back, so that the temperature field inside the oven is accurately represented through the temperature data, and the testing precision of the temperature uniformity of the oven is improved.
Based on the foregoing method for testing temperature uniformity of the oven according to the embodiments of the present invention, the embodiments of the present invention further provide a computer-readable storage medium having stored thereon a program for testing temperature uniformity of the oven, where the program for testing temperature uniformity of the oven implements the foregoing method for testing temperature uniformity of the oven according to the embodiments of the present invention when executed by a processor.
It should be noted that, the specific implementation of the computer readable storage medium according to the embodiment of the present invention corresponds to the specific implementation of the temperature uniformity testing method of the oven according to the foregoing embodiment of the present invention, and in order to reduce redundancy, no further description is given here.
In summary, according to the computer readable storage medium of the embodiment of the invention, the temperature uniformity test program of the oven stored on the computer readable storage medium is executed by the processor, so that the temperature field inside the oven can be accurately represented by the temperature data, and the test precision of the temperature uniformity of the oven is improved.
Fig. 6 is a block schematic diagram of a temperature uniformity test apparatus of an oven according to an embodiment of the present invention.
Specifically, in some embodiments of the present invention, as shown in fig. 6, the temperature uniformity test apparatus 100 of an oven includes: a control module 10 and an analysis module 20.
The control module 10 is configured to control the oven to heat at a preset power until the temperature inside the oven reaches a first temperature threshold, and control the oven to continuously heat for a first preset time; after the oven is continuously heated for a first preset time, controlling the oven to stop heating until the temperature inside the oven is cooled to a second temperature threshold; the analysis module 20 is configured to obtain temperature data detected by the plurality of thermocouple carriers, and generate a temperature curve according to the temperature data, where the temperature curve is used to determine temperature uniformity of the oven.
It should be noted that, the specific implementation manner of the temperature uniformity testing device of the oven according to the embodiment of the present invention corresponds to the specific implementation manner of the temperature uniformity testing method of the oven according to the embodiment of the present invention, so that redundancy is reduced, and no further description is given here.
In summary, according to the temperature uniformity testing device of the oven provided by the embodiment of the invention, the control module is used for controlling the oven to heat with preset power until the internal temperature of the oven reaches the first temperature threshold, controlling the oven to continuously heat for a first preset time, and after the oven continuously heats for the first preset time, controlling the oven to stop heating until the internal temperature of the oven is cooled to the second temperature threshold, acquiring temperature data detected by a plurality of thermocouple carriers through the analysis module, and generating a temperature curve according to the temperature data, wherein the temperature curve is used for determining the temperature uniformity of the oven. Therefore, the temperature change inside the oven is accurately detected through the thermocouple carriers distributed on the test experiment carrier, and the temperature distribution inside the oven is truly fed back, so that the temperature field inside the oven is accurately represented through the temperature data, and the testing precision of the temperature uniformity of the oven is improved.
Fig. 7 is a block schematic diagram of an oven according to an embodiment of the present invention.
Specifically, in some embodiments of the present invention, as shown in fig. 7, an oven 1000 includes the temperature uniformity test apparatus 100 of the oven of the aforementioned embodiments of the present invention.
It should be noted that, for the specific implementation manner of the embodiment of the present invention, reference may be made to the foregoing temperature uniformity testing apparatus of the oven of the embodiment of the present invention, and in order to reduce redundancy, details are not repeated.
In summary, according to the oven disclosed by the embodiment of the invention, by adopting the temperature uniformity testing device of the oven, the temperature field inside the oven can be accurately represented by temperature data, and the testing precision of the temperature uniformity of the oven is improved.
It should be noted that the logic and/or steps represented in the flowcharts or otherwise described herein, for example, may be considered as a ordered listing of executable instructions for implementing logical functions, and may be embodied in any computer-readable medium for use by or in connection with an instruction execution system, apparatus, or device, such as a computer-based system, processor-containing system, or other system that can fetch the instructions from the instruction execution system, apparatus, or device and execute the instructions. For the purposes of this description, a "computer-readable medium" can be any means that can contain, store, communicate, propagate, or transport the program for use by or in connection with the instruction execution system, apparatus, or device. More specific examples (a non-exhaustive list) of the computer-readable medium would include the following: an electrical connection (electronic device) having one or more wires, a portable computer diskette (magnetic device), a Random Access Memory (RAM), a read-only memory (ROM), an erasable programmable read-only memory (EPROM or flash memory), an optical fiber device, and a portable compact disc read-only memory (CDROM). In addition, the computer readable medium may even be paper or other suitable medium on which the program is printed, as the program may be electronically captured, via, for instance, optical scanning of the paper or other medium, then compiled, interpreted or otherwise processed in a suitable manner, if necessary, and then stored in a computer memory.
It is to be understood that portions of the present invention may be implemented in hardware, software, firmware, or a combination thereof. In the above-described embodiments, the various steps or methods may be implemented in software or firmware stored in a memory and executed by a suitable instruction execution system. For example, if implemented in hardware, as in another embodiment, may be implemented using any one or combination of the following techniques, as is well known in the art: discrete logic circuits having logic gates for implementing logic functions on data signals, application specific integrated circuits having suitable combinational logic gates, programmable Gate Arrays (PGAs), field Programmable Gate Arrays (FPGAs), and the like.
In the description of the present specification, a description referring to terms "one embodiment," "some embodiments," "examples," "specific examples," or "some examples," etc., means that a particular feature, structure, material, or characteristic described in connection with the embodiment or example is included in at least one embodiment or example of the present invention. In this specification, schematic representations of the above terms do not necessarily refer to the same embodiments or examples. Furthermore, the particular features, structures, materials, or characteristics described may be combined in any suitable manner in any one or more embodiments or examples.
In the description of the present invention, it should be understood that the terms "center", "longitudinal", "lateral", "length", "width", "thickness", "upper", "lower", "front", "rear", "left", "right", "vertical", "horizontal", "top", "bottom", "inner", "outer", "clockwise", "counterclockwise", "axial", "radial", "circumferential", etc. indicate orientations or positional relationships based on the orientations or positional relationships shown in the drawings are merely for convenience in describing the present invention and simplifying the description, and do not indicate or imply that the device or element being referred to must have a specific orientation, be configured and operated in a specific orientation, and therefore should not be construed as limiting the present invention.
Furthermore, the terms "first," "second," and the like, are used for descriptive purposes only and are not to be construed as indicating or implying a relative importance or implicitly indicating the number of technical features indicated. Thus, a feature defining "a first" or "a second" may explicitly or implicitly include at least one such feature. In the description of the present invention, the meaning of "plurality" means at least two, for example, two, three, etc., unless specifically defined otherwise.
In the present invention, unless explicitly specified and limited otherwise, the terms "mounted," "connected," "secured," and the like are to be construed broadly, and may be, for example, fixedly connected, detachably connected, or integrally formed; can be mechanically or electrically connected; either directly or indirectly, through intermediaries, or both, may be in communication with each other or in interaction with each other, unless expressly defined otherwise. The specific meaning of the above terms in the present invention can be understood by those of ordinary skill in the art according to the specific circumstances.
In the present invention, unless expressly stated or limited otherwise, a first feature "up" or "down" a second feature may be the first and second features in direct contact, or the first and second features in indirect contact via an intervening medium. Moreover, a first feature being "above," "over" and "on" a second feature may be a first feature being directly above or obliquely above the second feature, or simply indicating that the first feature is level higher than the second feature. The first feature being "under", "below" and "beneath" the second feature may be the first feature being directly under or obliquely below the second feature, or simply indicating that the first feature is less level than the second feature.
While embodiments of the present invention have been shown and described above, it will be understood that the above embodiments are illustrative and not to be construed as limiting the invention, and that variations, modifications, alternatives and variations may be made to the above embodiments by one of ordinary skill in the art within the scope of the invention.
Claims (10)
1. A method for testing temperature uniformity of an oven, the oven comprising a temperature measurement experiment carrier having a plurality of thermocouple carriers uniformly distributed thereon, the method comprising:
controlling the oven to heat with preset power until the temperature inside the oven reaches a first temperature threshold, and controlling the oven to continuously heat for a first preset time;
after the oven continues to heat for a first preset time, controlling the oven to stop heating until the internal temperature of the oven is cooled to a second temperature threshold;
and acquiring temperature data detected by the thermocouple carriers, and generating a temperature curve according to the temperature data, wherein the temperature curve is used for determining the temperature uniformity of the oven.
2. The method of claim 1, wherein the temperature profile includes a temperature ramp profile for determining temperature uniformity of the oven during a ramp up and a temperature ramp profile for determining temperature uniformity of the oven during a cool down.
3. The method of claim 1, wherein prior to said controlling the oven to heat at a preset power, the method further comprises:
and controlling the oven to empty residual fuel gas in the oven, and controlling the oven to heat at the preset power after determining that the oven meets the preset test condition.
4. A method of testing the temperature uniformity of an oven according to claim 3, wherein said predetermined test conditions comprise the oven cavity temperature reaching a predetermined temperature threshold and the oven cavity pressure reaching a predetermined pressure threshold.
5. The method of temperature uniformity testing a toaster according to claim 1, wherein said method further comprises, after said toaster internal temperature is cooled to a second temperature threshold:
and controlling the oven to open an oven door so as to cool the temperature-measuring experiment carrier to the room temperature.
6. The method of claim 1, wherein the plurality of thermocouple carriers are uniformly distributed on the front and back sides of the test experiment carrier.
7. The method of claim 6, wherein the outer surfaces of the plurality of thermocouple carriers are sprayed with a high temperature resistant black paint, and the inner portions of the plurality of thermocouple carriers leave insertion openings for thermocouple elements.
8. A computer-readable storage medium, characterized in that a temperature uniformity test program of an oven is stored thereon, which when executed by a processor implements the temperature uniformity test method of an oven according to any one of claims 1-4.
9. A temperature uniformity testing arrangement of oven, characterized in that, the oven includes temperature measurement experiment carrier, test experiment carrier evenly distributed has a plurality of thermocouple carrier, the device includes:
the control module is used for controlling the oven to heat at preset power until the internal temperature of the oven reaches a first temperature threshold value and controlling the oven to continuously heat for a first preset time;
and after the oven is continuously heated for a first preset time, controlling the oven to stop heating until the temperature inside the oven is cooled to a second temperature threshold;
the analysis module is used for acquiring temperature data detected by the thermocouple carriers and generating a temperature curve according to the temperature data, and the temperature curve is used for determining the temperature uniformity of the oven.
10. An oven, characterized in that the oven comprises a temperature uniformity testing device of the oven according to claim 9.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202310309779.4A CN116202641A (en) | 2023-03-27 | 2023-03-27 | Oven, temperature uniformity testing method and device thereof and storage medium |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202310309779.4A CN116202641A (en) | 2023-03-27 | 2023-03-27 | Oven, temperature uniformity testing method and device thereof and storage medium |
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| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN117287728A (en) * | 2023-11-27 | 2023-12-26 | 山东佰洁智能电器有限公司 | Induction cooker control system and method based on Internet of things |
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| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN117287728A (en) * | 2023-11-27 | 2023-12-26 | 山东佰洁智能电器有限公司 | Induction cooker control system and method based on Internet of things |
| CN117287728B (en) * | 2023-11-27 | 2024-02-09 | 山东佰洁智能电器有限公司 | Induction cooker control system and method based on Internet of things |
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