CN116192690A - Method, system, equipment and medium for rapidly testing C-V2X equipment for surface vector production - Google Patents
Method, system, equipment and medium for rapidly testing C-V2X equipment for surface vector production Download PDFInfo
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Abstract
The invention provides a method, a system and equipment for rapidly testing mass-produced C-V2X equipment, which comprise the following steps: acquiring a hardware architecture of target equipment, acquiring main target parameters of the target equipment according to input test instructions of the hardware architecture, and selecting the least test instructions for acquiring the main target parameters as target test instructions; acquiring all qualified parameters according to the attribute characteristics of qualified equipment, and constructing a judgment matrix according to all the qualified parameters; sequentially acquiring test parameters of the current equipment to be tested under different target test instructions based on the target test instructions, and sequentially performing parameter comparison with the judgment matrix according to the test parameters; when the parameter comparison is completely passed, outputting the test parameters of the current equipment to be tested and recording the test parameters as qualified parameters, and when the parameter comparison is not passed, interrupting the test of the current equipment to be tested and recording abnormal data. The rapid test method for the mass-produced C-V2X equipment can remarkably improve the test efficiency of the C-V2X equipment.
Description
Technical Field
The invention relates to the technical field of Internet of vehicles equipment testing, in particular to a method, a system, equipment and a medium for rapidly testing mass-produced C-V2X equipment.
Background
C-V2X is used as a core technology for intelligent transportation system construction, and around the technology, in recent years, C-V2X Internet of vehicles projects and intelligent Internet of vehicles implementation modes enter an explosion period from a technical incubation period and a standard formulation period, so that the technology is vigorously developed.
The throughput of the used C-V2X equipment (including OBU and RSU of road side equipment and other various forms) also gradually enters a large-scale mass production stage from an initial prototype machine and a small batch, but the current test of the hardware system of the C-V2X equipment in the industry is still a state of a relatively complex test environment compared with the prior technical development stage, the test environment is required to be built and configured, a large amount of manual input of a bottom layer instruction is used for checking the functions item by item, and no proper rapid test scheme with the beat within 60 seconds is available.
In summary, the prior art lacks efficient testing schemes for mass-produced C-V2X devices.
Disclosure of Invention
In view of the foregoing, it is desirable to provide a method, a system and a device for rapidly testing mass-produced C-V2X devices, which can perform efficient testing on mass-produced C-V2X devices.
In order to solve the technical problems, on the one hand, the invention provides a rapid test method for mass-production-oriented C-V2X equipment, which comprises the following steps:
acquiring a hardware architecture of a target C-V2X device, acquiring main target parameters of the target C-V2X device according to input test instructions of the hardware architecture, and selecting the minimum test instructions for acquiring the main target parameters as target test instructions;
acquiring all qualified parameters according to the attribute characteristics of qualified C-V2X equipment, and constructing a judgment matrix according to all the qualified parameters;
sequentially acquiring test parameters of the current C-V2X equipment to be tested under different target test instructions based on the target test instructions, and sequentially carrying out parameter comparison with a judgment matrix according to the test parameters;
when the parameter comparison is completely passed, outputting the test parameters of the current C-V2X equipment to be tested and recording the test parameters as qualified parameters, and when the parameter comparison is not passed, interrupting the test of the current C-V2X equipment to be tested and recording abnormal data.
In some possible implementations, the acquiring the hardware architecture of the target C-V2X device, acquiring main target parameters of the target C-V2X device according to the hardware architecture input test instruction, and selecting the least test instruction of all the target parameters as the target test instruction includes:
acquiring a core hardware module of the target C-V2X device;
respectively inputting different test instructions into the core hardware module of the target C-V2X equipment to obtain main target parameters, and carrying out statistics integration on all the input test instructions to obtain target test instructions;
the target test instruction is the least test instruction for acquiring main target parameters of target C-V2X equipment; the main target parameters can feed back the hardware IC of the core hardware module of the C-V2X equipment to which the parameters belong or the hardware state of the module.
In some possible implementations, the target C-V2X device core hardware module includes: a cellar module, a BT/WiFi module, a V2X module, a GNSS module, an HSM module, or a combination thereof.
In some possible implementations, the primary target parameters include:
the first module mounting state parameter, the resident network state parameter and the SIM IC state parameter of the cell module;
the second module of the BT/WiFi module is provided with a state parameter and an SSID parameter;
the third module of the V2X module is provided with a mounting state parameter, a signal power parameter and a star locking state parameter;
the fourth module of the GNSS module is provided with a mounting state parameter and a GPS state parameter;
and the fifth module mounting parameter and the self-checking parameter of the HSM module.
In some possible implementations, the target instruction includes: the method comprises a network equipment address display instruction, an equipment network detection instruction, a communication function confirmation instruction and a security verification function confirmation instruction.
In some possible implementations, the sequentially obtaining, based on the target test instruction, test parameters of the current C-V2X device to be tested under different target test instructions includes:
acquiring the first module mounting state parameter, the second module mounting state parameter, the third module mounting state parameter, the fourth module mounting state parameter, the fifth module mounting state parameter and the SSID parameter through the network equipment address display instruction;
acquiring the resident network state parameter and the SIM IC state parameter through the equipment network detection instruction;
acquiring the third module mounting state parameter and the star locking state parameter through a communication function confirmation instruction
Acquiring the fifth module mounting parameter and the self-checking parameter through the security signature checking function confirmation instruction;
the signal power parameters are obtained through measurement by a radio frequency comprehensive tester.
In some possible implementations, when the parameter comparison is all passed, outputting the test parameter of the current C-V2X device to be tested and recording the test parameter as a qualified parameter, and when the parameter comparison is not passed, interrupting the test of the current C-V2X device to be tested and recording the abnormal data, including:
outputting the test parameters of the current C-V2X equipment to be tested when the test parameters acquired in sequence are compared with the corresponding qualified parameters in the judgment matrix and pass through the judgment matrix, recording the test parameters as the qualified parameters, and ending the test of the current C-V2X equipment to be tested;
and when the comparison of the sequentially acquired test parameters and the corresponding qualified parameters in the judgment matrix is failed, interrupting the subsequent test of the current C-V2X equipment to be tested, recording the abnormal hardware module information of the current C-V2X equipment to be tested, and ending the test of the current C-V2X equipment to be tested.
On the other hand, the invention also provides a rapid test system of the mass-production-oriented C-V2X equipment, which comprises the following components:
the target instruction acquisition module is used for acquiring a hardware architecture of the target C-V2X equipment, acquiring all target parameters of the target C-V2X equipment according to the hardware architecture input test instruction, and selecting the minimum test instruction of all the target parameters as a target test instruction;
the judging matrix construction module is used for acquiring all qualified parameters according to the attribute characteristics of the qualified C-V2X equipment and constructing a judging matrix according to all the qualified parameters;
the test parameter comparison module is used for sequentially acquiring test parameters of the current C-V2X equipment to be tested under different target test instructions based on the target test instructions, and sequentially carrying out parameter comparison with the judgment matrix according to the test parameters;
and the data output recording module is used for outputting the test parameters of the current C-V2X equipment to be tested and recording the test parameters as qualified parameters when the parameter comparison is completely passed, and interrupting the test of the current C-V2X equipment to be tested and recording abnormal data when the parameter comparison is not passed.
On the other hand, the invention also provides an electronic device, which comprises a memory, a processor and a computer program stored on the memory and capable of running on the processor, wherein the processor realizes the quick test method of the C-V2X device of the face vector production in the implementation mode when executing the program.
Finally, the present invention also provides a computer readable storage medium, on which a computer program is stored, which when executed by a processor, implements the method for rapidly testing a C-V2X device for face vector production described in the above implementation.
The beneficial effects of adopting the embodiment are as follows: according to the mass production-oriented C-V2X equipment rapid test method provided by the invention, on one hand, the target test instruction is obtained by carrying out statistics integration on the test instruction for obtaining the main target parameters of the C-V2X equipment, and the main target parameters of the C-V2X equipment can be obtained by the target test instruction through a small amount of instructions, so that the input efficiency of the instruction is greatly improved, and the test efficiency of the C-V2X equipment is remarkably improved; on the other hand, the test parameters of the tested C-V2X equipment are obtained in real time through the target test instruction, the test parameters are compared with the constructed judgment matrix in real time, and the test process of the abnormal equipment can be interrupted in time when the abnormality occurs, so that the test efficiency of the C-V2X equipment is further improved.
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In order to more clearly illustrate the technical solutions of the embodiments of the present invention, the drawings that are needed in the description of the embodiments will be briefly described below, it being obvious that the drawings in the following description are only some embodiments of the present invention, and that other drawings may be obtained according to these drawings without inventive effort for a person skilled in the art.
FIG. 1 is a schematic flow chart of an embodiment of a method for rapidly testing mass-produced C-V2X devices according to the present invention;
FIG. 2 is a schematic diagram of one embodiment of a set-up test environment provided by the present invention;
FIG. 3 is a flow chart of a method of an embodiment of a mass-production-oriented C-V2X device rapid test system provided by the invention;
fig. 4 is a schematic structural diagram of an embodiment of an electronic device according to the present invention.
Detailed Description
The technical solutions in the embodiments of the present invention will be clearly and completely described below with reference to the accompanying drawings in the embodiments of the present invention. It will be apparent that the described embodiments are only some, but not all, embodiments of the invention. All other embodiments, which can be made by those skilled in the art based on the embodiments of the invention without making any inventive effort, are intended to be within the scope of the invention.
It should be understood that the schematic drawings are not drawn to scale. A flowchart, as used in this disclosure, illustrates operations implemented according to some embodiments of the present invention. It should be appreciated that the operations of the flow diagrams may be implemented out of order and that steps without logical context may be performed in reverse order or concurrently. Moreover, one or more other operations may be added to or removed from the flow diagrams by those skilled in the art under the direction of the present disclosure.
Some of the block diagrams shown in the figures are functional entities and do not necessarily correspond to physically or logically separate entities. These functional entities may be implemented in software or in one or more hardware modules or integrated circuits or in different networks and/or processor systems and/or microcontroller systems.
Reference herein to "an embodiment" means that a particular feature, structure, or characteristic described in connection with the embodiment may be included in at least one embodiment of the invention. The appearances of such phrases in various places in the specification are not necessarily all referring to the same embodiment, nor are separate or alternative embodiments mutually exclusive of other embodiments. Those of skill in the art will explicitly and implicitly appreciate that the embodiments described herein may be combined with other embodiments.
Before the description of the embodiments, the related words are interpreted:
C-V2X: i.e. Cellular Vehicle-to-evaluation, is a Cellular network based vehicular wireless communication technology. V2X Internet of vehicles communication is mainly divided into three main categories: V2V (Vehicle to Vehicle), V2I (Vehicle to Infrastructure) and V2P (Vehicle to Pedestrian).
OBU: i.e. On board Unit, is interpreted to mean an in-vehicle Unit, meaning a microwave device that communicates with the RSU.
RSU: namely the Road Side Unit, the transliteration is the meaning of a Road Side Unit, and various V2X application scenes are realized by communicating with an On Board Unit (OBU).
And (3) GNSS: the global navigation satellite system (Global Navigation Satellite System), also known as a global satellite navigation system, is an air-based radio navigation positioning system that can provide all-weather 3-dimensional coordinates and velocity and time information to a user at any location on the earth's surface or near earth space. Which includes one or more satellite constellations and augmentation systems required for supporting a particular job.
Cellular: is "cellular (technology)", which is a wireless communication technology. This technique divides a geographic area into cells, called "cells" (i.e., cells), which are therefore called cellular technologies. Handsets (or mobile phones) all employ this technology and are therefore often referred to as Cellular phones (Cellular phones).
HSM: i.e. Hardware security module hardware security module, which we generally interpret as a hardware device that can be used to secure manage/store keys and can provide cryptographic computing operations, is typically connected to a host device in the form of an extension or external device. HSM is a piece of tamper-proof and intrusion-resistant hardware that protects the storage keys while allowing authorized users to use, and acts as a Trust anchor in the system.
BT/WiFi: the Bluetooth/mobile hotspot Wi-Fi module is used for wireless communication and can realize wireless section distance communication.
SSID: is an abbreviation for Service Set Identifier, meaning: service set identification. The SSID technology can divide a wireless local area network into a plurality of sub-networks requiring different identity verification, each sub-network needs independent identity verification, and only users passing the identity verification can enter the corresponding sub-network to prevent unauthorized users from entering the network.
Based on the description of the technical terms, because the hardware system of the C-V2X equipment is complex, if the comprehensive test is carried out in a traditional mode, time and labor are wasted, reasonable test logic is adopted to discard unnecessary test items, the test time can be greatly shortened, the validity of a judgment result can be kept under the condition that special test tools are not required to be manufactured, the test efficiency is improved, a complex test environment is required to be configured when the C-V2X equipment is tested in the prior art, a plurality of manual input bottom layer instructions are used for carrying out item-by-item function check, the time consumption is long, and the efficiency is not high.
The following detailed description of specific embodiments is provided, and it should be noted that the description order of the following embodiments is not to be taken as a limitation on the preferred order of the embodiments.
The embodiment of the invention provides a method, a system, equipment and a medium for rapidly testing C-V2X equipment produced by surface vectors.
As shown in fig. 1, fig. 1 is a flow chart of an embodiment of a mass-production-oriented C-V2X device rapid test method provided by the present invention, where the mass-production-oriented C-V2X device rapid test method includes:
s101, acquiring a hardware architecture of a target C-V2X device, acquiring main target parameters of the target C-V2X device according to input test instructions of the hardware architecture, and selecting the minimum test instructions for acquiring the main target parameters as target test instructions;
s102, acquiring all qualified parameters according to the attribute characteristics of qualified C-V2X equipment, and constructing a judgment matrix according to all the qualified parameters;
s103, sequentially obtaining test parameters of the current C-V2X equipment to be tested under different target test instructions based on the target test instructions, and sequentially comparing the test parameters with a judgment matrix according to the test parameters;
and S104, outputting the test parameters of the current C-V2X equipment to be tested and recording the test parameters as qualified parameters when the parameter comparison is completely passed, and interrupting the test of the current C-V2X equipment to be tested and recording abnormal data when the parameter comparison is not passed.
Compared with the prior art, the method for rapidly testing the C-V2X equipment by the face vector provided by the embodiment of the invention has the advantages that on one hand, the target test instruction can acquire main target parameters of the C-V2X equipment through a small amount of instructions, the input efficiency of the instruction is greatly improved, and the test efficiency of the C-V2X equipment is remarkably improved; on the other hand, the test parameters of the tested C-V2X equipment are obtained in real time through the target test instruction, the test parameters are compared with the constructed judgment matrix in real time, and the test process of the abnormal equipment can be interrupted in time when the abnormality occurs, so that the test efficiency of the C-V2X equipment is further improved.
Further, in some embodiments of the present invention, step S101 includes:
acquiring a core hardware module of the target C-V2X equipment;
respectively inputting different test instructions into the core hardware module of the target C-V2X equipment to obtain main target parameters, and carrying out statistics integration on all the input test instructions to obtain target test instructions;
the target test instruction is the least test instruction for acquiring main target parameters of target C-V2X equipment; the main target parameters can feed back the hardware IC of the core hardware module of the C-V2X equipment to which the parameters belong or the hardware state of the module.
In a specific embodiment of the invention, because the hardware system of the C-V2X device is complex, if the traditional method is adopted to perform comprehensive test, the efficiency is low, time and labor are wasted, and the embodiment of the invention considers the association relation among all hardware function modules of the C-V2X device, adopts reasonable test logic, discards unnecessary test items to perform statistical integration on test instructions, so that the obtained target test instruction is the minimum test instruction for obtaining main target parameters of the target C-V2X device, and can obtain the hardware state parameters of the hardware IC or the hardware modules of the core hardware modules of the C-V2X device through the target test instruction.
The core hardware module of the target C-V2X device comprises: a cellar module, a BT/WiFi module, a V2X module, a GNSS module, and an HSM module.
Main target parameters, including:
the first module mounting state parameter, the resident network state parameter and the SIM IC state parameter of the cell module;
the second module of the BT/WiFi module is provided with a state parameter and an SSID parameter;
the third module of the V2X module is provided with a mounting state parameter, a signal power parameter and a star locking state parameter;
the fourth module of the GNSS module is provided with a mounting state parameter and a GPS state parameter;
and the fifth module mounting parameter and the self-checking parameter of the HSM module.
A target instruction comprising: the method comprises the steps of displaying an instruction of a network device address, detecting an instruction of a device network, confirming an instruction of a communication function and confirming an instruction of a security signature verification function.
Further, in a specific embodiment of the present invention, step S102 includes:
after determining the target parameters and the target test instructions, when facing a specific C-V2X device, filling corresponding instructions and corresponding parameters for comparison and judgment according to the hardware architecture of the qualified C-V2X device, and constructing a judgment matrix according to all qualified parameters by acquiring all qualified parameters, wherein the method comprises the following steps:
setting the OS (operating system) version number of the current target test C-V2X device;
setting GNSS hardware function test instructions and parameters, including: GNSS module firmware version number; the GNSS module acquires a current lock star state acquisition instruction and outputs a state keyword; outputting an acquisition instruction and a state keyword by using GNSS current positioning information;
setting the PC5 port hardware function test parameters, including: C-V2X module firmware target version number and acquisition instruction; the minimum transmission power of C-V2X is generally 27dB;
setting cellular (i.e., cellular, including 4G and/or 5G) hardware functional test parameters, including: the SIM card/eSIM card identifies the status acquisition instruction and outputs the status key word; networking success status keywords;
setting HSM (security module) hardware function test parameters, including: the HSM module identifies the instruction and outputs the state key word; the HSM module self-checking operation instruction and outputting a state keyword;
setting BT/WiFi (security module) hardware function test parameters, including: the SSID of the tested device acquires the instruction and the keyword.
And constructing a judgment matrix based on all qualified parameters according to the parameters output after the corresponding instructions are input by each module in the qualified C-V2X equipment sample, and comparing the judgment matrix with the test parameters of the equipment to be tested.
In a specific embodiment of the present invention, a test environment needs to be built before a test is performed, as shown in fig. 2, fig. 2 is a schematic diagram of an embodiment of the test environment building provided by the present invention, where the purpose of building the test environment is to quickly create a highly flexible environment capable of using the test method provided by the embodiment of the present invention, and the test environment building includes:
arranging GNSS antennas 201, and ensuring that the number of the search satellites in the test area is more than or equal to 8 and the signal-to-noise ratio is more than or equal to 40dB;
determining a C-V2X device under test 202;
the standard power supply 203 is connected, and the specific output current and voltage are determined by the tested C-V2X equipment specification;
starting a test PC204, opening a CMW500 integrated tester 205 connected with the PC204, and adjusting to a 5905-5925MHz V2X power test frequency band;
the PC204 is connected to the label printer 206.
Further, in some embodiments of the present invention, after the construction of the test environment is completed, the C-V2X device to be tested is tested based on the test environment, where step S103 includes:
acquiring the first module mounting state parameter, the second module mounting state parameter, the third module mounting state parameter, the fourth module mounting state parameter, the fifth module mounting state parameter and the SSID parameter through the network equipment address display instruction;
acquiring the resident network state parameter and the SIM IC state parameter through the equipment network detection instruction;
acquiring the third module mounting state parameter and the star locking state parameter through a communication function confirmation instruction;
acquiring the fifth module mounting parameter and the self-checking parameter through the security signature checking function confirmation instruction;
the signal power parameters are obtained through measurement by a radio frequency comprehensive tester.
In a specific embodiment of the invention, the built test environment is combined, through inputting instructions to the bottom layer functions of the core hardware module (GNSS, V2X, cellular, HSM, BT/WiFi) of the C-V2X equipment, the module can feed back corresponding messages containing characteristic data and parameters, namely test parameters, and feeds back specific hardware states of the module, the associated hardware IC, the module and the like after receiving the instructions, and the whole function of the equipment can be judged under the condition of least input by comparing the obtained test parameters with a judgment matrix.
As shown in table 1, table 1 is a table corresponding to the target instruction for obtaining the hardware parameters of each module, and +.in the table represents the parameters of the corresponding module hardware that can be obtained by the instruction.
TABLE 1
As can be seen from table 1, in the conventional method, if each functional module of a single cellular module needs at least three corresponding instructions for item-by-item confirmation, after integration, hardware confirmation can be performed on the functional module through two item-standard instructions, and meanwhile, related confirmation can be performed on other modules. The efficiency of acquiring the parameters to be tested of the hardware of each module of the C-V2X equipment to be tested can be remarkably improved through the integration of the instructions.
Further, in some embodiments of the present invention, when obtaining parameters to be tested of each module hardware of the C-V2X device to be tested, comparing the parameters to be tested with a judgment matrix in sequence according to the obtained parameters to be tested, and judging the qualification condition of the C-V2X device to be tested according to the comparison result, wherein step S104 includes:
outputting the test parameters of the current C-V2X equipment to be tested when the test parameters acquired in sequence are compared with the corresponding qualified parameters in the judgment matrix and pass through the judgment matrix, recording the test parameters as the qualified parameters, and ending the test of the current C-V2X equipment to be tested;
and when the comparison of the sequentially acquired test parameters and the corresponding qualified parameters in the judgment matrix is failed, interrupting the subsequent test of the current C-V2X equipment to be tested, recording the abnormal hardware module information of the current C-V2X equipment to be tested, and ending the test of the current C-V2X equipment to be tested.
In a specific embodiment of the invention, whether the whole hardware state of the currently tested C-V2X device reaches the shipment standard is judged by comparing the output test parameters with the judgment matrix, and the binding traceability information is stored in the information base log file. Any disqualified item appears in the whole test process, the system directly interrupts the test process to output error information, and simultaneously enters the next cycle, so that the time for executing the subsequent test is effectively saved, and the efficiency is improved.
If the tested device passes all the tests, green 'pass test' is displayed on the PC204 interface, the label printer 206 prints out the label of the device, the label records the serial number, wiFi SSID number and other information of the device, and other specific single test results are automatically stored in the database for subsequent traceability query.
If the device under test fails all the tests, a red "test exception" is displayed on the PC204 interface and the test is stopped when an exception test item is run, at which time the label printer 206 does not output a label and the test exception record is also recorded in the database.
According to the rapid test method for the C-V2X equipment of the face vector production, provided by the embodiment of the invention, through a large number of repeated practical tests, the beat of the whole test process can be controlled within 60 seconds, MSA (measurement system analysis) analysis is carried out on the results, the repeatability and the consistency reach excellent levels, and the rapid test scheme can be proved to be practical and effective.
In order to better implement the method for rapidly testing the surface vector produced C-V2X device in the embodiment of the present invention, correspondingly, on the basis of the method for rapidly testing the surface vector produced C-V2X device in mass production, the embodiment of the present invention further provides a system for rapidly testing the surface vector produced C-V2X device, as shown in fig. 3, the system 300 for rapidly testing the surface vector produced C-V2X device includes:
the target instruction obtaining module 301 is configured to obtain a hardware architecture of a target C-V2X device, obtain all target parameters of the target C-V2X device according to a test instruction input by the hardware architecture, and select a minimum test instruction of all the target parameters as a target test instruction;
the judging matrix construction module 302 is configured to obtain all qualified parameters according to the attribute characteristics of the qualified C-V2X device, and construct a judging matrix according to all the qualified parameters;
the test parameter comparison module 303 is configured to sequentially obtain test parameters of the current C-V2X device to be tested under different target test instructions based on the target test instructions, and sequentially perform parameter comparison with a judgment matrix according to the test parameters;
and the data output recording module 304 is used for outputting the test parameters of the current C-V2X equipment to be tested and recording the test parameters as qualified parameters when the parameter comparison is completely passed, and interrupting the test of the current C-V2X equipment to be tested and recording abnormal data when the parameter comparison is not passed.
The fast test system 300 for surface vector production C-V2X devices provided in the foregoing embodiment may implement the technical solution described in the foregoing embodiment of the fast test method for mass production C-V2X devices, and the specific implementation principle of each module or unit may refer to the corresponding content in the foregoing embodiment of the fast test method for mass production C-V2X devices, which is not described herein again.
As shown in fig. 4, the present invention further provides an electronic device 400 accordingly. The electronic device 400 comprises a processor 401, a memory 402 and a display 403. Fig. 4 shows only some of the components of the electronic device 400, but it should be understood that not all of the illustrated components are required to be implemented and that more or fewer components may be implemented instead.
The processor 401 may in some embodiments be a central processing unit (Central Processing Unit, CPU), microprocessor or other data processing chip for running program code or processing data stored in the memory 402, such as the mass-produced C-V2X device fast speed test program of the present invention.
In some embodiments, the processor 401 may be a single server or a group of servers. The server farm may be centralized or distributed. In some embodiments, the processor 401 may be local or remote. In some embodiments, the processor 401 may be implemented in a cloud platform. In an embodiment, the cloud platform may include a private cloud, a public cloud, a hybrid cloud, a community cloud, a distributed cloud, an inter-internal, multiple clouds, or the like, or any combination thereof.
The memory 402 may be an internal storage unit of the electronic device 400 in some embodiments, such as a hard disk or memory of the electronic device 400. The memory 402 may also be an external storage device of the electronic device 400 in other embodiments, such as a plug-in hard disk, a Smart Media Card (SMC), a Secure Digital (SD) Card, a Flash Card (Flash Card) or the like, which are provided on the electronic device 400.
Further, the memory 402 may also include both internal storage units and external storage devices of the electronic device 400. The memory 402 is used for storing application software and various types of data for installing the electronic device 400.
The display 403 may be an LED display, a liquid crystal display, a touch-sensitive liquid crystal display, an OLED (Organic Light-Emitting Diode) touch, or the like in some embodiments. The display 403 is used for displaying information at the electronic device 400 and for displaying a visual user interface. The components 401-403 of the electronic device 400 communicate with each other via a system bus.
In one embodiment, when the processor 401 executes the C-V2X device flash test program of the face vector generation in the memory 402, the following steps may be implemented:
acquiring a hardware architecture of a target C-V2X device, acquiring main target parameters of the target C-V2X device according to input test instructions of the hardware architecture, and selecting the minimum test instructions for acquiring the main target parameters as target test instructions;
acquiring all qualified parameters according to the attribute characteristics of qualified C-V2X equipment, and constructing a judgment matrix according to all the qualified parameters;
sequentially acquiring test parameters of the current C-V2X equipment to be tested under different target test instructions based on the target test instructions, and sequentially carrying out parameter comparison with a judgment matrix according to the test parameters;
when the parameter comparison is completely passed, outputting the test parameters of the current C-V2X equipment to be tested and recording the test parameters as qualified parameters, and when the parameter comparison is not passed, interrupting the test of the current C-V2X equipment to be tested and recording abnormal data.
It should be understood that: the processor 401 may perform other functions in addition to the above functions in executing the C-V2X device flash test program generated by the face vector in the memory 402, and in particular, reference may be made to the description of the corresponding method embodiments above.
Further, the type of the electronic device 400 is not particularly limited, and the electronic device 400 may be a portable electronic device such as a mobile phone, a tablet computer, a personal digital assistant (personal digital assistant, PDA), a wearable device, a laptop (laptop), etc. Exemplary embodiments of portable electronic devices include, but are not limited to, portable electronic devices that carry IOS, android, microsoft or other operating systems. The portable electronic device described above may also be other portable electronic devices, such as a laptop computer (laptop) or the like having a touch-sensitive surface, e.g. a touch panel. It should also be appreciated that in other embodiments of the invention, electronic device 400 may not be a portable electronic device, but rather a desktop computer having a touch-sensitive surface (e.g., a touch panel).
Correspondingly, the embodiment of the application also provides a computer readable storage medium, which is used for storing a computer readable program or instruction, and when the program or instruction is executed by a processor, the steps or functions in the method for rapidly testing the C-V2X equipment produced by the surface vector provided by the embodiments of the method can be realized.
Those skilled in the art will appreciate that all or part of the flow of the methods of the embodiments described above may be accomplished by way of a computer program stored in a computer readable storage medium to instruct related hardware (e.g., a processor, a controller, etc.). The computer readable storage medium is a magnetic disk, an optical disk, a read-only memory or a random access memory.
The method, the system, the equipment and the medium for rapidly testing the C-V2X equipment of the face vector production provided by the invention are described in detail, and specific examples are applied to illustrate the principle and the implementation mode of the invention, and the description of the examples is only used for helping to understand the method and the core idea of the invention; meanwhile, as those skilled in the art will have variations in the specific embodiments and application scope in light of the ideas of the present invention, the present description should not be construed as limiting the present invention.
Claims (10)
1. A mass production-oriented C-V2X equipment rapid test method is characterized by comprising the following steps:
acquiring a hardware architecture of a target C-V2X device, acquiring main target parameters of the target C-V2X device according to input test instructions of the hardware architecture, and selecting the minimum test instructions for acquiring the main target parameters as target test instructions;
acquiring all qualified parameters according to the attribute characteristics of qualified C-V2X equipment, and constructing a judgment matrix according to all the qualified parameters;
sequentially acquiring test parameters of the current C-V2X equipment to be tested under different target test instructions based on the target test instructions, and sequentially carrying out parameter comparison with a judgment matrix according to the test parameters;
when the parameter comparison is completely passed, outputting the test parameters of the current C-V2X equipment to be tested and recording the test parameters as qualified parameters, and when the parameter comparison is not passed, interrupting the test of the current C-V2X equipment to be tested and recording abnormal data.
2. The method for rapidly testing a C-V2X device produced by a surface vector according to claim 1, wherein the obtaining a hardware architecture of a target C-V2X device, obtaining main target parameters of the target C-V2X device according to the hardware architecture input test instruction, selecting a minimum test instruction of all the target parameters as a target test instruction, comprises:
acquiring a core hardware module of the target C-V2X device;
respectively inputting different test instructions into the core hardware module of the target C-V2X equipment to obtain main target parameters, and carrying out statistics integration on all the input test instructions to obtain target test instructions;
the target test instruction is the least test instruction for acquiring main target parameters of target C-V2X equipment; the main target parameters can feed back the hardware IC of the core hardware module of the C-V2X equipment to which the parameters belong or the hardware state of the module.
3. The mass-production-oriented C-V2X device rapid test method of claim 2, wherein the target C-V2X device core hardware module comprises: a cellar module, a BT/WiFi module, a V2X module, a GNSS module, an HSM module, or a combination thereof.
4. The mass-production-oriented C-V2X plant rapid test method according to claim 3, wherein the main target parameters include:
the first module mounting state parameter, the resident network state parameter and the SIM IC state parameter of the cell module;
the second module of the BT/WiFi module is provided with a state parameter and an SSID parameter;
the third module of the V2X module is provided with a mounting state parameter, a signal power parameter and a star locking state parameter;
the fourth module of the GNSS module is provided with a mounting state parameter and a GPS state parameter;
and the fifth module mounting parameter and the self-checking parameter of the HSM module.
5. The method for fast testing a C-V2X device for face vector production of claim 4, wherein said target instruction comprises: the method comprises a network equipment address display instruction, an equipment network detection instruction, a communication function confirmation instruction and a security verification function confirmation instruction.
6. The method for rapidly testing the C-V2X device produced by the surface vector according to claim 5, wherein the step of sequentially obtaining the test parameters of the current C-V2X device to be tested under different target test instructions based on the target test instructions comprises the steps of:
acquiring the first module mounting state parameter, the second module mounting state parameter, the third module mounting state parameter, the fourth module mounting state parameter, the fifth module mounting state parameter and the SSID parameter through the network equipment address display instruction;
acquiring the resident network state parameter and the SIM IC state parameter through the equipment network detection instruction;
acquiring the third module mounting state parameter and the star locking state parameter through a communication function confirmation instruction;
acquiring the fifth module mounting parameter and the self-checking parameter through the security signature checking function confirmation instruction;
the signal power parameters are obtained through measurement by a radio frequency comprehensive tester.
7. The method for rapidly testing the C-V2X device produced by the surface vector according to claim 5, wherein when the parameter comparison is completely passed, outputting the test parameter of the current C-V2X device to be tested and recording the test parameter as a qualified parameter, and when the parameter comparison is not passed, interrupting the test of the current C-V2X device to be tested and recording the abnormal data, comprising:
outputting the test parameters of the current C-V2X equipment to be tested when the test parameters acquired in sequence are compared with the corresponding qualified parameters in the judgment matrix and pass through the judgment matrix, recording the test parameters as the qualified parameters, and ending the test of the current C-V2X equipment to be tested;
and when the comparison of the sequentially acquired test parameters and the corresponding qualified parameters in the judgment matrix is failed, interrupting the subsequent test of the current C-V2X equipment to be tested, recording the abnormal hardware module information of the current C-V2X equipment to be tested, and ending the test of the current C-V2X equipment to be tested.
8. A quick test system of C-V2X equipment towards mass production is characterized in that includes:
the target instruction acquisition module is used for acquiring a hardware architecture of the target C-V2X equipment, acquiring all target parameters of the target C-V2X equipment according to the hardware architecture input test instruction, and selecting the minimum test instruction of all the target parameters as a target test instruction;
the judging matrix construction module is used for acquiring all qualified parameters according to the attribute characteristics of the qualified C-V2X equipment and constructing a judging matrix according to all the qualified parameters;
the test parameter comparison module is used for sequentially acquiring test parameters of the current C-V2X equipment to be tested under different target test instructions based on the target test instructions, and sequentially carrying out parameter comparison with the judgment matrix according to the test parameters;
and the data output recording module is used for outputting the test parameters of the current C-V2X equipment to be tested and recording the test parameters as qualified parameters when the parameter comparison is completely passed, and interrupting the test of the current C-V2X equipment to be tested and recording abnormal data when the parameter comparison is not passed.
9. An electronic device comprising a memory, a processor and a computer program stored on the memory and executable on the processor, characterized in that the processor implements a method for fast testing of a C-V2X device produced by a surface vector according to any one of claims 1 to 7 when the program is executed by the processor.
10. A computer-readable storage medium, on which a computer program is stored, characterized in that the program, when being executed by a processor, implements a C-V2X device rapid test method of face vector production according to any one of claims 1 to 7.
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Denomination of invention: Rapid testing methods, systems, equipment, and media for C-V2X equipment for mass production Effective date of registration: 20231010 Granted publication date: 20230714 Pledgee: Bank of China Limited Wuhan Economic and Technological Development Zone sub branch Pledgor: ISMARTWAYS (WUHAN) TECHNOLOGY Co.,Ltd. Registration number: Y2023980060478 |