CN116184095A - Electromagnetic interference injection probe and system - Google Patents
Electromagnetic interference injection probe and system Download PDFInfo
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- CN116184095A CN116184095A CN202310375713.5A CN202310375713A CN116184095A CN 116184095 A CN116184095 A CN 116184095A CN 202310375713 A CN202310375713 A CN 202310375713A CN 116184095 A CN116184095 A CN 116184095A
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- 238000002347 injection Methods 0.000 title claims abstract description 94
- 239000007924 injection Substances 0.000 title claims abstract description 94
- 239000000523 sample Substances 0.000 title claims abstract description 74
- 238000012360 testing method Methods 0.000 claims abstract description 39
- 239000000758 substrate Substances 0.000 claims abstract description 13
- 230000008054 signal transmission Effects 0.000 claims abstract description 7
- 230000008878 coupling Effects 0.000 claims description 19
- 238000010168 coupling process Methods 0.000 claims description 19
- 238000005859 coupling reaction Methods 0.000 claims description 19
- 239000003990 capacitor Substances 0.000 claims description 17
- 238000010586 diagram Methods 0.000 claims description 17
- 238000012545 processing Methods 0.000 claims description 17
- 238000001914 filtration Methods 0.000 claims description 10
- 238000010992 reflux Methods 0.000 claims description 2
- 230000005540 biological transmission Effects 0.000 description 6
- 238000000034 method Methods 0.000 description 6
- 230000008569 process Effects 0.000 description 6
- 238000007796 conventional method Methods 0.000 description 2
- 230000001627 detrimental effect Effects 0.000 description 2
- 239000000463 material Substances 0.000 description 2
- 230000005855 radiation Effects 0.000 description 2
- 230000001052 transient effect Effects 0.000 description 2
- 230000002238 attenuated effect Effects 0.000 description 1
- 239000003989 dielectric material Substances 0.000 description 1
- 238000005259 measurement Methods 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 230000037361 pathway Effects 0.000 description 1
- 239000000243 solution Substances 0.000 description 1
- 238000012546 transfer Methods 0.000 description 1
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/001—Measuring interference from external sources to, or emission from, the device under test, e.g. EMC, EMI, EMP or ESD testing
Abstract
The application relates to an electromagnetic interference injection probe and a system. The electromagnetic interference injection circuit includes: a substrate for functioning as a ground layer; the signal transmission module is arranged on the surface of the substrate and comprises a filter assembly, a first connector, a second connector and a third connector, wherein the first end of the filter assembly is connected with the first connector, the second end of the filter assembly is respectively connected with the second connector and the third connector, the first connector is used for receiving pulse signals, the second connector is used for being connected with an oscilloscope, and the third connector is used for being connected with a device to be tested. The electromagnetic interference injection probe can reduce noise interference, accurately monitor pulse parameters of pulse signals injected into a device to be tested in real time, and further obtain accurate electromagnetic interference test results.
Description
Technical Field
The present disclosure relates to the field of electromagnetic interference testing, and in particular, to an electromagnetic interference injection probe and system.
Background
Electromagnetic interference refers to some electrical variation phenomenon that occurs in the system during operation, independent of the useful signal, and detrimental to system performance or signal transmission. In the near field region, electromagnetic interference acts primarily through the pathway of conductive coupling.
At present, most electromagnetic interference injection tests are mainly divided into direct conduction injection and space radiation. The direct conduction injection mode is often realized by adopting a direct injection probe, and the direct injection probe directly injects the output pulse of the pulse generator into the device to be tested, but the mode can lead to inconsistent parameters of the pulse signal input into the device to be tested and the output parameters of the pulse generator.
Disclosure of Invention
Based on this, it is necessary to provide an electromagnetic interference injection probe and system that can accurately monitor the pulse parameters of the pulse signal injected into the device under test in real time.
In a first aspect, the present application provides an electromagnetic interference injection probe comprising:
a substrate for functioning as a ground layer;
the signal transmission module is arranged on the surface of the substrate and comprises a filter assembly, a first connector, a second connector and a third connector, wherein the first end of the filter assembly is connected with the first connector, the second end of the filter assembly is respectively connected with the second connector and the third connector, the first connector is used for receiving pulse signals, the second connector is used for being connected with an oscilloscope, and the third connector is used for being connected with a device to be tested.
In the electromagnetic interference injection system, the pulse signals are received through the first connector, the first connector transmits the pulse signals to the filtering component, the filtering component transmits the pulse signals to the oscilloscope through the second connector after filtering treatment, and the pulse signals are transmitted to the device to be tested through the third connector, so that noise interference is reduced; the signals injected into the device to be tested and transmitted to the oscilloscope are the same signals, so that the pulse parameters of the pulse signals injected into the device to be tested can be accurately monitored in real time through the pulse signals after the oscilloscope measures and processes, and further, accurate electromagnetic interference test results can be obtained.
In one embodiment, the filtering component comprises:
the first end of the filter circuit is used for receiving pulse signals, and the second end of the filter circuit is connected with the third connector and is used for injecting the pulse signals into the device to be tested through the third connector after the pulse signals are subjected to filter processing;
and the first end of the shunt circuit is connected with the second end of the filter circuit, and the second end of the shunt circuit is used for being connected with the second connector and transmitting the pulse signals processed by the filter circuit to the oscilloscope through the second connector.
In one embodiment, the filter circuit includes a coupling capacitor, a first connection line and a second connection line, wherein a first polar plate of the coupling capacitor is connected with the first connector through the first connection line, and a second polar plate of the coupling capacitor is connected with the third connector and the first end of the shunt circuit through the second connection line respectively.
In one embodiment, the third connector includes probes for contact connection with pins of a device under test.
In one embodiment, the substrate is provided with a fixing hole, and the fixing hole is used for being connected with the clamp.
In a second aspect, the present application further provides an electromagnetic interference injection system, including:
electromagnetic interference injection probes as described above;
the pulse generator is used for outputting pulse signals to the first connector of the electromagnetic interference injection probe;
and the oscilloscope is used for receiving the target pulse signal output by the second connector of the electromagnetic interference injection probe and measuring the waveform of the target pulse signal.
In one embodiment, the electromagnetic interference injection system further comprises:
and the calibration component is respectively connected with the third connector and the oscilloscope so as to receive the pulse signals output by the third connector, and outputs calibration pulse signals to the oscilloscope after performing calibration processing.
In one embodiment, the electromagnetic interference injection system further comprises:
and the processing component is connected with the oscilloscope, and is used for receiving calibration pulse signal data stored in the oscilloscope and generating a waveform diagram for comparison with a reference waveform according to the calibration pulse signal data.
In one embodiment, the electromagnetic interference injection system further comprises:
and the support component is used for placing a target component and providing a signal reflux path for the target component, wherein the target component is at least one of the device to be tested and the calibration component, and the surface of the support component is a ground plane.
In one embodiment, the electromagnetic interference injection system further comprises:
the clamp is used for clamping the electromagnetic interference injection probe;
and the moving platform is connected with the clamp and used for driving the clamp to move.
In the electromagnetic interference injection system, the pulse generator outputs the pulse signal to the first connector of the electromagnetic interference injection probe, so that the first connector transmits the pulse signal to the filter component, the filter component transmits the pulse signal to the oscilloscope through the second connector after filtering treatment, and the pulse signal is transmitted to the device to be tested through the third connector, thereby reducing noise interference; the signals injected into the device to be tested and transmitted to the oscilloscope are the same signals, so that the pulse parameters of the pulse signals injected into the device to be tested can be accurately monitored in real time through the pulse signals after the oscilloscope measures and processes, and further, accurate electromagnetic interference test results can be obtained.
Drawings
In order to more clearly illustrate the technical solutions of embodiments or conventional techniques of the present application, the drawings required for the descriptions of the embodiments or conventional techniques will be briefly described below, and it is apparent that the drawings in the following description are only some embodiments of the present application, and other drawings may be obtained according to these drawings without inventive effort for a person of ordinary skill in the art.
FIG. 1 is a schematic diagram of an electromagnetic interference injection probe in one embodiment;
FIG. 2 is a diagram of a pulse waveform of an electromagnetic interference injection probe injected into a device under test in one embodiment;
FIG. 3 is a schematic diagram of an equivalent circuit of an electromagnetic interference injection probe in one embodiment;
FIG. 4 is a schematic diagram of an electromagnetic interference injection probe in another embodiment;
FIG. 5 is a schematic diagram of an electromagnetic interference injection probe in yet another embodiment;
FIG. 6 is a schematic diagram of an electromagnetic interference injection system in one embodiment;
FIG. 7 is an equivalent circuit diagram of an electromagnetic interference injection system in one embodiment;
FIG. 8 is an equivalent circuit diagram of an electromagnetic interference injection system in another embodiment;
FIG. 9 is an equivalent circuit diagram of an electromagnetic interference injection system in yet another embodiment;
FIG. 10 is a diagram showing waveforms corresponding to calibration pulse signals versus reference waveforms according to an embodiment.
Reference numerals illustrate:
11-base plate, 111-fixed hole, 12-filter assembly, 121-filter circuit, 122-shunt circuit, 13-first connector, 14-second connector, 15-third connector, 151-probe, 21-pulse signal generator, 31-device under test, 41-oscilloscope, 51-calibration assembly, 61-support assembly, 71-processing assembly.
Detailed Description
In order to facilitate an understanding of the present application, a more complete description of the present application will now be provided with reference to the relevant figures. Examples of the present application are given in the accompanying drawings. This application may, however, be embodied in many different forms and is not limited to the embodiments described herein. Rather, these embodiments are provided so that this disclosure will be thorough and complete.
Unless defined otherwise, all technical and scientific terms used herein have the same meaning as commonly understood by one of ordinary skill in the art to which this application belongs. The terminology used herein in the description of the application is for the purpose of describing particular embodiments only and is not intended to be limiting of the application.
It will be understood that the terms "first," "second," and the like, as used herein, may be used to describe various elements, but these elements are not limited by these terms. These terms are only used to distinguish one element from another element. For example, a first resistance may be referred to as a second resistance, and similarly, a second resistance may be referred to as a first resistance, without departing from the scope of the present application. Both the first resistor and the second resistor are resistors, but they are not the same resistor.
It is to be understood that in the following embodiments, "connected" is understood to mean "electrically connected", "communicatively connected", etc., if the connected circuits, modules, units, etc., have electrical or data transfer between them.
As used herein, the singular forms "a", "an" and "the" are intended to include the plural forms as well, unless the context clearly indicates otherwise. It will be further understood that the terms "comprises" and/or "comprising," and/or the like, specify the presence of stated features, integers, steps, operations, elements, components, or groups thereof, but do not preclude the presence or addition of one or more other features, integers, steps, operations, elements, components, or groups thereof. Also, the term "and/or" as used in this specification includes any and all combinations of the associated listed items.
As described in the background, electromagnetic interference refers to some electrical variation phenomenon that occurs in a system during operation, independent of the useful signal, and detrimental to system performance or signal transmission. In the near field region, i.e. in the range of r < λ/(2π), electromagnetic interference acts mainly by means of conductive coupling.
At present, most electromagnetic interference injection tests are mainly divided into direct conduction injection and space radiation. The direct conduction injection mode is usually realized by adopting a direct injection probe, the direct injection probe directly injects the output pulse of the pulse signal generator into the device to be tested, the pulse parameter injected into the pin of the device is determined by the output parameter of the pulse signal generator, but in the actual process, the pulse parameter is often changed after passing through the transmission cable and the injection probe, so that the pulse parameter actually injected into the pin of the device to be tested is inconsistent with the output parameter of the pulse signal generator.
In one embodiment, as shown in fig. 1, the present application provides an electromagnetic interference injection probe, comprising: a substrate 11 and a signal transmission module.
Wherein the substrate 11 is used as a ground layer; the signal transmission module is arranged on the surface of the substrate 11 and comprises a filter assembly 12, a first connector 13, a second connector 14 and a third connector 15, wherein a first end of the filter assembly 12 is connected with the first connector 13, a second end of the filter assembly 12 is respectively connected with the second connector 14 and the third connector 15, the first connector 13 is used for receiving pulse signals, the second connector 14 is used for being connected with an oscilloscope 41, and the third connector 15 is used for being connected with a device 31 to be tested.
Alternatively, the substrate 11 may be a printed circuit board, the first connector 13 and the second connector 14 may be SMA connectors, and the pulse signal generator 21 may transmit the pulse signal to the filter assembly 12 through the first connector 13 based on characteristics of the SMA connectors; the filter assembly 12 may transmit the filtered pulse signal to the oscilloscope 41 via the second connector 14.
In application, the first connector 13 may be connected to the output end of the pulse signal generator 21 through a transmission cable to receive the pulse signal output by the pulse signal generator 21, and the second connector 14 may also be connected to the input end of the oscilloscope 41 through the transmission cable, where the impedance of the transmission cable may be 50 ohms. The third connector 15 may be a probe connector.
It can be understood that the second end of the filter assembly 12 is respectively connected to the second connector 14 and the third connector 15, the second connector 14 is used for being connected to the oscilloscope 41, the third connector 15 is used for being connected to the device under test 31, then the pulse signal output by the second end of the filter assembly 12 is respectively output to the device under test 31 and the oscilloscope 41, and the pulse signal measured by the oscilloscope 41 is the injection pulse signal received by the device under test 31. Accordingly, the pulse parameters of the pulse signal injected into the device under test 31 can be accurately monitored in real time by measuring the processed pulse signal with the oscilloscope 41.
Illustratively, fig. 2 is a pulse waveform diagram of an electromagnetic interference injection probe injected into a device under test in one embodiment. As can be seen from fig. 2, when the pulse signal generator 21 outputs the disturbance pulse with the amplitude of 350V, the actual pulse amplitude actually injected into the device pin by the direct injection probe is only 82.183V, which verifies that the pulse generation output pulse is attenuated compared with the pulse injection parameter of the probe during actual injection. It is therefore necessary to monitor the actual injection pulse parameters of the direct injection probe in real time.
The electromagnetic interference injection probe outputs a pulse signal to the first connector 13 of the electromagnetic interference injection probe through the pulse signal generator 21, so that the first connector 13 transmits the pulse signal to the filter component 12, the filter component 12 performs filter processing on the pulse signal, and then transmits the pulse signal to the oscilloscope 41 through the second connector 14 and transmits the pulse signal to the device 31 to be tested through the third connector 15, thereby reducing noise interference; since the signals injected into the device under test 31 and transmitted to the oscilloscope 41 are the same signals, the processed pulse signals are measured by the oscilloscope 41, so that the pulse parameters of the pulse signals injected into the device under test 31 can be accurately monitored in real time, and further, the accurate electromagnetic interference test result can be obtained.
For the above reasons, as shown in fig. 3, the filter assembly 12 includes: a filter circuit 121 and a shunt circuit 122.
The first end of the filter circuit 121 is configured to receive the pulse signal, and the second end of the filter circuit 121 is configured to be connected to the third connector 15, and configured to filter the pulse signal and inject the pulse signal into the device under test 31 through the third connector 15. The first end of the shunt circuit 122 is connected to the second end of the filter circuit 121, and the second end of the shunt circuit 122 is connected to the second connector 14, so as to transmit the pulse signal processed by the filter circuit 121 to the oscilloscope 41 through the second connector 14.
The pulse signal may be generated by the pulse signal generator 21, and an output terminal of the pulse signal generator 21 is connected to the first terminal of the filter circuit 121, so that the pulse signal is transmitted to the filter circuit 121. Illustratively, the pulse signal generator 21 may be an EFT (Electrical Fast Transient, electric fast pulse train) generator.
It can be understood that the second end of the filter circuit 121 is connected to the third connector 15 and the first end of the shunt circuit 122, and the second end of the shunt circuit 122 is connected to the second connector 14, so that the pulse signals output by the second end of the filter circuit 121 are respectively output to the device under test 31 and the oscilloscope 41, and the pulse signals measured by the oscilloscope 41 are the injection pulse signals received by the device under test 31, so that the pulse parameters of the pulse signals injected into the device under test 31 can be accurately monitored in real time.
Alternatively, the shunt circuit 122 may include a transmission line, and the second connector 14 is connected to the second plate of the coupling capacitor through the transmission line, and transmits the pulse signal after the filtering process to the device under test 31 through the second connector 14. Wherein the second connector 14 may be an SMA connector.
In this embodiment, the filter circuit 121 receives the pulse signal, filters the pulse signal, and injects the filtered pulse signal into the device under test 31, thereby reducing noise interference; the shunt circuit 122 transmits the pulse signal processed by the filter circuit 121 to the oscilloscope 41, and because the signals injected to the device under test 31 and transmitted to the oscilloscope 41 are the same signals, the pulse parameter of the pulse signal injected to the device under test 31 can be accurately monitored in real time by measuring the processed pulse signal by the oscilloscope 41, and further, an accurate electromagnetic interference test result can be obtained.
In one embodiment, as shown in fig. 4, the filter circuit 121 includes a coupling capacitor C, a first connection line L1 and a second connection line L2, wherein a first plate of the coupling capacitor C is connected to the first connector 13 through the first connection line L1, and a second plate of the coupling capacitor C is connected to the third connector 15 and a first end of the shunt circuit 122 through the second connection line L2, respectively.
The output pulse signals are integrated and filtered through the coupling capacitor C, so that noise is reduced.
Illustratively, the length and width dimensions of the first connection line L1 may be 2mm×16.1mm, the length of the second connection line L2 may be 7.2mm, and the width may be selected from four specifications of 2mm, 5mm, 8mm, and 10 mm.
It should be noted that, the performance of the electromagnetic interference injection probe may be adjusted by changing the capacitance value of the coupling capacitor C, the size of the first connection line L1 and the size of the second connection line L2, or applying different wire materials and dielectric materials. In addition, the probe usage pattern can be adjusted by changing the fixing pattern of the substrate 11. Therefore, in application, the coupling capacitors C with different specifications can be replaced according to actual requirements, and the specification of the coupling capacitor C is not limited in this embodiment. In the application, the first connecting line L1 and the second connecting line L2 with different sizes can be replaced according to actual requirements, and the first connecting line L1 and the second connecting line L2 can also have other sizes than the above examples.
In this embodiment, the first electrode plate of the coupling capacitor C is used to receive the pulse signal, and the second electrode plate of the coupling capacitor C is used to connect with the first end of the shunt circuit 122 and the third connector 15, so that the integrated filtering is performed through the coupling capacitor C, the pulse signal after the filtering processing is transmitted to the device under test 31 through the third connector 15, and the pulse signal after the filtering processing is transmitted to the oscilloscope 41 through the shunt circuit 122, so that the pulse parameter of the pulse signal injected into the device under test 31 can be accurately monitored in real time through the oscilloscope 41, and further an accurate electromagnetic interference test result can be obtained.
In one embodiment, as shown in fig. 4, the third connector includes probes for contact connection with pins of a device under test.
The third connector 15 may be a probe connector, so that the connection between the third connector 15 and the pin of the device 31 to be tested can be realized only by contacting the probe 511 with the pin of the device 31 to be tested, and the operation is flexible and convenient. The third connector 15 may be connected to a pin of the device under test 31 through a probe 511 to output the pulse signal filtered by the filter assembly 12 to the device under test 31.
In one embodiment, as shown in fig. 5, a fixing hole 111 is provided on the base plate 11, and the fixing hole 111 is used for connection with a jig.
The fixing hole 111 may be a screw hole, so that it may be fixedly connected with the clamp by a bolt.
In this embodiment, the fixing hole 111 is formed on the substrate 11, so that the electromagnetic interference injection probe can be connected with the fixture through the fixing hole 111, and then the electromagnetic interference injection probe can be driven to move through the fixture, so that the position of the electromagnetic interference injection probe can be accurately controlled, and the electromagnetic interference injection probe can be accurately controlled to be connected with the device 31 to be tested.
Based on the same inventive concept, in one embodiment, as shown in fig. 6 and 7, the present application further provides an electromagnetic interference injection system, including: an electromagnetic interference injection probe, a pulse signal generator 21 and an oscilloscope 41 according to any of the above aspects.
Wherein the pulse signal generator 21 is used for outputting pulse signals to the first connector 13 of the electromagnetic interference injection probe; the oscilloscope 41 is used for receiving the target pulse signal output by the second connector 14 of the electromagnetic interference injection probe and measuring the waveform of the target pulse signal.
The electromagnetic interference injection system comprises a pulse signal generator 21, an oscilloscope 41 and the electromagnetic interference injection probe of the embodiment, so that the pulse signal generator 21 outputs a pulse signal to the first connector 13 of the electromagnetic interference injection probe, the first connector 13 transmits the pulse signal to the filter component 12, the filter component 12 filters the pulse signal and then transmits the pulse signal to the oscilloscope 41 through the second connector 14 and transmits the pulse signal to the device under test 31 through the third connector 15, and noise interference is reduced; since the signals injected into the device under test 31 and transmitted to the oscilloscope 41 are the same signals, the processed pulse signals are measured by the oscilloscope 41, so that the pulse parameters of the pulse signals injected into the device under test 31 can be accurately monitored in real time, and further, the accurate electromagnetic interference test result can be obtained.
In one embodiment, as shown in fig. 8, the electromagnetic interference injection system further includes: the assembly 51 is calibrated.
The calibration assembly 51 is used for being respectively connected with the third connector 15 and the oscilloscope 41, so as to receive the pulse signal output by the third connector 15, perform calibration processing, and output a calibration pulse signal to the oscilloscope 41.
Wherein the calibration assembly 51 may comprise a shunt.
The shunt and oscilloscope 41 cooperate to measure fast transient current pulses over a range of frequencies, thereby enabling measurement of the pulse signal output by the electromagnetic interference injection probe in the case where the pulse signal generator 21 is an EFT generator.
In one embodiment, as shown in fig. 9, the electromagnetic interference injection system further includes: the processing component 71, the processing component 71 is connected with the oscilloscope 41, and is used for receiving the calibration pulse signal data stored in the oscilloscope 41 and generating a waveform diagram for comparing the calibration pulse signal data with a reference waveform.
In application, the standard probe may be connected to the pulse signal generator 21, the calibration component 51 and the oscilloscope 41, where the pulse signal generator 21 sends a pulse signal of a target parameter to the standard probe, and the standard probe processes the received pulse signal and transmits the processed pulse signal to the calibration component 51, and then sends reference pulse signal data after the calibration of the calibration component 51 to the oscilloscope 41. Processing component 71 may be coupled to oscilloscope 41 to obtain and store reference waveforms from the reference pulse signal data.
When calibrating the electromagnetic interference injection probe of the present embodiment, the electromagnetic interference injection probe is connected with the pulse signal generator 21, the calibration component 51 and the oscilloscope 41 in the connection manner of the above embodiment, the pulse signal generator 21 also transmits the pulse signal of the target parameter to the standard probe, and the electromagnetic interference injection probe processes the received pulse signal and transmits the processed pulse signal to the calibration component 51, and further transmits the calibrated pulse signal data calibrated by the calibration component 51 to the oscilloscope 41. The processing component 71 is connected with the oscilloscope 41, receives calibration pulse signal data stored in the oscilloscope 41, generates a comparison waveform diagram with a reference waveform according to the calibration pulse signal data, and compares the comparison waveform diagram with the reference waveform diagram to determine whether the electromagnetic interference injection probe meets the requirement.
As shown in fig. 10, under the same calibration conditions, the electromagnetic interference direct injection probe and the standard probe calibration waveform (corresponding to langer p250 waveform in the figure) only have 17% difference at the peak of the waveform, and other data and waveform forms are basically consistent, and the calibration result shows that the electromagnetic interference direct injection probe has good injection performance.
In one embodiment, as shown in fig. 8 and 9, the electromagnetic interference injection system further includes: and a support assembly 61.
The support component is used for placing a target component and providing a signal return path for the target component, wherein the target component is at least one of a device under test 31 and a calibration component 51, and the surface of the support component 61 is a ground plane.
In this embodiment, the surface of the supporting component 61 is set as a ground plane, so that when the target component is placed on the surface of the supporting component, the target component can be grounded, and thus a signal return path is provided for the target component.
In one embodiment, the electromagnetic interference injection system further comprises: clamps and a mobile platform (not shown).
The clamp is used for clamping the electromagnetic interference injection probe; the moving platform is connected with the clamp and used for driving the clamp to move.
In application, the mobile platform can be connected with the processing component 71, and when the clamp clamps the electromagnetic interference injection probe, the processing component 71 is used for controlling the moving path of the mobile platform, so that the clamp and the electromagnetic interference injection probe can be driven to move in the same path, and the position of the electromagnetic interference injection probe is controlled, so that the electromagnetic interference injection probe is accurately controlled to be connected with the device 31 to be tested.
In the description of the present specification, reference to the term "some embodiments," "other embodiments," etc., means that a particular feature, structure, material, or characteristic described in connection with the embodiment or example is included in at least one embodiment or example of the present application. In this specification, schematic descriptions of the above terms do not necessarily refer to the same embodiment or example.
The technical features of the above-described embodiments may be arbitrarily combined, and all possible combinations of the technical features in the above-described embodiments are not described for brevity of description, however, as long as there is no contradiction between the combinations of the technical features, they should be considered as the scope of the description.
The above examples only represent a few embodiments of the present application, which are described in more detail and are not to be construed as limiting the scope of the present application. It should be noted that it would be apparent to those skilled in the art that various modifications and improvements could be made without departing from the spirit of the present application, which would be within the scope of the present application. Accordingly, the scope of protection of the present application shall be subject to the appended claims.
Claims (10)
1. An electromagnetic interference injection probe, comprising:
a substrate for functioning as a ground layer;
the signal transmission module is arranged on the surface of the substrate and comprises a filter assembly, a first connector, a second connector and a third connector, wherein the first end of the filter assembly is connected with the first connector, the second end of the filter assembly is respectively connected with the second connector and the third connector, the first connector is used for receiving pulse signals, the second connector is used for being connected with an oscilloscope, and the third connector is used for being connected with a device to be tested.
2. The electromagnetic interference injection probe of claim 1, wherein the filtering assembly comprises:
the first end of the filter circuit is used for receiving pulse signals, and the second end of the filter circuit is connected with the third connector and is used for injecting the pulse signals into the device to be tested through the third connector after the pulse signals are subjected to filter processing;
and the first end of the shunt circuit is connected with the second end of the filter circuit, and the second end of the shunt circuit is used for being connected with the second connector and transmitting the pulse signals processed by the filter circuit to the oscilloscope through the second connector.
3. The electromagnetic interference injection probe of claim 2, wherein the filter circuit comprises a coupling capacitor, a first connection line, and a second connection line, a first plate of the coupling capacitor being connected to the first connector via the first connection line, and a second plate of the coupling capacitor being connected to the third connector via the second connection line, respectively, and a first end of the shunt circuit.
4. The electromagnetic interference injection probe of claim 1, wherein the third connector comprises a probe for contact connection with a pin of a device under test.
5. The electromagnetic interference injection probe of any one of claims 1-4, wherein the base plate is provided with a securing hole for connection with a clamp.
6. An electromagnetic interference injection system, comprising:
the electromagnetic interference injection probe of any one of claims 1 to 5;
the pulse generator is used for outputting pulse signals to the first connector of the electromagnetic interference injection probe;
and the oscilloscope is used for receiving the target pulse signal output by the second connector of the electromagnetic interference injection probe and measuring the waveform of the target pulse signal.
7. The electromagnetic interference injection system of claim 6, further comprising:
and the calibration component is respectively connected with the third connector and the oscilloscope so as to receive the pulse signals output by the third connector, and outputs calibration pulse signals to the oscilloscope after performing calibration processing.
8. The electromagnetic interference injection system of claim 7, further comprising:
and the processing component is connected with the oscilloscope, and is used for receiving calibration pulse signal data stored in the oscilloscope and generating a waveform diagram for comparison with a reference waveform according to the calibration pulse signal data.
9. The electromagnetic interference injection system of claim 7, further comprising:
and the support component is used for placing a target component and providing a signal reflux path for the target component, wherein the target component is at least one of the device to be tested and the calibration component, and the surface of the support component is a ground plane.
10. The electromagnetic interference injection system of claim 6, further comprising:
the clamp is used for clamping the electromagnetic interference injection probe;
and the moving platform is connected with the clamp and used for driving the clamp to move.
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