CN116154880A

CN116154880A - Test device of electronic equipment, control method and control device of test device and electronic equipment

Info

Publication number: CN116154880A
Application number: CN202111374577.5A
Authority: CN
Inventors: 杨灿钦; 孙亨; 潘武; 郭磊
Original assignee: Beijing ByteDance Network Technology Co Ltd
Current assignee: Beijing ByteDance Network Technology Co Ltd
Priority date: 2021-11-19
Filing date: 2021-11-19
Publication date: 2023-05-23

Abstract

The application discloses a testing device of electronic equipment, a control method and a control device of the testing device and the electronic equipment. A test apparatus for an electronic device, comprising: the universal serial bus hub comprises a first port and a second port, wherein the first port is used for receiving communication signals, and the second port is used for outputting first power supply signals and communication signals; the current module comprises a third port and a fourth port, the third port is connected with the second port, the fourth port is used for being connected with the electronic equipment to output a second power supply signal and a communication signal to the electronic equipment, and the current module is used for adjusting the first power supply signal so that the current value of the second power supply signal output by the fourth port is lower than the charging current of the electronic equipment or the current value of the second power supply signal is equal to the current value of the first power supply signal; and the embedded motherboard is connected with the current module and the universal serial bus hub and is used for controlling the current module to work according to the received control instruction. The battery overshoot can be avoided.

Description

Test device of electronic equipment, control method and control device of test device and electronic equipment

Technical Field

The application belongs to the technical field of electronic equipment, and particularly relates to a testing device of electronic equipment, a control method and device of the testing device, and the electronic equipment.

Background

In the related art, when testing an application capable of running on a mobile phone or testing a system function of the mobile phone, the mobile phone running the tested application needs to maintain an operating state for a long time, and thus it is connected to an external power supply for a long time. Under the condition of connecting an external power supply, the mobile phone battery is in a full power state for a long time, so that the service life of the mobile phone battery is shortened, and even dangerous situations such as battery bulge and the like can be caused.

Disclosure of Invention

An object of the embodiments of the present application is to provide a testing device for an electronic device, a control method thereof, a control device, and an electronic device, which can enable a battery of the electronic device to circulate between charging and discharging appropriately when the electronic device is tested for a long time, and prevent the battery from swelling.

In a first aspect, an embodiment of the present application provides a test apparatus for an electronic device, including:

the universal serial bus hub comprises a first port and a second port, wherein the first port is used for receiving communication signals, and the second port is used for outputting first power supply signals and communication signals;

The current module comprises a third port and a fourth port, the third port is connected with the second port, the fourth port is used for being connected with the electronic equipment to output a second power supply signal and a communication signal to the electronic equipment, and the current module is used for adjusting the first power supply signal so that the current value of the second power supply signal output by the fourth port is lower than the charging current of the electronic equipment or the current value of the second power supply signal is equal to the current value of the first power supply signal;

and the embedded motherboard is connected with the current module and the universal serial bus hub and is used for controlling the current module to work according to the received control instruction.

In a second aspect, an embodiment of the present application provides a method for controlling a testing device of an electronic apparatus, including:

acquiring current equipment information of the electronic equipment and current electric quantity of the electronic equipment;

determining a corresponding threshold according to the current equipment information;

and adjusting the current value of the power supply signal output to the electronic equipment based on the comparison result of the current electric quantity and the threshold value.

In a third aspect, an embodiment of the present application provides a control device of a testing device of an electronic apparatus, including:

the acquisition module is used for acquiring current equipment information of the electronic equipment and current electric quantity of the electronic equipment;

The determining module is used for determining a corresponding threshold according to the current equipment information;

and the adjusting module is used for adjusting the current value of the power supply signal output to the electronic equipment based on the comparison result of the current electric quantity and the threshold value.

In a fourth aspect, embodiments of the present application provide an electronic device comprising a processor, a memory and a program or instructions stored on the memory and executable on the processor, the program or instructions implementing the steps of the method as in the first aspect when executed by the processor.

In a fifth aspect, embodiments of the present application provide a readable storage medium having stored thereon a program or instructions which when executed by a processor perform the steps of the method as in the first aspect.

In a sixth aspect, embodiments of the present application provide a chip comprising a processor and a communication interface coupled to the processor for running a program or instructions implementing the steps of the method as in the first aspect.

In this embodiment of the present application, the test device for an electronic device includes a universal serial bus Hub (Universal SerialBus Hub, USB Hub) and an embedded motherboard, where the universal serial bus Hub includes a first port and a second port, the first port can be connected to a host computer such as a computer, and the number of the second ports can be multiple, so that one port (USB port) of the computer can be connected to multiple handsets at the same time. Meanwhile, the universal serial bus can also be connected with an external power supply, or the universal serial bus comprises a power supply module, a first power supply signal is generated through the external power supply or the power supply module, and the first power supply signal is transmitted to the electronic equipment through the second port, so that the electronic equipment is charged.

The testing device further comprises a current module and an embedded motherboard, wherein the embedded motherboard can be a microcomputer motherboard, such as a Raspberry group (ARM-based microcomputer motherboard developed by the Raspberry Pi foundation), and the current module is controlled to work by control instructions by writing corresponding functions in the embedded motherboard.

The current module comprises a third port and a fourth port, wherein the third port is connected with the second port, and the fourth port is used for connecting electronic equipment. When the number of the second ports is multiple, namely, each time an electronic device is connected, the current modules are correspondingly connected, through the current modules, under the control of an embedded motherboard (raspberry group), the first power supply signal output by the second port of the universal serial bus hub can be adjusted, so that the current value of the second power supply signal output by the fourth port is the same as that of the first power supply signal, or the current value of the second power supply signal is reduced, so that the current value of the second power supply signal is lower than the charging current of the electronic device, and it can be understood that the testing device cannot charge the electronic device when the current value of the second power supply signal is lower than the charging current of the electronic device.

When the current module does not limit the current value of the charging signal, the signal (including the second power supply signal and the communication signal) output by the fourth port of the current module is the same as the signal accessed by the third port of the current module. When the current module limits the current value of the charging signal, the communication signal output by the fourth port of the current module is kept unchanged, and the current value of the second power supply signal is reduced, specifically to be lower than the charging current value of the electronic equipment, so that the electronic equipment is circularly switched between a charging state and a discharging state according to the current residual electric quantity of the electronic equipment, the residual electric quantity of the electronic equipment can be kept in a proper range, long-time overshoot of a battery caused by long-time connection of the charging signal is prevented, the service life of the battery of the tested electronic equipment can be effectively prolonged, the problems of 'bulge' caused by long-time full electric and overshoot of the battery can be avoided, and the use safety of the testing device is effectively improved.

Drawings

Fig. 1 shows a schematic structural diagram of a test apparatus of an electronic device according to an embodiment of the present application;

FIG. 2 shows a flow chart of a control method of a test device of an electronic device according to an embodiment of the application;

FIG. 3 shows a logic diagram of a test apparatus of an electronic device according to an embodiment of the present application;

fig. 4 shows a block diagram of a control device of a test device of an electronic apparatus according to an embodiment of the present application;

FIG. 5 shows a block diagram of an electronic device according to an embodiment of the present application;

fig. 6 is a schematic hardware structure of an electronic device implementing an embodiment of the present application.

Reference numerals:

100 test devices, 102 usb hubs, 1022 first ports, 1024 second ports, 104 current modules, 1042 third ports, 1044 fourth ports, 106 embedded motherboard, 108 upper computer.

Detailed Description

Technical solutions in the embodiments of the present application will be clearly described below with reference to the drawings in the embodiments of the present application, and it is apparent that the described embodiments are some embodiments of the present application, but not all embodiments. All other embodiments obtained by a person of ordinary skill in the art based on the embodiments in the present application are within the scope of the protection of the present application.

The terms first, second and the like in the description and in the claims, are used for distinguishing between similar objects and not necessarily for describing a particular sequential or chronological order. It is to be understood that the data so used may be interchanged, as appropriate, such that embodiments of the present application may be implemented in sequences other than those illustrated or described herein, and that the objects identified by "first," "second," etc. are generally of a type and not limited to the number of objects, e.g., the first object may be one or more. Furthermore, in the description and claims, "and/or" means at least one of the connected objects, and the character "/", generally means that the associated object is an "or" relationship.

The test device for the electronic device, the control method and the control device for the electronic device, and the electronic device provided by the embodiment of the application are described in detail below by means of specific embodiments and application scenes thereof with reference to the accompanying drawings.

In some embodiments of the present application, a test apparatus of an electronic device is provided, fig. 1 shows a schematic structural diagram of the test apparatus of the electronic device according to an embodiment of the present application, and as shown in fig. 1, the test apparatus 100 includes:

the universal serial bus hub 102 includes a first port 1022 and a second port 1024, the first port 1022 for receiving communication signals, the second port 1024 for outputting first power signals and communication signals;

the current module 104 comprises a third port 1042 and a fourth port 1044, the third port 1042 is connected with the second port 1024, the fourth port 1044 is used for connecting the electronic device to output a second power supply signal and a communication signal to the electronic device, the current module 104 is used for adjusting the first power supply signal so that the current value of the second power supply signal output by the fourth port 1044 is lower than the charging current of the electronic device, or the current value of the second power supply signal is equal to the current value of the first power supply signal;

The embedded motherboard 106 is connected to the current module 104 and the usb hub 102, and is used for controlling the current module 104 to work according to the received control command.

In this embodiment of the present application, the test apparatus 100 of the electronic device includes a universal serial bus Hub 102, a current module 104 and an embedded motherboard 106, where the universal serial bus Hub 102 (Universal SerialBus Hub, USB Hub) includes a first port 1022 and a second port 1024, the first port 1022 can be connected to a host computer 108 such as a computer, and the number of the second ports 1024 can be multiple for connecting to the electronic device, so that one port (USB port) of the computer can be connected to multiple handsets at the same time. Meanwhile, the universal serial bus can also be connected with an external power supply, or the universal serial bus comprises a power supply module, a first power supply signal is generated through the external power supply or the power supply module, and the first power supply signal is transmitted to the electronic device through the second port 1024 so that the electronic device can be charged.

The test device 100 further includes a current module 104 and an embedded motherboard 106, where the embedded motherboard 106 may be a microcomputer motherboard, such as a Raspberry group (an ARM-based microcomputer motherboard developed by the three foundation of the Raspberry Pi), and the operation of the current module 104 is controlled by control instructions by writing corresponding functions in the embedded motherboard.

The current module 104 includes a third port 1042 and a fourth port 1044, wherein the third port 1042 is connected to the second port 1024, and the fourth port 1044 is used for connecting to an electronic device. When the number of the second ports 1024 is plural, that is, each of the second ports 1024 is connected to one electronic device, one current module 104 is correspondingly connected to the corresponding current module, and through the current module 104, the first power supply signal output by the second ports 1024 of the usb hub 102 can be adjusted under the control of the embedded motherboard 106 (raspberry group), so that the current value of the second power supply signal output by the fourth port 1044 is the same as the first power supply signal, or the current value of the second power supply signal is reduced, so that the current value of the second power supply signal is lower than the charging current of the electronic device.

When the current module 104 does not limit the current value of the charging signal, the signal (including the second power supply signal and the communication signal) output by the fourth port 1044 of the current module 104 is the same as the signal accessed by the third port 1042 thereof. When the current module 104 limits the current value of the charging signal, the communication signal output by the fourth port 1044 thereof remains unchanged, and the current value of the second power supply signal is reduced, specifically, reduced below the charging current value of the electronic device, so as to realize the cyclic switching of the electronic device in two states of the charging state and the discharging state according to the current residual electric quantity of the electronic device, so that the residual electric quantity of the electronic device can be kept in a proper range, long-time overshoot of the battery caused by long-time connection of the charging signal is prevented, on one hand, the battery life of the tested electronic device can be effectively improved, and on the other hand, the problems of 'bulging' caused by long-time full-charge and overshoot of the battery can be avoided, and the use safety of the testing device 100 is effectively improved.

In some embodiments of the present application, the test apparatus 100 further comprises: the upper computer 108 is connected with the first port 1022, and is used for outputting a communication signal and acquiring the current electric quantity and equipment information of the electronic equipment; the method is also used for determining a corresponding threshold according to the equipment information; if the current electric quantity is greater than the first threshold value, a first control instruction is sent to the embedded motherboard 106; and sending a second control instruction to the embedded motherboard 106 if the current electric quantity is less than or equal to a second threshold.

In this embodiment of the present application, the first port 1022 of the usb hub 102 is connected to the host computer 108, where the host computer 108 is specifically a computer, and the host computer 108 generates a communication signal for testing the electronic device and monitors the running state of the electronic device, thereby implementing an automatic test on the electronic device. The communication signals specifically comprise control signals, acquisition signals, digital files and driving signals.

Specifically, during the operation of the upper computer 108, the current power of the electronic device connected to the second port 1024 of the universal serial bus hub, that is, the remaining power of the battery of the electronic device, is monitored in real time, and a corresponding control command is sent to the embedded motherboard 106 (raspberry group) according to the current power of the electronic device, so that the raspberry group controls the current module 104 according to the control command, thereby changing the charging and discharging states of the electronic device.

If the current power of the electronic device is higher than the first threshold, that is, the battery of the electronic device is in a state to be fully charged, the upper computer 108 generates the first control instruction, so that the current value of the second power supply signal is limited by the raspberry group control current module 104, the electronic device works through the power of the battery, and the electronic device is in a discharging state.

When the current electric quantity of the electronic device is smaller than or equal to the second threshold, that is, the battery electric quantity of the electronic device is in a state to be emptied, the upper computer 108 generates a second control instruction, so that the current value of the second power supply signal is not limited any more through the raspberry group control current module 104, the current value of the second power supply signal is equal to the current value of the first power supply signal, the electronic device works through the second power supply signal and charges the battery through the second power supply signal, and the electronic device is in a charging state.

According to the method and the device, the charging and discharging states of the electronic equipment are controlled according to the current electric quantity of the electronic equipment, so that the problems of 'bulge' and the like caused by long-time full power and overshoot of the battery can be avoided, and the use safety of the testing device 100 is improved.

In some embodiments of the present application, when receiving the first control instruction, the embedded motherboard 106 outputs a first level signal to the current module 104, where the first level signal is used to control the current module 104 to reduce the current of the second power supply signal, so that the current value of the second power supply signal is lower than the charging current of the electronic device; or, in the case of receiving the second control instruction, the embedded motherboard 106 outputs a second level signal to the current module 104, where the second level signal is used to control the current module 104 to adjust the current of the second power supply signal to make the current value of the second power supply signal equal to the current value of the first power supply signal.

In this embodiment of the present application, when the upper computer 108 obtains that the current electric quantity of the electronic device is greater than the first threshold, a first control instruction is generated and sent to the embedded motherboard 106 (raspberry group), after the embedded motherboard 106 receives the first control instruction, a first level signal is output to the current module 104 through a preset pin, and after the current module 104 receives the first level signal, the current value of the second power supply signal starts to be limited, so that the current value of the second power supply signal is limited to be lower than the charging current of the electronic device, and at this time, the battery of the electronic device starts to discharge.

When the current electric quantity of the electronic device is smaller than or equal to the second threshold value, the upper computer 108 generates a second control instruction and sends the second control instruction to the embedded motherboard 106 (raspberry group), after the embedded motherboard 106 receives the second control instruction, a second level signal is output to the current module 104 through a preset pin, the current module 104 stops limiting the current value of the second power supply signal after receiving the second level signal, at the moment, the current value of the second power supply signal is the same as the current value of the first power supply signal, and at the moment, the battery of the electronic device starts to charge.

It can be appreciated that the second level signal is low when the first level signal is high and high when the first level signal is low.

The first threshold and the second threshold are full power threshold and empty power threshold of the electronic equipment respectively, and the first threshold and the second threshold are related to the model of the electronic equipment, so that different thresholds can be set for electronic equipment of different models and versions.

When the current power of the electronic device is between the first threshold and the second threshold, the current module 104 may maintain the current operating mode unchanged until the current power of the electronic device reaches above the first threshold or reaches the second threshold.

In some embodiments, the first threshold is 80% and the second threshold is 50%. In other embodiments, the first threshold is 90% and the second threshold is 35%.

In some embodiments of the present application, the number of second ports 1024 is N, where N is a positive integer; the number of the current modules 104 is N, and the N current modules 104 are in one-to-one correspondence with the N second ports 1024.

In this embodiment of the present application, the USB Hub 102, that is, the USB Hub with the USB Hub being "1-to-N", specifically includes N second ports 1024, that is, one port of the host computer 108 can be connected to N electronic devices at the same time, and the N electronic devices can be tested simultaneously at one time.

The number of the current modules 104 is the same as that of the second ports 1024, that is, each second port 1024 is connected with one current module 104, and the management and switching of the charging and discharging states of the electronic device are realized through the current modules 104, so that long-time overshoot of the battery caused by long-time connection of the charging signals is prevented, on one hand, the battery life of the tested electronic device can be effectively improved, on the other hand, the problems of 'bulge' caused by long-time full power and overshoot of the battery can be avoided, and the use safety of the testing device 100 is effectively improved.

In some embodiments of the present application, a control method of a testing apparatus of an electronic device is provided, and fig. 2 shows a flowchart of a control method of a testing apparatus of an electronic device according to an embodiment of the present application, as shown in fig. 2, the method includes:

step 202, acquiring current equipment information of the electronic equipment and current electric quantity of the electronic equipment;

step 204, determining a corresponding threshold according to the current equipment information;

step 206, adjusting the current value of the power supply signal output to the electronic device based on the comparison result of the current electric quantity and the threshold value.

In the embodiment of the application, the testing device of the electronic equipment comprises an upper computer, a USB Hub and a current module, wherein the upper computer is connected with the electronic equipment through the USB Hub, so that the electronic equipment is tested through a program preset by the upper computer.

After the connection between the electronic equipment and the upper computer is established, the upper computer acquires equipment information of the electronic equipment and real-time current electric quantity, wherein the equipment information comprises a unique hardware identification code of the electronic equipment, and the model, the hardware specification, the version and the like of the electronic equipment can be determined through the equipment information. According to the device information, a corresponding threshold of the electronic device can be determined, and the threshold is specifically a threshold for indicating whether the battery level of the electronic device is full or empty.

According to the comparison structure of the current electric quantity of the electronic equipment and the threshold value, whether the current electric quantity of the battery of the electronic equipment is full or not can be judged, so that the current value of a power supply signal transmitted to the electronic equipment is regulated, and the cyclic switching of the electronic equipment between a charging state and a discharging state is regulated, so that the residual electric quantity of the electronic equipment can be kept in a proper range, long-time overshoot of the battery caused by long-time connection of the charging signal is prevented, the service life of the battery of the electronic equipment to be tested can be effectively prolonged, the problems of 'bulge' caused by long-time full electric quantity and overshoot of the battery can be avoided, and the use safety of the testing device is effectively improved.

In some embodiments of the present application, adjusting a current value of a power supply signal output to an electronic device based on a comparison result of a current power amount and a threshold value includes:

under the condition that the current electric quantity is larger than a first threshold value, the current value of the power supply signal is regulated down, so that the electronic equipment stops charging;

and under the condition that the current electric quantity is smaller than or equal to a second threshold value, the current value of the power supply signal is regulated to enable the electronic equipment to start charging.

In this embodiment of the present application, the threshold specifically includes a first threshold and a second threshold, where the first threshold is a threshold where the electric quantity of the electronic device will be full, and the second threshold is a threshold where the electric quantity of the electronic device will be empty. If the current electric quantity of the electronic equipment is larger than a first threshold value, namely the battery of the electronic equipment is in a state to be fully charged, the upper computer generates a first control instruction at the moment, so that the current value of the power supply signal is regulated down by the raspberry group control current module, the electronic equipment stops charging, and works through the electric quantity of the battery, and the electronic equipment is in a discharging state at the moment.

If the current electric quantity of the electronic equipment is smaller than or equal to a second threshold value, namely the electric quantity of a battery of the electronic equipment is in a state to be emptied, the upper computer generates a second control instruction at the moment, so that the current value of the power supply signal is regulated up through the raspberry group control current module, the electronic equipment starts to charge and works through the power supply signal, meanwhile, the battery is charged through the power supply signal, and the electronic equipment is in a charging state at the moment.

According to the method and the device, the charging and discharging states of the electronic equipment are controlled according to the current electric quantity of the electronic equipment, so that the problems of 'bulge' and the like caused by long-time full power and overshoot of the battery can be avoided, and the use safety of the testing device is improved.

In some embodiments of the present application, the device information includes a charging current value;

reducing the current value of the power supply signal, comprising: adjusting the current value of the power supply signal to a target current value, wherein the target current value is smaller than the charging current value;

turning up the current value of the power supply signal, comprising: and adjusting the current value of the power supply signal to a charging current value.

In this embodiment of the present application, when the upper computer of the charging device obtains the state information of the electronic device, the state information carries the charging current of the currently connected electronic device to be tested. Specifically, the charging current differs for different electronic devices.

Thus, the charging current of the present electronic device may be referenced when adjusting the current value of the power supply signal. Specifically, when the current value of the power supply signal is adjusted to be low, the current value of the power supply signal is adjusted to be low to a corresponding target current value, the target current value is smaller, and is specifically smaller than the minimum charging current of the electronic equipment, and after the current value of the power supply signal is adjusted to be the target current value, the electronic equipment cannot supply power through the power supply signal and cannot charge the battery through the power supply signal. At this time, the electronic device operates by the electric energy stored in the battery, i.e., is in a discharge state.

When the current value of the power supply signal is increased, the current value of the power supply signal is adjusted to the charging current of the electronic equipment, at the moment, the electronic equipment is powered by the power supply signal and charges the battery by the power supply signal, and at the moment, the electronic equipment is in a charging state.

In some embodiments, the target current value ranges from 0A to 0.5A.

It will be appreciated that the charging current need not be a fixed value, and for some electronic devices, such as a cell phone that supports both normal charging (e.g., 5V 1A) and fast charging (e.g., 12V 2A), the charging current may include 1A and 2A. At this time, the target current is smaller than the smallest one of the plurality of charging currents, that is, smaller than 1A, and after the current of the power supply signal is turned up, the current value of the power supply signal may be any one of the plurality of charging currents.

In some embodiments of the present application, before determining the corresponding threshold value according to the device information, the method further comprises: receiving M pieces of equipment information, wherein the M pieces of equipment information comprise current equipment information, and M is a positive integer;

receiving configuration input of M pieces of equipment information; and responding to the configuration input, and configuring M groups of thresholds for the M pieces of equipment information, wherein the M groups of thresholds are in one-to-one correspondence with the M pieces of equipment information.

In this embodiment of the present application, corresponding device information and a threshold may be configured for M tested electronic devices of the testing apparatus. Specifically, M pieces of device information may be obtained by a batch import manner, where the M pieces of device information include current device information of an electronic device connected to the current testing apparatus.

Further, corresponding configuration inputs are received, and their corresponding thresholds may also be different for different device types. For example, for an electronic device running an Android system, a first threshold (i.e., a full threshold) may be set to 75% to 85%, and a second threshold (i.e., an empty threshold) may be set to 55% to 45%; while for an electronic device running the iOS system, its first threshold may be set to 80% to 90% and its second threshold may be set to 40% to 50%.

Thus, by configuring the input, M sets of threshold values are configured for the M pieces of device information imported, respectively. Wherein the set of thresholds includes a first threshold and a second threshold.

It can be understood that the threshold values corresponding to the plurality of device information can be set simultaneously at one time through one configuration input, so that the setting efficiency is improved.

It can be understood that a default threshold may be preset for each configuration information, and if no configuration input is received, the threshold corresponding to the configuration information is the default threshold.

By configuring corresponding thresholds for different device information, the electric quantity of the electronic devices of various models can be kept in the most suitable electric quantity interval, so that the battery life of the electronic devices is effectively prolonged.

In some embodiments of the present application, after configuring M sets of thresholds for M pieces of device information in response to the configuration input, the method further comprises:

storing the M pieces of equipment information and the M groups of threshold values to corresponding cloud servers;

or saving the M pieces of equipment information and the M groups of threshold values to an upper computer of the testing device.

In an embodiment of the application, fig. 3 shows a logic schematic diagram of a testing device of an electronic apparatus according to an embodiment of the application, and as shown in fig. 3, the testing device includes a configuration Platform (in fig. 3, setting Platform), a cloud server (in fig. 3, cloudService), a raspberry group (in fig. 3, pico), and a host computer (in fig. 3, PC).

The configuration platform is used for setting various information of the testing device, such as an address of a host computer, a pin number of a raspberry group and the like.

The cloud service is connected with a memory (Storage in fig. 3), and can store the M pieces of device information and M groups of thresholds correspondingly.

The raspberry pie can receive a control instruction of the upper computer and output a level signal to the current module through a corresponding pin.

The upper computer comprises a control module (Controller in fig. 3) and a node service (AgentService in fig. 3), the node service runs on the upper computer, can detect the current electric quantity of the connected tested electronic equipment, and generates a corresponding control instruction to the raspberry group by the control module according to a corresponding strategy, so that the electronic equipment is controlled to be switched between a charging state and a discharging state.

The M pieces of equipment information and M groups of thresholds corresponding to the M pieces of equipment information can be stored on a cloud server, and the data can be accessed by a plurality of upper computers, so that data unification is realized, configuration on each upper computer is avoided, and testing efficiency and data safety are improved.

The M pieces of equipment information and the M groups of threshold values can also be stored in a local storage space of the upper computer, so that the upper computer has the capability of offline testing.

In some embodiments of the present application, there is provided a control device of a testing device of an electronic apparatus, fig. 4 shows a block diagram of a structure of the control device of the testing device of the electronic apparatus according to an embodiment of the present application, and as shown in fig. 4, a control device 400 of the testing device includes:

an obtaining module 402, configured to obtain current device information of the electronic device and a current electric quantity of the electronic device;

A determining module 404, configured to determine a corresponding threshold according to the current device information;

and the adjusting module 406 is configured to adjust a current value of the power supply signal output to the electronic device based on a comparison result of the current power and the threshold value.

In some embodiments of the present application, the adjusting module is further configured to adjust a current value of the power supply signal to stop charging the electronic device when the current power is greater than the first threshold;

and the electronic equipment is also used for adjusting the current value of the power supply signal to enable the electronic equipment to start charging under the condition that the current electric quantity is smaller than or equal to a second threshold value.

According to the method and the device, the charging and discharging states of the electronic equipment are controlled according to the current electric quantity of the electronic equipment, so that the problems of battery swelling and the like caused by long-time full power and overshoot of the battery can be avoided, and the use safety of the testing device is improved.

In some embodiments of the present application, the device information includes a charging current value; the adjusting module is also used for adjusting the current value of the power supply signal to a target current value, wherein the target current value is smaller than the charging current value; and is also used for adjusting the current value of the power supply signal to the charging current value.

In some embodiments of the present application, the obtaining module is further configured to receive M pieces of device information, where M pieces of device information include current device information, and M is a positive integer;

the configuration input is also used for receiving the information of M devices; and responding to the configuration input, and configuring M groups of thresholds for the M pieces of equipment information, wherein the M groups of thresholds are in one-to-one correspondence with the M pieces of equipment information.

In some embodiments of the present application, the control device of the test device further includes: the storage module is used for storing the M pieces of equipment information and the M groups of threshold values to the corresponding cloud servers; or saving the M pieces of equipment information and the M groups of threshold values to an upper computer of the testing device.

In the embodiment of the application, M pieces of equipment information and M groups of thresholds corresponding to the pieces of equipment information can be stored on a cloud server, and the data can be accessed by a plurality of upper computers, so that data unification is realized, configuration on each upper computer is avoided, and test efficiency and data safety are improved.

The control device of the test device in the embodiment of the application may be a device, or may be a component, an integrated circuit, or a chip in a terminal. The device may be a mobile electronic device or a non-mobile electronic device. By way of example, the mobile electronic device may be a cell phone, tablet computer, notebook computer, palm computer, vehicle-mounted electronic device, wearable device, ultra-mobile personal computer (ultra-mobile personal computer, UMPC), netbook or personal digital assistant (personal digital assistant, PDA), etc., and the non-mobile electronic device may be a server, network attached storage (Network Attached Storage, NAS), personal computer (personal computer, PC), television (TV), teller machine or self-service machine, etc., and the embodiments of the present application are not limited in particular.

The control device of the test device in the embodiment of the present application may be a device having an operating system. The operating system may be an Android operating system, an iOS operating system, or other possible operating systems, which are not specifically limited in the embodiments of the present application.

The control device of the testing device provided in the embodiment of the present application can implement each process implemented by the foregoing method embodiment, and in order to avoid repetition, details are not repeated here.

Optionally, an electronic device 500 is further provided in the embodiments of the present application, and fig. 5 shows a block diagram of an electronic device according to the embodiments of the present application, as shown in fig. 5, including a processor 502, a memory 504, and a program or an instruction stored in the memory 504 and capable of running on the processor 502, where the program or the instruction is executed by the processor 502 to implement each process of the foregoing method embodiment, and the same technical effects are achieved, and are not repeated herein.

The electronic device in the embodiment of the application includes the mobile electronic device and the non-mobile electronic device.

The electronic device 600 includes, but is not limited to: radio frequency unit 601, network module 602, audio output unit 603, input unit 604, sensor 605, display unit 606, user input unit 607, interface unit 608, memory 609, and processor 610.

Those skilled in the art will appreciate that the electronic device 600 may further include a power source (e.g., a battery) for powering the various components, which may be logically connected to the processor 610 by a power management system to perform functions such as managing charge, discharge, and power consumption by the power management system. The electronic device structure shown in fig. 6 does not constitute a limitation of the electronic device, and the electronic device may include more or less components than shown, or may combine certain components, or may be arranged in different components, which are not described in detail herein.

The processor 610 is configured to obtain current device information of the electronic device and a current power of the electronic device; determining a corresponding threshold according to the current equipment information; and adjusting the current value of the power supply signal output to the electronic equipment based on the comparison result of the current electric quantity and the threshold value.

Optionally, the processor 610 is further configured to, if the current power is greater than the first threshold, turn down the current value of the power supply signal to stop charging the electronic device; and under the condition that the current electric quantity is smaller than or equal to a second threshold value, the current value of the power supply signal is regulated to enable the electronic equipment to start charging.

Optionally, the device information includes a charging current value; the processor 610 is further configured to adjust a current value of the power supply signal to a target current value, wherein the target current value is less than the charging current value; or the current value of the power supply signal is adjusted to the charging current value.

Optionally, the processor 610 is further configured to receive M pieces of device information, where M pieces of device information include current device information, and M is a positive integer; receiving configuration input of M pieces of equipment information; and responding to the configuration input, and configuring M groups of thresholds for the M pieces of equipment information, wherein the M groups of thresholds are in one-to-one correspondence with the M pieces of equipment information.

Optionally, the processor 610 is further configured to store the M pieces of device information and the M sets of thresholds to corresponding cloud servers; or saving the M pieces of equipment information and the M groups of threshold values to an upper computer of the testing device.

It should be understood that in the embodiment of the present application, the input unit 604 may include a graphics processor (Graphics Processing Unit, GPU) 6041 and a microphone 6042, and the graphics processor 6041 processes image data of still pictures or videos obtained by an image capturing apparatus (such as a camera) in a video capturing mode or an image capturing mode.

The display unit 606 may include a display panel 6061, and the display panel 6061 may be configured in the form of a liquid crystal display, an organic light emitting diode, or the like. The user input unit 607 includes a touch panel 6071 and other input devices 6072. The touch panel 6071 is also called a touch screen. The touch panel 6071 may include two parts of a touch detection device and a touch controller. Other input devices 6072 may include, but are not limited to, a physical keyboard, function keys (e.g., volume control keys, switch keys, etc.), a trackball, a mouse, a joystick, and so forth, which are not described in detail herein. The memory 609 may be used to store software programs as well as various data including, but not limited to, application programs and an operating system. The processor 610 may integrate an application processor that primarily handles operating systems, user interfaces, applications, etc., with a modem processor that primarily handles wireless communications. It will be appreciated that the modem processor described above may not be integrated into the processor 610.

The embodiment of the application further provides a readable storage medium, on which a program or an instruction is stored, which when executed by a processor, implements each process of the above method embodiment, and can achieve the same technical effects, so that repetition is avoided, and no further description is given here.

The processor is a processor in the electronic device in the above embodiment. Readable storage media include computer readable storage media such as Read-Only Memory (ROM), random access Memory (Random Access Memory, RAM), magnetic or optical disks, and the like.

The embodiment of the application further provides a chip, the chip includes a processor and a communication interface, the communication interface is coupled with the processor, the processor is used for running a program or instructions, the processes of the above method embodiment are realized, the same technical effects can be achieved, and in order to avoid repetition, the description is omitted here.

It should be understood that the chips referred to in the embodiments of the present application may also be referred to as system-on-chip chips, chip systems, or system-on-chip chips, etc.

It should be noted that, in this document, the terms "comprises," "comprising," or any other variation thereof, are intended to cover a non-exclusive inclusion, such that a process, method, article, or apparatus that comprises a list of elements does not include only those elements but may include other elements not expressly listed or inherent to such process, method, article, or apparatus. Without further limitation, an element defined by the phrase "comprising one … …" does not exclude the presence of other like elements in a process, method, article, or apparatus that comprises the element. Furthermore, it should be noted that the scope of the methods and apparatus in the embodiments of the present application is not limited to performing the functions in the order shown or discussed, but may also include performing the functions in a substantially simultaneous manner or in an opposite order depending on the functions involved, e.g., the described methods may be performed in an order different from that described, and various steps may also be added, omitted, or combined. Additionally, features described with reference to certain examples may be combined in other examples.

From the above description of the embodiments, it will be clear to those skilled in the art that the above-described embodiment method may be implemented by means of software plus a necessary general hardware platform, but of course may also be implemented by means of hardware, but in many cases the former is a preferred embodiment. Based on such understanding, the technical solutions of the present application may be embodied essentially or in a part contributing to the prior art in the form of a computer software product stored in a storage medium (such as ROM/RAM, magnetic disk, optical disk), comprising several instructions for causing a terminal (which may be a mobile phone, a computer, a server, or a network device, etc.) to perform the methods of the embodiments of the present application.

The embodiments of the present application have been described above with reference to the accompanying drawings, but the present application is not limited to the above-described embodiments, which are merely illustrative and not restrictive, and many forms may be made by those of ordinary skill in the art without departing from the spirit of the present application and the scope of the claims, which are also within the protection of the present application.

Claims

1. A test apparatus for an electronic device, comprising:

the universal serial bus hub comprises a first port and a second port, wherein the first port is used for receiving a communication signal, and the second port is used for outputting a first power supply signal and the communication signal;

the current module comprises a third port and a fourth port, the third port is connected with the second port, the fourth port is used for connecting electronic equipment to output a second power supply signal and the communication signal to the electronic equipment, and the current module is used for adjusting a first power supply signal so that the current value of the second power supply signal output by the fourth port is lower than the charging current of the electronic equipment or the current value of the second power supply signal is equal to the current value of the first power supply signal;

2. The test device of claim 1, further comprising:

the upper computer is connected with the first port and used for outputting the communication signal and acquiring the current electric quantity and equipment information of the electronic equipment;

The method is also used for determining a corresponding threshold according to the equipment information;

sending a first control instruction to the embedded motherboard under the condition that the current electric quantity is larger than a first threshold value; and

and sending a second control instruction to the embedded motherboard under the condition that the current electric quantity is smaller than or equal to a second threshold value.

3. The test device according to claim 2, wherein,

under the condition that the first control instruction is received, the embedded motherboard outputs a first level signal to the current module, wherein the first level signal is used for controlling the current module to reduce the current of the second power supply signal so that the current value of the second power supply signal is lower than the charging current of the electronic equipment;

or under the condition that the second control instruction is received, the embedded motherboard outputs a second level signal to the current module, wherein the second level signal is used for controlling the current module to adjust the current of the second power supply signal to be higher so that the current value of the second power supply signal is equal to the current value of the first power supply signal.

4. A test device according to any one of claims 1 to 3, wherein the number of second ports is N, wherein N is a positive integer;

The number of the current modules is N, and the N current modules are in one-to-one correspondence with the N second ports.

5. A control method of a test apparatus of an electronic device, comprising:

acquiring current equipment information of electronic equipment and current electric quantity of the electronic equipment;

6. The control method according to claim 5, wherein the adjusting the current value of the power supply signal output to the electronic device based on the comparison result of the current electric quantity and the threshold value includes:

and under the condition that the current electric quantity is smaller than or equal to a second threshold value, the current value of the power supply signal is regulated to be high, so that the electronic equipment starts to be charged.

7. The control method according to claim 6, wherein the device information includes a charging current value;

said reducing a current value of said power supply signal comprising:

Adjusting a current value of the power supply signal to a target current value, wherein the target current value is smaller than the charging current value;

said raising a current value of said power supply signal comprising:

and adjusting the current value of the power supply signal to the charging current value.

8. The control method according to any one of claims 5 to 7, characterized in that before the determination of the corresponding threshold value from the device information, the method further comprises:

receiving M pieces of equipment information, wherein the M pieces of equipment information comprise the current equipment information, and M is a positive integer;

receiving configuration inputs for the M device information;

and responding to the configuration input, configuring M groups of thresholds for the M pieces of equipment information, wherein the M groups of thresholds are in one-to-one correspondence with the M pieces of equipment information.

9. The control method of claim 8, wherein after said configuring M sets of thresholds for said M pieces of device information in response to said configuration input, said method further comprises:

storing the M pieces of equipment information and the M groups of thresholds to corresponding cloud servers;

or storing the M pieces of equipment information and the M groups of threshold values to an upper computer of the testing device.

10. A control device of a test device of an electronic apparatus, comprising:

the electronic equipment comprises an acquisition module, a control module and a control module, wherein the acquisition module is used for acquiring current equipment information of the electronic equipment and current electric quantity of the electronic equipment;

11. An electronic device comprising a processor, a memory and a program or instruction stored on the memory and executable on the processor, which when executed by the processor implements the steps of the control method of any one of claims 5 to 9.

12. A readable storage medium, characterized in that the readable storage medium has stored thereon a program or instructions which, when executed by a processor, implement the steps of the control method according to any of claims 5 to 9.