CN116150388A - Method and system for positioning relay protection defect point - Google Patents
Method and system for positioning relay protection defect point Download PDFInfo
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Abstract
The invention discloses a method and a system for positioning relay protection defect points, wherein the method comprises the following steps: obtaining a defect phenomenon of relay protection; determining a defect part associated with the defect phenomenon based on a pre-established association rule according to the defect phenomenon; calculating the conditional probability of any defect part under each defect phenomenon; based on the conditional probability, calculating the comprehensive probability of each defect phenomenon corresponding to any defect part; calculating the probability of each associated defect part under the defect phenomenon based on the comprehensive probability of any defect part; the defect site is located based on the probability of each associated defect site.
Description
Technical Field
The invention relates to the technical field of relay protection operation maintenance of power systems, in particular to a method and a system for positioning relay protection defect points.
Background
And the defect of the relay protection equipment causes that the relay protection equipment does not meet the reliability requirement, and the safety operation level of the primary power equipment is reduced due to lack of necessary guarantee. After the relay protection defect occurs, how to quickly position the defect and realize defect diagnosis has important significance. Because relay protection equipment and secondary circuit are complex in structure, relay protection defect phenomenon is coupled with defect parts, and defect diagnosis and positioning are difficult.
At present, no systematic method exists for relay protection defect diagnosis. The defect diagnosis of relay protection is mainly realized by relying on manual experience, the existing defect diagnosis method of relay protection is mainly summarized for typical individual cases of relay protection, field personnel take defect investigation measures in a heuristic way through collecting defect phenomena, and finally defects of a device are located. In the "tentative" defect inspection process, the trial defect inspection operation is performed, so that the defect diagnosis positioning process is long, the time consumption is long, and the defect diagnosis accuracy and efficiency are insufficient.
Therefore, a technology is needed to accurately locate the relay protection defect point.
Disclosure of Invention
The technical scheme of the invention provides a method and a system for positioning relay protection defect points, which are used for solving the problem of how to position the relay protection defect points.
In order to solve the above problems, the present invention provides a method for locating a relay protection defect point, the method comprising:
obtaining a defect phenomenon of relay protection;
determining a defect part associated with the defect phenomenon based on a pre-established association rule according to the defect phenomenon;
calculating the conditional probability of any defect part under each defect phenomenon;
based on the conditional probability, calculating the comprehensive probability of each defect phenomenon corresponding to any defect part;
calculating the probability of each associated defect part under the defect phenomenon based on the comprehensive probability of any defect part;
the defect site is located based on the probability of each associated defect site.
Preferably, the method further comprises:
when the defect site associated with the defect phenomenon is determined to be a single defect site, the defect site is located.
Preferably, the calculating, based on the conditional probability, a comprehensive probability of occurrence of each defect phenomenon corresponding to any defect part includes:
calculating the conditional probability of any defect part under each defect phenomenon
For any defect site f j Calculating each defect phenomenon a corresponding to the defect part i Conditional probability of occurrence P (a i |f j )；
Each defect phenomenon a corresponding to the defect part i Conditional probability of occurrence P (a i |f j ) Performing continuous multiplication to obtain comprehensive probability of each corresponding defect phenomenon when the defect phenomenon occurs at the defect part
Wherein a is k Is a defect phenomenon observed for each item.
Preferably, the calculating the probability of each associated defect site under the defect phenomenon based on the comprehensive probability of any defect site further includes:
based on the comprehensive probability p of the observed defect phenomena occurring at different defect sites j Calculating probability of each associated defect part under each defect phenomenon, namely P j ＝p j /(p 1 +p 2 +…+p n ) Where n is the total number of associated defect sites.
Preferably, the locating the defect site based on the probability of each associated defect site further includes:
the defect sites are ordered based on the probability of each associated defect site, and the defect sites are positioned in turn based on the ordering result.
Based on another aspect of the present invention, the present invention provides a system for locating a relay protection defect point, the system comprising:
the initial unit is used for acquiring the defect phenomenon of relay protection;
a determining unit, configured to determine a defect location associated with the defect phenomenon based on a pre-established association rule according to the defect phenomenon;
a calculating unit for calculating the conditional probability of any defect part occurring under each defect phenomenon; based on the conditional probability, calculating the comprehensive probability of each defect phenomenon corresponding to any defect part; calculating the probability of each associated defect part under the defect phenomenon based on the comprehensive probability of any defect part;
and a result unit for locating the defect site based on the probability of each associated defect site.
Preferably, the determining unit is further configured to:
when the defect site associated with the defect phenomenon is determined to be a single defect site, the defect site is located.
Preferably, the calculating unit is configured to calculate, based on the conditional probability, a comprehensive probability of occurrence of each defect phenomenon corresponding to any one defect part, and is further configured to:
calculating the conditional probability of any defect part under each defect phenomenon
For any defect site f j Calculating each defect phenomenon a corresponding to the defect part i Conditional probability of occurrence P (a i |f j )；
Each defect phenomenon a corresponding to the defect part i Conditional probability of occurrence P (a i |f j ) Performing continuous multiplication to obtain comprehensive probability of each corresponding defect phenomenon when the defect phenomenon occurs at the defect part
Wherein a is k Is a defect phenomenon observed for each item.
Preferably, the calculating unit is configured to calculate, based on the comprehensive probability of any defect site, a probability of each associated defect site under the defect phenomenon, and further configured to:
based on the comprehensive probability p of the observed defect phenomena occurring at different defect sites j Calculating probability of each associated defect part under each defect phenomenon, namely P j ＝p j /(p 1 +p 2 +…+p n ) Where n is the total number of associated defect sites.
Preferably, the result unit is configured to locate the defect site based on the probability of each associated defect site, and is further configured to:
the defect sites are ordered based on the probability of each associated defect site, and the defect sites are positioned in turn based on the ordering result.
The technical scheme of the invention provides a method and a system for positioning relay protection defect points, wherein the method comprises the following steps: obtaining a defect phenomenon of relay protection; determining a defect part associated with the defect phenomenon based on a pre-established association rule according to the defect phenomenon; calculating the conditional probability of any defect part under each defect phenomenon; based on the conditional probability, calculating the comprehensive probability of each defect phenomenon corresponding to any defect part; calculating the probability of each associated defect part under the defect phenomenon based on the comprehensive probability of any defect part; the defect site is located based on the probability of each associated defect site. The systematic solving method for the relay protection defect diagnosis solves the problem of difficult defect diagnosis caused by complex relay protection equipment and loops and multiple coupling of defect phenomena and parts, gives out the probability of different defect parts through probabilistic reasoning, determines defect checking points, and guides operation and maintenance personnel to check, thereby realizing defect diagnosis.
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Exemplary embodiments of the present invention may be more completely understood in consideration of the following drawings:
FIG. 1 is a flow chart of a method for locating relay protection defect points according to a preferred embodiment of the present invention;
FIG. 2 is a schematic diagram showing the relationship between defect phenomena and defect sites, check points established by mechanism analysis according to a preferred embodiment of the present invention;
FIG. 3 is a schematic view showing the effects of the defect case extended with a defect diagnosis knowledge density map according to the preferred embodiment of the present invention; and
fig. 4 is a system configuration diagram for locating relay protection defect points according to a preferred embodiment of the present invention.
Detailed Description
The exemplary embodiments of the present invention will now be described with reference to the accompanying drawings, however, the present invention may be embodied in many different forms and is not limited to the examples described herein, which are provided to fully and completely disclose the present invention and fully convey the scope of the invention to those skilled in the art. The terminology used in the exemplary embodiments illustrated in the accompanying drawings is not intended to be limiting of the invention. In the drawings, like elements/components are referred to by like reference numerals.
Unless otherwise indicated, terms (including technical and scientific terms) used herein have the same meaning as commonly understood by one of ordinary skill in the art. In addition, it will be understood that terms defined in commonly used dictionaries should be interpreted as having a meaning that is consistent with their meaning in the context of the relevant art and will not be interpreted in an idealized or overly formal sense.
Fig. 1 is a flowchart of a method for locating relay protection defect points according to a preferred embodiment of the present invention. The invention provides a systematic solving method for relay protection defect diagnosis, which solves the problem of difficult defect diagnosis caused by complex relay protection equipment and loops and multiple coupling of defect phenomena and parts, gives out the probability of different defect parts through probability reasoning, determines defect checking points, guides operation and maintenance personnel to check, and realizes defect diagnosis.
The method and the device construct a knowledge graph of relay protection defect diagnosis, cover the contents of relay protection equipment phenomena, defect positions, checking points, influence ranges, disposal measures and the like, and based on the knowledge graph, the relay protection equipment defects and the defect position multiple coupling characteristics are utilized to infer and obtain the defect positions of relay protection under certain defect phenomena according to defect phenomena probability statistical data of the equipment defects at different positions and defects occurring at different positions, and the defect checking points are determined according to the association relation between the defect positions and the checking points, so that the efficiency and the intelligent level of defect diagnosis are improved.
The invention adopts a relay protection abnormal phenomenon mechanism analysis method to determine possible defect positions under a certain relay protection defect phenomenon. Aiming at relay protection defect phenomena, according to the occurrence mechanism of the defect phenomena, analyzing defect positions possibly causing the defect phenomena. Through the mechanism analysis of the relay protection abnormal phenomenon, various possible defect position association rules under a certain relay protection abnormal phenomenon are generated, and the contents such as defect phenomenon-checking points-defect positions-influence ranges-disposal measures are covered.
The invention uses the defect case to expand the association relation of defect phenomenon-checking point-defect part-influence range-disposal measure which is established by adopting mechanism analysis. The method is characterized in that a text mining method is adopted to extract knowledge elements such as defect phenomena, defect positions, check points, influence ranges, disposal measures and the like from the existing defect cases, and the knowledge elements are expanded into a defect diagnosis knowledge graph to be used as expansion and necessary supplement of a defect phenomenon-defect position association relation system obtained by abnormal phenomenon mechanism analysis in the steps, so that the problem that the defect position analysis result is incomplete due to the fact that actual probability distribution cannot be considered in a defect phenomenon-defect position association rule constructed by mechanism analysis is solved.
When the defect part can be uniquely positioned according to the specific defect phenomenon, the defect phenomenon-defect part association relation constructed by the steps is adopted, the corresponding defect phenomenon in the knowledge graph is matched according to the defect phenomenon, and the defect part is obtained by reasoning in the knowledge graph according to the reasoning path in the knowledge graph, so that defect diagnosis is realized.
However, for more common occasions, because the relay protection defect phenomenon is coupled with the defect part, under a certain defect phenomenon, the relay protection defect part is difficult to uniquely and positively determine. Therefore, probability reasoning is needed to completely list different possible defect positions according to relay protection defect phenomena and position statistics data under a certain defect phenomena and the probability of different defect positions, and the probability of different defect positions is obtained, so that conditions are created for further adopting defect checking points to locate defects and realizing defect diagnosis. The specific steps of the probabilistic reasoning diagnosis of the relay protection defect are as follows:
as shown in fig. 1, the present invention provides a method for locating a relay protection defect point, the method comprising:
step 101: obtaining a defect phenomenon of relay protection;
step 102: determining a defect part associated with the defect phenomenon based on a pre-established association rule according to the defect phenomenon;
when the relay protection defect phenomenon occurs, the possible defect positions of the relay protection are obtained through reasoning on the defect diagnosis knowledge graph, and a relay protection defect position set is generated.
Step 103: calculating the conditional probability of any defect part under each defect phenomenon;
step 104: based on the conditional probability, calculating the comprehensive probability of each defect phenomenon corresponding to any defect part;
step 105: calculating the probability of each associated defect part under the defect phenomenon based on the comprehensive probability of any defect part;
preferably, based on the conditional probability, calculating the comprehensive probability of occurrence of each defect phenomenon corresponding to any defect part includes:
calculating the conditional probability of any defect part under each defect phenomenon
For any defect site f j Calculating each defect phenomenon a corresponding to the defect part i Conditional probability of occurrence P (a i |f j )；
Each defect phenomenon a corresponding to the defect part i Conditional probability of occurrence P (a i |f j ) Performing continuous multiplication to obtain comprehensive probability of each corresponding defect phenomenon when the defect phenomenon occurs at the defect part
Wherein a is k Is a defect phenomenon observed for each item.
Preferably, the calculating the probability of each associated defect site under the defect phenomenon based on the comprehensive probability of any defect site further comprises:
based on what is observed from the occurrence of different defect sitesComprehensive probability p of defect phenomena j Calculating probability of each associated defect part under each defect phenomenon, namely P j ＝p j /(p 1 +p 2 +…+p n ) Where n is the total number of associated defect sites.
The invention aims at any relay protection defect part f j When calculating the defect of the part, each defect phenomenon a i Conditional probability of occurrence P (a i |f j )；
The invention calculates the conditional probability P (a) of each defect occurrence corresponding to the defect position condition of the defect position because of the relay protection defect phenomenon or relation i |f j ) Performing continuous multiplication to obtain comprehensive probability of occurrence of all observed defect phenomena under the defect condition of occurrence of the defect part
Wherein a is k For each observed defect phenomenon; the comprehensive probability p due to site defect phenomena may not be fully collected j The probability that other non-occurring defect phenomena do not occur when the defect part occurs is not covered in the formula;
the probability p of defect phenomena observed by different defect parts is integrated j Calculating probability of each defective portion under the series of defect phenomena, namely P j ＝p j /(p 1 +p 2 +…+p n ) Where n is the total number of possible defect sites.
Step 106: the defect site is located based on the probability of each associated defect site.
Preferably, locating the defect site based on the probability of each associated defect site further comprises:
the defect sites are ordered based on the probability of each associated defect site, and the defect sites are positioned in turn based on the ordering result.
According to the probability of different defect positions, the defect diagnosis knowledge graph performs defect investigation at a certain defect investigation point to judge the defect positions, so as to obtain a defect positioning result. And then, according to the defect positioning result, reasoning in a defect diagnosis knowledge graph to obtain corresponding defect treatment measures, so as to realize relay protection defect intelligent diagnosis.
Preferably, when the defect site associated with the defect phenomenon is determined to be a single defect site, the defect site is located.
In the invention, when the defect part can be uniquely positioned according to the specific defect phenomenon, the defect phenomenon-defect part association relation constructed by the steps is adopted, the corresponding defect phenomenon in the knowledge graph is matched according to the defect phenomenon, and the defect part is obtained by reasoning through a reasoning path in the knowledge graph, so that defect diagnosis is realized.
In the invention, when the defect phenomenon can uniquely determine the defect part, the defect part and the disposal measure are determined according to the constructed defect diagnosis knowledge graph; when the defect position cannot be uniquely determined by the defect phenomenon, the probability of each possible defect position is calculated by integrating the related multiple defect phenomena, defect investigation is carried out at a certain defect investigation point, and the defect position is judged to obtain a defect positioning result.
The embodiment of the invention realizes relay protection defect diagnosis through the following steps:
(1) Firstly, defect positions, check points, influence ranges and disposal measures corresponding to relay protection abnormal phenomena are extracted through mechanism analysis. For example, among relay protection hardware defects, defect sites, check points, influence ranges, and treatment measures corresponding to abnormal phenomena are summarized as shown in fig. 2.
In fig. 2, "sampling error", "equipment lock", etc. are defect phenomena, "sampling board or I/O board is damaged", "power board is damaged", etc. are defect portions, "inspection sampling board or I/O board", "inspection power board", etc. are defect inspection points. Taking the defect phenomenon of 'sampling error' as an example, by analyzing a defect mechanism, possible defect positions which cause the sampling error are relay protection sampling plates and CPU plates, so that the association relation between the defect phenomenon of 'sampling error' and the defect position of 'sampling plates or I/O plates bad' and 'CPU plates or management plates bad' is established, and a defect position conclusion is obtained. After the field technician further performs the "check sampling plate or I/O plate", that is, after replacing the sampling plate or I/O plate, the defect is eliminated, thereby further verifying that the defective portion is the sampling plate or I/O plate. In fig. 2, the scope of the relay protection is the whole relay protection device.
(2) The defect case is adopted to enrich the defect phenomenon-checking point-defect part-influence range-disposal measures obtained through mechanism analysis, so that the defect diagnosis knowledge graph can cover the incidence relation between unusual but possibly occurring defect phenomena and defect parts, and supplement other possible defect parts under certain defect phenomena which cannot be mastered by manual mechanism analysis. Through text extraction, a correlation statistical table of relay protection defect phenomena and defect positions can be obtained, as shown in table 1.
TABLE 1 Defect phenomena and Defect site statistics extracted from Relay protection Defect cases
The invention realizes the automatic expansion of the defect diagnosis knowledge graph through the defect phenomenon, the defect part and the association relation thereof extracted from the defect case. The extended knowledge graph of defect diagnosis is shown in figure 3.
The invention expands the association between the defect phenomenon and the defect part by using the defect case, so that the defect part result corresponding to different defect phenomena is more complete. The relationship between the defect phenomenon and the defect part and the checking point are schematically drawn in fig. 3, so that the complex relationship between the defect phenomenon and the defect part can be completely described. For example, the phenomena of sampling error and the phenomena of power panel failure, CPU board or management board failure, sampling board or I/O board failure and configuration error have association relation, so that the analysis of possible defect parts of the defect phenomena of sampling error and the like is comprehensive and free from omission.
According to the association relation diagram of the defect phenomena and the defect positions drawn in the invention shown in fig. 3, the defect phenomena and the defect positions have multiple coupling association relations, the defect positions corresponding to the defect phenomena have multiple possibilities, the defect positions cannot be uniquely determined according to a single defect phenomenon or a combination of a plurality of defect phenomena, and the probability of faults of different defect positions needs to be calculated by further applying a probability reasoning method so as to provide objective diagnosis conclusion for defect diagnosis.
The phenomenon of a defect is that the running lamp is turned off and the internal communication of the device is interrupted. And determining the defect part and probability thereof by a method combining a knowledge graph and probability reasoning. Specifically:
(1) By means of knowledge graph reasoning of defect diagnosis, as shown in fig. 3, the possible positions of the defect are "power panel bad", "CPU panel or management panel bad", "sampling board or I/O panel bad", "configuration error".
(2) Selecting a defective part 'power panel bad', determining the occurrence probability of different abnormal information when the part is defective, namely P (running light off|power panel bad) and P (equipment internal communication interruption|power panel bad), wherein the 2 probabilities are respectively as follows according to the table 1
And->
(3) Calculating the comprehensive probability of each defect phenomenon under the condition that the defect part is' power panel bad
Similarly, when the defective portions are respectively "CPU board or management board bad", "sampling board or I/O board bad", "configuration error", the comprehensive probability of occurrence of each defective phenomenon is calculated. According to the formula
These 3 probability values are 0.0426, 0.0004, 0.0083, respectively.
(4) Calculating the defect phenomenon of running lamp off "&And under the condition of 'communication interruption in equipment', probability of different defect parts. According to the comprehensive probability of defect occurrence when the defects are at different positions calculated in 3), P is adopted j ＝p j /(p 1 +p 2 +…+p n ) Calculating to obtain the defect phenomenon of running lamp on-off "&Under the condition of 'communication interruption in equipment', the defect parts are the probabilities of 'power panel bad', 'CPU panel bad', 'sampling panel bad', 'I/O panel bad', 'configuration error', and the calculated results are 29.26%, 58.73%, 0.52% and 11.48% respectively.
(5) By applying the defect positioning result, the probability of the damage of the CPU board or the management board is up to 58.73%, so that the CPU board or the management board is firstly replaced according to the defect checking point in FIG. 3, and after the CPU board or the management board is replaced through verification, the defect phenomenon is eliminated, and the defect part is indicated to be the CPU board or the management board. If the defect phenomenon is not completely eliminated after the CPU board or the management board is replaced, according to the probability calculation result of different defect parts, the defect part with the second highest probability is 29.26% of the power panel, and the power panel should be replaced. And similarly, sequentially implementing defect inspection measures at corresponding defect inspection points until the defect positions are accurately determined, so as to realize defect diagnosis.
The invention constructs the defect diagnosis knowledge graph by adopting a mode of fusing the defect diagnosis rules with specific cases. The basic rule ensures inheritance of the existing expert knowledge, and the specific case ensures timely updating of the knowledge graph and adaptation to new defect types;
in the invention, under the scene that the defect phenomenon can uniquely determine the defect position, the defect position and the treatment measure are directly obtained by applying the defect diagnosis knowledge graph; under the scene that the position cannot be uniquely determined by the defect phenomenon, the probability of different defect positions is obtained, defect investigation is carried out at a certain defect investigation point, and the defect positions are judged to obtain a defect positioning result.
Fig. 4 is a system configuration diagram for locating relay protection defect points according to a preferred embodiment of the present invention. As shown in fig. 4, the present invention provides a system for locating a relay protection defect point, the system includes:
an initial unit 401, configured to obtain a defect phenomenon of relay protection;
a determining unit 402, configured to determine a defect location associated with the defect phenomenon based on a pre-established association rule according to the defect phenomenon; preferably, the determining unit 402 is further configured to:
when the defect site associated with the defect phenomenon is determined to be a single defect site, the defect site is located.
A calculating unit 403, configured to calculate a conditional probability that any defect portion occurs under each defect phenomenon; based on the conditional probability, calculating the comprehensive probability of each defect phenomenon corresponding to any defect part; calculating the probability of each associated defect part under the defect phenomenon based on the comprehensive probability of any defect part;
preferably, the calculating unit 403 is configured to calculate, based on the conditional probabilities, a comprehensive probability of occurrence of each defect phenomenon corresponding to any one defect site, and is further configured to:
calculating the conditional probability of any defect part under each defect phenomenon
For any defect site f j Calculating each defect phenomenon a corresponding to the defect part i Conditional probability of occurrence P (a i |f j )；
Each defect phenomenon a corresponding to the defect part i Conditional probability of occurrence P (a i |f j ) Performing continuous multiplication to obtain comprehensive probability of each corresponding defect phenomenon when the defect phenomenon occurs at the defect part
Wherein a is k Is a defect phenomenon observed for each item.
Preferably, the calculating unit 403 is configured to calculate, based on the integrated probability of any defect site, a probability of each associated defect site under the defect phenomenon, and is further configured to:
based on the comprehensive probability p of the observed defect phenomena occurring at different defect sites j Calculating probability of each associated defect part under each defect phenomenon, namely P j ＝p j /(p 1 +p 2 +…+p n ) Where n is the total number of associated defect sites.
A result unit 404 for locating the defect site based on the probability of each associated defect site.
Preferably, the result unit 404 is configured to locate the defect site based on the probability of each associated defect site, and is further configured to:
the defect sites are ordered based on the probability of each associated defect site, and the defect sites are positioned in turn based on the ordering result.
The system for locating a relay protection defect point according to the preferred embodiment of the present invention corresponds to a method for locating a relay protection defect point according to another preferred embodiment of the present invention, and will not be described herein.
It will be appreciated by those skilled in the art that embodiments of the present invention may be provided as a method, system, or computer program product. Accordingly, the present invention may take the form of an entirely hardware embodiment, an entirely software embodiment or an embodiment combining software and hardware aspects. Furthermore, the present invention may take the form of a computer program product embodied on one or more computer-usable storage media (including, but not limited to, disk storage, CD-ROM, optical storage, and the like) having computer-usable program code embodied therein. The scheme in the embodiment of the invention can be realized by adopting various computer languages, such as object-oriented programming language Java, an transliteration script language JavaScript and the like.
The present invention is described with reference to flowchart illustrations and/or block diagrams of methods, apparatus (systems) and computer program products according to embodiments of the invention. It will be understood that each flow and/or block of the flowchart illustrations and/or block diagrams, and combinations of flows and/or blocks in the flowchart illustrations and/or block diagrams, can be implemented by computer program instructions. These computer program instructions may be provided to a processor of a general purpose computer, special purpose computer, embedded processor, or other programmable data processing apparatus to produce a machine, such that the instructions, which execute via the processor of the computer or other programmable data processing apparatus, create means for implementing the functions specified in the flowchart flow or flows and/or block diagram block or blocks.
These computer program instructions may also be stored in a computer-readable memory that can direct a computer or other programmable data processing apparatus to function in a particular manner, such that the instructions stored in the computer-readable memory produce an article of manufacture including instruction means which implement the function specified in the flowchart flow or flows and/or block diagram block or blocks.
These computer program instructions may also be loaded onto a computer or other programmable data processing apparatus to cause a series of operational steps to be performed on the computer or other programmable apparatus to produce a computer implemented process such that the instructions which execute on the computer or other programmable apparatus provide steps for implementing the functions specified in the flowchart flow or flows and/or block diagram block or blocks.
While preferred embodiments of the present invention have been described, additional variations and modifications in those embodiments may occur to those skilled in the art once they learn of the basic inventive concepts. It is therefore intended that the following claims be interpreted as including the preferred embodiments and all such alterations and modifications as fall within the scope of the invention.
It will be apparent to those skilled in the art that various modifications and variations can be made to the present invention without departing from the spirit or scope of the invention. Thus, it is intended that the present invention also include such modifications and alterations insofar as they come within the scope of the appended claims or the equivalents thereof.
The invention has been described with reference to a few embodiments. However, as is well known to those skilled in the art, other embodiments than the above disclosed invention are equally possible within the scope of the invention, as defined by the appended patent claims.
Generally, all terms used in the claims are to be interpreted according to their ordinary meaning in the technical field, unless explicitly defined otherwise therein. All references to "a// the [ means, component, etc ]" are to be interpreted openly as referring to at least one instance of means, component, etc., unless explicitly stated otherwise. The steps of any method disclosed herein do not have to be performed in the exact order disclosed, unless explicitly stated.
Claims (10)
1. A method for locating relay protection defect points, the method comprising:
obtaining a defect phenomenon of relay protection;
determining a defect part associated with the defect phenomenon based on a pre-established association rule according to the defect phenomenon;
calculating the conditional probability of any defect part under each defect phenomenon;
based on the conditional probability, calculating the comprehensive probability of each defect phenomenon corresponding to any defect part;
calculating the probability of each associated defect part under the defect phenomenon based on the comprehensive probability of any defect part;
the defect site is located based on the probability of each associated defect site.
2. The method of claim 1, further comprising:
when the defect site associated with the defect phenomenon is determined to be a single defect site, the defect site is located.
3. The method of claim 1, wherein the calculating, based on the conditional probability, the comprehensive probability of occurrence of each defect phenomenon corresponding to any defect part includes:
calculating the conditional probability of any defect part under each defect phenomenon
For any defect site f j Calculating each defect phenomenon a corresponding to the defect part i Conditional probability of occurrence P (a i |f j )；
Each defect phenomenon a corresponding to the defect part i Conditional probability of occurrence P (a i |f j ) Performing continuous multiplication to obtain comprehensive probability of each corresponding defect phenomenon when the defect phenomenon occurs at the defect part
Wherein a is k Is a defect phenomenon observed for each item.
4. The method of claim 1, wherein the calculating the probability of each associated defect site under the defect event based on the integrated probability of any defect site, further comprises:
based on the comprehensive probability p of the observed defect phenomena occurring at different defect sites j Calculating probability of each associated defect part under each defect phenomenon, namely P j ＝p j /(p 1 +p 2 +…+p n ) Where n is the total number of associated defect sites.
5. The method of claim 1, the locating a defect site based on a probability of each associated defect site, further comprising:
the defect sites are ordered based on the probability of each associated defect site, and the defect sites are positioned in turn based on the ordering result.
6. A system for locating relay protection defect points, the system comprising:
the initial unit is used for acquiring the defect phenomenon of relay protection;
a determining unit, configured to determine a defect location associated with the defect phenomenon based on a pre-established association rule according to the defect phenomenon;
a calculating unit for calculating the conditional probability of any defect part occurring under each defect phenomenon; based on the conditional probability, calculating the comprehensive probability of each defect phenomenon corresponding to any defect part; calculating the probability of each associated defect part under the defect phenomenon based on the comprehensive probability of any defect part;
and a result unit for locating the defect site based on the probability of each associated defect site.
7. The system of claim 6, the determination unit further to:
when the defect site associated with the defect phenomenon is determined to be a single defect site, the defect site is located.
8. The system according to claim 6, wherein the calculating unit is configured to calculate, based on the conditional probability, a comprehensive probability of occurrence of each defect phenomenon corresponding to any one defect site, and further configured to:
calculating the conditional probability of any defect part under each defect phenomenon
For any defect site f j Calculating each defect phenomenon a corresponding to the defect part i Conditional probability of occurrence P (a i |f j )；
Each defect phenomenon a corresponding to the defect part i Conditional probability of occurrence P (a i |f j ) Performing continuous multiplication to obtain comprehensive probability of each corresponding defect phenomenon when the defect phenomenon occurs at the defect part
Wherein a is k Is a defect phenomenon observed for each item.
9. The system according to claim 6, wherein the calculating unit is configured to calculate, based on the integrated probability of any defect site, a probability of each associated defect site under the defect phenomenon, and further configured to:
based on the comprehensive probability p of the observed defect phenomena occurring at different defect sites j Calculating probability of each associated defect part under each defect phenomenon, namely P j ＝p j /(p 1 +p 2 +…+p n ) Where n is the total number of associated defect sites.
10. The system of claim 6, the outcome unit to locate the defect site based on the probability of each associated defect site, further to:
the defect sites are ordered based on the probability of each associated defect site, and the defect sites are positioned in turn based on the ordering result.
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| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202211054177.0A CN116150388A (en) | 2022-08-31 | 2022-08-31 | Method and system for positioning relay protection defect point |
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