CN116124403A - Mechanical impact test method and device, electronic equipment and storage medium - Google Patents

Mechanical impact test method and device, electronic equipment and storage medium Download PDF

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CN116124403A
CN116124403A CN202310228978.2A CN202310228978A CN116124403A CN 116124403 A CN116124403 A CN 116124403A CN 202310228978 A CN202310228978 A CN 202310228978A CN 116124403 A CN116124403 A CN 116124403A
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information
impact test
test
impact
result information
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张文志
赖春霞
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Zhongruitengbiao Shenzhen Testing Co ltd
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Zhongruitengbiao Shenzhen Testing Co ltd
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M7/00—Vibration-testing of structures; Shock-testing of structures
    • G01M7/08—Shock-testing
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
    • Y02P—CLIMATE CHANGE MITIGATION TECHNOLOGIES IN THE PRODUCTION OR PROCESSING OF GOODS
    • Y02P90/00—Enabling technologies with a potential contribution to greenhouse gas [GHG] emissions mitigation
    • Y02P90/30—Computing systems specially adapted for manufacturing

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  • Investigating Strength Of Materials By Application Of Mechanical Stress (AREA)

Abstract

The present disclosure relates to the field of impact testing technologies, and in particular, to a mechanical impact testing method, a mechanical impact testing device, an electronic device, and a storage medium. The method comprises the following steps: analyzing the obtained impact test result information to determine impact test abnormal result information, wherein the impact test result information is summarized test result information after the test of a plurality of objects to be tested in the same batch is completed; judging whether the impact test abnormal result information belongs to a preset first test abnormal deviation range or not; if the first impact test information does not belong to the first object to be tested, acquiring first impact test information corresponding to the impact test abnormal result information and second impact test information corresponding to other objects to be tested in the same batch; according to the first impact test information and the second impact test information, test compensation information corresponding to the impact test abnormal result information is determined, and the impact test abnormal result information is corrected based on the test compensation information.

Description

Mechanical impact test method and device, electronic equipment and storage medium
Technical Field
The present disclosure relates to the field of impact testing technologies, and in particular, to a mechanical impact testing method, a mechanical impact testing device, an electronic device, and a storage medium.
Background
Under the conditions of production process, transportation link and use of equipment, the conditions of reduced performance or faults of the equipment caused by mechanical impact exist, in order to ensure the safety, stability and effectiveness of the equipment under the conditions of production process, transportation link and application, the equipment simulation reality conditions in a batch are selected to carry out mechanical impact test, and each phase of new information of the equipment during the mechanical impact test is recorded and analyzed to determine the bearing capacity of the mechanical impact of the equipment in the batch and the relevant information of the damage degree of the equipment. In the mechanical impact test process of the device to be tested, if the number of mechanical impact times is not specifically set, the device is generally impacted for 3 times on each surface of the device, and when the mechanical impact on all surfaces of the device is finished, the mechanical impact test of the device to be tested is finished.
However, before the mechanical impact test is performed on the device to be tested, during the production process and the transportation link, even during the application process, there are situations that a certain degree of mechanical impact has been experienced and the capability of the device to be tested to be subjected to mechanical impact is reduced, and at this time, the mechanical impact test is performed on the device to be tested, which may cause the situation that the tested result of the mechanical impact resistance is inaccurate.
Disclosure of Invention
In order to improve accuracy of mechanical impact testing, the application provides a mechanical impact testing method, a mechanical impact testing device, electronic equipment and a storage medium.
In a first aspect, the present application provides a mechanical impact testing method, which adopts the following technical scheme:
a mechanical impact testing method, comprising:
analyzing the obtained impact test result information to determine impact test abnormal result information, wherein the impact test result information is summarized test result information after the test of a plurality of objects to be tested in the same batch is completed;
judging whether the impact test abnormal result information belongs to a preset first test abnormal deviation range or not;
if the first impact test information does not belong to the first object to be tested, acquiring first impact test information corresponding to the impact test abnormal result information and second impact test information corresponding to other objects to be tested in the same batch;
according to the first impact test information and the second impact test information, determining test compensation information corresponding to the impact test abnormal result information, and correcting the impact test abnormal result information based on the test compensation information.
By adopting the technical scheme, firstly, the impact test result information is acquired, analysis processing is carried out on the impact test result information, when the impact test abnormal result information is determined, the condition that the test deviation appears in the impact test result information is indicated, at the moment, the impact test abnormal result information is substituted into a preset first test abnormal deviation range, if the impact test abnormal result information is judged not to be in the first test abnormal deviation range, the possibility that the abnormality appears in the impact test abnormal result information due to external factors is indicated, at the moment, the test compensation information corresponding to the impact test abnormal result information is determined according to the first impact test information corresponding to the acquired impact test abnormal result information and the second impact test information corresponding to other objects to be tested in the same batch, and the impact test abnormal result information is corrected based on the test compensation information, so that the problem that the external factors negatively affect the test result is solved, and the accuracy of the impact test result is improved.
In one possible implementation manner, the impact test result information includes a plurality of sub-impact test result information, the analyzing the obtained impact test result information to determine impact test abnormal result information includes:
judging whether the sub-impact test result information respectively belongs to a preset second test abnormal deviation range or not;
if the sub-impact test result information does not belong to the preset second test abnormal deviation range, defining the sub-impact test result information which does not belong to the preset second test abnormal deviation range as the impact test abnormal result information.
By adopting the technical scheme, the impact test result information comprises a plurality of sub-impact side result information, the sub-impact test result information is respectively substituted into a preset second test abnormal deviation range for comparison, and when the sub-impact test result information does not belong to the second test abnormal deviation range, the sub-impact test result information which does not belong to the preset second test abnormal deviation range is defined as the impact test abnormal result information for accurately determining the impact test abnormal result information.
In one possible implementation manner, the determining whether the plurality of sub-impact test result information respectively belongs to a preset second test abnormal deviation range further includes:
If the sub-impact test result information does not belong to the preset second test abnormal deviation range, generating test information of the impact test equipment and feeding back the test information to the display terminal for display.
By adopting the technical scheme, when judging that the information of the plurality of sub-impact test results does not belong to the preset second test abnormal deviation range, the method indicates that a large amount of abnormal result information conditions possibly exist in the impact test process of all the objects to be tested in the batch by using the impact equipment, and at the moment, the test information of the impact test equipment is generated and fed back to the terminal equipment corresponding to the test personnel for display, so that the purpose of reminding the test personnel of checking whether the impact test equipment is normal is achieved.
In one possible implementation manner, the obtaining the second impact test information corresponding to the other objects to be tested in the same batch includes:
determining reference impact test information which is adjacent to the same batch and corresponds to the objects to be tested in the previous batch;
if the second impact test information does not belong to a preset reference test deviation range, eliminating the second impact test information, and acquiring second impact test information corresponding to an object to be tested except the object to be tested corresponding to the second impact test, wherein the preset reference test deviation range is set based on the reference impact test information, and the reference impact test information is in the preset reference test deviation range.
By adopting the technical scheme, the reference impact test information corresponding to the to-be-tested object in the previous batch adjacent to the same batch is obtained, the impact test information is the impact test information tested on the premise that the quality of the to-be-tested object is free of problems, then the second impact test information is substituted into the preset parameter deviation range set according to the reference impact test information, if the second impact test information does not belong to the preset reference test deviation range, the deviation of the second impact test information is indicated, the second impact test information cannot be used as the information of the test compensation information corresponding to the abnormal result information of the determined impact test, and then the second impact test information is removed, so that the accuracy of the second impact test information is ensured.
In one possible implementation manner, the determining, according to the first impact test information and the second impact test information, test compensation information corresponding to the impact test abnormal result information includes:
judging whether the first impact test information is identical to the second impact test information;
if not, carrying out difference calculation on the first impact test information and the second impact test information, and determining compensation information corresponding to the impact test abnormal result information.
By adopting the technical scheme, the first impact test information and the second impact test information are compared, whether the first impact test information is identical to the second impact test information or not is judged, if not, the deviation of the quality between objects to be tested corresponding to the first impact test information and the second impact test information respectively is indicated, then the difference value calculation is carried out on the first impact test information and the second impact test information, and further compensation information corresponding to the abnormal impact test result information is determined.
In one possible implementation manner, the first impact test information includes first initial information, the second impact test information includes second initial information, and the determining the test compensation information corresponding to the impact test abnormal result information further includes:
and carrying out difference calculation on the first initial information and the second initial information, determining initial abnormal deviation information corresponding to the impact test abnormal result information, and feeding back the initial abnormal deviation information to a display terminal.
By adopting the technical scheme, the initial abnormal deviation information corresponding to the impact test abnormal result information determined by carrying out the difference calculation on the first initial information and the second initial information can reflect the difference condition of the object to be tested corresponding to the first initial information and the object to be tested corresponding to the second initial information before the impact test is carried out.
In one possible implementation manner, the determining the reference impact test information adjacent to the same batch and corresponding to the previous batch of objects to be tested includes:
acquiring historical impact test information corresponding to a plurality of objects to be tested in the previous batch adjacent to the same batch;
and carrying out average value calculation on the historical impact test information corresponding to the plurality of objects to be tested respectively, and determining the reference impact test information.
By adopting the technical scheme, the historical impact test information respectively corresponding to all the objects to be tested contained in the previous batch adjacent to the same batch is obtained, then the average value calculation is carried out on the historical impact test information respectively corresponding to all the objects to be tested, the determined average impact test information corresponding to the batch is used as the reference impact test information, and the accuracy of the preset reference test deviation range set based on the reference impact test information is ensured.
In a second aspect, the present application provides a mechanical impact testing device, which adopts the following technical scheme:
a mechanical impact testing device, comprising: an abnormal result information determining module, a judging module, a test information obtaining module and a deviation compensation information determining module, wherein,
The abnormal result information determining module is used for analyzing the obtained impact test result information and determining impact test abnormal result information, wherein the impact test result information is summarized after the test of a plurality of objects to be tested in the same batch is completed;
the judging module is used for judging whether the impact test abnormal result information belongs to a preset first test abnormal deviation range or not;
the test information acquisition module is used for acquiring first impact test information corresponding to the impact test abnormal result information and second impact test information corresponding to other objects to be tested in the same batch if the first impact test information does not belong to the first impact test information;
the deviation compensation information determining module is used for determining test compensation information corresponding to the impact test abnormal result information according to the first impact test information and the second impact test information, and correcting the impact test abnormal result information based on the test compensation information.
By adopting the technical scheme, firstly, the abnormal result information determining module obtains the impact test result information, analyzes and processes the impact test result information, when the impact test abnormal result information is determined, the condition that the impact test result information has deviation in test is indicated, at the moment, the judging module substitutes the impact test abnormal result information into a preset first test abnormal deviation range, if the impact test abnormal result information is judged not to be in the first test abnormal deviation range, the possibility that abnormality caused by external factors exists in the impact test abnormal result information is indicated, at the moment, according to the first impact test information corresponding to the impact test abnormal result information and the second impact test information corresponding to other objects to be tested in the same batch, which are obtained by the test information obtaining module, the deviation compensation information corresponding to the impact test abnormal result information is determined by the deviation compensation information determining module, and the impact test abnormal result information is corrected based on the test compensation information, so that the problem that the external factors negatively affect the test result is solved, and the accuracy of the impact test result is improved.
In one possible implementation manner, the abnormal result information determining module further includes: a first judging unit and an information determining unit, wherein,
the impact test result information comprises a plurality of sub-impact test result information;
the first judging unit is used for judging whether the sub-impact test result information respectively belongs to a preset second test abnormal deviation range or not;
and the information determining unit is used for defining the sub-impact test result information which does not belong to the preset second test abnormal deviation range as the impact test abnormal result information if the sub-impact test result information does not belong to the preset second test abnormal deviation range.
In one possible implementation, the mechanical impact testing device further includes: a first feedback module, wherein,
and the first feedback module is used for generating test information of the impact test equipment and feeding back the test information to the display terminal for display if the information of the plurality of sub-impact test results does not belong to the preset second test abnormal deviation range.
In one possible implementation, the mechanical impact testing device further includes: the test information determining module and the test information obtaining module, wherein,
The test information determining module is used for determining reference impact test information which is adjacent to the same batch and corresponds to the objects to be tested in the previous batch;
the test information acquisition module is used for eliminating the second impact test information and acquiring the second impact test information corresponding to the object to be tested except the object to be tested corresponding to the second impact test if the second impact test information does not belong to a preset reference test deviation range, wherein the preset reference test deviation range is set based on the reference impact test information, and the reference impact test information is in the preset reference test deviation range.
In one possible implementation manner, the deviation compensation information determining module further includes: a second judgment unit and a compensation information determination unit, wherein:
a second judging unit configured to judge whether the first impact test information is identical to the second impact test information;
and the compensation information determining unit is used for calculating the difference value of the first impact test information and the second impact test information if the first impact test information is different from the second impact test information, and determining the compensation information corresponding to the impact test abnormal result information.
In one possible implementation, the mechanical impact testing device further includes: a second feedback module, wherein,
and the second feedback module is used for carrying out difference value calculation on the first initial information and the second initial information, determining initial abnormal deviation information corresponding to the impact test abnormal result information and feeding back the initial abnormal deviation information to the display terminal.
In one possible implementation manner, the test information determining module further includes: a history test information acquisition unit and a test information determination unit, wherein,
the historical test information acquisition unit is used for acquiring historical impact test information corresponding to a plurality of objects to be tested in the previous batch adjacent to the same batch respectively;
and the test information determining unit is used for carrying out average value calculation on the historical impact test information corresponding to the plurality of objects to be tested respectively and determining the reference impact test information.
In a third aspect, the present application provides an electronic device, which adopts the following technical scheme:
an electronic device, the electronic device comprising:
at least one processor;
a memory;
at least one application program, wherein the at least one application program is stored in the memory and configured to be executed by the at least one processor, the at least one application program configured to: a method of performing the above described mechanical shock test.
In a fourth aspect, the present application provides a computer readable storage medium, which adopts the following technical scheme:
a computer-readable storage medium, comprising: a computer program is stored that can be loaded by a processor and that performs the above described mechanical shock testing method.
In summary, the present application includes the following beneficial technical effects:
firstly, obtaining impact test result information, analyzing and processing the impact test result information, when determining impact test abnormal result information, indicating that the impact test abnormal result information has a test deviation, substituting the impact test abnormal result information into a preset first test abnormal deviation range, if judging that the impact test abnormal result information does not belong to the first test abnormal deviation range, indicating that the possibility caused by external factors exists in the abnormality of the impact test abnormal result information, determining test compensation information corresponding to the impact test abnormal result information according to the first impact test information corresponding to the obtained impact test abnormal result information and the second impact test information corresponding to other objects to be tested in the same batch, and correcting the impact test abnormal result information based on the test compensation information, thereby solving the problem that the external factors have negative influence on the test result and further improving the accuracy of the impact test result.
Drawings
FIG. 1 is a schematic flow chart of a mechanical shock testing method according to an embodiment of the present application;
FIG. 2 is a block schematic diagram of a mechanical impact testing apparatus according to an embodiment of the present application;
fig. 3 is a schematic diagram of an electronic device according to an embodiment of the present application.
Detailed Description
The present application is described in further detail below in conjunction with figures 1-3.
For the purposes of making the objects, technical solutions and advantages of the embodiments of the present application more clear, the technical solutions of the embodiments of the present application will be clearly and completely described below with reference to the drawings in the embodiments of the present application, and it is apparent that the described embodiments are some embodiments of the present application, but not all embodiments. All other embodiments, which can be made by one of ordinary skill in the art based on the embodiments herein without making any inventive effort, are intended to be within the scope of the present application.
The embodiment of the application provides a mechanical impact testing method, which is executed by electronic equipment, wherein the equipment can be a server or terminal equipment, and the server can be an independent physical server, a server cluster or distributed equipment formed by a plurality of physical servers, or a cloud server for providing cloud computing service. The terminal device may be a smart phone, a tablet computer, a notebook computer, a desktop computer, etc., but is not limited thereto, and the terminal device and the server may be directly or indirectly connected through a wired or wireless communication manner, which is not limited herein.
Referring to fig. 1, the method includes: step S101, step S102, step S103, and step S104, wherein,
s101, analyzing the obtained impact test result information to determine impact test abnormal result information.
For the embodiment of the application, the impact test result information is summarized after the test of a plurality of objects to be tested in the same batch is completed; the abnormal impact test result information is obtained after the impact test of a certain object to be tested with quality problems in the same batch is completed.
The method comprises the steps that a plurality of identical objects to be tested in the same batch are sequentially placed in impact test equipment for impact test, each object to be tested is subjected to multiple impact tests, corresponding impact test information in each impact test is recorded, impact test results corresponding to each object to be tested are obtained based on the impact test information, final impact test result information is determined based on the impact test results corresponding to each object to be tested, and the impact test result information is sent to electronic equipment.
S102, judging whether the impact test abnormal result information belongs to a preset first test abnormal deviation range.
For the embodiment of the application, the first test abnormal deviation range is comparison information for judging whether the impact test abnormal result information is tested after the quality problem occurs due to the external factors of the corresponding object to be tested, and the first test abnormal deviation range can be set by referring to the deviation amount of the maximum impact test of the object to be tested under the condition that the quality of the object to be tested is not problematic.
After the electronic equipment determines the impact test abnormal result information, the electronic equipment needs to further judge whether the impact test abnormal result information is caused by the reason of the mass of the corresponding object to be tested or caused by the reason that the object to be tested is influenced by external factors, namely, the electronic equipment substitutes the impact test abnormal result information into a preset first test abnormal deviation range, and judges whether the impact test abnormal result information belongs to the preset first test abnormal deviation range.
And S103, if the information does not belong to the first impact test information corresponding to the impact test abnormal result information and the second impact test information corresponding to other objects to be tested in the same batch are obtained.
For the embodiment of the application, the first impact test information is the impact test information output by the object to be tested in the single-round multiple impact test process, and the second impact test information is the impact test information output by other objects to be tested in the same batch in the single-round multiple impact test process.
If the impact test abnormal result information is judged not to belong to the preset first test abnormal deviation range, the impact test abnormal result information is tested due to the influence of external factors on the object to be tested corresponding to the impact test abnormal result information, for example, the object to be tested is collided before reaching an impact test place, and the quality problem of the object to be tested is caused before impact test; and then, the electronic equipment acquires first impact test information corresponding to the impact test abnormal result information and second impact test information corresponding to other objects to be tested in the same batch, wherein the other objects to be tested are objects to be tested which are not influenced by external factors before the impact test, and then, the electronic equipment participates in the first impact test information and the second impact test in a process of improving the impact test accuracy.
S104, determining test compensation information corresponding to the impact test abnormal result information according to the first impact test information and the second impact test information, and correcting the impact test abnormal result information based on the test compensation information.
For the embodiment of the application, the test compensation information is information for compensating the influence of external factors on the object to be tested corresponding to the impact test abnormal result information before the impact test.
The electronic equipment uses the second impact test information as reference information, compares the first impact test to determine the deviation amount between the first impact test information and the second impact test, namely, determines the test compensation information corresponding to the impact test abnormal result information, and then corrects the impact test abnormal result information by using the test compensation information so as to eliminate the influence of external factors on the object to be tested corresponding to the impact test abnormal result information, and obtain the impact test information tested under the condition that the quality of the object to be tested is free of problems, thereby improving the accuracy of the impact test.
The embodiment of the application provides a mechanical impact test method, electronic equipment firstly acquires impact test result information, analyzes and processes the impact test result information, when the electronic equipment determines impact test abnormal result information, the electronic equipment indicates that the impact test abnormal result information has a test occurrence deviation, at the moment, the electronic equipment substitutes the impact test abnormal result information into a preset first test abnormal deviation range, if the impact test abnormal result information is judged not to be in the first test abnormal deviation range, the electronic equipment indicates that the possibility of abnormality caused by external factors exists in the impact test abnormal result information, at the moment, the electronic equipment determines test compensation information corresponding to the impact test abnormal result information according to the first impact test information corresponding to the acquired impact test abnormal result information and second impact test information corresponding to other objects to be tested in the same batch, and corrects the impact test abnormal result information based on the test compensation information, so that the problem that the external factors negatively affect the test result is solved, and the accuracy of the impact test result is improved.
Specifically, the impact test result information includes a plurality of sub-impact test result information, and in step S101, the obtained impact test result information is analyzed to determine impact test abnormal result information, specifically including: judging whether the information of the multiple sub-impact test results respectively belong to a preset second test abnormal deviation range or not; if the sub-impact test result information does not belong to the preset second test abnormal deviation range, defining the sub-impact test result information which does not belong to the preset second test abnormal deviation range as the impact test abnormal result information.
For the embodiment of the application, the electronic equipment is preset with a second testing abnormal deviation range, and the second testing abnormal deviation range is used as judging information of whether impact testing results corresponding to a plurality of objects to be tested in the same batch exceed the normal deviation amount or not; the sub-impact test result information is the test result information after the impact test of the single object to be tested in the same batch.
The electronic equipment firstly determines a plurality of sub-impact test result information contained in the impact test result information, then substitutes each sub-impact test result information into a preset second test abnormal deviation range preset in advance, judges whether each sub-impact test result information belongs to the preset second test abnormal deviation range, and if the sub-impact test result information does not belong to the preset second test abnormal deviation range, the sub-impact test result information which does not belong to the preset second test abnormal deviation range indicates that the impact test of the object to be tested corresponding to the sub-impact test result information is unqualified, and at the moment, the sub-impact test result which does not belong to the preset second test abnormal deviation range is defined as the impact test abnormal result information.
Further, if the sub-impact test result information belongs to the preset second test abnormal deviation range, the fact that the object to be tested corresponding to the sub-impact test information belonging to the preset second test abnormal deviation range is qualified in the impact test process is indicated, and the electronic equipment does not serve as a test compensation object of the object to be tested.
Specifically, after judging whether the plurality of sub-impact test result information respectively belong to the preset second test abnormal deviation range, further including: if the information of the sub-impact test results does not belong to the preset second test abnormal deviation range, generating test information of the impact test equipment and feeding back the test information to the display terminal for display.
By adopting the technical scheme, the electronic equipment substitutes the information of the plurality of sub-impact test results into the preset second test abnormal deviation range to judge, if the information of the plurality of sub-impact test results is judged not to belong to the second test abnormal deviation range, the situation that the impact test results of all the objects to be tested in the same batch are abnormal due to the abnormality of the impact test equipment is predicted, and the impact test results at the moment are not objectivity and convincing, so that the electronic equipment generates the verification information of the impact test equipment and sends the verification information to related detection personnel so as to remind the detection personnel that a large number of abnormalities occur in the impact test results of the objects to be tested in the batch, and whether the impact test equipment operates normally or not is required to be detected, so that the impact test equipment is prevented from influencing the impact test results.
The electronic equipment acquires second impact test information corresponding to other objects to be tested in the same batch, and aims to judge information deviation of first impact test information corresponding to abnormal impact test result information, so that in order to ensure the accuracy of the information deviation corresponding to the first impact test information, the accuracy of the acquired second impact side information is required to be ensured; specifically, in step S103, the second impact test information corresponding to other objects to be tested in the same batch is obtained, and then includes: determining reference impact test information which is adjacent to the same batch and corresponds to the objects to be tested in the previous batch; if the second impact test information does not belong to the preset reference test deviation range, eliminating the second impact test information, and acquiring second impact test information corresponding to the object to be tested except the object to be tested corresponding to the second impact test, wherein the preset reference test deviation range is set based on the reference impact test information, and the reference impact test information is in the preset reference test deviation range.
For the embodiment of the application, the reference impact test information is impact test information which is output when the objects to be tested in the previous batch are subjected to impact test and is adjacent to the current batch.
The electronic equipment sets a preset reference test deviation range based on the determined reference impact test information which is adjacent to the same batch and corresponds to any object to be tested in the previous batch, the preset reference test deviation range comprises the reference impact test information, then the electronic equipment substitutes the second impact test information into the preset reference test deviation range to judge whether the second impact test information belongs to the second preset reference test deviation range, if not, the information deviation corresponding to the second impact test information exceeds the reasonable deviation amount in the impact test process on the premise of ensuring that the essential quantity of the object to be tested is free of problems; at this time, the electronic device eliminates the second impact test information, obtains the second impact test information corresponding to the object to be tested except the object to be tested corresponding to the second impact test, and participates the second impact test information in the test compensation information corresponding to the test abnormality result information.
Further, after the electronic device substitutes the second impact test information corresponding to the object to be tested other than the object to be tested corresponding to the obtained second impact test information into a preset reference test deviation range for comparison, if the second impact test information does not belong to the preset reference test deviation range, the second impact test information is continuously removed until the second impact test information belonging to the preset reference test deviation range is determined.
The reference impact test information determined by the electronic device is used for setting a preset reference test deviation range, the to-be-tested objects in the previous batch include a plurality of to-be-tested objects, and impact test information corresponding to the to-be-tested objects in the previous batch respectively has certain differences, so that in order to cover the differences existing between the impact test information corresponding to the to-be-tested objects in the preset reference test deviation range set based on the determined reference impact test information as far as possible, more accurate reference impact test information needs to be determined, and specifically, in the process of determining the reference impact test information adjacent to the same batch and corresponding to the to-be-tested objects in the previous batch, the method specifically includes: acquiring historical impact test information corresponding to a plurality of objects to be tested in the previous batch adjacent to the same batch; and carrying out average value calculation on the historical impact test information corresponding to the plurality of objects to be tested respectively, and determining the reference impact test information.
For the embodiment of the application, the electronic device acquires the historical impact test information respectively corresponding to all the objects to be tested contained in the previous batch adjacent to the same batch, then the electronic device carries out average value calculation on the historical impact test information respectively corresponding to all the objects to be tested, further determines the average value impact test information corresponding to the batch, and uses the average value impact test information as the reference impact test information to ensure the accuracy of the preset reference test deviation range set based on the reference impact test information.
If the object to be tested is collided by external factors before the impact test is performed, and the quality of the object to be tested is problematic, at this time, the impact test information obtained in the impact test process is larger than the information deviation amount of the relay test information of the object to be tested, which is not collided before the impact test, so that the part exceeding the normal information deviation amount caused by the impact needs to be determined and corresponding information compensation is performed, specifically, in step S104, the test compensation information corresponding to the impact test abnormal result information is determined according to the first impact test information and the second impact test information, and specifically includes: judging whether the first impact test information is identical to the second impact test information; if not, carrying out difference calculation on the first impact test information and the second impact test information, and determining compensation information corresponding to the impact test abnormal result information.
For the embodiment of the application, the electronic device compares the first impact test information with the second impact test information, judges whether the first impact test information is identical to the second impact test information, if the first impact test information is not identical to the second impact test information, the first impact test information indicates that the object to be tested corresponding to the first impact test information is collided due to external factors, at the moment, the electronic device calculates the difference value between the first impact test information and the second impact test information, determines compensation information corresponding to abnormal impact result information, and further compensates information deviation caused by the collision of the object to be tested due to the external factors.
Further, since the problem of the measured substance is caused by the collision of the measured substance before the impact test, when the impact test is performed on the measured substance, the initial information corresponding to the measured substance obtained by the impact test device is different from the initial information under normal conditions, and since the difference of the initial information is caused by the collision, the difference of the initial information can be used as another reference information in the generating process of the measured substance, it is necessary to determine the part of reference information, specifically, the first impact test information comprises the first initial information, the second impact test information comprises the second initial information, and the test compensation information corresponding to the abnormal result information of the impact test is determined, and then the method further comprises: and calculating the difference value of the first initial information and the second initial information, determining initial abnormal deviation information corresponding to the abnormal result information of the impact test, and feeding back the initial abnormal deviation information to the display terminal.
For the embodiment of the application, the first initial information is the basic information of the object to be tested, which is collided before the impact test, and the second initial information is the basic information of the object to be tested, which is not collided, before the impact test.
After the electronic equipment acquires the first initial information contained in the first impact test information and the second initial information contained in the second impact test information, difference value calculation is carried out on the first initial information and the second initial information, initial abnormal deviation information corresponding to the impact test abnormal result information is determined, and then the electronic equipment feeds the initial abnormal deviation information back to the display terminal for display, so that the initial abnormal information is used as test information of an impact test process.
Further, the initial abnormal deviation information can be fed back to the display terminal of the technician corresponding to the object to be tested manufacturer to be displayed, so that the technician corresponding to the manufacturer can know the possible problems in the equipment transportation process in the first time, and further the transportation environment of the equipment can be quickly adjusted, so that the occurrence of collision in the transportation process is reduced.
The above embodiment describes a method for mechanical impact testing from the viewpoint of the flow of the method, and the following embodiment describes an apparatus for mechanical impact testing from the viewpoint of a virtual module or a virtual unit, specifically the following embodiment.
Referring to fig. 2, the mechanical impact testing apparatus 20 may specifically include: an abnormal result information determination module 201, a judgment module 202, a test information acquisition module 203, and a deviation compensation information determination module 204, wherein,
The abnormal result information determining module 201 is configured to analyze the obtained impact test result information, determine impact test abnormal result information, where the impact test result information is summarized test result information after the multiple to-be-tested objects in the same batch are tested;
the judging module 202 is configured to judge whether the impact test abnormal result information belongs to a preset first test abnormal deviation range;
the test information obtaining module 203 is configured to obtain first impact test information corresponding to the impact test abnormal result information and second impact test information corresponding to other objects to be tested in the same batch if the first impact test information does not belong to the first impact test information;
the deviation compensation information determining module 204 is configured to determine test compensation information corresponding to the abnormal impact test result information according to the first impact test information and the second impact test information, and correct the abnormal impact test result information based on the test compensation information
In one possible implementation manner of the embodiment of the present application, the abnormal result information determining module 201 further includes: a first judging unit and an information determining unit, wherein,
the impact test result information comprises a plurality of sub-impact test result information;
the first judging unit is used for judging whether the information of the plurality of sub-impact test results respectively belong to a preset second test abnormal deviation range or not;
And the information determining unit is used for defining the sub-impact test result information which does not belong to the preset second test abnormal deviation range as the impact test abnormal result information if the sub-impact test result information does not belong to the preset second test abnormal deviation range.
In one possible implementation manner of the embodiment of the present application, the mechanical impact testing device further includes: a first feedback module, wherein,
and the first feedback module is used for generating test information of the impact test equipment and feeding back the test information to the display terminal for display if the information of the multiple sub-impact test results does not belong to the preset second test abnormal deviation range.
In one possible implementation manner of the embodiment of the present application, the mechanical impact testing apparatus 20 further includes: the test information determining module and the test information obtaining module, wherein,
the test information determining module is used for obtaining reference impact test information corresponding to any object to be tested in a previous batch adjacent to the same batch;
the test information acquisition module is used for eliminating the second impact test information and acquiring the second impact test information corresponding to the object to be tested except the object to be tested corresponding to the second impact test if the second impact test information does not belong to a preset reference test deviation range, wherein the preset reference test deviation range is set based on the reference impact test information, and the reference impact test information is in the preset reference test deviation range.
In one possible implementation manner of the embodiment of the present application, the deviation compensation information determining module 204 further includes: a second judgment unit and a compensation information determination unit, wherein:
the second judging unit is used for judging whether the first impact test information is the same as the second impact test information;
and the compensation information determining unit is used for calculating the difference value of the first impact test information and the second impact test information if the first impact test information is different from the second impact test information, and determining compensation information corresponding to the impact test abnormal result information.
In one possible implementation manner of the embodiment of the present application, the mechanical impact testing apparatus 20 further includes: a second feedback module, wherein,
and the second feedback module is used for carrying out difference value calculation on the first initial information and the second initial information, determining initial abnormal deviation information corresponding to the impact test abnormal result information and feeding back the initial abnormal deviation information to the display terminal.
In one possible implementation manner of the embodiment of the present application, the test information determining module further includes: a history test information acquisition unit and a test information determination unit, wherein,
the historical test information acquisition unit is used for acquiring historical impact test information corresponding to a plurality of objects to be tested in the previous batch adjacent to the same batch respectively;
The test information determining unit is used for carrying out average value calculation on the historical impact test information corresponding to the plurality of objects to be tested respectively and determining the reference impact test information.
It will be clear to those skilled in the art that, for convenience and brevity of description, specific working procedures of the above-described systems, apparatuses and units may refer to corresponding procedures in the foregoing method embodiments, and are not repeated herein.
The embodiment of the application also describes an electronic device from the perspective of the entity apparatus, as shown in fig. 3, the electronic device 30 shown in fig. 3 includes: a processor 301 and a memory 303. Wherein the processor 301 is coupled to the memory 303, such as via a bus 302. Optionally, the electronic device 30 may also include a transceiver 304. It should be noted that, in practical applications, the transceiver 304 is not limited to one, and the structure of the electronic device 30 is not limited to the embodiment of the present application.
The processor 301 may be a CPU (Central Processing Unit ), general purpose processor, DSP (Digital Signal Processor, data signal processor), ASIC (Application Specific Integrated Circuit ), FPGA (Field Programmable Gate Array, field programmable gate array) or other programmable logic device, transistor logic device, hardware components, or any combination thereof. Which may implement or perform the various exemplary logic blocks, modules, and circuits described in connection with this disclosure. Processor 301 may also be a combination that implements computing functionality, e.g., comprising one or more microprocessor combinations, a combination of a DSP and a microprocessor, etc.
Bus 302 may include a path to transfer information between the components. Bus 302 may be a PCI (Peripheral Component Interconnect, peripheral component interconnect Standard) bus or an EISA (Extended Industry Standard Architecture ) bus, or the like. Bus 302 may be divided into an address bus, a data bus, a control bus, and the like. For ease of illustration, only one thick line is shown in fig. 3, but not only one bus or one type of bus.
The Memory 303 may be, but is not limited to, a ROM (Read Only Memory) or other type of static storage device that can store static information and instructions, a RAM (Random Access Memory ) or other type of dynamic storage device that can store information and instructions, an EEPROM (Electrically Erasable Programmable Read Only Memory ), a CD-ROM (Compact Disc Read Only Memory, compact disc Read Only Memory) or other optical disk storage, optical disk storage (including compact discs, laser discs, optical discs, digital versatile discs, blu-ray discs, etc.), magnetic disk storage media or other magnetic storage devices, or any other medium that can be used to carry or store desired program code in the form of instructions or data structures and that can be accessed by a computer.
The memory 303 is used for storing application program codes for executing the present application and is controlled to be executed by the processor 301. The processor 301 is configured to execute the application code stored in the memory 303 to implement what is shown in the foregoing method embodiments.
The electronic device shown in fig. 3 is only an example and should not be construed as limiting the functionality and scope of use of the embodiments herein.
It should be understood that, although the steps in the flowcharts of the figures are shown in order as indicated by the arrows, these steps are not necessarily performed in order as indicated by the arrows. The steps are not strictly limited in order and may be performed in other orders, unless explicitly stated herein. Moreover, at least some of the steps in the flowcharts of the figures may include a plurality of sub-steps or stages that are not necessarily performed at the same time, but may be performed at different times, the order of their execution not necessarily being sequential, but may be performed in turn or alternately with other steps or at least a portion of the other steps or stages.
The foregoing is only a partial embodiment of the present application and it should be noted that, for a person skilled in the art, several improvements and modifications can be made without departing from the principle of the present application, and these improvements and modifications should also be considered as the protection scope of the present application.

Claims (10)

1. A method of mechanical impact testing comprising:
analyzing the obtained impact test result information to determine impact test abnormal result information, wherein the impact test result information is summarized test result information after the test of a plurality of objects to be tested in the same batch is completed;
judging whether the impact test abnormal result information belongs to a preset first test abnormal deviation range or not;
if the first impact test information does not belong to the first object to be tested, acquiring first impact test information corresponding to the impact test abnormal result information and second impact test information corresponding to other objects to be tested in the same batch;
according to the first impact test information and the second impact test information, determining test compensation information corresponding to the impact test abnormal result information, and correcting the impact test abnormal result information based on the test compensation information.
2. The method of claim 1, wherein the impact test result information comprises a plurality of sub-impact test result information, wherein the analyzing the obtained impact test result information to determine impact test abnormal result information comprises:
judging whether the sub-impact test result information respectively belongs to a preset second test abnormal deviation range or not;
If the sub-impact test result information does not belong to the preset second test abnormal deviation range, defining the sub-impact test result information which does not belong to the preset second test abnormal deviation range as the impact test abnormal result information.
3. The method according to claim 2, wherein the determining whether the plurality of sub-impact test result information respectively belongs to a preset second test anomaly deviation range further comprises:
if the sub-impact test result information does not belong to the preset second test abnormal deviation range, generating test information of the impact test equipment and feeding back the test information to the display terminal for display.
4. The method according to claim 1, wherein the obtaining the second impact test information corresponding to the other objects to be tested in the same batch includes:
determining reference impact test information which is adjacent to the same batch and corresponds to the objects to be tested in the previous batch;
if the second impact test information does not belong to a preset reference test deviation range, eliminating the second impact test information, and acquiring second impact test information corresponding to an object to be tested except the object to be tested corresponding to the second impact test, wherein the preset reference test deviation range is set based on the reference impact test information, and the reference impact test information is in the preset reference test deviation range.
5. The method according to claim 1, wherein determining the test compensation information corresponding to the impact test abnormality result information according to the first impact test information and the second impact test information includes:
judging whether the first impact test information is identical to the second impact test information;
if not, carrying out difference calculation on the first impact test information and the second impact test information, and determining compensation information corresponding to the impact test abnormal result information.
6. The method of claim 4, wherein the first impact test information comprises first initial information, the second impact test information comprises second initial information, and determining test compensation information corresponding to the impact test anomaly result information further comprises:
and carrying out difference calculation on the first initial information and the second initial information, determining initial abnormal deviation information corresponding to the impact test abnormal result information, and feeding back the initial abnormal deviation information to a display terminal.
7. The method of claim 1, wherein determining the reference impact test information corresponding to a previous batch of test objects adjacent to the same batch comprises:
Acquiring historical impact test information corresponding to a plurality of objects to be tested in the previous batch adjacent to the same batch;
and carrying out average value calculation on the historical impact test information corresponding to the plurality of objects to be tested respectively, and determining the reference impact test information.
8. A mechanical impact testing device, comprising:
the abnormal result information determining module is used for analyzing the obtained impact test result information and determining impact test abnormal result information, wherein the impact test result information is summarized after the test of a plurality of objects to be tested in the same batch is completed;
the judging module is used for judging whether the impact test abnormal result information belongs to a preset first test abnormal deviation range or not;
the test information acquisition module is used for acquiring first impact test information corresponding to the impact test abnormal result information and second impact test information corresponding to other objects to be tested in the same batch if the first impact test information does not belong to the first impact test information;
the deviation compensation information determining module is used for determining test compensation information corresponding to the impact test abnormal result information according to the first impact test information and the second impact test information, and correcting the impact test abnormal result information based on the test compensation information.
9. An electronic device, comprising:
at least one processor;
a memory;
at least one application program, wherein the at least one application program is stored in the memory and configured to be executed by the at least one processor, the at least one application program configured to: performing the mechanical shock test method of any one of claims 1 to 7.
10. A computer readable storage medium having stored thereon a computer program, characterized in that the computer program, when executed in a computer, causes the computer to perform the mechanical shock testing method according to any of claims 1-7.
CN202310228978.2A 2023-02-28 2023-02-28 Mechanical impact test method and device, electronic equipment and storage medium Pending CN116124403A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN202310228978.2A CN116124403A (en) 2023-02-28 2023-02-28 Mechanical impact test method and device, electronic equipment and storage medium

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN202310228978.2A CN116124403A (en) 2023-02-28 2023-02-28 Mechanical impact test method and device, electronic equipment and storage medium

Publications (1)

Publication Number Publication Date
CN116124403A true CN116124403A (en) 2023-05-16

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Country Status (1)

Country Link
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