CN116106585A - Manual conduction testing device and method for panel Cell segment crimping unit - Google Patents

Manual conduction testing device and method for panel Cell segment crimping unit Download PDF

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Publication number
CN116106585A
CN116106585A CN202310038920.1A CN202310038920A CN116106585A CN 116106585 A CN116106585 A CN 116106585A CN 202310038920 A CN202310038920 A CN 202310038920A CN 116106585 A CN116106585 A CN 116106585A
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CN
China
Prior art keywords
unit
cell segment
panel cell
conduction
interface
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
CN202310038920.1A
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Chinese (zh)
Inventor
程亮
王涛
邱乐乐
高健
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Wuhan Jingce Electronic Group Co Ltd
Wuhan Jingyitong Electronic Technology Co Ltd
Original Assignee
Wuhan Jingce Electronic Group Co Ltd
Wuhan Jingyitong Electronic Technology Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
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Publication date
Application filed by Wuhan Jingce Electronic Group Co Ltd, Wuhan Jingyitong Electronic Technology Co Ltd filed Critical Wuhan Jingce Electronic Group Co Ltd
Priority to CN202310038920.1A priority Critical patent/CN116106585A/en
Publication of CN116106585A publication Critical patent/CN116106585A/en
Pending legal-status Critical Current

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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/04—Housings; Supporting members; Arrangements of terminals
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/04—Housings; Supporting members; Arrangements of terminals
    • G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/04—Housings; Supporting members; Arrangements of terminals
    • G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
    • G01R1/0425—Test clips, e.g. for IC's
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/50—Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections
    • G01R31/54—Testing for continuity
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
    • Y02E—REDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
    • Y02E10/00—Energy generation through renewable energy sources
    • Y02E10/50—Photovoltaic [PV] energy

Abstract

The invention discloses a manual conduction testing device and method for a panel Cell segment crimping unit, wherein the manual conduction testing device comprises a testing unit, a first switching conduction unit and a second switching conduction unit; the first transfer conduction unit comprises connection terminals which are connected with golden fingers of the signal input connector of the panel Cell segment crimping unit in a one-to-one correspondence manner; the second switching-on unit comprises a first interface for electrically connecting all probes of the pressure head assembly of the panel Cell segment pressure welding unit and a second interface for electrically connecting the testing unit; during testing, one end of the testing unit is connected with the second interface, and the other end of the testing unit is connected with a connecting terminal. The invention can conduct the panel Cell segment crimping unit before shipment, and ensure the quality of the panel Cell segment crimping unit.

Description

Manual conduction testing device and method for panel Cell segment crimping unit
Technical Field
The invention belongs to the technical field of display equipment testing, and particularly discloses a manual conduction testing device of a panel Cell segment crimping unit, and a display panel detection device and method.
Background
With the development of domestic technology, various panel testing devices, such as panel Cell segment crimping units (Probe Unit technology) used by Cell segment products, are gradually domesticated, and a plurality of enterprises have the design and manufacturing capabilities of the panel Cell segment crimping units, as shown in fig. 1 and 2, the panel Cell segment crimping units are composed of N identical pressure head assemblies 7, each pressure head assembly 7 is provided with a Probe 8, each pressure head assembly 7 can be crimped with one display panel 9, and N display panels 9 can be simultaneously crimped at one time. When the panel Cell segment crimping unit is arranged on equipment, N signal input connectors 4 are in butt joint with the equipment, the input connectors 4 are transmitted to FPC6 on N pressure head assemblies through PCBA5, then to a probe 8, finally to a product, the product is lightened and then subjected to relevant tests, but the panel Cell segment crimping unit does not correspond to the equipment and the corresponding product before shipment, and cannot be subjected to the lightening tests, so that the conduction tests of the pressure head assemblies 7 can only be carried out by other methods; in general, after the panel Cell segment crimping unit is manufactured, conducting test is required, and the test method of the panel Cell segment crimping unit in the prior art is as follows: when the test is conducted by using the universal meter, one end of the meter pen is connected with a contact point on a signal input port of the panel Cell segment crimping unit, and the other end of the meter pen is contacted with a probe tip of the panel Cell segment crimping unit, and each needle is tested according to the corresponding relation of the signal diagram.
Disclosure of Invention
Aiming at the technical problems in the prior art, the invention provides a manual conduction testing device for a panel Cell segment crimping unit, which can conduct conduction testing on the panel Cell segment crimping unit before shipment, so as to ensure the quality of the panel Cell segment crimping unit.
The invention discloses a manual conduction testing device of a panel Cell segment crimping unit, which comprises a testing unit, a first switching conduction unit and a second switching conduction unit; the first transfer conduction unit comprises connection terminals which are connected with golden fingers of the signal input connector of the panel Cell segment crimping unit in a one-to-one correspondence manner; the second switching-on unit comprises a first interface for electrically connecting all probes of the pressure head assembly of the panel Cell segment pressure welding unit and a second interface for electrically connecting the testing unit; during testing, one end of the testing unit is connected with the second interface, and the other end of the testing unit is connected with a connecting terminal.
In a preferred embodiment of the invention, the first interface is a conducting surface, the conducting surface having an area greater than the area of all probes of the indenter assembly during testing; or the first interface is a first PAD lattice, and PAD points on the first PAD lattice are in one-to-one correspondence with probes of the pressure head assembly.
In a preferred embodiment of the present invention, during testing, the second interface is a conducting surface, or the second interface is a second PAD lattice, PAD points on the second PAD lattice correspond to probes of the pressure head assembly one by one, and a distance between PAD points on the second PAD lattice is greater than a distance between probes of the pressure head assembly.
In a preferred embodiment of the invention, each connection terminal is provided with an identification number, and the identification numbers of the connection terminals are in one-to-one correspondence with the PIN numbers of the golden fingers of the signal input connector during testing.
In a preferred embodiment of the present invention, the first transfer conduction unit includes a conduction clamp for a golden finger of a signal input connector and a transfer assembly for connecting the conduction clamp, and the transfer assembly includes a plurality of connection terminals for connecting the test unit.
In a preferred embodiment of the present invention, during testing, the conducting fixture comprises two clamping conducting assemblies with adjustable intervals and connected with each other, each clamping conducting assembly comprises a base, a PCB board is arranged on the base, and a probe assembly for connecting the signal input connector and a transfer port for connecting the transfer assembly are arranged on the PCB board.
In a preferred embodiment of the present invention, in the test, the adaptor assembly includes an adaptor, a wire and a header, one end of the wire is connected to the adaptor, the other end of the wire is connected to the header, and the header is provided with the connection terminal.
In a preferred embodiment of the present invention, the adaptor assembly comprises an adaptor and a plurality of wires, one end of each wire is connected with the adaptor and the other end is connected with the connecting terminal.
In a preferred embodiment of the present invention, during testing, the adapter assembly includes an adapter board, and a first interface for connecting the adapter board and a connection terminal or PAD array that is communicated with the first interface are disposed on the adapter board.
In a preferred embodiment of the invention, the test unit comprises a multimeter.
The invention also discloses a manual conduction test method of the Cell segment crimping unit, which uses the manual conduction test device of the panel Cell segment crimping unit to connect the panel Cell segment crimping unit to be tested, and judges whether the manual conduction test device of the Cell segment crimping unit is conducted or not based on the fact that the test units are connected with the connecting terminals and PAD points on a second PAD lattice corresponding to the connecting terminals one by one.
In a preferred embodiment of the present invention, the specific steps include, S1, implementing, based on the auxiliary alignment device, the golden finger of each pressure head assembly to be aligned and crimped with the first PAD lattice of the second transfer conduction unit; s2, one end of the test unit is connected with the connecting terminal, and the other end of the test unit contacts with a second PAD lattice corresponding to the connecting terminal, so that conduction test is realized.
The beneficial effects of the invention are as follows: the invention has the advantages of simple structure, high detection efficiency and good stability, realizes the switching of the panel Cell segment crimping unit by introducing the first switching-on unit and the second switching-on unit, facilitates the point-by-point test of the panel Cell segment crimping unit by the test unit, greatly improves the convenience of the detection operation of the panel Cell segment crimping unit by the indirect measurement method after the switching-on, and improves the detection efficiency of the panel Cell segment crimping unit;
furthermore, each connecting terminal is provided with an identification serial number, and the identification serial numbers of the connecting terminals are in one-to-one correspondence with the serial numbers of PIN needles on golden fingers of the signal input connector, so that detection personnel can orderly detect each PAD point on the Cell segment crimping unit of the panel to be suitable for qualification;
furthermore, the first transfer conduction unit comprises a conduction clamp for a golden finger of a signal input connector and a transfer assembly for connecting the conduction clamp, wherein the transfer assembly comprises a plurality of connecting terminals for connecting the test unit;
furthermore, the conduction clamp comprises two clamping conduction assemblies which are adjustable in distance and are connected with each other, each clamping conduction assembly comprises a base, a PCB (printed circuit board) is arranged on the base, a probe assembly used for connecting the signal input connector and an adapter used for connecting the adapter assembly are arranged on the PCB, and the structure design can adapt to connection and conduction of Cell section compression joint units of various types of panels;
further, a spring and a thread locking assembly are arranged between the two bases, the thread locking assembly comprises a screw arranged on one base and a threaded hole arranged on the other base, and the structural design is convenient for the connection of the panel Cell section crimping unit and the conduction clamp;
furthermore, a guide assembly is arranged between the two bases, and comprises a positioning pin arranged on one base and a positioning hole arranged on the other base, and the structure design is convenient for sliding guide between the panel Cell segment crimping unit and the conduction clamp;
furthermore, the adapter assembly comprises an adapter, a wire rod and a ox horn seat, wherein one end of the wire rod is connected with the adapter, the other end of the wire rod is connected with the ox horn seat, and the connecting terminal is arranged on the ox horn seat;
further, the invention also discloses a manual conduction test method of the panel Cell segment crimping unit, which comprises the following specific steps of S1, realizing the first PAD lattice counterpoint crimping of the golden finger of each pressure head component and the second switching conduction unit based on an auxiliary counterpoint device; s2, connecting one end of the test unit with a connecting terminal, and contacting the other end of the test unit with a second PAD lattice corresponding to the connecting terminal to realize conduction test; the position of the tested pressure head assembly is accurately adjusted, so that the secondary adjustment to the client is not needed after delivery.
Drawings
Fig. 1 is a schematic diagram of a panel Cell segment crimping unit;
FIG. 2 is a schematic diagram of a panel Cell segment crimping unit turning on a display panel;
FIG. 3 is a schematic diagram of a manual conduction testing apparatus of a panel Cell segment crimping unit according to the present invention;
FIG. 4 is a schematic diagram of a first transfer conduction unit of a manual transfer test device of a panel Cell segment crimping unit according to the present invention;
FIG. 5 is a schematic diagram of a clamping conduction assembly of a manual conduction testing device of a panel Cell segment crimping unit according to the present invention;
FIG. 6 is a schematic diagram of a clamping conduction assembly of a manual conduction testing device of a panel Cell segment crimping unit according to the present invention;
fig. 7 is a schematic diagram showing a released state of a clamping conduction assembly of a manual conduction testing device of a panel Cell segment crimping unit according to the present invention;
fig. 8 is a schematic diagram of a clamping state of a clamping conduction assembly of a manual conduction testing device of a panel Cell segment crimping unit according to the present invention;
FIG. 9 is a schematic diagram of a switching assembly of a manual conduction testing apparatus of a panel Cell segment crimping unit according to the present invention;
in the figure: the test device comprises a 1-test unit, a 2-first transfer conduction unit, a 3-second transfer conduction unit, a 4-signal input connector, a 5-PCBA, a 6-FPC, a 7-pressure head assembly, an 8-probe, a 9-display panel, a 21-conduction clamp, a 22-transfer assembly, a 31-first PAD lattice, a 32-second PAD lattice, a 211-base, a 212-PCB, a 213-probe assembly, a 214-transfer interface, a 215-spring, a 216-thread locking assembly, a 217-guide assembly, a 221-transfer connector, a 222-wire and a 223-ox horn seat.
Detailed Description
The following describes the invention in further detail, including preferred embodiments, by way of the accompanying drawings and by way of examples of some alternative embodiments of the invention. It will be apparent that the described embodiments are only some, but not all, embodiments of the invention. All other embodiments, which can be made by those skilled in the art based on the embodiments of the invention without making any inventive effort, are intended to fall within the scope of the invention.
As shown in fig. 3, the invention discloses a manual conduction testing device of a panel Cell segment crimping unit, which comprises a testing unit 1, a first switching conduction unit 2 and a second switching conduction unit 3; the first transfer conduction unit 2 comprises connecting terminals which are connected with golden fingers of the signal input connector of the panel Cell segment crimping unit in a one-to-one correspondence manner; the second transfer conduction unit 3 comprises a first interface for electrically connecting with all probes of the pressure head assembly of the panel Cell segment crimping unit and a second interface for electrically connecting with the testing unit; during testing, one end of the testing unit is connected with the second interface, and the other end of the testing unit is connected with a connecting terminal. It will be appreciated that the test unit 1 of the present invention can only test whether a probe on a ram assembly is capable of being turned on or off for a pass at a time.
It can be understood that the second switching and conducting unit 3 of the present invention may be a PCBA board, on which a first interface and a second interface are disposed, and the first interface and the second interface are conducted. The first interface is a conducting surface, and the area of the conducting surface is larger than the area of all probes of the pressure head assembly; or the first interface is a first PAD lattice, and PAD points on the first PAD lattice correspond to probes of the pressure head assembly one by one; the second interface is a conducting surface, or the second interface is a second PAD lattice, PAD points on the second PAD lattice are in one-to-one correspondence with probes of the pressure head assembly, and the distance between the PAD points on the second PAD lattice is larger than the distance between the probes of the pressure head assembly, so that in summary, the second switching conducting unit 3 has four technical schemes:
according to the technical scheme 1, a first interface on the PCBA board is a conducting surface, and a second interface on the PCBA board is a second PAD lattice;
according to the technical scheme 2, a first interface on the PCBA board is a conducting surface, and a second interface on the PCBA board is a conducting surface;
according to the technical scheme 3, a first interface on the PCBA board is a first PAD lattice and a second interface on the PCBA board is a conducting surface;
according to the technical scheme 4, a first PAD lattice on the PCBA board and a second interface on the PCBA board are second PAD lattices;
since the test unit 1 is selectively connected to the connection terminal of the first transfer conduction unit 2, as long as the probe of the pressure head assembly of the panel Cell segment pressure welding unit corresponding to the connection terminal is conducted, the connection terminals corresponding to other probes on the pressure head assembly of the panel Cell segment pressure welding unit are not conducted, so that the test is not affected.
As shown in fig. 3, the specific technical scheme 4 is that the manual conduction testing device for the panel Cell segment crimping unit comprises a testing unit 1, a first switching conduction unit 2 and a second switching conduction unit 3; the first transfer conduction unit 2 comprises connecting terminals which are connected with golden fingers of the signal input connector of the panel Cell segment crimping unit in a one-to-one correspondence manner; the second transfer conduction unit 3 comprises a first PAD lattice 31 and a second PAD lattice 32 which are connected with the test unit 1 in one-to-one correspondence with probes of a pressure head assembly of the panel Cell section pressure welding unit; the PAD points on the second PAD lattice 32 are in one-to-one corresponding conduction connection with the PAD points on the first PAD lattice 31, and the space between the PAD points on the second PAD lattice 32 is larger than the space between the PAD points on the first PAD lattice 31; the number of connection terminals of the switching component 22 is not less than the number of PAD points on the second PAD lattice 32.
The second switching-on unit 3 can conveniently realize PAD points on the connectors of the test unit 1 one by one, when the panel Cell segment crimping unit is tested and conducted, the position of each pressure head component 7 is firstly adjusted to be optimal under a microscope, the probe 8 is ensured to be contacted with the first PAD lattice 31 of the first switching-on unit 2 and then crimped, one end of the universal meter is connected with a terminal, and the other end of the universal meter is contacted with the second PAD lattice 32 with larger interval, so that the operation convenience is greatly improved.
Preferably, during testing, one end of the test unit 1 is connected to a connection terminal, and the other end of the test unit 1 is connected to a PAD point on the second PAD array 32 corresponding to the connection terminal.
Preferably, each connecting terminal is provided with an identification serial number, and the identification serial numbers of the connecting terminals are in one-to-one correspondence with the serial numbers of the PIN needles on the golden fingers of the signal input connector.
Preferably, the first transfer conducting unit 2 includes a conducting fixture 21 for a golden finger of the signal input connector and a transfer component 22 for connecting the conducting fixture 21, the transfer component 22 includes a plurality of connection terminals for connecting the test unit 1, and the transfer component 22 of the conducting fixture 21 constitutes a female connector in communication with the golden finger of the signal input connector.
Preferably, as shown in fig. 4-8, the conducting fixture 21 includes two clamping conducting assemblies connected to each other with adjustable space, each clamping conducting assembly includes a base 211, a PCB board 212 is disposed on the base 211, a probe assembly 213 for connecting to a signal input connector and a switching port 214 for connecting to the switching assembly 22 are disposed on the PCB board 212, and the switching port 214 may be an MIPI interface.
Preferably, a spring 215 and a threaded locking assembly 216 are disposed between the two bases 211, the threaded locking assembly 216 comprising a screw disposed on one base 211 and a threaded bore disposed on the other base 211.
Preferably, a guide assembly 217 is disposed between the two bases 211, the guide assembly 217 including a positioning pin disposed on one base 211 and a positioning hole disposed on the other base 211.
The adaptor assembly 22 of the present invention may adopt the following three technical schemes:
technical scheme 3: the adapter component 22 comprises an adapter 221, a wire 222 and a ox horn seat 223, one end of the wire 222 is connected with the adapter 221, the other end of the wire 222 is connected with the ox horn seat 223, a connecting terminal (i.e. a PIN) is arranged on the ox horn seat 223, the adapter 221 is an MIPI connector, the MIPI connector can be inserted into an MIPI interface, a universal meter pen can directly prick the connecting terminal of the 120PIN ox horn seat, the connecting terminal can be numbered by label paper and corresponds to the serial number of a golden finger of the 112PIN male connector one by one (redundant PIN is suspended);
technical scheme 2: the adaptor assembly 22 comprises an adaptor 221 and a plurality of wires, one end of each wire is connected with the adaptor, and the other end of each wire is connected with the connecting terminal;
technical scheme 3: the adapter assembly 22 comprises an adapter plate, and a first interface for connecting the adapter plate and a connecting terminal or a PAD lattice communicated with the first interface are arranged on the adapter plate; the adapter plate can be a PCBA plate
The advantage of using the conductive clamp 21 of the present invention in combination with the adapter assembly 22 is that:
(1) the multimeter pen is directly used to prick the PAD point on the signal input connector 4 (male connector),
firstly, the operation is inconvenient, secondly, the PIN sequence identification is not arranged on the operation, and the efficiency is very slow;
(2) for reasons of space limitation, since the whole panel Cell segment crimping unit is to be hung on the equipment for operation,
the input connector 4 (male connector) is buried inside the device and cannot be touched directly. The conduction clamp 21 of the invention is matched with the switching component 22 to be equivalent to extension line leading-out equipment, so that the follow-up needle insertion with a universal meter is convenient.
Preferably, the test unit 1 comprises a multimeter.
Preferably, the second switching-on unit 3 is a PCBA board, on which a first PAD lattice 31 and a second PAD lattice 32 are arranged, the first PAD lattice 31 corresponding to the golden finger of the indenter assembly 7;
the invention also discloses a manual conduction testing method of the Cell segment crimping unit, which uses the manual conduction testing device of the panel Cell segment crimping unit to connect the panel Cell segment crimping unit to be tested, and judges whether the manual conduction testing device of the Cell segment crimping unit is conducted or not based on the fact that the testing unit 1 is connected with the connecting terminal and the PAD points on the second PAD lattice 32 corresponding to the connecting terminal one by one.
Preferably, the specific steps include, S1, realizing the first PAD lattice counterpoint crimping of the golden finger of each pressure head assembly and the second switching-on unit based on the auxiliary counterpoint device; s2, one end of the test unit is connected with the connecting terminal, and the other end of the test unit contacts with a second PAD lattice corresponding to the connecting terminal, so that conduction test is realized.
Preferably, the auxiliary alignment device includes, but is not limited to, a microscope.
It will be readily understood by those skilled in the art that the foregoing is merely illustrative of the preferred embodiments of the present invention and that no limitations are intended to the scope of the invention, except insofar as modifications, combinations, substitutions, improvements or the like may be made within the spirit and principles of the invention.

Claims (12)

1. Manual conduction testing device of panel Cell section crimping unit, its characterized in that: the device comprises a test unit, a first switching-on unit and a second switching-on unit;
the first transfer conduction unit comprises connection terminals which are connected with golden fingers of the signal input connector of the panel Cell segment crimping unit in a one-to-one correspondence manner;
the second switching-on unit comprises a first interface for electrically connecting all probes of the pressure head assembly of the panel Cell segment pressure welding unit and a second interface for electrically connecting the testing unit;
during testing, one end of the testing unit is connected with the second interface, and the other end of the testing unit is connected with a connecting terminal.
2. The panel Cell segment crimping unit manual conduction testing apparatus of claim 1, wherein: the first interface is a conducting surface, or the first interface is a first PAD lattice, and PAD points on the first PAD lattice are in one-to-one correspondence with probes of the pressure head assembly.
3. The panel Cell segment crimping unit manual conduction testing apparatus of claim 1, wherein: the second interface is a conducting surface, or the second interface is a second PAD lattice, PAD points on the second PAD lattice are in one-to-one correspondence with probes of the pressure head assembly, and the interval between the PAD points on the second PAD lattice is larger than the interval between the probes of the pressure head assembly.
4. The panel Cell segment crimping unit manual conduction testing apparatus of claim 1, wherein: each connecting terminal is provided with an identification serial number, and the identification serial numbers of the connecting terminals are in one-to-one correspondence with the PIN serial numbers on the golden fingers of the signal input connector.
5. The panel Cell segment crimping unit manual conduction testing apparatus of claim 1, wherein: the first transfer conduction unit comprises a conduction clamp for a golden finger of a signal input connector and a transfer assembly for connecting the conduction clamp, and the transfer assembly comprises a plurality of connecting terminals for connecting the test unit.
6. The panel Cell segment crimping unit manual conduction testing apparatus of claim 5, wherein: the clamping and conducting fixture comprises two clamping and conducting assemblies which are connected with each other and have adjustable intervals, each clamping and conducting assembly comprises a base, a PCB (printed circuit board) is arranged on the base, and a probe assembly used for connecting the signal input connector and a switching port used for connecting the switching assembly are arranged on the PCB.
7. The panel Cell segment crimping unit manual conduction testing apparatus of claim 5, wherein: the switching subassembly includes adapter, wire rod and ox horn seat, the one end of wire rod with the adapter is connected, the other end of wire rod with the ox horn seat is connected, be provided with on the ox horn seat connecting terminal.
8. The panel Cell segment crimping unit manual conduction testing apparatus of claim 5, wherein: the switching subassembly includes adapter and many wires, the one end of every wire rod with the adapter is connected with the other end is connected with connecting terminal.
9. The panel Cell segment crimping unit manual conduction testing apparatus of claim 5, wherein: the switching assembly comprises a switching plate, wherein a first interface for connecting the switching interface and a connecting terminal or PAD lattice communicated with the first interface are arranged on the switching plate.
10. The panel Cell segment crimping unit manual conduction testing apparatus of claim 1, wherein: the test unit includes a multimeter.
11. A manual conduction test method for a panel Cell segment crimping unit is characterized by comprising the following steps of: the panel Cell segment press-connection unit to be tested is connected by using the panel Cell segment press-connection unit manual conduction testing device according to any one of claims 1-10, and whether the panel Cell segment press-connection unit manual conduction testing device is conducted is judged based on the fact that the test units are connected with the connection terminals one by one and the PAD points on the second PAD dot matrix corresponding to the connection terminals.
12. The panel Cell segment crimping unit manual conduction testing method according to claim 11, wherein: the specific steps include that,
s1, realizing the first PAD lattice counterpoint crimping of the golden finger of each pressure head component and the second switching-on unit based on an auxiliary counterpoint device;
s2, one end of the test unit is connected with the connecting terminal, and the other end of the test unit contacts with a second PAD lattice corresponding to the connecting terminal, so that conduction test is realized.
CN202310038920.1A 2023-01-13 2023-01-13 Manual conduction testing device and method for panel Cell segment crimping unit Pending CN116106585A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN202310038920.1A CN116106585A (en) 2023-01-13 2023-01-13 Manual conduction testing device and method for panel Cell segment crimping unit

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN202310038920.1A CN116106585A (en) 2023-01-13 2023-01-13 Manual conduction testing device and method for panel Cell segment crimping unit

Publications (1)

Publication Number Publication Date
CN116106585A true CN116106585A (en) 2023-05-12

Family

ID=86259320

Family Applications (1)

Application Number Title Priority Date Filing Date
CN202310038920.1A Pending CN116106585A (en) 2023-01-13 2023-01-13 Manual conduction testing device and method for panel Cell segment crimping unit

Country Status (1)

Country Link
CN (1) CN116106585A (en)

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