CN116106221A - Automatic inspection equipment for the appearance of semiconductor chips after soldering - Google Patents
Automatic inspection equipment for the appearance of semiconductor chips after soldering Download PDFInfo
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- CN116106221A CN116106221A CN202211446220.8A CN202211446220A CN116106221A CN 116106221 A CN116106221 A CN 116106221A CN 202211446220 A CN202211446220 A CN 202211446220A CN 116106221 A CN116106221 A CN 116106221A
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- 239000004065 semiconductor Substances 0.000 title claims abstract description 21
- 238000007689 inspection Methods 0.000 title claims abstract description 10
- 238000005476 soldering Methods 0.000 title claims description 9
- 239000000463 material Substances 0.000 claims abstract description 141
- 238000001514 detection method Methods 0.000 claims abstract description 40
- 238000011179 visual inspection Methods 0.000 claims abstract description 28
- 238000003466 welding Methods 0.000 claims abstract description 9
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Abstract
本发明涉及芯片外观检测领域,具体地说,涉及半导体芯片焊接后外观自动检测设备。其包括装置主体,装置主体内设有物料输送轨道和设置物料输送轨道旁的分拣组件,物料输送轨道处设有沿其长度方向移动的物料盘,物料盘上端面处设有多个用于放置芯片的放置槽,物料输送轨道处沿长度方向依次形成有上料段,用于芯片正面视觉检测的正面视觉检测段,芯片分拣段和下料段;分拣组件用于对位于芯片分拣段的芯片进行分拣,分拣组件的可分拣范围包括所述芯片分拣段。本发明中的装置主体首先能够实现芯片的的自动化运输;并且通过对于芯片的正反面识别检测能够较佳地提高外观检测结果的准确性。
The invention relates to the field of chip appearance detection, in particular to an automatic detection device for the appearance of semiconductor chips after welding. It includes the main body of the device. The main body of the device is equipped with a material conveying track and a sorting assembly next to the material conveying track. The material conveying track is provided with a material tray moving along its length. The placement slot for placing the chip, the material conveying track is sequentially formed along the length direction with a feeding section, a frontal visual inspection section for the frontal visual inspection of the chip, a chip sorting section and a feeding section; the sorting component is used to align the The chips in the sorting section are sorted, and the sortable range of the sorting component includes the chip sorting section. The main body of the device in the present invention can firstly realize the automatic transportation of the chip; and the accuracy of the appearance inspection result can be preferably improved by identifying and detecting the front and back of the chip.
Description
技术领域technical field
本发明涉及芯片外观检测领域,具体地说,涉及半导体芯片焊接后外观自动检测设备。The invention relates to the field of chip appearance detection, in particular to an automatic detection device for the appearance of semiconductor chips after soldering.
背景技术Background technique
半导体芯片是指在半导体片材上进行浸蚀,布线,制成的能实现某种功能的半导体器件。在半导体芯片的生产过程中,需要对半成品的芯片与外壳进行焊接。由于芯片在焊接过程中可能会产生不同程度的损坏;故而在焊接完成后,需要对半导体芯片进行外观检测以去除质量不达标的次品。A semiconductor chip refers to a semiconductor device that can realize a certain function by etching and wiring on a semiconductor sheet. In the production process of semiconductor chips, it is necessary to weld the semi-finished chip and the shell. Since the chip may be damaged to varying degrees during the welding process; therefore, after the welding is completed, it is necessary to perform visual inspection on the semiconductor chip to remove defective products that do not meet the quality standards.
现有的检测设备通常使用检测相机对待检测芯片依次进行拍照识别检测,一方面,该种检测方式无法同时对多个待检测的芯片进行识别检测,制约了检测效率的提高;另一方面,该种检测方式难以迅速高效地对检测芯片的正反两面均进行识别检测,故而在检测过程中可能出现次品遗漏未检出的情况出现。Existing detection equipment usually uses a detection camera to sequentially take pictures of the chips to be tested for identification and detection. On the one hand, this detection method cannot simultaneously identify and detect multiple chips to be detected, which restricts the improvement of detection efficiency; on the other hand, the This detection method is difficult to quickly and efficiently identify and detect both the front and back sides of the detection chip, so defective products may be missed and not detected during the detection process.
发明内容Contents of the invention
为克服现有技术中的技术问题,本发明提供了半导体芯片焊接后外观自动检测设备;In order to overcome the technical problems in the prior art, the invention provides an automatic detection device for the appearance of semiconductor chips after welding;
半导体芯片焊接后外观自动检测设备,其包括装置主体,装置主体内设有物料输送轨道和设置物料输送轨道旁的分拣组件,物料输送轨道处设有沿其长度方向移动的物料盘,物料盘上端面处设有多个用于放置芯片的放置槽,物料输送轨道处沿长度方向依次形成有上料段,用于芯片正面视觉检测的正面视觉检测段,芯片分拣段和下料段;分拣组件用于对位于芯片分拣段的芯片进行分拣,分拣组件的可分拣范围包括所述芯片分拣段,还包括设于装置主体内的用于芯片反面视觉检测的反面视觉检测段以及不良排出段。Automatic inspection equipment for the appearance of semiconductor chips after welding, which includes the main body of the device. The main body of the device is equipped with a material conveying track and a sorting component next to the material conveying track. The material conveying track is provided with a material tray moving along its length. The upper end surface is provided with a plurality of placement slots for placing chips, and the material conveying track is sequentially formed along the length direction with a feeding section, a frontal visual inspection section for frontal visual inspection of chips, a chip sorting section and a feeding section; The sorting component is used to sort the chips located in the chip sorting section. The sortable range of the sorting component includes the chip sorting section, and also includes the reverse visual inspection for chip reverse visual detection in the main body of the device. Detection section as well as bad discharge section.
本发明中的装置主体首先能够通过物料输送轨道实现对于放置有多个芯片的物料盘的自动化运输;并且通过对于芯片的正反面识别检测能够较佳地提高外观检测结果的准确性,从而有效地避免因单面检测而导致未检测面存在瑕疵未检出的情况。The main body of the device in the present invention can first realize the automatic transportation of the material tray with multiple chips placed on it through the material conveying track; and the accuracy of the appearance detection result can be better improved by identifying and detecting the front and back sides of the chip, thereby effectively Avoid undetected defects on the undetected surface due to single-sided inspection.
作为优选,装置主体包括壳体,壳体包括上壳体和下壳体,所述物料输送轨道包括多组垂直设置于上壳体底板处且相互平行的第一竖板和第二竖板,还包括平行设置于第一竖板和第二竖板相对的两侧内壁处传动配合的传动带和传动轮组件;第一竖板沿物料输送方向上的两端底部设有滑动组件,滑动组件包括滑动导轨,滑动导轨与物料输送方向垂直布置;滑动导轨处设有与其滑动配合的滑块,滑块的上部通过连接板与第一竖板的底端相连;第一竖板远第二竖板的一侧设有驱动电机,传动轮组件包括与驱动电机输出端相连接的驱动轮和用于张紧和支撑传动带的从动轮;传动带的上表面用于放置物料盘并带动物料盘沿物料输送轨道移动。Preferably, the main body of the device includes a casing, the casing includes an upper casing and a lower casing, and the material conveying track includes a plurality of sets of first vertical plates and second vertical plates vertically arranged at the bottom plate of the upper casing and parallel to each other, It also includes a transmission belt and a drive wheel assembly that are arranged in parallel on the inner walls of the opposite sides of the first vertical board and the second vertical board; the bottom of both ends of the first vertical board along the material conveying direction is provided with a sliding assembly, and the sliding assembly includes Sliding guide rail, the sliding guide rail is arranged perpendicular to the direction of material conveying; the sliding guide rail is provided with a slider that slides with it, and the upper part of the slider is connected with the bottom end of the first vertical plate through the connecting plate; the first vertical plate is far from the second vertical plate There is a drive motor on one side of the drive wheel assembly, which includes a drive wheel connected to the output end of the drive motor and a driven wheel for tensioning and supporting the transmission belt; the upper surface of the transmission belt is used to place the material tray and drive the material tray to convey along the material track moves.
在本发明的装置主体使用过程中,工作人员能够通过驱动电机来带动传动带运动;并且,第一竖板和第二竖板能够对位于传动带上的物料盘起到较佳的限位作用,从而保证了物料盘能够沿物料输送轨道顺利稳定地通过正面视觉检测段和芯片分拣段。During the use of the main body of the device of the present invention, the staff can drive the drive belt to move by driving the motor; and the first vertical plate and the second vertical plate can better limit the position of the material tray on the drive belt, thereby It ensures that the material tray can pass through the front visual inspection section and the chip sorting section smoothly and stably along the material conveying track.
作为优选,上壳体的两侧侧壁处设有进料口和出料口,上料段和下料段分别位于进料口和出料口处;下壳体处沿物料盘输送方向上的两侧外壁之间形成有贯通的回流通道,回流通道处设有用于输送空置物料盘的回流输送带,回流输送带的输送方向与物料输送轨道输送方向相反。As a preference, the sidewalls on both sides of the upper shell are provided with a feed port and a discharge port, and the feeding section and the unloading section are located at the feed port and the discharge port respectively; A through return channel is formed between the outer walls on both sides of the machine, and a return conveyor belt for conveying empty material trays is provided at the return channel. The conveying direction of the return conveyor belt is opposite to the conveying direction of the material conveying track.
通过进料口、出料口以及回流输送带能够实现了物料盘的循环使用。The recycling of the material tray can be realized through the inlet, the outlet and the return conveyor belt.
作为优选,物料输送轨道处沿传动带传动方向间隔设有用于挡停和放行物料盘的第一挡停组件和第二挡停组件;第一挡停组件设于正面视觉检测段,第二挡停组件设于芯片分拣段;正面视觉检测段的上侧设有上相机模块,上相机模块的拍摄范围内覆盖有第一挡停组件将物料盘挡停时物料盘所处位置。As a preference, the material conveying track is provided with a first stop assembly and a second stop assembly for stopping and releasing the material tray at intervals along the driving direction of the transmission belt; the first stop assembly is arranged in the front visual detection section, and the second stop assembly The components are located in the chip sorting section; the upper side of the front visual inspection section is equipped with an upper camera module, and the shooting range of the upper camera module is covered with the position of the material tray when the first stop component stops the material tray.
通过第一挡停组件能够保证了位于正面视觉检测段上侧的上相机模块能够有充足的时间对物料盘进行拍摄和扫描;进而确保了正面视觉检测的结果准确性,以有效避免出现不良品遗漏的情况。第二挡停组件能够确保在分拣组件工作时,物料盘能够保持停止直至分拣组件对检测完成的芯片分拣完成后再放行通过;从而确保了分拣组件的顺利稳定工作。The first stop component can ensure that the upper camera module located on the upper side of the front visual inspection section can have sufficient time to photograph and scan the material tray; thus ensuring the accuracy of the front visual inspection results to effectively avoid defective products case of omission. The second stop component can ensure that when the sorting component is working, the material tray can keep stopping until the sorting component sorts the detected chips and then releases them; thus ensuring the smooth and stable work of the sorting component.
作为优选,第一挡停组件和第二挡停组件均包括挡停模块,挡停模块包括通过安装块设于第二竖板近第一竖板一侧内壁处的光电感应器和伺服气缸;光电感应器用于对位于其上侧的传动轨道进行感应,伺服气缸的活塞杆运动与物料盘沿物料输送轨道运动发生干涉。Preferably, both the first stop assembly and the second stop assembly include a stop module, and the stop module includes a photoelectric sensor and a servo cylinder arranged on the inner wall of the second riser near the first riser through the installation block; The photoelectric sensor is used to sense the transmission track located on its upper side, and the movement of the piston rod of the servo cylinder interferes with the movement of the material tray along the material delivery track.
当光电感应器感应到其上侧有物料盘通过时,其发出信号传递至伺服气缸,伺服气缸的活塞杆伸出将物料盘挡停,从而配合上相机模块和分拣组件进行工作,具有较佳地实用性。When the photoelectric sensor senses that there is a material tray passing through its upper side, it sends a signal to the servo cylinder, and the piston rod of the servo cylinder stretches out to stop the material tray, so as to cooperate with the upper camera module and the sorting component to work. Good practicality.
作为优选,分拣组件包括绕竖直方向转动的机械手,还包括沿高度方向运动的物料吸盘;物料吸盘设置于机械手的移动端用于吸取和放下芯片,机械手活动时物料吸盘接触范围为分拣组件的分拣范围。Preferably, the sorting assembly includes a manipulator that rotates around the vertical direction, and also includes a material suction cup that moves along the height direction; the material suction cup is arranged on the moving end of the manipulator for picking up and putting down chips, and the contact range of the material suction cup when the manipulator is active is sorting. The sorting range for the component.
通过机械手和物料吸盘能够较佳地带动芯片在芯片分拣段、反面视觉检测段和不良排出段之间移动。The manipulator and the material sucker can better drive the chip to move between the chip sorting section, the reverse visual inspection section and the bad discharge section.
作为优选,物料吸盘包括滑台气缸、安装板和真空吸盘,滑台气缸的上部与机械手的移动端相连接;滑台气缸的滑轨沿高度方向布置,滑台设于滑轨处与滑轨滑动配合;安装板水平设置于滑台的下端,安装板包括与滑台下端贴合的贴合部和伸出滑台下端的伸出部;安装板的伸出部处沿物料输送方向均匀布置有多个吸盘安装孔,吸盘安装孔处安装有用于吸取芯片的真空吸盘;吸盘安装孔以及真空吸盘的布置数量与物料盘处长度方向上单行布置的放置槽数量相对应。As preferably, the material sucker includes a slide table cylinder, a mounting plate and a vacuum suction cup, the upper part of the slide table cylinder is connected with the moving end of the manipulator; the slide rail of the slide table cylinder is arranged along the height direction, and the slide table is arranged at the slide rail place and the slide rail Sliding fit; the mounting plate is horizontally arranged at the lower end of the sliding table, and the mounting plate includes a fitting part that fits with the lower end of the sliding table and a protruding part protruding from the lower end of the sliding table; the protruding part of the mounting plate is evenly arranged along the material conveying direction. There are a plurality of suction cup installation holes, and vacuum suction cups for absorbing chips are installed at the suction cup installation holes; the number of suction cup installation holes and vacuum suction cups is corresponding to the number of placement slots arranged in a single row in the length direction of the material tray.
滑台气缸能够较佳地实现真空吸盘的上下移动,从而确保了真空吸盘能够较佳地在跟随机械手以及滑台移动的同时对芯片进行吸取和放下。此外,真空吸盘的布置数量与物料盘处的放置槽相对应,从而能够保证物料吸盘能够依次吸取物料盘处各行的芯片,进而提高了分拣效率。The sliding table cylinder can better realize the up and down movement of the vacuum chuck, thus ensuring that the vacuum chuck can preferably absorb and put down the chips while following the movement of the manipulator and the sliding table. In addition, the arrangement quantity of the vacuum suction cups corresponds to the placement slots on the material tray, so as to ensure that the material suction cups can sequentially pick up the chips of each row on the material tray, thereby improving the sorting efficiency.
作为优选,下壳体内设有下相机模块,下相机模块位于反面视觉检测段的下侧;当分拣组件将芯片吸取后移动至反面视觉检测段时,分拣组件所吸取的芯片反面均处于所述下相机模块的拍摄范围内。As a preference, the lower housing is provided with a lower camera module, and the lower camera module is located on the lower side of the reverse visual inspection section; when the sorting assembly moves the chip to the reverse visual inspection section after being sucked by the sorting assembly, the reverse of the chips sucked by the sorting assembly are all in the The lower camera module is within the shooting range.
本发明通过下相机模块能够对于芯片的反面进行扫描和拍摄并将数据传输至电脑,电脑能够通过芯片的反面拍摄扫描数据配合此前得出的正面检测结果对芯片进行分类处理。The present invention can scan and photograph the reverse side of the chip through the lower camera module and transmit the data to the computer, and the computer can classify the chips by photographing the scanned data on the reverse side of the chip and matching with the previously obtained positive detection results.
不良排出段处设有不良排出模块,不良排出模块包括不良品输送轨道,不良品输送轨道处设有与其滑动配合的输送组件,输送组件处设有多个用于放置不良品的放置槽。不良品输送轨道包括移动平台和设于移动平台下侧且与移动平台布置方向相同的丝杆模组;丝杆模组包括伺服电机和联轴器,还包括通过联轴器与伺服电机输出端相连接的滚珠丝杆;滚珠丝杆的两侧设有沿不良品输送轨道布置的滑轨,滚珠丝杆处设有与滑轨滑动配合的移动座,移动座的上部通过连接块连接有输送组件;输送组件包括与连接块相连接且与移动平台滑动配合的滑动板,以及设于滑动板上表面处的多个不良品输送盘。A defective discharge module is provided at the defective discharge section, and the defective discharge module includes a defective product conveying track. The defective product conveying track is provided with a conveying assembly slidingly matched with it, and the conveying assembly is provided with a plurality of placement slots for placing defective products. The defective product conveying track includes a mobile platform and a screw module located on the lower side of the mobile platform and arranged in the same direction as the mobile platform; the screw module includes a servo motor and a coupling, and also includes Connected ball screw; both sides of the ball screw are provided with slide rails arranged along the conveying track of defective products, and the ball screw is provided with a moving seat that slides and cooperates with the slide rail, and the upper part of the moving seat is connected with a conveying Assemblies; the conveying assembly includes a sliding plate connected with the connecting block and slidingly matched with the mobile platform, and a plurality of defective product conveying plates arranged on the upper surface of the sliding plate.
工作人员可以通过丝杆模组控制输送组件的移动。从而使得单个不良品输送盘处的放置槽放满时,丝杆模组能够带动该不良品输送盘移动到不良品输送轨道的末端,便于工作人员将放满的不良品输送盘进行清空。清空后工作人员便可以将其放回输送轨道的始端继续用于放置芯。The staff can control the movement of the conveying components through the screw module. Therefore, when the placement slot at the single defective conveying tray is full, the screw module can drive the defective conveying tray to move to the end of the defective conveying track, which is convenient for the staff to empty the full defective conveying tray. After emptying, the staff can put it back to the beginning of the conveying track and continue to place cores.
附图说明Description of drawings
图1为实施例1中的装置主体的结构示意图;Fig. 1 is the structural representation of the device main body in embodiment 1;
图2为实施例1中上壳体的内部结构示意图;2 is a schematic diagram of the internal structure of the upper housing in Embodiment 1;
图3为图2的右视结构示意图;Fig. 3 is a schematic diagram of the right view structure of Fig. 2;
图4为实施例1中的物料输送轨道的结构示意图;Fig. 4 is the structural representation of the material delivery track in embodiment 1;
图5为图4中A处的放大示意图;Fig. 5 is the enlarged schematic view of place A in Fig. 4;
图6为实施例1中的滑动组件的结构示意图;Fig. 6 is the structural representation of the sliding assembly in embodiment 1;
图7为实施例1中的挡停组件的结构示意图;Figure 7 is a schematic structural view of the stop assembly in Embodiment 1;
图8为实施例1中的物料吸盘的结构示意图;Fig. 8 is the structural representation of the material sucker in embodiment 1;
图9为实施例1中不良排出模块的结构示意图;Fig. 9 is a structural schematic diagram of a bad discharge module in embodiment 1;
图10为实施例1中回流输送带的结构示意图。FIG. 10 is a schematic structural view of the return conveyor belt in Embodiment 1.
具体实施方式Detailed ways
实施例1Example 1
结合图1-10,本实施例提供半导体芯片焊接后外观自动检测设备,包括装置主体100,装置主体100内设有物料输送轨道210和设于物料输送轨道210旁的分拣组件,物料输送轨道210处设有沿其长度方向移动配合的物料盘260,物料盘260上端面处设有多个用于放置芯片的放置槽,物料输送轨道210处沿其长度方向依次形成有上料段、用于芯片正面视觉检测的正面视觉检测段、芯片分拣段和下料段;分拣组件用于对位于芯片分拣段的芯片进行分拣,分拣组件的可分拣范围包括所述芯片分拣段,还包括设于装置主体100内的用于芯片反面视觉检测的反面视觉检测段以及用于排出不良品的不良排出段。In conjunction with Figures 1-10, this embodiment provides an automatic detection device for the appearance of semiconductor chips after soldering, including a device
本实施例中的装置主体100在使用过程中,工作人员首先将待检测的芯片放置于物料盘260处的放置槽内;物料盘260处的放置槽数量可以根据分拣组件以及物料盘260的具体配合情况进行选择和调整从而能够在装置主体100的使用过程中同时对多个芯片进行自动检测。然后工作人员便可以将放置有芯片的物料盘260放入物料输送轨道210的上料段;物料盘260沿物料输送轨道210到达正面视觉检测段进行正面识别检测;并通过电脑判断出芯片正面外观是否存在瑕疵;相比于现有技术,本实施例中的装置主体100能够同时对多个芯片进行自动识别检测,从而较佳地提高了检测效率。During the use of the device
物料盘260沿物料输送轨道210通过正面检测段后进入到芯片分拣段;物料盘260到达芯片分拣段时,分拣组件会对物料盘260上的芯片进行吸取;分拣组件会携带所吸取的芯片首先移动到反面视觉检测段对芯片进行反面识别检测并通过电脑得出芯片反面外观是否存在瑕疵。芯片反面识别检测完成后,电脑会根据芯片的正面识别结果和反面识别结果将芯片进行分类,分为合格品和不良品;分拣组件会分别将合格品和不良品放入下料段和不良排出段。The material tray 260 passes through the front detection section along the
可以理解地,本实施例中的装置主体100首先能够通过物料输送轨道210实现对于放置有多个芯片的物料盘260的自动化运输;并且通过对于芯片的正反面识别检测能够较佳地提高外观检测结果的准确性,从而有效地避免因单面检测而导致未检测面存在瑕疵未检出的情况。It can be understood that the device
具体地,如图1、图2、图4、图6所示,本实施例中装置主体100包括壳体,壳体包括上壳体110和下壳体120,所述物料输送轨道210包括多组垂直设置于上壳体110底板处且相互平行的第一竖板211和第二竖板212,还包括平行设置于第一竖板211和第二竖板212相对的两侧内壁处传动配合的传动带214和传动轮组件;第一竖板211沿物料输送方向上的两端底部设有滑动组件213,滑动组件213包括滑动导轨2131,滑动导轨2131与物料输送方向垂直布置;滑动导轨2131处设有与其滑动配合的滑块2132,滑块2132的上部通过连接板2133与第一竖板211的底端相连;第一竖板211远第二竖板212的一侧设有驱动电机215,传动轮组件包括与驱动电机215输出端相连接的驱动轮216和用于张紧和支撑传动带214的从动轮217;传动带214的上表面用于放置物料盘260并带动物料盘260沿物料输送轨道210移动。Specifically, as shown in Fig. 1, Fig. 2, Fig. 4, and Fig. 6, the device main body 100 in this embodiment includes a casing, the casing includes an upper casing 110 and a lower casing 120, and the material conveying track 210 includes multiple A set of first riser 211 and second riser 212 vertically arranged on the bottom plate of the upper casing 110 and parallel to each other, and also includes a drive fit at the opposite inner walls of the first riser 211 and second riser 212 arranged in parallel The drive belt 214 and the drive wheel assembly; the bottom of the first vertical plate 211 along the two ends of the material conveying direction is provided with a sliding assembly 213, the sliding assembly 213 includes a sliding guide rail 2131, and the sliding guide rail 2131 is arranged perpendicular to the material conveying direction; the sliding guide rail 2131 There is a sliding block 2132 which slides with it, and the upper part of the sliding block 2132 is connected with the bottom end of the first vertical plate 211 through the connecting plate 2133; the side of the first vertical plate 211 far away from the second vertical plate 212 is provided with a drive motor 215, The drive wheel assembly includes a drive wheel 216 connected to the output end of the drive motor 215 and a driven wheel 217 for tensioning and supporting the drive belt 214; the upper surface of the drive belt 214 is used to place the material tray 260 and drive the material tray 260 along the material delivery track 210 moves.
具体说明地,在本实施例中的装置主体100使用过程中,工作人员能够通过驱动电机215来带动传动带214运动;并且,第一竖板211和第二竖板212能够对位于传动带214上的物料盘260起到较佳的限位作用,从而保证了物料盘260能够沿物料输送轨道210顺利稳定地通过正面视觉检测段和芯片分拣段;进而避免了因物料盘260移动路线出错而影响到正面视觉检测和芯片分拣工作的正常进行。Specifically, during the use of the device
此外,滑块2132能够带动第一竖板211沿其滑动方向滑动,从而能够调整第一竖板211以及第二竖板212间的间距,进而实现对于物料输送轨道210的调整以适用于不同尺寸物料盘260的输送工作。In addition, the
此外,如图1所示,上壳体110的两侧侧壁处设有进料口和出料口,上料段和下料段分别位于进料口和出料口处;下壳体120处沿物料盘260输送方向上的两侧外壁之间形成有贯通的回流通道,回流通道处设有用于输送空置物料盘260的回流输送带130,回流输送带130的输送方向与物料输送轨道210输送方向相反。In addition, as shown in FIG. 1 , the sidewalls on both sides of the
可以理解地,通过进料口、出料口以及回流输送带130能够使得物料盘260的使用形成循环,工作人员将载有待检测芯片的物料盘260从进料口放入上料段,然后已经检测分拣完成后的空置物料盘260经下料段到达出料口;此时,工作人员便可以通过回流输送带130将空置物料盘260运输到进料口处再用于待检测芯片的装载,从而实现了物料盘260的循环使用,进而能够通过少量的物料盘260循环使用即可满足芯片的装载需求。It can be understood that the use of the
前述物料输送轨道210处沿传动带214传动方向间隔设有用于挡停和放行物料盘260的第一挡停组件和第二挡停组件;第一挡停组件设于正面视觉检测段,第二挡停组件设于芯片分拣段;正面视觉检测段的上侧设有上相机模块220,上相机模块220的拍摄范围内覆盖有第一挡停组件将物料盘260挡停时物料盘260所处位置。The aforementioned
通过第一挡停组件能够确保物料盘260在沿物料输送轨道210经过正面视觉检测段时,物料盘260能够先停止一段时间再放行通过,从而保证了位于正面视觉检测段上侧的上相机模块220能够有充足的时间对物料盘260进行拍摄和扫描;进而确保了正面视觉检测的结果准确性,以有效避免出现不良品遗漏的情况。第二挡停组件能够确保在分拣组件工作时,物料盘260能够保持停止直至分拣组件对检测完成的芯片分拣完成后再放行通过;从而确保了分拣组件的顺利稳定工作。The first stop component can ensure that when the
如图5和图7,第一挡停组件和第二挡停组件均包括挡停模块218,挡停模块218包括通过安装块2183设于第二竖板212近第一竖板211一侧内壁处的光电感应器2181和伺服气缸2182;光电感应器2181用于对位于其上侧的传动轨道进行感应,伺服气缸2182的活塞杆运动与物料盘260沿物料输送轨道210运动发生干涉。As shown in Fig. 5 and Fig. 7, both the first stopper assembly and the second stopper assembly include a
当光电感应器2181感应到其上侧有物料盘260通过时,其发出信号传递至伺服气缸2182,伺服气缸2182的活塞杆伸出将物料盘260挡停,从而配合上相机模块220和分拣组件进行工作,具有较佳地实用性。When the
如图2所示,分拣组件包括绕竖直方向转动的机械手230,还包括沿高度方向运动的物料吸盘240;物料吸盘240设置于机械手230的移动端用于吸取和放下芯片,机械手230活动时物料吸盘240接触范围为分拣组件的分拣范围。As shown in Figure 2, the sorting assembly includes a
通过机械手230带动物料吸盘240能够较佳地对芯片进行吸取和分拣,具体说明地,在使用时,机械手230首先带动物料吸盘240对芯片分拣段处的芯片进行吸取,吸取后,机械手230带动物料吸盘240移动至反面检测段进行反面检测;检测完成后机械手230首先带动物料吸盘240移动到不良排出段,根据电脑得出的分类结果将分类为不良品的芯片在不良排出段放下;然后再移动回芯片分拣段,将分类为合格品的芯片放回芯片分拣段处的物料盘260处;然后芯片分拣段处的第二挡停组件进行放行,载有合格品的物料盘260沿物料输送轨道210移动到下料输送轨道完成下料。The
如图2和图8所示,前述物料吸盘240包括滑台气缸241、安装板243和真空吸盘245,滑台气缸241的上部与机械手230的移动端相连接;滑台气缸241的滑轨253沿高度方向布置,滑台242设于滑轨253处与滑轨253滑动配合;安装板243水平设置于滑台242的下端,安装板243包括与滑台242下端贴合的贴合部和伸出滑台242下端的伸出部;安装板243的伸出部处沿物料输送方向均匀布置有多个吸盘安装孔244,吸盘安装孔244处安装有用于吸取芯片的真空吸盘245;吸盘安装孔244以及真空吸盘245的布置数量与物料盘260处长度方向上单行布置的放置槽数量相对应。As shown in Fig. 2 and Fig. 8,
具体说明地,滑台气缸241能够较佳地实现真空吸盘245的上下移动,从而确保了真空吸盘245能够较佳地在跟随机械手230以及滑台移动的同时对芯片进行吸取和放下。此外,真空吸盘245的布置数量与物料盘260处的放置槽相对应,从而能够保证物料吸盘240能够依次吸取物料盘260处各行的芯片,进而提高了分拣效率。Specifically, the sliding
本实施例中,下壳体120内设有下相机模块310,下相机模块310位于反面视觉检测段的下侧;当分拣组件将芯片吸取后移动至反面视觉检测段时,分拣组件所吸取的芯片反面均处于所述下相机模块310的拍摄范围内。In this embodiment, the
可以理解地,通过下相机模块310能够对于芯片的反面进行扫描和拍摄并将数据传输至电脑,电脑能够通过芯片的反面拍摄扫描数据配合此前得出的正面检测结果对芯片进行分类处理。Understandably, the
如图9所示,前述不良排出段处设有不良排出模块250,不良排出模块250包括不良品输送轨道,不良品输送轨道处设有与其滑动配合的输送组件,输送组件处设有多个用于放置不良品的放置槽。不良品输送轨道包括移动平台259和设于移动平台259下侧且与移动平台259布置方向相同的丝杆模组;丝杆模组包括伺服电机251和联轴器252,还包括通过联轴器252与伺服电机251输出端相连接的滚珠丝杆254;滚珠丝杆254的两侧设有沿不良品输送轨道布置的滑轨253,滚珠丝杆254处设有与滑轨253滑动配合的移动座255,移动座255的上部通过连接块256连接有输送组件;输送组件包括与连接块256相连接且与移动平台259滑动配合的滑动板257,以及设于滑动板257上表面处的多个不良品输送盘258。As shown in Figure 9, a
具体地,工作人员可以通过丝杆模组控制输送组件的移动。从而使得单个不良品输送盘258处的放置槽放满时,丝杆模组能够带动该不良品输送盘258移动到不良品输送轨道的末端,便于工作人员将放满的不良品输送盘258进行清空。清空后工作人员便可以将其放回输送轨道的始端继续用于放置芯。Specifically, the staff can control the movement of the conveying component through the screw module. Thereby make when the placement slot at single defective
为进一步了解本发明的内容,结合附图和实施例对本发明作详细描述。应当理解的是,实施例仅仅是对本发明进行解释而并非限定。In order to further understand the content of the present invention, the present invention will be described in detail in conjunction with the accompanying drawings and embodiments. It should be understood that the examples are only for explaining the present invention and not for limiting it.
容易理解的是,本领域技术人员在本申请提供的一个或几个实施例的基础上,可以对本申请的实施例进行结合、拆分、重组等得到其他实施例,这些实施例均没有超出本申请的保护范围。It is easy to understand that, on the basis of one or several embodiments provided by this application, those skilled in the art can combine, split, recombine, etc., the embodiments of this application to obtain other embodiments, and these embodiments do not exceed the scope of this application. The scope of protection applied for.
以上示意性的对本发明及其实施方式进行了描述,该描述没有限制性,附图中所示的也只是本发明的实施方式之一,实际的结构并不局限于此。所以,如果本领域的普通技术人员受其启示,在不脱离本发明创造宗旨的情况下,不经创造性的设计出与该技术方案相似的结构方式及实施例,均应属于本发明的保护范围。The above schematically describes the present invention and its implementation, which is not restrictive, and what is shown in the drawings is only one of the implementations of the present invention, and the actual structure is not limited thereto. Therefore, if a person of ordinary skill in the art is inspired by it, without departing from the inventive concept of the present invention, without creatively designing a structural mode and embodiment similar to the technical solution, it shall all belong to the protection scope of the present invention .
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Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
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CN116441193A (en) * | 2023-05-15 | 2023-07-18 | 宁波九纵智能科技有限公司 | A new type of electroplating chip appearance defect detection equipment and detection method |
CN118604002A (en) * | 2024-06-20 | 2024-09-06 | 扬州泽旭电子科技有限责任公司 | Semiconductor chip welding appearance automatic detection device and detection method |
CN119951762A (en) * | 2025-04-10 | 2025-05-09 | 四川并济智算科技有限公司 | Automatic feeding and discharging device for finished integrated circuit board detection |
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2022
- 2022-11-18 CN CN202211446220.8A patent/CN116106221A/en active Pending
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN116441193A (en) * | 2023-05-15 | 2023-07-18 | 宁波九纵智能科技有限公司 | A new type of electroplating chip appearance defect detection equipment and detection method |
CN118604002A (en) * | 2024-06-20 | 2024-09-06 | 扬州泽旭电子科技有限责任公司 | Semiconductor chip welding appearance automatic detection device and detection method |
CN119951762A (en) * | 2025-04-10 | 2025-05-09 | 四川并济智算科技有限公司 | Automatic feeding and discharging device for finished integrated circuit board detection |
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