CN116105627A - Measurement method and measurement system - Google Patents

Measurement method and measurement system Download PDF

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Publication number
CN116105627A
CN116105627A CN202111322085.1A CN202111322085A CN116105627A CN 116105627 A CN116105627 A CN 116105627A CN 202111322085 A CN202111322085 A CN 202111322085A CN 116105627 A CN116105627 A CN 116105627A
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identification
light patterns
patterns
light
template
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Chinese (zh)
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张小龙
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Huawei Technologies Co Ltd
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Huawei Technologies Co Ltd
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G01B11/25—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object
    • G01B11/254—Projection of a pattern, viewing through a pattern, e.g. moiré

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  • Engineering & Computer Science (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Length Measuring Devices By Optical Means (AREA)

Abstract

The embodiment of the invention discloses a measuring method and a measuring system, which are used for improving the accuracy of distinguishing a structured light pattern so as to improve the accuracy of measuring three-dimensional information of an object to be measured. The method comprises the following steps: the method comprises the steps that a measuring device obtains a measuring image, wherein the measuring image is formed by shooting an object to be measured, the measuring image comprises N structured light patterns and M identification light patterns, M is a positive integer greater than or equal to 1, and N is a positive integer greater than or equal to 2; the measuring device identifies the N structured light patterns and the M identification light patterns in the measured image; the measuring device distinguishes each of the N structured light patterns according to the M identification light patterns; the measuring device acquires three-dimensional information of the object to be measured according to the distinguished N structured light patterns.

Description

Measurement method and measurement system
Technical Field
The present disclosure relates to the field of optical imaging technologies, and in particular, to a measurement method and a measurement system.
Background
Based on the three-dimensional information of the object to be detected, the three-dimensional reconstruction of the object to be detected can be realized. In order to measure three-dimensional information of an object to be measured, the surface of the object to be measured can be irradiated with multi-line structured light, and a camera shoots the object to be measured to obtain a measurement image by a measuring device. The measuring device can compare the multi-line structured light contained in the measuring image with the multi-line structured light in the template stored in the measuring device, and the aim of measuring the three-dimensional information of the object to be measured is fulfilled by comparing the change of the multi-line structured light in the measuring image relative to the multi-line structured light in the template.
If the shapes of the multi-line structured light in the measurement image are identical to each other, the measurement device cannot accurately distinguish the multi-line structured light in the measurement image, and thus cannot compare the multi-line structured light with the multi-line structured light in the template. Therefore, the measuring device needs to number the multi-line structured light in the measured image in sequence, and then compares the numbered multi-line structured light with the multi-line structured light in the template.
However, if the line structure light is lost due to shielding of the obstacle or the line structure light is misplaced, the loss of the structure light or the misplacement of the structure light in the measurement image is caused, and the error of the measuring device on the multi-line structure light number is caused, so that the error occurs during the comparison, and the accuracy of measuring the three-dimensional information of the object to be measured is reduced.
Disclosure of Invention
The embodiment of the invention provides a measuring method and a measuring system, which are used for improving the accuracy of distinguishing a structured light pattern so as to improve the accuracy of measuring three-dimensional information of an object to be measured.
An embodiment of the present invention provides a measurement method, where the method includes: the method comprises the steps that a measuring device obtains a measuring image, wherein the measuring image is formed by shooting an object to be measured, the measuring image comprises N structured light patterns and M identification light patterns, M is a positive integer greater than or equal to 1, and N is a positive integer greater than or equal to 2; the measuring device identifies the N structured light patterns and the M identification light patterns in the measured image; the measuring device distinguishes each of the N structured light patterns according to the M identification light patterns; the measuring device acquires three-dimensional information of the object to be measured according to the distinguished N structured light patterns.
Based on the identification light patterns, the measuring device can accurately determine the corresponding relation between each structure light pattern and the template light pattern, so that the accuracy of measuring the three-dimensional information of the object to be measured is improved, and the efficiency of measuring the three-dimensional information is improved. And even if the structure light pattern is lost or misplaced, the measuring device can ensure that the structure light pattern is accurately compared with the corresponding template light pattern to change so as to realize the measurement of the three-dimensional information and ensure the robustness of measuring the three-dimensional information.
Based on the first aspect, in an optional implementation manner, before the measuring device acquires the measurement image, the method further includes: the projection device emits structural light to the object to be detected so as to radiate the N structural light patterns on the surface of the object to be detected; the projection device emits identification light to the object to be detected so as to radiate the M identification light patterns on the surface of the object to be detected; the image acquisition device shoots the object to be measured to acquire the measurement image; the image acquisition device sends the measurement image to the measurement device.
The image acquisition device can shoot the object to be detected to acquire measurement images comprising N structural light patterns and M identification light patterns, so that the measurement device can measure three-dimensional information of the object to be detected based on the measurement images from the image acquisition device.
Based on the first aspect, in an optional implementation manner, the emitting, by the projection device, the identification light to the object to be measured includes: the projection device determines the light intensities of the M marking light patterns irradiated on the surface of the object to be measured according to the corresponding state of the object to be measured.
Therefore, the projection device can dynamically adjust the light intensities of M marking light patterns irradiated on the surface of the object to be measured according to the corresponding state of the object to be measured, so that the marking light patterns included in the measured image are clear in imaging, the accuracy of determining the corresponding marking light patterns and template light patterns based on the marking light patterns is ensured, and the accuracy of measuring three-dimensional information is ensured.
Based on the first aspect, in an optional implementation manner, one target identification light pattern of the M identification light patterns and one target structure light pattern of the N structure light patterns satisfy one condition as follows: the target identification light pattern is connected with the target structure light pattern; the target identification light pattern is partially overlapped with the target structure light pattern; or the distance between the target identification light pattern and the target structure light pattern is smaller than or equal to a preset value.
It can be seen that, based on the conditions satisfied by the target structured light pattern and the target identification light pattern, it can be ensured that the measuring device accurately ensures that the target identification light pattern can distinguish the target structured light pattern among the N structured light patterns.
Based on the first aspect, in an optional implementation manner, the M identification light patterns correspond to N template light patterns, and the obtaining, by the measurement device, three-dimensional information of the object to be measured according to the N distinguished structured light patterns includes: the measuring device obtains the N template light patterns corresponding to the N structure light patterns according to the M identification light patterns; and the measuring device acquires the three-dimensional information of the object to be measured according to the change of the N structured light patterns relative to the N template light patterns.
Based on the identification light pattern, the measuring device can accurately determine the corresponding relation between each structure light pattern and the template light pattern, and compare the change of the structure light pattern and the template light pattern corresponding to the structure light pattern, so as to realize measurement of three-dimensional information, improve the accuracy of measuring the three-dimensional information of the object to be measured, and improve the efficiency of measuring the three-dimensional information. And even if the structure light pattern is lost or misplaced, the measuring device can ensure that the structure light pattern is accurately compared with the corresponding template light pattern to change so as to realize the measurement of the three-dimensional information and ensure the robustness of measuring the three-dimensional information.
Based on the first aspect, in an optional implementation manner, the obtaining, by the measurement device, the N template light patterns corresponding to the N structured light patterns according to the M identification light patterns includes: the measuring device acquires an identification list, wherein the identification list comprises the corresponding relation between the identification light patterns and the identification serial numbers, the identification list also comprises the corresponding relation between the identification serial numbers and the template light patterns, and different identification serial numbers correspond to different template light patterns; the measuring device acquires N identification serial numbers corresponding to the M identification light patterns according to the identification list; and the measuring device acquires N template light patterns corresponding to the N identification serial numbers according to the identification list.
Therefore, the measuring device can determine the identification serial numbers corresponding to the identification light patterns, and accurately acquire the template light patterns corresponding to the structure light patterns according to the template light patterns corresponding to the identification serial numbers, so that the accuracy of measuring the three-dimensional information is improved.
Based on the first aspect, in an optional implementation manner, the obtaining, by the measurement device, the N template light patterns corresponding to the N structured light patterns according to the M identification light patterns includes: the measuring device acquires M template identification light patterns corresponding to the M identification light patterns, wherein the M template identification light patterns are used for distinguishing each template light pattern in the N template light patterns, and each identification light pattern in the M identification light patterns is at least partially identical with the corresponding template identification light pattern; the measuring device acquires N template light patterns corresponding to the M template identification light patterns.
Therefore, the measuring device can determine the template identification light patterns corresponding to the identification light patterns, and accurately acquire the template light patterns corresponding to the structure light patterns according to the template light patterns corresponding to the template identification light patterns, so that the accuracy of measuring the three-dimensional information is improved.
Based on the first aspect, in an optional implementation manner, the M is equal to the N, each of the M identification light patterns corresponds to one identification information, different identification light patterns correspond to different identification information, and the identification information is an identification serial number or a template identification light pattern.
Therefore, under the condition that M is equal to N, the measuring device can accurately acquire the template light patterns corresponding to the structure light patterns according to the one-to-one correspondence between the identification light patterns and the structure light patterns, and the accuracy of measuring the three-dimensional information is improved.
Based on the first aspect, in an optional implementation manner, the M is greater than the N, at least two of the M identification light patterns jointly correspond to one identification information, and the identification information is an identification serial number or a template identification light pattern.
Therefore, under the condition that M is larger than N, two or more than two identification light patterns jointly correspond to one piece of identification information, so that the success rate of distinguishing the structural light patterns by the identification light patterns is effectively ensured, and the situation that the structural light patterns cannot be distinguished due to the loss of the identification light patterns is avoided.
Based on the first aspect, in an optional implementation manner, the M is smaller than the N, and the M identification light patterns include a first identification light pattern and a second identification light pattern that are adjacent in position; the first identification light pattern corresponds to first identification information; the second identification light pattern corresponds to second identification information; and in the N pieces of identification information which are arranged in sequence, third identification information is further included between the first identification information and the second identification information, the first identification light pattern and the second identification light pattern correspond to the third identification information together, and the identification information is an identification serial number or a template identification light pattern.
Therefore, under the condition that M is smaller than N, the measuring device can identify N structural light patterns according to the M identification light patterns, and under the condition that the number of the identification light patterns is reduced, the N structural light patterns can be accurately distinguished, and the light power of the identification light emitted by the projection equipment is reduced.
Based on the first aspect, in an optional implementation manner, the obtaining, by the measurement device, the N template light patterns corresponding to the N structured light patterns according to the M identification light patterns includes: the measuring device identifies patterns corresponding to the M marking light patterns in the measuring image, wherein the patterns of the marking light patterns corresponding to different structured light patterns are different; and the measuring device determines the N template light patterns corresponding to the N structured light patterns according to the patterns respectively corresponding to the M identification light patterns.
Therefore, the measuring device can realize the purpose of determining the corresponding relation between the N structural light patterns and the N template light patterns based on the M identification light patterns, and the accuracy of measuring the three-dimensional information is improved.
Based on the first aspect, in an optional implementation manner, the obtaining, by the measurement device, the N template light patterns corresponding to the N structured light patterns according to the M identification light patterns includes: the measuring device identifies coding information carried by the M marking light patterns in the measuring image, wherein the coding information carried by the marking light patterns corresponding to different structured light patterns is different; and the measuring device determines the N template light patterns corresponding to the N structured light patterns according to the coding information carried by the M identification light patterns respectively.
Therefore, the measuring device can realize the purpose of determining the corresponding relation between the N structured light patterns and the N template light patterns based on the M identification light patterns based on the coding information carried by the M identification light patterns, and the accuracy of measuring the three-dimensional information is improved.
Based on the first aspect, in an optional implementation manner, the coding information includes a plurality of coding values, the identification light pattern has a plurality of sub-patterns, and at least one of brightness or color of each of the plurality of sub-patterns corresponds to the coding values.
Based on the first aspect, in an optional implementation manner, the identifying, by the measurement device, the N structured light patterns and the M identification light patterns in the measurement image includes: the measuring device identifies M pieces of characteristic information corresponding to the M identification light patterns in the measured image, wherein the characteristic information of the identification light patterns corresponding to different structured light patterns is different; the measuring device obtaining the N template light patterns corresponding to the N structured light patterns according to the M identification light patterns includes: the measuring device determines the N template light patterns corresponding to the N structured light patterns according to the characteristic information respectively corresponding to the M identification light patterns based on artificial intelligence AI.
Therefore, the measuring device can realize the purpose of determining the corresponding relation between the N structural light patterns and the N template light patterns based on the M identification light patterns based on the M characteristic information corresponding to the M identification light patterns, and the accuracy of measuring the three-dimensional information is improved.
Based on the first aspect, in an optional implementation manner, the obtaining, by the measurement device, three-dimensional information of the object to be measured according to the distinguished N structured light patterns includes: the measuring device acquires a to-be-measured identification light pattern, wherein the to-be-measured identification light pattern is positioned between a first identification light pattern and a second identification light pattern, the first identification light pattern, the to-be-measured identification light pattern and the second identification light pattern are used for sequentially distinguishing three adjacent structural light patterns in the N structural light patterns; the measuring device acquires first identification information, wherein the first identification information is the identification information corresponding to the identification light pattern to be measured; the measuring device acquires second identification information, wherein the second identification information is positioned between the identification information corresponding to the first identification light pattern and the identification information corresponding to the second identification light pattern in N pieces of identification information which are arranged in sequence, and the identification information is an identification serial number or a template identification light pattern; when the first identification information and the second identification information are at least partially identical, the measuring device acquires three-dimensional information of the object to be measured according to the distinguished N structured light patterns.
Therefore, the measuring device can determine whether the corresponding relation between the determined N structured light patterns and the N template light patterns is accurate based on the first identification information and the second identification information, and the three-dimensional information can be measured only when the measuring device determines that the corresponding relation between the N structured light patterns and the N template light patterns is accurate, so that the accuracy of measuring the three-dimensional information is improved.
A second aspect of an embodiment of the present invention provides a measurement system, the measurement system including a measurement device for: acquiring a measurement image, wherein the measurement image is formed by shooting an object to be measured, the measurement image comprises N structured light patterns and M identification light patterns, M is a positive integer greater than or equal to 1, and N is a positive integer greater than or equal to 2; identifying the N structured light patterns and the M identification light patterns in the measurement image; distinguishing each of the N structured light patterns according to the M identification light patterns; and acquiring three-dimensional information of the object to be detected according to the distinguished N structured light patterns.
The measurement system shown in the present aspect is configured to execute the measurement method shown in any one of the first aspect, and description of beneficial effects is shown in the first aspect, which is not repeated.
Based on the second aspect, in an optional implementation manner, the measurement system further includes a projection device and an image acquisition device, where the projection device is configured to emit structural light to the object to be measured, so as to radiate the N structural light patterns on the surface of the object to be measured; emitting identification light to the object to be detected so as to radiate the M identification light patterns on the surface of the object to be detected; the image acquisition device is used for shooting the object to be measured to acquire the measurement image, and sending the measurement image to the measurement device.
Based on the second aspect, in an optional implementation manner, the projection device is further configured to determine light intensities of the M identification light patterns irradiated on the surface of the object to be measured according to a state corresponding to the object to be measured.
Based on the second aspect, in an optional implementation manner, one target identification light pattern of the M identification light patterns and one target structure light pattern of the N structure light patterns satisfy one condition as follows:
the target identification light pattern is connected with the target structure light pattern; the target identification light pattern is partially overlapped with the target structure light pattern; or the distance between the target identification light pattern and the target structure light pattern is smaller than or equal to a preset value.
Based on the second aspect, in an optional implementation manner, the M identification light patterns correspond to N template light patterns, and the measurement device is further configured to obtain, according to the M identification light patterns, the N template light patterns corresponding to the N structured light patterns; and acquiring three-dimensional information of the object to be detected according to the change of the N structured light patterns relative to the N template light patterns.
Based on the second aspect, in an optional implementation manner, the measuring device is further configured to obtain an identification list, where the identification list includes a correspondence between the identification light pattern and an identification serial number, the identification list further includes a correspondence between the identification serial number and the template light pattern, and different identification serial numbers correspond to different template light patterns; according to the identification list, N identification serial numbers corresponding to the M identification light patterns are obtained; and acquiring N template light patterns corresponding to the N identification serial numbers according to the identification list.
Based on the second aspect, in an optional implementation manner, the measuring device is further configured to obtain M template identification light patterns corresponding to the M identification light patterns, where the M template identification light patterns are used to distinguish each template light pattern of the N template light patterns, and each of the M identification light patterns is at least partially identical to the corresponding template identification light pattern; and acquiring N template light patterns corresponding to the M template identification light patterns.
Based on the second aspect, in an optional implementation manner, the M is equal to the N, each of the M identification light patterns corresponds to one identification information, different identification light patterns correspond to different identification information, and the identification information is an identification serial number or a template identification light pattern.
Based on the second aspect, in an optional implementation manner, the M is greater than the N, at least two of the M identification light patterns jointly correspond to one identification information, and the identification information is an identification serial number or a template identification light pattern.
Based on the second aspect, in an optional implementation manner, the M is smaller than the N, and the M identification light patterns include a first identification light pattern and a second identification light pattern that are adjacent in position; the first identification light pattern corresponds to first identification information; the second identification light pattern corresponds to second identification information; and in the N pieces of identification information which are arranged in sequence, third identification information is further included between the first identification information and the second identification information, the first identification light pattern and the second identification light pattern correspond to the third identification information together, and the identification information is an identification serial number or a template identification light pattern.
Based on the second aspect, in an optional implementation manner, the measuring device is further configured to identify patterns corresponding to the M identification light patterns in the measurement image, where the patterns of the identification light patterns corresponding to different structured light patterns are different; the measuring device is further used for determining the N template light patterns corresponding to the N structured light patterns according to the patterns respectively corresponding to the M identification light patterns.
Based on the second aspect, in an optional implementation manner, the measuring device is further configured to identify, in the measurement image, coding information carried by the M identification light patterns, where coding information carried by the identification light patterns corresponding to different structured light patterns are different; and determining the N template light patterns corresponding to the N structured light patterns according to the coding information carried by the M identification light patterns respectively.
Based on the second aspect, in an optional implementation manner, the coding information includes a plurality of coding values, the identification light pattern has a plurality of sub-patterns, and at least one of brightness or color of each of the plurality of sub-patterns corresponds to the coding values.
Based on the second aspect, in an optional implementation manner, the measuring device is further configured to identify M pieces of characteristic information corresponding to the M identification light patterns in the measurement image, where the characteristic information of the identification light patterns corresponding to different structured light patterns is different; based on artificial intelligence AI, according to the characteristic information corresponding to the M identification light patterns, determining N template light patterns corresponding to the N structured light patterns.
Based on the second aspect, in an optional implementation manner, the measuring device is further configured to obtain a to-be-measured identification light pattern, where the to-be-measured identification light pattern is located between a first identification light pattern and a second identification light pattern, where the first identification light pattern, the to-be-measured identification light pattern, and the second identification light pattern are used to sequentially distinguish three adjacent structural light patterns from each other in the N structural light patterns; acquiring first identification information, wherein the first identification information is the identification information corresponding to the identification light pattern to be detected; acquiring second identification information, wherein the second identification information is positioned between the identification information corresponding to the first identification light pattern and the identification information corresponding to the second identification light pattern in N pieces of identification information which are arranged in sequence, and the identification information is an identification serial number or a template identification light pattern; and when the first identification information and the second identification information are at least partially identical, acquiring the three-dimensional information of the object to be detected according to the distinguished N structured light patterns.
Drawings
FIG. 1 is a diagram showing an example of the structure of an embodiment of a measuring system provided in the present application;
FIG. 2 is a flowchart showing steps of a first embodiment of a measurement method provided in the present application;
FIG. 3 is a diagram of a first exemplary scenario provided herein;
FIG. 4a is a diagram showing a first exemplary configuration of the identification light pattern provided herein;
FIG. 4b is a diagram showing a second exemplary configuration of the identification light pattern provided herein;
FIG. 4c is a diagram of a third exemplary configuration of the identification light pattern provided herein;
FIG. 5 is a diagram of a second exemplary scenario provided herein;
FIG. 6 is a flowchart showing steps of a second embodiment of the measuring method provided in the present application;
FIG. 7a is a diagram of a fourth exemplary configuration of the identification light pattern provided herein;
FIG. 7b is a diagram of a fourth exemplary configuration of the identification light pattern provided herein;
FIG. 8 is a flowchart illustrating steps of a third embodiment of a measurement method provided in the present application;
FIG. 9 is a flowchart illustrating steps of a fourth embodiment of a measurement method provided herein;
FIG. 10 is a third exemplary diagram of a scenario provided herein;
FIG. 11 is a flowchart illustrating steps of a fifth embodiment of a measurement method provided herein;
FIG. 12 is a fourth exemplary diagram of a scenario provided herein;
fig. 13 is a flowchart illustrating steps of a sixth embodiment of the measurement method provided in the present application.
Detailed Description
The following description of the embodiments of the present invention will be made clearly and completely with reference to the accompanying drawings, in which it is apparent that the embodiments described are only some embodiments of the present invention, but not all embodiments. All other embodiments, which can be made by those skilled in the art based on the embodiments of the invention without making any inventive effort, are intended to fall within the scope of the invention.
For a better understanding of the method shown in this embodiment, the structure of the measurement system provided in this application will be described first with reference to fig. 1. FIG. 1 is a schematic diagram of an embodiment of a measurement system according to the present application.
The measurement system shown in the present embodiment includes a projection device 101, an image acquisition device 102, and a measurement device 103. The present embodiment does not limit the number of physical devices included in the measurement system. For example, the projection device 101, the image acquisition device 102 and the measurement device 103 shown in this embodiment may be enclosed in the same product housing, and the measurement system may be in the form of a separate physical device. As another example, the projection device 101 may be enclosed in one product housing to form a structured light transmitting apparatus, while the image acquisition device 102 and the measurement device 103 may be enclosed in the same product housing to form a structured light receiving apparatus, then the measurement system exists in the form of two separate physical devices. As another example, the projection device 101 and the measurement device 103 may be enclosed in the same product housing, while the image acquisition device 102 is enclosed in another product housing, and then the measurement system exists as two separate physical devices.
The projection apparatus 101 shown in this embodiment specifically includes a light source and an imaging module. The light source is capable of transmitting a laser beam to the imaging module. The specific type of the light source is not limited in this embodiment, and for example, the light source may be a laser, a semiconductor Light Emitting Diode (LED), a Laser Diode (LD), or the like. The imaging module shown in this embodiment is located on the optical path of the laser beam emitted by the light source, so as to ensure that the imaging module can successfully receive the laser beam from the light source. The imaging module is capable of converting the laser beam into structured light to exit the structured light toward the object 104 to be measured. For example, the imaging module may be a grating, on which a plurality of light-transmitting areas are preset, and the laser beam can emit a plurality of structured light patterns to the surface of the object to be measured through the plurality of light-transmitting areas. As another example, the imaging module may be an optical deflector, which is a device capable of changing the transmission direction of the laser beam in space according to a certain rule. The optical deflector can be a galvanometer, a turning mirror, an acousto-optic deflector, or the like.
The structured light emitted from the projection device 101 can be irradiated on the surface of the object 104 to be measured to irradiate a specific structured light pattern on the surface of the object 104 to be measured. The specific type of the structured light pattern in this embodiment is not limited, and for example, the structured light pattern may be any shape such as a linear light pattern or a planar light pattern, and the structured light pattern is exemplified as a linear light pattern in this application.
The image acquisition device 102 captures the object 104 to be measured to obtain a measurement image including each structured light pattern imaged on the surface of the object 104 to be measured. The type of the image capturing device 102 is not limited in this embodiment, as long as the image capturing device 102 can capture the object 104 to be measured by using the optical imaging principle to obtain a measurement image, for example, the image capturing device 102 may be any device with image capturing capability, such as a charge coupled device image sensor or a complementary metal oxide semiconductor image sensor. The laser beam shown in this embodiment may be a visible light beam or an infrared light beam, and the specific beam type is not limited, as long as the image acquisition device 102 can successfully capture the structured light pattern of the laser beam imaged on the surface of the object to be measured.
The measurement device 103 obtains the measurement image from the image acquisition device 102, and the measurement device 103 can calculate three-dimensional information of the object 104 to be measured according to the measurement image, and realize three-dimensional reconstruction of the object 104 to be measured based on the three-dimensional information, namely, real-time three-dimensional reconstruction of the object 104 to be measured in the real three-dimensional world. The three-dimensional reconstruction based on the object 104 to be measured can be applied to aspects of automatic driving, virtual reality, visual navigation, video entertainment and the like. For example, the real-time detection, recognition, defect detection, intelligent grabbing and other engineering implementation aspects of the object 104 to be detected can be realized based on the three-dimensional reconstruction of the object 104 to be detected. For another example, if the object 104 to be detected is a human body, face recognition can be realized based on three-dimensional reconstruction of the object 104 to be detected, and various interactions of the human and the machine can be realized aiming at different actions of the detected human body. For another example, if the object 104 to be measured is a road condition in front of the vehicle, visual navigation, intelligent driving, etc. can be implemented based on the three-dimensional reconstruction of the object 104 to be measured, which is not particularly limited.
The type of the measuring device 103 is not limited in this embodiment, and the measuring device 103 may be one or more chips, or one or more integrated circuits, for example. For example, the measurement device 103 may be one or more field-programmable gate arrays (FPGAs), application specific integrated chips (application specific integrated circuit, ASICs), system on chips (socs), central processing units (central processor unit, CPUs), network processors (network processor, NPs), digital signal processing circuits (digital signal processor, DSPs), microcontrollers (micro controller unit, MCUs), programmable controllers (programmable logic device, PLDs) or other integrated chips, or any combination of the above chips or processors, etc.
Based on the above general description of the measurement system, the following describes the specific procedure of the measurement system to perform the measurement method:
example 1
The implementation of the measurement method is described in conjunction with fig. 2, where fig. 2 is a flowchart illustrating steps of a first embodiment of the measurement method provided in the present application.
In step 201, the projection device emits structured light to the object to be measured, so as to radiate N structured light patterns on the surface of the object to be measured.
The imaging module included in the projection device in this embodiment emits the structured light to the object to be measured, and for specific explanation of the imaging module, please refer to the explanation shown in fig. 1, details are not repeated. The imaging module emits structured light, and N structured light patterns can be irradiated on the surface of the object to be detected. Wherein N is any positive integer with the value of more than or equal to 2.
Such as shown in fig. 3, where fig. 3 is a first exemplary view of a scenario provided in the present application. The present example images 8 structured light patterns, namely, structured light pattern a1, structured light pattern a2 to structured light pattern a8 shown in fig. 3, on the surface of the object to be measured with the structured light emitted by the projection device. The present embodiment exemplifies that the structural light pattern is a linear structural light pattern, and in other examples, each structural light pattern may be a surface-shaped structural light pattern or any other shape.
Step 202, the projection device emits identification light to the object to be measured so as to radiate M identification light patterns on the surface of the object to be measured.
Specifically, the imaging module included in the projection device emits the identification light to the object to be measured, and the identification light can irradiate M identification light patterns on the surface of the object to be measured. Wherein M is any positive integer with the value of more than or equal to 1.
The M identification light patterns shown in the present embodiment can distinguish each of the N structured light patterns. Referring also to fig. 3, the identification light emitted by the projection device can image 8 identification light patterns on the surface of the object to be measured, and this example is exemplified by the number of identification light patterns being equal to the number of structured light patterns (i.e., m=n). It will be appreciated that one identification light pattern is used to distinguish one structured light pattern and that different identification light patterns are used to distinguish different structured light patterns. In other examples, multiple different structured light patterns (i.e., M < N) may also be distinguished by one identification light pattern, or one structured light pattern (i.e., M > N) may also be distinguished by multiple identification light patterns.
As shown in fig. 3, the identification light pattern 301 is used to distinguish the structured light pattern a1, the identification light pattern 302 is used to distinguish the structured light pattern a2, the identification light pattern 303 is used to distinguish the structured light pattern a3, the identification light pattern 304 is used to distinguish the structured light pattern a4, the identification light pattern 305 is used to distinguish the structured light pattern a5, the identification light pattern 306 is used to distinguish the structured light pattern a6, the identification light pattern 307 is used to distinguish the structured light pattern a7, and the identification light pattern 308 is used to distinguish the structured light pattern a8.
The positional relationship between the target marker light pattern and the target structured light pattern on the surface of the object to be measured will be described below by taking the target marker light pattern and the target structured light pattern as examples. The target identification light pattern is any identification light pattern imaged on the surface of the object to be detected, and the target structure light pattern is the structure light pattern distinguished by the target identification light pattern. Specifically, taking the target identification light pattern as the identification light pattern 301 as an example, the target structure light pattern is the structure light pattern 301.
In the case where the identification light pattern 301 is used to distinguish the structured light pattern a1, the identification light pattern 301 is in a connected relationship with the structured light pattern a 1. It will be appreciated that two different identification light patterns are connected to two different structured light patterns, respectively, to ensure that the different identification light patterns are used to distinguish between the different structured light patterns, e.g. the identification light pattern 301 is connected to the structured light pattern a1, the identification light pattern 302 is connected to the structured light pattern a2, and so on.
The specific position where the identification light pattern 301 is connected to the structured light pattern a1 is not limited in this example, for example, the identification light pattern 301 may be connected to any end of the structured light pattern a1, and the example shown in fig. 3 takes as an example that the identification light pattern 301 is connected to the starting end of the structured light pattern a 1. In other examples, the identification light pattern 301 may also be connected at a middle position or at a tail end of the structured light pattern a 1.
The present example illustrates an example where the target identification light pattern is connected to the target structure light pattern, and in other examples, the target identification light pattern may also partially coincide with the target structure light pattern. It will be appreciated that different target identification light patterns partially overlap with different structured light patterns to ensure that different identification light patterns are able to distinguish between different structured light patterns, e.g. identification light pattern 301 partially overlaps with structured light pattern a1, identification light pattern 302 partially overlaps with structured light pattern a2, and so on. The description of the overlapping position of the target marking light pattern and the target structure light pattern can be referred to the description of the position of the target marking light pattern connected to the target structure light pattern, which is not described in detail.
Alternatively, in other examples, the target identification light pattern and the target structure light pattern may not be in a connected or partially overlapped positional relationship, and a distance between the target identification light pattern and the target structure light pattern is less than or equal to a preset value. The specific size of the preset value is not limited in this embodiment, as long as the distance between the target identification light pattern and the target structure light pattern is smaller than or equal to the preset value, the target identification light pattern can be made to achieve the purpose of distinguishing the target structure light pattern, and different target identification light patterns can distinguish different target structure light patterns.
In this embodiment, the execution timing between the step 201 and the step 202 is not limited, for example, the projection device may execute the step 201 first and then execute the step 202, and for example, the projection device may execute the step 201 and the step 202 simultaneously, which is not limited in particular, as long as the N structured light patterns and the M identification light patterns can image the above positional relationship on the surface of the object to be measured.
Step 203, the image acquisition device shoots the object to be measured to acquire a measurement image.
In this embodiment, the image capturing device captures an object to be detected and can obtain a measurement image, where the measurement image includes N structured light patterns and M identification light patterns imaged on the surface of the object to be detected. The following describes how to ensure that the measurement image captured by the image capturing device can include a complete structured light pattern according to the method of the present embodiment:
the measuring device shown in this embodiment needs to control the exposure time of the image acquisition device to ensure that the image acquisition device can successfully capture the measurement image. The exposure time refers to the time interval from the shutter opening to the shutter closing of the image acquisition device, and it can be known that, in the exposure time, the N structured light patterns and the M identification light patterns on the surface of the object to be measured leave images on the negative film to form a measurement image. The duration of the exposure time shown in this embodiment is longer than or equal to the duration of the emission time, and the start time of the exposure time is earlier than or equal to the start time of the emission time. The emission time refers to the time of the projection device to emit the N structured light patterns and the M identification light patterns.
The present embodiment exemplifies that the duration of the exposure time is equal to the duration of the emission time, and the start timing of the exposure time is equal to the start timing of the emission time. It can be seen that, under the condition that the condition is satisfied, the projection device can ensure the structural light and the identification light emitted by the projection device in the exposure time, and can image in the exposure time of the image acquisition device, so that the loss of the structural light pattern and the identification light pattern is avoided.
The marking light pattern shown in this embodiment is used to improve accuracy of measuring three-dimensional information of an object to be measured, and therefore, it is necessary to ensure that a clear marking light pattern can be captured by a measurement image captured by an image capturing device. The projection device shown in this embodiment can determine the light intensities of M identification light patterns irradiated on the surface of the object to be measured according to the state corresponding to the object to be measured, so as to ensure the imaging definition of the M identification light patterns.
For example, the state corresponding to the object to be measured may be a distance between the object to be measured and the projection device. Specifically, the distance between the projection device and the object to be measured is far, so that more light power is lost in the process of irradiating the object to be measured with the identification light emitted from the projection device, and therefore, the light intensity of the identification light pattern imaged on the surface of the object to be measured is low, the light intensity of the identification light pattern is low in a measurement image formed by shooting the identification light pattern through the image acquisition device, and the measurement device cannot accurately distinguish each structure light pattern according to the identification light pattern with low light intensity.
For this purpose, the projection device can reduce the area of the identification light pattern imaged on the surface of the object to be measured. It can be understood that the smaller the area of the marking light pattern formed on the object to be measured by the marking light emitted from the projection device, which means that the higher the brightness of the marking light pattern, the higher the intensity of the measuring image of the marking light pattern can be obtained by the image acquisition device for shooting the marking light pattern. In particular, if the projection device includes an optical deflector, the optical deflector can achieve the purpose of adjusting the size of the area of the identification light pattern formed on the object to be measured.
For another example, the state corresponding to the object to be measured may be brightness of an environment in which the object to be measured is located. Specifically, if the environment brightness of the object to be measured is greater, the projection device can increase the light intensity of the marking light pattern in order to ensure that the image acquisition device can successfully shoot the marking light pattern on the surface of the object to be measured. If the brightness of the environment where the object to be measured is located is low, the projection device can reduce the light intensity of the identification light pattern in order to reduce the power consumption of the projection device. The specific way in which the measuring device increases the light intensity of the structured light pattern can be seen from the above, and details are not repeated.
It can be known that the identification light pattern imaged on the surface of the object to be measured can be matched with the ambient brightness of the object to be measured, so that the interference of the ambient brightness on the identification light pattern of the object to be measured shot by the image acquisition device is avoided, the identification light pattern can be clearly displayed by the measurement image shot by the image acquisition device, and the accuracy and the efficiency of acquiring the three-dimensional information of the object to be measured based on the measurement image are improved.
Step 204, the image acquisition device sends the measurement image to the measurement device.
Step 205, the measuring device identifies N structured light patterns and M identification light patterns in the measurement image.
The measuring device shown in this embodiment receives the measurement image from the image acquisition device. The measuring device recognizes N structured light patterns and M identification light patterns from the measurement image based on the image processing method. For example, the measuring device may perform boundary detection on the measurement image based on an image processing method such as hough transform, so as to achieve the purpose of identifying N structured light patterns and M identification light patterns in the measurement image.
To improve the efficiency and accuracy of recognizing the measurement image, the measurement device may also perform an image binarization (image binarization) process on the measurement image to convert the measurement image into a binarized image. The measuring device recognizes N structured light patterns and M identification light patterns in the binarized image.
Step 206, the measuring device distinguishes each of the N structured light patterns according to the M identification light patterns.
The measuring device shown in this embodiment can distinguish each of the N structured light patterns according to the received M identification light patterns, so that a correspondence relationship between the M identification light patterns and the N structured light patterns can be established.
With continued reference to the example shown in fig. 3, taking the measurement image 300 obtained by the measurement device as an example, the measurement device can establish a correspondence between the identification light pattern 301 and the structured light pattern a1, and so on, the measurement device can establish a correspondence between the identification light pattern 308 and the structured light pattern a 8. Specifically, the measuring device shown in this embodiment can determine the corresponding relationship between the target identification light pattern and the target structure light pattern according to the positional relationship between the target identification light pattern and the target structure light pattern in the measurement image 300, and for a specific description of the positional relationship between the target identification light pattern and the target structure light pattern, please refer to step 202, which is not described in detail.
Step 207, the measuring device acquires a first identification list.
In order to obtain three-dimensional information of an object to be measured, the measuring device in this embodiment needs to obtain a template image for measuring the object to be measured. The projection apparatus shown in this embodiment emits structured light to an object to be measured in accordance with a template image. Specifically, the structural light emitted by the projection device is emitted according to the patterns of the N template light patterns included in the template image, and after the structural light irradiates on the object to be detected, the structural light is influenced by the shape of the surface of the object to be detected to generate deformation, so that the N structural light patterns are imaged on the surface of the object to be detected, and as a result, the N structural light patterns have certain deformation relative to the N template light patterns.
With continued reference to fig. 3, the projection device emits structured light to the object to be measured according to the template image 310, and includes 8 template light patterns, namely, template light pattern b1, template light pattern b2 to template light pattern b8 in the template image 310. It can be seen that the projection device emits the structured light according to the forms of the template light patterns b1, b2 to b8, and after the structured light irradiates the object to be measured, the surface shape of the object to be measured is influenced to deform, so as to image 8 structured light patterns, namely the structured light pattern a1, a2 to a8, on the surface of the object to be measured.
After the measurement device acquires the measurement image 300, the measurement device can determine, based on the stored template image 310, a template light pattern corresponding to each of the structured light patterns included in the measurement image 300 in the template image 310, that is, the measurement device can determine, based on the identification light pattern 301, that the structured light pattern a1 included in the measurement image 300 corresponds to the template light pattern b1 in the template image 310, the measurement device can determine, based on the identification light pattern 302, that the structured light pattern a2 included in the measurement image 300 corresponds to the template light pattern b2 in the template image 310, and so on, the measurement device can determine, based on the identification light pattern 308, that the structured light pattern a8 included in the measurement image 308 corresponds to the template light pattern b8 in the template image 310. The measuring device can acquire template light patterns corresponding to the structure light patterns respectively, and further measurement of three-dimensional information of the object to be measured is achieved.
In order for the measuring device to acquire the template light patterns respectively corresponding to the structure light patterns, the measuring device needs to acquire a pre-stored first identification list. The first identification list comprises identification serial numbers, patterns of identification light patterns, template light patterns and corresponding relations of structure light patterns. The measuring device compares the change of the identification light pattern and the structural light pattern corresponding to the same identification serial number so as to realize the measurement of the three-dimensional information of the object to be measured.
Referring to fig. 3, the first identifier list is shown in table 1 below:
TABLE 1
Identification serial number Pattern of marking light pattern Template light pattern Structured light pattern
1 Pattern 1 of the identification light pattern 301 b1 a1
2 Pattern 2 of the identification light pattern 302 b2 a2
3 Pattern 3 of the identification light pattern 303 b3 a3
…… …… …… ……
8 Pattern 8 of the logo light pattern 308 b8 a8
It is understood that the pattern of the logo light pattern 301, the pattern of the template light pattern b1 and the pattern of the structured light pattern a1 correspond to the logo number 1, the pattern of the logo light pattern 302, the pattern of the template light pattern b2 and the pattern of the structured light pattern a2 correspond to the logo number 2, and similarly, the pattern of the logo light pattern 308, the pattern of the template light pattern b8 and the pattern of the structured light pattern a8 correspond to the logo number 8.
Step 208, the measuring device acquires corresponding N identification serial numbers according to the patterns of the M identification light patterns.
The measuring device shown in this embodiment can obtain N corresponding identification serial numbers according to patterns of M identification light patterns respectively corresponding to M identification light patterns included in a measurement image. The specific process is as follows:
first, the measuring device identifies a pattern corresponding to each of the identification light patterns in the measurement image, wherein the patterns of the identification light patterns corresponding to different structured light patterns are different.
Such as shown in fig. 4a, where fig. 4a is a diagram of a first structural example of the identification light pattern provided in the present application. The patterns corresponding to different marking light patterns in this example are: different structured light patterns comprise different numbers of sub-patterns. For example, the identification light pattern 301 corresponding to the structured light pattern a1 includes one sub-pattern, the identification light pattern 302 corresponding to the structured light pattern a2 includes two sub-patterns, and the identification light pattern 303 corresponding to the structured light pattern a3 includes three sub-patterns, for example. The present example is exemplified by taking each sub-pattern as a horizontal stripe light pattern, and in other examples, each sub-pattern may also be any shape such as a dot light pattern, an arc light pattern, and the like. This example illustrates that the structures of the different sub-patterns are the same, and in other examples, the shapes of the different sub-patterns may be different.
As further shown in fig. 4b, fig. 4b is a diagram illustrating a second exemplary configuration of the identification light pattern provided in the present application. The patterns corresponding to different marking light patterns in this example are: the different identification light patterns differ in shape. As shown in fig. 4b, the shape of the identification light pattern 301 corresponding to the structured light pattern a1 is triangular, the shape of the identification light pattern 302 corresponding to the structured light pattern a2 is square, and the shape of the identification light pattern 303 corresponding to the structured light pattern a3 is circular. The present example describes the shape of each of the identification light patterns as an alternative example, without limitation, and in other examples, the shape of the identification light pattern may be any shape such as trapezoid, irregular shape, T-shape, diamond shape, and the like.
As further shown in fig. 4c, fig. 4c is a diagram illustrating a third exemplary configuration of the identification light pattern provided in the present application. The patterns corresponding to different marking light patterns in this example are: the different identification light patterns differ in length. As shown in fig. 4c, the length of the identification light pattern refers to the number of pixels comprised by the identification light pattern in the Y direction. The length of the identification light pattern 301 corresponding to the structured light pattern a1 is L1, the length of the identification light pattern 302 corresponding to the structured light pattern a2 is L2, and the length of the identification light pattern 303 corresponding to the structured light pattern a3 is L3, wherein L1, L2 and L3 are sequentially increased. The present example exemplifies that the lengths of the respective identification light patterns are different, but is not limited thereto, and in other examples, the widths of the respective identification light patterns may be different, wherein the widths of the identification light patterns refer to the number of pixels included in the identification light patterns along the X direction, wherein the X direction and the Y direction are perpendicular to each other, and the respective structured light patterns extend along the Y direction.
The measuring means determines an identification number corresponding to the pattern of each identification light pattern from the first identification list as shown in table 1. With reference to any one of the examples of fig. 4a, 4b or 4c, pattern 1 of the identification light pattern 301 corresponds to identification number 1, pattern 2 of the identification light pattern 302 corresponds to identification number 2, and similarly, pattern 3 of the identification light pattern 303 corresponds to identification number 3.
And so on, the measuring device can determine the identification serial number corresponding to each identification light pattern in the measured image. In this embodiment, when m=n is greater than N, that is, two or more identification light patterns correspond to the same structural light pattern, the identification numbers corresponding to the two or more identification light patterns corresponding to the same structural light pattern are the same.
Step 209, the measuring device obtains N template light patterns corresponding to the N identification numbers according to the first identification list.
Specifically, the measuring device shown in this embodiment can query the template light patterns corresponding to the respective identification numbers according to the first identification list shown in table 1. As can be seen in connection with the examples shown in fig. 4a to 4c, the template light pattern b1 corresponding to the identification number 1, the template light pattern b2 corresponding to the identification number 2, and so on.
Step 210, the measuring device obtains three-dimensional information of the object to be measured according to the change of the N structured light patterns relative to the N template light patterns.
In this embodiment, the measuring device compares the change between the structured light pattern and the template light pattern corresponding to the same identification number, and obtains the three-dimensional information of the object to be measured.
The following describes the beneficial effects of the measurement method provided in the present application with reference to fig. 5:
the projection apparatus emits structured light in accordance with the template image 500, and this example takes each template light image as a line pattern, and takes the template image 500 as an example to include 8 template light patterns, and these 8 template light patterns are arranged in four rows and four columns.
In the prior art, when three-dimensional information is measured on an object to be measured, a projection device emits structured light according to 8 template light patterns shown in a template image 500, and the structured light can image 8 structured light patterns shown in a measurement image 501 on the surface of the object to be measured. The measuring device compares changes in the template light pattern and the structured light pattern corresponding to the position based on the measurement image 501 and the template image 500 to perform measurement of three-dimensional information. For example, the measurement device compares the first line of structured light pattern in the measurement image 501 with respect to the change in the first line of template light pattern in the template image 500, and so on, the measurement device compares the fourth column of structured light pattern in the measurement image 501 with respect to the change in the fourth column of template light pattern in the template image 500 to obtain three-dimensional information of the object to be measured.
However, there may be an obstacle in the path of the structured light emitted from the projection device, which may result in a loss of the structured light pattern imaged on the surface of the object to be measured. For example, the obstacle blocks the light path of the structured light corresponding to the third column of the template light pattern of the template image 500, so that the structured light is lost, and then the measurement image acquired by the measurement device is the measurement image 502, and it is known that the measurement image 502 is opposite to the template image 500, the third column of the template light pattern cannot be imaged on the surface of the object to be measured, and then the measurement device cannot compare the change of the lost structured light pattern relative to the third column of the template light image 500, so that the accuracy of measuring the three-dimensional information by the measurement device is lower.
With the measurement method shown in this embodiment, the measurement image acquired by the measurement device is the measurement image 503, the measurement device determines the corresponding first column of structured light patterns based on the identification light pattern 511 of the measurement image 503, and determines the first column of structured light patterns in the measurement image 503 to correspond to the first column of template light patterns in the template image. A corresponding second column of structured light patterns is determined based on the identification light pattern 512 of the measurement image 503, and a second column of structured light patterns in the measurement image 503 is determined to correspond to a second column of template light patterns in the template image. A corresponding fourth column of structured light patterns is determined based on the identification light pattern 514 of the measurement image 503, and a fourth column of structured light patterns in the measurement image 503 is determined to correspond to a fourth column of template light patterns in the template image. In the process that the measuring device compares the template image 500 and the measurement image 503, the measuring device cannot identify the identification light pattern corresponding to the third column of template light images in the template image 500 according to the measurement image 503, so that the measuring device can determine that the third column of template light images are lost, and the structured light pattern corresponding to the third column of template light images cannot be imaged on the surface of the object to be measured. Then, the measuring device determines the condition that the structured light pattern is lost, the change between the lost structured light pattern and the template light pattern is not compared, and the accuracy of measuring the three-dimensional information of the object to be measured is improved.
In the above-mentioned case that the structured light is lost, taking as an example that the template light pattern cannot be imaged on the surface of the object to be measured, in other examples, a situation that the position of the structured light pattern is misplaced may also occur, for example, a first row of template light patterns and a second row of template light patterns in the template image are imaged as the second row of structured light patterns and the first row of structured light patterns respectively in the measurement image, because each structured light pattern shown in the embodiment corresponds to the identification light pattern, the measurement device determines and compares the change of the second row of structured light patterns relative to the first row of template light patterns in the template image based on the identification light pattern corresponding to the first row of structured light patterns, and the measurement device determines and compares the change of the first row of structured light patterns relative to the second row of template light patterns in the template image, so that the measurement method shown in the embodiment can still effectively ensure the accuracy of the measurement three-dimensional information even if the structured light patterns are misplaced.
It can be seen that, according to the measurement method shown in the embodiment, based on the identification light pattern, the corresponding relationship between each structure light pattern and the template light pattern can be accurately determined, so that the accuracy of measuring the three-dimensional information of the object to be measured is improved. The measuring device directly determines the corresponding relation between the structured light pattern and the template light pattern according to the identification light pattern, so that the efficiency of measuring the three-dimensional information is improved. By adopting the method shown in the embodiment, even if the structured light pattern is lost or misplaced, the measuring device can ensure that the structured light pattern is accurately compared with the corresponding template light pattern to change so as to realize measurement of three-dimensional information, and ensure the robustness of measuring the three-dimensional information.
Example two
In a first embodiment, the measuring device determines the correspondence of each structured light pattern and each template light pattern by identifying the pattern of the light pattern. In the measurement method shown in this embodiment, the measurement device determines the corresponding relationship between each structured light pattern and each template light pattern by identifying the coding information carried by the light pattern, and the specific execution process is shown in fig. 6, where fig. 6 is a flow chart of steps of a second embodiment of the measurement method provided in this application.
In step 601, the projection device emits structured light to the object to be measured, so as to radiate N structured light patterns on the surface of the object to be measured.
In step 602, the projection device emits identification light to the object to be measured, so as to radiate M identification light patterns on the surface of the object to be measured.
Step 603, the image acquisition device shoots the object to be measured to acquire a measurement image.
Step 604, the image acquisition device sends the measurement image to the measurement device.
Step 605, the measuring device identifies N structured light patterns and M identification light patterns in the measurement image.
Step 606, the measuring device distinguishes each of the N structured light patterns according to the M identification light patterns.
For a description of the execution process of steps 601 to 606 in this embodiment, please refer to steps 201 to 206 in the first embodiment, and detailed descriptions thereof are omitted.
Step 607, the measuring device obtains a second identifier list.
In order to obtain three-dimensional information of an object to be measured, the measuring device in this embodiment needs to obtain a template image for measuring the three-dimensional information of the object to be measured, and description of the template image is shown in embodiment one, and details are not repeated. For accurate measurement of three-dimensional information of an object to be measured, it is necessary to accurately determine a template light pattern corresponding to each structured light pattern, for which purpose the measuring device can acquire a second identification list that has been stored in advance. The second identification list includes the correspondence of the encoded information, the template light pattern, and the structured light pattern. The measuring device compares the change of the identification light pattern and the structural light pattern corresponding to the same coded information so as to realize the measurement of the three-dimensional information of the object to be measured. Referring to fig. 3, the second identifier list may be shown in the following table 2, and it should be clearly understood that the description of the values of the encoded information included in the second identifier list shown in table 2 is an alternative example, and is not limited thereto.
TABLE 2
Figure BDA0003345876760000141
Figure BDA0003345876760000151
It is understood that the template light pattern b1 and the structured light pattern a1 correspond to the encoded information 0111, the template light pattern b2 and the structured light pattern a2 correspond to the encoded information 1110, and the template light pattern b8 and the structured light pattern a8 correspond to the encoded information 1000.
Step 608, the measuring device determines N template light patterns corresponding to the N structured light patterns according to the second identifier list.
The identification light patterns shown in the embodiment carry coding information, and the measuring device can determine N template light patterns corresponding to the N structured light patterns according to the coding information carried by the identification light patterns.
First, how the coded information is carried by the identification light pattern is described with reference to fig. 7a, where fig. 7a is a diagram of a fourth structural example of the identification light pattern provided in the present application. The structured light emitted from the projection device forms 8 structured light patterns, namely a structured light pattern a1, a structured light pattern a2 to a structured light pattern a8, on the surface of the object to be measured, and specific descriptions of the structured light patterns a1, a structured light pattern a2 to a structured light pattern a8 are omitted herein, referring to fig. 3. In this example, taking M equal to N as an example, each structured light pattern is connected to one identification light pattern, and it can be known that the 8 identification light patterns imaged on the surface of the object to be measured include identification light patterns 301, 302 to 308. For a description of the relative positions of the structured light pattern and the identification light pattern, please refer to the first embodiment, and detailed description is omitted.
The identification light pattern shown in this embodiment has a plurality of sub-patterns, each sub-pattern corresponds to a code value through brightness, and the identification light pattern carries code information through a plurality of code values corresponding to the plurality of sub-patterns, that is, the code information carried by the identification light pattern includes a plurality of code values corresponding to the identification light pattern.
The specific structure of the identification light pattern is exemplarily described with reference to fig. 7b, and as shown in fig. 7b, the identification light pattern includes a sub-pattern 701, a sub-pattern 702, a sub-pattern 703, and a sub-pattern 704. The four sub-patterns form a rectangular structure. It should be noted that the description of the number of the plurality of sub-patterns included in the identification light pattern and the arrangement structure of the plurality of sub-patterns according to the present embodiment is an optional example, and is not limited.
In this embodiment, for example, if the luminance value of the sub-pattern 701 is greater than or equal to the preset value, the encoded value carried by the sub-pattern is 0, and if the luminance value of the sub-pattern 701 is less than the preset value, the encoded value carried by the sub-pattern is 1, and the luminance shown in this example is the brightness of the sub-pattern, and the unit is cd/m2 (candela per square meter).
Referring to fig. 7a and fig. 7b, the brightness value of the sub-pattern 701 of the identification light pattern 301 is greater than or equal to a preset value, it is known that the measurement device determines that the coding value carried by the sub-pattern 701 of the identification light pattern 301 is 0, the brightness value of the sub-pattern 702 of the identification light pattern 301 is less than the preset value, it is known that the measurement device determines that the coding value carried by the sub-pattern 702 of the identification light pattern 301 is 1, and so on, the measurement device can determine that the coding values carried by the four sub-patterns of the identification light pattern 301 are 0,1, and then the coding information carried by the identification light pattern is 0111.
Similarly, the code information carried by the identification light pattern 302 is 1110, the code information carried by the identification light pattern 303 is 1001, the code information carried by the identification light pattern 304 is 0011, and so on, the code information carried by the identification light pattern 308 is 1000.
In the case that the measuring device acquires the coded information carried by each of the identification light patterns included in the measurement image, the measuring device may acquire the template light pattern and the structured light pattern corresponding to each of the coded information by referring to table 2. It is understood that, when the code information carried by the identification light pattern is 0111, the measurement device determines the template light pattern b1 and the structured light pattern a1 corresponding to the code information 0111, and the measurement device determines the template light pattern b8 and the structured light pattern a8 corresponding to the code information 1000 when the code information carried by the identification light pattern is 1000.
In this embodiment, the sub-pattern included in the identification light pattern is exemplified by carrying the encoded value by the luminance value, and in other examples, the sub-pattern included in the identification light pattern may also carry the encoded value by the color, so that the colors of the sub-patterns carrying different encoded values may be known to be different. For another example, the sub-patterns included in the identification light pattern may carry the encoded values by color and luminance values, and it may be known that the color and luminance values of the sub-patterns carrying different encoded values are different.
In this embodiment, m=n is taken as an example for illustration, and it is known that each structured light pattern is connected to one identification light pattern, and the coded information carried by different identification light patterns is different. When M is greater than N, that is, two or more identification light patterns correspond to the same structural light pattern, at this time, the identification information carried by the two or more identification light patterns corresponding to the same structural light pattern is the same.
Step 609, the measuring device obtains three-dimensional information of the object to be measured according to the change of the N structured light patterns relative to the N template light patterns.
For a specific description of step 609 in this embodiment, please refer to step 210 in the first embodiment, and detailed description thereof is omitted.
It can be seen that, according to the measurement method shown in this embodiment, based on the coding information carried by the identification light pattern, the corresponding relationship between each structured light pattern and the template light pattern can be accurately determined, so that the accuracy and efficiency of measuring the three-dimensional information of the object to be measured are improved, and the robustness of measuring the three-dimensional information is ensured.
Example III
The measurement method shown in this embodiment can determine the correspondence between each structured light pattern and each template light pattern based on artificial intelligence (artificial intelligence, AI), and the specific implementation process is shown in fig. 8, where fig. 8 is a flowchart of steps of a third embodiment of the measurement method provided in this application.
In step 801, the projection device emits structured light to the object to be measured, so as to radiate N structured light patterns on the surface of the object to be measured.
Step 802, the projection device emits identification light to the object to be measured, so as to radiate M identification light patterns on the surface of the object to be measured.
Step 803, the image acquisition device shoots the object to be measured to acquire a measurement image.
Step 804, the image acquisition device sends the measurement image to the measurement device.
Step 805, the measuring device identifies N structured light patterns and M identification light patterns in the measurement image.
Step 806, the measuring device distinguishes each of the N structured light patterns according to the M identification light patterns.
For a description of the execution process of steps 801 to 806 in this embodiment, please refer to steps 201 to 206 in the first embodiment, and detailed description thereof is omitted.
In step 807, the measurement device identifies M pieces of characteristic information corresponding to the M identification light patterns, respectively, in the measurement image.
The feature information corresponding to the identification light pattern shown in the embodiment is used for characterizing morphological characteristics of the identification light pattern, and the embodiment does not limit the feature information, for example, the feature information corresponding to the identification light pattern may include at least one of the following items:
the shape of the light pattern, the area of the light pattern, the position of the center of gravity of the light pattern, the position of the center of the light pattern, the circumference of the light pattern, the ratio of the principal axes of the light pattern, etc.
Step 808, the measuring device determines N template light patterns corresponding to the N structured light patterns according to the M feature information based on the target model.
Specifically, the measurement device shown in this embodiment may train the correspondence between the feature information of the identification light pattern, the feature information, and the identification number of the identification light pattern based on AI to obtain the target model. The description of the identification number can be referred to the description of the embodiment of the identification number, and detailed description is omitted.
When the measuring device recognizes the characteristic information of each of the identification light patterns from the measurement image, the measuring device inputs the characteristic information of each of the identification light patterns to a target model capable of outputting the identification number corresponding to each of the identification light patterns.
When the measuring device obtains the identification number, the measuring device can obtain the structured light pattern and the template light pattern corresponding to the identification number, and description of the correspondence between the identification number, the structured light pattern and the template light pattern is omitted, please refer to the first embodiment.
And step 809, the measuring device acquires the three-dimensional information of the object to be measured according to the change of the N structured light patterns relative to the N template light patterns.
For a description of the specific execution of step 809 in this embodiment, please refer to step 210 in the first embodiment, and details are not described.
In this embodiment, m=n is taken as an example for illustration, and it is known that each structured light pattern is connected to one identification light pattern, and identification numbers corresponding to feature information of different identification light patterns are different. When M is greater than N, that is, two or more identification light patterns correspond to the same structured light pattern, at this time, identification numbers corresponding to the feature information of the two or more identification light patterns corresponding to the same structured light pattern are the same.
The measuring device of the embodiment can determine the structure light pattern and the template light pattern corresponding to each identification light pattern based on AI, and improves the efficiency and accuracy of measuring the three-dimensional information of the object to be measured.
Example IV
In the first to third embodiments, the purpose of measuring three-dimensional information of an object to be measured is achieved by N template patterns included in the template image, but in this embodiment, the purpose of measuring three-dimensional information of an object to be measured is achieved by N template light patterns and M template identification light patterns included in the template image, and the process of performing the measurement method of this embodiment is described below with reference to fig. 9, where fig. 9 is a flowchart of the fourth embodiment steps of the measurement method provided in this application.
In step 901, the projection device emits structured light to the object to be measured, so as to radiate N structured light patterns on the surface of the object to be measured.
In step 902, the projection device emits identification light to the object to be measured, so as to radiate M identification light patterns on the surface of the object to be measured.
In step 903, the image capturing device captures an object to be measured to obtain a measurement image.
Step 904, the image acquisition device sends the measurement image to the measurement device.
In step 905, the measuring device identifies N structured light patterns and M identification light patterns in the measurement image.
Step 906, the measuring device distinguishes each of the N structured light patterns according to the M identification light patterns.
For a description of the execution process of steps 901 to 906 in this embodiment, please refer to steps 201 to 206 in the first embodiment, and detailed descriptions thereof are omitted.
Step 907, the measuring device obtains M template identification light patterns corresponding to the M identification light patterns.
The measuring device shown in this embodiment compares the M marking light patterns with the template marking light patterns in the template image to obtain the template marking light pattern corresponding to each marking light pattern.
Referring to fig. 10, the projection device emits structured light in accordance with a template image 1010 to acquire a measurement image 1020. The present example takes the template image 1010 as an example that includes three template light patterns, namely, a template light pattern b1, a template light pattern b2, and a template light pattern b 3. The measurement image 1020 includes three structured light patterns, namely a structured light pattern a1, a structured light pattern a2, and a structured light pattern a3. It should be noted that the present embodiment is described with the number of template light images included in the template image and the number of measurement images included in the measurement image as an alternative example, and is not limited thereto.
In the template images 1010 shown in this embodiment, each template image 1010 is connected to a template-identifying light pattern. That is, the template light pattern b1 is connected to the template identification light pattern 1011, the template light pattern b2 is connected to the template identification light pattern 1012, and the template light pattern b3 is connected to the template identification light pattern 1013. It should be clear that, for the description of the positional relationship between the template identification light pattern and the template light pattern in the present embodiment, reference may be made to the description of the positional relationship between the identification light pattern and the structured light pattern shown in the first embodiment, which is not repeated in detail. It is understood that the measuring apparatus can create the correspondence of the template light pattern b1 and the template identification light pattern 1011, the correspondence of the template light pattern b2 and the template identification light pattern 1012, and the correspondence of the template light pattern b3 and the template identification light pattern 1013 based on the template image.
In this embodiment, the forms of the different template identification light patterns are different, and the description of the form of the template identification light pattern shown in the first embodiment is omitted. Specifically, in this embodiment, the form of the template-marking light pattern 1011 is rectangular, the form of the template-marking light pattern 1012 is circular, and the form of the template-marking light pattern 1013 is diamond-shaped.
In other examples, different template identification light patterns may carry different coding information, and description of the template identification light patterns carrying the coding information may be referred to in the second embodiment, which is not described in detail. Or, different template identification light patterns may also have different feature information, so that the measurement device can determine the corresponding relationship with different template light patterns based on the different feature information of the different template identification light patterns, and the description of the process of determining the corresponding template light pattern based on the feature information of the template identification light pattern can be referred to in the third embodiment, and the process of determining the corresponding structured light pattern based on the feature information of the identification light pattern is not described in detail.
In this embodiment, the measurement device compares M identification light patterns identified from the measurement image with M template identification light patterns identified from the template image in the measurement image to determine the correspondence between the structured light patterns and the template light patterns. For example, the measurement device recognizes the identification light pattern 1021 connected to the structured light pattern a1, the identification light pattern 1022 connected to the structured light pattern a2, and the identification light pattern 1023 connected to the structured light pattern a3 included in the measurement image 1020. The measurement device compares the degree of similarity of the identification light pattern 1021 and each template identification light pattern in the template image 1010. The measuring device determines that the identification light pattern and the template identification light pattern are at least partially identical, for example, the identification light pattern 1021 and the template identification light pattern 1011 are both rectangular, the measuring device can determine that the identification light pattern 1021 corresponds to the template identification light pattern 1011, and similarly, the identification light pattern 1023 and the template identification light pattern 1013 are both diamond-shaped, and the measuring device can determine that the identification light pattern 1023 corresponds to the template identification light pattern 1013.
Step 908, the measuring device obtains N template light patterns corresponding to the N structured light patterns according to the M identification light patterns and the M template identification light patterns.
Because each of the template identification light patterns shown in the embodiment corresponds to one of the template light patterns, and each of the identification light patterns corresponds to one of the structured light patterns, when the measuring device determines a pair of the template identification light patterns and the identification light patterns that correspond to each other, the structured light patterns and the template light patterns that correspond to each other can be determined.
For example, taking the example in which the marker light pattern 1023 corresponds to the template marker light pattern 1013, the structural light pattern a3 corresponding to the marker light pattern 1023 corresponds to the template light pattern b3 corresponding to the template marker light pattern 1013, it is understood that the measuring device can determine the template light pattern corresponding to each marker light pattern based on the template marker light pattern and the marker light pattern.
And step 909, the measuring device acquires the three-dimensional information of the object to be measured according to the change of the N structured light patterns relative to the N template light patterns.
For a description of the specific execution of step 909 in this embodiment, please refer to step 210 in the first embodiment, and details are not described.
According to the measuring method, the measuring device can directly determine the corresponding structure light pattern and the corresponding template light pattern according to the similarity of the template identification light pattern and the identification light pattern, so that the accuracy of measuring the three-dimensional information of the object to be measured is improved.
Example five
In the first to fourth embodiments, the procedure of how to measure the three-dimensional information of the object to be measured is described in the embodiment, in which the value of M is any value greater than or equal to N, and the embodiment is described with the case that the value of M is less than N, and fig. 11 is a flowchart of the fifth embodiment of the measurement method provided in the present application.
In step 1101, the projection device emits structured light to the object to be measured, so as to radiate N structured light patterns on the surface of the object to be measured.
In step 1102, the projection device emits identification light to the object to be measured, so as to radiate M identification light patterns on the surface of the object to be measured.
In step 1103, the image capturing device captures an object to be measured to obtain a measurement image.
Step 1104, the image acquisition device sends the measurement image to the measurement device.
Step 1105, the measuring apparatus identifies N structured light patterns and M identification light patterns in the measurement image.
Step 1106, the measurement device distinguishes each of the N structured light patterns according to the M identification light patterns.
For a description of the execution process of steps 1101 to 1106 in this embodiment, please refer to steps 201 to 206 in the first embodiment, and detailed description thereof is omitted.
The following description will be made with reference to fig. 12 for the measurement image 1220 and the template image 1210 of the present embodiment, where the projection device emits the structured light according to the pattern of each template light pattern included in the template image 1210, and can image 8 structured light patterns on the surface of the object to be measured, and the description of the template light patterns included in the template image 1210 and the structured light patterns included in the measurement image 1220 is shown in fig. 3, which is not repeated specifically.
The number of the identification light patterns of the identification light emitted by the projection device and imaged on the surface of the object to be measured is smaller than the number of the structured light patterns of the structured light emitted by the projection device and imaged on the surface of the object to be measured. For example, as shown in fig. 12, the marking light emitted from the projection device images 5 marking light patterns on the surface of the object to be measured.
In particular, the measurement image 1220 includes a first identification light pattern 1221 and a second identification light pattern 1222 that are adjacent in position. The adjacent positions mean that no other identification light pattern is included between the first identification light pattern 1221 and the second identification light pattern 1222. The first identification light pattern 1221 is used for distinguishing the structured light pattern a1 from 8 structured light patterns, the second identification light pattern 1222 is used for distinguishing the structured light pattern a3 from 8 structured light patterns, and the specific description of the identification light pattern distinguishing the structured light patterns can be seen in any of the first to fourth embodiments, and is not repeated.
The present embodiment is exemplified by the example that each of the structured light patterns shown in the first embodiment corresponds to the identification number, and the difference between the first and second identified light patterns 1221 and 1222 in the present embodiment is that the first and second identified light patterns are also used for distinguishing the structured light patterns a2, that is, in the above embodiment, two or more identified light patterns are needed to achieve the purpose of distinguishing two different structured light patterns, but the present embodiment can achieve the purpose of distinguishing three different structured light patterns only by two identified light patterns.
As shown in table 1 of the first embodiment, the first identification light pattern 1221 corresponds to the identification number 1, the second identification light pattern 1222 corresponds to the identification number 3, and the measuring device has previously stored the first identification list shown in table 1, and it is known that the 8 identification numbers stored in the measuring device are 1,2,3 to 8. The measuring device can determine the first identification light pattern 1221 corresponding to the identification number 1, and can also determine the second identification light pattern 1222 corresponding to the identification number 3, while the measurement image 1220 does not include the identification light pattern corresponding to the identification number 3, and it can be seen that the third structure light pattern a2 located between the first structure light pattern a1 and the second structure light pattern a3 corresponds to the identification number 2, wherein the first structure light pattern a1 is connected with the first identification light pattern 1221, and the second identification light pattern 1222 is connected with the second identification light pattern 1222. From this, the measuring device can determine that the corresponding identification numbers are 1,2, and 3, respectively, based on the first identification light pattern 1221 and the second identification light pattern 1222. Likewise, the identification light pattern 1222 and the identification light pattern 1223 are commonly used for the corresponding structure light pattern a3, the structure light pattern a4 and the structure light pattern a5, and the identification light pattern 1224 and the identification light pattern 1225 are commonly used for the corresponding structure light pattern a6, the structure light pattern a7 and the structure light pattern a8, which are not described in detail.
Step 1107, the measuring device acquires N template light patterns corresponding to the N identification serial numbers.
In the case that the measuring device in this embodiment has acquired the corresponding N identification numbers according to the M identification light patterns, the processing device may acquire the corresponding N template light patterns according to the N identification numbers, and the description of the specific execution process is omitted herein, referring to step 209 in the first embodiment.
And 1108, the measuring device acquires the three-dimensional information of the object to be measured according to the change of the N structured light patterns relative to the N template light patterns.
In the specific implementation process of step 1108 in this embodiment, please refer to step 210 in the first embodiment, and the specific implementation process is not described in detail.
By adopting the method shown in the embodiment, the number of the marking light patterns imaged on the surface of the object to be measured can be effectively reduced, and the power consumption of the projection device for emitting the marking light is reduced. And the measuring device can accurately achieve the purpose of measuring three-dimensional information of the object to be measured even in the case that the number of the identification light patterns imaged on the surface of the object to be measured is reduced.
Example six
As can be seen from the foregoing embodiments one to five, in order to accurately measure three-dimensional information of an object to be measured, the measuring device is required to accurately determine the template light pattern corresponding to each of the structured light patterns. The present embodiment is described with reference to fig. 13, where fig. 13 is a flowchart illustrating steps of a sixth embodiment of the measurement method provided in the present application.
In step 1301, the projection device emits structured light to the object to be measured, so as to radiate N structured light patterns on the surface of the object to be measured.
In step 1302, the projection device emits the identification light to the object to be measured, so as to radiate M identification light patterns on the surface of the object to be measured.
In step 1303, the image capturing device captures an object to be measured to obtain a measurement image.
In step 1304, the image acquisition device transmits the measurement image to the measurement device.
Step 1305, the measuring device identifies N structured light patterns and M identification light patterns in the measurement image.
Step 1306, the measuring device distinguishes each of the N structured light patterns according to the M identification light patterns.
Step 1307, the measurement apparatus acquires a first identifier list.
Step 1308, the measuring device acquires corresponding N identification serial numbers according to the patterns of the M identification light patterns.
Step 1309, the measuring device obtains N template light patterns corresponding to the N identification numbers according to the first identification list.
For the description of the execution process of steps 1301 to 1309 in this embodiment, please refer to steps 201 to 209 in the first embodiment, and detailed description thereof is omitted. It should be clearly understood that, in this embodiment, the example of obtaining the correspondence between the structured light pattern and the template light pattern in the manner shown in the first embodiment is illustrated, and in other examples, the measuring device shown in this embodiment may also obtain the correspondence between the structured light pattern and the template light pattern by the method shown in any of the second embodiment to the fifth embodiment, and the detailed description is shown in any of the second embodiment to the fifth embodiment, which is not repeated.
The difference with respect to the first embodiment is that, after the correspondence between the N structured light patterns and the N template light patterns is obtained, the present embodiment does not perform the process of measuring the three-dimensional information of the object to be measured as shown in the first embodiment, but needs to check whether the correspondence between the N structured light patterns and the N template light patterns obtained by the measuring device is accurate, and the measuring device performs the process of measuring the three-dimensional information of the object to be measured only if the measuring device determines that the correspondence between the N structured light patterns and the N template light patterns is accurate. The following describes a procedure for checking whether the correspondence between N structured light patterns and N template light patterns is accurate by the measuring device shown in this embodiment:
step 1310, the measuring device obtains a to-be-measured identification light pattern.
The measuring device selects one marking light pattern from M marking light patterns included in the measuring image as the marking light pattern to be measured. The identification light pattern to be measured shown in this embodiment is located between the first identification light pattern and the second identification light pattern. For a specific description of the first identification light pattern and the second identification light pattern, please refer to the fifth embodiment, and detailed description is omitted.
The measuring device shown in this embodiment is based on the first identification light pattern, where the identification light pattern to be measured and the second identification light pattern can sequentially distinguish three adjacent structured light patterns in the N structured light patterns, and for a description of a specific distinguishing process, please refer to a fifth embodiment, and details are not described in detail.
In order to achieve the purpose of checking whether the N structured light patterns and the N template light patterns acquired by the measurement device are accurate, the embodiment can check whether the identification serial numbers corresponding to the structured light patterns are accurate, if the identification serial numbers corresponding to the structured light patterns are accurate, because the identification serial numbers already correspond to the template light patterns, it is known that if the identification serial numbers corresponding to the structured light patterns are accurate, then the correspondence between the structured light patterns and the template light patterns is also accurate.
Step 1311, the measurement device acquires the first identification information.
In this embodiment, the first identification information is taken as a first identification serial number, where the first identification serial number is an identification serial number corresponding to the identification light pattern to be measured, which is obtained by the measuring device in N identification serial numbers. For example, as shown in table 1, if the identification light pattern to be measured determined by the measuring device is the identification light pattern 302, the first identification number is 2.
Step 1312, the measuring device obtains the second identification information.
In this embodiment, the second identification information is taken as an example of a second identification sequence number, where the second identification sequence number is located between the identification sequence number corresponding to the first identification light pattern and the identification sequence number corresponding to the second identification light pattern in N identification sequence numbers that are sequentially arranged. Continuing to combine with the table 1, in the case that the first identification light pattern is the identification light pattern 301 and the second identification light pattern is the identification light pattern 303, the measurement device determines that the identification number corresponding to the identification light pattern 301 is 1 and the identification number corresponding to the identification light pattern 303 is 3 based on the table 1, and then the measurement device determines that the identification number between the identification number 1 and the identification number 3 is 2 from the determined N identification numbers.
Step 1313, the measurement device determines whether the first identification information and the second identification information are the same, if so, step 1314 is executed, and if not, step 1305 is executed.
If the measuring device determines that the first identification number is the same as the second identification number, then it determines that the correspondence between the structured light pattern distinguished by the identification light pattern to be measured and the template light pattern is accurate, and the measuring device may execute step 1314. If the measuring device determines that the first identification number and the second identification number are different, it is determined that the correspondence between the structured light pattern distinguished by the to-be-measured identification light pattern and the template light pattern is wrong, and it is necessary to return to the execution step 1305 to identify the N structured light patterns and the M identification light patterns in the measured image again, and it is clear that the present embodiment is exemplified by the execution step 1305 that the first identification number and the second identification number are different, and is not limited, for example, the execution steps 1301 and 1302 may also be returned to enable the projecting device to re-emit the structured light and the identification light.
If the measuring device determines that the first identification serial number is different from the second identification serial number, the corresponding relation between the structure light pattern distinguished by the identification light pattern to be measured and the template light pattern is determined to be wrong. In this embodiment, the number of the to-be-measured identification light patterns is not limited, if the number of the to-be-measured identification light patterns determined by the measurement device is multiple, the measurement device performs steps 1310 to 1313 described above for each to-be-measured identification light pattern until the measurement device determines that the first identification serial number and the determined second identification serial number of each to-be-measured identification light pattern are the same, and then step 1314 is performed. If the measuring device determines that the first identification number and the determined second identification number of the one or more identification light patterns to be measured are different from each other in the plurality of identification light patterns to be measured, then the step 1305 is executed.
In step 1314, the measuring device obtains three-dimensional information of the object to be measured according to the change of the N structured light patterns relative to the N template light patterns.
For a description of the execution of step 1314 in this embodiment, please refer to step 210 in the first embodiment, and detailed description thereof is omitted.
It should be noted that, in this embodiment, the identification information is exemplified by the identification number, the identification information shown in this embodiment may be the coding information described in the second embodiment or the template identification light pattern shown in the fourth embodiment, and if the identification information is the template identification light pattern, the measurement device may perform the step of measuring the three-dimensional information of the object to be measured when determining that the first identification information and the second identification information are at least partially identical.
By adopting the method shown in the embodiment, the measuring device can check whether the corresponding relation between the structural light pattern and the template light pattern is accurate, so that the measuring device can only measure three-dimensional information aiming at the structural light pattern and the template light pattern with accurate corresponding relation, the accuracy of measuring the three-dimensional information of the object to be measured is effectively ensured, and the robustness of measuring the three-dimensional information is ensured.
The above embodiments are only for illustrating the technical solution of the present invention, and not for limiting the same; although the invention has been described in detail with reference to the foregoing embodiments, it will be understood by those of ordinary skill in the art that: the technical scheme described in the foregoing embodiments can be modified or some technical features thereof can be replaced by equivalents; such modifications and substitutions do not depart from the spirit and scope of the technical solutions of the embodiments of the present invention.

Claims (24)

1. A method of measurement, the method comprising:
the method comprises the steps that a measuring device obtains a measuring image, wherein the measuring image is formed by shooting an object to be measured, the measuring image comprises N structured light patterns and M identification light patterns, M is a positive integer greater than or equal to 1, and N is a positive integer greater than or equal to 2;
The measuring device identifies the N structured light patterns and the M identification light patterns in the measured image;
the measuring device distinguishes each of the N structured light patterns according to the M identification light patterns;
the measuring device acquires three-dimensional information of the object to be measured according to the distinguished N structured light patterns.
2. The method of claim 1, wherein prior to the measuring device acquiring the measurement image, the method further comprises:
the projection device emits structural light to the object to be detected so as to radiate the N structural light patterns on the surface of the object to be detected;
the projection device emits identification light to the object to be detected so as to radiate the M identification light patterns on the surface of the object to be detected;
the image acquisition device shoots the object to be measured to acquire the measurement image;
the image acquisition device sends the measurement image to the measurement device.
3. The method of claim 2, wherein the projecting device emitting identification light toward the object to be measured comprises:
the projection device determines the light intensities of the M marking light patterns irradiated on the surface of the object to be measured according to the corresponding state of the object to be measured.
4. A method according to any one of claims 1 to 3, wherein one target identification light pattern of the M identification light patterns and one target structured light pattern of the N structured light patterns satisfy one of the following conditions:
the target identification light pattern is connected with the target structure light pattern; the target identification light pattern is partially overlapped with the target structure light pattern; or the distance between the target identification light pattern and the target structure light pattern is smaller than or equal to a preset value.
5. The method according to any one of claims 1 to 4, wherein the M identification light patterns correspond to N template light patterns, and the measuring device obtaining three-dimensional information of the object to be measured according to the N distinguished structured light patterns comprises:
the measuring device obtains the N template light patterns corresponding to the N structure light patterns according to the M identification light patterns;
and the measuring device acquires the three-dimensional information of the object to be measured according to the change of the N structured light patterns relative to the N template light patterns.
6. The method of claim 5, wherein the measuring means obtaining the N template light patterns corresponding to the N structured light patterns according to the M identification light patterns comprises:
The measuring device acquires an identification list, wherein the identification list comprises the corresponding relation between the identification light patterns and the identification serial numbers, the identification list also comprises the corresponding relation between the identification serial numbers and the template light patterns, and different identification serial numbers correspond to different template light patterns;
the measuring device acquires N identification serial numbers corresponding to the M identification light patterns according to the identification list;
and the measuring device acquires N template light patterns corresponding to the N identification serial numbers according to the identification list.
7. The method of claim 5, wherein the measuring means obtaining the N template light patterns corresponding to the N structured light patterns according to the M identification light patterns comprises:
the measuring device acquires M template identification light patterns corresponding to the M identification light patterns, wherein the M template identification light patterns are used for distinguishing each template light pattern in the N template light patterns, and each identification light pattern in the M identification light patterns is at least partially identical with the corresponding template identification light pattern;
the measuring device acquires N template light patterns corresponding to the M template identification light patterns.
8. The method according to claim 6 or 7, wherein M is equal to N, each of the M identification light patterns corresponds to one identification information, a different identification light pattern corresponds to a different identification information, and the identification information is an identification serial number or a template identification light pattern.
9. The method according to claim 6 or 7, wherein M is greater than N, and at least two of the M identification light patterns collectively correspond to one identification information, and the identification information is an identification serial number or a template identification light pattern.
10. The method of claim 6 or 7, wherein M is less than N, the M identification light patterns comprising first and second identification light patterns that are adjacent in position;
the first identification light pattern corresponds to first identification information;
the second identification light pattern corresponds to second identification information;
and in the N pieces of identification information which are arranged in sequence, third identification information is further included between the first identification information and the second identification information, the first identification light pattern and the second identification light pattern correspond to the third identification information together, and the identification information is an identification serial number or a template identification light pattern.
11. The method according to any one of claims 5 to 10, wherein the measuring means obtaining the N template light patterns corresponding to the N structured light patterns from the M identification light patterns comprises:
the measuring device identifies patterns corresponding to the M marking light patterns in the measuring image, wherein the patterns of the marking light patterns corresponding to different structured light patterns are different;
and the measuring device determines the N template light patterns corresponding to the N structured light patterns according to the patterns respectively corresponding to the M identification light patterns.
12. The method according to any one of claims 5 to 10, wherein the measuring means obtaining the N template light patterns corresponding to the N structured light patterns from the M identification light patterns comprises:
the measuring device identifies coding information carried by the M marking light patterns in the measuring image, wherein the coding information carried by the marking light patterns corresponding to different structured light patterns is different;
and the measuring device determines the N template light patterns corresponding to the N structured light patterns according to the coding information carried by the M identification light patterns respectively.
13. The method of claim 12, wherein the encoded information comprises a plurality of encoded values, the identified light pattern having a plurality of sub-patterns, at least one of a luminance or a color of each of the plurality of sub-patterns corresponding to the encoded values.
14. The method according to any one of claims 5 to 10, wherein the measuring device identifying the N structured light patterns and the M identification light patterns in the measurement image comprises:
the measuring device identifies M pieces of characteristic information corresponding to the M identification light patterns in the measured image, wherein the characteristic information of the identification light patterns corresponding to different structured light patterns is different;
the measuring device obtaining the N template light patterns corresponding to the N structured light patterns according to the M identification light patterns includes:
the measuring device determines the N template light patterns corresponding to the N structured light patterns according to the characteristic information respectively corresponding to the M identification light patterns based on artificial intelligence AI.
15. The method according to any one of claims 6 to 10, wherein the measuring means obtaining three-dimensional information of the object to be measured from the N differentiated structured-light patterns comprises:
The measuring device acquires a to-be-measured identification light pattern, wherein the to-be-measured identification light pattern is positioned between a first identification light pattern and a second identification light pattern, the first identification light pattern, the to-be-measured identification light pattern and the second identification light pattern are used for sequentially distinguishing three adjacent structural light patterns in the N structural light patterns;
the measuring device acquires first identification information, wherein the first identification information is the identification information corresponding to the identification light pattern to be measured;
the measuring device acquires second identification information, wherein the second identification information is positioned between the identification information corresponding to the first identification light pattern and the identification information corresponding to the second identification light pattern in N pieces of identification information which are arranged in sequence, and the identification information is an identification serial number or a template identification light pattern;
when the first identification information and the second identification information are at least partially identical, the measuring device acquires three-dimensional information of the object to be measured according to the distinguished N structured light patterns.
16. A measurement system, characterized in that the measurement system comprises a measurement device for:
Acquiring a measurement image, wherein the measurement image is formed by shooting an object to be measured, the measurement image comprises N structured light patterns and M identification light patterns, M is a positive integer greater than or equal to 1, and N is a positive integer greater than or equal to 2;
identifying the N structured light patterns and the M identification light patterns in the measurement image;
distinguishing each of the N structured light patterns according to the M identification light patterns;
and acquiring three-dimensional information of the object to be detected according to the distinguished N structured light patterns.
17. The measurement system of claim 16, further comprising a projection device and an image acquisition device;
the projection device is used for emitting structural light to the object to be detected so as to emit the N structural light patterns on the surface of the object to be detected; the device is also used for emitting identification light to the object to be detected so as to radiate the M identification light patterns on the surface of the object to be detected;
the image acquisition device is used for shooting the object to be measured by the image acquisition device so as to acquire the measurement image; and is also used for transmitting the measurement image to the measurement device.
18. The measurement system of claim 17, wherein the projection device is further configured to determine light intensities of the M identification light patterns irradiated on the surface of the object to be measured according to a state corresponding to the object to be measured.
19. The measurement system according to any one of claims 16 to 18, wherein the M identification light patterns correspond to N template light patterns, the measurement device being further configured to:
acquiring the N template light patterns corresponding to the N structure light patterns according to the M identification light patterns;
and acquiring three-dimensional information of the object to be detected according to the change of the N structured light patterns relative to the N template light patterns.
20. The measurement system of claim 19, wherein the measurement device is further configured to:
according to the M identification light patterns, obtaining the N template light patterns corresponding to the N structured light patterns includes:
acquiring an identification list, wherein the identification list comprises the corresponding relation between the identification light patterns and the identification serial numbers, the identification list also comprises the corresponding relation between the identification serial numbers and the template light patterns, and different identification serial numbers correspond to different template light patterns;
According to the identification list, N identification serial numbers corresponding to the M identification light patterns are obtained;
and acquiring N template light patterns corresponding to the N identification serial numbers according to the identification list.
21. The measurement system of claim 19, wherein the measurement device is further configured to:
obtaining M template identification light patterns corresponding to the M identification light patterns, wherein the M template identification light patterns are used for distinguishing each template light pattern in the N template light patterns, and each identification light pattern in the M identification light patterns is at least partially identical to the corresponding template identification light pattern;
and acquiring N template light patterns corresponding to the M template identification light patterns.
22. The measurement system according to any one of claims 19 to 21, wherein the measurement device is further configured to:
identifying patterns corresponding to the M marking light patterns in the measurement image, wherein the patterns of the marking light patterns corresponding to different structured light patterns are different;
and determining the N template light patterns corresponding to the N structured light patterns according to the patterns respectively corresponding to the M identification light patterns.
23. The measurement system according to any one of claims 19 to 21, wherein the measurement device is further configured to:
identifying coding information carried by the M marking light patterns in the measurement image, wherein the coding information carried by the marking light patterns corresponding to different structured light patterns is different;
and determining the N template light patterns corresponding to the N structured light patterns according to the coding information carried by the M identification light patterns respectively.
24. The measurement system according to any one of claims 19 to 21, wherein the measurement device is further configured to:
identifying M pieces of characteristic information corresponding to the M identification light patterns in the measurement image, wherein the characteristic information of the identification light patterns corresponding to different structured light patterns is different;
based on artificial intelligence AI, according to the characteristic information corresponding to the M identification light patterns, determining N template light patterns corresponding to the N structured light patterns.
CN202111322085.1A 2021-11-09 2021-11-09 Measurement method and measurement system Pending CN116105627A (en)

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