CN116090310A - Optimization method of multi-objective plastic packaging process parameters based on Taguchi test and response surface method - Google Patents

Optimization method of multi-objective plastic packaging process parameters based on Taguchi test and response surface method Download PDF

Info

Publication number
CN116090310A
CN116090310A CN202310150167.5A CN202310150167A CN116090310A CN 116090310 A CN116090310 A CN 116090310A CN 202310150167 A CN202310150167 A CN 202310150167A CN 116090310 A CN116090310 A CN 116090310A
Authority
CN
China
Prior art keywords
plastic packaging
process parameter
response surface
packaging process
quality index
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
CN202310150167.5A
Other languages
Chinese (zh)
Inventor
禹华宸
杨航
蔡志匡
刘璐
谢祖帅
郭宇锋
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Nanjing University of Posts and Telecommunications
Original Assignee
Nanjing University of Posts and Telecommunications
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nanjing University of Posts and Telecommunications filed Critical Nanjing University of Posts and Telecommunications
Priority to CN202310150167.5A priority Critical patent/CN116090310A/en
Publication of CN116090310A publication Critical patent/CN116090310A/en
Pending legal-status Critical Current

Links

Images

Classifications

    • GPHYSICS
    • G06COMPUTING; CALCULATING OR COUNTING
    • G06FELECTRIC DIGITAL DATA PROCESSING
    • G06F30/00Computer-aided design [CAD]
    • G06F30/20Design optimisation, verification or simulation
    • G06F30/23Design optimisation, verification or simulation using finite element methods [FEM] or finite difference methods [FDM]
    • GPHYSICS
    • G06COMPUTING; CALCULATING OR COUNTING
    • G06FELECTRIC DIGITAL DATA PROCESSING
    • G06F2119/00Details relating to the type or aim of the analysis or the optimisation
    • G06F2119/08Thermal analysis or thermal optimisation
    • GPHYSICS
    • G06COMPUTING; CALCULATING OR COUNTING
    • G06FELECTRIC DIGITAL DATA PROCESSING
    • G06F2119/00Details relating to the type or aim of the analysis or the optimisation
    • G06F2119/14Force analysis or force optimisation, e.g. static or dynamic forces

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Theoretical Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Evolutionary Computation (AREA)
  • Geometry (AREA)
  • General Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Injection Moulding Of Plastics Or The Like (AREA)

Abstract

本发明公开了一种基于田口试验和响应面法的多目标塑封工艺参数优化方法,涉及芯片塑封工艺技术领域,通过选取试验所需工艺参数,采用田口法设计实验表;建立有限元模型,模拟仿真得出质量指标,计算信噪比;采用信噪比的极差分析法确定各质量指标权重;针对多目标质量指标采用百分制加权的综合评分的极差分析法确定工艺参数的综合影响程度排名;将综合影响程度排名靠前的工艺参数作为设计变量,建立与质量指标之间的响应面模型;基于拟合好的响应面模型,采用多目标遗传算法进行寻优;根据试验数据和响应面模型建立芯片塑封工艺参数优化系统,从而提高获取最优工艺参数组合的精确性,提高生产效率,满足芯片塑封的生产周期和产品质量要求。

Figure 202310150167

The invention discloses a multi-objective plastic packaging process parameter optimization method based on Taguchi test and response surface method, and relates to the technical field of chip plastic packaging technology. By selecting the process parameters required for the test, the Taguchi method is used to design the experimental table; a finite element model is established to simulate The quality index is obtained by simulation, and the signal-to-noise ratio is calculated; the weight of each quality index is determined by the range analysis method of the signal-to-noise ratio; the comprehensive influence degree ranking of the process parameters is determined by the range analysis method of the comprehensive score weighted by the percentage system for the multi-objective quality index ;Take the process parameters with the highest comprehensive influence degree as the design variables, and establish a response surface model with the quality index; based on the fitted response surface model, use a multi-objective genetic algorithm for optimization; The model establishes a chip plastic packaging process parameter optimization system, thereby improving the accuracy of obtaining the optimal process parameter combination, improving production efficiency, and meeting the production cycle and product quality requirements of chip plastic packaging.

Figure 202310150167

Description

基于田口试验和响应面法的多目标塑封工艺参数优化方法Multi-objective plastic packaging process parameter optimization method based on Taguchi test and response surface method

技术领域technical field

本发明涉及芯片塑封工艺技术领域,特别是涉及一种基于田口试验和响应面法的多目标塑封工艺参数优化方法。The invention relates to the technical field of chip plastic packaging technology, in particular to a multi-objective plastic packaging process parameter optimization method based on Taguchi test and response surface method.

背景技术Background technique

传统芯片塑封工艺,为了保证产品的性能与质量,都需要工程师根据自己的经验对塑封工艺参数进行反复的调整,才能获得最佳产品质量,显然这种方法过度依赖工程师的工作经验,且无法保证芯片最终的成型质量,严重影响芯片生产速度和生产成本。In the traditional chip plastic packaging process, in order to ensure the performance and quality of the product, engineers need to repeatedly adjust the plastic packaging process parameters based on their own experience in order to obtain the best product quality. Obviously, this method relies too much on the engineer's work experience and cannot guarantee The final molding quality of the chip seriously affects the chip production speed and production cost.

面对芯片行业的激烈竞争,加工周期与上市时间要求越来越短,因此,缩短工艺参数设计时间势在必行,在智能制造时代,建立数学模型指导实际塑料制件生产越来越普遍,算法的运用在其生产过程中发挥的作用也越来越大。In the face of fierce competition in the chip industry, the processing cycle and time-to-market requirements are getting shorter and shorter. Therefore, it is imperative to shorten the design time of process parameters. In the era of intelligent manufacturing, it is more and more common to establish mathematical models to guide the actual production of plastic parts. The use of algorithms is also playing an increasing role in its production process.

发明内容Contents of the invention

为了解决以上技术问题,本发明提供一种基于田口试验和响应面法的多目标塑封工艺参数优化方法,包括以下步骤In order to solve the above technical problems, the present invention provides a multi-objective plastic packaging process parameter optimization method based on Taguchi test and response surface method, comprising the following steps

S1、选取试验所需塑封工艺参数,将各项塑封工艺参数划分不同水平组合,并采用田口法设计实验表;S1. Select the plastic sealing process parameters required for the test, divide each plastic sealing process parameter into different levels of combinations, and use the Taguchi method to design the experimental table;

S2、建立塑封产品有限元模型,模拟仿真得出质量指标,计算信噪比,统计到实验表;S2. Establish the finite element model of the plastic package product, obtain the quality index through simulation, calculate the signal-to-noise ratio, and put the statistics into the experimental table;

S3、采用信噪比的极差分析法得到各塑封工艺参数对单个质量指标影响程度排名,进而确定各质量指标权重;S3. Using the signal-to-noise ratio range analysis method to obtain the ranking of the influence degree of each plastic packaging process parameter on a single quality index, and then determine the weight of each quality index;

S4、针对多目标质量指标,采用百分制加权的综合评分的极差分析法,确定各塑封工艺参数的综合影响程度排名;S4. For multi-objective quality indicators, adopt the range analysis method of the comprehensive score weighted by the percentage system to determine the ranking of the comprehensive influence degree of each plastic packaging process parameter;

S5、将综合影响程度排名前三位的塑封工艺参数作为设计变量,以最小二乘法拟合响应面函数,建立与质量指标之间的响应面模型,并验证其精确性;S5. Taking the top three plastic packaging process parameters ranked in the comprehensive influence degree as design variables, using the least squares method to fit the response surface function, establishing a response surface model with quality indicators, and verifying its accuracy;

S6、基于拟合好的响应面模型,采用多目标遗传算法进行寻优,将算法寻优结果对比相应塑封工艺参数仿真结果进行验证;S6. Based on the fitted response surface model, the multi-objective genetic algorithm is used for optimization, and the algorithm optimization result is compared with the simulation result of the corresponding plastic packaging process parameters for verification;

S7、根据步骤S1中实验表中的试验数据和步骤S6中的响应面模型,建立芯片塑封工艺参数优化系统,芯片塑封工艺参数优化系统用于将产生的最优参数组合推送给工程师。S7. According to the test data in the experiment table in step S1 and the response surface model in step S6, establish a chip plastic packaging process parameter optimization system, and the chip plastic packaging process parameter optimization system is used to push the generated optimal parameter combination to engineers.

本发明进一步限定的技术方案是:The technical scheme further defined in the present invention is:

进一步的,步骤S1中,塑封工艺参数包括模具温度、塑料温度、冲胶压力、冲胶时间、熟化压力、熟化时间以及空气温度。Further, in step S1, the plastic sealing process parameters include mold temperature, plastic temperature, glue flushing pressure, glue flushing time, curing pressure, curing time and air temperature.

前所述的基于田口试验和响应面法的多目标塑封工艺参数优化方法,步骤S1中,通过Moldex3D推荐的成型条件参数与企业实际生产的工程样品数据,对各项塑封工艺参数划分不同水平组合;In the above-mentioned multi-objective plastic packaging process parameter optimization method based on Taguchi test and response surface method, in step S1, through the molding condition parameters recommended by Moldex3D and the engineering sample data actually produced by the enterprise, each plastic packaging process parameter is divided into different level combinations ;

采用田口法设计实验表,田口法采用软件Minitab设计正交表,选定因子和各自的水平值输入软件进行实验设计。Using the Taguchi method to design the experimental table, the Taguchi method uses the software Minitab to design the orthogonal table, and the selected factors and their respective level values are input into the software for the experimental design.

前所述的基于田口试验和响应面法的多目标塑封工艺参数优化方法,步骤S2中,质量指标设置为翘曲量、Von Mises应力、金线偏移、导线架偏移以及体积收缩率中的两种或者多种。In the aforementioned multi-objective plastic packaging process parameter optimization method based on Taguchi test and response surface method, in step S2, the quality index is set to warpage, Von Mises stress, gold wire offset, lead frame offset and volume shrinkage two or more of.

前所述的基于田口试验和响应面法的多目标塑封工艺参数优化方法,步骤2中,通过Rhino建立塑封产品有限元模型,然后导出表面网格,利用Moldex3D模流分析软件对表面网格进行模拟仿真得出质量指标;In the multi-objective plastic packaging process parameter optimization method based on the Taguchi test and the response surface method mentioned above, in step 2, the finite element model of the plastic packaging product is established through Rhino, and then the surface grid is exported, and the surface grid is analyzed using Moldex3D mold flow analysis software. Quality indicators obtained by simulation;

计算信噪比,信噪比基于望目、望大以及望小这三种特性进行分析。The signal-to-noise ratio is calculated, and the signal-to-noise ratio is analyzed based on the three characteristics of the eye, the large and the small.

前所述的基于田口试验和响应面法的多目标塑封工艺参数优化方法,步骤S3中,采用信噪比的极差分析法得到各塑封工艺参数对质量指标影响的权重R值,R值越大,影响程度越大;In the aforementioned multi-objective plastic packaging process parameter optimization method based on Taguchi test and response surface method, in step S3, the weight R value of each plastic packaging process parameter affecting the quality index is obtained by using the range analysis method of signal-to-noise ratio. Larger, the greater the degree of influence;

选用正交试验信噪比结果作为影响程度指标,将所有的去量纲化的信噪比加和,进而确定各质量指标权重。The signal-to-noise ratio results of the orthogonal test are selected as the index of influence degree, and all the dedimensionalized signal-to-noise ratios are summed up to determine the weight of each quality index.

前所述的基于田口试验和响应面法的多目标塑封工艺参数优化方法,步骤S4中,根据步骤S3确定权重分配,按百分制加权,百分制加权评判公式为:In the multi-objective plastic packaging process parameter optimization method based on Taguchi test and response surface method mentioned above, in step S4, the weight distribution is determined according to step S3, weighted by the percentage system, and the weighted evaluation formula of the percentage system is:

Figure BDA0004090481800000031
Figure BDA0004090481800000031

其中,i表示试验序号,Yi表示第i组试验综合评分,wk表示权重占比,Yki表示质量指标数据结果。Among them, i represents the test sequence number, Y i represents the comprehensive score of the i-th group of tests, w k represents the weight ratio, and Y ki represents the quality index data results.

前所述的基于田口试验和响应面法的多目标塑封工艺参数优化方法,步骤S5中,去除对质量指标影响排名后三位的塑封工艺参数,将综合影响程度排名前三位的塑封工艺参数作为设计变量,采用Design-Expert中的Box-Behnken法,以最小二乘法拟合响应面函数,建立与质量指标之间的响应面模型,并选取方差和残差验证其精确性。In the above-mentioned multi-objective plastic packaging process parameter optimization method based on Taguchi test and response surface method, in step S5, remove the last three plastic packaging process parameters that affect the quality index, and rank the top three plastic packaging process parameters in terms of comprehensive influence As a design variable, the Box-Behnken method in Design-Expert was used to fit the response surface function with the least square method, and the response surface model between the quality index and the quality index was established, and the variance and residual error were selected to verify its accuracy.

前所述的基于田口试验和响应面法的多目标塑封工艺参数优化方法,步骤S6中,基于拟合好的响应面模型,利用MATLAB自带的遗传算法工具箱进行多目标寻优,寻优范围为步骤S1中所确定的水平划分范围,将算法寻优结果对比相应工艺参数仿真结果进行验证,其中被去除的工艺参数数值取步骤S1中所确定的水平划分范围的均值。The aforementioned multi-objective plastic packaging process parameter optimization method based on Taguchi test and response surface method, in step S6, based on the fitted response surface model, use the genetic algorithm toolbox that comes with MATLAB to perform multi-objective optimization. The range is the horizontal division range determined in step S1, and the algorithm optimization result is compared with the corresponding process parameter simulation results for verification, wherein the value of the removed process parameter is the mean value of the horizontal division range determined in step S1.

前所述的基于田口试验和响应面法的多目标塑封工艺参数优化方法,步骤S7中,根据步骤S1中实验表中的试验数据和步骤S6中的响应面模型,建立芯片塑封工艺参数优化系统,当工程师输入的工艺参数范围不在系统设定范围内时,芯片塑封工艺参数优化系统进行报错;当在系统设定范围内时,芯片塑封工艺参数优化系统将此有效范围内的最优参数组合推送给工程师,芯片塑封工艺参数优化系统推送的最优参数组合在给定任何参数值的情况下产生最佳的质量指标。In the aforementioned multi-objective plastic packaging process parameter optimization method based on Taguchi test and response surface method, in step S7, according to the test data in the experimental table in step S1 and the response surface model in step S6, a chip plastic packaging process parameter optimization system is established , when the process parameter range input by the engineer is not within the system setting range, the chip plastic packaging process parameter optimization system will report an error; when it is within the system setting range, the chip plastic packaging process parameter optimization system will combine the optimal parameters within the effective range Pushed to engineers, the optimal parameter combination pushed by the chip plastic packaging process parameter optimization system produces the best quality index under the condition of any given parameter value.

本发明的有益效果是:The beneficial effects of the present invention are:

本发明中,通过正交试验和信噪比的极差分析法确定各个工艺参数对单个质量指标的权重初步优化,然后通过百分制加权的综合评分的极差分析法确定工艺参数的综合影响程度排名二次优化,再将综合影响程度较大的工艺参数作为设计变量建立响应面模型的三次优化,最后开发出芯片塑封工艺参数优化系统,提高获取最优工艺参数组合的精确性,提高生产效率,满足当下芯片塑封的生产周期要求及产品质量要求。In the present invention, the initial optimization of the weight of each process parameter to a single quality index is determined by the orthogonal test and the range analysis method of the signal-to-noise ratio, and then the comprehensive influence degree ranking of the process parameters is determined by the range analysis method of the weighted comprehensive score of the percentage system The second optimization, and then the third optimization of the response surface model is established by taking the process parameters with a large comprehensive influence as the design variables, and finally develops the chip plastic packaging process parameter optimization system to improve the accuracy of obtaining the optimal process parameter combination and improve production efficiency. Meet the current production cycle requirements and product quality requirements of chip plastic packaging.

附图说明Description of drawings

图1为本发明的流程示意图;Fig. 1 is a schematic flow sheet of the present invention;

图2为本发明实施例的芯片塑封工艺仿真流程图。Fig. 2 is a simulation flow chart of the chip plastic packaging process according to the embodiment of the present invention.

具体实施方式Detailed ways

本实施例提供的一种基于田口试验和响应面法的多目标塑封工艺参数优化方法,如图1和图2所示,包括以下步骤A multi-objective plastic packaging process parameter optimization method based on Taguchi test and response surface method provided in this embodiment, as shown in Figure 1 and Figure 2, includes the following steps

S1、选取试验所需塑封工艺参数,塑封工艺参数包括模具温度、塑料温度、冲胶压力、冲胶时间、熟化压力、熟化时间以及空气温度;通过Moldex3D推荐的成型条件参数与企业实际生产的工程样品数据,对各项塑封工艺参数划分不同水平组合;S1. Select the plastic sealing process parameters required for the test. The plastic sealing process parameters include mold temperature, plastic temperature, glue punching pressure, glue punching time, curing pressure, curing time, and air temperature; the molding condition parameters recommended by Moldex3D are compared with the actual production projects of the company Sample data, divide different levels of combinations for each plastic packaging process parameter;

并采用田口法设计实验表,田口法采用软件Minitab设计正交表,选定因子和各自的水平值输入软件进行实验设计。The Taguchi method was used to design the experimental table, and the Taguchi method was used to design the orthogonal table using the software Minitab, and the selected factors and their respective level values were input into the software for the experimental design.

如下表1和表2所示,分别为塑封工艺参数的选取和实验参数的组合,表1的水平划分根据Moldex3D推荐的成型条件与企业实际生产的工程样品数据确定,表2通过Minitab分析软件中的田口正交试验设计,本实施例选取翘曲量与金线偏移量作为质量指标,表2中的C8-C12列输出正交试验的结果。As shown in Table 1 and Table 2 below, they are the selection of plastic sealing process parameters and the combination of experimental parameters. The horizontal division of Table 1 is determined according to the molding conditions recommended by Moldex3D and the actual engineering sample data produced by the enterprise. Table 2 is determined by the Minitab analysis software. Taguchi's orthogonal test design, this embodiment selects warpage and gold wire offset as quality indicators, and columns C8-C12 in Table 2 output the results of the orthogonal test.

表1试验因素及水平Table 1 Test factors and levels

Figure BDA0004090481800000051
Figure BDA0004090481800000051

表2田口试验设计表Table 2 Taguchi experimental design table

Figure BDA0004090481800000052
Figure BDA0004090481800000052

S2、通过Rhino建立塑封产品有限元模型,然后导出表面网格,利用Moldex3D模流分析软件对表面网格进行模拟仿真得出质量指标,质量指标设置为翘曲量和金线偏移量;计算信噪比,统计到实验表。S2. Establish the finite element model of the plastic packaging product through Rhino, and then export the surface mesh, use Moldex3D mold flow analysis software to simulate the surface mesh to obtain the quality index, and the quality index is set to warpage and gold wire offset; calculate Signal-to-noise ratio, statistics to the experiment table.

如表3所示,为统计后的实验表,作为质量指标的翘曲量和金线偏移量由于量纲不同,需要数据归一化处理,再将二者映射到[0,1]的数值空间中。As shown in Table 3, it is the experimental table after statistics. The warpage amount and the gold wire offset as quality indicators are different in dimension, so the data needs to be normalized, and then the two are mapped to [0, 1] in the numerical space.

表3田口试验设计表Table 3 Taguchi experimental design table

Figure BDA0004090481800000053
Figure BDA0004090481800000053

Figure BDA0004090481800000061
Figure BDA0004090481800000061

信噪比能够真实地反映出塑封工艺参数对质量指标数据的影响情况,信噪比可基于望目、望大和望小这三种特性进行分析,翘曲量与金线偏移量均是望小特性,不同特性的计算公式不同:The signal-to-noise ratio can truly reflect the influence of the plastic packaging process parameters on the quality index data. Small features, different calculation formulas for different features:

望小特性:

Figure BDA0004090481800000062
Hope small features:
Figure BDA0004090481800000062

其中,yi为第i次实验结果的实际计算值或测量值;Among them, y i is the actual calculated value or measured value of the ith experimental result;

望大特性:

Figure BDA0004090481800000063
Expect big features:
Figure BDA0004090481800000063

其中,yi为第i次实验结果的实际计算值或测量值;Among them, y i is the actual calculated value or measured value of the ith experimental result;

望目特性:

Figure BDA0004090481800000064
Wangmu features:
Figure BDA0004090481800000064

其中,

Figure BDA0004090481800000065
为均值,yi为第i次的实际值。in,
Figure BDA0004090481800000065
is the mean value, and y i is the actual value of the ith time.

S3、采用信噪比的极差分析法得到各塑封工艺参数对单个质量指标影响程度排名,进而确定各质量指标权重。S3. Using the signal-to-noise ratio range analysis method to obtain the ranking of the influence degree of each plastic packaging process parameter on a single quality index, and then determine the weight of each quality index.

如表4和表5所示,分别为由仿真结果分析得出的翘曲量平均信噪比响应和金线偏移量平均信噪比响应,通过极差分析列出各塑封工艺参数对质量指标影响的权重R值,R值越大,影响程度越大,展示各塑封工艺参数影响程度排序。As shown in Table 4 and Table 5, they are the average signal-to-noise ratio response of the warpage amount and the average signal-to-noise ratio response of the gold wire offset obtained from the analysis of the simulation results. The weight R value of the influence of the index, the greater the R value, the greater the degree of influence, showing the ranking of the influence degree of each plastic packaging process parameter.

表4翘曲量的极差结果分析Table 4 Analysis of extreme difference in warpage

水平level A/℃A/℃ B/℃B/℃ C/MPaC/MPa D/sD/s E/MPaE/MPa F/sF/s G/sG/s 11 12.402012.4020 12.176312.1763 12.124012.1240 12.138012.1380 12.201012.2010 12.160512.1605 11.973911.9739 22 11.896311.8963 12.122012.1220 12.174412.1744 12.160312.1603 12.097312.0973 12.137812.1378 12.324412.3244 RR 0.50570.5057 0.05430.0543 0.05040.0504 0.02230.0223 0.10370.1037 0.02270.0227 0.35050.3505 排序to sort 11 44 55 77 33 66 22

表5金线偏移量的极差结果分析Table 5 Analysis of extreme difference results of gold wire offset

水平level A/℃A/℃ B/℃B/℃ C/MPaC/MPa D/sD/s E/MPaE/MPa F/sF/s G/sG/s 11 16.715416.7154 17.194217.1942 17.207117.2071 16.988916.9889 17.198317.1983 17.188017.1880 17.204317.2043 22 17.677117.6771 17.198217.1982 17.185317.1853 17.403517.4035 17.194217.1942 17.204517.2045 17.188217.1882 RR 0.96170.9617 0.00400.0040 0.02180.0218 0.41460.4146 0.00410.0041 0.01650.0165 0.01610.0161 排序to sort 11 77 33 22 66 44 55

如表6所示,为各质量指标权重,通过将所有的信噪比加和,确定各质量指标权重。As shown in Table 6, it is the weight of each quality index, and the weight of each quality index is determined by adding all the signal-to-noise ratios.

表6各质量指标权重Table 6 The weight of each quality index

质量指标Quality Index 去量纲化均值dequantized mean 权重Weights 翘曲量Warpage 97.193197.1931 0.41400.4140 金线偏移gold wire offset 137.5697137.5697 0.58600.5860 总和sum 234.7628234.7628 11

S4、各个因素对不同产品指标的影响规律不同,需要通过百分制加权的综合评分的极差分析法确定工艺参数的综合影响程度排名,权重分配根据步骤S3确定,将计算结果统计到实验表。S4. Each factor has different influence laws on different product indexes. It is necessary to determine the ranking of the comprehensive influence degree of the process parameters through the range analysis method of the comprehensive score weighted by the percentage system. The weight distribution is determined according to step S3, and the calculation results are counted in the experiment table.

百分制加权评判公式为:Yi=w1×Y1i+w2×Y2iThe weighted judgment formula of the percentage system is: Y i =w 1 ×Y 1i +w 2 ×Y 2i ;

其中,i表示试验序号,Yi表示第i组试验综合评分,wk表示权重占比,Yki表示质量指标数据结果。Among them, i represents the test sequence number, Y i represents the comprehensive score of the i-th group of tests, w k represents the weight ratio, and Y ki represents the quality index data results.

如表7所示,为统计综合评分后的实验表;如表8所示,为仿真结果分析得出的百分制加权的综合评分响应。As shown in Table 7, it is the experimental table after the statistical comprehensive score; as shown in Table 8, it is the comprehensive score response of the weighted 100-point scale obtained from the analysis of the simulation results.

表7田口试验设计表Table 7 Taguchi test design table

Figure BDA0004090481800000081
Figure BDA0004090481800000081

表8综合评分的极差结果分析Table 8 Analysis of Extreme Poor Results of Comprehensive Score

水平level A/℃A/℃ B/℃B/℃ C/MPaC/MPa D/sD/s E/MPaE/MPa F/sF/s G/sG/s 11 0.18490.1849 0.18300.1830 0.18360.1836 0.18550.1855 0.18290.1829 0.18330.1833 0.18540.1854 22 0.18190.1819 0.18370.1837 0.18320.1832 0.18130.1813 0.18390.1839 0.18350.1835 0.18140.1814 RR 0.00300.0030 0.00070.0007 0.00040.0004 0.00420.0042 0.00100.0010 0.00020.0002 0.00400.0040 排序to sort 33 55 66 11 44 77 22

S5、去除对质量指标影响排名后三位的塑封工艺参数,将综合影响程度排名前三位的塑封工艺参数作为设计变量,采用Design-Expert中的Box-Behnken法,以最小二乘法拟合响应面函数,建立与质量指标之间的响应面模型,并选取方差和残差验证其精确性。S5. Remove the last three plastic packaging process parameters that have the highest impact on quality indicators, and use the top three plastic packaging process parameters with the highest comprehensive influence as design variables, and use the Box-Behnken method in Design-Expert to fit the response with the least squares method Surface function, establish a response surface model with quality indicators, and select variance and residual to verify its accuracy.

S6、基于拟合好的响应面模型,利用MATLAB自带的遗传算法工具箱进行多目标寻优,寻优范围为步骤S1中所确定的水平划分范围,将算法寻优结果对比相应工艺参数仿真结果进行验证,其中被去除的工艺参数数值取步骤S1中所确定的水平划分范围的均值。S6. Based on the fitted response surface model, use the genetic algorithm toolbox that comes with MATLAB to perform multi-objective optimization. The optimization range is the horizontal division range determined in step S1. Compare the algorithm optimization results with the corresponding process parameter simulation The result is verified, wherein the value of the removed process parameter takes the mean value of the horizontal division range determined in step S1.

S7、根据步骤S1中实验表中的试验数据和步骤S6中的响应面模型,建立芯片塑封工艺参数优化系统,当工程师输入的工艺参数范围不在系统设定范围内时,芯片塑封工艺参数优化系统进行报错;当在系统设定范围内时,芯片塑封工艺参数优化系统将此有效范围内的最优参数组合推送给工程师。S7. According to the test data in the experimental table in step S1 and the response surface model in step S6, establish a chip plastic packaging process parameter optimization system. When the process parameter range input by the engineer is not within the system setting range, the chip plastic packaging process parameter optimization system Make an error report; when it is within the system setting range, the chip plastic packaging process parameter optimization system will push the optimal parameter combination within this effective range to the engineer.

从而通过正交试验和信噪比的极差分析法确定各个工艺参数对单个质量指标的权重初步优化,然后通过百分制加权的综合评分的极差分析法确定工艺参数的综合影响程度排名二次优化,再将综合影响程度较大的工艺参数作为设计变量建立响应面模型的三次优化,最后开发出芯片塑封工艺参数优化系统,提高获取最优工艺参数组合的精确性,提高生产效率,满足当下芯片塑封的生产周期要求及产品质量要求。Therefore, the initial optimization of the weight of each process parameter to a single quality index is determined through the orthogonal test and the range analysis method of the signal-to-noise ratio, and then the secondary optimization of the ranking of the comprehensive influence degree of the process parameters is determined through the range analysis method of the weighted comprehensive score of the percentage system. , and then take the process parameters with greater comprehensive influence as the design variables to establish the three-time optimization of the response surface model, and finally develop the chip plastic packaging process parameter optimization system to improve the accuracy of obtaining the optimal process parameter combination, improve production efficiency, and meet the needs of the current chip industry. Production cycle requirements and product quality requirements for plastic packaging.

除上述实施例外,本发明还可以有其他实施方式。凡采用等同替换或等效变换形成的技术方案,均落在本发明要求的保护范围。In addition to the above-mentioned embodiments, the present invention can also have other implementations. All technical solutions formed by equivalent replacement or equivalent transformation fall within the scope of protection required by the present invention.

Claims (10)

1. A multi-target plastic packaging process parameter optimization method based on a field test and a response surface method is characterized by comprising the following steps of: comprises the following steps
S1, selecting plastic packaging process parameters required by a test, dividing the plastic packaging process parameters into different horizontal combinations, and designing an experiment table by a field opening method;
s2, establishing a finite element model of the plastic package product, obtaining a quality index through simulation, calculating a signal-to-noise ratio, and counting to an experiment table;
s3, obtaining the degree of influence ranking of each plastic package process parameter on a single quality index by adopting a signal-to-noise ratio range analysis method, and further determining the weight of each quality index;
s4, determining comprehensive influence degree ranking of each plastic packaging process parameter by adopting a minimum analysis method of comprehensive scores weighted by a percentile system according to the multi-objective quality index;
s5, taking plastic packaging process parameters with the top three comprehensive influence degrees as design variables, fitting a response surface function by a least square method, establishing a response surface model between the response surface model and the quality index, and verifying the accuracy of the response surface model;
s6, optimizing by adopting a multi-target genetic algorithm based on the fitted response surface model, and comparing the algorithm optimizing result with the corresponding plastic package process parameter simulation result to verify;
and S7, establishing a chip plastic packaging process parameter optimization system according to the test data in the test table in the step S1 and the response surface model in the step S6, wherein the chip plastic packaging process parameter optimization system is used for pushing the generated optimal parameter combination to engineers.
2. The multi-objective plastic packaging process parameter optimization method based on the field test and the response surface method according to claim 1, wherein the method is characterized by comprising the following steps of: in the step S1, the plastic packaging process parameters include a mold temperature, a plastic temperature, a glue-pouring pressure, a glue-pouring time, a curing pressure, a curing time and an air temperature.
3. The multi-objective plastic packaging process parameter optimization method based on the field test and the response surface method according to claim 1, wherein the method is characterized by comprising the following steps of: in the step S1, different level combinations are divided for each plastic package process parameter through the molding condition parameters recommended by Moldex3D and engineering sample data actually produced by enterprises;
the experimental table is designed by using a field method, the field method adopts a software Minitab to design an orthogonal table, and factors and respective horizontal values are selected to input the software for experimental design.
4. The multi-objective plastic packaging process parameter optimization method based on the field test and the response surface method according to claim 1, wherein the method is characterized by comprising the following steps of: in the step S2, the quality index is set to two or more of warpage, von Mises stress, gold wire offset, lead frame offset, and volume shrinkage.
5. The multi-objective plastic packaging process parameter optimization method based on the field test and the response surface method according to claim 1, wherein the method is characterized by comprising the following steps of: in the step 2, a finite element model of the plastic package product is built through Rhino, then a surface grid is derived, and the surface grid is simulated by utilizing Moldex3D model flow analysis software to obtain a quality index;
and calculating a signal-to-noise ratio, wherein the signal-to-noise ratio is analyzed based on three characteristics of looking, looking big and looking small.
6. The multi-objective plastic packaging process parameter optimization method based on the field test and the response surface method according to claim 1, wherein the method is characterized by comprising the following steps of: in the step S3, a range analysis method of signal to noise ratio is adopted to obtain a weight R value of each plastic package process parameter affecting the quality index, and the larger the R value is, the larger the affecting degree is;
and selecting an orthogonal test signal-to-noise ratio result as an influence degree index, and summing all the dimensionalized signal-to-noise ratios to further determine the weight of each quality index.
7. The multi-objective plastic packaging process parameter optimization method based on the field test and the response surface method according to claim 1, wherein the method is characterized by comprising the following steps of: in the step S4, weight allocation is determined according to the step S3, and the weight is weighted according to a percentage system, where a percentage system weight evaluation formula is as follows:
Figure FDA0004090481790000021
wherein i represents test number, Y i Represents the i-th group test comprehensive score, w k Represents the weight ratio, Y ki Representing the quality index data results.
8. The multi-objective plastic packaging process parameter optimization method based on the field test and the response surface method according to claim 1, wherein the method is characterized by comprising the following steps of: in the step S5, the plastic packaging process parameters with three ranked positions affecting the quality index are removed, the plastic packaging process parameters with the three ranked positions affecting the degree of the comprehensive effect are used as Design variables, a Box-Behnken method in Design-Expert is adopted, a response surface function is fitted by a least square method, a response surface model between the Design-Expert and the quality index is established, and variance and residual errors are selected to verify the accuracy of the response surface model.
9. The multi-objective plastic packaging process parameter optimization method based on the field test and the response surface method according to claim 1, wherein the method is characterized by comprising the following steps of: in the step S6, based on the fitted response surface model, the MATLAB is utilized to perform multi-objective optimization by using the genetic algorithm tool box, the optimizing range is the horizontal dividing range determined in the step S1, the algorithm optimizing result is verified against the corresponding process parameter simulation result, and the removed process parameter value takes the average value of the horizontal dividing range determined in the step S1.
10. The multi-objective plastic packaging process parameter optimization method based on the field test and the response surface method according to claim 1, wherein the method is characterized by comprising the following steps of: in the step S7, a chip plastic package process parameter optimization system is established according to the test data in the test table in the step S1 and the response surface model in the step S6, and when the process parameter range input by the engineer is not within the system setting range, the chip plastic package process parameter optimization system performs error reporting; when the parameters are within the set range of the system, the optimal parameter combination in the effective range is pushed to an engineer by the chip plastic package process parameter optimization system, and the optimal parameter combination pushed by the chip plastic package process parameter optimization system generates the optimal quality index under the condition of giving any parameter value.
CN202310150167.5A 2023-02-22 2023-02-22 Optimization method of multi-objective plastic packaging process parameters based on Taguchi test and response surface method Pending CN116090310A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN202310150167.5A CN116090310A (en) 2023-02-22 2023-02-22 Optimization method of multi-objective plastic packaging process parameters based on Taguchi test and response surface method

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN202310150167.5A CN116090310A (en) 2023-02-22 2023-02-22 Optimization method of multi-objective plastic packaging process parameters based on Taguchi test and response surface method

Publications (1)

Publication Number Publication Date
CN116090310A true CN116090310A (en) 2023-05-09

Family

ID=86204447

Family Applications (1)

Application Number Title Priority Date Filing Date
CN202310150167.5A Pending CN116090310A (en) 2023-02-22 2023-02-22 Optimization method of multi-objective plastic packaging process parameters based on Taguchi test and response surface method

Country Status (1)

Country Link
CN (1) CN116090310A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN117305016A (en) * 2023-10-19 2023-12-29 湖南师范大学 Refined oil neutralization process optimization control method based on intelligent decision-making mode mining
CN117910363A (en) * 2024-03-19 2024-04-19 中国汽车技术研究中心有限公司 Collision simulation optimization method, device and equipment for electric two-wheel vehicle and storage medium

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN117305016A (en) * 2023-10-19 2023-12-29 湖南师范大学 Refined oil neutralization process optimization control method based on intelligent decision-making mode mining
CN117910363A (en) * 2024-03-19 2024-04-19 中国汽车技术研究中心有限公司 Collision simulation optimization method, device and equipment for electric two-wheel vehicle and storage medium

Similar Documents

Publication Publication Date Title
CN116090310A (en) Optimization method of multi-objective plastic packaging process parameters based on Taguchi test and response surface method
CN112115635B (en) A deep learning-based injection molding process optimization method
CN103810328B (en) Transformer maintenance decision method based on hybrid model
CN103336869B (en) A kind of Multipurpose Optimal Method based on Gaussian process simultaneous MIMO model
CN109035730A (en) It is a kind of to consider that the concrete dam that Service Environment influences damages dynamic warning method
CN103559369B (en) Circuit yield estimation method based on CAD Monte Carlo analysis
CN101520652A (en) Method for evaluating service reliability of numerical control equipment
CN112199875A (en) Component welding point random vibration fatigue life distribution prediction method based on rain flow method
CN105488297A (en) Method for establishing complex product optimization design agent model based on small sample
CN112257303A (en) Thermal simulation model-based temperature stability time testing method
CN113190424A (en) Fuzzy comprehensive evaluation method for knowledge graph recommendation system
CN112906331A (en) Standard unit delay model construction method based on logarithmic expansion skewed state distribution
CN105893665B (en) It is a kind of using combination weighting-grey correlation machine tool beam optimization design appraisal procedure
CN119337503A (en) Production process optimization method, system, device and storage medium for automobile parts
US20070180411A1 (en) Method and apparatus for comparing semiconductor-related technical systems characterized by statistical data
CN116306220A (en) Rolling force prediction method based on quantum particle swarm algorithm and BP neural network
CN118709245B (en) Storage tank layering configuration method, equipment and medium based on digital twin
CN106599448A (en) Dynamic reliability-based gear system tolerance optimization calculation method
CN114036875A (en) Method and system for obtaining thermophysical parameters of supercritical fluid working medium
CN101477582B (en) Model modification method for a semiconductor device
CN113311795A (en) Intelligent production line product quality control method and system based on machine learning
CN106709167A (en) Similarity theory-based assembling validity assessment method
CN113688468B (en) Compensation method for creep aging simulation complex molded surface
CN116627089A (en) Small sample reliability modeling method for numerical control machine tool
CN105930552A (en) Tolerance determining method based on digital simulation technique

Legal Events

Date Code Title Description
PB01 Publication
PB01 Publication
SE01 Entry into force of request for substantive examination
SE01 Entry into force of request for substantive examination