CN116087665A - Aging test system and device - Google Patents
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- CN116087665A CN116087665A CN202310161434.9A CN202310161434A CN116087665A CN 116087665 A CN116087665 A CN 116087665A CN 202310161434 A CN202310161434 A CN 202310161434A CN 116087665 A CN116087665 A CN 116087665A
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Abstract
The invention discloses an aging test system and device. The burn-in test system comprises a power module, wherein the power module is used for connecting a device to be tested and supplying power to the device to be tested. And the load is connected with the device to be tested in series and is used for adjusting the current value input into the device to be tested. The driving module is connected with the device to be tested and used for outputting a first control signal. The first control signal is used for driving the device to be tested to work, the parameter acquisition module is used for acquiring parameter information of the device to be tested when working, the control module is connected with the parameter module, and the control module is used for determining an aging test result of the device to be tested according to the parameter information. The technical scheme provided by the embodiment of the invention realizes that the working environments of the power devices under different working conditions are simulated through the aging test, so as to achieve the effect of screening out the devices which fail due to unsuitable working conditions in practical application.
Description
Technical Field
The invention relates to the technical field of aging test, in particular to an aging test system and an aging test device.
Background
The power device is an electronic device with wide application, static test and dynamic test can be carried out when the power device leaves a factory, and the device with weak, invalid and out-of-range parameters is screened out. However, in practical application, the power device may be aged and disabled due to high temperature generated by unsuitable working conditions. The existing test system cannot meet the aging test requirement of the power device, and in order to timely screen out devices which fail due to unsuitable working conditions in practical application, a set of aging test system needs to be established.
Disclosure of Invention
The invention provides a burn-in test system and device, which are used for solving the problem that the existing test system cannot meet the burn-in test requirement of a power device.
According to an aspect of the present invention, there is provided a burn-in test system including:
the power module is used for connecting the device to be tested and supplying power to the device to be tested;
the load is connected with the device to be tested in series and is used for adjusting the current value input into the device to be tested;
the driving module is connected with the device to be tested and is used for outputting a first control signal; the first control signal is used for driving the device to be tested to work;
the parameter acquisition module is used for acquiring parameter information of the device to be tested when in operation;
the control module is connected with the parameter module and is used for determining an aging test result of the device to be tested according to the parameter information.
Optionally, the burn-in test system further comprises:
the output end of the signal generation module is connected with the input end of the driving module, and the signal generation module is used for outputting a second control signal;
the frequency of the second control signal is matched with the switching frequency of the device to be tested, and the duty ratio of the second control signal is matched with the duty ratio of the device to be tested.
Optionally, the voltage of the power module is adjustable, and the power module is used for adjusting the working voltage information of the device to be tested;
the load is adjustable, and the load is used for changing resistance information so as to adjust current information of the device to be tested;
the driving module is used for adjusting the switching frequency and the duty ratio of the device to be tested.
Optionally, the parameter obtaining module is used for obtaining initial temperature information of the device to be tested and temperature information after working for a preset time; the parameter information comprises initial temperature information and temperature information after working for a preset time;
the control module is used for calculating test temperature rise information according to the temperature information and the initial temperature information; comparing the test temperature rise information with preset standard temperature rise information, and determining an aging test result of the device to be tested according to the comparison result;
the preset standard temperature rise information is determined by working voltage information, resistance information, switching frequency and duty ratio.
Optionally, after the temperature rise value of the device to be tested reaches a preset value and the device to be tested is controlled to run for a preset time,
the parameter acquisition module is used for acquiring current information of the device to be tested; wherein the parameter information includes current information;
the control module is used for determining an aging test result of the device to be tested according to the current information and the preset standard current information.
Optionally, the burn-in system further comprises:
the base is connected with the power module and the load and is used for connecting a device to be tested.
Optionally, the driving module includes:
the input end of the optical coupling unit is connected with the output end of the signal generation module, and the optical coupling unit is used for outputting a first control signal according to the control signal so as to set the switching frequency and the duty ratio of the device to be tested;
the adjusting unit is connected with the optocoupler unit and the control end of the device to be measured and is used for adjusting the response speed of the device to be measured.
Optionally, the optocoupler unit includes:
the first resistor, the second resistor, the third resistor and the first optocoupler;
the first end of the first resistor is connected with the output end of the signal generation module, the second end of the first resistor is connected with the first end of the second resistor and the first end of the first optical coupler, the second end of the second resistor is connected with the first end of the third resistor and the third end of the first optical coupler, and the second end of the third resistor is grounded.
Optionally, the adjusting unit comprises;
the fourth resistor, the fifth resistor and the first diode;
the first end of the fourth resistor is connected with the fifth end of the first optocoupler and the first end of the fifth resistor, the second end of the fourth resistor is connected with the control end of the device to be tested and the anode of the first diode, and the second end of the fifth resistor is connected with the cathode of the first diode.
In a second aspect, an embodiment of the present invention provides a burn-in test apparatus, including at least one burn-in test system set forth in any of the foregoing aspects.
The technical scheme of the embodiment of the invention comprises a power supply module, a load, a driving module, a parameter acquisition module and a control module, wherein the power supply module is connected with a device to be tested, the load is connected with the device to be tested in series, the driving module is connected with the device to be tested, and the control module is connected with the parameter acquisition module. The power module supplies power to the device to be tested, the load adjusts the current value input into the device to be tested, and the driving module outputs a first control signal to drive the device to be tested to work so as to start the burn-in test. The parameter acquisition module acquires parameter information of the device to be tested in operation, and the control module determines an aging test result of the device to be tested according to the parameter information of the device to be tested. The aging detection circuit provided by the invention can simulate the working environments of the power device under different working conditions to judge whether the power device fails or not, so that the failed device is screened out.
It should be understood that the description in this section is not intended to identify key or critical features of the embodiments of the invention or to delineate the scope of the invention. Other features of the present invention will become apparent from the description that follows.
Drawings
In order to more clearly illustrate the technical solutions of the embodiments of the present invention, the drawings required for the description of the embodiments will be briefly described below, and it is apparent that the drawings in the following description are only some embodiments of the present invention, and other drawings may be obtained according to these drawings without inventive effort for a person skilled in the art.
FIG. 1 is a schematic diagram of an aging test system according to an embodiment of the present invention;
FIG. 2 is a schematic diagram of another burn-in system according to an embodiment of the present invention;
FIG. 3 is a schematic diagram of a burn-in system according to an embodiment of the present invention;
FIG. 4 is a schematic diagram of a burn-in system according to an embodiment of the present invention;
fig. 5 is a schematic structural diagram of an aging testing apparatus according to an embodiment of the present invention.
Detailed Description
In order that those skilled in the art will better understand the present invention, a technical solution in the embodiments of the present invention will be clearly and completely described below with reference to the accompanying drawings in which it is apparent that the described embodiments are only some embodiments of the present invention, not all embodiments. All other embodiments, which can be made by those skilled in the art based on the embodiments of the present invention without making any inventive effort, shall fall within the scope of the present invention.
It should be noted that the terms "first," "second," and the like in the description and the claims of the present invention and the above figures are used for distinguishing between similar objects and not necessarily for describing a particular sequential or chronological order. It is to be understood that the data so used may be interchanged where appropriate such that the embodiments of the invention described herein may be implemented in sequences other than those illustrated or otherwise described herein. Furthermore, the terms "comprises," "comprising," and "having," and any variations thereof, are intended to cover a non-exclusive inclusion, such that a process, method, system, article, or apparatus that comprises a list of steps or elements is not necessarily limited to those steps or elements expressly listed but may include other steps or elements not expressly listed or inherent to such process, method, article, or apparatus.
Fig. 1 is a schematic structural diagram of an aging test system according to an embodiment of the present invention. Referring to fig. 1, the burn-in test system provided in an embodiment of the present invention includes a power module 10, where the power module 10 is used to connect with a device under test 30 and supply power to the device under test 30. The load 20, the load 20 is connected in series with the device under test 30, and the load 20 is used for adjusting the current value input to the device under test 30. The driving module 40 is connected with the device to be tested 30, and the driving module 40 is used for outputting a first control signal; wherein the first control signal is used to drive the device under test 30 to operate. The parameter obtaining module 50 is configured to obtain parameter information of the device under test 30 during operation. The control module 60, the control module 60 is connected with the parameter module, and the control module 60 is used for determining the aging test result of the device under test 30 according to the parameter information.
Specifically, burn-in testing is to drive the power device for a period of time under certain temperature conditions, which causes various potential drawbacks inside the power device to be exposed, so as to screen out invalid devices. The power module 10 is connected with the device under test 30 for supplying power to the device under test 30, and the load 20 and the device under test 30 are connected in series on the loop of the power module 10 for adjusting the current value input into the device under test 30. The driving module 40 is connected to the control terminal of the device under test 30, and the driving module 40 can output a first control signal to drive the device under test 30 to work. Along with the extension of the working time of the device under test 30, the temperature of the device under test 30 also gradually rises, and the burn-in test is started, the parameter obtaining module 50 obtains the parameter information of the device under test 30 and outputs the parameter information to the control module 60, and the control module 60 determines the burn-in test result of the device under test 30 according to the parameter information.
For example, if a power device needs to be subjected to burn-in test, the power module 10 supplies power to the device under test 30, the load 20 adjusts the current value input into the device under test 30, the driving module 40 outputs a first control signal to drive the device under test 30 to work, the temperature of the device under test 30 gradually increases, and the burn-in test is started. The parameter obtaining module 50 obtains parameter information of the device under test 30 during operation and outputs the parameter information to the control module 60, and the control module 60 determines an aging test result of the device under test 30 according to the parameter information of the device under test 30.
The aging test system provided by the embodiment of the invention comprises a power supply module 10, a load 20, a driving module 40, a parameter acquisition module 50 and a control module 60. By connecting the power module 10 with the device 30 to be tested, the load 20 is connected in series with the device 30 to be tested, the driving module 40 is connected with the control end of the device 30 to be tested, and the control module 60 is connected with the parameter acquisition module 50, the power device is subjected to burn-in test to determine whether the power device fails, and then the failed device is screened out.
Optionally, fig. 2 is a schematic structural diagram of another burn-in testing system according to an embodiment of the present invention. On the basis of the above embodiment, referring to fig. 2, the burn-in test system further includes a signal generating module 70, an output end of the signal generating module 70 is connected to an input end of the driving module 40, and the signal generating module 70 is configured to output a second control signal. Wherein, the frequency of the second control signal is matched with the switching frequency of the device under test 30, and the duty cycle of the second control signal is matched with the duty cycle of the device under test 30.
Specifically, an output end of the signal generating module 70 is connected to an input end of the driving module 40, and is configured to output a second control signal to the driving module 40. After the signal generating module 70 outputs the second control signal to the driving module 40, the driving module 40 adjusts and outputs the first control signal according to the frequency and the duty cycle of the second control signal, and the device under test 30 starts to operate according to the frequency and the duty cycle of the first control signal. At this time, the switching frequency of the device under test 30 is matched with the frequency of the second control signal, and the duty cycle of the device under test 30 is matched with the duty cycle of the second control signal. The switching frequency and the duty ratio of the device 30 to be tested can be adjusted according to the test requirement, so that the requirements of testing the working states of the power devices under different working conditions can be met.
Optionally, with continued reference to fig. 2 based on the above embodiment, the voltage of the power module 10 is adjustable, and the power module 10 is used to adjust the operating voltage information of the device under test 30. The load 20 is adjustable, the load 20 being used to change the resistance information to adjust the current information of the device under test 30. The driving module 40 is used for adjusting the switching frequency and the duty cycle of the device under test 30.
Specifically, the power module 10 provides an operating voltage for the test system. The operating voltage of the device under test 30 may be varied by adjusting the voltage of the power module 10. The load 20 is connected in series with the device under test 30, and adjusting the resistance information of the load 20 can change the current information of the device under test 30, when the resistance of the load 20 increases, the current of the device under test 30 decreases, and when the resistance of the load 20 decreases, the current of the device under test 30 increases. The driving module 40 outputs a first control signal to control the device under test 30 to operate, and adjusting the frequency and duty cycle of the first control signal can change the switching frequency and duty cycle of the device under test 30. The setting enables the working voltage, the current information, the switching frequency and the duty ratio of the device to be tested to be adjustable, can meet the aging test under various conditions, and screens the power devices meeting different application conditions. Illustratively, the power supply module may be an adjustable direct current power supply and the load may be an electronic load.
Optionally, based on the above embodiment, referring to fig. 2, the parameter obtaining module 50 is configured to obtain initial temperature information of the device under test 30 and temperature information after a preset time of operation. The parameter information comprises initial temperature information and temperature information after working for a preset time. The control module 60 is used for calculating test temperature rise information according to the temperature information and the initial temperature information; and comparing the test temperature rise information with preset standard temperature rise information, and determining the aging test result of the device under test 30 according to the comparison result. The preset standard temperature rise information is determined by working voltage information, resistance information, switching frequency and duty ratio.
Specifically, the device under test 30 will run for a predetermined time after the burn-in test is initiated. The preset time is a time required for performing the burn-in test, and may be, for example, 24 hours. The parameter obtaining module 50 obtains initial temperature information of the device under test 30 just after starting the test and temperature information after working for a preset time, and the control module 60 calculates test temperature rise information by subtracting the initial temperature information and the temperature information. Comparing the test temperature rise information with the preset standard temperature rise information can determine whether the device under test 30 passes the burn-in test. The preset temperature rise information is a temperature rise value generated after the device to be tested is subjected to aging test in theory, and the preset standard temperature rise information is calculated by the following formula:
P tot ＝f sw *(E on +E off )+V cesat *I c *D (2)
ΔT＝P tot *R th (3)
wherein I is c For the current of the device under test, V bus R is the working voltage of the device to be tested d The resistance value of the load, D is the duty ratio of the device to be tested, f sw For the switching frequency, P, of the device to be tested tot For actual loss of the device under test E on For the turn-on loss of the device under test E off For the turn-off loss of the device under test, V cesat For the static parameters of the device to be tested, deltaT is the preset standard temperature rise information of the device to be tested, R th Is a thermal resistance parameter of the device to be tested. By combining the formulas (1), (2) and (3), the preset standard temperature rise information delta T of the device to be detected can be calculated. Opening loss E of device under test on Turn-off loss E of device under test off Static parameter V of device under test cesat And thermal resistance parameter R of the device under test th Are available from the specification of the device under test.
And comparing the test temperature rise information with preset standard temperature rise information, and considering the test error, if the test temperature rise information is not different from the preset standard temperature rise information by more than 10%, considering that the device 30 to be tested passes the burn-in test, otherwise, considering that the device 30 to be tested fails and fails the burn-in test. The device to be tested can judge whether the device to be tested passes the burn-in test or not through the temperature rise information of the device to be tested, and the test environment can be changed by adjusting the parameter information of the device to be tested, so that various test requirements are met.
Optionally, based on the above embodiment, referring to fig. 2, after the temperature rise value of the device under test 30 reaches a preset value and the device under test 30 is controlled to operate for a preset time, the parameter obtaining module 50 is configured to obtain current information of the device under test 30. The parameter information includes current information, and the control module 60 is configured to determine an aging test result of the device under test 30 according to the current information and preset standard current information.
Specifically, the result of the aging test can also be judged by comparing the current information with the preset standard current information. Referring to (1), (2) and (3), the preset standard current information is the current information of the device under test 30 when the device under test 30 operates with the preset standard temperature rise information. After the device under test 30 starts to operate, the temperature rise value of the device under test 30 reaches a preset value by adjusting the duty ratio of the device under test 30, and the device under test 30 is controlled to operate for a preset time. At this time, the parameter obtaining module 50 obtains the current information of the device under test 30, the control module 60 compares the current information of the device under test 30 with the preset standard current information, and considering the test error, if the current information of the device under test 30 differs from the preset standard current information by not more than 10%, the device under test 30 is considered to pass the burn-in test, otherwise, the device under test 30 is considered to fail, and the burn-in test is not passed. The device to be tested can judge whether the device to be tested passes the burn-in test or not through the current information of the device to be tested, and the test environment can be changed by adjusting the parameter information of the device to be tested, so that various test requirements are met.
Optionally, fig. 3 is a schematic structural diagram of yet another burn-in testing system according to an embodiment of the present invention. On the basis of the above embodiment, referring to fig. 3, the burn-in system provided in this embodiment further includes a base 80, where the base 80 is connected to the power module 10 and the load 20, and the base 80 is used to connect to a device to be tested.
Specifically, the base 80 and the driving module 40 of the device 30 to be tested are arranged on one side of the circuit board, the power module 10 and the load 20 are connected with the device 30 to be tested through the base 80, and the base is arranged to facilitate the plugging and unplugging of the device to be tested, so that different devices to be tested can be tested conveniently.
Optionally, fig. 4 is a schematic structural diagram of yet another burn-in testing system according to an embodiment of the present invention. On the basis of the above embodiment, referring to fig. 4, the driving module 40 includes an optocoupler unit 41, an input end of the optocoupler unit 41 is connected to an output end of the signal generating module 70, and the optocoupler unit 41 is configured to output a first control signal according to the control signal to set the switching frequency and the duty ratio of the device under test 30. The adjusting unit 42, the adjusting unit 42 is connected with the optocoupler unit 41 and the control end of the device under test 30, and the adjusting unit 42 is used for adjusting the response speed of the device under test 30.
Specifically, the driving module 40 may include an optocoupler unit 41 and an adjusting unit 42, where the optocoupler unit 41 is connected to the output end of the signal generating module 70, and the adjusting unit 42 is connected to the optocoupler unit 41 and the control end of the device under test 30. The second control signal is input from the signal generation module 70 to the optocoupler module, which sets the switching frequency and the duty ratio of the first control signal according to the second control signal, and outputs the first control signal. The first control signal is output to the device under test 30 after passing through the adjusting unit 42, and the adjusting unit 42 can adjust the response speed of the device under test 30 to the first control signal by changing the resistance value.
Optionally, with continued reference to fig. 4 based on the foregoing embodiment, the optocoupler unit 41 includes a first resistor R1, a second resistor R2, a third resistor R3, and a first optocoupler 43, where a first end of the first resistor R1 is connected to an output end of the signal generating module 70, a second end of the first resistor R1 is connected to a first end of the second resistor R2 and a first end of the first optocoupler 43, a second end of the second resistor R2 is connected to a first end of the third resistor R3 and a third end of the first optocoupler 43, and a second end of the third resistor R3 is grounded.
Specifically, the signal generating module 70 outputs the second control signal to the first resistor R1, and the second control signal is output from the third terminal of the first optocoupler 43 after being input from the first terminal of the first optocoupler 43, and then is grounded through the third resistor R3. The first optocoupler 43 sets the switching frequency and the duty ratio of the device under test 30 according to the second control signal and outputs the first control signal from the fifth end of the first optocoupler 43 to the adjustment module. The arrangement can prevent the output first control signal from being influenced by the input second control signal, and has strong anti-interference capability and stable operation.
Optionally, with continued reference to fig. 4 based on the above embodiment, the adjusting unit 42 includes a fourth resistor R4, a fifth resistor R5, and a first diode 44, where a first end of the fourth resistor R4 is connected to a fifth end of the first optocoupler 43 and a first end of the fifth resistor R5, a second end of the fourth resistor R4 is connected to a control end of the device under test 30 and an anode of the first diode 44, and a second end of the fifth resistor R5 is connected to a cathode of the first diode 44.
Specifically, the first control signal is output from the fifth end of the first optocoupler 43 and then output to the device under test 30 through the fourth resistor R4. The response speed of the device under test 30 to the first control signal is affected by the fourth resistor R4 and the fifth resistor R5, when the fourth resistor R4 and the fifth resistor R5 are increased, the response speed of the device under test 30 is reduced, and when the fourth resistor R4 and the fifth resistor R5 are reduced, the response speed of the device under test 30 is increased. The response speed of the device 30 to be tested can be adjusted according to the requirement, and the test is convenient.
For example, if a power device is to be burn-in tested, the device under test 30 is first placed on the mount 80. The power module 10 supplies power to the device under test 30, the load 20 adjusts the current value input to the device under test 30, and the signal generating module 70 outputs a second control signal to the driving module 40. The second control signal is input from the first end of the first optocoupler 43 after passing through the first resistor R1, output from the third end of the first optocoupler 43, and then grounded through the third resistor R3. The first optocoupler 43 sets the switching frequency and the duty ratio of the device under test 30 according to the second control signal, and outputs a first control signal from the fifth end of the first optocoupler 43, where the first control signal is output to the device under test 30 through the fourth resistor R4. The response speed of the device under test 30 to the first control signal depends on the resistance values of the fourth resistor R4 and the fifth resistor R5, and after the device under test 30 starts to operate in response to the first control signal, the temperature of the device under test 30 gradually increases, and the burn-in test starts.
If the temperature information is used to determine the device under test 30, the parameter obtaining module 50 obtains initial temperature information of the device under test 30 immediately after starting the test and temperature information after a preset time of operation, and the control module 60 calculates test temperature rise information by subtracting the initial temperature information and the temperature information. And comparing the test temperature rise information with preset standard temperature rise information, if the difference between the test temperature rise information and the preset standard temperature rise information is not more than 10%, considering that the device 30 to be tested passes the burn-in test, otherwise, considering that the device 30 to be tested fails and fails the burn-in test.
If the current information is used to determine the device under test 30, after the device under test 30 starts to operate, the duty cycle of the device under test 30 is adjusted to make the temperature rise value of the device under test 30 reach a preset value, and the device under test 30 is controlled to operate for a preset time. The control module 60 compares the current information of the device under test 30 with the preset standard current information, if the current information of the device under test 30 differs from the preset standard current information by no more than 10%, the device under test 30 is considered to pass the burn-in test, otherwise, the device under test 30 is considered to fail, and the burn-in test is not passed.
According to the aging test system provided by the embodiment of the invention, the device to be tested can be judged through the temperature information or the current information, the temperature rise information or the current information of the device to be tested is calculated by acquiring the parameter information of the device to be tested, and the temperature rise information or the current information is compared with the preset standard temperature rise information or the preset standard current information, so that whether the device to be tested passes the test is judged. And the working parameters of the device to be tested can be adjusted, so that the aging test under various conditions can be met, and the power devices meeting different application conditions can be screened. The aging test system provided by the invention can screen out the failure device through the aging test, and can reduce the loss caused by failure due to mismatching of the power device and the application environment in practical application.
Optionally, fig. 5 is a schematic structural diagram of an aging testing apparatus according to an embodiment of the present invention. The embodiment of the present invention provides an aging test apparatus 200, which includes at least one aging test system 100 provided in any embodiment, and a plurality of aging test systems 100 are configured to perform a plurality of groups of tests at the same time, so as to improve the test efficiency.
It should be appreciated that various forms of the flows shown above may be used to reorder, add, or delete steps. For example, the steps described in the present invention may be performed in parallel, sequentially, or in a different order, so long as the desired results of the technical solution of the present invention are achieved, and the present invention is not limited herein.
The above embodiments do not limit the scope of the present invention. It will be apparent to those skilled in the art that various modifications, combinations, sub-combinations and alternatives are possible, depending on design requirements and other factors. Any modifications, equivalent substitutions and improvements made within the spirit and principles of the present invention should be included in the scope of the present invention.
Claims (10)
1. A burn-in test system, comprising:
the power module is used for connecting a device to be tested and supplying power to the device to be tested;
the load is connected with the device to be tested in series and is used for adjusting the current value input into the device to be tested;
the driving module is connected with the device to be tested and is used for outputting a first control signal; the first control signal is used for driving the device to be tested to work;
the parameter acquisition module is used for acquiring parameter information of the device to be tested when in operation;
the control module is connected with the parameter module and is used for determining an aging test result of the device to be tested according to the parameter information.
2. The burn-in system of claim 1, further comprising:
the output end of the signal generation module is connected with the input end of the driving module, and the signal generation module is used for outputting a second control signal;
the frequency of the second control signal is matched with the switching frequency of the device to be tested, and the duty ratio of the second control signal is matched with the duty ratio of the device to be tested.
3. The burn-in system of claim 1 wherein,
the voltage of the power supply module is adjustable, and the power supply module is used for adjusting the working voltage information of the device to be tested;
the load is adjustable, and is used for changing resistance information so as to adjust current information of the device to be tested;
the driving module is used for adjusting the switching frequency and the duty ratio of the device to be tested.
4. The burn-in system of claim 3 wherein,
the parameter acquisition module is used for acquiring initial temperature information of the device to be tested and temperature information after working for a preset time; the parameter information comprises initial temperature information and temperature information after working for a preset time;
the control module is used for calculating test temperature rise information according to the temperature information and the initial temperature information; comparing the test temperature rise information with preset standard temperature rise information, and determining an aging test result of the device to be tested according to a comparison result;
the preset standard temperature rise information is determined by the working voltage information, the resistance information, the switching frequency and the duty ratio.
5. The burn-in system of claim 3 wherein,
after the temperature rise value of the device to be tested reaches a preset value and the device to be tested is controlled to run for a preset time,
the parameter acquisition module is used for acquiring current information of the device to be tested; wherein the parameter information includes current information;
and the control module is used for determining the ageing test result of the device to be tested according to the current information and preset standard current information.
6. The burn-in system of claim 1, further comprising:
the base is connected with the power module and the load and is used for connecting the device to be tested.
7. The burn-in system of claim 1, wherein the drive module comprises:
the input end of the optical coupling unit is connected with the output end of the signal generation module, and the optical coupling unit is used for outputting a first control signal according to the control signal so as to set the switching frequency and the duty ratio of the device to be tested;
the adjusting unit is connected with the optocoupler unit and the control end of the device to be measured, and is used for adjusting the response speed of the device to be measured.
8. The optocoupler unit of claim 7, wherein the optocoupler unit comprises:
the first resistor, the second resistor, the third resistor and the first optocoupler;
the first end of the first resistor is connected with the output end of the signal generation module, the second end of the first resistor is connected with the first end of the second resistor and the first end of the first optocoupler, the second end of the second resistor is connected with the first end of the third resistor and the third end of the first optocoupler, and the second end of the third resistor is grounded.
9. The burn-in system of claim 8, wherein the conditioning unit comprises;
the fourth resistor, the fifth resistor and the first diode;
the first end of the fourth resistor is connected with the fifth end of the first optocoupler and the first end of the fifth resistor, the second end of the fourth resistor is connected with the control end of the device to be tested and the anode of the first diode, and the second end of the fifth resistor is connected with the cathode of the first diode.
10. A burn-in apparatus, comprising: at least one burn-in system according to any one of claims 1 to 9.
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