CN116073896B - Method, device, equipment and storage medium for determining test parameters - Google Patents
Method, device, equipment and storage medium for determining test parameters Download PDFInfo
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- 238000012360 testing method Methods 0.000 title claims abstract description 263
- 238000000034 method Methods 0.000 title claims abstract description 52
- 239000013307 optical fiber Substances 0.000 claims abstract description 133
- 230000003287 optical effect Effects 0.000 claims abstract description 97
- 238000005259 measurement Methods 0.000 claims abstract description 64
- 238000002347 injection Methods 0.000 claims description 38
- 239000007924 injection Substances 0.000 claims description 38
- 238000004364 calculation method Methods 0.000 claims description 6
- 239000000835 fiber Substances 0.000 claims description 4
- 238000000605 extraction Methods 0.000 claims description 2
- 238000012163 sequencing technique Methods 0.000 claims description 2
- 238000000253 optical time-domain reflectometry Methods 0.000 abstract description 25
- 238000004891 communication Methods 0.000 abstract description 2
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- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04B—TRANSMISSION
- H04B10/00—Transmission systems employing electromagnetic waves other than radio-waves, e.g. infrared, visible or ultraviolet light, or employing corpuscular radiation, e.g. quantum communication
- H04B10/07—Arrangements for monitoring or testing transmission systems; Arrangements for fault measurement of transmission systems
- H04B10/071—Arrangements for monitoring or testing transmission systems; Arrangements for fault measurement of transmission systems using a reflected signal, e.g. using optical time domain reflectometers [OTDR]
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- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04B—TRANSMISSION
- H04B10/00—Transmission systems employing electromagnetic waves other than radio-waves, e.g. infrared, visible or ultraviolet light, or employing corpuscular radiation, e.g. quantum communication
- H04B10/07—Arrangements for monitoring or testing transmission systems; Arrangements for fault measurement of transmission systems
- H04B10/075—Arrangements for monitoring or testing transmission systems; Arrangements for fault measurement of transmission systems using an in-service signal
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- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04B—TRANSMISSION
- H04B10/00—Transmission systems employing electromagnetic waves other than radio-waves, e.g. infrared, visible or ultraviolet light, or employing corpuscular radiation, e.g. quantum communication
- H04B10/07—Arrangements for monitoring or testing transmission systems; Arrangements for fault measurement of transmission systems
- H04B10/075—Arrangements for monitoring or testing transmission systems; Arrangements for fault measurement of transmission systems using an in-service signal
- H04B10/079—Arrangements for monitoring or testing transmission systems; Arrangements for fault measurement of transmission systems using an in-service signal using measurements of the data signal
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- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04B—TRANSMISSION
- H04B10/00—Transmission systems employing electromagnetic waves other than radio-waves, e.g. infrared, visible or ultraviolet light, or employing corpuscular radiation, e.g. quantum communication
- H04B10/07—Arrangements for monitoring or testing transmission systems; Arrangements for fault measurement of transmission systems
- H04B10/075—Arrangements for monitoring or testing transmission systems; Arrangements for fault measurement of transmission systems using an in-service signal
- H04B10/079—Arrangements for monitoring or testing transmission systems; Arrangements for fault measurement of transmission systems using an in-service signal using measurements of the data signal
- H04B10/0795—Performance monitoring; Measurement of transmission parameters
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Abstract
The invention relates to the field of optical fiber communication, and discloses a method, a device, equipment and a storage medium for determining test parameters. The method comprises the following steps: the method comprises the steps of obtaining a waveform curve obtained by testing a target optical fiber by an optical time domain reflectometer, extracting data points in the waveform curve, determining the length of the optical fiber based on a preset background noise threshold, obtaining an effective dynamic range required by testing the target optical fiber according to the data points corresponding to the length value of the optical fiber and the slope of the waveform curve, and determining measurement parameters of the optical time domain reflectometer based on the effective dynamic range and the length of the optical fiber. According to the method and the device, the test waveform curves under different gain coefficients are obtained and analyzed, and the minimum test pulse width and the optimal test distance are selected, so that the measurement parameters of the optical time domain reflectometer are determined, and the use threshold of the OTDR is reduced.
Description
Technical Field
The present invention relates to the field of optical fiber communications, and in particular, to a method, an apparatus, a device, and a storage medium for determining a test parameter.
Background
At present, when an optical time domain reflectometer (Optical Time Domain Reflectometer, OTDR) is used for measuring the performance of an optical fiber and detecting the integrity of the optical fiber, a laser or an optical pulse with higher power is injected from one end of the optical cable and reflected signals are received through the same side, but when the measurement is performed, proper measurement parameters are required to be set manually, namely, a traditional optical time domain reflectometer needs an operator to have a certain operation basis, and the problem of complicated measurement parameter setting exists.
Disclosure of Invention
The invention mainly aims to solve the problems that the conventional optical time domain reflectometer is complex in parameter setting and has a high use threshold.
The first aspect of the present invention provides a method for determining a test parameter, including: acquiring a waveform curve obtained by testing a target optical fiber by the optical time domain reflectometer, wherein the waveform curve is a splicing curve of a first waveform curve under a first gain coefficient and a second waveform curve under a second gain coefficient, and the splicing curve can completely cover the dynamic range of the optical time domain reflectometer; extracting each data point in the waveform curve, and determining the length of the optical fiber based on a preset background noise threshold value; obtaining an effective dynamic range required by testing the target optical fiber according to the data point corresponding to the optical fiber length value and the slope of the waveform curve; and determining measurement parameters of the optical time domain reflectometer based on the effective dynamic range and the optical fiber length, wherein the measurement parameters comprise a minimum pulse width and a measurement distance.
Optionally, in a first implementation manner of the first aspect of the present invention, the obtaining a waveform curve obtained by testing a target optical fiber by using the optical time domain reflectometer includes: acquiring a first waveform curve based on the first gain coefficient under a preset pulse width; acquiring a second waveform curve based on the second gain coefficient under a preset pulse width, wherein the first gain coefficient is smaller than the second gain coefficient, and the effective range of the first waveform curve is larger than the range of a saturation region of the second waveform curve; respectively acquiring event change areas of the first waveform curve and the second waveform curve, and determining a splicing point and an effective splicing area based on the event change areas; and dividing the first waveform curve and the second waveform curve based on the splicing points, and connecting the divided waveform curves with the effective splicing area to obtain a tested waveform curve.
Optionally, in a second implementation manner of the first aspect of the present invention, the extracting each data point in the waveform curve and determining the optical fiber length based on a preset noise floor threshold includes: extracting and identifying each data point in the waveform curve, calculating the noise value of each data point and sequencing; identifying the first data point smaller than the background noise threshold value on the waveform curve according to a preset background noise threshold value; and obtaining the length of the target optical fiber based on the value of the corresponding length axis of the data point in the waveform curve.
Optionally, in a third implementation manner of the first aspect of the present invention, the obtaining, according to the data point corresponding to the optical fiber length value and the slope of the waveform curve, an effective dynamic range required for testing the target optical fiber includes: calculating the slope of the non-abrupt part of the waveform curve, and taking the slope as the slope of the waveform curve; extending the initial end of the waveform curve based on the data point corresponding to the optical fiber length value and the slope of the waveform curve to obtain the first injection power of the waveform curve at the initial position; acquiring a second injection power corresponding to a data point corresponding to the optical fiber length value; and calculating the difference value of the first injection power and the second injection power to obtain the effective dynamic range required by testing the target optical fiber.
Optionally, in a fourth implementation manner of the first aspect of the present invention, the determining, based on the effective dynamic range and the optical fiber length, a measurement parameter of the optical time domain reflectometer includes: obtaining a minimum test pulse width capable of meeting the effective dynamic range according to the effective dynamic range; determining a test distance based on the measurement multiple relation of the optical fiber length; and configuring measurement parameters of the optical time domain reflectometer according to the minimum test pulse width and the test distance, and measuring.
Optionally, in a fifth implementation manner of the first aspect of the present invention, the obtaining, according to the effective dynamic range, a minimum test pulse width that can meet the effective dynamic range includes: determining a maximum injection power capable of covering the effective dynamic range according to the effective dynamic range; determining a test pulse width capable of meeting the effective dynamic range based on a preset corresponding relation table of the maximum injection power and the test pulse width, wherein the preset corresponding relation table corresponds to different maximum injection powers for different pulse widths; gradually reducing the test pulse width, and sequentially acquiring a test waveform curve based on the gradually reduced test pulse width value; and selecting a test pulse width corresponding to the waveform curve capable of covering the effective dynamic range based on the test waveform curve to obtain a minimum test pulse width.
Optionally, in a sixth implementation manner of the first aspect of the present invention, after the obtaining, according to the effective dynamic range, a minimum test pulse width that can meet the effective dynamic range, the method further includes: determining a maximum measurable length based on the effective dynamic range of the minimum test pulse width, and determining whether the maximum measurable length is greater than the optical fiber length; if yes, confirming that the minimum test pulse width is an effective minimum test pulse width, and reserving the pulse width value; if not, the minimum test pulse width is an invalid minimum test pulse width, the pulse width value is removed, and the test pulse width value in the last test is extracted as the minimum test pulse width.
The second aspect of the present invention provides a test parameter determining apparatus, including: the acquisition module is used for acquiring a waveform curve obtained by testing the target optical fiber by the optical time domain reflectometer, wherein the waveform curve is a splicing curve of a first waveform curve under a first gain coefficient and a second waveform curve under a second gain coefficient, and the splicing curve can completely cover the dynamic range of the optical time domain reflectometer; the extraction module is used for extracting each data point in the waveform curve and determining the length of the optical fiber based on a preset background noise threshold value; the calculation module is used for obtaining an effective dynamic range required by testing the target optical fiber according to the data point corresponding to the optical fiber length value and the slope of the waveform curve; and the setting module is used for determining measurement parameters of the optical time domain reflectometer based on the effective dynamic range and the optical fiber length, wherein the measurement parameters comprise a minimum pulse width and a measurement distance.
Optionally, in a first implementation manner of the second aspect of the present invention, the acquiring module includes:
the curve acquisition unit is used for acquiring a first waveform curve based on the first gain coefficient under a preset pulse width; acquiring a second waveform curve based on the second gain coefficient under a preset pulse width, wherein the first gain coefficient is smaller than the second gain coefficient, and the effective range of the first waveform curve is larger than the range of a saturation region of the second waveform curve;
the segmentation unit is used for respectively acquiring event change areas of the first waveform curve and the second waveform curve and determining a splicing point and an effective splicing area based on the event change areas;
and the splicing unit is used for dividing the first waveform curve and the second waveform curve based on the splicing points, and connecting the first waveform curve and the second waveform curve based on the divided waveform curve and the effective splicing area to obtain a tested waveform curve.
Optionally, in a second implementation manner of the second aspect of the present invention, the extracting module includes:
the sorting unit is used for extracting and identifying each data point in the waveform curve, calculating the noise value of each data point and sorting the data points;
The identification unit is used for identifying the first data point smaller than the background noise threshold value on the waveform curve according to a preset background noise threshold value;
and the determining unit is used for obtaining the length of the target optical fiber based on the value of the corresponding length axis of the data point in the waveform curve.
Optionally, in a third implementation manner of the second aspect of the present invention, the calculating module includes:
a slope calculation unit for calculating a slope of a non-abrupt portion of the waveform curve and taking the slope as a slope of the waveform curve;
the extension unit is used for extending the initial end of the waveform curve based on the data point corresponding to the optical fiber length value and the slope of the waveform curve to obtain the first injection power of the waveform curve at the initial position;
and the difference value calculation unit is used for acquiring second injection power corresponding to the data point corresponding to the optical fiber length value, calculating the difference value between the first injection power and the second injection power, and obtaining the effective dynamic range required by testing the target optical fiber.
Optionally, in a fourth implementation manner of the second aspect of the present invention, the setting module includes:
the selecting unit is used for obtaining a minimum test pulse width which can meet the effective dynamic range according to the effective dynamic range;
A determining unit for determining a test distance based on a measurement multiple relationship of the optical fiber length;
and the configuration unit is used for configuring the measurement parameters of the optical time domain 5 reflectometer according to the minimum test pulse width and the test distance and measuring the measurement parameters.
Optionally, in a fifth implementation manner of the second aspect of the present invention, the selecting unit is specifically configured to: determining a maximum injection power capable of covering the effective dynamic range according to the effective dynamic range; and determining that the effective condition can be met based on a preset corresponding relation table of the maximum injection power and the test pulse width
The dynamic range is tested by pulse widths, wherein the preset corresponding relation table is that different pulse widths correspond to different 0 maximum injection powers; gradually reducing the test pulse width, and sequentially acquiring a test waveform curve based on the gradually reduced test pulse width value; and selecting a test pulse width corresponding to the waveform curve capable of covering the effective dynamic range based on the test waveform curve to obtain a minimum test pulse width.
Optionally, in a sixth implementation manner of the second aspect of the present invention, after the selecting unit,
the system further comprises a verification unit, which is specifically used for: determining a maximum 5 maximum measurable length based on the effective dynamic range of the minimum test pulse width, and determining whether the maximum measurable length is greater than the optical fiber length; if so, the first and second data are not identical,
Confirming the minimum test pulse width as an effective minimum test pulse width and reserving the pulse width value; if not, the minimum test pulse width is an invalid minimum test pulse width, the pulse width value is removed, and the test pulse width value in the last test is extracted as the minimum test pulse width.
0 a third aspect of the present invention provides a test parameter determination apparatus comprising a memory and at least one processor, the memory having instructions stored therein; the at least one processor invokes the instructions in the memory to cause the test parameter determination device to perform the steps of the test parameter determination method as described above.
A fourth aspect of the invention provides a computer-readable storage medium having instructions stored thereon which, when executed by a processor, implement the steps of a method of determining test parameters as described above.
According to the technical scheme provided by the invention, the effective dynamic range required by testing the target optical fiber is obtained by acquiring the waveform curve obtained by testing the target optical fiber by the optical time domain reflectometer, extracting each data point in the waveform curve, determining the length of the optical fiber based on the preset background noise threshold value, and determining the measurement parameters of the optical time domain reflectometer based on the effective dynamic range and the optical fiber length according to the data point corresponding to the optical fiber length value and the slope of the waveform curve. According to the method and the device, the test waveform curves under different gain coefficients are obtained and analyzed, so that the minimum test pulse width and the optimal test distance of the optical time domain reflectometer are automatically determined, and the use threshold of the optical time domain reflectometer is reduced.
Drawings
FIG. 1 is a schematic diagram of a first embodiment of a method for determining test parameters according to an embodiment of the present invention;
FIG. 2 is a schematic diagram of a second embodiment of a method for determining test parameters according to an embodiment of the present invention;
FIG. 3 is a schematic diagram of two test curves of a curve 1 of a maximum gain factor and a curve 2 of a minimum gain factor of a test pulse width of 20us of an optical time domain reflectometer;
FIG. 4 is a graph of a splice of waveform curves under different gain factors based on a test pulse width of 20 us;
FIG. 5 is a schematic structural diagram of a device for determining test parameters according to an embodiment of the present invention;
FIG. 6 is a schematic diagram of another configuration of a device for determining test parameters according to an embodiment of the present invention;
fig. 7 is a schematic structural diagram of a test parameter determining apparatus according to an embodiment of the present invention.
Detailed Description
Aiming at the problems that the parameter setting is complex and the using threshold is higher when the OTDR is utilized to test the performance of the optical fiber, the application automatically determines the minimum test pulse width and the optimal test distance of the optical time domain reflectometer by acquiring and analyzing the test waveform curves under different gain coefficients, and reduces the using threshold of the OTDR.
The terms "first," "second," "third," "fourth" and the like in the description and in the claims and in the above drawings, if any, are used for distinguishing between similar objects and not necessarily for describing a particular sequential or chronological order. It is to be understood that the data so used may be interchanged where appropriate such that the embodiments described herein may be implemented in other sequences than those illustrated or otherwise described herein. Furthermore, the terms "comprises," "comprising," or any other variation thereof, are intended to cover a non-exclusive inclusion, such that a process, method, apparatus, article, or apparatus that comprises a list of steps or elements is not necessarily limited to those steps or elements expressly listed or inherent to such process, method, article, or apparatus.
For ease of understanding, the following describes a specific flow of an embodiment of the present invention, and please refer to fig. 1 for a schematic diagram of a first embodiment of a method for determining test parameters according to an embodiment of the present invention, where the method specifically includes the following steps:
101. and acquiring a waveform curve obtained by testing the target optical fiber by the optical time domain reflectometer.
The waveform curve is a splicing curve of a first waveform curve under a first gain coefficient and a second waveform curve under a second gain coefficient, and the splicing curve can completely cover the dynamic range of the optical time domain reflectometer.
The OTDR curve is a graph of distance versus level, and the dynamic range of each optical time domain reflectometer is fixed, and the effective dynamic range is the height of the noise peak to the initial level, also called peak dynamic range, the dynamic range of the OTDR can represent the maximum distance that the instrument can test, according to g.652 cable tested with 1550nm wavelength signal, cable attenuation is 0.25dB/km, the testable distance is 38/0.25=150 km, but in general, the dynamic range should also be subtracted by the signal-to-noise ratio, so if the measurement requirement of the dynamic range at 30dB is met, a single mode OTDR with a dynamic range of 35dB should be prepared.
In this embodiment, the waveform curve for testing may be a spliced curve of two waveform curves based on different gain coefficients of the same pulse width, where the first gain coefficient is smaller than the second gain coefficient, or may be a spliced curve of two waveform curves based on the same gain coefficient of different pulse widths, where the spliced curve is required to completely cover the dynamic range of the entire optical time domain reflectometer. Specifically, when the pulse width is large or the gain coefficient is high, the energy of the transmitted test signal is too large to be measured, a saturation region parallel to the transverse axis of the coordinate axis exists at the front section of the waveform curve, the saturation region and the effective range can be represented by the transverse axis of the waveform curve, as can be seen from the OTDR curve, the effective range of the small gain curve is from the starting end of the curve to the first position smaller than the noise threshold value, the saturation region of the large gain curve is from the starting end of the curve to the transverse axis of the coordinate axis and ends in parallel, and the obtained waveform curve is invalid and has no measurement significance in the length of the optical fiber corresponding to the starting end of the optical fiber to the ending point of the saturation region. Therefore, in the case of small pulse width or low gain factor, the performance of the optical fiber in a short distance can be tested due to the small energy of the test signal, but the optical fiber in a long distance cannot be measured, so that the background noise appears after the effective range of the waveform curve after a certain distance, and therefore, the effective range of the waveform curve in the case of small pulse width or low gain factor is required to be larger than the range of the saturation region in the case of large pulse width or high gain factor.
In practical application, for the selection of the large pulse width or the high gain coefficient, the maximum test pulse width that can be achieved by the optical time domain reflectometer can be selected based on the performance of the optical time domain reflectometer, and then a suitable small pulse width is determined based on the range of the saturation region under the maximum test pulse width. In the testing process, the maximum testing precision is obtained on the basis that parameters such as proper testing pulse width, testing distance and the like are set to meet the testing length requirement. In practical application, in order to increase the testing dynamic range of the OTDR, the maximum distance that the instrument can test is increased, and the method is generally implemented by splicing curves with the same testing pulse width under different gain coefficients, and in the testing process, parameters such as a proper testing pulse width, a testing distance and the like need to be set to obtain the maximum testing precision on the basis of meeting the testing length requirement. The collected curves are spliced, the rear ends of the waveform curves with smaller dynamic ranges in the two waveform curves are mainly removed, the overlapped parts of the two curves are reserved, event analysis is carried out on the curves with different performances, meanwhile, the curves with higher precision are selected to serve as effective curves according to the difference of characteristics of forming the curves with different gain coefficients, and the effective curves are connected to obtain the tested waveform curves. More preferably, the method can also search the superposition area of the two optical fiber strain curves by utilizing sliding quotient-solving weight integration by taking the strain data correlation weight calculation method as a core according to superposition similarity characteristics of strain data obtained by testing the two ends of the optical fiber, so that the curve is spliced.
102. Each data point in the waveform curve is extracted, and the length of the optical fiber is determined based on a preset background noise threshold.
The OTDR track curve is a set of points comprising an abscissa and an ordinate, the data points are connected to form a gradually descending curve, when a reflection event and a non-reflection event occur on the tested optical fiber, the curve can change, and the types of the events occurring at different positions are analyzed according to different manifestations of the change of the curve, so that the effect of measuring the performance of the optical fiber is achieved. Extracting each data point in a waveform curve, obtaining the distribution characteristics of the data points according to the horizontal coordinate and the vertical coordinate of the data point, specifically, in the middle section of the curve, the data points are distributed uniformly, in the rear section of the curve, most of the data points are concentrated in a certain range of the horizontal coordinate, the vertical coordinate of the data point in the range is extracted, the corresponding value of the vertical coordinate is processed in a numerical mode, a numerical distribution section is obtained, a large number of data points exist in the distribution section, only the vertical coordinate value of a small number of data points exceeds the distribution section, in general, the minimum endpoint value of the distribution section is 0, the maximum endpoint value can be sequenced, the maximum endpoint value is determined when the vertical coordinate value of most of the data points is ensured to be in the section, the maximum endpoint value is used as a preset bottom noise threshold, namely the bottom noise threshold is the threshold of the distribution of most of the data points in the rear section of the curve, and the numerical value of the horizontal coordinate corresponding to the data point is selected from the waveform curve based on the bottom noise threshold, namely the optical fiber length.
In practical application, the commonly used optical fiber length measurement method mainly comprises a back scattering method, a pulse method and a phase shift method, for the optical fiber length measurement by using an OTDR, a front-back double-pass test method can be adopted, and also the optical beam of an ASE light source can be split into a coherent optical path passing through an optical fiber to be measured and a reference optical path passing through a standard optical fiber, the optical path length of the optical beam of the reference optical path is regulated, the optical paths of the optical beam of the coherent optical path and the optical beam of the reference optical path are matched to generate white light interference, the optical power of the optical beam of the coherent optical path and the optical power of the reference optical path after being combined is monitored, the optical path difference corresponding to the maximum optical power after being combined is obtained, and the length of the optical fiber to be measured is obtained according to the optical path difference.
103. And obtaining the effective dynamic range required by the test target optical fiber according to the data point corresponding to the optical fiber length value and the slope of the waveform curve.
Obtaining a bottom noise threshold value corresponding to a data point corresponding to an optical fiber length value, obtaining a straight line which takes the slope of a waveform curve as the slope and passes through the data point corresponding to the optical fiber length value according to the slope of the waveform curve, prolonging the straight line to obtain an intersection point with a Y axis, obtaining the longitudinal coordinate value of the intersection point, subtracting the values of the two longitudinal coordinates to obtain an effective dynamic range, wherein the effective dynamic range is the minimum dynamic range for measuring the optical fiber, and if the dynamic range of the OTDR is smaller than the effective dynamic range and the optical fiber to be measured has higher loss, the far end possibly disappears in noise.
104. The measurement parameters of the optical time domain reflectometer are determined based on the effective dynamic range and the length of the optical fiber.
The measurement parameters comprise a minimum pulse width and a measurement distance, and the measurement parameters of the optical time domain reflectometer are set according to the minimum pulse width and the measurement distance, and the method comprises the following steps: and acquiring the minimum pulse width value and inputting the minimum pulse width value into a corresponding region of the optical time domain reflectometer, acquiring a measurement curve according to the filled measurement parameters, judging whether the difference value between the actual test distance of the measurement curve and the test distance is smaller than a preset threshold value, and if so, confirming that the minimum pulse width is the final measurement parameter of the optical time domain reflectometer. Among the test parameters of the OTDR, there is also an average number of times, and some OTDRs are set for average time, both of which have the same meaning, and the test curve is smoother by means of average processing to suppress noise in the curve as much as possible. The setting of the average number of times (or average time) should be flexibly grasped according to the situation, and generally, after a certain number of times (such as 300 times or 3 minutes) of average treatment, the effect is no longer obvious.
The key parameters involved in using the OTDR instrument include a test pulse width, a test distance and the like, wherein the large pulse width has a larger dynamic range and can be measured farther, but the blind area is relatively larger when the large pulse width is used, partial events in the optical fiber can not be detected, the small pulse width has a smaller blind area, the dynamic range is smaller, and the test distance is short. According to the scheme, the test waveform curves under different gain coefficients are obtained and analyzed, so that the minimum test pulse width and the optimal test distance of the optical time domain reflectometer are automatically determined, and the measurement parameters of the optical time domain reflectometer are automatically set.
Referring to fig. 2, a second embodiment of a method for determining test parameters according to the present invention is shown, and the method specifically includes the following steps:
201. and acquiring a first waveform curve based on the first gain coefficient under the preset pulse width, and acquiring a second waveform curve based on the second gain coefficient under the preset pulse width.
The first gain coefficient is smaller than the second gain coefficient, and the effective range of the first waveform curve is larger than the range of the saturation region of the second waveform curve.
In the prior art, considering that the wide pulse contains more energy, the back scattering signal is large and has a larger dynamic range, so the selection of pulse width is generally: and (3) starting to select from a narrow pulse width, gradually adjusting upwards, and when the dead zone of the displayed curve front peak is smaller, detecting an event in the optical fiber and the curve noise is not much, obtaining the optimal pulse width. In this embodiment, on the screen of the OTDR, the horizontal axis represents the light length, which can be obtained according to the transmission speed and the transmission time of the light in the optical fiber, and the maximum length that can be detected by the optical time domain reflectometer depends on the peak power of the emitted light pulse, so as to determine the dynamic range of the optical time domain reflectometer. The different gain coefficients are only used for distinguishing different dynamic ranges of the two OTDR curves, specific numerical values of the two OTDR curves are not limited, the two OTDR curves can be spliced as long as the dynamic ranges of the two OTDR curves are different, the dynamic ranges of the spliced OTDR curves are larger, whether the dynamic ranges of the spliced curves can cover the dynamic ranges of the instrument at the moment is judged, and if so, the dynamic ranges of the spliced curves are used as waveform curves for testing. The rayleigh scattering and fresnel reflection values returned in the fiber are usually small, and in order to be collected by the digital system, gain amplification is usually required for the scattered signal, whereas for the low gain stage of the amplifier, near-end events can be seen, but due to the limited gain, no long-distance rayleigh curve can be seen. For the high gain stage of the amplifier, the high gain will saturate the acquired curve over a range from the point of start acquisition to the backward one, but a more distal rayleigh curve can be seen. Referring to fig. 3, two test curves of the optical time domain reflectometer at the maximum gain factor curve 1 and the minimum gain factor curve 2 of the test pulse width of 20us are shown, in which the front section of the small gain factor curve 2 is reserved because the near-end curve can be seen at the time of small gain.
202. And respectively acquiring event change areas of the first waveform curve and the second waveform curve, determining a splicing point and an effective splicing area based on the event change areas, and obtaining the tested waveform curve through segmentation and connection.
And dividing the first waveform curve and the second waveform curve based on the splicing points, and connecting the divided waveform curves with the effective splicing area to obtain a tested waveform curve. The first waveform curve and the second waveform curve are inconsistent due to inconsistent gain coefficients, so that the performance of events in the optical fiber is inconsistent, specifically, when the input power of an optical pulse is larger at the initial end, namely the pulse width is larger, echo caused by strong reflection and being closer to the incident end forms a peak, namely ghosts can be generated, particularly, the ghost can be identified in a symmetrical mode by not causing obvious loss at the ghost position on the curve and the distance between the ghost and the initial end along the curve is a multiple of the distance between the strong reflection event and the initial end, and the reliable front end curve is obtained by selecting a short pulse width and adding attenuation in the strong reflection front end for elimination.
The curve obtained by the OTDR instrument is an attenuation curve inclined to the lower right, and the starting point position and the end point position of the characteristic section of the test curve are determined according to the relation between the optical fiber link event and the test curve, so that an effective splicing area is obtained. The optical fiber link event mainly comprises a reflection event, a non-reflection event and a blind area covering event, wherein the peak shape curve on the curve reflects various reflection events and steps are non-reflection events. Specifically, at the set sampling frequency, a plurality of points with the slope of the curve greater than the slope threshold of the reflection peak, that is, a plurality of points with the slope of the curve greater than the slope threshold of the reflection peak in a section of the curve, are continuously obtained, and optionally, the point with the minimum value of the slope of the curve in the points with the slope of the curve greater than the slope threshold of the reflection peak is taken as the starting point position of the characteristic section. For example, the slope threshold of the reflection peak is set to 80 degrees, when the slope of the curve is detected to be greater than 80 degrees, the point of the minimum value in the section of the curve with the slope of the curve greater than the slope threshold of the reflection peak is marked as the starting point position of the characteristic section, the starting point position of the characteristic section can be determined by setting other judging conditions, for example, the first point with the slope of the curve greater than the slope threshold of the reflection peak is used as the starting point position of the characteristic section, for example, the nth point with the slope of the curve greater than the slope threshold of the reflection peak is used as the starting point position of the characteristic section, the end point position of the characteristic section is determined according to the same method, and the effective curves remained in the first waveform curve and the second waveform curve are spliced to obtain the tested waveform curve. Referring to fig. 4, the waveform curves based on the concatenation of the waveform curves under different gain coefficients of the test pulse width of 20 us.
203. And identifying the first data point smaller than the background noise threshold value on the waveform curve based on each data point in the waveform curve and the preset background noise threshold value, and obtaining the length of the target optical fiber.
And extracting and identifying each data point in the waveform curve, calculating the noise value of each data point, sorting, identifying the first data point smaller than the background noise threshold value on the waveform curve according to a preset background noise threshold value, and obtaining the length of the target optical fiber based on the value of the corresponding length axis of the data point in the waveform curve.
204. And calculating the slope of the waveform curve, and obtaining the first injection power of the waveform curve at the initial position based on the data point corresponding to the optical fiber length value.
Calculating the slope of the non-abrupt part of the waveform curve, taking the slope as the slope of the waveform curve, and extending the initial end of the waveform curve based on the data point corresponding to the optical fiber length value and the slope of the waveform curve to obtain the first injection power of the waveform curve at the initial position.
205. And obtaining second injection power corresponding to the data point corresponding to the optical fiber length value, and calculating the difference value between the first injection power and the second injection power to obtain the effective dynamic range required by the test optical fiber.
In general, the relationship between dynamic range and test distance is: (dynamic range-10 dB)/0.22 = test distance, the dynamic range is defined as the difference between the starting level and the noise level on the back-scattering curve, which is the maximum attenuation value (in dB) of the back-scattering curve that can be tested. The dynamic range, which represents the maximum fiber loss information that can be measured, directly determines the longest fiber distance that can be measured, is typically calculated as the difference between the starting level and the root mean square level of noise on the back-scattering curve (signal to noise ratio=1).
206. And determining the maximum injection power capable of covering the effective dynamic range, and determining the test pulse width capable of meeting the effective dynamic range based on a preset corresponding relation table of the maximum injection power and the test pulse width.
Corresponding to different test pulse widths, actually corresponding to different maximum injection powers, which are in log multiple relation with the test pulse widths, and looking up a table, wherein the injection power is the power of an optical signal which is injected into light rays by the OTDR and used for testing, and the test pulse widths can be obtained according to a corresponding table of the injection power and the pulse widths.
207. Gradually reducing the test pulse width value, sequentially obtaining corresponding test waveform curves, and selecting the test pulse width corresponding to the waveform curve capable of covering the effective dynamic range based on the test waveform curves to obtain the minimum test pulse width.
Gradually reducing the test pulse width value, obtaining a waveform curve corresponding to the pulse width based on the pulse width, analyzing the characteristics of the waveform curve according to the method, and selecting the minimum pulse width from the pulse widths which completely cover the effective dynamic range to obtain the minimum test pulse width. And the waveform curve can be acquired and analyzed according to the method, whether the dynamic range of the last test waveform curve of the adjacent two times covers the effective dynamic range is judged, if so, the test pulse width corresponding to the last test waveform curve is smaller, the comparison is carried out in sequence, and when the dynamic range of the last test waveform curve can not cover the effective dynamic range, the pulse width value corresponding to the last test waveform curve is the minimum test pulse width. More preferably, when comparing, the first test pulse width which can not completely cover the effective dynamic range is obtained, the previous test pulse width adjacent to the pulse width value is extracted according to the pulse width value, and the pulse width value is determined as the minimum test pulse width.
208. And determining the maximum measurable length based on the effective dynamic range of the minimum test pulse width, judging whether the maximum measurable length is larger than the length of the optical fiber, if so, confirming the minimum test pulse width as the effective minimum test pulse width, and reserving the pulse width value.
If not, the minimum test pulse width is an invalid minimum test pulse width, the pulse width value is removed, and the test pulse width value in the last test is extracted as the minimum test pulse width.
Acquiring a waveform curve based on the minimum test pulse width, identifying the waveform curve according to the curve analysis method, acquiring the effective dynamic range of the waveform curve, determining the maximum measurable length, namely the optical fiber test distance, by the dynamic range of the OTDR and other factors,
209. and determining a test distance based on the measurement multiple relation of the length of the optical fiber, configuring measurement parameters of the optical time domain reflectometer according to the minimum test pulse width and the test distance, and measuring.
The measurement distance parameter is the measurement range of the OTDR, the measurement range is the maximum distance which can be achieved by the abscissa in the graph, when the measurement range is selected, the proper multiple length is selected according to the length of the measured optical fiber, if the multiple is too small, the optical time domain reflectometer cannot measure the length of the measured optical fiber, the display screen of the optical time domain reflectometer cannot see the whole surface, if the measurement range is too large, the abscissa on the display screen of the optical time domain reflectometer cannot be compressed to be seen clearly, the event in the optical fiber cannot be represented obviously, the event is generally 1.5-2 times the length of the measured optical fiber, and specifically, the distance can be set to be 1.5 times, so that the waveform curve occupies 2/3 of the screen in the display screen of the optical time domain reflectometer, and a better direct vision effect is achieved. After the minimum test pulse width and the test distance are determined, the optical time domain reflectometer can be used for measurement, and the measurement parameter automatically configured by the optical time domain reflectometer is the optimal test parameter for measuring the tested optical fiber.
According to the scheme, a waveform curve obtained by testing a target optical fiber by the optical time domain reflectometer is obtained, each data point in the waveform curve is extracted, the length of the optical fiber is determined based on a preset background noise threshold, an effective dynamic range required by testing the target optical fiber is obtained according to the data point corresponding to the length value of the optical fiber and the slope of the waveform curve, and the measurement parameters of the optical time domain reflectometer are determined based on the effective dynamic range and the length of the optical fiber. According to the method, the minimum test pulse width and the optimal test distance of the optical time domain reflectometer are automatically determined by acquiring and analyzing the test waveform curves under different gain coefficients.
The method for determining the test parameters in the embodiment of the present invention is described above, and the device for determining the test parameters in the embodiment of the present invention is described in detail from the perspective of the modularized functional entity, referring to fig. 5, a schematic structural diagram of the device for determining the test parameters provided in the embodiment of the present invention includes:
the obtaining module 301 is configured to obtain a waveform curve obtained by testing a target optical fiber by using the optical time domain reflectometer, where the waveform curve is a spliced curve of a first waveform curve under a first gain coefficient and a second waveform curve under a second gain coefficient, and the spliced curve can completely cover a dynamic range of the optical time domain reflectometer;
The extracting module 302 is configured to extract each data point in the waveform curve, and determine the length of the optical fiber based on a preset background noise threshold;
the calculating module 303 is configured to obtain an effective dynamic range required for testing the target optical fiber according to the data point corresponding to the optical fiber length value and the slope of the waveform curve;
a setting module 304, configured to determine a measurement parameter of the optical time domain reflectometer based on the effective dynamic range and the optical fiber length, where the measurement parameter includes a minimum pulse width and a measurement distance.
According to the scheme, the test waveform curves under different gain coefficients are obtained and analyzed, so that the minimum test pulse width and the optimal test distance of the optical time domain reflectometer are automatically determined, and the measurement parameters of the optical time domain reflectometer are automatically set.
Referring to fig. 6, another schematic structural diagram of a test parameter determining apparatus according to an embodiment of the present invention includes:
the obtaining module 301 is configured to obtain a waveform curve obtained by testing a target optical fiber by using the optical time domain reflectometer, where the waveform curve is a spliced curve of a first waveform curve under a first gain coefficient and a second waveform curve under a second gain coefficient, and the spliced curve can completely cover a dynamic range of the optical time domain reflectometer;
The extracting module 302 is configured to extract each data point in the waveform curve, and determine the length of the optical fiber based on a preset background noise threshold;
the calculating module 303 is configured to obtain an effective dynamic range required for testing the target optical fiber according to the data point corresponding to the optical fiber length value and the slope of the waveform curve;
a setting module 304, configured to determine a measurement parameter of the optical time domain reflectometer based on the effective dynamic range and the optical fiber length, where the measurement parameter includes a minimum pulse width and a measurement distance.
In this embodiment, the obtaining module 301 includes:
a curve obtaining unit 3011, configured to obtain a first waveform curve based on the first gain coefficient under a preset pulse width; acquiring a second waveform curve based on the second gain coefficient under a preset pulse width, wherein the first gain coefficient is smaller than the second gain coefficient, and the effective range of the first waveform curve is larger than the range of a saturation region of the second waveform curve;
a dividing unit 3012, configured to obtain event change areas of the first waveform curve and the second waveform curve, and determine a splice point and an effective splice area based on the event change areas;
And the splicing unit 3013 is configured to split the first waveform curve and the second waveform curve based on the splicing points, and connect the split waveform curve with the effective splicing area to obtain a tested waveform curve.
In this embodiment, the extracting module 302 includes:
a sorting unit 3021, configured to extract and identify each data point in the waveform curve, calculate a noise value of each data point, and sort the data points;
an identifying unit 3022, configured to identify, according to a preset background noise threshold, a first data point smaller than the background noise threshold on the waveform curve;
a determining unit 3023, configured to obtain the length of the target optical fiber based on the value of the length axis corresponding to the data point in the waveform curve.
In this embodiment, the computing module 303 includes:
a slope calculation unit 3031, configured to calculate a slope of the non-abrupt portion of the waveform curve, and use the slope as a slope of the waveform curve;
an extension unit 3032, configured to extend a start end of the waveform curve based on a data point corresponding to the optical fiber length value and a slope of the waveform curve, so as to obtain a first injection power of the waveform curve at a start position;
And the difference value calculating unit 3033 is configured to obtain a second injection power corresponding to a data point corresponding to the optical fiber length value, calculate a difference value between the first injection power and the second injection power, and obtain an effective dynamic range required by testing the target optical fiber.
In this embodiment, the setting module 304 includes:
a selecting unit 3041, configured to obtain, according to the effective dynamic range, a minimum test pulse width that can satisfy the effective dynamic range;
a determining unit 3042 for determining a test distance based on a measurement multiple relation of the optical fiber length;
and a configuration unit 3043, configured to configure measurement parameters of the optical time domain reflectometer according to the minimum test pulse width and the test distance, and perform measurement.
In this embodiment, the selecting unit 3041 is specifically configured to: determining a maximum injection power capable of covering the effective dynamic range according to the effective dynamic range; determining a test pulse width capable of meeting the effective dynamic range based on a preset corresponding relation table of the maximum injection power and the test pulse width, wherein the preset corresponding relation table corresponds to different maximum injection powers for different pulse widths; gradually reducing the test pulse width, and sequentially acquiring a test waveform curve based on the gradually reduced test pulse width value; and selecting a test pulse width corresponding to the waveform curve capable of covering the effective dynamic range based on the test waveform curve to obtain a minimum test pulse width.
In this embodiment, after the selecting unit 3041, a verifying unit is further included, specifically for: determining a maximum measurable length based on the effective dynamic range of the minimum test pulse width, and determining whether the maximum measurable length is greater than the optical fiber length; if yes, confirming that the minimum test pulse width is an effective minimum test pulse width, and reserving the pulse width value; if not, the minimum test pulse width is an invalid minimum test pulse width, the pulse width value is removed, and the test pulse width value in the last test is extracted as the minimum test pulse width.
According to the scheme, a waveform curve obtained by testing a target optical fiber by the optical time domain reflectometer is obtained, each data point in the waveform curve is extracted, the length of the optical fiber is determined based on a preset background noise threshold, an effective dynamic range required by testing the target optical fiber is obtained according to the data point corresponding to the length value of the optical fiber and the slope of the waveform curve, and the measurement parameters of the optical time domain reflectometer are determined based on the effective dynamic range and the length of the optical fiber. According to the method, the minimum test pulse width and the optimal test distance of the optical time domain reflectometer are automatically determined by acquiring and analyzing the test waveform curves under different gain coefficients.
The above-described determining device for testing parameters in the embodiment of the present invention is described in detail in fig. 5-6 from the point of view of modularized functional entities, and the following describes the determining device for testing parameters in the embodiment of the present invention in detail from the point of view of hardware processing.
Fig. 7 is a schematic structural diagram of a test parameter determining apparatus according to an embodiment of the present invention, where the test parameter determining apparatus 400 may have a relatively large difference due to different configurations or performances, and may include one or more processors (central processing units, CPU) 410 (e.g., one or more processors) and a memory 420, and one or more storage media 430 (e.g., one or more mass storage devices) storing application programs 433 or data 432. Wherein memory 420 and storage medium 430 may be transitory or persistent storage. The program stored on the storage medium 430 may include one or more modules (not shown), each of which may include a series of instruction operations in the determination device 400 of the test parameters. Still further, the processor 410 may be configured to communicate with the storage medium 430 and execute a series of instruction operations in the storage medium 430 on the test parameter determination apparatus 400 to implement the method provided by the implementation described above.
The test parameter determination apparatus 400 may also include one or more power supplies 440, one or more wired or wireless network interfaces 450, one or more input/output interfaces 460, and/or one or more operating devices 431, such as Windows Serve, mac OS X, unix, linux, freeBSD, and the like. It will be appreciated by those skilled in the art that the configuration of the test parameter determination device shown in FIG. 7 is not limiting of the computer device provided by the present invention and may include more or fewer components than shown, or may be a combination of certain components, or a different arrangement of components.
The present invention also provides a computer readable storage medium, which may be a non-volatile computer readable storage medium, or may be a volatile computer readable storage medium, where instructions are stored in the computer readable storage medium, where the instructions when executed on a computer cause the computer to perform the steps of the test parameter determining method provided in the foregoing embodiments.
It will be clearly understood by those skilled in the art that, for convenience and brevity of description, the specific working process of the apparatus or device, unit described above may refer to the corresponding process in the foregoing method embodiment, which is not repeated herein.
The integrated units, if implemented in the form of software functional units and sold or used as stand-alone products, may be stored in a computer readable storage medium. Based on such understanding, the technical solution of the present invention may be embodied essentially or in part or all of the technical solution or in part in the form of a software product stored in a storage medium, including instructions for causing a computer device (which may be a personal computer, a server, or a network device, etc.) to perform all or part of the steps of the method according to the embodiments of the present invention. And the aforementioned storage medium includes: a U-disk, a removable hard disk, a read-only memory (ROM), a random access memory (random access memory, RAM), a magnetic disk, or an optical disk, or other various media capable of storing program codes.
The above embodiments are only for illustrating the technical solution of the present invention, and not for limiting the same; although the invention has been described in detail with reference to the foregoing embodiments, it will be understood by those of ordinary skill in the art that: the technical scheme described in the foregoing embodiments can be modified or some technical features thereof can be replaced by equivalents; such modifications and substitutions do not depart from the spirit and scope of the technical solutions of the embodiments of the present invention.
Claims (10)
1. The method for determining the test parameters is applied to an optical time domain reflectometer and is characterized by comprising the following steps of:
acquiring a waveform curve obtained by testing a target optical fiber by the optical time domain reflectometer, wherein the waveform curve is a splicing curve of a first waveform curve under a first gain coefficient and a second waveform curve under a second gain coefficient, and the splicing curve covers the dynamic range of the optical time domain reflectometer;
extracting each data point in the waveform curve, and determining the length of the optical fiber based on a preset background noise threshold value;
obtaining an effective dynamic range required by testing the target optical fiber according to the data point corresponding to the value of the optical fiber length and the slope of the waveform curve;
determining a measurement parameter of the optical time domain reflectometer based on the effective dynamic range and the optical fiber length, wherein the measurement parameter comprises a minimum pulse width and a measurement distance;
the method comprises the steps of obtaining a waveform curve obtained by testing a target optical fiber by the optical time domain reflectometer, wherein the waveform curve comprises a first waveform curve based on the first gain coefficient under a preset pulse width; acquiring a second waveform curve based on the second gain coefficient under the preset pulse width, wherein the first gain coefficient is smaller than the second gain coefficient, and the effective range of the first waveform curve is larger than the range of a saturation region of the second waveform curve; respectively acquiring event change areas of the first waveform curve and the second waveform curve, and determining a splicing point and an effective splicing area based on the event change areas; and dividing the first waveform curve and the second waveform curve based on the splicing points, and connecting the divided waveform curves with the effective splicing area to obtain a tested waveform curve.
2. The method of determining test parameters of claim 1, wherein the extracting each data point in the waveform curve and determining the fiber length based on a preset background noise threshold comprises:
extracting and identifying each data point in the waveform curve, calculating the noise value of each data point and sequencing;
identifying the first data point smaller than the background noise threshold value on the waveform curve according to a preset background noise threshold value;
and obtaining the length of the target optical fiber based on the value of the corresponding length axis of the data point in the waveform curve.
3. The method for determining a test parameter according to claim 1, wherein the obtaining the effective dynamic range required for testing the target optical fiber according to the data point corresponding to the value of the optical fiber length and the slope of the waveform curve includes:
calculating the slope of the non-abrupt part of the waveform curve, and taking the slope as the slope of the waveform curve;
extending the initial end of the waveform curve based on the data point corresponding to the value of the optical fiber length and the slope of the waveform curve to obtain the first injection power of the waveform curve at the initial position;
Acquiring a second injection power corresponding to a data point corresponding to the value of the optical fiber length;
and calculating the difference value of the first injection power and the second injection power to obtain the effective dynamic range required by testing the target optical fiber.
4. A method of determining a test parameter as claimed in any one of claims 1 to 3, wherein said determining a measurement parameter of said optical time domain reflectometer based on said effective dynamic range and said length of optical fiber comprises:
obtaining a minimum test pulse width capable of meeting the effective dynamic range according to the effective dynamic range;
determining a test distance based on the measurement multiple relation of the optical fiber length;
and configuring measurement parameters of the optical time domain reflectometer according to the minimum test pulse width and the test distance, and measuring.
5. The method of determining test parameters according to claim 4, wherein said obtaining a minimum test pulse width that satisfies said effective dynamic range based on said effective dynamic range comprises:
determining a maximum injection power capable of covering the effective dynamic range according to the effective dynamic range;
determining a test pulse width capable of meeting the effective dynamic range based on a preset corresponding relation table of the maximum injection power and the test pulse width, wherein the preset corresponding relation table corresponds to different maximum injection powers for different pulse widths;
Gradually reducing the test pulse width, and sequentially acquiring a test waveform curve based on the value of the gradually reduced test pulse width;
and selecting a test pulse width corresponding to the waveform curve capable of covering the effective dynamic range based on the test waveform curve to obtain a minimum test pulse width.
6. The method of determining test parameters according to claim 4, further comprising, after said obtaining a minimum test pulse width that satisfies said effective dynamic range from said effective dynamic range:
determining a maximum measurable length based on the effective dynamic range of the minimum test pulse width, and determining whether the maximum measurable length is greater than the optical fiber length;
if yes, confirming that the minimum test pulse width is an effective minimum test pulse width, and reserving the value of the minimum test pulse width;
if not, the minimum test pulse width is an invalid minimum test pulse width, the value of the minimum test pulse width is removed, and the value of the test pulse width in the last test is extracted as the minimum test pulse width.
7. A device for determining a test parameter, which is applied to an optical time domain reflectometer, and is characterized in that the device for determining the test parameter comprises:
The acquisition module is used for acquiring a waveform curve obtained by testing the target optical fiber by the optical time domain reflectometer, wherein the waveform curve is a splicing curve of a first waveform curve under a first gain coefficient and a second waveform curve under a second gain coefficient, and the splicing curve covers the dynamic range of the optical time domain reflectometer;
the extraction module is used for extracting each data point in the waveform curve and determining the length of the optical fiber based on a preset background noise threshold value;
the calculation module is used for obtaining an effective dynamic range required by testing the target optical fiber according to the data point corresponding to the value of the optical fiber length and the slope of the waveform curve;
a setting module, configured to determine a measurement parameter of the optical time domain reflectometer based on the effective dynamic range and the optical fiber length, where the measurement parameter includes a minimum pulse width and a measurement distance; the method comprises the steps of obtaining a waveform curve obtained by testing a target optical fiber by the optical time domain reflectometer, wherein the waveform curve comprises a first waveform curve based on the first gain coefficient under a preset pulse width; acquiring a second waveform curve based on the second gain coefficient under the preset pulse width, wherein the first gain coefficient is smaller than the second gain coefficient, and the effective range of the first waveform curve is larger than the range of a saturation region of the second waveform curve; respectively acquiring event change areas of the first waveform curve and the second waveform curve, and determining a splicing point and an effective splicing area based on the event change areas; and dividing the first waveform curve and the second waveform curve based on the splicing points, and connecting the divided waveform curves with the effective splicing area to obtain a tested waveform curve.
8. The apparatus for determining test parameters according to claim 7, wherein the setting module comprises:
the selecting unit is used for obtaining a minimum test pulse width which can meet the effective dynamic range according to the effective dynamic range;
a determining unit for determining a test distance based on a measurement multiple relationship of the optical fiber length;
and the configuration unit is used for configuring the measurement parameters of the optical time domain reflectometer according to the minimum test pulse width and the test distance and measuring the measurement parameters.
9. A test parameter determining device, characterized in that the test parameter determining device comprises a memory and at least one processor, the memory storing instructions; the at least one processor invokes the instructions in the memory to cause the test parameter determination apparatus to perform the steps of the test parameter determination method of any one of claims 1-6.
10. A computer readable storage medium having instructions stored thereon, which when executed by a processor, implement the steps of the method of determining a test parameter according to any of claims 1-6.
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Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN103808339A (en) * | 2014-02-13 | 2014-05-21 | 上海温光自动化技术有限公司 | OTDR (optical time domain reflectometry) device and method based on multi-wavelength pulse optical signals |
| CN111162834A (en) * | 2018-11-07 | 2020-05-15 | 中国移动通信集团湖南有限公司 | Optical time domain reflectometer testing method and optical time domain reflectometer |
| WO2021082522A1 (en) * | 2019-11-01 | 2021-05-06 | 华为技术有限公司 | Optical fiber testing method based on optical time-domain reflectometer, and optical time-domain reflectometer |
| CN114696893A (en) * | 2022-06-02 | 2022-07-01 | 高勘(广州)技术有限公司 | Event positioning method, system, device and storage medium based on OTDR |
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Patent Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN103808339A (en) * | 2014-02-13 | 2014-05-21 | 上海温光自动化技术有限公司 | OTDR (optical time domain reflectometry) device and method based on multi-wavelength pulse optical signals |
| CN111162834A (en) * | 2018-11-07 | 2020-05-15 | 中国移动通信集团湖南有限公司 | Optical time domain reflectometer testing method and optical time domain reflectometer |
| WO2021082522A1 (en) * | 2019-11-01 | 2021-05-06 | 华为技术有限公司 | Optical fiber testing method based on optical time-domain reflectometer, and optical time-domain reflectometer |
| CN112769471A (en) * | 2019-11-01 | 2021-05-07 | 华为技术有限公司 | Optical fiber testing method based on optical time domain reflectometer and optical time domain reflectometer |
| CN114696893A (en) * | 2022-06-02 | 2022-07-01 | 高勘(广州)技术有限公司 | Event positioning method, system, device and storage medium based on OTDR |
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