CN116045851A - Line laser profiler calibration method and device, electronic equipment and storage medium - Google Patents
Line laser profiler calibration method and device, electronic equipment and storage medium Download PDFInfo
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- CN116045851A CN116045851A CN202310332199.7A CN202310332199A CN116045851A CN 116045851 A CN116045851 A CN 116045851A CN 202310332199 A CN202310332199 A CN 202310332199A CN 116045851 A CN116045851 A CN 116045851A
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B21/00—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant
- G01B21/02—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring length, width, or thickness
- G01B21/04—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring length, width, or thickness by measuring coordinates of points
- G01B21/042—Calibration or calibration artifacts
Abstract
The invention relates to the technical field of laser profilers, and provides a line laser profiler calibration method, a device, electronic equipment and a storage medium, wherein the method comprises the following steps: acquiring a real contour point cloud of a preset calibration object and an original contour point cloud of the preset calibration object acquired by a line laser profiler; registering the real contour point cloud and the original contour point cloud based on a first parameter to obtain a point cloud pair, wherein the first parameter represents a mapping relation between a world coordinate system and a coordinate system of a line laser profiler; the first parameter is determined according to a first geometric center of a preset calibration object in a world coordinate system and a second geometric center of an on-line laser profiler in the coordinate system, and the second geometric center is determined based on an original profile point cloud; and determining calibration parameters of the line laser profiler according to the point cloud pairs so as to calibrate the line laser profiler. The invention can accurately calibrate the linear laser profiler without a 2D camera, and can correct distortion of a large-range view field.
Description
Technical Field
The invention relates to the technical field of laser profilers, in particular to a line laser profiler calibration method, a line laser profiler calibration device, electronic equipment and a storage medium.
Background
The line laser profiler is a three-dimensional measurement technology based on line laser, and realizes the measurement of the surface morphology of a large-area and high-resolution three-dimensional object by a high-speed laser scanning mode. The line laser profilometer has been widely applied to the field of industrial online measurement due to the characteristics of rapidness, non-contact, high precision and the like, and effectively ensures the accuracy and timeliness of industrial online measurement.
The line laser profiler calibration technology is one of the core technologies for industrial on-line measurement by using a line laser profiler. Due to the reasons of manufacturing process, mounting technology, mounting position, environmental dust interference and the like, the actual focal length, lens distortion coefficient and the like of the line laser profiler often deviate from theoretical values. In order to avoid the influence of the offset on the actual measurement precision, how to accurately calibrate the linear laser profiler is important to high-precision industrial online measurement, and is a technical problem to be solved by those skilled in the art.
Disclosure of Invention
The invention aims to provide a line laser profiler calibration method, a device, electronic equipment and a storage medium, which can accurately calibrate a line laser profiler.
Embodiments of the invention may be implemented as follows:
in a first aspect, the present invention provides a line laser profiler calibration method, the method comprising:
acquiring a real contour point cloud of a preset calibration object and an original contour point cloud of the preset calibration object acquired by a line laser profiler;
registering the real contour point cloud and the original contour point cloud based on a first parameter to obtain a point cloud pair, wherein the first parameter represents a mapping relation between a world coordinate system and a coordinate system of the line laser profiler; the first parameter is determined according to a first geometric center of the preset calibration object in the world coordinate system and a second geometric center of the line laser profiler in the coordinate system, and the second geometric center is determined based on the original profile point cloud;
and determining calibration parameters of the line laser profiler according to the point cloud pair so as to calibrate the line laser profiler.
In an optional embodiment, the step of registering the true contour point cloud and the original contour point cloud based on the first parameter to obtain a point cloud pair includes:
correcting the original contour point cloud according to the first parameter to obtain a reference contour point cloud;
Registering the reference contour point cloud and the real contour point cloud to obtain a registration pair, wherein the registration pair comprises the reference contour point cloud and the corresponding real contour point cloud;
and replacing the reference contour point cloud in the registration pair with a corresponding original contour point cloud to obtain the point cloud pair.
In an alternative embodiment, the step of registering the reference contour point cloud and the real contour point cloud to obtain a registration pair includes:
calculating a second parameter according to the reference contour point cloud and the real contour point cloud, wherein the second parameter characterizes the corresponding relation between the reference contour point cloud and the real contour point cloud;
updating the reference contour point cloud according to the second parameter;
calculating a distance error according to the updated reference contour point cloud and the real contour point cloud;
if the distance error is greater than or equal to a preset threshold value, replacing the reference contour point cloud with the updated reference contour point cloud, and repeatedly executing the steps until the distance error is smaller than the preset threshold value;
and determining the reference contour point cloud and the real contour point cloud as registration pairs when the distance error is smaller than the preset threshold value.
In an alternative embodiment, the step of calculating the second parameter from the reference contour point cloud and the real contour point cloud comprises:
calculating a first centroid of the reference contour point cloud;
calculating a second centroid of the real contour point cloud;
determining a parameter matrix according to the first centroid, the second centroid, the reference contour point cloud and the real contour point cloud;
and performing singular value decomposition on the parameter matrix to obtain a second parameter.
In an alternative embodiment, the number of the preset calibrations is multiple, each of the preset calibrations corresponds to a first geometric center in the world coordinate system, and the method further includes:
acquiring an original contour point cloud of each preset calibration object;
performing ellipse fitting on the original contour point cloud of each preset calibration object to obtain a second geometric center of each preset calibration object in the coordinate system of the line laser profiler;
and determining the first parameter according to the first geometric center and the second geometric center of each preset calibration object.
In an alternative embodiment, the step of determining the first parameter according to the first geometric center and the second geometric center of each of the preset calibrations includes:
Randomly selecting a preset number of target calibration objects from all the preset calibration objects each time until the selection times reach preset times;
calculating a rotation matrix and a translation matrix of each time according to the first geometric centers and the second geometric centers of the target calibration objects of the preset number selected each time, wherein the rotation matrix represents the rotation relationship between the world coordinate system of the target calibration object selected each time and the coordinate system of the line laser profiler, and the translation matrix represents the translation relationship between the world coordinate system of the target calibration object selected each time and the coordinate system of the line laser profiler;
calculating each transformation error according to the first geometric center and the second geometric center of all the preset calibrations, the rotation matrix and the translation matrix of each time;
and determining a rotation matrix and a translation matrix with the minimum transformation error in the preset times as the first parameter.
In an alternative embodiment, the number of the point cloud pairs is plural, and the step of determining the calibration parameters of the line laser profiler according to the point cloud pairs includes:
acquiring the coordinates of the original contour point clouds and the coordinates of the corresponding real contour point clouds in each point cloud pair;
Solving a pre-established polynomial calibration equation according to the coordinates of all the original contour point clouds and the coordinates of the real contour point clouds corresponding to each original contour point to obtain equation coefficients of the polynomial calibration equation;
and taking the equation coefficient as a calibration parameter of the line laser profiler.
In an alternative embodiment, the line laser profiler is a plurality of line laser profilers, the fields of view of the line laser profilers are in the same plane, the field of view plane of the line laser profiler is parallel to the bottom plate of the three-dimensional calibration plate, the three-dimensional calibration plate is in the overlapping area of the fields of view of the line laser profilers, the three-dimensional calibration plate is provided with the preset calibration object, and the preset calibration object is in the field of view of at least one line laser profiler.
In a second aspect, the present invention provides a line laser profiler calibration apparatus, the apparatus comprising:
the acquisition module is used for acquiring the real contour point cloud of the preset calibration object and the original contour point cloud of the preset calibration object acquired by the line laser profiler;
the registration module is used for registering the real contour point cloud and the original contour point cloud based on a first parameter to obtain a point cloud pair, and the first parameter characterizes a mapping relation between a world coordinate system and a coordinate system of the line laser profiler; the first parameter is determined according to a first geometric center of the preset calibration object in the world coordinate system and a second geometric center of the line laser profiler in the coordinate system, and the second geometric center is determined based on the original profile point cloud;
And the calibration module is used for determining calibration parameters of the line laser profiler according to the point cloud pair so as to calibrate the line laser profiler.
In a third aspect, the present invention provides an electronic device, including a processor and a memory, where the memory is configured to store a program, and the processor is configured to implement the line laser profiler calibration method according to the first aspect in the foregoing embodiment when the program is executed.
In a fourth aspect, the present invention provides a computer readable storage medium having stored thereon a computer program which, when executed by a processor, implements the line laser profiler calibration method according to the first aspect of the previous embodiments.
Compared with the prior art, the embodiment of the invention registers the real contour point cloud and the original contour point cloud based on the first parameter representing the mapping relation between the world coordinate system and the coordinate system of the line laser profiler to obtain the point cloud pair, and then determines the calibration parameters of the line laser profiler according to the point cloud pair so as to calibrate the line laser profiler.
Drawings
In order to more clearly illustrate the technical solutions of the embodiments of the present invention, the drawings that are needed in the embodiments will be briefly described below, it being understood that the following drawings only illustrate some embodiments of the present invention and therefore should not be considered as limiting the scope, and other related drawings may be obtained according to these drawings without inventive effort for a person skilled in the art.
Fig. 1 is a schematic diagram of a laser profiler calibration method based on camera assistance according to the present embodiment.
Fig. 2 is a schematic diagram of a calibration method based on a single polygonal prism calibration block according to the present embodiment.
Fig. 3 is a schematic diagram of a three-dimensional calibration plate according to the present embodiment.
Fig. 4 is a schematic diagram of the relative positional relationship between the three-dimensional calibration plate and the line laser profilometer set provided in this embodiment.
Fig. 5 is a flow chart of a calibration method of the line laser profiler according to the present embodiment.
Fig. 6 is an exemplary diagram of an overall flow of a calibration method of a line laser profiler according to an embodiment of the present invention.
Fig. 7 is a schematic block diagram of a calibration device for a line laser profiler according to an embodiment of the present invention.
Fig. 8 is a block schematic diagram of an electronic device according to an embodiment of the present invention.
Icon: 10-a three-dimensional calibration plate; 101-a bottom plate; 102-a calibration object mounting hole; 103-calibration; 104-calibrating a plate fixing hole; 100-line laser profiler calibration device; 110-an acquisition module; a 120-registration module; 130-a calibration module; 20-an electronic device; a 21-processor; 22-memory; 23-bus.
Detailed Description
For the purpose of making the objects, technical solutions and advantages of the embodiments of the present invention more apparent, the technical solutions of the embodiments of the present invention will be clearly and completely described below with reference to the accompanying drawings in the embodiments of the present invention, and it is apparent that the described embodiments are some embodiments of the present invention, but not all embodiments of the present invention. The components of the embodiments of the present invention generally described and illustrated in the figures herein may be arranged and designed in a wide variety of different configurations.
Thus, the following detailed description of the embodiments of the invention, as presented in the figures, is not intended to limit the scope of the invention, as claimed, but is merely representative of selected embodiments of the invention. All other embodiments, which can be made by those skilled in the art based on the embodiments of the invention without making any inventive effort, are intended to be within the scope of the invention.
It should be noted that: like reference numerals and letters denote like items in the following figures, and thus once an item is defined in one figure, no further definition or explanation thereof is necessary in the following figures.
In the description of the present invention, it should be noted that, if the terms "upper", "lower", "inner", "outer", and the like indicate an azimuth or a positional relationship based on the azimuth or the positional relationship shown in the drawings, or the azimuth or the positional relationship in which the inventive product is conventionally put in use, it is merely for convenience of describing the present invention and simplifying the description, and it is not indicated or implied that the apparatus or element referred to must have a specific azimuth, be configured and operated in a specific azimuth, and thus it should not be construed as limiting the present invention.
Furthermore, the terms "first," "second," and the like, if any, are used merely for distinguishing between descriptions and not for indicating or implying a relative importance.
It should be noted that the features of the embodiments of the present invention may be combined with each other without conflict.
The existing line laser profilometer calibration technology is mainly divided into two types: 1) A line laser profiler calibration technique based on camera assistance; 2) Calibration techniques based on a single polygonal cylinder calibration block.
The line laser profiler calibration technology based on camera assistance is mainly applied to the calibration of the line laser profiler integrated with the camera. The main calibration process is as follows: a) Acquiring calibration plate images through a camera and a laser profiler to obtain N groups of laser-containing and non-laser calibration plate images; b) Calibrating the camera by adopting a traditional camera calibration method, such as a Zhang's calibration method, and solving the internal and external parameters of the camera; c) According to the obtained internal and external parameters of the camera, carrying out de-distortion on all N calibration plate images with laser to obtain N de-distorted laser line pixel coordinates; d) Calculating coordinates of the laser line under a camera coordinate system; e) And solving the relative position relation between the laser profiler and the camera according to the pixel coordinates of the undistorted laser line and the coordinates of the laser line under the camera coordinate system, thereby completing the calibration of the laser profiler. Referring to fig. 1, fig. 1 is a schematic diagram of a calibration method of a laser profiler based on camera assistance provided in this embodiment, in fig. 1, a camera sensor is used to collect an image of a calibration board without laser, a line laser emitter of the laser profiler emits laser to the calibration board, and the laser profiler collects an image of the calibration board with laser according to the emitted laser.
In the line laser profiler calibration technology based on camera assistance, a camera is a key structure in a calibration scheme. However, in practical applications, due to limitations of manufacturing process and cost, the exposure of the camera in many line laser profiler products is too low or there is no camera component, and the texture information of the calibration plate cannot be obtained. In this case, the line laser profiler calibration technique based on camera assistance fails. Meanwhile, the method requires the matching of cameras, so that the calibration cost is increased, in addition, the camera is calibrated firstly in the calibration process, and then the relative position of the laser profiler and the camera is calibrated.
The calibration technology based on the single polygonal column calibration block can calibrate the line laser profiler without a camera, and can realize the calibration which only depends on the line laser profiler. The main calibration process is as follows: a) Placing a polygonal body with a known size (the number of the prisms is the same as that of the line laser profilers in the line laser profiler set) in the middle of the line laser profiler set; b) Acquiring polygonal column profile information by using a line laser profile instrument group; c) And (3) adjusting the translation and rotation angles of the laser profilers of all lines to enable the acquired profile to be effectively integrated, and finally obtaining the correct and undistorted whole polygonal overall profile. Referring to fig. 2, fig. 2 is a schematic diagram of a calibration method based on a single polygonal column calibration block provided in this embodiment, in fig. 2, the laser profiler set is a four-line laser profiler set, that is, 4 line laser profilers in the line laser profiler set, the calibration block is disposed between the 4 line laser profilers, and each line laser profiler has a line laser emitter for emitting laser.
In the calibration technology based on a single polygonal column calibration block, only a single position of the line laser profilometer group can be calibrated in each calibration. However, line laser profilers often have nonlinear distortions (e.g., pincushion and barrel distortion) at different locations in the field of view, which are difficult to achieve with a single location for efficient calibration. Therefore, this method makes it difficult to achieve accurate calibration of the line laser profilometer set over a large field of view. The calibration plate adopted by the line laser profiler calibration method based on camera assistance is a two-dimensional calibration plate, so that the line laser profiler set with a large range and multiple angles is difficult to calibrate synchronously, and the industrial practicability of the line laser profiler set is reduced.
In view of this, the embodiment of the invention provides a line laser profiler calibration method, a device, an electronic apparatus and a storage medium, by determining a first parameter based on an original profile point cloud of a preset calibration object acquired by a line laser profiler, registering a real profile point cloud and the original profile point cloud based on the first parameter, and finally determining calibration parameters of the line laser profiler according to the point cloud pair obtained by registration, the line laser profiler is accurately calibrated when no camera assistance or no effective acquisition of calibration board texture information by a camera in the line laser profiler is realized, in addition, in an application scene of a line laser profiler group formed by a plurality of line laser profilers, by arranging the view fields of the line laser profilers in the same plane, the view field plane of the line laser profiler is parallel to a bottom plate of a three-dimensional calibration board, and the three-dimensional calibration board is positioned in a view overlapping area of the line laser profiler, the preset calibration object on the three-dimensional calibration board is positioned in a view field of at least one line laser profiler, thereby realizing accurate calibration in a large view field, and simultaneously, all line laser profilers in the line laser profiler group can be synchronized. Which will be described in detail below.
Referring to fig. 3, fig. 3 is a schematic diagram of the three-dimensional calibration plate provided in the embodiment, and in fig. 3, the three-dimensional calibration plate 10 includes a bottom plate 101, a calibration object mounting hole 102, a calibration object 103 and a calibration plate fixing hole 104. The position and the size of the calibration object mounting hole 102 on the bottom plate 101 of the three-dimensional calibration plate 10, and the shape contour and the size of the calibration object 103 are all precisely machined to ensure high-precision calibration. The calibration object mounting holes 102 are equally spaced, and the calibration object 103 may be a cylinder. The calibration plate fixing holes 104 are used to fix the three-dimensional calibration plate 10. When in calibration, the three-dimensional calibration plate 10 is arranged at the overlapping position of the visual fields of the line laser profilometer, the bottom plate 101 is parallel to the plane formed by the visual fields of the line laser profilometer, and the calibration object 103 is positioned in the visual field range of the line laser profilometer, so that the line laser profilometer can measure and calibrate according to the three-dimensional calibration plate 10 at as many positions as possible, the high-precision calibration in the visual field range as large as possible is realized, and 2 conditions are satisfied as much as possible when the calibration object 103 is installed: 1) Installing as many calibration objects 103 as possible in as many calibration object installing holes 102 as possible; 2) The calibration object 103 is not blocked from each other as much as possible in the field of view of each line laser profiler in the line laser profiler set. Referring to fig. 4, fig. 4 is a schematic diagram showing a relative positional relationship between a three-dimensional calibration board and a line laser profiler set according to the present embodiment, in fig. 4, the line laser profiler set includes 4 line laser profilers, each line laser profiler includes a probe, that is, a laser emitter, for emitting laser, the relative positions of the three-dimensional calibration board 10 and the 4 line laser profilers are as shown in fig. 4, the fields of view of the 4 line laser profilers are in the same plane, and the plane formed by the base plate 101 and the fields of view of the line laser profiler set is parallel.
After setting the three-dimensional calibration board 10 of fig. 3 according to the positional relationship of fig. 4, an original contour point cloud of the calibration object 103 on the three-dimensional calibration board 10 can be obtained, and then the line laser profiler is calibrated based on the original contour point cloud and the real contour point cloud, and referring to fig. 5, fig. 5 is a schematic flow chart of the line laser profiler calibration method provided in this embodiment, and the method includes the following steps:
step S101, acquiring a real contour point cloud of a preset calibration object and an original contour point cloud of the preset calibration object acquired by a line laser profiler.
In this embodiment, the preset calibrations may be a plurality of calibrations 103 on the three-dimensional calibration plate 10 in fig. 4. When the laser emitted by the line laser profiler reaches the calibration object 103, the line laser profiler can collect the original profile point cloud of the preset calibration object within the visual field range of the line laser profiler. When the number of the line laser profilers is one or more, each line laser profiler can collect original profile point clouds of a preset calibration object in the visual field range of the line laser profilers, and then each line laser profiler calibrates the line laser profiler by using the collected original profile point clouds and real profile point clouds of the preset calibration object respectively.
Step S102, registering a real contour point cloud and an original contour point cloud based on a first parameter to obtain a point cloud pair, wherein the first parameter represents a mapping relation between a world coordinate system and a coordinate system of a line laser profiler; the first parameter is determined according to a first geometric center of a preset calibration object in a world coordinate system and a second geometric center of the coordinate system of the online laser profiler, and the second geometric center is determined based on an original profile point cloud.
In this embodiment, the first geometric center is a geometric center of the preset calibration object in a world coordinate system, the second geometric center is a geometric center of the preset calibration object in a coordinate system of the line laser profiler, the first parameter is determined according to the first geometric center and the second geometric center, the first parameter characterizes a mapping relationship between the world coordinate system and the coordinate system of the line laser profiler, and the second geometric center is determined based on an original profile point cloud. The point cloud pairs comprise a plurality of pairs, each pair comprises one point in the original contour point cloud and a corresponding point in the real contour point cloud, and two points in the same pair correspond to the same position point of the same preset calibration object.
And step S103, determining calibration parameters of the line laser profiler according to the point cloud pair so as to calibrate the line laser profiler.
In this embodiment, the calibration parameter is used to characterize the correspondence between the contour collected by the line laser profiler and the real contour, and according to the calibration parameter, the accuracy of the line laser profiler can be detected, calibrated and optimized.
According to the method provided by the embodiment, a 2D camera is not needed in the calibration process, the calibration process is simplified, errors introduced in different stages in the multi-stage calibration process of calibrating the camera and then calibrating the relative position of the laser profiler and the camera are effectively avoided, the integral upper precision limit of a calibration algorithm is improved, the accurate calibration of the line laser profiler is realized, and the calibration cost introduced by the camera is reduced.
In an alternative embodiment, the first parameter may be determined by using a plurality of preset calibrations, each corresponding to a first geometric center in the world coordinate system, and one implementation may be:
firstly, acquiring an original contour point cloud of each preset calibration object;
secondly, carrying out ellipse fitting on the original contour point cloud of each preset calibration object to obtain a second geometric center of each preset calibration object in the coordinate system of the online laser profiler;
in this embodiment, the fields of view of the line laser profilers in the line laser profiler set are all in the same plane, defined as 
,/>
Plane, since each line laser profiler in the line laser profiler set is not offset +.>
,/>
The planar space is measured without consideration of the edges in calibration>
The calibration problem of the axis, therefore, the geometric center (i.e. the second geometric center) of the fitted preset calibration object under the online laser profiler coordinate system can be expressed as +.>
. Wherein (1)>
，/>
For presetting the number of the calibration objects, < > and->
And->
The x-axis coordinate and the y-axis coordinate of the second geometric center of the kth preset calibration object are respectively.
Finally, determining a first parameter according to the first geometric center and the second geometric center of each preset calibration object.
In an alternative embodiment, the process of determining the first parameter is also a process of performing coarse registration on the first geometric center and the second geometric center, and one implementation manner of determining the first parameter according to the first geometric center and the second geometric center of each preset calibration object is as follows:
firstly, randomly selecting a preset number of target calibration objects from all preset calibration objects each time until the selection times reach preset times;
in this embodiment, the preset number of times may be set according to actual needs, where the preset number depends on the solution requirement of the first parameter, for example, is set to 3.
Secondly, calculating a rotation matrix and a translation matrix of each time according to the first geometric centers and the second geometric centers of the target calibration objects of the preset number selected each time, wherein the rotation matrix represents the rotation relationship between the world coordinate system of the target calibration object selected each time and the coordinate system of the line laser profiler, and the translation matrix represents the translation relationship between the world coordinate system of the target calibration object selected each time and the coordinate system of the line laser profiler;
in this embodiment, taking the preset number as 3 as an example, with 3 pairs of the first geometric center and the second geometric center, the rotation matrix and the translation matrix of each time can be solved according to the following formula:
wherein R is a rotation matrix,
，/>
is the rotation angle; t is a translation matrix, ">
，/>
For translation on the x-axis +.>
For translation on the y-axis; />
For the first geometric center of the target calibration object, < +.>
，/>
、/>
X-axis and y-axis coordinates, respectively, of the first geometric center of the first target calibration object,/->
、/>
X-axis and y-axis coordinates, respectively, of the first geometric center of the second target calibration object,/->
、/>
Respectively an x-axis coordinate and a y-axis coordinate of a first geometric center of a third target calibration object; />
Is the second geometric center of the target calibration object, 
，/>
、/>
X-axis and y-axis coordinates, respectively, of the second geometric center of the first target calibration object,/->
、/>
X-axis and y-axis coordinates, respectively, of the second geometric center of the second target calibration object,/->
、/>
The x-axis and y-axis coordinates of the second geometric center of the third target calibration object, respectively.
Thirdly, calculating each transformation error according to the first geometric center and the second geometric center of all preset calibration objects, each rotation matrix and each translation matrix;
in this embodiment, the transformation error for any one time can be calculated using the following formula:
Fourth, a rotation matrix and a translation matrix with the minimum transformation error in the preset times are determined as the first parameter.
After determining the first parameter, registering the real contour point cloud and the original contour point cloud based on the first parameter to obtain a point cloud pair, wherein one implementation method may be as follows:
firstly, correcting an original contour point cloud according to a first parameter to obtain a reference contour point cloud;
In this embodiment, the correction of the original contour point cloud is performed by correcting the coordinates of each point in the original contour point cloud, and for the coordinates of each point in the original contour point cloud, the correction is performed by using the first parameter alignment, and the reference contour point cloud includes each point in all corrected original contour point clouds.
Secondly, registering the reference contour point cloud and the real contour point cloud to obtain a registration pair, wherein the registration pair comprises the reference contour point cloud and the corresponding real contour point cloud;
in this embodiment, the registration pairs include a plurality of pairs, each pair including one point in the reference contour point cloud and a corresponding point in the true contour point cloud.
And finally, replacing the reference contour point cloud in the registration pair with the corresponding original contour point cloud to obtain a point cloud pair.
In fact, in addition to the above implementation, in order to simplify the calculation, the registration pair may also be directly used as a point cloud pair for subsequent calibration processing.
In an alternative embodiment, in order to improve the registration accuracy, an iterative closest point algorithm is used to perform fine registration on the reference contour point cloud and the real contour point cloud, and in order to continuously adjust the reference contour point cloud to approach the expectation more quickly, the embodiment provides a calculation manner for adjusting the second parameter of the reference contour point cloud:
First, calculating a first centroid of a reference contour point cloud;
in this embodiment, the calculation formula of the first centroid may be:
wherein->
For the first centroid, n is the number of points in the reference contour point cloud, +.>
Is the coordinates of the ith point in the reference contour point cloud.
Second, calculating a second centroid of the real contour point cloud;
in this embodiment, the calculation formula of the second centroid may be:
wherein->
For the second centroid, n is the number of points in the true contour point cloud, which is the same as the number of points in the reference contour point cloud, ">
Is the coordinates of the ith point in the true contour point cloud.
Thirdly, determining a parameter matrix according to the first centroid, the second centroid, the reference contour point cloud and the real contour point cloud;
in this embodiment, the parameter matrix can be obtained by the following formula:
Fourth, singular value decomposition is carried out on the parameter matrix, and a second parameter is obtained.
In this embodiment, H may be decomposed into:
wherein H is a parameter matrix, if H is an mxn matrix, U is an mxm matrix, D is an mxn matrix, all but the elements on the main diagonal are 0, each element on the main diagonal is called a singular value, V is an nxn matrix, U and V are unitary matrices, and the rotation matrix R of the second parameter and the translation matrix T of the second parameter can be calculated by the following formula:
Based on the calculation mode of the second parameter, the embodiment provides a registration method for registering the reference contour point cloud and the real contour point cloud, and one implementation mode for obtaining a registration pair is as follows:
firstly, calculating a second parameter according to a reference contour point cloud and a real contour point cloud, wherein the second parameter represents the corresponding relation between the reference contour point cloud and the real contour point cloud;
secondly, updating the reference contour point cloud according to the second parameter;
in this embodiment, updating the reference contour point cloud according to the second parameter is achieved by updating each point in the reference contour point cloud according to the second parameter. The second parameter may include at least one of a rotation matrix and a translation matrix. The formula for updating the reference contour point cloud may be:
Thirdly, calculating a distance error according to the updated reference contour point cloud and the updated real contour point cloud;
in this embodiment, the calculation formula of the distance error is:
wherein->
For distance error, n is the number of points in the reference contour point cloud, also the number of points in the real contour point cloud, and P is the real contour point cloud, +.>
Is the updated reference contour point cloud.
Fourth, if the distance error is greater than or equal to the preset threshold, replacing the reference contour point cloud with the updated reference contour point cloud, and repeating the steps until the distance error is less than the preset threshold;
Fifthly, determining the reference contour point cloud and the real contour point cloud as registration pairs when the distance error is smaller than a preset threshold value.
In this embodiment, the registration pairs may be one or more groups, and accordingly, the point cloud pairs may be one or more groups, and as an implementation manner, the angle of the three-dimensional calibration plate 10 may be adjusted once to obtain a set of registration pairs, or the installation position of the calibration object 103 on the three-dimensional calibration plate 10 may be exchanged once to obtain a set of registration pairs.
In an alternative embodiment, the number of the point cloud pairs is multiple, and one implementation manner of determining the calibration parameters of the line laser profiler according to the point cloud pairs is as follows:
firstly, acquiring coordinates of original contour point clouds in each point cloud pair and coordinates of corresponding real contour point clouds;
secondly, solving a polynomial calibration equation established in advance according to the coordinates of all original contour point clouds and the coordinates of the real contour point clouds corresponding to each original contour point to obtain equation coefficients of the polynomial calibration equation;
thirdly, the equation coefficient is used as the calibration parameter of the line laser profiler.
In this embodiment, the calibration equation can be expressed as:
wherein, the liquid crystal display device comprises a liquid crystal display device,
,/>
is the total number of all N groups of point cloud pairs. / >
And->
Is->
The real contour point cloud of each preset calibration object and the corresponding point pair of the original contour point cloud are +.>
Axis coordinates->
And->
Is->
The real contour point cloud of the calibration object and the corresponding point pair of the original contour point cloud are +.>
And (5) axis coordinates.
The equation coefficients of the calibration equation can be solved by using a least square method:
and (3) making:
The least squares solution for B is then:
and B is a calibration parameter.
It should be noted that, the least square method is just an implementation manner for solving the polynomial equation coefficients, and in fact, other overdetermined equation solving algorithms may be used to solve the polynomial equation coefficients.
According to the method provided by the embodiment, the linear laser profiler distortion is calibrated by adopting the polynomial equation fitting scheme, so that not only can the rigid distortion comprising rotation and translation be well fitted, but also nonlinear distortion such as affine transformation can be calibrated and corrected.
In order to describe the calibration flow integrally, the present embodiment further provides an example diagram of the overall flow of the calibration method of the line laser profiler, please refer to fig. 6, fig. 6 is an example diagram of the overall flow of the calibration method of the line laser profiler provided by the embodiment of the present invention, it can be seen from fig. 6 that, in the calibration method provided by the present embodiment, first coarse registration is performed on the first geometric center and the second geometric center of the calibration object to obtain the first parameter, then the first parameter is used to correct the original profile point cloud, fine registration is performed on the reference profile point cloud and the real profile point cloud obtained after correction, a plurality of sets of point cloud pairs are obtained by rotating the three-dimensional calibration plate, equation coefficients of the calibration equation are solved by the plurality of sets of point cloud pairs, and finally the calibration parameter is obtained, thereby realizing the calibration of the line laser profiler.
In order to carry out the respective steps of the above-described embodiments and of the various possible embodiments, an implementation of a line laser profiler calibration device is given below. Referring to fig. 7, fig. 7 is a block diagram of a line laser profiler calibration apparatus 100 according to an embodiment of the invention. It should be noted that, the basic principle and the technical effects of the line laser profiler calibration device 100 according to the present embodiment are the same as those of the foregoing embodiments, and for brevity, the description of this embodiment is not mentioned.
The line laser profiler calibration device 100 includes an acquisition module 110, a registration module 120, and a calibration module 130.
The acquisition module 110 is configured to acquire a real contour point cloud of a preset calibration object and an original contour point cloud of the preset calibration object acquired by a line laser profiler;
the registration module 120 is configured to register the real contour point cloud and the original contour point cloud based on a first parameter, to obtain a point cloud pair, where the first parameter characterizes a mapping relationship between a world coordinate system and a coordinate system of the line laser profiler; the first parameter is determined according to a first geometric center of a preset calibration object in a world coordinate system and a second geometric center of an on-line laser profiler in the coordinate system, and the second geometric center is determined based on an original profile point cloud;
In an alternative embodiment, the registration module 120 is specifically configured to: correcting the original contour point cloud according to the first parameter to obtain a reference contour point cloud; registering the reference contour point cloud and the real contour point cloud to obtain a registration pair, wherein the registration pair comprises the reference contour point cloud and the corresponding real contour point cloud; and replacing the reference contour point cloud in the registration pair with the corresponding original contour point cloud to obtain a point cloud pair.
In an alternative embodiment, the registration module 120 is specifically configured to register the reference contour point cloud and the true contour point cloud to obtain a registration pair, and is specifically configured to: calculating a second parameter according to the reference contour point cloud and the real contour point cloud, wherein the second parameter represents the corresponding relation between the reference contour point cloud and the real contour point cloud; updating the reference contour point cloud according to the second parameter; calculating a distance error according to the updated reference contour point cloud and the updated real contour point cloud; if the distance error is greater than or equal to the preset threshold value, replacing the reference contour point cloud with the updated reference contour point cloud, and repeatedly executing the steps until the distance error is smaller than the preset threshold value; and determining the reference contour point cloud and the real contour point cloud as registration pairs when the distance error is smaller than a preset threshold value.
In an alternative embodiment, the registration module 120 is specifically configured to, when specifically configured to calculate the second parameter from the reference contour point cloud and the true contour point cloud: calculating a first centroid of the reference contour point cloud; calculating a second centroid of the real contour point cloud; determining a parameter matrix according to the first centroid, the second centroid, the reference contour point cloud and the real contour point cloud; and performing singular value decomposition on the parameter matrix to obtain a second parameter.
In an alternative embodiment, the number of the preset calibrations is plural, each preset calibration corresponding to a first geometric center in the world coordinate system, and the registration module 120 is further configured to: acquiring an original contour point cloud of each preset calibration object; performing ellipse fitting on the original contour point cloud of each preset calibration object to obtain a second geometric center of each preset calibration object in the coordinate system of the online laser profiler; and determining a first parameter according to the first geometric center and the second geometric center of each preset calibration object.
In an alternative embodiment, the registration module 120 is specifically configured to, when configured to determine the first parameter according to the first geometric center and the second geometric center of each preset landmark: randomly selecting a preset number of target calibration objects from all preset calibration objects each time until the selection times reach preset times; calculating a rotation matrix and a translation matrix of each time according to the first geometric centers and the second geometric centers of the target calibration objects of the preset number selected each time, wherein the rotation matrix represents the rotation relationship between the world coordinate system of the target calibration object selected each time and the coordinate system of the line laser profiler, and the translation matrix represents the translation relationship between the world coordinate system of the target calibration object selected each time and the coordinate system of the line laser profiler; calculating each transformation error according to the first geometric center and the second geometric center of all preset calibration objects, each rotation matrix and each translation matrix; and determining a rotation matrix and a translation matrix with the minimum transformation error in the preset times as a first parameter.
And the calibration module 130 is used for determining calibration parameters of the line laser profiler according to the point cloud pair so as to calibrate the line laser profiler.
In an alternative embodiment, the number of the point cloud pairs is plural, and the calibration module 130 is specifically configured to: acquiring the coordinates of the original contour point cloud and the coordinates of the corresponding real contour point cloud in each point cloud pair; solving a pre-established polynomial calibration equation according to the coordinates of all original contour point clouds and the coordinates of the real contour point clouds corresponding to each original contour point to obtain equation coefficients of the polynomial calibration equation; and taking the equation coefficient as a calibration parameter of the line laser profiler.
In an alternative embodiment, in the line laser profiler calibration device 100, a plurality of line laser profilers are provided, the fields of view of the plurality of line laser profilers are in the same plane, the field of view plane of the line laser profilers is parallel to the bottom plate of the three-dimensional calibration plate, the three-dimensional calibration plate is in the overlapping area of the fields of view of the plurality of line laser profilers, a preset calibration object is mounted on the three-dimensional calibration plate, and the preset calibration object is in the field of view of at least one line laser profiler.
Referring to fig. 8, fig. 8 is a block diagram of the electronic device 20 according to the embodiment of the invention, and the electronic device 20 includes a processor 21, a memory 22, and a bus 23. The processor 21 and the memory 22 are connected by a bus 23.
The processor 21 may be an integrated circuit chip with signal processing capabilities. In implementation, the steps of the above method may be performed by integrated logic circuits of hardware in the processor 21 or by instructions in the form of software. The processor 21 may be a general-purpose processor, including a central processing unit (Central Processing Unit, CPU for short), a network processor (Network Processor, NP for short), etc.; but may also be a Digital Signal Processor (DSP), application Specific Integrated Circuit (ASIC), an off-the-shelf programmable gate array (FPGA) or other programmable logic device, discrete gate or transistor logic device, discrete hardware components.
The memory 22 is used for storing a program, such as the line laser profiler calibration device 100 in fig. 7, and the line laser profiler calibration device 100 includes at least one software functional module that may be stored in the memory 22 in the form of software or firmware (firmware), and the processor 21 executes the program after receiving the execution instruction to implement the line laser profiler calibration method in the embodiment of the present invention.
The memory 22 may include high-speed random access memory (RAM: random Access Memory) and may also include non-volatile memory (nonvolatile memory). Alternatively, the memory 22 may be a storage device built into the processor 21, or may be a storage device independent of the processor 21.
The bus 23 may be an ISA bus, a PCI bus, an EISA bus, or the like. Fig. 8 is represented by only one double-headed arrow, but does not represent only one bus or one type of bus.
An embodiment of the present invention provides a computer-readable storage medium having stored thereon a computer program which, when executed by a processor, implements a line laser profiler calibration method as in the foregoing embodiments.
In summary, the embodiment of the invention provides a line laser profiler calibration method, a device, an electronic device and a storage medium, wherein the method comprises the following steps: acquiring a real contour point cloud of a preset calibration object and an original contour point cloud of the preset calibration object acquired by a line laser profiler; registering the real contour point cloud and the original contour point cloud based on a first parameter to obtain a point cloud pair, wherein the first parameter represents a mapping relation between a world coordinate system and a coordinate system of a line laser profiler; the first parameter is determined according to a first geometric center of a preset calibration object in a world coordinate system and a second geometric center of an on-line laser profiler in the coordinate system, and the second geometric center is determined based on an original profile point cloud; and determining calibration parameters of the line laser profiler according to the point cloud pairs so as to calibrate the line laser profiler. The embodiment of the invention has at least the following advantages: 1) The linear laser profiler is directly calibrated without a 2D camera, and the one-step in-place direct calibration scheme can effectively avoid errors introduced by the traditional multi-stage algorithm at different stages, and is beneficial to improving the overall accuracy upper limit of the calibration algorithm. Meanwhile, the calibration cost is reduced, and the industrial practicability of the calibration algorithm is increased; 2) By using the three-dimensional calibration plate, the distortion correction of a large-range view field is realized, the high-precision calibration in the large-range view field is further realized, and all line laser profilers in the line laser profiler set can be calibrated synchronously. 3) And calibrating the linear laser profiler according to the point cloud. The point cloud is used for calibration, so that a higher-precision calibration result is obtained. 4) The linear laser profiler distortion is calibrated by adopting a polynomial fitting scheme in a calibration algorithm, so that not only can rigid distortion including rotation and translation be well fitted, but also nonlinear distortion such as affine transformation can be calibrated and corrected, and secondary distortion can be corrected.
The foregoing is merely illustrative of the present invention, and the present invention is not limited thereto, and any changes or substitutions easily contemplated by those skilled in the art within the scope of the present invention should be included in the present invention. Therefore, the protection scope of the invention is subject to the protection scope of the claims.
Claims (11)
1. A line laser profiler calibration method, the method comprising:
acquiring a real contour point cloud of a preset calibration object and an original contour point cloud of the preset calibration object acquired by a line laser profiler;
registering the real contour point cloud and the original contour point cloud based on a first parameter to obtain a point cloud pair, wherein the first parameter represents a mapping relation between a world coordinate system and a coordinate system of the line laser profiler; the first parameter is determined according to a first geometric center of the preset calibration object in the world coordinate system and a second geometric center of the line laser profiler in the coordinate system, and the second geometric center is determined based on the original profile point cloud;
and determining calibration parameters of the line laser profiler according to the point cloud pair so as to calibrate the line laser profiler.
2. The line laser profiler calibration method of claim 1, wherein the registering the true profile point cloud and the original profile point cloud based on the first parameter to obtain the point cloud pair comprises:
correcting the original contour point cloud according to the first parameter to obtain a reference contour point cloud;
registering the reference contour point cloud and the real contour point cloud to obtain a registration pair, wherein the registration pair comprises the reference contour point cloud and the corresponding real contour point cloud;
and replacing the reference contour point cloud in the registration pair with a corresponding original contour point cloud to obtain the point cloud pair.
3. The line laser profiler calibration method of claim 2, wherein the step of registering the reference profile point cloud and the true profile point cloud to obtain a registration pair comprises:
calculating a second parameter according to the reference contour point cloud and the real contour point cloud, wherein the second parameter characterizes the corresponding relation between the reference contour point cloud and the real contour point cloud;
updating the reference contour point cloud according to the second parameter;
calculating a distance error according to the updated reference contour point cloud and the real contour point cloud;
If the distance error is greater than or equal to a preset threshold value, replacing the reference contour point cloud with the updated reference contour point cloud, and repeatedly executing the steps until the distance error is smaller than the preset threshold value;
and determining the reference contour point cloud and the real contour point cloud as registration pairs when the distance error is smaller than the preset threshold value.
4. A line laser profiler calibration method as set forth in claim 3, wherein the step of calculating a second parameter from the reference profile point cloud and the real profile point cloud includes:
calculating a first centroid of the reference contour point cloud;
calculating a second centroid of the real contour point cloud;
determining a parameter matrix according to the first centroid, the second centroid, the reference contour point cloud and the real contour point cloud;
and performing singular value decomposition on the parameter matrix to obtain a second parameter.
5. The line laser profiler calibration method of claim 1, wherein the plurality of predetermined calibration objects each correspond to a first geometric center in the world coordinate system, the method further comprising:
acquiring an original contour point cloud of each preset calibration object;
Performing ellipse fitting on the original contour point cloud of each preset calibration object to obtain a second geometric center of each preset calibration object in the coordinate system of the line laser profiler;
and determining the first parameter according to the first geometric center and the second geometric center of each preset calibration object.
6. The line laser profiler calibration method as set forth in claim 5, wherein the step of determining the first parameter based on the first geometric center and the second geometric center of each of the predetermined calibration objects comprises:
randomly selecting a preset number of target calibration objects from all the preset calibration objects each time until the selection times reach preset times;
calculating a rotation matrix and a translation matrix of each time according to the first geometric centers and the second geometric centers of the target calibration objects of the preset number selected each time, wherein the rotation matrix represents the rotation relationship between the world coordinate system of the target calibration object selected each time and the coordinate system of the line laser profiler, and the translation matrix represents the translation relationship between the world coordinate system of the target calibration object selected each time and the coordinate system of the line laser profiler;
Calculating each transformation error according to the first geometric center and the second geometric center of all the preset calibrations, the rotation matrix and the translation matrix of each time;
and determining a rotation matrix and a translation matrix with the minimum transformation error in the preset times as the first parameter.
7. The line laser profiler calibration method of claim 1, wherein the point cloud pairs are plural, and the step of determining calibration parameters of the line laser profiler from the point cloud pairs comprises:
acquiring the coordinates of the original contour point clouds and the coordinates of the corresponding real contour point clouds in each point cloud pair;
solving a pre-established polynomial calibration equation according to the coordinates of all the original contour point clouds and the coordinates of the real contour point clouds corresponding to each original contour point to obtain equation coefficients of the polynomial calibration equation;
and taking the equation coefficient as a calibration parameter of the line laser profiler.
8. The line laser profiler calibration method of claim 1, wherein the line laser profilers are a plurality of, the fields of view of the line laser profilers are in the same plane, the field of view plane of the line laser profilers is parallel to the bottom plate of the three-dimensional calibration plate, the three-dimensional calibration plate is in the overlapping area of the fields of view of the line laser profilers, the preset calibration object is mounted on the three-dimensional calibration plate, and the preset calibration object is in the field of view of at least one line laser profiler.
9. A line laser profiler calibration device, the device comprising:
the acquisition module is used for acquiring the real contour point cloud of the preset calibration object and the original contour point cloud of the preset calibration object acquired by the line laser profiler;
the registration module is used for registering the real contour point cloud and the original contour point cloud based on a first parameter to obtain a point cloud pair, and the first parameter characterizes a mapping relation between a world coordinate system and a coordinate system of the line laser profiler; the first parameter is determined according to a first geometric center of the preset calibration object in the world coordinate system and a second geometric center of the line laser profiler in the coordinate system, and the second geometric center is determined based on the original profile point cloud;
and the calibration module is used for determining calibration parameters of the line laser profiler according to the point cloud pair so as to calibrate the line laser profiler.
10. An electronic device comprising a processor and a memory, the memory for storing a program, the processor for implementing the line laser profiler calibration method according to any one of claims 1-8 when the program is executed.
11. A computer-readable storage medium, characterized in that it has stored thereon a computer program which, when executed by a processor, implements the line laser profiler calibration method according to any one of claims 1 to 8.
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