CN116027071A - Novel TEM cell for IC electromagnetic radiation test - Google Patents
Novel TEM cell for IC electromagnetic radiation test Download PDFInfo
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- CN116027071A CN116027071A CN202211130723.4A CN202211130723A CN116027071A CN 116027071 A CN116027071 A CN 116027071A CN 202211130723 A CN202211130723 A CN 202211130723A CN 116027071 A CN116027071 A CN 116027071A
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- electromagnetic radiation
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Abstract
The invention relates to the technical field of TEM cells, in particular to a novel TEM cell for IC electromagnetic radiation test, which comprises a TEM cell main body and a fixed plate, wherein the top end of the TEM cell main body is provided with a stabilizing mechanism, the stabilizing mechanism comprises a mounting frame, and the bottom end of the mounting frame is fixedly connected with the top end of the TEM cell main body. According to the invention, the pressing part is pressed downwards by the stabilizing mechanism, the object to be tested is arranged at the top end of the TEM cell main body, the object to be tested is positioned at the bottom of the pressing block, then the pressing part is released, the pressing part moves upwards under the action of the elastic force of the spring, and meanwhile, the pressing block moves downwards until the object to be tested can be tightly pressed by the pressing block and is fixed under the action of the spring, so that the stability of the object to be tested in the test process is improved, the test is more convenient, and the problems that the existing TEM cell is not provided with a clamping mechanism, the test is inconvenient during working, and the stability of the test cannot be ensured are solved.
Description
Technical Field
The invention relates to the technical field of TEM cells, in particular to a novel TEM cell for testing IC electromagnetic radiation.
Background
Under the condition of very limited laboratory space, a small-sized tested object and a cable are simultaneously placed in electric field radiation to evaluate the radiation immunity of the tested object, and the TEM cell can be used for testing the radiation emission of an integrated circuit and the immunity of the integrated circuit, and has the advantages of convenient use, low testing cost and wide application.
The authorized bulletin number is CN212207579U, which discloses an IC electromagnetic compatibility testing device based on a TEM cell, wherein the size of the TEM cell is greatly reduced, so that the working frequency of the TEM cell is expanded, a special test PCB (printed circuit board) is not required to be manufactured, the operation is convenient, and the on-line test of the IC can be realized.
The base of the prior art scheme is locked on the bottom of the TEM cell through the countersunk head screw so as to be convenient to install and detach, but when IC test is actually carried out, the IC test needs to be carried out stably, the existing TEM cell is not provided with a clamping mechanism, the test is inconvenient during operation, and the stability of the test cannot be ensured, so that a novel TEM cell for the IC electromagnetic radiation test needs to be designed to solve the problems.
Disclosure of Invention
The invention aims to provide a novel TEM cell for IC electromagnetic radiation test, which solves the problems that the IC test needs to be carried out stably when the IC test is carried out in practice, the existing TEM cell is not provided with a clamping mechanism, the test is inconvenient when the test is working, and the test stability cannot be ensured.
In order to achieve the above purpose, the present invention provides the following technical solutions: a novel TEM cell for IC electromagnetic radiation testing, comprising: TEM cell main part and fixed plate, the top of TEM cell main part is provided with stabilizing mean, stabilizing mean includes the mounting bracket, the bottom of mounting bracket and the top fixed connection of TEM cell main part, the inboard of mounting bracket is through pivot movable mounting has the movable frame, the one end fixed mounting of movable frame has the portion of pressing, the bottom fixedly connected with spring of portion of pressing, the bottom of spring and the top fixed connection of TEM cell main part, the one end fixed mounting who keeps away from the portion of pressing of movable frame has the briquetting.
Preferably, the two ends of the TEM cell main body are provided with tightening pieces, the bottom ends of the tightening pieces are fixedly provided with extension blocks, the top ends of the extension blocks are provided with bolts in a threaded manner, and the top ends of the fixing plates are provided with thread grooves.
Preferably, the fixing plates on the front and back sides of the tightening piece are fixedly provided with mounting plates, and one side, close to each other, of each mounting plate is fixedly provided with a blocking block.
Preferably, the top end of the inner side of the tightening piece is fixedly provided with a protruding block, and both ends of the TEM cell main body are provided with limiting grooves.
Preferably, a connecting rod is fixedly connected between the two pressing parts, and a control sleeve is fixedly arranged on the outer surface of the connecting rod.
Preferably, the top end of the pressing part is fixedly provided with a rubber pad, and the upper surface of the rubber pad is uniformly provided with stripes.
Preferably, the bottom end of the pressing block is fixedly provided with a sponge cushion.
Compared with the prior art, the invention has the beneficial effects that:
1. through being provided with firm mechanism, push down the pressing part, place the object that awaits measuring on the top of TEM cell main part, and make the object that awaits measuring be in the bottom of pressing the piece, afterwards loosen the pressing part, the pressing part receives the elasticity effect of spring and can upwards move, the pressing part upwards moves simultaneously and presses the piece and can downwards move, until pressing the piece and can tightly press down the object that awaits measuring, receive the effort of spring, the object that awaits measuring is fixed, stability in the test process has been improved, thereby make the test more convenient, the problem that the current TEM cell is not equipped with tight mechanism, the inconvenient test of during operation, the stability of test can not be guaranteed.
2. Through being provided with the cramp, the fixed plate, extend piece, bolt and screw groove, overlap the cramp respectively at the both ends of TEM cell main part for extend the piece and aim at the screw groove, screw in the screw groove with the bolt again, the bolt has realized the fixed of cramp, and the cramp is by fixed, and the inboard of cramp closely laminates with the both ends of TEM cell main part, thereby has realized the steadiness when TEM cell main part is whole to use.
Drawings
FIG. 1 is a schematic top view of the structure of the present invention;
FIG. 2 is a schematic elevational view of the structure of the present invention;
FIG. 3 is a schematic side view of the structure of the present invention;
fig. 4 is an enlarged partial cross-sectional view of the structure of fig. 3 a in accordance with the present invention.
In the figure: 110. a TEM cell body; 111. a fixing plate; 112. a tightening member; 113. an extension block; 114. a bolt; 115. a thread groove; 116. a mounting plate; 117. a stopper; 118. a protruding block; 119. a limit groove; 200. a stabilizing mechanism; 210. a mounting frame; 211. a movable frame; 212. a pressing part; 213. a spring; 214. pressing the blocks; 215. a sponge cushion; 216. a connecting rod; 217. a control sleeve; 218. rubber pads.
Detailed Description
The following description of the embodiments of the present invention will be made clearly and completely with reference to the accompanying drawings, in which it is apparent that the embodiments described are only some embodiments of the present invention, but not all embodiments. All other embodiments, which can be made by those skilled in the art based on the embodiments of the invention without making any inventive effort, are intended to be within the scope of the invention.
Example 1
Referring to fig. 1-2, an embodiment of the present invention is provided: a novel TEM cell for IC electromagnetic radiation testing, comprising: TEM cell main part 110 and fixed plate 111, TEM cell main part 110's top is provided with stabilizing mean 200, stabilizing mean 200 includes mounting bracket 210, mounting bracket 210's bottom and TEM cell main part 110's top fixed connection, mounting bracket 210's inboard is through pivot movable mounting movable frame 211, movable frame 211's one end fixed mounting has press part 212, press part 212's bottom fixedly connected with spring 213, spring 213's bottom and TEM cell main part 110's top fixed connection, movable frame 211 keeps away from press part 212's one end fixed mounting has press piece 214, press part 212 downwards, place the object to be tested in TEM cell main part 110's top, and make the object to be tested be in the bottom of press piece 214, afterwards loosen press part 212, press part 212 receives spring 213's elasticity effect and upwards moves simultaneously press piece 214 and can downwardly move, until press piece 214 can tightly press down the object to be tested, receive spring 213's effort, the object to be tested is fixed, stability in the test process has been improved, thereby make the test more convenient, the problem of the test that current TEM cell is not equipped with tight mechanism, when working, the test can not be guaranteed.
Further, the top end of the pressing portion 212 is fixedly provided with a rubber pad 218, the upper surface of the rubber pad 218 is uniformly provided with stripes, a worker can realize downward movement of the pressing portion 212 by pressing the rubber pad 218, the stripes on the rubber pad 218 enable the upper surface of the rubber pad 218 to be rough, and the worker can operate the pressing portion 212 to move conveniently, so that the pressing portion is convenient to use.
Further, the bottom fixed mounting of the pressing block 214 has the foam-rubber cushion 215, and when the object to be tested is fixed, the foam-rubber cushion 215 directly contacts with the upper surface of the object to be tested, prevents the pressing block 214 from directly contacting with the object to be tested and leading to the abrasion of the upper surface of the object to be tested during testing, and the foam-rubber cushion 215 improves the protection performance during testing.
Example two
Compared with the first embodiment, referring to fig. 3-4, the two ends of the TEM cell main body 110 are provided with the tightening piece 112, the bottom end of the tightening piece 112 is fixedly provided with the extension block 113, the top end of the extension block 113 is provided with the bolt 114 in a threaded manner, the top end of the fixing plate 111 is provided with the thread groove 115, when the TEM cell main body 110 is used, the tightening piece 112 is respectively sleeved at the two ends of the TEM cell main body 110, so that the extension block 113 is aligned with the thread groove 115, the bolt 114 is screwed into the thread groove 115, the fixation of the tightening piece 112 is realized by the bolt 114, and when the tightening piece 112 is fixed, the inner side of the tightening piece 112 is tightly attached to the two ends of the TEM cell main body 110, thereby realizing the stability of the whole TEM cell main body 110 in use.
Further, the mounting plates 116 are fixedly mounted on the fixing plates 111 on the front and back sides of the tightening member 112, the stop blocks 117 are fixedly mounted on the sides, close to each other, of the mounting plates 116, when the tightening member 112 is sleeved on the end portion of the TEM cell main body 110, the tightening member 112 is controlled to be located between the two stop blocks 117, and the two stop blocks 117 limit the tightening member 112, so that the tightening member 112 cannot move greatly, the worker can control the extension blocks 113 to align with the thread grooves 115, and the worker can screw the bolts 114 into the thread grooves 115 conveniently.
Further, the protruding block 118 is fixedly installed at the top end of the inner side of the tightening piece 112, the limiting grooves 119 are formed in the two ends of the TEM cell main body 110, after the tightening piece 112 is fixed, the protruding block 118 is located in the limiting grooves 119, the limiting grooves 119 play a limiting role, the protruding block 118 and the limiting grooves 119 enable the tightening piece 112 to be fixed and then not to move, the fixing effect is better, and the stability of the TEM cell main body 110 in use is further improved.
Example III
Compared with the first embodiment, referring to fig. 1, the novel TEM cell for IC electromagnetic radiation testing provided by the invention has the advantages that the connecting rod 216 is fixedly connected between the two pressing parts 212, the control sleeve 217 is fixedly arranged on the outer surface of the connecting rod 216, and in order to enable a worker to quickly fix an object to be tested, the worker can control the two pressing parts 212 to move simultaneously through the control sleeve 217, and the moving convenience of the operation pressing parts 212 is improved by the connecting rod 216 and the control sleeve 217.
Working principle: when the TEM cell is used, the pressing part 212 is pressed downwards to place an object to be tested on the top end of the TEM cell main body 110, the object to be tested is positioned at the bottom of the pressing block 214, then the pressing part 212 is loosened, the pressing part 212 moves upwards under the action of the elastic force of the spring 213, the pressing part 212 moves upwards and simultaneously the pressing block 214 moves downwards until the pressing block 214 can tightly press the object to be tested, the object to be tested is fixed under the action of the spring 213, the stability in the test process is improved, so that the test is more convenient, and the problems that the existing TEM cell is not provided with a clamping mechanism, the test is inconvenient during working, and the stability of the test cannot be ensured are solved.
When the TEM cell main body 110 is used, the clamping pieces 112 are respectively sleeved at two ends of the TEM cell main body 110, the extension blocks 113 are aligned with the thread grooves 115, then the bolts 114 are screwed into the thread grooves 115, the bolts 114 realize the fixation of the clamping pieces 112, when the clamping pieces 112 are fixed, the inner sides of the clamping pieces 112 are tightly attached to the two ends of the TEM cell main body 110, the stability of the whole TEM cell main body 110 in use is realized, when the clamping pieces 112 are sleeved at the end parts of the TEM cell main body 110, the clamping pieces 112 are controlled to enable the two sides of the clamping pieces to be positioned between the two resisting blocks 117, and the two resisting blocks 117 limit the clamping pieces 112, so that the clamping pieces 112 cannot move greatly, and a worker can conveniently control the extension blocks 113 to be aligned with the thread grooves 115, so that the bolts 114 are screwed into the thread grooves 115 by the worker.
It will be evident to those skilled in the art that the invention is not limited to the details of the foregoing illustrative embodiments, and that the present invention may be embodied in other specific forms without departing from the spirit or essential characteristics thereof. The present embodiments are, therefore, to be considered in all respects as illustrative and not restrictive, the scope of the invention being indicated by the appended claims rather than by the foregoing description, and all changes which come within the meaning and range of equivalency of the claims are therefore intended to be embraced therein. Any reference sign in a claim should not be construed as limiting the claim concerned.
Claims (7)
1. A novel TEM cell for IC electromagnetic radiation testing, comprising: TEM cell main part (110) and fixed plate (111), the top of TEM cell main part (110) is provided with stabilizing mean (200), stabilizing mean (200) are including mounting bracket (210), the bottom of mounting bracket (210) and the top fixed connection of TEM cell main part (110), movable frame (211) are installed through pivot movable mounting to the inboard of mounting bracket (210), one end fixed mounting of movable frame (211) has pressing part (212), the bottom fixedly connected with spring (213) of pressing part (212), the bottom of spring (213) and the top fixed connection of TEM cell main part (110), one end fixed mounting that pressing part (212) were kept away from to movable frame (211) has press briquetting (214).
2. A novel TEM cell for IC electromagnetic radiation testing as claimed in claim 1 wherein: both ends of TEM cell main part (110) all are provided with cramp piece (112), and the bottom fixed mounting of cramp piece (112) has extension piece (113), and bolt (114) are installed to the top screw thread of extension piece (113), and thread groove (115) have been seted up on the top of fixed plate (111).
3. A novel TEM cell for IC electromagnetic radiation testing according to claim 2, wherein: the front and back fixing plates (111) of the tightening piece (112) are fixedly provided with mounting plates (116), and one surfaces of the mounting plates (116) close to each other are fixedly provided with stop blocks (117).
4. A novel TEM cell for IC electromagnetic radiation testing according to claim 2, wherein: protruding blocks (118) are fixedly arranged at the top end of the inner side of the tightening piece (112), and limiting grooves (119) are formed in two ends of the TEM cell main body (110).
5. A novel TEM cell for IC electromagnetic radiation testing as claimed in claim 1 wherein: a connecting rod (216) is fixedly connected between the two pressing parts (212), and a control sleeve (217) is fixedly arranged on the outer surface of the connecting rod (216).
6. A novel TEM cell for IC electromagnetic radiation testing as claimed in claim 1 wherein: the top end of the pressing part (212) is fixedly provided with a rubber pad (218), and the upper surface of the rubber pad (218) is uniformly provided with stripes.
7. A novel TEM cell for IC electromagnetic radiation testing as claimed in claim 1 wherein: the bottom end of the pressing block (214) is fixedly provided with a foam cushion (215).
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202211130723.4A CN116027071A (en) | 2022-09-16 | 2022-09-16 | Novel TEM cell for IC electromagnetic radiation test |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202211130723.4A CN116027071A (en) | 2022-09-16 | 2022-09-16 | Novel TEM cell for IC electromagnetic radiation test |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN116027071A true CN116027071A (en) | 2023-04-28 |
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Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202211130723.4A Pending CN116027071A (en) | 2022-09-16 | 2022-09-16 | Novel TEM cell for IC electromagnetic radiation test |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN116027071A (en) |
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- 2022-09-16 CN CN202211130723.4A patent/CN116027071A/en active Pending
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