CN116009621A - Split temperature control system and method of modem for rotor system ground test - Google Patents
Split temperature control system and method of modem for rotor system ground test Download PDFInfo
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B64—AIRCRAFT; AVIATION; COSMONAUTICS
- B64F—GROUND OR AIRCRAFT-CARRIER-DECK INSTALLATIONS SPECIALLY ADAPTED FOR USE IN CONNECTION WITH AIRCRAFT; DESIGNING, MANUFACTURING, ASSEMBLING, CLEANING, MAINTAINING OR REPAIRING AIRCRAFT, NOT OTHERWISE PROVIDED FOR; HANDLING, TRANSPORTING, TESTING OR INSPECTING AIRCRAFT COMPONENTS, NOT OTHERWISE PROVIDED FOR
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- G01D—MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE; ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVERED IN A SINGLE OTHER SUBCLASS; TARIFF METERING APPARATUS; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR
- G01D5/00—Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable
- G01D5/26—Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable characterised by optical transfer means, i.e. using infrared, visible, or ultraviolet light
- G01D5/32—Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable characterised by optical transfer means, i.e. using infrared, visible, or ultraviolet light with attenuation or whole or partial obturation of beams of light
- G01D5/34—Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable characterised by optical transfer means, i.e. using infrared, visible, or ultraviolet light with attenuation or whole or partial obturation of beams of light the beams of light being detected by photocells
- G01D5/353—Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable characterised by optical transfer means, i.e. using infrared, visible, or ultraviolet light with attenuation or whole or partial obturation of beams of light the beams of light being detected by photocells influencing the transmission properties of an optical fibre
- G01D5/35306—Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable characterised by optical transfer means, i.e. using infrared, visible, or ultraviolet light with attenuation or whole or partial obturation of beams of light the beams of light being detected by photocells influencing the transmission properties of an optical fibre using an interferometer arrangement
- G01D5/35309—Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable characterised by optical transfer means, i.e. using infrared, visible, or ultraviolet light with attenuation or whole or partial obturation of beams of light the beams of light being detected by photocells influencing the transmission properties of an optical fibre using an interferometer arrangement using multiple waves interferometer
- G01D5/35316—Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable characterised by optical transfer means, i.e. using infrared, visible, or ultraviolet light with attenuation or whole or partial obturation of beams of light the beams of light being detected by photocells influencing the transmission properties of an optical fibre using an interferometer arrangement using multiple waves interferometer using a Bragg gratings
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- G01K—MEASURING TEMPERATURE; MEASURING QUANTITY OF HEAT; THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR
- G01K11/00—Measuring temperature based upon physical or chemical changes not covered by groups G01K3/00, G01K5/00, G01K7/00 or G01K9/00
- G01K11/32—Measuring temperature based upon physical or chemical changes not covered by groups G01K3/00, G01K5/00, G01K7/00 or G01K9/00 using changes in transmittance, scattering or luminescence in optical fibres
- G01K11/3206—Measuring temperature based upon physical or chemical changes not covered by groups G01K3/00, G01K5/00, G01K7/00 or G01K9/00 using changes in transmittance, scattering or luminescence in optical fibres at discrete locations in the fibre, e.g. using Bragg scattering
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01K—MEASURING TEMPERATURE; MEASURING QUANTITY OF HEAT; THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR
- G01K7/00—Measuring temperature based on the use of electric or magnetic elements directly sensitive to heat ; Power supply therefor, e.g. using thermoelectric elements
- G01K7/16—Measuring temperature based on the use of electric or magnetic elements directly sensitive to heat ; Power supply therefor, e.g. using thermoelectric elements using resistive elements
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Abstract
The invention provides a split temperature control system and a method of a modem for rotor system ground test, wherein the temperature control system comprises an incubator and a semiconductor refrigeration control box, wherein a semiconductor refrigeration device is arranged in the incubator, and the hot end of the semiconductor refrigeration device is contacted with a supercooling water pipe; a fiber grating temperature sensor connected with a fiber grating demodulator is arranged outside the incubator; the inner cavity of the incubator is also provided with a temperature sensor; a control system is arranged in the semiconductor refrigeration control box; the control system adjusts the circulation temperature of the semiconductor refrigeration and supercooled oil according to the difference between the internal temperature sensor and the external temperature sensor and the target temperature to stabilize the temperature in the incubator. The invention can actively regulate the temperature according to the internal and external environments, particularly regulate the temperature before the internal temperature changes, ensure the internal temperature to be in a reasonable working interval under the condition of the severe external environment changes, and ensure the temperature fluctuation to be always in the demodulator requirement range during the temperature regulation.
Description
Technical Field
The invention belongs to the technical field of temperature control of electric control test equipment, and particularly relates to a split temperature control system and method of a modem for ground test of a rotor system.
Background
The rotor wing is a core component for providing power and operation for the helicopter, and the dynamic monitoring of the structural load of the blade is a main basis for the dynamic characteristic analysis and the blade design verification of the rotor blade, so that the strength, the performance and the flight characteristic of the helicopter are directly influenced. The rotor blade dynamic load test has the advantages of complex distribution, large measuring range, dense measuring points, sensitivity to additional mass, high dynamic response and being in complex environments such as rotation, vibration and the like. How to monitor the dynamic load of the blade in the flying state and analyze and evaluate the running state in real time is the key point of the helicopter measurement technology. The bending moment of the blade is an important parameter for identifying the structural load of the blade, and the dynamic bending moment of the rotor blade in the running process is measured in real time, so that the dynamic monitoring of the structural load of the blade becomes very important.
The traditional rotor wing load test adopts an electrical measurement sensor to obtain measurement data, has low signal to noise ratio and seriously affects the accuracy of rotor wing load identification; a large number of strain gages are required to be stuck so as to be connected with a large number of transmission wires, so that the smoothness and the structure of the blade surface can be damaged when the surface of the composite material blade is subjected to multipoint measurement, larger additional mass is generated, and the pneumatic flight characteristic of the blade is influenced. The fiber bragg grating sensor has the advantages of small volume, light weight, high electrical insulation, electromagnetic interference resistance, high precision, high reliability and the like, and the characteristics of high sensitivity, easiness in realizing high efficiency of distribution measurement and the like of the fiber bragg grating, breaks through the limitations of the traditional measurement mode based on the electric sensor, can directly measure various physical quantities such as strain, speed, vibration and the like, reduces the complexity of a system, simplifies the structure of the system, and is convenient for monitoring the maintenance characteristics of the system.
However, because the working temperature range of the optical device or the optoelectronic device is relatively narrow due to the process limitation and principle characteristics of the existing photoelectric device, the working temperature range of the demodulator in the adopted fiber grating demodulation system is usually-20 ℃ to 60 ℃, the service condition of the rotor wing is-40 ℃ to 70 ℃, the demodulator cannot work at low temperature or high temperature, therefore, a device is needed to improve the working temperature range of the demodulator, part of electronic elements in the fiber grating demodulator are sensitive to temperature, the working environment of the fiber grating demodulator is kept in a proper temperature range, and the temperature is not subject to drastic fluctuation. The prior constant temperature device controls the heating and refrigerating system to work to control the internal temperature by receiving temperature signals from an internal temperature sensor, when the external environment temperature changes drastically, the control system cannot respond timely, in the temperature adjustment process, the internal temperature may temporarily exceed the working temperature interval of the demodulator, the traditional temperature adjustment algorithm can generate a large amount of cold or heat in a short time, so that the internal temperature environment of the constant temperature box fluctuates drastically, and the drastic temperature change can cause equipment failure or even damage.
Aiming at the problem of efficiency reduction caused by heating in the refrigeration of a semiconductor adopted at present, and simultaneously combining with the actual service environment of a demodulator, the split temperature control system and method of the modem for the ground test of a rotor system are disclosed, and the split temperature control system and method are mainly used.
Disclosure of Invention
The invention aims to overcome the problems in the prior art, and provides a split type temperature control system and a split type temperature control method of a modem for ground test of a rotor system, which aim at the application environment of the modem in a helicopter cabin.
The technical scheme of the invention is as follows: the split temperature control system of the modem for the ground test of the rotor system comprises an incubator and a semiconductor refrigeration control box, wherein a semiconductor refrigeration device and a supercooling water pipe are arranged in the incubator, the cold end of the semiconductor refrigeration device faces the inner cavity of the incubator, and the hot end of the semiconductor refrigeration device is in contact with the supercooling water pipe; a fiber grating temperature sensor connected with a fiber grating demodulator is arranged outside the incubator; the inner cavity of the incubator is used for storing the fiber bragg grating demodulator and is provided with a resistance type temperature sensor; a control system, a cooling water tank and a water chiller are arranged in the semiconductor refrigeration control box; the semiconductor refrigeration device in the incubator is connected with the temperature sensor and the control system in the control cabinet; the control system adjusts the circulation temperature of the semiconductor refrigeration and supercooled oil liquid according to the temperature data measured by the resistance type temperature sensor and the fiber bragg grating temperature sensor to stabilize the temperature in the incubator.
The control system comprises a control circuit and a control panel, wherein the control circuit comprises a PIC controller, and a temperature alarm indicator lamp is arranged on the control panel; the semiconductor refrigerating device and the resistance type temperature sensor in the constant temperature box are connected with a control system in the control box through signal lines.
And 4 fixing clamps are welded on the inner wall of the constant temperature box cover and the inner wall of the bottom of the constant temperature box and are used for fixing the fiber grating demodulator.
The temperature control method of the split temperature control system of the modem for the ground test of the rotor system comprises the following steps:
1) Detecting temperature data of each area according to a stipulated period, wherein the area comprises the temperature of the outer wall area of the incubator corresponding to each fiber bragg grating temperature sensor string and the temperature of the inner area corresponding to the resistance type temperature sensor; the resistance type temperature sensor corresponds to an internal temperature value A of the incubator, wherein A is the temperature acquired by each time node; the temperature sensor in the incubator transmits the acquired temperature value to the control system according to a stipulated period; the temperature information acquired by the fiber bragg grating temperature sensor is analyzed and processed by a fiber bragg grating demodulator to obtain an external surface temperature value B of the incubator N The temperature value is a set B of a plurality of sensor acquisition values N Where n=1, 2, …,20, N is the number of gratings in the fiber grating temperature sensor;
2) The PIC controller in the control system judges the internal temperature value A of the incubator when receiving the signals of the resistance type temperature sensor at each moment, and gives an alarm when A is more than 60 ℃ or A is less than-20 ℃, and the alarm indicator lamp is on;
3) Obtaining the heat transfer coefficient C of the outer surface part of the corresponding incubator in each grating temperature sensor to the internal environment of the equipment N The method comprises the steps of carrying out a first treatment on the surface of the When the internal temperature and the external temperature of the incubator are the same, the side wall of the external surface of the incubator is heated or refrigerated to measure the surface temperature of the same part inside and outside the incubator, the absolute value obtained by subtracting the internal temperature and the external temperature is taken as the heat transfer coefficient,the heat transfer coefficient C N The method is used for quantifying the influence of the external temperature environment of the incubator on the inside;
4) Determining a target temperature value S to be maintained in the incubator, wherein the target temperature is determined according to the working temperature of the fiber bragg grating demodulator, namely-20 ℃ < S <60 ℃, and the target temperature value S is input into a control system through a control box;
5) Determining se:Sup>A first difference function e (t) =s-se:Sup>A of the temperature in the oven and the target temperature, the function being se:Sup>A function of the time variation of the difference between the temperature value se:Sup>A in the oven and the target temperature value S; determining a second difference function between the temperature outside the incubator and the target temperature
Wherein, for the calculation method of the second difference function, the temperature value B of each grating temperature sensor is obtained first N And corresponding heat transfer coefficient C N The multiplied average value, the function of the difference value of the average value and the target temperature about time is a second difference function, and N is the number of the gratings of the external temperature sensor;
6) Determining a first output function from the first difference function; the process is determined by a PID algorithm, namely a first output function is obtained through accumulation of proportional integral calculation, integral calculation and differential calculation;
wherein K is p e (t) is proportional integral calculation, i.e. the temperature difference function e (t) in the incubator at time t is multiplied by the proportional gain K p ，K p ＝0.65K c ,K c The PID is adopted only under the control condition of a proportion link, and the steady-state error of the control system reaches the minimum as much as possible e(t) ＝K c K in e (t) c A value; by adjusting K p Controlling the speed of the constant temperature box reaching the target temperature, K p The greater the speed of approaching the target temperature, the faster; />
Is an integral calculation step, i.e. taking into account past errors, integrating the first difference function from the beginning to the current time and with the integral gain K i Multiplication can reduce the error of the adjustment, < >>
T is the sampling calculation period of PID control, T i Is the integration time of the control system; />
Is a differential calculation step, i.e. taking into account the upcoming error, of calculating a first derivative of the first difference function and adding a constant K of positive value d Multiply by (I)>
t is the differential time of the control system; the three parameters are all the adapting parameters and are more than 0, and are adjusted according to the environmental temperature range of the outer wall of the incubator;
7) Determining a second output function from the second difference function; the process is determined by PID algorithm, i.e. the second output function is obtained by accumulation of proportional, integral and differential calculations
Wherein the proportional calculation, the integral calculation and the differential calculation are all obtained based on a second difference function f (t), the meaning and the method are the same as those of the first output function, and the three calculation links and the parameter function are the same as those of the first output function, but K p 、K i 、K d Specific values are different;
8) Determining an output function μ (t); the output function mu (t) is obtained by adding the first function and the second function; wherein the output function μ (t) is μ (t) =αpid e(t) +βPID f(t) Wherein α and β are adaptation parameters of the first output function and the second output function, respectively, wherein
0<α<1，0<β<1, alpha is a proportional parameter corresponding to the internal environment temperature difference and the maximum temperature difference, e is the current internal environment temperature of the constant temperature box and a set target when the PIC control system samplesThe temperature difference of the temperature is that alpha takes 1 when the internal environment temperature is below-40 ℃ or above 70 ℃, and alpha takes 0 when the internal environment temperature is the same as the target temperature; beta is a proportional parameter corresponding to the maximum temperature difference and f is the temperature difference between the current external environment temperature and the set target temperature when the PIC control system samples, beta is 1 when the external environment temperature is below-20 ℃ and above 60 ℃, and beta is 0 when the external environment temperature is the same as the target temperature;
9) Determining semiconductor refrigerating and heating capacities; the semiconductor generates heat accumulation during refrigeration, and in order to reduce the influence of the heat accumulation on the refrigeration power of the semiconductor, the circulating liquid is driven by the water chiller to take away the heat accumulation;
10 According to the output function and the refrigerating and heating capacity of the semiconductor, adjusting the refrigerating or heating power of the semiconductor; when μ (t) >0 is output, the control system adjusts the magnitude and direction of the semiconductor voltage according to μ (t) to control the semiconductor heating power for the semiconductor heating mode; when mu (t) is output <0, the control system adjusts the direction and the size of the semiconductor voltage according to mu (t) to control the refrigeration power in the semiconductor refrigeration mode, and meanwhile, the water chiller is started to provide cooling water to ensure the normal operation of semiconductor refrigeration.
The invention has the beneficial effects that: the invention discloses a split temperature control system and method of a modem for ground test of a rotor system.
The split type temperature control system provided by the invention has the following beneficial effects:
1. the device integrates two temperature control technologies to ensure the realization of the constant temperature function, firstly, glass fiber is used as a heat insulation material to isolate heat exchange between the inner environment and the outer environment of the constant temperature box, and the temperature fluctuation in the box is reduced; and secondly, the temperature in the box is kept constant by adopting a semiconductor refrigeration/heating mode, the semiconductor refrigeration device can stabilize the temperature balance in the box under the service environment of a high-temperature or low-temperature environment, and the applicable temperature range of the incubator is effectively improved under the combined action of the two measures.
2. The semiconductor refrigerating device of the device is arranged in the filler outside the inner cavity of the incubator, the semiconductor clings to the inner cavity wall of the incubator, the inner cavity space of the incubator is not occupied, and the phenomenon of overhigh or overlow local temperature is not caused.
3. The device is characterized in that stainless steel is adopted as the cavity wall in the incubator, so that the semiconductor refrigeration device can absorb the heat of the environment in the incubator cavity, and the heat of the semiconductor refrigeration device can be conducted into the cavity.
4. The device leaves the cable hole on the thermostated container box, can reserve the space for the cable connection of the equipment in the box, is favorable to the use of internal equipment and the extension of using, can connect more signal lines, improves availability factor. The device adopts the fiber bragg grating sensor and the demodulator, can monitor a plurality of temperature signals outside the incubator simultaneously and output, can stack other sensors simultaneously and measure.
5. The device adopts the mode that adopts cooling fluid circulation cooling, has reduced the temperature of the end that generates heat when semiconductor refrigeration, has improved the efficiency of semiconductor refrigeration, ensures the continuous normal work of thermostated container under high temperature environment.
The device adopts split type box, cools down for semiconductor refrigeration device through supercooling fluid, has reduced the influence that generates heat and bring when semiconductor refrigeration, has improved the refrigeration efficiency of semiconductor, has also improved the operating temperature scope of thermostated container. The device adopts split type box, and semiconductor refrigeration control box is arranged in normal atmospheric temperature environment, need not to carry out high low temperature resistant design, simple structure. The device has increased clamping device, and fixed demodulation appearance prevents the removal of demodulation appearance in the course of the work, and isolated demodulation appearance and insulation can inner wall's contact guarantees the temperature equilibrium of demodulation appearance surface, prevents that local temperature from too high or too low.
6. The device adopts the mode that the demodulator is fixed by fixing fixtures on the bottom and the upper and lower parts of the box cover, so that the demodulator is prevented from being displaced in the working process; on the other hand, the contact part of the fixing clamp and the demodulation instrument is provided with the heat insulation pad, so that the demodulation instrument is not contacted with the inner wall of the heat insulation box, the whole temperature of the surface of the demodulation instrument is prevented from being balanced, and the situation that the local temperature is too high or too low is avoided.
7. The device uses the fiber bragg grating sensor and the fiber bragg grating demodulator as main sources of temperature signals, and the fiber bragg grating sensor is arranged in the external service environment of the incubator to accurately monitor the temperature change inside and outside the incubator.
8. The temperature control method of the split temperature control system of the modem for the rotor system ground test comprises the following technical advantages:
according to the temperature control method, heating/refrigerating power required by balancing internal and external environment fluctuation is calculated according to the two temperature sensors inside and outside the incubator, and the two outputs are overlapped, so that the influence output of the internal self and external environment can be integrated, and the reaction time of temperature regulation and the internal environment temperature fluctuation are reduced. The device takes the influence of external cold and hot environments and internal heat sources on the internal temperature environment of the incubator into consideration, the detection results of the internal sensor and the external sensor are taken as independent inputs, two output functions are respectively obtained, and overall refrigerating and heating output is obtained by integrating the two output functions, so that on one hand, the internal temperature rise caused by heating of internal equipment of the incubator can be balanced, and on the other hand, the influence of the external temperature environment on the internal temperature environment of the incubator can be balanced. When the external environment severely fluctuates and the internal temperature of the equipment starts to change, the control system increases heating/refrigerating power, balances the influence of the external environment in advance and can effectively reduce the fluctuation of the internal temperature.
Wherein the temperature fluctuation in the incubator is affected by three aspects, namely self-heating generated during the operation of the demodulator, and the heat can be accumulated in the incubator to cause the temperature to rise; secondly, the heat or cold is conducted to the inside by the wall of the constant temperature box at the high temperature or the low temperature outside, so that the temperature fluctuation is caused; finally, the cooling or heating of the semiconductor in the tank wall affects the internal temperature. The invention overcomes the defects of certain adjustment delay and severe temperature fluctuation existing in the traditional temperature control method which adopts single input and single output. The temperature control method of the invention calculates the influence of the internal and external environment change on the internal temperature, firstly calculates the self-heating refrigeration power of the balance equipment by adopting the methods of proportion, integral and derivative for the influence of the self-heating of the demodulator on the internal temperature; then, for the influence of the external environment, according to the heat transfer coefficient of the position of each sensor, adopting proportional, integral and differential calculation to obtain the refrigeration or heating power required by balancing the influence of the external environment, wherein the influence of the external environment is counteracted in the wall of the incubator and cannot be conducted to the inside, and the fluctuation of the internal temperature environment cannot be caused; the refrigerating or heating quantity of the inner and outer parts is added and executed by a set of system, so that the energy loss is reduced. Therefore, the control method balances the influence of the internal heat source, a plurality of external heat sources or cold sources of the incubator through a set of refrigerating and heating system; when the surface temperature of the incubator changes, but when the internal temperature is not changed, the temperature control system intervenes in regulation, and the temperature control system has the characteristics of quick regulation reaction and small temperature fluctuation.
Drawings
FIG. 1: the appearance schematic diagram of the incubator of the device is shown;
fig. 2: the internal structure of the incubator is schematically shown;
fig. 3: the structure of the incubator cover of the device is schematically shown;
fig. 4: the device of the invention is characterized in that the thermostat is a schematic diagram of the top-down internal structure;
fig. 5: the device of the invention is a schematic diagram of the front internal structure of the incubator;
fig. 6: the semiconductor control box structure of the device is schematically shown;
fig. 7: the temperature control flow of the device of the invention;
fig. 8: the invention relates to a control relation schematic block diagram of a temperature control system of a device.
Reference numerals illustrate: 1. a cable hole; 2. a grating signal line; 3. a net wire; 4. a demodulator power line; 5. a fiber grating demodulator; 6. a thermostat signal interface; 7. a water inlet; 8. a water outlet; 9. a power interface of the incubator; 10. a stainless steel housing; 11. a glass fiber heat-insulating layer; 12. supercooling water pipe; 13. a semiconductor refrigeration device; 14. a resistive temperature sensor; 15. a heat insulating mat; 16. a handle; 17. quick-release buckle; 18. a case cover; 19. a thermostat controller; 20. a temperature alarm indicator lamp; 21. a transformer; 22. a cooling water tank; 23. a water chiller; 24. a PIC controller; 25. a semiconductor refrigeration switch; 26. a cooling oil switch; 27. a cooling oil controller; 28. a fixing clamp; 29. a fiber grating temperature sensor.
Detailed Description
One embodiment of the present invention will be described in detail below with reference to the attached drawings, but it should be understood that the scope of the present invention is not limited by the embodiment.
In the description of the present invention, it should be understood that the terms "center", "longitudinal", "lateral", "length", "width", "thickness", "upper", "lower", "front", "rear", "left", "right", "vertical", "horizontal", "top", "bottom", "inner", "outer", "axial", "radial", "circumferential", etc. indicate orientations or positional relationships based on the orientations or positional relationships shown in the drawings are merely for convenience in describing the technical solutions of the present invention and to simplify the description, and do not indicate or imply that the devices or elements referred to must have a specific orientation, be configured and operated in a specific orientation, and therefore should not be construed as limiting the present invention.
Referring to fig. 1-8, embodiments of the present invention provide a split temperature control system and method for a modem for ground testing of a rotor system,
the temperature control system comprises a constant temperature box and a semiconductor refrigeration control box; the constant temperature box comprises a box cover 18 and a box body; a heat preservation layer 11 is arranged in the incubator, a semiconductor refrigeration device 13 and a supercooling water pipe 12 are arranged in the heat preservation layer, one side of the semiconductor refrigeration device is attached to the inner cavity wall, and the other side is contacted with the supercooling water pipe; the constant temperature box body is provided with a water inlet 7, a water outlet 8, a signal interface 6, a power interface 8 and a cable hole 1; the inner cavity of the incubator is provided with a fiber bragg grating demodulator 5 and a resistance type temperature sensor 14; the fiber bragg grating demodulator comprises a power line 4, a signal line 2 and a network cable 3; the 4 fixing clamps 28 are welded on the inner wall of the constant temperature box cover, and the 4 fixing clamps 28 are welded on the inner wall of the bottom of the constant temperature box; the constant temperature box cover is connected with the box body through a buckle 17; a temperature control system, a cooling water tank 22 and a water chiller 23 are arranged in the semiconductor refrigeration control box; the control system comprises a control circuit and a control panel, wherein the control circuit comprises a transformer 21 and a PIC controller 24; the control panel comprises a temperature alarm indicator lamp 20, an incubator temperature controller 19, a cooling oil temperature controller 27, a power switch 26 and a semiconductor refrigeration switch 25; the surface of the box body of the semiconductor refrigeration control box is provided with a water inlet 7, a water outlet 8, a signal interface 6 and a power interface 9, and the water inlet, the water outlet, the signal interface and the power interface are respectively and correspondingly connected with an upper interface of the incubator; the semiconductor refrigeration device in the incubator is connected with the temperature sensor through a signal wire with a control system in the control cabinet; the control system adjusts the circulation temperature of the semiconductor refrigeration and supercooled oil according to the difference value of the internal temperature sensor and the external temperature sensor to stabilize the temperature in the incubator.
Working principle: the split type constant temperature device firstly isolates heat transfer of the environment in and outside the box through the heat preservation layer 11, so that temperature fluctuation in the box is reduced; the measures of a semiconductor refrigerating device arranged in a heat insulation layer are adopted, signals of a resistance type temperature sensor 14 and a fiber grating sensor 29 arranged outside the box are detected (the fiber grating sensor is a grating, the temperature is changed due to the temperature, the temperature is analyzed through a demodulator), when the internal temperature and the external temperature are different from the target temperature, the refrigerating system and the heating system are started, and the power is adjusted at any time according to the difference; when the temperature in the box is higher than the working temperature, adopting a refrigeration mode to reduce the temperature in the box; when the temperature in the box is lower than the working temperature, a heating mode is adopted to increase the temperature in the box. In order to further solve the problem of refrigeration efficiency reduction caused by heat generation in the semiconductor refrigeration working process, a cooling oil circulation heat absorption method is adopted to absorb heat on the surface of the semiconductor, so that the semiconductor refrigeration efficiency is improved. The demodulator is fixed through the fixation clamp of case lid and bottom, prevents the removal of demodulator, is provided with the heat insulating mattress on the fixation clamp, makes the insulation can inner wall can not direct conduction heat to the demodulator on.
The working process comprises the following steps: before starting, adding enough cooling oil into a water tank; the fiber bragg grating demodulator is arranged on a fixed clamp in the incubator, and a power line, a fiber bragg grating sensor line and a network line of the demodulator are connected and pass through a cable hole on the incubator; covering the case cover, and fixing the demodulator by the case cover clamp matched with the bottom clamp; connecting a power line, a control signal line and a cooling water pipe of the constant temperature box; and starting the cold water machine, firstly cooling the cooling oil liquid, and starting the semiconductor refrigeration after the period of time. At this time, the split type constant temperature device enters a working state. The insulation layer firstly weakens the influence of the external high-low temperature environment on the insulation box, the resistance type temperature sensor can always detect the temperature in the insulation box, the fiber grating demodulator analyzes the change of the fiber grating and outputs a temperature signal, the temperature signal is transmitted to the PIC control system through a signal wire, the PIC control system continuously compares the temperature with a threshold value, and when the external environment temperature and the temperature in the box generate a difference value, the heating and refrigerating system is started; when the external environment temperature is higher than the set threshold value, the PIC control system outputs and controls the semiconductor to start refrigeration, and the temperature of the inner cavity wall of the heat preservation box is continuously reduced until the temperature in the box reaches the set value. When the external environment temperature is lower than the set threshold value, the PIC control system outputs and controls the semiconductor to heat and start, and the inner cavity wall of the heat preservation box is continuously heated until the temperature in the box reaches the set value.
The temperature control flow chart 7 of the temperature control system shows that the fiber bragg grating demodulator detects the temperature change, the temperature change is input into a target temperature which needs to be kept by the semiconductor incubator, the temperature sensor inside and outside the incubator detects the ambient temperature, the fiber bragg grating demodulator receives and processes signals, the signals are input into the control system, the control system judges whether the ambient temperature gives an alarm or not, the temperature deviates from the target temperature, the semiconductor heating/refrigerating system works, and the refrigerating or heating function is started.
The input and output control relation of the temperature control system is as follows:
μ(t)＝αPID e(t) +βPID f(t)
e(t)＝S-A
wherein: k (K) p ＝0.65K c ；
e: the temperature difference inside the incubator;
f: temperature difference outside the incubator:
s: temperature set point:
a: the temperature of the temperature sensor inside the incubator;
B N : the temperature of a temperature sensor on the surface of the incubator;
C N : influence parameters of sensors at different positions on the surface of the incubator;
t: PID control sampling calculation period
T i : integration time of control system
T d : differential time of control system
The temperature control algorithm of the invention is based on a PID algorithm, after setting a target temperature, an internal resistance temperature sensor 14 detects the internal temperature, a detection result A is input into a control system to calculate a difference function e (t) between the internal current environment temperature and the target temperature, e (t) is substituted into the PID algorithm, and after a proportional algorithm, an integral algorithm and a differential algorithm are overlapped, an internal required output function is obtained and is the PID e(t) The method comprises the steps of carrying out a first treatment on the surface of the The external temperature sensor 29 detects the external temperature and outputs the detection result B N In the input control system, the control system adds an influence factor C according to the influence of the temperature of each temperature sensor on the interior of the incubator N Calculating the temperature difference between the external environment and the internal environment to obtain a temperature difference function f (t), and substituting f (t) into the PID algorithm to obtain an output function of PIDf (t) The influence of the internal heat source and the external heat source/cold source on the internal temperature environment is synthesized, and the total output of the heating and refrigerating system is obtained by superposing two output functionsMu (t); the device can adjust the refrigerating or heating power in real time according to the influence change of the internal and external temperature environments to maintain the temperature environment of the incubator to be balanced near the target temperature; the PID algorithm of the internal temperature sensor can rapidly control the internal temperature of the incubator to the target temperature, and the PID algorithm of the external temperature sensor can reduce the vibration influence of the external temperature environment on the internal environment control. K (K) p 、K i 、K d Alpha and beta are adaptive parameters, and can be determined by repeated tests.
Specifically, the temperature control method of the split temperature control system of the modem for the rotor system ground test comprises the following steps:
1) Detecting temperature data of each area according to a stipulated period, wherein the area comprises the temperature of the outer wall area of the incubator corresponding to each fiber bragg grating temperature sensor string and the temperature of the inner area corresponding to the resistance type temperature sensor; the resistance type temperature sensor corresponds to an internal temperature value A of the incubator, wherein A is the temperature acquired by each time node; the temperature sensor in the incubator transmits the acquired temperature value to the control system according to a stipulated period; the temperature information acquired by the fiber bragg grating temperature sensor is analyzed and processed by a fiber bragg grating demodulator to obtain an external surface temperature value B of the incubator N The temperature value is a set B of a plurality of sensor acquisition values N Where n=1, 2, …,20, N is the number of gratings in the fiber grating temperature sensor;
2) The PIC controller in the control system judges the internal temperature value A of the incubator when receiving the signals of the resistance type temperature sensor at each moment, and gives an alarm when A is more than 60 ℃ or A is less than-20 ℃, and the alarm indicator lamp is on;
3) Obtaining the heat transfer coefficient C of the outer surface part of the corresponding incubator in each grating temperature sensor to the internal environment of the equipment N The method comprises the steps of carrying out a first treatment on the surface of the When the internal temperature and the external temperature of the incubator are the same, the side wall of the external surface of the incubator is heated or refrigerated, the surface temperature of the same part inside and outside the incubator is measured, and the absolute value obtained by subtracting the internal temperature from the external temperature is taken as the heat transfer coefficientC N The method is used for quantifying the influence of the external temperature environment of the incubator on the inside;
4) Determining a target temperature value S to be maintained in the incubator, wherein the target temperature is determined according to the working temperature of the fiber bragg grating demodulator, namely-20 ℃ < S <60 ℃, and the target temperature value S is input into a control system through a control box;
5) Determining se:Sup>A first difference function e (t) =s-se:Sup>A of the temperature in the oven and the target temperature, the function being se:Sup>A function of the time variation of the difference between the temperature value se:Sup>A in the oven and the target temperature value S; determining a second difference function between the temperature outside the incubator and the target temperature
Wherein, for the calculation method of the second difference function, the temperature value B of each grating temperature sensor is obtained first N And corresponding heat transfer coefficient C N The multiplied average value, the function of the difference value of the average value and the target temperature about time is a second difference function, and N is the number of the gratings of the external temperature sensor;
6) Determining a first output function from the first difference function; the process is determined by a PID algorithm, namely a first output function is obtained through accumulation of proportional integral calculation, integral calculation and differential calculation;
wherein K is p e (t) is proportional integral calculation, i.e. the temperature difference function e (t) in the incubator at time t is multiplied by the proportional gain K p ，K p ＝0.65K c ,K c The PID is adopted only under the control condition of a proportion link, and the steady-state error of the control system reaches the minimum as much as possible e(t) ＝K c K in e (t) c A value; by adjusting K p Controlling the speed of the constant temperature box reaching the target temperature, K p The greater the speed of approaching the target temperature, the faster; />
Is an integral calculation step, i.e. taking into account past errors, integrating the first difference function from the beginning to the current time and with the integral gain K i MultiplicationCan reduce the error of regulation, +.>
T is the sampling calculation period of PID control, T i Is the integration time of the control system; />
Is a differential calculation step, i.e. taking into account the upcoming error, of calculating a first derivative of the first difference function and adding a constant K of positive value d Multiply by (I)>
t is the differential time of the control system; the three parameters are all the adapting parameters and are more than 0, and are adjusted according to the environmental temperature range of the outer wall of the incubator;
7) Determining a second output function from the second difference function; the process is determined by PID algorithm, i.e. the second output function is obtained by accumulation of proportional, integral and differential calculations
Wherein the proportional calculation, the integral calculation and the differential calculation are all obtained based on a second difference function f (t), the meaning and the method are the same as those of the first output function, and the three calculation links and the parameter function are the same as those of the first output function, but K p 、K i 、K d Specific values are different;
8) Determining an output function μ (t); the output function mu (t) is obtained by adding the first function and the second function; wherein the output function μ (t) is μ (t) =αpid e(t) +βPID f(t) Wherein α and β are adaptation parameters of the first output function and the second output function, respectively, wherein
0<α<1，0<β<1, alpha is a proportional parameter corresponding to the internal environment temperature difference and the maximum temperature difference, e is the temperature of the current internal environment temperature of the incubator and the set target temperature when the control system samplesThe difference in the degree is that alpha is 1 when the internal environment temperature is below-40 ℃ or above 70 ℃, and alpha is 0 when the internal environment temperature is the same as the target temperature; beta is a proportional parameter corresponding to the maximum temperature difference and f is the temperature difference between the current external environment temperature and the set target temperature when the control system samples, beta is 1 when the external environment temperature is below-20 ℃ and above 60 ℃, and beta is 0 when the external environment temperature is the same as the target temperature;
9) Determining semiconductor refrigerating and heating capacities; the semiconductor generates heat accumulation during refrigeration, and in order to reduce the influence of the heat accumulation on the refrigeration power of the semiconductor, the circulating liquid is driven by the water chiller to take away the heat accumulation;
10 According to the output function and the refrigerating and heating capacity of the semiconductor, adjusting the refrigerating or heating power of the semiconductor; when μ (t) >0 is output, the control system adjusts the magnitude and direction of the semiconductor voltage according to μ (t) to control the semiconductor heating power for the semiconductor heating mode; when mu (t) is output <0, the control system adjusts the direction and the size of the semiconductor voltage according to mu (t) to control the refrigeration power in the semiconductor refrigeration mode, and meanwhile, the water chiller is started to provide cooling water to ensure the normal operation of semiconductor refrigeration.
The schematic block diagram of the control relationship of the temperature control system of the present invention is shown in fig. 8. According to the temperature control method, heating/refrigerating power required by balancing internal and external environment fluctuation is calculated according to the two temperature sensors inside and outside the incubator, and the two outputs are overlapped, so that the influence output of the internal self and external environment can be integrated, and the reaction time of temperature regulation and the internal environment temperature fluctuation are reduced. The device takes the influence of external cold and hot environments and internal heat sources on the internal temperature environment of the incubator into consideration, the detection results of the internal sensor and the external sensor are taken as independent inputs, two output functions are respectively obtained, and overall refrigerating and heating output is obtained by integrating the two output functions, so that on one hand, the internal temperature rise caused by heating of internal equipment of the incubator can be balanced, and on the other hand, the influence of the external temperature environment on the internal temperature environment of the incubator can be balanced. When the external environment severely fluctuates and the internal temperature of the equipment starts to change, the control system increases heating/refrigerating power, balances the influence of the external environment in advance and can effectively reduce the fluctuation of the internal temperature.
The foregoing disclosure is merely illustrative of some embodiments of the invention, but the embodiments are not limited thereto and variations within the scope of the invention will be apparent to those skilled in the art.
Claims (4)
1. The split temperature control system of the modem for the rotor system ground test is characterized by comprising an incubator and a semiconductor refrigeration control box, wherein a semiconductor refrigeration device (13) and a supercooling water pipe (12) are arranged in the incubator, the cold end of the semiconductor refrigeration device (13) faces the inner cavity of the incubator, and the hot end of the semiconductor refrigeration device (13) is in contact with the supercooling water pipe (12); a fiber grating temperature sensor (29) connected with the fiber grating demodulator (5) is arranged outside the incubator; the inner cavity of the incubator is used for storing the fiber bragg grating demodulator (5) and is provided with a resistance type temperature sensor (14); a control system, a cooling water tank (22) and a water chiller (23) are arranged in the semiconductor refrigeration control box; the semiconductor refrigeration device and the resistance type temperature sensor (14) in the incubator are connected with a control system in the control cabinet; the control system adjusts the circulation temperature of the semiconductor refrigeration and supercooled oil liquid according to the temperature data measured by the resistance type temperature sensor (14) and the fiber bragg grating temperature sensor (29) to stabilize the temperature in the incubator.
2. The split temperature control system of a modem for ground testing of a rotor system according to claim 1, wherein the control system comprises a control circuit and a control panel, the control circuit comprises a PIC controller (24), and a temperature alarm indicator lamp (20) is arranged on the control panel; the semiconductor refrigeration device (13) and the resistance type temperature sensor (14) in the constant temperature box are connected with a control system in the control box through signal lines.
3. The split temperature control system of a modem for ground testing of a rotor system according to claim 1, wherein 4 fixing clamps (28) are welded on the inner wall of the oven cover and the inner wall of the bottom of the oven, and the fixing clamps (28) are used for fixing the fiber grating demodulator (5).
4. The temperature control method of a split temperature control system of a modem for ground testing of a rotor system according to claim 1, comprising the steps of:
1) Detecting temperature data of each area according to a stipulated period, wherein the area comprises the temperature of the outer wall area of the incubator corresponding to each fiber bragg grating temperature sensor string and the temperature of the inner area corresponding to the resistance type temperature sensor; the resistance type temperature sensor corresponds to an internal temperature value A of the incubator, wherein A is the temperature acquired by each time node; the temperature sensor in the incubator transmits the acquired temperature value to the control system according to a stipulated period; the temperature information acquired by the fiber bragg grating temperature sensor is analyzed and processed by a fiber bragg grating demodulator to obtain an external surface temperature value B of the incubator N The temperature value is a set B of a plurality of sensor acquisition values N Where n=1, 2, …,20, N is the number of gratings in the fiber grating temperature sensor;
2) The control system judges the internal temperature value A of the incubator when receiving the signal of the resistance type temperature sensor at each moment, and when A is more than 60 ℃ or A < -20 ℃, an alarm is given out and an alarm indicator lamp is turned on;
3) Obtaining the heat transfer coefficient C of the outer surface part of the corresponding incubator in each grating temperature sensor to the internal environment of the equipment N The method comprises the steps of carrying out a first treatment on the surface of the When the internal temperature and the external temperature of the incubator are the same, the side wall of the external surface of the incubator is required to be heated or refrigerated, the surface temperature of the same part inside and outside the incubator is measured, and the absolute value obtained by subtracting the internal temperature and the external temperature is taken as the heat transfer coefficient;
4) Determining a target temperature value S to be maintained in the incubator, wherein the target temperature is determined according to the working temperature of the fiber bragg grating demodulator, namely-20 ℃ < S <60 ℃;
5) Determining se:Sup>A first difference function e (t) =s-se:Sup>A of the temperature in the oven and the target temperature, which is the difference between the temperature value se:Sup>A in the oven and the target temperature value SA function that varies over time; determining a second difference function between the temperature outside the incubator and the target temperature
Wherein, for the calculation method of the second difference function, the temperature value B of each grating temperature sensor is obtained first N And corresponding heat transfer coefficient C N The multiplied average value, the function of the difference value of the average value and the target temperature about time is a second difference function, and N is the number of the gratings of the external temperature sensor; />
6) Determining a first output function from the first difference function; i.e. a first output function is obtained by accumulation of proportional integral calculation, integral calculation and differential calculation;
wherein K is p e (t) is proportional integral calculation, i.e. the temperature difference function e (t) in the incubator at time t is multiplied by the proportional gain K p ，K p ＝0.65K c ,K c The PID is adopted only under the control condition of a proportion link, and the steady-state error of the control system reaches the minimum as much as possible e(t) ＝K c K in e (t) c A value; by adjusting K p Controlling the speed of the constant temperature box reaching the target temperature, K p The greater the speed of approaching the target temperature, the faster; />
Is an integral calculation step, i.e. taking into account past errors, integrating the first difference function from the beginning to the current time and with the integral gain K i Multiplication can reduce the error of the adjustment, < >>
T is the sampling calculation period of PID control, T i Is the integration time of the control system; />
Is a differential meterThe calculation step, i.e. taking into account the upcoming error, of a first derivative of the first difference function and of a constant K of positive value d Multiply by (I)>
t is the differential time of the control system; the three parameters are all the adapting parameters and are more than 0, and are adjusted according to the environmental temperature range of the outer wall of the incubator;
7) Determining a second output function from the second difference function; the process is determined by PID algorithm, i.e. the second output function is obtained by accumulation of proportional, integral and differential calculations
The proportional calculation, the integral calculation and the differential calculation are all obtained based on a second difference function f (t), the meaning and the method are the same as those of the first output function, and the three calculation links and the parameter function are the same as those of the first output function;
8) Determining an output function μ (t); the output function mu (t) is obtained by adding the first function and the second function; wherein the output function μ (t) is μ (t) =αpid e(t) +βPID f(t) Wherein α and β are adaptation parameters of the first output function and the second output function, respectively, wherein
0<α<1，0<β<1, alpha is a proportional parameter corresponding to the internal environment temperature difference and the maximum temperature difference, e is the temperature difference between the current internal environment temperature of the constant temperature box and the set target temperature when the control system samples, alpha is 1 when the internal environment temperature change range is below-40 ℃ or above 70 ℃, and alpha is 0 when the internal environment temperature is the same as the target temperature; beta is a proportional parameter corresponding to the maximum temperature difference and f is the temperature difference between the current external environment temperature and the set target temperature when the control system samples, beta is 1 when the external environment temperature is below-20 ℃ and above 60 ℃, and beta is 0 when the external environment temperature is the same as the target temperature;
9) Determining semiconductor refrigerating and heating capacities; the semiconductor generates heat accumulation during refrigeration, and in order to reduce the influence of the heat accumulation on the refrigeration power of the semiconductor, the circulating liquid is driven by the water chiller to take away the heat accumulation;
10 According to the output function and the refrigerating and heating capacity of the semiconductor, adjusting the refrigerating or heating power of the semiconductor;
when μ (t) >0 is output, the control system adjusts the magnitude and direction of the semiconductor voltage according to μ (t) to control the semiconductor heating power for the semiconductor heating mode; when mu (t) is output <0, the control system adjusts the direction and the size of the semiconductor voltage according to mu (t) to control the refrigeration power in the semiconductor refrigeration mode, and meanwhile, the water chiller is started to provide cooling water to ensure the normal operation of semiconductor refrigeration.
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